US20140070329A1 - Wireless module with active and passive components - Google Patents
Wireless module with active and passive components Download PDFInfo
- Publication number
- US20140070329A1 US20140070329A1 US14/020,782 US201314020782A US2014070329A1 US 20140070329 A1 US20140070329 A1 US 20140070329A1 US 201314020782 A US201314020782 A US 201314020782A US 2014070329 A1 US2014070329 A1 US 2014070329A1
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- United States
- Prior art keywords
- mosfet
- integrated circuit
- leads
- wireless module
- gate
- Prior art date
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- Abandoned
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Definitions
- the invention is generally related to providing multiple semiconductors in a common package, and, in particular to multi-chip modules (MCM) that includes an integrated circuit (IC) and one or more power devices, especially a half-bridge circuit with a driver IC and high side and low side power mosfets.
- MCM multi-chip modules
- IC integrated circuit
- power devices especially a half-bridge circuit with a driver IC and high side and low side power mosfets.
- a MCM is shown with an IC and two power mosfets packaged as a module.
- the IC is formed on a die of semiconductor material which is attached to a central die pad of a leadframe.
- Very thin wire bonds connect the bond pads of the IC to external and internal leads or to the power mosfets.
- the mosfets are flip chip attached to leadframes and have clips that selectively connect terminals of the mosfets to the IC and to internal and external leads.
- Wire bonding generally requires larger package sizes since the wire bonds need room to loop wire from the bond pads on the IC to the leads of the leadframe. As the IC becomes more complex, it tends to have more bond pads for input, output and internal connections to other devices.
- wire bonding has a number of disadvantages and drawbacks.
- the designer must leave physical space in the package to allow room for the bonding equipment to attach one of each wire to a bond pad, loop the wire, and attach the other end of the wire to the leads.
- the external leads are distributed around the periphery of the package, thereby requiring a package outline that is substantially greater than the size of the IC die.
- Even with all the improvements in wire bonding there are still risks of displacement in X, Y and Z axis during assembly. Stacked devices with wire bonds are prone to misalignment.
- wire bonds themselves are subject to a number of potential failures including ball/wedge bond lifting, shorting, wire breaking, voids in bonds and contaminants.
- Each wire bond may fail at any one of three points: the bond pad, the lead and along the length of the wire and any one failure will result in the loss of the entire die even if the die passed its electrical tests.
- the following embodiments of the invention show complete wireless solutions for mounting two or more semiconductor devices and an integrated circuit in one molded module.
- the embodiments of the invention eliminate the need for bond wires to connect devices to each other or to the integrated circuit.
- the devices and integrated circuit are interconnected by one or more interconnect structures including leadframe structures such as attach pads, traces, clips, downsets and terminals. These wireless connections provide robust metal conductors to interconnect devices and integrated circuits in lieu of conventional slender, fragile bond wires.
- the interconnect structures provided by attach pads, traces, clips, downset and terminals have low inductance compared to comparable bond wire interconnects.
- the molded module also has a smaller thickness compared to modules made with wire bonds because the loop height clearance required by wire bonds is not needed for the interconnect structures of the invention.
- the invention allows all devices and integrated circuits to be flip-chip mounted. Molding material is locked to the interconnect structures by half or double etching the interconnect structures to provide stepped profiles which hold the interconnect structures in place in the molding material.
- the integrated circuit may be pre-molded in insulating material for later encapsulation with the semiconductor devices.
- the integrated circuit is molded at the same time as the rest of the components.
- the semiconductor devices are high side and low side mosfets which are connected to the integrated circuit to provide a half-bridge circuit module.
- the mosfets may be mounted in standard fashion with suitable modifications made to the clips, downsets and leads.
- Other embodiments include one mosfet flip-chip mounted and the other mosfet regularly mounted.
- passive components are mounted on the leadframe structures of the invention.
- at least one device is external the molding material and in other embodiments all the passive components are within the molded material.
- FIG. 1 is a top isometric view of one embodiment of the MCM.
- FIG. 2 is a bottom isometric view of the embodiment of FIG. 1 .
- FIG. 3 is a top isometric view of another embodiment of the MCM.
- FIG. 4 is a bottom isometric view of the embodiment of FIG. 2 .
- FIG. 5 a is a top view of one embodiment of the invention with all flipped dies.
- FIG. 5 b is a bottom view of the embodiment of the invention in FIG. 5 a.
- FIG. 6 a is an outline views of a wireless assembly of integrated circuit and mosfet dies assembled on a leadframe.
- FIG. 6 b is a plan view of the assembly shown in FIG. 6 a.
- FIGS. 7 a 1 , 7 a 2 , and 7 a 3 are, respectively, isometric, top and bottom views of the half-etched terminals for the IC.
- FIGS. 7 b 1 , 7 b 2 , and 7 b 3 are, respectively, isometric, top and bottom views of conductive clips with downsets.
- FIG. 8 a is an isometric view of an embodiment of a leadframe.
- FIG. 8 b is a plan view of the top of the leadframe of FIG. 8 a.
- FIG. 8 c is a plan view of the bottom of the leadframe of FIG. 8 a.
- FIG. 9 is a perspective exploded view of components of an embodiment of the invention arranged in the order to their assembly.
- FIGS. 10 a , 10 b , and 10 c are, respectively, isometric, front and side views of another embodiment of the invention prior to molding.
- FIGS. 11 a and 11 b are, respectively, top and bottom isometric view of the embodiment of FIGS. 10 a , 10 b , and 10 c after molding.
- FIG. 12 is an isometric view of the leadframe of the embodiment of FIGS. 10 a , 10 b , and 10 c
- FIGS. 13 a , 13 b , and 13 c are, respectively, isometric, front and side views of another embodiment of the invention prior to molding.
- FIGS. 14 a and 14 b are, respectively, top and bottom isometric view of the embodiment of FIGS. 13 a , 13 b , and 13 c after molding.
- FIG. 15 is an isometric view of the leadframe of the embodiment of FIGS. 13 a , 13 b , and 13 c.
- FIGS. 16 a and 16 b are, respectively, isometric and side views of a clip of the invention.
- FIG. 17 is an isometric view of an assembled MCM with die attach pads for receiving the drains of the mosfets.
- FIG. 18 is a bottom isometric view of the MCM of FIG. 18 with one molding compound.
- FIG. 19 is a bottom isometric view of the MCM of FIG. 18 with the integrated circuit terminals embedded in a non-conductive material and the rest of the MCM encapsulated in a molding compound.
- FIG. 20 a is top view of the assembled MCM of FIG. 17 without molding compound.
- FIG. 20 b is a bottom view of the assembled MCM of FIG. 17 with non-conductive material embedding the terminals of the integrated circuit.
- leadframe structure can refer to a structure that is derived from or is the same as a leadframe.
- Each leadframe structure can include two or more leads with lead surfaces and a die attach region. The leads extend laterally from the die attach region.
- a single lead frame structure may include a gate lead structure, and a source lead structure.
- the leadframe structure may comprise any suitable material.
- Exemplary leadframe structure materials include metals such as copper, aluminum, gold, etc., and alloys thereof.
- the leadframe structures may also include plated layers such as plated layers of gold, chromium, silver, palladium, nickel, etc.
- the leadframe structure may also have any suitable thickness, including a thickness less than about 1 mm (e.g., less than about 0.5 mm).
- the leadframe structure can be stamped, etched and/or patterned using conventional processes to shape the leads or other portions of the leadframe structure.
- the leadframe structure can be formed by stamping, or by etching a continuous conductive sheet to form a predetermined pattern. If by etching, before or after etching the leadframe structure can also be optionally stamped so that a die attach surface of the leadframe structure is downset with respect to the lead surfaces of the leads of the leadframe structure.
- stamping is used, the leadframe structure may be one of many leadframe structures in an array of leadframe structures that are connected by tie-bars. The leadframe structure array may also be cut to separate the leadframe structures from other leadframes structures.
- a leadframe structure in a final semiconductor die package such as a source lead and a gate lead may be electrically and mechanically uncoupled from each other.
- a leadframe structure may be a continuous metallic structure or a discontinuous metallic structure.
- some of the leadframe structures are double half-etched to still further improve the lock between molding compound and the leads.
- FIGS. 1 and 2 The embodiment of FIGS. 1 and 2 is a wireless module 10 which has an integrated circuit 2 , a high side mosfet 3 , and a low side mosfet 4 .
- the input/output terminals 21 . 01 - 21 . 20 and the terminals for an integrated circuit 2 are flip-chip attached to a leadframe structure 11 that includes IC and mosfet portions 20 , 30 , 40 .
- the mosfets are embedded in molding compound 70 and the integrated circuit 2 has its terminals 21 . 01 - 21 . 20 embedded in a non-conductive material 75 , such as polyimide or another molding compound.
- wireless module 14 as shown in FIGS.
- a leadframe structure 11 has component frames 20 , 30 , and 40 for the integrated circuit 2 , the high side mosfet 3 , and the low side mosfet 4 , respectively.
- the difference between module 10 and module 12 is that the module 10 embeds the terminals 21 . 01 - 21 . 20 of the integrated circuit 2 in non-conductive material 75 including and not limited to polyimide and the module 12 embeds all terminals of module 12 in second layer molding compound or other non-conductive material.
- the module 10 has individual leadframe portions 20 , 30 , 40 (See FIG. 8 a ) for the integrated circuit 2 , the high side mosfet 3 , and the low side mosfet 4 , respectively, where all devices are flip chip attached.
- the leadframe portion 20 for the integrated circuit 2 includes an array of terminals 21 . 01 - 21 . 20 .
- the terminals 21 . 1 - 21 . 20 have their top and bottom surfaces half-etched.
- the half-etched surfaces of the terminals provide edge, top and bottom surfaces on the terminals 21 . 1 - 21 . 20 that interlock with non-conductive material 75 in the embodiment of FIGS. 1 and 2 .
- the integrated circuit 2 is flip chip attached to terminals 21 . 01 - 21 . 20 that are embedded in molding compound 70 .
- module 10 has that both mosfets flip-chip mounted. In other words, their sources and gates face down and their drains face up.
- clips 50 , 55 with downsets connect the source of the high side mosfet 3 to the drain of the low side mosfet 4 .
- the leadframe portion 30 for the high side mosfet 3 includes a high side source lead trace 32 extending from the high side source leadframe structure toward a high side source terminal 21 . 11 of the integrated circuit.
- a high side gate lead trace 33 extends from the high side leadframe portion 30 to a high side gate terminal 21 . 6 of the integrated circuit. See FIGS. 5 a , 5 b .
- the high side leadframe portion has a drain lead post 35 disposed along an edge of the high side leadframe structure for receiving a downset from clip 50 .
- the leadframe portion 40 for the low side mosfet includes a source trace 44 extending from the low side source leadframe portion toward a low side source terminal 21 . 16 of the integrated circuit 20 .
- a low side gate lead trace 47 extends from the low side leadframe portion 40 to a low side gate terminal 21 . 20 of the integrated circuit 20 .
- Lead posts 42 , 46 and leads 41 . 1 - 41 . 5 disposed along edges of the low side leadframe structure receive downset bars of drain clip 55 .
- FIGS. 5 a , 5 b show the top and bottom view, respectively, of the assembly of the leadframe 10 and dies 2 , 3 , 4 for the module 10 or 12 .
- FIG. 6 a shows details of the interconnection of clips, traces and terminals for the assembly of FIGS. 5 a , 5 b .
- the clip 50 covers the high side die 3 .
- Trace 32 connects the gate of the high side die 3 to one of the terminals 20 . 10 - 20 . 20 of the IC 2 and trace 33 connects the source of the high side mosfet 3 to another terminal of IC 2 .
- Trace 44 connects the gate of the low side mosfet 4 to one of the terminals 20 . 10 - 20 .
- trace 47 connects the source of the low side mosfet 4 to another terminal of IC 2 .
- Downset 58 connects the clip 55 on the drain of the low side mosfet to source pad 34 . 1 of the high side mosfet source pad 34 .
- FIGS. 7 a 1 , 7 a 2 and 7 a 3 show details of the structure for the input/output terminals 21 . 01 - 21 . 20 of the integrated circuit.
- Each terminal is fashioned from leadframe structure material to have terminals 20 with differently shaped upper and lower elements 22 , 23 , respectively.
- the top surface 22 . 1 of upper element 22 has a quasi-rectangular shape with rounded corners 24 and central arcs 25 on opposite sides of axis 22 . 3 .
- the element 22 is symmetrical about the axis 22 . 3 .
- the bottom element 23 has four sides and may be rhombic, rectangular or square in shape.
- the axis 22 . 3 of the element 22 is aligned with the diagonal axis 23 .
- the terminals 20 are formed from a sheet of conductive material.
- the shape of element 22 is formed by one etch step and the shape of element 23 is performed by a second etch step on the same sheet of material. As such, the terminals 22 are double etched to provide multiple steps for their contours.
- FIGS. 7 b 1 , 7 b 2 and 7 b 3 show details of the conductive clips 50 , 55 .
- One clip 50 connects the high side mosfet 3 to a power supply. It has a planar portion 52 that is raised with respect to a larger lower planar portion 54 .
- the raised planar portion contributes to locking the clip in the molding compound 70 and is formed by half-etching a flat sheet of conductive material. For example, the desired raised area is covered with a patterned resist and the rest of the sheet is etched to form the raised pad 50 and the downset 51 .
- the downset is bent into position.
- the lower surface of the lower planar portion is soldered or otherwise fixed to the source of the high side mosfet 3 .
- a downset 51 terminates in leads for connection to a supply voltage.
- the other clip 55 interconnects the two mosfets 3 , 4 and provides an output terminal for the half bridge circuit. It is formed in a similar manner as described above for clip 50 .
- Clip 55 has a planar portion 56 a is raised with respect to a larger lower portion planar portion 56 b .
- the raised planar portion 56 a contributes to locking the clip in the molding compound 70 .
- the lower surface of the lower planar portion 56 b is soldered or otherwise fixed to the source of the low side mosfet 4 .
- Clip 54 has one downset 58 that interconnects source of the high side mosfet 3 to the drain of the low side mosfet 3 and carries that connection to external drain terminals 59 .
- Other downsets 57 , 59 have terminals that are exposed by the molding compound 70 to provide connections for the output of the half bridge circuit.
- FIGS. 8 a - 8 c show features of the half-etched leadframe structure 11 . It includes three portions: portion 20 for the IC 2 , portion 30 for the high side mosfet 3 and portion 40 for the low side mosfet 4 .
- Portion 20 has a plurality of half-etched leads 20 . 01 - 20 . 20 arranged in a 4-by-5 array. Those skilled in the art understand that the twenty leads are representative of the number of leads for an integrated circuit which may have more or less than 20 leads. Each lead is soldered or attached with a conductive adhesive to a terminal of the IC 2 . Further details of the half-etched configuration of the leads 20 . 01 - 20 . 20 are shown in FIGS.
- Traces 32 , 33 contact, respectively, the gate and source of the high side mosfet 3 and interconnect them to terminals of the integrated circuit 2 .
- Lead 37 provides an external contact, preferably to a power supply line on a printed circuit board.
- Trace 44 interconnects the source of the low side mosfet 4 to the integrated circuit 2 .
- Trace 47 connects the gate of the low side mosfet 4 to the integrated circuit 2 .
- High side mosfet leadframe structure portion 30 has a source pad 34 that is half-etched to provide three raised surfaces 34 . 1 - 34 . 3 for contacting the source terminal of mosfet 3 and three external leads 36 . 1 - 36 . 3 for contact an input power source (not shown).
- the raised surfaces 34 . 1 - 34 . 3 are rectangular in shape and surface 34 . 1 is slightly larger than the raised surfaces 34 . 2 and 34 . 3 for receiving the downset 58 of clip 55 .
- the raised surfaces are provided by half-etching the source pad 34 .
- Low side mosfet leadframe structure portion 40 has a source pad 43 that is half-etched to provide five raised surfaces 43 . 1 - 43 . 5 for contacting the source of mosfet 4 and external leads 41 . 1 - 41 . 5 .
- Drain bars 42 , 46 are also part of the leadframe structure portion 40 and they make mechanical and electrical contact with the conductive clip 50 . See FIGS. 7 a 1 - 7 a 3 and 9 .
- Another embodiment of the invention has a conductive connection on the clips to laterally support a gang of clips and provide stability during clip attachment. See FIG. 9 where conductive connectors 151 , 152 extend from the planar portion 56 a of clip 55 and conductive connectors 155 , 156 extend from top planar portion 52 of clip 50 .
- FIG. 9 there is shown an exploded isometric view of the components of one embodiment of the invention in the order in which the components for module 10 or 12 are assembled and molded into a multi-chip package.
- Step 1 a strip of suitable metal is punched and/or half-etched to provide the leadframe structure 11 with source pads 34 , 43 IC terminals 20 . 01 - 20 . 20 which are all initially connected together at the bottom side for module 12 while only IC terminals 20 . 01 - 20 . 20 are initially connected for module 10 .
- solder or conductive adhesive is applied to the top surfaces of the half-etched leads in a pattern corresponding to the surface.
- step 3 the IC 2 and the mosfets 3 , 4 are attached to the soldered or adhesive surfaces of the leads.
- step 4 another layer or solder or conductive adhesive is applied to the upper surfaces of the dies 2 , 3 and 4 .
- step 5 clips with downsets are attached via the solder or the adhesive applied in step 4 .
- the assembled multi-chip circuit is encapsulated by molding compound 70 , then second half-etched at the bottom side to define the terminals. Finally, the non-conductive material or second molding compound is applied to fill in the gaps between terminals.
- Embodiments described above solve bond wire problems by eliminating all bond wires among the dies to provide a completely wireless multi-chip module that includes an integrated circuit.
- embodiments are described with respect to a half-bridge circuit, such embodiments are exemplary only and not intended to limit the spirit or scope of the invention which may include multiple integrated circuits, passive devices and additional mosfets, power diodes, and IGBTs.
- the claimed invention avoids a number of problems inherent in bond wires such as forming strong metallurgical bonds between bond pads on dies and lead posts and mosfet interconnections.
- the structures and methods of assembly of the embodiments of the invention are highly efficient and eliminate the need for special wire bonding equipment.
- the resulting products have improved performance because eliminating the bond wires reduces the inherent inductance of the packaged circuit which will then have lower noise than equivalent circuits made with bond wires.
- Overall performance is improved due to direct conductive interconnection of integrated circuit bond pads.
- Using clips with downsets reduces the conventional space requirements of wired bonded devices.
- the perimeter of the resulting module is reduced compared to the equivalent perimeter of wire bonded modules.
- the half-etched leadframe structure interlocks the molding material to improve the overall sealing of the devices in molding compound. Using some double half-etched leadframe structures improves locking and sealing even further.
- the downsets for the clips stabilize bond line thickness by using the conductive clip downset terminals as standoff control.
- the die attach pads, clips, downsets and traces can be reconfigured to provide two devices regularly mounted with their respective drains on separate die attach pads, a clip with a downset or other means for connecting the high side source to the low side drain, another clip connecting the low side source to external contacts for connection to ground and the die attach pad for the high side source connected to external leads for connection to a suitable power source.
- Still other configurations include one mosfet flip-chip mounted and the other mosfet regularly mounted with its drain on the die attach pad. Suitable clips, downsets and external leads interconnect the high side source to the low side drain, connect the source of the low side drain to external terminals connectable to ground and connect the high side drain to external terminals connectable to a power supply.
- Embodiments of the invention are fabricated with half-etching and double half-etching techniques for forming copper traces.
- Those skilled in the art know one or more process techniques for half-etching and double half-etching.
- applicant hereby incorporates by reference the entire disclosure of Provisional Application No. 61/834,206, filed Jun. 2, 2013, and assigned to the same assignee as this patent.
- the incorporated application shows improved techniques for forming pre-molded substrates with upper and lower land. That application discloses a method for manufacturing a pre-molded substrate with routed traces.
- a metal substrate having upper and lower surfaces; applying and patterning a first masking layer to expose one or more selected areas of the upper surface corresponding to one or more desired traces; partially etching the exposed surface area to form portions of the desired traces; covering the upper surface of the substrate with a second masking layer to protect the surfaces of the traces; patterning a third masking layer on lower surface of the substrate to expose one or more selected areas corresponding to contact lands; partially etching the exposed surface areas of the lower surface to form the contact lands and simultaneously fully etch the remaining portions of the exposed half-etched lower surface to finish forming the traces; and molding the substrate to fill the half-etched and fully etched areas to hold the traces in position and stiffen the pre-molded substrate.
- FIGS. 10 a , 10 b and 10 c they show multi-component module 100 with a leadframe 200 , an integrated circuit (IC) 120 , a first or high side mosfet 130 and a second of low side mosfet 140 and five passive components including an external input capacitor 150 and four passive components 212 , 214 , 216 , 218 .
- the passive components may be resistors, capacitors, inductors or any combination thereof.
- the IC 120 if flip chip mounted on IC leads of the IC portion 220 of the leadframe 110 .
- the mosfets 130 , 140 are also flip chip mounted on mosfet portions 230 , 240 , respectively, of leadframe 200 .
- FIGS. 11 a , 11 b show the fully formed module 100 .
- the module has a suitable half and/or double etched leadframe 110 in the form shown in FIG. 12 .
- the bottom surface of the module has exposed high and low source pads 231 , 241 , respectively, and other pads 201 . 01 - 201 . 11 .
- copper clips 132 , 133 mechanically and electrically connect the drain terminal of low side mosfet 140 to the source of the high side mosfet 130 and to external leads 224 . 01 - 224 . 03 via raised pad 246 and serve as landing pads for the terminals of input capacitor 150 .
- the input capacitor 150 has one terminal connected to the high side source by means of clip 134 and pad 234 . Its other terminal is connected to the low side drain by means of clips 133 , 132 and pad 234 .
- the lower clip 132 has a lateral downset (not shown) for connecting the drain of the low side mosfet 140 to the source of the high side mosfet 130 via a raised pad 233 on the high side portion 230 of the leadframe 200 .
- Upper clip 133 has a downset 136 for connecting one terminal of the external input capacitor to raised pad 246 which has external leads 224 . 01 - 224 . 03 .
- Raised pad 246 receives the downset 136 of clip 133 .
- Clip 134 serves as a landing pad for the other terminal of the external input capacitor 150 .
- Downset 135 on clip 134 connects to pad 225 which is connected to external leads 225 . 01 - 225 . 03 .
- the high side portion 230 of leadframe 200 has an L-shaped base portion 231 with one or more raised pads 233 , 234 , 235 and 236 .
- the raised pads are formed by half-etching or double half-etching a metal strip.
- Raised pad 233 of the high side portion 230 receives a lateral downset (not shown) of lower clip 132 that is coupled to the drain terminal of the low side mosfet 240 and connects the drain of the low side mosfet 240 to the source of the high side mosfet 230 .
- Raised pads 234 , 235 are electrically and mechanically connected to the source terminal of the high side mosfet 230 .
- Pad 236 connects the source of the high side mosfet to one terminal of passive component 214 .
- Trace 222 . 01 connects to the other terminal of passive component 214 to the IC 120 .
- the low side portion 240 of the leadframe 200 has a base portion 241 and raised pads 242 - 246 .
- Pad 246 receives the downset from lower copper clip 132 that is attached to the drain of the low side mosfet 240 .
- Pads 242 - 245 are mechanically and electrically connected to the source terminal of the low side mosfet 240 .
- Pad 245 mechanically and electrically connects the source terminal of the low side mosfet 240 to passive component 212 .
- Trace 222 . 08 connects the other terminal of passive component 212 to the IC 120 and to output terminals 221 . 09 - 221 . 12 .
- the IC portion 220 of the leadframe has a plurality of external leads 221 . 01 - 221 . 12 and a plurality of external-to-internal metal (copper) traces 222 . 01 - 222 . 08 , each of which has one terminus at an external lead and an elongated body that extends toward another terminus within the plane of the IC portion 220 of the leadframe.
- Trace 222 . 07 has a terminus on one end that contacts two external leads and trace 222 . 08 has a terminus at one end that contact three external leads.
- Trace 223 . 01 connects IC 120 to the source of the high side mosfet 230 , trace 223 .
- 02 connects IC 120 to the gate of the high side mosfet 230 , trace 223 .
- 03 connects IC 120 to the gate of the low side mosfet 240 and trace 223 .
- 04 connects IC 120 to the source of the low side mosfet 240 .
- the leadframe 110 could be provided in the form of a pre-molded substrate having traces embedded in molding compound as shown and described in Provisional Application No. 61/834,206, filed Jun. 2, 2013, assigned to the same assignee as this patent and hereby entirely incorporated by reference.
- the IC 120 , the mosfets 130 , 140 and the passive components 211 - 214 are assembled on the leadframe 110 .
- Solder paste of other conductive adhesive is applied to the pads, leads and traces for fixing the components 120 , 130 , 140 and 211 - 214 to the leadframe 110 .
- one or more copper clips 132 , 133 , 134 are attached to the drain terminals of the mosfets 130 , 140 and to the raised pads 233 , 234 , 246 of the leadframe 110 .
- the solder if used, is reflowed to fix the components to the leadframe.
- the assembly is then transfer injection molded to provide a four-sided module with exposed pads 231 , 241 and leads on the bottom surface of the module 100 . Portions of the molding compound on the top surface 101 are etched or ground away to expose portions of the surface of the copper clips 134 , 134 .
- the exposed surfaces are treated with solder paste and the input capacitor 150 is soldered to the exposed surfaces of the clips 133 , 134 .
- FIGS. 13 a , 13 b , and 13 c show another embodiment of the invention, multi-component module 300 .
- module 100 and module 300 include an input capacitor 350 which is small enough to fit inside a molded module.
- FIGS. 14 a , 14 b show the fully formed module 300 .
- the module has a suitable half and/or double etched leadframe 500 in the form shown in FIG. 15 .
- the bottom surface of the module has exposed high and low source pads 531 , 541 , respectively, and other pads 501 . 01 - 501 . 10 .
- the input capacitor 350 has one terminal connected to the high side source by means of clip 333 and clip post 536 and pad 525 . Its other terminal is connected to the low side drain by means of clips 133 , 132 and pad 546 . Otherwise the rest of the components of the module 300 are the same as module 100 .
- the process for forming module 300 includes the step of soldering or using a conductive adhesive to attach the input capacitor 350 to the mosfets 130 , 140 prior to encapsulating the assembled device.
- Still further embodiments include partial pre-encapsulation of the IC 120 in non-conductive material 75 and regular attachment of the mosfets 130 , 140 in a manner similar to the attachment shown and described in connection with the embodiments of FIG. 3 and FIG. 4 .
- FIGS. 17 , 18 , 19 and 20 a , 20 b show further multichip embodiments using standard die attach mounting.
- the multichip module 600 has integrated circuit 2 mounted on its leads 610 . 01 - 610 . 09 . Although nine leads are shown those skilled in the art understand that there may be more or less leads depending upon the complexity of the integrated circuit 2 .
- the high side mosfet 3 is mounted with its drain attached to a high side die attach pad 624 .
- External high side drain terminals 625 and 626 are soldered or otherwise electrically and mechanically connected to the high side die attach pad 624 .
- a high side source clip 620 has its lower surface electrically and mechanically attached to the source of the high side mosfet 3 .
- Gate clip 621 connects the high side gate to the integrated circuit 2 .
- High side source lead 632 connects the high side source to the integrated circuit 2 .
- Downset 623 is integral with the clip 620 and extends down from the clip 620 to attach to the low side die attach pad 634 which has external switch node terminals 666 .
- Another clip 628 connects the high side source to an external terminal 627 .
- the low side mosfet 4 has its drain attached to low side die attach pad 634 .
- external switch node terminals 666 are integral with the low side die attach pad 634 .
- a low side source clip 630 has its lower surface electrically and mechanically attached to the source of the low side mosfet 4 .
- Lead 632 extends from the low source clip to a terminal of the integrated circuit 2 .
- Gate clip 631 connects the high side gate to the integrated circuit 2 .
- Downset 633 is integral with the clip 630 and extends down from the clip 630 to attach to low side source external terminals 636 .
- all components are encapsulated in molding compound 670 .
- the terminals of the integrated circuit are molded in a non-conductive compound 675 and later further encapsulated in a molding compound 670 which protects the mosfets 3 , 4 .
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Abstract
Description
- This application claims the benefit of Provisional Application No. 61/697,893, filed Sep. 7, 2012, the entire disclosure of which is hereby expressly incorporated by reference in its entirety. This application shares one or more inventors, and portions of the specification are also found in U.S. application Ser. No. ______, filed ______, 2013 (Attorney Docket No. FAIR-1-42374).
- The invention is generally related to providing multiple semiconductors in a common package, and, in particular to multi-chip modules (MCM) that includes an integrated circuit (IC) and one or more power devices, especially a half-bridge circuit with a driver IC and high side and low side power mosfets.
- In U.S. Pat. No. 7,915,721, a MCM is shown with an IC and two power mosfets packaged as a module. The IC is formed on a die of semiconductor material which is attached to a central die pad of a leadframe. Very thin wire bonds connect the bond pads of the IC to external and internal leads or to the power mosfets. The mosfets are flip chip attached to leadframes and have clips that selectively connect terminals of the mosfets to the IC and to internal and external leads.
- The above reference demonstrates the two types of assembly techniques common in the semiconductor industry: wire bonding and flip chip attachment. Wire bonding generally requires larger package sizes since the wire bonds need room to loop wire from the bond pads on the IC to the leads of the leadframe. As the IC becomes more complex, it tends to have more bond pads for input, output and internal connections to other devices.
- Although the technology of wire bonding has overcome many obstacles, nevertheless wire bonding has a number of disadvantages and drawbacks. The designer must leave physical space in the package to allow room for the bonding equipment to attach one of each wire to a bond pad, loop the wire, and attach the other end of the wire to the leads. In many cases the external leads are distributed around the periphery of the package, thereby requiring a package outline that is substantially greater than the size of the IC die. Even with all the improvements in wire bonding, there are still risks of displacement in X, Y and Z axis during assembly. Stacked devices with wire bonds are prone to misalignment. The wire bonds themselves are subject to a number of potential failures including ball/wedge bond lifting, shorting, wire breaking, voids in bonds and contaminants. Each wire bond may fail at any one of three points: the bond pad, the lead and along the length of the wire and any one failure will result in the loss of the entire die even if the die passed its electrical tests.
- Other assembly techniques provide packages that have very small profiles. With flip chip assembly, balls, pillars or bumps are deposited on the contact terminals of chips. The balls, pillars, or bumps are attached to pads or leads in a single operation where the balls, pillars or bumps are soldered to the leads. Where a single mosfet or multiple mosfets are all flip chip assembled and encapsulated with an insulating resin, the resulting package may be relatively small, approaching the actual scale of the chips themselves. Since power mosfets have only three terminals (source, gate and drain) it is relatively simple to flip chip assemble mosfet and make a chip scale package. However, when a MCM includes an IC, the multiple wire bonds required to assemble the IC will result in a relatively large size package in order to accommodate the wire bonded IC, such as the one shown in U.S. Pat. No. 7,915,721.
- This summary is provided to introduce a selection of concepts in a simplified form that are further described below in the Detailed Description. This summary is not intended to identify key features of the claimed subject matter, nor is it intended to be used as an aid in determining the scope of the claimed subject matter.
- The following embodiments of the invention show complete wireless solutions for mounting two or more semiconductor devices and an integrated circuit in one molded module. The embodiments of the invention eliminate the need for bond wires to connect devices to each other or to the integrated circuit. The devices and integrated circuit are interconnected by one or more interconnect structures including leadframe structures such as attach pads, traces, clips, downsets and terminals. These wireless connections provide robust metal conductors to interconnect devices and integrated circuits in lieu of conventional slender, fragile bond wires. The interconnect structures provided by attach pads, traces, clips, downset and terminals have low inductance compared to comparable bond wire interconnects. The molded module also has a smaller thickness compared to modules made with wire bonds because the loop height clearance required by wire bonds is not needed for the interconnect structures of the invention. The invention allows all devices and integrated circuits to be flip-chip mounted. Molding material is locked to the interconnect structures by half or double etching the interconnect structures to provide stepped profiles which hold the interconnect structures in place in the molding material.
- In one embodiment the integrated circuit may be pre-molded in insulating material for later encapsulation with the semiconductor devices. In another embodiment the integrated circuit is molded at the same time as the rest of the components. In other embodiments the semiconductor devices are high side and low side mosfets which are connected to the integrated circuit to provide a half-bridge circuit module. The mosfets may be mounted in standard fashion with suitable modifications made to the clips, downsets and leads. Other embodiments include one mosfet flip-chip mounted and the other mosfet regularly mounted.
- In still other embodiments, passive components are mounted on the leadframe structures of the invention. In some embodiments at least one device is external the molding material and in other embodiments all the passive components are within the molded material.
- The foregoing aspects and many of the attendant advantages of this invention will become more readily appreciated as the same become better understood by reference to the following detailed description, when taken in conjunction with the accompanying drawings, wherein:
-
FIG. 1 is a top isometric view of one embodiment of the MCM. -
FIG. 2 is a bottom isometric view of the embodiment ofFIG. 1 . -
FIG. 3 is a top isometric view of another embodiment of the MCM. -
FIG. 4 is a bottom isometric view of the embodiment ofFIG. 2 . -
FIG. 5 a is a top view of one embodiment of the invention with all flipped dies. -
FIG. 5 b is a bottom view of the embodiment of the invention inFIG. 5 a. -
FIG. 6 a is an outline views of a wireless assembly of integrated circuit and mosfet dies assembled on a leadframe. -
FIG. 6 b is a plan view of the assembly shown inFIG. 6 a. -
FIGS. 7 a 1, 7 a 2, and 7 a 3 are, respectively, isometric, top and bottom views of the half-etched terminals for the IC. -
FIGS. 7 b 1, 7b 2, and 7b 3 are, respectively, isometric, top and bottom views of conductive clips with downsets. -
FIG. 8 a is an isometric view of an embodiment of a leadframe. -
FIG. 8 b is a plan view of the top of the leadframe ofFIG. 8 a. -
FIG. 8 c is a plan view of the bottom of the leadframe ofFIG. 8 a. -
FIG. 9 is a perspective exploded view of components of an embodiment of the invention arranged in the order to their assembly. -
FIGS. 10 a, 10 b, and 10 c are, respectively, isometric, front and side views of another embodiment of the invention prior to molding. -
FIGS. 11 a and 11 b are, respectively, top and bottom isometric view of the embodiment ofFIGS. 10 a, 10 b, and 10 c after molding. -
FIG. 12 is an isometric view of the leadframe of the embodiment ofFIGS. 10 a, 10 b, and 10 c -
FIGS. 13 a, 13 b, and 13 c are, respectively, isometric, front and side views of another embodiment of the invention prior to molding. -
FIGS. 14 a and 14 b are, respectively, top and bottom isometric view of the embodiment ofFIGS. 13 a, 13 b, and 13 c after molding. -
FIG. 15 is an isometric view of the leadframe of the embodiment ofFIGS. 13 a, 13 b, and 13 c. -
FIGS. 16 a and 16 b are, respectively, isometric and side views of a clip of the invention. -
FIG. 17 is an isometric view of an assembled MCM with die attach pads for receiving the drains of the mosfets. -
FIG. 18 is a bottom isometric view of the MCM ofFIG. 18 with one molding compound. -
FIG. 19 is a bottom isometric view of the MCM ofFIG. 18 with the integrated circuit terminals embedded in a non-conductive material and the rest of the MCM encapsulated in a molding compound. -
FIG. 20 a is top view of the assembled MCM ofFIG. 17 without molding compound. -
FIG. 20 b is a bottom view of the assembled MCM ofFIG. 17 with non-conductive material embedding the terminals of the integrated circuit. - This application incorporates by reference the entire contents of U.S. Pat. Nos. 7,975,721 and 7,371,616. Those skilled in the art understand that the modules described herein may be used to fabricate half-bridge circuits and the modules of this patent may be configured in the schematic arrangements shown in the patents incorporated reference by suitable modifications of the connection made among the devices of the module.
- The term “leadframe structure” can refer to a structure that is derived from or is the same as a leadframe. Each leadframe structure can include two or more leads with lead surfaces and a die attach region. The leads extend laterally from the die attach region. A single lead frame structure may include a gate lead structure, and a source lead structure.
- The leadframe structure may comprise any suitable material. Exemplary leadframe structure materials include metals such as copper, aluminum, gold, etc., and alloys thereof. The leadframe structures may also include plated layers such as plated layers of gold, chromium, silver, palladium, nickel, etc. The leadframe structure may also have any suitable thickness, including a thickness less than about 1 mm (e.g., less than about 0.5 mm).
- The leadframe structure can be stamped, etched and/or patterned using conventional processes to shape the leads or other portions of the leadframe structure. For example, the leadframe structure can be formed by stamping, or by etching a continuous conductive sheet to form a predetermined pattern. If by etching, before or after etching the leadframe structure can also be optionally stamped so that a die attach surface of the leadframe structure is downset with respect to the lead surfaces of the leads of the leadframe structure. If stamping is used, the leadframe structure may be one of many leadframe structures in an array of leadframe structures that are connected by tie-bars. The leadframe structure array may also be cut to separate the leadframe structures from other leadframes structures. As a result of cutting, portions of a leadframe structure in a final semiconductor die package such as a source lead and a gate lead may be electrically and mechanically uncoupled from each other. Thus, a leadframe structure may be a continuous metallic structure or a discontinuous metallic structure. In addition, some of the leadframe structures are double half-etched to still further improve the lock between molding compound and the leads.
- The embodiment of
FIGS. 1 and 2 is awireless module 10 which has an integratedcircuit 2, ahigh side mosfet 3, and alow side mosfet 4. The input/output terminals 21.01-21.20 and the terminals for anintegrated circuit 2 are flip-chip attached to aleadframe structure 11 that includes IC andmosfet portions molding compound 70 and theintegrated circuit 2 has its terminals 21.01-21.20 embedded in anon-conductive material 75, such as polyimide or another molding compound. In an alternate embodiment, wireless module 14 as shown inFIGS. 3 and 4 has itsmosfets integrated circuit 2 are flip chip attached to aleadframe structure 11 and all terminals forhigh side mosfet 3,low side mosfet 4 and for theintegrated circuit 2 are embedded in second layer ofmolding compound 70 or othernon-conductive material 75. In both embodiments, aleadframe structure 11 has component frames 20, 30, and 40 for theintegrated circuit 2, thehigh side mosfet 3, and thelow side mosfet 4, respectively. The difference betweenmodule 10 andmodule 12 is that themodule 10 embeds the terminals 21.01-21.20 of theintegrated circuit 2 innon-conductive material 75 including and not limited to polyimide and themodule 12 embeds all terminals ofmodule 12 in second layer molding compound or other non-conductive material. - In
FIGS. 1 and 2 themodule 10 hasindividual leadframe portions FIG. 8 a) for theintegrated circuit 2, thehigh side mosfet 3, and thelow side mosfet 4, respectively, where all devices are flip chip attached. Theleadframe portion 20 for theintegrated circuit 2 includes an array of terminals 21.01-21.20. The terminals 21.1-21.20 have their top and bottom surfaces half-etched. The half-etched surfaces of the terminals provide edge, top and bottom surfaces on the terminals 21.1-21.20 that interlock withnon-conductive material 75 in the embodiment ofFIGS. 1 and 2 . Inembodiment 12 shown inFIGS. 3 and 4 , theintegrated circuit 2 is flip chip attached to terminals 21.01-21.20 that are embedded inmolding compound 70. - In the first embodiment,
module 10 has that both mosfets flip-chip mounted. In other words, their sources and gates face down and their drains face up. As will be explained hereinafter, clips 50, 55 with downsets connect the source of thehigh side mosfet 3 to the drain of thelow side mosfet 4. Theleadframe portion 30 for thehigh side mosfet 3 includes a high side sourcelead trace 32 extending from the high side source leadframe structure toward a high side source terminal 21.11 of the integrated circuit. A high sidegate lead trace 33 extends from the highside leadframe portion 30 to a high side gate terminal 21.6 of the integrated circuit. SeeFIGS. 5 a, 5 b. The high side leadframe portion has a drainlead post 35 disposed along an edge of the high side leadframe structure for receiving a downset fromclip 50. - The
leadframe portion 40 for the low side mosfet includes asource trace 44 extending from the low side source leadframe portion toward a low side source terminal 21.16 of theintegrated circuit 20. A low sidegate lead trace 47 extends from the lowside leadframe portion 40 to a low side gate terminal 21.20 of theintegrated circuit 20. Lead posts 42, 46 and leads 41.1-41.5 disposed along edges of the low side leadframe structure receive downset bars ofdrain clip 55. -
FIGS. 5 a, 5 b show the top and bottom view, respectively, of the assembly of theleadframe 10 and dies 2, 3, 4 for themodule FIG. 6 a shows details of the interconnection of clips, traces and terminals for the assembly ofFIGS. 5 a, 5 b. Theclip 50 covers the high side die 3.Trace 32 connects the gate of the high side die 3 to one of the terminals 20.10-20.20 of theIC 2 and trace 33 connects the source of thehigh side mosfet 3 to another terminal ofIC 2.Trace 44 connects the gate of thelow side mosfet 4 to one of the terminals 20.10-20.20 of theIC 2 and trace 47 connects the source of thelow side mosfet 4 to another terminal ofIC 2.Downset 58 connects theclip 55 on the drain of the low side mosfet to source pad 34.1 of the high sidemosfet source pad 34. -
FIGS. 7 a 1, 7 a 2 and 7 a 3 show details of the structure for the input/output terminals 21.01-21.20 of the integrated circuit. Each terminal is fashioned from leadframe structure material to haveterminals 20 with differently shaped upper andlower elements upper element 22 has a quasi-rectangular shape withrounded corners 24 andcentral arcs 25 on opposite sides of axis 22.3. Theelement 22 is symmetrical about the axis 22.3. Thebottom element 23 has four sides and may be rhombic, rectangular or square in shape. The axis 22.3 of theelement 22 is aligned with the diagonal axis 23.3 of thebottom element 23. The different half-etched shapes on top and bottom of the terminals provide interlocking connections among the terminals and thenon-conductive material 75 or molding compound. More specifically, theterminals 20 are formed from a sheet of conductive material. The shape ofelement 22 is formed by one etch step and the shape ofelement 23 is performed by a second etch step on the same sheet of material. As such, theterminals 22 are double etched to provide multiple steps for their contours. -
FIGS. 7 b 1, 7 b 2 and 7 b 3 show details of theconductive clips clip 50 connects thehigh side mosfet 3 to a power supply. It has aplanar portion 52 that is raised with respect to a larger lowerplanar portion 54. The raised planar portion contributes to locking the clip in themolding compound 70 and is formed by half-etching a flat sheet of conductive material. For example, the desired raised area is covered with a patterned resist and the rest of the sheet is etched to form the raisedpad 50 and thedownset 51. The downset is bent into position. The lower surface of the lower planar portion is soldered or otherwise fixed to the source of thehigh side mosfet 3. Adownset 51 terminates in leads for connection to a supply voltage. - The
other clip 55 interconnects the twomosfets clip 50.Clip 55 has aplanar portion 56 a is raised with respect to a larger lower portionplanar portion 56 b. The raisedplanar portion 56 a contributes to locking the clip in themolding compound 70. The lower surface of the lowerplanar portion 56 b is soldered or otherwise fixed to the source of thelow side mosfet 4.Clip 54 has onedownset 58 that interconnects source of thehigh side mosfet 3 to the drain of thelow side mosfet 3 and carries that connection toexternal drain terminals 59.Other downsets molding compound 70 to provide connections for the output of the half bridge circuit. - Turning to
FIGS. 8 a-8 c, they show features of the half-etchedleadframe structure 11. It includes three portions:portion 20 for theIC 2,portion 30 for thehigh side mosfet 3 andportion 40 for thelow side mosfet 4.Portion 20 has a plurality of half-etched leads 20.01-20.20 arranged in a 4-by-5 array. Those skilled in the art understand that the twenty leads are representative of the number of leads for an integrated circuit which may have more or less than 20 leads. Each lead is soldered or attached with a conductive adhesive to a terminal of theIC 2. Further details of the half-etched configuration of the leads 20.01-20.20 are shown inFIGS. 7 a 1, 7 a 2 and 7 a 3 which are discussed hereinafter.Traces high side mosfet 3 and interconnect them to terminals of theintegrated circuit 2.Lead 37 provides an external contact, preferably to a power supply line on a printed circuit board.Trace 44 interconnects the source of thelow side mosfet 4 to theintegrated circuit 2.Trace 47 connects the gate of thelow side mosfet 4 to theintegrated circuit 2. - High side mosfet
leadframe structure portion 30 has asource pad 34 that is half-etched to provide three raised surfaces 34.1-34.3 for contacting the source terminal ofmosfet 3 and three external leads 36.1-36.3 for contact an input power source (not shown). The raised surfaces 34.1-34.3 are rectangular in shape and surface 34.1 is slightly larger than the raised surfaces 34.2 and 34.3 for receiving thedownset 58 ofclip 55. The raised surfaces are provided by half-etching thesource pad 34. - Low side mosfet
leadframe structure portion 40 has asource pad 43 that is half-etched to provide five raised surfaces 43.1-43.5 for contacting the source ofmosfet 4 and external leads 41.1-41.5. Drain bars 42, 46 are also part of theleadframe structure portion 40 and they make mechanical and electrical contact with theconductive clip 50. SeeFIGS. 7 a 1-7 a 3 and 9. - Another embodiment of the invention has a conductive connection on the clips to laterally support a gang of clips and provide stability during clip attachment. See
FIG. 9 whereconductive connectors planar portion 56 a ofclip 55 andconductive connectors planar portion 52 ofclip 50. - Turning to
FIG. 9 , there is shown an exploded isometric view of the components of one embodiment of the invention in the order in which the components formodule leadframe structure 11 withsource pads module 12 while only IC terminals 20.01-20.20 are initially connected formodule 10. Instep 2 solder or conductive adhesive is applied to the top surfaces of the half-etched leads in a pattern corresponding to the surface. Instep 3 theIC 2 and themosfets step 4 another layer or solder or conductive adhesive is applied to the upper surfaces of the dies 2, 3 and 4. Instep 5 clips with downsets are attached via the solder or the adhesive applied instep 4. In the next step (not shown) the assembled multi-chip circuit is encapsulated by moldingcompound 70, then second half-etched at the bottom side to define the terminals. Finally, the non-conductive material or second molding compound is applied to fill in the gaps between terminals. - Embodiments described above solve bond wire problems by eliminating all bond wires among the dies to provide a completely wireless multi-chip module that includes an integrated circuit. Although embodiments are described with respect to a half-bridge circuit, such embodiments are exemplary only and not intended to limit the spirit or scope of the invention which may include multiple integrated circuits, passive devices and additional mosfets, power diodes, and IGBTs. By eliminating the bond wires the claimed invention avoids a number of problems inherent in bond wires such as forming strong metallurgical bonds between bond pads on dies and lead posts and mosfet interconnections. The structures and methods of assembly of the embodiments of the invention are highly efficient and eliminate the need for special wire bonding equipment. The resulting products have improved performance because eliminating the bond wires reduces the inherent inductance of the packaged circuit which will then have lower noise than equivalent circuits made with bond wires. Overall performance is improved due to direct conductive interconnection of integrated circuit bond pads. Using clips with downsets reduces the conventional space requirements of wired bonded devices. In addition, the perimeter of the resulting module is reduced compared to the equivalent perimeter of wire bonded modules. The half-etched leadframe structure interlocks the molding material to improve the overall sealing of the devices in molding compound. Using some double half-etched leadframe structures improves locking and sealing even further. The downsets for the clips stabilize bond line thickness by using the conductive clip downset terminals as standoff control.
- While the embodiments disclosed above show both devices flip-chip mounted, persons having ordinary skill in the art know that other configurations are possible. For example, the die attach pads, clips, downsets and traces can be reconfigured to provide two devices regularly mounted with their respective drains on separate die attach pads, a clip with a downset or other means for connecting the high side source to the low side drain, another clip connecting the low side source to external contacts for connection to ground and the die attach pad for the high side source connected to external leads for connection to a suitable power source.
- Still other configurations include one mosfet flip-chip mounted and the other mosfet regularly mounted with its drain on the die attach pad. Suitable clips, downsets and external leads interconnect the high side source to the low side drain, connect the source of the low side drain to external terminals connectable to ground and connect the high side drain to external terminals connectable to a power supply.
- Embodiments of the invention are fabricated with half-etching and double half-etching techniques for forming copper traces. Those skilled in the art know one or more process techniques for half-etching and double half-etching. In addition, applicant hereby incorporates by reference the entire disclosure of Provisional Application No. 61/834,206, filed Jun. 2, 2013, and assigned to the same assignee as this patent. The incorporated application shows improved techniques for forming pre-molded substrates with upper and lower land. That application discloses a method for manufacturing a pre-molded substrate with routed traces. It relies upon a number of steps beginning with providing a metal substrate having upper and lower surfaces; applying and patterning a first masking layer to expose one or more selected areas of the upper surface corresponding to one or more desired traces; partially etching the exposed surface area to form portions of the desired traces; covering the upper surface of the substrate with a second masking layer to protect the surfaces of the traces; patterning a third masking layer on lower surface of the substrate to expose one or more selected areas corresponding to contact lands; partially etching the exposed surface areas of the lower surface to form the contact lands and simultaneously fully etch the remaining portions of the exposed half-etched lower surface to finish forming the traces; and molding the substrate to fill the half-etched and fully etched areas to hold the traces in position and stiffen the pre-molded substrate.
- Turning to
FIGS. 10 a, 10 b and 10 c, they showmulti-component module 100 with aleadframe 200, an integrated circuit (IC) 120, a first orhigh side mosfet 130 and a second oflow side mosfet 140 and five passive components including anexternal input capacitor 150 and fourpassive components IC 120 if flip chip mounted on IC leads of theIC portion 220 of theleadframe 110. Themosfets mosfet portions leadframe 200. -
FIGS. 11 a, 11 b show the fully formedmodule 100. The module has a suitable half and/or doubleetched leadframe 110 in the form shown inFIG. 12 . The bottom surface of the module has exposed high andlow source pads - With reference to
FIGS. 12 and 10 a, 10 b, and 10 c, copper clips 132, 133 mechanically and electrically connect the drain terminal of low side mosfet 140 to the source of thehigh side mosfet 130 and to external leads 224.01-224.03 via raisedpad 246 and serve as landing pads for the terminals ofinput capacitor 150. SeeFIGS. 16 a, 16 b for details of a clip with a downset, inparticular clip 133. Theinput capacitor 150 has one terminal connected to the high side source by means ofclip 134 andpad 234. Its other terminal is connected to the low side drain by means ofclips pad 234. Thelower clip 132 has a lateral downset (not shown) for connecting the drain of the low side mosfet 140 to the source of thehigh side mosfet 130 via a raisedpad 233 on thehigh side portion 230 of theleadframe 200.Upper clip 133 has adownset 136 for connecting one terminal of the external input capacitor to raisedpad 246 which has external leads 224.01-224.03. Raisedpad 246 receives thedownset 136 ofclip 133.Clip 134 serves as a landing pad for the other terminal of theexternal input capacitor 150. Downset 135 onclip 134 connects to pad 225 which is connected to external leads 225.01-225.03. - The
high side portion 230 ofleadframe 200 has an L-shapedbase portion 231 with one or more raisedpads pad 233 of thehigh side portion 230 receives a lateral downset (not shown) oflower clip 132 that is coupled to the drain terminal of thelow side mosfet 240 and connects the drain of the low side mosfet 240 to the source of thehigh side mosfet 230. Raisedpads high side mosfet 230.Pad 236 connects the source of the high side mosfet to one terminal ofpassive component 214. Trace 222.01 connects to the other terminal ofpassive component 214 to theIC 120. - The
low side portion 240 of theleadframe 200 has abase portion 241 and raised pads 242-246.Pad 246 receives the downset fromlower copper clip 132 that is attached to the drain of thelow side mosfet 240. Pads 242-245 are mechanically and electrically connected to the source terminal of thelow side mosfet 240.Pad 245 mechanically and electrically connects the source terminal of the low side mosfet 240 topassive component 212. Trace 222.08 connects the other terminal ofpassive component 212 to theIC 120 and to output terminals 221.09-221.12. - The
IC portion 220 of the leadframe has a plurality of external leads 221.01-221.12 and a plurality of external-to-internal metal (copper) traces 222.01-222.08, each of which has one terminus at an external lead and an elongated body that extends toward another terminus within the plane of theIC portion 220 of the leadframe. Trace 222.07 has a terminus on one end that contacts two external leads and trace 222.08 has a terminus at one end that contact three external leads. Other elongated traces 223.01-223.04 are internal traces that have a terminus at one end for contacting a terminal of theIC 120, an elongated portion and terminus at the other end. Trace 223.01 connectsIC 120 to the source of thehigh side mosfet 230, trace 223.02 connectsIC 120 to the gate of thehigh side mosfet 230, trace 223.03 connectsIC 120 to the gate of thelow side mosfet 240 and trace 223.04 connectsIC 120 to the source of thelow side mosfet 240. - Those skilled in the art understand that the
leadframe 110 could be provided in the form of a pre-molded substrate having traces embedded in molding compound as shown and described in Provisional Application No. 61/834,206, filed Jun. 2, 2013, assigned to the same assignee as this patent and hereby entirely incorporated by reference. TheIC 120, themosfets leadframe 110. Solder paste of other conductive adhesive is applied to the pads, leads and traces for fixing thecomponents leadframe 110. Next one ormore copper clips mosfets pads leadframe 110. The solder, if used, is reflowed to fix the components to the leadframe. The assembly is then transfer injection molded to provide a four-sided module with exposedpads module 100. Portions of the molding compound on thetop surface 101 are etched or ground away to expose portions of the surface of the copper clips 134, 134. The exposed surfaces are treated with solder paste and theinput capacitor 150 is soldered to the exposed surfaces of theclips -
FIGS. 13 a, 13 b, and 13 c show another embodiment of the invention,multi-component module 300. One difference betweenmodule 100 andmodule 300 include aninput capacitor 350 which is small enough to fit inside a molded module. In addition, there are only two clips, 333, and 334.FIGS. 14 a, 14 b show the fully formedmodule 300. The module has a suitable half and/or doubleetched leadframe 500 in the form shown inFIG. 15 . The bottom surface of the module has exposed high andlow source pads FIG. 12 shows leadframe 500 which retains most of the features and structure of theleadframe 200 but replaces raisedpad 246 with asmaller pad 546 and replaces raisedpad 225 withpads input capacitor 350 has one terminal connected to the high side source by means ofclip 333 andclip post 536 andpad 525. Its other terminal is connected to the low side drain by means ofclips pad 546. Otherwise the rest of the components of themodule 300 are the same asmodule 100. The process for formingmodule 300 includes the step of soldering or using a conductive adhesive to attach theinput capacitor 350 to themosfets - Still further embodiments include partial pre-encapsulation of the
IC 120 innon-conductive material 75 and regular attachment of themosfets FIG. 3 andFIG. 4 . -
FIGS. 17 , 18, 19 and 20 a, 20 b, show further multichip embodiments using standard die attach mounting. InFIG. 17 the multichip module 600 has integratedcircuit 2 mounted on its leads 610.01-610.09. Although nine leads are shown those skilled in the art understand that there may be more or less leads depending upon the complexity of theintegrated circuit 2. - The
high side mosfet 3 is mounted with its drain attached to a high side die attachpad 624. External highside drain terminals pad 624. A highside source clip 620 has its lower surface electrically and mechanically attached to the source of thehigh side mosfet 3.Gate clip 621 connects the high side gate to theintegrated circuit 2. High side source lead 632 connects the high side source to theintegrated circuit 2.Downset 623 is integral with theclip 620 and extends down from theclip 620 to attach to the low side die attachpad 634 which has externalswitch node terminals 666. Another clip 628 connects the high side source to anexternal terminal 627. - The
low side mosfet 4 has its drain attached to low side die attachpad 634. As mentioned above, externalswitch node terminals 666 are integral with the low side die attachpad 634. A lowside source clip 630 has its lower surface electrically and mechanically attached to the source of thelow side mosfet 4.Lead 632 extends from the low source clip to a terminal of theintegrated circuit 2.Gate clip 631 connects the high side gate to theintegrated circuit 2.Downset 633 is integral with theclip 630 and extends down from theclip 630 to attach to low side sourceexternal terminals 636. - In the embodiment shown in
FIG. 19 , all components are encapsulated inmolding compound 670. In the embodiment shown inFIG. 19 , the terminals of the integrated circuit are molded in anon-conductive compound 675 and later further encapsulated in amolding compound 670 which protects themosfets - While illustrative embodiments have been illustrated and described, it will be appreciated that various changes can be made therein without departing from the spirit and scope of the invention.
Claims (39)
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Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20150001618A1 (en) * | 2013-06-28 | 2015-01-01 | Magnachip Semiconductor, Ltd. | Semiconductor package |
CN105374788A (en) * | 2015-10-20 | 2016-03-02 | 杰群电子科技(东莞)有限公司 | Stacked flip chip packaging structure and manufacture method thereof |
US20170256479A1 (en) * | 2014-06-24 | 2017-09-07 | Ibis Innotech Inc. | Package structure |
US10340210B2 (en) * | 2016-09-16 | 2019-07-02 | Texas Instruments Incorporated | System in package device including inductor |
WO2020021402A1 (en) * | 2018-07-24 | 2020-01-30 | International Business Machines Corporation | Multi-chip package structure having chip interconnection bridge which provides power connections between chip and package substrate |
DE102020119611A1 (en) | 2020-07-24 | 2022-01-27 | Infineon Technologies Ag | CIRCUIT ARRANGEMENT AND METHOD OF FORMING CIRCUIT ARRANGEMENT |
DE102018121308B4 (en) | 2017-09-01 | 2024-10-02 | Infineon Technologies Ag | transistor package with three-pin clip |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
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US9177925B2 (en) | 2013-04-18 | 2015-11-03 | Fairfchild Semiconductor Corporation | Apparatus related to an improved package including a semiconductor die |
US9735112B2 (en) | 2014-01-10 | 2017-08-15 | Fairchild Semiconductor Corporation | Isolation between semiconductor components |
US9468087B1 (en) | 2015-07-13 | 2016-10-11 | Texas Instruments Incorporated | Power module with improved cooling and method for making |
US10600724B2 (en) | 2016-05-10 | 2020-03-24 | Texas Instruments Incorporated | Leadframe with vertically spaced die attach pads |
US10930604B2 (en) | 2018-03-29 | 2021-02-23 | Semiconductor Components Industries, Llc | Ultra-thin multichip power devices |
CN109638002B (en) * | 2018-11-07 | 2021-01-29 | 华润微电子(重庆)有限公司 | Power circuit module and electronic device |
US20200194347A1 (en) * | 2018-12-18 | 2020-06-18 | Alpha And Omega Semiconductor (Cayman) Ltd. | Semiconductor package and method of making the same |
CN111627882B (en) * | 2019-02-28 | 2022-08-26 | 无锡华润安盛科技有限公司 | Packaging device and chip packaging method |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040130009A1 (en) * | 2002-10-03 | 2004-07-08 | Tangpuz Consuelo N. | Method for maintaining solder thickness in flipchip attach packaging processes |
US20050206010A1 (en) * | 2004-03-18 | 2005-09-22 | Noquil Jonathan A | Multi-flip chip on lead frame on over molded IC package and method of assembly |
US20060113664A1 (en) * | 2004-11-30 | 2006-06-01 | Masaki Shiraishi | Semiconductor device |
US20120168925A1 (en) * | 2011-01-03 | 2012-07-05 | International Rectifier Corporation | High Power Semiconductor Package with Conductive Clips and Flip Chip Driver IC |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7586179B2 (en) * | 2007-10-09 | 2009-09-08 | Fairchild Semiconductor Corporation | Wireless semiconductor package for efficient heat dissipation |
US7745892B1 (en) * | 2007-12-13 | 2010-06-29 | Rf Micro Devices, Inc. | Integrated MEMS switch |
US7915721B2 (en) * | 2008-03-12 | 2011-03-29 | Fairchild Semiconductor Corporation | Semiconductor die package including IC driver and bridge |
US8138585B2 (en) * | 2008-05-28 | 2012-03-20 | Fairchild Semiconductor Corporation | Four mosfet full bridge module |
KR100938094B1 (en) | 2008-03-14 | 2010-01-21 | 주식회사 하이닉스반도체 | Semiconductor memory device ans method for erase of the same |
US8358017B2 (en) | 2008-05-15 | 2013-01-22 | Gem Services, Inc. | Semiconductor package featuring flip-chip die sandwiched between metal layers |
SG142321A1 (en) * | 2008-04-24 | 2009-11-26 | Micron Technology Inc | Pre-encapsulated cavity interposer |
US8450149B2 (en) | 2009-10-16 | 2013-05-28 | Texas Instruments Incorporated | Stacked leadframe implementation for DC/DC convertor power module incorporating a stacked controller and stacked leadframe construction methodology |
US8148823B1 (en) * | 2009-12-14 | 2012-04-03 | Picor Corporation | Low loss package for electronic device |
US8115260B2 (en) * | 2010-01-06 | 2012-02-14 | Fairchild Semiconductor Corporation | Wafer level stack die package |
US8587101B2 (en) | 2010-12-13 | 2013-11-19 | International Rectifier Corporation | Multi-chip module (MCM) power quad flat no-lead (PQFN) semiconductor package utilizing a leadframe for electrical interconnections |
EP2482312A4 (en) | 2011-04-29 | 2012-09-26 | Huawei Tech Co Ltd | Power supply module and packaging and integrating method thereof |
-
2013
- 2013-09-06 US US14/020,775 patent/US9698143B2/en active Active
- 2013-09-06 US US14/020,782 patent/US20140070329A1/en not_active Abandoned
- 2013-09-09 CN CN201310407678.7A patent/CN103681575A/en active Pending
- 2013-09-09 TW TW102132525A patent/TW201415596A/en unknown
- 2013-09-09 WO PCT/US2013/058770 patent/WO2014039973A1/en active Application Filing
- 2013-09-09 KR KR1020130107936A patent/KR20140032923A/en not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040130009A1 (en) * | 2002-10-03 | 2004-07-08 | Tangpuz Consuelo N. | Method for maintaining solder thickness in flipchip attach packaging processes |
US20050206010A1 (en) * | 2004-03-18 | 2005-09-22 | Noquil Jonathan A | Multi-flip chip on lead frame on over molded IC package and method of assembly |
US20060113664A1 (en) * | 2004-11-30 | 2006-06-01 | Masaki Shiraishi | Semiconductor device |
US20120168925A1 (en) * | 2011-01-03 | 2012-07-05 | International Rectifier Corporation | High Power Semiconductor Package with Conductive Clips and Flip Chip Driver IC |
Cited By (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9601453B2 (en) * | 2013-06-28 | 2017-03-21 | Magnachip Semiconductor, Ltd. | Semiconductor package |
US9991192B2 (en) | 2013-06-28 | 2018-06-05 | Magnachip Semiconductor, Ltd. | Semiconductor package |
US20150001618A1 (en) * | 2013-06-28 | 2015-01-01 | Magnachip Semiconductor, Ltd. | Semiconductor package |
US20170256479A1 (en) * | 2014-06-24 | 2017-09-07 | Ibis Innotech Inc. | Package structure |
US9859193B2 (en) * | 2014-06-24 | 2018-01-02 | Ibis Innotech Inc. | Package structure |
CN105374788A (en) * | 2015-10-20 | 2016-03-02 | 杰群电子科技(东莞)有限公司 | Stacked flip chip packaging structure and manufacture method thereof |
WO2017067346A1 (en) * | 2015-10-20 | 2017-04-27 | 杰群电子科技(东莞)有限公司 | Stacked flip chip packaging structure and manufacturing method therefor |
US10943856B2 (en) | 2016-09-16 | 2021-03-09 | Texas Instruments Incorporated | System in package device including inductor |
US10340210B2 (en) * | 2016-09-16 | 2019-07-02 | Texas Instruments Incorporated | System in package device including inductor |
DE102018121308B4 (en) | 2017-09-01 | 2024-10-02 | Infineon Technologies Ag | transistor package with three-pin clip |
WO2020021402A1 (en) * | 2018-07-24 | 2020-01-30 | International Business Machines Corporation | Multi-chip package structure having chip interconnection bridge which provides power connections between chip and package substrate |
GB2588354A (en) * | 2018-07-24 | 2021-04-21 | Ibm | Multi-chip package structure having chip interconnection bridge which provides power connections between chip and package substrate |
GB2588354B (en) * | 2018-07-24 | 2021-08-25 | Ibm | Multi-chip package structure having chip interconnection bridge which provides power connections between chip and package substrate |
US10804204B2 (en) | 2018-07-24 | 2020-10-13 | International Business Machines Corporation | Multi-chip package structure having chip interconnection bridge which provides power connections between chip and package substrate |
DE102020119611A1 (en) | 2020-07-24 | 2022-01-27 | Infineon Technologies Ag | CIRCUIT ARRANGEMENT AND METHOD OF FORMING CIRCUIT ARRANGEMENT |
US11935874B2 (en) | 2020-07-24 | 2024-03-19 | Infineon Technologies Ag | Circuitry and method of forming a circuitry |
Also Published As
Publication number | Publication date |
---|---|
US20140071650A1 (en) | 2014-03-13 |
US9698143B2 (en) | 2017-07-04 |
KR20140032923A (en) | 2014-03-17 |
WO2014039973A1 (en) | 2014-03-13 |
TW201415596A (en) | 2014-04-16 |
CN103681575A (en) | 2014-03-26 |
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