US20120023468A1 - Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness - Google Patents
Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness Download PDFInfo
- Publication number
- US20120023468A1 US20120023468A1 US12/982,732 US98273210A US2012023468A1 US 20120023468 A1 US20120023468 A1 US 20120023468A1 US 98273210 A US98273210 A US 98273210A US 2012023468 A1 US2012023468 A1 US 2012023468A1
- Authority
- US
- United States
- Prior art keywords
- constraint
- electrical
- parasitic
- electronic circuit
- design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/394—Routing
Definitions
- VDSM very deep sub-micron
- most conventional electronic circuit design tools focus on post-layout verification to verify, for example, whether parasitics satisfy the corresponding constraints when the entire chip design is complete and detailed information about the parasitics of the physical designs and the currents drawn by the transistors are known.
- the parasitics are extracted from the completed layout and then verified against the corresponding constraints.
- the conventional circuit synthesis step is followed by layout synthesis, and each step is carried out independent of the other in these conventional approaches.
- This is again followed by a physical or formal verification step upon the completion of the entire physical layout to check whether the desired goals have been achieved after layout generation and extraction.
- the method or system for constraint verification for implementing electronic circuit designs with electrical awareness identifies, determines, or updates the physical data of a net, a device, or a component (hereinafter “component” collectively.)
- the method or system may characterize shapes associated with a net and need to determine connectivity to identify one net from another.
- the method or the system may also comprise the process or module for identifying, determining, or characterizing an electrical parasitic that is associated with the component in the physical design.
- the method or the system may also comprise the process or module for identifying, determining, or characterizing a device parameter that is associated with the component in the physical design. In some embodiments, the method or the system may also comprise the process or module for identifying, determining, or characterizing an electrical parasitic or a device parameter that is associated with the component in the physical design. In these embodiments, the electrical parasitic and the device parameter are collectively referred to as “electrical parasitic” or simply “parasitic”.
- the method or the system may identify or receive one or more constraints corresponding to the one or more parasitics. In these embodiments, the methods or systems may then perform the process(es) to compare the one or more electrical parasitics with the corresponding parasitic constraints. More details about various processes or modules for the methods or systems for constraint verification for implementing electronic circuits with electrical awareness will be further described in the following paragraphs with reference to the respective figures.
- the characterization of electrical parasitics such as but not limited to various types of R, L, or C for one or more shapes that constitute a net
- the subsequent characterization of the electrical behavior or characteristic(s) such as but not limited to various types of currents, voltages, or current densities, as well as the constraint verification occur as a single net (or one or more shapes that are part of a net) has been created or modified but before the creation or modification of the next net or one or more shapes that are part of the next net.
- These characterizations or verification may also occur incrementally as a net is being created or modified in some embodiments.
- the simulation produced terminal currents may be used as one or more nets that connect to these terminals are being created or modified in some embodiments.
- these characterizations or verification may occur while there is only a partial layout in some embodiments.
- the simulation, re-simulation, characterization, or verification of the electronic circuit design may be performed in conjunction with the creation or modification of the physical design of an electronic circuit design so that any impact of a circuit component is addressed before the physical design is completed.
- FIGS. 1A-B illustrate top level block diagrams for a method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- FIGS. 2A-B illustrate top level block diagrams for a method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- FIG. 3 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- FIG. 4 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- FIG. 5 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- FIG. 6 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- FIG. 7 depicts a computerized system on which a method for timing closure with concurrent process models can be implemented.
- FIG. 1A illustrates a top level diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in some embodiments.
- FIG. 1A illustrates that the system may comprise using an user interface of a computing system 110 to interface with various processes or modules for performing various actions as described below. More details about the user interface are described in U.S. patent application Ser. No. ______, entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR PROVIDING IN SITU, CUSTOMIZABLE INFORMATION FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS” and filed concurrently under Atty. Dkt. No. 10PA061US01, the entire disclosure of which are hereby expressly incorporated by reference in their entireties in the instant Application.
- the method or the system may comprise the process or module 104 for identifying, determining, or updating the physical data of a net, a device, or a component (hereinafter “component” collectively) of a portion of a physical design of an electronic circuit, for example a portion of a layout of the electronic design.
- the method or the system applies to an electronic design when the first component of the design is being implemented in a physical design tool, such as a layout tool.
- the process for identifying, determining, or updating physical data of a component of an electronic circuit physical design may be invoked from within a physical design tool or flow, such as a layout editor, while the designer is implementing or modifying the physical design of the electronic circuit rather than from a post-layout verification tool or flow in one or more embodiments.
- device recognition and connectivity tasks are performed to able to map electrical characteristics such as current at a given terminal with the proper nets attached to that terminal.
- connectivity can be directed to traverse the nets hierarchically and stop on levels determined by the user.
- the method or the process may also comprise the process or module 106 for characterizing one or more electrical parasitics that are associated with the physical data of the component.
- the characterization of electrical parasitics associated with physical data may be done with a two stage approach. This process begins with the selection a particular net or partial net. In the first stage, the process identifies where along that net that a geometric description should be created.
- the geometric descriptions may include wire widths and spacings, conductor and ILD (inter layer dielectrics) thicknesses, or thickness of barrier materials.
- a common description may be created and provided via an API (application programming interface.)
- the second stage may include one or more components that may translate, transform, convert, or map (hereinafter “map”) the geometric description to an equivalent parasitic value such as a resistance, capacitance or inductance.
- map This translation, transformation, conversion, or mapping
- the models may be created through the use of semi-empirical methods that combine models or knowledge of the underlying physics with data provided by various solver(s), simulator(s), or a combination thereof.
- the mapping for capacitance may also be done with a solver.
- the second stage may use parasitic extraction for some nets and a field solver for other nets.
- the second stage may use a combination of parasitic extraction for, for example, resistance(s) and a field solver for, for example, capacitance(s) on the same net.
- the characterization of electrical parasitics may be performed with extraction tools that map geometric dimensions and patterns to corresponding parasitics such as R, L, and C.
- the characterization of electrical parasitics includes the use of field solvers (such as but not limited to one or more EM field solvers) that map geometric dimensions and patterns to capacitance(s).
- the electrical parasitic data associated with the physical data is provided to a matrix solver for static or transient analysis.
- the matrix solver is run to produce voltage and current data for device and interconnect components of the design.
- the method or system for implementing electronic circuit designs with simulation related constraints or performance expectations comprises a flow where the simulator or solver is invoked after a single net has been created or modified.
- the method or the system may further comprise a process or a module 102 for identifying one or more parasitic constraints that are associated with the one or more electrical parasitics in some embodiments.
- the method or the system may identify or receive the constraints on the resistance (R), the total, coupling, or capacitance coupled through substrate (collectively C), or inductance (L) of a net between two terminals from various sources, such as a user, a constraint manager that interacts with a constraint library, or from the electronic circuit design tool set that comprises various tools in various domains (e.g., the schematic domain, the physical domain, the post-layout domain, . . . ), etc.
- R resistance
- C total, coupling, or capacitance coupled through substrate
- L inductance
- the method or the system may further comprise the process or module 108 of performing constraint verification for the one or more constraints associated with the one or more electrical parasitics.
- the process or module 108 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied.
- the characterization of parasitics such as but not limited to various types of R, L, or C for one or more shapes that constitute a net and the subsequent characterization of the electrical behavior or characteristic(s), such as but not limited to various types of currents, voltages, or current densities, as well as the constraint verification occur as a single net (or one or more shapes that are part of a net) has been created or modified but before the creation or modification of the next net or one or more shapes that are part of the next net. These characterizations or verification may also occur incrementally as a net is being created or modified in some embodiments.
- the simulation produced terminal currents may be used as one or more nets that connect to these terminals are being created or modified in some embodiments.
- these characterizations or verification may occur while there is only a partial layout in some embodiments.
- the simulation, re-simulation, characterization, or verification of the electrical parasitics may be performed in conjunction with the creation or modification of the physical design of an electronic circuit design so that any impact of a circuit component is addressed before the physical design is completed.
- FIG. 1B illustrates a top level block diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in one or more embodiments.
- the block diagram as illustrated in FIG. 1B is substantially similar to that of FIG. 1A .
- the method or the system for constraint verification illustrated in FIG. 1B may comprise using an user interface of a computing system 162 to interface with various processes or modules for performing various actions as described below.
- the method or the system may comprise the process or module 154 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit.
- the method or the system may comprise the process or module 156 for characterizing one or more electrical parasitics that are associated with the physical data of a component of a portion of a physical design of an electronic circuit.
- the method or the process may also comprise the process or module 156 for characterizing one or more electrical parasitics that are associated with the physical data of the component.
- the method or the system may further comprise a process or a module 152 for identifying one or more parasitic constraints that are associated with the one or more electrical parasitics in some embodiments.
- the method or the system may further comprise the process or module 158 of performing constraint verification for the one or more constraints associated with the one or more electrical parasitics.
- the process or module 158 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied.
- the method or system as illustrated in FIG. 1B may further optionally comprise the process or module 160 for storing one or more results of the process or module in a non-transitory computer readable storage medium or displaying the one or more results in the user interface on a display apparatus in some embodiments.
- FIG. 2A illustrates a top level block diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in one or more embodiments.
- the method or the system for constraint verification for implementing electronic circuit designs comprise using an user interface of a computing system 210 to interface with various processes or modules for performing various actions as described below.
- the method or the system may comprise the process or module 204 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit, for example a portion of a layout of the electronic design.
- the method or the process may also comprise the process or module 206 for characterizing one or more electrical parasitics that are associated with the physical data of the component.
- the method or the system may further comprise a process or a module 202 for identifying or receiving one or more manual settings of parasitic constraints from a user in some embodiments. For example, a designer may manually set the limit on the resistance of an interconnect between two terminals, and the method or the system takes that limit as a constraint and determines whether the electrical parasitic (R in this example) of the interconnect satisfies the constraint that is manually entered by the designer.
- the method or the system may further comprise the process or module 208 of performing constraint verification for the one or more constraints associated with the one or more electrical parasitics.
- the process or module 208 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied.
- FIG. 2B illustrates a top level block diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in one or more embodiments.
- the method or the system for constraint verification for implementing electronic circuit designs comprise using an user interface of a computing system 266 to interface with various processes or modules for performing various actions as described below.
- the method or the system may comprise the process or module 252 for identifying or creating a schematic design of the electronic circuit and/or the process or module 254 for using an environment, for example a simulation environment, for setting, receiving, or identifying one or more circuit performance or behavior constraints in some embodiments.
- the method or the system may also comprise the process or module 256 for performing one or more simulations using at least the schematic design and the one or more performance or behavior constraints in some embodiments.
- the method or the system may further comprise the process or module 258 for estimating one or more parasitic constraints based at least in part upon the result(s) of the one or more simulations and/or the one or more performance or behavior constraints in some embodiments as illustrated in FIG. 2B .
- the method or the system may use the currents, voltages, etc. determined in the schematic level simulations to estimate the constraints for the corresponding electrical parasitics in some embodiments.
- the method or the system may also comprise the process or module 260 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit.
- the method or the process may also comprise the process or module 262 for characterizing one or more electrical parasitics that are associated with the physical data of the component.
- the method or the system may further comprise the process or module 264 for performing constraint verification for the one or more constraints associated with the one or more electrical parasitics.
- the process or module 264 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied.
- FIG. 3 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments.
- the method or the system may comprise the process or module for using an user interface of a computing system 316 to interface with various processes or modules for performing various actions as described below.
- the method or the system may further comprise the process or module 302 for identifying, setting, or receiving one or more constraints.
- the method or system may further comprise the process or module 304 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit, for example a portion of a layout of the electronic design.
- the method or the system may also comprise the process or module 306 for characterizing one or more electrical parasitics that are associated with the physical data of the component.
- the method or the system may further comprise the process or module 308 for verifying whether or not the one or more electrical parasitics meet the corresponding one or more parasitic constraints at 308 in some embodiments.
- the method or the system may further optionally comprise the process or module 310 for determining or computing one or more adjustments for the physical data in the event that some of the one or more parasitic constraints are not satisfied in some embodiments.
- an adjustment comprises creation of a new route or a segment thereof or modification of an existing route or a segment thereof.
- an adjustment comprises placement of a component in a physical design of an electronic circuit design.
- the method or the system may further comprise the process or module 310 for providing one or more hints to correct the physical data in the event that some of the one or more parasitic constraints are not satisfied in some embodiments.
- the method or the system may also optionally comprise the process or module 312 for determining or checking to see whether the one or more adjustments or the one or more hints violate other design rule(s), constraint(s), or other requirement(s).
- the method or the system may comprise the process or module for applying, either automatically or with assistance, at least one of the one or more adjustments to fix the physical data of the component or the physical data of other elements that are also affected by the corresponding one or more electrical parasitics.
- FIG. 4 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in one or more embodiments.
- the method or the system may comprise the process or module 402 for identifying or creating a schematic design of the electronic circuit and/or the process or module 404 for setting, receiving, or identifying one or more parasitic constraints in some embodiments.
- the method or the system may further optionally comprise the process or module 406 for mapping the one or more parasitics to a physical design representation in some embodiments.
- the method or the system may comprise the process or module 408 for identifying, determining, or updating the physical data of a component of a portion of a physical design of the electronic circuit in some embodiments.
- the method or the system may also comprise the process or module 410 for characterizing one or more electrical parasitics that are associated with the physical data in some embodiments.
- the method or the system may further comprise the process or module 412 for verifying whether the one or more electrical parasitics meet the one or more parasitic constraints in some embodiments.
- the method or the system may further optionally comprise the process or module 414 for displaying the results of the act of verifying the parasitic constraints in a user interface on a display apparatus or storing the results on a non-transitory computer readable storage medium in some embodiments.
- FIG. 5 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in one or more embodiments.
- the method or the system may comprise the process or module 502 for identifying or creating a schematic design of the electronic circuit and/or the process or module 504 for setting, receiving, or identifying one or more parasitic constraints in some embodiments.
- the method or the system may further comprise the process or module 506 for identifying, determining, or updating the physical data of a component in a partial physical design of the electronic circuit.
- the method or the system may further comprise the process or module 508 for characterizing one or more electrical parasitics that are associated with the physical data of the component in a partial physical design of the electronic circuit.
- the method or the system may further comprise the process or module 512 for verifying whether the one or more electrical parasitics meet the corresponding one or more parasitic constraints in some embodiments.
- the process or module 512 comprise the process or module of comparing the one or more electrical parasitics with the corresponding one or more parasitic constraints to determine whether the one or more parasitic constraints are met.
- the method or the system may further optionally comprise the process or module 514 for displaying the results of the act of verifying the parasitic constraints in a user interface on a display apparatus or storing the results on a non-transitory computer readable storage medium in some embodiments.
- FIG. 6 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in one or more embodiments.
- the method or system for constraint verification for implementing electronic circuit design with electrical awareness may comprise the process or module of identifying or creating a schematic design at 602 in some embodiments.
- the method or system for constraint verification for implementing electronic circuit designs with electrical awareness may further comprise the process or module for identifying or receiving a parasitic constraint at 604 in some embodiments.
- the method or system for constraint verification for implementing electronic circuit designs with electrical awareness may further comprise the process or module for mapping the parasitic constraint at 606 based at least in part upon the schematic-to-physical design representation in some embodiments.
- the method or system for constraint verification for implementing electronic circuit designs with electrical awareness may further comprise the process or module for identifying, determining, or updating physical data of a net, a device, or a component of an electronic circuit physical design at 608 in some embodiments.
- the method or system may also comprise the process or module for 610 characterizing the electrical parasitic associated with the physical data at 660 in some embodiments.
- the method or system may also proceed to the process or module for verifying the parasitic constraint at 612 in some embodiments.
- the process or module 612 may comprise the process or module 612 for comparing the electrical parasitic with the parasitic constraint to determine whether the parasitic constraint is satisfied.
- the method or system may also comprise the process or module for computing one or more adjustments or providing one or more hints to correct the physical data at 614 in some embodiments where the parasitic constraint is not met.
- the method or system may further comprise the process or module for determining or checking to ensure the one or more adjustments or the one or more hints do not violate other constraints, design rules, or requirements at 616 in some embodiments.
- the method or system may further comprise the process or module for applying at least one of the one or more adjustments to the component with which the physical data are associated at 618 .
- FIG. 7 illustrates a block diagram of an illustrative computing system 1400 suitable for implementing some embodiments of the method or system for constraint verification for implementing an electronic circuit design of an electronic circuit with electrical awareness as described in the preceding paragraphs with reference to various figures.
- Computer system 1400 includes a bus 1406 or other communication mechanism for communicating information, which interconnects subsystems and devices, such as processor 1407 , system memory 1408 (e.g., RAM), static storage device 1409 (e.g., ROM), disk drive 1410 (e.g., magnetic or optical), communication interface 1414 (e.g., modem or Ethernet card), display 1411 (e.g., CRT or LCD), input device 1412 (e.g., keyboard), and cursor control (not shown).
- processor 1407 system memory 1408 (e.g., RAM), static storage device 1409 (e.g., ROM), disk drive 1410 (e.g., magnetic or optical), communication interface 1414 (e.g., modem or Ethernet card), display 14
- computer system 1400 performs specific operations by one or more processors or processor cores 1407 executing one or more sequences of one or more instructions contained in system memory 1408 .
- Such instructions may be read into system memory 1408 from another computer readable/usable storage medium, such as static storage device 1409 or disk drive 1410 .
- static storage device 1409 or disk drive 1410 may be used in place of or in combination with software instructions to implement the invention.
- hard-wired circuitry may be used in place of or in combination with software instructions to implement the invention.
- embodiments of the invention are not limited to any specific combination of hardware circuitry and/or software.
- the term “logic” shall mean any combination of software or hardware that is used to implement all or part of the invention.
- Various actions or processes as described in the preceding paragraphs may be performed by using one or more processors, one or more processor cores, or combination thereof 1407 , where the one or more processors, one or more processor cores, or combination thereof executes one or more threads.
- the act of specifying various net or terminal sets or the act or module of performing verification or simulation, etc. may be performed by one or more processors, one or more processor cores, or combination thereof.
- the parasitic extraction, current solving, current density computation and current or current density verification is done in memory as layout shapes or nets are created or modified.
- Non-volatile media includes, for example, optical or magnetic disks, such as disk drive 1410 .
- Volatile media includes dynamic memory, such as system memory 1408 .
- Computer readable storage media includes, for example, electromechanical disk drives (such as a floppy disk, a flexible disk, or a hard disk), a flash-based, RAM-based (such as SRAM, DRAM, SDRAM, DDR, MRAM, etc.), or any other solid-state drives (SSD), magnetic tape, any other magnetic or magneto-optical medium, CD-ROM, any other optical medium, any other physical medium with patterns of holes, RAM, PROM, EPROM, FLASH-EPROM, any other memory chip or cartridge, or any other medium from which a computer can read.
- electromechanical disk drives such as a floppy disk, a flexible disk, or a hard disk
- RAM-based such as SRAM, DRAM, SDRAM, DDR, MRAM, etc.
- SSD solid-state drives
- magnetic tape any other magnetic or magneto-optical medium
- CD-ROM any other optical medium
- any other physical medium with patterns of holes RAM, PROM, EPROM, FLASH-EPROM, any other memory chip or cartridge, or any other
- execution of the sequences of instructions to practice the invention is performed by a single computer system 1400 .
- two or more computer systems 1400 coupled by communication link 1415 may perform the sequence of instructions required to practice the invention in coordination with one another.
- Computer system 1400 may transmit and receive messages, data, and instructions, including program, i.e., application code, through communication link 1415 and communication interface 1414 .
- Received program code may be executed by processor 1407 as it is received, and/or stored in disk drive 1410 , or other non-volatile storage for later execution.
- the computer system 1400 operates in conjunction with a data storage system 1431 , e.g., a data storage system 1431 that contains a database 1432 that is readily accessible by the computer system 1400 .
- the computer system 1400 communicates with the data storage system 1431 through a data interface 1433 .
- a data interface 1433 which is coupled to the bus 1406 , transmits and receives electrical, electromagnetic or optical signals that include data streams representing various types of signal information, e.g., instructions, messages and data.
- the functions of the data interface 1433 may be performed by the communication interface 1414 .
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Networks & Wireless Communication (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- User Interface Of Digital Computer (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
- This application claims the benefit of U.S. Provisional App. Ser. No. 61/367,398, filed on Jul. 24, 2010 and entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR CONSTRAINT VERIFICATION FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS”, U.S. Provisional App. Ser. No. 61/367,412, filed on Jul. 24, 2010 and entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS”, U.S. Provisional App. Ser. No. 61/367,404, filed on Jul. 24, 2010 and entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURES FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRO-MIGRATION AWARENESS”, U.S. Provisional App. Ser. No. 61/367,406, filed on Jul. 24, 2010 and entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURES FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH IR-DROP AWARENESS”, U.S. Provisional App. Ser. No. 61/367,407, filed on Jul. 24, 2010 and entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURES FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH SIMULATION AWARENESS”, and U.S. Provisional App. Ser. No. 61/367,410, filed on Jul. 24, 2010 and entitled “METHOD, APPARATUS, AND ARTICLE OF MANUFACTURE FOR PROVIDING IN SITU, CUSTOMIZABLE INFORMATION IN DESIGNING ELECTRONIC CIRCUITS WITH ELECTRICAL AWARENESS”. The entire contents of the aforementioned applications are hereby expressly incorporated by reference in their entirety.
- This application is related to U.S. patent application Ser. No. ______, entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS” and filed concurrently under Atty. Dkt. No. 10PA057US01, U.S. patent application Ser. No. ______, entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRO-MIGRATION AWARENESS” and filed concurrently under Atty. Dkt. No. 10PA058US01, U.S. patent application Ser. No. ______, entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH SIMULATION AWARENESS” and filed concurrently under Atty. Dkt. No. 10PA060US01, and U.S. patent application Ser. No. ______, entitled “METHOD, APPARATUS, AND ARTICLE OF MANUFACTURE FOR PROVIDING IN SITU, CUSTOMIZABLE INFORMATION IN DESIGNING ELECTRONIC CIRCUITS WITH ELECTRICAL AWARENESS” and filed concurrently under Atty. Dkt. No. 10PA061US01. The entire disclosures of the above applications are hereby expressly incorporated by reference in their entireties in the instant Application.
- The recent advances in very deep sub-micron (VDSM) integrated circuits (ICs) have brought new challenges in the physical design methodology process of integrated systems.
- For example, most conventional electronic circuit design tools focus on post-layout verification to verify, for example, whether parasitics satisfy the corresponding constraints when the entire chip design is complete and detailed information about the parasitics of the physical designs and the currents drawn by the transistors are known. In these conventional approaches, the parasitics are extracted from the completed layout and then verified against the corresponding constraints. Moreover, the conventional circuit synthesis step is followed by layout synthesis, and each step is carried out independent of the other in these conventional approaches. This is again followed by a physical or formal verification step upon the completion of the entire physical layout to check whether the desired goals have been achieved after layout generation and extraction. These steps are carried out iteratively in the conventional approaches till the desired performance goals are met.
- Nonetheless, such an iterative approach wastes significant amount of resources because various physical design tools, such as the placement tool, the router, etc., and various schematic design tools, such as the schematic editor, the schematic level simulator(s), etc., are unaware of the parasitics associated with the physical design of the electronic circuit and the electrical characteristics associated with the parasitics.
- Thus, there exists a need for constraint verification for implementing electronic circuit designs with electrical awareness early in the design stage.
- What is needed is a method, a system, and a computer program product for constraint verification for implementing electronic circuit designs with electrical awareness. Some embodiments are directed at performing constraint verification during the implementation of the physical design of an electronic circuit. In one or more embodiments, the method or system for constraint verification for implementing electronic circuit designs with electrical awareness identifies, determines, or updates the physical data of a net, a device, or a component (hereinafter “component” collectively.) In various embodiments, the method or system may characterize shapes associated with a net and need to determine connectivity to identify one net from another. In some embodiments, the method or the system may also comprise the process or module for identifying, determining, or characterizing an electrical parasitic that is associated with the component in the physical design. In some embodiments, the method or the system may also comprise the process or module for identifying, determining, or characterizing a device parameter that is associated with the component in the physical design. In some embodiments, the method or the system may also comprise the process or module for identifying, determining, or characterizing an electrical parasitic or a device parameter that is associated with the component in the physical design. In these embodiments, the electrical parasitic and the device parameter are collectively referred to as “electrical parasitic” or simply “parasitic”.
- In one or more embodiments, the method or the system may identify or receive one or more constraints corresponding to the one or more parasitics. In these embodiments, the methods or systems may then perform the process(es) to compare the one or more electrical parasitics with the corresponding parasitic constraints. More details about various processes or modules for the methods or systems for constraint verification for implementing electronic circuits with electrical awareness will be further described in the following paragraphs with reference to the respective figures.
- In one or more embodiments, the characterization of electrical parasitics, such as but not limited to various types of R, L, or C for one or more shapes that constitute a net, and the subsequent characterization of the electrical behavior or characteristic(s), such as but not limited to various types of currents, voltages, or current densities, as well as the constraint verification occur as a single net (or one or more shapes that are part of a net) has been created or modified but before the creation or modification of the next net or one or more shapes that are part of the next net. These characterizations or verification may also occur incrementally as a net is being created or modified in some embodiments. The simulation produced terminal currents may be used as one or more nets that connect to these terminals are being created or modified in some embodiments. In addition, these characterizations or verification may occur while there is only a partial layout in some embodiments. In these embodiments, the simulation, re-simulation, characterization, or verification of the electronic circuit design may be performed in conjunction with the creation or modification of the physical design of an electronic circuit design so that any impact of a circuit component is addressed before the physical design is completed.
- The drawings illustrate the design and utility of various embodiments of the invention. It should be noted that the figures are not drawn to scale and that elements of similar structures or functions are represented by like reference numerals throughout the figures. In order to better appreciate how to obtain the above-recited and other advantages and objects of various embodiments of the invention, a more detailed description of the inventions briefly described above will be rendered by reference to specific embodiments thereof, which are illustrated in the accompanying drawings. Understanding that these drawings depict only typical embodiments of the invention and are not therefore to be considered limiting of its scope, the invention will be described and explained with additional specificity and detail through the use of the accompanying drawings in which:
-
FIGS. 1A-B illustrate top level block diagrams for a method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. -
FIGS. 2A-B illustrate top level block diagrams for a method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. -
FIG. 3 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. -
FIG. 4 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. -
FIG. 5 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. -
FIG. 6 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. -
FIG. 7 depicts a computerized system on which a method for timing closure with concurrent process models can be implemented. - Various embodiments of the invention are directed to a methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness in one or more embodiments. Other objects, features, and advantages of the invention are described in the detailed description, figures, and claims.
- Various embodiments will now be described in detail with reference to the drawings, which are provided as illustrative examples of the invention so as to enable those skilled in the art to practice the invention. Notably, the figures and the examples below are not meant to limit the scope of the invention. Where certain elements of the present invention can be partially or fully implemented using known components (or methods or processes), only those portions of such known components (or methods or processes) that are necessary for an understanding of the present invention will be described, and the detailed descriptions of other portions of such known components (or methods or processes) will be omitted so as not to obscure the invention. Further, various embodiments of the present invention encompasses present and future known equivalents to the components referred to herein by way of illustration.
-
FIG. 1A illustrates a top level diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in some embodiments.FIG. 1A illustrates that the system may comprise using an user interface of acomputing system 110 to interface with various processes or modules for performing various actions as described below. More details about the user interface are described in U.S. patent application Ser. No. ______, entitled “METHODS, SYSTEMS, AND ARTICLES OF MANUFACTURE FOR PROVIDING IN SITU, CUSTOMIZABLE INFORMATION FOR IMPLEMENTING ELECTRONIC CIRCUIT DESIGNS WITH ELECTRICAL AWARENESS” and filed concurrently under Atty. Dkt. No. 10PA061US01, the entire disclosure of which are hereby expressly incorporated by reference in their entireties in the instant Application. - In one or more embodiments, the method or the system may comprise the process or
module 104 for identifying, determining, or updating the physical data of a net, a device, or a component (hereinafter “component” collectively) of a portion of a physical design of an electronic circuit, for example a portion of a layout of the electronic design. In some embodiments, the method or the system applies to an electronic design when the first component of the design is being implemented in a physical design tool, such as a layout tool. In some embodiments, the process for identifying, determining, or updating physical data of a component of an electronic circuit physical design may be invoked from within a physical design tool or flow, such as a layout editor, while the designer is implementing or modifying the physical design of the electronic circuit rather than from a post-layout verification tool or flow in one or more embodiments. In some embodiments, device recognition and connectivity tasks are performed to able to map electrical characteristics such as current at a given terminal with the proper nets attached to that terminal. In some embodiments, connectivity can be directed to traverse the nets hierarchically and stop on levels determined by the user. - In these embodiments as illustrated in
FIG. 1A , the method or the process may also comprise the process ormodule 106 for characterizing one or more electrical parasitics that are associated with the physical data of the component. - In some embodiments, the characterization of electrical parasitics associated with physical data may be done with a two stage approach. This process begins with the selection a particular net or partial net. In the first stage, the process identifies where along that net that a geometric description should be created. The geometric descriptions may include wire widths and spacings, conductor and ILD (inter layer dielectrics) thicknesses, or thickness of barrier materials. A common description may be created and provided via an API (application programming interface.)
- The second stage may include one or more components that may translate, transform, convert, or map (hereinafter “map”) the geometric description to an equivalent parasitic value such as a resistance, capacitance or inductance. This translation, transformation, conversion, or mapping (hereinafter “mapping”) may be done with mathematical algorithms or models that are often referred to as parasitic extraction. The models may be created through the use of semi-empirical methods that combine models or knowledge of the underlying physics with data provided by various solver(s), simulator(s), or a combination thereof. In some cases, the mapping for capacitance may also be done with a solver.
- In some embodiments, the second stage may use parasitic extraction for some nets and a field solver for other nets. In some embodiments, the second stage may use a combination of parasitic extraction for, for example, resistance(s) and a field solver for, for example, capacitance(s) on the same net. In some embodiments, the characterization of electrical parasitics may be performed with extraction tools that map geometric dimensions and patterns to corresponding parasitics such as R, L, and C. In some embodiments, the characterization of electrical parasitics includes the use of field solvers (such as but not limited to one or more EM field solvers) that map geometric dimensions and patterns to capacitance(s).
- In a single embodiment or in some embodiments, the electrical parasitic data associated with the physical data is provided to a matrix solver for static or transient analysis. The matrix solver is run to produce voltage and current data for device and interconnect components of the design. In a single embodiment or in some embodiments, the method or system for implementing electronic circuit designs with simulation related constraints or performance expectations comprises a flow where the simulator or solver is invoked after a single net has been created or modified.
- More details about the processes or
modules - The method or the system may further comprise a process or a
module 102 for identifying one or more parasitic constraints that are associated with the one or more electrical parasitics in some embodiments. For example, the method or the system may identify or receive the constraints on the resistance (R), the total, coupling, or capacitance coupled through substrate (collectively C), or inductance (L) of a net between two terminals from various sources, such as a user, a constraint manager that interacts with a constraint library, or from the electronic circuit design tool set that comprises various tools in various domains (e.g., the schematic domain, the physical domain, the post-layout domain, . . . ), etc. - In one or more embodiments, the method or the system may further comprise the process or
module 108 of performing constraint verification for the one or more constraints associated with the one or more electrical parasitics. In some embodiments, the process ormodule 108 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied. - In one or more embodiments, the characterization of parasitics such as but not limited to various types of R, L, or C for one or more shapes that constitute a net and the subsequent characterization of the electrical behavior or characteristic(s), such as but not limited to various types of currents, voltages, or current densities, as well as the constraint verification occur as a single net (or one or more shapes that are part of a net) has been created or modified but before the creation or modification of the next net or one or more shapes that are part of the next net. These characterizations or verification may also occur incrementally as a net is being created or modified in some embodiments. The simulation produced terminal currents may be used as one or more nets that connect to these terminals are being created or modified in some embodiments. In addition, these characterizations or verification may occur while there is only a partial layout in some embodiments. In these embodiments, the simulation, re-simulation, characterization, or verification of the electrical parasitics may be performed in conjunction with the creation or modification of the physical design of an electronic circuit design so that any impact of a circuit component is addressed before the physical design is completed.
