USD708244S1 - Electron microscope - Google Patents
Electron microscope Download PDFInfo
- Publication number
- USD708244S1 USD708244S1 US29/456,320 US201329456320F USD708244S US D708244 S1 USD708244 S1 US D708244S1 US 201329456320 F US201329456320 F US 201329456320F US D708244 S USD708244 S US D708244S
- Authority
- US
- United States
- Prior art keywords
- electron microscope
- view
- elevational view
- ornamental design
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
Description
The broken lines of FIG. 8 are for illustrative purposes of the boundaries of the enlarged view and form no part of the claimed design.
Claims (1)
- We claim the ornamental design for an electron microscope, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012029392 | 2012-11-30 | ||
| JP2012-029392 | 2012-11-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD708244S1 true USD708244S1 (en) | 2014-07-01 |
Family
ID=50982581
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/456,320 Active USD708244S1 (en) | 2012-11-30 | 2013-05-30 | Electron microscope |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD708244S1 (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD797831S1 (en) * | 2014-08-01 | 2017-09-19 | Centre Hospitalier Universitaire De Toulous | Microscope |
| USD851151S1 (en) * | 2017-07-25 | 2019-06-11 | Hitachi High-Tech Science Corporation | Microscope |
| USD876506S1 (en) * | 2017-04-08 | 2020-02-25 | Leica Microsystems Cms Gmbh | Microscope |
| USD878444S1 (en) * | 2017-04-08 | 2020-03-17 | Leica Microsystems Cms Gmbh | Microscope |
| USD982055S1 (en) * | 2021-10-04 | 2023-03-28 | Levan Shatashvili | Gemstone viewer |
| USD1064023S1 (en) * | 2021-10-05 | 2025-02-25 | Leica Microsystems Cms Gmbh | Accessory for a microscope |
| USD1085195S1 (en) | 2024-11-30 | 2025-07-22 | Shenzhen Chuangshi Optical Technology Co., Ltd. | Electron microscope |
| USD1117392S1 (en) * | 2021-04-06 | 2026-03-10 | Leica Microsystems Cms Gmbh | Combination of accessories for a microscope |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2370373A (en) * | 1939-01-17 | 1945-02-27 | Ruska Ernst | Electronic microscope |
| US3297284A (en) * | 1964-11-06 | 1967-01-10 | Pellerin Corp Milnor | Suspension system for machines |
| US3814356A (en) * | 1970-10-02 | 1974-06-04 | J Coleman | Electron microscope |
| US3835320A (en) * | 1969-05-28 | 1974-09-10 | Siemens Ag | Particle-beam device equipped with means for attenuating mechanical movements |
| US4523094A (en) * | 1981-02-27 | 1985-06-11 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Evaluation device for electron-optical images |
| USD303267S (en) * | 1986-08-07 | 1989-09-05 | Olympus Optical Co., Ltd. | Ultrasonic microscope |
| US4961003A (en) * | 1988-11-05 | 1990-10-02 | Seiko Instruments, Inc. | Scanning electron beam apparatus |
| USD332616S (en) * | 1990-01-26 | 1993-01-19 | Hitachi, Ltd. | Electronic microscope |
| US5350921A (en) * | 1992-07-29 | 1994-09-27 | Hitachi, Ltd. | Analytical electron microscope and a method of operating such an electron microscope |
| USD381031S (en) * | 1995-07-03 | 1997-07-15 | Hitachi, Ltd. | Electron microscope |
| US6084239A (en) * | 1995-09-14 | 2000-07-04 | Hitachi, Ltd. | Electron microscope |
| US20020148961A1 (en) * | 2000-11-02 | 2002-10-17 | Mamoru Nakasuji | Electron beam apparatus and device production method using the electron beam apparatus |
| US20050029452A1 (en) * | 2003-06-26 | 2005-02-10 | Jeol Ltd. | Electron microscope |
| USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
| USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
| USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
-
2013
- 2013-05-30 US US29/456,320 patent/USD708244S1/en active Active
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2370373A (en) * | 1939-01-17 | 1945-02-27 | Ruska Ernst | Electronic microscope |
| US3297284A (en) * | 1964-11-06 | 1967-01-10 | Pellerin Corp Milnor | Suspension system for machines |
| US3835320A (en) * | 1969-05-28 | 1974-09-10 | Siemens Ag | Particle-beam device equipped with means for attenuating mechanical movements |
| US3814356A (en) * | 1970-10-02 | 1974-06-04 | J Coleman | Electron microscope |
| US4523094A (en) * | 1981-02-27 | 1985-06-11 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Evaluation device for electron-optical images |
| USD303267S (en) * | 1986-08-07 | 1989-09-05 | Olympus Optical Co., Ltd. | Ultrasonic microscope |
| US4961003A (en) * | 1988-11-05 | 1990-10-02 | Seiko Instruments, Inc. | Scanning electron beam apparatus |
| USD332616S (en) * | 1990-01-26 | 1993-01-19 | Hitachi, Ltd. | Electronic microscope |
| US5350921A (en) * | 1992-07-29 | 1994-09-27 | Hitachi, Ltd. | Analytical electron microscope and a method of operating such an electron microscope |
| USD381031S (en) * | 1995-07-03 | 1997-07-15 | Hitachi, Ltd. | Electron microscope |
| US6084239A (en) * | 1995-09-14 | 2000-07-04 | Hitachi, Ltd. | Electron microscope |
| US20020148961A1 (en) * | 2000-11-02 | 2002-10-17 | Mamoru Nakasuji | Electron beam apparatus and device production method using the electron beam apparatus |
| US20050029452A1 (en) * | 2003-06-26 | 2005-02-10 | Jeol Ltd. | Electron microscope |
| USD638046S1 (en) * | 2010-02-22 | 2011-05-17 | Hitachi High-Technologies Corporation | Electron microscope |
| USD644258S1 (en) * | 2010-02-22 | 2011-08-30 | Hitachi High-Technologies Corporation | Electron microscope |
| USD687475S1 (en) * | 2012-05-10 | 2013-08-06 | Hitachi High-Technologies Corporation | Electron microscope |
Non-Patent Citations (6)
| Title |
|---|
| Hitachi High-Technologies Corporation, General Catalog for Semiconductor Manufacturing Equipments, Electron Microscope, Feb. 24, 2006 with partial translation. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Tech Launches the SU8000, A New Type of Scanning Electron Microscope, Jul. 23, 2008 in English. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new S-5500, Scanning Electron Microscope, Recorded World-Leading Resolution in 30 kV, Oct. 19, 2004 with partial translation. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU3500 Scanning Electron Microscope, Enables Fast, High-Resolution Observations During Low Acceleration Voltages, May 11, 2012 in English. |
| Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of new SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English. |
| JP Office of Appln. No. 2012-029392 dated May 7, 2013 with English translation. |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD797831S1 (en) * | 2014-08-01 | 2017-09-19 | Centre Hospitalier Universitaire De Toulous | Microscope |
| USD876506S1 (en) * | 2017-04-08 | 2020-02-25 | Leica Microsystems Cms Gmbh | Microscope |
| USD878444S1 (en) * | 2017-04-08 | 2020-03-17 | Leica Microsystems Cms Gmbh | Microscope |
| USD851151S1 (en) * | 2017-07-25 | 2019-06-11 | Hitachi High-Tech Science Corporation | Microscope |
| USD1117392S1 (en) * | 2021-04-06 | 2026-03-10 | Leica Microsystems Cms Gmbh | Combination of accessories for a microscope |
| USD982055S1 (en) * | 2021-10-04 | 2023-03-28 | Levan Shatashvili | Gemstone viewer |
| USD1064023S1 (en) * | 2021-10-05 | 2025-02-25 | Leica Microsystems Cms Gmbh | Accessory for a microscope |
| USD1085195S1 (en) | 2024-11-30 | 2025-07-22 | Shenzhen Chuangshi Optical Technology Co., Ltd. | Electron microscope |
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