US20120312472A1 - Semiconductor device manufacturing apparatus - Google Patents
Semiconductor device manufacturing apparatus Download PDFInfo
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- US20120312472A1 US20120312472A1 US13/591,281 US201213591281A US2012312472A1 US 20120312472 A1 US20120312472 A1 US 20120312472A1 US 201213591281 A US201213591281 A US 201213591281A US 2012312472 A1 US2012312472 A1 US 2012312472A1
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 37
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 30
- 239000000463 material Substances 0.000 claims abstract description 134
- 238000005530 etching Methods 0.000 claims abstract description 63
- 238000000059 patterning Methods 0.000 claims abstract description 17
- 238000009966 trimming Methods 0.000 claims abstract description 17
- 239000011800 void material Substances 0.000 claims abstract description 9
- 229920002120 photoresistant polymer Polymers 0.000 claims description 38
- 239000000758 substrate Substances 0.000 claims description 18
- 239000010410 layer Substances 0.000 description 189
- 238000000034 method Methods 0.000 description 167
- 230000002093 peripheral effect Effects 0.000 description 13
- 238000000576 coating method Methods 0.000 description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 10
- 238000000206 photolithography Methods 0.000 description 9
- 239000002253 acid Substances 0.000 description 8
- 239000011248 coating agent Substances 0.000 description 7
- 229910052681 coesite Inorganic materials 0.000 description 5
- 229910052906 cristobalite Inorganic materials 0.000 description 5
- 238000001459 lithography Methods 0.000 description 5
- 239000000377 silicon dioxide Substances 0.000 description 5
- 229910052682 stishovite Inorganic materials 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 229910052905 tridymite Inorganic materials 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 238000001312 dry etching Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000001039 wet etching Methods 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 238000000231 atomic layer deposition Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000007654 immersion Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 239000002344 surface layer Substances 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
- H01L21/0334—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
- H01L21/0337—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/308—Chemical or electrical treatment, e.g. electrolytic etching using masks
- H01L21/3083—Chemical or electrical treatment, e.g. electrolytic etching using masks characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
- H01L21/3086—Chemical or electrical treatment, e.g. electrolytic etching using masks characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31144—Etching the insulating layers by chemical or physical means using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/105—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration including field-effect components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B99/00—Subject matter not provided for in other groups of this subclass
Definitions
- the present disclosure relates to a pattern forming method for forming a mask used in performing an etching process such as a plasma etching process or the like on a substrate such as a semiconductor wafer or the like; and also relates to a semiconductor device manufacturing method and a semiconductor device manufacturing apparatus.
- a microscopic circuit pattern has been formed by performing an etching process, e.g., a plasma etching process on a substrate such as a semiconductor wafer.
- a mask is formed by a photolithography process employing a photoresist.
- a double patterning In the double patterning, a two-step patterning is performed. In one step, a first pattern is formed by a first lithography process of performing coating, exposure and development processes on a photoresist; and in the other step, a second pattern is formed by a second lithography process of performing coating, exposure and development processes again on a photoresist after the first lithography process.
- a two-step patterning it is possible to form a mask having a finer gap in comparison to a mask formed by performing the patterning only once (for example, see Patent Document 1).
- Patent Document 1 U.S. Pat. No. 7,064,078
- the present disclosure provides a pattern forming method capable of accurately forming a microscopic pattern without performing the second exposure process, thereby simplifying the process in comparison to the conventional process and reducing the manufacturing cost of the semiconductor device; and also provides a semiconductor device manufacturing method and a semiconductor device manufacturing apparatus.
- a pattern forming method for forming a pattern of a predetermined shape which serves as a mask for etching an etching target layer on a substrate, the method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer; a second mask material removing process for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the side
- a pattern forming method for forming a pattern of a predetermined shape which serves as a mask for etching an etching target layer on a substrate, the method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming process for reducing a width of the first pattern and a
- a semiconductor device manufacturing method including a process for etching an etching target layer on a substrate through a mask, wherein the mask is formed by a pattern forming method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer; a second mask material removing process for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between
- a semiconductor device manufacturing method including a process for etching an etching target layer on a substrate through a mask, wherein the mask is formed by a pattern forming method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming process for reducing a width of the first pattern and
- a semiconductor device manufacturing apparatus for forming a mask for etching an etching target layer on a substrate, the apparatus including: a first pattern forming unit for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming unit for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming unit for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer; a second mask material removing unit for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching unit for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material
- a semiconductor device manufacturing apparatus for forming a mask for etching an etching target layer on a substrate, the apparatus including: a first pattern forming unit for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming unit for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming unit for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed; a boundary layer etching unit for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming unit for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- FIGS. 1A to 1G are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with an embodiment of the present disclosure
- FIG. 2 is a flowchart showing a process of the method of FIGS. 1A to 1G ;
- FIG. 3 is a block diagram showing a configuration of a semiconductor device manufacturing apparatus in accordance with the embodiment of the present disclosure
- FIGS. 4A to 4F are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with a second embodiment of the present disclosure
- FIG. 5 is a flowchart showing a process of the method of FIGS. 4A to 4F ;
- FIG. 6 is a diagram showing a configuration of a semiconductor device manufacturing apparatus in accordance with the second embodiment of the present disclosure
- FIGS. 7A to 7K are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with a third embodiment of the present disclosure
- FIGS. 8A to 8J are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with a fourth embodiment of the present disclosure.
- FIGS. 9A to 9C are views for explaining a pattern forming process by a sidewall transfer process.
