US20190257763A1 - System and method for detecting a condition of a seal - Google Patents
System and method for detecting a condition of a seal Download PDFInfo
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- US20190257763A1 US20190257763A1 US16/127,986 US201816127986A US2019257763A1 US 20190257763 A1 US20190257763 A1 US 20190257763A1 US 201816127986 A US201816127986 A US 201816127986A US 2019257763 A1 US2019257763 A1 US 2019257763A1
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- seal
- processing circuit
- electrical processing
- analysis device
- hardware
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- 238000000034 method Methods 0.000 title claims description 24
- 230000013011 mating Effects 0.000 claims abstract description 68
- 238000012545 processing Methods 0.000 claims abstract description 45
- 230000007547 defect Effects 0.000 claims abstract description 30
- 230000003287 optical effect Effects 0.000 claims abstract description 8
- 238000007689 inspection Methods 0.000 claims abstract description 6
- 238000002604 ultrasonography Methods 0.000 claims abstract description 5
- 238000011179 visual inspection Methods 0.000 claims description 3
- 238000009434 installation Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 238000007789 sealing Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000004891 communication Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 238000012552 review Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M13/00—Testing of machine parts
- G01M13/005—Sealing rings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/888—Marking defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8803—Visual inspection
Definitions
- the present invention relates to seal detection, in particular, to a system and method for determining relevant characteristics of a seal.
- Seal detection devices are used to determine when a seal should be repaired or replaced.
- U.S. Pat. No. 8,166,891 to Borowski et al. disclose concentric circular chevrons on a sealing surface to provide visual detection of proper installation.
- U.S. Pat. No. 7,477,374 to Schmidt et al. disclose a method and device for examining a sealing surface wherein an optical deflector is used to scatter light across a sealing surface.
- U.S. Pat. No. 7,405,818 to Heinzen discloses a self-monitoring static seal that utilizes an optical sensor and wear indicator on a sealing surface.
- U.S. Pat. No. 9,168,696 to Farrell and U.S. Pat. No. 9,662,833 to Farrell et al. disclose using lasers to change the optical properties of the seal surface.
- a seal analysis system measures and analyzes a seal and/or mating hardware.
- the seal analysis system includes a seal analysis device, e.g. a sensor, and an electrical processing circuit, e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit, configured for communication with the seal analysis device.
- the seal analysis system is further configured for detecting an undesirable characteristic, e.g. defect, information pertaining to useful life or a manufacturing recall, etc., and for analyzing a condition of the seal and/or the mating hardware.
- the seal analysis system can detect defects including a crack scratch, chip, depression and other flaws being located on the surface or internal to the seal and/or mating hardware.
- the seal analysis device may be portable or stationary and may be made up of devices including an optical inspection device, a laser scanner, a phone and an ultrasound scanner.
- the seal analysis device may be further provided to capture an image and/or a video.
- Communication between the seal analysis device and the electrical processing circuit may be wired or wireless.
- the electrical processing circuit may analyze and compare the information of a condition or defect supplied by the seal analysis device against pre-set criteria or against previously captured information of the seal and/or mating surface.
- a seal analysis device such as a sensor.
- the seal analysis device includes an electrical processing circuit and is configured for detecting an undesirable characteristic, e.g. defect, information pertaining to useful life or a manufacturing recall, etc., and for analyzing a condition of the seal and/or the mating hardware.
- the seal analysis device can detect defects including a crack scratch, chip, depression and other flaws being located on the surface or internal to the seal and/or mating hardware.
- the seal analysis device may be portable or stationary and may be made up of devices including an optical inspection device, a laser scanner, a phone and an ultrasound scanner.
- the seal analysis device may be further provided to capture an image and/or a video.
- the electrical processing circuit may analyze and compare the information of a condition or defect supplied by the seal analysis device against pre-set criteria or against previously captured information of the seal and/or mating surface.
- a method for analyzing a seal and/or mating hardware includes the steps of providing a seal and/or mating hardware, cleaning the mating hardware if needed, performing a visual inspection if needed, providing a seal analysis device, e.g. a sensor, configured for detecting an undesirable characteristic, e.g. defect, information pertaining to useful life or a manufacturing recall, etc., providing an electrical processing circuit, e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit, configured to communicate with the seal analysis device, capturing at least one undesirable characteristic about the seal and/or mating surface, and communication the at least one undesirable characteristic to the electrical processing circuit.
- a seal analysis device e.g. a sensor
- an undesirable characteristic e.g. defect, information pertaining to useful life or a manufacturing recall, etc.
- an electrical processing circuit e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit
- the at least one undesirable characteristic captured by the seal analysis device may include a defect or a condition.
- the electrical processing circuit may be configured to compare the at least one undesirable characteristic against a pre-set criteria point such as shape, color or sheen of a surface, or the depth or perimeter of the defect on a seal and/or mating surface.
- An advantage of the present invention is an improved apparatus and method for determining acceptable seals and/or mating surfaces.
- FIG. 1 shows an embodiment of a seal analysis system of the present invention
- FIG. 2 shows a perspective view of another embodiment of a seal analysis device
- FIG. 3 shows an embodiment of a flowchart of a method for analyzing a seal and a mating hardware.
- the seal analysis system 10 for measuring and analyzing a seal 12 and the mating hardware 18 .
- the seal analysis system 10 generally includes a seal analysis device 14 , e.g. sensor, and an electrical processing circuit 16 , e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit, which operably communicates with the seal analysis device 14 .
- the seal analysis system 10 is configured for detecting an undesirable characteristic 12 D in the seal 12 and/or the mating hardware 18 , if one is present, and analyzing a condition of the seal 12 and/or the mating hardware 18 .
- the seal 12 may be in the form of any desired seal 12 , which seals two or more mating surfaces.
- the seal 12 may be in the form of a plate heat exchanger gasket, a manway seal for a railway car, gasket on various valve and engine assemblies, a seal in piping systems, annular seals, shaft seals, and a gasket for any other desired application.
- the seal 12 may be composed of any desired material such as a rubber material, plastic material, or other materials used in seals.
- the seal 12 may include identifying information such as a unique identifier in the form of an identifying label such as a part number, a mark, or a design including lettering, shapes, lines, colors, stripes, a QR code, a data matrix, a mark, an RFID tag, or any other desirable identifier.
- the unique identifier may be associated with information about the seal 12 , which may be retrieved upon scanning the unique identifier. It should be appreciated that the identifier of the seal 12 may only be readable when the seal 12 is properly installed.
- the undesirable characteristic 12 D of the seal 12 and/or the mating hardware 18 may be in the form of any defect, such as a crack, a scratch, a chip, an expansion, a depression, and/or any other flaw in the seal 12 and may also include an identifying label.
- the defect may be on the surface of the seal 12 , it may extend across the length, width, or depth of the seal 12 , and/or the defect may be internally within the seal 12 . As shown, the defect is on the surface of the seal 12 and extends into the depth of the seal 12 .
- the undesirable characteristic 18 D of the mating hardware 18 may be in the form of any defect on the surface and/or within the body of the mating hardware 18 .
- the defect may be in the form of a crack, a scratch, a chip, an expansion, a depression, and/or any other flaw present on and/or within the mating hardware 18 .
- the defect of the mating hardware 18 may extend across the length, width, or depth of the mating hardware 18 and/or the defect may be internally disposed within the mating hardware 18 .
- the mating hardware 18 may be in the form of any hardware or portion thereof to which the seal mates onto or otherwise seals.
- the mating hardware 18 may be in the form of plate heat exchangers, manway covers on railway cars, valves, pipes in various piping systems, hardware for door covers, hardware for housing seals, and/or hardware for tubing connections.
- the seal analysis device 14 may capture information of or identify the seal 12 by way of its unique identifier, the defect 12 D of the seal 12 , and/or mating hardware 18 to which the seal 12 mounts onto.
- the seal analysis device 14 may be in the form of any desired seal analysis device, such as an optical inspection device which may take a photo and/or video of the seal 12 , a laser scanner, and/or an ultrasound scanner.
- the seal analysis device 14 may be a portable and/or a stationary device.
- the seal analysis device 14 may be in the form of a portable three-dimensional (3D) laser scanner 14 that may scan the entire seal 12 or portions thereof, and which may be operated on-site by an operator.
- the portable 3D scanner 14 may capture a 3D image of the seal 12 and/or the defect 12 D of the seal 12 , and/or a 3D image of the mating hardware 18 and/or the defect 18 D of the mating hardware 18 .
- the 3D data captured by the seal analysis device 14 may be used to create a 3D model of the seal 12 and/or the defect 12 D of the seal 12 .
- the seal analysis device 14 may also be in the form of a phone equipped with an image or video capturing device in order to capture data about the seal 12 and/or mating hardware 18 .
- the electrical processing circuit 16 may be operably coupled to the seal analysis device 14 .
- the electrical processing circuit 16 may operably communicate with the seal analysis device 14 via a wired or wireless connection.
- the seal analysis device 14 wirelessly communicates with the electrical processing circuit 16 .
- the electrical processing circuit 16 may be in the form of a central processing unit (CPU) or control unit that includes software to review the data received from the seal analysis device 14 .
- the electrical processing circuit 16 may include the necessary software to process the images or videos captured by the seal analysis device 14 by comparing these images or videos to pre-set criteria in order to detect an acceptable or unacceptable condition of the seal 12 .
- the pre-set criteria may include tolerance levels regarding the shape of the seal 12 , the color or sheen of the seal 12 , the depth of the defect 12 D, or the perimeter of the defect 12 D on the surface of the seal 12 . It is possible for the electrical processing circuit 16 to include various pre-set acceptable or unacceptable conditions of a particular type of seal 12 and/or mating hardware 18 .
- the electrical processing circuit 16 may include prior or pre-set information about the seal 12 , such as the type of seal 12 , the seal model number, the manufacturing date, date of installation of the seal 12 , the material(s) of the seal 12 , the previous and/or next service interval(s), a photograph, video, or service report of the previous inspection or analysis of the seal 12 and/or mating hardware 18 , the date of replacement of the seal 12 , and any other desired information.
- the electrical processing circuit 16 may be located at an off-site, e.g. remote, location.
- the information captured by the seal analysis device 14 may be uploaded to a remote database, and the information may be subsequently checked by an offsite software program via the electrical processing circuit 16 and/or by an offsite individual.
- the seal analysis device 18 is substantially the same as the seal analysis device 14 , except that the seal analysis device 18 includes the electrical processing circuit 16 such that the electrical processing circuit 16 is internally disposed within the seal analysis device 18 . Thereby, analysis of the seal 12 can be conducted without the need to communicate information to an off-site location.
- FIG. 3 there is shown a method to analyze a seal 12 and/or mating hardware 18 according to the present invention.
- the method is discussed in regard to the seal analysis device 14 ; however, both seal analysis devices 14 , 18 may be used to conduct the method of the present invention.
- an on-site operator such as a technician, may begin the method by removing old parts and cleaning up the hardware surrounding the seal 12 so that an acceptable visual image may be captured, if necessary.
- the on-site operator may also conduct a visual inspection of the seal 12 , the mating hardware 18 , or any other pertinent equipment in order to ensure a good working order and that the seal 12 is calibrated correctly.
- the visual check of the seal 12 and/or mating hardware 18 may include visually checking the sealed element 12 , visually checking the contact surface(s) of the sealed element 12 or mating hardware 18 , and/or visually checking the non-contact surface(s) and non-sealing surface(s) to which the seal 12 is not attached or sealed.
- an off-site or on-site operator may then conduct a step of identifying the seal 12 and/or the mating hardware 18 .
- the step of identifying the seal 12 may include inputting any desired information about the seal 12 , e.g. the part number, lot number, application of the seal 12 , etc., directly into the seal analysis device 14 and/or into the electrical processing circuit 16 .
- this sub-step may be completed to manually input the appropriate background information into the software of the electrical processing circuit 16 so that the software knows which seal 12 and/or mating hardware 18 is at hand and/or identify the application of the seal 12 in order to subsequently begin the analysis of the seal 12 and/or the mating hardware 18 .
- the step of identifying the seal 12 and/or mating hardware 18 may include using the seal analysis device 14 , by an on-site operator, to capture information about the seal 12 and the mating hardware 18 .
- the seal analysis device 14 can capture imagery in the form of a photo or video of the seal 12 or scan the identifier of the seal 12 and/or the mating hardware 18 in order to automatically inform the electrical processing circuit 16 as to the particular seal 12 and/or mating hardware 18 which will be analyzed.
- an on-site operator may use the seal analysis device 14 to gather information, such as imagery in the form of a photo or video, of the seal 12 , the seal defect 12 D of the seal 12 , and/or the mating hardware 18 .
- the seal analysis device 14 may then communicate this captured imagery to the electrical processing circuit 16 .
- the electrical processing circuit 16 may process the information based upon the pre-determined criteria discussed above in order to determine a condition of the seal 12 and/or mating hardware 18 .
- the electrical processing circuit 16 and/or an off-site individual may analyze the general shape of the seal 12 , the sealed surface(s) of the seal 12 , the gap(s) or lack thereof between the mating surface(s) of the seal 12 and the mating hardware 18 .
- an off-site individual may then conduct a final analysis of whether the seal 12 and/or the mating hardware 18 is acceptable or unacceptable by reviewing the analysis conducted by the electrical processing circuit 16 to confirm its conclusion. It should be appreciated that the off-site individual may also review the information gathered by the seal analysis device 14 .
- the method may also include a step of repeating the above process steps for each component of the seal 12 , the mating hardware 18 , and/or for multiple seal 12 and mating hardware 18 combinations in an assembly.
- the method may further include a step of taking a photo or video during and/or after the installation of the seal 12 and/or mating hardware 18 to confirm that the installation and the operating process is correct. A photo or video may also be taken of the installed seal 12 and/or the mating hardware 18 , and then this information may be analyzed by the electrical processing circuit 16 against known criteria in order to confirm that the installation of the seal 12 is correct.
Abstract
Description
- This is a non-provisional application based upon U.S. provisional patent application Ser. No. 62/633,868 entitled “SYSTEM AND METHOD FOR DETECTING A CONDITION OF A SEAL”, filed Feb. 22, 2018, which is incorporated herein by reference.
- The present invention relates to seal detection, in particular, to a system and method for determining relevant characteristics of a seal.
- Seal detection devices are used to determine when a seal should be repaired or replaced. U.S. Pat. No. 8,166,891 to Borowski et al. disclose concentric circular chevrons on a sealing surface to provide visual detection of proper installation. U.S. Pat. No. 7,477,374 to Schmidt et al. disclose a method and device for examining a sealing surface wherein an optical deflector is used to scatter light across a sealing surface. U.S. Pat. No. 7,405,818 to Heinzen discloses a self-monitoring static seal that utilizes an optical sensor and wear indicator on a sealing surface. U.S. Pat. No. 9,168,696 to Farrell and U.S. Pat. No. 9,662,833 to Farrell et al. disclose using lasers to change the optical properties of the seal surface.
- In one exemplary embodiment formed in accordance with the present invention, a seal analysis system measures and analyzes a seal and/or mating hardware. The seal analysis system includes a seal analysis device, e.g. a sensor, and an electrical processing circuit, e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit, configured for communication with the seal analysis device. The seal analysis system is further configured for detecting an undesirable characteristic, e.g. defect, information pertaining to useful life or a manufacturing recall, etc., and for analyzing a condition of the seal and/or the mating hardware. The seal analysis system can detect defects including a crack scratch, chip, depression and other flaws being located on the surface or internal to the seal and/or mating hardware. The seal analysis device may be portable or stationary and may be made up of devices including an optical inspection device, a laser scanner, a phone and an ultrasound scanner. The seal analysis device may be further provided to capture an image and/or a video. Communication between the seal analysis device and the electrical processing circuit may be wired or wireless. The electrical processing circuit may analyze and compare the information of a condition or defect supplied by the seal analysis device against pre-set criteria or against previously captured information of the seal and/or mating surface.
- In another exemplary embodiment formed in accordance with the present invention, there is provided a seal analysis device, such as a sensor. The seal analysis device includes an electrical processing circuit and is configured for detecting an undesirable characteristic, e.g. defect, information pertaining to useful life or a manufacturing recall, etc., and for analyzing a condition of the seal and/or the mating hardware. The seal analysis device can detect defects including a crack scratch, chip, depression and other flaws being located on the surface or internal to the seal and/or mating hardware. The seal analysis device may be portable or stationary and may be made up of devices including an optical inspection device, a laser scanner, a phone and an ultrasound scanner. The seal analysis device may be further provided to capture an image and/or a video. The electrical processing circuit may analyze and compare the information of a condition or defect supplied by the seal analysis device against pre-set criteria or against previously captured information of the seal and/or mating surface.
- In another exemplary embodiment formed in accordance with the present invention, there is provided a method for analyzing a seal and/or mating hardware. The method includes the steps of providing a seal and/or mating hardware, cleaning the mating hardware if needed, performing a visual inspection if needed, providing a seal analysis device, e.g. a sensor, configured for detecting an undesirable characteristic, e.g. defect, information pertaining to useful life or a manufacturing recall, etc., providing an electrical processing circuit, e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit, configured to communicate with the seal analysis device, capturing at least one undesirable characteristic about the seal and/or mating surface, and communication the at least one undesirable characteristic to the electrical processing circuit. The at least one undesirable characteristic captured by the seal analysis device may include a defect or a condition. The electrical processing circuit may be configured to compare the at least one undesirable characteristic against a pre-set criteria point such as shape, color or sheen of a surface, or the depth or perimeter of the defect on a seal and/or mating surface.
- An advantage of the present invention is an improved apparatus and method for determining acceptable seals and/or mating surfaces.
- The above-mentioned and other features and advantages of this invention, and the manner of attaining them, will become more apparent and the invention will be better understood by reference to the following description of embodiments of the invention taken in conjunction with the accompanying drawings, wherein:
-
FIG. 1 shows an embodiment of a seal analysis system of the present invention; -
FIG. 2 shows a perspective view of another embodiment of a seal analysis device; and -
FIG. 3 shows an embodiment of a flowchart of a method for analyzing a seal and a mating hardware. - Corresponding reference characters indicate corresponding parts throughout the several views. The exemplifications set out herein illustrate embodiments of the invention, and such exemplifications are not to be construed as limiting the scope of the invention in any manner.
- Referring now to the drawings, and more particularly to
FIG. 1 , there is shown aseal analysis system 10 for measuring and analyzing aseal 12 and themating hardware 18. Theseal analysis system 10 generally includes aseal analysis device 14, e.g. sensor, and anelectrical processing circuit 16, e.g. a digital processor, analog processor or any device configured to be used as an electrical processing circuit, which operably communicates with theseal analysis device 14. Theseal analysis system 10 is configured for detecting anundesirable characteristic 12D in theseal 12 and/or themating hardware 18, if one is present, and analyzing a condition of theseal 12 and/or themating hardware 18. - The
seal 12 may be in the form of any desiredseal 12, which seals two or more mating surfaces. For example, theseal 12 may be in the form of a plate heat exchanger gasket, a manway seal for a railway car, gasket on various valve and engine assemblies, a seal in piping systems, annular seals, shaft seals, and a gasket for any other desired application. Theseal 12 may be composed of any desired material such as a rubber material, plastic material, or other materials used in seals. Theseal 12 may include identifying information such as a unique identifier in the form of an identifying label such as a part number, a mark, or a design including lettering, shapes, lines, colors, stripes, a QR code, a data matrix, a mark, an RFID tag, or any other desirable identifier. The unique identifier may be associated with information about theseal 12, which may be retrieved upon scanning the unique identifier. It should be appreciated that the identifier of theseal 12 may only be readable when theseal 12 is properly installed. - The
undesirable characteristic 12D of theseal 12 and/or themating hardware 18 may be in the form of any defect, such as a crack, a scratch, a chip, an expansion, a depression, and/or any other flaw in theseal 12 and may also include an identifying label. The defect may be on the surface of theseal 12, it may extend across the length, width, or depth of theseal 12, and/or the defect may be internally within theseal 12. As shown, the defect is on the surface of theseal 12 and extends into the depth of theseal 12. - The
undesirable characteristic 18D of themating hardware 18 may be in the form of any defect on the surface and/or within the body of themating hardware 18. For example, the defect may be in the form of a crack, a scratch, a chip, an expansion, a depression, and/or any other flaw present on and/or within themating hardware 18. The defect of themating hardware 18 may extend across the length, width, or depth of themating hardware 18 and/or the defect may be internally disposed within themating hardware 18. Themating hardware 18 may be in the form of any hardware or portion thereof to which the seal mates onto or otherwise seals. For instance, themating hardware 18 may be in the form of plate heat exchangers, manway covers on railway cars, valves, pipes in various piping systems, hardware for door covers, hardware for housing seals, and/or hardware for tubing connections. - The
seal analysis device 14 may capture information of or identify theseal 12 by way of its unique identifier, thedefect 12D of theseal 12, and/ormating hardware 18 to which theseal 12 mounts onto. Theseal analysis device 14 may be in the form of any desired seal analysis device, such as an optical inspection device which may take a photo and/or video of theseal 12, a laser scanner, and/or an ultrasound scanner. Theseal analysis device 14 may be a portable and/or a stationary device. For instance, theseal analysis device 14 may be in the form of a portable three-dimensional (3D)laser scanner 14 that may scan theentire seal 12 or portions thereof, and which may be operated on-site by an operator. Thereby, theportable 3D scanner 14 may capture a 3D image of theseal 12 and/or thedefect 12D of theseal 12, and/or a 3D image of themating hardware 18 and/or thedefect 18D of themating hardware 18. For instance, the 3D data captured by theseal analysis device 14 may be used to create a 3D model of theseal 12 and/or thedefect 12D of theseal 12. It should be appreciated that theseal analysis device 14 may also be in the form of a phone equipped with an image or video capturing device in order to capture data about theseal 12 and/ormating hardware 18. - The
electrical processing circuit 16 may be operably coupled to theseal analysis device 14. For example, theelectrical processing circuit 16 may operably communicate with theseal analysis device 14 via a wired or wireless connection. In the present embodiment shown, theseal analysis device 14 wirelessly communicates with theelectrical processing circuit 16. Theelectrical processing circuit 16 may be in the form of a central processing unit (CPU) or control unit that includes software to review the data received from theseal analysis device 14. For instance, theelectrical processing circuit 16 may include the necessary software to process the images or videos captured by theseal analysis device 14 by comparing these images or videos to pre-set criteria in order to detect an acceptable or unacceptable condition of theseal 12. The pre-set criteria may include tolerance levels regarding the shape of theseal 12, the color or sheen of theseal 12, the depth of thedefect 12D, or the perimeter of thedefect 12D on the surface of theseal 12. It is possible for theelectrical processing circuit 16 to include various pre-set acceptable or unacceptable conditions of a particular type ofseal 12 and/ormating hardware 18. It is also possible for theelectrical processing circuit 16 to include prior or pre-set information about theseal 12, such as the type ofseal 12, the seal model number, the manufacturing date, date of installation of theseal 12, the material(s) of theseal 12, the previous and/or next service interval(s), a photograph, video, or service report of the previous inspection or analysis of theseal 12 and/ormating hardware 18, the date of replacement of theseal 12, and any other desired information. Theelectrical processing circuit 16 may be located at an off-site, e.g. remote, location. In this regard, the information captured by theseal analysis device 14 may be uploaded to a remote database, and the information may be subsequently checked by an offsite software program via theelectrical processing circuit 16 and/or by an offsite individual. - Referring now to
FIG. 2 , there is shown another embodiment of aseal analysis device 18. Theseal analysis device 18 is substantially the same as theseal analysis device 14, except that theseal analysis device 18 includes theelectrical processing circuit 16 such that theelectrical processing circuit 16 is internally disposed within theseal analysis device 18. Thereby, analysis of theseal 12 can be conducted without the need to communicate information to an off-site location. - Referring now to
FIG. 3 , there is shown a method to analyze aseal 12 and/ormating hardware 18 according to the present invention. For brevity of description, the method is discussed in regard to theseal analysis device 14; however, bothseal analysis devices seal 12 so that an acceptable visual image may be captured, if necessary. The on-site operator may also conduct a visual inspection of theseal 12, themating hardware 18, or any other pertinent equipment in order to ensure a good working order and that theseal 12 is calibrated correctly. For example, the visual check of theseal 12 and/ormating hardware 18 may include visually checking the sealedelement 12, visually checking the contact surface(s) of the sealedelement 12 ormating hardware 18, and/or visually checking the non-contact surface(s) and non-sealing surface(s) to which theseal 12 is not attached or sealed. After conducting any preliminary step(s), an off-site or on-site operator may then conduct a step of identifying theseal 12 and/or themating hardware 18. The step of identifying theseal 12 may include inputting any desired information about theseal 12, e.g. the part number, lot number, application of theseal 12, etc., directly into theseal analysis device 14 and/or into theelectrical processing circuit 16. Effectively, this sub-step may be completed to manually input the appropriate background information into the software of theelectrical processing circuit 16 so that the software knows whichseal 12 and/ormating hardware 18 is at hand and/or identify the application of theseal 12 in order to subsequently begin the analysis of theseal 12 and/or themating hardware 18. Additionally, or alternatively, the step of identifying theseal 12 and/ormating hardware 18 may include using theseal analysis device 14, by an on-site operator, to capture information about theseal 12 and themating hardware 18. For example, theseal analysis device 14 can capture imagery in the form of a photo or video of theseal 12 or scan the identifier of theseal 12 and/or themating hardware 18 in order to automatically inform theelectrical processing circuit 16 as to theparticular seal 12 and/ormating hardware 18 which will be analyzed. After identifying theseal 12 and/or themating hardware 18, or concurrently therewith, an on-site operator may use theseal analysis device 14 to gather information, such as imagery in the form of a photo or video, of theseal 12, theseal defect 12D of theseal 12, and/or themating hardware 18. Theseal analysis device 14 may then communicate this captured imagery to theelectrical processing circuit 16. Then, theelectrical processing circuit 16 may process the information based upon the pre-determined criteria discussed above in order to determine a condition of theseal 12 and/ormating hardware 18. In the embodiment where theseal analysis device 14 is used to capture a 3D model of theseal 12 and/or the mating surface(s) of themating hardware 18, theelectrical processing circuit 16 and/or an off-site individual may analyze the general shape of theseal 12, the sealed surface(s) of theseal 12, the gap(s) or lack thereof between the mating surface(s) of theseal 12 and themating hardware 18. Further, an off-site individual may then conduct a final analysis of whether theseal 12 and/or themating hardware 18 is acceptable or unacceptable by reviewing the analysis conducted by theelectrical processing circuit 16 to confirm its conclusion. It should be appreciated that the off-site individual may also review the information gathered by theseal analysis device 14. The method may also include a step of repeating the above process steps for each component of theseal 12, themating hardware 18, and/or formultiple seal 12 andmating hardware 18 combinations in an assembly. The method may further include a step of taking a photo or video during and/or after the installation of theseal 12 and/ormating hardware 18 to confirm that the installation and the operating process is correct. A photo or video may also be taken of the installedseal 12 and/or themating hardware 18, and then this information may be analyzed by theelectrical processing circuit 16 against known criteria in order to confirm that the installation of theseal 12 is correct. - While this invention has been described with respect to at least one embodiment, the present invention can be further modified within the spirit and scope of this disclosure. This application is therefore intended to cover any variations, uses, or adaptations of the invention using its general principles. Further, this application is intended to cover such departures from the present disclosure as come within known or customary practice in the art to which this invention pertains.
Claims (20)
Priority Applications (1)
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US16/127,986 US10620132B2 (en) | 2018-02-22 | 2018-09-11 | System and method for detecting a condition of a seal |
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US201862633868P | 2018-02-22 | 2018-02-22 | |
US16/127,986 US10620132B2 (en) | 2018-02-22 | 2018-09-11 | System and method for detecting a condition of a seal |
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EP (1) | EP3755541A4 (en) |
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Cited By (1)
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WO2023154599A1 (en) * | 2022-02-09 | 2023-08-17 | Caterpillar Inc. | Automated seal inspection system and method |
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Also Published As
Publication number | Publication date |
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CN111741854B (en) | 2022-10-21 |
EP3755541A1 (en) | 2020-12-30 |
EP3755541A4 (en) | 2021-11-03 |
CN111741854A (en) | 2020-10-02 |
WO2019164551A1 (en) | 2019-08-29 |
JP7254825B2 (en) | 2023-04-10 |
JP2021523343A (en) | 2021-09-02 |
US10620132B2 (en) | 2020-04-14 |
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