US20120161775A1 - Inspection method for an active matrix substrate - Google Patents
Inspection method for an active matrix substrate Download PDFInfo
- Publication number
- US20120161775A1 US20120161775A1 US13/410,296 US201213410296A US2012161775A1 US 20120161775 A1 US20120161775 A1 US 20120161775A1 US 201213410296 A US201213410296 A US 201213410296A US 2012161775 A1 US2012161775 A1 US 2012161775A1
- Authority
- US
- United States
- Prior art keywords
- voltage
- pixel
- common
- common line
- inspection method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136213—Storage capacitors associated with the pixel electrode
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0439—Pixel structures
- G09G2300/0443—Pixel structures with several sub-pixels for the same colour in a pixel, not specifically used to display gradations
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0439—Pixel structures
- G09G2300/0443—Pixel structures with several sub-pixels for the same colour in a pixel, not specifically used to display gradations
- G09G2300/0447—Pixel structures with several sub-pixels for the same colour in a pixel, not specifically used to display gradations for multi-domain technique to improve the viewing angle in a liquid crystal display, such as multi-vertical alignment [MVA]
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
- G09G2300/0876—Supplementary capacities in pixels having special driving circuits and electrodes instead of being connected to common electrode or ground; Use of additional capacitively coupled compensation electrodes
Abstract
An active matrix substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of independent common line patterns, and a plurality of pixels is provided. The scan lines, data lines, and common line patterns are disposed on the substrate. The pixels are arranged in array on the substrate, wherein each pixel is electrically connected to corresponding scan line and data line, and the common line patterns are distributed under each pixel. Each pixel includes a plurality of active components and a plurality of pixel electrodes. Each of the pixel electrodes is electrically connected to corresponding scan line and data line through different active components. The capacitance coupling effect between each of the pixel electrodes and common line patterns are different. Additionally, an inspection method for the active matrix substrate and a liquid crystal display having the active matrix substrate are further provided.
Description
- This application is a divisional application of and claims the priority benefit of U.S. application Ser. No. 11/556,193, filed on Nov. 3, 2006, now allowed, which claims the priority benefit of Taiwan application serial no. 95132144, filed Aug. 31, 2006. The entirety of each of the above-mentioned patent applications is hereby incorporated by reference herein and made a part of specification.
- 1. Field of Invention
- The present invention relates to an inspection method. More particularly, the present invention relates to an inspection method capable of effectively inspecting the short defects between pixel electrodes in a single pixel.
- 2. Description of Related Art
- Currently, TFT-LCDs (thin film transistor-liquid crystal display) with high contrast ratio, no gray scale inversion, high brightness, high color saturation, quick response, and wide viewing angle, etc are required by the market. The common wide viewing angle techniques includes TN with wide viewing film, in-plane switching (IPS) LCD, fringe field switching (FFS) LCD, and multi-domain vertical alignment (MVA) LCD. For example, the MVA LCD panel uses some alignment patterns, such as alignment protrusions or the slits to make liquid crystal molecules in each pixel being arranged in multi-direction, thereby obtaining multiple different aligned domains. The conventional MVA LCD panels, due to the alignment protrusions or slits formed on the color filter substrate or the TFT array substrate can make the liquid crystal molecules being arranged in multi-direction, thereby obtaining multiple different aligned domains, thus meeting the requirement for wide viewing angle. However, when viewing an image from different viewing angles, the color saturation of the image observed by users is different, which is referred to as color-shift.
- Accordingly, the present invention is directed to provide an active matrix substrate having a plurality of independent common line patterns for performing inspection.
- The present invention is also directed to provide an inspection method capable of effectively inspecting short defects between the pixel electrodes on the active matrix substrate.
- The present invention is further directed to provide an LCD having a relatively high yield rate.
- The present invention provides an active matrix substrate, which comprises a substrate, a plurality of scan lines, a plurality of data lines, a plurality of independent common line patterns, and a plurality of pixels. The scan lines, the data lines, and the common line patterns are disposed on the substrate, and the pixels are arranged in array on the substrate, wherein each pixel is electrically connected to corresponding scan line and data line, and the common line patterns are distributed under each pixel. Further, each pixel comprises a plurality of active components and a plurality of pixel electrodes. Each pixel electrode is electrically connected to corresponding scan line and data line through different active components, wherein the capacitance coupling effect between each pixel electrode and each common line pattern are different.
