US4564562A - Silicone encapsulated devices - Google Patents
Silicone encapsulated devices Download PDFInfo
- Publication number
- US4564562A US4564562A US06/614,898 US61489884A US4564562A US 4564562 A US4564562 A US 4564562A US 61489884 A US61489884 A US 61489884A US 4564562 A US4564562 A US 4564562A
- Authority
- US
- United States
- Prior art keywords
- weight percent
- dialkylaminoalkoxysilane
- amine
- aminoethyl
- silicone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
- H01L23/3121—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L83/00—Compositions of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon only; Compositions of derivatives of such polymers
- C08L83/04—Polysiloxanes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
- H01L23/296—Organo-silicon compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S528/00—Synthetic resins or natural rubbers -- part of the class 520 series
- Y10S528/901—Room temperature curable silicon-containing polymer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31652—Of asbestos
- Y10T428/31663—As siloxane, silicone or silane
Definitions
- This invention relates to electronic devices which are encapsulated by means of a polymeric encapsulant and more particularly, to such devices which are encapsulated by means of a silicone resin.
- Silicone resins have been used in various industrial applications because of their thermal stability, dielectric properties, mechanical properties, chemical resistance and resistance to atmospheric deterioration.
- One such use is as an encapsulant for electronic devices, e.g., integrated circuit devices and hybrid integrated circuits.
- the silicone encapsulant tends not to adhere well to the metal surface and further often exhibits swelling and bleeding.
- there are no commercially available screen printable silicone resins which exhibit the desired adhesion to gold and tantalum surfaces especially when processing includes exposure of the encapsulated device to Freon®.
- a modifier for silicone resins which eliminates the aforementioned problems and allows selective encapsulation over gold or tantalum surfaces by screen printing methods as well as other coating processes.
- An article of manufacture comprises an electronic device having a silicone resin encapsulant thereover, wherein the silicone resin formulation is free of oxime and water and is derived from curing a mixture consisting essentially of a heat curable silicone elastomer prepolymer and a dialkylaminoalkoxysilane.
- the mixture may also contain fillers and a small amount of curing catalyst and stabilizer.
- FIG. 1 is a photograph of a Freon® treated gold patterned substrate encapsulated in a heat cured silicone resin formulation not including the dialkylaminoalkoxysilane additive;
- FIG. 2 represents a similar gold patterned substrate treated in a similar manner but having an encapsulant similar to the above but which includes the dialkylaminoalkoxysilane additive in accordance with this invention
- FIG. 3 is an elevational cross-sectional view of a typical I.C. encapsulated circuit utilizing a silicone encapsulant.
- FIG. 1 This figure shows the poor adhesion to a gold surface of a commercially available, heat curable, silicone encapsulant after exposure to the Freon.
- the problem of adhesion of silicone encapsulants to gold is one that has been recognized in the industry and has limited the use of silicones in certain manufacturing processes.
- FIG. 2 one can see the excellent adhesion to gold of the silicone encapsulant which has been modified in accordance with this invention by the addition of the dialkylaminoalkoxysilane. This surface was exposed to the same Freon treatment as that shown in FIG. 1.
- the improvement is achieved by adding a compound having functional groups which act as a cross-linking agent, a catalyst and a promoter to an oxime free and water free heat curable silicone elastomer prepolymer and then heat curing the mixture subsequent to coating or encapsulating the device or substrate to be encapsulated.
- Suitable compounds are the dialkylaminotrialkoxysilanes, and dialkylaminodialkoxysilanes, particularly those wherein the alkyl and alkoxy groups have from one to four carbon atoms, the amine groups include a secondary and a primary amine nitrogen separated by an alkyl group and wherein an alkyl group separates the secondary amine nitrogen from the silicon atom.
- a preferred additive is N-2-aminoethyl-3 aminopropyl-trimethoxy silane (NH 2 CH 2 CH 2 NH CH 2 CH 2 CH 2 Si(OCH 3 ) 3 ).
- Such additives are effective in preventing delamination, blistering and swelling even when present in small quantities, e.g., 0.5 to 3 weight percent. Generally, one weight percent is sufficient when using the preferred compound indicated above.
- the novel formulations which exhibit the superior adhesion to gold and tantalum metal surfaces, even under severe solvent cleaning conditions employed in the electronics industry, are free of oximes and are heat curable as opposed to room temperature moisture curable and are also free of water.
- These formulations consist essentially of a heat curable silicone elastomer prepolymer in an amount of from 20 to 25 weight percent and having an average molecular weight of from 400,000 to 600,000, 0.5 to 2.0 weight percent of a dialkylaminoalkoxysilane wherein one amine group is a secondary amine and the other is a primary amine and the amine nitrogen is not directly coupled to the silicon atom; 0 to 80 weight percent filler; 0 to 2 weight percent curing catalyst and 0 to 0.2 weight percent stabilizer.
- a solvent to adjust viscosity.
- Suitable heat curable silicone elastomers are known in the art and are commercially available.
- the alkyl groups of the suitable silanes are preferably from 1 to 4 carbon atoms in length and the alkoxy groups are preferably methoxy but can be ethoxy or propoxy.
- the silane can be a trialkoxy or a dialkoxy silane. When it is a dialkoxysilane, the remaining radical bonded to the silicon atom may be hydrogen or an alkyl group of from 1 to 3 carbon atoms.
- Preferred materials are hereinafter set forth.
- the fillers are generally employed to control viscosity and should be limited in amount to allow for good dispersion and desired viscosity control.
- the fillers should be inert and are generally of fine particle size. Typical fillers are silica and alumina.
- dialkylaminoalkoxy silane acts to catalyze curing
- an additional curing catalyst e.g., a tri-amino-alkylalkoxysilane may be added as well.
- stabilizers such as metal complexes and phosphites as are known in the art may be employed.
- the quantity limits of the additives should be adhered to in order to assure achieving the desired physical, chemical and electrical properties of the cured elastomer.
- a screen printable heat curable silicone resin formulation was prepared in accordance with the following formulation wherein DC-649 is a hydroxy functional phenyl-methyl siloxane made by Dow Corning, Midland, Michigan and BASF-5882 is an organic type pigment.
- the solvent is not included in calculating the weight percent of the components and is employed to the extent necessary to achieve the desired viscosity for the screen printing or other coating technique to be employed.
- the viscosity can also be adjusted by changing the amount of filler.
- the above formulation was printed on a test substrate containing gold plated surfaces and cured at 200° C. for 4-6 hours.
- the substrates were then processed by exposing them to a Freon TMC cleaning operation wherein, as can be seen in FIG. 1, it was found that the silicone delaminated, swelled and/or bled in the areas over the gold.
- Example 1 The formulation of Example 1 was modified by adding 1 weight percent N-2-aminoethyl-3-aminopropyltrimethoxysilane. It was found that to reach the same degree of cure in the same time, curing temperatures should be reduced to 150° C. Further, as can be seen in FIG. 2, no delamination, swelling or bleeding occurred on the screen printed gold surfaced substrates even after exposure to the same Freon TLC treatment as previously performed on the samples made from the formulation of Example 1.
- the preferred formulations generally include 20 to 25 weight percent heat curable silicone elastomer prepolymer, 0.5 to 2 weight percent dialkylaminoalkoxysilane, 1 to 2 weight percent amine catalyst, 73 to 80 weight percent silica filler and 0.1 to 0.2 weight percent pigment in a viscosity controlling solvent.
- FIG. 3 there is shown an example of a hybrid integrated circuit 10 having a gold plated electrode pattern 12 thereon for ease of bonding to integrated circuit chips 14 on the device 10.
- the entire device in this instance is coated with the novel silicone formulation 16.
- the circuit chips 14 are bonded to the electrode pattern by means of wire bonds 18.
- wire bonds Alternatively, of course, one can coat discrete components or portions of the device by well known screen printing techniques.
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
Description
______________________________________ Weight Ingredient Percent ______________________________________ DC-649 23.9 buffered amine catalyst 1 silica filler 75 pigment 0.1 terpinol solvent -- ______________________________________
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/614,898 US4564562A (en) | 1984-05-29 | 1984-05-29 | Silicone encapsulated devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/614,898 US4564562A (en) | 1984-05-29 | 1984-05-29 | Silicone encapsulated devices |
Publications (1)
Publication Number | Publication Date |
---|---|
US4564562A true US4564562A (en) | 1986-01-14 |
Family
ID=24463171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US06/614,898 Expired - Lifetime US4564562A (en) | 1984-05-29 | 1984-05-29 | Silicone encapsulated devices |
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Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4720431A (en) * | 1986-05-21 | 1988-01-19 | American Telephone And Telegraph Company At&T Technologies, Inc. | Silicone encapsulated devices |
EP0292029A1 (en) * | 1987-04-16 | 1988-11-23 | Koninklijke Philips Electronics N.V. | Semiconductor laser device and method of manufacturing same |
EP0311173A1 (en) * | 1987-10-02 | 1989-04-12 | Koninklijke Philips Electronics N.V. | Method of manufacturing a semiconductor device comprising a silicon oxide layer protecting a PN junction |
US4830922A (en) * | 1986-02-28 | 1989-05-16 | Sparrowhawk Bryan L | Removable controlled thickness conformal coating |
US4888226A (en) * | 1988-08-08 | 1989-12-19 | American Telephone And Telegraph Company | Silicone gel electronic device encapsulant |
US5051275A (en) * | 1989-11-09 | 1991-09-24 | At&T Bell Laboratories | Silicone resin electronic device encapsulant |
EP0447611A2 (en) * | 1990-03-15 | 1991-09-25 | International Business Machines Corporation | Planarizing silsesquioxane copolymer coating |
US5085913A (en) * | 1990-04-27 | 1992-02-04 | At&T Bell Laboratories | Silicone material |
US5215801A (en) * | 1990-08-22 | 1993-06-01 | At&T Bell Laboratories | Silicone resin electronic device encapsulant |
EP0620591A1 (en) * | 1993-04-12 | 1994-10-19 | Delco Electronics Corporation | Silicone over-mould of a flip-chip device |
US5568684A (en) * | 1992-08-28 | 1996-10-29 | Lucent Technologies Inc. | Method of encapsulating an electronic device |
GB2279817B (en) * | 1993-07-02 | 1998-01-14 | Gec Avery Ltd | A method of encapsulating components on a printed circuit |
US20040265531A1 (en) * | 2003-06-30 | 2004-12-30 | Mckean Dennis R. | Sliders bonded by a debondable silicon-based encapsulant |
US20060004170A1 (en) * | 2004-07-02 | 2006-01-05 | Sanduja Mohan L | Coating material for a grafted ignition wire |
EP1995281A1 (en) * | 2006-03-16 | 2008-11-26 | JSR Corporation | Oxide particle-containing polysiloxane composition and method for producing same |
US7678615B2 (en) | 2007-08-29 | 2010-03-16 | Advanced Micro Devices, Inc. | Semiconductor device with gel-type thermal interface material |
US7833839B1 (en) | 2007-09-15 | 2010-11-16 | Globalfoundries Inc. | Method for decreasing surface delamination of gel-type thermal interface material by management of the material cure temperature |
WO2015100155A1 (en) * | 2013-12-23 | 2015-07-02 | Cornell University | Printable elastomer materials |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3674738A (en) * | 1969-08-13 | 1972-07-04 | Wacker Chemie Gmbh | Room temperature vulcanizable silicone rubber stocks |
US3678003A (en) * | 1969-12-23 | 1972-07-18 | Wacker Chemie Gmbh | Room temperature vulcanizable silicone elastomer stocks |
US3686357A (en) * | 1969-11-28 | 1972-08-22 | Carl Anthony Cheeseman | Room temperature vulcanizable silicone rubber stocks |
US3702769A (en) * | 1971-01-04 | 1972-11-14 | Dow Corning | Method of polishing leather with compositions containing reaction product of hydroxy endblocked siloxanes and aminofunctional silanes |
US3923736A (en) * | 1971-03-16 | 1975-12-02 | Wacker Chemie Gmbh | Room temperature vulcanizable organopolysiloxanes |
US3983265A (en) * | 1973-05-11 | 1976-09-28 | Rhone-Poulenc S.A. | Method of coating a substrate with curable organopolysiloxane compositions |
US4036813A (en) * | 1975-11-26 | 1977-07-19 | General Electric Company | Composition for promoting adhesion of curable silicones to substrates |
US4219607A (en) * | 1978-01-13 | 1980-08-26 | Raychem Corporation | High voltage insulating compositions containing phosphorus compounds |
US4248993A (en) * | 1977-06-29 | 1981-02-03 | Shin-Etsu Chemical Co. Ltd. | Room temperature curable organopolysiloxane |
US4318939A (en) * | 1980-08-21 | 1982-03-09 | Western Electric Co., Incorporated | Stabilized catalyzed organopolysiloxanes |
US4431472A (en) * | 1982-03-17 | 1984-02-14 | Wacker-Chemie Gmbh | Method for improving the adhesion of organopolysiloxane elastomers |
-
1984
- 1984-05-29 US US06/614,898 patent/US4564562A/en not_active Expired - Lifetime
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3674738A (en) * | 1969-08-13 | 1972-07-04 | Wacker Chemie Gmbh | Room temperature vulcanizable silicone rubber stocks |
US3686357A (en) * | 1969-11-28 | 1972-08-22 | Carl Anthony Cheeseman | Room temperature vulcanizable silicone rubber stocks |
US3678003A (en) * | 1969-12-23 | 1972-07-18 | Wacker Chemie Gmbh | Room temperature vulcanizable silicone elastomer stocks |
US3702769A (en) * | 1971-01-04 | 1972-11-14 | Dow Corning | Method of polishing leather with compositions containing reaction product of hydroxy endblocked siloxanes and aminofunctional silanes |
US3923736A (en) * | 1971-03-16 | 1975-12-02 | Wacker Chemie Gmbh | Room temperature vulcanizable organopolysiloxanes |
US3983265A (en) * | 1973-05-11 | 1976-09-28 | Rhone-Poulenc S.A. | Method of coating a substrate with curable organopolysiloxane compositions |
US4036813A (en) * | 1975-11-26 | 1977-07-19 | General Electric Company | Composition for promoting adhesion of curable silicones to substrates |
US4248993A (en) * | 1977-06-29 | 1981-02-03 | Shin-Etsu Chemical Co. Ltd. | Room temperature curable organopolysiloxane |
US4219607A (en) * | 1978-01-13 | 1980-08-26 | Raychem Corporation | High voltage insulating compositions containing phosphorus compounds |
US4318939A (en) * | 1980-08-21 | 1982-03-09 | Western Electric Co., Incorporated | Stabilized catalyzed organopolysiloxanes |
US4431472A (en) * | 1982-03-17 | 1984-02-14 | Wacker-Chemie Gmbh | Method for improving the adhesion of organopolysiloxane elastomers |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4830922A (en) * | 1986-02-28 | 1989-05-16 | Sparrowhawk Bryan L | Removable controlled thickness conformal coating |
US4720431A (en) * | 1986-05-21 | 1988-01-19 | American Telephone And Telegraph Company At&T Technologies, Inc. | Silicone encapsulated devices |
EP0292029A1 (en) * | 1987-04-16 | 1988-11-23 | Koninklijke Philips Electronics N.V. | Semiconductor laser device and method of manufacturing same |
EP0311173A1 (en) * | 1987-10-02 | 1989-04-12 | Koninklijke Philips Electronics N.V. | Method of manufacturing a semiconductor device comprising a silicon oxide layer protecting a PN junction |
US4940673A (en) * | 1987-10-02 | 1990-07-10 | U.S. Philips Corporation | PN junction passivation using methylated silyloxy groups |
US4888226A (en) * | 1988-08-08 | 1989-12-19 | American Telephone And Telegraph Company | Silicone gel electronic device encapsulant |
US5051275A (en) * | 1989-11-09 | 1991-09-24 | At&T Bell Laboratories | Silicone resin electronic device encapsulant |
EP0447611A2 (en) * | 1990-03-15 | 1991-09-25 | International Business Machines Corporation | Planarizing silsesquioxane copolymer coating |
EP0447611A3 (en) * | 1990-03-15 | 1991-10-16 | International Business Machines Corporation | Planarizing silsesquioxane copolymer coating |
US5085913A (en) * | 1990-04-27 | 1992-02-04 | At&T Bell Laboratories | Silicone material |
US5215801A (en) * | 1990-08-22 | 1993-06-01 | At&T Bell Laboratories | Silicone resin electronic device encapsulant |
US5568684A (en) * | 1992-08-28 | 1996-10-29 | Lucent Technologies Inc. | Method of encapsulating an electronic device |
EP0620591A1 (en) * | 1993-04-12 | 1994-10-19 | Delco Electronics Corporation | Silicone over-mould of a flip-chip device |
GB2279817B (en) * | 1993-07-02 | 1998-01-14 | Gec Avery Ltd | A method of encapsulating components on a printed circuit |
US20040265531A1 (en) * | 2003-06-30 | 2004-12-30 | Mckean Dennis R. | Sliders bonded by a debondable silicon-based encapsulant |
US20060004170A1 (en) * | 2004-07-02 | 2006-01-05 | Sanduja Mohan L | Coating material for a grafted ignition wire |
US7309745B2 (en) | 2004-07-02 | 2007-12-18 | Federal-Mogul World Wide, Inc. | Coating material for a grafted ignition wire |
EP1995281A1 (en) * | 2006-03-16 | 2008-11-26 | JSR Corporation | Oxide particle-containing polysiloxane composition and method for producing same |
US20090093579A1 (en) * | 2006-03-16 | 2009-04-09 | Jsr Corporation | Oxide particle-containing polysiloxane composition and method for producing same |
EP1995281A4 (en) * | 2006-03-16 | 2010-03-24 | Jsr Corp | Oxide particle-containing polysiloxane composition and method for producing same |
US7678615B2 (en) | 2007-08-29 | 2010-03-16 | Advanced Micro Devices, Inc. | Semiconductor device with gel-type thermal interface material |
US7833839B1 (en) | 2007-09-15 | 2010-11-16 | Globalfoundries Inc. | Method for decreasing surface delamination of gel-type thermal interface material by management of the material cure temperature |
WO2015100155A1 (en) * | 2013-12-23 | 2015-07-02 | Cornell University | Printable elastomer materials |
US10344176B2 (en) | 2013-12-23 | 2019-07-09 | Cornell University | Printable elastomer materials |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: AT&T TECHNOLOGIES, INC.,NEW YORK Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WONG, CHING-PING;OTT, LEE;COCHRAN, PHIL;SIGNING DATES FROM 19840511 TO 19840525;REEL/FRAME:004266/0687 Owner name: AT&T TECHNOLOGIES, INC., 222 BROADWAY, NEW YORK NY Free format text: ASSIGNMENT OF ASSIGNORS INTEREST.;ASSIGNORS:WONG, CHING-PING;OTT, LEE;COCHRAN, PHIL;REEL/FRAME:004266/0687;SIGNING DATES FROM 19840511 TO 19840525 |
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