USD830208S1 - Probe - Google Patents

Probe Download PDF

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Publication number
USD830208S1
USD830208S1 US29/598,346 US201729598346F USD830208S US D830208 S1 USD830208 S1 US D830208S1 US 201729598346 F US201729598346 F US 201729598346F US D830208 S USD830208 S US D830208S
Authority
US
United States
Prior art keywords
probe
view
design
break
dash
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/598,346
Inventor
Yoshiyasu Makino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sintokogio Ltd
Original Assignee
Sintokogio Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sintokogio Ltd filed Critical Sintokogio Ltd
Assigned to SINTOKOGIO, LTD. reassignment SINTOKOGIO, LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MAKINO, Yoshiyasu
Application granted granted Critical
Publication of USD830208S1 publication Critical patent/USD830208S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a probe showing my new design;
FIG. 2 is a front view thereof, the rear view being a mirror image thereof;
FIG. 3 is a left side view thereof;
FIG. 4 is a right side view thereof;
FIG. 5 is a top plan view thereof; and,
FIG. 6 is a bottom plan side view thereof.
The drawings include surface shading which represents contour and not surface ornamentation.
The parallel dash-dot-dash broken lines represent a symbolic break in the length of an element of the probe and form no part of the claimed design.
The appearance of any portion of the probe between the break lines forms no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a probe, as shown and described.
US29/598,346 2016-10-03 2017-03-24 Probe Active USD830208S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-021518 2016-10-03
JPD2016-21518F JP1580264S (en) 2016-10-03 2016-10-03

Publications (1)

Publication Number Publication Date
USD830208S1 true USD830208S1 (en) 2018-10-09

Family

ID=59217154

Family Applications (2)

Application Number Title Priority Date Filing Date
US29/598,347 Active USD830865S1 (en) 2016-10-03 2017-03-24 Probe
US29/598,346 Active USD830208S1 (en) 2016-10-03 2017-03-24 Probe

Family Applications Before (1)

Application Number Title Priority Date Filing Date
US29/598,347 Active USD830865S1 (en) 2016-10-03 2017-03-24 Probe

Country Status (3)

Country Link
US (2) USD830865S1 (en)
JP (1) JP1580264S (en)
TW (2) TWD187434S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD929880S1 (en) * 2019-11-03 2021-09-07 Jinhe Lan Laser probe head
USD954971S1 (en) * 2019-12-19 2022-06-14 Father Flanagan's Boys' Home Neural net adaptor

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991016638A1 (en) * 1990-04-17 1991-10-31 Iowa State University Research Foundation, Inc. Method and apparatus for photoinductive imaging
USD431867S (en) * 1999-03-22 2000-10-10 Biostar, Incorporated Immunoassay test device
USD450000S1 (en) * 2000-02-24 2001-11-06 Ann F. Koo Multiple environment testing chamber
USD571831S1 (en) * 2005-07-29 2008-06-24 Tokyo Electron Limited Top panel for microwave introduction window of a plasma processing apparatus
US20130314084A1 (en) * 2012-05-22 2013-11-28 Industry-Academic Cooperation Foundation Chosun University Apparatus for detecting crack using heterogeneous magnetic sensors
USD744360S1 (en) * 2014-01-06 2015-12-01 Sintokogio, Ltd. Probe for peening inspection
USD808901S1 (en) * 2016-05-03 2018-01-30 Meemoobaby Ltd. Charging base

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5532591A (en) * 1992-02-27 1996-07-02 Logue; Delmar L. Apparatus for detecting surface flaws in cylindrical articles by means of asymmetric magnetic detection
USD381030S (en) * 1995-11-21 1997-07-15 Avi Tepman Sputtering target
TWD117940S1 (en) * 2005-07-29 2007-07-01 東京威力科創股份有限公司 Top panel for microwave introduction window of plasma processing apparatus
USD579809S1 (en) * 2006-09-08 2008-11-04 United Pacific Industries Inc. Gauge cover with visor
KR101580560B1 (en) * 2008-01-10 2015-12-28 지바 랩스 엘엘씨 Customizable modular multi-function communication device
US8333116B2 (en) * 2010-06-30 2012-12-18 Westinghouse Electric Company Llc Inspection vehicle for a turbine disk
USD697224S1 (en) * 2012-10-26 2014-01-07 Paragonix Technologies Inc. Lid for a tissue transport system
USD747267S1 (en) * 2013-03-15 2016-01-12 Samsung Electronics Co., Ltd. Charger for an electronic device
USD782973S1 (en) * 2015-03-19 2017-04-04 Bluesmart Technology Corporation Wireless charger
USD798807S1 (en) * 2015-09-15 2017-10-03 Anhui Huami Information Technology Co., Ltd. Charger
USD810015S1 (en) * 2016-02-12 2018-02-13 Axonics Modulation Technologies, Inc. Charging station
USD797042S1 (en) * 2016-03-18 2017-09-12 Halo2Cloud Llc Portable battery

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1991016638A1 (en) * 1990-04-17 1991-10-31 Iowa State University Research Foundation, Inc. Method and apparatus for photoinductive imaging
USD431867S (en) * 1999-03-22 2000-10-10 Biostar, Incorporated Immunoassay test device
USD450000S1 (en) * 2000-02-24 2001-11-06 Ann F. Koo Multiple environment testing chamber
USD571831S1 (en) * 2005-07-29 2008-06-24 Tokyo Electron Limited Top panel for microwave introduction window of a plasma processing apparatus
US20130314084A1 (en) * 2012-05-22 2013-11-28 Industry-Academic Cooperation Foundation Chosun University Apparatus for detecting crack using heterogeneous magnetic sensors
USD744360S1 (en) * 2014-01-06 2015-12-01 Sintokogio, Ltd. Probe for peening inspection
USD808901S1 (en) * 2016-05-03 2018-01-30 Meemoobaby Ltd. Charging base

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD929880S1 (en) * 2019-11-03 2021-09-07 Jinhe Lan Laser probe head
USD954971S1 (en) * 2019-12-19 2022-06-14 Father Flanagan's Boys' Home Neural net adaptor

Also Published As

Publication number Publication date
TWD187435S (en) 2017-12-21
USD830865S1 (en) 2018-10-16
JP1580264S (en) 2020-06-29
TWD187434S (en) 2017-12-21

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