- In an embodiment of the present invention, the common line patterns comprise a first common line pattern and a second common line pattern, wherein the first common line pattern and the second common line pattern are distributed under each pixel electrode.
- In an embodiment of the present invention, the active components comprise a first TFT and a second TFT, and the pixel electrodes comprise a first pixel electrode electrically connected to the first TFT and a second pixel electrode electrically connected to the second TFT.
- In an embodiment of the present invention, the channel width/length ratio of the first TFT is W1/L1, the channel width/length ratio of the second TFT is W2/L2, and W1/L1≠W2/L2. In an preferred embodiment of the present invention, (W1/L1)/(W2/L2)≧2.
- In an embodiment of the present invention, each pixel further comprises a plurality of capacitor electrodes disposed between the common line patterns and the pixel electrodes, wherein the capacitor electrodes are electrically connected to corresponding pixel electrodes, and the pixel electrodes are coupled to the common line patterns through the capacitor electrodes, so as to form a plurality of storage capacitors.
- In an embodiment of the present invention, the capacitor electrodes comprise a first capacitor electrode and a second capacitor electrode. The first capacitor electrode is disposed between the first common line pattern and the first pixel electrode, and is electrically connected to the first pixel electrode. The second capacitor electrode is disposed between the second common line pattern and the first pixel electrode, and is electrically connected to the first pixel electrode. Further, the capacitance of the storage capacitor constituted by the first capacitor electrode and the first common line pattern is C1, the capacitance of the storage capacitor constituted by the second capacitor electrode and the second common line pattern is C2, and C2>C1.
- In an embodiment of the present invention, the capacitance of the storage capacitor constituted by the second pixel electrode and the second common line pattern is C3.
- In an embodiment of the present invention, the capacitor electrodes further comprise a third capacitor electrode disposed between the first common line pattern and the second pixel electrode. The third capacitor electrode is electrically connected to the second pixel electrode, and the capacitance of the storage capacitor constituted by the third capacitor electrode and the first common line pattern is C4, and C4>C3.
- In an embodiment of the present invention, each pixel further comprises a capacitor coupled line, wherein the capacitor coupled line is electrically connected to the first pixel electrode, and disposed under the second pixel electrode.
- In an embodiment of the present invention, the pixel electrodes have a jagged edge.
- Also, the present invention provides an inspection method suitable for inspecting the above active matrix substrate. The inspection method comprises providing different voltage levels or wave patterns to each common line pattern, so as to increase the voltage difference between pixel electrodes in each pixel, and generating a short circuit determination according to the voltage difference.
- In an embodiment of the present invention, when the quantity of the common line patterns is 2, the common line patterns are respectively coupled to a first voltage and a second voltage lower than the first voltage. In an embodiment of the present invention, the first voltage is, for example, a common voltage. In another embodiment of the present invention, the first voltage is higher than a common voltage, and the second voltage is higher than, equal to, or lower than the common voltage. In still another embodiment of the present invention, the first voltage is, for example, lower than common voltage.
- In an embodiment of the present invention, when the quantity of the common line patterns is 3, the common line patterns are respectively coupled to a first voltage, a second voltage lower than the first voltage, and a third voltage lower than the second voltage. In an embodiment of the present invention, the first voltage is, for example, a common voltage. In another embodiment of the present invention, the first voltage is higher than the common voltage, the second voltage is higher than, equal to, or lower than the common voltage, and the third voltage is higher than, equal to, or lower than the common voltage. In still another embodiment of the present invention, the first voltage is, for example, lower than the common voltage.
- In an embodiment of the present invention, the common voltage is, for example, between −50 V and 50 V. Moreover, the voltage difference between the first voltage and the second voltage is between 0 V and 100 V.
