USD307724S - Defect inspection device for semiconductors - Google Patents
Defect inspection device for semiconductors Download PDFInfo
- Publication number
- USD307724S USD307724S US07/134,892 US13489287F USD307724S US D307724 S USD307724 S US D307724S US 13489287 F US13489287 F US 13489287F US D307724 S USD307724 S US D307724S
- Authority
- US
- United States
- Prior art keywords
- semiconductors
- inspection device
- defect inspection
- defect
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a front, top and left side perspective view of a defect inspection device for semiconductors showing my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a rear elevational view thereof; and
FIG. 7 is a bottom plan view thereof.
Claims (1)
- The ornamental design for a defect inspection device for semiconductors, as shown.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62-25627 | 1987-06-25 | ||
| JP2562787 | 1987-06-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD307724S true USD307724S (en) | 1990-05-08 |
Family
ID=64425929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US07/134,892 Expired - Lifetime USD307724S (en) | 1987-06-25 | 1987-12-18 | Defect inspection device for semiconductors |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD307724S (en) |
-
1987
- 1987-12-18 US US07/134,892 patent/USD307724S/en not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| Toshiba, "A Defect Inspection Device for Semiconductors", Dec. 5, 1961. |
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