USD769754S1 - Probe pin - Google Patents

Probe pin Download PDF

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Publication number
USD769754S1
USD769754S1 US29/557,788 US201629557788F USD769754S US D769754 S1 USD769754 S1 US D769754S1 US 201629557788 F US201629557788 F US 201629557788F US D769754 S USD769754 S US D769754S
Authority
US
United States
Prior art keywords
probe pin
view
probe
pin
design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/557,788
Inventor
Hirotada Teranishi
Takahiro Sakai
Makoto Kondo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Assigned to OMRON CORPORATION reassignment OMRON CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KONDO, MAKOTO, SAKAI, TAKAHIRO, TERANISHI, HIROTADA
Application granted granted Critical
Publication of USD769754S1 publication Critical patent/USD769754S1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a perspective view of a probe pin;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The dashed broken lines in the figures show portions of the probe pin that form no part of the claimed design. The dot-dash broken lines in the figures show boundaries of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a probe pin, as shown and described.
US29/557,788 2015-09-15 2016-03-11 Probe pin Active USD769754S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2015-20448F JP1554473S (en) 2015-09-15 2015-09-15
JP2015-020448 2015-09-15

Publications (1)

Publication Number Publication Date
USD769754S1 true USD769754S1 (en) 2016-10-25

Family

ID=56414213

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/557,788 Active USD769754S1 (en) 2015-09-15 2016-03-11 Probe pin

Country Status (3)

Country Link
US (1) USD769754S1 (en)
JP (1) JP1554473S (en)
TW (1) TWD180086S (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9207260B2 (en) * 2011-11-07 2015-12-08 Kabushiki Kaisha Nihon Micronics Probe block, probe card and probe apparatus both having the probe block
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD507197S1 (en) * 2004-11-22 2005-07-12 Fu-Cheng Sun Measure tape
US8460010B2 (en) * 2009-09-28 2013-06-11 Kabushiki Kaisha Nihon Micronics Contact and electrical connecting apparatus
US8808038B2 (en) * 2009-11-11 2014-08-19 Hicon Co., Ltd. Spring contact and a socket embedded with spring contacts
USD662895S1 (en) * 2010-01-27 2012-07-03 Kabushiki Kaisha Nihon Micronics Electric contact
US8366496B2 (en) * 2010-03-18 2013-02-05 Hon Hai Precision Ind. Co., Ltd. Composite contact assembly having lower contact with contact engaging points offset from each other
US8669774B2 (en) * 2010-04-09 2014-03-11 Yamaichi Electronics Co., Ltd. Probe pin and an IC socket with the same
USD665744S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
USD665745S1 (en) * 2010-09-28 2012-08-21 Adamant Kogyo Co., Ltd. Optical fiber connector
US9130290B2 (en) * 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
US9322846B2 (en) * 2011-10-14 2016-04-26 Omron Corporation Contactor
US9207260B2 (en) * 2011-11-07 2015-12-08 Kabushiki Kaisha Nihon Micronics Probe block, probe card and probe apparatus both having the probe block
USD749968S1 (en) * 2014-01-24 2016-02-23 Danaher (Shanghai) Industrial Instrumentation Technologies R&D Co., Ltd. Electrical test lead
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
U.S. Appl. No. 29/557,790, filed Mar. 11, 2016; Teranishi et al.

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1030689S1 (en) * 2022-04-29 2024-06-11 Point Engineering Co., Ltd. Semiconductor probe pin
USD1051865S1 (en) * 2022-04-29 2024-11-19 Point Engineering Co., Ltd. Semiconductor probe pin

Also Published As

Publication number Publication date
JP1554473S (en) 2016-07-25
TWD180086S (en) 2016-12-11

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