USB337703I5 - - Google Patents

Info

Publication number
USB337703I5
USB337703I5 US33770373A USB337703I5 US B337703 I5 USB337703 I5 US B337703I5 US 33770373 A US33770373 A US 33770373A US B337703 I5 USB337703 I5 US B337703I5
Authority
US
United States
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to US337703A priority Critical patent/US3914690A/en
Publication of USB337703I5 publication Critical patent/USB337703I5/en
Application granted granted Critical
Publication of US3914690A publication Critical patent/US3914690A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/263—Circuits therefor for testing thyristors
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/20—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess voltage

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
US337703A 1973-03-02 1973-03-02 Scr and diode tester Expired - Lifetime US3914690A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US337703A US3914690A (en) 1973-03-02 1973-03-02 Scr and diode tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US337703A US3914690A (en) 1973-03-02 1973-03-02 Scr and diode tester

Publications (2)

Publication Number Publication Date
USB337703I5 true USB337703I5 (en) 1975-01-28
US3914690A US3914690A (en) 1975-10-21

Family

ID=23321653

Family Applications (1)

Application Number Title Priority Date Filing Date
US337703A Expired - Lifetime US3914690A (en) 1973-03-02 1973-03-02 Scr and diode tester

Country Status (1)

Country Link
US (1) US3914690A (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4215309A (en) * 1977-11-17 1980-07-29 Frey Raymond A High efficiency switching circuit
US4434401A (en) 1981-05-04 1984-02-28 Flight Systems, Inc. Apparatus for testing semiconductor devices and capacitors
JPH07112001B2 (en) * 1990-03-09 1995-11-29 株式会社東芝 Variable capacitance diode characteristic inspection method
US6020735A (en) * 1998-04-24 2000-02-01 Lucent Technologies Inc. Switching device internal diode detection circuit and method of operating the same
US6246187B1 (en) 1999-05-20 2001-06-12 Nsi Enterprises, Inc. System for promoting passive end of life light source failure
CN100449319C (en) * 2006-03-17 2009-01-07 中国电力科学研究院 A synthetic full working condition test device main circuit
CN103777132B (en) * 2014-01-16 2017-01-04 深圳市金宏威技术有限责任公司 Diode monitor device for enhancement mode direct-current dual power power distribution cabinet
US11848798B2 (en) * 2021-02-09 2023-12-19 Rhymebus Corporation Array controlling system for controlling multiple array modules and controlling method thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2895106A (en) * 1958-04-29 1959-07-14 Ibm Tester
US3193766A (en) * 1961-02-17 1965-07-06 Electronic Dimmer Corp Controlled silicon rectifier test apparatus for determining defects and operating characteristics
US3478264A (en) * 1968-01-31 1969-11-11 Ram Tool Corp Scr,diode and transistor analyzer
US3676767A (en) * 1969-07-25 1972-07-11 Gen Aviat Electronics Inc Device for automatically identifying unknown transistors

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2895106A (en) * 1958-04-29 1959-07-14 Ibm Tester
US3193766A (en) * 1961-02-17 1965-07-06 Electronic Dimmer Corp Controlled silicon rectifier test apparatus for determining defects and operating characteristics
US3478264A (en) * 1968-01-31 1969-11-11 Ram Tool Corp Scr,diode and transistor analyzer
US3676767A (en) * 1969-07-25 1972-07-11 Gen Aviat Electronics Inc Device for automatically identifying unknown transistors

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Hopkins T. E., "SCR TESTER", Electronics World, Jan. 1964, pg. 56 *

Also Published As

Publication number Publication date
US3914690A (en) 1975-10-21

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