-
FIG. 1B illustrates a top level block diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in one or more embodiments. The block diagram as illustrated inFIG. 1B is substantially similar to that ofFIG. 1A . The method or the system for constraint verification illustrated inFIG. 1B may comprise using an user interface of acomputing system 162 to interface with various processes or modules for performing various actions as described below. In one or more embodiments, the method or the system may comprise the process ormodule 154 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit. In one or more embodiments, the method or the system may comprise the process ormodule 156 for characterizing one or more electrical parasitics that are associated with the physical data of a component of a portion of a physical design of an electronic circuit. - In these embodiments as illustrated in
FIG. 1B , the method or the process may also comprise the process ormodule 156 for characterizing one or more electrical parasitics that are associated with the physical data of the component. The method or the system may further comprise a process or amodule 152 for identifying one or more parasitic constraints that are associated with the one or more electrical parasitics in some embodiments. In one or more embodiments, the method or the system may further comprise the process ormodule 158 of performing constraint verification for the one or more constraints associated with the one or more electrical parasitics. - In some embodiments, the process or
module 158 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied. The method or system as illustrated inFIG. 1B may further optionally comprise the process ormodule 160 for storing one or more results of the process or module in a non-transitory computer readable storage medium or displaying the one or more results in the user interface on a display apparatus in some embodiments. -
FIG. 2A illustrates a top level block diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in one or more embodiments. In one or more embodiments, the method or the system for constraint verification for implementing electronic circuit designs comprise using an user interface of acomputing system 210 to interface with various processes or modules for performing various actions as described below. In one or more embodiments, the method or the system may comprise the process ormodule 204 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit, for example a portion of a layout of the electronic design. - In these embodiments as illustrated in
FIG. 2A , the method or the process may also comprise the process ormodule 206 for characterizing one or more electrical parasitics that are associated with the physical data of the component. The method or the system may further comprise a process or amodule 202 for identifying or receiving one or more manual settings of parasitic constraints from a user in some embodiments. For example, a designer may manually set the limit on the resistance of an interconnect between two terminals, and the method or the system takes that limit as a constraint and determines whether the electrical parasitic (R in this example) of the interconnect satisfies the constraint that is manually entered by the designer. - In one or more embodiments, the method or the system may further comprise the process or
module 208 of performing constraint verification for the one or more constraints associated with the one or more electrical parasitics. In some embodiments, the process ormodule 208 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied. -
FIG. 2B illustrates a top level block diagram for a method or system for constraint verification for implementing electronic circuit design with electrical awareness in one or more embodiments. In these embodiments as illustrated inFIG. 2B , the method or the system for constraint verification for implementing electronic circuit designs comprise using an user interface of acomputing system 266 to interface with various processes or modules for performing various actions as described below. The method or the system may comprise the process ormodule 252 for identifying or creating a schematic design of the electronic circuit and/or the process ormodule 254 for using an environment, for example a simulation environment, for setting, receiving, or identifying one or more circuit performance or behavior constraints in some embodiments. - The method or the system may also comprise the process or
module 256 for performing one or more simulations using at least the schematic design and the one or more performance or behavior constraints in some embodiments. The method or the system may further comprise the process or module 258 for estimating one or more parasitic constraints based at least in part upon the result(s) of the one or more simulations and/or the one or more performance or behavior constraints in some embodiments as illustrated inFIG. 2B . For example, the method or the system may use the currents, voltages, etc. determined in the schematic level simulations to estimate the constraints for the corresponding electrical parasitics in some embodiments. - The method or the system may also comprise the process or
module 260 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit. The method or the process may also comprise the process ormodule 262 for characterizing one or more electrical parasitics that are associated with the physical data of the component. - In one or more embodiments after 262 or 256, the method or the system may further comprise the process or
module 264 for performing constraint verification for the one or more constraints associated with the one or more electrical parasitics. In some embodiments, the process ormodule 264 may comprise the process or module of comparing the one or more electrical constraints with the respective one or more constraints to determine whether the one or more constraints are satisfied. -
FIG. 3 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in some embodiments. In one or more embodiments as illustrated inFIG. 3 , the method or the system may comprise the process or module for using an user interface of acomputing system 316 to interface with various processes or modules for performing various actions as described below. The method or the system may further comprise the process ormodule 302 for identifying, setting, or receiving one or more constraints. The method or system may further comprise the process ormodule 304 for identifying, determining, or updating the physical data of a component of a portion of a physical design of an electronic circuit, for example a portion of a layout of the electronic design. In these embodiments, the method or the system may also comprise the process ormodule 306 for characterizing one or more electrical parasitics that are associated with the physical data of the component. - Once the one or more parasitics are characterized at 306 and the one or more parasitic constraints are set, identified, or received at 302, the method or the system may further comprise the process or
module 308 for verifying whether or not the one or more electrical parasitics meet the corresponding one or more parasitic constraints at 308 in some embodiments. The method or the system may further optionally comprise the process or module 310 for determining or computing one or more adjustments for the physical data in the event that some of the one or more parasitic constraints are not satisfied in some embodiments. In some embodiments, an adjustment comprises creation of a new route or a segment thereof or modification of an existing route or a segment thereof. In some embodiments, an adjustment comprises placement of a component in a physical design of an electronic circuit design. - In addition or in the alternative, the method or the system may further comprise the process or module 310 for providing one or more hints to correct the physical data in the event that some of the one or more parasitic constraints are not satisfied in some embodiments. In addition, the method or the system may also optionally comprise the process or module 312 for determining or checking to see whether the one or more adjustments or the one or more hints violate other design rule(s), constraint(s), or other requirement(s). At 314, the method or the system may comprise the process or module for applying, either automatically or with assistance, at least one of the one or more adjustments to fix the physical data of the component or the physical data of other elements that are also affected by the corresponding one or more electrical parasitics.
-
FIG. 4 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in one or more embodiments. In some embodiments as illustrated inFIG. 4 , the method or the system may comprise the process ormodule 402 for identifying or creating a schematic design of the electronic circuit and/or the process ormodule 404 for setting, receiving, or identifying one or more parasitic constraints in some embodiments. The method or the system may further optionally comprise the process ormodule 406 for mapping the one or more parasitics to a physical design representation in some embodiments. - In addition or in the alternative, the method or the system may comprise the process or
module 408 for identifying, determining, or updating the physical data of a component of a portion of a physical design of the electronic circuit in some embodiments. The method or the system may also comprise the process ormodule 410 for characterizing one or more electrical parasitics that are associated with the physical data in some embodiments. - After the one or more electrical parasitics are characterized at 410 or after the one or more parasitic constraints are mapped at 406, the method or the system may further comprise the process or
module 412 for verifying whether the one or more electrical parasitics meet the one or more parasitic constraints in some embodiments. In these embodiments, the method or the system may further optionally comprise the process ormodule 414 for displaying the results of the act of verifying the parasitic constraints in a user interface on a display apparatus or storing the results on a non-transitory computer readable storage medium in some embodiments. -
FIG. 5 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in one or more embodiments. In these embodiments as illustrated inFIG. 5 , the method or the system may comprise the process ormodule 502 for identifying or creating a schematic design of the electronic circuit and/or the process ormodule 504 for setting, receiving, or identifying one or more parasitic constraints in some embodiments. In these embodiments as illustrated inFIG. 5 , the method or the system may further comprise the process ormodule 506 for identifying, determining, or updating the physical data of a component in a partial physical design of the electronic circuit. In one or more embodiments, the method or the system may further comprise the process ormodule 508 for characterizing one or more electrical parasitics that are associated with the physical data of the component in a partial physical design of the electronic circuit. - After the one or more parasitic constraints are mapped at 510 or after the one or more parasitic constraints are set, identified, or received at 504, the method or the system may further comprise the process or
module 512 for verifying whether the one or more electrical parasitics meet the corresponding one or more parasitic constraints in some embodiments. In some embodiments, the process ormodule 512 comprise the process or module of comparing the one or more electrical parasitics with the corresponding one or more parasitic constraints to determine whether the one or more parasitic constraints are met. In these embodiments, the method or the system may further optionally comprise the process ormodule 514 for displaying the results of the act of verifying the parasitic constraints in a user interface on a display apparatus or storing the results on a non-transitory computer readable storage medium in some embodiments. -
FIG. 6 illustrates more detailed block diagram for the method or system for constraint verification for implementing electronic circuit designs with electrical awareness in one or more embodiments. - The method or system for constraint verification for implementing electronic circuit design with electrical awareness may comprise the process or module of identifying or creating a schematic design at 602 in some embodiments. The method or system for constraint verification for implementing electronic circuit designs with electrical awareness may further comprise the process or module for identifying or receiving a parasitic constraint at 604 in some embodiments. The method or system for constraint verification for implementing electronic circuit designs with electrical awareness may further comprise the process or module for mapping the parasitic constraint at 606 based at least in part upon the schematic-to-physical design representation in some embodiments.
- The method or system for constraint verification for implementing electronic circuit designs with electrical awareness may further comprise the process or module for identifying, determining, or updating physical data of a net, a device, or a component of an electronic circuit physical design at 608 in some embodiments. The method or system may also comprise the process or module for 610 characterizing the electrical parasitic associated with the physical data at 660 in some embodiments. After the process or
module 610 or the process ormodule 606, the method or system may also proceed to the process or module for verifying the parasitic constraint at 612 in some embodiments. In some embodiments, the process ormodule 612 may comprise the process ormodule 612 for comparing the electrical parasitic with the parasitic constraint to determine whether the parasitic constraint is satisfied. - The method or system may also comprise the process or module for computing one or more adjustments or providing one or more hints to correct the physical data at 614 in some embodiments where the parasitic constraint is not met. The method or system may further comprise the process or module for determining or checking to ensure the one or more adjustments or the one or more hints do not violate other constraints, design rules, or requirements at 616 in some embodiments. The method or system may further comprise the process or module for applying at least one of the one or more adjustments to the component with which the physical data are associated at 618.
-
FIG. 7 illustrates a block diagram of anillustrative computing system 1400 suitable for implementing some embodiments of the method or system for constraint verification for implementing an electronic circuit design of an electronic circuit with electrical awareness as described in the preceding paragraphs with reference to various figures.Computer system 1400 includes abus 1406 or other communication mechanism for communicating information, which interconnects subsystems and devices, such asprocessor 1407, system memory 1408 (e.g., RAM), static storage device 1409 (e.g., ROM), disk drive 1410 (e.g., magnetic or optical), communication interface 1414 (e.g., modem or Ethernet card), display 1411 (e.g., CRT or LCD), input device 1412 (e.g., keyboard), and cursor control (not shown). - According to one embodiment,
computer system 1400 performs specific operations by one or more processors orprocessor cores 1407 executing one or more sequences of one or more instructions contained insystem memory 1408. Such instructions may be read intosystem memory 1408 from another computer readable/usable storage medium, such asstatic storage device 1409 ordisk drive 1410. In alternative embodiments, hard-wired circuitry may be used in place of or in combination with software instructions to implement the invention. Thus, embodiments of the invention are not limited to any specific combination of hardware circuitry and/or software. In one embodiment, the term “logic” shall mean any combination of software or hardware that is used to implement all or part of the invention. - Various actions or processes as described in the preceding paragraphs may be performed by using one or more processors, one or more processor cores, or
combination thereof 1407, where the one or more processors, one or more processor cores, or combination thereof executes one or more threads. For example, the act of specifying various net or terminal sets or the act or module of performing verification or simulation, etc. may be performed by one or more processors, one or more processor cores, or combination thereof. In one embodiment, the parasitic extraction, current solving, current density computation and current or current density verification is done in memory as layout shapes or nets are created or modified. - The term “computer readable storage medium” or “computer usable storage medium” as used herein refers to any medium that participates in providing instructions to
processor 1407 for execution. Such a medium may take many forms, including but not limited to, non-volatile media and volatile media. Non-volatile media includes, for example, optical or magnetic disks, such asdisk drive 1410. Volatile media includes dynamic memory, such assystem memory 1408. - Common forms of computer readable storage media includes, for example, electromechanical disk drives (such as a floppy disk, a flexible disk, or a hard disk), a flash-based, RAM-based (such as SRAM, DRAM, SDRAM, DDR, MRAM, etc.), or any other solid-state drives (SSD), magnetic tape, any other magnetic or magneto-optical medium, CD-ROM, any other optical medium, any other physical medium with patterns of holes, RAM, PROM, EPROM, FLASH-EPROM, any other memory chip or cartridge, or any other medium from which a computer can read.
- In an embodiment of the invention, execution of the sequences of instructions to practice the invention is performed by a
single computer system 1400. According to other embodiments of the invention, two ormore computer systems 1400 coupled by communication link 1415 (e.g., LAN, PTSN, or wireless network) may perform the sequence of instructions required to practice the invention in coordination with one another. -
Computer system 1400 may transmit and receive messages, data, and instructions, including program, i.e., application code, throughcommunication link 1415 andcommunication interface 1414. Received program code may be executed byprocessor 1407 as it is received, and/or stored indisk drive 1410, or other non-volatile storage for later execution. In an embodiment, thecomputer system 1400 operates in conjunction with adata storage system 1431, e.g., adata storage system 1431 that contains adatabase 1432 that is readily accessible by thecomputer system 1400. Thecomputer system 1400 communicates with thedata storage system 1431 through adata interface 1433. Adata interface 1433, which is coupled to thebus 1406, transmits and receives electrical, electromagnetic or optical signals that include data streams representing various types of signal information, e.g., instructions, messages and data. In embodiments of the invention, the functions of thedata interface 1433 may be performed by thecommunication interface 1414. - In the foregoing specification, the invention has been described with reference to specific embodiments thereof. It will, however, be evident that various modifications and changes may be made thereto without departing from the broader spirit and scope of the invention. For example, the above-described process flows are described with reference to a particular ordering of process actions. However, the ordering of many of the described process actions may be changed without affecting the scope or operation of the invention. The specification and drawings are, accordingly, to be regarded in an illustrative rather than restrictive sense.