- In an embodiment of the present invention, the inspection method further comprises charging the pixel electrodes, wherein the step of providing different voltage levels to each common line pattern is performed after the pixel electrodes are charged.
- The present invention provides an LCD, which comprises the above active matrix substrate, an opposite substrate, a liquid crystal layer, and a control circuit board. The opposite substrate is disposed above the active matrix substrate, and the liquid crystal layer is disposed between the active matrix substrate and the opposite substrate, and the control circuit board is electrically connected to the active matrix substrate and the opposite substrate, wherein the independent common line patterns are electrically connected to each other through the control circuit board and are coupled to the common voltage.
- In an embodiment of the present invention, the opposite substrate is a color filter substrate.
- The present invention employs a plurality of independent common line patterns, so the defects in the active matrix substrate and the LCD of the present invention can be effectively inspected as the fabricating of the active matrix substrate is complete.
- In order to the make aforementioned and other objectives, features and advantages of the present invention comprehensible, preferred embodiments accompanied with figures are described in detail below.
-
FIG. 1 is a top view of an active matrix substrate according to an embodiment of the present invention. -
FIGS. 2A and 2B are schematic views of the common voltage and the voltage of the pixel electrode. -
FIG. 3A is a circuit diagram of a single pixel according to an embodiment of the present invention. -
FIG. 3B is a top view of a single pixel according to an embodiment of the present invention. -
FIG. 4 is a schematic view of the voltage of the first pixel electrode and the second pixel electrode, when performing inspection on the pixel ofFIG. 3B . -
FIG. 5 is a schematic view of the LCD according to an embodiment of the present invention. - In manufacturing process of the TFT array substrate, after two pixel electrodes in a single pixel are patterned, the short defect of the two pixel electrodes may occur due to ITO residue, resulting in abnormal pixel display.
- In order to overcome the above mentioned color-shift problem, many concepts dividing a single pixel into two different voltage areas are put forward one after another. Specifically, two pixel electrodes electrically insulated from each other are used in a single pixel, and the two pixel electrodes electrically insulated from each other are driven to have different voltages.
-
FIG. 1 is a top view of an active matrix substrate according to an embodiment of the present invention. Referring toFIG. 1 , theactive matrix substrate 100 of the present embodiment includes asubstrate 110, a plurality ofscan lines 120, a plurality ofdata lines 130, a plurality of independent common line patterns 140, and a plurality ofpixels 150. Thescan lines 120, thedata lines 130, and the common line patterns 140 are all disposed on thesubstrate 110, and thepixels 150 are arranged in array on thesubstrate 110. As shown inFIG. 1 , eachpixel 150 is electrically connected tocorresponding scan line 120 anddata line 130, and the common line patterns 140 are distributed under eachpixel 150. Moreover, eachpixel 150 includes a plurality ofactive components 152 and a plurality ofpixel electrodes 154. Eachpixel electrode 154 is electrically connected to thecorresponding scan line 120 anddata line 130 through differentactive components 152, and the capacitance coupling effect between eachpixel electrode 154 and different common line patterns 140 are different. It should be noted that when the capacitance coupling effect between eachpixel electrode 154 and different common line patterns 140 are different, the abnormal short phenomenon between thepixel electrodes 154 in asame pixel 150 could be inspected in an array inspection stage. The details of the inspection mechanism are illustrated with reference toFIGS. 2A and 2B . - In this embodiment, the
substrate 110 is, for example, a glass substrate, a plastic substrate, or another rigid substrate or flexible substrate. Generally speaking, the extending direction of thescan line 120 is, for example, perpendicular to the extending direction of thedata line 130. Definitely, as the shape and arrangement manner such as strip arrangement, delta arrangement, and honeycomb arrangement of thepixels 150 are different, the present invention can adopt different types ofscan lines 120 anddata lines 130. - In the present invention, the quantity of the common line patterns 140, the
active components 152, and thepixel electrodes 154 is two or more. In the following embodiment, mainly two common line patterns 140, twoactive components 152, and twopixel electrodes 154 are illustrated as examples, which are not intended to limit the present invention. - As shown in
FIG. 1 , the common line patterns 140 of this embodiment include a firstcommon line pattern 142 and a secondcommon line pattern 144, and the firstcommon line pattern 142 and the secondcommon line pattern 144 are distributed under eachpixel 150. Specifically, as the firstcommon line pattern 142 and the secondcommon line pattern 144 on theactive matrix substrate 100 are independent trace patterns, in the present invention, the firstcommon line pattern 142 and the secondcommon line pattern 144 can be coupled to different voltage levels respectively, so as to perform inspection on thepixels 150 of theactive matrix substrate 100. Moreover, theactive component 152 of this embodiment includes a first TFT T1 and a second TFT T2, and thepixel electrodes 154 include a first pixel electrode P1 electrically connected to the first TFT T1 and a second pixel electrode P2 electrically connected to the second TFT T2. Moreover, thepixel electrodes 154 of this embodiment (i.e. the first pixel electrode P1 and the second pixel electrode P2) have a jagged edge, as shown inFIG. 1 . - In order to improve the above-mentioned color shift problem, the channel width/length ratios of the first TFT T1 and the second TFT T2 are respectively designed to be W1/L1 and W2/L2 in this embodiment, and the channel width/length ratios of the first TFT T1 and the second TFT T2 are made to be different (i.e. W1/L1≠W2/L2). In a preferred embodiment, in order to obtain an enough difference between the channel width/length ratios of the first TFT T1 and the second TFT T2, usually the channel width/length ratios of the first TFT T1 and the second TFT T2 are made to meet the condition (W1/L1)/(W2/L2)≧2.
- In this embodiment, each
pixel 150 may further include a plurality ofcapacitor electrodes 156 disposed between the common line patterns 140 and thepixel electrodes 154, wherein thecapacitor electrodes 156 are electrically connected to correspondingpixel electrodes 154, and thepixel electrodes 154 are coupled to the common line patterns 140 through thecapacitor electrodes 156, so as to form a plurality of storage capacitors. As known fromFIG. 1 , the storage capacitors constituted by thecapacitor electrodes 156 and the common line patterns 140 are of a metal-insulator-metal (MIM) architecture. However, it should be noted that the storage capacitors in thepixels 150 of the present invention could also employ a metal-insulator-ITO (MII) architecture. In other words, thecapacitor electrodes 156 disclosed in this embodiment are optional elements. - In this embodiment, each
pixel 150 further includes a capacitor coupledline 158, wherein the capacitor coupledline 158 is electrically connected to the first pixel electrode P1, and disposed under the second pixel electrode P2. It can be known fromFIG. 1 that since the capacitor coupledline 158 is electrically connected to the first pixel electrode P1, and the voltage of the capacitor coupledline 158 and the voltage of the second pixel electrode P2 are different, the capacitor coupledline 158 affects the voltage of the second pixel electrode P2 because of a capacitance coupling effect. Specifically, during the time of turning on the first TFT T1 and the second TFT T2, the voltage of the second pixel electrode P2 is affected by the capacitor coupledline 158 and the second TFT T2 at the same time. During the time of turning off the first TFT T1 and the second TFT T2, the voltage of the second pixel electrode P2 is affected by the capacitor coupledline 158. The relation of the capacitor coupledline 158 and the second pixel electrode P2 is as described in Taiwan Patent Application No. 94,116,051, the entire content of which is incorporated herein by reference. -
FIGS. 2A and 2B are schematic views of the common voltage and the voltage of the pixel electrode. Generally speaking, during the array inspection, the array inspection equipment can send out a gate pulse with a pulse width that is several times greater than that of a real panel, so as to ensure that most part of the defects can be inspected. Under the condition, the charging results of the two pixel electrodes in a single pixel are much more similar, so usually the abnormal short between two pixel electrodes cannot be inspected in the array inspection. The LCD panels fabricated by the TFT array substrate having defects have bright dot defects, which may result in the difficulty in manufacturing and the increase of cost, and also the grade of the fabricated LCD panels is declined. Referring toFIGS. 2A and 2B , as the current array inspection equipment cannot identify slight voltage difference, the present invention controls the voltage level coupled to the common line patterns to change the voltage of the pixel electrodes. When the voltage level coupled to the common line patterns remains at the same voltage level, the voltage of the pixel electrodes may not be influenced by the common line patterns to change (as shown inFIG. 2A ). Otherwise, when the voltage level coupled to the common line patterns swings up to a high voltage level, the voltage of the pixel electrodes is affected by the common line patterns to rise (as shown inFIG. 2B ). As shown inFIG. 2B , the voltage of the pixel electrodes may rise or fall along with the change of the voltage of the common line patterns. -
