US3589817A - Photoelectric web defect-detecting apparatus which provides for overcoming the ray-diverging effect of roller curvature - Google Patents
Photoelectric web defect-detecting apparatus which provides for overcoming the ray-diverging effect of roller curvature Download PDFInfo
- Publication number
- US3589817A US3589817A US802946*A US3589817DA US3589817A US 3589817 A US3589817 A US 3589817A US 3589817D A US3589817D A US 3589817DA US 3589817 A US3589817 A US 3589817A
- Authority
- US
- United States
- Prior art keywords
- web
- roller
- light rays
- lens
- directing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
Definitions
- Grigsby Attorney-Sughrue, Rothwell, Mion, Zinn & Macpeak ABSTRACT Apparatus for optically detecting imperfections on the surface of a web which is being advanced on a roller.
- the apparatus comprises a light source for directing light rays onto the surface of the web on the roller, a lens assembly disposed between the light source and the roller for directing parallel light rays toward the web surface, and an optical system for directing the reflected light rays to a photoconductive element.
- the present invention relates to a method and apparatus for detecting imperfections on the surface of a web by optical means.
- These devices for detecting imperfections are used in general to provide signals of the imperfections to an automatic cutter to cut out and remove the cut portion containing the imperfection. Otherwise, the above devices are used for marking the web to indicate the imperfection or for recording the condition of the imperfection on the web.
- a semicylindrical lens is provided for making the illuminating light rays parallel with one another.
- Another semicylindrical lens is also provided for concentrating the parallel light rays onto the portion of the surface of the web to be checked for imperfections.
- the light rays reflected from the surface of the web are detected by a photoconductive element using the flying image method. 7
- the conventional method of the flying image has been to employ uniform illumination of the web. Therefore, when an imperfection has been illuminated by rays from various directions, the reflected light rays from the imperfection which reached the photoconductive element have been an extremely small part of the total number of rays from the reflected imperfection.
- This method has been disadvantageous from the point of view of efficiency and the resolution of power.
- the imperfection on the moving web is illuminated by parallel light rays and as a result high efficiency in resolving power are achieved.
- FIG. 1 is a perspective view of an embodiment of the detecting apparatus in accordance with the present invention.
- FIG. 2 is a perspective view of an example of the detecting device which is exemplary of the prior art.
- FIG. 3 is a perspective view of the main part of the detecting device in accordance with the present invention.
- FIG. 4 is a cross-sectional view of the main part of the detecting device shown in FIG. 3 in accordance with the present invention.
- reference character 1 denotes a light source such as a tungsten lamp including a linear filament.
- the reference numeral 2 denotes an infrared filter to be used in the event the device is used to detect imperfections on the surface of a photosensitive photographic film.
- Numeral 3 denotes a first semicylindrical lens for making the emitted light rays from the light source 1 parallel with one another and projecting them perpendicular to the portion 5 to be detected on the web 6.
- the lens 3 may be spherical.
- the reference character 4 denotes a second semicylindrical lens for concentrating the parallel rays formed by the first semicylindrical lens 3 onto the surface of the web 6 in the shape of a wedge.
- the reference numeral 7 denotes a roller for rolling the web in a predetermined position.
- Numeral 8 denotes a lens for concentrating the reflected parallel light rays from the detected portion 5 onto a mirror 10 which is vibrated.
- Numeral 9 denotes a spherical lens for focusing the image of the detected portion 5.
- Numeral l0 denotes a vibrating mirror for scanning the detected portion 5 which corresponds to the site field of the photoconductive element 15. The vibrating mirror 10 is driven by means of a magnet 11 and a coil 12.
- the coil 12 is connected to an oscillator 13 in the present invention.
- the vibrating mirror 10 vibrates at a frequency of, for example, 200 cycles per second. Accordingly, the site field of the photoconductive element 15 reciprocates on the portion of the surface of the web 6 to be detected at a speed of 200 times per second.
- the vibrating mirror 10 can be replaced by a rotating multifaced mirror, but in this case, a complicated device is required to obtain the results since the illuminating light is cut out at the end of the detected portion 5 or at the end of the lenses 4 and 8 and therefore, a clamp device is required for eliminating the signal.
- the signal from the photoconductive element 15 is amplified by the amplifier 16.
- the amplifier 16 is constructed having a high pass filter and a low-pass filter in order to separate the signals of sharp imperfections such as scratches from the signals of relatively mild imperfections such as unevenness.
- the amplifier 16 can detect the two kinds of imperfections with different sensitivity.
- the reference numeral 17 denotes a discriminating circuit which transmits a signal to the memory circuit 18 when a signal of a level higher than a reference level is provided at the input thereof.
- the memory circuit 18 memorizes the signal until the web is cut off at the portion of the web having the imperfection detected by the above device which includes circuit 17.
- a solenoid is energized to take out the portion of the web having the imperfection detected.
- the memory circuit 18 memorizes the signal until the portion of the web having the imperfection comes up to the position to be marked and then energizes the marking solenoid.
- FIG. 2 illustrates a conventional illuminating method wherein the detected portion of the web is uniformly illuminated over a broad range with a lamp 19. If imperfection 20 passes, the light value of the light ray 21 directed to the photoconductive element varies, however, the variation of. the light value is very small because the detected portion is illuminated from various directions.
- a roller is provided for feeding the web, a light source is provided for directing the light rays onto the surface of the web which moves along the roller, and an optical system is provided for directing the reflected light rays from the surface of the web to a photoconductive element;
- first lens disposed between said light source and said roller for making said light rays from said light source parallel with one another
- second lens disposed between said first lens and said roller for concentrating the parallel rays formed by said first lens onto the web surface in the form of a wedge, the focal point of said second lens being positioned beyond the surface of the web on the roller so that most of the light rays will be reflected in the same direction.
- said optical system comprises a vibrating mirror, and a third lens disposed near said roller for directing the reflected light rays toward said vibrating mirror, said vibrating mirror directing the reflected light rays toward said photoconductive element.
- the apparatus of claim 2 further comprising an amplifier, a discriminating circuit and a memory circuit connected to said photoconductive element.
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- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Silver Salt Photography Or Processing Solution Therefor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP43011961A JPS5114039B1 (fr) | 1968-02-27 | 1968-02-27 |
Publications (1)
Publication Number | Publication Date |
---|---|
US3589817A true US3589817A (en) | 1971-06-29 |
Family
ID=11792196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US802946*A Expired - Lifetime US3589817A (en) | 1968-02-27 | 1969-02-27 | Photoelectric web defect-detecting apparatus which provides for overcoming the ray-diverging effect of roller curvature |
Country Status (3)
Country | Link |
---|---|
US (1) | US3589817A (fr) |
JP (1) | JPS5114039B1 (fr) |
DE (1) | DE1910048A1 (fr) |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4911390A (fr) * | 1972-06-01 | 1974-01-31 | ||
JPS5249880A (en) * | 1975-10-18 | 1977-04-21 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
US4302108A (en) * | 1979-01-29 | 1981-11-24 | Polaroid Corporation | Detection of subsurface defects by reflection interference |
US4703187A (en) * | 1985-03-15 | 1987-10-27 | Swiss Aluminium Ltd. | Method and apparatus for the determination of the thickness of transparent layers of lacquer |
US4982104A (en) * | 1988-07-29 | 1991-01-01 | Fuji Photo Film Co., Ltd. | Web drive control apparatus |
US5066865A (en) * | 1989-09-01 | 1991-11-19 | Measurex Corporation | Single sided reflectance sensor for measuring select physical properties of a material using one or more wavelengths of radiation |
US5075562A (en) * | 1990-09-20 | 1991-12-24 | Eastman Kodak Company | Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface |
US5075560A (en) * | 1990-09-20 | 1991-12-24 | Eastman Kodak Company | Moire distance measurements using a grating printed on or attached to a surface |
US5488480A (en) * | 1994-02-16 | 1996-01-30 | Cmd Corporation | Apparatus and method for detecting a heat seal in a moving plastic film |
US5678447A (en) * | 1996-04-17 | 1997-10-21 | Eastman Kodak Company | On-line web planarity measurement apparatus and method |
US5861078A (en) * | 1993-08-12 | 1999-01-19 | Cmd Corporation | Method and apparatus for detecting a seal on a plastic bag |
US5959737A (en) * | 1993-02-25 | 1999-09-28 | Nikkiso Co., Ltd. | Frame feeding apparatus and automatic sheet thickness detection apparatus |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3701267A1 (de) * | 1987-01-17 | 1988-07-28 | Achenbach Buschhuetten Gmbh | Planheitsmesseinrichtung fuer bandfoermiges walzgut |
JPS646390U (fr) * | 1987-06-30 | 1989-01-13 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2371963A (en) * | 1944-01-07 | 1945-03-20 | Gen Electric | Scanning apparatus for moving strip |
US2487511A (en) * | 1947-05-21 | 1949-11-08 | Rca Corp | Contour indicating device |
US3117182A (en) * | 1961-09-12 | 1964-01-07 | Rudolf Hell Kommanditgesellsch | Facsimile transmitter |
US3206606A (en) * | 1961-07-20 | 1965-09-14 | Eastman Kodak Co | Photosensitive inspection method and apparatus |
US3410643A (en) * | 1961-04-14 | 1968-11-12 | Saint Gobain | Apparatus for detecting and recording the locations of defects in sheet material in two dimensions |
-
1968
- 1968-02-27 JP JP43011961A patent/JPS5114039B1/ja active Pending
-
1969
- 1969-02-27 DE DE19691910048 patent/DE1910048A1/de active Pending
- 1969-02-27 US US802946*A patent/US3589817A/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2371963A (en) * | 1944-01-07 | 1945-03-20 | Gen Electric | Scanning apparatus for moving strip |
US2487511A (en) * | 1947-05-21 | 1949-11-08 | Rca Corp | Contour indicating device |
US3410643A (en) * | 1961-04-14 | 1968-11-12 | Saint Gobain | Apparatus for detecting and recording the locations of defects in sheet material in two dimensions |
US3206606A (en) * | 1961-07-20 | 1965-09-14 | Eastman Kodak Co | Photosensitive inspection method and apparatus |
US3117182A (en) * | 1961-09-12 | 1964-01-07 | Rudolf Hell Kommanditgesellsch | Facsimile transmitter |
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4911390A (fr) * | 1972-06-01 | 1974-01-31 | ||
JPS5249880A (en) * | 1975-10-18 | 1977-04-21 | Omron Tateisi Electronics Co | Defect inspecting apparatus |
JPS5612815B2 (fr) * | 1975-10-18 | 1981-03-24 | ||
US4302108A (en) * | 1979-01-29 | 1981-11-24 | Polaroid Corporation | Detection of subsurface defects by reflection interference |
US4703187A (en) * | 1985-03-15 | 1987-10-27 | Swiss Aluminium Ltd. | Method and apparatus for the determination of the thickness of transparent layers of lacquer |
US4982104A (en) * | 1988-07-29 | 1991-01-01 | Fuji Photo Film Co., Ltd. | Web drive control apparatus |
US5066865A (en) * | 1989-09-01 | 1991-11-19 | Measurex Corporation | Single sided reflectance sensor for measuring select physical properties of a material using one or more wavelengths of radiation |
US5075562A (en) * | 1990-09-20 | 1991-12-24 | Eastman Kodak Company | Method and apparatus for absolute Moire distance measurements using a grating printed on or attached to a surface |
US5075560A (en) * | 1990-09-20 | 1991-12-24 | Eastman Kodak Company | Moire distance measurements using a grating printed on or attached to a surface |
US5959737A (en) * | 1993-02-25 | 1999-09-28 | Nikkiso Co., Ltd. | Frame feeding apparatus and automatic sheet thickness detection apparatus |
US5660674A (en) * | 1993-08-12 | 1997-08-26 | Cmd Corporation | Method and apparatus for registration of a seal and perforation on a plastic bag |
US5861078A (en) * | 1993-08-12 | 1999-01-19 | Cmd Corporation | Method and apparatus for detecting a seal on a plastic bag |
US5488480A (en) * | 1994-02-16 | 1996-01-30 | Cmd Corporation | Apparatus and method for detecting a heat seal in a moving plastic film |
US5701180A (en) * | 1994-02-16 | 1997-12-23 | Cmd Corporation | Apparatus and method for detecting a formation in a sheet material |
US5678447A (en) * | 1996-04-17 | 1997-10-21 | Eastman Kodak Company | On-line web planarity measurement apparatus and method |
Also Published As
Publication number | Publication date |
---|---|
JPS5114039B1 (fr) | 1976-05-06 |
DE1910048A1 (de) | 1969-09-11 |
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