- FIGS. 1A to 1G show enlarged schematic views of a part of a substrate in accordance with an embodiment of the present disclosure so as to illustrate a process of the present embodiment
- FIG. 2 is a flowchart showing the process of the present embodiment.
- formed on a substrate 101 is a multilayer of a first layer 102 , a second layer 103 and a third layer 104 which are made of different materials. Among these layers, at least one layer (the third layer 104 ) becomes an etching target layer.
- a first pattern forming process for forming a first pattern 105 which is made of a photoresist patterned in a predetermined pattern, by performing coating, exposure and development processes on the third layer 104 (Step 201 of FIG. 2 ).
- the photoresist (first mask material) for forming the first pattern 105 it is desirable to use an ArF resist so as to form a finer pattern, and a positive type chemically amplified resist may be used, for example.
- a boundary layer forming process for forming a boundary layer 106 at sidewall portions and top portions of the first pattern 105 (Step 202 of FIG. 2 ).
- the boundary layer 106 can be formed by a film forming process or by modifying surfaces of the sidewall portions and the top portions of the first pattern 105 ( FIG. 1B shows a case of the film forming process).
- the boundary layer 106 needs to be made of a material which can be selectively removed with respect to the photoresist constituting the first pattern 105 . In case that the boundary layer 106 is formed by the film forming process, SiO 2 can be appropriately used as the material, for example.
- boundary layer 106 In case of forming the boundary layer 106 by using SiO 2 , it is necessary to perform the film forming process at a temperature lower than a heat resistant temperature of the first pattern 105 , and for example, a low temperature CVD (Chemical Vapor Deposition) or an ALD (Atomic Layer Deposition) is performed.
- a thickness of the boundary layer 106 is set to be, for example, about 5 to 20 nm.
- a second mask material layer forming process for forming a second mask material layer 107 so as to cover surfaces of the boundary layer 106 (Step 203 of FIG. 2 ).
- the second mask material layer 107 needs to be made of a material which allows the boundary layer 106 to be selectively removed, and a photoresist or an organic film can be used, for example.
- a photoresist or an organic film can be used, for example.
- the photoresist it may be possible to use the same photoresist as the photoresist constituting the first pattern 105 or use a different kind of photoresist (e.g., a KrF resist if the first pattern 105 is made of an ArF resist).
- the second mask material layer 107 can be formed through a coating process by a spin coating apparatus or through a film forming process by a CVD apparatus.
- a second mask material removing process for removing a part (surface layer) of the second mask material layer 107 till top portions of the boundary layer 106 are exposed (Step 204 of FIG. 2 ).
- this second mask material removing process there may be used a removing method by melting with liquid chemical, a removing method by a dry etching or a chemical and physical removing method by a CMP.
- a boundary layer etching process for forming a second pattern made of the second mask material layer 107 by selectively etching and removing the boundary layer 106 with respect to the first pattern 105 and the second mask material layer 107 (Step 205 of FIG. 2 ).
- the boundary layer 106 is formed by modifying, for example, SiO 2 or the photoresist, it is easy to selectively etch the boundary layer 106 with respect to the first pattern 105 made of the photoresist and the second mask material layer 107 made of the photoresist or the organic film.
- the boundary layer etching process can be performed by, e.g., a dry etching or a wet etching using dilute hydrofluoric acid.
- the trimming process can be performed by, for example, an immersion method in a developing solution having a high temperature or a high concentration for a long period of time; a developing method after a coating process with an acid material or an exposing process to an acid vapor atmosphere; a method of performing a pre-processing of an immersion process in a developing solution having a high temperature or a high concentration for a long period of time and then performing a developing process after a coating process with an acid material or an exposing process to an acid vapor atmosphere; or a method of performing a coating process with an acid material or an exposing process to an acid vapor atmosphere and then performing a developing process after coating a top portion of a pattern with an amine-based material neutralizing the acid or exposing it to a vapor atmosphere.
- a pattern serving as an etching mask is formed. Further, by using this pattern as a mask, performed is an etching process on the third layer 104 as a lower layer or the like, as illustrated in FIG. 1G .
- the pattern forming method in accordance with the present embodiment it is possible to form a pattern as fine as that of the conventional double patterning by performing only the first exposure process for forming the first pattern 105 without requiring a second exposure process. Therefore, there is no need for an alignment to be performed in the second exposure process and there occurs no misalignment during the alignment. Accordingly, it is possible to accurately form a pattern and to simplify the process in comparison to the conventional process, thereby reducing a manufacturing cost of a semiconductor device.
- FIG. 3 shows a configuration of a semiconductor device manufacturing apparatus for performing the above-stated pattern forming method.
- a semiconductor device manufacturing apparatus 300 includes a first pattern forming unit 301 , a boundary layer forming unit 302 , a second mask material layer forming unit 303 , a second mask material removing unit 304 , a boundary layer etching unit 305 and a trimming unit 306 . Further, each of these units is connected to each other by a substrate transfer path 310 for transferring a substrate such as a semiconductor wafer or the like.
- the first pattern forming unit 301 is used for forming the first pattern 105 , and includes a coating device, an exposure device, a developing device and the like.
- the boundary layer forming unit 302 is used for forming the boundary layer 106 , and includes a film forming apparatus such as a CVD apparatus or a surface modifying apparatus for modifying the surfaces of the sidewall portions and the top portions of the first pattern 105 .
- the second mask material layer forming unit 303 is used for forming the second mask material layer 107 , and includes a coating device for coating a photoresist or a film forming apparatus for forming an organic film.
- the second mask material removing unit 304 is used for performing the second mask material removing process which removes a part of the second mask material layer 107 till the top portion of the boundary layer 106 is exposed, and includes a wet or dry etching apparatus, or a CMP apparatus.
- the boundary layer etching unit 305 is used for performing the boundary layer etching process in which the boundary layer 106 is selectively etched and removed with respect to the first pattern 105 and the second mask material layer 107 , and includes a wet or dry etching apparatus.
- the trimming unit 306 is used for performing the trimming process, and includes an apparatus for immersing a semiconductor wafer into liquid chemical such as a developing solution or for exposing the semiconductor wafer to a vapor atmosphere. With the semiconductor device manufacturing apparatus 300 configured as stated above, it is possible to perform a series of the processes in the above-stated embodiment.
- FIGS. 4A to 4F are enlarged schematic views of a part of a substrate in accordance with the second embodiment so as to illustrate a process of the second embodiment
- FIG. 5 is a flowchart showing the process of the second embodiment.
- a second mask material layer 107 is formed so that a top portion of a boundary layer 106 is exposed in a second mask material layer forming process (Step 403 of FIG. 5 ). Therefore, the second embodiment does not include a process corresponding to the second mask material removing process (Step 204 of FIG. 2 ) performed in the first embodiment.
- these materials are selected so that a wettability of the boundary layer 106 is lower with respect to the second mask material (for example, different materials having polarity), and a liquid phase second mask material may be coated onto the boundary layer 106 to realize this process.
- FIG. 6 illustrates a configuration of a semiconductor device manufacturing apparatus for performing the pattern forming method in accordance with the second embodiment.
- a semiconductor device manufacturing apparatus 300 a includes a first pattern forming unit 301 , a boundary layer forming unit 302 , a second mask material layer forming unit 303 , a boundary layer etching unit 305 and a trimming unit 306 . Further, each of these units is connected to each other by a substrate transfer path 310 for transferring a substrate such as a semiconductor wafer or the like. That is, the semiconductor device manufacturing apparatus 300 a is different from the semiconductor device manufacturing apparatus 300 illustrated in FIG. 3 only in that it does not include the second mask material removing unit 304 . With the semiconductor device manufacturing apparatus 300 a configured as stated above, it is possible to perform a series of the processes in the second embodiment.
- a repeated pattern of a narrow pitch formed by the above-stated process can be used in a semiconductor device such as a NAND-type flash memory.
- a method for forming the repeated pattern of a narrow pitch there has been conventionally known a method employing, for example, a so-called sidewall transfer process.
- a film 602 serving as a mask is formed at sidewalls of a first pattern 601 formed by a lithography process using a photoresist, and by removing the first pattern 601 formed first, two patterns are formed from one pattern, thereby forming a pattern of a narrow pitch.
- a pattern formed at the sidewalls of the first pattern 601 is formed in a loop shape throughout the entire periphery of the sidewalls.
- a second photolithography process so as to remove an unnecessary part of this loop (end loop).
- the first pattern 601 is removed from a state illustrated in FIG. 9C , and the pattern at the sidewalls is used as a mask. If a pattern of a peripheral circuit or the like is formed at the periphery of the repeated pattern described above, a third photolithography process is performed to form the pattern of the peripheral circuit or the like.
- the pattern of the peripheral circuit connected with the repeated pattern can not be formed during the first photolithography process. Further, since the second photolithography process is performed to remove the end loop, the pattern connected with the repeated pattern can not be formed without performing this process.
- the part of the first pattern 105 made of the photoresist formed in the first pattern forming process remains as a part of the repeated pattern in the end, it is possible to form a pattern of a peripheral circuit partially connected with the repeated pattern during the photolithography process of the first pattern forming process.
- FIGS. 7A to 7K illustrate a process of a third embodiment of forming a memory cell unit having a repeated pattern of a narrow pitch such as a NAND-type flash memory and a peripheral circuit electrically connected with this memory cell unit, and schematically illustrate cross-sectional configurations thereof in upper sides and plane configurations thereof in lower sides.
- a part of the peripheral circuit pattern portion 502 may be connected with the repeated pattern portion 501 .
- FIGS. 7B to 7D performed are a boundary layer forming process ( FIG. 7B ) for forming a boundary layer 106 as illustrated in FIG. 1B , a second mask material layer forming process ( FIG. 7C ) for forming a second mask material layer 107 to cover a surface of the boundary layer 106 , and a second mask material removing process ( FIG. 7D ) for removing a part (surface layer) of the second mask material layer 107 till top portions of the boundary layer 106 are exposed.
- a boundary layer forming process FIG. 7B
- FIG. 7C a second mask material layer forming process
- FIG. 7D second mask material removing process
- a second boundary layer forming process for forming a second boundary layer 120 made of a material (e.g., SiO 2 or the like), which can be selectively removed with respect to a photoresist, on the second mask material layer 107 and the boundary layer 106 .
- a material e.g., SiO 2 or the like
- a third mask material layer forming process for forming a third mask material layer 121 , which is made of a photoresist and formed in a predetermined pattern, on the second boundary layer 120 .
- the third mask material layer 121 is formed in a pattern capable of removing unnecessary parts of the second mask material layer 107 .
- FIG. 7G a process of etching the second boundary layer 120 into a predetermined pattern by using the third mask material layer 121 as a mask
- FIG. 7H an etching process of etching the unnecessary parts of the second mask material layer 107 by using the second boundary layer 120 of the predetermined pattern as a mask.