FIG. 3A is a circuit diagram of a single pixel according to an embodiment of the present invention, andFIG. 3B is a top view of a single pixel according to an embodiment of the present invention. Referring toFIGS. 3A and 3B , thecapacitor electrodes 156 of this embodiment include at least one first capacitor electrode E1 and at least one second capacitor electrode E2. The first capacitor electrode E1 is disposed between the firstcommon line pattern 142 and the first pixel electrode P1, and is electrically connected to the first pixel electrode P1 via a contact window CH1. The second capacitor electrode E2 is disposed between the secondcommon line pattern 144 and the first pixel electrode P1, and is electrically connected to the first pixel electrode P1 via a contact window CH2. Moreover, the capacitance of the storage capacitor constituted by the first capacitor electrode E1 and the firstcommon line pattern 142 is C1, and the capacitance of the storage capacitor constituted by the second capacitor electrode E2 and the secondcommon line pattern 144 is C2, and C2>C1. - Accordingly, the capacitance of the storage capacitor constituted by the second capacitor electrode P2 and the second
common line pattern 144 is C3. Moreover, thecapacitor electrodes 156 of this embodiment further include a third capacitor electrode E3 disposed between the firstcommon line pattern 142 and the second pixel electrode P2. The third capacitor electrode E3 is electrically connected to the second pixel electrode P2 via a contact window CH3, and the capacitance of the storage capacitor constituted by the third capacitor electrode E3 and the firstcommon line pattern 142 is C4, and C4>C3. -
FIG. 4 is a schematic view of the voltage of the first pixel electrode and the second pixel electrode when performing inspection on the pixel ofFIG. 3B . Referring toFIGS. 3B and 4 , in order to increase the voltage difference between the first pixel electrode P1 and the second pixel electrode P2, each common line pattern is provided with different voltage levels and/or wave patterns in the present invention, so as to increase the voltage difference between pixel electrodes (as shown inFIG. 4 ). Specifically, in this embodiment, a gate pulse is first transmitted though the scan line to turn on the first TFT T1 and the second TFT T2, and to charge the first pixel electrode P1 and the second pixel electrode P2. After charging the first pixel electrode P1 and the second pixel electrode P2, the first TFT T1 and the second TFT T2 are turned off instantly. At this time, in this embodiment, the voltage coupled to the firstcommon line pattern 142 is controlled to swing up to a first voltage, and the voltage coupled to the secondcommon line pattern 144 is controlled to swing down to a second voltage lower than the first voltage. After the common line patterns are respectively coupled to different voltage levels (the first voltage and the second voltage), the voltage different between pixel electrodes is measured, and whether or not abnormal short exists between the pixel electrodes electrically insulated from each other is identified according to the measured voltage different. - In this embodiment, the first
common line pattern 142 is applied with a first voltage, and the secondcommon line pattern 144 is applied with a second voltage lower than the first voltage. The first voltage is, for example, the common voltage used in the normal operation of the display panel, and the second voltage is lower than the common voltage. Definitely, the present invention can also use the first voltage lower or higher than the common voltage. When the first voltage is higher than the common voltage, the second voltage can be higher than, equal to, or lower than the common voltage. - Referring to
FIGS. 3B and 4 , two common line patterns (142, 144) and two pixel electrodes (P1, P2) are illustrated as examples. However, the present invention is not limited to the quantity of the common line patterns and the pixel electrodes in a single pixel described above. For example, the quantity of the common line patterns and the pixel electrodes can also be 3. Under this circumstance, the common line patterns are, for example, coupled to a first voltage, a second voltage lower than the first voltage, and a third voltage lower than the second voltage. In an embodiment of the present invention, the first voltage is, for example, a common voltage. In another embodiment of the present invention, the first voltage is lower or higher than the common voltage. When the first voltage is higher than the common voltage, the second voltage can be higher than, equal to, or lower than the common voltage, and the third voltage can be higher than, equal to, or lower than the common voltage. -
