USD637098S1 - Semiconductor testing machine - Google Patents

Semiconductor testing machine Download PDF

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Publication number
USD637098S1
USD637098S1 US29/360,394 US36039410F USD637098S US D637098 S1 USD637098 S1 US D637098S1 US 36039410 F US36039410 F US 36039410F US D637098 S USD637098 S US D637098S
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US
United States
Prior art keywords
testing machine
semiconductor testing
semiconductor
view
machine
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/360,394
Inventor
Mitsuru Oonuma
Akira Omachi
Kazuhiko Nishiyama
Hiroyuki Suzuki
Yasuhiko Nara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Assigned to HITACHI HIGH-TECHNOLOGIES CORPORATION reassignment HITACHI HIGH-TECHNOLOGIES CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: NARA, YASUHIKO, SUZUKI, HIROYUKI, NISHIYAMA, KAZUHIKO, OMACHI, AKIRA, OONUMA, MITSURU
Application granted granted Critical
Publication of USD637098S1 publication Critical patent/USD637098S1/en
Assigned to HITACHI HIGH-TECH CORPORATION reassignment HITACHI HIGH-TECH CORPORATION CHANGE OF NAME AND ADDRESS Assignors: HITACHI HIGH-TECHNOLOGIES CORPORATION
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and right side perspective view of a semiconductor testing machine showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a right side elevational view thereof; and,
FIG. 7 is a left side elevational view thereof.

Claims (1)

  1. The ornamental design for a semiconductor testing machine, as shown.
US29/360,394 2009-10-30 2010-04-26 Semiconductor testing machine Expired - Lifetime USD637098S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009-025480 2009-10-30
JP2009025480 2009-10-30

Publications (1)

Publication Number Publication Date
USD637098S1 true USD637098S1 (en) 2011-05-03

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ID=43903548

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/360,394 Expired - Lifetime USD637098S1 (en) 2009-10-30 2010-04-26 Semiconductor testing machine

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US (1) USD637098S1 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD655824S1 (en) * 2010-09-22 2012-03-13 Sysmex Corporation Specimen analyzer
USD657067S1 (en) * 2010-06-29 2012-04-03 Sysmex Corporation Specimen analyzer
USD657068S1 (en) * 2010-06-29 2012-04-03 Sysmex Corporation Specimen analyzer
USD858590S1 (en) * 2017-02-28 2019-09-03 Mitsubishi Heavy Industries Machine Tool Co., Ltd. Machine tool
USD905139S1 (en) * 2019-02-13 2020-12-15 Agie Charmilles Sa Electrical discharge machine
USD905140S1 (en) * 2019-02-13 2020-12-15 Gf Machining Solutions Ag Milling machine
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD350490S (en) * 1992-10-08 1994-09-13 Tokyo Electron Kabushiki Kaisha Semiconductor wafer testing apparatus
USD365584S (en) * 1993-12-15 1995-12-26 Tokyo Electron Kabushiki Kaisha Semiconductor manufacturing device
USD447967S1 (en) * 2000-11-08 2001-09-18 Sysmex Corporation Measuring apparatus for measuring a particle size distribution

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD350490S (en) * 1992-10-08 1994-09-13 Tokyo Electron Kabushiki Kaisha Semiconductor wafer testing apparatus
USD365584S (en) * 1993-12-15 1995-12-26 Tokyo Electron Kabushiki Kaisha Semiconductor manufacturing device
USD447967S1 (en) * 2000-11-08 2001-09-18 Sysmex Corporation Measuring apparatus for measuring a particle size distribution

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD657067S1 (en) * 2010-06-29 2012-04-03 Sysmex Corporation Specimen analyzer
USD657068S1 (en) * 2010-06-29 2012-04-03 Sysmex Corporation Specimen analyzer
USD655824S1 (en) * 2010-09-22 2012-03-13 Sysmex Corporation Specimen analyzer
USD858590S1 (en) * 2017-02-28 2019-09-03 Mitsubishi Heavy Industries Machine Tool Co., Ltd. Machine tool
USD905139S1 (en) * 2019-02-13 2020-12-15 Agie Charmilles Sa Electrical discharge machine
USD905140S1 (en) * 2019-02-13 2020-12-15 Gf Machining Solutions Ag Milling machine
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate

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