US7116153B2 - Circuit for driving a depletion-type JFET - Google Patents
Circuit for driving a depletion-type JFET Download PDFInfo
- Publication number
- US7116153B2 US7116153B2 US10/842,571 US84257104A US7116153B2 US 7116153 B2 US7116153 B2 US 7116153B2 US 84257104 A US84257104 A US 84257104A US 7116153 B2 US7116153 B2 US 7116153B2
- Authority
- US
- United States
- Prior art keywords
- depletion
- type jfet
- switch
- gate
- jfet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000003990 capacitor Substances 0.000 claims abstract description 40
- 239000004065 semiconductor Substances 0.000 claims description 22
- 238000000034 method Methods 0.000 claims description 21
- 230000008569 process Effects 0.000 claims description 21
- 238000004519 manufacturing process Methods 0.000 claims 5
- 230000004048 modification Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000005669 field effect Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K17/6877—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the control circuit comprising active elements different from those used in the output circuit
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/098—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being PN junction gate field-effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K2017/6875—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors using self-conductive, depletion FETs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0036—Means reducing energy consumption
Definitions
- the present invention relates generally to a power junction field-effect transistor (JFET) and, more specifically, to a circuit for driving a depletion-type JFET.
- JFET power junction field-effect transistor
- FET and bipolar junction transistor are well-known electronic devices and have been used for various applications. Even though FET is similar to BJT in its characteristics and functions, it is much simpler and better for use than BJT, because of the non-zero base current and low input impedance inherently possessed by BJT which will result in disadvantages when it is used for circuit applications.
- MOS metal-oxide-semiconductor
- a parallel resistor and capacitor network 10 for driving an N-channel depletion-type JFET 12 comprises a capacitor 102 connected between a control input 106 and the gate G of the JFET 12 , and a resistor 104 connected to the capacitor 102 in parallel.
- V S the voltage on the source of the JFET 12 .
- V S the voltage on the source of the JFET 12
- V IS V C +V GS , EQ-3 where V C is the voltage drop across the capacitor 102 and V GS is the gate-source voltage of the JFET 12 .
- V GS V I ⁇ V C .
- EQ-4 When the voltage V I is at a high level, the gate-source voltage V GS of the JFET 12 is positive, since the charged voltage V C of the capacitor 102 cannot be higher than V I . As a result, the JFET 12 is conductive. When the voltage V I is switched to a level lower than V C , the gate-source voltage V GS of the JFET 12 becomes negative, resulting in cutoff of the JFET 12 .
- One object of the present invention is to provide a CMOS compatible circuit for driving a depletion-type JFET.
- Another object of the present invention is to provide a circuit for driving a depletion-type JFET by which only a small gate-source current is needed to turn on the depletion-type JFET.
- Yet another object of the present invention is to provide a circuit for driving a depletion-type JFET which can be integrated on a single chip with the depletion-type JFET to be a power switch apparatus.
- a capacitor is connected between a control signal and a gate of the N-channel depletion-type JFET, a switch is connected between the gate and a source of the N-channel depletion-type JFET, which is controlled by the control signal, and a resistor is connected between the control signal and the switch for limiting the current of the switch.
- the control signal is at a high level
- the switch is turned on, such that the voltage difference between the gate and source of the N-channel depletion-type JFET is zero, thereby turning on the N-channel depletion-type JFET.
- the control signal is switched to a low voltage, the switch is turned off, such that the voltage difference between the gate and source of the N-channel depletion-type JFET becomes negative, thereby turning off the N-channel depletion JFET.
- a circuit for driving a P-channel depletion-type JFET comprises a capacitor connected between a control signal and a gate of the P-channel depletion-type JFET, a switch connected between the gate and a source of the P-channel depletion-type JFET, which is controlled by the control signal, and a resistor connected between the control signal and the switch for limiting the current of the switch.
- the control signal is at a high level
- the switch is turned off, such that the voltage difference between the gate and source of the P-channel depletion-type JFET is positive, thereby turning off the P-channel depletion-type JFET.
- the control signal is switched to a low voltage, the switch is turned on, such that the voltage difference between the gate and source of the P-channel depletion-type JFET achieves to zero, thereby turning on the P-channel depletion-type JFET.
- the driving circuits of the present invention when the N-channel or P-channel depletion-type JFET is turned on, the switch is also turned on, and the switch is not a power device, so that the gate-source current of the N-channel or P-channel depletion-type JFET is dramatically reduced.
- the driving circuit of the present invention can be integrated with the driven depletion-type JFET on a single chip to become a new power switch apparatus which can be directly driven by the driver for MOSFET.
- the depletion-type JFET and the switch can be manufactured on a chip by a same semiconductor process, and the capacitor and resistor can be also integrated on the chip.
- FIG. 1 shows a conventional circuit for driving an N-channel depletion-type JFET
- FIG. 2 shows a circuit for driving an N-channel JFET according to the present invention
- FIG. 3 shows a circuit for driving a P-channel JFET according to the present invention
- FIG. 4 shows a first embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET;
- FIG. 5 shows a second embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET;
- FIG. 6 shows a third embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET;
- FIG. 7 shows a fourth embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET;
- FIG. 8 shows a fifth embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET;
- FIG. 9 shows a sixth embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- FIG. 10 shows a driving circuit of the present invention applied in a synchronous buck converter.
- FIG. 2 shows a circuit for driving an N-channel JFET according to the present invention.
- a capacitor 302 is connected between a control signal V I and a gate G of an N-channel depletion-type JFET 32
- an N-channel enhancement-type JFET 304 is connected between the gate G and a source S of the N-channel depletion-type JFET 32 as a switch and controlled by the control signal V I
- a resistor 305 is connected between the control signal V I and a gate of the N-channel enhancement-type JFET 304 to limit the gate-source current of the N-channel enhancement-type JFET 304 .
- V IS V C +V GS , EQ-6 where V GS is the voltage difference between the gate G and source S of the N-channel depletion-type JFET 32 and V C is the voltage drop across the capacitor 302 .
- V I the control signal
- V I the control signal
- V I the control signal
- V GS the voltage difference between the gate G and source S of the N-channel depletion-type JFET 32
- V GS 0
- the voltage difference V IS between the input 306 and source S of the N-channel depletion-type JFET 32 equals to the control signal V I .
- the voltage drop V C equals to the control signal V I which is 3V.
- FIG. 3 shows a circuit for driving a P-channel JFET according to the present invention.
- a capacitor 402 is connected between a control signal V I and a gate G of a P-channel depletion-type JFET 42
- a P-channel enhancement-type JFET 404 is connected between the gate G and source S of the P-channel depletion-type JFET 42 as a switch and controlled by the control signal V I
- a resistor 405 is connected between the control signal V I and the gate of the P-channel enhancement-type JFET 404 to limit the gate-source current of the P-channel enhancement-type JFET 404 .
- V GS voltage difference between the gate G and source S of the P-channel depletion-type JFET 42 and V C is the voltage drop across the capacitor 402 .
- the power source supplied voltage V CC connected to the source S of the P-channel depletion-type JFET 42 is 5V
- the voltage difference V IS between the input 406 and the source S of the P-channel depletion-type JFET 42 is ⁇ 3V
- Either the N-channel enhancement-type JFET 302 or the P-channel enhancement-type JFET 402 in the aforementioned embodiments can be replaced with other switch devices.
- FIG. 4 shows a first embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- the aforementioned circuit 30 and N-channel depletion-type JFET 32 are integrated on a single chip, with the drain pin D of the apparatus 50 connected to the drain of the N-channel depletion-type JFET 32 , the source pin S of the apparatus 50 connected to the source of the N-channel depletion-type JFET 32 , the gate pin G of the apparatus 50 connected to the gate of the N-channel depletion-type JFET 32 , and the control input pin V I connected to the capacitor 302 and resistor 305 , as shown in FIG. 4 .
- the N-channel depletion-type JFET 32 and N-channel enhancement-type JFET 304 can be manufactured on the chip by the same semiconductor process, and the capacitor 302 and resistor 305 are also integrated on the chip.
- FIG. 5 shows a second embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- a power switch apparatus 52 the aforementioned circuit 40 and P-channel depletion-type JFET 42 are integrated on a single chip, with the drain pin D of the power switch apparatus 52 connected to the drain of the P-channel depletion-type JFET 42 , the source pin S of the power switch apparatus 52 connected to the source of the P-channel depletion-type JFET 42 , the gate pin G of the power switch apparatus 52 connected to the gate of the P-channel depletion-type JFET 42 , and the control input pin V I of the power switch apparatus 52 connected to the capacitor 402 and resistor 405 , as shown in FIG. 5 .
- the P-channel depletion-type JFET 42 and P-channel enhancement-type JFET 404 can be manufactured on the chip by the same semiconductor process, and the capacitor 402 and resistor 405 are also integrated on the chip.
- FIG. 6 shows a third embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- the N-channel depletion-type JFET 32 and N-channel enhancement-type JFET 304 are integrated on a single chip, with the drain pin D of the power switch apparatus 54 connected to the drain of the N-channel depletion-type JFET 32 , the source pin S of the power switch apparatus 54 connected to the source of the N-channel depletion-type JFET 32 , the gate pin G of the power switch apparatus 54 connected to the gate of the N-channel depletion-type JFET 32 , and the control input pin V I of the power switch apparatus 54 connected to the gate of the N-channel enhancement-type JFET 304 .
- the N-channel depletion-type JFET 32 and N-channel enhancement-type JFET 304 are manufactured on the chip by the same semiconductor process.
- FIG. 7 shows a fourth embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- the P-channel depletion-type JFET 42 and P-channel enhancement-type JFET 404 are integrated on a single chip, with the drain pin D of the power switch apparatus 56 connected to the drain of the P-channel depletion-type JFET 42 , the source pin S of the power switch apparatus 56 connected to the source of the P-channel depletion-type JFET 42 , the gate pin G of the power switch apparatus 56 connected to the gate of the P-channel depletion-type JFET 42 , and the control input pin V I of the power switch apparatus 56 connected to the gate of the P-channel enhancement-type JFET 404 .
- the P-channel depletion-type JFET 42 and P-channel enhancement-type JFET 404 are manufactured on the chip by the same semiconductor process.
- FIG. 8 shows a fifth embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- a power switch apparatus 58 the aforementioned circuit 30 , N-channel depletion-type JFET 32 , and a diode D 1 are integrated on a single chip.
- the diode D 1 is connected between the source and drain of the N-channel depletion-type JFET 32 , such that a conductive loop is still provided when the N-channel depletion-type JFET 32 is turned off.
- the power switch apparatus 58 has its drain pin D connected to the drain of the N-channel depletion-type JFET 32 , source pin S connected to the source of the N-channel depletion-type JFET 32 , gate pin G connected to the gate of the N-channel depletion-type JFET 32 , and control input pin V I connected to the capacitor 302 and resistor 305 .
- the N-channel depletion-type JFET 32 and N-channel enhancement-type JFET 304 are manufactured on the chip by the same semiconductor process, and the capacitor 302 , resistor 305 , and diode D 1 are also integrated on the chip.
- FIG. 9 shows a sixth embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET.
- a power switch apparatus 60 the N-channel depletion-type JFET 32 , N-channel enhancement-type JFET 304 , and a diode D 1 are integrated on a single chip.
- the diode D 1 is connected between the source and drain of the N-channel depletion-type JFET 32 , such that a conductive loop is still provided when the N-channel depletion-type JFET 32 is turned off.
- the power switch apparatus 60 has its drain pin D connected to the drain of the N-channel depletion-type JFET 32 , source pin S connected to the source of the N-channel depletion-type JFET 32 , gate pin G connected to the gate of the N-channel depletion-type JFET 32 , and control input pin V I connected to the gate of the N-channel enhancement-type JFET 304 .
- the N-channel depletion-type JFET 32 and N-channel enhancement-type JFET 304 are manufactured on the chip by the same semiconductor process, and the diode D 1 is also integrated on the chip.
- the aforementioned six power switch apparatus 50 – 60 can be modified, for example by replacing the N-channel enhancement-type JFETs 304 and 404 with other switch devices.
- FIG. 10 shows the power switch apparatus 60 applied in a synchronous buck converter.
- a converter 70 two drivers 702 and 704 alternatively switch a MOSFET 706 and the power switch apparatus 60 to generate an output voltage Vout to supply to a load R L .
- a resistor R 1 is inserted between the control signal V I and the control input pin of the power switch apparatus 60 to serve as a current limiter for the N-channel enhancement-type JFET 304 .
- the power switch apparatus 60 is compatible to conventional CMOS driver.
- the power switch apparatus 60 can be directly driven by the driver of a MOSFET.
- those skilled in the art should understand that the other embodiments that have illustrated and their modifications and variations are also compatible to conventional CMOS driver.
Landscapes
- Electronic Switches (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
A circuit for driving a depletion-type JFET comprises a capacitor connected between the gate of the depletion-type JFET and a control signal, and a switch that is controlled by the control signal connected between the gate and source of the depletion-type JFET. The depletion-type JFET is turned on when the control signal is at a high voltage, and is turned off when the control signal is switched to a low voltage. The circuit and its driven depletion-type JFET can be integrated on a single chip to be a new power switch apparatus.
Description
The present invention relates generally to a power junction field-effect transistor (JFET) and, more specifically, to a circuit for driving a depletion-type JFET.
FET and bipolar junction transistor (BJT) are well-known electronic devices and have been used for various applications. Even though FET is similar to BJT in its characteristics and functions, it is much simpler and better for use than BJT, because of the non-zero base current and low input impedance inherently possessed by BJT which will result in disadvantages when it is used for circuit applications. There are two typical FETs, i.e., metal-oxide-semiconductor (MOS) FET and JFET. Unfortunately, the well-developed circuits for driving MOSFETs are not applicable for driving JFETs for their different gate driving mechanisms. Therefore, modification is proposed for example by Lovoltech in which parallel resistor and capacitor network is introduced into the driver circuit prior to the gate of the driven JFET in addition to PWM control circuit, see http://www.lovoltech.com/pdf/an100.pdf and http://www.lovoltech.com/pdf/AN 101-112003.pdf.
For more detail, the art proposed by Lovoltech is shown in FIG. 1 , in which a parallel resistor and capacitor network 10 for driving an N-channel depletion-type JFET 12 comprises a capacitor 102 connected between a control input 106 and the gate G of the JFET 12, and a resistor 104 connected to the capacitor 102 in parallel. Voltage VI is applied to the circuit 10 on the control input 106, and thus, the voltage difference between the control input 106 of the circuit 10 and the source of the JFET 12 is
V IS =V I −V S, EQ-1
where VS is the voltage on the source of theJFET 12. In this illustration, the source of the JFET 12 is grounded, and it is therefore obtained
VIS=VI. EQ-2
Furthermore, according to Kirchhoff's voltage law, it is obvious that
V IS =V C +V GS, EQ-3
where VC is the voltage drop across thecapacitor 102 and VGS is the gate-source voltage of the JFET 12. In combination of the equation EQ-2 with the equation EQ-3, it leads to
V GS =V I −V C. EQ-4
When the voltage VI is at a high level, the gate-source voltage VGS of theJFET 12 is positive, since the charged voltage VC of the capacitor 102 cannot be higher than VI. As a result, the JFET 12 is conductive. When the voltage VI is switched to a level lower than VC, the gate-source voltage VGS of the JFET 12 becomes negative, resulting in cutoff of the JFET 12.
V IS =V I −V S, EQ-1
where VS is the voltage on the source of the
VIS=VI. EQ-2
Furthermore, according to Kirchhoff's voltage law, it is obvious that
V IS =V C +V GS, EQ-3
where VC is the voltage drop across the
V GS =V I −V C. EQ-4
When the voltage VI is at a high level, the gate-source voltage VGS of the
However, when such apparatus 10 turns on the N-channel depletion-type JFET 12, the gate of the JFET 12 is forward biased and therefore, a very high current is conductive between its gate and source, which makes it not suitable for low power applications such as portable apparatus.
Accordingly, it is desired a circuit for driving a depletion-type JFET without high gate-source current generated when the depletion-type JFET is turned on.
One object of the present invention is to provide a CMOS compatible circuit for driving a depletion-type JFET.
Another object of the present invention is to provide a circuit for driving a depletion-type JFET by which only a small gate-source current is needed to turn on the depletion-type JFET.
Yet another object of the present invention is to provide a circuit for driving a depletion-type JFET which can be integrated on a single chip with the depletion-type JFET to be a power switch apparatus.
In a circuit for driving an N-channel depletion-type JFET, according to the present invention, a capacitor is connected between a control signal and a gate of the N-channel depletion-type JFET, a switch is connected between the gate and a source of the N-channel depletion-type JFET, which is controlled by the control signal, and a resistor is connected between the control signal and the switch for limiting the current of the switch. When the control signal is at a high level, the switch is turned on, such that the voltage difference between the gate and source of the N-channel depletion-type JFET is zero, thereby turning on the N-channel depletion-type JFET. When the control signal is switched to a low voltage, the switch is turned off, such that the voltage difference between the gate and source of the N-channel depletion-type JFET becomes negative, thereby turning off the N-channel depletion JFET.
In another embodiment, a circuit for driving a P-channel depletion-type JFET comprises a capacitor connected between a control signal and a gate of the P-channel depletion-type JFET, a switch connected between the gate and a source of the P-channel depletion-type JFET, which is controlled by the control signal, and a resistor connected between the control signal and the switch for limiting the current of the switch. When the control signal is at a high level, the switch is turned off, such that the voltage difference between the gate and source of the P-channel depletion-type JFET is positive, thereby turning off the P-channel depletion-type JFET. When the control signal is switched to a low voltage, the switch is turned on, such that the voltage difference between the gate and source of the P-channel depletion-type JFET achieves to zero, thereby turning on the P-channel depletion-type JFET.
In the driving circuits of the present invention, when the N-channel or P-channel depletion-type JFET is turned on, the switch is also turned on, and the switch is not a power device, so that the gate-source current of the N-channel or P-channel depletion-type JFET is dramatically reduced. In addition, the driving circuit of the present invention can be integrated with the driven depletion-type JFET on a single chip to become a new power switch apparatus which can be directly driven by the driver for MOSFET. Moreover, the depletion-type JFET and the switch can be manufactured on a chip by a same semiconductor process, and the capacitor and resistor can be also integrated on the chip.
These and other objects, features and advantages of the present invention will become apparent to those skilled in the art upon consideration of the following description of the preferred embodiments of the present invention taken in conjunction with the accompanying drawings, in which:
V IS =V I −V S, EQ-5
where VS is the voltage on the source S of the N-channel depletion-
V IS =V C +V GS, EQ-6
where VGS is the voltage difference between the gate G and source S of the N-channel depletion-
0V=3V+V GS, EQ-7
and thus, at this moment, the voltage difference between the gate G and source S of the N-channel depletion-
V GS=−3V.
As a result, the N-channel depletion-
V IS =V I −V S =V I −V CC, EQ-8
where VS is the voltage on the source S of the P-channel depletion-
VIS +V C =V GS, EQ-9
where VGS is voltage difference between the gate G and source S of the P-channel depletion-
−3V+V C=0V. EQ-10
Therefore, the charging voltage is
VC=3V.
When the control signal VI is switched to a high voltage, for example 5V, the P-channel enhancement-
0V+3V=V GS, EQ-11
and thus, at this moment, the voltage difference between the gate G and source S of the P-channel depletion-
VGS=3V.
As a result, the P-channel depletion-
Either the N-channel enhancement-type JFET 302 or the P-channel enhancement-type JFET 402 in the aforementioned embodiments can be replaced with other switch devices.
Furthermore, the driving circuit of the present invention and the driven JFET can be integrated on a single chip, such that a new device is obtained for a power switch apparatus. FIG. 4 shows a first embodiment power switch apparatus by integrating a driving circuit of the present invention with the driven depletion-type JFET. In a power switch apparatus 50, the aforementioned circuit 30 and N-channel depletion-type JFET 32 are integrated on a single chip, with the drain pin D of the apparatus 50 connected to the drain of the N-channel depletion-type JFET 32, the source pin S of the apparatus 50 connected to the source of the N-channel depletion-type JFET 32, the gate pin G of the apparatus 50 connected to the gate of the N-channel depletion-type JFET 32, and the control input pin VI connected to the capacitor 302 and resistor 305, as shown in FIG. 4 . The N-channel depletion-type JFET 32 and N-channel enhancement-type JFET 304 can be manufactured on the chip by the same semiconductor process, and the capacitor 302 and resistor 305 are also integrated on the chip.
The aforementioned six power switch apparatus 50–60 can be modified, for example by replacing the N-channel enhancement- type JFETs 304 and 404 with other switch devices.
While the present invention has been described in conjunction with preferred embodiments thereof, it is evident that many alternatives, modifications and variations will be apparent to those skilled in the art. Accordingly, it is intended to embrace all such alternatives, modifications and variations that fall within the spirit and scope thereof as set forth in the appended claims.
Claims (38)
1. A circuit for driving a depletion-type JFET having a drain, a source and a gate, said circuit comprising:
a capacitor connected between said gate and a control signal; and
a switch connected between said gate and source, said switch having a control input for receiving said control signal, wherein said switch comprises an N-channel enhancement-type JFET.
2. A circuit for driving a depletion-type JFET having a drain, a source and a gate, said circuit comprising:
a capacitor connected between said gate and a control signal; and
a switch connected between said gate and source, said switch having a control input for receiving said control signal, wherein said switch comprises a P-channel enhancement-type JFET.
3. The circuit of claim 1 , wherein said capacitor and switch are integrated with said depletion-type JFET in a single chip.
4. The circuit of claim 3 , wherein said capacitor and switch are manufactured by a semiconductor process of manufacturing said depletion-type JFET.
5. The circuit of claim 1 , wherein said switch is integrated with said depletion-type JFET in a single chip.
6. The circuit of claim 5 , wherein said switch is manufactured by a semiconductor process of manufacturing said depletion-type JFET.
7. A circuit for driving a depletion-type JFET having a drain, a source and a gate, said circuit comprising:
a capacitor connected between said gate and a control signal;
a switch connected between said gate and source, said switch having a control input for receiving said control signal, said circuit generating at an output thereof a gate driving voltage turning ON and OFF said depletion-type JFET when coupled between the gate and the source thereof; and
a current limiter connected between said control input and control signal.
8. The circuit of claim 7 , wherein said capacitor, switch and current limiter are integrated with said depletion-type JFET in a single chip.
9. The circuit of claim 8 , wherein said capacitor, switch and current limiter are manufactured by a semiconductor process of manufacturing said depletion-type JFET.
10. A power switch apparatus comprising:
a depletion-type JFET having a drain, a source and a gate; and
a switch connected between said gate and source, said switch having a control input for receiving a control signal, said switch outputting at an output thereof a gate driving voltage turning ON and OFF said depletion-type JFET when coupled between the gate and the source thereof, said switch including an N-channel enhancement-type JFET.
11. The power switch apparatus of claim 10 , wherein said depletion-type JFET is an N-channel JFET.
12. The power switch apparatus of claim 10 , wherein said depletion-type JFET is a P-channel JFET.
13. A power switch apparatus comprising:
a depletion-type JFET having a drain, a source and a gate; and
a switch connected between said gate and source, said switch having a control input for receiving a control signal, said switch outputting at an output thereof a gate driving voltage turning ON and OFF said depletion-type JFET when coupled between the gate and the source thereof, said switch including a P-channel enhancement-type JFET.
14. The power switch apparatus of claim 10 , wherein said depletion-type JFET and switch are integrated in a single chip.
15. The power switch apparatus of claim 14 , wherein said depletion-type JFET and switch are manufactured by a semiconductor process.
16. The power switch apparatus of claim 10 , further comprising a capacitor connected between said gate and control signal.
17. The power switch apparatus of claim 16 , wherein said depletion-type JFET, switch and capacitor are integrated in a single chip.
18. The power switch apparatus of claim 17 , wherein said depletion-type JFET, switch and capacitor are manufactured by a semiconductor process.
19. The power switch apparatus of claim 10 , further comprising a diode connected between said drain and source.
20. The power switch apparatus of claim 19 , wherein said depletion-type JFET, switch and diode are integrated in a single chip.
21. The power switch apparatus of claim 20 , wherein said depletion-type JFET, switch and diode are manufactured by a semiconductor process.
22. A power switch apparatus comprising:
a depletion-type JFET having a drain, a source and a gate;
a switch connected between said gate and source, said switch having a control input for receiving a control signal, said switch outputting at an output thereof a gate driving voltage turning ON and OFF said depletion-type JFET when coupled between the gate and the source thereof; and
a current limiter connected between said control input and control signal.
23. The power switch apparatus of claim 22 , wherein said depletion-type JFET, switch and current limiter are integrated in a single chip.
24. The power switch apparatus of claim 23 , wherein said depletion-type JFET, switch and current limiter are manufactured by a semiconductor process.
25. The circuit of claim 2 , wherein said capacitor and switch are integrated with said depletion-type JFET in a single chip.
26. The circuit of claim 25 , wherein said capacitor and switch are manufactured by a semiconductor process of manufacturing said depletion-type JFET.
27. The circuit of claim 2 , wherein said switch is integrated with said depletion-type JFET in a single chip.
28. The circuit of claim 27 , wherein said switch is manufactured by a semiconductor process of manufacturing said depletion-type JFET.
29. The power switch apparatus of claim 13 , wherein said depletion-type JFET is an N-channel JFET.
30. The power switch apparatus of claim 13 , wherein said depletion-type JFET is a P-channel JFET.
31. The power switch apparatus of claim 13 , wherein said depletion-type JFET and switch are integrated in a single chip.
32. The power switch apparatus of claim 31 , wherein said depletion-type JFET and switch are manufactured by a semiconductor process.
33. The power switch apparatus of claim 13 , further comprising a capacitor connected between said gate and control signal.
34. The power switch apparatus of claim 33 , wherein said depletion-type JFET, switch and capacitor are integrated in a single chip.
35. The power switch apparatus of claim 34 , wherein said depletion-type JEET, switch and capacitor are manufactured by a semiconductor process.
36. The power switch apparatus of claim 13 , further comprising a diode connected between said drain and source.
37. The power switch apparatus of claim 36 , wherein said depletion-type JFET, switch and diode are integrated in a single chip.
38. The power switch apparatus of claim 37 , wherein said depletion-type JFET, switch and diode are manufactured by a semiconductor process.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW093108205 | 2004-03-25 | ||
TW093108205A TWI224869B (en) | 2004-03-25 | 2004-03-25 | Apparatus for driving depletion type junction field effect transistor |
Publications (2)
Publication Number | Publication Date |
---|---|
US20050212583A1 US20050212583A1 (en) | 2005-09-29 |
US7116153B2 true US7116153B2 (en) | 2006-10-03 |
Family
ID=34570498
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/842,571 Expired - Fee Related US7116153B2 (en) | 2004-03-25 | 2004-05-11 | Circuit for driving a depletion-type JFET |
Country Status (2)
Country | Link |
---|---|
US (1) | US7116153B2 (en) |
TW (1) | TWI224869B (en) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060208788A1 (en) * | 2005-03-18 | 2006-09-21 | Alpha & Omega Semiconductor, Ltd. | MOSFET for synchronous rectification |
US20060214722A1 (en) * | 2005-03-28 | 2006-09-28 | Masaya Hirose | Power switching circuit |
US7215174B1 (en) * | 2005-12-07 | 2007-05-08 | Summer Steven E | Method and apparatus for implementing a radiation hardened N-channel transistor with the use of non-radiation hardened transistors |
US20080265952A1 (en) * | 2005-11-21 | 2008-10-30 | Texas Instruments Deutschland G.M.B.H. | Gate Driver Circuit for Power Transistor |
US20120306545A1 (en) * | 2011-05-31 | 2012-12-06 | Sanken Electric Co., Ltd. | Gate driver |
US20130015886A1 (en) * | 2011-07-12 | 2013-01-17 | Brant T. Johnson | High Voltage, High temperature Semiconductor Driver for Switching Power semiconductor devices |
TWI411205B (en) * | 2010-12-10 | 2013-10-01 | Richtek Technology Corp | Current sense circuit for a switch mode power supply |
US20140111246A1 (en) * | 2012-10-19 | 2014-04-24 | Cree, Inc. | Increased transition speed switching device driver |
US8779807B2 (en) | 2012-08-27 | 2014-07-15 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method, system, and apparatus for efficiently driving a transistor with a booster in voltage supply |
US9344077B2 (en) | 2012-04-04 | 2016-05-17 | Cree, Inc. | High voltage driver |
US9917578B2 (en) * | 2016-02-19 | 2018-03-13 | Infineon Technologies Austria Ag | Active gate-source capacitance clamp for normally-off HEMT |
US20210288640A1 (en) * | 2020-03-11 | 2021-09-16 | Hitachi Power Semiconductor Device, Ltd. | Semiconductor Device Signal Transmission Circuit for Drive-Control, Method of Controlling Semiconductor Device Signal Transmission Circuit for Drive-Control, Semiconductor Device, Power Conversion Device, and Electric System for Railway Vehicle |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1935026A1 (en) | 2005-10-12 | 2008-06-25 | Acco | Insulated gate field-effet transistor having a dummy gate |
US7746156B1 (en) * | 2006-04-14 | 2010-06-29 | Qspeed Semiconductor Inc. | Circuit and method for driving a junction field effect transistor |
US7969243B2 (en) * | 2009-04-22 | 2011-06-28 | Acco Semiconductor, Inc. | Electronic circuits including a MOSFET and a dual-gate JFET |
US9240402B2 (en) | 2008-02-13 | 2016-01-19 | Acco Semiconductor, Inc. | Electronic circuits including a MOSFET and a dual-gate JFET |
KR20120132643A (en) * | 2008-02-13 | 2012-12-06 | 아코 세미컨덕터, 인크 | High breakdown voltage double-gate semiconductor device |
US8928410B2 (en) | 2008-02-13 | 2015-01-06 | Acco Semiconductor, Inc. | Electronic circuits including a MOSFET and a dual-gate JFET |
CN102422537B (en) * | 2009-05-11 | 2014-11-26 | Pi公司 | Gate driver for enhancement mode and depletion mode wide bandgap semiconductor JFETs |
US7893754B1 (en) | 2009-10-02 | 2011-02-22 | Power Integrations, Inc. | Temperature independent reference circuit |
US8634218B2 (en) * | 2009-10-06 | 2014-01-21 | Power Integrations, Inc. | Monolithic AC/DC converter for generating DC supply voltage |
US8310845B2 (en) * | 2010-02-10 | 2012-11-13 | Power Integrations, Inc. | Power supply circuit with a control terminal for different functional modes of operation |
CN101807905B (en) * | 2010-02-11 | 2012-05-23 | 西安捷威半导体有限公司 | Drive circuit of deplete semiconductor switching element and drive method thereof |
EP2701294B1 (en) * | 2012-08-24 | 2017-11-08 | Dialog Semiconductor GmbH | Low current start up including power switch |
TWI504119B (en) * | 2013-03-22 | 2015-10-11 | Richtek Technology Corp | Apparatus and method for avoiding conduction of parasitic devices |
US9455621B2 (en) | 2013-08-28 | 2016-09-27 | Power Integrations, Inc. | Controller IC with zero-crossing detector and capacitor discharge switching element |
US9667154B2 (en) | 2015-09-18 | 2017-05-30 | Power Integrations, Inc. | Demand-controlled, low standby power linear shunt regulator |
US9602009B1 (en) | 2015-12-08 | 2017-03-21 | Power Integrations, Inc. | Low voltage, closed loop controlled energy storage circuit |
US9629218B1 (en) | 2015-12-28 | 2017-04-18 | Power Integrations, Inc. | Thermal protection for LED bleeder in fault condition |
TWI688192B (en) * | 2018-11-06 | 2020-03-11 | 新唐科技股份有限公司 | Control circuit and semiconductor structure thereof |
CN110380381A (en) * | 2019-08-09 | 2019-10-25 | 无锡启腾电子科技有限公司 | A kind of electrical fuse of multiple transmission modes |
JP7357562B2 (en) * | 2020-02-04 | 2023-10-06 | 日清紡マイクロデバイス株式会社 | high frequency switch circuit |
TWI726817B (en) * | 2020-09-24 | 2021-05-01 | 漢威光電股份有限公司 | Electrostatic discharge protection circuit |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5441771A (en) * | 1977-09-09 | 1979-04-03 | Seiko Instr & Electronics Ltd | Electronic watch |
JPS5854734A (en) * | 1981-09-28 | 1983-03-31 | Oki Electric Ind Co Ltd | Digital logical circuit |
US4668919A (en) * | 1986-02-19 | 1987-05-26 | Advanced Micro Devices, Inc. | High speed operational amplifier |
US5748019A (en) * | 1997-05-15 | 1998-05-05 | Vlsi Technology, Inc. | Output buffer driver with load compensation |
US6307223B1 (en) * | 1998-12-11 | 2001-10-23 | Lovoltech, Inc. | Complementary junction field effect transistors |
US6344768B1 (en) * | 2000-08-10 | 2002-02-05 | International Business Machines Corporation | Full-bridge DC-to-DC converter having an unipolar gate drive |
US6741099B1 (en) * | 2003-01-31 | 2004-05-25 | Power-One Limited | Transistor driver circuit |
US6753723B2 (en) * | 2002-04-03 | 2004-06-22 | International Rectifier Corporation | Synchronous buck converter with improved transient performance |
-
2004
- 2004-03-25 TW TW093108205A patent/TWI224869B/en not_active IP Right Cessation
- 2004-05-11 US US10/842,571 patent/US7116153B2/en not_active Expired - Fee Related
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5441771A (en) * | 1977-09-09 | 1979-04-03 | Seiko Instr & Electronics Ltd | Electronic watch |
JPS5854734A (en) * | 1981-09-28 | 1983-03-31 | Oki Electric Ind Co Ltd | Digital logical circuit |
US4668919A (en) * | 1986-02-19 | 1987-05-26 | Advanced Micro Devices, Inc. | High speed operational amplifier |
US5748019A (en) * | 1997-05-15 | 1998-05-05 | Vlsi Technology, Inc. | Output buffer driver with load compensation |
US6307223B1 (en) * | 1998-12-11 | 2001-10-23 | Lovoltech, Inc. | Complementary junction field effect transistors |
US6344768B1 (en) * | 2000-08-10 | 2002-02-05 | International Business Machines Corporation | Full-bridge DC-to-DC converter having an unipolar gate drive |
US6753723B2 (en) * | 2002-04-03 | 2004-06-22 | International Rectifier Corporation | Synchronous buck converter with improved transient performance |
US6741099B1 (en) * | 2003-01-31 | 2004-05-25 | Power-One Limited | Transistor driver circuit |
Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080309382A1 (en) * | 2005-03-18 | 2008-12-18 | Alpha & Omega Semiconductor, Ltd. | MOSFET for synchronous rectification |
US7764105B2 (en) * | 2005-03-18 | 2010-07-27 | Alpha & Omega Semiconductor, Ltd | MOSFET for synchronous rectification |
US7221195B2 (en) * | 2005-03-18 | 2007-05-22 | Alpha & Omega Semiconductor, Ltd. | MOSFET for synchronous rectification |
US20070221972A1 (en) * | 2005-03-18 | 2007-09-27 | Alpha & Omega Semiconductor, Ltd. | MOSFET for synchronous rectification |
US20060208788A1 (en) * | 2005-03-18 | 2006-09-21 | Alpha & Omega Semiconductor, Ltd. | MOSFET for synchronous rectification |
US7378884B2 (en) * | 2005-03-18 | 2008-05-27 | Alpha & Omega Semiconductor, Ltd. | MOSFET for synchronous rectification |
US20060214722A1 (en) * | 2005-03-28 | 2006-09-28 | Masaya Hirose | Power switching circuit |
US7423472B2 (en) * | 2005-03-28 | 2008-09-09 | Matsushita Electric Industrial Co., Ltd. | Power switching circuit |
US7560973B2 (en) * | 2005-11-21 | 2009-07-14 | Texas Instruments Deutschland Gmbh | Gate driver circuit for power transistor |
US20080265952A1 (en) * | 2005-11-21 | 2008-10-30 | Texas Instruments Deutschland G.M.B.H. | Gate Driver Circuit for Power Transistor |
WO2007067576A3 (en) * | 2005-12-07 | 2007-12-06 | Steven Summer | A method and apparatus for implementing a radiation hardened n-channel transistor with the use of non-radiation hardened transistors |
WO2007067576A2 (en) * | 2005-12-07 | 2007-06-14 | Steven Summer | A method and apparatus for implementing a radiation hardened n-channel transistor with the use of non-radiation hardened transistors |
US7215174B1 (en) * | 2005-12-07 | 2007-05-08 | Summer Steven E | Method and apparatus for implementing a radiation hardened N-channel transistor with the use of non-radiation hardened transistors |
TWI411205B (en) * | 2010-12-10 | 2013-10-01 | Richtek Technology Corp | Current sense circuit for a switch mode power supply |
US20120306545A1 (en) * | 2011-05-31 | 2012-12-06 | Sanken Electric Co., Ltd. | Gate driver |
US8558587B2 (en) * | 2011-05-31 | 2013-10-15 | Sanken Electric Co., Ltd. | Gate driver |
US20130015886A1 (en) * | 2011-07-12 | 2013-01-17 | Brant T. Johnson | High Voltage, High temperature Semiconductor Driver for Switching Power semiconductor devices |
US9344077B2 (en) | 2012-04-04 | 2016-05-17 | Cree, Inc. | High voltage driver |
US9054704B2 (en) | 2012-08-27 | 2015-06-09 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method, system, and apparatus for efficiently driving a transistor with a booster in voltage supply |
US8779807B2 (en) | 2012-08-27 | 2014-07-15 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Method, system, and apparatus for efficiently driving a transistor with a booster in voltage supply |
US8963576B2 (en) * | 2012-10-19 | 2015-02-24 | Cree, Inc. | Increased transition speed switching device driver |
US20140111246A1 (en) * | 2012-10-19 | 2014-04-24 | Cree, Inc. | Increased transition speed switching device driver |
US9917578B2 (en) * | 2016-02-19 | 2018-03-13 | Infineon Technologies Austria Ag | Active gate-source capacitance clamp for normally-off HEMT |
US10326441B2 (en) | 2016-02-19 | 2019-06-18 | Infineon Technologies Austria Ag | Active gate-source capacitance clamp for normally-off HEMT |
US20210288640A1 (en) * | 2020-03-11 | 2021-09-16 | Hitachi Power Semiconductor Device, Ltd. | Semiconductor Device Signal Transmission Circuit for Drive-Control, Method of Controlling Semiconductor Device Signal Transmission Circuit for Drive-Control, Semiconductor Device, Power Conversion Device, and Electric System for Railway Vehicle |
US11539361B2 (en) * | 2020-03-11 | 2022-12-27 | Hitachi Power Semiconductor Device, Ltd. | Semiconductor device signal transmission circuit for drive-control, method of controlling semiconductor device signal transmission circuit for drive-control, semiconductor device, power conversion device, and electric system for railway vehicle |
Also Published As
Publication number | Publication date |
---|---|
TW200532926A (en) | 2005-10-01 |
TWI224869B (en) | 2004-12-01 |
US20050212583A1 (en) | 2005-09-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7116153B2 (en) | Circuit for driving a depletion-type JFET | |
US7233191B2 (en) | JFET driver circuit and JFET driving method | |
US7728529B2 (en) | LED driver using a depletion mode transistor to serve as a current source | |
US6812782B2 (en) | Switch mode converter that allows 100% duty cycle on gate driver | |
US7911192B2 (en) | High voltage power regulation using two power switches with low voltage transistors | |
US7224204B2 (en) | Method and circuit for driving a gate of a MOS transistor negative | |
US7227343B2 (en) | Linear voltage regulator with selectable output voltage | |
US5959442A (en) | Buck converter | |
US10379564B2 (en) | Constant voltage generating circuit | |
US20090315609A1 (en) | Level shift circuit and power semiconductor device | |
US11209464B2 (en) | Current detection circuit and power converter | |
US10666137B2 (en) | Method and circuitry for sensing and controlling a current | |
US20230361115A1 (en) | Transistor module and its associated semiconductor module | |
US9595967B2 (en) | Level shift circuit and driver circuit | |
JP7032154B2 (en) | Switching circuits, semiconductor devices, DC / DC converters | |
US7692479B2 (en) | Semiconductor integrated circuit device including charge pump circuit capable of suppressing noise | |
US7439771B2 (en) | Integrated interface circuitry for integrated VRM power field effect transistors | |
US20240048048A1 (en) | Boost charge circuit for dc/dc converter | |
KR20070026612A (en) | Gate driver output stage with bias circuit for high and wide operating voltage range | |
US7053691B2 (en) | Electrical circuit for selecting a desired power source | |
US10498337B2 (en) | Level shift device and IC device | |
JP6846280B2 (en) | Switch circuit | |
US11239750B2 (en) | Charge pump circuits | |
KR101462749B1 (en) | Power supply circuit with positive and negative feedback loops | |
JP5633234B2 (en) | Semiconductor device drive circuit |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: RICHTEK TECHNOLOGY CORP., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:PAI, CHUNG-LUNG;REEL/FRAME:015322/0283 Effective date: 20040503 |
|
FPAY | Fee payment |
Year of fee payment: 4 |
|
REMI | Maintenance fee reminder mailed | ||
LAPS | Lapse for failure to pay maintenance fees | ||
STCH | Information on status: patent discontinuation |
Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362 |
|
FP | Lapsed due to failure to pay maintenance fee |
Effective date: 20141003 |