USD708244S1 - Electron microscope - Google Patents

Electron microscope Download PDF

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Publication number
USD708244S1
USD708244S1 US29/456,320 US201329456320F USD708244S US D708244 S1 USD708244 S1 US D708244S1 US 201329456320 F US201329456320 F US 201329456320F US D708244 S USD708244 S US D708244S
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United States
Prior art keywords
electron microscope
view
elevational view
ornamental design
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/456,320
Inventor
Kosuke Matoba
Hiroyuki Suzuki
Hirofumi Sato
Naoki Sakamoto
Toshiyuki Moriya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SATO, HIROFUMI, SAKAMOTO, NAOKI, SUZUKI, HIROYUKI, MATOBA, KOSUKE, MORIYA, TOSHIYUKI
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)

Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is an enlarged view of the portion indicated by lines 8 in FIG. 2.
The broken lines of FIG. 8 are for illustrative purposes of the boundaries of the enlarged view and form no part of the claimed design.

Claims (1)

    CLAIM
  1. We claim the ornamental design for an electron microscope, as shown and described.
US29/456,320 2012-11-30 2013-05-30 Electron microscope Active USD708244S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012029392 2012-11-30
JP2012-029392 2012-11-30

Publications (1)

Publication Number Publication Date
USD708244S1 true USD708244S1 (en) 2014-07-01

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ID=50982581

Family Applications (1)

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US29/456,320 Active USD708244S1 (en) 2012-11-30 2013-05-30 Electron microscope

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US (1) USD708244S1 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD797831S1 (en) * 2014-08-01 2017-09-19 Centre Hospitalier Universitaire De Toulous Microscope
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD982055S1 (en) * 2021-10-04 2023-03-28 Levan Shatashvili Gemstone viewer

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation.
Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English.
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new S-5500, Scanning Electron Microscope, Recorded World-Leading Resolution in 30 kV, Oct. 19, 2004 with partial translation.
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English.
Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English.
JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation.

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD797831S1 (en) * 2014-08-01 2017-09-19 Centre Hospitalier Universitaire De Toulous Microscope
USD876506S1 (en) * 2017-04-08 2020-02-25 Leica Microsystems Cms Gmbh Microscope
USD878444S1 (en) * 2017-04-08 2020-03-17 Leica Microsystems Cms Gmbh Microscope
USD851151S1 (en) * 2017-07-25 2019-06-11 Hitachi High-Tech Science Corporation Microscope
USD982055S1 (en) * 2021-10-04 2023-03-28 Levan Shatashvili Gemstone viewer

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