USD788722S1 - Socket for an electronic device testing apparatus - Google Patents
Socket for an electronic device testing apparatus Download PDFInfo
- Publication number
- USD788722S1 USD788722S1 US29/509,962 US201429509962F USD788722S US D788722 S1 USD788722 S1 US D788722S1 US 201429509962 F US201429509962 F US 201429509962F US D788722 S USD788722 S US D788722S
- Authority
- US
- United States
- Prior art keywords
- socket
- electronic device
- testing apparatus
- device testing
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Description
The part represented by solid lines is a part of the claimed design. The dot-dash broken lines (the alternate long and short dash lines) represent only a border between the part of the claimed design and other part. The dashed broken lines (the broken lines) are for illustrative purposes only and form no part of the claimed design.
The broken lines connecting the arrows in FIG. 3 which show the cut of the plane for FIGS. 9 and 10 form no part of the claimed design.
Claims (1)
- The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29/601,371 USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR20140035155 | 2014-07-17 | ||
| KR30-2014-0035155 | 2014-07-17 | ||
| KR30-2014-0035153 | 2014-07-17 | ||
| KR20140035153 | 2014-07-17 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/601,371 Division USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD788722S1 true USD788722S1 (en) | 2017-06-06 |
Family
ID=58778578
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/509,962 Active USD788722S1 (en) | 2014-07-17 | 2014-11-24 | Socket for an electronic device testing apparatus |
| US29/601,371 Active USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/601,371 Active USD819581S1 (en) | 2014-07-17 | 2017-04-21 | Socket for electronic device testing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| US (2) | USD788722S1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD819581S1 (en) * | 2014-07-17 | 2018-06-05 | Advantest Corporation | Socket for electronic device testing apparatus |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP1678672S (en) * | 2019-11-07 | 2021-02-08 |
Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD358806S (en) * | 1993-09-24 | 1995-05-30 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
| USD359028S (en) * | 1993-09-02 | 1995-06-06 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
| US20030032322A1 (en) * | 2001-08-08 | 2003-02-13 | Yamaichi Electronics Co., Ltd. | Semiconductor device-socket |
| US20040063241A1 (en) * | 2001-06-19 | 2004-04-01 | Tomohiro Nakano | Socket for semiconductor package |
| US20040212382A1 (en) * | 2003-04-28 | 2004-10-28 | Cram Daniel P. | Test socket for semiconductor components having serviceable nest |
| US20050136721A1 (en) * | 2003-12-19 | 2005-06-23 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
| US20050231919A1 (en) * | 2004-04-16 | 2005-10-20 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
| US20050250363A1 (en) * | 2002-07-09 | 2005-11-10 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
| US20050287837A1 (en) * | 2004-06-24 | 2005-12-29 | Trobough Mark B | Multi-portion socket and related apparatuses |
| USD522977S1 (en) * | 2004-08-31 | 2006-06-13 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
| US20070173081A1 (en) * | 2006-01-20 | 2007-07-26 | Hon Hai Precision Ind. Co., Ltd. | Socket assembly |
| US20100062623A1 (en) * | 2008-09-08 | 2010-03-11 | Hon Hai Precision Industry Co., Ltd. | Ic socket with floatable pressing device for receiving testing ic packages of different sizes |
| USD633880S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket housing |
| USD633877S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket frame |
| USD633878S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cover cap |
| USD633879S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cap |
| USD645426S1 (en) * | 2010-03-26 | 2011-09-20 | Advanced Micro Devices, Inc. | Socket assembly |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3803099B2 (en) * | 2002-12-17 | 2006-08-02 | 山一電機株式会社 | Socket for semiconductor device |
| JP4471941B2 (en) * | 2005-03-10 | 2010-06-02 | 山一電機株式会社 | Socket for semiconductor device |
| JP4495200B2 (en) * | 2007-09-28 | 2010-06-30 | 山一電機株式会社 | Socket for semiconductor device |
| TWM351499U (en) * | 2008-08-11 | 2009-02-21 | Hon Hai Prec Ind Co Ltd | Electrical connector |
| JP2010118275A (en) * | 2008-11-13 | 2010-05-27 | Yamaichi Electronics Co Ltd | Socket for semiconductor device |
| JP6251104B2 (en) * | 2014-03-31 | 2017-12-20 | 株式会社エンプラス | Elevating mechanism and socket for electrical parts |
| USD788722S1 (en) * | 2014-07-17 | 2017-06-06 | Advantest Corporation | Socket for an electronic device testing apparatus |
-
2014
- 2014-11-24 US US29/509,962 patent/USD788722S1/en active Active
-
2017
- 2017-04-21 US US29/601,371 patent/USD819581S1/en active Active
Patent Citations (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD359028S (en) * | 1993-09-02 | 1995-06-06 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
| USD358806S (en) * | 1993-09-24 | 1995-05-30 | Sgs-Thomson Microelectronics, Inc. | Socketed integrated circuit package |
| US20040063241A1 (en) * | 2001-06-19 | 2004-04-01 | Tomohiro Nakano | Socket for semiconductor package |
| US20030032322A1 (en) * | 2001-08-08 | 2003-02-13 | Yamaichi Electronics Co., Ltd. | Semiconductor device-socket |
| US20050250363A1 (en) * | 2002-07-09 | 2005-11-10 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
| US20040212382A1 (en) * | 2003-04-28 | 2004-10-28 | Cram Daniel P. | Test socket for semiconductor components having serviceable nest |
| US20050136721A1 (en) * | 2003-12-19 | 2005-06-23 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
| US20050231919A1 (en) * | 2004-04-16 | 2005-10-20 | Yamaichi Electronics Co., Ltd. | Semiconductor device socket |
| US20050287837A1 (en) * | 2004-06-24 | 2005-12-29 | Trobough Mark B | Multi-portion socket and related apparatuses |
| USD522977S1 (en) * | 2004-08-31 | 2006-06-13 | Yamaichi Electronics Co., Ltd. | Socket for semiconductor device |
| US20070173081A1 (en) * | 2006-01-20 | 2007-07-26 | Hon Hai Precision Ind. Co., Ltd. | Socket assembly |
| US20100062623A1 (en) * | 2008-09-08 | 2010-03-11 | Hon Hai Precision Industry Co., Ltd. | Ic socket with floatable pressing device for receiving testing ic packages of different sizes |
| USD633880S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket housing |
| USD633877S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket frame |
| USD633878S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cover cap |
| USD633879S1 (en) * | 2010-03-26 | 2011-03-08 | Advanced Micro Devices, Inc. | Socket cap |
| USD645426S1 (en) * | 2010-03-26 | 2011-09-20 | Advanced Micro Devices, Inc. | Socket assembly |
| USD648688S1 (en) * | 2010-03-26 | 2011-11-15 | Advanced Micro Devices, Inc. | Socket housing |
| USD661667S1 (en) * | 2010-03-26 | 2012-06-12 | Advanced Micro Devices, Inc. | Socket assembly |
Non-Patent Citations (2)
| Title |
|---|
| Office Action issued in Taiwan Counterpart Patent Appl. No. 103306664, dated Jul. 20, 2015. |
| Office Action issued in Taiwan Counterpart Patent Appl. No. 10420942510, dated Jul. 20, 2015. |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD819581S1 (en) * | 2014-07-17 | 2018-06-05 | Advantest Corporation | Socket for electronic device testing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| USD819581S1 (en) | 2018-06-05 |
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