US20230411061A1 - Laminated sheet - Google Patents
Laminated sheet Download PDFInfo
- Publication number
- US20230411061A1 US20230411061A1 US18/455,359 US202318455359A US2023411061A1 US 20230411061 A1 US20230411061 A1 US 20230411061A1 US 202318455359 A US202318455359 A US 202318455359A US 2023411061 A1 US2023411061 A1 US 2023411061A1
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- US
- United States
- Prior art keywords
- sample
- laminated sheet
- rate
- determined
- magnetic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 238000012545 processing Methods 0.000 claims abstract description 92
- 239000002245 particle Substances 0.000 claims abstract description 61
- 229910052751 metal Inorganic materials 0.000 claims abstract description 46
- 239000002184 metal Substances 0.000 claims abstract description 46
- 229920001187 thermosetting polymer Polymers 0.000 claims abstract description 34
- 239000006249 magnetic particle Substances 0.000 claims abstract description 21
- 239000011342 resin composition Substances 0.000 claims abstract description 21
- 239000000463 material Substances 0.000 claims abstract description 20
- 229920005989 resin Polymers 0.000 claims abstract description 17
- 239000011347 resin Substances 0.000 claims abstract description 17
- 229910010272 inorganic material Inorganic materials 0.000 claims abstract description 14
- 239000011230 binding agent Substances 0.000 claims abstract description 13
- 150000002484 inorganic compounds Chemical class 0.000 claims abstract description 12
- 230000035699 permeability Effects 0.000 claims description 105
- 230000008859 change Effects 0.000 claims description 63
- 238000012360 testing method Methods 0.000 claims description 62
- 239000000243 solution Substances 0.000 claims description 34
- 238000007654 immersion Methods 0.000 claims description 28
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 18
- 230000008961 swelling Effects 0.000 claims description 9
- 238000007747 plating Methods 0.000 claims description 8
- 239000002253 acid Substances 0.000 claims description 7
- 239000007864 aqueous solution Substances 0.000 claims description 7
- 229910000365 copper sulfate Inorganic materials 0.000 claims description 7
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 claims description 7
- 239000012141 concentrate Substances 0.000 claims description 5
- 239000013256 coordination polymer Substances 0.000 claims description 5
- 230000009467 reduction Effects 0.000 claims description 5
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims description 4
- 239000000460 chlorine Substances 0.000 claims description 4
- 229910052801 chlorine Inorganic materials 0.000 claims description 4
- JZCCFEFSEZPSOG-UHFFFAOYSA-L copper(II) sulfate pentahydrate Chemical compound O.O.O.O.O.[Cu+2].[O-]S([O-])(=O)=O JZCCFEFSEZPSOG-UHFFFAOYSA-L 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 104
- 229910045601 alloy Inorganic materials 0.000 description 38
- 239000000956 alloy Substances 0.000 description 38
- 239000003822 epoxy resin Substances 0.000 description 23
- 229920000647 polyepoxide Polymers 0.000 description 23
- 239000003795 chemical substances by application Substances 0.000 description 20
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 17
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 13
- 230000000052 comparative effect Effects 0.000 description 11
- 238000000034 method Methods 0.000 description 11
- 239000005011 phenolic resin Substances 0.000 description 11
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 10
- -1 imidazole compound Chemical class 0.000 description 10
- 239000000203 mixture Substances 0.000 description 9
- 229920005992 thermoplastic resin Polymers 0.000 description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 229910000859 α-Fe Inorganic materials 0.000 description 8
- 239000010949 copper Substances 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 150000002736 metal compounds Chemical class 0.000 description 6
- 230000002093 peripheral effect Effects 0.000 description 6
- 239000002966 varnish Substances 0.000 description 6
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 5
- 229930003836 cresol Natural products 0.000 description 5
- 150000002739 metals Chemical class 0.000 description 5
- 230000003472 neutralizing effect Effects 0.000 description 5
- 239000004843 novolac epoxy resin Substances 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000004841 bisphenol A epoxy resin Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 229910017052 cobalt Inorganic materials 0.000 description 4
- 239000010941 cobalt Substances 0.000 description 4
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 4
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 4
- 230000005496 eutectics Effects 0.000 description 4
- 238000002156 mixing Methods 0.000 description 4
- 229910052755 nonmetal Inorganic materials 0.000 description 4
- 239000012286 potassium permanganate Substances 0.000 description 4
- 238000001878 scanning electron micrograph Methods 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000002904 solvent Substances 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 229910018487 Ni—Cr Inorganic materials 0.000 description 3
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 3
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- 229910052799 carbon Inorganic materials 0.000 description 3
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 3
- 229920001577 copolymer Polymers 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 239000010955 niobium Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 229920003986 novolac Polymers 0.000 description 3
- 229910052698 phosphorus Inorganic materials 0.000 description 3
- 239000011574 phosphorus Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- RUEBPOOTFCZRBC-UHFFFAOYSA-N (5-methyl-2-phenyl-1h-imidazol-4-yl)methanol Chemical compound OCC1=C(C)NC(C=2C=CC=CC=2)=N1 RUEBPOOTFCZRBC-UHFFFAOYSA-N 0.000 description 2
- HECLRDQVFMWTQS-RGOKHQFPSA-N 1755-01-7 Chemical compound C1[C@H]2[C@@H]3CC=C[C@@H]3[C@@H]1C=C2 HECLRDQVFMWTQS-RGOKHQFPSA-N 0.000 description 2
- VPWNQTHUCYMVMZ-UHFFFAOYSA-N 4,4'-sulfonyldiphenol Chemical compound C1=CC(O)=CC=C1S(=O)(=O)C1=CC=C(O)C=C1 VPWNQTHUCYMVMZ-UHFFFAOYSA-N 0.000 description 2
- 229920000178 Acrylic resin Polymers 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
- 229910052582 BN Inorganic materials 0.000 description 2
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 2
- LCGLNKUTAGEVQW-UHFFFAOYSA-N Dimethyl ether Chemical compound COC LCGLNKUTAGEVQW-UHFFFAOYSA-N 0.000 description 2
- 229910017082 Fe-Si Inorganic materials 0.000 description 2
- 229910017133 Fe—Si Inorganic materials 0.000 description 2
- 229910008458 Si—Cr Inorganic materials 0.000 description 2
- 229910000808 amorphous metal alloy Inorganic materials 0.000 description 2
- 230000001588 bifunctional effect Effects 0.000 description 2
- IYJMFNNRVITCDG-UHFFFAOYSA-N biphenylene;phenol Chemical group OC1=CC=CC=C1.C1=CC=C2C3=CC=CC=C3C2=C1 IYJMFNNRVITCDG-UHFFFAOYSA-N 0.000 description 2
- 239000004842 bisphenol F epoxy resin Substances 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- 239000003054 catalyst Substances 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- ZUOUZKKEUPVFJK-UHFFFAOYSA-N diphenyl Chemical compound C1=CC=CC=C1C1=CC=CC=C1 ZUOUZKKEUPVFJK-UHFFFAOYSA-N 0.000 description 2
- 238000009472 formulation Methods 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 150000002506 iron compounds Chemical class 0.000 description 2
- 239000011572 manganese Substances 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Natural products CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 1
- 229910021364 Al-Si alloy Inorganic materials 0.000 description 1
- 229910000521 B alloy Inorganic materials 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910020516 Co—V Inorganic materials 0.000 description 1
- 229910019819 Cr—Si Inorganic materials 0.000 description 1
- 229910017518 Cu Zn Inorganic materials 0.000 description 1
- 229910017758 Cu-Si Inorganic materials 0.000 description 1
- 229910017752 Cu-Zn Inorganic materials 0.000 description 1
- 229910017931 Cu—Si Inorganic materials 0.000 description 1
- 229910017943 Cu—Zn Inorganic materials 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- 229910017061 Fe Co Inorganic materials 0.000 description 1
- 229910017060 Fe Cr Inorganic materials 0.000 description 1
- 229910002544 Fe-Cr Inorganic materials 0.000 description 1
- 229910002060 Fe-Cr-Al alloy Inorganic materials 0.000 description 1
- 229910017112 Fe—C Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910001030 Iron–nickel alloy Inorganic materials 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910017315 Mo—Cu Inorganic materials 0.000 description 1
- 229910001199 N alloy Inorganic materials 0.000 description 1
- 229910017709 Ni Co Inorganic materials 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 229910003267 Ni-Co Inorganic materials 0.000 description 1
- 229910003296 Ni-Mo Inorganic materials 0.000 description 1
- 229910003262 Ni‐Co Inorganic materials 0.000 description 1
- 229910018605 Ni—Zn Inorganic materials 0.000 description 1
- 229910001096 P alloy Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229910018598 Si-Co Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910002796 Si–Al Inorganic materials 0.000 description 1
- 229910008423 Si—B Inorganic materials 0.000 description 1
- 229910008453 Si—Co Inorganic materials 0.000 description 1
- 229910001035 Soft ferrite Inorganic materials 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910007565 Zn—Cu Inorganic materials 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 235000010290 biphenyl Nutrition 0.000 description 1
- 239000004305 biphenyl Substances 0.000 description 1
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical class C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 1
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical class C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- UPHIPHFJVNKLMR-UHFFFAOYSA-N chromium iron Chemical compound [Cr].[Fe] UPHIPHFJVNKLMR-UHFFFAOYSA-N 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- WCCJDBZJUYKDBF-UHFFFAOYSA-N copper silicon Chemical compound [Si].[Cu] WCCJDBZJUYKDBF-UHFFFAOYSA-N 0.000 description 1
- TVZPLCNGKSPOJA-UHFFFAOYSA-N copper zinc Chemical compound [Cu].[Zn] TVZPLCNGKSPOJA-UHFFFAOYSA-N 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000011256 inorganic filler Substances 0.000 description 1
- 229910003475 inorganic filler Inorganic materials 0.000 description 1
- 239000012948 isocyanate Substances 0.000 description 1
- 150000002513 isocyanates Chemical class 0.000 description 1
- 239000006247 magnetic powder Substances 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 150000002903 organophosphorus compounds Chemical class 0.000 description 1
- 229910000889 permalloy Inorganic materials 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 229920003987 resole Polymers 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 229910000702 sendust Inorganic materials 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- KCNSDMPZCKLTQP-UHFFFAOYSA-N tetraphenylen-1-ol Chemical compound C12=CC=CC=C2C2=CC=CC=C2C2=CC=CC=C2C2=C1C=CC=C2O KCNSDMPZCKLTQP-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
- H01F17/0013—Printed inductances with stacked layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/04—Fixed inductances of the signal type with magnetic core
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/14—Layered products comprising a layer of synthetic resin next to a particulate layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/18—Layered products comprising a layer of synthetic resin characterised by the use of special additives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/18—Layered products comprising a layer of synthetic resin characterised by the use of special additives
- B32B27/20—Layered products comprising a layer of synthetic resin characterised by the use of special additives using fillers, pigments, thixotroping agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/18—Layered products comprising a layer of synthetic resin characterised by the use of special additives
- B32B27/26—Layered products comprising a layer of synthetic resin characterised by the use of special additives using curing agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/28—Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42
- B32B27/283—Layered products comprising a layer of synthetic resin comprising synthetic resins not wholly covered by any one of the sub-groups B32B27/30 - B32B27/42 comprising polysiloxanes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/38—Layered products comprising a layer of synthetic resin comprising epoxy resins
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B27/00—Layered products comprising a layer of synthetic resin
- B32B27/42—Layered products comprising a layer of synthetic resin comprising condensation resins of aldehydes, e.g. with phenols, ureas or melamines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
- B32B3/02—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions
- B32B3/08—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by features of form at particular places, e.g. in edge regions characterised by added members at particular parts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B3/00—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
- B32B3/26—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer
- B32B3/30—Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer characterised by a layer formed with recesses or projections, e.g. hollows, grooves, protuberances, ribs
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B5/00—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts
- B32B5/22—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by the presence of two or more layers which are next to each other and are fibrous, filamentary, formed of particles or foamed
- B32B5/30—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by the presence of two or more layers which are next to each other and are fibrous, filamentary, formed of particles or foamed one layer being formed of particles, e.g. chips, granules, powder
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/02—Physical, chemical or physicochemical properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B7/00—Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
- B32B7/02—Physical, chemical or physicochemical properties
- B32B7/025—Electric or magnetic properties
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/01—Use of inorganic substances as compounding ingredients characterized by their specific function
- C08K3/013—Fillers, pigments or reinforcing additives
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/02—Elements
- C08K3/08—Metals
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/56—Organo-metallic compounds, i.e. organic compounds containing a metal-to-carbon bond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
- H01F1/12—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials
- H01F1/14—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys
- H01F1/20—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys in the form of particles, e.g. powder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
- H01F1/12—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials
- H01F1/14—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys
- H01F1/20—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys in the form of particles, e.g. powder
- H01F1/22—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys in the form of particles, e.g. powder pressed, sintered, or bound together
- H01F1/24—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys in the form of particles, e.g. powder pressed, sintered, or bound together the particles being insulated
- H01F1/26—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials metals or alloys in the form of particles, e.g. powder pressed, sintered, or bound together the particles being insulated by macromolecular organic substances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/24—Magnetic cores
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/24—Magnetic cores
- H01F27/255—Magnetic cores made from particles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2823—Wires
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2250/00—Layers arrangement
- B32B2250/04—4 layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2255/00—Coating on the layer surface
- B32B2255/04—Coating on the layer surface on a particulate layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2255/00—Coating on the layer surface
- B32B2255/20—Inorganic coating
- B32B2255/205—Metallic coating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2260/00—Layered product comprising an impregnated, embedded, or bonded layer wherein the layer comprises an impregnation, embedding, or binder material
- B32B2260/02—Composition of the impregnated, bonded or embedded layer
- B32B2260/025—Particulate layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2260/00—Layered product comprising an impregnated, embedded, or bonded layer wherein the layer comprises an impregnation, embedding, or binder material
- B32B2260/04—Impregnation, embedding, or binder material
- B32B2260/046—Synthetic resin
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2264/00—Composition or properties of particles which form a particulate layer or are present as additives
- B32B2264/10—Inorganic particles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2264/00—Composition or properties of particles which form a particulate layer or are present as additives
- B32B2264/10—Inorganic particles
- B32B2264/102—Oxide or hydroxide
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2264/00—Composition or properties of particles which form a particulate layer or are present as additives
- B32B2264/10—Inorganic particles
- B32B2264/105—Metal
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2264/00—Composition or properties of particles which form a particulate layer or are present as additives
- B32B2264/10—Inorganic particles
- B32B2264/107—Ceramic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2264/00—Composition or properties of particles which form a particulate layer or are present as additives
- B32B2264/12—Mixture of at least two particles made of different materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2270/00—Resin or rubber layer containing a blend of at least two different polymers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/20—Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/20—Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
- B32B2307/202—Conductive
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/20—Properties of the layers or laminate having particular electrical or magnetic properties, e.g. piezoelectric
- B32B2307/208—Magnetic, paramagnetic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/50—Properties of the layers or laminate having particular mechanical properties
- B32B2307/538—Roughness
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/70—Other properties
- B32B2307/732—Dimensional properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B5/00—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts
- B32B5/16—Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by features of a layer formed of particles, e.g. chips, powder or granules
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K2201/00—Specific properties of additives
- C08K2201/01—Magnetic additives
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/0006—Printed inductances
- H01F2017/0066—Printed inductances with a magnetic layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F17/00—Fixed inductances of the signal type
- H01F17/04—Fixed inductances of the signal type with magnetic core
- H01F2017/048—Fixed inductances of the signal type with magnetic core with encapsulating core, e.g. made of resin and magnetic powder
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/32—Composite [nonstructural laminate] of inorganic material having metal-compound-containing layer and having defined magnetic layer
Definitions
- the present invention relates to a laminated sheet.
- Patent Document 1 a sheet-shaped inductor including a wiring, and a magnetic layer covering the wiring and containing flat-shaped magnetic particles has been known (ref: for example, Patent Document 1 below).
- a slit may be formed in the surface of the inductor to reduce crosstalk, or the inductor may be immersed in a solution such as cleaning solution to clean the surface of the inductor.
- the present invention provides a laminated sheet having excellent processing stability.
- the present invention (1) includes a laminated sheet including a sheet-shaped inductor including a plurality of wirings and a magnetic layer embedding the plurality of wirings, and a processing stability layer disposed on at least one surface in a thickness direction of the inductor, wherein the magnetic layer includes a binder and a magnetic particle having a generally flat shape and whose material is a metal; the processing stability layer includes a cured product of a thermosetting resin composition; and the thermosetting resin composition includes a thermosetting resin as an essential component, and at least one kind of particle, as an optional component, selected from the group consisting of a first particle having a generally spherical shape and a second particle having a generally flat shape and whose material is an inorganic compound.
- the laminated sheet includes the processing stability layer, it is excellent in processing stability.
- the present invention (2) includes the laminated sheet described in (1) satisfying at least one test of the following test (a) to test (e).
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- the laminated sheet satisfies at least one test of the test (a) to test (e), it is excellent in stability with respect to process processing using a chemical solution.
- the present invention (3) includes the laminated sheet described in (1) or (2), wherein the arithmetic average roughness Ra of one surface in the thickness direction of the laminated sheet is 10 ⁇ m or less.
- the laminated sheet has the arithmetic average roughness Ra of one surface in the thickness direction of 10 ⁇ m or less, it can ensure excellent mountability.
- the laminated sheet of the present invention is excellent in processing stability.
- FIG. 1 shows a front cross-sectional view of one embodiment of a laminated sheet of the present invention.
- FIG. 2 shows a front cross-sectional view of an inductor in the middle of production of the laminated sheet shown in FIG. 1 .
- FIG. 3 shows a front cross-sectional view of an embodiment in which a slit is formed in the laminated sheet shown in FIG. 1 .
- FIGS. 4 A to 4 C show front cross-sectional views of a usage embodiment of the laminated sheet shown in FIG. 1 :
- FIG. 4 A illustrating a modified example in which a via is formed in the laminated sheet
- FIG. 4 B illustrating a modified example in which a processing stability layer newly fills the via
- FIG. 4 C illustrating a modified example in which the via exposes a portion of a wiring.
- FIGS. 5 A to 5 D show front cross-sectional views of a modified example of a laminated sheet of one embodiment, and a usage embodiment thereof:
- FIG. 5 A illustrating a modified example in which a processing stability layer is disposed on the other surface in a thickness direction of an inductor
- FIG. 5 B illustrating a modified example in which a via is formed in the laminated sheet shown in FIG. 5 A .
- FIG. 5 C illustrating a modified example in which a processing stability layer newly fills the via in the laminated sheet shown in FIG. 5 B .
- FIG. 5 D illustrating a modified example in which the via exposes a portion of a wiring.
- FIG. 6 shows a front cross-sectional view in which a slit is formed in a laminated sheet of Comparative Example 1.
- FIG. 7 shows an image processing view of an SEM image in which a slit is formed in a laminated sheet of Example 1.
- FIG. 8 shows an image processing view of an SEM image in which a slit is formed in a laminated sheet of Comparative Example 1.
- FIG. 1 One embodiment of a laminated sheet of the preset invention is described with reference to FIG. 1 .
- a laminated sheet 1 has a predetermined thickness, and has a sheet shape extending in a plane direction perpendicular to a thickness direction.
- the laminated sheet 1 has a sheet-shaped inductor 2 , and a processing stability layer 3 .
- the inductor 2 has a predetermined thickness, and has the same outer shape as the laminated sheet 1 .
- the inductor 2 includes a plurality of wirings 4 , and a magnetic layer 5 .
- the plurality of wirings 4 are adjacent to each other at spaced intervals in a direction (hereinafter, may be referred to as a width direction) perpendicular to a direction in which each of the wirings 4 extends and the thickness direction.
- the plurality of wirings 4 are parallel with each other.
- a shape, a dimension, a configuration, a material, and a formulation (filling rate, content ratio, or the like) of the wiring 4 are, for example, described in Japanese Unexamined Patent Publication No. 2019-220618 or the like.
- the wiring 4 has a generally circular shape when viewed in the cross-sectional view (front cross-sectional view along a direction perpendicular to the direction in which the wiring 4 extends), and the lower limit of the diameter thereof is, for example, 25 ⁇ m, and the upper limit of the diameter thereof is, for example, 2,000 ⁇ m.
- the wiring 4 preferably includes a conducting wiring made of a conductor, and an insulating film covering a peripheral surface of the conducting wiring.
- the lower limit of an interval between the wirings 4 adjacent to each other is, for example, 10 ⁇ m, preferably 50 ⁇ m
- the upper limit of an interval between the wirings 4 adjacent to each other is, for example, 5,000 ⁇ m, preferably 3,000 ⁇ m.
- the upper limit of a ratio (diameter/interval) of the diameter of the wiring 4 to the interval between the wirings 4 adjacent to each other is, for example, 200, preferably 50, and the lower limit thereof is, for example, 0.01, preferably 0.1.
- the magnetic layer 5 improves the inductance of the laminated sheet 1 .
- the magnetic layer has the same outer shape as the laminated sheet 1 when viewed from the top.
- the magnetic layer 5 has a plate shape extending in the plane direction. Further, the magnetic layer 5 embeds the plurality of wirings 4 when viewed in the cross-sectional view.
- the magnetic layer 5 has a one surface 6 , an other surface 7 , and an inner peripheral surface 8 .
- the one surface 6 forms one surface in the thickness direction of the magnetic layer 5 .
- the other surface 7 forms the other surface in the thickness direction of the magnetic layer 5 .
- the other surface 7 is spaced apart from the other side in the thickness direction of the one surface 6 .
- the inner peripheral surface 8 is spaced apart from the one surface 6 and the other surface 7 in the thickness direction.
- the inner peripheral surface 8 is located between the one surface 6 and the other surface 7 in the thickness direction.
- the inner peripheral surface 8 is in contact with the outer peripheral surface of the wiring 4 .
- the magnetic layer 5 contains a binder and magnetic particles.
- a material for the magnetic layer 5 is a magnetic composition containing the binder and the magnetic particles.
- the binder is a matrix for dispersing the magnetic particles.
- the binder include thermoplastic resins such as an acrylic resin and thermosetting resins such as an epoxy resin composition.
- the acrylic resin includes, for example, a carboxyl group-including acrylic acid ester copolymer.
- the epoxy resin composition includes, for example, an epoxy resin (cresol novolac epoxy resin or the like) as a main agent, a curing agent for an epoxy resin (phenol resin or the like), and a curing accelerator for an epoxy resin (imidazole compound or the like).
- the thermoplastic resin and the thermosetting resin can be used alone or in combination of two or more, and preferably, the thermoplastic resin and the thermosetting resin are used in combination of two or more.
- a volume ratio of the binder in the magnetic composition is a remaining portion of a volume ratio of the magnetic particles to be described later.
- the magnetic particles are, for example, dispersed in the binder.
- the magnetic particles have a generally flat shape.
- the generally flat shape includes a generally plate shape.
- the lower limit of a flat ratio (flat degree) of the magnetic particles is, for example, 8, preferably 15, and the upper limit thereof is, for example, 500, preferably 450.
- the flat ratio is, for example, calculated as an aspect ratio obtained by dividing a median diameter of the magnetic particles by an average thickness of the magnetic particles.
- the lower limit of the median diameter of the magnetic particles is, for example, 3.5 ⁇ m, preferably 10 ⁇ m, and the upper limit thereof is, for example, 200 ⁇ m, preferably 150 ⁇ m.
- the lower limit of the average thickness of the magnetic particles is, for example, 0.1 ⁇ m, preferably 0.2 ⁇ m, and the upper limit thereof is, for example, 3.0 ⁇ m, preferably 2.5 ⁇ m.
- a material for the magnetic particles is a metal.
- the metal include magnetic bodies such as a soft magnetic body and a hard magnetic body.
- a soft magnetic body is used.
- the soft magnetic body examples include a single metal body containing one kind of metal element in a state of a pure material and an alloy body which is a eutectic (mixture) of one or more kinds of metal element (first metal element) and one or more kinds of metal element (second metal element) and/or non-metal element (carbon, nitrogen, silicon, phosphorus, or the like). These may be used alone or in combination of two or more.
- the single metal body includes a metal single body consisting of only one kind of metal element (first metal element).
- the first metal element is, for example, appropriately selected from iron (Fe), cobalt (Co), nickel (Ni), and another metal element that can be included as the first metal element of the soft magnetic body.
- examples of the single metal body include an embodiment including a core including only one kind of metal element and a surface layer including an inorganic material and/or an organic material which modify/modifies a portion of or the entire surface of the core, and an embodiment in which an organic metal compound and an inorganic metal compound including the first metal element are decomposed (thermally decomposed or the like). More specifically, an example of the latter embodiment includes an iron powder (may be referred to as a carbonyl iron powder) in which an organic iron compound (specifically, carbonyl iron) including iron as the first metal element is thermally decomposed. The position of a layer including the inorganic material and/or the organic material modifying a portion including only one kind of metal element is not limited to the surface described above.
- the organic metal compound and the inorganic metal compound that can obtain the single metal body are not particularly limited, and can be appropriately selected from a known or conventional organic metal compound and inorganic metal compound that can obtain the single metal body of the soft magnetic body.
- the alloy body is not particularly limited as long as it is a eutectic of one or more kinds of metal element (first metal element) and one or more kinds of metal element (second metal element) and/or non-metal element (carbon, nitrogen, silicon, phosphorus, or the like) and can be used as an alloy body of a soft magnetic body.
- the first metal element is an essential element in the alloy body, and examples thereof include iron (Fe), cobalt (Co), and nickel (Ni).
- the alloy body is referred to as a Fe-based alloy
- the first metal element is Co
- the alloy body is referred to as a Co-based alloy
- the first metal element is Ni
- the alloy body is referred to as a Ni-based alloy.
- the second metal element is an element (auxiliary component) which is auxiliarily included in the alloy body, and is a metal element which is compatible (eutectic) with the first metal element.
- metal element which is compatible (eutectic) with the first metal element.
- examples thereof include iron (Fe) (when the first metal element is other than Fe), cobalt (Co) (when the first metal element is other than Co), nickel (Ni) (when the first metal element is other than Ni), chromium (Cr), aluminum (Al), silicon (Si), copper (Cu), silver (Ag), manganese (Mn), calcium (Ca), barium (B a), titanium (Ti), zirconium (Zr), hafnium (Hf), vanadium (V), niobium (Nb), tantalum (Ta), molybdenum (Mo), tungsten (W), ruthenium (Ru), rhodium (Rh), zinc (Zn), gallium (Ga), indium (In), german
- the non-metal element is an element (auxiliary component) which is auxiliarily included in the alloy body and is a non-metal element which is compatible (eutectic) with the first metal element, and examples thereof include boron (B), carbon (C), nitrogen (N), silicon (Si), phosphorus (P), and sulfur (S). These may be used alone or in combination of two or more.
- Fe-based alloy which is one example of an alloy body
- magnetic stainless steel Fe—Cr—Al—Si alloy
- Sendust Fe—Si—Al alloy
- permalloy Fe—Ni alloy
- Fe—Ni—Mo alloy Fe—Ni—Mo—Cu alloy
- Fe—Ni—Co alloy Fe—Cr alloy, Fe—Cr—Al alloy, Fe—Ni—Cr alloy, Fe—Ni—Cr—Si alloy, silicon copper (Fe—Cu—Si alloy), Fe—Si alloy, Fe—Si—B(—Cu—Nb) alloy, Fe—B—Si—Cr alloy, Fe—Si—Cr—Ni alloy, Fe—Si—Cr alloy, Fe—Si—Al—Ni—Cr alloy, Fe—Ni—Si—Co alloy, Fe—N alloy, Fe—C alloy, Fe—B alloy, Fe—P alloy, ferrite (including stainless
- Co-based alloy which is one example of an alloy body
- Co—Ta—Zr and a cobalt (Co)-based amorphous alloy.
- Ni-based alloy which is one example of an alloy body includes a Ni—Cr alloy.
- the lower limit of a volume ratio of the magnetic particles in the magnetic composition is, for example, 40% by volume, preferably 50% by volume, more preferably 60% by volume, and the upper limit thereof is, for example, 95% by volume, preferably 90% by volume.
- the lower limit of a thickness of the inductor 2 is, for example, 30 ⁇ m, preferably 40 ⁇ m, and the upper limit of the thickness of the inductor 2 is, for example, 2,500 ⁇ m, preferably 2,000 ⁇ m.
- the lower limit of a ratio of the thickness of the inductor 2 to the thickness of the laminated sheet 1 is, for example, 0.1, preferably 0.3, more preferably 0.7, and the upper limit thereof is, for example, 0.999, preferably 0.990, more preferably 0.980.
- the processing stability layer 3 improves the surface processability with respect to the one surface 6 and the other surface 7 of the inductor 2 .
- the processing stability layer 3 is disposed on the one surface 6 and the other surface 7 of the inductor 2 . Specifically, the processing stability layer 3 is in contact with the entire one surface 6 and the entire other surface 7 of the magnetic layer 5 .
- Each of the two processing stability layers 3 has a sheet shape extending in the plane direction.
- One surface in the thickness direction of the processing stability layer 3 located on one side in the thickness direction of the inductor 2 forms one surface in the thickness direction of the laminated sheet 1 .
- the upper limit of the arithmetic average roughness Ra of one surface in the thickness direction of the laminated sheet 1 is, for example, 10 ⁇ m, preferably 5 ⁇ m, more preferably 1 ⁇ m, and the lower limit thereof is, for example, 0.001 ⁇ m.
- the other surface in the thickness direction of the processing stability layer 3 located on the other surface in the thickness direction of the inductor 2 forms the other surface in the thickness direction of the laminated sheet 1 .
- the upper limit of the arithmetic average roughness Ra of one surface in the thickness direction of the other surface in the thickness direction of the laminated sheet 1 is, for example, 10 ⁇ m, preferably 5 ⁇ m, more preferably 1 ⁇ m, and the lower limit thereof is, for example, 0.001 ⁇ m.
- the arithmetic average roughness Ra of one surface and/or the other surface in the thickness direction of the laminated sheet 1 is the above-described upper limit or less, it is possible to ensure excellent mountability.
- the arithmetic average roughness Ra of one surface and the other surface in the thickness direction of the laminated sheet 1 is determined with a stylus-type surface shape measuring device.
- the processing stability layer 3 includes a cured product of a thermosetting resin composition.
- a material for the processing stability layer 3 includes the thermosetting resin composition.
- thermosetting resin composition includes a thermosetting resin as an essential component and particles as an optional component.
- the thermosetting resin includes a main agent, a curing agent, and a curing accelerator.
- the main agent examples include an epoxy resin and a silicone resin, and preferably, an epoxy resin is used.
- the epoxy resin examples include bifunctional epoxy resins such as a bisphenol A epoxy resin, a bisphenol F epoxy resin, a bisphenol S epoxy resin, a modified bisphenol A epoxy resin, a modified bisphenol F epoxy resin, a modified bisphenol S epoxy resin, and a biphenyl epoxy resin; and trifunctional or more polyfunctional epoxy resins such as a phenol novolac epoxy resin, a cresol novolac epoxy resin, a trishydroxyphenylmethane epoxy resin, a tetraphenylol ethane epoxy resin, and a dicyclopentadiene epoxy resin.
- These epoxy resins may be used alone or in combination of two or more.
- a bifunctional epoxy resin is used, more preferably, a bisphenol A epoxy resin is used.
- the lower limit of an epoxy equivalent of the epoxy resin is, for example, 10 g/eq., and the upper limit thereof is, for example, 1,000 g/eq.
- examples of the curing agent include a phenol resin and an isocyanate resin.
- examples of the phenol resin include polyfunctional phenol resins such as a phenol novolac resin, a cresol novolac resin, a phenol aralkyl resin, a phenol biphenylene resin, a dicyclopentadiene phenol resin, and a resol resin. These may be used alone or in combination of two or more.
- phenol resin preferably, a phenol novolac resin and a phenol biphenylene resin are used.
- the lower limit of the total sum of hydroxyl groups in the phenol resin is, for example, 0.7 equivalents, preferably 0.9 equivalents, and the upper limit thereof is, for example, 1.5 equivalents, preferably 1.2 equivalents with respect to 1 equivalent of epoxy groups in the epoxy resin.
- the lower limit of the number of parts by mass of the curing agent is, for example, 1 part by mass
- the upper limit thereof is, for example, 50 parts by mass with respect to 100 parts by mass of the main agent.
- the curing accelerator is a catalyst (thermosetting catalyst) which promotes curing of the main agent (preferably, epoxy resin curing accelerator), and examples thereof include an organic phosphorus compound, and an imidazole compound such as 2-phenyl-4-methyl-5-hydroxymethylimidazole (2P4MHZ).
- the lower limit of the number of parts by mass of the curing accelerator is, for example, 0.05 parts by mass, and the upper limit thereof is, for example, 5 parts by mass with respect to 100 parts by mass of the main agent.
- the particles are an optional component in the thermosetting resin composition.
- the particles are dispersed in the thermosetting resin.
- the particles are at least one kind selected from the group consisting of first particles and second particles.
- the first particles have a generally spherical shape.
- the lower limit of the median diameter of the first particles is, for example, 1 ⁇ m, preferably 5 ⁇ m, and the upper limit of the median diameter of the first particles is, for example, 250 ⁇ m, preferably 200 ⁇ m.
- the median diameter of the first particles is determined with a laser diffraction particle size distribution measuring device.
- the median diameter of the first particles can be also determined, for example, by binarization process by cross-sectional observation of the laminated sheet 1 .
- a material for the first particles is not particularly limited.
- Examples of the material for the first particles include metals, an inorganic compound, and an organic compound, and in order to increase the thermal expansion coefficient, preferably, metals and an inorganic compound are used.
- the metals are included in the thermosetting resin composition when the processing stability layer 3 functions as an inductance-improving layer.
- An example of the metals includes the magnetic body illustrated in the magnetic layer 5 , and preferably, an organic iron compound including iron as the first metal element is used, more preferably, carbonyl iron is used.
- the inorganic compound is included in the thermosetting resin composition when the processing stability layer 3 functions as a thermal expansion coefficient-suppressing layer.
- An example of the inorganic compound includes an inorganic filler, and specifically, silica and alumina are used, preferably, silica is used.
- the first particles preferably, spherical silica is used, and preferably, spherical carbonyl iron is used.
- the second particles have a generally flat shape.
- the generally flat shape includes a generally plate shape.
- the lower limit of a flat ratio (flat degree) of the second particles is, for example, 8, preferably 15, and the upper limit thereof is, for example, 500, preferably 450.
- the flat ratio of the second particles is determined by the same calculation method as the flat ratio of the magnetic particles in the magnetic layer 5 described above.
- the lower limit of the median diameter of the second particles is, for example, 1 ⁇ m, preferably 5 ⁇ m, and the upper limit of the median diameter of the second particles is, for example, 250 ⁇ m, preferably 200 ⁇ m.
- the median diameter of the second particles is determined in the same manner as that of the first particles.
- the lower limit of the average thickness of the second particles is, for example, 0.1 ⁇ m, preferably 0.2 ⁇ m, and the upper limit thereof is, for example, 3.0 ⁇ m, preferably 2.5 ⁇ m.
- a material for the second particles is an inorganic compound.
- An example of the inorganic compound includes a thermally conductive compound such as boron nitride. Accordingly, preferably, the inorganic compound is included in the thermosetting resin composition when the processing stability layer 3 functions as a thermal conductivity-improving layer.
- the second particles preferably, a flat-shaped boron nitride is used.
- thermosetting resin composition One kind or both of the first particles and the second particles are included in the thermosetting resin composition.
- the lower limit of the number of parts by mass of the particles is, for example, 10 parts by mass, preferably 50 parts by mass, and the upper limit thereof is, for example, 2,000 parts by mass, preferably 1,500 parts by mass with respect to 100 parts by mass of the thermosetting resin.
- the lower limit of a content ratio of the particles in the cured product is, for example, 10% by mass, and the upper limit thereof is, for example, 90% by mass.
- the lower limit of the number of parts by mass of the second particles is, for example, 30 parts by mass
- the upper limit thereof is, for example, 300 parts by mass with respect to 100 parts by mass of the first particles.
- thermosetting resin composition may not include the particles.
- the lower limit of a thickness of the processing stability layer 3 is, for example, 1 ⁇ m, preferably 10 ⁇ m, and the upper limit thereof is, for example, 1,000 ⁇ m, preferably 100 ⁇ m.
- the lower limit of a ratio of the thickness of the processing stability layer 3 in the thickness of the laminated sheet 1 is, for example, 0.001, preferably 0.005, more preferably 0.01, and the upper limit thereof is, for example, 0.5, preferably 0.3, more preferably 0.1.
- the thickness of the two processing stability layers 3 may be the same or different from each other.
- the lower limit of a ratio (thickness of the processing stability layer 3 on one side in the thickness direction/thickness of the processing stability layer 3 on the other side) of the thickness of the processing stability layer 3 located on one side in the thickness direction of the inductor 2 with respect to the thickness of the processing stability layer 3 located on the other side in the thickness direction of the inductor 2 is, for example, 0.05, preferably 0.1, and the upper limit thereof is 10.
- the inductor 2 is prepared.
- the plurality of wirings 4 are prepared to be sandwiched between the two magnetic sheets.
- the inductor 2 is, for example, prepared by a method described in Japanese Unexamined Patent Publication No. 2019-220618 or the like.
- the processing stability sheet 9 is formed from the material for the processing stability layer 3 into a sheet shape.
- the processing stability sheet 9 preferably includes a B-stage thermosetting resin composition.
- the above-described material can be also prepared as a varnish by further blending a solvent into the above-described thermosetting resin composition.
- a thermoplastic resin can be further blended in the material.
- the solvent examples include alcohol compounds such as methanol, ether compounds such as dimethyl ether, and ketone compounds such as methyl ethyl ketone and cyclohexanone.
- a mixing ratio of the solvent is adjusted so that the lower limit of the mass ratio of the solid content in the varnish is, for example, 10% by mass, and the upper limit thereof is, for example, 95% by mass.
- thermoplastic resin includes a thermoplastic resin illustrated in the binder of the magnetic layer 5 .
- the lower limit of the number of parts by mass of the thermoplastic resin is, for example, 1 part by mass, and the upper limit thereof is, for example, 100 parts by mass with respect to 100 parts by mass of the thermosetting resin.
- the varnish is applied to the surface of a release sheet that is not shown to be then dried to form the processing stability sheet 9 .
- the two processing stability sheets 9 and the inductor 2 are pressed from both sides in the thickness direction.
- the two processing stability sheets 9 are attached to each of the one surface 6 and the other surface 7 of the inductor 2 .
- the processing stability layer 3 disposed on both sides in the thickness direction of the inductor 2 is formed.
- the laminated sheet 1 is obtained.
- the laminated sheet 1 satisfies, for example, at least one test of the test (a) to test (e).
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- the upper limit of the rate of change of the magnetic permeability of the sample in the test (a) is preferably 4%, more preferably 3%.
- the laminated sheet 1 is excellent in stability with respect to the immersion of the copper sulfate solution of the electrolytic copper plating.
- the upper limit of the rate of change of the magnetic permeability of the sample in the test (b) is preferably 4%, more preferably 3%.
- the laminated sheet 1 is excellent in stability with respect to the immersion of the acid active solution.
- the upper limit of the rate of change of the magnetic permeability of the sample in the test (c) is preferably 4%, more preferably 3%.
- Reduction Solution Securiganth P manufactured by Atotech Japan K.K. in the test (c) includes a sulfuric acid aqueous solution, and is used as a neutralizing solution (neutralizing agent or an aqueous solution for neutralization). Therefore, when the test (c) is satisfied, the laminated sheet 1 is excellent in stability with respect to the immersion of the neutralizing solution.
- the upper limit of the rate of change of the magnetic permeability of the sample in the test (d) is preferably 4%, more preferably 3%.
- Concentrate Compact CP manufactured by Atotech Japan K.K. in the test (d) includes a potassium permanganate solution. Therefore, when the test (d) is satisfied, the laminated sheet 1 is excellent in stability with respect to the immersion of the potassium permanganate solution of desmear (cleaning).
- the upper limit of the rate of change of the magnetic permeability of the sample in the test (e) is preferably 4%, more preferably 3%.
- Swelling Dip Securiganth P manufactured by Atotech Japan K.K. in the test (e) is an aqueous solution containing glycol ethers and sodium hydroxide, and is used as a swelling solution. Therefore, when the test (e) is satisfied, the laminated sheet 1 is excellent in stability with respect to the immersion of the swelling solution.
- the laminated sheet 1 is excellent in stability with respect to the immersion of the copper sulfate solution of the electrolytic copper plating, the acid active solution, the neutralizing solution, the potassium permanganate solution of the desmear (cleaning), and the swelling solution, and is excellent in stability with respect to various processes using these solutions.
- the laminated sheet 1 is immersed in various chemical solutions (including the copper sulfate solution of the electrolytic copper plating, the acid active solution, the neutralizing solution, the potassium permanganate solution of the desmear (cleaning), the swelling solution, or the like) in accordance with its purpose and applications to be subjected to surface treatment.
- various chemical solutions including the copper sulfate solution of the electrolytic copper plating, the acid active solution, the neutralizing solution, the potassium permanganate solution of the desmear (cleaning), the swelling solution, or the like
- the slit 10 is formed on one side in the thickness direction of the magnetic layer 5 .
- the slit 10 is located between the wirings 4 adjacent to each other when projected in the thickness direction.
- the slit 10 penetrates the processing stability layer 3 in the thickness direction, and is formed in one surface in the thickness direction of the magnetic layer 5 to the middle thereof.
- the slit 10 is parallel with the wiring 4 , and is along the direction in which the wiring 4 extends.
- a width of the slit 10 is not particularly limited.
- the lower limit of the width of the slit 10 is, for example, 10 ⁇ m, and the upper limit thereof is 1,000 ⁇ m.
- a depth of the slit 10 is not particularly limited.
- a method for forming the slit 10 is not particularly limited, and examples thereof include contact-type cutting using a dicing saw 11 and non-contact-type cutting using a laser (not shown).
- the dicing saw 11 includes a dicing blade having a disc shape.
- processing is carried out from one side in the thickness direction of the laminated sheet 1 with respect to one surface in the thickness direction of the laminated sheet 1 .
- the laminated sheet 1 in which the slit 10 is formed is obtained.
- the laminated sheet 1 includes the processing stability layer 3 , it is excellent in processing stability.
- the laminated sheet 1 does not include the processing stability layer 3 and consists of only the inductor 2 , the inner end portion facing the slit 10 in the one surface 6 of the magnetic layer 5 warps up (is raised) toward one side in the thickness direction at the time of forming the slit 10 in the magnetic layer 5 .
- the slit 10 is formed in the magnetic layer 5 , since the magnetic particles are made of the metals, they are difficult to crack, and since the shape of these are generally flat, the magnetic layer 5 moves to one side in the thickness direction, while entraining the binder around the magnetic particles.
- the laminated sheet 1 of one embodiment includes the processing stability layer 3 , and the processing stability layer 3 contains at least one kind of particles, as an optional component, selected from the group consisting of the first particles and the second particles.
- the processing stability layer 3 does not contain the particles, there is no deformation of the processing stability layer 3 due to the movement of the above-described particles, and therefore, it is possible to suppress the deformation of the magnetic layer 5 by the cured product in the processing stability layer 3 .
- the processing stability layer 3 contains the first particles having a generally spherical shape
- the movement of the first particles in the processing stability layer 3 is suppressed, while entraining the binder around the first particles. Therefore, the deformation of the magnetic layer 5 can be suppressed by the cured product in the processing stability layer 3 .
- the processing stability layer 3 contains the second particles whose material is an inorganic compound, even when the shape of these is generally flat, since the material for the second particles is the fragile inorganic compound, the second particles easily crack at the time of forming the slit 10 in the magnetic layer 5 . Therefore, the movement of the second particles in the processing stability layer 3 is suppressed. As a result, the deformation of the magnetic layer can be suppressed by the cured product in the processing stability layer 3 .
- the laminated sheet 1 of the present embodiment includes the processing stability layer 3 described above, when the slit 10 is formed in the laminated sheet 1 , it is possible to suppress the deformation of the magnetic layer 5 .
- a varnish is applied to a release sheet.
- the varnish may be also applied to the one surface 6 and the other surface 7 of the magnetic layer 5 .
- the via 12 is a through hole which exposes the central portion of one surface in the thickness direction of the wiring 4 and penetrates in the thickness direction of the magnetic layer 5 and the processing stability layer 3 located on one side in the thickness direction with respect to the wiring 4 .
- the via 12 has a generally circular shape when viewed from the top (not shown).
- the via 12 also has a tapered shape in which the opening area expands toward one side in the thickness direction when viewed in the cross-sectional view.
- Examples of a method for forming the via 12 include contact-type opening using a drill and non-contact-type opening using a laser.
- the processing stability layer 3 further fills the wiring 4 exposed from the via 12 and the magnetic layer 5 .
- the via 12 is formed again.
- the via 12 exposes the central portion of one surface in the thickness direction of the wiring 4 , and does not expose the magnetic layer 5 . That is, the inner-side surface of the magnetic layer 5 is covered with the newly filled processing stability layer 3 .
- the via 12 is formed, and the laminated sheet 1 in which the inner-side surface of the magnetic layer 5 corresponding thereto is covered with the processing stability layer 3 is obtained.
- the processing stability layer 3 is disposed on one surface and the other surface in the thickness direction of the inductor 2 .
- the processing stability layer 3 may be also disposed on only one surface, or, as shown in FIG. 5 A , may be disposed on only the other surface.
- the via 12 may be also formed in the magnetic layer 5 in the laminated sheet 1 described above.
- the processing stability layer 3 is disposed on the other surface in the thickness direction of the inductor 2 , and the processing stability layer 3 may be also further formed on one surface in the thickness direction of the inductor 2 of the laminated sheet 1 in which the via 12 is formed in the inductor 2 .
- the processing stability layer 3 on one side in the thickness direction fills the via 12 .
- the via 12 is formed again. However, the via 12 exposes the central portion of one surface in the thickness direction of the wiring 4 , and does not expose the magnetic layer 5 .
- An electrically conductive layer (not shown) can be also formed in the via 12 .
- Examples of a material for the electrically conductive layer (not shown) include conductive materials such as copper.
- an electrolytic copper plating solution is used in the formation of the electrically conductive layer.
- the laminated sheet 1 including the electrically conductive layer (not shown) is obtained.
- Example and Comparative Example shown below.
- the present invention is however not limited by the following Example and Comparative Example.
- the specific numerical values in mixing ratio (content ratio), property value, and parameter used in the following description can be replaced with upper limit values (numerical values defined as “or less” or “below”) or lower limit values (numerical values defined as “or more” or “above”) of corresponding numerical values in mixing ratio (content ratio), property value, and parameter described in the above-described “Embodiment of the Invention”.
- the laminated sheet 1 shown in FIG. 1 was produced based on one embodiment.
- the inductor 2 was fabricated. Specifically, the inductor 2 in which the plurality of wirings 4 having a radius of 110 ⁇ m were covered with the magnetic layer 5 consisting of a first magnetic sheet having a thickness of 100 ⁇ m and a second magnetic sheet having a thickness of 125 ⁇ m was fabricated.
- the first magnetic sheet contained 60% by volume of spherical magnetic powder, 9.7% by volume of cresol novolac epoxy resin (main agent), 9.7% by volume of phenol resin (curing agent), 0.3% by volume of imidazole compound (curing accelerator), and 18.7% by volume of thermoplastic resin (carboxyl group-including acrylic acid ester copolymer).
- the second magnetic sheet contained 55% by volume of magnetic particles made of a flat-shaped Fe—Si alloy, 11.0% by volume of cresol novolac epoxy resin (main agent), 11.0% by volume of phenol resin (curing agent), 0.4% by volume of imidazole compound (curing accelerator), and 21.2% by volume of thermoplastic resin (carboxyl group-including acrylic acid ester copolymer).
- the processing stability sheet 9 was formed by application and drying of a varnish containing 935 parts by mass of spherical silica particles (first particles), 100 parts by mass of bisphenol A epoxy resin (main agent of a thermosetting resin), 106 parts by mass of phenol resin (curing agent), 4 parts by mass of imidazole compound (curing accelerator), and 10 parts by mass of cyclohexanone (solvent).
- a content ratio of the silica particles in the processing stability sheet 9 was 55% by volume.
- a thickness of the processing stability sheet 9 was 40 ⁇ m.
- the processing stability sheet 9 was in a B-stage state.
- the two processing stability sheets 9 were attached to one surface and the other surface in the thickness direction of the inductor 2 . Thereafter, the processing stability sheet 9 was heated at 190° C. for one hour to be brought into a C-stage state.
- the processing stability layer 3 in a C-stage state was formed.
- a thickness of the processing stability layer 3 was 40 ⁇ m.
- the laminated sheet 1 including the inductor 2 and the processing stability layers 3 was produced.
- the inductor 2 in the middle of production that is, the inductor 2 without including the processing stability layers 3 was referred to as the laminated sheet 1 of Comparative Example 1.
- the slit 10 was formed on one surface in the thickness direction of each of the laminated sheets 1 of Example 1 and Comparative Example 1.
- the slit 10 was formed by the dicing saw 11 .
- a width of the slit 10 was 30 ⁇ m, and a depth thereof was 100 ⁇ m.
- the slit 10 in the laminated sheet 1 was observed by SEM (electron microscope).
- the SEM image of Example 1 is shown in FIG. 7 .
- the SEM image of Comparative Example 1 is shown in FIG. 8 .
- Example 1 in the inner end portion of the magnetic layer 5 facing the slit 10 , a warp up (raise) was not observed. This case was evaluated as excellent.
- the relative permeability ⁇ 1 to ⁇ 10 described above was measured with an impedance analyzer (manufactured by Agilent, “4291B”).
- test (a) to test (e) was evaluated in accordance with the following criteria.
