USD867183S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD867183S1
USD867183S1 US29/612,176 US201729612176F USD867183S US D867183 S1 USD867183 S1 US D867183S1 US 201729612176 F US201729612176 F US 201729612176F US D867183 S USD867183 S US D867183S
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US
United States
Prior art keywords
probe pin
view
probe
pin
design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/612,176
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English (en)
Inventor
Mika NASU
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Assigned to KABUSHIKI KAISHA NIHON MICRONICS reassignment KABUSHIKI KAISHA NIHON MICRONICS ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NASU, MIKA
Assigned to KABUSHIKI KAISHA NIHON MICRONICS reassignment KABUSHIKI KAISHA NIHON MICRONICS CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS PREVIOUSLY RECORDED AT REEL: 043161 FRAME: 0659. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT . Assignors: NASU, MIKA
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Publication of USD867183S1 publication Critical patent/USD867183S1/en
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US29/612,176 2017-02-10 2017-07-28 Probe pin Active USD867183S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-002475 2017-02-10
JPD2017-2475F JP1592871S (cs) 2017-02-10 2017-02-10

Publications (1)

Publication Number Publication Date
USD867183S1 true USD867183S1 (en) 2019-11-19

Family

ID=60570635

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/612,176 Active USD867183S1 (en) 2017-02-10 2017-07-28 Probe pin

Country Status (3)

Country Link
US (1) USD867183S1 (cs)
JP (1) JP1592871S (cs)
TW (1) TWD190540S (cs)

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
KR20160063284A (ko) 2014-11-26 2016-06-03 가부시키가이샤 니혼 마이크로닉스 프로브 및 접촉검사장치
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD397052S (en) * 1997-04-08 1998-08-18 Societe Chauvin Arnoux Test lead
US20110050261A1 (en) * 2009-09-01 2011-03-03 Hon Hai Precision Industry Co., Ltd. Test probe
US20130069669A1 (en) * 2011-09-19 2013-03-21 Vasu MOGAVEERA Electrostatic shielding technique on high voltage diodes
US20150070040A1 (en) * 2012-04-13 2015-03-12 Xcerra Corporation Test probe assembly and related methods
US20150369859A1 (en) * 2012-07-23 2015-12-24 Yamaichi Electronics Co., Ltd. Contact probe and semiconductor element socket provided with same
USD686098S1 (en) * 2012-11-14 2013-07-16 Agar Corporation Ltd. Antenna detection probe for a storage tank
US20170138985A1 (en) * 2014-06-16 2017-05-18 Omron Corporation Probe pin and electronic device using the same
KR20160063284A (ko) 2014-11-26 2016-06-03 가부시키가이샤 니혼 마이크로닉스 프로브 및 접촉검사장치
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin

Also Published As

Publication number Publication date
JP1592871S (cs) 2017-12-11
TWD190540S (zh) 2018-05-21

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