FIG. 5 is a schematic view of the LCD according to an embodiment of the present invention. Referring toFIG. 5 , theLCD 200 of this embodiment includes theactive matrix substrate 100, an opposite substrate 210 (e.g. a color filter substrate), aliquid crystal layer 220, and at least onecontrol circuit board 230. Theopposite substrate 210 is disposed above theactive matrix substrate 100, theliquid crystal layer 220 is disposed between theactive matrix substrate 100 and theopposite substrate 210, and thecontrol circuit board 230 is electrically connected to theactive matrix substrate 100 and theopposite substrate 220. It should be noted that the independent common line patterns 140 (e.g. the firstcommon line pattern 142 and the second common line pattern 144) on theactive matrix substrate 100 are electrically connected to each other through thecontrol circuit board 230, and are coupled to the common voltage. - Since the present invention adopts a plurality of independent common line patterns, the defects in the active matrix substrate and the LCD of the present invention can be effectively inspected as the fabricating of the active matrix substrate is complete, thereby improving the yield rate, reducing the process cost, and improving the grade of the LCD panel.
- It will be apparent to those skilled in the art that various modifications and variations can be made to the structure of the present invention without departing from the scope or spirit of the invention. In view of the foregoing, it is intended that the present invention cover modifications and variations of this invention provided they fall within the scope of the following claims and their equivalents.
Claims (14)
1. A method for inspecting the active matrix substrate, the active matrix substrate comprising: a substrate; a plurality of scan lines, a plurality of data lines, and a plurality of common line patterns disposed on the substrate; a plurality of pixels arranged in array on the substrate, each pixel being electrically connected to a corresponding scan line and a data line, and the common line patterns being distributed under each pixel, each pixel comprising a plurality of active components and a plurality of pixel electrodes, each of the pixel electrodes being electrically connected to a corresponding data line through different active components, and a capacitance coupling effect between one pixel electrode and one common line pattern being different from that between another pixel electrode and another common line pattern, the method comprising:
providing different voltage levels or wave patterns to each common line pattern, so as to increase voltage difference between the pixel electrodes of each pixel; and
generating a short circuit determination according to the voltage difference.
2. The inspection method as claimed in claim 1 , wherein two of the common line patterns are respectively applied with a first voltage and a second voltage lower than the first voltage.
3. The inspection method as claimed in claim 2 , wherein the first voltage is a common voltage.
4. The inspection method as claimed in claim 2 , wherein the first voltage is higher than a common voltage.
5. The inspection method as claimed in claim 4 , wherein the common voltage is approximately between −50 V and 50 V.
6. The inspection method as claimed in claim 2 , wherein the voltage difference between the first voltage and the second voltage is approximately between 0 V and 100 V.
7. The inspection method as claimed in claim 2 , wherein the first voltage is lower than a common voltage.
8. The inspection method as claimed in claim 1 , wherein three of the common line patterns are respectively coupled to a first voltage, a second voltage lower than the first voltage, and a third voltage lower than the second voltage.
9. The inspection method as claimed in claim 8 , wherein the first voltage is a common voltage.
10. The inspection method as claimed in claim 9 , wherein the common voltage is approximately between −50 V and 50 V.
11. The inspection method as claimed in claim 8 , wherein the first voltage is lower than a common voltage.
12. The inspection method as claimed in claim 8 , wherein the first voltage is higher than a common voltage.
13. The inspection method as claimed in claim 8 , wherein the voltage difference between the first voltage and the second voltage is approximately between 0 V and 100 V.
