USD307724S - Defect inspection device for semiconductors - Google Patents

Defect inspection device for semiconductors Download PDF

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Publication number
USD307724S
USD307724S US07/134,892 US13489287F USD307724S US D307724 S USD307724 S US D307724S US 13489287 F US13489287 F US 13489287F US D307724 S USD307724 S US D307724S
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US
United States
Prior art keywords
semiconductors
inspection device
defect inspection
defect
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US07/134,892
Inventor
Yoshiaki Nishida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Assigned to KABUSHIKI KAISHA TOSHIBA reassignment KABUSHIKI KAISHA TOSHIBA ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: NISHIDA, YOSHIAKI
Application granted granted Critical
Publication of USD307724S publication Critical patent/USD307724S/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a front, top and left side perspective view of a defect inspection device for semiconductors showing my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a rear elevational view thereof; and
FIG. 7 is a bottom plan view thereof.

Claims (1)

  1. The ornamental design for a defect inspection device for semiconductors, as shown.
US07/134,892 1987-06-25 1987-12-18 Defect inspection device for semiconductors Expired - Lifetime USD307724S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP62-25627 1987-06-25
JP2562787 1987-06-25

Publications (1)

Publication Number Publication Date
USD307724S true USD307724S (en) 1990-05-08

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ID=64425929

Family Applications (1)

Application Number Title Priority Date Filing Date
US07/134,892 Expired - Lifetime USD307724S (en) 1987-06-25 1987-12-18 Defect inspection device for semiconductors

Country Status (1)

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US (1) USD307724S (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD292979S (en) 1985-04-26 1987-12-01 Prometrix Corporation Automatic semiconductor wafer tester
US4745354A (en) 1985-05-20 1988-05-17 Fts Systems, Inc. Apparatus and methods for effecting a burn-in procedure on semiconductor devices
US4755746A (en) 1985-04-24 1988-07-05 Prometrix Corporation Apparatus and methods for semiconductor wafer testing

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4755746A (en) 1985-04-24 1988-07-05 Prometrix Corporation Apparatus and methods for semiconductor wafer testing
USD292979S (en) 1985-04-26 1987-12-01 Prometrix Corporation Automatic semiconductor wafer tester
US4745354A (en) 1985-05-20 1988-05-17 Fts Systems, Inc. Apparatus and methods for effecting a burn-in procedure on semiconductor devices

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Toshiba, "A Defect Inspection Device for Semiconductors", Dec. 5, 1961.

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