US20180119274A1 - Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material - Google Patents
Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material Download PDFInfo
- Publication number
- US20180119274A1 US20180119274A1 US15/564,819 US201615564819A US2018119274A1 US 20180119274 A1 US20180119274 A1 US 20180119274A1 US 201615564819 A US201615564819 A US 201615564819A US 2018119274 A1 US2018119274 A1 US 2018119274A1
- Authority
- US
- United States
- Prior art keywords
- raw material
- chemical deposition
- thin film
- transition metal
- deposition raw
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 239000002994 raw material Substances 0.000 title claims abstract description 65
- 238000005234 chemical deposition Methods 0.000 title claims abstract description 51
- 229910052751 metal Inorganic materials 0.000 claims abstract description 77
- 239000002184 metal Substances 0.000 claims abstract description 76
- 239000010409 thin film Substances 0.000 claims abstract description 58
- 150000003624 transition metals Chemical class 0.000 claims abstract description 42
- 229910052723 transition metal Inorganic materials 0.000 claims abstract description 41
- 239000002131 composite material Substances 0.000 claims abstract description 24
- 125000000058 cyclopentadienyl group Chemical group C1(=CC=CC1)* 0.000 claims abstract description 18
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 claims abstract description 17
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 14
- ZSWFCLXCOIISFI-UHFFFAOYSA-N endo-cyclopentadiene Natural products C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 claims abstract description 14
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 10
- 125000001424 substituent group Chemical group 0.000 claims abstract description 10
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 9
- 150000002736 metal compounds Chemical class 0.000 claims abstract description 8
- 229910052748 manganese Inorganic materials 0.000 claims description 21
- 229910052742 iron Inorganic materials 0.000 claims description 19
- 229910052707 ruthenium Inorganic materials 0.000 claims description 14
- 230000008016 vaporization Effects 0.000 claims description 10
- 238000000034 method Methods 0.000 claims description 9
- 229910052759 nickel Inorganic materials 0.000 claims description 9
- 239000000126 substance Substances 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 7
- 229910052741 iridium Inorganic materials 0.000 claims description 5
- 229910052703 rhodium Inorganic materials 0.000 claims description 5
- 229910052804 chromium Inorganic materials 0.000 claims description 4
- 229910052750 molybdenum Inorganic materials 0.000 claims description 4
- 229910052697 platinum Inorganic materials 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 claims description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 3
- 229910052758 niobium Inorganic materials 0.000 claims description 3
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 claims description 3
- 229910052715 tantalum Inorganic materials 0.000 claims description 3
- 229910052720 vanadium Inorganic materials 0.000 claims description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 claims description 2
- 239000007789 gas Substances 0.000 claims 9
- 150000002739 metals Chemical class 0.000 abstract description 25
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 30
- 239000010408 film Substances 0.000 description 26
- 230000015572 biosynthetic process Effects 0.000 description 25
- 239000011572 manganese Substances 0.000 description 22
- XEEYBQQBJWHFJM-UHFFFAOYSA-N iron Substances [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 21
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 20
- -1 5-cyclopentadienyl Chemical group 0.000 description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 15
- 0 [1*]c1c([2*])c([3*])c([4*])c1[5*] Chemical compound [1*]c1c([2*])c([3*])c([4*])c1[5*] 0.000 description 15
- 125000004989 dicarbonyl group Chemical group 0.000 description 14
- 239000003446 ligand Substances 0.000 description 12
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 10
- 239000011541 reaction mixture Substances 0.000 description 10
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 10
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 9
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 9
- PXHVJJICTQNCMI-UHFFFAOYSA-N nickel Substances [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 8
- 239000010949 copper Substances 0.000 description 7
- 238000006243 chemical reaction Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 238000009834 vaporization Methods 0.000 description 6
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 5
- 239000007795 chemical reaction product Substances 0.000 description 5
- 229910052681 coesite Inorganic materials 0.000 description 5
- 238000004440 column chromatography Methods 0.000 description 5
- 229910052906 cristobalite Inorganic materials 0.000 description 5
- 239000003480 eluent Substances 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 5
- 238000000746 purification Methods 0.000 description 5
- 239000012495 reaction gas Substances 0.000 description 5
- 239000010948 rhodium Substances 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 5
- 239000000377 silicon dioxide Substances 0.000 description 5
- 229910052708 sodium Inorganic materials 0.000 description 5
- 239000011734 sodium Substances 0.000 description 5
- 229910052682 stishovite Inorganic materials 0.000 description 5
- 238000000859 sublimation Methods 0.000 description 5
- 230000008022 sublimation Effects 0.000 description 5
- 238000003786 synthesis reaction Methods 0.000 description 5
- 229910052905 tridymite Inorganic materials 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 239000011651 chromium Substances 0.000 description 4
- 229910002027 silica gel Inorganic materials 0.000 description 4
- 239000000741 silica gel Substances 0.000 description 4
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 239000010941 cobalt Substances 0.000 description 3
- 229910017052 cobalt Inorganic materials 0.000 description 3
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 3
- 150000001875 compounds Chemical class 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- QFEOTYVTTQCYAZ-UHFFFAOYSA-N dimanganese decacarbonyl Chemical compound [Mn].[Mn].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-].[O+]#[C-] QFEOTYVTTQCYAZ-UHFFFAOYSA-N 0.000 description 3
- 229910052739 hydrogen Inorganic materials 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- BRLPZEFDPRKYSC-UHFFFAOYSA-M iodoruthenium Chemical compound I[Ru] BRLPZEFDPRKYSC-UHFFFAOYSA-M 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000012046 mixed solvent Substances 0.000 description 3
- 239000010955 niobium Substances 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 3
- 229910052702 rhenium Inorganic materials 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- 229910020598 Co Fe Inorganic materials 0.000 description 2
- 229910002519 Co-Fe Inorganic materials 0.000 description 2
- 229910002551 Fe-Mn Inorganic materials 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 150000004696 coordination complex Chemical class 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 230000007850 degeneration Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 230000004580 weight loss Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F13/00—Compounds containing elements of Groups 7 or 17 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/0006—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table compounds of the platinum group
- C07F15/0046—Ruthenium compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/02—Iron compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/04—Nickel compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F15/00—Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
- C07F15/06—Cobalt compounds
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F17/00—Metallocenes
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F17/00—Metallocenes
- C07F17/02—Metallocenes of metals of Groups 8, 9 or 10 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F19/00—Metal compounds according to more than one of main groups C07F1/00 - C07F17/00
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/16—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metal carbonyl compounds
Definitions
- the present invention relates to a chemical deposition raw material including a heterogeneous polynuclear complex, which is used for producing a composite metal thin film or a composite metal compound thin film including different kinds of metals by a chemical deposition method such as a CVD method or an ALD method.
- a chemical deposition raw material which is capable of forming a thin film including a composite metal in one-time film formation and which is capable of forming a film at a low temperature (about 200° C.) while having moderate thermal stability.
- various kinds of metal thin films are used for satisfying the required properties of the devices.
