US20130008227A1 - Shock and impact testing device and method - Google Patents

Shock and impact testing device and method Download PDF

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Publication number
US20130008227A1
US20130008227A1 US13/327,421 US201113327421A US2013008227A1 US 20130008227 A1 US20130008227 A1 US 20130008227A1 US 201113327421 A US201113327421 A US 201113327421A US 2013008227 A1 US2013008227 A1 US 2013008227A1
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US
United States
Prior art keywords
rod
platform
impact
impact head
shock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US13/327,421
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English (en)
Inventor
Di-Gang Zhai
Guang-Ming Wen
Yuan-Wang Liu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Hongfujin Precision Industry Shenzhen Co Ltd
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hongfujin Precision Industry Shenzhen Co Ltd, Hon Hai Precision Industry Co Ltd filed Critical Hongfujin Precision Industry Shenzhen Co Ltd
Assigned to HON HAI PRECISION INDUSTRY CO., LTD., HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD. reassignment HON HAI PRECISION INDUSTRY CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: LIU, YUAN-WANG, WEN, Guang-ming, ZHAI, DI-GANG
Publication of US20130008227A1 publication Critical patent/US20130008227A1/en
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M7/00—Vibration-testing of structures; Shock-testing of structures
    • G01M7/08—Shock-testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G01M99/005—Testing of complete machines, e.g. washing-machines or mobile phones

Definitions

  • the disclosure generally relates to shock and impact testing devices and methods, and particularly to a shock and impact testing device and method for electronic devices such as mobile phones.
  • a typical shock and impact testing device includes a platform, an impact head positioned on one side of the platform, an air cylinder aligned with the impact head and a lifting structure.
  • the platform is configured for supporting the electronic device.
  • the lifting structure drives the platform to rise to a height and then release the platform. The platform falls downwards until the impact head hits the air cylinder to simulate a shock and impact situation to test the electronic device.
  • a suitable height difference between the impact head and the air cylinder, and the pressure of the air cylinder is needed to obtain corresponding impact parameters such as a rebounding acceleration of the platform and a staying time of the impact head for the electronic devices.
  • FIG. 1 is a schematic view of a shock and impact module of a shock and impact device, according to an exemplary embodiment of the disclosure.
  • FIG. 2 is a block diagram of a control module of a shock and impact device, according to an exemplary embodiment of the disclosure.
  • an exemplary embodiment of shock and impact testing device 100 includes a shock and impact module 10 and a control module 30 electrically connected to the shock and impact module 10 .
  • the control module 30 receives impact parameters, computing the impact parameters to get testing parameters, and drives the shock and impact module 10 to execute shock and impact testing for an electronic device 200 according to the testing parameters.
  • the shock and impact module 10 includes a lifting structure 11 (schematically shown), an impact head 13 , an air cylinder 15 , a platform 17 secured to the lifting structure 11 , and a testing structure 19 .
  • the impact head 13 is position on the one side of the platform 17 facing the cylinder 15 .
  • the cylinder 15 has a rod 151 aligned with the impact head 13 .
  • the cylinder 15 is a piston-type air cylinder.
  • the platform 17 is configured for supporting the electronic device 200 .
  • the lifting structure 11 is configured for driving the platform 17 to rise to an appropriate height, and thus a height difference H, which is one of the testing parameters, between the impact head 13 and the rod 151 can meet an appropriate height difference.
  • a height difference H which is one of the testing parameters
  • the lifting structure 14 drives the platform 17 to rise to the appropriate height, and then releases the platform 17 , the platform 17 and the electronic device 200 falls freely until the impact head 13 hits the rod 151 .
  • the impact head 13 stays on the rod 151 for a period of time, which is one of the impact parameters and is defined as staying time D, and then rebounds back from the rod 151 with the platform 17 and the electronic device 200 .
  • the testing structure 19 is configured for testing a rebounding acceleration A, which is another impact parameter, of the platform 17 when the impact head 13 rebounds back from the rod 151 and the staying time D.
  • the testing structure 19 includes a first sensor 191 and a second sensor 193 , both of which are mounted on the platform 17 .
  • the first sensor 191 is configured to measure the rebounding acceleration A of the platform 17 and send the rebounding acceleration A to a display (not shown), and the second sensor 193 is configured to measure the staying time D and sends the staying time D to the display.
  • the control module 30 includes an interface 31 and a main controller 33 .
  • the interface 31 is configured for inputting the impact parameters including the rebounding acceleration A and the staying time D.
  • the main controller 33 includes a converting unit 331 and a controlling unit 333 connecting to the converting unit 331 .
  • the converting unit 331 is configured for receiving the impact parameters, and computing corresponding testing parameters to be set in the shock and impact module 10 such as the height difference H between the impact head 13 and the rod 151 , and the pressure P of the cylinder 15 , which is another testing parameter, according to the impact parameters.
  • the controlling unit 333 is configured for controlling the lifting structure 14 to drive the platform 17 to move to an appropriate height and adjusting the pressure P of the cylinder 15 according to the testing parameters.
  • a method of computing the height difference H between the impact head 13 and the rod 151 by the converting unit 331 may be illuminated as follow:
  • M is a total weight of the impact head 13 , the platform 17 and the electronic device 200 , and is a fixed value;
  • g is the acceleration of free fall.
  • ⁇ V (1+e) ⁇ square root over (2gH) ⁇ , wherein e is a restitution coefficient, and is a fixed value.
  • a method of computing the pressure P of the rod 151 by the converting unit 331 may be illuminated as follow:
  • the value of the rebounding acceleration A and the staying time D can be derived through the testing structure 19 , the value of end surface area S of the rod 151 can be calculated by inputting the values of the rebounding acceleration A and the determined pressure P of the cylinder 15 to the tenth formula:
  • the converting unit 331 can compute the pressure P of the cylinder 15 according to the tenth formula:
  • the suitable parameter can be obtained without executing the crash process for many times, which can save the testing time and decrease crash times of the shock and impact module 10 .

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
US13/327,421 2011-07-08 2011-12-15 Shock and impact testing device and method Abandoned US20130008227A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN2011101905943A CN102865988A (zh) 2011-07-08 2011-07-08 冲击试验机及其进行冲击试验的方法
CN201110190594.3 2011-07-08

Publications (1)

Publication Number Publication Date
US20130008227A1 true US20130008227A1 (en) 2013-01-10

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US13/327,421 Abandoned US20130008227A1 (en) 2011-07-08 2011-12-15 Shock and impact testing device and method

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US (1) US20130008227A1 (zh)
CN (1) CN102865988A (zh)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107340189A (zh) * 2017-07-27 2017-11-10 德清县蓝鸟照明电器有限公司 红外线防爆灯泡检测线
CN112147002A (zh) * 2020-09-27 2020-12-29 安徽万鼎工艺品有限公司 一种用于水烟壶制作的磨砂玻璃冲击测试装置
CN112326176A (zh) * 2020-11-10 2021-02-05 东莞市恒宇仪器有限公司 一种婴幼儿背带承载冲击试验机
CN113465862A (zh) * 2021-07-03 2021-10-01 中国飞机强度研究所 一种离散源分布式撞击试验装置及方法
KR102534938B1 (ko) * 2021-11-30 2023-05-26 국방과학연구소 절리암석 동적전단하중 재현을 위한 충격 낙하 테이블 시험장치

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104198146B (zh) * 2014-08-14 2017-01-25 东北农业大学 农业物料碰撞恢复系数测试平台
CN106124153A (zh) * 2016-08-19 2016-11-16 华侨大学 一种确定金属材料接触碰撞中恢复系数的试验装置
CN107219135B (zh) * 2017-04-21 2020-06-26 江苏大学 一种振动筛分过程中蝇蛆恢复系数的测试方法
CN110261055B (zh) * 2019-07-23 2024-04-30 中国人民解放军军事科学院国防工程研究院工程防护研究所 一种大型精密冲击试验系统
CN110954418A (zh) * 2019-12-12 2020-04-03 苏州苏试试验集团股份有限公司 一种小型冲击试验台的控制装置及其控制方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0688777A (ja) * 1991-03-04 1994-03-29 Hodogaya Giken:Kk 製品落下衝撃試験装置
US20070125152A1 (en) * 2005-12-02 2007-06-07 California Micro Devices Corporation Method and apparatus for dynamic impact testing

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0688777A (ja) * 1991-03-04 1994-03-29 Hodogaya Giken:Kk 製品落下衝撃試験装置
US20070125152A1 (en) * 2005-12-02 2007-06-07 California Micro Devices Corporation Method and apparatus for dynamic impact testing

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107340189A (zh) * 2017-07-27 2017-11-10 德清县蓝鸟照明电器有限公司 红外线防爆灯泡检测线
CN112147002A (zh) * 2020-09-27 2020-12-29 安徽万鼎工艺品有限公司 一种用于水烟壶制作的磨砂玻璃冲击测试装置
CN112326176A (zh) * 2020-11-10 2021-02-05 东莞市恒宇仪器有限公司 一种婴幼儿背带承载冲击试验机
CN113465862A (zh) * 2021-07-03 2021-10-01 中国飞机强度研究所 一种离散源分布式撞击试验装置及方法
KR102534938B1 (ko) * 2021-11-30 2023-05-26 국방과학연구소 절리암석 동적전단하중 재현을 위한 충격 낙하 테이블 시험장치

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AS Assignment

Owner name: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:ZHAI, DI-GANG;WEN, GUANG-MING;LIU, YUAN-WANG;REEL/FRAME:027392/0959

Effective date: 20111212

Owner name: HON HAI PRECISION INDUSTRY CO., LTD., TAIWAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:ZHAI, DI-GANG;WEN, GUANG-MING;LIU, YUAN-WANG;REEL/FRAME:027392/0959

Effective date: 20111212

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION