US5963338A - Method and apparatus for calibrating multi-element sensors - Google Patents

Method and apparatus for calibrating multi-element sensors Download PDF

Info

Publication number
US5963338A
US5963338A US08/886,703 US88670397A US5963338A US 5963338 A US5963338 A US 5963338A US 88670397 A US88670397 A US 88670397A US 5963338 A US5963338 A US 5963338A
Authority
US
United States
Prior art keywords
photosensors
signals
transfer gate
register means
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
US08/886,703
Inventor
Hisashi Harada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to US08/886,703 priority Critical patent/US5963338A/en
Application granted granted Critical
Publication of US5963338A publication Critical patent/US5963338A/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/672Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction between adjacent sensors or output registers for reading a single image
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H04N25/671Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
    • H04N25/673Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/713Transfer or readout registers; Split readout registers or multiple readout registers

Definitions

  • the present invention relates to a method and apparatus for calibrating high-resolution multi-element sensors which are mounted in artificial satellites or the like for earth observation, or in facsimile machines or the like for detecting optical images, etc.
  • Multi-element sensing apparatuses mounted in facsimile machines, artificial satellites, etc. perform electric calibration at regular time intervals to keep track of the operational state of electric circuits throughout the equipment while detecting image signals.
  • Multi-element sensing apparatuses of the prior art are designed to receive image signals when the subject being photographed is well lit, and to perform electric calibration while the subject being photographed is poorly lit.
  • FIG. 7 schematically shows such image signals in time sequence, including outputted image signals 16, outputted electric calibration signals 18, and outputted zero (or offset)-level signals 17. As illustrated therein, all the image signals 16, the electric calibration signals 18 and the zero (or offset)-level signals 17 are outputted to the same-numbered pixels.
  • FIG. 1 is a circuit diagram illustrative of an embodiment of a multi-element sensor-calibrating apparatus according to the present invention
  • FIG. 2 is a flow chart illustrative of a method for calibrating multi-element sensors according to the present invention
  • FIG. 3 is a timing waveform chart of the transfer gate and the input drain
  • FIG. 4 is a chart of waveform of output from the multi-element sensing apparatus when the temperature and other parameters are stable
  • FIG. 5 is a chart of waveform of output from the multi-element sensing apparatus when outputted image signals have been changed due to change in the temperature and other parameters
  • FIG. 6 is a view of waveform of outputted image signals after compensation for changes due to the temperature and others.
  • FIGS. 7 is a view illustrative of image signals, calibration signals and offset level signals in time sequence, from a multi-element sensing apparatus of the prior art.
  • the method of calibrating multi-element sensors comprises: first outputting image signals which have been subjected to photoelectric conversion to a register for temporary storage, during which time an input drain is OFF; outputting the image signals to an amplifier circuit through ON/OFF operations of the register after the image signals have been outputted to the register; inputting electric calibration signals through ON/OFF control of the input drain while the image signals are being outputted to the amplifier circuit from the register when the transfer gate is OFF; and adjusting timing of respective driving pulses through a CDD-driving circuit so that zero-level signals and the electric calibration signals are outputted after the image signals.
  • a change in the sensitivity of the image signals is detected and calibrated in an accurate and continuous manner, with reference to the zero-level signals and the electric calibration signals.
  • An apparatus for use in the method comprises:
  • a photoreceptor section composed of an array of a plurality of photosensors; a CCD register for temporarily storing image signals which have been subjected to photoelectric conversion in the photoreceptor section; a transfer gate for ON/OFF connection of charge from the photoreceptor section to the register; an input drain provided at one end of the register for inputting electric calibration signals to the register; an amplifier circuit for amplifying weak signals; a multiplexer circuit for synthesizing signals from a plurality of amplifier circuits of the same type as the aforementioned amplifier circuit; an A/D conversion circuit for converting signals inputted through the multiplexer circuit into digital signals; a memory circuit for storing the digital signals; a pulse-generating circuit connected to the A/D conversion circuit; a CCD-driving circuit connected to the pulse-generating circuit, capable of adjusting timing of respective driving pulses so that zero-level signals and the electric calibration signals are outputted after the image signals; and a circuit for generating the electric calibration signals which are outputted via the register.
