US20140186768A1 - Photosensitive Resin Composition for Insulating Film of Display Device, Insulating Film Using the Same, and Display Device Using the Same - Google Patents
Photosensitive Resin Composition for Insulating Film of Display Device, Insulating Film Using the Same, and Display Device Using the Same Download PDFInfo
- Publication number
- US20140186768A1 US20140186768A1 US13/962,153 US201313962153A US2014186768A1 US 20140186768 A1 US20140186768 A1 US 20140186768A1 US 201313962153 A US201313962153 A US 201313962153A US 2014186768 A1 US2014186768 A1 US 2014186768A1
- Authority
- US
- United States
- Prior art keywords
- display device
- insulating film
- resin composition
- photosensitive resin
- compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011342 resin composition Substances 0.000 title claims abstract description 67
- 150000001875 compounds Chemical class 0.000 claims abstract description 61
- 239000006096 absorbing agent Substances 0.000 claims abstract description 33
- 239000003513 alkali Substances 0.000 claims abstract description 27
- 239000002243 precursor Substances 0.000 claims abstract description 25
- 239000011347 resin Substances 0.000 claims abstract description 23
- 229920005989 resin Polymers 0.000 claims abstract description 23
- 239000002904 solvent Substances 0.000 claims abstract description 19
- 229920001721 polyimide Polymers 0.000 claims abstract description 17
- 229920002577 polybenzoxazole Polymers 0.000 claims abstract description 16
- 239000004642 Polyimide Substances 0.000 claims abstract description 15
- 238000010521 absorption reaction Methods 0.000 claims abstract description 10
- 229920005575 poly(amic acid) Polymers 0.000 claims abstract description 8
- -1 silane compound Chemical class 0.000 claims description 52
- 229910000077 silane Inorganic materials 0.000 claims description 14
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 claims description 10
- KWOLFJPFCHCOCG-UHFFFAOYSA-N Acetophenone Chemical compound CC(=O)C1=CC=CC=C1 KWOLFJPFCHCOCG-UHFFFAOYSA-N 0.000 claims description 8
- 239000012965 benzophenone Substances 0.000 claims description 7
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 claims description 6
- 244000028419 Styrax benzoin Species 0.000 claims description 5
- 235000000126 Styrax benzoin Nutrition 0.000 claims description 5
- 235000008411 Sumatra benzointree Nutrition 0.000 claims description 5
- 229960002130 benzoin Drugs 0.000 claims description 5
- 235000019382 gum benzoic Nutrition 0.000 claims description 5
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 claims description 5
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 claims description 4
- 150000002923 oximes Chemical class 0.000 claims description 4
- 239000010408 film Substances 0.000 description 84
- 239000000126 substance Substances 0.000 description 43
- 125000000217 alkyl group Chemical group 0.000 description 28
- 238000011161 development Methods 0.000 description 23
- 125000000962 organic group Chemical group 0.000 description 20
- 125000003118 aryl group Chemical group 0.000 description 18
- 239000000203 mixture Substances 0.000 description 16
- 239000001257 hydrogen Substances 0.000 description 14
- 229910052739 hydrogen Inorganic materials 0.000 description 14
- 230000035945 sensitivity Effects 0.000 description 14
- 125000002723 alicyclic group Chemical group 0.000 description 11
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 10
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 10
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 9
- 238000000576 coating method Methods 0.000 description 9
- 239000002253 acid Substances 0.000 description 8
- 125000003545 alkoxy group Chemical group 0.000 description 8
- 239000011248 coating agent Substances 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 8
- 239000000654 additive Substances 0.000 description 7
- 239000007864 aqueous solution Substances 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 239000004593 Epoxy Substances 0.000 description 6
- 230000000996 additive effect Effects 0.000 description 6
- 125000003342 alkenyl group Chemical group 0.000 description 6
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 6
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 5
- 125000001931 aliphatic group Chemical group 0.000 description 5
- 125000002947 alkylene group Chemical group 0.000 description 5
- 150000004984 aromatic diamines Chemical class 0.000 description 5
- 125000000732 arylene group Chemical group 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 125000000753 cycloalkyl group Chemical group 0.000 description 5
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 4
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 4
- 229910052736 halogen Inorganic materials 0.000 description 4
- 150000002367 halogens Chemical class 0.000 description 4
- 150000002431 hydrogen Chemical group 0.000 description 4
- 239000004973 liquid crystal related substance Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000002156 mixing Methods 0.000 description 4
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 125000000304 alkynyl group Chemical group 0.000 description 3
- 230000008901 benefit Effects 0.000 description 3
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 description 3
- PASDCCFISLVPSO-UHFFFAOYSA-N benzoyl chloride Chemical compound ClC(=O)C1=CC=CC=C1 PASDCCFISLVPSO-UHFFFAOYSA-N 0.000 description 3
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 3
- 150000001990 dicarboxylic acid derivatives Chemical class 0.000 description 3
- 238000004090 dissolution Methods 0.000 description 3
- 125000000524 functional group Chemical group 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- 229910052760 oxygen Inorganic materials 0.000 description 3
- 239000000376 reactant Substances 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- GPXCORHXFPYJEH-UHFFFAOYSA-N 3-[[3-aminopropyl(dimethyl)silyl]oxy-dimethylsilyl]propan-1-amine Chemical compound NCCC[Si](C)(C)O[Si](C)(C)CCCN GPXCORHXFPYJEH-UHFFFAOYSA-N 0.000 description 2
- OSUWBBMPVXVSOA-UHFFFAOYSA-N 4-(4-carbonochloridoylphenoxy)benzoyl chloride Chemical compound C1=CC(C(=O)Cl)=CC=C1OC1=CC=C(C(Cl)=O)C=C1 OSUWBBMPVXVSOA-UHFFFAOYSA-N 0.000 description 2
- UJOBWOGCFQCDNV-UHFFFAOYSA-N 9H-carbazole Chemical compound C1=CC=C2C3=CC=CC=C3NC2=C1 UJOBWOGCFQCDNV-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 2
- QUSNBJAOOMFDIB-UHFFFAOYSA-N Ethylamine Chemical compound CCN QUSNBJAOOMFDIB-UHFFFAOYSA-N 0.000 description 2
- AFVFQIVMOAPDHO-UHFFFAOYSA-N Methanesulfonic acid Chemical compound CS(O)(=O)=O AFVFQIVMOAPDHO-UHFFFAOYSA-N 0.000 description 2
- OJGMBLNIHDZDGS-UHFFFAOYSA-N N-Ethylaniline Chemical compound CCNC1=CC=CC=C1 OJGMBLNIHDZDGS-UHFFFAOYSA-N 0.000 description 2
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 2
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 238000000862 absorption spectrum Methods 0.000 description 2
- 125000004450 alkenylene group Chemical group 0.000 description 2
- 125000004419 alkynylene group Chemical group 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- VYHBFRJRBHMIQZ-UHFFFAOYSA-N bis[4-(diethylamino)phenyl]methanone Chemical compound C1=CC(N(CC)CC)=CC=C1C(=O)C1=CC=C(N(CC)CC)C=C1 VYHBFRJRBHMIQZ-UHFFFAOYSA-N 0.000 description 2
- 239000011203 carbon fibre reinforced carbon Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 239000003086 colorant Substances 0.000 description 2
- 125000000392 cycloalkenyl group Chemical group 0.000 description 2
- 125000005724 cycloalkenylene group Chemical group 0.000 description 2
- 125000002993 cycloalkylene group Chemical group 0.000 description 2
- 125000006159 dianhydride group Chemical group 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 125000001072 heteroaryl group Chemical group 0.000 description 2
- 125000005549 heteroarylene group Chemical group 0.000 description 2
- 125000005842 heteroatom Chemical group 0.000 description 2
- 125000000623 heterocyclic group Chemical group 0.000 description 2
- 125000004366 heterocycloalkenyl group Chemical group 0.000 description 2
- 125000000592 heterocycloalkyl group Chemical group 0.000 description 2
- 125000006588 heterocycloalkylene group Chemical group 0.000 description 2
- OAKJQQAXSVQMHS-UHFFFAOYSA-N hydrazine group Chemical group NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 description 2
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 2
- 239000003999 initiator Substances 0.000 description 2
- 239000011229 interlayer Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- KBJFYLLAMSZSOG-UHFFFAOYSA-N n-(3-trimethoxysilylpropyl)aniline Chemical compound CO[Si](OC)(OC)CCCNC1=CC=CC=C1 KBJFYLLAMSZSOG-UHFFFAOYSA-N 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000004843 novolac epoxy resin Substances 0.000 description 2
- QWVGKYWNOKOFNN-UHFFFAOYSA-N o-cresol Chemical compound CC1=CC=CC=C1O QWVGKYWNOKOFNN-UHFFFAOYSA-N 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- WGYKZJWCGVVSQN-UHFFFAOYSA-N propylamine Chemical compound CCCN WGYKZJWCGVVSQN-UHFFFAOYSA-N 0.000 description 2
- 239000011241 protective layer Substances 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000007363 ring formation reaction Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 238000010186 staining Methods 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 2
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 2
- GETQZCLCWQTVFV-UHFFFAOYSA-N trimethylamine Chemical compound CN(C)C GETQZCLCWQTVFV-UHFFFAOYSA-N 0.000 description 2
- 229910021642 ultra pure water Inorganic materials 0.000 description 2
- 239000012498 ultrapure water Substances 0.000 description 2
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 2
- HJIAMFHSAAEUKR-UHFFFAOYSA-N (2-hydroxyphenyl)-phenylmethanone Chemical compound OC1=CC=CC=C1C(=O)C1=CC=CC=C1 HJIAMFHSAAEUKR-UHFFFAOYSA-N 0.000 description 1
- FJKOQFIGFHTRRW-UHFFFAOYSA-N (2-methoxy-3-methylphenyl)-(3-methylphenyl)methanone Chemical compound COC1=C(C)C=CC=C1C(=O)C1=CC=CC(C)=C1 FJKOQFIGFHTRRW-UHFFFAOYSA-N 0.000 description 1
- LTQBNYCMVZQRSD-UHFFFAOYSA-N (4-ethenylphenyl)-trimethoxysilane Chemical compound CO[Si](OC)(OC)C1=CC=C(C=C)C=C1 LTQBNYCMVZQRSD-UHFFFAOYSA-N 0.000 description 1
- 125000000008 (C1-C10) alkyl group Chemical group 0.000 description 1
- MSAHTMIQULFMRG-UHFFFAOYSA-N 1,2-diphenyl-2-propan-2-yloxyethanone Chemical compound C=1C=CC=CC=1C(OC(C)C)C(=O)C1=CC=CC=C1 MSAHTMIQULFMRG-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 1
- DKEGCUDAFWNSSO-UHFFFAOYSA-N 1,8-dibromooctane Chemical compound BrCCCCCCCCBr DKEGCUDAFWNSSO-UHFFFAOYSA-N 0.000 description 1
- BUZYGTVTZYSBCU-UHFFFAOYSA-N 1-(4-chlorophenyl)ethanone Chemical compound CC(=O)C1=CC=C(Cl)C=C1 BUZYGTVTZYSBCU-UHFFFAOYSA-N 0.000 description 1
- IMDHDEPPVWETOI-UHFFFAOYSA-N 1-(4-tert-butylphenyl)-2,2,2-trichloroethanone Chemical compound CC(C)(C)C1=CC=C(C(=O)C(Cl)(Cl)Cl)C=C1 IMDHDEPPVWETOI-UHFFFAOYSA-N 0.000 description 1
- VMCRQYHCDSXNLW-UHFFFAOYSA-N 1-(4-tert-butylphenyl)-2,2-dichloroethanone Chemical compound CC(C)(C)C1=CC=C(C(=O)C(Cl)Cl)C=C1 VMCRQYHCDSXNLW-UHFFFAOYSA-N 0.000 description 1
- ASOKPJOREAFHNY-UHFFFAOYSA-N 1-Hydroxybenzotriazole Chemical compound C1=CC=C2N(O)N=NC2=C1 ASOKPJOREAFHNY-UHFFFAOYSA-N 0.000 description 1
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- YIKSHDNOAYSSPX-UHFFFAOYSA-N 1-propan-2-ylthioxanthen-9-one Chemical compound S1C2=CC=CC=C2C(=O)C2=C1C=CC=C2C(C)C YIKSHDNOAYSSPX-UHFFFAOYSA-N 0.000 description 1
- XJEVHMGJSYVQBQ-UHFFFAOYSA-N 2,3-dihydro-1h-inden-1-amine Chemical compound C1=CC=C2C(N)CCC2=C1 XJEVHMGJSYVQBQ-UHFFFAOYSA-N 0.000 description 1
- BRKORVYTKKLNKX-UHFFFAOYSA-N 2,4-di(propan-2-yl)thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C(C)C)=CC(C(C)C)=C3SC2=C1 BRKORVYTKKLNKX-UHFFFAOYSA-N 0.000 description 1
- BTJPUDCSZVCXFQ-UHFFFAOYSA-N 2,4-diethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(CC)=CC(CC)=C3SC2=C1 BTJPUDCSZVCXFQ-UHFFFAOYSA-N 0.000 description 1
- VRMKFAFIVOVETG-UHFFFAOYSA-N 2,6-bis(methoxymethyl)-4-methylphenol Chemical compound COCC1=CC(C)=CC(COC)=C1O VRMKFAFIVOVETG-UHFFFAOYSA-N 0.000 description 1
- OZQXFOQOBWTCQA-UHFFFAOYSA-N 2,6-bis[[5-[2-(2-amino-4-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-hydroxyanilino]methyl]-4-methylphenol Chemical compound OC=1C(CNC=2C(=CC=C(C=2)C(C=2C(=CC(O)=CC=2)N)(C(F)(F)F)C(F)(F)F)O)=CC(C)=CC=1CNC(C(=CC=1)O)=CC=1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(O)C=C1N OZQXFOQOBWTCQA-UHFFFAOYSA-N 0.000 description 1
- DQMOHZLFVGYNAN-UHFFFAOYSA-N 2-(2-phenylethenyl)-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound ClC(Cl)(Cl)C1=NC(C(Cl)(Cl)Cl)=NC(C=CC=2C=CC=CC=2)=N1 DQMOHZLFVGYNAN-UHFFFAOYSA-N 0.000 description 1
- FVNIIPIYHHEXQA-UHFFFAOYSA-N 2-(4-methoxynaphthalen-1-yl)-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound C12=CC=CC=C2C(OC)=CC=C1C1=NC(C(Cl)(Cl)Cl)=NC(C(Cl)(Cl)Cl)=N1 FVNIIPIYHHEXQA-UHFFFAOYSA-N 0.000 description 1
- QRHHZFRCJDAUNA-UHFFFAOYSA-N 2-(4-methoxyphenyl)-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound C1=CC(OC)=CC=C1C1=NC(C(Cl)(Cl)Cl)=NC(C(Cl)(Cl)Cl)=N1 QRHHZFRCJDAUNA-UHFFFAOYSA-N 0.000 description 1
- MPNIGZBDAMWHSX-UHFFFAOYSA-N 2-(4-methylphenyl)-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound C1=CC(C)=CC=C1C1=NC(C(Cl)(Cl)Cl)=NC(C(Cl)(Cl)Cl)=N1 MPNIGZBDAMWHSX-UHFFFAOYSA-N 0.000 description 1
- MXPYJVUYLVNEBB-UHFFFAOYSA-N 2-[2-(2-carboxybenzoyl)oxycarbonylbenzoyl]oxycarbonylbenzoic acid Chemical compound OC(=O)C1=CC=CC=C1C(=O)OC(=O)C1=CC=CC=C1C(=O)OC(=O)C1=CC=CC=C1C(O)=O MXPYJVUYLVNEBB-UHFFFAOYSA-N 0.000 description 1
- ZJRNXDIVAGHETA-UHFFFAOYSA-N 2-[2-(3,4-dimethoxyphenyl)ethenyl]-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound C1=C(OC)C(OC)=CC=C1C=CC1=NC(C(Cl)(Cl)Cl)=NC(C(Cl)(Cl)Cl)=N1 ZJRNXDIVAGHETA-UHFFFAOYSA-N 0.000 description 1
- KZLDGFZCFRXUIB-UHFFFAOYSA-N 2-amino-4-(3-amino-4-hydroxyphenyl)phenol Chemical group C1=C(O)C(N)=CC(C=2C=C(N)C(O)=CC=2)=C1 KZLDGFZCFRXUIB-UHFFFAOYSA-N 0.000 description 1
- KECOIASOKMSRFT-UHFFFAOYSA-N 2-amino-4-(3-amino-4-hydroxyphenyl)sulfonylphenol Chemical compound C1=C(O)C(N)=CC(S(=O)(=O)C=2C=C(N)C(O)=CC=2)=C1 KECOIASOKMSRFT-UHFFFAOYSA-N 0.000 description 1
- MSTZGVRUOMBULC-UHFFFAOYSA-N 2-amino-4-[2-(3-amino-4-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phenol Chemical compound C1=C(O)C(N)=CC(C(C=2C=C(N)C(O)=CC=2)(C(F)(F)F)C(F)(F)F)=C1 MSTZGVRUOMBULC-UHFFFAOYSA-N 0.000 description 1
- UHIDYCYNRPVZCK-UHFFFAOYSA-N 2-amino-4-[2-(3-amino-4-hydroxyphenyl)propan-2-yl]phenol Chemical compound C=1C=C(O)C(N)=CC=1C(C)(C)C1=CC=C(O)C(N)=C1 UHIDYCYNRPVZCK-UHFFFAOYSA-N 0.000 description 1
- UVULKOXOMNNKHQ-UHFFFAOYSA-N 2-amino-4-[2-[3-amino-4-hydroxy-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-3-(trifluoromethyl)phenol Chemical compound NC1=C(O)C=CC(C(C=2C(=C(N)C(O)=CC=2)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1C(F)(F)F UVULKOXOMNNKHQ-UHFFFAOYSA-N 0.000 description 1
- GCPBXBPTVLXELM-UHFFFAOYSA-N 2-amino-4-[2-[3-amino-4-hydroxy-5-(1,1,2,2,2-pentafluoroethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-6-(1,1,2,2,2-pentafluoroethyl)phenol Chemical compound FC(F)(F)C(F)(F)C1=C(O)C(N)=CC(C(C=2C=C(C(O)=C(N)C=2)C(F)(F)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1 GCPBXBPTVLXELM-UHFFFAOYSA-N 0.000 description 1
- QJHQWCIVTUDZAS-UHFFFAOYSA-N 2-amino-4-[2-[3-amino-4-hydroxy-5-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-6-(1,1,2,2,2-pentafluoroethyl)phenol Chemical compound FC(F)(F)C1=C(O)C(N)=CC(C(C=2C=C(C(O)=C(N)C=2)C(F)(F)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1 QJHQWCIVTUDZAS-UHFFFAOYSA-N 0.000 description 1
- CERCNNGWSFHMRS-UHFFFAOYSA-N 2-amino-4-[2-[3-amino-4-hydroxy-5-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-6-(trifluoromethyl)phenol Chemical compound FC(F)(F)C1=C(O)C(N)=CC(C(C=2C=C(C(O)=C(N)C=2)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1 CERCNNGWSFHMRS-UHFFFAOYSA-N 0.000 description 1
- GUAABCABPPALIY-UHFFFAOYSA-N 2-amino-4-[2-[4-amino-3-hydroxy-5-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-3-(trifluoromethyl)phenol Chemical compound C1=C(C(F)(F)F)C(N)=C(O)C=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(O)C(N)=C1C(F)(F)F GUAABCABPPALIY-UHFFFAOYSA-N 0.000 description 1
- KDTQDPGQSURHCS-UHFFFAOYSA-N 2-amino-4-[2-[4-amino-3-hydroxy-5-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-6-(trifluoromethyl)phenol Chemical compound FC(F)(F)C1=C(O)C(N)=CC(C(C=2C=C(C(N)=C(O)C=2)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1 KDTQDPGQSURHCS-UHFFFAOYSA-N 0.000 description 1
- HSDJJCLSBWAWCR-UHFFFAOYSA-N 2-amino-4-[2-[4-amino-5-hydroxy-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-6-(trifluoromethyl)phenol Chemical compound C1=C(O)C(N)=CC(C(F)(F)F)=C1C(C(F)(F)F)(C(F)(F)F)C1=CC(N)=C(O)C(C(F)(F)F)=C1 HSDJJCLSBWAWCR-UHFFFAOYSA-N 0.000 description 1
- UAOAJEXJIVJGFW-UHFFFAOYSA-N 2-amino-4-[2-[5-amino-4-hydroxy-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-5-(trifluoromethyl)phenol Chemical compound C1=C(O)C(N)=CC(C(C=2C(=CC(O)=C(N)C=2)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1C(F)(F)F UAOAJEXJIVJGFW-UHFFFAOYSA-N 0.000 description 1
- ZGDMDBHLKNQPSD-UHFFFAOYSA-N 2-amino-5-(4-amino-3-hydroxyphenyl)phenol Chemical group C1=C(O)C(N)=CC=C1C1=CC=C(N)C(O)=C1 ZGDMDBHLKNQPSD-UHFFFAOYSA-N 0.000 description 1
- KHAFBBNQUOEYHB-UHFFFAOYSA-N 2-amino-5-(4-amino-3-hydroxyphenyl)sulfonylphenol Chemical compound C1=C(O)C(N)=CC=C1S(=O)(=O)C1=CC=C(N)C(O)=C1 KHAFBBNQUOEYHB-UHFFFAOYSA-N 0.000 description 1
- ZDRNVPNSQJRIRN-UHFFFAOYSA-N 2-amino-5-[2-(4-amino-3-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phenol Chemical compound C1=C(O)C(N)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(N)C(O)=C1 ZDRNVPNSQJRIRN-UHFFFAOYSA-N 0.000 description 1
- JDFAWEKPFLGRAK-UHFFFAOYSA-N 2-amino-5-[2-(4-amino-3-hydroxyphenyl)propan-2-yl]phenol Chemical compound C=1C=C(N)C(O)=CC=1C(C)(C)C1=CC=C(N)C(O)=C1 JDFAWEKPFLGRAK-UHFFFAOYSA-N 0.000 description 1
- GXEAXAATWBRDKR-UHFFFAOYSA-N 2-amino-5-[2-[4-amino-3-hydroxy-5-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-3-(trifluoromethyl)phenol Chemical compound C1=C(C(F)(F)F)C(N)=C(O)C=C1C(C(F)(F)F)(C(F)(F)F)C1=CC(O)=C(N)C(C(F)(F)F)=C1 GXEAXAATWBRDKR-UHFFFAOYSA-N 0.000 description 1
- WYQNZULITNCPDJ-UHFFFAOYSA-N 2-amino-5-[2-[4-amino-5-hydroxy-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-4-(trifluoromethyl)phenol Chemical compound C1=C(O)C(N)=CC(C(F)(F)F)=C1C(C(F)(F)F)(C(F)(F)F)C1=CC(O)=C(N)C=C1C(F)(F)F WYQNZULITNCPDJ-UHFFFAOYSA-N 0.000 description 1
- NJQCNUUEPDKIOO-UHFFFAOYSA-N 2-amino-5-[2-[5-amino-4-hydroxy-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-3-(trifluoromethyl)phenol Chemical compound C1=C(O)C(N)=CC(C(C=2C=C(C(N)=C(O)C=2)C(F)(F)F)(C(F)(F)F)C(F)(F)F)=C1C(F)(F)F NJQCNUUEPDKIOO-UHFFFAOYSA-N 0.000 description 1
- CDAWCLOXVUBKRW-UHFFFAOYSA-N 2-aminophenol Chemical compound NC1=CC=CC=C1O CDAWCLOXVUBKRW-UHFFFAOYSA-N 0.000 description 1
- UHFFVFAKEGKNAQ-UHFFFAOYSA-N 2-benzyl-2-(dimethylamino)-1-(4-morpholin-4-ylphenyl)butan-1-one Chemical compound C=1C=C(N2CCOCC2)C=CC=1C(=O)C(CC)(N(C)C)CC1=CC=CC=C1 UHFFVFAKEGKNAQ-UHFFFAOYSA-N 0.000 description 1
- AAXRSWGYLGOFQP-UHFFFAOYSA-N 2-butoxy-1-(2-butoxyphenyl)ethanone Chemical compound CCCCOCC(=O)C1=CC=CC=C1OCCCC AAXRSWGYLGOFQP-UHFFFAOYSA-N 0.000 description 1
- ZCDADJXRUCOCJE-UHFFFAOYSA-N 2-chlorothioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(Cl)=CC=C3SC2=C1 ZCDADJXRUCOCJE-UHFFFAOYSA-N 0.000 description 1
- KMNCBSZOIQAUFX-UHFFFAOYSA-N 2-ethoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OCC)C(=O)C1=CC=CC=C1 KMNCBSZOIQAUFX-UHFFFAOYSA-N 0.000 description 1
- MRDMGGOYEBRLPD-UHFFFAOYSA-N 2-ethoxy-1-(2-ethoxyphenyl)ethanone Chemical compound CCOCC(=O)C1=CC=CC=C1OCC MRDMGGOYEBRLPD-UHFFFAOYSA-N 0.000 description 1
- BQZJOQXSCSZQPS-UHFFFAOYSA-N 2-methoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OC)C(=O)C1=CC=CC=C1 BQZJOQXSCSZQPS-UHFFFAOYSA-N 0.000 description 1
- LWRBVKNFOYUCNP-UHFFFAOYSA-N 2-methyl-1-(4-methylsulfanylphenyl)-2-morpholin-4-ylpropan-1-one Chemical compound C1=CC(SC)=CC=C1C(=O)C(C)(C)N1CCOCC1 LWRBVKNFOYUCNP-UHFFFAOYSA-N 0.000 description 1
- CRWNQZTZTZWPOF-UHFFFAOYSA-N 2-methyl-4-phenylpyridine Chemical compound C1=NC(C)=CC(C=2C=CC=CC=2)=C1 CRWNQZTZTZWPOF-UHFFFAOYSA-N 0.000 description 1
- MYISVPVWAQRUTL-UHFFFAOYSA-N 2-methylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3SC2=C1 MYISVPVWAQRUTL-UHFFFAOYSA-N 0.000 description 1
- DGUBLKUCHAAUFT-UHFFFAOYSA-N 2-oxobut-3-enoic acid Chemical compound OC(=O)C(=O)C=C DGUBLKUCHAAUFT-UHFFFAOYSA-N 0.000 description 1
- HAZQZUFYRLFOLC-UHFFFAOYSA-N 2-phenyl-4,6-bis(trichloromethyl)-1,3,5-triazine Chemical compound ClC(Cl)(Cl)C1=NC(C(Cl)(Cl)Cl)=NC(C=2C=CC=CC=2)=N1 HAZQZUFYRLFOLC-UHFFFAOYSA-N 0.000 description 1
- QITGRLDGDYMKNB-UHFFFAOYSA-N 3-(3-aminopropyl-phenyl-triphenylsilyloxysilyl)propan-1-amine Chemical compound C=1C=CC=CC=1[Si](CCCN)(CCCN)O[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 QITGRLDGDYMKNB-UHFFFAOYSA-N 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- ZBMISJGHVWNWTE-UHFFFAOYSA-N 3-(4-aminophenoxy)aniline Chemical compound C1=CC(N)=CC=C1OC1=CC=CC(N)=C1 ZBMISJGHVWNWTE-UHFFFAOYSA-N 0.000 description 1
- FGWQCROGAHMWSU-UHFFFAOYSA-N 3-[(4-aminophenyl)methyl]aniline Chemical compound C1=CC(N)=CC=C1CC1=CC=CC(N)=C1 FGWQCROGAHMWSU-UHFFFAOYSA-N 0.000 description 1
- QMAQHCMFKOQWML-UHFFFAOYSA-N 3-[2-[2-(3-aminophenoxy)phenyl]sulfonylphenoxy]aniline Chemical compound NC1=CC=CC(OC=2C(=CC=CC=2)S(=O)(=O)C=2C(=CC=CC=2)OC=2C=C(N)C=CC=2)=C1 QMAQHCMFKOQWML-UHFFFAOYSA-N 0.000 description 1
- FPHRTSFRLFDOHZ-UHFFFAOYSA-N 3-[[4-[3-aminopropyl(dimethyl)silyl]phenyl]-dimethylsilyl]propan-1-amine Chemical compound NCCC[Si](C)(C)C1=CC=C([Si](C)(C)CCCN)C=C1 FPHRTSFRLFDOHZ-UHFFFAOYSA-N 0.000 description 1
- DOYKFSOCSXVQAN-UHFFFAOYSA-N 3-[diethoxy(methyl)silyl]propyl 2-methylprop-2-enoate Chemical compound CCO[Si](C)(OCC)CCCOC(=O)C(C)=C DOYKFSOCSXVQAN-UHFFFAOYSA-N 0.000 description 1
- LZMNXXQIQIHFGC-UHFFFAOYSA-N 3-[dimethoxy(methyl)silyl]propyl 2-methylprop-2-enoate Chemical compound CO[Si](C)(OC)CCCOC(=O)C(C)=C LZMNXXQIQIHFGC-UHFFFAOYSA-N 0.000 description 1
- KQIGMPWTAHJUMN-UHFFFAOYSA-N 3-aminopropane-1,2-diol Chemical compound NCC(O)CO KQIGMPWTAHJUMN-UHFFFAOYSA-N 0.000 description 1
- JSGVZVOGOQILFM-UHFFFAOYSA-N 3-methoxy-1-butanol Chemical compound COC(C)CCO JSGVZVOGOQILFM-UHFFFAOYSA-N 0.000 description 1
- QMYGFTJCQFEDST-UHFFFAOYSA-N 3-methoxybutyl acetate Chemical compound COC(C)CCOC(C)=O QMYGFTJCQFEDST-UHFFFAOYSA-N 0.000 description 1
- XDLMVUHYZWKMMD-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(C)=C XDLMVUHYZWKMMD-UHFFFAOYSA-N 0.000 description 1
- KBQVDAIIQCXKPI-UHFFFAOYSA-N 3-trimethoxysilylpropyl prop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C=C KBQVDAIIQCXKPI-UHFFFAOYSA-N 0.000 description 1
- ICNFHJVPAJKPHW-UHFFFAOYSA-N 4,4'-Thiodianiline Chemical compound C1=CC(N)=CC=C1SC1=CC=C(N)C=C1 ICNFHJVPAJKPHW-UHFFFAOYSA-N 0.000 description 1
- YBRVSVVVWCFQMG-UHFFFAOYSA-N 4,4'-diaminodiphenylmethane Chemical compound C1=CC(N)=CC=C1CC1=CC=C(N)C=C1 YBRVSVVVWCFQMG-UHFFFAOYSA-N 0.000 description 1
- OKISUZLXOYGIFP-UHFFFAOYSA-N 4,4'-dichlorobenzophenone Chemical compound C1=CC(Cl)=CC=C1C(=O)C1=CC=C(Cl)C=C1 OKISUZLXOYGIFP-UHFFFAOYSA-N 0.000 description 1
- CHJYKNDQMVDBKS-UHFFFAOYSA-N 4,4,4-trifluorobutane-1-sulfonic acid Chemical compound OS(=O)(=O)CCCC(F)(F)F CHJYKNDQMVDBKS-UHFFFAOYSA-N 0.000 description 1
- JQGUWEUKOQRRJU-UHFFFAOYSA-N 4-(4-aminobutyl-methyl-trimethylsilyloxysilyl)butan-1-amine Chemical compound NCCCC[Si](C)(O[Si](C)(C)C)CCCCN JQGUWEUKOQRRJU-UHFFFAOYSA-N 0.000 description 1
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 1
- KKTPGXGRDRSYMY-UHFFFAOYSA-N 4-[(4-aminophenyl)-dimethylsilyl]aniline Chemical compound C=1C=C(N)C=CC=1[Si](C)(C)C1=CC=C(N)C=C1 KKTPGXGRDRSYMY-UHFFFAOYSA-N 0.000 description 1
- XYLBCGCMHQVLNJ-UHFFFAOYSA-N 4-[(4-aminophenyl)-methyl-trimethylsilyloxysilyl]aniline Chemical compound C=1C=C(N)C=CC=1[Si](C)(O[Si](C)(C)C)C1=CC=C(N)C=C1 XYLBCGCMHQVLNJ-UHFFFAOYSA-N 0.000 description 1
- JCRRFJIVUPSNTA-UHFFFAOYSA-N 4-[4-(4-aminophenoxy)phenoxy]aniline Chemical compound C1=CC(N)=CC=C1OC(C=C1)=CC=C1OC1=CC=C(N)C=C1 JCRRFJIVUPSNTA-UHFFFAOYSA-N 0.000 description 1
- LDFYRFKAYFZVNH-UHFFFAOYSA-N 4-[4-[4-(4-aminophenoxy)phenoxy]phenoxy]aniline Chemical compound C1=CC(N)=CC=C1OC(C=C1)=CC=C1OC(C=C1)=CC=C1OC1=CC=C(N)C=C1 LDFYRFKAYFZVNH-UHFFFAOYSA-N 0.000 description 1
- HYDATEKARGDBKU-UHFFFAOYSA-N 4-[4-[4-(4-aminophenoxy)phenyl]phenoxy]aniline Chemical group C1=CC(N)=CC=C1OC1=CC=C(C=2C=CC(OC=3C=CC(N)=CC=3)=CC=2)C=C1 HYDATEKARGDBKU-UHFFFAOYSA-N 0.000 description 1
- UTDAGHZGKXPRQI-UHFFFAOYSA-N 4-[4-[4-(4-aminophenoxy)phenyl]sulfonylphenoxy]aniline Chemical compound C1=CC(N)=CC=C1OC1=CC=C(S(=O)(=O)C=2C=CC(OC=3C=CC(N)=CC=3)=CC=2)C=C1 UTDAGHZGKXPRQI-UHFFFAOYSA-N 0.000 description 1
- SHDBJOYDLRRTRA-UHFFFAOYSA-N 4-tert-butyl-2,6-bis(methoxymethyl)phenol Chemical compound COCC1=CC(C(C)(C)C)=CC(COC)=C1O SHDBJOYDLRRTRA-UHFFFAOYSA-N 0.000 description 1
- YGYCECQIOXZODZ-UHFFFAOYSA-N 4415-87-6 Chemical compound O=C1OC(=O)C2C1C1C(=O)OC(=O)C12 YGYCECQIOXZODZ-UHFFFAOYSA-N 0.000 description 1
- VQVIHDPBMFABCQ-UHFFFAOYSA-N 5-(1,3-dioxo-2-benzofuran-5-carbonyl)-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(C(C=2C=C3C(=O)OC(=O)C3=CC=2)=O)=C1 VQVIHDPBMFABCQ-UHFFFAOYSA-N 0.000 description 1
- QQGYZOYWNCKGEK-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)oxy]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(OC=2C=C3C(=O)OC(C3=CC=2)=O)=C1 QQGYZOYWNCKGEK-UHFFFAOYSA-N 0.000 description 1
- IXERBUBSCDXHNZ-UHFFFAOYSA-N 6-(2,5-dioxooxolan-3-yl)-4-methyl-3a,4,5,6,7,7a-hexahydro-2-benzofuran-1,3-dione Chemical compound C1C(C(OC2=O)=O)C2C(C)CC1C1CC(=O)OC1=O IXERBUBSCDXHNZ-UHFFFAOYSA-N 0.000 description 1
- PWGYQXPTXMXJKP-UHFFFAOYSA-N 6-amino-3-[2-[3-amino-4-hydroxy-5-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-(trifluoromethyl)phenol Chemical compound FC(F)(F)C1=C(O)C(N)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC(N)=C(O)C(C(F)(F)F)=C1 PWGYQXPTXMXJKP-UHFFFAOYSA-N 0.000 description 1
- ABLCBXQSJAXLNQ-UHFFFAOYSA-N 6-amino-3-[2-[4-amino-3-hydroxy-2-(trifluoromethyl)phenyl]-1,1,1,3,3,3-hexafluoropropan-2-yl]-2-(trifluoromethyl)phenol Chemical compound FC(F)(F)C1=C(O)C(N)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(N)C(O)=C1C(F)(F)F ABLCBXQSJAXLNQ-UHFFFAOYSA-N 0.000 description 1
- LPEKGGXMPWTOCB-UHFFFAOYSA-N 8beta-(2,3-epoxy-2-methylbutyryloxy)-14-acetoxytithifolin Natural products COC(=O)C(C)O LPEKGGXMPWTOCB-UHFFFAOYSA-N 0.000 description 1
- MRABAEUHTLLEML-UHFFFAOYSA-N Butyl lactate Chemical compound CCCCOC(=O)C(C)O MRABAEUHTLLEML-UHFFFAOYSA-N 0.000 description 1
- MQJKPEGWNLWLTK-UHFFFAOYSA-N Dapsone Chemical compound C1=CC(N)=CC=C1S(=O)(=O)C1=CC=C(N)C=C1 MQJKPEGWNLWLTK-UHFFFAOYSA-N 0.000 description 1
- XXRCUYVCPSWGCC-UHFFFAOYSA-N Ethyl pyruvate Chemical compound CCOC(=O)C(C)=O XXRCUYVCPSWGCC-UHFFFAOYSA-N 0.000 description 1
- QPJVMBTYPHYUOC-UHFFFAOYSA-N Methyl benzoate Natural products COC(=O)C1=CC=CC=C1 QPJVMBTYPHYUOC-UHFFFAOYSA-N 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- JLTDJTHDQAWBAV-UHFFFAOYSA-N N,N-dimethylaniline Chemical compound CN(C)C1=CC=CC=C1 JLTDJTHDQAWBAV-UHFFFAOYSA-N 0.000 description 1
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 description 1