- FIG. 7I a process ( FIG. 7I ), which corresponds to the boundary layer etching process as illustrated in FIG. 1E , for etching the boundary layer 106
- FIG. 7J a process corresponding to the trimming process for reducing a width of the first pattern 105 and a width of the second pattern made of the second mask material layer 107 to predetermined widths as illustrated in FIG. 1F .
- a pattern serving as an etching mask is formed.
- FIG. 7K a process ( FIG. 7K ), which corresponds to the etching process as illustrated in FIG. 1G , for etching a third layer 104 and the like as a lower layer.
- FIGS. 8A to 8J schematically illustrate cross-sectional configurations thereof in the upper side and plane configurations thereof in the lower side.
- a part of the peripheral circuit pattern portion 502 may be connected with the repeated pattern portion 501 .
- FIGS. 8B and 8C performed are a boundary layer forming process ( FIG. 8B ) for forming a boundary layer 106 as illustrated in FIG. 4B , and a second mask material layer forming process ( FIG. 8C ) for forming a second mask material layer 107 so that top portions of the boundary layer 106 are exposed.
- a second boundary layer forming process for forming a second boundary layer 120 made of a material (e.g., SiO 2 or the like), which can be selectively removed with respect to the photoresist, on the second mask material layer 107 and the boundary layer 106 .
- a material e.g., SiO 2 or the like
- a third mask material layer forming process for forming a third mask material layer 121 , which is made of a photoresist formed in a predetermined pattern, on the second boundary layer 120 .
- the third mask material layer 121 is formed in a pattern capable of removing unnecessary parts of the second mask material layer 107 .
- FIG. 8F a process of etching the second boundary layer 120 into a predetermined pattern by using the third mask material layer 121 as a mask
- FIG. 8G an etching process of etching the unnecessary parts of the second mask material layer 107 by using the second boundary layer 120 of the predetermined pattern as a mask.
- FIG. 8H a process which corresponds to the boundary layer etching process as illustrated in FIG. 4D , for etching the boundary layer 106
- FIG. 8I a process corresponding to the trimming process for reducing a width of the first pattern 105 and a width of the second pattern made of the second mask material layer 107 to predetermined widths as illustrated in FIG. 4E .
- FIG. 8J a process corresponding to the etching process as illustrated in FIG. 4F , for etching a third layer 104 and the like as a lower layer.
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- Condensed Matter Physics & Semiconductors (AREA)
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- Computer Hardware Design (AREA)
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- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
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Abstract
A semiconductor device manufacturing apparatus includes: a first pattern forming unit for forming a first pattern by patterning a first mask material layer; a boundary layer forming unit for forming a boundary layer at sidewall portions and top portions of the first pattern; a second mask material layer forming unit for forming a second mask material layer so as to cover a surface of the boundary layer; a second mask material removing unit for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching unit for forming a second pattern by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming unit for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
Description
- The present disclosure relates to a pattern forming method for forming a mask used in performing an etching process such as a plasma etching process or the like on a substrate such as a semiconductor wafer or the like; and also relates to a semiconductor device manufacturing method and a semiconductor device manufacturing apparatus.
- Conventionally, in a manufacturing process for a semiconductor device or the like, a microscopic circuit pattern has been formed by performing an etching process, e.g., a plasma etching process on a substrate such as a semiconductor wafer. In this etching process, a mask is formed by a photolithography process employing a photoresist.
- With respect to this photolithography process, there have been developed various techniques so as to keep up with the miniaturization of a pattern to be formed. One example is so-called a double patterning. In the double patterning, a two-step patterning is performed. In one step, a first pattern is formed by a first lithography process of performing coating, exposure and development processes on a photoresist; and in the other step, a second pattern is formed by a second lithography process of performing coating, exposure and development processes again on a photoresist after the first lithography process. By performing the two-step patterning, it is possible to form a mask having a finer gap in comparison to a mask formed by performing the patterning only once (for example, see Patent Document 1).
- Patent Document 1: U.S. Pat. No. 7,064,078
- As stated above, in the double patterning technique, exposure processes are performed two times while lithography processes are performed two times. As a result, there have been problems that the process becomes complicated and the manufacturing cost of a semiconductor device increases; and there have been other problems that it is difficult to accurately perform an alignment with respect to a first exposure process in a second exposure process and it is difficult to accurately perform the patterning.
- In view of the foregoing, the present disclosure provides a pattern forming method capable of accurately forming a microscopic pattern without performing the second exposure process, thereby simplifying the process in comparison to the conventional process and reducing the manufacturing cost of the semiconductor device; and also provides a semiconductor device manufacturing method and a semiconductor device manufacturing apparatus.
- In accordance with one aspect of the present disclosure, there is provided a pattern forming method for forming a pattern of a predetermined shape which serves as a mask for etching an etching target layer on a substrate, the method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer; a second mask material removing process for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming process for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- In accordance with another aspect of the present disclosure, there is provided a pattern forming method for forming a pattern of a predetermined shape which serves as a mask for etching an etching target layer on a substrate, the method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming process for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- In accordance with still another aspect of the present disclosure, there is provided a semiconductor device manufacturing method including a process for etching an etching target layer on a substrate through a mask, wherein the mask is formed by a pattern forming method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer; a second mask material removing process for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming process for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- In accordance with still another aspect of the present disclosure, there is provided a semiconductor device manufacturing method including a process for etching an etching target layer on a substrate through a mask, wherein the mask is formed by a pattern forming method including: a first pattern forming process for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming process for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming process for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed; a boundary layer etching process for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming process for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- In accordance with still another aspect of the present disclosure, there is provided a semiconductor device manufacturing apparatus for forming a mask for etching an etching target layer on a substrate, the apparatus including: a first pattern forming unit for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming unit for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming unit for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer; a second mask material removing unit for removing a part of the second mask material layer to expose top portions of the boundary layer; a boundary layer etching unit for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming unit for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- In accordance with still another aspect of the present disclosure, there is provided a semiconductor device manufacturing apparatus for forming a mask for etching an etching target layer on a substrate, the apparatus including: a first pattern forming unit for forming a first pattern by patterning a first mask material layer made of a photoresist; a boundary layer forming unit for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern; a second mask material layer forming unit for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed; a boundary layer etching unit for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and a trimming unit for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
- The disclosure may best be understood by reference to the following description taken in conjunction with the following figures:
-
FIGS. 1A to 1G are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with an embodiment of the present disclosure; -
FIG. 2 is a flowchart showing a process of the method ofFIGS. 1A to 1G ; -
FIG. 3 is a block diagram showing a configuration of a semiconductor device manufacturing apparatus in accordance with the embodiment of the present disclosure; -
FIGS. 4A to 4F are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with a second embodiment of the present disclosure; -
FIG. 5 is a flowchart showing a process of the method ofFIGS. 4A to 4F ; -
FIG. 6 is a diagram showing a configuration of a semiconductor device manufacturing apparatus in accordance with the second embodiment of the present disclosure; -
FIGS. 7A to 7K are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with a third embodiment of the present disclosure; -
FIGS. 8A to 8J are views for explaining a pattern forming method and a semiconductor device manufacturing method in accordance with a fourth embodiment of the present disclosure; and -
FIGS. 9A to 9C are views for explaining a pattern forming process by a sidewall transfer process. -
- 101: substrate
- 102: first layer
- 103: second layer
- 104: third layer
- 105: first pattern
- 106: boundary layer
- 107: second mask material layer
- Hereinafter, embodiments of the present disclosure will be described in detail with reference to the accompanying drawings.
-
FIGS. 1A to 1G show enlarged schematic views of a part of a substrate in accordance with an embodiment of the present disclosure so as to illustrate a process of the present embodiment, andFIG. 2 is a flowchart showing the process of the present embodiment. As illustrated inFIGS. 1A to 1G , formed on asubstrate 101 is a multilayer of afirst layer 102, asecond layer 103 and athird layer 104 which are made of different materials. Among these layers, at least one layer (the third layer 104) becomes an etching target layer. - First, as illustrated in
FIG. 1A , performed is a first pattern forming process for forming afirst pattern 105, which is made of a photoresist patterned in a predetermined pattern, by performing coating, exposure and development processes on the third layer 104 (Step 201 ofFIG. 2 ). As the photoresist (first mask material) for forming thefirst pattern 105, it is desirable to use an ArF resist so as to form a finer pattern, and a positive type chemically amplified resist may be used, for example. - Subsequently, as illustrated in
FIG. 1B , performed is a boundary layer forming process for forming aboundary layer 106 at sidewall portions and top portions of the first pattern 105 (Step 202 ofFIG. 2 ). Theboundary layer 106 can be formed by a film forming process or by modifying surfaces of the sidewall portions and the top portions of the first pattern 105 (FIG. 1B shows a case of the film forming process). Theboundary layer 106 needs to be made of a material which can be selectively removed with respect to the photoresist constituting thefirst pattern 105. In case that theboundary layer 106 is formed by the film forming process, SiO2 can be appropriately used as the material, for example. In case of forming theboundary layer 106 by using SiO2, it is necessary to perform the film forming process at a temperature lower than a heat resistant temperature of thefirst pattern 105, and for example, a low temperature CVD (Chemical Vapor Deposition) or an ALD (Atomic Layer Deposition) is performed. A thickness of theboundary layer 106 is set to be, for example, about 5 to 20 nm. Meanwhile, in case of forming theboundary layer 106 by modifying the surfaces of the sidewall portions and the top portions of thefirst pattern 105, it is possible to employ a method of silylating by using an HMDS or the like, or a method of oxidizing by supplying acid to the photoresist. - Thereafter, as illustrated in
FIG. 1C , performed is a second mask material layer forming process for forming a secondmask material layer 107 so as to cover surfaces of the boundary layer 106 (Step 203 ofFIG. 2 ). The secondmask material layer 107 needs to be made of a material which allows theboundary layer 106 to be selectively removed, and a photoresist or an organic film can be used, for example. In case of using the photoresist, it may be possible to use the same photoresist as the photoresist constituting thefirst pattern 105 or use a different kind of photoresist (e.g., a KrF resist if thefirst pattern 105 is made of an ArF resist). In this case, the secondmask material layer 107 can be formed through a coating process by a spin coating apparatus or through a film forming process by a CVD apparatus. - Further, as illustrated in
FIG. 1D , performed is a second mask material removing process for removing a part (surface layer) of the secondmask material layer 107 till top portions of theboundary layer 106 are exposed (Step 204 ofFIG. 2 ). In this second mask material removing process, there may be used a removing method by melting with liquid chemical, a removing method by a dry etching or a chemical and physical removing method by a CMP. - Subsequently, as illustrated in
FIG. 1E , performed is a boundary layer etching process for forming a second pattern made of the secondmask material layer 107 by selectively etching and removing theboundary layer 106 with respect to thefirst pattern 105 and the second mask material layer 107 (Step 205 ofFIG. 2 ). In this case, since theboundary layer 106 is formed by modifying, for example, SiO2 or the photoresist, it is easy to selectively etch theboundary layer 106 with respect to thefirst pattern 105 made of the photoresist and the secondmask material layer 107 made of the photoresist or the organic film. The boundary layer etching process can be performed by, e.g., a dry etching or a wet etching using dilute hydrofluoric acid. - Thereafter, as illustrated in
FIG. 1F , performed is a trimming process for reducing a width of thefirst pattern 105 and a width of the second pattern made of the secondmask material layer 107 to predetermined widths (Step 206 ofFIG. 2 ). The trimming process can be performed by, for example, an immersion method in a developing solution having a high temperature or a high concentration for a long period of time; a developing method after a coating process with an acid material or an exposing process to an acid vapor atmosphere; a method of performing a pre-processing of an immersion process in a developing solution having a high temperature or a high concentration for a long period of time and then performing a developing process after a coating process with an acid material or an exposing process to an acid vapor atmosphere; or a method of performing a coating process with an acid material or an exposing process to an acid vapor atmosphere and then performing a developing process after coating a top portion of a pattern with an amine-based material neutralizing the acid or exposing it to a vapor atmosphere. - Through performing the above-stated process, a pattern serving as an etching mask is formed. Further, by using this pattern as a mask, performed is an etching process on the
third layer 104 as a lower layer or the like, as illustrated inFIG. 1G . - As stated above, in the pattern forming method in accordance with the present embodiment, it is possible to form a pattern as fine as that of the conventional double patterning by performing only the first exposure process for forming the
first pattern 105 without requiring a second exposure process. Therefore, there is no need for an alignment to be performed in the second exposure process and there occurs no misalignment during the alignment. Accordingly, it is possible to accurately form a pattern and to simplify the process in comparison to the conventional process, thereby reducing a manufacturing cost of a semiconductor device. -
FIG. 3 shows a configuration of a semiconductor device manufacturing apparatus for performing the above-stated pattern forming method. As illustrated inFIG. 3 , a semiconductordevice manufacturing apparatus 300 includes a firstpattern forming unit 301, a boundarylayer forming unit 302, a second mask materiallayer forming unit 303, a second maskmaterial removing unit 304, a boundarylayer etching unit 305 and atrimming unit 306. Further, each of these units is connected to each other by asubstrate transfer path 310 for transferring a substrate such as a semiconductor wafer or the like. - The first
pattern forming unit 301 is used for forming thefirst pattern 105, and includes a coating device, an exposure device, a developing device and the like. The boundarylayer forming unit 302 is used for forming theboundary layer 106, and includes a film forming apparatus such as a CVD apparatus or a surface modifying apparatus for modifying the surfaces of the sidewall portions and the top portions of thefirst pattern 105. The second mask materiallayer forming unit 303 is used for forming the secondmask material layer 107, and includes a coating device for coating a photoresist or a film forming apparatus for forming an organic film. The second maskmaterial removing unit 304 is used for performing the second mask material removing process which removes a part of the secondmask material layer 107 till the top portion of theboundary layer 106 is exposed, and includes a wet or dry etching apparatus, or a CMP apparatus. The boundarylayer etching unit 305 is used for performing the boundary layer etching process in which theboundary layer 106 is selectively etched and removed with respect to thefirst pattern 105 and the secondmask material layer 107, and includes a wet or dry etching apparatus. Thetrimming unit 306 is used for performing the trimming process, and includes an apparatus for immersing a semiconductor wafer into liquid chemical such as a developing solution or for exposing the semiconductor wafer to a vapor atmosphere. With the semiconductordevice manufacturing apparatus 300 configured as stated above, it is possible to perform a series of the processes in the above-stated embodiment. - Hereinafter, a second embodiment will be described with reference to
FIGS. 4A to 6 .FIGS. 4A to 4F are enlarged schematic views of a part of a substrate in accordance with the second embodiment so as to illustrate a process of the second embodiment, andFIG. 5 is a flowchart showing the process of the second embodiment. In the second embodiment, as illustrated inFIG. 4C , a secondmask material layer 107 is formed so that a top portion of aboundary layer 106 is exposed in a second mask material layer forming process (Step 403 ofFIG. 5 ). Therefore, the second embodiment does not include a process corresponding to the second mask material removing process (Step 204 ofFIG. 2 ) performed in the first embodiment. In this manner, in order to form the secondmask material layer 107 so that the top portion of theboundary layer 106 is exposed, these materials are selected so that a wettability of theboundary layer 106 is lower with respect to the second mask material (for example, different materials having polarity), and a liquid phase second mask material may be coated onto theboundary layer 106 to realize this process. - In addition, the other processes are performed in the same manner as in the first embodiment so that the explanation thereof is omitted. In the second embodiment, it is possible to obtain the same effect as that of the first embodiment and also, as stated above, it is possible to omit the second mask material removing process so that the process can be more simplified.
-
FIG. 6 illustrates a configuration of a semiconductor device manufacturing apparatus for performing the pattern forming method in accordance with the second embodiment. As illustrated inFIG. 6 , a semiconductordevice manufacturing apparatus 300 a includes a firstpattern forming unit 301, a boundarylayer forming unit 302, a second mask materiallayer forming unit 303, a boundarylayer etching unit 305 and atrimming unit 306. Further, each of these units is connected to each other by asubstrate transfer path 310 for transferring a substrate such as a semiconductor wafer or the like. That is, the semiconductordevice manufacturing apparatus 300 a is different from the semiconductordevice manufacturing apparatus 300 illustrated inFIG. 3 only in that it does not include the second maskmaterial removing unit 304. With the semiconductordevice manufacturing apparatus 300 a configured as stated above, it is possible to perform a series of the processes in the second embodiment. - A repeated pattern of a narrow pitch formed by the above-stated process can be used in a semiconductor device such as a NAND-type flash memory. As a method for forming the repeated pattern of a narrow pitch, there has been conventionally known a method employing, for example, a so-called sidewall transfer process.
- In the sidewall transfer process, as illustrated in
FIGS. 9A to 9C , afilm 602 serving as a mask is formed at sidewalls of afirst pattern 601 formed by a lithography process using a photoresist, and by removing thefirst pattern 601 formed first, two patterns are formed from one pattern, thereby forming a pattern of a narrow pitch. - In this case, as illustrated in
FIG. 9A , a pattern formed at the sidewalls of thefirst pattern 601 is formed in a loop shape throughout the entire periphery of the sidewalls. For this reason, as illustrated inFIG. 9B , performed is a second photolithography process so as to remove an unnecessary part of this loop (end loop). Subsequently, thefirst pattern 601 is removed from a state illustrated inFIG. 9C , and the pattern at the sidewalls is used as a mask. If a pattern of a peripheral circuit or the like is formed at the periphery of the repeated pattern described above, a third photolithography process is performed to form the pattern of the peripheral circuit or the like. - This is because that in case of forming the pattern of the peripheral circuit partially connected with the repeated pattern, since the repeated pattern is formed at the sidewalls of the
first pattern 601 as described above, the pattern of the peripheral circuit connected with the repeated pattern can not be formed during the first photolithography process. Further, since the second photolithography process is performed to remove the end loop, the pattern connected with the repeated pattern can not be formed without performing this process. - Contrary to this, in the aforementioned embodiments, since the part of the
first pattern 105 made of the photoresist formed in the first pattern forming process remains as a part of the repeated pattern in the end, it is possible to form a pattern of a peripheral circuit partially connected with the repeated pattern during the photolithography process of the first pattern forming process. -
FIGS. 7A to 7K illustrate a process of a third embodiment of forming a memory cell unit having a repeated pattern of a narrow pitch such as a NAND-type flash memory and a peripheral circuit electrically connected with this memory cell unit, and schematically illustrate cross-sectional configurations thereof in upper sides and plane configurations thereof in lower sides. - In the third embodiment, as illustrated in
FIG. 7A , during a process corresponding to the first pattern forming process illustrated inFIG. 1A , formed are a repeatedpattern portion 501 in which a plurality of same patterns is formed at a predetermined distance and a peripheralcircuit pattern portion 502 formed at a periphery of the repeatedpattern portion 501. A part of the peripheralcircuit pattern portion 502 may be connected with the repeatedpattern portion 501. - Subsequently, as illustrated in
FIGS. 7B to 7D , performed are a boundary layer forming process (FIG. 7B ) for forming aboundary layer 106 as illustrated inFIG. 1B , a second mask material layer forming process (FIG. 7C ) for forming a secondmask material layer 107 to cover a surface of theboundary layer 106, and a second mask material removing process (FIG. 7D ) for removing a part (surface layer) of the secondmask material layer 107 till top portions of theboundary layer 106 are exposed. - Thereafter, there is performed a second boundary layer forming process (
FIG. 7E ) for forming asecond boundary layer 120 made of a material (e.g., SiO2 or the like), which can be selectively removed with respect to a photoresist, on the secondmask material layer 107 and theboundary layer 106. - Then, performed is a third mask material layer forming process (
FIG. 7F ) for forming a thirdmask material layer 121, which is made of a photoresist and formed in a predetermined pattern, on thesecond boundary layer 120. The thirdmask material layer 121 is formed in a pattern capable of removing unnecessary parts of the secondmask material layer 107. - Subsequently, there are performed a process (
FIG. 7G ) of etching thesecond boundary layer 120 into a predetermined pattern by using the thirdmask material layer 121 as a mask, and an etching process (FIG. 7H ) of etching the unnecessary parts of the secondmask material layer 107 by using thesecond boundary layer 120 of the predetermined pattern as a mask. - Thereafter, performed is a process (
FIG. 7I ), which corresponds to the boundary layer etching process as illustrated inFIG. 1E , for etching theboundary layer 106, and then performed is a process (FIG. 7J ) corresponding to the trimming process for reducing a width of thefirst pattern 105 and a width of the second pattern made of the secondmask material layer 107 to predetermined widths as illustrated inFIG. 1F . As a result, a pattern serving as an etching mask is formed. Further, by using this pattern as a mask, performed is a process (FIG. 7K ), which corresponds to the etching process as illustrated inFIG. 1G , for etching athird layer 104 and the like as a lower layer. - As stated above, in the third embodiment, by performing the photolithography processes two times, it is possible to form the repeated pattern and the pattern of the peripheral circuit or the like.
- Hereinafter, by a process corresponding to the above-described second embodiment, explained with reference to
FIGS. 8A to 8J is a fourth embodiment of forming a memory cell unit having a repeated pattern of a narrow pitch such as a NAND-type flash memory and a peripheral circuit electrically connected with this memory cell unit. Further,FIGS. 8A to 8J schematically illustrate cross-sectional configurations thereof in the upper side and plane configurations thereof in the lower side. - In the fourth embodiment, as illustrated in
FIG. 8A , during a process corresponding to the first pattern forming process illustrated inFIG. 4A , formed are a repeatedpattern portion 501 in which a plurality of same patterns is formed at a predetermined distance and a peripheralcircuit pattern portion 502 formed at a periphery of the repeatedpattern portion 501. A part of the peripheralcircuit pattern portion 502 may be connected with the repeatedpattern portion 501. - Subsequently, as illustrated in
FIGS. 8B and 8C , performed are a boundary layer forming process (FIG. 8B ) for forming aboundary layer 106 as illustrated inFIG. 4B , and a second mask material layer forming process (FIG. 8C ) for forming a secondmask material layer 107 so that top portions of theboundary layer 106 are exposed. - Thereafter, there is performed a second boundary layer forming process (
FIG. 8D ) for forming asecond boundary layer 120 made of a material (e.g., SiO2 or the like), which can be selectively removed with respect to the photoresist, on the secondmask material layer 107 and theboundary layer 106. - Then, performed is a third mask material layer forming process (
FIG. 8E ) for forming a thirdmask material layer 121, which is made of a photoresist formed in a predetermined pattern, on thesecond boundary layer 120. The thirdmask material layer 121 is formed in a pattern capable of removing unnecessary parts of the secondmask material layer 107. - Subsequently, there are performed a process (
FIG. 8F ) of etching thesecond boundary layer 120 into a predetermined pattern by using the thirdmask material layer 121 as a mask, and an etching process (FIG. 8G ) of etching the unnecessary parts of the secondmask material layer 107 by using thesecond boundary layer 120 of the predetermined pattern as a mask. - Thereafter, performed is a process (
FIG. 8H ), which corresponds to the boundary layer etching process as illustrated inFIG. 4D , for etching theboundary layer 106, and then performed is a process (FIG. 8I ) corresponding to the trimming process for reducing a width of thefirst pattern 105 and a width of the second pattern made of the secondmask material layer 107 to predetermined widths as illustrated inFIG. 4E . As a result, a pattern serving as an etching mask is formed. Further, by using this pattern as a mask, performed is a process (FIG. 8J ), which corresponds to the etching process as illustrated inFIG. 4F , for etching athird layer 104 and the like as a lower layer. - As stated above, in the fourth embodiment, by performing the photolithography processes two times, it is possible to form the repeated pattern and the pattern of the peripheral circuit or the like.
- The above description of the present invention is provided for the purpose of illustration, and it would be understood by those skilled in the art that various changes and modifications may be made without changing technical conception and essential features of the present invention. Thus, it is clear that the above-described embodiments are illustrative in all aspects and do not limit the present invention.
Claims (2)
1. A semiconductor device manufacturing apparatus for forming a mask for etching an etching target layer on a substrate, the apparatus comprising:
a first pattern forming unit for forming a first pattern by patterning a first mask material layer made of a photoresist;
a boundary layer forming unit for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern;
a second mask material layer forming unit for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, so as to cover a surface of the boundary layer;
a second mask material removing unit for removing a part of the second mask material layer to expose top portions of the boundary layer;
a boundary layer etching unit for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and
a trimming unit for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
2. A semiconductor device manufacturing apparatus for forming a mask for etching an etching target layer on a substrate, the apparatus comprising:
a first pattern forming unit for forming a first pattern by patterning a first mask material layer made of a photoresist;
a boundary layer forming unit for forming a boundary layer, which is made of a material selectively removable with respect to the photoresist, at sidewall portions and top portions of the first pattern;
a second mask material layer forming unit for forming a second mask material layer, which is made of a material that allows the boundary layer to be selectively removed, while top portions of the boundary layer are exposed;
a boundary layer etching unit for forming a second pattern made of the second mask material layer by etching and removing the boundary layer and forming a void between the sidewall portions of the first pattern and the second mask material layer; and
a trimming unit for reducing a width of the first pattern and a width of the second pattern to predetermined widths.
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JP2009-003910 | 2009-01-09 | ||
US12/370,768 US8273661B2 (en) | 2008-02-15 | 2009-02-13 | Pattern forming method, semiconductor device manufacturing method and semiconductor device manufacturing apparatus |
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US12/370,768 Active 2031-01-04 US8273661B2 (en) | 2008-02-15 | 2009-02-13 | Pattern forming method, semiconductor device manufacturing method and semiconductor device manufacturing apparatus |
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US (2) | US8273661B2 (en) |
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KR101871748B1 (en) | 2011-12-06 | 2018-06-28 | 삼성전자주식회사 | Method for forming pattern of semiconductor device |
JP6126570B2 (en) * | 2013-12-13 | 2017-05-10 | 富士フイルム株式会社 | Pattern forming method, electronic device manufacturing method |
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CN106707715B (en) * | 2017-01-11 | 2019-05-21 | 中国科学院长春光学精密机械与物理研究所 | A kind of semiconductor devices and preparation method thereof |
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KR20090088823A (en) | 2009-08-20 |
KR101000947B1 (en) | 2010-12-13 |
US20090209109A1 (en) | 2009-08-20 |
TW201003780A (en) | 2010-01-16 |
JP5254049B2 (en) | 2013-08-07 |
US8273661B2 (en) | 2012-09-25 |
TWI404141B (en) | 2013-08-01 |
JP2009218574A (en) | 2009-09-24 |
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