  • the input drain When image signals are being inputted to the register, the input drain is normally placed in the OFF position to prevent electric calibration signals from entering the register via the input drain.
  • the calibration signals are inputted when the input drain, which undergoes repeated ON/OFF operations as illustrated in FIG. 3, is ON. During this period of time, the transfer gate is placed in the OFF position to ensure that no image signals enter the register through the transfer gate.
  • one lineful of output from the register includes the image signals and the zero (or offset)-level signals and the electric calibration signals at an even level, as illustrated in FIG. 4.
  • FIG. 1 showing an embodiment of a multi-element sensor-calibrating apparatus according to the present invention
  • the embodiment comprises a photoreceptor section 1 composed of a plurality of photosensors, "n" photosensors numbered from “i” to “n” in the case shown here, transfer gates 2 and 3 arranged along the photoreceptor section 1, CCD registers 4 and 5 placed opposite to the photoreceptor section 1 across the transfer gates 2 and 3, and input drains 6 and 7 provided at one end of each registers.
  • a photoreceptor section 1 composed of a plurality of photosensors, "n" photosensors numbered from “i” to “n” in the case shown here
  • transfer gates 2 and 3 arranged along the photoreceptor section 1
  • CCD registers 4 and 5 placed opposite to the photoreceptor section 1 across the transfer gates 2 and 3
  • input drains 6 and 7 provided at one end of each registers.
  • the two sets which include the transfer gate 2, the register 4 and the input drain 6, and the transfer gate 3, the register 5 and the input drain 7, are arranged for odd-numbered photosensors and even-numbered photosensors in the photoreceptor section 1, respectively.
  • a CCD-driving circuit 13 which generates CCD-driving pulses for activating the transfer gates 2 and 3, and the registers 4 and 5.
  • signals which have undergone photoelectric conversion and been stored in the photoreceptor section 1 are transferred to the register 4 while the transfer gate 2 is ON, and are successively transferred to an amplifier circuit 8 in response to transfer clock signals from the CCD-driving circuit 13 after the transfer gate 2 has been switched to the OFF position.
  • the input drain 6 is switched from the OFF (low-level) state to ON/OFF control, and this triggers inputting of electric calibration signals through the input drain 6 which are then transferred to the amplifier circuit 8 successively in response to transfer clock signals.
  • the foregoing operation also applies to the combination of the transfer gate 3, the register 5, the input drain 7 and the amplifier circuit 9.
  • the amplifier circuits 8 and 9 amplify the weak signals.
  • the amplified signals of the odd-numbered and even-numbered photosensors delivered from the amplifier circuits 8 and 9 are then synthesized in a multiplexer circuit 10 and sent to an A/D conversion circuit 11 which converts the inputted synthesized signals into digital signals.
  • the digital signals are stored in a memory circuit 12.
  • a pulse-generating circuit 15 generates clocks for the A/D conversion circuit 12.
  • an electric calibration signal-generating circuit 14 which is connected to the input drains 6 and 7.
  • FIG. 3 illustrates timing waveforms of the transfer gate and the input drain according to the present invention.
  • the input drain When the transfer gate is ON (at the high level), the input drain is OFF (at the low level), and after the transfer gate has been switched to the OFF (low-level) state, and a plurality of stages of clock signals have been transferred, the input drain is ON/OFF controlled to input electric calibration signals to the register.
  • FIG. 4 illustrates the outputted state of image signals and electric calibration signals in time sequence.
  • the first half of the output consists of image signals of respective photosensors "i” through “n”, and after the signals have been outputted, several stages of zero (offset)-level image signals are outputted, after which the electric calibration signals are outputted.
  • Output levels of the respective photoreceptor sections are plotted along the axis of ordinates.
  • the image signals are outputted at various levels depending on the subject being photographed, whereas the electric calibration signals are inputted through the input drain at an even level, and the zero (offset)-level signals are also at an offset level, since neither image signals nor electric calibration signals are inputted during that time.
  • the electric calibration signals according to the present invention are at a fixed level, nevertheless, the present invention may be applied to various levels as well.
  • the design is such that electric calibration signals are inputted to the register through the input drain while the transfer gate is OFF, and image signals are inputted to the register while the transfer gate is ON, simultaneous output of the image signals, the electric calibration signals and the zero (offset) level signals allows calibration of the image signals whenever necessary, even when the outputted image signals fluctuate due to changes in the temperature and other parameters.

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Facsimile Heads (AREA)

Abstract

A method and apparatus for subjecting multi-element sensing apparatuses to electric calibration whenever necessary, regardless of whether the subject under being photographed is well or poorly lit. The apparatus comprises a photoreceptor section having n photosensors, a transfer gate placed along the photoreceptor section, a register for temporarily storing image signals, an input drain provided at one end of the register, a CCD-driving circuit for adjusting timing of respective driving pulses, and a circuit for generating electric calibration signals. The input drain is ON/OFF controlled to input electric calibration signals while image signals are being outputted when the transfer gate is OFF, and the CCD-driving circuit adjusts timing of respective driving pulses so that zero-level signals and the electric calibration signals are simultaneously outputted after the image signals.

Description

This is a Continuation of application Ser. No. 08/680,124, filed on Jul. 15, 1996 now abandoned.
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to a method and apparatus for calibrating high-resolution multi-element sensors which are mounted in artificial satellites or the like for earth observation, or in facsimile machines or the like for detecting optical images, etc.
2. Description of the Prior Art
Multi-element sensing apparatuses mounted in facsimile machines, artificial satellites, etc. perform electric calibration at regular time intervals to keep track of the operational state of electric circuits throughout the equipment while detecting image signals. Multi-element sensing apparatuses of the prior art are designed to receive image signals when the subject being photographed is well lit, and to perform electric calibration while the subject being photographed is poorly lit.
Particularly, in the multi-element sensing apparatuses used for the artificial satellites, electric calibration signals having a predetermined level are applied to a CCD part in the sensing apparatuses in an observation-off time and the resultant calibration output signals are transmitted to an earth station as the same as observation output signals (image signals). In the earth station, the observation output signals are calibrated using the resultant calibration output signals. FIG. 7 schematically shows such image signals in time sequence, including outputted image signals 16, outputted electric calibration signals 18, and outputted zero (or offset)-level signals 17. As illustrated therein, all the image signals 16, the electric calibration signals 18 and the zero (or offset)-level signals 17 are outputted to the same-numbered pixels.
With conventional multi-element sensing apparatuses of this type, electric calibration is performed only when the subject being photographed is placed under low light conditions, since electric calibration for the subject being photographed in lit places results in overlapping of image signals on electric calibration signals. Therefore, some limits are imposed on the timing of the performance of electric calibration, resulting in the drawback of preventing calibration measurements whenever necessary. Further, according to the conventional apparatuses, it is impossible to realize accurate and continuous calibration when a condition such as temperature is changed during an observation time.
To improve such conventional apparatus, a technique applying a particular register having additional stages for calibration sequences is disclosed in U.S. Pat. No. 5,317,423. However, this technique requires a special sensing device having such additional stages which is disadvantageous with respect to circuit configuration and cost.
SUMMARY OF THE INVENTION
It is therefore an object of the present invention to provide a method and apparatus for subjecting multi-element sensors to electric calibration at all time, which never requires a special circuit configuration, i.e., an additional register stages.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a circuit diagram illustrative of an embodiment of a multi-element sensor-calibrating apparatus according to the present invention;
FIG. 2 is a flow chart illustrative of a method for calibrating multi-element sensors according to the present invention;
FIG. 3 is a timing waveform chart of the transfer gate and the input drain;
FIG. 4 is a chart of waveform of output from the multi-element sensing apparatus when the temperature and other parameters are stable;
FIG. 5 is a chart of waveform of output from the multi-element sensing apparatus when outputted image signals have been changed due to change in the temperature and other parameters,
FIG. 6 is a view of waveform of outputted image signals after compensation for changes due to the temperature and others; and
FIGS. 7 is a view illustrative of image signals, calibration signals and offset level signals in time sequence, from a multi-element sensing apparatus of the prior art.
In order to accomplish the above object, the method of calibrating multi-element sensors according to the present invention comprises: first outputting image signals which have been subjected to photoelectric conversion to a register for temporary storage, during which time an input drain is OFF; outputting the image signals to an amplifier circuit through ON/OFF operations of the register after the image signals have been outputted to the register; inputting electric calibration signals through ON/OFF control of the input drain while the image signals are being outputted to the amplifier circuit from the register when the transfer gate is OFF; and adjusting timing of respective driving pulses through a CDD-driving circuit so that zero-level signals and the electric calibration signals are outputted after the image signals. According to the present invention, a change in the sensitivity of the image signals is detected and calibrated in an accurate and continuous manner, with reference to the zero-level signals and the electric calibration signals.
An apparatus for use in the method comprises:
a photoreceptor section composed of an array of a plurality of photosensors; a CCD register for temporarily storing image signals which have been subjected to photoelectric conversion in the photoreceptor section; a transfer gate for ON/OFF connection of charge from the photoreceptor section to the register; an input drain provided at one end of the register for inputting electric calibration signals to the register; an amplifier circuit for amplifying weak signals; a multiplexer circuit for synthesizing signals from a plurality of amplifier circuits of the same type as the aforementioned amplifier circuit; an A/D conversion circuit for converting signals inputted through the multiplexer circuit into digital signals; a memory circuit for storing the digital signals; a pulse-generating circuit connected to the A/D conversion circuit; a CCD-driving circuit connected to the pulse-generating circuit, capable of adjusting timing of respective driving pulses so that zero-level signals and the electric calibration signals are outputted after the image signals; and a circuit for generating the electric calibration signals which are outputted via the register.
When image signals are being inputted to the register, the input drain is normally placed in the OFF position to prevent electric calibration signals from entering the register via the input drain. On the other hand, in order to input electric calibration signals to the register, the calibration signals are inputted when the input drain, which undergoes repeated ON/OFF operations as illustrated in FIG. 3, is ON. During this period of time, the transfer gate is placed in the OFF position to ensure that no image signals enter the register through the transfer gate.
According to the present invention, one lineful of output from the register includes the image signals and the zero (or offset)-level signals and the electric calibration signals at an even level, as illustrated in FIG. 4.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
The present invention will now be explained with reference to the drawings. In FIG. 1 showing an embodiment of a multi-element sensor-calibrating apparatus according to the present invention, the embodiment comprises a photoreceptor section 1 composed of a plurality of photosensors, "n" photosensors numbered from "i" to "n" in the case shown here, transfer gates 2 and 3 arranged along the photoreceptor section 1, CCD registers 4 and 5 placed opposite to the photoreceptor section 1 across the transfer gates 2 and 3, and input drains 6 and 7 provided at one end of each registers. In FIG. 1, the two sets, which include the transfer gate 2, the register 4 and the input drain 6, and the transfer gate 3, the register 5 and the input drain 7, are arranged for odd-numbered photosensors and even-numbered photosensors in the photoreceptor section 1, respectively. There is also provided a CCD-driving circuit 13 which generates CCD-driving pulses for activating the transfer gates 2 and 3, and the registers 4 and 5.
With the configuration illustrated in FIG. 1, for example, signals which have undergone photoelectric conversion and been stored in the photoreceptor section 1 are transferred to the register 4 while the transfer gate 2 is ON, and are successively transferred to an amplifier circuit 8 in response to transfer clock signals from the CCD-driving circuit 13 after the transfer gate 2 has been switched to the OFF position. After several stages of signals have been transferred, the input drain 6 is switched from the OFF (low-level) state to ON/OFF control, and this triggers inputting of electric calibration signals through the input drain 6 which are then transferred to the amplifier circuit 8 successively in response to transfer clock signals. The foregoing operation also applies to the combination of the transfer gate 3, the register 5, the input drain 7 and the amplifier circuit 9.
The amplifier circuits 8 and 9 amplify the weak signals. The amplified signals of the odd-numbered and even-numbered photosensors delivered from the amplifier circuits 8 and 9 are then synthesized in a multiplexer circuit 10 and sent to an A/D conversion circuit 11 which converts the inputted synthesized signals into digital signals. The digital signals are stored in a memory circuit 12. In addition, a pulse-generating circuit 15 generates clocks for the A/D conversion circuit 12. Also provided is an electric calibration signal-generating circuit 14 which is connected to the input drains 6 and 7.
FIG. 3 illustrates timing waveforms of the transfer gate and the input drain according to the present invention.
When the transfer gate is ON (at the high level), the input drain is OFF (at the low level), and after the transfer gate has been switched to the OFF (low-level) state, and a plurality of stages of clock signals have been transferred, the input drain is ON/OFF controlled to input electric calibration signals to the register.
FIG. 4 illustrates the outputted state of image signals and electric calibration signals in time sequence. The first half of the output consists of image signals of respective photosensors "i" through "n", and after the signals have been outputted, several stages of zero (offset)-level image signals are outputted, after which the electric calibration signals are outputted.
Output levels of the respective photoreceptor sections are plotted along the axis of ordinates. The image signals are outputted at various levels depending on the subject being photographed, whereas the electric calibration signals are inputted through the input drain at an even level, and the zero (offset)-level signals are also at an offset level, since neither image signals nor electric calibration signals are inputted during that time.
Even in cases where fluctuations of the image signals are caused by change in the temperature and other parameters of the CCD, the circuit sections, etc., as shown in FIG. 5, setting of the zero level 17 and the level of the outputted electric calibration signals 18 as two reference levels allow detection of the difference between the zero (or offset) level and the gain of the entire multi-element sensing apparatus, and thus one lineful of image signals may be easily corrected as shown in FIG. 6.
In the foregoing explanation, the electric calibration signals according to the present invention are at a fixed level, nevertheless, the present invention may be applied to various levels as well.
As described above, according to the present invention, since the design is such that electric calibration signals are inputted to the register through the input drain while the transfer gate is OFF, and image signals are inputted to the register while the transfer gate is ON, simultaneous output of the image signals, the electric calibration signals and the zero (offset) level signals allows calibration of the image signals whenever necessary, even when the outputted image signals fluctuate due to changes in the temperature and other parameters.

Claims (8)

What is claimed is:
1. A method for calibrating multi-element sensing apparatus having a plurality of photosensors, a register means arranged along said plurality of photosensors, said register means having a plurality of stages corresponding to said plurality of photosensors, a transfer gate disposed between said plurality of photosensors and said register means and an input drain provided at an end of said register means, said method comprising the steps of:
transferring image signals from said plurality of photosensors through said transfer gate to said register means while said transfer gate is in an ON state;
shifting said image signals through said register means to deliver said image signal while said transfer gate is inhibited;
inputting a calibration signal through said input drain into said register means when a predetermined time period elapses after said image signals are shifted through said register means while said transfer gate is inhibited;
sequentially receiving said image signal, offset signals, and said calibration signal from said register means said offset signals being received from said register means during said predetermined time period while said input drain is in an OFF state.
2. An apparatus for calibrating multi-element sensor, comprising:
a plurality of photosensors arrayed in a line;
a CCD register means arranged along said plurality of photosensors for receiving image signals from said plurality of photosensors, said CCD register means having a plurality of stages corresponding to said plurality of photosensors;
a transfer gate disposed between said plurality of photosensors and said CCD register means for allowing transfer of said image signal from said plurality of photosensors to said CCD register means;
an input drain coupled to said CCD register means for inputting a calibration signal into said CCD register means;
a means for generating said calibrating signal having a predetermined level; and
control means for controlling said CCD register means, said transfer gate and said input drain such that said calibration signal is inputted into said CCD register means when a predetermined time period elapses after said image signals are transferred through said CCD register means.
3. An apparatus for calibrating multi-element sensor as claimed in claim 2, further comprising a storing means for storing said image signals, offset signals, and said calibration signal which are sequentially delivered from said CCD register means, said offset signals being delivered from said CCD register means during said predetermined time period.
4. An apparatus for calibrating multi-element sensor as claimed in claim 2, further comprising:
a second CCD register means arranged along said plurality of photosensor at an opposite side to said first CCD register means, said first and second CCD register means receiving image signals from odd-numbered photosensors and even-numbered photosensors, respectively;
a second transfer gate disposed between said plurality of said photosensors and said second CCD register means;
a second input drain coupled to said second CCD register means for inputting a calibrating signal into said second CCD register means; and
a mixing means for mixing output signals from said first and second CCD register means.
5. An apparatus for calibrating multi-element sensor as claimed in claim 4, further comprising a storing means for storing said image signals, offset signals and said calibration signal in a sequential manner, said offset signals being received from said CCD register means during said predetermined time period.
6. An apparatus for calibrating multi-element sensor as claimed in claim 2, wherein said control means controls said transfer gate to be ON-state and said input drain to be inhibited when said image signal is transferred from said plurality of photosensors to said CCD register means, controls said transfer gate to be inhibited and said input drain to be inhibited during said predetermined time period, and controls said transfer gate to be inhibited and said input drain to be ON-state when said calibration signal is inputted into said CCD register means.
7. A method for calibrating a multi-element sensing apparatus having a plurality of photosensors, a register coupled to said plurality of photosensors and having a plurality of storage elements in one to one correspondence to said plurality of photosensors, a transfer gate coupled to said plurality of photosensors and to said register, and an input drain coupled to said register, said method comprising the steps of:
enabling said transfer gate;
transferring image signals from said plurality of photosensors to said register means in response to said enablement of said transfer gate;
disabling said transfer gate after said transfer of said image signals to said register;
outputting said image signals from said register after said transfer gate has been disabled;
outputting offset signals from said register for a predetermined period of time after said outputting of said image signals has been completed;
inputting a calibration signal in said register through said input drain after said predetermined time period has elapsed; and
outputting said calibration signals from said register.
8. An apparatus for calibrating multi-element sensor, comprising:
a plurality of photosensors generating image signals;
a CCD register coupled to said plurality of photosensors, said CCD register having a plurality of storage elements in one to one correspondence to said plurality of photosensors, said CCD register outputting offset signals in the absence of other signals in CCD register;
a transfer gate coupled to said plurality of photosensors and coupled to said CCD register, said transfer gate transferring said image signals from said plurality of photosensors to said CDD register;
an input drain coupled to said CCD register, said input drain inputting calibration signals into said CCD register; and
a controller coupled to said CCD register, said transfer gate and said input drain, said controller controlling said CCD register, said transfer gate and said input drain such that said CCD register sequentially outputs said image signals said offset signals and said calibration signals.
US08/886,703 1995-07-19 1997-07-01 Method and apparatus for calibrating multi-element sensors Expired - Fee Related US5963338A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US08/886,703 US5963338A (en) 1995-07-19 1997-07-01 Method and apparatus for calibrating multi-element sensors

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP7182309A JP2770795B2 (en) 1995-07-19 1995-07-19 Calibration method and device for multi-element sensor
JP7-182309 1995-07-19
US68012496A 1996-07-15 1996-07-15
US08/886,703 US5963338A (en) 1995-07-19 1997-07-01 Method and apparatus for calibrating multi-element sensors

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US68012496A Continuation 1995-07-19 1996-07-15

Publications (1)

Publication Number Publication Date
US5963338A true US5963338A (en) 1999-10-05

Family

ID=16116049

Family Applications (1)

Application Number Title Priority Date Filing Date
US08/886,703 Expired - Fee Related US5963338A (en) 1995-07-19 1997-07-01 Method and apparatus for calibrating multi-element sensors

Country Status (3)

Country Link
US (1) US5963338A (en)
EP (1) EP0755150A3 (en)
JP (1) JP2770795B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6259087B1 (en) * 1997-11-11 2001-07-10 Nec Corporation Calibration apparatus for multi-element sensor

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102694610B (en) * 2012-05-25 2014-05-28 北京空间飞行器总体设计部 Calibration system for RDSS channel zero value
CN102694609B (en) * 2012-05-25 2014-05-28 北京空间飞行器总体设计部 Calibration method for radio determination-satellite service (RDSS) channel zero value

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5317423A (en) * 1991-12-30 1994-05-31 Nec Corporation Image sensing apparatus using calibration sequences stored in extended portions of shift registers
US5337163A (en) * 1990-11-14 1994-08-09 Sony Corporation Linear image sensor with varied electric charge storage time
US5473660A (en) * 1994-06-01 1995-12-05 U.S. Philips Corporation Image sensing device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5337163A (en) * 1990-11-14 1994-08-09 Sony Corporation Linear image sensor with varied electric charge storage time
US5317423A (en) * 1991-12-30 1994-05-31 Nec Corporation Image sensing apparatus using calibration sequences stored in extended portions of shift registers
US5473660A (en) * 1994-06-01 1995-12-05 U.S. Philips Corporation Image sensing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6259087B1 (en) * 1997-11-11 2001-07-10 Nec Corporation Calibration apparatus for multi-element sensor

Also Published As

Publication number Publication date
JPH0937022A (en) 1997-02-07
EP0755150A3 (en) 1998-12-16
JP2770795B2 (en) 1998-07-02
EP0755150A2 (en) 1997-01-22

Similar Documents

Publication Publication Date Title
US4555732A (en) Image sensor correction system
US5352884A (en) Method and apparatus for providing offset for light detector
EP0700195A2 (en) Method of calibration of image scanner signal processing circuits
US6441851B1 (en) Solid state image pickup device, signal processing method and camera therefor
US4620236A (en) Image picture reading device
US5963338A (en) Method and apparatus for calibrating multi-element sensors
US4896215A (en) Imaging apparatus with flexible interface for controlling different image sensor types
EP0848546A1 (en) Solid-state imaging device and method for driving the same
JP2725508B2 (en) Multi-element optical sensor device
EP0865684B1 (en) Charge measurement circuit
US5576761A (en) Solid-state sensor having direct current control circuitry and logarithmic output signal
US5606367A (en) Solid state imaging device having common output coupling for monitoring a photosensitive pixel and picture photosensitive pixels
US6259087B1 (en) Calibration apparatus for multi-element sensor
JP3730442B2 (en) Solid-state imaging device
US6133952A (en) System for detecting defective photosensors in an image sensor array
KR100266843B1 (en) Solid-state imaging device
EP0522526A2 (en) Color linear sensor
EP0659014B1 (en) Solid state image sensing device and charge transfer method thereof
JP4227274B2 (en) Solid-state imaging device
JP2870477B2 (en) High-resolution calibration device for multi-element sensors
JPS6359254A (en) One-dimensional image sensor device
JPH11177767A (en) Photosensing device
JP3120426B2 (en) Solid-state imaging device
CN102256067A (en) Imaging apparatus
JPH0698079A (en) Image sensor and its reading method

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

REMI Maintenance fee reminder mailed
LAPS Lapse for failure to pay maintenance fees
LAPS Lapse for failure to pay maintenance fees

Free format text: PATENT EXPIRED FOR FAILURE TO PAY MAINTENANCE FEES (ORIGINAL EVENT CODE: EXP.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

STCH Information on status: patent discontinuation

Free format text: PATENT EXPIRED DUE TO NONPAYMENT OF MAINTENANCE FEES UNDER 37 CFR 1.362

FP Lapsed due to failure to pay maintenance fee

Effective date: 20031005