- PSBPNWBGNOWCCU-UHFFFAOYSA-N OB(O)O.S.S.S Chemical compound OB(O)O.S.S.S PSBPNWBGNOWCCU-UHFFFAOYSA-N 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical group [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 239000006087 Silane Coupling Agent Substances 0.000 description 1
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 1
- JOFSEHHMYPDWFR-UHFFFAOYSA-N [3-(acetyloxymethyl)-2-hydroxy-5-methylphenyl]methyl acetate Chemical compound CC(=O)OCC1=CC(C)=CC(COC(C)=O)=C1O JOFSEHHMYPDWFR-UHFFFAOYSA-N 0.000 description 1
- MPGOFFXRGUQRMW-UHFFFAOYSA-N [N-]=[N+]=[N-].[N-]=[N+]=[N-].O=C1C=CC=CC1=O Chemical group [N-]=[N+]=[N-].[N-]=[N+]=[N-].O=C1C=CC=CC1=O MPGOFFXRGUQRMW-UHFFFAOYSA-N 0.000 description 1
- 125000004183 alkoxy alkyl group Chemical group 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- QTQUJRIHTSIVOF-UHFFFAOYSA-N amino(phenyl)methanol Chemical compound NC(O)C1=CC=CC=C1 QTQUJRIHTSIVOF-UHFFFAOYSA-N 0.000 description 1
- 150000008064 anhydrides Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- FYXKZNLBZKRYSS-UHFFFAOYSA-N benzene-1,2-dicarbonyl chloride Chemical compound ClC(=O)C1=CC=CC=C1C(Cl)=O FYXKZNLBZKRYSS-UHFFFAOYSA-N 0.000 description 1
- FDQSRULYDNDXQB-UHFFFAOYSA-N benzene-1,3-dicarbonyl chloride Chemical compound ClC(=O)C1=CC=CC(C(Cl)=O)=C1 FDQSRULYDNDXQB-UHFFFAOYSA-N 0.000 description 1
- SRSXLGNVWSONIS-UHFFFAOYSA-N benzenesulfonic acid Chemical compound OS(=O)(=O)C1=CC=CC=C1 SRSXLGNVWSONIS-UHFFFAOYSA-N 0.000 description 1
- 229940092714 benzenesulfonic acid Drugs 0.000 description 1
- HFACYLZERDEVSX-UHFFFAOYSA-N benzidine Chemical compound C1=CC(N)=CC=C1C1=CC=C(N)C=C1 HFACYLZERDEVSX-UHFFFAOYSA-N 0.000 description 1
- CHIHQLCVLOXUJW-UHFFFAOYSA-N benzoic anhydride Chemical compound C=1C=CC=CC=1C(=O)OC(=O)C1=CC=CC=C1 CHIHQLCVLOXUJW-UHFFFAOYSA-N 0.000 description 1
- HXTBYXIZCDULQI-UHFFFAOYSA-N bis[4-(methylamino)phenyl]methanone Chemical compound C1=CC(NC)=CC=C1C(=O)C1=CC=C(NC)C=C1 HXTBYXIZCDULQI-UHFFFAOYSA-N 0.000 description 1
- 239000004841 bisphenol A epoxy resin Substances 0.000 description 1
- WKDNYTOXBCRNPV-UHFFFAOYSA-N bpda Chemical compound C1=C2C(=O)OC(=O)C2=CC(C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 WKDNYTOXBCRNPV-UHFFFAOYSA-N 0.000 description 1
- QDHFHIQKOVNCNC-UHFFFAOYSA-N butane-1-sulfonic acid Chemical compound CCCCS(O)(=O)=O QDHFHIQKOVNCNC-UHFFFAOYSA-N 0.000 description 1
- 239000001191 butyl (2R)-2-hydroxypropanoate Substances 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 125000003739 carbamimidoyl group Chemical group C(N)(=N)* 0.000 description 1
- CREMABGTGYGIQB-UHFFFAOYSA-N carbon carbon Chemical compound C.C CREMABGTGYGIQB-UHFFFAOYSA-N 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 125000004093 cyano group Chemical group *C#N 0.000 description 1
- MGNCLNQXLYJVJD-UHFFFAOYSA-N cyanuric chloride Chemical compound ClC1=NC(Cl)=NC(Cl)=N1 MGNCLNQXLYJVJD-UHFFFAOYSA-N 0.000 description 1
- WOSVXXBNNCUXMT-UHFFFAOYSA-N cyclopentane-1,2,3,4-tetracarboxylic acid Chemical compound OC(=O)C1CC(C(O)=O)C(C(O)=O)C1C(O)=O WOSVXXBNNCUXMT-UHFFFAOYSA-N 0.000 description 1
- 229960002887 deanol Drugs 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000006297 dehydration reaction Methods 0.000 description 1
- 238000006356 dehydrogenation reaction Methods 0.000 description 1
- 230000032798 delamination Effects 0.000 description 1
- 125000000664 diazo group Chemical group [N-]=[N+]=[*] 0.000 description 1
- URQUNWYOBNUYJQ-UHFFFAOYSA-N diazonaphthoquinone Chemical compound C1=CC=C2C(=O)C(=[N]=[N])C=CC2=C1 URQUNWYOBNUYJQ-UHFFFAOYSA-N 0.000 description 1
- HPNMFZURTQLUMO-UHFFFAOYSA-N diethylamine Chemical compound CCNCC HPNMFZURTQLUMO-UHFFFAOYSA-N 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 1
- 239000012972 dimethylethanolamine Substances 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- ODQWQRRAPPTVAG-GZTJUZNOSA-N doxepin Chemical compound C1OC2=CC=CC=C2C(=C/CCN(C)C)/C2=CC=CC=C21 ODQWQRRAPPTVAG-GZTJUZNOSA-N 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000000183 esterificating effect Effects 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- CCIVGXIOQKPBKL-UHFFFAOYSA-M ethanesulfonate Chemical compound CCS([O-])(=O)=O CCIVGXIOQKPBKL-UHFFFAOYSA-M 0.000 description 1
- ZYBWTEQKHIADDQ-UHFFFAOYSA-N ethanol;methanol Chemical compound OC.CCO ZYBWTEQKHIADDQ-UHFFFAOYSA-N 0.000 description 1
- FWDBOZPQNFPOLF-UHFFFAOYSA-N ethenyl(triethoxy)silane Chemical compound CCO[Si](OCC)(OCC)C=C FWDBOZPQNFPOLF-UHFFFAOYSA-N 0.000 description 1
- NKSJNEHGWDZZQF-UHFFFAOYSA-N ethenyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C=C NKSJNEHGWDZZQF-UHFFFAOYSA-N 0.000 description 1
- WOXXJEVNDJOOLV-UHFFFAOYSA-N ethenyl-tris(2-methoxyethoxy)silane Chemical compound COCCO[Si](OCCOC)(OCCOC)C=C WOXXJEVNDJOOLV-UHFFFAOYSA-N 0.000 description 1
- 229940116333 ethyl lactate Drugs 0.000 description 1
- 229940117360 ethyl pyruvate Drugs 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 239000000852 hydrogen donor Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000002401 inhibitory effect Effects 0.000 description 1
- 229940018564 m-phenylenediamine Drugs 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229940098779 methanesulfonic acid Drugs 0.000 description 1
- CHFHCGSFJVYQRV-UHFFFAOYSA-N methyl 2-acetamido-3-chloro-3-hydroxypropanoate Chemical compound COC(=O)C(C(O)Cl)NC(C)=O CHFHCGSFJVYQRV-UHFFFAOYSA-N 0.000 description 1
- BDJSOPWXYLFTNW-UHFFFAOYSA-N methyl 3-methoxypropanoate Chemical compound COCCC(=O)OC BDJSOPWXYLFTNW-UHFFFAOYSA-N 0.000 description 1
- 229940095102 methyl benzoate Drugs 0.000 description 1
- CRVGTESFCCXCTH-UHFFFAOYSA-N methyl diethanolamine Chemical compound OCCN(C)CCO CRVGTESFCCXCTH-UHFFFAOYSA-N 0.000 description 1
- 229940057867 methyl lactate Drugs 0.000 description 1
- CWKLZLBVOJRSOM-UHFFFAOYSA-N methyl pyruvate Chemical compound COC(=O)C(C)=O CWKLZLBVOJRSOM-UHFFFAOYSA-N 0.000 description 1
- DAZXVJBJRMWXJP-UHFFFAOYSA-N n,n-dimethylethylamine Chemical compound CCN(C)C DAZXVJBJRMWXJP-UHFFFAOYSA-N 0.000 description 1
- GNVRJGIVDSQCOP-UHFFFAOYSA-N n-ethyl-n-methylethanamine Chemical compound CCN(C)CC GNVRJGIVDSQCOP-UHFFFAOYSA-N 0.000 description 1
- GNWCSWUWMHQEMD-UHFFFAOYSA-N naphthalene-1,2-dione diazide Chemical group [N-]=[N+]=[N-].[N-]=[N+]=[N-].C1=CC=C2C(=O)C(=O)C=CC2=C1 GNWCSWUWMHQEMD-UHFFFAOYSA-N 0.000 description 1
- KQSABULTKYLFEV-UHFFFAOYSA-N naphthalene-1,5-diamine Chemical compound C1=CC=C2C(N)=CC=CC2=C1N KQSABULTKYLFEV-UHFFFAOYSA-N 0.000 description 1
- GOGZBMRXLADNEV-UHFFFAOYSA-N naphthalene-2,6-diamine Chemical compound C1=C(N)C=CC2=CC(N)=CC=C21 GOGZBMRXLADNEV-UHFFFAOYSA-N 0.000 description 1
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
- 231100000252 nontoxic Toxicity 0.000 description 1
- 230000003000 nontoxic effect Effects 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 125000005515 organic divalent group Chemical group 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- LCUPNHOUKMJAQN-UHFFFAOYSA-N phenoxycarbonyl phenyl carbonate Chemical compound C=1C=CC=CC=1OC(=O)OC(=O)OC1=CC=CC=C1 LCUPNHOUKMJAQN-UHFFFAOYSA-N 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- LYXOWKPVTCPORE-UHFFFAOYSA-N phenyl-(4-phenylphenyl)methanone Chemical compound C=1C=C(C=2C=CC=CC=2)C=CC=1C(=O)C1=CC=CC=C1 LYXOWKPVTCPORE-UHFFFAOYSA-N 0.000 description 1
- CLYVDMAATCIVBF-UHFFFAOYSA-N pigment red 224 Chemical compound C=12C3=CC=C(C(OC4=O)=O)C2=C4C=CC=1C1=CC=C2C(=O)OC(=O)C4=CC=C3C1=C42 CLYVDMAATCIVBF-UHFFFAOYSA-N 0.000 description 1
- 229960005235 piperonyl butoxide Drugs 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 150000003141 primary amines Chemical class 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 239000007870 radical polymerization initiator Substances 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 239000011541 reaction mixture Substances 0.000 description 1
- 230000002829 reductive effect Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 150000003335 secondary amines Chemical class 0.000 description 1
- 238000007086 side reaction Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 238000009987 spinning Methods 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 150000003457 sulfones Chemical class 0.000 description 1
- LXEJRKJRKIFVNY-UHFFFAOYSA-N terephthaloyl chloride Chemical compound ClC(=O)C1=CC=C(C(Cl)=O)C=C1 LXEJRKJRKIFVNY-UHFFFAOYSA-N 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 1
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 150000004992 toluidines Chemical class 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- GQIUQDDJKHLHTB-UHFFFAOYSA-N trichloro(ethenyl)silane Chemical compound Cl[Si](Cl)(Cl)C=C GQIUQDDJKHLHTB-UHFFFAOYSA-N 0.000 description 1
- ITMCEJHCFYSIIV-UHFFFAOYSA-N triflic acid Chemical compound OS(=O)(=O)C(F)(F)F ITMCEJHCFYSIIV-UHFFFAOYSA-N 0.000 description 1
- DQZNLOXENNXVAD-UHFFFAOYSA-N trimethoxy-[2-(7-oxabicyclo[4.1.0]heptan-4-yl)ethyl]silane Chemical compound C1C(CC[Si](OC)(OC)OC)CCC2OC21 DQZNLOXENNXVAD-UHFFFAOYSA-N 0.000 description 1
- 239000005050 vinyl trichlorosilane Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
- G03F7/0755—Non-macromolecular compounds containing Si-O, Si-C or Si-N bonds
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
Definitions
- This disclosure relates to a photosensitive resin composition for an insulating film of a display device, and an insulating film of a display device and a display device using the same.
- a surface protective layer and an interlayer insulating film for a semiconductor device use a polyimide resin having excellent heat resistance, electrical characteristics, mechanical characteristics, and the like.
- the polyimide resin has recently been used as a photosensitive polyimide precursor composition.
- the photosensitive polyimide precursor composition can be easily coated on a semiconductor device, patterned by ultraviolet (UV) rays, developed, and heat-imidized, to thereby form a surface protective layer, an interlayer insulating film, and the like.
- the photosensitive polyimide precursor composition may remarkably shorten processing time compared with a conventional non-photosensitive polyimide precursor composition.
- the photosensitive polyimide precursor composition can be applied as a positive type in which an exposed part is developed and dissolved or as a negative type in which the exposed part is cured and maintained.
- the positive type photosensitive polyimide precursor composition is preferably used, since a non-toxic alkali aqueous solution is used as a development solution.
- the positive photosensitive polyimide precursor composition includes a polyimide precursor of polyamic acid, a photosensitive material of diazonaphthoquinone, and the like.
- the positive photosensitive polyimide precursor composition may not provide the desired pattern because the carboxylic acid of the polyamic acid is too highly soluble in an alkali.
- the carboxylic acid can be replaced with phenolic hydroxyl acid, for example, by esterificating the polyamidic acid with an alcohol compound having at least one hydroxyl group. See Japanese Patent Laid-Open Publication No. H10-30739. This material, however, can be insufficiently developed and can exhibit film loss or resin delamination from a substrate.
- the positive photosensitive resin composition including a polybenzoxazole precursor may also be applied to an organic insulating film or a barrier rib material in the field of display devices.
- a liquid crystal display can have advantages such as lightness, thinness, low cost, low power consumption for operation, excellent adherence to an integrated circuit, and the like and is increasingly used in laptop computers, monitors, and TV screens.
- the liquid crystal display includes a lower substrate having a black matrix, a color filter, and an ITO pixel electrode, an active circuit portion including a liquid crystal layer, a thin film transistor, and a capacitor layer, and an upper substrate having an ITO pixel electrode.
- each organic light emitting element is arranged as pixels in a matrix format. These pixels may be arranged to emit the same color and fabricate a single color display, or arranged into three primary colors of red (R), green (G), and blue (B) to emit various colors.
- RGB red
- G green
- B blue
- On embodiment of the present invention provides a photosensitive resin composition for an insulating film of a display device that can have an improved film residue ratio, sensitivity, and/or dielectric constant and a low residue occurrence rate of an exposure part.
- Another embodiment of the present invention provides an insulating film of a display device using the photosensitive resin composition for an insulating film of a display device.
- Yet another embodiment of the present invention provides a display device including the insulating film of a display device.
- a photosensitive resin composition for an insulating film of a display device includes (A) an alkali soluble resin including a polybenzoxazole precursor, polyamic acid, polyimide, or a combination thereof; (B) a photosensitive diazoquinone compound; (C) an ultraviolet (UV) absorber having a maximum absorption wavelength of about 300 to about 400 nm; and (D) a solvent.
- the ultraviolet (UV) absorber (C) may include a benzophenone-based compound, an acetophenone-based compound, a thioxanthone-based compound, a benzoin-based compound, a triazine-based compound, an oxime-based compound, or a combination thereof.
- the photosensitive resin composition for an insulating film of a display device may include about 5 to about 100 parts by weight of the photosensitive diazoquinone compound (B); about 0.1 to about 5 parts by weight of the ultraviolet (UV) absorber (C); and about 100 to about 900 parts by weight of the solvent (D), based on about 100 parts by weight of the alkali soluble resin (A).