14. The inspection method as claimed in claim 1 , further comprising charging the pixel electrodes, wherein the step of providing different voltage levels to each common line pattern is performed after the pixel electrodes are charged.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/410,296 US20120161775A1 (en) | 2006-08-31 | 2012-03-02 | Inspection method for an active matrix substrate |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW95132144 | 2006-08-31 | ||
TW095132144A TWI287685B (en) | 2006-08-31 | 2006-08-31 | Liquid crystal display, active matrix substrate and test method therefor |
US11/556,193 US8159625B2 (en) | 2006-08-31 | 2006-11-03 | Liquid crystal display and active matrix substrate |
US13/410,296 US20120161775A1 (en) | 2006-08-31 | 2012-03-02 | Inspection method for an active matrix substrate |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/556,193 Division US8159625B2 (en) | 2006-08-31 | 2006-11-03 | Liquid crystal display and active matrix substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
US20120161775A1 true US20120161775A1 (en) | 2012-06-28 |
Family
ID=39150965
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/556,193 Active 2030-02-07 US8159625B2 (en) | 2006-08-31 | 2006-11-03 | Liquid crystal display and active matrix substrate |
US13/410,296 Abandoned US20120161775A1 (en) | 2006-08-31 | 2012-03-02 | Inspection method for an active matrix substrate |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/556,193 Active 2030-02-07 US8159625B2 (en) | 2006-08-31 | 2006-11-03 | Liquid crystal display and active matrix substrate |
Country Status (2)
Country | Link |
---|---|
US (2) | US8159625B2 (en) |
TW (1) | TWI287685B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130243304A1 (en) * | 2012-03-14 | 2013-09-19 | Guang hai Jin | Array testing method and device |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI287685B (en) * | 2006-08-31 | 2007-10-01 | Au Optronics Corp | Liquid crystal display, active matrix substrate and test method therefor |
TWI339304B (en) * | 2007-10-16 | 2011-03-21 | Au Optronics Corp | Pixel structure, driving method thereof and pixel array structure |
KR101392741B1 (en) * | 2007-10-29 | 2014-05-09 | 삼성디스플레이 주식회사 | Display substrate and display panel having the same |
TWI363917B (en) | 2008-02-01 | 2012-05-11 | Au Optronics Corp | Thin film transistor array substrate |
TWI384307B (en) * | 2009-04-13 | 2013-02-01 | Au Optronics Corp | Liquid crystal display |
KR101881084B1 (en) * | 2012-04-25 | 2018-08-20 | 삼성디스플레이 주식회사 | Organic light emitting display apparatus and method for inspecting the organic light emitting display apparatus |
TWI448709B (en) * | 2012-05-15 | 2014-08-11 | Elan Microelectronics Corp | Quality detecting method of a touch panel by different exciting signals with different voltages and a detecting device using the same |
TWI470332B (en) | 2012-06-29 | 2015-01-21 | Au Optronics Corp | Display panel and method for inspecting thereof |
CN104460148B (en) * | 2014-11-20 | 2017-09-01 | 深圳市华星光电技术有限公司 | Lift the dot structure and detection method of bad recall rate |
CN104505011B (en) * | 2014-12-17 | 2017-02-22 | 深圳市华星光电技术有限公司 | Detection circuit of display panel and use method thereof |
CN104503158B (en) * | 2014-12-17 | 2017-04-19 | 深圳市华星光电技术有限公司 | Array baseplate, liquid crystal display panel and detection method of liquid crystal display panel |
TWI566228B (en) * | 2015-01-23 | 2017-01-11 | 友達光電股份有限公司 | Active device array substrate and method of inspecting the same |
KR20170002731A (en) * | 2015-06-29 | 2017-01-09 | 삼성디스플레이 주식회사 | Liquid crystal display device and method of manufacturing the same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7330221B2 (en) * | 2005-01-06 | 2008-02-12 | Au Optronics Corporation | Thin film transistor array substrate and repairing method thereof |
US7518687B2 (en) * | 2005-05-18 | 2009-04-14 | Au Optronics Corporation | Pixel structure and active matrix substrate |
US7755710B2 (en) * | 2007-06-07 | 2010-07-13 | Chunghwa Picture Tubes, Ltd. | Pixel structure |
US8125237B2 (en) * | 2006-07-17 | 2012-02-28 | Scanimetrics Inc. | Thin film transistor array having test circuitry |
US8159625B2 (en) * | 2006-08-31 | 2012-04-17 | Au Optronics Corporation | Liquid crystal display and active matrix substrate |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100750916B1 (en) * | 2000-12-18 | 2007-08-22 | 삼성전자주식회사 | Liquid Crystal Display device using a swing common electrode voltage and driving method therefor |
JP4342200B2 (en) * | 2002-06-06 | 2009-10-14 | シャープ株式会社 | Liquid crystal display |
US7683988B2 (en) * | 2006-05-10 | 2010-03-23 | Au Optronics | Transflective liquid crystal display with gamma harmonization |
-
2006
- 2006-08-31 TW TW095132144A patent/TWI287685B/en active
- 2006-11-03 US US11/556,193 patent/US8159625B2/en active Active
-
2012
- 2012-03-02 US US13/410,296 patent/US20120161775A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7330221B2 (en) * | 2005-01-06 | 2008-02-12 | Au Optronics Corporation | Thin film transistor array substrate and repairing method thereof |
US7518687B2 (en) * | 2005-05-18 | 2009-04-14 | Au Optronics Corporation | Pixel structure and active matrix substrate |
US8125237B2 (en) * | 2006-07-17 | 2012-02-28 | Scanimetrics Inc. | Thin film transistor array having test circuitry |
US8159625B2 (en) * | 2006-08-31 | 2012-04-17 | Au Optronics Corporation | Liquid crystal display and active matrix substrate |
US7755710B2 (en) * | 2007-06-07 | 2010-07-13 | Chunghwa Picture Tubes, Ltd. | Pixel structure |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130243304A1 (en) * | 2012-03-14 | 2013-09-19 | Guang hai Jin | Array testing method and device |
US9230474B2 (en) * | 2012-03-14 | 2016-01-05 | Samsung Display Co., Ltd. | Array testing method and device |
Also Published As
Publication number | Publication date |
---|---|
TWI287685B (en) | 2007-10-01 |
US8159625B2 (en) | 2012-04-17 |
US20080055506A1 (en) | 2008-03-06 |
TW200811567A (en) | 2008-03-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8159625B2 (en) | Liquid crystal display and active matrix substrate | |
US7787096B2 (en) | Liquid crystal display device and manufacturing method thereof | |
US8107045B2 (en) | Color active matrix type vertically aligned mode liquid crystal display and driving method thereof | |
KR100737882B1 (en) | Substrate for a liquid crystal display device, liquid crystal display device having it, and driving method of a liquid crystal display device | |
US7355666B2 (en) | Liquid crystal display and driving method thereof | |
US6819384B2 (en) | Liquid crystal display panel capable of reducing persistence degree and development method thereof | |
US20080123005A1 (en) | Array Substrate and Display Panel Having the Same | |
DE102014207420B4 (en) | Liquid crystal display and method of testing a liquid crystal display | |
US20090294771A1 (en) | Thin film transistor array panel having a means for array test | |
US20080170195A1 (en) | Display panel, method of inspecting the display panel and method of manufacturing the display panel | |
JP4106193B2 (en) | Liquid crystal display device and manufacturing method thereof | |
WO2004046793A2 (en) | Liquid crystal display and driving method thereof | |
US8026989B2 (en) | Liquid crystal display panel | |
KR100640212B1 (en) | In plane switching mode liquid crystal display panel of strengthening connection of common electrode and method of fabricating thereof | |
CN100407033C (en) | Liquid crystal display device, active component array substrate and testing method thereof | |
KR101992852B1 (en) | Display device | |
US9159259B2 (en) | Testing circuits of liquid crystal display and the testing method thereof | |
US10031382B2 (en) | Liquid crystal display device | |
KR20050053441A (en) | Apparatus and method of testing liquid crystal display panel of horizontal electronic field applying type | |
KR20060001163A (en) | Liquid crystal display | |
JPH10123566A (en) | Liquid crystal panel test method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |