US20210143091A1 - Redistribution layer structure and semiconductor package - Google Patents

Redistribution layer structure and semiconductor package Download PDF

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Publication number
US20210143091A1
US20210143091A1 US16/677,604 US201916677604A US2021143091A1 US 20210143091 A1 US20210143091 A1 US 20210143091A1 US 201916677604 A US201916677604 A US 201916677604A US 2021143091 A1 US2021143091 A1 US 2021143091A1
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pad
conductive layer
coupled
rdl structure
conductive
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US16/677,604
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US10991648B1 (en
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Wu-Der Yang
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Nanya Technology Corp
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Nanya Technology Corp
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Priority to US16/677,604 priority Critical patent/US10991648B1/en
Priority to TW108141099A priority patent/TWI708334B/en
Assigned to NANYA TECHNOLOGY CORPORATION reassignment NANYA TECHNOLOGY CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: YANG, WU-DER
Priority to CN201911281915.3A priority patent/CN112786551B/en
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Definitions

  • the invention relates to a semiconductor structure, and particularly relates to a redistribution layer (RDL) structure and a semiconductor package.
  • RDL redistribution layer
  • the invention provides an RDL structure and a semiconductor package, which can effectively reduce the production cost.
  • the invention provides an RDL structure, which includes a first pad, a second pad, a third pad, a fourth pad, a first switch device, a second switch device, a third switch device, and a fourth switch device.
  • the first pad, the second pad, the third pad, and the fourth pad are separated from each other.
  • the first switch device includes a first conductive layer and a second conductive layer separated from each other.
  • the first conductive layer is coupled to the first pad.
  • the second conductive layer is coupled to the third pad.
  • the second switch device includes a third conductive layer and a fourth conductive layer separated from each other.
  • the third conductive layer is coupled to the first pad.
  • the fourth conductive layer is coupled to the fourth pad.
  • the third switch device includes a fifth conductive layer and a sixth conductive layer separated from each other.
  • the fifth conductive layer is coupled to the second pad.
  • the sixth conductive layer is coupled to the third pad.
  • the fourth switch device includes a seventh conductive layer and an eighth conductive layer separated from each other.
  • the seventh conductive layer is coupled to the second pad.
  • the eighth conductive layer is coupled to the fourth pad.
  • the RDL structure may further include a first conductive line, a second conductive line, a third conductive line, a fourth conductive line, a fifth conductive line, a sixth conductive line, a seventh conductive line, and an eighth conductive line.
  • the first conductive line is coupled between the first conductive layer and the first pad.
  • the second conductive line is coupled between the second conductive layer and the third pad.
  • the third conductive line is coupled between the third conductive layer and the first pad.
  • the fourth conductive line is coupled between the fourth conductive layer and the fourth pad.
  • the fifth conductive line is coupled between the fifth conductive layer and the second pad.
  • the sixth conductive line is coupled between the sixth conductive layer and the third pad.
  • the seventh conductive line is coupled between the seventh conductive layer and the second pad.
  • the eighth conductive line is coupled between the eighth conductive layer and the fourth pad.
  • the first conductive line, the first conductive layer, and the first pad may be integrally formed.
  • the second conductive line, the second conductive layer, and the third pad may be integrally formed.
  • the third conductive line, the third conductive layer, and the first pad may be integrally formed.
  • the fourth conductive line, the fourth conductive layer, and the fourth pad may be integrally formed.
  • the fifth conductive line, the fifth conductive layer, and the second pad may be integrally formed.
  • the sixth conductive line, the sixth conductive layer, and the third pad may be integrally formed.
  • the seventh conductive line, the seventh conductive layer, and the second pad may be integrally formed.
  • the eighth conductive line, the eighth conductive layer, and the fourth pad may be integrally formed.
  • the RDL structure may further include a fifth pad and a sixth pad.
  • the fifth pad is coupled to the third pad.
  • the sixth pad is coupled to the fourth pad.
  • the RDL structure may further include a ninth conductive line and a tenth conductive line.
  • the ninth conductive line is coupled between the third pad and the fifth pad.
  • the tenth conductive line is coupled between the fourth pad and the sixth pad.
  • the ninth conductive line, the third pad, and the fifth pad may be integrally formed.
  • the tenth conductive line, the fourth pad, and the sixth pad may be integrally formed.
  • the RDL structure may further include at least one dummy pad.
  • the dummy pad is separated from the first pad, the second pad, the third pad, the fourth pad, the first switch device, the second switch device, the third switch device, and the fourth switch device.
  • the invention provides a semiconductor package, which includes a first die, a second die, a first RDL structure, and a second RDL structure.
  • the first RDL structure is disposed on the first die.
  • the second RDL structure is disposed on the second die.
  • the first RDL structure and the second RDL structure respectively include the above-mentioned RDL structure.
  • the first RDL structure and the second RDL structure are located between the first die and the second die and coupled to each other.
  • the third pad of the first RDL structure may be coupled to the fourth pad of the second RDL structure.
  • the fourth pad of the first RDL structure may be coupled to the third pad of the second RDL structure.
  • the semiconductor package may further include a first electrical connector and a second electrical connector.
  • the first electrical connector is coupled between the third conductive layer of the first RDL structure and the fourth conductive layer of the first RDL structure.
  • the second electrical connector is coupled between the fifth conductive layer of the first RDL structure and the sixth conductive layer of the first RDL structure.
  • the semiconductor package may further include a third electrical connector and a fourth electrical connector.
  • the third electrical connector is coupled between the first conductive layer of the second RDL structure and the second conductive layer of the second RDL structure.
  • the fourth electrical connector is coupled between the seventh conductive layer of the second RDL structure and the eighth conductive layer of the second RDL structure.
  • the semiconductor package may further include a fifth electrical connector and a sixth electrical connector.
  • the fifth electrical connector is coupled between the third pad of the first RDL structure and the fourth pad of the second RDL structure.
  • the sixth electrical connector is coupled between the fourth pad of the first RDL structure and the third pad of the second RDL structure.
  • the RDL structure may further include a first conductive line, a second conductive line, a third conductive line, a fourth conductive line, a fifth conductive line, a sixth conductive line, a seventh conductive line, and an eighth conductive line.
  • the first conductive line is coupled between the first conductive layer and the first pad.
  • the second conductive line is coupled between the second conductive layer and the third pad.
  • the third conductive line is coupled between the third conductive layer and the first pad.
  • the fourth conductive line is coupled between the fourth conductive layer and the fourth pad.
  • the fifth conductive line is coupled between the fifth conductive layer and the second pad.
  • the sixth conductive line is coupled between the sixth conductive layer and the third pad.
  • the seventh conductive line is coupled between the seventh conductive layer and the second pad.
  • the eighth conductive line is coupled between the eighth conductive layer and the fourth pad.
  • the first conductive line, the first conductive layer, and the first pad may be integrally formed.
  • the second conductive line, the second conductive layer, and the third pad may be integrally formed.
  • the third conductive line, the third conductive layer, and the first pad may be integrally formed.
  • the fourth conductive line, the fourth conductive layer, and the fourth pad may be integrally formed.
  • the fifth conductive line, the fifth conductive layer, and the second pad may be integrally formed.
  • the sixth conductive line, the sixth conductive layer, and the third pad may be integrally formed.
  • the seventh conductive line, the seventh conductive layer, and the second pad may be integrally formed.
  • the eighth conductive line, the eighth conductive layer, and the fourth pad may be integrally formed.
  • the RDL structure may further include a fifth pad and a sixth pad.
  • the fifth pad is coupled to the third pad.
  • the sixth pad is coupled to the fourth pad.
  • the RDL structure may further include a ninth conductive line and a tenth conductive line.
  • the ninth conductive line is coupled between the third pad and the fifth pad.
  • the tenth conductive line is coupled between the fourth pad and the sixth pad.
  • the ninth conductive line, the third pad, and the fifth pad may be integrally formed.
  • the tenth conductive line, the fourth pad, and the sixth pad may be integrally formed.
  • the RDL structure may further include at least one dummy pad.
  • the dummy pad is separated from the first pad, the second pad, the third pad, the fourth pad, the first switch device, the second switch device, the third switch device, and the fourth switch device.
  • the semiconductor package may further include a substrate.
  • the first die and the second die may be stacked on the substrate.
  • the second die may be located between the first die and the substrate.
  • the semiconductor package may further include an encapsulant.
  • the first die and the second die are encapsulated by the encapsulant.
  • the RDL structure according to the invention includes the first switch device, the second switch device, the third switch device, and the fourth switch device. Therefore, the coupling relationship between the pads can be determined by respectively setting the first switch device, the second switch device, the third switch device, and the fourth switch device to the “on state” or the “off state”. In this way, various wiring methods of RDL can be achieved by the same RDL structure.
  • the first die and the second die can be coupled to each other by the first and second RDL structures having the same RDL layout pattern. Therefore, the quantity of the photomask can be effectively reduced, and the production cost can be reduced.
  • FIG. 1 is a top view illustrating an RDL structure according to an embodiment of the invention.
  • FIG. 2 is a side view illustrating a semiconductor package according to an embodiment of the invention.
  • FIG. 3 is a top view illustrating the RDL structures disposed on the dies in FIG. 2 .
  • FIG. 4 is a schematic diagram illustrating the RDL structures after flipping one of the dies of FIG. 3 .
  • FIG. 1 is a top view illustrating an RDL structure according to an embodiment of the invention.
  • an RDL structure 100 includes a pad 102 a, a pad 102 b, a pad 102 c, a pad 102 d, a switch device 104 a, a switch device 104 b, a switch device 104 c, and a switch device 104 d.
  • RDL structure 100 is, for example, an RDL layout pattern.
  • the pad 102 a, the pad 102 b, the pad 102 c, and the pad 102 d are separated from each other.
  • the pad 102 a and the pad 102 b can be used as die pads, and the pad 102 c and the pad 102 d can be used as solder pads, but the invention is not limited thereto.
  • the pad 102 a and the pad 102 b are, for example, located between the pad 102 c and the pad 102 d, but the invention is not limited thereto.
  • One of ordinary skill in the art can adjust the arrangement of the pad 102 a, the pad 102 b, the pad 102 c, and the pad 102 d according to the product design.
  • the material of the pads 102 a ⁇ 102 d is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • the switch device 104 a includes a conductive layer 106 a and a conductive layer 106 b separated from each other.
  • the conductive layer 106 a is coupled to the pad 102 a.
  • the conductive layer 106 b is coupled to the pad 102 c.
  • the switch device 104 b includes a conductive layer 106 c and a conductive layer 106 d separated from each other.
  • the conductive layer 106 c is coupled to the pad 102 a.
  • the conductive layer 106 d is coupled to the pad 102 d.
  • the switch device 104 c includes a conductive layer 106 e and a conductive layer 106 f separated from each other.
  • the conductive layer 106 e is coupled to the pad 102 b.
  • the conductive layer 106 f is coupled to the pad 102 c.
  • the switch device 104 d includes a conductive layer 106 g and a conductive layer 106 h separated from each other.
  • the conductive layer 106 g is coupled to the pad 102 b.
  • the conductive layer 106 h is coupled to the pad 102 d.
  • the term “coupled” may be “directly coupled” or “indirectly coupled”.
  • the material of the conductive layers 106 a ⁇ 106 h is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • the switch device 104 a can be used to determine the coupling relationship between the pad 102 a and the pad 102 c.
  • the switch device 104 b can be used to determine the coupling relationship between the pad 102 a and the pad 102 d.
  • the switch device 104 c can be used to determine the coupling relationship between the pad 102 b and the pad 102 c.
  • the switch device 104 d can be used to determine the coupling relationship between the pad 102 b and the pad 102 d.
  • the switch device 104 a is taken as an example for explanation.
  • the switch device 104 a is in the “off state”, and the pad 102 a and the pad 102 c are not coupled to each other.
  • the switch device 104 a is in the “on state”, and the pad 102 a and the pad 102 c are coupled to each other.
  • the RDL structure 100 may further include a conductive line 108 a, a conductive line 108 b, a conductive line 108 c, a conductive line 108 d, a conductive line 108 e, a conductive line 108 f, a conductive line 108 g, and a conductive line 108 h.
  • the conductive line 108 a is coupled between the conductive layer 106 a and the pad 102 a.
  • the conductive line 108 a, the conductive layer 106 a, and the pad 102 a may be integrally formed.
  • the conductive line 108 b is coupled between the conductive layer 106 b and the pad 102 c.
  • the conductive line 108 b, the conductive layer 106 b, and the pad 102 c may be integrally formed.
  • the conductive line 108 c is coupled between the conductive layer 106 c and the pad 102 a.
  • the conductive line 108 c, the conductive layer 106 c, and the pad 102 a may be integrally formed.
  • the conductive line 108 d is coupled between the conductive layer 106 d and the pad 102 d.
  • the conductive line 108 d, the conductive layer 106 d, and the pad 102 d may be integrally formed.
  • the conductive line 108 e is coupled between the conductive layer 106 e and the pad 102 b.
  • the conductive line 108 e, the conductive layer 106 e, and the pad 102 b may be integrally formed.
  • the conductive line 108 f is coupled between the conductive layer 106 f and the pad 102 c.
  • the conductive line 108 f, the conductive layer 106 f, and the pad 102 c may be integrally formed.
  • the conductive line 108 g is coupled between the conductive layer 106 g and the pad 102 b.
  • the conductive line 108 g, the conductive layer 106 g, and the pad 102 b may be integrally formed.
  • the conductive line 108 h is coupled between the conductive layer 106 h and the pad 102 d.
  • the conductive line 108 h, the conductive layer 106 h, and the pad 102 d may be integrally formed.
  • the material of the conductive lines 108 a ⁇ 108 h is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • the conductive lines coupled to the same pad may be separated from each other or have the shared portion.
  • the conductive lines 108 a, 108 c, 108 e, and 108 g are taken as examples for explanation.
  • the conductive line 108 a and the conductive line 108 c are coupled to the same pad 102 a and separated from each other, but the invention is not limited thereto.
  • the conductive line 108 a and the conductive line 108 c coupled to the same pad 102 a may have the shared portion.
  • the conductive line 108 e and the conductive line 108 g are coupled to the same pad 102 b and have the shared portion, but the invention is not limited thereto.
  • the conductive line 108 e and the conductive line 108 g coupled to the same pad 102 b may be separated from each other.
  • the RDL structure 100 may further include a pad 102 e and a pad 102 f.
  • the pad 102 e is coupled to the pad 102 c.
  • the pad 102 f is coupled to the pad 102 d.
  • the pad 102 e and the pad 102 f can be used as bond pads.
  • the material of the pads 102 e and 102 f is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • the RDL structure 100 may further include a conductive line 108 i and a conductive line 108 j.
  • the conductive line 108 i is coupled between the pad 102 c and the pad 102 e.
  • the conductive line 108 i, the pad 102 c, and the pad 102 e may be integrally formed.
  • the conductive line 108 j is coupled between the pad 102 d and the pad 102 f.
  • the conductive line 108 j, the pad 102 d, and the pad 102 f may be integrally formed.
  • the material of the conductive lines 108 i and 108 j is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • the RDL structure 100 may further include at least one dummy pad.
  • the RDL structure 100 may include a dummy pad 110 a, a dummy pad 110 b, a dummy pad 110 c, and a dummy pad 110 d, but the invention is not limited thereto.
  • the dummy pads 110 a ⁇ 110 d are separated from the pads 102 a ⁇ 102 f, the switch devices 104 a ⁇ 104 d, and the conductive lines 108 a ⁇ 108 j.
  • the dummy pads 110 a ⁇ 110 d can be used to support the electrical connectors (e.g., solder ball) (not shown).
  • the coupling relationship between the pads can be determined by respectively setting the switch device 104 a, the switch device 104 b, the switch device 104 c, and the switch device 104 d to the “on state” or the “off state”.
  • various wiring methods of RDL can be achieved by the same RDL structure 100 , so that the quantity of the photomask can be effectively reduced, thereby reducing the production cost.
  • FIG. 2 is a side view illustrating a semiconductor package according to an embodiment of the invention. Some of the components and reference numerals are omitted in FIG. 2 to clearly illustrate the arrangement relationship between the electrical connectors 114 a, 114 b, 114 e, 114 f and the components coupled to the electrical connectors 114 a, 114 b, 114 e, 114 f.
  • FIG. 3 is a top view illustrating the RDL structures disposed on the dies in FIG. 2 .
  • FIG. 4 is a schematic diagram illustrating the RDL structures after flipping one of the dies of FIG. 3 .
  • a semiconductor package 10 includes a die 112 a, a die 112 b, an RDL structure 100 a, and an RDL structure 100 b.
  • the above-mentioned RDL structure 100 is exemplified by applying to the semiconductor package 10 , but the invention is not limited thereto.
  • the RDL structure 100 can be applied to any semiconductor package 10 to flexibly design the wiring method of RDL.
  • the semiconductor package 10 is, for example, a dual die package (DDP), but the invention is not limited thereto.
  • the semiconductor package 10 is exemplified by a flip chip package (FCP).
  • the RDL structure 100 a is disposed on the die 112 a.
  • the RDL structure 100 b is disposed on the die 112 b.
  • the RDL structure 100 a and the RDL structure 100 b respectively include the above-mentioned RDL structure 100 .
  • the RDL structure 100 a and the RDL structure 100 b include all of the components of the RDL structure 100 .
  • the pad 102 a of the RDL structure 100 a and the pad 102 b of the RDL structure 100 a may be coupled to the die 112 a.
  • the pad 102 a of the RDL structure 100 b and the pad 102 b of the RDL structure 100 b may be coupled to the die 112 b.
  • the material, the arrangement, and the effect of each component of the RDL structure 100 have been described in detail in the above embodiments, and are not repeated herein.
  • the RDL structure 100 a and the RDL structure 100 b are located between the die 112 a and the die 112 b and coupled to each other.
  • the pad 102 c of the RDL structure 100 a may be coupled to the pad 102 d of the RDL structure 100 b
  • the pad 102 d of the RDL structure 100 a may be coupled to the pad 102 c of the RDL structure 100 b.
  • the semiconductor package 10 may further include at least one of an electrical connector 114 a, an electrical connector 114 b, an electrical connector 114 c, an electrical connector 114 d, an electrical connector 114 e, an electrical connector 114 f, a substrate 116 , a bonding wire 118 a, a bonding wire 118 b, and an encapsulant 120 .
  • the electrical connectors 114 a ⁇ 114 f are, for example, solder balls, conductive pillars (e.g., copper pillar), a combination thereof, or the like. In the present embodiment, the electrical connectors 114 a ⁇ 114 f are exemplified by solder balls, but the invention is not limited thereto.
  • the electrical connector 114 a is coupled between the conductive layer 106 c of the RDL structure 100 a and the conductive layer 106 d of the RDL structure 100 a. Thereby, in the RDL structure 100 a, the switch device 104 b is in the “on state”, and the pad 102 a and the pad 102 d are coupled to each other.
  • the electrical connector 114 b is coupled between the conductive layer 106 e of the RDL structure 100 a and the conductive layer 106 f of the RDL structure 100 a. Thereby, in the RDL structure 100 a, the switch device 104 c is in the “on state”, and the pad 102 b and the pad 102 c are coupled to each other.
  • the switch device 104 a and the switch device 104 d are in the “off state”, the pad 102 a and the pad 102 c are not coupled to each other, and the pad 102 b and the pad 102 d are not coupled to each other.
  • the electrical connector 114 c is coupled between the conductive layer 106 a of the RDL structure 100 b and the conductive layer 106 b of the RDL structure 100 b. Thereby, in the RDL structure 100 b, the switch device 104 a is in the “on state”, and the pad 102 a and the pad 102 c are coupled to each other.
  • the electrical connector 114 d is coupled between the conductive layer 106 g of the RDL structure 100 b and the conductive layer 106 h of the RDL structure 100 b. Thereby, in the RDL structure 100 b, the switch device 104 d is in the “on state”, and the pad 102 b and the pad 102 d are coupled to each other.
  • the switch device 104 b and the switch device 104 c are in the “off state”, the pad 102 a and the pad 102 d are not coupled to each other, and the pad 102 b and the pad 102 c are not coupled to each other.
  • the electrical connector 114 e is coupled between the pad 102 c of the RDL structure 100 a and the pad 102 d of the RDL structure 100 b.
  • the electrical connector 114 f is coupled between the pad 102 d of the RDL structure 100 a and the pad 102 c of the RDL structure 100 b. Thereby, the RDL structure 100 a and the RDL structure 100 b can be coupled to each other.
  • the pad 102 a of the RDL structure 100 a and the pad 102 a of the RDL structure 100 b can be coupled to each other, and the pad 102 b of the RDL structure 100 a and the pad 102 b of the RDL structure 100 b can be coupled to each other.
  • the RDL structure 100 can be used to achieve various wiring methods of RDL, the die 112 a and the die 112 b can be coupled to each other by the RDL structures 100 a and 100 b having the same RDL layout pattern. Therefore, the quantity of the photomask can be effectively reduced, and the production cost can be reduced.
  • the dummy pad 110 b of the RDL structure 100 a can be used to support the electrical connector 114 c.
  • the dummy pad 110 c of the RDL structure 100 a can be used to support the electrical connector 114 d.
  • the dummy pad 110 a of the RDL structure 100 b can be used to support the electrical connector 114 a.
  • the dummy pad 110 d of the RDL structure 100 b can be used to support the electrical connector 114 b.
  • the die 112 a and the die 112 b may be stacked on the substrate 116 .
  • the die 112 b may be located between the die 112 a and the substrate 116 , but the invention is not limited thereto.
  • the substrate 116 may have a first side S 1 and a second side S 2 opposite to each other.
  • the die 112 a and the die 112 b may be located on the first side S 1 .
  • the substrate 116 is, for example, a package substrate such as a printed circuit board (PCB).
  • PCB printed circuit board
  • the bonding wires 118 a and 118 b can be used to couple the RDL structure 100 b to the substrate 116 , but the invention is not limited thereto.
  • the bonding wires 118 a may be coupled between the pad 102 e of the RDL structure 100 b and the substrate 116
  • the bonding wires 118 b may be coupled between the pad 102 f of the RDL structure 100 b and the substrate 116 .
  • the die 112 a and the die 112 b are encapsulated by the encapsulant 120 . Therefore, the encapsulant 120 can be used to protect the die 112 a and the die 112 b.
  • the encapsulant 120 includes a molding compound, a resin such as epoxy, a combination thereof, or the like.
  • the semiconductor package 10 is exemplified by including one RDL structure 100 a and one RDL structure 100 b, but the invention is not limited thereto.
  • the semiconductor package 10 may include a plurality of RDL structures 100 a disposed on the die 112 a and a plurality of RDL structures 100 b disposed on the die 112 b.
  • the semiconductor package 10 may further include other components known in the art (e.g., an under bump metallization (UBM) layer (not shown) or at least one electrical connector (not shown) located on the second side S 2 of the substrate 116 ), and will not be described herein.
  • UBM under bump metallization
  • the die 112 a and the die 112 b can be coupled to each other by the RDL structures 100 a and 100 b having the same RDL layout pattern. Therefore, the quantity of the photomask can be effectively reduced, and the production cost can be reduced.

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Abstract

An RDL structure including a first pad, a second pad, a third pad, a fourth pad, a first switch device, a second switch device, a third switch device, and a fourth switch device is provided. The first pad, the second pad, the third pad, and the fourth pad are separated from each other. The first switch device includes a first conductive layer and a second conductive layer separated from each other. The second switch device includes a third conductive layer and a fourth conductive layer separated from each other. The third switch device includes a fifth conductive layer and a sixth conductive layer separated from each other. The fourth switch device includes a seventh conductive layer and an eighth conductive layer separated from each other.

Description

    BACKGROUND OF THE INVENTION Field of the Invention
  • The invention relates to a semiconductor structure, and particularly relates to a redistribution layer (RDL) structure and a semiconductor package.
    • Description of Related Art
  • In order for electronic product design to achieve being light, slim, short, and small, semiconductor packaging technology has kept progressing, in attempt to develop products that are smaller in volume, lighter in weight, higher in integration, and more competitive in market. For example, in some products, if a package requires multi-chip stacking, different RDL structures are generally required to provide the connection. However, since the different RDL structures need to be fabricated using different masks, the production cost is increased.
    • SUMMARY OF THE INVENTION
  • The invention provides an RDL structure and a semiconductor package, which can effectively reduce the production cost.
  • The invention provides an RDL structure, which includes a first pad, a second pad, a third pad, a fourth pad, a first switch device, a second switch device, a third switch device, and a fourth switch device. The first pad, the second pad, the third pad, and the fourth pad are separated from each other. The first switch device includes a first conductive layer and a second conductive layer separated from each other. The first conductive layer is coupled to the first pad. The second conductive layer is coupled to the third pad. The second switch device includes a third conductive layer and a fourth conductive layer separated from each other. The third conductive layer is coupled to the first pad. The fourth conductive layer is coupled to the fourth pad. The third switch device includes a fifth conductive layer and a sixth conductive layer separated from each other. The fifth conductive layer is coupled to the second pad. The sixth conductive layer is coupled to the third pad. The fourth switch device includes a seventh conductive layer and an eighth conductive layer separated from each other. The seventh conductive layer is coupled to the second pad. The eighth conductive layer is coupled to the fourth pad.
  • According to an embodiment of the invention, the RDL structure may further include a first conductive line, a second conductive line, a third conductive line, a fourth conductive line, a fifth conductive line, a sixth conductive line, a seventh conductive line, and an eighth conductive line. The first conductive line is coupled between the first conductive layer and the first pad. The second conductive line is coupled between the second conductive layer and the third pad. The third conductive line is coupled between the third conductive layer and the first pad. The fourth conductive line is coupled between the fourth conductive layer and the fourth pad. The fifth conductive line is coupled between the fifth conductive layer and the second pad. The sixth conductive line is coupled between the sixth conductive layer and the third pad. The seventh conductive line is coupled between the seventh conductive layer and the second pad. The eighth conductive line is coupled between the eighth conductive layer and the fourth pad.
  • According to an embodiment of the invention, in the RDL structure, the first conductive line, the first conductive layer, and the first pad may be integrally formed. The second conductive line, the second conductive layer, and the third pad may be integrally formed. The third conductive line, the third conductive layer, and the first pad may be integrally formed. The fourth conductive line, the fourth conductive layer, and the fourth pad may be integrally formed. The fifth conductive line, the fifth conductive layer, and the second pad may be integrally formed. The sixth conductive line, the sixth conductive layer, and the third pad may be integrally formed. The seventh conductive line, the seventh conductive layer, and the second pad may be integrally formed. The eighth conductive line, the eighth conductive layer, and the fourth pad may be integrally formed.
  • According to an embodiment of the invention, the RDL structure may further include a fifth pad and a sixth pad. The fifth pad is coupled to the third pad. The sixth pad is coupled to the fourth pad.
  • According to an embodiment of the invention, the RDL structure may further include a ninth conductive line and a tenth conductive line. The ninth conductive line is coupled between the third pad and the fifth pad. The tenth conductive line is coupled between the fourth pad and the sixth pad.
  • According to an embodiment of the invention, in the RDL structure, the ninth conductive line, the third pad, and the fifth pad may be integrally formed. The tenth conductive line, the fourth pad, and the sixth pad may be integrally formed.
  • According to an embodiment of the invention, the RDL structure may further include at least one dummy pad. The dummy pad is separated from the first pad, the second pad, the third pad, the fourth pad, the first switch device, the second switch device, the third switch device, and the fourth switch device.
  • The invention provides a semiconductor package, which includes a first die, a second die, a first RDL structure, and a second RDL structure. The first RDL structure is disposed on the first die. The second RDL structure is disposed on the second die. The first RDL structure and the second RDL structure respectively include the above-mentioned RDL structure. The first RDL structure and the second RDL structure are located between the first die and the second die and coupled to each other.
  • According to an embodiment of the invention, in the semiconductor package, the third pad of the first RDL structure may be coupled to the fourth pad of the second RDL structure. The fourth pad of the first RDL structure may be coupled to the third pad of the second RDL structure.
  • According to an embodiment of the invention, the semiconductor package may further include a first electrical connector and a second electrical connector. The first electrical connector is coupled between the third conductive layer of the first RDL structure and the fourth conductive layer of the first RDL structure. The second electrical connector is coupled between the fifth conductive layer of the first RDL structure and the sixth conductive layer of the first RDL structure.
  • According to an embodiment of the invention, the semiconductor package may further include a third electrical connector and a fourth electrical connector. The third electrical connector is coupled between the first conductive layer of the second RDL structure and the second conductive layer of the second RDL structure. The fourth electrical connector is coupled between the seventh conductive layer of the second RDL structure and the eighth conductive layer of the second RDL structure.
  • According to an embodiment of the invention, the semiconductor package may further include a fifth electrical connector and a sixth electrical connector. The fifth electrical connector is coupled between the third pad of the first RDL structure and the fourth pad of the second RDL structure. The sixth electrical connector is coupled between the fourth pad of the first RDL structure and the third pad of the second RDL structure.
  • According to an embodiment of the invention, in the semiconductor package, the RDL structure may further include a first conductive line, a second conductive line, a third conductive line, a fourth conductive line, a fifth conductive line, a sixth conductive line, a seventh conductive line, and an eighth conductive line. The first conductive line is coupled between the first conductive layer and the first pad. The second conductive line is coupled between the second conductive layer and the third pad. The third conductive line is coupled between the third conductive layer and the first pad. The fourth conductive line is coupled between the fourth conductive layer and the fourth pad. The fifth conductive line is coupled between the fifth conductive layer and the second pad. The sixth conductive line is coupled between the sixth conductive layer and the third pad. The seventh conductive line is coupled between the seventh conductive layer and the second pad. The eighth conductive line is coupled between the eighth conductive layer and the fourth pad.
  • According to an embodiment of the invention, in the semiconductor package, the first conductive line, the first conductive layer, and the first pad may be integrally formed. The second conductive line, the second conductive layer, and the third pad may be integrally formed. The third conductive line, the third conductive layer, and the first pad may be integrally formed. The fourth conductive line, the fourth conductive layer, and the fourth pad may be integrally formed. The fifth conductive line, the fifth conductive layer, and the second pad may be integrally formed. The sixth conductive line, the sixth conductive layer, and the third pad may be integrally formed. The seventh conductive line, the seventh conductive layer, and the second pad may be integrally formed. The eighth conductive line, the eighth conductive layer, and the fourth pad may be integrally formed.
  • According to an embodiment of the invention, in the semiconductor package, the RDL structure may further include a fifth pad and a sixth pad. The fifth pad is coupled to the third pad. The sixth pad is coupled to the fourth pad.
  • According to an embodiment of the invention, in the semiconductor package, the RDL structure may further include a ninth conductive line and a tenth conductive line. The ninth conductive line is coupled between the third pad and the fifth pad. The tenth conductive line is coupled between the fourth pad and the sixth pad.
  • According to an embodiment of the invention, in the semiconductor package, the ninth conductive line, the third pad, and the fifth pad may be integrally formed. The tenth conductive line, the fourth pad, and the sixth pad may be integrally formed.
  • According to an embodiment of the invention, in the semiconductor package, the RDL structure may further include at least one dummy pad. The dummy pad is separated from the first pad, the second pad, the third pad, the fourth pad, the first switch device, the second switch device, the third switch device, and the fourth switch device.
  • According to an embodiment of the invention, the semiconductor package may further include a substrate. The first die and the second die may be stacked on the substrate. The second die may be located between the first die and the substrate.
  • According to an embodiment of the invention, the semiconductor package may further include an encapsulant. The first die and the second die are encapsulated by the encapsulant.
  • Based on the above, the RDL structure according to the invention includes the first switch device, the second switch device, the third switch device, and the fourth switch device. Therefore, the coupling relationship between the pads can be determined by respectively setting the first switch device, the second switch device, the third switch device, and the fourth switch device to the “on state” or the “off state”. In this way, various wiring methods of RDL can be achieved by the same RDL structure. In the semiconductor package according to the invention, since the RDL structure can be used to achieve various wiring methods of RDL, the first die and the second die can be coupled to each other by the first and second RDL structures having the same RDL layout pattern. Therefore, the quantity of the photomask can be effectively reduced, and the production cost can be reduced.
  • In order to make the aforementioned and other objects, features and advantages of the invention comprehensible, several exemplary embodiments accompanied with figures are described in detail below.
    • BRIEF DESCRIPTION OF THE DRAWINGS
  • The accompanying drawings are included to provide a further understanding of the invention, and are incorporated in and constitute a part of this specification. The drawings illustrate embodiments of the invention and, together with the description, serve to explain the principles of the invention.
  • FIG. 1 is a top view illustrating an RDL structure according to an embodiment of the invention.
  • FIG. 2 is a side view illustrating a semiconductor package according to an embodiment of the invention.
  • FIG. 3 is a top view illustrating the RDL structures disposed on the dies in FIG. 2.
  • FIG. 4 is a schematic diagram illustrating the RDL structures after flipping one of the dies of FIG. 3.
    •  DESCRIPTION OF THE EMBODIMENTS
  • FIG. 1 is a top view illustrating an RDL structure according to an embodiment of the invention.
  • Referring to FIG. 1A, an RDL structure 100 includes a pad 102 a, a pad 102 b, a pad 102 c, a pad 102 d, a switch device 104 a, a switch device 104 b, a switch device 104 c, and a switch device 104 d. RDL structure 100 is, for example, an RDL layout pattern.
  • The pad 102 a, the pad 102 b, the pad 102 c, and the pad 102 d are separated from each other. In the present embodiment, the pad 102 a and the pad 102 b can be used as die pads, and the pad 102 c and the pad 102 d can be used as solder pads, but the invention is not limited thereto. Furthermore, the pad 102 a and the pad 102 b are, for example, located between the pad 102 c and the pad 102 d, but the invention is not limited thereto. One of ordinary skill in the art can adjust the arrangement of the pad 102 a, the pad 102 b, the pad 102 c, and the pad 102 d according to the product design. The material of the pads 102 a˜102 d is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • The switch device 104 a includes a conductive layer 106 a and a conductive layer 106 b separated from each other. The conductive layer 106 a is coupled to the pad 102 a. The conductive layer 106 b is coupled to the pad 102 c. The switch device 104 b includes a conductive layer 106 c and a conductive layer 106 d separated from each other. The conductive layer 106 c is coupled to the pad 102 a. The conductive layer 106 d is coupled to the pad 102 d. The switch device 104 c includes a conductive layer 106 e and a conductive layer 106 f separated from each other. The conductive layer 106 e is coupled to the pad 102 b. The conductive layer 106 f is coupled to the pad 102 c. The switch device 104 d includes a conductive layer 106 g and a conductive layer 106 h separated from each other. The conductive layer 106 g is coupled to the pad 102 b. The conductive layer 106 h is coupled to the pad 102 d. In the present embodiment, the term “coupled” may be “directly coupled” or “indirectly coupled”. The material of the conductive layers 106 a˜106 h is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • The switch device 104 a can be used to determine the coupling relationship between the pad 102 a and the pad 102 c. The switch device 104 b can be used to determine the coupling relationship between the pad 102 a and the pad 102 d. The switch device 104 c can be used to determine the coupling relationship between the pad 102 b and the pad 102 c. The switch device 104 d can be used to determine the coupling relationship between the pad 102 b and the pad 102 d.
  • Hereinafter, the switch device 104 a is taken as an example for explanation. When the conductive layer 106 a and the conductive layer 106 b are not coupled to each other, the switch device 104 a is in the “off state”, and the pad 102 a and the pad 102 c are not coupled to each other. When the conductive layer 106 a and the conductive layer 106 b are coupled to each other by an electrical connector (e.g., solder ball), the switch device 104 a is in the “on state”, and the pad 102 a and the pad 102 c are coupled to each other.
  • Moreover, the RDL structure 100 may further include a conductive line 108 a, a conductive line 108 b, a conductive line 108 c, a conductive line 108 d, a conductive line 108 e, a conductive line 108 f, a conductive line 108 g, and a conductive line 108 h. The conductive line 108 a is coupled between the conductive layer 106 a and the pad 102 a. The conductive line 108 a, the conductive layer 106 a, and the pad 102 a may be integrally formed. The conductive line 108 b is coupled between the conductive layer 106 b and the pad 102 c. The conductive line 108 b, the conductive layer 106 b, and the pad 102 c may be integrally formed. The conductive line 108 c is coupled between the conductive layer 106 c and the pad 102 a. The conductive line 108 c, the conductive layer 106 c, and the pad 102 a may be integrally formed. The conductive line 108 d is coupled between the conductive layer 106 d and the pad 102 d. The conductive line 108 d, the conductive layer 106 d, and the pad 102 d may be integrally formed. The conductive line 108 e is coupled between the conductive layer 106 e and the pad 102 b. The conductive line 108 e, the conductive layer 106 e, and the pad 102 b may be integrally formed. The conductive line 108 f is coupled between the conductive layer 106 f and the pad 102 c. The conductive line 108 f, the conductive layer 106 f, and the pad 102 c may be integrally formed. The conductive line 108 g is coupled between the conductive layer 106 g and the pad 102 b. The conductive line 108 g, the conductive layer 106 g, and the pad 102 b may be integrally formed. The conductive line 108 h is coupled between the conductive layer 106 h and the pad 102 d. The conductive line 108 h, the conductive layer 106 h, and the pad 102 d may be integrally formed. The material of the conductive lines 108 a˜108 h is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • The conductive lines coupled to the same pad may be separated from each other or have the shared portion. Hereinafter, the conductive lines 108 a, 108 c, 108 e, and 108 g are taken as examples for explanation. In the present embodiment, the conductive line 108 a and the conductive line 108 c are coupled to the same pad 102 a and separated from each other, but the invention is not limited thereto. In other embodiment, the conductive line 108 a and the conductive line 108 c coupled to the same pad 102 a may have the shared portion. In the present embodiment, the conductive line 108 e and the conductive line 108 g are coupled to the same pad 102 b and have the shared portion, but the invention is not limited thereto. In other embodiment, the conductive line 108 e and the conductive line 108 g coupled to the same pad 102 b may be separated from each other.
  • In addition, the RDL structure 100 may further include a pad 102 e and a pad 102 f. The pad 102 e is coupled to the pad 102 c. The pad 102 f is coupled to the pad 102 d. The pad 102 e and the pad 102 f can be used as bond pads. The material of the pads 102 e and 102 f is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • Besides, the RDL structure 100 may further include a conductive line 108 i and a conductive line 108 j. The conductive line 108 i is coupled between the pad 102 c and the pad 102 e. The conductive line 108 i, the pad 102 c, and the pad 102 e may be integrally formed. The conductive line 108 j is coupled between the pad 102 d and the pad 102 f. The conductive line 108 j, the pad 102 d, and the pad 102 f may be integrally formed. The material of the conductive lines 108 i and 108 j is, for example, copper (Cu), aluminum (Al), nickel (Ni), or gold (Au).
  • Furthermore, the RDL structure 100 may further include at least one dummy pad. For example, the RDL structure 100 may include a dummy pad 110 a, a dummy pad 110 b, a dummy pad 110 c, and a dummy pad110 d, but the invention is not limited thereto. The dummy pads 110 a˜110 d are separated from the pads 102 a˜102 f, the switch devices 104 a˜104 d, and the conductive lines 108 a˜108 j. The dummy pads 110 a˜110 d can be used to support the electrical connectors (e.g., solder ball) (not shown).
  • Based on the above, in the RDL structure 100 of the aforementioned embodiments, the coupling relationship between the pads can be determined by respectively setting the switch device 104 a, the switch device 104 b, the switch device 104 c, and the switch device 104 d to the “on state” or the “off state”. In this way, various wiring methods of RDL can be achieved by the same RDL structure 100, so that the quantity of the photomask can be effectively reduced, thereby reducing the production cost.
  • FIG. 2 is a side view illustrating a semiconductor package according to an embodiment of the invention. Some of the components and reference numerals are omitted in FIG. 2 to clearly illustrate the arrangement relationship between the electrical connectors 114 a, 114 b, 114 e, 114 f and the components coupled to the electrical connectors 114 a, 114 b, 114 e, 114 f. FIG. 3 is a top view illustrating the RDL structures disposed on the dies in FIG. 2. FIG. 4 is a schematic diagram illustrating the RDL structures after flipping one of the dies of FIG. 3.
  • Referring to FIG. 1 to FIG. 4, a semiconductor package 10 includes a die 112 a, a die 112 b, an RDL structure 100 a, and an RDL structure 100 b. In the present embodiment, the above-mentioned RDL structure 100 is exemplified by applying to the semiconductor package 10, but the invention is not limited thereto.
  • The RDL structure 100 can be applied to any semiconductor package 10 to flexibly design the wiring method of RDL. The semiconductor package 10 is, for example, a dual die package (DDP), but the invention is not limited thereto. In the present embodiment, the semiconductor package 10 is exemplified by a flip chip package (FCP).
  • The RDL structure 100 a is disposed on the die 112 a. The RDL structure 100 b is disposed on the die 112 b. The RDL structure 100 a and the RDL structure 100 b respectively include the above-mentioned RDL structure 100. In other words, the RDL structure 100 a and the RDL structure 100 b include all of the components of the RDL structure 100. The pad 102 a of the RDL structure 100 a and the pad 102 b of the RDL structure 100 a may be coupled to the die 112 a. The pad 102 a of the RDL structure 100 b and the pad 102 b of the RDL structure 100 b may be coupled to the die 112 b. Furthermore, the material, the arrangement, and the effect of each component of the RDL structure 100 have been described in detail in the above embodiments, and are not repeated herein.
  • The RDL structure 100 a and the RDL structure 100 b are located between the die 112 a and the die 112 b and coupled to each other. For example, the pad 102 c of the RDL structure 100 a may be coupled to the pad 102 d of the RDL structure 100 b, and the pad 102 d of the RDL structure 100 a may be coupled to the pad 102 c of the RDL structure 100 b.
  • The semiconductor package 10 may further include at least one of an electrical connector 114 a, an electrical connector 114 b, an electrical connector 114 c, an electrical connector 114 d, an electrical connector 114 e, an electrical connector 114 f, a substrate 116, a bonding wire 118 a, a bonding wire 118 b, and an encapsulant 120. The electrical connectors 114 a˜114 f are, for example, solder balls, conductive pillars (e.g., copper pillar), a combination thereof, or the like. In the present embodiment, the electrical connectors 114 a˜114 f are exemplified by solder balls, but the invention is not limited thereto.
  • The electrical connector 114 a is coupled between the conductive layer 106 c of the RDL structure 100 a and the conductive layer 106 d of the RDL structure 100 a. Thereby, in the RDL structure 100 a, the switch device 104 b is in the “on state”, and the pad 102 a and the pad 102 d are coupled to each other. The electrical connector 114 b is coupled between the conductive layer 106 e of the RDL structure 100 a and the conductive layer 106 f of the RDL structure 100 a. Thereby, in the RDL structure 100 a, the switch device 104 c is in the “on state”, and the pad 102 b and the pad 102 c are coupled to each other. Furthermore, in the RDL structure 100 a, since the switch device 104 a and the switch device 104 d are in the “off state”, the pad 102 a and the pad 102 c are not coupled to each other, and the pad 102 b and the pad 102 d are not coupled to each other.
  • The electrical connector 114 c is coupled between the conductive layer 106 a of the RDL structure 100 b and the conductive layer 106 b of the RDL structure 100 b. Thereby, in the RDL structure 100 b, the switch device 104 a is in the “on state”, and the pad 102 a and the pad 102 c are coupled to each other. The electrical connector 114 d is coupled between the conductive layer 106 g of the RDL structure 100 b and the conductive layer 106 h of the RDL structure 100 b. Thereby, in the RDL structure 100 b, the switch device 104 d is in the “on state”, and the pad 102 b and the pad 102 d are coupled to each other. Furthermore, in the RDL structure 100 b, since the switch device 104 b and the switch device 104 c are in the “off state”, the pad 102 a and the pad 102 d are not coupled to each other, and the pad 102 b and the pad 102 c are not coupled to each other.
  • The electrical connector 114 e is coupled between the pad 102 c of the RDL structure 100 a and the pad 102 d of the RDL structure 100 b. The electrical connector 114 f is coupled between the pad 102 d of the RDL structure 100 a and the pad 102 c of the RDL structure 100 b. Thereby, the RDL structure 100 a and the RDL structure 100 b can be coupled to each other.
  • In this way, the pad 102 a of the RDL structure 100 a and the pad 102 a of the RDL structure 100 b can be coupled to each other, and the pad 102 b of the RDL structure 100 a and the pad 102 b of the RDL structure 100 b can be coupled to each other. Moreover, since the RDL structure 100 can be used to achieve various wiring methods of RDL, the die 112 a and the die 112 b can be coupled to each other by the RDL structures 100 a and 100 b having the same RDL layout pattern. Therefore, the quantity of the photomask can be effectively reduced, and the production cost can be reduced.
  • Furthermore, the dummy pad 110 b of the RDL structure 100 a can be used to support the electrical connector 114 c. The dummy pad 110 c of the RDL structure 100 a can be used to support the electrical connector 114 d. The dummy pad 110 a of the RDL structure 100 b can be used to support the electrical connector 114 a. The dummy pad 110 d of the RDL structure 100 b can be used to support the electrical connector 114 b.
  • The die 112 a and the die 112 b may be stacked on the substrate 116. The die 112 b may be located between the die 112 a and the substrate 116, but the invention is not limited thereto. Furthermore, the substrate 116 may have a first side S1 and a second side S2 opposite to each other. The die 112 a and the die 112 b may be located on the first side S1. The substrate 116 is, for example, a package substrate such as a printed circuit board (PCB).
  • The bonding wires 118 a and 118 b can be used to couple the RDL structure 100 b to the substrate 116, but the invention is not limited thereto. For example, the bonding wires 118 a may be coupled between the pad 102 e of the RDL structure 100 b and the substrate 116, and the bonding wires 118 b may be coupled between the pad 102 f of the RDL structure 100 b and the substrate 116.
  • The die 112 a and the die 112 b are encapsulated by the encapsulant 120. Therefore, the encapsulant 120 can be used to protect the die 112 a and the die 112 b. The encapsulant 120 includes a molding compound, a resin such as epoxy, a combination thereof, or the like.
  • In the present embodiment, the semiconductor package 10 is exemplified by including one RDL structure 100 a and one RDL structure 100 b, but the invention is not limited thereto. In other embodiment, the semiconductor package 10 may include a plurality of RDL structures 100 a disposed on the die 112 a and a plurality of RDL structures 100 b disposed on the die 112 b.
  • In some embodiments, the semiconductor package 10 may further include other components known in the art (e.g., an under bump metallization (UBM) layer (not shown) or at least one electrical connector (not shown) located on the second side S2 of the substrate 116), and will not be described herein.
  • Based on the above, in the semiconductor package 10 of the aforementioned embodiments, since the RDL structure 100 can be used to achieve various wiring methods of RDL, the die 112 a and the die 112 b can be coupled to each other by the RDL structures 100 a and 100 b having the same RDL layout pattern. Therefore, the quantity of the photomask can be effectively reduced, and the production cost can be reduced.
  • In summary, in the RDL structure and the semiconductor package of the aforementioned embodiments, various wiring methods of RDL can be achieved by the same RDL structure, so that the quantity of the photomask can be effectively reduced, thereby reducing the production cost.
  • Although the invention has been described with reference to the above embodiments, it will be apparent to one of ordinary skill in the art that modifications to the described embodiments may be made without departing from the spirit of the invention. Accordingly, the scope of the invention is defined by the attached claims not by the above detailed descriptions.

Claims (20)

1. A redistribution layer (RDL) structure, comprising:
a first pad, a second pad, a third pad, and a fourth pad separated from each other;
a fifth pad coupled to the third pad;
a sixth pad coupled to the fourth pad;
a first switch device comprising a first conductive layer and a second conductive layer separated from each other, wherein the first conductive layer is coupled to the first pad, and the second conductive layer is coupled to the third pad;
a second switch device comprising a third conductive layer and a fourth conductive layer separated from each other, wherein the third conductive layer is coupled to the first pad, and the fourth conductive layer is coupled to the fourth pad;
a third switch device comprising a fifth conductive layer and a sixth conductive layer separated from each other, wherein the fifth conductive layer is coupled to the second pad, and the sixth conductive layer is coupled to the third pad; and
a fourth switch device comprising a seventh conductive layer and an eighth conductive layer separated from each other, wherein the seventh conductive layer is coupled to the second pad, and the eighth conductive layer is coupled to the fourth pad.
2. The RDL structure according to claim 1, further comprising:
a first conductive line coupled between the first conductive layer and the first pad;
a second conductive line coupled between the second conductive layer and the third pad;
a third conductive line coupled between the third conductive layer and the first pad;
a fourth conductive line coupled between the fourth conductive layer and the fourth pad;
a fifth conductive line coupled between the fifth conductive layer and the second pad;
a sixth conductive line coupled between the sixth conductive layer and the third pad;
a seventh conductive line coupled between the seventh conductive layer and the second pad; and
an eighth conductive line coupled between the eighth conductive layer and the fourth pad.
3. The RDL structure according to claim 2, wherein
the first conductive line, the first conductive layer, and the first pad are integrally formed,
the second conductive line, the second conductive layer, and the third pad are integrally formed,
the third conductive line, the third conductive layer, and the first pad are integrally formed,
the fourth conductive line, the fourth conductive layer, and the fourth pad are integrally formed,
the fifth conductive line, the fifth conductive layer, and the second pad are integrally formed,
the sixth conductive line, the sixth conductive layer, and the third pad are integrally formed,
the seventh conductive line, the seventh conductive layer, and the second pad are
the eighth conductive line, the eighth conductive layer, and the fourth pad are integrally formed.
4. (canceled)
5. The RDL structure according to claim 1, further comprising:
a ninth conductive line coupled between the third pad and the fifth pad; and
a tenth conductive line coupled between the fourth pad and the sixth pad.
6. The RDL structure according to claim 5, wherein
the ninth conductive line, the third pad, and the fifth pad are integrally formed, and
the tenth conductive line, the fourth pad, and the sixth pad are integrally formed.
7. An RDL structure, comprising:
a first pad, a second pad, a third pad, and a fourth pad separated from each other;
a first switch device comprising a first conductive layer and a second conductive layer separated from each other, wherein the first conductive layer is coupled to the first pad, and the second conductive layer is coupled to the third pad;
a second switch device comprising a third conductive layer and a fourth conductive layer separated from each other, wherein the third conductive layer is coupled to the first pad, and the fourth conductive layer is coupled to the fourth pad;
a third switch device comprising a fifth conductive layer and a sixth conductive layer separated from each other, wherein the fifth conductive layer is coupled to the second pad, and the sixth conductive layer is coupled to the third pad;
a fourth switch device comprising a seventh conductive layer and an eighth conductive layer separated from each other, wherein the seventh conductive layer is coupled to the second pad, and the eighth conductive layer is coupled to the fourth pad; and
at least one dummy pad separated from the first pad, the second pad, the third pad, the fourth pad, the first switch device, the second switch device, the third switch device, and the fourth switch device.
8. A semiconductor package, comprising:
a first die;
a second die;
a first RDL structure disposed on the first die; and
a second RDL structure disposed on the second die, wherein
the first RDL structure and the second RDL structure respectively comprise an RDL structure comprising:
a first pad, a second pad, a third pad, and a fourth pad separated from each other;
a first switch device comprising a first conductive layer and a second conductive layer separated from each other, wherein the first conductive layer is coupled to the first pad, and the second conductive layer is coupled to the third pad;
a second switch device comprising a third conductive layer and a fourth conductive layer separated from each other, wherein the third conductive layer is coupled to the first pad, and the fourth conductive layer is coupled to the fourth pad;
a third switch device comprising a fifth conductive layer and a sixth conductive layer separated from each other, wherein the fifth conductive layer is coupled to the second pad, and the sixth conductive layer is coupled to the third pad; and
a fourth switch device comprising a seventh conductive layer and an eighth conductive layer separated from each other, wherein the seventh conductive layer is coupled to the second pad, and the eighth conductive layer is coupled to the fourth pad, and
the first RDL structure and the second RDL structure are located between the first die and the second die and coupled to each other.
9. The semiconductor package according to claim 8, wherein the third pad of the first RDL structure is coupled to the fourth pad of the second RDL structure, and the fourth pad of the first RDL structure is coupled to the third pad of the second RDL structure.
10. The semiconductor package according to claim 9, further comprising:
a first electrical connector coupled between the third conductive layer of the first RDL structure and the fourth conductive layer of the first RDL structure; and
a second electrical connector coupled between the fifth conductive layer of the first RDL structure and the sixth conductive layer of the first RDL structure.
11. The semiconductor package according to claim 10, further comprising:
a third electrical connector coupled between the first conductive layer of the second RDL structure and the second conductive layer of the second RDL structure; and
a fourth electrical connector coupled between the seventh conductive layer of the second RDL structure and the eighth conductive layer of the second RDL structure.
12. The semiconductor package according to claim 9, further comprising:
a fifth electrical connector coupled between the third pad of the first RDL structure and the fourth pad of the second RDL structure; and
a sixth electrical connector coupled between the fourth pad of the first RDL structure and the third pad of the second RDL structure.
13. The semiconductor package according to claim 8, wherein the RDL structure further comprises:
a first conductive line coupled between the first conductive layer and the first pad;
a second conductive line coupled between the second conductive layer and the third pad;
a third conductive line coupled between the third conductive layer and the first pad;
a fourth conductive line coupled between the fourth conductive layer and the fourth pad;
a fifth conductive line coupled between the fifth conductive layer and the second pad;
a sixth conductive line coupled between the sixth conductive layer and the third pad;
a seventh conductive line coupled between the seventh conductive layer and the second pad; and
an eighth conductive line coupled between the eighth conductive layer and the fourth pad.
14. The semiconductor package according to claim 13, wherein
the first conductive line, the first conductive layer, and the first pad are integrally formed,
the second conductive line, the second conductive layer, and the third pad are integrally formed,
the third conductive line, the third conductive layer, and the first pad are integrally formed,
the fourth conductive line, the fourth conductive layer, and the fourth pad are integrally formed,
the fifth conductive line, the fifth conductive layer, and the second pad are integrally formed,
the sixth conductive line, the sixth conductive layer, and the third pad are integrally formed,
the seventh conductive line, the seventh conductive layer, and the second pad are integrally formed, and
the eighth conductive line, the eighth conductive layer, and the fourth pad are integrally formed.
15. The semiconductor package according to claim 8, wherein the RDL structure further comprises:
a fifth pad coupled to the third pad; and
a sixth pad coupled to the fourth pad.
16. The semiconductor package according to claim 15, wherein the RDL structure further comprises:
a ninth conductive line coupled between the third pad and the fifth pad; and
a tenth conductive line coupled between the fourth pad and the sixth pad.
17. The semiconductor package according to claim 16, wherein
the ninth conductive line, the third pad, and the fifth pad are integrally formed, and
the tenth conductive line, the fourth pad, and the sixth pad are integrally formed.
18. The semiconductor package according to claim 8, wherein the RDL structure further comprises:
at least one dummy pad separated from the first pad, the second pad, the third pad, the fourth pad, the first switch device, the second switch device, the third switch device, and the fourth switch device.
19. The semiconductor package according to claim 8, further comprising:
a substrate, wherein the first die and the second die are stacked on the substrate, and the second die is located between the first die and the substrate.
20. The semiconductor package according to claim 8, further comprising:
an encapsulant, wherein the first die and the second die are encapsulated by the encapsulant.
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