Claims (30)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/982,732 US8762914B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness |
TW100126052A TWI529552B (en) | 2010-07-24 | 2011-07-22 | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness |
PCT/US2011/045126 WO2012015709A1 (en) | 2010-07-24 | 2011-07-22 | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness |
Applications Claiming Priority (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US36739810P | 2010-07-24 | 2010-07-24 | |
US36741210P | 2010-07-24 | 2010-07-24 | |
US36740710P | 2010-07-24 | 2010-07-24 | |
US36740410P | 2010-07-24 | 2010-07-24 | |
US36741010P | 2010-07-24 | 2010-07-24 | |
US36740610P | 2010-07-24 | 2010-07-24 | |
US12/982,732 US8762914B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness |
Publications (2)
Publication Number | Publication Date |
---|---|
US20120023468A1 true US20120023468A1 (en) | 2012-01-26 |
US8762914B2 US8762914B2 (en) | 2014-06-24 |
Family
ID=45494297
Family Applications (7)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/982,721 Active 2031-05-01 US8694950B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness |
US12/982,762 Active 2032-02-13 US9330222B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electro-migration awareness |
US12/982,790 Active 2031-05-04 US8694933B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with simulation awareness |
US12/982,628 Active 2031-08-22 US8689169B2 (en) | 2010-07-24 | 2010-12-30 | Method, apparatus, and article of manufacture for providing in situ, customizable information in designing electronic circuits with electrical awareness |
US12/982,732 Active 2031-05-21 US8762914B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness |
US13/189,274 Active US8701067B1 (en) | 2010-07-24 | 2011-07-22 | Methods, systems, and articles of manufactures for implementing electronic circuit designs with IR-drop awareness |
US14/247,236 Active US9223925B2 (en) | 2010-07-24 | 2014-04-07 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with simulation awareness |
Family Applications Before (4)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/982,721 Active 2031-05-01 US8694950B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness |
US12/982,762 Active 2032-02-13 US9330222B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electro-migration awareness |
US12/982,790 Active 2031-05-04 US8694933B2 (en) | 2010-07-24 | 2010-12-30 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with simulation awareness |
US12/982,628 Active 2031-08-22 US8689169B2 (en) | 2010-07-24 | 2010-12-30 | Method, apparatus, and article of manufacture for providing in situ, customizable information in designing electronic circuits with electrical awareness |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US13/189,274 Active US8701067B1 (en) | 2010-07-24 | 2011-07-22 | Methods, systems, and articles of manufactures for implementing electronic circuit designs with IR-drop awareness |
US14/247,236 Active US9223925B2 (en) | 2010-07-24 | 2014-04-07 | Methods, systems, and articles of manufacture for implementing electronic circuit designs with simulation awareness |
Country Status (2)
Country | Link |
---|---|
US (7) | US8694950B2 (en) |
TW (5) | TWI529552B (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090199139A1 (en) * | 2007-12-27 | 2009-08-06 | David White | Method, system, and computer program product for improved electrical analysis |
US8595662B1 (en) | 2011-12-30 | 2013-11-26 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing a physical design of an electronic circuit with automatic snapping |
US8645902B1 (en) | 2011-12-30 | 2014-02-04 | Cadence Design Systems, Inc. | Methods, systems, and computer program products for implementing interactive coloring of physical design components in a physical electronic design with multiple-patterning techniques awareness |
US8694943B1 (en) * | 2011-12-30 | 2014-04-08 | Cadence Design Systems, Inc. | Methods, systems, and computer program product for implementing electronic designs with connectivity and constraint awareness |
US9053289B1 (en) | 2012-04-12 | 2015-06-09 | Cadence Design Systems, Inc. | Method and system for implementing an improved interface for designing electronic layouts |
US9064063B1 (en) | 2011-12-30 | 2015-06-23 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing interactive, real-time checking or verification of complex constraints |
US20170241040A1 (en) * | 2014-10-17 | 2017-08-24 | Dipsol Chemicals Co., Ltd. | Copper-nickel alloy electroplating device |
US10237644B1 (en) * | 2016-09-23 | 2019-03-19 | Apple Inc. | Enhancing a listening experience by adjusting physical attributes of an audio playback system based on detected environmental attributes of the system's environment |
Families Citing this family (53)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8521483B1 (en) * | 2010-06-02 | 2013-08-27 | Cadence Design Systems, Inc. | Method and apparatus for concurrent design of modules across different design entry tools targeted to single simulation |
US8694950B2 (en) | 2010-07-24 | 2014-04-08 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness |
US8782577B2 (en) | 2010-07-24 | 2014-07-15 | Cadence Design Systems, Inc. | Method, apparatus, and article of manufacture for providing in situ, customizable information in designing electronic circuits with electrical awareness |
US8726207B2 (en) * | 2011-05-25 | 2014-05-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | On-the-fly device characterization from layouts of circuits |
US8769456B1 (en) * | 2011-10-26 | 2014-07-01 | Cadence Design Systems, Inc. | Methods, systems, and articles for implementing extraction and electrical analysis-driven module creation |
US9177095B1 (en) * | 2011-10-26 | 2015-11-03 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for creating or manipulating electrical data sets for an electronic design |
US8510702B2 (en) * | 2011-11-15 | 2013-08-13 | Texas Instruments Incorporated | Interactive routing editor with symbolic and geometric views for integrated circuit layout |
US8656325B2 (en) * | 2012-01-12 | 2014-02-18 | International Business Machines Corporation | Integrated circuit design method and system |
US8631372B2 (en) * | 2012-02-10 | 2014-01-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method of electromigration mitigation in stacked IC designs |
US8621409B2 (en) * | 2012-04-30 | 2013-12-31 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for reducing layout-dependent effects |
US8793632B2 (en) * | 2012-05-31 | 2014-07-29 | Freescale Semiconductor, Inc. | Techniques for electromigration stress determination in interconnects of an integrated circuit |
US8732641B1 (en) * | 2012-11-15 | 2014-05-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | Pattern matching based parasitic extraction with pattern reuse |
US8826211B1 (en) * | 2012-11-30 | 2014-09-02 | Cadence Design Systems, Inc. | Graphical user interface for physically aware clock tree planning |
US9141746B1 (en) * | 2014-03-31 | 2015-09-22 | Cadence Design Systems, Inc. | System and method to drag instance master physical shell |
US8898608B1 (en) * | 2013-07-15 | 2014-11-25 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method for displaying timing information of an integrated circuit floorplan |
US9152751B2 (en) * | 2013-09-30 | 2015-10-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Metal lines for preventing AC electromigration |
US9384317B1 (en) * | 2013-11-01 | 2016-07-05 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing electronic designs using constraint driven techniques |
US9092589B2 (en) * | 2013-11-29 | 2015-07-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | Integrated circuit design flow with device array layout generation |
US10445699B2 (en) * | 2014-01-30 | 2019-10-15 | Mentor Graphics Corporation | Social electronic design automation |
US9569583B2 (en) | 2014-04-07 | 2017-02-14 | TallannQuest LLC | Method and system for computer-aided design of radiation-hardened integrated circuits |
DE102014220215A1 (en) * | 2014-10-07 | 2016-04-07 | Robert Bosch Gmbh | Method for wireless communication |
CN105653744A (en) * | 2014-11-13 | 2016-06-08 | 中芯国际集成电路制造(上海)有限公司 | Method and device for designing layout |
US9471738B2 (en) * | 2015-02-05 | 2016-10-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for capacitance extraction |
US10783292B1 (en) | 2015-05-21 | 2020-09-22 | Pulsic Limited | Automated analog layout |
US9679099B2 (en) | 2015-07-01 | 2017-06-13 | International Business Machines Corporation | De-coupling capacitance placement |
US9740815B2 (en) | 2015-10-26 | 2017-08-22 | Globalfoundries Inc. | Electromigration-aware integrated circuit design methods and systems |
US10282507B2 (en) * | 2015-11-24 | 2019-05-07 | Oracle International Corporation | Method and system for determining circuit failure rate |
US10127338B2 (en) * | 2015-12-15 | 2018-11-13 | Taiwan Semiconductor Manufacturing Company Ltd. | System, method and associated computer readable medium for designing integrated circuit with pre-layout RC information |
US10216870B2 (en) * | 2016-01-13 | 2019-02-26 | International Business Machines Corporation | Methodology to prevent metal lines from current pulse damage |
US20170308639A1 (en) * | 2016-04-25 | 2017-10-26 | Mediatek Inc. | Method for analyzing ir drop and electromigration of ic |
US9990454B2 (en) | 2016-06-03 | 2018-06-05 | International Business Machines Corporation | Early analysis and mitigation of self-heating in design flows |
US10161994B2 (en) * | 2016-06-14 | 2018-12-25 | Formfactor Beaverton, Inc. | Systems and methods for electrically testing electromigration in an electromigration test structure |
US10445457B1 (en) * | 2016-06-30 | 2019-10-15 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing a physical design of an electronic design with DFM and design specification awareness |
US10331843B1 (en) * | 2016-09-27 | 2019-06-25 | Altera Corporation | System and method for visualization and analysis of a chip view including multiple circuit design revisions |
TWI750155B (en) * | 2017-03-03 | 2021-12-21 | 聯華電子股份有限公司 | System for automatically generating design rule check (drc) and method thereof |
US10380314B1 (en) * | 2017-05-10 | 2019-08-13 | Cadence Design Systems, Inc. | System and method for estimating current in an electronic circuit design |
US10423752B2 (en) | 2017-09-29 | 2019-09-24 | International Business Machines Corporation | Semiconductor package metal shadowing checks |
US10521097B1 (en) | 2017-09-29 | 2019-12-31 | Cadence Design Systems, Inc. | User interface to implement topology integrity throughout routing implementations |
US10423751B2 (en) | 2017-09-29 | 2019-09-24 | International Business Machines Corporation | Semiconductor package floating metal checks |
US10423753B1 (en) * | 2017-09-29 | 2019-09-24 | Cadence Design Systems, Inc. | Method and apparatus for efficient and accurate signal electromigration analysis of digital-on-top designs with complex interface pin shapes |
US10678978B1 (en) * | 2017-09-30 | 2020-06-09 | Cadence Design Systems, Inc. | Methods, systems, and computer program product for binding and back annotating an electronic design with a schematic driven extracted view |
US10467370B1 (en) | 2017-09-30 | 2019-11-05 | Cadence Design Systems, Inc. | Methods, systems, and computer program product for implementing a net as a transmission line model in a schematic driven extracted view for an electronic design |
US10558780B1 (en) | 2017-09-30 | 2020-02-11 | Cadence Design Systems, Inc. | Methods, systems, and computer program product for implementing schematic driven extracted views for an electronic design |
US10551431B1 (en) * | 2017-12-22 | 2020-02-04 | Cadence Design Systems, Inc. | EM-compliance topology in a tree router |
US10592628B2 (en) * | 2018-01-17 | 2020-03-17 | Mentor Graphics Corporation | Parasitic extraction based on compact representation of process calibration data |
US10073440B1 (en) * | 2018-02-13 | 2018-09-11 | University Of Central Florida Research Foundation, Inc. | Method for the design and manufacture of composites having tunable physical properties |
US10783296B1 (en) * | 2018-06-08 | 2020-09-22 | Diakopto, Inc. | Matched net and device analysis based on parasitics |
US11107714B2 (en) * | 2018-10-31 | 2021-08-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Electromigration evaluation methodology with consideration of thermal and signal effects |
US11314914B2 (en) * | 2018-11-29 | 2022-04-26 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and non-transitory computer readable medium of operating an electronic design automation platform for an optimal intgrated circuit design |
US11074391B2 (en) * | 2019-01-22 | 2021-07-27 | International Business Machines Corporation | Characterizing and simulating library gates to enable identification and elimination of electromigration violations in semiconductor chips |
US10997333B1 (en) | 2019-12-05 | 2021-05-04 | Cadence Design Systems, Inc. | Methods, systems, and computer program product for characterizing an electronic design with a schematic driven extracted view |
US11853680B2 (en) * | 2020-07-06 | 2023-12-26 | Synopsys, Inc. | Incremental routing based pin assignment |
CN117932980B (en) * | 2024-03-22 | 2024-06-11 | 芯瑞微(上海)电子科技有限公司 | Multi-process industrial design software simulation method and device based on instruction set architecture |
Citations (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5553002A (en) * | 1990-04-06 | 1996-09-03 | Lsi Logic Corporation | Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, using milestone matrix incorporated into user-interface |
US6131182A (en) * | 1997-05-02 | 2000-10-10 | International Business Machines Corporation | Method and apparatus for synthesizing and optimizing control logic based on SRCMOS logic array macros |
US6438729B1 (en) * | 1994-11-08 | 2002-08-20 | Synopsys, Inc. | Connectivity-based approach for extracting layout parasitics |
US6470482B1 (en) * | 1990-04-06 | 2002-10-22 | Lsi Logic Corporation | Method and system for creating, deriving and validating structural description of electronic system from higher level, behavior-oriented description, including interactive schematic design and simulation |
US6507932B1 (en) * | 1999-07-02 | 2003-01-14 | Cypress Semiconductor Corp. | Methods of converting and/or translating a layout or circuit schematic or netlist thereof to a simulation schematic or netlist, and/or of simulating function(s) and/or performance characteristic(s) of a circuit |
US6643831B2 (en) * | 1999-07-09 | 2003-11-04 | Sequence Design, Inc. | Method and system for extraction of parasitic interconnect impedance including inductance |
US20040049747A1 (en) * | 2002-09-11 | 2004-03-11 | Renesas Technology Corp. | Verification apparatus |
US6954915B2 (en) * | 2002-07-31 | 2005-10-11 | Agilent Technologies, Inc. | System and methods for pre-artwork signal-timing verification of an integrated circuit design |
US6981238B1 (en) * | 2002-10-22 | 2005-12-27 | Cypress Semiconductor Corporation | Verification of integrated circuit designs using buffer control |
US7155689B2 (en) * | 2003-10-07 | 2006-12-26 | Magma Design Automation, Inc. | Design-manufacturing interface via a unified model |
US7159202B2 (en) * | 2002-12-04 | 2007-01-02 | Samsung Electronics Co., Ltd. | Methods, apparatus and computer program products for generating selective netlists that include interconnection influences at pre-layout and post-layout design stages |
US7178118B2 (en) * | 2003-05-30 | 2007-02-13 | Synplicity, Inc. | Method and apparatus for automated circuit design |
US7206731B2 (en) * | 2003-06-02 | 2007-04-17 | Agilent Technologies, Inc. | Electromagnetic/circuit co-simulation and co-optimization with parametric layout components |
US7228514B2 (en) * | 2005-01-21 | 2007-06-05 | International Business Machines Corporation | Method, system and computer program product for automatically estimating pin locations and interconnect parasitics of a circuit layout |
US7243317B2 (en) * | 2003-05-30 | 2007-07-10 | Illinios Institute Of Technology | Parameter checking method for on-chip ESD protection circuit physical design layout verification |
US7251800B2 (en) * | 2003-05-30 | 2007-07-31 | Synplicity, Inc. | Method and apparatus for automated circuit design |
US7260562B2 (en) * | 2003-06-30 | 2007-08-21 | Intel Corporation | Solutions for constraint satisfaction problems requiring multiple constraints |
US20070245274A1 (en) * | 2006-04-12 | 2007-10-18 | Kabushiki Kaisha Toshiba | Integrated circuit design apparatus and method thereof |
US7331029B2 (en) * | 2005-09-22 | 2008-02-12 | International Business Machines Corporation | Method and system for enhancing circuit design process |
US7356784B1 (en) * | 2003-12-05 | 2008-04-08 | Cadence Design Systems, Inc. | Integrated synthesis placement and routing for integrated circuits |
US7552409B2 (en) * | 2005-06-07 | 2009-06-23 | Synopsys, Inc. | Engineering change order process optimization |
US7596771B2 (en) * | 2005-05-10 | 2009-09-29 | Texas Instruments Incorporated | Distributed element generator, method of generating distributed elements and an electronic design automation tool employing the same |
US20100023897A1 (en) * | 2008-02-20 | 2010-01-28 | Pikus Fedor G | Property-Based Classification In Electronic Design Automation |
US7853915B2 (en) * | 2008-06-24 | 2010-12-14 | Synopsys, Inc. | Interconnect-driven physical synthesis using persistent virtual routing |
US7996812B2 (en) * | 2008-08-14 | 2011-08-09 | International Business Machines Corporation | Method of minimizing early-mode violations causing minimum impact to a chip design |
US20110197170A1 (en) * | 2010-02-11 | 2011-08-11 | Synopsys, Inc. | Active Net Based Approach for Circuit Characterization |
US8091055B2 (en) * | 2009-01-26 | 2012-01-03 | Synopsys, Inc. | Method and apparatus for managing violations and error classifications during physical verification |
US8127260B1 (en) * | 2006-11-22 | 2012-02-28 | Cadence Design Systems, Inc. | Physical layout estimator |
US8141013B2 (en) * | 2009-06-30 | 2012-03-20 | International Business Machines Corporation | Method and system of linking on-chip parasitic coupling capacitance into distributed pre-layout passive models |
US8150638B1 (en) * | 2008-08-25 | 2012-04-03 | Xilinx, Inc. | Predicting parasitic capacitance in schematic circuit simulations using sub-circuit modeling |
US8185856B2 (en) * | 2008-01-24 | 2012-05-22 | Sony Corporation | Manufacturing method, manufacturing program and manufacturing system for adjusting signal delay in a semiconductor device |
US8209650B2 (en) * | 2008-04-16 | 2012-06-26 | Texas Instruments Incorporated | Method and system for entry and verification of parasitic design constraints for analog integrated circuits |
US8261228B1 (en) * | 2008-10-01 | 2012-09-04 | Cadence Design Systems, Inc. | Technique for modeling parasitics from layout during circuit design and for parasitic aware circuit design using modes of varying accuracy |
Family Cites Families (91)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IT1215273B (en) | 1985-05-09 | 1990-01-31 | Ates Componenti Elettron | PROCEDURE AND DEVICE FOR IDENTIFYING PARASITIC TRANSISTORS IN AN INTEGRATED STRUCTURE. |
US5555201A (en) | 1990-04-06 | 1996-09-10 | Lsi Logic Corporation | Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, including interactive system for hierarchical display of control and dataflow information |
US5469366A (en) | 1993-09-20 | 1995-11-21 | Lsi Logic Corporation | Method and apparatus for determining the performance of nets of an integrated circuit design on a semiconductor design automation system |
US5629857A (en) | 1994-11-15 | 1997-05-13 | International Business Machines Corporation | Method and system for indicating a status of a circuit design |
US5872952A (en) | 1995-04-17 | 1999-02-16 | Synopsys, Inc. | Integrated circuit power net analysis through simulation |
US6910200B1 (en) | 1997-01-27 | 2005-06-21 | Unisys Corporation | Method and apparatus for associating selected circuit instances and for performing a group operation thereon |
US7076410B1 (en) | 1997-01-27 | 2006-07-11 | Unisys Corporation | Method and apparatus for efficiently viewing a number of selected components using a database editor tool |
US6072945A (en) | 1997-06-26 | 2000-06-06 | Sun Microsystems Inc. | System for automated electromigration verification |
US6378110B1 (en) | 1998-03-31 | 2002-04-23 | Synopsys, Inc. | Layer-based rule checking for an integrated circuit layout |
US7016794B2 (en) | 1999-03-16 | 2006-03-21 | Lsi Logic Corporation | Floor plan development electromigration and voltage drop analysis tool |
US6449578B1 (en) | 1999-06-30 | 2002-09-10 | Hewlett-Packard Company | Method and apparatus for determining the RC delays of a network of an integrated circuit |
US6581191B1 (en) | 1999-11-30 | 2003-06-17 | Synplicity, Inc. | Hardware debugging in a hardware description language |
WO2001054001A1 (en) | 2000-01-18 | 2001-07-26 | Cadence Design Systems, Inc. | Adaptable circuit blocks for use in multi-block chip design |
US6499130B1 (en) * | 2000-02-17 | 2002-12-24 | Avant! Corporation | Methods, apparatus and computer program products that perform layout versus schematic comparison of integrated circuits using advanced symmetry resolution techniques |
US6665845B1 (en) | 2000-02-25 | 2003-12-16 | Sun Microsystems, Inc. | System and method for topology based noise estimation of submicron integrated circuit designs |
US6584606B1 (en) | 2000-06-01 | 2003-06-24 | International Business Machines Corporation | Fast method of I/O circuit placement and electrical rule checking |
US6889370B1 (en) | 2000-06-20 | 2005-05-03 | Unisys Corporation | Method and apparatus for selecting and aligning cells using a placement tool |
US6539533B1 (en) * | 2000-06-20 | 2003-03-25 | Bae Systems Information And Electronic Systems Integration, Inc. | Tool suite for the rapid development of advanced standard cell libraries |
AU2002210300A1 (en) | 2000-10-18 | 2002-04-29 | Chipworks | Design analysis workstation for analyzing integrated circuits |
US6557153B1 (en) | 2000-11-15 | 2003-04-29 | Reshape, Inc. | Method and system for implementing a user interface for performing physical design operations on an integrated circuit netlist |
US6507940B2 (en) * | 2001-05-02 | 2003-01-14 | Oridus, Inc. | Method for generating information for a window view of an integrated circuit from layout-formatted data |
US7103863B2 (en) | 2001-06-08 | 2006-09-05 | Magma Design Automation, Inc. | Representing the design of a sub-module in a hierarchical integrated circuit design and analysis system |
US6728942B2 (en) * | 2001-06-12 | 2004-04-27 | Conexant Systems, Inc. | Method and system for predictive MOSFET layout generation with reduced design cycle |
US6643836B2 (en) | 2001-08-29 | 2003-11-04 | Intel Corporation | Displaying information relating to a logic design |
US6523150B1 (en) | 2001-09-28 | 2003-02-18 | International Business Machines Corporation | Method of designing a voltage partitioned wirebond package |
US6701508B1 (en) * | 2001-11-19 | 2004-03-02 | Cypress Semiconductor Corporation | Method and system for using a graphics user interface for programming an electronic device |
US20030131323A1 (en) * | 2002-01-07 | 2003-07-10 | Mcconaghy Trent Lorne | Method of schematic-level AMS topology optimization using direct representations |
US6877148B1 (en) | 2002-04-07 | 2005-04-05 | Barcelona Design, Inc. | Method and apparatus for routing an integrated circuit |
US7152215B2 (en) | 2002-06-07 | 2006-12-19 | Praesagus, Inc. | Dummy fill for integrated circuits |
AU2003274370A1 (en) | 2002-06-07 | 2003-12-22 | Praesagus, Inc. | Characterization adn reduction of variation for integrated circuits |
US6766498B2 (en) | 2002-08-28 | 2004-07-20 | Advanced Micro Devices, Inc. | Extracting wiring parasitics for filtered interconnections in an integrated circuit |
JP3944030B2 (en) | 2002-08-30 | 2007-07-11 | キヤノン株式会社 | Network device control apparatus, network device control method, and program for implementing the control method |
JP2004139181A (en) | 2002-10-15 | 2004-05-13 | Renesas Technology Corp | Layout device and program |
US6922823B2 (en) | 2002-12-13 | 2005-07-26 | Lsi Logic Corporation | Method for creating derivative integrated circuit layouts for related products |
WO2004057501A2 (en) | 2002-12-17 | 2004-07-08 | Cadence Design Systems, Inc. | Method and system for implementing circuit simulators |
US6817004B2 (en) | 2003-01-22 | 2004-11-09 | Lsi Logic Corporation | Net segment analyzer for chip CAD layout |
US7209105B2 (en) * | 2003-06-06 | 2007-04-24 | Clairvoyante, Inc | System and method for compensating for visual effects upon panels having fixed pattern noise with reduced quantization error |
US6842714B1 (en) | 2003-08-22 | 2005-01-11 | International Business Machines Corporation | Method for determining the leakage power for an integrated circuit |
US7089129B2 (en) | 2003-11-12 | 2006-08-08 | International Business Machines Corporation | Electromigration check of signal nets using net capacitance to evaluate thermal characteristics |
US20050114818A1 (en) | 2003-11-21 | 2005-05-26 | Lsi Logic Corporation | Chip design command processor |
US7181383B1 (en) * | 2003-11-26 | 2007-02-20 | Cadence Design Systems, Inc. | System and method for simulating a circuit having hierarchical structure |
US20070234266A1 (en) | 2004-02-07 | 2007-10-04 | Chao-Chiang Chen | Method of optimizing IC logic performance by static timing based parasitic budgeting |
US7139990B2 (en) * | 2004-03-23 | 2006-11-21 | International Business Machines Corporation | Method of checking the layout versus the schematic of multi-fingered MOS transistor layouts using a sub-circuit based extraction |
TWI262411B (en) | 2004-05-07 | 2006-09-21 | Dorado Design Automation Inc | Integrated circuit design system |
US20050268269A1 (en) | 2004-06-01 | 2005-12-01 | Tera Systems, Inc. | Methods and systems for cross-probing in integrated circuit design |
WO2005119531A2 (en) | 2004-06-01 | 2005-12-15 | Tera Systems, Inc. | Rule-based design consultant and method for integrated circuit design |
US7350164B2 (en) | 2004-06-04 | 2008-03-25 | Carnegie Mellon University | Optimization and design method for configurable analog circuits and devices |
US7275230B2 (en) | 2004-06-11 | 2007-09-25 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Methods to gather and display pin congestion statistics using graphical user interface |
US7347621B2 (en) | 2004-07-16 | 2008-03-25 | International Business Machines Corporation | Method and system for real-time estimation and prediction of the thermal state of a microprocessor unit |
US7278120B2 (en) | 2004-07-23 | 2007-10-02 | Synplicity, Inc. | Methods and apparatuses for transient analyses of circuits |
US20060101368A1 (en) | 2004-09-08 | 2006-05-11 | Mentor Graphics Corporation | Distributed electronic design automation environment |
US7458045B2 (en) | 2004-10-29 | 2008-11-25 | Synopsys, Inc. | Silicon tolerance specification using shapes as design intent markers |
US7240310B2 (en) | 2004-12-07 | 2007-07-03 | International Business Machines Corporation | Method, system and program product for evaluating a circuit |
US7281230B2 (en) | 2005-04-20 | 2007-10-09 | Taiwan Semiconductor Manufacturing Company | Method of using mixed multi-Vt devices in a cell-based design |
JP4600823B2 (en) | 2005-06-30 | 2010-12-22 | 富士通株式会社 | Electronic circuit analysis program, method and apparatus |
EP1907956B1 (en) | 2005-07-26 | 2012-12-26 | Mentor Graphics Corporation | Accelerated analog and/or rf simulation |
US7526739B2 (en) | 2005-07-26 | 2009-04-28 | R3 Logic, Inc. | Methods and systems for computer aided design of 3D integrated circuits |
US7904852B1 (en) | 2005-09-12 | 2011-03-08 | Cadence Design Systems, Inc. | Method and system for implementing parallel processing of electronic design automation tools |
US7398500B1 (en) | 2005-09-30 | 2008-07-08 | Taray Technologies | Netlist synthesis and automatic generation of PC board schematics |
FR2893159B1 (en) | 2005-11-04 | 2013-02-08 | Edxact Sa | METHOD AND DEVICE FOR ANALYZING INTEGRATED CIRCUITS |
US7363607B2 (en) | 2005-11-08 | 2008-04-22 | Pulsic Limited | Method of automatically routing nets according to parasitic constraint rules |
US20070118827A1 (en) | 2005-11-21 | 2007-05-24 | Asifur Rahman | Method and apparatus for integrated circuit fault isolation and failure analysis using linked tools cockpit |
EP1960921A1 (en) | 2005-12-17 | 2008-08-27 | Gradient Design Automation, Inc. | Simulation of ic temperature distributions using an adaptive 3d grid |
US7921383B1 (en) * | 2006-01-11 | 2011-04-05 | Olambda, Inc | Photolithographic process simulation including efficient result computation for multiple process variation values |
US7626626B2 (en) * | 2006-01-13 | 2009-12-01 | Micron Technology, Inc. | Method and apparatus providing pixel storage gate charge sensing for electronic stabilization in imagers |
EP1864219A1 (en) | 2006-02-28 | 2007-12-12 | Mentor Graphics Corporation | Monitoring physical parameters in an emulation environment |
US7490303B2 (en) | 2006-03-03 | 2009-02-10 | International Business Machines Corporation | Identifying parasitic diode(s) in an integrated circuit physical design |
US8332793B2 (en) | 2006-05-18 | 2012-12-11 | Otrsotech, Llc | Methods and systems for placement and routing |
US20070288881A1 (en) | 2006-06-12 | 2007-12-13 | Sreeni Maheshwarla | Method of merging designs of an integrated circuit from a plurality of sources |
US7640527B1 (en) | 2006-06-29 | 2009-12-29 | Xilinx, Inc. | Method and apparatus for partial reconfiguration circuit design for a programmable device |
US7761834B2 (en) | 2006-07-20 | 2010-07-20 | Solido Design Automation Inc. | Interactive schematic for use in analog, mixed-signal, and custom digital circuit design |
JP4799311B2 (en) * | 2006-08-01 | 2011-10-26 | パナソニック株式会社 | Electromigration verification method |
KR101269055B1 (en) * | 2006-08-19 | 2013-05-29 | 삼성전자주식회사 | Method for increasing the yield of layout and the recording medium having the same |
US20080061843A1 (en) | 2006-09-11 | 2008-03-13 | Asier Goikoetxea Yanci | Detecting voltage glitches |
US7802222B2 (en) | 2006-09-25 | 2010-09-21 | Cadence Design Systems, Inc. | Generalized constraint collection management method |
US20080086709A1 (en) * | 2006-10-05 | 2008-04-10 | Dan Rittman | System and method for automatic elimination of electromigration and self heat violations during construction of a mask layout block, maintaining the process design rules (DRC Clean) and layout connectivity (LVS Clean) correctness |
US7665048B2 (en) | 2006-12-18 | 2010-02-16 | Cadence Design Systems, Inc. | Method and system for inspection optimization in design and production of integrated circuits |
US7559045B2 (en) | 2006-12-22 | 2009-07-07 | Inventec Corporation | Database-aided circuit design system and method therefor |
US7810063B1 (en) | 2007-02-01 | 2010-10-05 | Cadence Design Systems, Inc. | Graphical user interface for prototyping early instance density |
US7574682B2 (en) | 2007-02-28 | 2009-08-11 | Freescale Semiconductor, Inc. | Yield analysis and improvement using electrical sensitivity extraction |
US7698677B2 (en) | 2007-03-31 | 2010-04-13 | Freescale Semiconductor, Inc. | On-chip decoupling capacitance and power/ground network wire co-optimization to reduce dynamic noise |
TWI334554B (en) | 2007-07-27 | 2010-12-11 | King Yuan Electronics Co Ltd | Method for designing stacked pattern of printed circuit board and the system, device and computer-readable medium thereof |
US7805698B1 (en) | 2007-09-19 | 2010-09-28 | Cadence Design Systems, Inc. | Methods and systems for physical hierarchy configuration engine and graphical editor |
US7784007B2 (en) | 2007-09-27 | 2010-08-24 | United Microelectronics Corp. | Method for automatically producing layout information |
WO2009105138A2 (en) | 2007-11-30 | 2009-08-27 | Coventor, Inc. | A system and method for three-dimensional schematic capture and result visualization of multi-physics system models |
US7966588B1 (en) | 2008-01-26 | 2011-06-21 | National Semiconductor Corporation | Optimization of electrical circuits |
US8136068B2 (en) | 2008-09-30 | 2012-03-13 | Cadence Design Systems, Inc. | Methods, systems, and computer program products for implementing compact manufacturing models in electronic design automation |
US8024051B2 (en) * | 2009-02-24 | 2011-09-20 | Oracle America, Inc. | Parallel power grid analysis |
US8799850B2 (en) | 2009-10-29 | 2014-08-05 | Synopsys, Inc. | Simulation-based design state snapshotting in electronic design automation |
US8694950B2 (en) | 2010-07-24 | 2014-04-08 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness |
US8495556B2 (en) | 2010-11-09 | 2013-07-23 | Chipworks Inc. | Circuit visualization using flightlines |
-
2010
- 2010-12-30 US US12/982,721 patent/US8694950B2/en active Active
- 2010-12-30 US US12/982,762 patent/US9330222B2/en active Active
- 2010-12-30 US US12/982,790 patent/US8694933B2/en active Active
- 2010-12-30 US US12/982,628 patent/US8689169B2/en active Active
- 2010-12-30 US US12/982,732 patent/US8762914B2/en active Active
-
2011
- 2011-07-22 TW TW100126052A patent/TWI529552B/en not_active IP Right Cessation
- 2011-07-22 TW TW100126109A patent/TWI519983B/en not_active IP Right Cessation
- 2011-07-22 TW TW100126053A patent/TWI509443B/en not_active IP Right Cessation
- 2011-07-22 TW TW100126108A patent/TWI533153B/en not_active IP Right Cessation
- 2011-07-22 US US13/189,274 patent/US8701067B1/en active Active
- 2011-07-22 TW TW100126113A patent/TW201218005A/en unknown
-
2014
- 2014-04-07 US US14/247,236 patent/US9223925B2/en active Active
Patent Citations (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5553002A (en) * | 1990-04-06 | 1996-09-03 | Lsi Logic Corporation | Method and system for creating and validating low level description of electronic design from higher level, behavior-oriented description, using milestone matrix incorporated into user-interface |
US6470482B1 (en) * | 1990-04-06 | 2002-10-22 | Lsi Logic Corporation | Method and system for creating, deriving and validating structural description of electronic system from higher level, behavior-oriented description, including interactive schematic design and simulation |
US6438729B1 (en) * | 1994-11-08 | 2002-08-20 | Synopsys, Inc. | Connectivity-based approach for extracting layout parasitics |
US6131182A (en) * | 1997-05-02 | 2000-10-10 | International Business Machines Corporation | Method and apparatus for synthesizing and optimizing control logic based on SRCMOS logic array macros |