- a chemical deposition method such as a CVD method, which is capable of forming a uniform and homogeneous film at a high film formation rate and in conformity with even a three-dimensional shape etc. of a device, is used.
- a complex including a plurality of ligands such as cyclopentadienyl with one metal as a central metal (nucleus) (hereinafter, referred to as a mononuclear complex) as shown in the following chemical formula 1 is known.
- a complex including a plurality of metals of the same kind as central metals (hereinafter, referred to as a homogeneous polynuclear complex) as shown in the following chemical formula 2 is also known.
- a thin film including a plurality of kinds of metals is often applied.
- a device having a reduced size and weight, such as a semiconductor a plurality of metal thin films are applied, and deposited for imparting various kinds of required properties, so that the device is densified and highly integrated while attaining required properties.
- a structure is used in which a thin film of MnO, MnSiO or the like as a barrier layer for preventing diffusion of copper, and a thin film of ruthenium and the like as a base for introducing the barrier layer are deposited together.
- Patent Document 1 suggests that a plurality of mononuclear complexes etc. are provided, and metal thin films are sequentially deposited from the complexes to form a plurality of metal layers each including a single metal.
- Patent Document 2 suggests that a plurality of mononuclear complexes are mixed beforehand, and dissolved or emulsified to obtain an inert liquid, and from the inert liquid, a composite metal thin film containing a plurality of metals is formed.
- the present invention has been made in view of the background described above, and provides a chemical deposition raw material which is capable of forming a plurality of kinds of metal thin films in a simple process, and capable of forming a homogeneous thin film, and is easily quality-controlled.
- the present inventors conducted the following studies for synthesizing a complex including a plurality of kinds of metals as central metals in one complex (hereinafter, referred to as a heterogeneous polynuclear complex), and applying the complex as a chemical deposition raw material instead of applying a plurality of complexes having different metal species as in a conventional art.
- a heterogeneous polynuclear complex When a heterogeneous polynuclear complex is applied as a chemical deposition raw material, first a plurality of kinds of metals as central metals should be all deposited in formation of a metal thin film by a chemical deposition method as a required property of the chemical deposition raw material. Preferably, the deposition ratios of a plurality of metals are almost the same.
- the chemical deposition raw material should also have such a general required property of a chemical deposition raw material that in formation of a thin film by a chemical deposition method, the chemical deposition raw material has thermal stability sufficient to prevent thermal decomposition in a vaporization stage while having a decomposition property which ensures that a film can be formed at a low temperature.
- the present inventors extensively conducted studies on a complex having all the above-mentioned properties, and resultantly arrived at a chemical deposition raw material of the present invention which includes a heterogeneous polynuclear complex having a configuration as described
- the present invention relates to a chemical deposition raw material for producing a composite metal thin film or a composite metal compound thin film by a chemical deposition method, including a heterogeneous polynuclear complex in which a cyclopentadienyl (L) and a carbonyl are coordinated to a first transition metal (M 1 ) and a second transition metal (M 2 ) as central metals, the heterogeneous polynuclear complex being represented by the following formula:
- M 1 and M 2 are mutually different transition metals; x is an integer of 1 or more and 2 or less, and y is an integer of 1 or more and 9 or less; and R 1 to R 5 are each one of a hydrogen atom and an alkyl group with a carbon number of 1 or more and 5 or less.
- the complex in the present invention is a heterogeneous polynuclear complex including a plurality of kinds of transition metals: a first transition metal (M 1 ) and a second transition metal (M 2 ) as central metals of the complex, and to these central metals are coordinated a cyclopentadienyl (L) and a carbonyl (—CO) as ligands.
- a first transition metal M 1
- M 2 second transition metal
- L cyclopentadienyl
- —CO carbonyl
- the complex of the present invention has moderate thermal stability because the cyclopentadienyl as a ligand has a relatively strong bonding force with a transition metal, and the carbonyl as a ligand has a relatively weak bonding force with a transition metal.
- the carbon number of the alkyl group as each of substituents R 1 to R 5 arbitrarily designed, the vapor pressure and the melting point are adjustable.
- heterogeneous polynuclear complex included in the chemical deposition raw material according to the present invention will be described in detail.
- x and y representing the numbers of cyclopentadienyls (L) and carbonyls (—CO), respectively, in the raw material of the present invention will be described.
- x is an integer of 1 or more and 2 or less, and y is an integer of 1 or more and 9 or less; and Preferably, x is 1 or more and 2 or less, and y is 2 or more and 7 or less.
- Preferred ranges of the integers that can be selected as x and y depend on the kind (valence) of the transition metal and the correlation associated with the value of x.
- y is 5 to 7 when x is 1, and y is 2 to 4 when x is 2.
- y is 3 to 7 when at least one of M 1 and M 2 is Mn or Re, and preferably y is 2 to 6 when at least one of M 1 and M 2 is Co, Rh or Ir.
- x is 1 and y is n+2 as a combination of x and y, and mention is made of a chemical deposition raw material including a heterogeneous polynuclear complex represented by the following formula:
- M 1 is one of Ru, Mn and Fe
- M 2 is one of V, Cr, Mn, Fe, Co and Ni
- M 1 and M 2 are different
- n is 3 or more and 5 or less
- R 1 to R 5 are each one of a hydrogen atom and an alkyl group with a carbon number of 1 or more and 5 or less.
- M 1 and M 2 are mutually different transition metals.
- the transition metal are titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), niobium (Nb), molybdenum (Mo), ruthenium (Ru), rhodium (Rh), palladium (Pd), silver (Ag), tantalum (Ta), tungsten (W), rhenium (Re), osmium (Os), iridium (Ir), platinum (Pt) and gold (Au).
- transition metal Mn, Fe, Co, Ni, Cu, Nb, Mo, Ru, Rh, Ta, W, Ir and Pt are preferable, and Mn, Fe, Co, Ni, Cu, Mo, Ru, W and Pt are especially preferable.
- transition metal as M 1 , Ru, Mn and Fe are especially preferable, and as the transition metal as M 2 , Mn, Fe, Co and Ni are especially preferable.
- Ligands to be coordinated to central metals will now be described.
- a cyclopentadienyl (L) and a carbonyl are coordinated to central metals including two transition metals.
- the present inventors conceived the raw material based on the following grounds regarding the configurations of the central metals and the ligands coordinated to the central metals.
- the “cyclopentadienyl (L)” as a ligand forms a compound which has a small molecular weight, and is easily vaporized as a chemical deposition raw material, and also the cyclopentadienyl (L) is hardly thermally decomposed in a vaporization stage before film formation, so that stable vaporization is easily attained.
- the second transition metal M 2 to which only the carbonyl is coordinated is apt to be deposited in a larger amount in the composite metal thin film than the first transition metal M 1 to which the cyclopentadienyl is coordinated.
- M 1 is one of Ru, Mn and Fe
- M 2 is one of V, Cr, Mn, Fe, Co and Ni
- M 1 and M 2 are different
- n is 3 or more and 5 or less
- each of R 1 to R 5 is a hydrogen atom, or an alkyl group with a carbon number of 1 or more and 5 or less.
- Each of substituents R 1 to R 5 of the cyclopentadienyl is a hydrogen atom or an alkyl group with a carbon number of 1 or more and 5 or less, preferably one of a hydrogen atom, a methyl group, an ethyl group, a propyl group and a butyl group.
- the total carbon number of all the substituents R 1 to R 5 is preferably 1 or more and 4 or less.
- the total number of carbonyls (CO) is 1 or more and 9 or less, and preferably the ligand of the first transition metal (M 1 ) has two or three carbonyls.
- the coordination number (n) of carbonyls as the ligand of the second transition metal (M 2 ) is preferably 3 or more and 5 or less, especially preferably 4 or 5.
- the coordination number (n) is especially preferably 5 when M 2 is Mn or Re, and the coordination number (n) is especially preferably 4 when M 2 is Co, Rh or Ir.
- heterogeneous polynuclear complexes that are preferred for the chemical deposition raw material of the present invention are listed below as examples.
- the chemical deposition raw material of the present invention described above can be produced in the following manner: a starting raw material that is a cyclopentadienyl derivative with the first transition metal (M 1 ) as a central metal is reacted with a complex to which a plurality of carbonyls are coordinated with the second transition metal (M 2 ) as a central metal.
- the chemical deposition raw material according to the present invention is useful for formation of a composite metal thin film by a CVD method.
- This thin film formation method includes preparing a reaction gas by vaporizing a raw material including a heterogeneous polynuclear complex, introducing the reaction gas to a substrate surface, and decomposing the complex to deposit a plurality of metals.
- the heterogeneous polynuclear complex according to the present invention is used as a raw material.
- the reaction atmosphere during formation of the thin film is preferably a reducing atmosphere, and therefore preferably hydrogen or ammonia is introduced as a reaction gas.
- the heating temperature during film formation is preferably 150° C. to 350° C. When the heating temperature is lower than 150° C., the film formation hardly proceeds, and thus a required thickness is hard to obtain. When the heating temperature is higher than 350° C., formation of a uniform thin film is difficult.
- a composite metal thin film or a composite metal compound thin film containing a plurality of metals can be formed from a single raw material as described above.
- the raw material of the present invention has a high vapor pressure, is capable of producing a thin film at a low temperature, has moderate thermal stability, and is thus suitable for film formation by a chemical deposition method.
- FIG. 1 illustrates a TG curve of a metal complex produced in an embodiment.
- FIG. 2 is a photograph of a cross-section of a metal thin film formed in an embodiment.
- FIG. 3 illustrates a Ru/Mn ratio in a metal thin film formed in an embodiment.
- the following five kinds of complexes were synthesized. Synthesized complexes were each evaluated for physical properties, and subjected to a film formation test as a chemical deposition raw material.
- a heterogeneous polynuclear complex (pentacarbonyl[dicarbonyl( ⁇ 5 -cyclopentadienyl)ruthenium]manganese (Mn—Ru)) having ruthenium as a first transition metal and manganese as a second transition metal was produced.
- the synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and a mixed solvent of hexane and dichloromethane as an eluent. Sublimation purification was performed to obtain 2.94 g (7.0 mmol) of pentacarbonyl[dicarbonyl( ⁇ 5 -cyclopentadienyl)ruthenium]manganese (Mn—Ru) as a specified substance (yield: 70%).
- a heterogeneous polynuclear complex (pentacarbonyl[dicarbonyl( ⁇ 5 -cyclopentadienyl)iron]manganese (Fe—Mn)) having iron as a first transition metal and manganese as a second transition metal was produced.
- the synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and hexane as an eluent. Sublimation purification was performed to obtain 1.86 g (5.0 mmol) of pentacarbonyl[dicarbonyl( ⁇ 5 -cyclopentadienyl)iron]manganese (Fe—Mn) as a specified substance (yield: 50%).
- a heterogeneous polynuclear complex (dicarbonyl( ⁇ 5 -cyclopentadienyl)(tetracarbonylcobalt)ruthenium (Co—Ru)) having ruthenium as a first transition metal and cobalt as a second transition metal was produced.
- the synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- reaction mixture was extracted with hexane, and purified by column chromatography with alumina as a carrier and a mixed solvent of hexane and dichloromethane as an eluent. Sublimation purification was performed to obtain 2.56 g (6.5 mmol) of pentacarbonyldicarbonyl( ⁇ 5 -cyclopentadienyl)(tetracarbonylcobalt)ruthenium (Co—Ru) as a specified substance (yield: 65%).
- a heterogeneous polynuclear complex (dicarbonyl( ⁇ 5 -cyclopentadienyl)(tetracarbonylcobalt)iron (Co—Fe)) having iron as a first transition metal and cobalt as a second transition metal was produced.
- the synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and hexane as an eluent. Sublimation purification was performed to obtain 2.44 g (7.0 mmol) of dicarbonyl( ⁇ 5 -cyclopentadienyl)(tetracarbonylcobalt)iron (Co—Fe) as a specified substance (yield: 70%).
- a heterogeneous polynuclear complex (pentacarbonyl[dicarbonyl( ⁇ 5 -methylcyclopentadienyl)ruthenium]manganese (Mn—Ru)) in which a cyclopentadienyl derivative having one methyl group as a substituent was coordinated was produced.
- the synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and a mixed solvent of hexane and dichloromethane as an eluent. Sublimation purification was performed to obtain 2.59 g (6.0 mmol) of pentacarbonyl[dicarbonyl( ⁇ 5 -methylcyclopentadienyl)ruthenium]manganese (Mn—Ru) as a specified substance (yield: 60%).
- Evaluation of physical properties of heterogeneous polynuclear complex Physical properties were evaluated by TG for the heterogeneous polynuclear complexes produced in Examples 1 and 5. Analysis was performed by observing a change in weight of a complex sample (5 mg) in heating of the sample at a temperature elevation rate of 5° C./min over a measurement temperature range, i.e. from room temperature to 450° C., under a nitrogen atmosphere in TG-DTA2000SA manufactured by BRUKER Corporation. The results are shown in FIG. 1 .
- TG in FIG. 1 show that for the complexes in Examples 1 and 5, vaporization and decomposition of the complex were started by heating at about 150° C., and thus these complexes had a low decomposition temperature, and were capable of forming a film at a low temperature. After elevation of the temperature to about 200° C., the weight loss was constant. This shows that almost the whole of the raw material was vaporized, and the complexes had a favorable vaporization property.
- Film formation test Next, a film formation test was conducted in which a composite metal thin film was formed by a CVD method with the complex produced in Example 5 as a raw material compound.
- the metal thin film was formed on a substrate (15 mm ⁇ 15 mm) with a silicon oxide film deposited on a silicon substrate by use of tetraethoxysilane (TEOS).
- TEOS tetraethoxysilane
- a hot wall type thermal CVD apparatus was used as a film formation apparatus.
