USD827459S1 - Probe for remote coordinate measuring machine - Google Patents

Probe for remote coordinate measuring machine Download PDF

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Publication number
USD827459S1
USD827459S1 US29/593,538 US201729593538F USD827459S US D827459 S1 USD827459 S1 US D827459S1 US 201729593538 F US201729593538 F US 201729593538F US D827459 S USD827459 S US D827459S
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United States
Prior art keywords
probe
measuring machine
coordinate measuring
remote coordinate
remote
Prior art date
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Active
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US29/593,538
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English (en)
Inventor
Sadayuki Matsumiya
Takeshi Kawabata
Hidekazu Sano
Yu Sugai
Shigeru Ohtani
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Mitutoyo Corp
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Mitutoyo Corp
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Assigned to MITUTOYO CORPORATION reassignment MITUTOYO CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAWABATA, TAKESHI, MATSUMIYA, SADAYUKI, OHTANI, SHIGERU, SANO, HIDEKAZU, SUGAI, YU
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US29/593,538 2016-09-26 2017-02-09 Probe for remote coordinate measuring machine Active USD827459S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016-020567 2016-09-26
JPD2016-20567F JP1578944S (enrdf_load_stackoverflow) 2016-09-26 2016-09-26

Publications (1)

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USD827459S1 true USD827459S1 (en) 2018-09-04

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US29/593,538 Active USD827459S1 (en) 2016-09-26 2017-02-09 Probe for remote coordinate measuring machine

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US (1) USD827459S1 (enrdf_load_stackoverflow)
JP (1) JP1578944S (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220221261A1 (en) * 2019-06-25 2022-07-14 Asanuma Giken Co., Ltd. Inspection master
TWD222756S (zh) 2021-11-15 2022-12-21 南韓商ＯＫｉｎｓ電子股份有限公司 電氣特性測量用探針

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
US4578873A (en) * 1984-05-15 1986-04-01 Mauser-Werke Oberndorf Gmbh Sensor head with stop elements for establishing stable rest position
USD327854S (en) * 1989-04-22 1992-07-14 Renishaw Plc Coordinate positioning probe head
US5446971A (en) * 1993-01-14 1995-09-05 Leitz Messtechnik Gmbh Method for the dimensional measurement of workpieces
US5524354A (en) * 1992-12-21 1996-06-11 Carl Zeiss Jena Gmbh Probe element for coordinate measurement systems
US6360176B1 (en) * 1998-04-14 2002-03-19 Mitutoyo Corporation Touch signal probe
US6678966B1 (en) * 1999-06-16 2004-01-20 Mitutoyo Corporation Reseat system of touch signal probe
US8122610B2 (en) * 2008-03-28 2012-02-28 Hexagon Metrology, Inc. Systems and methods for improved coordination acquisition member comprising calibration information
USD666513S1 (en) * 2010-10-21 2012-09-04 Mitutoyo Corporation Remote probe for a coordinate measuring machine
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
US9354042B2 (en) * 2014-05-07 2016-05-31 Mitutoyo Corporation Coordinate measuring system, coordinate measuring method, and probe
US20160258738A1 (en) * 2015-03-05 2016-09-08 Mitutoyo Corporation Measuring probe
US9618312B2 (en) * 2015-03-05 2017-04-11 Mitutoyo Corporation Measuring probe
US9759540B2 (en) * 2014-06-11 2017-09-12 Hexagon Metrology, Inc. Articulating CMM probe
US9810529B2 (en) * 2015-03-05 2017-11-07 Mitotoyo Corporation Measuring probe for measuring a three-dimensional shape of an object to be measured

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
US4578873A (en) * 1984-05-15 1986-04-01 Mauser-Werke Oberndorf Gmbh Sensor head with stop elements for establishing stable rest position
USD327854S (en) * 1989-04-22 1992-07-14 Renishaw Plc Coordinate positioning probe head
US5524354A (en) * 1992-12-21 1996-06-11 Carl Zeiss Jena Gmbh Probe element for coordinate measurement systems
US5446971A (en) * 1993-01-14 1995-09-05 Leitz Messtechnik Gmbh Method for the dimensional measurement of workpieces
US6360176B1 (en) * 1998-04-14 2002-03-19 Mitutoyo Corporation Touch signal probe
US6678966B1 (en) * 1999-06-16 2004-01-20 Mitutoyo Corporation Reseat system of touch signal probe
US8122610B2 (en) * 2008-03-28 2012-02-28 Hexagon Metrology, Inc. Systems and methods for improved coordination acquisition member comprising calibration information
USD666513S1 (en) * 2010-10-21 2012-09-04 Mitutoyo Corporation Remote probe for a coordinate measuring machine
USD731904S1 (en) * 2014-03-19 2015-06-16 Hexagon Metrology Vision GmbH Coordinate measuring machine
US9354042B2 (en) * 2014-05-07 2016-05-31 Mitutoyo Corporation Coordinate measuring system, coordinate measuring method, and probe
US9759540B2 (en) * 2014-06-11 2017-09-12 Hexagon Metrology, Inc. Articulating CMM probe
US20160258738A1 (en) * 2015-03-05 2016-09-08 Mitutoyo Corporation Measuring probe
US9618312B2 (en) * 2015-03-05 2017-04-11 Mitutoyo Corporation Measuring probe
US9810529B2 (en) * 2015-03-05 2017-11-07 Mitotoyo Corporation Measuring probe for measuring a three-dimensional shape of an object to be measured

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
http://www.ndigital.com/msci/products/procmm/.
Multi-Sided Probe. NDI (Northern Digital Inc.). Jul. 2008. NDI P/N 8300220.

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220221261A1 (en) * 2019-06-25 2022-07-14 Asanuma Giken Co., Ltd. Inspection master
US11781849B2 (en) * 2019-06-25 2023-10-10 Asanuma Giken Co., Ltd. Inspection master
TWD222756S (zh) 2021-11-15 2022-12-21 南韓商ＯＫｉｎｓ電子股份有限公司 電氣特性測量用探針
USD1024815S1 (en) 2021-11-15 2024-04-30 Okins Electronics Co., Ltd. Probe for measuring electrical characteristics

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JP1578944S (enrdf_load_stackoverflow) 2017-06-12

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