US6507932B1 (en) * | 1999-07-02 | 2003-01-14 | Cypress Semiconductor Corp. | Methods of converting and/or translating a layout or circuit schematic or netlist thereof to a simulation schematic or netlist, and/or of simulating function(s) and/or performance characteristic(s) of a circuit |
US6643831B2 (en) * | 1999-07-09 | 2003-11-04 | Sequence Design, Inc. | Method and system for extraction of parasitic interconnect impedance including inductance |
US6954915B2 (en) * | 2002-07-31 | 2005-10-11 | Agilent Technologies, Inc. | System and methods for pre-artwork signal-timing verification of an integrated circuit design |
US20040049747A1 (en) * | 2002-09-11 | 2004-03-11 | Renesas Technology Corp. | Verification apparatus |
US6981238B1 (en) * | 2002-10-22 | 2005-12-27 | Cypress Semiconductor Corporation | Verification of integrated circuit designs using buffer control |
US7159202B2 (en) * | 2002-12-04 | 2007-01-02 | Samsung Electronics Co., Ltd. | Methods, apparatus and computer program products for generating selective netlists that include interconnection influences at pre-layout and post-layout design stages |
US7243317B2 (en) * | 2003-05-30 | 2007-07-10 | Illinios Institute Of Technology | Parameter checking method for on-chip ESD protection circuit physical design layout verification |
US7178118B2 (en) * | 2003-05-30 | 2007-02-13 | Synplicity, Inc. | Method and apparatus for automated circuit design |
US7251800B2 (en) * | 2003-05-30 | 2007-07-31 | Synplicity, Inc. | Method and apparatus for automated circuit design |
US7206731B2 (en) * | 2003-06-02 | 2007-04-17 | Agilent Technologies, Inc. | Electromagnetic/circuit co-simulation and co-optimization with parametric layout components |
US7260562B2 (en) * | 2003-06-30 | 2007-08-21 | Intel Corporation | Solutions for constraint satisfaction problems requiring multiple constraints |
US7155689B2 (en) * | 2003-10-07 | 2006-12-26 | Magma Design Automation, Inc. | Design-manufacturing interface via a unified model |
US7356784B1 (en) * | 2003-12-05 | 2008-04-08 | Cadence Design Systems, Inc. | Integrated synthesis placement and routing for integrated circuits |
US7228514B2 (en) * | 2005-01-21 | 2007-06-05 | International Business Machines Corporation | Method, system and computer program product for automatically estimating pin locations and interconnect parasitics of a circuit layout |
US7596771B2 (en) * | 2005-05-10 | 2009-09-29 | Texas Instruments Incorporated | Distributed element generator, method of generating distributed elements and an electronic design automation tool employing the same |
US7552409B2 (en) * | 2005-06-07 | 2009-06-23 | Synopsys, Inc. | Engineering change order process optimization |
US7331029B2 (en) * | 2005-09-22 | 2008-02-12 | International Business Machines Corporation | Method and system for enhancing circuit design process |
US20070245274A1 (en) * | 2006-04-12 | 2007-10-18 | Kabushiki Kaisha Toshiba | Integrated circuit design apparatus and method thereof |
US8127260B1 (en) * | 2006-11-22 | 2012-02-28 | Cadence Design Systems, Inc. | Physical layout estimator |
US8185856B2 (en) * | 2008-01-24 | 2012-05-22 | Sony Corporation | Manufacturing method, manufacturing program and manufacturing system for adjusting signal delay in a semiconductor device |
US20100023897A1 (en) * | 2008-02-20 | 2010-01-28 | Pikus Fedor G | Property-Based Classification In Electronic Design Automation |
US8209650B2 (en) * | 2008-04-16 | 2012-06-26 | Texas Instruments Incorporated | Method and system for entry and verification of parasitic design constraints for analog integrated circuits |
US7853915B2 (en) * | 2008-06-24 | 2010-12-14 | Synopsys, Inc. | Interconnect-driven physical synthesis using persistent virtual routing |
US7996812B2 (en) * | 2008-08-14 | 2011-08-09 | International Business Machines Corporation | Method of minimizing early-mode violations causing minimum impact to a chip design |
US8150638B1 (en) * | 2008-08-25 | 2012-04-03 | Xilinx, Inc. | Predicting parasitic capacitance in schematic circuit simulations using sub-circuit modeling |
US8261228B1 (en) * | 2008-10-01 | 2012-09-04 | Cadence Design Systems, Inc. | Technique for modeling parasitics from layout during circuit design and for parasitic aware circuit design using modes of varying accuracy |
US8091055B2 (en) * | 2009-01-26 | 2012-01-03 | Synopsys, Inc. | Method and apparatus for managing violations and error classifications during physical verification |
US8141013B2 (en) * | 2009-06-30 | 2012-03-20 | International Business Machines Corporation | Method and system of linking on-chip parasitic coupling capacitance into distributed pre-layout passive models |
US20110197170A1 (en) * | 2010-02-11 | 2011-08-11 | Synopsys, Inc. | Active Net Based Approach for Circuit Characterization |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20090199139A1 (en) * | 2007-12-27 | 2009-08-06 | David White | Method, system, and computer program product for improved electrical analysis |
US8386975B2 (en) | 2007-12-27 | 2013-02-26 | Cadence Design Systems, Inc. | Method, system, and computer program product for improved electrical analysis |
US8595662B1 (en) | 2011-12-30 | 2013-11-26 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing a physical design of an electronic circuit with automatic snapping |
US8645902B1 (en) | 2011-12-30 | 2014-02-04 | Cadence Design Systems, Inc. | Methods, systems, and computer program products for implementing interactive coloring of physical design components in a physical electronic design with multiple-patterning techniques awareness |
US8694943B1 (en) * | 2011-12-30 | 2014-04-08 | Cadence Design Systems, Inc. | Methods, systems, and computer program product for implementing electronic designs with connectivity and constraint awareness |
US9064063B1 (en) | 2011-12-30 | 2015-06-23 | Cadence Design Systems, Inc. | Methods, systems, and articles of manufacture for implementing interactive, real-time checking or verification of complex constraints |
US9053289B1 (en) | 2012-04-12 | 2015-06-09 | Cadence Design Systems, Inc. | Method and system for implementing an improved interface for designing electronic layouts |
US20170241040A1 (en) * | 2014-10-17 | 2017-08-24 | Dipsol Chemicals Co., Ltd. | Copper-nickel alloy electroplating device |
US10237644B1 (en) * | 2016-09-23 | 2019-03-19 | Apple Inc. | Enhancing a listening experience by adjusting physical attributes of an audio playback system based on detected environmental attributes of the system's environment |
US10735854B1 (en) * | 2016-09-23 | 2020-08-04 | Apple Inc. | Enhancing a listening experience by adjusting physical attributes of an audio playback system based on detected environmental attributes of the system's environment |
US11425490B2 (en) | 2016-09-23 | 2022-08-23 | Apple Inc. | Enhancing a listening experience by adjusting physical attributes of an audio playback system based on detected environmental attributes of the system's environment |
Also Published As
Publication number | Publication date |
---|---|
US20120022846A1 (en) | 2012-01-26 |
US20120023467A1 (en) | 2012-01-26 |
US8762914B2 (en) | 2014-06-24 |
US20120023472A1 (en) | 2012-01-26 |
US20120023465A1 (en) | 2012-01-26 |
TW201218005A (en) | 2012-05-01 |
TWI533153B (en) | 2016-05-11 |
US9330222B2 (en) | 2016-05-03 |
US20140237440A1 (en) | 2014-08-21 |
US8701067B1 (en) | 2014-04-15 |
TW201218003A (en) | 2012-05-01 |
TWI529552B (en) | 2016-04-11 |
TW201218002A (en) | 2012-05-01 |
TW201218004A (en) | 2012-05-01 |
US8694950B2 (en) | 2014-04-08 |
US8694933B2 (en) | 2014-04-08 |
US8689169B2 (en) | 2014-04-01 |
TWI519983B (en) | 2016-02-01 |
TWI509443B (en) | 2015-11-21 |
TW201218001A (en) | 2012-05-01 |
US9223925B2 (en) | 2015-12-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8762914B2 (en) | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness | |
US11487924B2 (en) | System, method and associated computer readable medium for designing integrated circuit with pre-layout RC information | |
US8806414B2 (en) | Method and system for layout parasitic estimation | |
US8671367B2 (en) | Integrated circuit design in optical shrink technology node | |
US8209650B2 (en) | Method and system for entry and verification of parasitic design constraints for analog integrated circuits | |
US9141740B2 (en) | Methods, systems, and articles of manufacture for implementing full-chip optimization with reduced physical design data | |
US8407646B2 (en) | Active net and parasitic net based approach for circuit simulation and characterization | |
US9122833B2 (en) | Method of designing fin field effect transistor (FinFET)-based circuit and system for implementing the same | |
US9348965B2 (en) | Parasitic component library and method for efficient circuit design and simulation using the same | |
US10445457B1 (en) | Methods, systems, and articles of manufacture for implementing a physical design of an electronic design with DFM and design specification awareness | |
US20100153893A1 (en) | Constraint management and validation for template-based circuit design | |
US11023640B1 (en) | Methods, systems, and computer program product for characterizing timing behavior of an electronic design with a derived current waveform | |
US10216887B1 (en) | Methods, systems, and computer program products for implementing an electronic design with time varying resistors in power gating analysis | |
US8694943B1 (en) | Methods, systems, and computer program product for implementing electronic designs with connectivity and constraint awareness | |
US9418192B1 (en) | Pass eco flow based on reduced timing scope timer | |
US11429773B1 (en) | Methods, systems, and computer program product for implementing an electronic design using connect modules with dynamic and interactive control | |
US10997333B1 (en) | Methods, systems, and computer program product for characterizing an electronic design with a schematic driven extracted view | |
WO2012015709A1 (en) | Methods, systems, and articles of manufacture for constraint verification for implementing electronic circuit designs with electrical awareness | |
WO2012015702A1 (en) | Methods, systems, and articles of manufacture for implementing electronic circuit designs with simulation awareness | |
US10395000B1 (en) | Methods, systems, and computer program products for implementing an electronic design using voltage-based electrical analyses and simulations with corrections | |
US11494540B1 (en) | Method, system, and computer program product for implementing electronic design closure with reduction techniques | |
US11334697B1 (en) | Methods, systems, and computer program product for characterizing an electronic design with efficient cell cloning | |
US20240143877A1 (en) | Efficient delay calculations in replicated designs | |
US10839133B1 (en) | Circuit layout similarity metric for semiconductor testsite coverage | |
WO2012018570A1 (en) | Methods, systems, and articles of manufacture for implementing electronic circuit designs with electrical awareness |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: CADENCE DESIGN SYSTEMS, INC., CALIFORNIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:FISCHER, ED;MCSHERRY, MICHAEL;WHITE, DAVID;AND OTHERS;SIGNING DATES FROM 20110131 TO 20110307;REEL/FRAME:026397/0330 |
|
FEPP | Fee payment procedure |
Free format text: PAYOR NUMBER ASSIGNED (ORIGINAL EVENT CODE: ASPN); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551) Year of fee payment: 4 |
|
MAFP | Maintenance fee payment |
Free format text: PAYMENT OF MAINTENANCE FEE, 8TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1552); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY Year of fee payment: 8 |