- the arithmetic average roughness Ra of one surface of the laminated sheet 1 in Example 1 was measured. As a result, the arithmetic average roughness Ra thereof was 0.1 ⁇ m.
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Abstract
A laminated sheet includes a sheet-shaped inductor including a plurality of wirings and a magnetic layer embedding the plurality of wirings, and a processing stability layer disposed on at least one surface in a thickness direction of the inductor. The magnetic layer includes a binder and a magnetic particle having a generally flat shape and whose material is a metal. The processing stability layer includes a cured product of a thermosetting resin composition. The thermosetting resin composition includes a thermosetting resin as an essential component. The thermosetting resin composition includes at least one kind of particle, as an optical component, selected from the group consisting of a first particle having a generally spherical shape and a second particle having a generally flat shape and whose material is an inorganic compound.
Description
- The present application is a Continuation of U.S. patent application Ser. No. 17/174,988, filed on Feb. 12, 2021, which claims priority from Japanese Patent Application No. 2020-024311 filed on Feb. 17, 2020, the contents of all of which are hereby incorporated by reference into this application.
- The present invention relates to a laminated sheet.
- Conventionally, a sheet-shaped inductor including a wiring, and a magnetic layer covering the wiring and containing flat-shaped magnetic particles has been known (ref: for example,
Patent Document 1 below). -
- [Patent Document 1] Japanese Unexamined Patent Publication No. 2019-220618
- However, there is a case where the surface of the inductor is subjected to processing. For example, a slit may be formed in the surface of the inductor to reduce crosstalk, or the inductor may be immersed in a solution such as cleaning solution to clean the surface of the inductor.
- However, when the surface of the inductor of
Patent Document 1 is subjected to the processing described above, the surface of the inductor may be deformed, or the magnetic permeability may vary greatly. That is, there is a problem that the processing stability of the inductor is insufficient. - The present invention provides a laminated sheet having excellent processing stability.
- The present invention (1) includes a laminated sheet including a sheet-shaped inductor including a plurality of wirings and a magnetic layer embedding the plurality of wirings, and a processing stability layer disposed on at least one surface in a thickness direction of the inductor, wherein the magnetic layer includes a binder and a magnetic particle having a generally flat shape and whose material is a metal; the processing stability layer includes a cured product of a thermosetting resin composition; and the thermosetting resin composition includes a thermosetting resin as an essential component, and at least one kind of particle, as an optional component, selected from the group consisting of a first particle having a generally spherical shape and a second particle having a generally flat shape and whose material is an inorganic compound.
- Since the laminated sheet includes the processing stability layer, it is excellent in processing stability.
- The present invention (2) includes the laminated sheet described in (1) satisfying at least one test of the following test (a) to test (e).
- Test (a): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ1 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of copper sulfate plating solution containing 66 g/L of copper sulfate pentahydrate, 180 g/L of sulfuric acid concentration, 50 ppm of chlorine, and Top Lutina alpha at 25° C. for 120 minutes, and thereafter, the relative permeability μ2 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
- w
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Rate of Change of Magnetic Permeability (%)=Iμ1−μ2I/μ1×100 - Test (b): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ3 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of an acid active aqueous solution containing 55 g/L of sulfuric acid at 25° C. for 1 minute, and thereafter, the relative permeability μ4 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
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Rate of Change of Magnetic Permeability (%)=Iμ3−μ4I/μ3×100 - Test (c): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ5 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of Reduction Solution Securiganth P manufactured by Atotech Japan K.K. at 45° C. for 5 minutes, and thereafter, the relative permeability μ6 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
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Rate of Change of Magnetic Permeability (%)=Iμ5−μ6I/μ5×100 - Test (d): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ7 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of Concentrate Compact CP manufactured by Atotech Japan K.K. at 80° C. for 15 minutes, and thereafter, the relative permeability μ8 of the sample at a frequency of MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
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Rate of Change of Magnetic Permeability (%)=Iμ7−μ8I/μ7×100 - Test (e): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ9 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of Swelling Dip Securiganth P manufactured by Atotech Japan K.K. at 60° C. for 5 minutes, and thereafter, the relative permeability μ10 of the sample at a frequency of MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less.
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Rate of Change of Magnetic Permeability (%)=Iμ9−μ10I/μ9×100 - Since the laminated sheet satisfies at least one test of the test (a) to test (e), it is excellent in stability with respect to process processing using a chemical solution.
- The present invention (3) includes the laminated sheet described in (1) or (2), wherein the arithmetic average roughness Ra of one surface in the thickness direction of the laminated sheet is 10 μm or less.
- Since the laminated sheet has the arithmetic average roughness Ra of one surface in the thickness direction of 10 μm or less, it can ensure excellent mountability.
- The laminated sheet of the present invention is excellent in processing stability.
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FIG. 1 shows a front cross-sectional view of one embodiment of a laminated sheet of the present invention. -
FIG. 2 shows a front cross-sectional view of an inductor in the middle of production of the laminated sheet shown inFIG. 1 . -
FIG. 3 shows a front cross-sectional view of an embodiment in which a slit is formed in the laminated sheet shown inFIG. 1 . -
FIGS. 4A to 4C show front cross-sectional views of a usage embodiment of the laminated sheet shown inFIG. 1 : -
FIG. 4A illustrating a modified example in which a via is formed in the laminated sheet, -
FIG. 4B illustrating a modified example in which a processing stability layer newly fills the via, and -
FIG. 4C illustrating a modified example in which the via exposes a portion of a wiring. -
FIGS. 5A to 5D show front cross-sectional views of a modified example of a laminated sheet of one embodiment, and a usage embodiment thereof: -
FIG. 5A illustrating a modified example in which a processing stability layer is disposed on the other surface in a thickness direction of an inductor, -
FIG. 5B illustrating a modified example in which a via is formed in the laminated sheet shown inFIG. 5A , -
FIG. 5C illustrating a modified example in which a processing stability layer newly fills the via in the laminated sheet shown inFIG. 5B , and -
FIG. 5D illustrating a modified example in which the via exposes a portion of a wiring. -
FIG. 6 shows a front cross-sectional view in which a slit is formed in a laminated sheet of Comparative Example 1. -
FIG. 7 shows an image processing view of an SEM image in which a slit is formed in a laminated sheet of Example 1. -
FIG. 8 shows an image processing view of an SEM image in which a slit is formed in a laminated sheet of Comparative Example 1. - One embodiment of a laminated sheet of the preset invention is described with reference to
FIG. 1 . - A
laminated sheet 1 has a predetermined thickness, and has a sheet shape extending in a plane direction perpendicular to a thickness direction. Thelaminated sheet 1 has a sheet-shapedinductor 2, and aprocessing stability layer 3. - The
inductor 2 has a predetermined thickness, and has the same outer shape as thelaminated sheet 1. Theinductor 2 includes a plurality ofwirings 4, and amagnetic layer 5. - The plurality of
wirings 4 are adjacent to each other at spaced intervals in a direction (hereinafter, may be referred to as a width direction) perpendicular to a direction in which each of thewirings 4 extends and the thickness direction. The plurality ofwirings 4 are parallel with each other. A shape, a dimension, a configuration, a material, and a formulation (filling rate, content ratio, or the like) of thewiring 4 are, for example, described in Japanese Unexamined Patent Publication No. 2019-220618 or the like. Preferably, thewiring 4 has a generally circular shape when viewed in the cross-sectional view (front cross-sectional view along a direction perpendicular to the direction in which thewiring 4 extends), and the lower limit of the diameter thereof is, for example, 25 μm, and the upper limit of the diameter thereof is, for example, 2,000 μm. Thewiring 4 preferably includes a conducting wiring made of a conductor, and an insulating film covering a peripheral surface of the conducting wiring. The lower limit of an interval between thewirings 4 adjacent to each other is, for example, 10 μm, preferably 50 μm, and the upper limit of an interval between thewirings 4 adjacent to each other is, for example, 5,000 μm, preferably 3,000 μm. The upper limit of a ratio (diameter/interval) of the diameter of thewiring 4 to the interval between thewirings 4 adjacent to each other is, for example, 200, preferably 50, and the lower limit thereof is, for example, 0.01, preferably 0.1. - The
magnetic layer 5 improves the inductance of thelaminated sheet 1. The magnetic layer has the same outer shape as thelaminated sheet 1 when viewed from the top. Themagnetic layer 5 has a plate shape extending in the plane direction. Further, themagnetic layer 5 embeds the plurality ofwirings 4 when viewed in the cross-sectional view. Themagnetic layer 5 has a onesurface 6, another surface 7, and an innerperipheral surface 8. - The one
surface 6 forms one surface in the thickness direction of themagnetic layer 5. - The
other surface 7 forms the other surface in the thickness direction of themagnetic layer 5. Theother surface 7 is spaced apart from the other side in the thickness direction of the onesurface 6. - The inner
peripheral surface 8 is spaced apart from the onesurface 6 and theother surface 7 in the thickness direction. The innerperipheral surface 8 is located between the onesurface 6 and theother surface 7 in the thickness direction. The innerperipheral surface 8 is in contact with the outer peripheral surface of thewiring 4. - The
magnetic layer 5 contains a binder and magnetic particles. Specifically, a material for themagnetic layer 5 is a magnetic composition containing the binder and the magnetic particles. - The binder is a matrix for dispersing the magnetic particles. Examples of the binder include thermoplastic resins such as an acrylic resin and thermosetting resins such as an epoxy resin composition. The acrylic resin includes, for example, a carboxyl group-including acrylic acid ester copolymer. The epoxy resin composition includes, for example, an epoxy resin (cresol novolac epoxy resin or the like) as a main agent, a curing agent for an epoxy resin (phenol resin or the like), and a curing accelerator for an epoxy resin (imidazole compound or the like). As the binder, the thermoplastic resin and the thermosetting resin can be used alone or in combination of two or more, and preferably, the thermoplastic resin and the thermosetting resin are used in combination of two or more. A volume ratio of the binder in the magnetic composition is a remaining portion of a volume ratio of the magnetic particles to be described later.
- The magnetic particles are, for example, dispersed in the binder. In the present embodiment, the magnetic particles have a generally flat shape. The generally flat shape includes a generally plate shape.
- The lower limit of a flat ratio (flat degree) of the magnetic particles is, for example, 8, preferably 15, and the upper limit thereof is, for example, 500, preferably 450. The flat ratio is, for example, calculated as an aspect ratio obtained by dividing a median diameter of the magnetic particles by an average thickness of the magnetic particles.
- The lower limit of the median diameter of the magnetic particles is, for example, 3.5 μm, preferably 10 μm, and the upper limit thereof is, for example, 200 μm, preferably 150 μm. The lower limit of the average thickness of the magnetic particles is, for example, 0.1 μm, preferably 0.2 μm, and the upper limit thereof is, for example, 3.0 μm, preferably 2.5 μm.
- Further, a material for the magnetic particles is a metal. Examples of the metal include magnetic bodies such as a soft magnetic body and a hard magnetic body. Preferably, from the viewpoint of ensuring excellent inductance, a soft magnetic body is used.
- Examples of the soft magnetic body include a single metal body containing one kind of metal element in a state of a pure material and an alloy body which is a eutectic (mixture) of one or more kinds of metal element (first metal element) and one or more kinds of metal element (second metal element) and/or non-metal element (carbon, nitrogen, silicon, phosphorus, or the like). These may be used alone or in combination of two or more.
- An example of the single metal body includes a metal single body consisting of only one kind of metal element (first metal element). The first metal element is, for example, appropriately selected from iron (Fe), cobalt (Co), nickel (Ni), and another metal element that can be included as the first metal element of the soft magnetic body.
- Further, examples of the single metal body include an embodiment including a core including only one kind of metal element and a surface layer including an inorganic material and/or an organic material which modify/modifies a portion of or the entire surface of the core, and an embodiment in which an organic metal compound and an inorganic metal compound including the first metal element are decomposed (thermally decomposed or the like). More specifically, an example of the latter embodiment includes an iron powder (may be referred to as a carbonyl iron powder) in which an organic iron compound (specifically, carbonyl iron) including iron as the first metal element is thermally decomposed. The position of a layer including the inorganic material and/or the organic material modifying a portion including only one kind of metal element is not limited to the surface described above. The organic metal compound and the inorganic metal compound that can obtain the single metal body are not particularly limited, and can be appropriately selected from a known or conventional organic metal compound and inorganic metal compound that can obtain the single metal body of the soft magnetic body.
- The alloy body is not particularly limited as long as it is a eutectic of one or more kinds of metal element (first metal element) and one or more kinds of metal element (second metal element) and/or non-metal element (carbon, nitrogen, silicon, phosphorus, or the like) and can be used as an alloy body of a soft magnetic body.
- The first metal element is an essential element in the alloy body, and examples thereof include iron (Fe), cobalt (Co), and nickel (Ni). When the first metal element is Fe, the alloy body is referred to as a Fe-based alloy; when the first metal element is Co, the alloy body is referred to as a Co-based alloy; and when the first metal element is Ni, the alloy body is referred to as a Ni-based alloy.
- The second metal element is an element (auxiliary component) which is auxiliarily included in the alloy body, and is a metal element which is compatible (eutectic) with the first metal element. Examples thereof include iron (Fe) (when the first metal element is other than Fe), cobalt (Co) (when the first metal element is other than Co), nickel (Ni) (when the first metal element is other than Ni), chromium (Cr), aluminum (Al), silicon (Si), copper (Cu), silver (Ag), manganese (Mn), calcium (Ca), barium (B a), titanium (Ti), zirconium (Zr), hafnium (Hf), vanadium (V), niobium (Nb), tantalum (Ta), molybdenum (Mo), tungsten (W), ruthenium (Ru), rhodium (Rh), zinc (Zn), gallium (Ga), indium (In), germanium (Ge), tin (Sn), lead (Pb), scandium (Sc), yttrium (Y), strontium (Sr), and various rare earth elements. These may be used alone or in combination of two or more.
- The non-metal element is an element (auxiliary component) which is auxiliarily included in the alloy body and is a non-metal element which is compatible (eutectic) with the first metal element, and examples thereof include boron (B), carbon (C), nitrogen (N), silicon (Si), phosphorus (P), and sulfur (S). These may be used alone or in combination of two or more.
- Examples of the Fe-based alloy which is one example of an alloy body include magnetic stainless steel (Fe—Cr—Al—Si alloy) (including electromagnetic stainless steel), Sendust (Fe—Si—Al alloy) (including Supersendust), permalloy (Fe—Ni alloy), Fe—Ni—Mo alloy, Fe—Ni—Mo—Cu alloy, Fe—Ni—Co alloy, Fe—Cr alloy, Fe—Cr—Al alloy, Fe—Ni—Cr alloy, Fe—Ni—Cr—Si alloy, silicon copper (Fe—Cu—Si alloy), Fe—Si alloy, Fe—Si—B(—Cu—Nb) alloy, Fe—B—Si—Cr alloy, Fe—Si—Cr—Ni alloy, Fe—Si—Cr alloy, Fe—Si—Al—Ni—Cr alloy, Fe—Ni—Si—Co alloy, Fe—N alloy, Fe—C alloy, Fe—B alloy, Fe—P alloy, ferrite (including stainless steel-based ferrite, and furthermore, soft ferrite such as Mn—Mg-based ferrite, Mn—Zn-based ferrite, Ni—Zn-based ferrite, Ni—Zn—Cu-based ferrite, Cu—Zn-based ferrite, and Cu—Mg—Zn-based ferrite), Permendur (Fe—Co alloy), Fe—Co—V alloy, and Fe-based amorphous alloy.
- Examples of the Co-based alloy which is one example of an alloy body include Co—Ta—Zr and a cobalt (Co)-based amorphous alloy.
- An example of the Ni-based alloy which is one example of an alloy body includes a Ni—Cr alloy.
- A more detailed formulation of the above-described magnetic composition is described in Japanese Unexamined Patent Publication No. 2014-165363 or the like.
- The lower limit of a volume ratio of the magnetic particles in the magnetic composition is, for example, 40% by volume, preferably 50% by volume, more preferably 60% by volume, and the upper limit thereof is, for example, 95% by volume, preferably 90% by volume.
- The lower limit of a thickness of the
inductor 2 is, for example, 30 μm, preferably 40 μm, and the upper limit of the thickness of theinductor 2 is, for example, 2,500 μm, preferably 2,000 μm. The lower limit of a ratio of the thickness of theinductor 2 to the thickness of thelaminated sheet 1 is, for example, 0.1, preferably 0.3, more preferably 0.7, and the upper limit thereof is, for example, 0.999, preferably 0.990, more preferably 0.980. - The
processing stability layer 3 improves the surface processability with respect to the onesurface 6 and theother surface 7 of theinductor 2. Theprocessing stability layer 3 is disposed on the onesurface 6 and theother surface 7 of theinductor 2. Specifically, theprocessing stability layer 3 is in contact with the entire onesurface 6 and the entireother surface 7 of themagnetic layer 5. Each of the two processing stability layers 3 has a sheet shape extending in the plane direction. - One surface in the thickness direction of the
processing stability layer 3 located on one side in the thickness direction of theinductor 2 forms one surface in the thickness direction of thelaminated sheet 1. The upper limit of the arithmetic average roughness Ra of one surface in the thickness direction of thelaminated sheet 1 is, for example, 10 μm, preferably 5 μm, more preferably 1 μm, and the lower limit thereof is, for example, 0.001 μm. - The other surface in the thickness direction of the
processing stability layer 3 located on the other surface in the thickness direction of theinductor 2 forms the other surface in the thickness direction of thelaminated sheet 1. The upper limit of the arithmetic average roughness Ra of one surface in the thickness direction of the other surface in the thickness direction of thelaminated sheet 1 is, for example, 10 μm, preferably 5 μm, more preferably 1 μm, and the lower limit thereof is, for example, 0.001 μm. - When the arithmetic average roughness Ra of one surface and/or the other surface in the thickness direction of the
laminated sheet 1 is the above-described upper limit or less, it is possible to ensure excellent mountability. - The arithmetic average roughness Ra of one surface and the other surface in the thickness direction of the
laminated sheet 1 is determined with a stylus-type surface shape measuring device. - The
processing stability layer 3 includes a cured product of a thermosetting resin composition. In other words, a material for theprocessing stability layer 3 includes the thermosetting resin composition. - The thermosetting resin composition includes a thermosetting resin as an essential component and particles as an optional component.
- The thermosetting resin includes a main agent, a curing agent, and a curing accelerator.
- Examples of the main agent include an epoxy resin and a silicone resin, and preferably, an epoxy resin is used. Examples of the epoxy resin include bifunctional epoxy resins such as a bisphenol A epoxy resin, a bisphenol F epoxy resin, a bisphenol S epoxy resin, a modified bisphenol A epoxy resin, a modified bisphenol F epoxy resin, a modified bisphenol S epoxy resin, and a biphenyl epoxy resin; and trifunctional or more polyfunctional epoxy resins such as a phenol novolac epoxy resin, a cresol novolac epoxy resin, a trishydroxyphenylmethane epoxy resin, a tetraphenylol ethane epoxy resin, and a dicyclopentadiene epoxy resin. These epoxy resins may be used alone or in combination of two or more. Preferably, a bifunctional epoxy resin is used, more preferably, a bisphenol A epoxy resin is used.
- The lower limit of an epoxy equivalent of the epoxy resin is, for example, 10 g/eq., and the upper limit thereof is, for example, 1,000 g/eq.
- When the main agent is the epoxy resin, examples of the curing agent include a phenol resin and an isocyanate resin. Examples of the phenol resin include polyfunctional phenol resins such as a phenol novolac resin, a cresol novolac resin, a phenol aralkyl resin, a phenol biphenylene resin, a dicyclopentadiene phenol resin, and a resol resin. These may be used alone or in combination of two or more. As the phenol resin, preferably, a phenol novolac resin and a phenol biphenylene resin are used. When the main agent is the epoxy resin and the curing agent is the phenol resin, the lower limit of the total sum of hydroxyl groups in the phenol resin is, for example, 0.7 equivalents, preferably 0.9 equivalents, and the upper limit thereof is, for example, 1.5 equivalents, preferably 1.2 equivalents with respect to 1 equivalent of epoxy groups in the epoxy resin. Specifically, the lower limit of the number of parts by mass of the curing agent is, for example, 1 part by mass, and the upper limit thereof is, for example, 50 parts by mass with respect to 100 parts by mass of the main agent.
- The curing accelerator is a catalyst (thermosetting catalyst) which promotes curing of the main agent (preferably, epoxy resin curing accelerator), and examples thereof include an organic phosphorus compound, and an imidazole compound such as 2-phenyl-4-methyl-5-hydroxymethylimidazole (2P4MHZ). The lower limit of the number of parts by mass of the curing accelerator is, for example, 0.05 parts by mass, and the upper limit thereof is, for example, 5 parts by mass with respect to 100 parts by mass of the main agent.
- The particles are an optional component in the thermosetting resin composition. The particles are dispersed in the thermosetting resin. The particles are at least one kind selected from the group consisting of first particles and second particles.
- The first particles have a generally spherical shape. The lower limit of the median diameter of the first particles is, for example, 1 μm, preferably 5 μm, and the upper limit of the median diameter of the first particles is, for example, 250 μm, preferably 200 μm. The median diameter of the first particles is determined with a laser diffraction particle size distribution measuring device. The median diameter of the first particles can be also determined, for example, by binarization process by cross-sectional observation of the
laminated sheet 1. - A material for the first particles is not particularly limited. Examples of the material for the first particles include metals, an inorganic compound, and an organic compound, and in order to increase the thermal expansion coefficient, preferably, metals and an inorganic compound are used.
- The metals are included in the thermosetting resin composition when the
processing stability layer 3 functions as an inductance-improving layer. An example of the metals includes the magnetic body illustrated in themagnetic layer 5, and preferably, an organic iron compound including iron as the first metal element is used, more preferably, carbonyl iron is used. - The inorganic compound is included in the thermosetting resin composition when the
processing stability layer 3 functions as a thermal expansion coefficient-suppressing layer. An example of the inorganic compound includes an inorganic filler, and specifically, silica and alumina are used, preferably, silica is used. - Specifically, as the first particles, preferably, spherical silica is used, and preferably, spherical carbonyl iron is used.
- The second particles have a generally flat shape. The generally flat shape includes a generally plate shape.
- The lower limit of a flat ratio (flat degree) of the second particles is, for example, 8, preferably 15, and the upper limit thereof is, for example, 500, preferably 450. The flat ratio of the second particles is determined by the same calculation method as the flat ratio of the magnetic particles in the
magnetic layer 5 described above. - The lower limit of the median diameter of the second particles is, for example, 1 μm, preferably 5 μm, and the upper limit of the median diameter of the second particles is, for example, 250 μm, preferably 200 μm. The median diameter of the second particles is determined in the same manner as that of the first particles.
- The lower limit of the average thickness of the second particles is, for example, 0.1 μm, preferably 0.2 μm, and the upper limit thereof is, for example, 3.0 μm, preferably 2.5 μm.
- A material for the second particles is an inorganic compound. An example of the inorganic compound includes a thermally conductive compound such as boron nitride. Accordingly, preferably, the inorganic compound is included in the thermosetting resin composition when the
processing stability layer 3 functions as a thermal conductivity-improving layer. - Specifically, as the second particles, preferably, a flat-shaped boron nitride is used.
- One kind or both of the first particles and the second particles are included in the thermosetting resin composition.
- The lower limit of the number of parts by mass of the particles (first particles and/or second particles) is, for example, 10 parts by mass, preferably 50 parts by mass, and the upper limit thereof is, for example, 2,000 parts by mass, preferably 1,500 parts by mass with respect to 100 parts by mass of the thermosetting resin. Further, the lower limit of a content ratio of the particles in the cured product is, for example, 10% by mass, and the upper limit thereof is, for example, 90% by mass. When both of the first particles and the second particles are included in the thermosetting resin composition, the lower limit of the number of parts by mass of the second particles is, for example, 30 parts by mass, and the upper limit thereof is, for example, 300 parts by mass with respect to 100 parts by mass of the first particles.
- Since the particles are an optional component in the thermosetting resin composition, the thermosetting resin composition may not include the particles.
- The lower limit of a thickness of the
processing stability layer 3 is, for example, 1 μm, preferably 10 μm, and the upper limit thereof is, for example, 1,000 μm, preferably 100 μm. The lower limit of a ratio of the thickness of theprocessing stability layer 3 in the thickness of thelaminated sheet 1 is, for example, 0.001, preferably 0.005, more preferably 0.01, and the upper limit thereof is, for example, 0.5, preferably 0.3, more preferably 0.1. - The thickness of the two
processing stability layers 3 may be the same or different from each other. The lower limit of a ratio (thickness of theprocessing stability layer 3 on one side in the thickness direction/thickness of theprocessing stability layer 3 on the other side) of the thickness of theprocessing stability layer 3 located on one side in the thickness direction of theinductor 2 with respect to the thickness of theprocessing stability layer 3 located on the other side in the thickness direction of theinductor 2 is, for example, 0.05, preferably 0.1, and the upper limit thereof is 10. - Next, a method for producing the
laminated sheet 1 is described with reference toFIGS. 1 to 2 . - As shown in
FIG. 2 , first, in this method, theinductor 2 is prepared. To prepare theinductor 2, the plurality ofwirings 4 are prepared to be sandwiched between the two magnetic sheets. Theinductor 2 is, for example, prepared by a method described in Japanese Unexamined Patent Publication No. 2019-220618 or the like. - In this method, subsequently, two processing stability sheets 9 are prepared.
- The processing stability sheet 9 is formed from the material for the
processing stability layer 3 into a sheet shape. The processing stability sheet 9 preferably includes a B-stage thermosetting resin composition. - The above-described material can be also prepared as a varnish by further blending a solvent into the above-described thermosetting resin composition. In addition, a thermoplastic resin can be further blended in the material.
- Examples of the solvent include alcohol compounds such as methanol, ether compounds such as dimethyl ether, and ketone compounds such as methyl ethyl ketone and cyclohexanone. A mixing ratio of the solvent is adjusted so that the lower limit of the mass ratio of the solid content in the varnish is, for example, 10% by mass, and the upper limit thereof is, for example, 95% by mass.
- An example of the thermoplastic resin includes a thermoplastic resin illustrated in the binder of the
magnetic layer 5. The lower limit of the number of parts by mass of the thermoplastic resin is, for example, 1 part by mass, and the upper limit thereof is, for example, 100 parts by mass with respect to 100 parts by mass of the thermosetting resin. - In this method, the varnish is applied to the surface of a release sheet that is not shown to be then dried to form the processing stability sheet 9.
- Subsequently, the two processing stability sheets 9 and the
inductor 2 are pressed from both sides in the thickness direction. The two processing stability sheets 9 are attached to each of the onesurface 6 and theother surface 7 of theinductor 2. - Thereafter, those are heated to bring the processing stability sheet 9 into a C-stage state. Thus, the
processing stability layer 3 disposed on both sides in the thickness direction of theinductor 2 is formed. - As shown in
FIG. 1 , in this manner, thelaminated sheet 1 is obtained. - The
laminated sheet 1 satisfies, for example, at least one test of the test (a) to test (e). - Test (a): the
laminated sheet 1 is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ1 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of copper sulfate plating solution containing 66 g/L of copper sulfate pentahydrate, 180 g/L of sulfuric acid concentration, 50 ppm of chlorine, and Top Lutina alpha manufactured by Okuno Chemical Industries Co., Ltd. at 25° C. for 120 minutes, and thereafter, the relative permeability μ2 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less. -
Rate of Change of Magnetic Permeability (%)=Iμ1−μ2I/μ1×100 - Test (b): the
laminated sheet 1 is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ3 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of an acid active aqueous solution containing 55 g/L of sulfuric acid at 25° C. for 1 minute, and thereafter, the relative permeability μ4 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less. -
Rate of Change of Magnetic Permeability (%)=Iμ3−μ4I/μ3×100 - Test (c): the
laminated sheet 1 is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ5 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of Reduction Solution Securiganth P manufactured by Atotech Japan K.K. at 45° C. for 5 minutes, and thereafter, the relative permeability μ6 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less. -
Rate of Change of Magnetic Permeability (%)=Iμ5−μ6I/μ5×100 - Test (d): the
laminated sheet 1 is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ7 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of Concentrate Compact CP manufactured by Atotech Japan K.K. at 80° C. for 15 minutes, and thereafter, the relative permeability μ8 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less. -
Rate of Change of Magnetic Permeability (%)=Iμ7−μ8I/μ7×100 - Test (e): the
laminated sheet 1 is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ9 thereof at a frequency of 10 MHz is determined. Thereafter, the sample is immersed in 200 mL of Swelling Dip Securiganth P manufactured by Atotech Japan K.K. at 60° C. for 5 minutes, and thereafter, the relative permeability μ10 of the sample at a frequency of 10 MHz is determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion is determined. As a result, the rate of change of the magnetic permeability of the sample is 5% or less. -
Rate of Change of Magnetic Permeability (%)=Iμ9−μ10I/μ9×100 - When the test (a) is satisfied, the upper limit of the rate of change of the magnetic permeability of the sample in the test (a) is preferably 4%, more preferably 3%.
- When the test (a) is satisfied, the
laminated sheet 1 is excellent in stability with respect to the immersion of the copper sulfate solution of the electrolytic copper plating. - When the test (b) is satisfied, the upper limit of the rate of change of the magnetic permeability of the sample in the test (b) is preferably 4%, more preferably 3%.
- When the test (b) is satisfied, the
laminated sheet 1 is excellent in stability with respect to the immersion of the acid active solution. - When the test (c) is satisfied, the upper limit of the rate of change of the magnetic permeability of the sample in the test (c) is preferably 4%, more preferably 3%.
- Reduction Solution Securiganth P manufactured by Atotech Japan K.K. in the test (c) includes a sulfuric acid aqueous solution, and is used as a neutralizing solution (neutralizing agent or an aqueous solution for neutralization). Therefore, when the test (c) is satisfied, the
laminated sheet 1 is excellent in stability with respect to the immersion of the neutralizing solution. - When the test (d) is satisfied, the upper limit of the rate of change of the magnetic permeability of the sample in the test (d) is preferably 4%, more preferably 3%.
- Concentrate Compact CP manufactured by Atotech Japan K.K. in the test (d) includes a potassium permanganate solution. Therefore, when the test (d) is satisfied, the
laminated sheet 1 is excellent in stability with respect to the immersion of the potassium permanganate solution of desmear (cleaning). - When the test (e) is satisfied, the upper limit of the rate of change of the magnetic permeability of the sample in the test (e) is preferably 4%, more preferably 3%.
- Swelling Dip Securiganth P manufactured by Atotech Japan K.K. in the test (e) is an aqueous solution containing glycol ethers and sodium hydroxide, and is used as a swelling solution. Therefore, when the test (e) is satisfied, the
laminated sheet 1 is excellent in stability with respect to the immersion of the swelling solution. - Preferably, all of the test (a) to test (e) are satisfied. Therefore, the
laminated sheet 1 is excellent in stability with respect to the immersion of the copper sulfate solution of the electrolytic copper plating, the acid active solution, the neutralizing solution, the potassium permanganate solution of the desmear (cleaning), and the swelling solution, and is excellent in stability with respect to various processes using these solutions. - The
laminated sheet 1 is immersed in various chemical solutions (including the copper sulfate solution of the electrolytic copper plating, the acid active solution, the neutralizing solution, the potassium permanganate solution of the desmear (cleaning), the swelling solution, or the like) in accordance with its purpose and applications to be subjected to surface treatment. - Subsequently, as shown in
FIG. 3 , as processing with respect to one surface in the thickness direction of thelaminated sheet 1, an embodiment of forming aslit 10 is described. - In this embodiment, in order to reduce the crosstalk between the
wirings 4 adjacent to each other, theslit 10 is formed on one side in the thickness direction of themagnetic layer 5. - The
slit 10 is located between thewirings 4 adjacent to each other when projected in the thickness direction. Theslit 10 penetrates theprocessing stability layer 3 in the thickness direction, and is formed in one surface in the thickness direction of themagnetic layer 5 to the middle thereof. Theslit 10 is parallel with thewiring 4, and is along the direction in which thewiring 4 extends. - A width of the
slit 10 is not particularly limited. The lower limit of the width of theslit 10 is, for example, 10 μm, and the upper limit thereof is 1,000 μm. A depth of theslit 10 is not particularly limited. - A method for forming the
slit 10 is not particularly limited, and examples thereof include contact-type cutting using a dicing saw 11 and non-contact-type cutting using a laser (not shown). The dicing saw 11 includes a dicing blade having a disc shape. - In any method described above, processing is carried out from one side in the thickness direction of the
laminated sheet 1 with respect to one surface in the thickness direction of thelaminated sheet 1. - Thus, the
laminated sheet 1 in which theslit 10 is formed is obtained. - Then, since the
laminated sheet 1 includes theprocessing stability layer 3, it is excellent in processing stability. - In detail, as shown in
FIG. 6 , when thelaminated sheet 1 does not include theprocessing stability layer 3 and consists of only theinductor 2, the inner end portion facing theslit 10 in the onesurface 6 of themagnetic layer 5 warps up (is raised) toward one side in the thickness direction at the time of forming theslit 10 in themagnetic layer 5. In this phenomenon, when theslit 10 is formed in themagnetic layer 5, since the magnetic particles are made of the metals, they are difficult to crack, and since the shape of these are generally flat, themagnetic layer 5 moves to one side in the thickness direction, while entraining the binder around the magnetic particles. - However, as shown in
FIG. 3 , thelaminated sheet 1 of one embodiment includes theprocessing stability layer 3, and theprocessing stability layer 3 contains at least one kind of particles, as an optional component, selected from the group consisting of the first particles and the second particles. - Specifically, when the
processing stability layer 3 does not contain the particles, there is no deformation of theprocessing stability layer 3 due to the movement of the above-described particles, and therefore, it is possible to suppress the deformation of themagnetic layer 5 by the cured product in theprocessing stability layer 3. - When the
processing stability layer 3 contains the first particles having a generally spherical shape, the movement of the first particles in theprocessing stability layer 3 is suppressed, while entraining the binder around the first particles. Therefore, the deformation of themagnetic layer 5 can be suppressed by the cured product in theprocessing stability layer 3. - When the
processing stability layer 3 contains the second particles whose material is an inorganic compound, even when the shape of these is generally flat, since the material for the second particles is the fragile inorganic compound, the second particles easily crack at the time of forming theslit 10 in themagnetic layer 5. Therefore, the movement of the second particles in theprocessing stability layer 3 is suppressed. As a result, the deformation of the magnetic layer can be suppressed by the cured product in theprocessing stability layer 3. - Therefore, since the
laminated sheet 1 of the present embodiment includes theprocessing stability layer 3 described above, when theslit 10 is formed in thelaminated sheet 1, it is possible to suppress the deformation of themagnetic layer 5. - In the following modified examples, the same reference numerals are provided for members and steps corresponding to each of those in the above-described one embodiment, and their detailed description is omitted. Further, each of the modified examples can achieve the same function and effect as that of one embodiment unless otherwise specified. Furthermore, one embodiment and the modified examples thereof can be appropriately used in combination.
- In one embodiment, a varnish is applied to a release sheet. Alternatively, for example, the varnish may be also applied to the one
surface 6 and theother surface 7 of themagnetic layer 5. - Further, as shown in
FIG. 4A , it is also possible to form a via 12 in thelaminated sheet 1. - The via 12 is a through hole which exposes the central portion of one surface in the thickness direction of the
wiring 4 and penetrates in the thickness direction of themagnetic layer 5 and theprocessing stability layer 3 located on one side in the thickness direction with respect to thewiring 4. The via 12 has a generally circular shape when viewed from the top (not shown). The via 12 also has a tapered shape in which the opening area expands toward one side in the thickness direction when viewed in the cross-sectional view. - Examples of a method for forming the via 12 include contact-type opening using a drill and non-contact-type opening using a laser.
- As shown in
FIG. 4B , thereafter, in this method, theprocessing stability layer 3 further fills thewiring 4 exposed from the via 12 and themagnetic layer 5. - As shown in
FIG. 4C , thereafter, the via 12 is formed again. However, the via 12 exposes the central portion of one surface in the thickness direction of thewiring 4, and does not expose themagnetic layer 5. That is, the inner-side surface of themagnetic layer 5 is covered with the newly filledprocessing stability layer 3. - Thus, the via 12 is formed, and the
laminated sheet 1 in which the inner-side surface of themagnetic layer 5 corresponding thereto is covered with theprocessing stability layer 3 is obtained. - In one embodiment, as shown in
FIG. 1 , theprocessing stability layer 3 is disposed on one surface and the other surface in the thickness direction of theinductor 2. Alternatively, though not shown, theprocessing stability layer 3 may be also disposed on only one surface, or, as shown inFIG. 5A , may be disposed on only the other surface. - As shown in
FIG. 5B , the via 12 may be also formed in themagnetic layer 5 in thelaminated sheet 1 described above. - Furthermore, as shown in
FIG. 5C , theprocessing stability layer 3 is disposed on the other surface in the thickness direction of theinductor 2, and theprocessing stability layer 3 may be also further formed on one surface in the thickness direction of theinductor 2 of thelaminated sheet 1 in which the via 12 is formed in theinductor 2. Theprocessing stability layer 3 on one side in the thickness direction fills the via 12. - Furthermore, as shown in
FIG. 5D , the via 12 is formed again. However, the via 12 exposes the central portion of one surface in the thickness direction of thewiring 4, and does not expose themagnetic layer 5. - An electrically conductive layer (not shown) can be also formed in the via 12. Examples of a material for the electrically conductive layer (not shown) include conductive materials such as copper. In the formation of the electrically conductive layer, for example, an electrolytic copper plating solution is used. Thus, the
laminated sheet 1 including the electrically conductive layer (not shown) is obtained. - Next, the present invention is further described based on Example and Comparative Example shown below. The present invention is however not limited by the following Example and Comparative Example. The specific numerical values in mixing ratio (content ratio), property value, and parameter used in the following description can be replaced with upper limit values (numerical values defined as “or less” or “below”) or lower limit values (numerical values defined as “or more” or “above”) of corresponding numerical values in mixing ratio (content ratio), property value, and parameter described in the above-described “Embodiment of the Invention”.
- The
laminated sheet 1 shown inFIG. 1 was produced based on one embodiment. - As shown in
FIG. 2 , first, theinductor 2 was fabricated. Specifically, theinductor 2 in which the plurality ofwirings 4 having a radius of 110 μm were covered with themagnetic layer 5 consisting of a first magnetic sheet having a thickness of 100 μm and a second magnetic sheet having a thickness of 125 μm was fabricated. The first magnetic sheet contained 60% by volume of spherical magnetic powder, 9.7% by volume of cresol novolac epoxy resin (main agent), 9.7% by volume of phenol resin (curing agent), 0.3% by volume of imidazole compound (curing accelerator), and 18.7% by volume of thermoplastic resin (carboxyl group-including acrylic acid ester copolymer). The second magnetic sheet contained 55% by volume of magnetic particles made of a flat-shaped Fe—Si alloy, 11.0% by volume of cresol novolac epoxy resin (main agent), 11.0% by volume of phenol resin (curing agent), 0.4% by volume of imidazole compound (curing accelerator), and 21.2% by volume of thermoplastic resin (carboxyl group-including acrylic acid ester copolymer). - Thereafter, the two processing stability sheets 9 were prepared. The processing stability sheet 9 was formed by application and drying of a varnish containing 935 parts by mass of spherical silica particles (first particles), 100 parts by mass of bisphenol A epoxy resin (main agent of a thermosetting resin), 106 parts by mass of phenol resin (curing agent), 4 parts by mass of imidazole compound (curing accelerator), and 10 parts by mass of cyclohexanone (solvent). A content ratio of the silica particles in the processing stability sheet 9 was 55% by volume. A thickness of the processing stability sheet 9 was 40 μm. The processing stability sheet 9 was in a B-stage state.
- The two processing stability sheets 9 were attached to one surface and the other surface in the thickness direction of the
inductor 2. Thereafter, the processing stability sheet 9 was heated at 190° C. for one hour to be brought into a C-stage state. - Thus, the
processing stability layer 3 in a C-stage state was formed. A thickness of theprocessing stability layer 3 was 40 μm. - Thus, the
laminated sheet 1 including theinductor 2 and theprocessing stability layers 3 was produced. - The
inductor 2 in the middle of production, that is, theinductor 2 without including theprocessing stability layers 3 was referred to as thelaminated sheet 1 of Comparative Example 1. - (Evaluation)
- (Slit Processing)
- The
slit 10 was formed on one surface in the thickness direction of each of thelaminated sheets 1 of Example 1 and Comparative Example 1. Theslit 10 was formed by the dicing saw 11. A width of theslit 10 was 30 μm, and a depth thereof was 100 μm. - The
slit 10 in thelaminated sheet 1 was observed by SEM (electron microscope). The SEM image of Example 1 is shown inFIG. 7 . The SEM image of Comparative Example 1 is shown inFIG. 8 . - In Example 1, in the inner end portion of the
magnetic layer 5 facing theslit 10, a warp up (raise) was not observed. This case was evaluated as excellent. - In contrast, in Comparative Example 1, in the inner end portion of the
magnetic layer 5 facing theslit 10, a warp up (raise) was observed. This case was evaluated as bad. - (Tests (a) to (e))
- In the test (a) to test (e), each of the rate of change of the magnetic permeability of Example 1 and Comparative Example 1 was determined.
- Test (a): the
laminated sheet 1 was trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ1 thereof at a frequency of 10 MHz was determined. Thereafter, the sample was immersed in 200 mL of copper sulfate plating solution containing 66 g/L of copper sulfate pentahydrate, 180 g/L of sulfuric acid concentration, 50 ppm of chlorine, and Top Lutina alpha manufactured by Okuno Chemical Industries Co., Ltd. at 25° C. for 120 minutes, and thereafter, the relative permeability μ2 of the sample at a frequency of 10 MHz was determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion was determined. -
Rate of Change of Magnetic Permeability (%)=Iμ1−μ2I/μ1×100 - Test (b): the
laminated sheet 1 was trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ3 thereof at a frequency of 10 MHz was determined. Thereafter, the sample was immersed in 200 mL of an acid active aqueous solution containing 55 g/L of sulfuric acid at 25° C. for 1 minute, and thereafter, the relative permeability μ4 of the sample at a frequency of 10 MHz was determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion was determined. -
Rate of Change of Magnetic Permeability (%)=Iμ3−μ4I/μ3×100 - Test (c): the
laminated sheet 1 was trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ5 thereof at a frequency of 10 MHz was determined. Thereafter, the sample was immersed in 200 mL of Reduction Solution Securiganth P manufactured by Atotech Japan K.K. at 45° C. for 5 minutes, and thereafter, the relative permeability μ6 of the sample at a frequency of 10 MHz was determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion was determined. -
Rate of Change of Magnetic Permeability (%)=Iμ5−μ6I/μ5×100 - Test (d): the
laminated sheet 1 was trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ7 thereof at a frequency of 10 MHz was determined. Thereafter, the sample was immersed in 200 mL of Concentrate Compact CP manufactured by Atotech Japan K.K. at 80° C. for 15 minutes, and thereafter, the relative permeability μ8 of the sample at a frequency of 10 MHz was determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion was determined. -
Rate of Change of Magnetic Permeability (%)=Iμ7−μ8I/μ7×100 - Test (e): the
laminated sheet 1 was trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ9 thereof at a frequency of 10 MHz was determined. Thereafter, the sample was immersed in 200 mL of Swelling Dip Securiganth P manufactured by Atotech Japan K.K. at 60° C. for 5 minutes, and thereafter, the relative permeability μ10 of the sample at a frequency of 10 MHz was determined. By the following formula, a rate of change of the magnetic permeability before and after the immersion was determined. -
Rate of Change of Magnetic Permeability (%)=Iμ9−μ10I/μ9×100 - The relative permeability μ1 to μ10 described above was measured with an impedance analyzer (manufactured by Agilent, “4291B”).
- Each of the test (a) to test (e) was evaluated in accordance with the following criteria.
- Excellent: the rate of change of the magnetic permeability before and after the immersion was 5% or less.
- Bad: the rate of change of the magnetic permeability before and after the immersion was above 5%.
-
TABLE 1 Ex. 1 Comparative Ex. 1 Slit Processability Excellent Bad Test a Excellent Bad Test b Excellent Bad Test c Excellent Bad Test d Excellent Bad Test e Excellent Bad - (Arithmetic Average Roughness Ra of One Surface of Laminated Sheet)
- The arithmetic average roughness Ra of one surface of the
laminated sheet 1 in Example 1 was measured. As a result, the arithmetic average roughness Ra thereof was 0.1 μm. - While the illustrative embodiments of the present invention are provided in the above description, such is for illustrative purpose only and it is not to be construed as limiting the scope of the present invention. Modification and variation of the present invention that will be obvious to those skilled in the art is to be covered by the following claims.
-
-
- 1 Laminated sheet
- 2 Inductor
- 3 Processing stability layer
- 4 Wiring
- 5 Magnetic layer
- 6 One surface
Claims (7)
1. A laminated sheet comprising:
a sheet-shaped inductor including a plurality of wirings and a magnetic layer embedding the plurality of wirings, and
a processing stability layer disposed on the inductor, wherein
the magnetic layer has a first surface and a second surface spaced from the first surface,
the magnetic layer includes a binder, and
a magnetic particle having a generally flat shape and whose material is a metal;
the processing stability layer includes a cured product of a thermosetting resin composition; and
the thermosetting resin composition includes:
a thermosetting resin, and
at least one particle selected from the group consisting of a first particle having a generally spherical shape and a second particle having a generally flat shape and whose material is an inorganic compound, and any combinations thereof; and
wherein the processing stability layer is in contact with the first surface of the magnetic layer.
2. The laminated sheet according to claim 1 , wherein
the processing stability layer is in contact with the entire first surface.
3. The laminated sheet according to claim 1 , further comprising a second processing stability layer being contact with the second surface of the magnetic layer.
4. The laminated sheet according to claim 3 , wherein
the second processing stability layer is in contact with the entire second surface.
5. The laminated sheet according to claim 1 , wherein
the particle included in the thermosetting resin composition consists of the first particle.
6. The laminated sheet according to claim 1 satisfying at least one test of the following test (a) to test (e):
test (a): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ1 thereof at a frequency of 10 MHz is determined, thereafter, the sample is immersed in 200 mL of copper sulfate plating solution containing 66 g/L of copper sulfate pentahydrate, 180 g/L of sulfuric acid concentration, 50 ppm of chlorine, and Top Lutina alpha at 25° C. for 120 minutes, and thereafter, the relative permeability μ2 of the sample at a frequency of 10 MHz is determined, by the following formula, a rate of change of the magnetic permeability before and after the immersion is determined, and as a result, the rate of change of the magnetic permeability of the sample is 5% or less:
Rate of Change of Magnetic Permeability (%)=Iμ1−μ2I/μ1×100;
Rate of Change of Magnetic Permeability (%)=Iμ1−μ2I/μ1×100;
test (b): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ3 thereof at a frequency of 10 MHz is determined, thereafter, the sample is immersed in 200 mL of an acid active aqueous solution containing 55 g/L of sulfuric acid at 25° C. for 1 minute, and thereafter, the relative permeability μ4 of the sample at a frequency of 10 MHz is determined, by the following formula, a rate of change of the magnetic permeability before and after the immersion is determined, and as a result, the rate of change of the magnetic permeability of the sample is 5% or less:
Rate of Change of Magnetic Permeability (%)=Iμ3−μ4I/μ3×100;
Rate of Change of Magnetic Permeability (%)=Iμ3−μ4I/μ3×100;
test (c): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ5 thereof at a frequency of 10 MHz is determined, thereafter, the sample is immersed in 200 mL of Reduction Solution Securiganth P manufactured by Atotech Japan K.K. at 45° C. for 5 minutes, and thereafter, the relative permeability μ6 of the sample at a frequency of 10 MHz is determined, by the following formula, a rate of change of the magnetic permeability before and after the immersion is determined, and as a result, the rate of change of the magnetic permeability of the sample is 5% or less:
Rate of Change of Magnetic Permeability (%)=Iμ5−μ6I/μ5×100;
Rate of Change of Magnetic Permeability (%)=Iμ5−μ6I/μ5×100;
test (d): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ7 thereof at a frequency of 10 MHz is determined, thereafter, the sample is immersed in 200 mL of Concentrate Compact CP manufactured by Atotech Japan K.K. at 80° C. for 15 minutes, and thereafter, the relative permeability μ8 of the sample at a frequency of 10 MHz is determined, by the following formula, a rate of change of the magnetic permeability before and after the immersion is determined, and as a result, the rate of change of the magnetic permeability of the sample is 5% or less:
Rate of Change of Magnetic Permeability (%)=Iμ7−μ8I/μ7×100;
Rate of Change of Magnetic Permeability (%)=Iμ7−μ8I/μ7×100;
test (e): the laminated sheet is trimmed into a 3 cm square piece to fabricate a sample, and the relative permeability μ9 thereof at a frequency of 10 MHz is determined, thereafter, the sample is immersed in 200 mL of Swelling Dip Securiganth P manufactured by Atotech Japan K.K. at 60° C. for 5 minutes, and thereafter, the relative permeability μ10 of the sample at a frequency of 10 MHz is determined, by the following formula, a rate of change of the magnetic permeability before and after the immersion is determined, and as a result, the rate of change of the magnetic permeability of the sample is 5% or less:
Rate of Change of Magnetic Permeability (%)=Iμ9−μ101/μ9×100.
Rate of Change of Magnetic Permeability (%)=Iμ9−μ101/μ9×100.
7. The laminated sheet according to claim 1 , wherein
the arithmetic average roughness Ra of a surface of the processing stability layer is 10 μm or less.
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US8840800B2 (en) * | 2011-08-31 | 2014-09-23 | Kabushiki Kaisha Toshiba | Magnetic material, method for producing magnetic material, and inductor element |
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