- a reaction gas (hydrogen) was fed at a constant flow rate by use of a mass flow controller. Film formation conditions are as described below. The result of observing a cross-section of the metal thin film with a SEM is shown in FIG. 2 .
- the metal thin film formed in this way was shiny silvery-white, and had a thickness of 74.9 nm.
- FIG. 2 shows that the metal thin film formed on SiO 2 had a smooth and uniform surface.
- M 1 /M 2 ratio the Ru/Mn ratio was analyzed as an abundance of metal elements by an X-ray photoelectron spectroscopy (XPS) method for the metal thin film formed as described above.
- XPS X-ray photoelectron spectroscopy
- KRATOS Axis Nova manufactured by Shimadzu Corporation was used as a measurement apparatus.
- the thin film (thickness: 74.9 nm) was analyzed in a depth direction from the vicinity of the surface to the upper side of the vicinity of the interface with the SiO 2 film.
- influences of Si and O made it difficult to correctly analyze the Ru/Mn ratio, and the analysis was performed over a range where these influences were small.
- the results are shown in FIG. 3 .
- the abscissa in FIG. 3 is approximately consistent with a thickness (74.9 nm) from the thin film surface to the upper side of the vicinity of the interface with the SiO 2 film.
- FIG. 3 shows that both Ru and Mn were deposited in the metal thin film.
- the Ru/Mn ratio did not depend on the film depth, and was constant (about 0.15 to 0.2), and thus a thin film having an almost constant metal composition ratio was obtained.
- the present invention is capable of forming a composite metal thin film from a single raw material by a chemical deposition method, and it is easy to make the thin film homogeneous and control quality of raw materials.
- the present invention can be applied to uses which employ a structure in which a plurality of metal layers are deposited, such as copper diffusion layers in semiconductor devices.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Chemical Vapour Deposition (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
The present invention relates to a chemical deposition raw material including a heterogeneous polynuclear complex in which a cyclopentadienyl and a carbonyl are coordinated to a first transition metal and a second transition metal as central metals, the chemical deposition raw material being represented by the following formula. In the following formula, the first transition metal (Mi) and the second transition metal (M2) are mutually different. The number of cyclopentadienyls (L) is 1 or more and 2 or less, and to the cyclopentadienyl is coordinated one of a hydrogen atom and an alkyl group with a carbon number of 1 or more and 5 or less as each of substituents R1 to R5. With the chemical deposition raw material of the present invention, a composite metal thin film or a composite metal compound thin film containing plural metals can be formed from a single raw material.
Description
- The present invention relates to a chemical deposition raw material including a heterogeneous polynuclear complex, which is used for producing a composite metal thin film or a composite metal compound thin film including different kinds of metals by a chemical deposition method such as a CVD method or an ALD method. Specifically, the present invention relates to a chemical deposition raw material which is capable of forming a thin film including a composite metal in one-time film formation and which is capable of forming a film at a low temperature (about 200° C.) while having moderate thermal stability.
- In various kinds of devices such as semiconductors, various kinds of metal thin films are used for satisfying the required properties of the devices. As a method for forming these metal thin films, a chemical deposition method such as a CVD method, which is capable of forming a uniform and homogeneous film at a high film formation rate and in conformity with even a three-dimensional shape etc. of a device, is used.
- As a metal complex that is a raw material in formation of a metal thin film by the chemical deposition method, a complex including a plurality of ligands such as cyclopentadienyl with one metal as a central metal (nucleus) (hereinafter, referred to as a mononuclear complex) as shown in the following
chemical formula 1 is known. A complex including a plurality of metals of the same kind as central metals (hereinafter, referred to as a homogeneous polynuclear complex) as shown in the following chemical formula 2 is also known. - In formation of a metal thin film for use in a device such as a semiconductor by use of the above-mentioned mononuclear complex or homogeneous polynuclear complex as a chemical deposition raw material, a thin film including a plurality of kinds of metals is often applied. In a device having a reduced size and weight, such as a semiconductor, a plurality of metal thin films are applied, and deposited for imparting various kinds of required properties, so that the device is densified and highly integrated while attaining required properties. For example, when copper is used as a wiring material of a semiconductor, a structure is used in which a thin film of MnO, MnSiO or the like as a barrier layer for preventing diffusion of copper, and a thin film of ruthenium and the like as a base for introducing the barrier layer are deposited together.
- As an example of forming a thin film including a plurality of metals as described above, mention is made of
Patent Document 1, Patent Document 2 and so on.Patent Document 1 suggests that a plurality of mononuclear complexes etc. are provided, and metal thin films are sequentially deposited from the complexes to form a plurality of metal layers each including a single metal. Patent Document 2 suggests that a plurality of mononuclear complexes are mixed beforehand, and dissolved or emulsified to obtain an inert liquid, and from the inert liquid, a composite metal thin film containing a plurality of metals is formed. -
- Patent Document 1: JP 2011-1568 A
- Patent Document 2: JP 2002-60944 A
- However, when a plurality of thin films are sequentially formed by use of a plurality of complexes as in
Patent Document 1, a large number of steps are required for film formation, condition setting is complicated, much time and labor is needed for quality control of raw materials, and use of a plurality of raw materials causes an increase in cost. When a plurality of metal complexes are mixed beforehand as in Patent Document 2, the complexes have different vaporization properties, and therefore the ratio of metals in the thin film easily varies, so that formation of a homogeneous film becomes difficult. Before film formation, raw materials may react with each other, leading to degeneration. - The present invention has been made in view of the background described above, and provides a chemical deposition raw material which is capable of forming a plurality of kinds of metal thin films in a simple process, and capable of forming a homogeneous thin film, and is easily quality-controlled.
- As a solution to the problems described above, the present inventors conducted the following studies for synthesizing a complex including a plurality of kinds of metals as central metals in one complex (hereinafter, referred to as a heterogeneous polynuclear complex), and applying the complex as a chemical deposition raw material instead of applying a plurality of complexes having different metal species as in a conventional art.
- When a heterogeneous polynuclear complex is applied as a chemical deposition raw material, first a plurality of kinds of metals as central metals should be all deposited in formation of a metal thin film by a chemical deposition method as a required property of the chemical deposition raw material. Preferably, the deposition ratios of a plurality of metals are almost the same. The chemical deposition raw material should also have such a general required property of a chemical deposition raw material that in formation of a thin film by a chemical deposition method, the chemical deposition raw material has thermal stability sufficient to prevent thermal decomposition in a vaporization stage while having a decomposition property which ensures that a film can be formed at a low temperature. The present inventors extensively conducted studies on a complex having all the above-mentioned properties, and resultantly arrived at a chemical deposition raw material of the present invention which includes a heterogeneous polynuclear complex having a configuration as described below.
- The present invention relates to a chemical deposition raw material for producing a composite metal thin film or a composite metal compound thin film by a chemical deposition method, including a heterogeneous polynuclear complex in which a cyclopentadienyl (L) and a carbonyl are coordinated to a first transition metal (M1) and a second transition metal (M2) as central metals, the heterogeneous polynuclear complex being represented by the following formula:
- wherein M1 and M2 are mutually different transition metals; x is an integer of 1 or more and 2 or less, and y is an integer of 1 or more and 9 or less; and R1 to R5 are each one of a hydrogen atom and an alkyl group with a carbon number of 1 or more and 5 or less.
- As described above, the complex in the present invention is a heterogeneous polynuclear complex including a plurality of kinds of transition metals: a first transition metal (M1) and a second transition metal (M2) as central metals of the complex, and to these central metals are coordinated a cyclopentadienyl (L) and a carbonyl (—CO) as ligands. When a thin film is formed from the complex by a chemical deposition method, a plurality of metals as central metals are all deposited.
- The complex of the present invention has moderate thermal stability because the cyclopentadienyl as a ligand has a relatively strong bonding force with a transition metal, and the carbonyl as a ligand has a relatively weak bonding force with a transition metal. With the carbon number of the alkyl group as each of substituents R1 to R5 arbitrarily designed, the vapor pressure and the melting point are adjustable.
- Hereinafter, the heterogeneous polynuclear complex included in the chemical deposition raw material according to the present invention will be described in detail.
- First, x and y representing the numbers of cyclopentadienyls (L) and carbonyls (—CO), respectively, in the raw material of the present invention will be described. x is an integer of 1 or more and 2 or less, and y is an integer of 1 or more and 9 or less; and Preferably, x is 1 or more and 2 or less, and y is 2 or more and 7 or less.
- Preferred ranges of the integers that can be selected as x and y depend on the kind (valence) of the transition metal and the correlation associated with the value of x. For example, regarding x and y, preferably y is 5 to 7 when x is 1, and y is 2 to 4 when x is 2. Preferably y is 3 to 7 when at least one of M1 and M2 is Mn or Re, and preferably y is 2 to 6 when at least one of M1 and M2 is Co, Rh or Ir.
- It is especially preferable that x is 1 and y is n+2 as a combination of x and y, and mention is made of a chemical deposition raw material including a heterogeneous polynuclear complex represented by the following formula:
- wherein M1 is one of Ru, Mn and Fe, M2 is one of V, Cr, Mn, Fe, Co and Ni, and M1 and M2 are different; n is 3 or more and 5 or less; and R1 to R5 are each one of a hydrogen atom and an alkyl group with a carbon number of 1 or more and 5 or less.
- M1 and M2 are mutually different transition metals. What can be named as examples of the transition metal are titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), niobium (Nb), molybdenum (Mo), ruthenium (Ru), rhodium (Rh), palladium (Pd), silver (Ag), tantalum (Ta), tungsten (W), rhenium (Re), osmium (Os), iridium (Ir), platinum (Pt) and gold (Au). As the transition metal, Mn, Fe, Co, Ni, Cu, Nb, Mo, Ru, Rh, Ta, W, Ir and Pt are preferable, and Mn, Fe, Co, Ni, Cu, Mo, Ru, W and Pt are especially preferable. As the transition metal as M1, Ru, Mn and Fe are especially preferable, and as the transition metal as M2, Mn, Fe, Co and Ni are especially preferable.
- Ligands to be coordinated to central metals will now be described. In the raw material of the present invention, a cyclopentadienyl (L) and a carbonyl are coordinated to central metals including two transition metals. The present inventors conceived the raw material based on the following grounds regarding the configurations of the central metals and the ligands coordinated to the central metals.
- When coordinated to a transition metal together with a carbonyl, the “cyclopentadienyl (L)” as a ligand forms a compound which has a small molecular weight, and is easily vaporized as a chemical deposition raw material, and also the cyclopentadienyl (L) is hardly thermally decomposed in a vaporization stage before film formation, so that stable vaporization is easily attained.
- Here, comparison between the ligands for ease of separation from the central metal shows that the carbonyl (—CO) tends to be more easily separated from the central metal than the cyclopentadienyl (L). Thus, when a composite metal thin film is formed by a chemical deposition method, the amount of each transition metal deposited in the thin film is likely to depend on the kind of a ligand coordinated to each transition metal. Of two transition metals, a transition metal having a larger amount of the carbonyl and a smaller amount of the cyclopentadienyl in terms of a ligand tends to be deposited in a larger amount in the formed composite metal thin film. For example, in the case of the following compound that is mentioned as a preferred example in the present invention, the second transition metal M2 to which only the carbonyl is coordinated is apt to be deposited in a larger amount in the composite metal thin film than the first transition metal M1 to which the cyclopentadienyl is coordinated.
- wherein M1 is one of Ru, Mn and Fe, M2 is one of V, Cr, Mn, Fe, Co and Ni, and M1 and M2 are different; n is 3 or more and 5 or less; and each of R1 to R5 is a hydrogen atom, or an alkyl group with a carbon number of 1 or more and 5 or less.
- Each of substituents R1 to R5 of the cyclopentadienyl is a hydrogen atom or an alkyl group with a carbon number of 1 or more and 5 or less, preferably one of a hydrogen atom, a methyl group, an ethyl group, a propyl group and a butyl group. When the carbon chain is excessively long, the vapor pressure of the complex tends to decrease, and in the case of a long-chain alkyl group with a carbon number of more than 5, the complex is difficult to vaporize. The total carbon number of all the substituents R1 to R5 is preferably 1 or more and 4 or less. By limiting not only the carbon number of one substituent but also the total carbon number of all the substituents, thermal stability of the complex is more easily maintained. Either a linear or branched alkyl group can be applied as each of substituents R1 to R5. For example, when a propyl group or a butyl group is applied, an n-propyl group, an iso-propyl group, an n-butyl group, an iso-butyl group, a sec-butyl group, a tert-butyl group or the like can be applied.
- In the complex in the present invention, the total number of carbonyls (CO) is 1 or more and 9 or less, and preferably the ligand of the first transition metal (M1) has two or three carbonyls. The coordination number (n) of carbonyls as the ligand of the second transition metal (M2) is preferably 3 or more and 5 or less, especially preferably 4 or 5. The coordination number (n) is especially preferably 5 when M2 is Mn or Re, and the coordination number (n) is especially preferably 4 when M2 is Co, Rh or Ir.
- Specific kinds of heterogeneous polynuclear complexes that are preferred for the chemical deposition raw material of the present invention are listed below as examples.
- The chemical deposition raw material of the present invention described above can be produced in the following manner: a starting raw material that is a cyclopentadienyl derivative with the first transition metal (M1) as a central metal is reacted with a complex to which a plurality of carbonyls are coordinated with the second transition metal (M2) as a central metal.
- The chemical deposition raw material according to the present invention is useful for formation of a composite metal thin film by a CVD method. This thin film formation method includes preparing a reaction gas by vaporizing a raw material including a heterogeneous polynuclear complex, introducing the reaction gas to a substrate surface, and decomposing the complex to deposit a plurality of metals. In this method, the heterogeneous polynuclear complex according to the present invention is used as a raw material.
- The reaction atmosphere during formation of the thin film is preferably a reducing atmosphere, and therefore preferably hydrogen or ammonia is introduced as a reaction gas. The heating temperature during film formation is preferably 150° C. to 350° C. When the heating temperature is lower than 150° C., the film formation hardly proceeds, and thus a required thickness is hard to obtain. When the heating temperature is higher than 350° C., formation of a uniform thin film is difficult.
- With the chemical deposition raw material according to the present invention, a composite metal thin film or a composite metal compound thin film containing a plurality of metals can be formed from a single raw material as described above. The raw material of the present invention has a high vapor pressure, is capable of producing a thin film at a low temperature, has moderate thermal stability, and is thus suitable for film formation by a chemical deposition method.
-
FIG. 1 illustrates a TG curve of a metal complex produced in an embodiment. -
FIG. 2 is a photograph of a cross-section of a metal thin film formed in an embodiment. -
FIG. 3 illustrates a Ru/Mn ratio in a metal thin film formed in an embodiment. - Hereinafter, the best embodiments in the present invention will be described.
- In the embodiments, the following five kinds of complexes were synthesized. Synthesized complexes were each evaluated for physical properties, and subjected to a film formation test as a chemical deposition raw material.
- A heterogeneous polynuclear complex (pentacarbonyl[dicarbonyl(η5-cyclopentadienyl)ruthenium]manganese (Mn—Ru)) having ruthenium as a first transition metal and manganese as a second transition metal was produced. The synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- 1.95 g (5 mmol) of decacarbonyldimanganese and 0.23 g (10 mmol) of metal sodium were added in a flask containing 250 ml of tetrahydrofuran. The solution was stirred at room temperature for 24 hours, a solution obtained by dissolving 3.49 g (10 mmol) of dicarbonyl(η5-cyclopentadienyl)iodoruthenium in 250 ml of tetrahydrofuran was then added, and the mixture was heated at 55° C. and stirred for 18 hours. After completion of the reaction, the reaction product was cooled to room temperature, and concentrated to obtain a muddy reaction mixture. The reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and a mixed solvent of hexane and dichloromethane as an eluent. Sublimation purification was performed to obtain 2.94 g (7.0 mmol) of pentacarbonyl[dicarbonyl(η5-cyclopentadienyl)ruthenium]manganese (Mn—Ru) as a specified substance (yield: 70%).
- A heterogeneous polynuclear complex (pentacarbonyl[dicarbonyl(η5-cyclopentadienyl)iron]manganese (Fe—Mn)) having iron as a first transition metal and manganese as a second transition metal was produced. The synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- 1.95 g (5 mmol) of decacarbonyldimanganese and 0.23 g (10 mmol) of metal sodium were added in a flask containing 250 ml of tetrahydrofuran. The solution was stirred at room temperature for 24 hours, a solution obtained by dissolving 3.04 g (10 mmol) of dicarbonyl(η5-cyclopentadienyl)iodoiron in 250 ml of tetrahydrofuran was then added, and the mixture was stirred at room temperature for 2 days. After completion of the reaction, the reaction product was cooled to room temperature, and concentrated to obtain a muddy reaction mixture. The reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and hexane as an eluent. Sublimation purification was performed to obtain 1.86 g (5.0 mmol) of pentacarbonyl[dicarbonyl(η5-cyclopentadienyl)iron]manganese (Fe—Mn) as a specified substance (yield: 50%).
- A heterogeneous polynuclear complex (dicarbonyl(η5-cyclopentadienyl)(tetracarbonylcobalt)ruthenium (Co—Ru)) having ruthenium as a first transition metal and cobalt as a second transition metal was produced. The synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- 1.71 g (5 mmol) of octacarbonyldicobalt and 0.23 g (10 mmol) of metal sodium were added in a flask containing 250 ml of tetrahydrofuran. The solution was stirred at room temperature for 24 hours, a solution obtained by dissolving 3.49 g (10 mmol) of dicarbonyl(η5-cyclopentadienyl)iodoruthenium in 250 ml of tetrahydrofuran was then added, and the mixture was stirred at room temperature for 18 hours. After completion of the reaction, the reaction product was cooled to room temperature, and concentrated to obtain a muddy reaction mixture. The reaction mixture was extracted with hexane, and purified by column chromatography with alumina as a carrier and a mixed solvent of hexane and dichloromethane as an eluent. Sublimation purification was performed to obtain 2.56 g (6.5 mmol) of pentacarbonyldicarbonyl(η5-cyclopentadienyl)(tetracarbonylcobalt)ruthenium (Co—Ru) as a specified substance (yield: 65%).
- A heterogeneous polynuclear complex (dicarbonyl(η5-cyclopentadienyl)(tetracarbonylcobalt)iron (Co—Fe)) having iron as a first transition metal and cobalt as a second transition metal was produced. The synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- 1.71 g (5 mmol) of octacarbonyldicobalt and 0.23 g (10 mmol) of metal sodium were added in a flask containing 250 ml of tetrahydrofuran. The solution was stirred at room temperature for 24 hours, a solution obtained by dissolving 3.04 g (10 mmol) of dicarbonyl(η5-cyclopentadienyl)iodoiron in 250 ml of tetrahydrofuran was then added, and the mixture was stirred at room temperature for 2 days. After completion of the reaction, the reaction product was cooled to room temperature, and concentrated to obtain a muddy reaction mixture. The reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and hexane as an eluent. Sublimation purification was performed to obtain 2.44 g (7.0 mmol) of dicarbonyl(η5-cyclopentadienyl)(tetracarbonylcobalt)iron (Co—Fe) as a specified substance (yield: 70%).
- A heterogeneous polynuclear complex (pentacarbonyl[dicarbonyl(η5-methylcyclopentadienyl)ruthenium]manganese (Mn—Ru)) in which a cyclopentadienyl derivative having one methyl group as a substituent was coordinated was produced. The synthesis reaction formula is as described below. Hereinafter, the production process will be described in detail.
- 1.95 g (5 mmol) of decacarbonyldimanganese and 0.23 g (10 mmol) of metal sodium were added in a flask containing 250 ml of tetrahydrofuran. The solution was stirred at room temperature for 24 hours, a solution obtained by dissolving 3.65 g (10 mmol) of dicarbonyl(η5-methylcyclopentadienyl)iodoruthenium in 250 ml of tetrahydrofuran was then added, and the mixture was heated at 55° C. and stirred for 18 hours. After completion of the reaction, the reaction product was cooled to room temperature, and concentrated to obtain a muddy reaction mixture. The reaction mixture was extracted with hexane, and purified by column chromatography with silica gel as a carrier and a mixed solvent of hexane and dichloromethane as an eluent. Sublimation purification was performed to obtain 2.59 g (6.0 mmol) of pentacarbonyl[dicarbonyl(η5-methylcyclopentadienyl)ruthenium]manganese (Mn—Ru) as a specified substance (yield: 60%).
- Evaluation of physical properties of heterogeneous polynuclear complex: Physical properties were evaluated by TG for the heterogeneous polynuclear complexes produced in Examples 1 and 5. Analysis was performed by observing a change in weight of a complex sample (5 mg) in heating of the sample at a temperature elevation rate of 5° C./min over a measurement temperature range, i.e. from room temperature to 450° C., under a nitrogen atmosphere in TG-DTA2000SA manufactured by BRUKER Corporation. The results are shown in
FIG. 1 . - The results of TG in
FIG. 1 show that for the complexes in Examples 1 and 5, vaporization and decomposition of the complex were started by heating at about 150° C., and thus these complexes had a low decomposition temperature, and were capable of forming a film at a low temperature. After elevation of the temperature to about 200° C., the weight loss was constant. This shows that almost the whole of the raw material was vaporized, and the complexes had a favorable vaporization property. - Film formation test: Next, a film formation test was conducted in which a composite metal thin film was formed by a CVD method with the complex produced in Example 5 as a raw material compound.
- The metal thin film was formed on a substrate (15 mm×15 mm) with a silicon oxide film deposited on a silicon substrate by use of tetraethoxysilane (TEOS). As a film formation apparatus, a hot wall type thermal CVD apparatus was used. A reaction gas (hydrogen) was fed at a constant flow rate by use of a mass flow controller. Film formation conditions are as described below. The result of observing a cross-section of the metal thin film with a SEM is shown in
FIG. 2 . - Substrate: SiO2
- Film formation temperature: 250° C.
- Sample temperature: 70° C.
- Film formation pressure: 5 torr
- Reaction gas (hydrogen) flow rate: 10 sccm
- Film formation time: 20 minutes
- The metal thin film formed in this way was shiny silvery-white, and had a thickness of 74.9 nm.
FIG. 2 shows that the metal thin film formed on SiO2 had a smooth and uniform surface. - M1/M2 ratio: the Ru/Mn ratio was analyzed as an abundance of metal elements by an X-ray photoelectron spectroscopy (XPS) method for the metal thin film formed as described above. As a measurement apparatus, KRATOS Axis Nova manufactured by Shimadzu Corporation was used. In this measurement, the thin film (thickness: 74.9 nm) was analyzed in a depth direction from the vicinity of the surface to the upper side of the vicinity of the interface with the SiO2 film. In the vicinity of the interface with the SiO2 film, influences of Si and O made it difficult to correctly analyze the Ru/Mn ratio, and the analysis was performed over a range where these influences were small. The results are shown in
FIG. 3 . The abscissa inFIG. 3 is approximately consistent with a thickness (74.9 nm) from the thin film surface to the upper side of the vicinity of the interface with the SiO2 film. -
FIG. 3 shows that both Ru and Mn were deposited in the metal thin film. The Ru/Mn ratio did not depend on the film depth, and was constant (about 0.15 to 0.2), and thus a thin film having an almost constant metal composition ratio was obtained. - The present invention is capable of forming a composite metal thin film from a single raw material by a chemical deposition method, and it is easy to make the thin film homogeneous and control quality of raw materials. Thus, the present invention can be applied to uses which employ a structure in which a plurality of metal layers are deposited, such as copper diffusion layers in semiconductor devices.
Claims (10)
1. A chemical deposition raw material for producing a composite metal thin film or a composite metal compound thin film by a chemical deposition method,
comprising a heterogeneous polynuclear complex in which a cyclopentadienyl (L) and a carbonyl are coordinated to a first transition metal (M1) as a central metal, and a carbonyl is coordinated to a second transition metal (M2) as a central metal, the heterogeneous polynuclear complex being represented by the chemical formula 1:
2. The chemical deposition raw material according to claim 1 , wherein x is 1 and y is n+2, the chemical deposition raw material comprising a heterogeneous polynuclear complex represented by the following formula:
3. The chemical deposition raw material according to claim 1 , wherein the transition metal is one of Mn, Fe, Co, Ni, Cu, Nb, Mo, Ru, Rh, Ta, W, Ir and Pt.
4. The chemical deposition raw material according to claim 1 , wherein M1 is one of Ru, Mn and Fe, M2 is one of Mn, Fe, Co and Ni, and M1 and M2 are different.
5. The chemical deposition raw material according to claim 1 , wherein each of R1 to R5 is one of a hydrogen atom, a methyl group, an ethyl group, a propyl group and a butyl group.
6. The chemical deposition raw material according to claim 1 , wherein the total carbon number of all the substituents R1 to R5 is 1 or more and 4 or less.
7. A method for chemical deposition of a composite metal thin film or a composite metal compound thin film, comprising vaporizing a raw material including a heterogeneous polynuclear complex to prepare a raw material gas, and while introducing the raw material gas to a substrate surface, the gas is heated,
wherein the chemical deposition raw material defined in claim 1 is used as the raw material.
8. The chemical deposition raw material according to claim 5 , wherein the total carbon number of all the substituents R1 to R5 is 1 or more and 4 or less.
9. A method for chemical deposition of a composite metal thin film or a composite metal compound thin film, comprising vaporizing a raw material including a heterogeneous polynuclear complex to prepare a raw material gas, and while introducing the raw material gas to a substrate surface, the gas is heated,
wherein the chemical deposition raw material defined in claim 5 is used as the raw material.
10. A method for chemical deposition of a composite metal thin film or a composite metal compound thin film, comprising vaporizing a raw material including a heterogeneous polynuclear complex to prepare a raw material gas, and while introducing the raw material gas to a substrate surface, the gas is heated,
wherein the chemical deposition raw material defined in claim 6 is used as the raw material.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-096981 | 2015-05-12 | ||
JP2015096981A JP6043835B1 (en) | 2015-05-12 | 2015-05-12 | Chemical vapor deposition material comprising heterogeneous binuclear complex and chemical vapor deposition method using the chemical vapor deposition material |
PCT/JP2016/063695 WO2016181918A1 (en) | 2015-05-12 | 2016-05-09 | Chemical vapor deposition starting material comprising heterogeneous polynuclear complex, and chemical vapor deposition method using said chemical vapor deposition starting material |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2016/063695 A-371-Of-International WO2016181918A1 (en) | 2015-05-12 | 2016-05-09 | Chemical vapor deposition starting material comprising heterogeneous polynuclear complex, and chemical vapor deposition method using said chemical vapor deposition starting material |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US16/277,789 Division US10526698B2 (en) | 2015-05-12 | 2019-02-15 | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
Publications (1)
Publication Number | Publication Date |
---|---|
US20180119274A1 true US20180119274A1 (en) | 2018-05-03 |
Family
ID=57248222
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US15/564,819 Abandoned US20180119274A1 (en) | 2015-05-12 | 2016-05-09 | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
US16/277,789 Active US10526698B2 (en) | 2015-05-12 | 2019-02-15 | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US16/277,789 Active US10526698B2 (en) | 2015-05-12 | 2019-02-15 | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
Country Status (6)
Country | Link |
---|---|
US (2) | US20180119274A1 (en) |
EP (1) | EP3296424A4 (en) |
JP (1) | JP6043835B1 (en) |
KR (1) | KR102161526B1 (en) |
TW (1) | TWI596102B (en) |
WO (1) | WO2016181918A1 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180079764A1 (en) * | 2015-05-12 | 2018-03-22 | Tanaka Kikinzoku Kogyo K.K. | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
US10526698B2 (en) * | 2015-05-12 | 2020-01-07 | Tanaka Kikinzoku K.K. | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
US11084837B2 (en) | 2017-03-24 | 2021-08-10 | Tanaka Kikinzoku Kogyo K.K. | Chemical deposition raw material including iridium complex and chemical deposition method using the chemical deposition raw material |
US12065453B2 (en) | 2018-01-26 | 2024-08-20 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Lanthanoid compound, lanthanoid-containing thin film and formation of lanthanoid-containing thin film using the lanthanoid compound |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220235455A1 (en) * | 2019-06-17 | 2022-07-28 | Tanaka Kikinzoku Kogyo K.K. | Starting material for chemical vapor deposition composed of organomanganese compound, and chemical vapor deposition method using said starting material for chemical vapor deposition |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US301725A (en) * | 1884-07-08 | Vehicle-axle |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8717566D0 (en) * | 1987-07-24 | 1987-09-03 | Thorn Emi Ltd | Organic compounds |
JPH02210054A (en) * | 1989-02-09 | 1990-08-21 | Polymer Processing Res Inst | Production of wide warp and weft laminated cloth comprising yarn as weft |
US5171610A (en) * | 1990-08-28 | 1992-12-15 | The Regents Of The University Of Calif. | Low temperature photochemical vapor deposition of alloy and mixed metal oxide films |
US6984591B1 (en) | 2000-04-20 | 2006-01-10 | International Business Machines Corporation | Precursor source mixtures |
JP2006328526A (en) * | 2005-04-27 | 2006-12-07 | Jsr Corp | Method for depositing metallic film |
JP5487748B2 (en) | 2009-06-16 | 2014-05-07 | 東京エレクトロン株式会社 | Barrier layer, film forming method and processing system |
JP6043835B1 (en) * | 2015-05-12 | 2016-12-14 | 田中貴金属工業株式会社 | Chemical vapor deposition material comprising heterogeneous binuclear complex and chemical vapor deposition method using the chemical vapor deposition material |
-
2015
- 2015-05-12 JP JP2015096981A patent/JP6043835B1/en active Active
-
2016
- 2016-05-04 TW TW105113842A patent/TWI596102B/en active
- 2016-05-09 US US15/564,819 patent/US20180119274A1/en not_active Abandoned
- 2016-05-09 WO PCT/JP2016/063695 patent/WO2016181918A1/en active Application Filing
- 2016-05-09 EP EP16792643.5A patent/EP3296424A4/en not_active Withdrawn
- 2016-05-09 KR KR1020177030166A patent/KR102161526B1/en active IP Right Grant
-
2019
- 2019-02-15 US US16/277,789 patent/US10526698B2/en active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US301725A (en) * | 1884-07-08 | Vehicle-axle |
Non-Patent Citations (1)
Title |
---|
Caffyn et al., J. Chem. Dalton Trans., 1991, 2349-2356 * |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180079764A1 (en) * | 2015-05-12 | 2018-03-22 | Tanaka Kikinzoku Kogyo K.K. | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
US10407450B2 (en) * | 2015-05-12 | 2019-09-10 | Tanaka Kikinzoku Kogyo K.K. | Heterogeneous polynuclear complex for use in the chemical deposition of composite metal or metal compound thin films |
US10526698B2 (en) * | 2015-05-12 | 2020-01-07 | Tanaka Kikinzoku K.K. | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material |
US11084837B2 (en) | 2017-03-24 | 2021-08-10 | Tanaka Kikinzoku Kogyo K.K. | Chemical deposition raw material including iridium complex and chemical deposition method using the chemical deposition raw material |
US12065453B2 (en) | 2018-01-26 | 2024-08-20 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Lanthanoid compound, lanthanoid-containing thin film and formation of lanthanoid-containing thin film using the lanthanoid compound |
Also Published As
Publication number | Publication date |
---|---|
US20190177837A1 (en) | 2019-06-13 |
KR102161526B1 (en) | 2020-10-05 |
TWI596102B (en) | 2017-08-21 |
EP3296424A4 (en) | 2018-04-25 |
JP6043835B1 (en) | 2016-12-14 |
US10526698B2 (en) | 2020-01-07 |
TW201710278A (en) | 2017-03-16 |
JP2016211049A (en) | 2016-12-15 |
WO2016181918A1 (en) | 2016-11-17 |
EP3296424A1 (en) | 2018-03-21 |
KR20170128583A (en) | 2017-11-22 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10526698B2 (en) | Chemical deposition raw material including heterogeneous polynuclear complex and chemical deposition method using the chemical deposition raw material | |
Ramos et al. | Precursor design and reaction mechanisms for the atomic layer deposition of metal films | |
US10407450B2 (en) | Heterogeneous polynuclear complex for use in the chemical deposition of composite metal or metal compound thin films | |
TWI486475B (en) | Organoruthenium compound for chemical deposition and chemical deposition process using the organoruthenium compound | |
TWI470107B (en) | Cyclopentadienyl transition metal precursors for deposition of transition metal containing films | |
TWI611038B (en) | Chemical vapor deposition raw material containing organoruthenium compound and chemical vapor deposition method using the chemical vapor deposition raw material | |
TW200906835A (en) | Deposition precursors for semiconductor applications | |
US10763001B2 (en) | Liquid precursor compositions, preparation methods thereof, and methods for forming layer using the composition | |
TWI722456B (en) | Bis(diazadiene)cobalt compounds, method of making and method of use thereof | |
US10815260B2 (en) | Chemical vapor deposition raw material including dinuclear ruthenium complex and chemical deposition method using chemical vapor deposition raw material | |
US9034761B2 (en) | Heteroleptic (allyl)(pyrroles-2-aldiminate) metal-containing precursors, their synthesis and vapor deposition thereof to deposit metal-containing films | |
Chi et al. | Fluorinated aminoalkoxide Cu II complexes: new CVD precursors for deposition of copper metal | |
US20090326254A1 (en) | Organic-metal precursor material and method of manufacturing metal thin film using the same | |
JP2009057618A (en) | Copper-containing thin film, and method for producing the same | |
JP2010059471A (en) | Ruthenium particle and manufacturing method thereof, and manufacturing method of metal-containing thin film using ruthenium particles for lower metal film | |
JP2009057617A (en) | Metal-containing thin film, and method for producing the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: TANAKA KIKINZOKU KOGYO K.K., JAPAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:HARADA, RYOSUKE;SHIGETOMI, TOSHIYUKI;NABEYA, SHUNICHI;AND OTHERS;SIGNING DATES FROM 20170821 TO 20170828;REEL/FRAME:043803/0488 |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: FINAL REJECTION MAILED |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |