US3900759A - Device for observing waveform repeated at high frequency - Google Patents

Device for observing waveform repeated at high frequency Download PDF

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Publication number
US3900759A
US3900759A US450972A US45097274A US3900759A US 3900759 A US3900759 A US 3900759A US 450972 A US450972 A US 450972A US 45097274 A US45097274 A US 45097274A US 3900759 A US3900759 A US 3900759A
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United States
Prior art keywords
electron beam
waveform
electron
pin
collecting
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Expired - Lifetime
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US450972A
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English (en)
Inventor
Kazuo Fujisawa
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Osaka University NUC
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Osaka University NUC
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/52—Arrangements for controlling intensity of ray or beam, e.g. for modulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/342—Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying periodic H.F. signals

Definitions

  • a sampling oscilloscope In order to observe a waveform of extremely short duration which is repeated at high frequency, a sampling oscilloscope has been used.
  • a voltage pulse which is synchronized with the waveform to be observed and varies its phase bit by bit at every cycle, is produced and the waveform is sampled during the duration of this pulse and amplified for use in waveform display.
  • the duration of the voltage pulse must be short as compared with the duration of the waveform to be observed, the shorter the duration of the waveform becomes, the shorter the required duration of the voltage pulse becomes.
  • the prior techniques only enable observation of the waveforms having a duration of the order of a nanosecond at the best.
  • With the advance of the recent lasar technique however, it has become possible to produce pulses having durations of the order of picosecond and, consequently. it has become necessary to observe the pico second light pulses.
  • an object of this invention is to provide a novel and improved device enabling display of a waveform having an extremely short duration such as of the order of a picosecond and being repeated at a high frequency.
  • the device comprises means for producing an electron beam having a density variation according to the waveform to be observed, means for deflecting said electron beam under control of a microwave voltage which is synchronous with the repetition of said waveform to be observed, means for sweeping the phase difference between said electron beam and microwave voltage at a low frequency, means for controlling said electron beam only at the position corresponding to a predetermined deflection effected by said deflecting means, and means for displaying the magnitude of the electron flow collected by said collecting means along the phenomenon axis and said phase difference along the time axis.
  • FIG. 1 is a schematic sectional side view, partly in block form, representing an embodiment of this invention for observing the waveform of a high frequency light pulse;
  • FIG. 2 is a waveform diagram presented to aid the explanation of the operation of the device of FIG. 1.
  • a photoelectric surface 1 is formed on a transparent electrode (not shown) which is formed on the inner face of one end wall of an evacuated glass envelope E, and arranged to receive a light pulse L to be observed.
  • a transparent electrode not shown
  • lens forming electrodes 3, 4 and 5 Located in front of the photoelectric surface I are an anode electrode 2, lens forming electrodes 3, 4 and 5, a drift tube 6 and a reentrant cavity resonator 7 in that order.
  • the cavity resonator 7 is coupled to a waveguide 8 through a coupling hole 12 and its inner post forms a modulation gap II in the center.
  • Pin-holes 9 and 10 are formed in the walls of the cavity along the tube axis.
  • a masking electrode I3 having a pin-hole l4 and an electron collector electrode 15 is located behind the pin-hole 14.
  • the pin-hole 14 of the masking electrode 13 is positioned a specific distance from the tube axis so that only the electron beam encountering the corresponding deflection can pass the pin-hole 14 to be collected by the electrode 15.
  • a microwave oscillator 16 generating a proper microwave signal P synchronized with the repetition of the light pulse L to be observed is connected through a phase shifter 17 to the waveguide 8.
  • a saw-tooth wave generator 18 is connected to the drift tube 6 through a fixed contact 19a of a single-pole doublethrow switch 19 and a transformer 20 and also to the control terminal of the phase shifter 17 through the other fixed contact 19b of the switch 19.
  • the output of the saw-tooth wave generator 18 is further connected to the time axis input X of a cathode-ray tube oscilloscope 23.
  • the electron collector electrode 15 is grounded through a resistor 21 and also connected through a high gain amplifier 22 of the phenomenon axis input Y of the oscillator 23.
  • the light pulse L incident upon the photoelectric surface 1 emits an electron beam B having a density waveform which is identical to the waveform of itself, as shown in FIG. 2 (l).
  • the pulsed electron beam 8 passes through the anode electrode 2, the lens electrodes 3, 4 and 5 and the drift tube 6 and enters the cavity resonator 7 from the pin-hole 9.
  • the oscillator 16 generates a microwave signal P, synchronous with the repetition of the pulsed electron beam B and accordingly with the incident light pulse L, and the signal P is shifted in phase by the phase shifter 17 and applied to the modulation gap 11 of the resonator 7 through the waveguide 8 as a microwave signal P, as shown in FIG. 2 (2).
  • the period of the microwave signal P is selected to be one third of the repetition period T of the pulsed beam B in the drawing.
  • the electron beam B is deflected laterally in the modulation gap 1 l by an electric field controlled by the signal P, and comes out of the pinhole 10. Although most of the deflected electrons of the beam collide against the masking electrode 13 and are absorbed thereby, only the electrons passing through the pinhole 14 are collected by the collector electrode 15. Assuming that the deflected portion of the electron beam passing through the pin-hole 14 corresponds to a voltage level V, of the microwave signal P, the possible time points at which the electron beam passes through the pin-hole 14 are t t as shown in FIG. 2(2) and, in this case, an electron flow having a density 1, passes therethrough at the time points t t,,.
  • a saw-tooth wave signal Pm of relatively low frequency is applied to the drift tube 6 when the switch 19 is turned to the contact as shown in FIG. 1, and varies the electron speed of the electron beam B linearly.
  • phase difference 9 between the pulsed electron beam B and the microwave signal P, at the modulation gap It is equal to a sum of the electron transit angle from the photoelectric surface I to the gap 11 and the phase shift produced by the phase shifter [7, it is swept over a specific range by the saw-tooth wave signal Pm.
  • the sweep of the phase difference results in a sweep of the sampling time point t and, therefore, in a variation of the density of the electron beam passing the pin-hole 14 in accordance with the waveform B to be observed. Since this variation is applied to the phenomenon axis input of the oscilloscope and the saw-tooth wave signal Pm is also applied to the time axis input thereof.
  • the waveform corresponding to the waveform B to be observed is displayed on the display screen of the oscilloscope 23.
  • the sweep of the phase difference 0 can be effected by directly shifting the phase of the microwave signal P under control of the saw-tooth wave signal Pm. This can be attained by turning the switch 19 to the contact 19b to apply the signal Pm to the control terminal of the phase shifter 17.
  • the device of this invention does not need to feed the sampling voltage pulse to the outside of the envelope E and effects the sampling of the waveform to be observed within the vacuum envelope of an electron tube. Waveform observation can be done in an extremely high frequency range.
  • this invention is applicable to a device for observing the waveform of a high frequency electric signal such as microwave signal by providing a suitable unit for density-modulating an electron beam with this microwave signal.
  • the waveform display can be effected by a mechanical XY-recorder instead of the cathode-ray tube oscilloscope 23.
  • a device for observing a waveform repeated at a high frequency comprising means of producing an electron beam having a density variation according to the waveform to be observed, means for generating a microwave voltage which is synchronous with the repetition rate of the waveform to be observed, means for deflecting said electron beam under control of said microwave voltage, means for sweeping the phase difference between said electron beam and microwave voltage at a low frequency, means for collecting said electron beam only at a position corresponding to a prede termined deflection effected by said deflecting means, and means for displaying the magnitude of the electron flow collected by said collecting means along the phenomenon axis and said phase difference along the time axis.
  • said electron beam producing means comprises a photoelectric surface formed in an evacuated envelope.
  • said deflection means comprises a reentrant cavity resonator to which said microwave voltage is applied.
  • said electron beam collecting means comprises a masking electrode having a pin-hole or slit and an electron collector electrode located behind said pin-hole or slit for collecting the electrons passing said pin-hole or slit
  • said display means comprises a cathode-ray tube oscilloscope, a voltage corresponding to the electron flow collected by said collector electrode being applied to the phenomenon axis input of said oscilloscope.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
US450972A 1973-06-25 1974-03-14 Device for observing waveform repeated at high frequency Expired - Lifetime US3900759A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48071539A JPS5249984B2 (enrdf_load_html_response) 1973-06-25 1973-06-25

Publications (1)

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US3900759A true US3900759A (en) 1975-08-19

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US450972A Expired - Lifetime US3900759A (en) 1973-06-25 1974-03-14 Device for observing waveform repeated at high frequency

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US (1) US3900759A (enrdf_load_html_response)
JP (1) JPS5249984B2 (enrdf_load_html_response)
FR (1) FR2234567B1 (enrdf_load_html_response)
GB (1) GB1429401A (enrdf_load_html_response)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS542894U (enrdf_load_html_response) * 1977-06-09 1979-01-10
JPS57183327U (enrdf_load_html_response) * 1981-05-15 1982-11-20
US4645918A (en) * 1982-12-07 1987-02-24 Hamamatsu Photonics Kabushiki Kaisha Instruments for measuring light pulses clocked at high repetition rate and electron tube devices therefor
JPS6138100A (ja) * 1984-07-30 1986-02-24 戸田建設株式会社 シ−ルド工事における２次覆工コンクリ−トの充てん工法
JPS6146111U (ja) * 1984-08-29 1986-03-27 株式会社 呉英製作所 ドリル位置決め治具
IL72878A (en) * 1984-09-06 1988-10-31 Tadiran Ltd Reconnaissance system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3268860A (en) * 1964-02-20 1966-08-23 Exxon Production Research Co Correlation apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3268860A (en) * 1964-02-20 1966-08-23 Exxon Production Research Co Correlation apparatus

Also Published As

Publication number Publication date
FR2234567A1 (enrdf_load_html_response) 1975-01-17
JPS5249984B2 (enrdf_load_html_response) 1977-12-21
DE2410179B2 (de) 1975-07-03
FR2234567B1 (enrdf_load_html_response) 1976-12-10
JPS5021773A (enrdf_load_html_response) 1975-03-07
GB1429401A (en) 1976-03-24
DE2410179A1 (de) 1975-01-16

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