- the photosensitive resin composition for an insulating film of a display device may further include a silane compound.
- the photosensitive resin composition for an insulating film of a display device may further include a phenol compound.
- an insulating film of a display device manufactured using the photosensitive resin composition for an insulating film of a display device.
- a display device including the insulating film of a display device is provided.
- the photosensitive resin composition for an insulating film of a display device and an insulating film of a display device formed of the photosensitive resin composition and a display device fabricated using the same may have an improved film residue ratio, sensitivity, and/or a dielectric constant but a low residue occurrence rate in an exposed part.
- FIG. 1 shows the ultraviolet (UV) absorption spectrum of an ultraviolet (UV) absorber according to one embodiment of the present invention.
- substituted refers to one substituted with at least a substituent including halogen (—F, —Cl, —Br or —I), a hydroxy group, a nitro group, a cyano group, an amino group (NH 2 , NH(R 200 ) or N(R 201 )(R 202 ), wherein R 200 , R 201 and R 202 are the same or different and are each independently C1 to C10 alkyl), an amidino group, a hydrazine group, a hydrazine group, a carboxyl group, substituted or unsubstituted alkyl, substituted or unsubstituted alkenyl, substituted or unsubstituted alkynyl, a substituted or unsubstituted alicyclic organic group, substituted or unsubstituted aryl, a substituted or unsubstituted heterocycl
- alkyl refers to C1 to C30 alkyl, for example C1 to C15 alkyl
- cycloalkyl refers to C3 to C30 cycloalkyl, for example C3 to C18 cycloalkyl
- alkoxy refers to C1 to C30 alkoxy, for example C1 to C18 alkoxy
- aryl refers to C6 to C30 aryl, for example C6 to C18 aryl
- alkenyl refers to C2 to C30 alkenyl, for example C2 to C18 alkenyl
- alkylene refers to C1 to C30 alkylene, for example C1 to C18 alkylene
- arylene refers to C6 to C30 arylene, for example C6 to C16 arylene.
- aliphatic organic group refers to C1 to C30 alkyl, C2 to C30 alkenyl, C2 to C30 alkynyl, C1 to C30 alkylene, C2 to C30 alkenylene, or C2 to C30 alkynylene, for example C1 to C15 alkyl, C2 to C15 alkenyl, C2 to C15 alkynyl, C1 to C15 alkylene, C2 to C15 alkenylene, or C2 to C15 alkynylene
- the term “alicyclic organic group” refers to C3 to C30 cycloalkyl, C3 to C30 cycloalkenyl, C3 to C30 cycloalkynyl, C3 to C30 cycloalkylene, C3 to C30 cycloalkenylene, or C3 to C30 cycloalkynylene, for example C3 to C15 cycloalkyl
- One embodiment of the present invention provides a photosensitive resin composition for an insulating film of a display device that includes (A) an alkali soluble resin including a polybenzoxazole precursor, polyamic acid, polyimide, or a combination thereof; (B) a photosensitive diazoquinone compound; (C) an ultraviolet (UV) absorber having maximum absorption wavelength of about 300 to about 400 nm; and (D) a solvent.
- A an alkali soluble resin including a polybenzoxazole precursor, polyamic acid, polyimide, or a combination thereof
- B a photosensitive diazoquinone compound
- C an ultraviolet (UV) absorber having maximum absorption wavelength of about 300 to about 400 nm
- D a solvent.
- the photosensitive resin composition for an insulating film of a display device may be a positive photosensitive resin composition.
- the alkali soluble resin (A) may be any generally-used alkali soluble resin in the art of the present invention without limitation.
- the alkali soluble resin may include without limitation polybenzoxazole precursors including a repeating unit represented by the following Chemical Formula 1, polyamic acids including a repeating unit represented by the following Chemical Formula 2, polyimides including a repeating unit represented by the following Chemical Formula 3, and the like, and combinations thereof.
- X 1 is a substituted or unsubstituted C6 to C30 aromatic organic group
- Y 1 is a substituted or unsubstituted C6 to C30 aromatic organic group, a substituted or unsubstituted divalent to hexavalent C1 to C30 aliphatic organic group, or a substituted or unsubstituted divalent to hexavalent C3 to C30 alicyclic organic group.
- X 1 may be an aromatic organic group which is a residual group derived from aromatic diamine.
- aromatic diamine may include without limitation 3,3′-diamino-4,4′-dihydroxybiphenyl, 4,4′-diamino-3,3′-dihydroxybiphenyl, bis(3-amino-4-hydroxyphenyl)propane, bis(4-amino-3-hydroxyphenyl)propane, bis(3-amino-4-hydroxyphenyl)sulfone, bis(4-amino-3-hydroxyphenyl)sulfone, 2,2-bis(3-amino-4-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropane, 2,2-bis(4-amino-3-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropane, 2,2-bis(3-amino-4-hydroxy-5-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(3-amino-4-hydroxy-6-trifluoromethylphenyl)hexan
- Y 1 is an aromatic organic group, divalent to hexavalent aliphatic organic group, or divalent to hexavalent alicyclic organic group, and may be a residual group of dicarboxylic acid or a residual group of a dicarboxylic acid derivative.
- Y 1 may be an aromatic organic group or a divalent to hexavalent alicyclic organic group.
- Examples of the dicarboxylic acid include may include without limitation Y 1 (COOH) 2 (wherein Y 1 is the same as Y 1 of the above Chemical Formula 1).
- carboxylic acid derivative may include without limitation carbonyl halide derivatives of the dicarboxylic acid derivative or active compounds of an active ester derivative obtained by reacting Y 1 (COOH) 2 with 1-hydroxy-1,2,3-benzotriazole (wherein Y 1 is the same as Y 1 of the above Chemical Formula 1).
- dicarboxylic acid derivative may include without limitation 4,4′-oxydibenzoyl chloride, diphenyloxydicarbonyl dichloride, bis(phenylcarbonylchloride)sulfone, bis(phenylcarbonylchloride)ether, bis(phenylcarbonylchloride)phenone, phthaloyl dichloride, terephthaloyl dichloride, isophthaloyl dichloride, dicarbonyldichloride, diphenyloxydicarboxylate dibenzotriazole, and the like, and combinations thereof.
- the polybenzoxazole precursor may have a thermally polymerizable functional group derived from a reactive end-capping monomer, at one terminal end or both terminal ends of the branch.
- a reactive end-capping monomer may include without limitation monoamines, monoanhydrides, and the like, and combinations thereof having a carbon-carbon double bond.
- Examples of the monoamines may include without limitation toluidine, dimethylaniline, ethylaniline, aminophenol, aminobenzylalcohol, aminoindan, aminoacetonephenone, and the like, and combinations thereof.
- X 2 and X 3 are the same or different and are each independently a substituted or unsubstituted C6 to C30 aromatic organic group, substituted or unsubstituted divalent to hexavalent C1 to C30 aliphatic organic group, substituted or unsubstituted divalent to hexavalent C3 to C30 alicyclic organic group, or an organic silane group.
- X 2 and X 3 the same or different and each can be independently a residual group derived from aromatic diamine, alicyclic diamine, and/or silicon diamine.
- the aromatic diamine, alicyclic diamine, and silicon diamine may be used singularly or as a mixture of one or more.
- aromatic diamine may include without limitation 3,4′-diaminodiphenylether, 4,4′-diaminodiphenylether, 3,4′-diaminodiphenylmethane, 4,4′-diaminodiphenylmethane, 4,4′-diaminodiphenylsulfone, 4,4′-diaminodiphenylsulfide, benzidine, m-phenylenediamine, p-phenylenediamine, 1,5-naphthalenediamine, 2,6-naphthalenediamine, bis[4-(4-aminophenoxy)phenyl]sulfone, bis(3-aminophenoxyphenyl)sulfone, bis(4-aminophenoxy)biphenyl, bis[4-(4-aminophenoxy)phenyl]ether, 1,4-bis(4-aminophenoxy)benzene, the forgoing compounds including an aromatic ring substitute
- Examples of the alicyclic diamine may include without limitation 1,2-cyclohexyl diamine, 1,3-cyclohexyl diamine, and the like, and combinations thereof.
- Examples of the silicon diamine may include without limitation bis(4-aminophenyl)dimethylsilane, bis(4-aminophenyl)tetramethylsiloxane, bis(p-aminophenyl)tetramethyldisiloxane, bis( ⁇ -aminopropyl)tetramethyldisiloxane, 1,4-bis( ⁇ -aminopropyldimethylsilyl)benzene, bis(4-aminobutyl)tetramethyldisiloxane, bis( ⁇ -aminopropyl)tetraphenyldisiloxane, 1,3-bis(aminopropyl)tetramethyldisiloxane, and the like, and combinations thereof.
- Y 2 and Y 3 are the same or different and are each independently a substituted or unsubstituted C6 to C30 aromatic organic group, substituted or unsubstituted tetravalent to hexavalent C1 to C30 aliphatic organic group, or substituted or unsubstituted tetravalent to hexavalent C3 to C30 alicyclic organic group.
- the Y 2 and Y 3 may be independently residual groups derived from aromatic acid dianhydride or alicyclic acid dianhydride.
- the aromatic acid dianhydride and the alicyclic acid dianhydride may be used singularly or as a mixture of more than one.
- aromatic acid dianhydride may include without limitation benzophenone tetracarboxylic dianhydrides such as pyromellitic dianhydride; benzophenone-3,3′,4,4′-tetracarboxylic dianhydride, and the like; oxydiphthalic dianhydrides such as 4,4′-oxydiphthalic dianhydride; biphthalic dianhydride such as 3,3′,4,4′-biphthalic dianhydride; (hexafluoroisopropyledene)diphthalic dianhydrides such as 4,4′-(hexafluoroisopropyledene)diphthalic dianhydride; naphthalene-1,4,5,8-tetracarboxylic dianhydride; 3,4,9,10-perylenetetracarboxylic dianhydride, and the like, and combinations thereof.
- benzophenone tetracarboxylic dianhydrides such as pyromellitic dianhydride
- Examples of the alicyclic acid dianhydride may include without limitation 1,2,3,4-cyclobutanetetracarboxylic dianhydride, 1,2,3,4-cyclopentanetetracarboxylic dianhydride, 5-(2,5-dioxotetrahydrofuryl)-3-methyl-cyclohexane-1,2-dicarboxylic anhydride, 4-(2,5-dioxotetrahydrofuran-3-yl)-tetralin-1,2-dicarboxylic anhydride, bicyclooctene-2,3,5,6-tetracarboxylic dianhydride, bicyclooctene-1,2,4,5-tetracarboxylic dianhydride, and the like, and combinations thereof.
- the alkali soluble resin may have a weight average molecular weight (Mw) of about 5,000 to about 20,000 g/mol, for example about 6,000 to about 10,000 g/mol. Within the above weight average molecular weight (Mw), the alkali soluble resin may exhibit sufficient film residue ratios of non-exposed parts during development using an alkali aqueous solution, and patterning may be performed efficiently.
- Mw weight average molecular weight
- the photosensitive diazoquinone compound may be a compound having a 1,2-benzoquinone diazide structure and/or 1,2-naphthoquinone diazide structure.
- the photosensitive diazoquinone compound may include at least one compound represented by the following Chemical Formulae 4, and 6 to 8, and combinations thereof, but is not limited thereto.
- R 60 to R 62 are the same or different and are each independently hydrogen or substituted or unsubstituted C1 to C30 alkyl, for example methyl.
- R 63 to R 65 are the same or different and are each independently OQ, wherein Q is hydrogen, a functional group represented by the following Chemical Formula 5a or a functional group represented by the following Chemical Formula 5b, provided that all Qs are not simultaneously hydrogen
- n 20 to n 22 may be the same or different and are each independently integers of 0 to 5.
- R 66 is hydrogen or substituted or unsubstituted C1 to C30 alkyl
- R 67 to R 69 are the same or different and are each independently OQ
- Q is the same as defined in the above
- n 23 to n 25 are the same or different and are each independently integers of 0 to 5.
- a 3 is CO or CR 74 R 75 , wherein R 74 and R 75 are the same or different and are each independently substituted or unsubstituted C1 to C30 alkyl.
- R 70 to R 73 are the same or different and are each independently hydrogen, substituted or unsubstituted C1 to C30 alkyl, OQ, or NHQ, wherein Q is the same as defined in the above.
- n 26 to n 29 are the same or different and are each integers ranging from 0 to 4, and each n 26 +n 27 and n 28 +n 29 is an integer of less than or equal to 5.
- At least one of R 70 and R 71 is OQ, and one aromatic ring includes one to three OQs and the other aromatic ring includes one to four OQs.
- R 74 to R 81 are the same or different and are each independently hydrogen or substituted or unsubstituted C1 to C30 alkyl
- n 30 and n 31 are the same or different and are each an integer of 1 to 5
- Q is the same as defined above.
- the photosensitive resin composition may include the photosensitive diazoquinone compound in an amount of about 5 to about 100 parts by weight, for example about 10 to about 50 parts by weight, based on about 100 parts by weight of the alkali soluble resin (A).
- the photosensitive resin composition may include the photosensitive diazoquinone compound in an amount of about 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76, 77, 78, 79, 80, 81, 82, 83, 84, 85, 86, 87, 88, 89, 90,
- the photosensitive resin composition includes the photosensitive diazoquinone compound in an amount within the above range, the pattern can be well-formed with minimal or no residue from exposure, and film thickness loss during development may be minimized or prevented and thereby a good pattern can be provided.
- the photosensitive resin composition for an insulating film of a display device includes an ultraviolet (UV) absorber (C) having a maximum absorption wavelength ranging from about 300 to about 400 nm, for example about 350 to about 380 nm.
- the ultraviolet (UV) absorber may be an i-line absorber.
- the i-line absorber has a maximum absorption wavelength of about 365 nm.
- the ultraviolet (UV) absorber absorbing a light within the above wavelength range may effectively regulate developability (a development rate) balance of the photosensitive resin composition for an insulating film of a display device and sensitivity.
- UV absorber (C) examples include without limitation benzophenone-based compounds, acetophenone-based compounds, thioxanthone-based compounds, benzoin-based compounds, triazine-based compounds, oxime-based compounds, and the like, and combinations thereof.
- a compound having a maximum absorption wavelength ranging from about 300 to about 400 nm may be appropriately selected.
- benzophenone-based compound may include without limitation benzophenone, benzoyl benzoate, benzoyl methyl benzoate, 4-phenyl benzophenone, hydroxy benzophenone, acrylated benzophenone, 4,4′-bis(dimethyl amino)benzophenone, 4,4′-bis(diethylamino)benzophenone, 4,4′-dimethylaminobenzophenone, 4,4′-dichlorobenzophenone, 3,3′-dimethyl-2-methoxybenzophenone, and the like, and combinations thereof.
- acetophenone-based compound may include without limitation 2,2′-diethoxyacetophenone, 2,2′-dibutoxyacetophenone, 2-hydroxy-2-methylpropinophenone, p-t-butyltrichloroacetophenone, p-t-butyldichloroacetophenone, 4-chloroacetophenone, 2,2′-dichloro-4-phenoxyacetophenone, 2-methyl-1-(4-(methylthio)phenyl)-2-morpholinopropan-1-one, 2-benzyl-2-dimethylamino-1-(4-morpholinophenyl)-butan-1-one, and the like, and combinations thereof.
- thioxanthone-based compound may include without limitation thioxanthone, 2-methylthioxanthone, isopropyl thioxanthone, 2,4-diethyl thioxanthone, 2,4-diisopropyl thioxanthone, 2-chlorothioxanthone, and the like, and combinations thereof.
- benzoin-based compound may include without limitation benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzyldimethylketal, and the like, and combinations thereof.
- triazine-based compound may include without limitation 2,4,6-trichloro-s-triazine, 2-phenyl 4,6-bis(trichloromethyl)-s-triazine, 2-(3′,4′-dimethoxystyryl)-4,6-bis(trichloromethyl)-s-triazine, 2-(4′-methoxynaphthyl)-4,6-bis(trichloromethyl)-s-triazine, 2-(p-methoxyphenyl)-4,6-bis(trichloromethyl)-s-triazine, 2-(p-tolyl)-4,6-bis(trichloro methyl)-s-triazine, 2-biphenyl 4,6-bis(trichloro methyl)-s-triazine, bis(trichloromethyl)-6-styryl-s-triazine, 2-(naphto-1-yl)-4,6-bis(trichlor
- Examples of the oxime-based compound may include without limitation 2-(o-benzoyloxime)-[[4-(phenylthio)phenyl]-1,2-octandione, 1-(o-acetyloxime)-1-[9-ethyl-6-(2-methylbenzoyl)-9H-carbazol-3-yl]ethanone, and the like, and combinations thereof.
- UV absorbers a compound having a maximum absorption wavelength ranging from about 300 to about 400 nm may be appropriately selected.
- UV absorber In addition to, or other than the ultraviolet (UV) absorbers, a carbazole-based compound, a diketone compound, a sulfonium borate-based compound, a diazo-based compound, a biimidazole-based compound, and the like, and combinations thereof, may be used as the ultraviolet (UV) absorber, if these compounds have a maximum absorption wavelength ranging from about 300 to about 400 nm.
- the ultraviolet (UV) absorber may be an intermolecular hydrogen abstraction type.
- the ultraviolet (UV) absorber in a triplet state is combined with a hydrogen donor and forms a complex, in which a hydrogen atom moves to an ultraviolet (UV) absorber molecule and forms a radical.
- the photosensitive resin composition may include the ultraviolet (UV) absorber in an amount of about 0.1 to about 5 parts by weight, for example about 1 to about 3 parts by weight, based on about 100 parts by weight of the alkali soluble resin.
- the photosensitive resin composition may include the ultraviolet (UV) absorber in an amount of about 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9, 1, 2, 3, 4, or 5 parts by weight.
- the amount of the ultraviolet (UV) absorber can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- the ultraviolet (UV) absorber may easily regulate development rate balance of the photosensitive resin composition for an insulating film of a display device and effectively adjust sensitivity.
- the photosensitive resin composition for an insulating film of a display device may include a solvent that is capable of easily dissolving each component.
- the solvent may include without limitation N-methyl-2-pyrrolidone, ⁇ -butyrolactone, N,N-dimethylacetamide, dimethylsulfoxide, diethyleneglycoldimethylether, diethylene glycoldiethylether, diethyleneglycoldibutylether, propyleneglycolmonomethylether, dipropyleneglycolmonomethylether, propyleneglycolmonomethyletheracetate, methyl lactate, ethyl lactate, butyl lactate, methyl-1,3-butyleneglycolacetate, 1,3-butyleneglycol-3-monomethylether, methyl pyruvate, ethyl pyruvate, methyl-3-methoxy propionate, and the like.
- the solvent may be used singularly or as a mixture of two or more.
- the solvent may be used in an amount of about 100 to about 900 parts by weight, for example about 200 to about 700 parts by weight, based on about 100 parts by weight of the alkali soluble resin.
- the photosensitive resin composition includes the solvent in an amount within the above range, a sufficiently thick film can be obtained, and good solubility and coating properties may be provided.
- the solvent may be used so that a solid content of the photosensitive resin composition for an insulating film of a display device is about 3 to 50 wt %, for example about 5 to about 30 wt %.
- the photosensitive resin composition for an insulating film of a display device may further include a silane compound.
- the silane compound can improve adherence between the photosensitive resin composition for an insulating film of a display device and a substrate.
- the silane compound may include a silane compound having a carbon-carbon unsaturated bond such as but not limited to compounds represented by the following Chemical Formulae 9 to 11; vinyltrimethoxysilane, vinyltriethoxysilane, vinyltrichlorosilane, vinyltris( ⁇ -methoxyethoxy)silane; 2-(3,4 epoxycyclohexyl)-ethyltrimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-acryloxypropyltrimethoxysilane, p-styryltrimethoxysilane, 3-methacryloxypropylmethyldimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane; trimethoxy[3-(phenylamino)propyl]silane, and the like, and combinations thereof.
- Chemical Formulae 9 to 11 vinyltrimethoxysilane, vinyltriethoxysilane, vinyltrichlorosilane, vinyltris
- R 20 is a vinyl group, substituted or unsubstituted alkyl, or substituted or unsubstituted aryl, for example 3-(meth)cryloxypropyl, p-styryl or 3-(phenylamino)propyl.
- R 21 to R 23 are the same or different and are each independently substituted or unsubstituted alkoxy, substituted or unsubstituted alkyl, or halogen, wherein at least one of R 21 to R 23 is alkoxy or halogen, and the alkoxy group may be C1 to C8 alkoxy, and the alkyl may be C1 to C20 alkyl.
- each R 24 is independently —NH 2 or —CH 3 CONH
- R 25 to R 27 are the same or different and are each independently substituted or unsubstituted C1 to C20 alkoxy, wherein the alkoxy may be OCH 3 or OCH 2 CH 3
- n 34 is an integer of 1 to 5.
- R 28 to R 31 are the same or different and are each independently substituted or unsubstituted C1 to C20 alkyl or substituted or unsubstituted C1 to C20 alkoxy, for example CH 3 or OCH 3 .
- R 32 and R 33 are the same or different and are each independently substituted or unsubstituted amino, for example NH 2 or CH 3 CONH.
- n 35 and n 36 are the same or different and are each independently an integer ranging from 1 to 5.
- the photosensitive resin composition may include the silane compound in an amount of about 0.1 parts by weight to about 30 parts, for example about 0.5 to about 10 parts by weight, based on about 100 parts by weight of the alkali soluble resin.
- the photosensitive resin composition may include the silane compound in an amount of about 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, or 30 parts by weight.
- the amount of the silane compound can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- silane compound When the silane compound is included in an amount within the above range, adherence between lower and upper layers can be sufficiently improved, residual film may not remain after development, and/or optical properties such as transmittance and mechanical properties such as tensile strength, elongation, and the like may be improved.
- the photosensitive resin composition for an insulating film of a display device may further include a phenol compound.
- the phenol compound can play a role of increasing dissolution rate and sensitivity of an exposed part and forming a pattern with a high resolution with minimal or no residue during the development using an alkali aqueous solution when the photosensitive resin composition is used to form the pattern.
- the phenol compound may include a compound represented by the following Chemical Formulae 12 to 18, or a combination thereof, but is not limited thereto.
- R 82 to R 87 are the same or different and are each independently hydrogen, hydroxyl (OH), C1 to C8 substituted or unsubstituted alkyl, C1 to C8 alkoxyalkyl or —OCO—R 88 , wherein R 88 is C1 to C8 substituted or unsubstituted alkyl, at least one of R 82 to R 87 is hydroxyl, and all R 82 to R 87 are not hydroxyl.
- R 99 to R 101 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl
- R 102 to R 106 are the same or different and are each independently H, OH, or C1 to C8 substituted or unsubstituted alkyl, for example the alkyl may be CH 3
- n 68 is an integer ranging from 1 to 5.
- R 107 to R 112 are the same or different and are each independently H, OH, or C1 to C8 substituted or unsubstituted alkyl
- a 3 is CR 205 R 206 or a single bond, wherein R 205 and R 206 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, for example CH 3
- n 69 +n 70 +n 71 and n 72 +n 73 +n 74 are the same or different and are each independently integers of less than or equal to 5.
- R 113 to R 115 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl
- n 75 , n 76 and n 79 are the same or different and are each independently integers ranging from 1 to 5
- n 77 and n 78 are the same or different and are each independently integers ranging from 0 to 4.
- R 116 to R 121 are the same or different and are each independently hydrogen, OH, or C1 to C8 substituted or unsubstituted alkyl, and n 80 to n 83 are the same or different and are each independently integers ranging from 1 to 4. n 80 +n 82 and n 81 +n 83 are the same or different and are each independently integers of less than or equal to 5.
- R 122 is C1 to C8 substituted or unsubstituted alkyl, for example CH 3 , R 123 to R 125 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, n 84 , n 86 and n 88 are the same or different and are each independently integers of 1 to 5, and n 85 , n 87 and n 89 are the same or different and are each independently integers ranging from 0 to 4. n 84 +n 85 , n 86 +n 87 and n 88 +n 89 are the same or different and are each independently integers of less than or equal to 5.
- R 126 to R 128 are the same or different and are each independently C1 to C8 substituted or unsubstituted alkyl, for example CH 3
- R 129 to R 132 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl
- n 90 , n 92 and n 94 are the same or different and are each independently integers ranging from 1 to 5
- n 91 , n 93 and n 95 are the same or different and are each independently integers ranging from 0 to 4
- n 96 is an integer ranging from 1 to 4.
- n 90 +n 91 , n 92 +n 93 and n 94 +n 95 are the same or different and are each independently integers of less than or equal to 5.
- phenol compound examples include without limitation 2,6-dimethoxymethyl-4-t-butylphenol, 2,6-dimethoxymethyl-p-cresol, 2,6-diacetoxymethyl-p-cresol, and the like, and combinations thereof.
- the photosensitive resin composition may include the phenol compound in an amount of about 1 to about 30 parts by weight based on about 100 parts by weight of the alkali soluble resin.
- the photosensitive resin composition may include the phenol compound in an amount of about 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, or 30 parts by weight.
- the amount of the phenol compound can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- the photosensitive resin composition includes the phenol compound in an amount within the above range, the photosensitive resin composition may not deteriorate sensitivity but appropriately increase dissolution rate of a non-exposed part during the development, resultantly obtaining a good pattern.
- the phenol compound is not extracted during the storage in a freezer, excellent storage stability may be accomplished.
- the photosensitive resin composition for an insulating film of a display device may further include one or more other additives.
- the photosensitive resin composition for an insulating film of a display device may include an additive such as malonic acid; 3-amino-1,2-propanediol; and/or a silane coupling agent having a vinyl group or a (meth)acryloxy group in order to prevent staining of the film during coating, leveling improvement, or residues production due to non-development.
- the amount of the additive(s) may be controlled depending on desired properties and can be readily determined by the skilled artisan without undue experimentation.
- the photosensitive resin composition for an insulating film of a display device may further include an additive of an epoxy compound in order to improve adherence with a substrate.
- the epoxy compound may include without limitation epoxy novolac acryl carboxylate resins, ortho cresol novolac epoxy resins, phenol novolac epoxy resins, tetramethyl biphenyl epoxy resins, bisphenol A epoxy resins, alicyclic epoxy resins, and the like, and combinations thereof.
- a radical polymerization initiator such as a peroxide initiator or an azobis-based initiator may be further used.
- the photosensitive resin composition may include the epoxy compound in an amount of about 0.01 to about 5 parts by weight based on about 100 parts by weight of the photosensitive resin composition for an insulating film of a display device.
- the photosensitive resin composition includes the epoxy compound in an amount within the above range, storage and adherence and other characteristics may be improved economically.
- the photosensitive resin composition may also include a latent thermal acid generator.
- the latent thermal acid generator is a catalyst for a dehydration reaction and a cyclization reaction of the polybenzoxazole precursor that is polyamide including a phenolic hydroxy group, and thus a cyclization reaction may be performed smoothly even if curing temperature is decreased.
- latent thermal acid generator may include without limitation aryl sulfonic acids such as p-toluene sulfonic acid, benzene sulfonic acid, and the like; perfluoroalkyl sulfonic acids such as trifluoromethane sulfonic acid, trifluorobutane sulfonic acid, and the like; alkyl sulfonic acids such as methane sulfonic acid, ethane sulfonic acid, butane sulfonic acid, and the like; and combinations thereof.
- aryl sulfonic acids such as p-toluene sulfonic acid, benzene sulfonic acid, and the like
- perfluoroalkyl sulfonic acids such as trifluoromethane sulfonic acid, trifluorobutane sulfonic acid, and the like
- alkyl sulfonic acids such as methane sul
- an additive such as a suitable surfactant and/or leveling agent may be included in order to prevent staining of the film or to improve development.
- a method of preparing the photosensitive resin composition for an insulating film of a display device is not particularly limited.
- the photosensitive resin composition may be prepared by mixing the alkali soluble resin (A), the photosensitive diazoquinone compound (B), the UV absorber (C), solvent, and optionally the additive(s) to prepare a photosensitive resin composition for an insulating film of a display device.
- an insulating film of a display device manufactured using the photosensitive resin composition for an insulating film of a display device is provided.
- the insulating film of a display device may be formed according to the following method.
- the photosensitive resin composition can be coated on the surface of a substrate using a spraying method, a roll coater method, a spinning coating method, or the like.
- the coated substrate can be pre-baked and solvent removed to form a coating film.
- the pre-baking step can be performed at a temperature ranging from about 70 to about 120° C. for about 1 to about 5 minutes.
- the pre-baked coating film can be radiated by a visible ray, ultraviolet (UV), far ultraviolet (UV), an electron beam, far ultraviolet (UV), an x-ray, and the like according to a predetermined pattern and then, developed to remove an unnecessary part, obtaining the predetermined pattern.
- the development solution may include an alkali aqueous solution.
- the development solution can include without limitation inorganic alkalis such as sodium hydroxide, potassium hydroxide, sodium carbonate, and the like; primary amines such as ethylamine, n-propylamine, and the like; secondary amines such as diethylamine, and the like; tertiary amines such as trimethylamine, methyldiethylamine, dimethylethylamine, triethylamine, and the like; alcohol amines such as dimethylethanolamine, methyl diethanolamine, triethanolamine, and the like; a quaternary ammonium salt aqueous solutions such as tetramethylammonium hydroxide, tetraethylammonium hydroxide, and the like; and mixtures thereof.
- the development solution can include an alkali compound in a concentration of about 0.1 to about 10%.
- a water-soluble organic solvent such as methanol ethanol and
- the insulating film can be developed with the development solution and then, washed with ultra-pure water for about 30 to about 140 seconds to remove an unnecessary part and dried to obtain a pattern.
- the pattern can be radiated by a light such as ultraviolet (UV) and the like and heated at a temperature ranging from about 110 to about 250° C. for about 30 to about 120 minutes in an oven and the like, obtaining a final pattern.
- UV ultraviolet
- a display device including the insulating film is provided.
- the display device may include without limitation liquid crystal displays, light emitting diodes, plasma displays, organic light emitting diodes (OLED), and the like.
- NMP N-methyl-2-pyrrolidone
- the reaction mixture is added to a solution prepared by mixing water/methanol in a volume ratio of 10/1 to produce a precipitate.
- the precipitate is filtered, sufficiently washed with water, and vacuum-dried at 80° C. for greater than or equal to 24 hours, obtaining a polybenzoxazole precursor having a weight average molecular weight of 9,500.
- FIG. 1 shows the ultraviolet (UV) absorption spectra of the ultraviolet (UV) absorbers C-1 and C-2.
- the ultraviolet (UV) absorber had a maximum absorption wavelength of 365 nm.
- Each photosensitive resin composition for an insulating film of a display device is prepared by mixing the components in the amounts set forth in the following Table 1. Specifically, a photosensitive resin composition for an insulating film of a display device is prepared by dissolving an alkali soluble resin (A) in a solvent (D), adding a photosensitive diazoquinone compound (B), an ultraviolet (UV) absorber (C), a silane compound (E), and a phenol compound (F) thereto, and then, agitating the mixture for 3 hours at room temperature and filtering the agitated reactant with a 0.45 ⁇ m fluororesin filter.
- the units of the amounts of the components (B) to (F) are parts by weight based on 100 parts by weight of the component (A).
- the photosensitive resin compositions for an insulating film of a display device according to Examples 1 to 6 and Comparative Example 1 are respectively coated on an ITO glass with a spin coater and heated up to 130° C. for 2 minutes on a hot plate, forming coating films.
- the coating films are exposed to a light using a predetermined pattern mask and an exposure equipment (1-line stepper, NSR i10C, Nikon Inc.)
- the exposed part is dissolved and removed in a 2.38% tetramethyl ammonium hydroxide aqueous solution at temperature for 40 seconds through 2 puddles, and the resultant is washed with distilled water for 30 seconds.
- the obtained patterns are cured at 250° C. for 60 minutes under an oxygen concentration of less than or equal to 1000 ppm, obtaining pattern films.
- the pattern films are evaluated regarding film residue ratio, sensitivity, residue, and dielectric constant according to the following method.
- the results are provided in the following Table 2.
- the pre-baked films are developed in a 2.38% tetramethyl ammonium hydroxide (TMAH) aqueous solution at 23° C. for 60 seconds, washed with ultra-pure water for 60 seconds, and dried and then measured regarding thickness change using an Alpha step (Tencor Co.) and calculated according to the following Equation 1.
- TMAH tetramethyl ammonium hydroxide
- Optimal exposure time of the pattern film is obtained by measuring exposure time taking to form a 10 ⁇ m L/S pattern to have a line width of 1:1 after the exposure and development.
- a minimum pattern dimension in the optimal exposure time is obtained as resolution of the pattern film.
- Residue of the pattern formed by using the photosensitive resin composition is obtained using an optical microscope and CD-SEM.
- the resin composition is coated on an ITO glass and treated at 130° C. for 2 minutes on a hot plate, forming a 2.0-2.5 ⁇ m-thick coating film.
- a metal electrode (Au) having a diameter of 300 ⁇ m is deposited on the coating film.
- a dielectric constant is calculated by measuring capacitance with a precision impedance analyzer (HP 4294A) and using the following equation 2.
- C denotes capacitance
- ⁇ 0 denotes a dielectric constant under vacuum
- ⁇ denotes a non-dielectric ratio
- A denotes an electrode area
- d denotes thickness of a photosensitive resin composition.
- Example 1 Film residue ratio Sensitivity Residue Dielectric constant
- Example 2 ⁇ ⁇ None ⁇
- Example 3 ⁇ ⁇ None ⁇
- Example 4 ⁇ ⁇ None ⁇
- Example 5 ⁇ ⁇ None ⁇
- Example 6 ⁇ ⁇ None ⁇ Comparative ⁇ ⁇ Occur ⁇
- Example 1
- the photosensitive resin composition according to the present invention appropriately regulated development rate of an exposed part and realized sensitivity (EOP) where no film residue remained. Accordingly, no residue occurred over the entire region of the exposed part having various film differences.
- the film according to Comparative Example 1 has a severe film residue in the exposed part, while the films according to Examples 1 to 6 maintain excellent film residue ratio and sensitivity of a non-exposed part and an excellent dielectric constant, while the film residue of the exposed part is removed.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Materials For Photolithography (AREA)
Abstract
Description
- This application claims priority to and the benefit of Korean Patent Application No. 10-2012-0157564 filed in the Korean Intellectual Property Office on Dec. 28, 2012, the entire disclosure of which is incorporated herein by reference.
- This disclosure relates to a photosensitive resin composition for an insulating film of a display device, and an insulating film of a display device and a display device using the same.
- Conventionally, a surface protective layer and an interlayer insulating film for a semiconductor device use a polyimide resin having excellent heat resistance, electrical characteristics, mechanical characteristics, and the like. The polyimide resin has recently been used as a photosensitive polyimide precursor composition. The photosensitive polyimide precursor composition can be easily coated on a semiconductor device, patterned by ultraviolet (UV) rays, developed, and heat-imidized, to thereby form a surface protective layer, an interlayer insulating film, and the like.
- Accordingly, the photosensitive polyimide precursor composition may remarkably shorten processing time compared with a conventional non-photosensitive polyimide precursor composition.
- The photosensitive polyimide precursor composition can be applied as a positive type in which an exposed part is developed and dissolved or as a negative type in which the exposed part is cured and maintained. The positive type photosensitive polyimide precursor composition is preferably used, since a non-toxic alkali aqueous solution is used as a development solution. The positive photosensitive polyimide precursor composition includes a polyimide precursor of polyamic acid, a photosensitive material of diazonaphthoquinone, and the like.
- However, the positive photosensitive polyimide precursor composition may not provide the desired pattern because the carboxylic acid of the polyamic acid is too highly soluble in an alkali. In order to solve this problem, the carboxylic acid can be replaced with phenolic hydroxyl acid, for example, by esterificating the polyamidic acid with an alcohol compound having at least one hydroxyl group. See Japanese Patent Laid-Open Publication No. H10-30739. This material, however, can be insufficiently developed and can exhibit film loss or resin delamination from a substrate.
- Recently, another material prepared by mixing the polybenzoxazole precursor with a diazonaphthoquinone compound has drawn attention (Japanese Patent Laid-open Publication No. S63-96162). However, when actually used as the polybenzoxazole precursor composition, film loss of an unexposed part is remarkably increased, and the desirable pattern may not be obtained after development.
- In order to improve this problem, if the molecular weight of the polybenzoxazole precursor is increased, the film loss of the unexposed part can be reduced. A residue (a scum), however, can be generated during development, which can deteriorate resolution and increase development time on the exposed part.
- In order to solve the problem, addition of a certain phenol compound to a polybenzoxazole precursor composition has been reported to suppress film loss in unexposed parts during development (Japanese Patent Laid-Open Publication No. H9-302221 and Japanese Patent Laid-Open Publication No. 2000-292913). However, the suppression of the film loss in unexposed parts is insufficient.
- Accordingly, research on increasing the suppression of the film loss as well as preventing generation of the development residue (scum) is required. In addition, research on a dissolution-inhibiting agent is required, since a phenol compound used to adjust solubility can decompose at a high temperature during curing, can cause a side reaction, and the like and as a result, can damage the mechanical properties of a cured film.
- The positive photosensitive resin composition including a polybenzoxazole precursor may also be applied to an organic insulating film or a barrier rib material in the field of display devices. For example, a liquid crystal display can have advantages such as lightness, thinness, low cost, low power consumption for operation, excellent adherence to an integrated circuit, and the like and is increasingly used in laptop computers, monitors, and TV screens.
- The liquid crystal display includes a lower substrate having a black matrix, a color filter, and an ITO pixel electrode, an active circuit portion including a liquid crystal layer, a thin film transistor, and a capacitor layer, and an upper substrate having an ITO pixel electrode.
- With regard to recently developed organic light emitting diodes (OLEDs), each organic light emitting element is arranged as pixels in a matrix format. These pixels may be arranged to emit the same color and fabricate a single color display, or arranged into three primary colors of red (R), green (G), and blue (B) to emit various colors.
- On embodiment of the present invention provides a photosensitive resin composition for an insulating film of a display device that can have an improved film residue ratio, sensitivity, and/or dielectric constant and a low residue occurrence rate of an exposure part.
- Another embodiment of the present invention provides an insulating film of a display device using the photosensitive resin composition for an insulating film of a display device.
- Yet another embodiment of the present invention provides a display device including the insulating film of a display device.
- According to one embodiment of the present invention, provided is a photosensitive resin composition for an insulating film of a display device includes (A) an alkali soluble resin including a polybenzoxazole precursor, polyamic acid, polyimide, or a combination thereof; (B) a photosensitive diazoquinone compound; (C) an ultraviolet (UV) absorber having a maximum absorption wavelength of about 300 to about 400 nm; and (D) a solvent.
- The ultraviolet (UV) absorber (C) may include a benzophenone-based compound, an acetophenone-based compound, a thioxanthone-based compound, a benzoin-based compound, a triazine-based compound, an oxime-based compound, or a combination thereof.
- The photosensitive resin composition for an insulating film of a display device may include about 5 to about 100 parts by weight of the photosensitive diazoquinone compound (B); about 0.1 to about 5 parts by weight of the ultraviolet (UV) absorber (C); and about 100 to about 900 parts by weight of the solvent (D), based on about 100 parts by weight of the alkali soluble resin (A).
- The photosensitive resin composition for an insulating film of a display device may further include a silane compound.
- The photosensitive resin composition for an insulating film of a display device may further include a phenol compound.
- According to another embodiment of the present invention, provided is an insulating film of a display device manufactured using the photosensitive resin composition for an insulating film of a display device.
- According to yet another embodiment of the present invention, a display device including the insulating film of a display device is provided.
- The photosensitive resin composition for an insulating film of a display device and an insulating film of a display device formed of the photosensitive resin composition and a display device fabricated using the same may have an improved film residue ratio, sensitivity, and/or a dielectric constant but a low residue occurrence rate in an exposed part.
-
FIG. 1 shows the ultraviolet (UV) absorption spectrum of an ultraviolet (UV) absorber according to one embodiment of the present invention. - The present invention will be described more fully hereinafter in the following detailed description of the invention, in which some but not all embodiments of the invention are described. Indeed, this invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will satisfy applicable legal requirements.
- As used herein, when a specific definition is not otherwise provided, the term “substituted” refers to one substituted with at least a substituent including halogen (—F, —Cl, —Br or —I), a hydroxy group, a nitro group, a cyano group, an amino group (NH2, NH(R200) or N(R201)(R202), wherein R200, R201 and R202 are the same or different and are each independently C1 to C10 alkyl), an amidino group, a hydrazine group, a hydrazine group, a carboxyl group, substituted or unsubstituted alkyl, substituted or unsubstituted alkenyl, substituted or unsubstituted alkynyl, a substituted or unsubstituted alicyclic organic group, substituted or unsubstituted aryl, a substituted or unsubstituted heterocyclic group, or a combination thereof.
- As used herein, when a specific definition is not otherwise provided, the term “alkyl” refers to C1 to C30 alkyl, for example C1 to C15 alkyl, the term “cycloalkyl” refers to C3 to C30 cycloalkyl, for example C3 to C18 cycloalkyl, the term “alkoxy” refers to C1 to C30 alkoxy, for example C1 to C18 alkoxy, the term “aryl” refers to C6 to C30 aryl, for example C6 to C18 aryl, the term “alkenyl” refers to C2 to C30 alkenyl, for example C2 to C18 alkenyl, the term “alkylene” refers to C1 to C30 alkylene, for example C1 to C18 alkylene, and the term “arylene” refers to C6 to C30 arylene, for example C6 to C16 arylene.
- As used herein, when a specific definition is not otherwise provided, the term “aliphatic organic group” refers to C1 to C30 alkyl, C2 to C30 alkenyl, C2 to C30 alkynyl, C1 to C30 alkylene, C2 to C30 alkenylene, or C2 to C30 alkynylene, for example C1 to C15 alkyl, C2 to C15 alkenyl, C2 to C15 alkynyl, C1 to C15 alkylene, C2 to C15 alkenylene, or C2 to C15 alkynylene, the term “alicyclic organic group” refers to C3 to C30 cycloalkyl, C3 to C30 cycloalkenyl, C3 to C30 cycloalkynyl, C3 to C30 cycloalkylene, C3 to C30 cycloalkenylene, or C3 to C30 cycloalkynylene, for example C3 to C15 cycloalkyl, C3 to C15 cycloalkenyl, C3 to C15 cycloalkynyl, C3 to C15 cycloalkylene, C3 to C15 cycloalkenylene, or C3 to C15 cycloalkynylene, the term “aromatic organic group” refers to C6 to C30 aryl or C6 to C30 arylene, for example C6 to C16 aryl or C6 to C16 arylene, the term “heterocyclic group” refers to C2 to C30 heterocycloalkyl, C2 to C30 heterocycloalkylene, C2 to C30 heterocycloalkenyl, C2 to C30 heterocycloalkenylene, C2 to C30 heterocycloalkynyl, C2 to C30 heterocycloalkynylene, C2 to C30 heteroaryl, or C2 to C30 heteroarylene that includes 1 to 3 hetero atoms including O, S, N, P, Si, or a combination thereof in a ring, for example C2 to C15 heterocycloalkyl, C2 to C15 heterocycloalkylene, C2 to C15 heterocycloalkenyl, C2 to C15 heterocycloalkenylene, C2 to C15 heterocycloalkynyl, C2 to C15 heterocycloalkynylene, C2 to C15 heteroaryl, or C2 to C15 heteroarylene that include 1 to 3 hetero atoms including O, S, N, P, Si, or a combination thereof in a ring.
- One embodiment of the present invention provides a photosensitive resin composition for an insulating film of a display device that includes (A) an alkali soluble resin including a polybenzoxazole precursor, polyamic acid, polyimide, or a combination thereof; (B) a photosensitive diazoquinone compound; (C) an ultraviolet (UV) absorber having maximum absorption wavelength of about 300 to about 400 nm; and (D) a solvent.
- The photosensitive resin composition for an insulating film of a display device may be a positive photosensitive resin composition.
- Hereinafter, each component of the photosensitive resin composition for an insulating film of a display device is described.
- The alkali soluble resin (A) may be any generally-used alkali soluble resin in the art of the present invention without limitation. Examples of, the alkali soluble resin may include without limitation polybenzoxazole precursors including a repeating unit represented by the following Chemical Formula 1, polyamic acids including a repeating unit represented by the following Chemical Formula 2, polyimides including a repeating unit represented by the following Chemical Formula 3, and the like, and combinations thereof.
- Polybenzoxazole Precursor
- In
Chemical Formula 1, X1 is a substituted or unsubstituted C6 to C30 aromatic organic group, and Y1 is a substituted or unsubstituted C6 to C30 aromatic organic group, a substituted or unsubstituted divalent to hexavalent C1 to C30 aliphatic organic group, or a substituted or unsubstituted divalent to hexavalent C3 to C30 alicyclic organic group. - In Chemical Formula 1, X1 may be an aromatic organic group which is a residual group derived from aromatic diamine.
- Examples of the aromatic diamine may include without limitation 3,3′-diamino-4,4′-dihydroxybiphenyl, 4,4′-diamino-3,3′-dihydroxybiphenyl, bis(3-amino-4-hydroxyphenyl)propane, bis(4-amino-3-hydroxyphenyl)propane, bis(3-amino-4-hydroxyphenyl)sulfone, bis(4-amino-3-hydroxyphenyl)sulfone, 2,2-bis(3-amino-4-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropane, 2,2-bis(4-amino-3-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropane, 2,2-bis(3-amino-4-hydroxy-5-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(3-amino-4-hydroxy-6-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(3-amino-4-hydroxy-2-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(4-amino-3-hydroxy-5-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(4-amino-3-hydroxy-6-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(4-amino-3-hydroxy-2-trifluoromethylphenyl)hexafluoropropane, 2,2-bis(3-amino-4-hydroxy-5-pentafluoroethylphenyl)hexafluoropropane, 2-(3-amino-4-hydroxy-5-trifluoromethylphenyl)-2-(3-amino-4-hydroxy-5-pentafluoroethylphenyl)hexafluoropropane, 2-(3-amino-4-hydroxy-5-trifluoromethylphenyl)-2-(3-hydroxy-4-amino-5-trifluoromethylphenyl)hexafluoropropane, 2-(3-amino-4-hydroxy-5-trifluoromethylphenyl)-2-(3-hydroxy-4-amino-6-trifluoromethylphenyl)hexafluoropropane, 2-(3-amino-4-hydroxy-5-trifluoromethylphenyl)-2-(3-hydroxy-4-amino-2-trifluoromethylphenyl)hexafluoropropane, 2-(3-amino-4-hydroxy-2-trifluoromethylphenyl)-2-(3-hydroxy-4-amino-5-trifluoromethylphenyl)hexafluoropropane, 2-(3-amino-4-hydroxy-6-trifluoromethylphenyl)-2-(3-hydroxy-4-amino-5-trifluoromethylphenyl)hexafluoropropane, and the like, and combinations thereof.
- In Chemical Formula 1, Y1 is an aromatic organic group, divalent to hexavalent aliphatic organic group, or divalent to hexavalent alicyclic organic group, and may be a residual group of dicarboxylic acid or a residual group of a dicarboxylic acid derivative. For example, Y1 may be an aromatic organic group or a divalent to hexavalent alicyclic organic group.
- Examples of the dicarboxylic acid include may include without limitation Y1(COOH)2 (wherein Y1 is the same as Y1 of the above Chemical Formula 1).
- Examples of the carboxylic acid derivative may include without limitation carbonyl halide derivatives of the dicarboxylic acid derivative or active compounds of an active ester derivative obtained by reacting Y1(COOH)2 with 1-hydroxy-1,2,3-benzotriazole (wherein Y1 is the same as Y1 of the above Chemical Formula 1).
- Examples of the dicarboxylic acid derivative may include without limitation 4,4′-oxydibenzoyl chloride, diphenyloxydicarbonyl dichloride, bis(phenylcarbonylchloride)sulfone, bis(phenylcarbonylchloride)ether, bis(phenylcarbonylchloride)phenone, phthaloyl dichloride, terephthaloyl dichloride, isophthaloyl dichloride, dicarbonyldichloride, diphenyloxydicarboxylate dibenzotriazole, and the like, and combinations thereof.
- The polybenzoxazole precursor may have a thermally polymerizable functional group derived from a reactive end-capping monomer, at one terminal end or both terminal ends of the branch. Examples of the reactive end-capping monomer may include without limitation monoamines, monoanhydrides, and the like, and combinations thereof having a carbon-carbon double bond.
- Examples of the monoamines may include without limitation toluidine, dimethylaniline, ethylaniline, aminophenol, aminobenzylalcohol, aminoindan, aminoacetonephenone, and the like, and combinations thereof.
- Polyamic Acid and Polyimide
- In
Chemical Formulae 2 and 3, X2 and X3 are the same or different and are each independently a substituted or unsubstituted C6 to C30 aromatic organic group, substituted or unsubstituted divalent to hexavalent C1 to C30 aliphatic organic group, substituted or unsubstituted divalent to hexavalent C3 to C30 alicyclic organic group, or an organic silane group. - In the
above Chemical Formulae 2 and 3, X2 and X3 the same or different and each can be independently a residual group derived from aromatic diamine, alicyclic diamine, and/or silicon diamine. The aromatic diamine, alicyclic diamine, and silicon diamine may be used singularly or as a mixture of one or more. - Examples of the aromatic diamine may include without limitation 3,4′-diaminodiphenylether, 4,4′-diaminodiphenylether, 3,4′-diaminodiphenylmethane, 4,4′-diaminodiphenylmethane, 4,4′-diaminodiphenylsulfone, 4,4′-diaminodiphenylsulfide, benzidine, m-phenylenediamine, p-phenylenediamine, 1,5-naphthalenediamine, 2,6-naphthalenediamine, bis[4-(4-aminophenoxy)phenyl]sulfone, bis(3-aminophenoxyphenyl)sulfone, bis(4-aminophenoxy)biphenyl, bis[4-(4-aminophenoxy)phenyl]ether, 1,4-bis(4-aminophenoxy)benzene, the forgoing compounds including an aromatic ring substituted with an alkyl group or a halogen, and the like, and combinations thereof.
- Examples of the alicyclic diamine may include without
limitation 1,2-cyclohexyl diamine, 1,3-cyclohexyl diamine, and the like, and combinations thereof. - Examples of the silicon diamine may include without limitation bis(4-aminophenyl)dimethylsilane, bis(4-aminophenyl)tetramethylsiloxane, bis(p-aminophenyl)tetramethyldisiloxane, bis(γ-aminopropyl)tetramethyldisiloxane, 1,4-bis(γ-aminopropyldimethylsilyl)benzene, bis(4-aminobutyl)tetramethyldisiloxane, bis(γ-aminopropyl)tetraphenyldisiloxane, 1,3-bis(aminopropyl)tetramethyldisiloxane, and the like, and combinations thereof.
- In the
above Chemical Formulae 2 and 3, Y2 and Y3 are the same or different and are each independently a substituted or unsubstituted C6 to C30 aromatic organic group, substituted or unsubstituted tetravalent to hexavalent C1 to C30 aliphatic organic group, or substituted or unsubstituted tetravalent to hexavalent C3 to C30 alicyclic organic group. - The Y2 and Y3 may be independently residual groups derived from aromatic acid dianhydride or alicyclic acid dianhydride. The aromatic acid dianhydride and the alicyclic acid dianhydride may be used singularly or as a mixture of more than one.
- Examples of the aromatic acid dianhydride may include without limitation benzophenone tetracarboxylic dianhydrides such as pyromellitic dianhydride; benzophenone-3,3′,4,4′-tetracarboxylic dianhydride, and the like; oxydiphthalic dianhydrides such as 4,4′-oxydiphthalic dianhydride; biphthalic dianhydride such as 3,3′,4,4′-biphthalic dianhydride; (hexafluoroisopropyledene)diphthalic dianhydrides such as 4,4′-(hexafluoroisopropyledene)diphthalic dianhydride; naphthalene-1,4,5,8-tetracarboxylic dianhydride; 3,4,9,10-perylenetetracarboxylic dianhydride, and the like, and combinations thereof.
- Examples of the alicyclic acid dianhydride may include without
1,2,3,4-cyclobutanetetracarboxylic dianhydride, 1,2,3,4-cyclopentanetetracarboxylic dianhydride, 5-(2,5-dioxotetrahydrofuryl)-3-methyl-cyclohexane-1,2-dicarboxylic anhydride, 4-(2,5-dioxotetrahydrofuran-3-yl)-tetralin-1,2-dicarboxylic anhydride, bicyclooctene-2,3,5,6-tetracarboxylic dianhydride, bicyclooctene-1,2,4,5-tetracarboxylic dianhydride, and the like, and combinations thereof.limitation - The alkali soluble resin may have a weight average molecular weight (Mw) of about 5,000 to about 20,000 g/mol, for example about 6,000 to about 10,000 g/mol. Within the above weight average molecular weight (Mw), the alkali soluble resin may exhibit sufficient film residue ratios of non-exposed parts during development using an alkali aqueous solution, and patterning may be performed efficiently.
- The photosensitive diazoquinone compound may be a compound having a 1,2-benzoquinone diazide structure and/or 1,2-naphthoquinone diazide structure.
- The photosensitive diazoquinone compound may include at least one compound represented by the following Chemical Formulae 4, and 6 to 8, and combinations thereof, but is not limited thereto.
- In Chemical Formula 4, R60 to R62 are the same or different and are each independently hydrogen or substituted or unsubstituted C1 to C30 alkyl, for example methyl.
- In Chemical Formula 4, R63 to R65 are the same or different and are each independently OQ, wherein Q is hydrogen, a functional group represented by the following Chemical Formula 5a or a functional group represented by the following Chemical Formula 5b, provided that all Qs are not simultaneously hydrogen
- In Chemical Formula 4, n20 to n22 may be the same or different and are each independently integers of 0 to 5.
- In Chemical Formula 6, R66 is hydrogen or substituted or unsubstituted C1 to C30 alkyl, R67 to R69 are the same or different and are each independently OQ, wherein Q is the same as defined in the above, and n23 to n25 are the same or different and are each independently integers of 0 to 5.
- In Chemical Formula 7, A3 is CO or CR74R75, wherein R74 and R75 are the same or different and are each independently substituted or unsubstituted C1 to C30 alkyl.
- In Chemical Formula 7, R70 to R73 are the same or different and are each independently hydrogen, substituted or unsubstituted C1 to C30 alkyl, OQ, or NHQ, wherein Q is the same as defined in the above.
- In Chemical Formula 7, n26 to n29 are the same or different and are each integers ranging from 0 to 4, and each n26+n27 and n28+n29 is an integer of less than or equal to 5.
- At least one of R70 and R71 is OQ, and one aromatic ring includes one to three OQs and the other aromatic ring includes one to four OQs.
- In Chemical Formula 8,
- R74 to R81 are the same or different and are each independently hydrogen or substituted or unsubstituted C1 to C30 alkyl, n30 and n31 are the same or different and are each an integer of 1 to 5, and Q is the same as defined above.
- The photosensitive resin composition may include the photosensitive diazoquinone compound in an amount of about 5 to about 100 parts by weight, for example about 10 to about 50 parts by weight, based on about 100 parts by weight of the alkali soluble resin (A). In some embodiments, the photosensitive resin composition may include the photosensitive diazoquinone compound in an amount of about 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60, 61, 62, 63, 64, 65, 66, 67, 68, 69, 70, 71, 72, 73, 74, 75, 76, 77, 78, 79, 80, 81, 82, 83, 84, 85, 86, 87, 88, 89, 90, 91, 92, 93, 94, 95, 96, 97, 98, 99 or 100 parts by weight. Further, according to some embodiments of the present invention, the amount of the photosensitive diazoquinone compound can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- When the photosensitive resin composition includes the photosensitive diazoquinone compound in an amount within the above range, the pattern can be well-formed with minimal or no residue from exposure, and film thickness loss during development may be minimized or prevented and thereby a good pattern can be provided.
- The photosensitive resin composition for an insulating film of a display device according to one embodiment includes an ultraviolet (UV) absorber (C) having a maximum absorption wavelength ranging from about 300 to about 400 nm, for example about 350 to about 380 nm. Specifically, the ultraviolet (UV) absorber may be an i-line absorber. The i-line absorber has a maximum absorption wavelength of about 365 nm.
- The ultraviolet (UV) absorber absorbing a light within the above wavelength range may effectively regulate developability (a development rate) balance of the photosensitive resin composition for an insulating film of a display device and sensitivity.
- Examples of the ultraviolet (UV) absorber (C) may include without limitation benzophenone-based compounds, acetophenone-based compounds, thioxanthone-based compounds, benzoin-based compounds, triazine-based compounds, oxime-based compounds, and the like, and combinations thereof. Among the compounds, a compound having a maximum absorption wavelength ranging from about 300 to about 400 nm may be appropriately selected.
- Examples of the benzophenone-based compound may include without limitation benzophenone, benzoyl benzoate, benzoyl methyl benzoate, 4-phenyl benzophenone, hydroxy benzophenone, acrylated benzophenone, 4,4′-bis(dimethyl amino)benzophenone, 4,4′-bis(diethylamino)benzophenone, 4,4′-dimethylaminobenzophenone, 4,4′-dichlorobenzophenone, 3,3′-dimethyl-2-methoxybenzophenone, and the like, and combinations thereof.
- Examples of the acetophenone-based compound may include without
2,2′-diethoxyacetophenone, 2,2′-dibutoxyacetophenone, 2-hydroxy-2-methylpropinophenone, p-t-butyltrichloroacetophenone, p-t-butyldichloroacetophenone, 4-chloroacetophenone, 2,2′-dichloro-4-phenoxyacetophenone, 2-methyl-1-(4-(methylthio)phenyl)-2-morpholinopropan-1-one, 2-benzyl-2-dimethylamino-1-(4-morpholinophenyl)-butan-1-one, and the like, and combinations thereof.limitation - Examples of the thioxanthone-based compound may include without limitation thioxanthone, 2-methylthioxanthone, isopropyl thioxanthone, 2,4-diethyl thioxanthone, 2,4-diisopropyl thioxanthone, 2-chlorothioxanthone, and the like, and combinations thereof.
- Examples of the benzoin-based compound may include without limitation benzoin, benzoin methyl ether, benzoin ethyl ether, benzoin isopropyl ether, benzoin isobutyl ether, benzyldimethylketal, and the like, and combinations thereof.
- Examples of the triazine-based compound may include without
limitation 2,4,6-trichloro-s-triazine, 2-phenyl 4,6-bis(trichloromethyl)-s-triazine, 2-(3′,4′-dimethoxystyryl)-4,6-bis(trichloromethyl)-s-triazine, 2-(4′-methoxynaphthyl)-4,6-bis(trichloromethyl)-s-triazine, 2-(p-methoxyphenyl)-4,6-bis(trichloromethyl)-s-triazine, 2-(p-tolyl)-4,6-bis(trichloro methyl)-s-triazine, 2-biphenyl 4,6-bis(trichloro methyl)-s-triazine, bis(trichloromethyl)-6-styryl-s-triazine, 2-(naphto-1-yl)-4,6-bis(trichloromethyl)-s-triazine, 2-(4-methoxynaphto-1-yl)-4,6-bis(trichloromethyl)-s-triazine, 2-4-tri chloromethyl(piperonyl)-6-triazine, 2-4-trichloromethyl (4′-methoxystyryl)-6-triazine, and the like, and combinations thereof. - Examples of the oxime-based compound may include without limitation 2-(o-benzoyloxime)-[[4-(phenylthio)phenyl]-1,2-octandione, 1-(o-acetyloxime)-1-[9-ethyl-6-(2-methylbenzoyl)-9H-carbazol-3-yl]ethanone, and the like, and combinations thereof.
- Among the aforementioned ultraviolet (UV) absorbers, a compound having a maximum absorption wavelength ranging from about 300 to about 400 nm may be appropriately selected.
- In addition to, or other than the ultraviolet (UV) absorbers, a carbazole-based compound, a diketone compound, a sulfonium borate-based compound, a diazo-based compound, a biimidazole-based compound, and the like, and combinations thereof, may be used as the ultraviolet (UV) absorber, if these compounds have a maximum absorption wavelength ranging from about 300 to about 400 nm.
- In the present invention, the ultraviolet (UV) absorber may be an intermolecular hydrogen abstraction type. The ultraviolet (UV) absorber in a triplet state is combined with a hydrogen donor and forms a complex, in which a hydrogen atom moves to an ultraviolet (UV) absorber molecule and forms a radical.
- The photosensitive resin composition may include the ultraviolet (UV) absorber in an amount of about 0.1 to about 5 parts by weight, for example about 1 to about 3 parts by weight, based on about 100 parts by weight of the alkali soluble resin. In some embodiments, the photosensitive resin composition may include the ultraviolet (UV) absorber in an amount of about 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9, 1, 2, 3, 4, or 5 parts by weight. Further, according to some embodiments of the present invention, the amount of the ultraviolet (UV) absorber can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- When the photosensitive resin composition includes the ultraviolet (UV) absorber in an amount within the above range, the ultraviolet (UV) absorber may easily regulate development rate balance of the photosensitive resin composition for an insulating film of a display device and effectively adjust sensitivity.
- The photosensitive resin composition for an insulating film of a display device may include a solvent that is capable of easily dissolving each component.
- Examples of the solvent may include without limitation N-methyl-2-pyrrolidone, γ-butyrolactone, N,N-dimethylacetamide, dimethylsulfoxide, diethyleneglycoldimethylether, diethylene glycoldiethylether, diethyleneglycoldibutylether, propyleneglycolmonomethylether, dipropyleneglycolmonomethylether, propyleneglycolmonomethyletheracetate, methyl lactate, ethyl lactate, butyl lactate, methyl-1,3-butyleneglycolacetate, 1,3-butyleneglycol-3-monomethylether, methyl pyruvate, ethyl pyruvate, methyl-3-methoxy propionate, and the like. The solvent may be used singularly or as a mixture of two or more.
- The solvent may be used in an amount of about 100 to about 900 parts by weight, for example about 200 to about 700 parts by weight, based on about 100 parts by weight of the alkali soluble resin. When the photosensitive resin composition includes the solvent in an amount within the above range, a sufficiently thick film can be obtained, and good solubility and coating properties may be provided.
- In one embodiment, the solvent may be used so that a solid content of the photosensitive resin composition for an insulating film of a display device is about 3 to 50 wt %, for example about 5 to about 30 wt %.
- The photosensitive resin composition for an insulating film of a display device may further include a silane compound. The silane compound can improve adherence between the photosensitive resin composition for an insulating film of a display device and a substrate.
- The silane compound may include a silane compound having a carbon-carbon unsaturated bond such as but not limited to compounds represented by the following Chemical Formulae 9 to 11; vinyltrimethoxysilane, vinyltriethoxysilane, vinyltrichlorosilane, vinyltris(β-methoxyethoxy)silane; 2-(3,4 epoxycyclohexyl)-ethyltrimethoxysilane, 3-methacryloxypropyltrimethoxysilane, 3-acryloxypropyltrimethoxysilane, p-styryltrimethoxysilane, 3-methacryloxypropylmethyldimethoxysilane, 3-methacryloxypropylmethyldiethoxysilane; trimethoxy[3-(phenylamino)propyl]silane, and the like, and combinations thereof.
- In Chemical Formula 9, R20 is a vinyl group, substituted or unsubstituted alkyl, or substituted or unsubstituted aryl, for example 3-(meth)cryloxypropyl, p-styryl or 3-(phenylamino)propyl.
- In Chemical Formula 9, R21 to R23 are the same or different and are each independently substituted or unsubstituted alkoxy, substituted or unsubstituted alkyl, or halogen, wherein at least one of R21 to R23 is alkoxy or halogen, and the alkoxy group may be C1 to C8 alkoxy, and the alkyl may be C1 to C20 alkyl.
- In Chemical Formula 10, each R24 is independently —NH2 or —CH3CONH, R25 to R27 are the same or different and are each independently substituted or unsubstituted C1 to C20 alkoxy, wherein the alkoxy may be OCH3 or OCH2CH3, and n34 is an integer of 1 to 5.
- In Chemical Formula 11, R28 to R31 are the same or different and are each independently substituted or unsubstituted C1 to C20 alkyl or substituted or unsubstituted C1 to C20 alkoxy, for example CH3 or OCH3.
- In Chemical Formula 11, R32 and R33 are the same or different and are each independently substituted or unsubstituted amino, for example NH2 or CH3CONH. n35 and n36 are the same or different and are each independently an integer ranging from 1 to 5.
- The photosensitive resin composition may include the silane compound in an amount of about 0.1 parts by weight to about 30 parts, for example about 0.5 to about 10 parts by weight, based on about 100 parts by weight of the alkali soluble resin. In some embodiments, the photosensitive resin composition may include the silane compound in an amount of about 0.1, 0.2, 0.3, 0.4, 0.5, 0.6, 0.7, 0.8, 0.9, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, or 30 parts by weight. Further, according to some embodiments of the present invention, the amount of the silane compound can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- When the silane compound is included in an amount within the above range, adherence between lower and upper layers can be sufficiently improved, residual film may not remain after development, and/or optical properties such as transmittance and mechanical properties such as tensile strength, elongation, and the like may be improved.
- The photosensitive resin composition for an insulating film of a display device may further include a phenol compound. The phenol compound can play a role of increasing dissolution rate and sensitivity of an exposed part and forming a pattern with a high resolution with minimal or no residue during the development using an alkali aqueous solution when the photosensitive resin composition is used to form the pattern.
- The phenol compound may include a compound represented by the following Chemical Formulae 12 to 18, or a combination thereof, but is not limited thereto.
- In Chemical Formula 12,
- R82 to R87 are the same or different and are each independently hydrogen, hydroxyl (OH), C1 to C8 substituted or unsubstituted alkyl, C1 to C8 alkoxyalkyl or —OCO—R88, wherein R88 is C1 to C8 substituted or unsubstituted alkyl, at least one of R82 to R87 is hydroxyl, and all R82 to R87 are not hydroxyl.
- In Chemical Formula 13,
- R99 to R101 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, R102 to R106 are the same or different and are each independently H, OH, or C1 to C8 substituted or unsubstituted alkyl, for example the alkyl may be CH3, and n68 is an integer ranging from 1 to 5.
- In Chemical Formula 14,
- R107 to R112 are the same or different and are each independently H, OH, or C1 to C8 substituted or unsubstituted alkyl, A3 is CR205R206 or a single bond, wherein R205 and R206 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, for example CH3, and n69+n70+n71 and n72+n73+n74 are the same or different and are each independently integers of less than or equal to 5.
- In Chemical Formula 15,
- R113 to R115 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, n75, n76 and n79 are the same or different and are each independently integers ranging from 1 to 5, and n77 and n78 are the same or different and are each independently integers ranging from 0 to 4.
- In Chemical Formula 16,
- R116 to R121 are the same or different and are each independently hydrogen, OH, or C1 to C8 substituted or unsubstituted alkyl, and n80 to n83 are the same or different and are each independently integers ranging from 1 to 4. n80+n82 and n81+n83 are the same or different and are each independently integers of less than or equal to 5.
- In Chemical Formula 17,
- R122 is C1 to C8 substituted or unsubstituted alkyl, for example CH3, R123 to R125 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, n84, n86 and n88 are the same or different and are each independently integers of 1 to 5, and n85, n87 and n89 are the same or different and are each independently integers ranging from 0 to 4. n84+n85, n86+n87 and n88+n89 are the same or different and are each independently integers of less than or equal to 5.
- In Chemical Formula 18,
- R126 to R128 are the same or different and are each independently C1 to C8 substituted or unsubstituted alkyl, for example CH3, R129 to R132 are the same or different and are each independently hydrogen or C1 to C8 substituted or unsubstituted alkyl, n90, n92 and n94 are the same or different and are each independently integers ranging from 1 to 5, n91, n93 and n95 are the same or different and are each independently integers ranging from 0 to 4, and n96 is an integer ranging from 1 to 4. n90+n91, n92+n93 and n94+n95 are the same or different and are each independently integers of less than or equal to 5.
- Examples of the phenol compound may include without
limitation 2,6-dimethoxymethyl-4-t-butylphenol, 2,6-dimethoxymethyl-p-cresol, 2,6-diacetoxymethyl-p-cresol, and the like, and combinations thereof. - The photosensitive resin composition may include the phenol compound in an amount of about 1 to about 30 parts by weight based on about 100 parts by weight of the alkali soluble resin. In some embodiments, the photosensitive resin composition may include the phenol compound in an amount of about 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, or 30 parts by weight. Further, according to some embodiments of the present invention, the amount of the phenol compound can be in a range from about any of the foregoing amounts to about any other of the foregoing amounts.
- When the photosensitive resin composition includes the phenol compound in an amount within the above range, the photosensitive resin composition may not deteriorate sensitivity but appropriately increase dissolution rate of a non-exposed part during the development, resultantly obtaining a good pattern. In addition, when the phenol compound is not extracted during the storage in a freezer, excellent storage stability may be accomplished.
- The photosensitive resin composition for an insulating film of a display device according to one embodiment may further include one or more other additives.
- The photosensitive resin composition for an insulating film of a display device may include an additive such as malonic acid; 3-amino-1,2-propanediol; and/or a silane coupling agent having a vinyl group or a (meth)acryloxy group in order to prevent staining of the film during coating, leveling improvement, or residues production due to non-development. The amount of the additive(s) may be controlled depending on desired properties and can be readily determined by the skilled artisan without undue experimentation.
- The photosensitive resin composition for an insulating film of a display device may further include an additive of an epoxy compound in order to improve adherence with a substrate. Examples of the epoxy compound may include without limitation epoxy novolac acryl carboxylate resins, ortho cresol novolac epoxy resins, phenol novolac epoxy resins, tetramethyl biphenyl epoxy resins, bisphenol A epoxy resins, alicyclic epoxy resins, and the like, and combinations thereof.
- When the epoxy compound is further used, a radical polymerization initiator such as a peroxide initiator or an azobis-based initiator may be further used.
- The photosensitive resin composition may include the epoxy compound in an amount of about 0.01 to about 5 parts by weight based on about 100 parts by weight of the photosensitive resin composition for an insulating film of a display device. When the photosensitive resin composition includes the epoxy compound in an amount within the above range, storage and adherence and other characteristics may be improved economically.
- The photosensitive resin composition may also include a latent thermal acid generator. The latent thermal acid generator is a catalyst for a dehydration reaction and a cyclization reaction of the polybenzoxazole precursor that is polyamide including a phenolic hydroxy group, and thus a cyclization reaction may be performed smoothly even if curing temperature is decreased.
- Examples of the latent thermal acid generator may include without limitation aryl sulfonic acids such as p-toluene sulfonic acid, benzene sulfonic acid, and the like; perfluoroalkyl sulfonic acids such as trifluoromethane sulfonic acid, trifluorobutane sulfonic acid, and the like; alkyl sulfonic acids such as methane sulfonic acid, ethane sulfonic acid, butane sulfonic acid, and the like; and combinations thereof.
- In addition, an additive such as a suitable surfactant and/or leveling agent may be included in order to prevent staining of the film or to improve development.
- A method of preparing the photosensitive resin composition for an insulating film of a display device is not particularly limited. The photosensitive resin composition may be prepared by mixing the alkali soluble resin (A), the photosensitive diazoquinone compound (B), the UV absorber (C), solvent, and optionally the additive(s) to prepare a photosensitive resin composition for an insulating film of a display device.
- According to another embodiment, an insulating film of a display device manufactured using the photosensitive resin composition for an insulating film of a display device is provided.
- The insulating film of a display device may be formed according to the following method. The photosensitive resin composition can be coated on the surface of a substrate using a spraying method, a roll coater method, a spinning coating method, or the like. The coated substrate can be pre-baked and solvent removed to form a coating film. The pre-baking step can be performed at a temperature ranging from about 70 to about 120° C. for about 1 to about 5 minutes. Then, the pre-baked coating film can be radiated by a visible ray, ultraviolet (UV), far ultraviolet (UV), an electron beam, far ultraviolet (UV), an x-ray, and the like according to a predetermined pattern and then, developed to remove an unnecessary part, obtaining the predetermined pattern. As used herein, the development solution may include an alkali aqueous solution. Examples of the development solution can include without limitation inorganic alkalis such as sodium hydroxide, potassium hydroxide, sodium carbonate, and the like; primary amines such as ethylamine, n-propylamine, and the like; secondary amines such as diethylamine, and the like; tertiary amines such as trimethylamine, methyldiethylamine, dimethylethylamine, triethylamine, and the like; alcohol amines such as dimethylethanolamine, methyl diethanolamine, triethanolamine, and the like; a quaternary ammonium salt aqueous solutions such as tetramethylammonium hydroxide, tetraethylammonium hydroxide, and the like; and mixtures thereof. The development solution can include an alkali compound in a concentration of about 0.1 to about 10%. In addition, a water-soluble organic solvent such as methanol ethanol and the like and/or a surfactant along with the solvent may be used in an appropriate amount.
- Accordingly, the insulating film can be developed with the development solution and then, washed with ultra-pure water for about 30 to about 140 seconds to remove an unnecessary part and dried to obtain a pattern. The pattern can be radiated by a light such as ultraviolet (UV) and the like and heated at a temperature ranging from about 110 to about 250° C. for about 30 to about 120 minutes in an oven and the like, obtaining a final pattern.
- According to another embodiment, a display device including the insulating film is provided. Examples of the display device may include without limitation liquid crystal displays, light emitting diodes, plasma displays, organic light emitting diodes (OLED), and the like.
- The following examples illustrate the present invention in more detail. However, it is understood that the present invention is not limited by these examples.
- 41.1 g of 2,6-bis[[[5-[1-(amino-4-hydroxyphenyl)-2,2,2-trifluoro-1-(trifluoromethyl)ethyl]-2-hydroxyphenyl]amino]methyl]-4-methylphenol is dissolved in 280 g of N-methyl-2-pyrrolidone (NMP) in a 4-necked flask equipped with an agitator, a thermometer, a nitrogen gas injector, and a cooler, while nitrogen gas is passed therethrough.
- When the solid is completely dissolved, 9.9 g of pyridine is added to the solution, and another solution prepared by dissolving 13.3 g of 4,4′-oxydibenzoylchloride in 142 g of N-methyl-2-pyrrolidone (NMP) is slowly added thereto in a dropwise fashion for 30 minutes, while the temperature is maintained at 0 to 5° C. The mixture is reacted for 1 hour at the temperature ranging from 0 to 5° C. Then, the temperature is increased up to room temperature, and the reactant is agitated for one hour.
- Then, 1.6 g of 5-norbornene-2,3-dicarboxyl anhydride is added to the agitated reactant at 70° C. for 24 hours, terminating the reaction.
- The reaction mixture is added to a solution prepared by mixing water/methanol in a volume ratio of 10/1 to produce a precipitate. The precipitate is filtered, sufficiently washed with water, and vacuum-dried at 80° C. for greater than or equal to 24 hours, obtaining a polybenzoxazole precursor having a weight average molecular weight of 9,500.
- Hereinafter, the following components are used in Examples.
- The polybenzoxazole precursor prepared according to Synthesis Example 1
- The photosensitive diazoquinone represented by the following Chemical Formula 19
- In the above Chemical Formula 19, two of three Q's are substituted with the following Chemical Formula 20, and the last one Q is substituted with hydrogen.
-
-
-
FIG. 1 shows the ultraviolet (UV) absorption spectra of the ultraviolet (UV) absorbers C-1 and C-2. Referring toFIG. 1 , the ultraviolet (UV) absorber had a maximum absorption wavelength of 365 nm. - Trimethoxy[3-(phenylamino)propyl]silane represented by the following Chemical Formula 23
- A phenol compound represented by the following Chemical Formula 24
- Each photosensitive resin composition for an insulating film of a display device is prepared by mixing the components in the amounts set forth in the following Table 1. Specifically, a photosensitive resin composition for an insulating film of a display device is prepared by dissolving an alkali soluble resin (A) in a solvent (D), adding a photosensitive diazoquinone compound (B), an ultraviolet (UV) absorber (C), a silane compound (E), and a phenol compound (F) thereto, and then, agitating the mixture for 3 hours at room temperature and filtering the agitated reactant with a 0.45 μm fluororesin filter.
-
TABLE 1 Example Example Example Example Example Example Comparative 1 2 3 4 5 6 Example 1 (A) Alkali soluble 100 100 100 100 100 100 100 resin (B) Photosensitive 10 10 10 10 10 10 10 diazoquinone compound (C) Ultra- C-1 1 2 3 — — — — violet (UV) C-2 — — — 1 2 3 — absorber (D) Solvent D-1 100 100 100 100 100 100 100 D-2 250 250 250 250 250 250 250 (E) Silane compound 0.2 0.2 0.2 0.2 0.2 0.2 0.2 (F) Phenol compound 7.5 7.5 7.5 7.5 7.5 7.5 7.5 - In Table 1, the units of the amounts of the components (B) to (F) are parts by weight based on 100 parts by weight of the component (A).
- Fabrication of Pattern Film
- The photosensitive resin compositions for an insulating film of a display device according to Examples 1 to 6 and Comparative Example 1 are respectively coated on an ITO glass with a spin coater and heated up to 130° C. for 2 minutes on a hot plate, forming coating films. Next, the coating films are exposed to a light using a predetermined pattern mask and an exposure equipment (1-line stepper, NSR i10C, Nikon Inc.) The exposed part is dissolved and removed in a 2.38% tetramethyl ammonium hydroxide aqueous solution at temperature for 40 seconds through 2 puddles, and the resultant is washed with distilled water for 30 seconds. Then, the obtained patterns are cured at 250° C. for 60 minutes under an oxygen concentration of less than or equal to 1000 ppm, obtaining pattern films.
- The pattern films are evaluated regarding film residue ratio, sensitivity, residue, and dielectric constant according to the following method. The results are provided in the following Table 2.
- The pre-baked films are developed in a 2.38% tetramethyl ammonium hydroxide (TMAH) aqueous solution at 23° C. for 60 seconds, washed with ultra-pure water for 60 seconds, and dried and then measured regarding thickness change using an Alpha step (Tencor Co.) and calculated according to the following
Equation 1. -
Film residue ratio=(thickness after development/initial thickness before development)×100 [Equation 1] - (OO: excellent film residue ratio of greater than or equal to 90%, Δ: medium film residue ratio of 80-90%, X: low film residue ratio of less than or equal to 80%)
- Optimal exposure time of the pattern film is obtained by measuring exposure time taking to form a 10 μm L/S pattern to have a line width of 1:1 after the exposure and development. A minimum pattern dimension in the optimal exposure time is obtained as resolution of the pattern film.
- (OO: excellent sensitivity of less than or equal to 50 mJ/cm2, Δ: medium sensitivity of 50-200 mJ/cm2, X: low sensitivity of greater than or equal to 200 mJ/cm2)
- Residue of the pattern formed by using the photosensitive resin composition is obtained using an optical microscope and CD-SEM.
- (Occurrence: high residue, medium occurrence: medium residue, no occurrence: no residue)
- The resin composition is coated on an ITO glass and treated at 130° C. for 2 minutes on a hot plate, forming a 2.0-2.5 μm-thick coating film. Next, a metal electrode (Au) having a diameter of 300 μm is deposited on the coating film. Then, a dielectric constant is calculated by measuring capacitance with a precision impedance analyzer (HP 4294A) and using the
following equation 2. -
C=∈ 0 ×∈×A/d [Equation 2] - In the
equation 2, C denotes capacitance, ∈0 denotes a dielectric constant under vacuum, ∈ denotes a non-dielectric ratio, A denotes an electrode area, and d denotes thickness of a photosensitive resin composition. - (O: dielectric constant of less than or equal to 5.5, X: dielectric constant of greater than 5.5)
-
TABLE 2 Film residue ratio Sensitivity Residue Dielectric constant Example 1 ◯ ◯ None ◯ Example 2 ◯ ◯ None ◯ Example 3 ◯ ◯ None ◯ Example 4 ◯ ◯ None ◯ Example 5 ◯ ◯ None ◯ Example 6 ◯ ◯ None ◯ Comparative ◯ Δ Occur ◯ Example 1 - Referring to the evaluation example, the photosensitive resin composition according to the present invention appropriately regulated development rate of an exposed part and realized sensitivity (EOP) where no film residue remained. Accordingly, no residue occurred over the entire region of the exposed part having various film differences.
- As shown in Table 2, the film according to Comparative Example 1 has a severe film residue in the exposed part, while the films according to Examples 1 to 6 maintain excellent film residue ratio and sensitivity of a non-exposed part and an excellent dielectric constant, while the film residue of the exposed part is removed.
- Many modifications and other embodiments of the invention will come to mind to one skilled in the art to which this invention pertains having the benefit of the teachings presented in the foregoing descriptions. Therefore, it is to be understood that the invention is not to be limited to the specific embodiments disclosed and that modifications and other embodiments are intended to be included within the scope of the appended claims. Although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purposes of limitation, the scope of the invention being defined in the claims.
Claims (7)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2012-0157564 | 2012-12-28 | ||
| KR1020120157564A KR20140086724A (en) | 2012-12-28 | 2012-12-28 | Photosensitive resin composition for insulating film of display device, insulating film using the same, and display device using the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| US20140186768A1 true US20140186768A1 (en) | 2014-07-03 |
| US8987342B2 US8987342B2 (en) | 2015-03-24 |
Family
ID=51017566
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US13/962,153 Active US8987342B2 (en) | 2012-12-28 | 2013-08-08 | Photosensitive resin composition for insulating film of display device, insulating film using the same, and display device using the same |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8987342B2 (en) |
| KR (1) | KR20140086724A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170139323A1 (en) * | 2015-11-12 | 2017-05-18 | Samsung Sdi Co., Ltd. | Resin Composition Including Novel Polymer and Organic Film Using the Same |
| US9835944B2 (en) | 2014-12-10 | 2017-12-05 | Goo Chemical Co., Ltd. | Liquid solder resist composition and covered-printed wiring board |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20150049547A (en) * | 2013-10-30 | 2015-05-08 | 제일모직주식회사 | Positive photosensitive resin composition, photosensitive resin film prepared by using the same, and display device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100216070A1 (en) * | 2006-12-04 | 2010-08-26 | Central Glass Co., Ltd. | Photosensitive Polyimides and Methods of Making the Same |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE539175A (en) | 1954-08-20 | |||
| US3669658A (en) | 1969-06-11 | 1972-06-13 | Fuji Photo Film Co Ltd | Photosensitive printing plate |
| EP0264678B1 (en) | 1986-10-02 | 1991-09-18 | Hoechst Celanese Corporation | Polyamides with hexafluoroisopropylidene groups, positively acting photosensitive compositions, and recording materials using them |
| JPH0660140A (en) | 1992-08-06 | 1994-03-04 | Mitsubishi Electric Corp | Semiconductor design verification device |
| JP3207352B2 (en) | 1996-05-13 | 2001-09-10 | 住友ベークライト株式会社 | Positive photosensitive resin composition |
| JP3871767B2 (en) | 1997-05-07 | 2007-01-24 | 旭化成エレクトロニクス株式会社 | Photosensitive composition |
| JP4314335B2 (en) | 1999-04-02 | 2009-08-12 | 旭化成イーマテリアルズ株式会社 | Positive photosensitive resin composition |
| MY151139A (en) * | 2005-11-30 | 2014-04-30 | Sumitomo Bakelite Co | Positive photosensitive resin composition, and simiconductor device and display therewith |
| CN101529334A (en) | 2006-08-21 | 2009-09-09 | Jsr株式会社 | Photosensitive resin composition, photosensitive film, and method for formation of pattern |
| KR20100028102A (en) * | 2007-07-26 | 2010-03-11 | 스미토모 베이클리트 컴퍼니 리미티드 | Positive photosensitive resin composition for spray coating, method for forming cured film using the same, cured film and semiconductor device |
| JP5090833B2 (en) | 2007-09-11 | 2012-12-05 | 東京応化工業株式会社 | Positive photoresist composition and photosensitive film-coated substrate using the same |
| EP2345933A4 (en) * | 2008-10-20 | 2013-01-23 | Sumitomo Bakelite Co | POSITIVE PHOTOSENSITIVE RESIN COMPOSITION FOR SPRAY COATING AND PROCESS FOR PRODUCING THROUGH ELECTRODE USING THE SAME |
| KR101333706B1 (en) | 2008-12-30 | 2013-11-27 | 제일모직주식회사 | Positive type photosensitive resin composition |
| KR101333704B1 (en) | 2009-12-29 | 2013-11-27 | 제일모직주식회사 | Positive type photosensitive resin composition |
| TWI542644B (en) | 2011-02-09 | 2016-07-21 | Sumitomo Chemical Co | Coloring the photosensitive resin composition |
-
2012
- 2012-12-28 KR KR1020120157564A patent/KR20140086724A/en not_active Ceased
-
2013
- 2013-08-08 US US13/962,153 patent/US8987342B2/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100216070A1 (en) * | 2006-12-04 | 2010-08-26 | Central Glass Co., Ltd. | Photosensitive Polyimides and Methods of Making the Same |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9835944B2 (en) | 2014-12-10 | 2017-12-05 | Goo Chemical Co., Ltd. | Liquid solder resist composition and covered-printed wiring board |
| US20170139323A1 (en) * | 2015-11-12 | 2017-05-18 | Samsung Sdi Co., Ltd. | Resin Composition Including Novel Polymer and Organic Film Using the Same |
| US9983476B2 (en) * | 2015-11-12 | 2018-05-29 | Samsung Sdi Co., Ltd. | Resin composition including novel polymer and organic film using the same |
Also Published As
| Publication number | Publication date |
|---|---|
| US8987342B2 (en) | 2015-03-24 |
| KR20140086724A (en) | 2014-07-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8921019B2 (en) | Positive photosensitive resin composition, and photosensitive resin layer and display device using the same | |
| US8198002B2 (en) | Positive photosensitive resin composition | |
| US8815489B2 (en) | Positive photosensitive resin composition, photosensitive resin film prepared by using the same, and semiconductor device including the photosensitive resin film | |
| US9023559B2 (en) | Positive photosensitive resin composition, photosensitive resin film prepared by using the same, and semiconductor device including the photosensitive resin film | |
| KR101400181B1 (en) | Positive photosensitive resin composition, photosensitive resin layer prepared by using the same, and display device including the photosensitive resin layer | |
| US8703367B2 (en) | Positive photosensitive resin composition | |
| US9256118B2 (en) | Positive photosensitive resin composition | |
| US8841064B2 (en) | Positive photosensitive resin composition, photosensitive resin film prepared by using the same, and semiconductor device including the photosensitive resin film | |
| US20150291842A1 (en) | Positive Photosensitive Resin Composition, Photosensitive Resin Film and Display Device Using the Same | |
| US9709710B2 (en) | Device including light blocking layer and method of patterning the light blocking layer | |
| US9268221B2 (en) | Positive photosensitive resin composition, photosensitive resin layer prepared by using the same, and semiconductor device including the photosensitive resin layer | |
| US8501375B2 (en) | Positive photosensitive resin composition | |
| US8987342B2 (en) | Photosensitive resin composition for insulating film of display device, insulating film using the same, and display device using the same | |
| US9482943B2 (en) | Positive photosensitive resin composition, and photosensitive resin film and display device prepared by using the same | |
| US8440734B2 (en) | Positive photosensitive resin composition, cured film, protecting film, insulating film, and semiconductor device and display device using the same | |
| US20150160553A1 (en) | Positive Photosensitive Resin Composition, Photosensitive Resin Film, and Display Device Using the Same | |
| US9040213B2 (en) | Positive photosensitive resin composition, photosensitive resin film prepared by using the same, and semiconductor device including the photosensitive resin film | |
| US8956790B2 (en) | Positive photosensitive resin composition, and organic insulator film for display device and display device fabricated using the same | |
| US8367283B2 (en) | Positive photosensitive resin composition, cured film, protecting film, insulating film and semiconductor and display devices using the same | |
| US9465289B2 (en) | Photosensitive resin composition for display device insulation film, and display device insulation film and display device using same | |
| TWI492976B (en) | Photosensitive resin composition for insulating film of display device, insulating film using the same, and display device using the same | |
| US20250291248A1 (en) | Photosensitive resin composition, photosensitive resin layer and semiconductor device using the same | |
| KR20130072934A (en) | Positive photosensitive resin composition, photosensitive resin film prepared by using the same, and semiconductor device including the photosensitive resin film | |
| KR20200026594A (en) | Photosensitive resin composition, photosensitive resin layer and electronic device using the same | |
| KR20200026591A (en) | Photosensitive resin composition, photosensitive resin layer and electronic device using the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AS | Assignment |
Owner name: CHEIL INDUSTRIES INC., KOREA, REPUBLIC OF Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:KWON, JI-YUN;KANG, JIN-HEE;KIM, DAE-YUN;AND OTHERS;REEL/FRAME:030969/0132 Effective date: 20130711 |
|
| STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
| MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 4 |
|
| MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 8 |





















