US20080200028A1 - Methods of positioning and/or orienting nanostructures - Google Patents
Methods of positioning and/or orienting nanostructures Download PDFInfo
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- US20080200028A1 US20080200028A1 US11/602,784 US60278406A US2008200028A1 US 20080200028 A1 US20080200028 A1 US 20080200028A1 US 60278406 A US60278406 A US 60278406A US 2008200028 A1 US2008200028 A1 US 2008200028A1
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y10S977/858—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including positioning/mounting nanostructure
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Definitions
- Nanotubes, nanocrystals, nanowires, and particularly semiconductor nanowires have gained a great deal of attention for their interesting and novel properties in electrical, chemical, optical and other applications.
- Such nanomaterials have a wide variety of expected and actual uses, including use as semiconductors for nanoscale electronics, optoelectronic applications in emissive devices, e.g., nanolasers, LEDs, etc., photovoltaics, and sensor applications, e.g., as nano-ChemFETS.
- the present invention is generally directed to methods of positioning and orienting nanostructures, and particularly nanowires on substrates for subsequent use, integration or application.
- the invention also envisions systems for practicing such methods, devices that include oriented and positioned nanostructures, populations of positioned and/or oriented nanostructures, and systems that include such positioned and/or oriented nanostructures.
- the present invention provides a method of depositing nanowires on a surface substantially in a desired orientation.
- the method generally comprises flowing a fluid containing nanowires over the surface in a first direction, where the first direction is substantially parallel to a desired longitudinal orientation of the nanowires.
- the nanowires in the solution are then permitted to become immobilized onto the surface, with the longitudinal dimension of the nanowires being substantially oriented in the first direction.
- the invention is directed to methods of positioning nanowires in one or more predetermined regions on a substrate.
- the methods typically comprise providing a substrate having a first surface, overlaying the first surface with a mask, where the mask provides fluid access to one or more first predetermined regions on the first surface, but not to one or more second predetermined regions on the surface of the substrate.
- a fluid containing nanowires is then flowed through the mask and into contact with the first predetermined regions of the substrate surface.
- the nanowires contained in the nanowire containing fluid are then permitted to immobilize in the first predetermined regions of the surface of the substrate.
- the invention is directed to one or more populations of nanowires immobilized on a planar surface of a substrate, where the population(s) of nanowires are substantially longitudinally oriented in a first direction parallel to the planar surface.
- the invention includes populations of nanowires immobilized on a surface of a substrate that comprise a first set of nanowires immobilized in a first selected region of the surface of the substrate, and a second set of nanowires immobilized in a second selected region of the surface of the substrate, the second selected region being separate from the first selected region.
- the invention is also directed to a nanowire based device that comprises at least a first population of nanowires immobilized in at least a first region of a surface of a substrate, the first population of nanowires being substantially longitudinally oriented in a first direction.
- the devices of the invention typically include at least first and second electrical contacts disposed on the first region of the surface of the substrate. The first and second electrical contacts are typically separated from each other on the first surface of the substrate in the first direction by a less than an average length of the nanowires in the population of nanowires.
- the invention also includes a substrate comprising a plurality of populations of nanowires deposited upon a first surface of said substrate, wherein each of the populations of nanowires is deposited and immobilized in a separate discrete region of the surface of the substrate.
- electrical contacts are disposed in the separate regions such that at least one wire in the populations of nanowires bridges and connects at least two electrical contacts.
- the invention is directed to a system for orienting nanowires on a surface of a substrate in accordance with the methods of the invention.
- the system typically comprises a substrate having a first surface, a fluid channel disposed on the first surface, and a fluid direction system coupled to the first channel and coupled to a source of fluid containing nanowires, for flowing the fluid containing nanowires in a first direction through the first fluid channel.
- the invention also includes, as one aspect, a system for positioning nanowires on a surface of a substrate.
- the system includes the substrate having the first surface.
- a masking element is provided over the first surface which provides fluid access to separate discrete regions of the first surface of the substrate.
- a source of fluid that includes the nanowires or other nanostructures is provided fluidicly coupled to the fluid passages in the masking element.
- a fluid direction system is operably coupled to the fluid source and passages in the masking element to delver the fluid from the source to the passages, so that the nanowires in the fluid can contact and thus be immobilized upon the discrete regions of the surface of the substrate.
- FIG. 1 schematically illustrates a wafer based process for positioning and orienting nanowires on a substrate.
- FIG. 2 schematically illustrates the integration of electrical elements with positioned and oriented nanowires on a wafer substrate.
- FIG. 3 is a schematic illustration of patterned substrate functionalization followed by positioning and orienting of nanowires.
- FIG. 4 shows a schematic illustration of bidirectional orientation of nanowires in accordance with the processes described herein.
- FIG. 5A-5D show schematic illustrations of different fluidic channel structures designed to achieve different deposition patterns of nanowires on substrate surfaces.
- FIG. 6 is a schematic illustration of an overall system for positioning and aligning nanowires onto substrate surfaces.
- FIG. 7 is an SEM image of oriented nanowires immobilized on a substrate surface.
- FIG. 8A is a postulated electrode deposition over the oriented nanowire population shown in FIG. 7
- FIG. 8B shows a plot of expected frequency of 0, 1, 2 and 3 wire connections between electrode pairs.
- FIG. 9 shows aligned nanowires connected to electrical contact pairs.
- the present invention is generally directed to methods of positioning and/or orienting nanowires on substrates, nanowires so positioned and/or oriented, devices produced from such oriented and/or positioned nanowires, and systems used in so orienting and/or positioning such nanowires.
- nanowire generally refers to any elongated conductive or semiconductive material that includes at least one cross sectional dimension that is less than 500 nm, and preferably, less than 100 nm, and has an aspect ratio (length:width) of greater than 10, preferably, greater than 50, and more preferably, greater than 100.
- Examples of such nanowires include semiconductor nanowires as described in Published International Patent Application Nos. WO 02/17362, WO 02/48701, and 01/03208, carbon nanotubes, and other elongated conductive or semiconductive structures of like dimensions.
- nanowires include semiconductive nanowires, that are comprised of semiconductor material selected from, e.g., Si, Ge, Sn, Se, Te, B, Diamond, P, B—C, B—P(BP6), B—Si, Si—C, Si—Ge, Si—Sn and Ge—Sn, SiC, BN/BP/BAs, AlN/AlP/AlAs/AlSb, GaN/GaP/GaAs/GaSb, InN/InP/InAs/InSb, BN/BP/BAs, AlN/AlP/AlAs/AlSb, GaN/GaP/GaAs/GaSb, InN/InP/InAs/InSb, ZnO/ZnS/ZnSe/ZnTe, CdS/CdSe/CdTe, HgS/HgSe/HgTe, BeS/BeSe/BeTe/Mg
- the semiconductor may comprise a dopant from a group consisting of: a p-type dopant from Group III of the periodic table; an n-type dopant from Group V of the periodic table; a p-type dopant selected from a group consisting of: B, Al and In; an n-type dopant selected from a group consisting of: P, As and Sb; a p-type dopant from Group II of the periodic table; a p-type dopant selected from a group consisting of: Mg, Zn, Cd and Hg; a p-type dopant from Group IV of the periodic table; a p-type dopant selected from a group consisting of: C and Si.; or an n-type is selected from a group consisting of: Si, Ge, Sn, S, Se and Te.
- the present invention provides for the selective deposition of nanowires in preselected regions of substrates by providing a masking layer that masks off certain portions of the substrate surface, while providing fluid access to those portions of the substrate surface where it is desired to deposit nanowires. Fluid containing the nanowires is then directed through the mask such that the nanowires contact the desired regions of the substrate, and the nanowires are immobilized thereon.
- the substrate to which nanowires are immobilized may comprise a uniform substrate, e.g., a wafer of solid material, e.g., silicon, glass, quartz, plastic, etc. or it may comprise additional elements, e.g., structural, compositional etc.
- the substrate may include other circuit or structural elements that are part of the ultimately desired device.
- Particular examples of such elements include electrical circuit elements such as electrical; contacts, other wires or conductive paths, including nanowires or other nanoscale conducting elements, optical and/or optoelectrical elements, e.g., lasers, LEDs, etc., structural elements, e.g., microcantilevers, pits, wells, posts, etc.
- nanowires that are being deposited on a surface tend to be longitudinally oriented in the direction of flow of the carrier fluid in which they are suspended. Accordingly, one can substantially longitudinally orient nanowires on a surface by flowing the carrier fluid in a direction across the surface that is parallel to the desired longitudinal orientation of the nanowires.
- substantially longitudinally oriented is meant that the longitudinal axes of a majority of nanowires in a collection or population of nanowires are oriented within 30 degrees of a single direction.
- at least 80% of the nanowires in a population are so oriented, more preferably at least 90% of the nanowires are so oriented.
- the majority of nanowires are oriented within 10 degrees of the desired direction.
- a mask may be a simple stencil type mask where a solid layer that includes apertures disposed through it is placed or fabricated over the surface of the substrate.
- the apertures provide the fluid access to certain regions of the substrate surface and by directing fluid containing nanowires (or other collections of nanowires, e.g., dry powders, etc.) to the surface of the substrate, one can ensure nanowire contact, and ultimately localization and immobilization to those regions.
- nanowires may be particularly targeted for positioning or localization in desired areas of the substrate, e.g., areas in which integration with additional elements is to occur, or to keep nanowires out of areas in which their presence could prove detrimental to ancillary functions of a nanowire based device.
- it may be particularly desirable to ensure hat nanowires contact electrical contacts or other circuit elements, while avoiding contact with other regions of the substrate surface. By doing so, one can ensure that efforts at depositing nanowires are focused in those regions of the substrate where deposition is desired, and not in other regions where it is less desirable.
- the masking element will be somewhat more complex than a simple stencil like mask.
- a masking element that provides fluidic channels across selected regions of a substrate's surface.
- Such masking elements are also often referred to as manifolds.
- the mating of the manifold element with the substrate surface encloses the groove on the manifold element and provides a channel which includes as one of its walls, a portion of the substrate surface.
- the groove typically includes a fluid inlet port and a fluid outlet port to permit the introduction and flow of fluid containing nanowires into and through the channel in the manifold element.
- these fluidic channels disposed over the substrate surface will be microscale in cross section, e.g., having a width dimension across the substrate that is less than 1 mm, preferably, less than 500 ⁇ m, and in many cases, less than 100 ⁇ m.
- One of the advantages of the present invention is its ability to be readily adapted to provide methods for larger scale production of nanowire containing devices by providing full wafer scale nanowire orientation and/or positioning processes.
- a nanowire containing device like most integrated circuit devices, is typically embodied in a small chip.
- a substrate wafer is provided from which multiple devices are to be produced.
- a fluid that contains nanowires is contacted with, or in the case of flow aligned nanowires, flowed over all or one or more selected portions of the substrate in a desired direction.
- the direction of flow will typically dictate the substantial longitudinal orientation of the nanowires that become immobilized on the surface of the substrate.
- nanowires only on selected regions of the surface of the substrate, e.g., to minimize extraneous wire deposition, avoid wasting wires on unused portions of the substrate, etc.
- a masking element is provided over the substrate surface to ensure that nanowire containing fluid only comes into contact with one or more selected regions on the substrate surface.
- a channel block or manifold that includes one or more channel grooves is placed against the substrate wafer and fluid containing the nanowires is flowed through the channels in the desired direction to provided oriented nanowires in the selected locations on the wafer surface.
- multiple electrical interface components are provided on the wafer.
- multiple pairs of electrical contacts can be provided on the substrate wafer, corresponding to each device.
- each pair of such electrical contacts will be provided close enough to each other in the desired direction, e.g., the direction of longitudinal orientation of the nanowires, such that a nanowire could bridge the space between the electrical contacts.
- Multiple pairs of electrical contacts are provided at multiple different positions on the wafer surface. The wafer containing multiple nanowire devices, e.g., one or more nanowires bridging a pair of electrodes, are then segmented into multiple separate devices.
- FIG. 1 illustrates a wafer based process for producing nanowire based devices in which nanowires are oriented, positioned and integrated with electrical contacts for subsequent application.
- a substrate wafer 100 is provided from which multiple nanowire based devices are to be fabricated.
- the wafer 100 may include surface functionalization, e.g., as described herein.
- a masking element, such as manifold 102 is overlaid on the relevant surface of the wafer 100 .
- the manifold includes a plurality of fluid accesses, e.g., fluid channels 104 - 118 , to the surface of the substrate.
- channels 104 - 118 are sealed on one side by the surface of the wafer 100 , as described above. These channels are coupled to fluid ports 120 and 122 as the fluid inlet and outlet ports, respectively.
- the manifold or masking element 102 may take on a variety of forms and/or be fabricated from a variety of materials.
- the manifold may be fabricated from rigid substrates, e.g., glass, quartz, silicon, or other silica based materials.
- rigid substrates e.g., glass, quartz, silicon, or other silica based materials.
- Such materials provide ease of manufacturing, in that the elements of the manifold, e.g., the fluidic channels, can be fabricated by processes that are well known in the microfluidics, and microfabrication industries, e.g., photolithography and wet chemical etching.
- polymeric materials may be used and are readily manufactured using micromolding techniques, e.g., injection molding, microembossing, etc.
- flexible materials are desirable as they provide enhanced contact between the manifold element and substrate surfaces that may not be perfectly flat.
- materials include, e.g., polydimethylsiloxane (PDMS) and the like.
- PDMS polydimethylsiloxane
- Such materials are readily produced by micromolding techniques, where molds are fabricated in accordance with well known microfabrication techniques, e.g., photolithography and nickel electroforming of a master, followed by in situ polymerization of the PDMS manifold. Methods of fabricating such manifolds from a large variety of different materials are described in detail in the microfluidic patent literature, e.g., U.S. Pat.
- a fluid that contains nanowires is flowed into fluid inlet port 120 and through channels 104 - 118 , and out of fluid port 122 .
- nanowires immobilize to the regions of the wafer surface that are included in the channels 104 - 118 . Removal of the manifold then yields immobilized nanowire populations 124 - 138 in selected regions that correspond to the regions accessed by the fluid. Further, because the fluid was flowed in a selected direction, e.g., through the channels from the inlet port to the outlet port, the nanowires that are immobilized on the wafer surface in these selected regions are substantially longitudinally oriented in the direction of fluid flow, as shown by expanded view 140 which shows oriented individual wires 142 .
- one may employ more complex fluidic channels or fluid control systems in or attached to the manifold element to more acutely control where and how nanowires immobilize on the surface of the substrate during the deposition process.
- one can take advantage of fluid mechanics within the manifold channels in order to more precisely direct deposition of nanowires against a substrate surface.
- FIG. 5 provides examples of channel geometries or control systems that can be used to provide for wire deposition in desired locations.
- FIG. 5A shows a cross section of a fluidic channel 500 , viewed from above where the fluid channels widen at the region 502 of desired deposition. By widening the channels, fluid velocity through that channel portion is slowed (the residence time of wires in this region is increased) which enhances the likelihood that wires will deposit against the substrate in these regions, e.g., shown as the dashed oval 504 .
- channel regions 510 that have regions with shallower depths 512 , e.g., shorter diffusion distances required to be traversed to reach the substrate surface, may be provided. By providing a shorter diffusion distance between the fluid and the substrate surface region of interest, e.g., region 514 , again, one may enhance the rate at which wires contact and are deposited on the desired surface regions.
- flow irregularities may be provided by the channel geometry which yield aggregation or deposition of particulates, e.g., nanowires in desired regions.
- particulates e.g., nanowires in desired regions.
- FIG. 5C one may provide channels 520 that include coves 522 in the channel geometry, or corners 524 at which will function as deposition zones 526 as a result of eddies or other recirculating flows that contain nanowires in these regions for extended times.
- Streamlines are indicated by the dashed arrows.
- One such example involves producing standing wave patterns in the fluid containing the nanowires over the surface of the substrate. Such standing waves can be used to create regular periodic patterns of nanowires deposited on the substrate surface.
- FIG. 5D schematically illustrates a fluid channel 530 and wave generator 532 , as well as an exemplary deposition pattern for the nanowires on the surface of the substrate. As shown, a series of standing rolls 534 is set up within a fluid containing channel that yields periodic deposition of nanowires, e.g., in zones 536 .
- interfering waves could be set up in other directions, e.g., orthogonal to the first standing wave, to provide more precise localization of deposited wires.
- Wave generators that are particularly useful in accordance with this aspect of the invention include piezoelectric elements that provide high frequency vibrations to the fluid within the channel.
- Positioned and oriented nanowires are far more amenable to integration with electrical elements in a controlled, high yield fashion.
- populations of positioned and oriented nanowires e.g., populations 124 - 138
- populations 124 - 138 e.g., populations 124 - 138
- Such a distance can be selected to be less than the average size of the nanowires in the population of nanowires. To ensure greater likelihood of spanning the contacts, one could place them at a distance that is less than 90% of the average length, less than 80% of the average length, less than 70% of the average length, and in some cases, less than 50% of the average length of the nanowires in the population. Of course, the closer together the contacts, the more likely it becomes that one or many nanowires will bridge the two electrical contacts.
- the nanowires may be integrated with a wide variety of other elements, including multiple, e.g., more than two electrical contacts, other circuit elements or nanoscale structures or elements fabricated into or onto the substrate (see, e.g., commonly owned U.S. Patent Publication No. 20040136866, published Jul. 15, 2004 and incorporated herein by reference in its entirety for all purposes), structural elements, e.g., ridges, posts, walls, etc., optical elements, or virtually any other element that would be employed in a device that comprises nanowires.
- the wafer may be pre-patterned with electrical contacts, such that immobilization of nanowires in selected regions corresponding to the positions of the electrical contacts yields wires that bridge the contacts.
- the electrical contacts may be patterned over the nanowires (or at least portions of the nanowires) that are immobilized on the wafer.
- a number of metallization patterns can be provided on a wafer.
- a wafer 100 that has nanowire populations 124 - 138 deposited thereon is subjected to further processing to deposit electrical elements onto it.
- electrical elements may be prepatterned onto the substrate.
- a metallization pattern is established on the substrate using conventional photolithographic processes, e.g., photolithographically defining and developing a pattern in a resist coating over the substrate, followed by e.g., evaporative deposition or sputtering of metal electrodes in the open regions.
- a photomask 202 that corresponds to the desired electrode pattern 204 is used in the photolithographic definition of the electrode patterns.
- the wafer based process produces multiple discrete devices (each corresponding to a square 206 in the photomask).
- the mask is removed to yield a wafer with multiple integrated devices 208 , where each device includes a discrete pattern of electrodes 210 that are connected by nanowires 212 within each population of nanowires.
- the electrode patterns are targeted to be overlaid upon the regions where the different populations of nanowires are deposited, to maximize the potential of accurate integration of the two elements.
- the electrical contact patterns also employ elements of efficiency.
- a common electrode 222 is provided for all device elements in a discrete device.
- a number of nanowire based devices are provided, e.g., the wire connection between electrode 224 and 222 and between electrode 220 and 222 , both elements share the common electrode 222 .
- each device may include a single wire connection or may include multiple connections, e.g., as shown in FIG. 2 .
- connections may be of the same type, e., wires of the same composition, or with surface treatments that are the same, e.g., attached ligands, antibodies, nucleic acids, etc. (for sensor applications).
- each device may comprise multiple different wire connections, e.g., wires that have a different basic composition or surface binding element.
- wire connections e.g., wires that have a different basic composition or surface binding element.
- each metallization pattern 210 corresponds to an individual device. As shown in the expanded view, each metallization pattern 210 includes a series of patterned electrical contacts/traces, e.g., contacts/traces 220 , 222 etc.
- the pairs of electrical contacts e.g., contact 220 and 222 , are spaced apart from each other by a distance that has a desired likelihood of having a desired number of nanowires that span the two electrical contacts.
- the electrical contacts will be less than 5 ⁇ m apart, and in other cases, less than 1 ⁇ m apart.
- the methods described herein are not limited to single sets of nanowires oriented in a single direction, but can be used to provide substrates that include nanowires oriented in any desired direction.
- Such differently oriented nanowires can be positioned at different locations on a substrate or substrate wafer, or they can be provided in the same location, e.g., layered, so as to provide arrays of crossed, but electrically or structurally coupled nanowires.
- layered structures may simply be used to provide a three dimensional architecture for a device, e.g., where each layer of nanowires is separated by an intermediate layer.
- the manifold element may be rotated and additional nanowires immobilized and oriented on the surface of the substrate.
- the result is populations of nanowires positioned on a substrate that are oriented in a first direction that overlap with populations of nanowires oriented in a different direction.
- Nanowires that are differently oriented may comprise the same composition or they may comprise different compositions.
- a first population of semiconductor nanowires that is p doped may be positioned and oriented in a first direction.
- a second population may be positioned and oriented orthogonally to the first set and may include n-doping.
- the resulting p-n junction could then be used for a variety of different applications, including, e.g., optoelectronic applications, memory and logic applications, and the like, e.g., as discussed in Published PCT Application Nos. WO 02/17362, WO 02/48701, and 01/03208, the full disclosures of which are hereby incorporated herein by reference in their entirety for all purposes.
- FIG. 4 Bidirectional or multidirectional orientation of nanowires is schematically illustrated in FIG. 4 .
- fluid containing nanowires is flowed in one direction over the substrate surface region 400 where wire deposition is desired. This results in the deposition and immobilization of wires 402 in this region where the wires are substantially longitudinally oriented in the direction of flow.
- Fluid containing wires are then flowed over the same substrate region 400 in a different direction, e.g., orthogonal to the original direction of flow and orientation. This results in deposition and immobilization of wires 404 on the same substrate region oriented in the different direction. This will result in a certain number of cross wire junctions 406 being formed on the substrate surface.
- electrical contacts 408 , 410 , 412 and 414 either before or after the addition of wires, one can establish integrated electrical cross junctions, which may include wires of like or different composition, e.g., doping.
- integrated nanowire junctions may be created from a first nanowire that is fabricated onto the surface of the substrate by more conventional means, e.g., e-beam lithography or the like (see, Provisional Application No. 60/392,205, previously incorporated herein by reference).
- integrated circuits may be readily combined with the free standing nanostructures in accordance with the present invention, as can other integrated circuit elements, e.g., elements that are fabricated into or onto the surface of the substrate prior to adding the nanostructure element as described in the present invention.
- a second nanowire is interfaced with the first using the flow based alignment methods described herein.
- a thin nanowire element may be fabricated from an SOI wafer where the relevant semiconductor is p-doped. An n-doped, free standing nanowire is then deposited across the first wire element to provide a p-n junction.
- junction types may be created in this manner, including simple switches, etc. as described above.
- the methods of the invention involve the immobilization of nanowires onto a surface of a substrate.
- immobilization refers to the coupling of a nanowire with the substrate surface, or chemical groups on that surface, such that the nanowire remains in position on the substrate surface despite being contacted by fluids, moving air or gas, etc. Immobilization may be permanent or reversible. Typically, immobilization is the result of chemical interaction between the surface or chemical groups on the surface and the nanowires themselves, or chemical groups on the nanowires. Such interactions include, e.g., ionic interactions, covalent interactions, hydrophobic or hydrophilic interactions, and electrostatic or magnetic interactions.
- the existing surfaces of the substrate and the nanowire may provide sufficient attraction between the substrate and the nanowire to provide immobilization.
- the nanowires and substrate surface are generally hydrophilic, one could dispose the nanowires in a hydrophobic solvent to contact them with the surface. As a result, the favored reaction would be for the nanowires to associate with the substrate surface, resulting in immobilization.
- one may provide surface functionalization on one or both of the substrate and/or the nanowire that facilitates coupling between the two.
- FIG. 3 illustrates such a process using the same manifold 102 for surface functionalization followed by nanowire deposition. As shown, manifold 102 is placed over wafer 100 , and appropriate functionalization chemistry is directed through the channels of the manifold.
- Functionalization of the surface may be carried out by a variety of means. For example, as discussed above, functionalization may be directed at an entire substrate surface, or it may be patterned or chemically templated onto the substrate surface.
- the term “chemical template” generally refers to the deposition and/or reaction upon a substrate surface of a template that is defined by chemical modification of that substrate surface. In particular, chemical modification of the surface in selected regions will make it more likely that a nanostructure will localize to a particular region, e.g., a desired region, than in another region, e.g., an undesired region.
- Chemical modification can be positive modification, e.g., the region of modification provides enhanced affinity of the nanostructure to the substrate, or it can be negative, e.g., it provides a repulsing effect such that nanostructures are unlikely to localize in the particular region.
- Chemical modifications include any of a variety of different surface treatments that are well known in the art of surface chemistry, including coupling of active groups that are capable of bonding to or otherwise associating with the nanostructures or with chemical groups disposed upon those nanostructures.
- the functional chemical groups presented may interact with the nanostructures via affinity interactions, ionic interactions, hydrophobic and/or hydrophilic interactions.
- the substrate may comprise a bare substrate or may include other elements, including other device elements and/or other nanostructures, e.g., electrodes, nanowires, circuit elements, etc.
- the chemical moieties may be an element of the substrate, or they may be coupled, either directly or through a linker molecule, or otherwise provided upon the surface of the substrate in the desired pattern or at the desired locations or regions of the substrate's surface.
- One arrangement for capturing nanostructures involves forming surfaces that comprise regions that selectively attract nanostructures.
- —NH 2 moieties can be presented in a particular pattern at a surface, and that pattern will attract nanowires or nanotubes having surface functionality attractive to amines.
- This same surface functionality is also optionally used to generate an ionic attraction whereby surface amines are exposed to an acidic environment resulting in a predominantly positively charged surface, e.g., populated with NH 3 + groups that can attract negatively charged nanostructure surfaces or repel like charged materials.
- Surfaces can be patterned using known techniques such as electron-beam patterning, soft-lithography, or the like. See also, International Patent Publication No. WO 96/29629, published Jul. 26, 1996, and U.S. Pat. No. 5,512,131, issued Apr. 30, 1996.
- Templates may have inherent affinity toward nanostructures, or may be provided such that the affinity can be accentuated.
- chemical templates are generated by providing protected functional groups over the surface of the substrate upon which the nanostructures are going to be provided. Desired portions or regions of the substrate surface are then deprotected, e.g., the protecting groups are removed or transformed, to yield an active site to which nanostructures will bind or otherwise be localized.
- the regions of the substrate that are deprotected may comprise a basic substrate surface, e.g., a SiO 2 substrate, or they may include other elements, including functional elements, on the surface of a basic substrate.
- a chemical template may define regions only on the surfaces of electrical contacts that are present on a basic substrate, and not elsewhere on the substrate surface, so as to increase the likelihood that nanostructures, e.g., nanowire(s), will be coupled to those electrodes, and nowhere else.
- photodeprotection is used to provide a chemical template for directed positioning of nanostructures.
- a substrate to which nanostructures are to be coupled, bound or otherwise associated is treated to provide a layer of chemical moieties that include active functional chemical groups that would interact, e.g., bind, to a nanostructure, but for the presence of a protecting group coupled to that active group.
- the protecting group provided on the active group is a photolabile protecting group. Specifically, in order to activate the molecules on the surface of the substrate, one must expose the photolabile protecting group to light of a desired wavelength, to remove the protecting group and yield the active chemical moiety with which a nanostructure may interact/bind.
- selectively exposing desired regions of the substrate By selectively exposing desired regions of the substrate, one can selectively activate a pattern of regions on that surface and drive the selective positioning of nanostructures accordingly.
- Such selective exposure can be carried out using standard photolithographic techniques, e.g., mask-based exposure, laser writing, e-beam lithography, etc. that are very well known in the art.
- photolabile protecting groups and their associated linkage chemistries e.g., that couple other elements to surfaces, once activated, are well known in the art, and have been used extensively in the directed positioning of chemical elements on substrate surfaces.
- amino or hydroxyl terminated organosilane linker molecules are provided coupled to the substrate surface.
- the linker group is capped by a protecting group that is cleaved or rendered cleavable upon exposure to light of a desired wavelength.
- photolabile protecting groups include nitroveratryloxycarbonyl protecting groups, such as NVOC and MeNVOC, as well as nitropiperonyloxycarbonyl protecting groups, such as NPOC and MeNPOC, and others, e.g., PyMOC.
- nitroveratryloxycarbonyl protecting groups such as NVOC and MeNVOC
- nitropiperonyloxycarbonyl protecting groups such as NPOC and MeNPOC
- NPOC and MeNPOC e.g., PyMOC.
- the use of these protecting groups and others in photolithographic activation of surfaces is described in, e.g., U.S. Pat. Nos. 5,489,678 and 6,147,205, the complete disclosures of which are hereby incorporated herein by reference in their entirety for all purposes.
- functional groups may be in an ionizable form, such that under certain conditions, e.g., low or high pH, the functional group has substantial affinity for the nanostructure, e.g., a strong positive or negative charge, while under different environmental conditions, the affinity is substantially lower, or is even negative.
- the organosilane polymer is terminated with a hydrophilic moiety.
- the natural affinity of the nanowire components, e.g., for semiconductor nanowires, to the hydrophilic moiety provides the selectivity of binding in the overall positioning process.
- linkers including such hydrophilic terminators include, e.g., (hydroxy/amino) propyltriethoxy silane derivatives and poly(hydroxy/amino)propyltriethoxysilane derivatives.
- protecting groups for this particular embodiment would be generally hydrophobic in nature. Cleavage would then yield an increase in hydrophilicity at the desired location.
- a fluidic suspension of nanostructures is flowed over or otherwise contacted with the entire substrate.
- the affinity of the nanostructures, e.g., semiconductor nanostructures, for the hydrophilic regions provides for the preferential localization of the nanowires in the deprotected regions.
- Such regions may include regions between and including electrical contacts, or between electrical contact(s) and other nanostructures, or regions on substrates where subsequent additional elements will be patterned to contact the nanostructures so deposited.
- hydrophilic affinity While described in terms of hydrophilic affinity, it will be appreciated that a variety of different interactions may be exploited in the attraction and/or repulsion of nanostructures within the selected pattern, including hydrophobic interactions, e.g., in regions where it is not desired to have binding, combined hydrophobic/hydrophilic interactions, specific molecular affinity interactions, e.g., antibody:antigen, aviden:biotin, nucleic acid hybridization,, or ionic interactions.
- hydrophobic interactions e.g., in regions where it is not desired to have binding, combined hydrophobic/hydrophilic interactions, specific molecular affinity interactions, e.g., antibody:antigen, aviden:biotin, nucleic acid hybridization,, or ionic interactions.
- nanowires may be silanized for attachment to the substrate surface, either directly or through an intermediate group.
- Such derivatization could include addition of affinity molecules, hydrophilic or hydrophobic groups, ionic groups, etc. as desired to improve efficiency of the positioning process.
- functionalization of the nanowire provides facility in adding additional components to the nanowire element, i.e., for attachment of biomolecules for biosensor applications (see, e.g., U.S. Patent Publication No. 20040136866, previously incorporated herein).
- both the nanowire and substrate may be derivatized to facilitate binding and improve efficiency of the positioning process.
- patterning of a surface for nanostructure attachment may utilize chemical deprotection methods, e.g., acid deprotection.
- Acid deprotection generally utilizes acid labile protecting groups in place of the photolabile protecting groups described above.
- Directed exposure of regions to acid may be accomplished through mechanically directed means, e.g., channeling acid to the desired regions while preventing the acid from reaching other regions.
- mechanical means can include the use of channel blocks mated with the substrate, template masks. However, such methods often yield low resolution due to the difficulty in sealing the channel block to the substrate surface.
- Other mechanical methods include ink jet printing methods, microcontact printing methods, etc.
- the patterned electrodes with a thin gold layer as the chemical moiety to increase affinity, and treat the nanostructures with thiol terminated organosilanes. The thiolated nanostructure would then bind preferentially to the gold electrode.
- photoresist layers are used to generate a mechanical stencil or mask for subsequent acid exposure.
- a resist is coated on a substrate that includes acid labile protecting group capping the functional groups.
- the resist is exposed and developed, e.g., removed, in the desired regions and the exposed portions of the substrate are subjected to acid deprotection while the unexposed regions are not.
- an acid generating resist is used, where exposure of the resist in the desired locations results in generation of an acid which in turn deprotects the functional groups in those desired locations. This latter method has an added advantage of reducing the number of required process steps, in that the exposure and acid deprotection steps are concurrent.
- acid labile protecting groups examples include, e.g., DMT (dimethoxytrityl) and its derivatives, as well as acid generating resist layers that are generally commercially available.
- patterning techniques such as microcontact printing techniques, laser ablative techniques (either direct or in conjunction with a resist layer, i.e., PMMA), and the like may be employed in the patterning steps.
- Such methods are generally well known in the art and are described in, e.g., U.S. Pat. Nos. 6,180,239 to Whitesides et al, and 5,500,071 to Swedberg et al.
- protecting group types may be employed, e.g., allyloxycarbonyl (ALLOC), fluorenylmethoxycarbonyl (FMOC), —NH-FMOC groups, t-butyl esters, t-butyl ethers, and the like.
- ALLOC allyloxycarbonyl
- FMOC fluorenylmethoxycarbonyl
- —NH-FMOC groups t-butyl esters
- t-butyl ethers e.g., Various exemplary protecting groups are described in, for example, Atherton et al., (1989) Solid Phase Peptide Synthesis, IRL Press, and Greene, et al. ( 1991 ) Protective Groups In Organic Chemistry, 2nd Ed., John Wiley & Sons, New York, N.Y.
- a masking element for the steps of selectively patterning nanowires onto the surface, through the use of a masking element, while in preferred aspects, the masking element or manifold is provided as a separate element or layer that is removably placed against the substrate surface, it will be appreciated that this element may be fabricated onto the surface of the substrate, e.g., in the same fashion as described with reference to chemical templating of the substrate surface. Further, this masking element may remain permanently on the surface of the substrate, or it may be removed through subsequent processing of the substrate.
- a manifold element may be fabricated onto a substrate or substrate wafer surface by coating a layer of material, e.g., a polymeric resist layer on the substrate.
- polymeric resists, and preferably photoresists are spin coated onto wafer surfaces.
- the substrate may include electrical contacts pre-patterned onto the surface of the wafer.
- the surface may be pre-functionalized in first selected regions for coupling to nanowires, as described above.
- passages are defined through that layer, typically as troughs, trenches or fluid channels in the layer to provide fluid access to the surface of the substrate.
- a photoresist as the masking layer, one can simply use the recommended exposure and development processes for the resist used to define the passages.
- an additional cover layer is optionally and preferably disposed over the masking layer to provide flow channels, like with a manifold.
- positive or negative resists may generally be employed in accordance with the invention, for use in templating, it will be generally desirable to use positive photoresists, as they are less prone to swelling in aqueous solutions or in ethanol, which is often employed as the fluid carrier for nanostructures, e.g., nanowires.
- Positive resists additionally provide better adhesion to many substrate layer types, e.g., silicon, and provide greater mechanical strength. This allows for more precise templating or masking in the positioning of nanowires.
- this layer may be removed in subsequent steps or it may be allowed to remain on the overall device to provide additional structural features, e.g., insulation, moisture barriers, fluidic conduits, etc.
- additional structural features e.g., insulation, moisture barriers, fluidic conduits, etc.
- positive and negative resists are generally commercially available, e.g., from DuPont, i.e., DuPont 8000 series resists.
- the masking layer may be removed from the substrate to allow for additional processing.
- various integration elements are prepositioned on the wafer or substrate, it may not be necessary to remove the masking layer.
- the masking layer may provide a barrier or insulation between electrical or fluidic elements of a device.
- resist layers any of a variety of resist layers are readily commercially available for this process, including, e.g., polyimide or PMMA based resists, or any of a variety of resists that are generally commercially available.
- FIG. 6 schematically illustrates an overall system that may be used in commercial scale alignment and deposition of nanowires onto substrates and subsequent device integration.
- the system 600 includes a source of nanowire containing fluid 602 .
- a pump 604 delivers the fluid to the inlet port 606 of a deposition module 608 which would typically include a base substrate 610 onto which nanowires are to be deposited, and a manifold element 612 which directs the flowing nanowires to selected regions on the surface of the substrate to which the manifold is mated.
- the fluid exits the manifold 612 through outlet port 614 , where the fluid and the nanowires still contained therein are reclaimed, e.g., in a reclamation vessel (not shown) or recycled back into source 602 (as shown).
- the module 606 may be multiplexed either in parallel, e.g., as shown by module 616 , or in series, as shown by module 618 , provided there is a sufficient concentration of nanowires in the fluid, in order to increase the throughput of the deposition process.
- Nanowires were positioned and oriented on a substrate and subsequently integrated with electrical connections in accordance with the invention.
- Silicon nanowires used for flow alignment were synthesized by gold cluster mediated chemical vapor deposition methods, and the resulting nanowires were suspended in ethanol solution via ultrasonication.
- a poly(dimethylsiloxane) (PDMS) stamp e.g., as shown in FIG. 1 , was fabricated by photolithography.
- the PDMS stamp had a three-inch diameter, with eight parallel channels spaced 7 mm apart with each channel having a width of 500 ⁇ m, and a depth of ⁇ 200 ⁇ m.
- a silicon substrate wafer (surface oxidized, 600 nm oxide) to be used in flow assembly was functionalized with an NH 2 -terminated self-assembled monolayer (SAM) by immersion in a 1 mM chloroform solution of 3-aminopropyltriethoxysilane (APTES) for 30 min, followed by heating at 110° C. for 10 min.
- SAM NH 2 -terminated self-assembled monolayer
- APTES 3-aminopropyltriethoxysilane
- Alignment of nanowires was performed by conforming the PDMS stamp to the functionalized surface of the silicon substrate.
- the ethanol solution of nanowires was flowed into the parallel channels of the stamp through one port (inlet) and out through the other port. Flow was either induced by gravity, e.g., tilting the substrate to ⁇ 40°, or through application of a positive pressure to the inlet port.
- FIG. 7 shows an SEM image of flow aligned nanowires immobilized on a substrate. As can be seen, a substantial majority of the nanowires are substantially longitudinally oriented in a single direction in the direction of flow during the deposition process.
- FIG. 8A A virtual electrical contact pattern overlaid on the oriented nanowires is shown in FIG. 8A . Examination of overlay in FIG. 8A allows for an estimate of 0, 1, 2 and 3 wire connections between electrode pairs.
- FIG. 8B provides a plot of the distribution of connections in the estimated devices of FIG. 8A . As can be seen, functional device yield, e.g., percentage of devices showing one or more connection between a pair of electrical contacts, is approximately 75%.
- FIG. 9 illustrates the overall device, as well as expanded views of the electrodes and nanowire connections between electrode pairs. Electrode pairs are made up between the common central electrode and each of the separate orthogonally oriented electrodes. Each connected electrode pair, e.g., connection between the central electrode and an orthogonal electrode, represents an operation element of a nanowire based device.
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Abstract
Description
- This application is a continuation of U.S. patent application Ser. No. 11/000,557, filed Dec. 1, 2004, which is a continuation of U.S. patent application Ser. No. 10/239,000, filed Sep. 10, 2002 and is related to and claims priority from Provisional U.S. Patent Application No. 60/370,113, filed Apr. 2, 2002, each of which is hereby incorporated herein in its entirety for all purposes.
- Nanotubes, nanocrystals, nanowires, and particularly semiconductor nanowires have gained a great deal of attention for their interesting and novel properties in electrical, chemical, optical and other applications. Such nanomaterials have a wide variety of expected and actual uses, including use as semiconductors for nanoscale electronics, optoelectronic applications in emissive devices, e.g., nanolasers, LEDs, etc., photovoltaics, and sensor applications, e.g., as nano-ChemFETS.
- While commercial applications of the molecular, physical, chemical and optical properties of these materials have been postulated for all of these different types of materials, generating commercially viable products has not, as yet, been forthcoming. In the world of devices with integrated nanomaterial elements, some of the difficulties in producing commercially viable products has stemmed from the difficulty in handling and interfacing with such small scale materials. Specifically, for the most part, these materials are produced in bulk as free standing elements that must be positioned within an operational device. Accurate and reproducible positioning of these materials has proven difficult.
- Accordingly, it would be desirable to be able to provide methods of positioning and orienting nanowires on substrates or within integrated devices or systems, in a reasonably practicable fashion. The present invention meets these and a variety of other needs.
- The present invention is generally directed to methods of positioning and orienting nanostructures, and particularly nanowires on substrates for subsequent use, integration or application. The invention also envisions systems for practicing such methods, devices that include oriented and positioned nanostructures, populations of positioned and/or oriented nanostructures, and systems that include such positioned and/or oriented nanostructures.
- In one aspect, the present invention provides a method of depositing nanowires on a surface substantially in a desired orientation. The method generally comprises flowing a fluid containing nanowires over the surface in a first direction, where the first direction is substantially parallel to a desired longitudinal orientation of the nanowires. The nanowires in the solution are then permitted to become immobilized onto the surface, with the longitudinal dimension of the nanowires being substantially oriented in the first direction.
- In a further aspect, the invention is directed to methods of positioning nanowires in one or more predetermined regions on a substrate. The methods typically comprise providing a substrate having a first surface, overlaying the first surface with a mask, where the mask provides fluid access to one or more first predetermined regions on the first surface, but not to one or more second predetermined regions on the surface of the substrate. A fluid containing nanowires is then flowed through the mask and into contact with the first predetermined regions of the substrate surface. The nanowires contained in the nanowire containing fluid are then permitted to immobilize in the first predetermined regions of the surface of the substrate.
- In another aspect, the invention is directed to one or more populations of nanowires immobilized on a planar surface of a substrate, where the population(s) of nanowires are substantially longitudinally oriented in a first direction parallel to the planar surface.
- Similarly, the invention includes populations of nanowires immobilized on a surface of a substrate that comprise a first set of nanowires immobilized in a first selected region of the surface of the substrate, and a second set of nanowires immobilized in a second selected region of the surface of the substrate, the second selected region being separate from the first selected region.
- The invention is also directed to a nanowire based device that comprises at least a first population of nanowires immobilized in at least a first region of a surface of a substrate, the first population of nanowires being substantially longitudinally oriented in a first direction. The devices of the invention typically include at least first and second electrical contacts disposed on the first region of the surface of the substrate. The first and second electrical contacts are typically separated from each other on the first surface of the substrate in the first direction by a less than an average length of the nanowires in the population of nanowires.
- The invention also includes a substrate comprising a plurality of populations of nanowires deposited upon a first surface of said substrate, wherein each of the populations of nanowires is deposited and immobilized in a separate discrete region of the surface of the substrate. In preferred aspects, electrical contacts are disposed in the separate regions such that at least one wire in the populations of nanowires bridges and connects at least two electrical contacts.
- In a further aspect, the invention is directed to a system for orienting nanowires on a surface of a substrate in accordance with the methods of the invention. The system typically comprises a substrate having a first surface, a fluid channel disposed on the first surface, and a fluid direction system coupled to the first channel and coupled to a source of fluid containing nanowires, for flowing the fluid containing nanowires in a first direction through the first fluid channel.
- The invention also includes, as one aspect, a system for positioning nanowires on a surface of a substrate. As above, the system includes the substrate having the first surface. A masking element is provided over the first surface which provides fluid access to separate discrete regions of the first surface of the substrate. A source of fluid that includes the nanowires or other nanostructures is provided fluidicly coupled to the fluid passages in the masking element. A fluid direction system is operably coupled to the fluid source and passages in the masking element to delver the fluid from the source to the passages, so that the nanowires in the fluid can contact and thus be immobilized upon the discrete regions of the surface of the substrate.
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FIG. 1 schematically illustrates a wafer based process for positioning and orienting nanowires on a substrate. -
FIG. 2 schematically illustrates the integration of electrical elements with positioned and oriented nanowires on a wafer substrate. -
FIG. 3 is a schematic illustration of patterned substrate functionalization followed by positioning and orienting of nanowires. -
FIG. 4 shows a schematic illustration of bidirectional orientation of nanowires in accordance with the processes described herein. -
FIG. 5A-5D show schematic illustrations of different fluidic channel structures designed to achieve different deposition patterns of nanowires on substrate surfaces. -
FIG. 6 is a schematic illustration of an overall system for positioning and aligning nanowires onto substrate surfaces. -
FIG. 7 is an SEM image of oriented nanowires immobilized on a substrate surface. -
FIG. 8A is a postulated electrode deposition over the oriented nanowire population shown inFIG. 7 , andFIG. 8B shows a plot of expected frequency of 0, 1, 2 and 3 wire connections between electrode pairs. -
FIG. 9 shows aligned nanowires connected to electrical contact pairs. - The present invention is generally directed to methods of positioning and/or orienting nanowires on substrates, nanowires so positioned and/or oriented, devices produced from such oriented and/or positioned nanowires, and systems used in so orienting and/or positioning such nanowires.
- As used herein, the term “nanowire” generally refers to any elongated conductive or semiconductive material that includes at least one cross sectional dimension that is less than 500 nm, and preferably, less than 100 nm, and has an aspect ratio (length:width) of greater than 10, preferably, greater than 50, and more preferably, greater than 100. Examples of such nanowires include semiconductor nanowires as described in Published International Patent Application Nos. WO 02/17362, WO 02/48701, and 01/03208, carbon nanotubes, and other elongated conductive or semiconductive structures of like dimensions. Particularly preferred nanowires include semiconductive nanowires, that are comprised of semiconductor material selected from, e.g., Si, Ge, Sn, Se, Te, B, Diamond, P, B—C, B—P(BP6), B—Si, Si—C, Si—Ge, Si—Sn and Ge—Sn, SiC, BN/BP/BAs, AlN/AlP/AlAs/AlSb, GaN/GaP/GaAs/GaSb, InN/InP/InAs/InSb, BN/BP/BAs, AlN/AlP/AlAs/AlSb, GaN/GaP/GaAs/GaSb, InN/InP/InAs/InSb, ZnO/ZnS/ZnSe/ZnTe, CdS/CdSe/CdTe, HgS/HgSe/HgTe, BeS/BeSe/BeTe/MgS/MgSe, GeS, GeSe, GeTe, SnS, SnSe, SnTe, PbO, PbS, PbSe, PbTe, CuF, CuCl, CuBr, Cul, AgF, AgCl, AgBr, AgI, BeSiN2, CaCN2, ZnGeP2, CdSnAs2, ZnSnSb2, CuGeP3, CuSi2P3, (Cu, Ag)(Al, Ga, In, TI, Fe)(S, Se, Te)2, Si3N4, Ge3N4, Al2O3, (Al, Ga, In)2(S, Se, Te)3, Al2CO, and an appropriate combination of two or more such semiconductors. In certain aspects, the semiconductor may comprise a dopant from a group consisting of: a p-type dopant from Group III of the periodic table; an n-type dopant from Group V of the periodic table; a p-type dopant selected from a group consisting of: B, Al and In; an n-type dopant selected from a group consisting of: P, As and Sb; a p-type dopant from Group II of the periodic table; a p-type dopant selected from a group consisting of: Mg, Zn, Cd and Hg; a p-type dopant from Group IV of the periodic table; a p-type dopant selected from a group consisting of: C and Si.; or an n-type is selected from a group consisting of: Si, Ge, Sn, S, Se and Te.
- The present invention provides for the selective deposition of nanowires in preselected regions of substrates by providing a masking layer that masks off certain portions of the substrate surface, while providing fluid access to those portions of the substrate surface where it is desired to deposit nanowires. Fluid containing the nanowires is then directed through the mask such that the nanowires contact the desired regions of the substrate, and the nanowires are immobilized thereon. In the context of the invention, the substrate to which nanowires are immobilized may comprise a uniform substrate, e.g., a wafer of solid material, e.g., silicon, glass, quartz, plastic, etc. or it may comprise additional elements, e.g., structural, compositional etc. For example, the substrate may include other circuit or structural elements that are part of the ultimately desired device. Particular examples of such elements include electrical circuit elements such as electrical; contacts, other wires or conductive paths, including nanowires or other nanoscale conducting elements, optical and/or optoelectrical elements, e.g., lasers, LEDs, etc., structural elements, e.g., microcantilevers, pits, wells, posts, etc.
- By further controlling the direction of flow of the nanowire containing fluid through the mask, one can substantially align or orient the nanowires that immobilize to the surface of the substrate. In particular, nanowires that are being deposited on a surface tend to be longitudinally oriented in the direction of flow of the carrier fluid in which they are suspended. Accordingly, one can substantially longitudinally orient nanowires on a surface by flowing the carrier fluid in a direction across the surface that is parallel to the desired longitudinal orientation of the nanowires. By “substantially longitudinally oriented” is meant that the longitudinal axes of a majority of nanowires in a collection or population of nanowires are oriented within 30 degrees of a single direction. Preferably, at least 80% of the nanowires in a population are so oriented, more preferably at least 90% of the nanowires are so oriented. In certain preferred aspects, the majority of nanowires are oriented within 10 degrees of the desired direction.
- In the context of the present invention, it is generally preferred to provide for selective positioning of nanowires on certain regions of substrates while simultaneously providing for desired orientation of those nanowires. However, as will be readily appreciated, there may be a number of instances in which one aspect of the invention is more desired than the other. For example, in certain cases, it may be desired to align nanowires on a substrate surface with little or no regard for the positioning of the nanowires on that surface. Similarly, there may be instances where selected positioning of nanowires is desired with little or no regard for the orientation of the nanowires once positioned. Although the disclosure may focus a particular discussion on one aspect or the other, such discussion is generally for ease of understanding and convenience of description. It will be appreciated that in many cases, such disclosure applies equally to all aspects of the invention.
- As noted previously, selective contact between nanowires and regions of a substrate is accomplished through a mask-based method, where a masking element is placed over the entire substrate surface. The mask provides for fluidic access to the desired regions of the substrate. A mask may be a simple stencil type mask where a solid layer that includes apertures disposed through it is placed or fabricated over the surface of the substrate. The apertures provide the fluid access to certain regions of the substrate surface and by directing fluid containing nanowires (or other collections of nanowires, e.g., dry powders, etc.) to the surface of the substrate, one can ensure nanowire contact, and ultimately localization and immobilization to those regions. By way of example, nanowires may be particularly targeted for positioning or localization in desired areas of the substrate, e.g., areas in which integration with additional elements is to occur, or to keep nanowires out of areas in which their presence could prove detrimental to ancillary functions of a nanowire based device. By way of example, it may be particularly desirable to ensure hat nanowires contact electrical contacts or other circuit elements, while avoiding contact with other regions of the substrate surface. By doing so, one can ensure that efforts at depositing nanowires are focused in those regions of the substrate where deposition is desired, and not in other regions where it is less desirable.
- In particularly preferred aspects, however, the masking element will be somewhat more complex than a simple stencil like mask. In particular, in order to provide for both positioning and orientation of nanowires on a substrate surface, it is generally desirable to provide for directed flow of fluid across the surface of the substrate. As such, it will generally be desired to provide a masking element that provides fluidic channels across selected regions of a substrate's surface. Such masking elements are also often referred to as manifolds. In brief, one can fabricate one or more grooves into a planar substrate to provide a manifold element. This planar element is then mated with the substrate surface upon which selective deposition of nanowires is desired. The mating of the manifold element with the substrate surface encloses the groove on the manifold element and provides a channel which includes as one of its walls, a portion of the substrate surface. The groove typically includes a fluid inlet port and a fluid outlet port to permit the introduction and flow of fluid containing nanowires into and through the channel in the manifold element. In more preferred aspects, these fluidic channels disposed over the substrate surface will be microscale in cross section, e.g., having a width dimension across the substrate that is less than 1 mm, preferably, less than 500 μm, and in many cases, less than 100 μm.
- One of the advantages of the present invention is its ability to be readily adapted to provide methods for larger scale production of nanowire containing devices by providing full wafer scale nanowire orientation and/or positioning processes. In particular, a nanowire containing device, like most integrated circuit devices, is typically embodied in a small chip. Like the integrated circuit industry, it would be desirable to be able to manufacture multiple devices in parallel from individual and larger wafers.
- In accordance with the present invention, a substrate wafer is provided from which multiple devices are to be produced. A fluid that contains nanowires is contacted with, or in the case of flow aligned nanowires, flowed over all or one or more selected portions of the substrate in a desired direction. As noted above, for flow aligned nanowires, the direction of flow will typically dictate the substantial longitudinal orientation of the nanowires that become immobilized on the surface of the substrate.
- In some cases, it is preferred to provide nanowires only on selected regions of the surface of the substrate, e.g., to minimize extraneous wire deposition, avoid wasting wires on unused portions of the substrate, etc. In such cases, a masking element is provided over the substrate surface to ensure that nanowire containing fluid only comes into contact with one or more selected regions on the substrate surface. By way of example, a channel block or manifold that includes one or more channel grooves is placed against the substrate wafer and fluid containing the nanowires is flowed through the channels in the desired direction to provided oriented nanowires in the selected locations on the wafer surface.
- In order to produce multiple devices from the single wafer, multiple electrical interface components are provided on the wafer. For example, in producing multiple simple devices that includes two electrical contacts bridged by one or more nanowires, multiple pairs of electrical contacts can be provided on the substrate wafer, corresponding to each device. Typically, each pair of such electrical contacts will be provided close enough to each other in the desired direction, e.g., the direction of longitudinal orientation of the nanowires, such that a nanowire could bridge the space between the electrical contacts. Multiple pairs of electrical contacts are provided at multiple different positions on the wafer surface. The wafer containing multiple nanowire devices, e.g., one or more nanowires bridging a pair of electrodes, are then segmented into multiple separate devices.
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FIG. 1 illustrates a wafer based process for producing nanowire based devices in which nanowires are oriented, positioned and integrated with electrical contacts for subsequent application. As shown, asubstrate wafer 100 is provided from which multiple nanowire based devices are to be fabricated. Thewafer 100 may include surface functionalization, e.g., as described herein. A masking element, such asmanifold 102 is overlaid on the relevant surface of thewafer 100. The manifold includes a plurality of fluid accesses, e.g., fluid channels 104-118, to the surface of the substrate. In particular, as shown, channels 104-118 are sealed on one side by the surface of thewafer 100, as described above. These channels are coupled tofluid ports - The manifold or masking
element 102 may take on a variety of forms and/or be fabricated from a variety of materials. By way of example, the manifold may be fabricated from rigid substrates, e.g., glass, quartz, silicon, or other silica based materials. Such materials provide ease of manufacturing, in that the elements of the manifold, e.g., the fluidic channels, can be fabricated by processes that are well known in the microfluidics, and microfabrication industries, e.g., photolithography and wet chemical etching. Similarly, polymeric materials may be used and are readily manufactured using micromolding techniques, e.g., injection molding, microembossing, etc. In some preferred cases, flexible materials are desirable as they provide enhanced contact between the manifold element and substrate surfaces that may not be perfectly flat. Examples of such materials include, e.g., polydimethylsiloxane (PDMS) and the like. Such materials are readily produced by micromolding techniques, where molds are fabricated in accordance with well known microfabrication techniques, e.g., photolithography and nickel electroforming of a master, followed by in situ polymerization of the PDMS manifold. Methods of fabricating such manifolds from a large variety of different materials are described in detail in the microfluidic patent literature, e.g., U.S. Pat. Nos., 6,180,239 to Whitesides et al, and 5,500,071 to Swedberg et al., and U.S. Pat. No. 6,123,798 to Ghandi et al., the full disclosure of each of which are hereby incorporated herein by reference in their entirety for all purposes. - A fluid that contains nanowires is flowed into
fluid inlet port 120 and through channels 104-118, and out offluid port 122. During flow of the fluid, nanowires immobilize to the regions of the wafer surface that are included in the channels 104-118. Removal of the manifold then yields immobilized nanowire populations 124-138 in selected regions that correspond to the regions accessed by the fluid. Further, because the fluid was flowed in a selected direction, e.g., through the channels from the inlet port to the outlet port, the nanowires that are immobilized on the wafer surface in these selected regions are substantially longitudinally oriented in the direction of fluid flow, as shown by expandedview 140 which shows orientedindividual wires 142. - In alternate aspects, one may employ more complex fluidic channels or fluid control systems in or attached to the manifold element to more acutely control where and how nanowires immobilize on the surface of the substrate during the deposition process. In particular, one can take advantage of fluid mechanics within the manifold channels in order to more precisely direct deposition of nanowires against a substrate surface.
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FIG. 5 provides examples of channel geometries or control systems that can be used to provide for wire deposition in desired locations. By way of example,FIG. 5A shows a cross section of afluidic channel 500, viewed from above where the fluid channels widen at theregion 502 of desired deposition. By widening the channels, fluid velocity through that channel portion is slowed (the residence time of wires in this region is increased) which enhances the likelihood that wires will deposit against the substrate in these regions, e.g., shown as the dashedoval 504. Alternatively, as shown inFIG. 5B , channel regions 510 that have regions withshallower depths 512, e.g., shorter diffusion distances required to be traversed to reach the substrate surface, may be provided. By providing a shorter diffusion distance between the fluid and the substrate surface region of interest, e.g.,region 514, again, one may enhance the rate at which wires contact and are deposited on the desired surface regions. - In other aspects, flow irregularities may be provided by the channel geometry which yield aggregation or deposition of particulates, e.g., nanowires in desired regions. By way of example, and as shown in
FIG. 5C , one may providechannels 520 that includecoves 522 in the channel geometry, orcorners 524 at which will function asdeposition zones 526 as a result of eddies or other recirculating flows that contain nanowires in these regions for extended times. Streamlines are indicated by the dashed arrows. - In a further aspect, one may employ other means for preferentially depositing wires in certain locations. One such example involves producing standing wave patterns in the fluid containing the nanowires over the surface of the substrate. Such standing waves can be used to create regular periodic patterns of nanowires deposited on the substrate surface.
FIG. 5D schematically illustrates afluid channel 530 andwave generator 532, as well as an exemplary deposition pattern for the nanowires on the surface of the substrate. As shown, a series of standingrolls 534 is set up within a fluid containing channel that yields periodic deposition of nanowires, e.g., inzones 536. In addition, interfering waves could be set up in other directions, e.g., orthogonal to the first standing wave, to provide more precise localization of deposited wires. Wave generators that are particularly useful in accordance with this aspect of the invention include piezoelectric elements that provide high frequency vibrations to the fluid within the channel. - Positioned and oriented nanowires are far more amenable to integration with electrical elements in a controlled, high yield fashion. In particular, by providing populations of positioned and oriented nanowires, e.g., populations 124-138, one can more precisely select locations for electrical contacts, in order to maximize the likelihood of functional connection between nanowires and electrical contacts or other elements. By way of example, if one has a population of nanowires that are randomly dispersed within a relatively small area, but are oriented to be pointing substantially in one direction, one can provide electrical contacts within that small area and spaced apart in the direction of orientation by a distance that will likely be spanned by at least one nanowire. Such a distance can be selected to be less than the average size of the nanowires in the population of nanowires. To ensure greater likelihood of spanning the contacts, one could place them at a distance that is less than 90% of the average length, less than 80% of the average length, less than 70% of the average length, and in some cases, less than 50% of the average length of the nanowires in the population. Of course, the closer together the contacts, the more likely it becomes that one or many nanowires will bridge the two electrical contacts. Although described in terms of two electrical contacts, it will be appreciated that the nanowires may be integrated with a wide variety of other elements, including multiple, e.g., more than two electrical contacts, other circuit elements or nanoscale structures or elements fabricated into or onto the substrate (see, e.g., commonly owned U.S. Patent Publication No. 20040136866, published Jul. 15, 2004 and incorporated herein by reference in its entirety for all purposes), structural elements, e.g., ridges, posts, walls, etc., optical elements, or virtually any other element that would be employed in a device that comprises nanowires.
- Integration of the populations of nanowires on the wafer with electrical elements can either be concurrent with the immobilization process or it can take place in a subsequent separate step. In particular, the wafer may be pre-patterned with electrical contacts, such that immobilization of nanowires in selected regions corresponding to the positions of the electrical contacts yields wires that bridge the contacts. Alternatively, the electrical contacts may be patterned over the nanowires (or at least portions of the nanowires) that are immobilized on the wafer.
- As shown in
FIG. 2 , a number of metallization patterns can be provided on a wafer. As shown inFIG. 2 , awafer 100 that has nanowire populations 124-138 deposited thereon is subjected to further processing to deposit electrical elements onto it. As noted above, however, electrical elements may be prepatterned onto the substrate. A metallization pattern is established on the substrate using conventional photolithographic processes, e.g., photolithographically defining and developing a pattern in a resist coating over the substrate, followed by e.g., evaporative deposition or sputtering of metal electrodes in the open regions. As shown, aphotomask 202 that corresponds to the desiredelectrode pattern 204 is used in the photolithographic definition of the electrode patterns. As can be seen, the wafer based process produces multiple discrete devices (each corresponding to a square 206 in the photomask). Once the electrodes are laid down on the substrate, the mask is removed to yield a wafer with multiple integrated devices 208, where each device includes a discrete pattern ofelectrodes 210 that are connected by nanowires 212 within each population of nanowires. As shown, the electrode patterns are targeted to be overlaid upon the regions where the different populations of nanowires are deposited, to maximize the potential of accurate integration of the two elements. - As shown, the electrical contact patterns also employ elements of efficiency. In particular, as shown, a common electrode 222 is provided for all device elements in a discrete device. In particular, while a number of nanowire based devices are provided, e.g., the wire connection between
electrode 224 and 222 and between electrode 220 and 222, both elements share the common electrode 222. This permits the easier connection of the electrical contacts for all of the elements within a given device with other portions of an overall system. In the case of operable devices, it will be readily appreciated that each device may include a single wire connection or may include multiple connections, e.g., as shown inFIG. 2 . Further, these connections may be of the same type, e., wires of the same composition, or with surface treatments that are the same, e.g., attached ligands, antibodies, nucleic acids, etc. (for sensor applications). Alternatively, each device may comprise multiple different wire connections, e.g., wires that have a different basic composition or surface binding element. For a discussion of sensor based applications of nanowire based devices, see, e.g., U.S. Patent Publication No. 20040136866, filed Jun. 27, 2002, and Cui, et al., Science 293, 1289-1292 (2001), the full disclosures of which are incorporated herein by reference in their entirety for all purposes. - Again, as noted above, each
metallization pattern 210 corresponds to an individual device. As shown in the expanded view, eachmetallization pattern 210 includes a series of patterned electrical contacts/traces, e.g., contacts/traces 220, 222 etc. The pairs of electrical contacts, e.g., contact 220 and 222, are spaced apart from each other by a distance that has a desired likelihood of having a desired number of nanowires that span the two electrical contacts. In particular, if one has a population of nanowires where the average length of nanowires is approximately 10 μm, one can increase the likelihood of one or more wires spanning two electrical contacts by placing them less than 10 μm apart. The closer the electrical contacts are together, the more likely it will be that at least one nanowire sill span the two contacts. Thus, in some cases, the electrical contacts will be less than 5 μm apart, and in other cases, less than 1 μm apart. - As will be readily appreciated, the methods described herein are not limited to single sets of nanowires oriented in a single direction, but can be used to provide substrates that include nanowires oriented in any desired direction. Such differently oriented nanowires can be positioned at different locations on a substrate or substrate wafer, or they can be provided in the same location, e.g., layered, so as to provide arrays of crossed, but electrically or structurally coupled nanowires. Alternatively, such layered structures may simply be used to provide a three dimensional architecture for a device, e.g., where each layer of nanowires is separated by an intermediate layer.
- For example, following immobilization and orientation of nanowires in a first direction, the manifold element may be rotated and additional nanowires immobilized and oriented on the surface of the substrate. The result is populations of nanowires positioned on a substrate that are oriented in a first direction that overlap with populations of nanowires oriented in a different direction. Nanowires that are differently oriented may comprise the same composition or they may comprise different compositions. For example, a first population of semiconductor nanowires that is p doped may be positioned and oriented in a first direction. A second population may be positioned and oriented orthogonally to the first set and may include n-doping. The resulting p-n junction could then be used for a variety of different applications, including, e.g., optoelectronic applications, memory and logic applications, and the like, e.g., as discussed in Published PCT Application Nos. WO 02/17362, WO 02/48701, and 01/03208, the full disclosures of which are hereby incorporated herein by reference in their entirety for all purposes.
- Bidirectional or multidirectional orientation of nanowires is schematically illustrated in
FIG. 4 . As shown inFIG. 4 , fluid containing nanowires is flowed in one direction over thesubstrate surface region 400 where wire deposition is desired. This results in the deposition and immobilization ofwires 402 in this region where the wires are substantially longitudinally oriented in the direction of flow. Fluid containing wires are then flowed over thesame substrate region 400 in a different direction, e.g., orthogonal to the original direction of flow and orientation. This results in deposition and immobilization ofwires 404 on the same substrate region oriented in the different direction. This will result in a certain number ofcross wire junctions 406 being formed on the substrate surface. By then addingelectrical contacts - In an alternative arrangement, and as discussed above, integrated nanowire junctions may be created from a first nanowire that is fabricated onto the surface of the substrate by more conventional means, e.g., e-beam lithography or the like (see, Provisional Application No. 60/392,205, previously incorporated herein by reference). Such “integrated circuits” may be readily combined with the free standing nanostructures in accordance with the present invention, as can other integrated circuit elements, e.g., elements that are fabricated into or onto the surface of the substrate prior to adding the nanostructure element as described in the present invention. A second nanowire is interfaced with the first using the flow based alignment methods described herein. By way of example, a thin nanowire element may be fabricated from an SOI wafer where the relevant semiconductor is p-doped. An n-doped, free standing nanowire is then deposited across the first wire element to provide a p-n junction. A variety of different junction types may be created in this manner, including simple switches, etc. as described above.
- As described above, the methods of the invention involve the immobilization of nanowires onto a surface of a substrate. As used herein, the term “immobilization” refers to the coupling of a nanowire with the substrate surface, or chemical groups on that surface, such that the nanowire remains in position on the substrate surface despite being contacted by fluids, moving air or gas, etc. Immobilization may be permanent or reversible. Typically, immobilization is the result of chemical interaction between the surface or chemical groups on the surface and the nanowires themselves, or chemical groups on the nanowires. Such interactions include, e.g., ionic interactions, covalent interactions, hydrophobic or hydrophilic interactions, and electrostatic or magnetic interactions.
- In the case of certain substrates and nanowires, the existing surfaces of the substrate and the nanowire may provide sufficient attraction between the substrate and the nanowire to provide immobilization. For example, where the nanowires and substrate surface are generally hydrophilic, one could dispose the nanowires in a hydrophobic solvent to contact them with the surface. As a result, the favored reaction would be for the nanowires to associate with the substrate surface, resulting in immobilization. Alternatively, and in particularly preferred aspects, one may provide surface functionalization on one or both of the substrate and/or the nanowire that facilitates coupling between the two.
- In functionalizing the substrate surface, where such functionalization is necessary or desired, one may provide the ability to couple the nanowires to an entire substrate surface and rely upon the masking step to selectively position nanowires, or one may also provide only selected regions of functionalized surfaces to further selectively position nanowires on the surface. In particular, one may functionalize only first selected regions on the substrate or wafer. Then, by masking off other selected regions that include portions of the functionalized regions, one can further control how nanowires are coupled to the surface of the substrate.
FIG. 3 illustrates such a process using thesame manifold 102 for surface functionalization followed by nanowire deposition. As shown,manifold 102 is placed overwafer 100, and appropriate functionalization chemistry is directed through the channels of the manifold. This results in derivatized surface regions that correspond to channels 104-118. The manifold is then rotated, e.g., 90°, and nanowire containing fluid is directed through the manifold. Because only a portion of the surface which the nanowires contact is functionalized, the nanowires will be positioned and oriented substantially only in those regions. When the manifold is removed, it yields a substrate in which nanowires are only immobilized in selected small regions, e.g.,regions - Functionalization of the surface may be carried out by a variety of means. For example, as discussed above, functionalization may be directed at an entire substrate surface, or it may be patterned or chemically templated onto the substrate surface. As used herein, the term “chemical template” generally refers to the deposition and/or reaction upon a substrate surface of a template that is defined by chemical modification of that substrate surface. In particular, chemical modification of the surface in selected regions will make it more likely that a nanostructure will localize to a particular region, e.g., a desired region, than in another region, e.g., an undesired region. Chemical modification can be positive modification, e.g., the region of modification provides enhanced affinity of the nanostructure to the substrate, or it can be negative, e.g., it provides a repulsing effect such that nanostructures are unlikely to localize in the particular region. Chemical modifications include any of a variety of different surface treatments that are well known in the art of surface chemistry, including coupling of active groups that are capable of bonding to or otherwise associating with the nanostructures or with chemical groups disposed upon those nanostructures. The functional chemical groups presented may interact with the nanostructures via affinity interactions, ionic interactions, hydrophobic and/or hydrophilic interactions.
- As noted above, the substrate may comprise a bare substrate or may include other elements, including other device elements and/or other nanostructures, e.g., electrodes, nanowires, circuit elements, etc. The chemical moieties may be an element of the substrate, or they may be coupled, either directly or through a linker molecule, or otherwise provided upon the surface of the substrate in the desired pattern or at the desired locations or regions of the substrate's surface.
- One arrangement for capturing nanostructures involves forming surfaces that comprise regions that selectively attract nanostructures. For example, —NH2 moieties can be presented in a particular pattern at a surface, and that pattern will attract nanowires or nanotubes having surface functionality attractive to amines. This same surface functionality is also optionally used to generate an ionic attraction whereby surface amines are exposed to an acidic environment resulting in a predominantly positively charged surface, e.g., populated with NH3 + groups that can attract negatively charged nanostructure surfaces or repel like charged materials. Surfaces can be patterned using known techniques such as electron-beam patterning, soft-lithography, or the like. See also, International Patent Publication No. WO 96/29629, published Jul. 26, 1996, and U.S. Pat. No. 5,512,131, issued Apr. 30, 1996.
- Templates may have inherent affinity toward nanostructures, or may be provided such that the affinity can be accentuated. For example, in preferred aspects, chemical templates are generated by providing protected functional groups over the surface of the substrate upon which the nanostructures are going to be provided. Desired portions or regions of the substrate surface are then deprotected, e.g., the protecting groups are removed or transformed, to yield an active site to which nanostructures will bind or otherwise be localized. As alluded to above, the regions of the substrate that are deprotected may comprise a basic substrate surface, e.g., a SiO2 substrate, or they may include other elements, including functional elements, on the surface of a basic substrate. For example, a chemical template may define regions only on the surfaces of electrical contacts that are present on a basic substrate, and not elsewhere on the substrate surface, so as to increase the likelihood that nanostructures, e.g., nanowire(s), will be coupled to those electrodes, and nowhere else.
- In a first aspect, photodeprotection is used to provide a chemical template for directed positioning of nanostructures. In particular, a substrate to which nanostructures are to be coupled, bound or otherwise associated, is treated to provide a layer of chemical moieties that include active functional chemical groups that would interact, e.g., bind, to a nanostructure, but for the presence of a protecting group coupled to that active group. In accordance with this aspect of the invention, the protecting group provided on the active group is a photolabile protecting group. Specifically, in order to activate the molecules on the surface of the substrate, one must expose the photolabile protecting group to light of a desired wavelength, to remove the protecting group and yield the active chemical moiety with which a nanostructure may interact/bind. By selectively exposing desired regions of the substrate, one can selectively activate a pattern of regions on that surface and drive the selective positioning of nanostructures accordingly. Such selective exposure can be carried out using standard photolithographic techniques, e.g., mask-based exposure, laser writing, e-beam lithography, etc. that are very well known in the art.
- A wide variety of photolabile protecting groups and their associated linkage chemistries, e.g., that couple other elements to surfaces, once activated, are well known in the art, and have been used extensively in the directed positioning of chemical elements on substrate surfaces. By way of example, in at least one aspect of the invention, amino or hydroxyl terminated organosilane linker molecules are provided coupled to the substrate surface. The linker group is capped by a protecting group that is cleaved or rendered cleavable upon exposure to light of a desired wavelength. Examples of known photolabile protecting groups include nitroveratryloxycarbonyl protecting groups, such as NVOC and MeNVOC, as well as nitropiperonyloxycarbonyl protecting groups, such as NPOC and MeNPOC, and others, e.g., PyMOC. The use of these protecting groups and others in photolithographic activation of surfaces is described in, e.g., U.S. Pat. Nos. 5,489,678 and 6,147,205, the complete disclosures of which are hereby incorporated herein by reference in their entirety for all purposes.
- In alternative arrangements, functional groups may be in an ionizable form, such that under certain conditions, e.g., low or high pH, the functional group has substantial affinity for the nanostructure, e.g., a strong positive or negative charge, while under different environmental conditions, the affinity is substantially lower, or is even negative.
- In certain aspects, the organosilane polymer is terminated with a hydrophilic moiety. In such cases, the natural affinity of the nanowire components, e.g., for semiconductor nanowires, to the hydrophilic moiety provides the selectivity of binding in the overall positioning process. Examples of linkers including such hydrophilic terminators include, e.g., (hydroxy/amino) propyltriethoxy silane derivatives and poly(hydroxy/amino)propyltriethoxysilane derivatives. To take advantage of an increase in hydrophilicity, protecting groups for this particular embodiment would be generally hydrophobic in nature. Cleavage would then yield an increase in hydrophilicity at the desired location. Use of relatively hydrophilic and hydrophobic surface templates has been described for use in, e.g., in situ chemical synthesis for biochemical microarrays (see, e.g., U.S. Pat. No. 5,985,551, to Brennan et al.).
- In this case, following exposure of the desired regions to expose the hydrophilic moiety in the desired regions for coupling nanostructures, a fluidic suspension of nanostructures is flowed over or otherwise contacted with the entire substrate. The affinity of the nanostructures, e.g., semiconductor nanostructures, for the hydrophilic regions provides for the preferential localization of the nanowires in the deprotected regions. Such regions may include regions between and including electrical contacts, or between electrical contact(s) and other nanostructures, or regions on substrates where subsequent additional elements will be patterned to contact the nanostructures so deposited.
- While described in terms of hydrophilic affinity, it will be appreciated that a variety of different interactions may be exploited in the attraction and/or repulsion of nanostructures within the selected pattern, including hydrophobic interactions, e.g., in regions where it is not desired to have binding, combined hydrophobic/hydrophilic interactions, specific molecular affinity interactions, e.g., antibody:antigen, aviden:biotin, nucleic acid hybridization,, or ionic interactions.
- In the cases of affinity interactions (and even in other non-affinity cases, where higher efficiency coupling is desired), it may be necessary or desirable to provide a functional group on the nanowire to permit the desired interaction between the nanowire and the substrate, e.g., a complementary molecule to that disposed on the substrate surface. In such cases, and particularly with reference to semiconductor nanowires, e.g., silicon nanowires, derivatization of the nanowire may be carried out according to methods used to derivatize the substrate surface of like make-up. For example, nanowires may be silanized for attachment to the substrate surface, either directly or through an intermediate group. In particular, in the same fashion described for derivatizing the surface of the substrate, supra, one could derivatize the nanowire itself. Such derivatization could include addition of affinity molecules, hydrophilic or hydrophobic groups, ionic groups, etc. as desired to improve efficiency of the positioning process. In addition, functionalization of the nanowire provides facility in adding additional components to the nanowire element, i.e., for attachment of biomolecules for biosensor applications (see, e.g., U.S. Patent Publication No. 20040136866, previously incorporated herein). Thus, in certain cases both the nanowire and substrate may be derivatized to facilitate binding and improve efficiency of the positioning process.
- Additionally, or alternatively to the photo-deprotection process described above, patterning of a surface for nanostructure attachment may utilize chemical deprotection methods, e.g., acid deprotection. Acid deprotection generally utilizes acid labile protecting groups in place of the photolabile protecting groups described above. Directed exposure of regions to acid may be accomplished through mechanically directed means, e.g., channeling acid to the desired regions while preventing the acid from reaching other regions. Such mechanical means can include the use of channel blocks mated with the substrate, template masks. However, such methods often yield low resolution due to the difficulty in sealing the channel block to the substrate surface. Other mechanical methods include ink jet printing methods, microcontact printing methods, etc.
- For modification of electrodes to increase affinity, one could provide the patterned electrodes with a thin gold layer as the chemical moiety to increase affinity, and treat the nanostructures with thiol terminated organosilanes. The thiolated nanostructure would then bind preferentially to the gold electrode.
- Alternatively, photoresist layers are used to generate a mechanical stencil or mask for subsequent acid exposure. In particular, a resist is coated on a substrate that includes acid labile protecting group capping the functional groups. The resist is exposed and developed, e.g., removed, in the desired regions and the exposed portions of the substrate are subjected to acid deprotection while the unexposed regions are not. In still more preferred aspects, an acid generating resist is used, where exposure of the resist in the desired locations results in generation of an acid which in turn deprotects the functional groups in those desired locations. This latter method has an added advantage of reducing the number of required process steps, in that the exposure and acid deprotection steps are concurrent.
- Examples of both acid labile protecting groups and acid generating photoresists are well known in the art and include, e.g., DMT (dimethoxytrityl) and its derivatives, as well as acid generating resist layers that are generally commercially available.
- Although described primarily in terms of photolithographic patterning techniques, it will be appreciated that other patterning techniques, such as microcontact printing techniques, laser ablative techniques (either direct or in conjunction with a resist layer, i.e., PMMA), and the like may be employed in the patterning steps. Such methods are generally well known in the art and are described in, e.g., U.S. Pat. Nos. 6,180,239 to Whitesides et al, and 5,500,071 to Swedberg et al.
- For other applications, different protecting group types may be employed, e.g., allyloxycarbonyl (ALLOC), fluorenylmethoxycarbonyl (FMOC), —NH-FMOC groups, t-butyl esters, t-butyl ethers, and the like. Various exemplary protecting groups are described in, for example, Atherton et al., (1989) Solid Phase Peptide Synthesis, IRL Press, and Greene, et al. (1991) Protective Groups In Organic Chemistry, 2nd Ed., John Wiley & Sons, New York, N.Y.
- For the steps of selectively patterning nanowires onto the surface, through the use of a masking element, while in preferred aspects, the masking element or manifold is provided as a separate element or layer that is removably placed against the substrate surface, it will be appreciated that this element may be fabricated onto the surface of the substrate, e.g., in the same fashion as described with reference to chemical templating of the substrate surface. Further, this masking element may remain permanently on the surface of the substrate, or it may be removed through subsequent processing of the substrate. In particular, a manifold element may be fabricated onto a substrate or substrate wafer surface by coating a layer of material, e.g., a polymeric resist layer on the substrate. In preferred aspects, polymeric resists, and preferably photoresists are spin coated onto wafer surfaces. As described above, the substrate may include electrical contacts pre-patterned onto the surface of the wafer. Similarly, the surface may be pre-functionalized in first selected regions for coupling to nanowires, as described above.
- Following coating of the layer that is to form the manifold or masking layer onto the substrate surface, passages are defined through that layer, typically as troughs, trenches or fluid channels in the layer to provide fluid access to the surface of the substrate. By using a photoresist as the masking layer, one can simply use the recommended exposure and development processes for the resist used to define the passages. Once the masking layer is defined on the surface of the substrate, fluid containing the nanowires is flowed over the substrate and/or specifically through the defined channels or troughs in the desired direction in order to allow the nanowires to be immobilized on the substrate surface in the desired orientation. As will be appreciated, enclosed or sealed channels are generally preferred for flowing nanowires in a desired direction. As such, in preferred aspects, an additional cover layer is optionally and preferably disposed over the masking layer to provide flow channels, like with a manifold. While either positive or negative resists may generally be employed in accordance with the invention, for use in templating, it will be generally desirable to use positive photoresists, as they are less prone to swelling in aqueous solutions or in ethanol, which is often employed as the fluid carrier for nanostructures, e.g., nanowires. Positive resists additionally provide better adhesion to many substrate layer types, e.g., silicon, and provide greater mechanical strength. This allows for more precise templating or masking in the positioning of nanowires. As noted, this layer may be removed in subsequent steps or it may be allowed to remain on the overall device to provide additional structural features, e.g., insulation, moisture barriers, fluidic conduits, etc. A wide variety of different positive and negative resists are generally commercially available, e.g., from DuPont, i.e., DuPont 8000 series resists.
- Once the nanowires are deposited, the masking layer may be removed from the substrate to allow for additional processing. Alternatively, where various integration elements are prepositioned on the wafer or substrate, it may not be necessary to remove the masking layer. In fact, in some cases, the masking layer may provide a barrier or insulation between electrical or fluidic elements of a device. In the case of such masking layers, it will be appreciated that any of a variety of resist layers are readily commercially available for this process, including, e.g., polyimide or PMMA based resists, or any of a variety of resists that are generally commercially available.
- One of the advantages of the invention is its applicability to manufacturing on a commercial scale. In accordance with this advantage,
FIG. 6 schematically illustrates an overall system that may be used in commercial scale alignment and deposition of nanowires onto substrates and subsequent device integration. As shown, thesystem 600 includes a source ofnanowire containing fluid 602. Apump 604 delivers the fluid to theinlet port 606 of adeposition module 608 which would typically include abase substrate 610 onto which nanowires are to be deposited, and amanifold element 612 which directs the flowing nanowires to selected regions on the surface of the substrate to which the manifold is mated. Following contact with the substrate, the fluid exits the manifold 612 throughoutlet port 614, where the fluid and the nanowires still contained therein are reclaimed, e.g., in a reclamation vessel (not shown) or recycled back into source 602 (as shown). Typically, themodule 606 may be multiplexed either in parallel, e.g., as shown bymodule 616, or in series, as shown bymodule 618, provided there is a sufficient concentration of nanowires in the fluid, in order to increase the throughput of the deposition process. - Nanowires were positioned and oriented on a substrate and subsequently integrated with electrical connections in accordance with the invention.
- Silicon nanowires used for flow alignment were synthesized by gold cluster mediated chemical vapor deposition methods, and the resulting nanowires were suspended in ethanol solution via ultrasonication.
- A poly(dimethylsiloxane) (PDMS) stamp, e.g., as shown in
FIG. 1 , was fabricated by photolithography. The PDMS stamp had a three-inch diameter, with eight parallel channels spaced 7 mm apart with each channel having a width of 500 μm, and a depth of ˜200 μm. - A silicon substrate wafer (surface oxidized, 600 nm oxide) to be used in flow assembly was functionalized with an NH2-terminated self-assembled monolayer (SAM) by immersion in a 1 mM chloroform solution of 3-aminopropyltriethoxysilane (APTES) for 30 min, followed by heating at 110° C. for 10 min.
- Alignment of nanowires was performed by conforming the PDMS stamp to the functionalized surface of the silicon substrate. The ethanol solution of nanowires was flowed into the parallel channels of the stamp through one port (inlet) and out through the other port. Flow was either induced by gravity, e.g., tilting the substrate to ˜40°, or through application of a positive pressure to the inlet port.
- Once the nanowire solution was delivered through the stamp, the PDMS stamp was removed, and the surface of the substrate wafer was coated with a photoresist.
FIG. 7 shows an SEM image of flow aligned nanowires immobilized on a substrate. As can be seen, a substantial majority of the nanowires are substantially longitudinally oriented in a single direction in the direction of flow during the deposition process. - By superimposing virtual or postulated pairs of electrical contacts over the oriented nanowires, one can estimate the efficacy of the fabrication process in producing functioning nanowire containing devices, e.g., devices in which one or more nanowires connects a pair of electrical contacts. A virtual electrical contact pattern overlaid on the oriented nanowires is shown in
FIG. 8A . Examination of overlay inFIG. 8A allows for an estimate of 0, 1, 2 and 3 wire connections between electrode pairs.FIG. 8B provides a plot of the distribution of connections in the estimated devices ofFIG. 8A . As can be seen, functional device yield, e.g., percentage of devices showing one or more connection between a pair of electrical contacts, is approximately 75%. - Photolithography was used to selectively remove portions of the photoresist, and electron-beam evaporation was performed to define the metal contacts on to the nanowires in selected locations on the substrate surface. The pattern of electrodes was as shown in
FIG. 1 .FIG. 9 illustrates the overall device, as well as expanded views of the electrodes and nanowire connections between electrode pairs. Electrode pairs are made up between the common central electrode and each of the separate orthogonally oriented electrodes. Each connected electrode pair, e.g., connection between the central electrode and an orthogonal electrode, represents an operation element of a nanowire based device. - Although described in considerable detail above, it will be appreciated that various modifications may be made to the above-described invention, while still practicing the invention as it is delineated in the appended claims. All publications and patent documents cited herein are hereby incorporated herein by reference in their entirety for all purposes to the same extent as if each such document was individually incorporated herein.
Claims (20)
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109989101A (en) * | 2019-04-04 | 2019-07-09 | 西京学院 | A kind of indium antimonide nanowire preparation method |
Families Citing this family (571)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7651875B2 (en) * | 1998-06-08 | 2010-01-26 | Borealis Technical Limited | Catalysts |
US20110125412A1 (en) * | 1998-12-17 | 2011-05-26 | Hach Company | Remote monitoring of carbon nanotube sensor |
US9056783B2 (en) * | 1998-12-17 | 2015-06-16 | Hach Company | System for monitoring discharges into a waste water collection system |
US7454295B2 (en) | 1998-12-17 | 2008-11-18 | The Watereye Corporation | Anti-terrorism water quality monitoring system |
US8958917B2 (en) * | 1998-12-17 | 2015-02-17 | Hach Company | Method and system for remote monitoring of fluid quality and treatment |
US20060175601A1 (en) * | 2000-08-22 | 2006-08-10 | President And Fellows Of Harvard College | Nanoscale wires and related devices |
TWI292583B (en) * | 2000-08-22 | 2008-01-11 | Harvard College | Doped elongated semiconductor articles, growing such articles, devices including such articles and fabicating such devices |
US7301199B2 (en) * | 2000-08-22 | 2007-11-27 | President And Fellows Of Harvard College | Nanoscale wires and related devices |
DE60135775D1 (en) | 2000-12-11 | 2008-10-23 | Harvard College | DEVICE CONTAINING NANOSENSORS FOR THE DETECTION OF AN ANALYTE AND METHOD FOR THE PRODUCTION THEREOF |
US20020197474A1 (en) * | 2001-06-06 | 2002-12-26 | Reynolds Thomas A. | Functionalized fullerenes, their method of manufacture and uses thereof |
US6835591B2 (en) * | 2001-07-25 | 2004-12-28 | Nantero, Inc. | Methods of nanotube films and articles |
US7563711B1 (en) * | 2001-07-25 | 2009-07-21 | Nantero, Inc. | Method of forming a carbon nanotube-based contact to semiconductor |
US6919592B2 (en) | 2001-07-25 | 2005-07-19 | Nantero, Inc. | Electromechanical memory array using nanotube ribbons and method for making same |
US7566478B2 (en) * | 2001-07-25 | 2009-07-28 | Nantero, Inc. | Methods of making carbon nanotube films, layers, fabrics, ribbons, elements and articles |
US6706402B2 (en) * | 2001-07-25 | 2004-03-16 | Nantero, Inc. | Nanotube films and articles |
US7259410B2 (en) * | 2001-07-25 | 2007-08-21 | Nantero, Inc. | Devices having horizontally-disposed nanofabric articles and methods of making the same |
US7955559B2 (en) | 2005-11-15 | 2011-06-07 | Nanomix, Inc. | Nanoelectronic electrochemical test device |
US7312095B1 (en) * | 2002-03-15 | 2007-12-25 | Nanomix, Inc. | Modification of selectivity for sensing for nanostructure sensing device arrays |
US6872645B2 (en) * | 2002-04-02 | 2005-03-29 | Nanosys, Inc. | Methods of positioning and/or orienting nanostructures |
US8294025B2 (en) * | 2002-06-08 | 2012-10-23 | Solarity, Llc | Lateral collection photovoltaics |
WO2004010552A1 (en) | 2002-07-19 | 2004-01-29 | President And Fellows Of Harvard College | Nanoscale coherent optical components |
EP1388521B1 (en) * | 2002-08-08 | 2006-06-07 | Sony Deutschland GmbH | Method for preparing a nanowire crossbar structure |
TW200425530A (en) | 2002-09-05 | 2004-11-16 | Nanosys Inc | Nanostructure and nanocomposite based compositions and photovoltaic devices |
AU2003298998A1 (en) | 2002-09-05 | 2004-04-08 | Nanosys, Inc. | Oriented nanostructures and methods of preparing |
US7067867B2 (en) * | 2002-09-30 | 2006-06-27 | Nanosys, Inc. | Large-area nonenabled macroelectronic substrates and uses therefor |
KR101191632B1 (en) * | 2002-09-30 | 2012-10-17 | 나노시스, 인크. | Large-area nanoenabled macroelectronic substrates and uses therefor |
US7619562B2 (en) * | 2002-09-30 | 2009-11-17 | Nanosys, Inc. | Phased array systems |
US7135728B2 (en) * | 2002-09-30 | 2006-11-14 | Nanosys, Inc. | Large-area nanoenabled macroelectronic substrates and uses therefor |
CA2499944A1 (en) * | 2002-09-30 | 2004-04-15 | Nanosys, Inc. | Integrated displays using nanowire transistors |
US7051945B2 (en) * | 2002-09-30 | 2006-05-30 | Nanosys, Inc | Applications of nano-enabled large area macroelectronic substrates incorporating nanowires and nanowire composites |
WO2004034025A2 (en) | 2002-10-10 | 2004-04-22 | Nanosys, Inc. | Nano-chem-fet based biosensors |
US20060121080A1 (en) | 2002-11-13 | 2006-06-08 | Lye Whye K | Medical devices having nanoporous layers and methods for making the same |
US20050070989A1 (en) * | 2002-11-13 | 2005-03-31 | Whye-Kei Lye | Medical devices having porous layers and methods for making the same |
US9770349B2 (en) * | 2002-11-13 | 2017-09-26 | University Of Virginia Patent Foundation | Nanoporous stents with enhanced cellular adhesion and reduced neointimal formation |
CN1725988A (en) * | 2002-11-13 | 2006-01-25 | 斯特根有限公司 | Medical apparatus and manufacture method thereof with porous layer |
FR2847567B1 (en) * | 2002-11-22 | 2005-07-01 | Commissariat Energie Atomique | METHOD FOR PRODUCING A CVD OF NANO-STRUCTURES OF SEMI-CONDUCTOR MATERIAL ON DIELECTRIC, HOMOGENEOUS SIZES AND CONTROLLED |
US7355216B2 (en) * | 2002-12-09 | 2008-04-08 | The Regents Of The University Of California | Fluidic nanotubes and devices |
US7211143B2 (en) * | 2002-12-09 | 2007-05-01 | The Regents Of The University Of California | Sacrificial template method of fabricating a nanotube |
US7898005B2 (en) * | 2002-12-09 | 2011-03-01 | The Regents Of The University Of California | Inorganic nanotubes and electro-fluidic devices fabricated therefrom |
US6936496B2 (en) | 2002-12-20 | 2005-08-30 | Hewlett-Packard Development Company, L.P. | Nanowire filament |
KR20040059300A (en) * | 2002-12-28 | 2004-07-05 | 학교법인 포항공과대학교 | Nanostructure comprising magnetic material and nanomaterial and method for manufacturing thereof |
US7078276B1 (en) * | 2003-01-08 | 2006-07-18 | Kovio, Inc. | Nanoparticles and method for making the same |
US9422651B2 (en) | 2003-01-13 | 2016-08-23 | Nantero Inc. | Methods for arranging nanoscopic elements within networks, fabrics, and films |
US8937575B2 (en) | 2009-07-31 | 2015-01-20 | Nantero Inc. | Microstrip antenna elements and arrays comprising a shaped nanotube fabric layer and integrated two terminal nanotube select devices |
CA2512387A1 (en) * | 2003-01-13 | 2004-08-05 | Nantero, Inc. | Methods of using thin metal layers to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
US9574290B2 (en) | 2003-01-13 | 2017-02-21 | Nantero Inc. | Methods for arranging nanotube elements within nanotube fabrics and films |
US7560136B2 (en) * | 2003-01-13 | 2009-07-14 | Nantero, Inc. | Methods of using thin metal layers to make carbon nanotube films, layers, fabrics, ribbons, elements and articles |
US7858185B2 (en) * | 2003-09-08 | 2010-12-28 | Nantero, Inc. | High purity nanotube fabrics and films |
US7666382B2 (en) * | 2004-12-16 | 2010-02-23 | Nantero, Inc. | Aqueous carbon nanotube applicator liquids and methods for producing applicator liquids thereof |
US7656027B2 (en) * | 2003-01-24 | 2010-02-02 | Nanoconduction, Inc. | In-chip structures and methods for removing heat from integrated circuits |
US6906358B2 (en) * | 2003-01-30 | 2005-06-14 | Epir Technologies, Inc. | Nonequilibrium photodetector with superlattice exclusion layer |
US7083586B2 (en) * | 2003-02-03 | 2006-08-01 | Dj Orthopedics, Llc | Patellofemoral brace |
US7273095B2 (en) | 2003-03-11 | 2007-09-25 | United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Nanoengineered thermal materials based on carbon nanotube array composites |
US8920619B2 (en) | 2003-03-19 | 2014-12-30 | Hach Company | Carbon nanotube sensor |
US7027833B1 (en) * | 2003-04-03 | 2006-04-11 | The United States Of America As Represented By The Secretary Of The Navy | Dual band superheterodyne receiver |
EP1631812A4 (en) | 2003-05-14 | 2010-12-01 | Nantero Inc | Sensor platform using a horizontally oriented nanotube element |
US9234867B2 (en) | 2003-05-16 | 2016-01-12 | Nanomix, Inc. | Electrochemical nanosensors for biomolecule detection |
EP2062642A1 (en) * | 2003-05-29 | 2009-05-27 | Japan Science and Technology Agency | Catalyst for synthesizing carbon nanocoils, synthesising method of the same and synthesizing method of carbon nanocoils |
US20040252737A1 (en) * | 2003-06-16 | 2004-12-16 | Gyu Chul Yi | Zinc oxide based nanorod with quantum well or coaxial quantum structure |
FR2856702B1 (en) * | 2003-06-27 | 2005-09-09 | Centre Nat Rech Scient | PROCESS FOR SYNTHESIZING CRYSTALLINE MATERIAL AND MATERIAL OBTAINED THEREBY |
US7335259B2 (en) * | 2003-07-08 | 2008-02-26 | Brian A. Korgel | Growth of single crystal nanowires |
WO2005006346A2 (en) * | 2003-07-08 | 2005-01-20 | Qunano Ab | Probe structures incorporating nanowhiskers, production methods thereof, and methods of forming nanowhiskers |
US7091120B2 (en) * | 2003-08-04 | 2006-08-15 | Nanosys, Inc. | System and process for producing nanowire composites and electronic substrates therefrom |
US7109581B2 (en) * | 2003-08-25 | 2006-09-19 | Nanoconduction, Inc. | System and method using self-assembled nano structures in the design and fabrication of an integrated circuit micro-cooler |
US20070114658A1 (en) * | 2004-08-24 | 2007-05-24 | Carlos Dangelo | Integrated Circuit Micro-Cooler with Double-Sided Tubes of a CNT Array |
US7732918B2 (en) * | 2003-08-25 | 2010-06-08 | Nanoconduction, Inc. | Vapor chamber heat sink having a carbon nanotube fluid interface |
US7538422B2 (en) * | 2003-08-25 | 2009-05-26 | Nanoconduction Inc. | Integrated circuit micro-cooler having multi-layers of tubes of a CNT array |
US8048688B2 (en) * | 2006-10-24 | 2011-11-01 | Samsung Electronics Co., Ltd. | Method and apparatus for evaluation and improvement of mechanical and thermal properties of CNT/CNF arrays |
US7477527B2 (en) * | 2005-03-21 | 2009-01-13 | Nanoconduction, Inc. | Apparatus for attaching a cooling structure to an integrated circuit |
US20070126116A1 (en) * | 2004-08-24 | 2007-06-07 | Carlos Dangelo | Integrated Circuit Micro-Cooler Having Tubes of a CNT Array in Essentially the Same Height over a Surface |
US20060284218A1 (en) * | 2003-09-03 | 2006-12-21 | The Regents Of The University Of California | Nanoelectonic devices based on nanowire networks |
US7416993B2 (en) * | 2003-09-08 | 2008-08-26 | Nantero, Inc. | Patterned nanowire articles on a substrate and methods of making the same |
US7375369B2 (en) * | 2003-09-08 | 2008-05-20 | Nantero, Inc. | Spin-coatable liquid for formation of high purity nanotube films |
US7452735B2 (en) * | 2003-09-12 | 2008-11-18 | Applied Nanotech Holdings, Inc. | Carbon nanotube deposition with a stencil |
JP3928727B2 (en) * | 2003-09-17 | 2007-06-13 | セイコーエプソン株式会社 | Electrode formation method |
US7067328B2 (en) * | 2003-09-25 | 2006-06-27 | Nanosys, Inc. | Methods, devices and compositions for depositing and orienting nanostructures |
US7223611B2 (en) * | 2003-10-07 | 2007-05-29 | Hewlett-Packard Development Company, L.P. | Fabrication of nanowires |
US7132298B2 (en) * | 2003-10-07 | 2006-11-07 | Hewlett-Packard Development Company, L.P. | Fabrication of nano-object array |
WO2005053828A2 (en) * | 2003-11-07 | 2005-06-16 | Ahwahnee Technology, Inc. | Systems and methods for manufacture of carbon nanotubes |
KR101102642B1 (en) * | 2003-11-18 | 2012-01-04 | 가부시키가이샤 니콘 | Display device manufacturing method and display device |
TWI248106B (en) | 2003-11-19 | 2006-01-21 | Canon Kk | Method for aligning needle-like substances and alignment unit |
US7459839B2 (en) * | 2003-12-05 | 2008-12-02 | Zhidan Li Tolt | Low voltage electron source with self aligned gate apertures, and luminous display using the electron source |
WO2005062347A2 (en) * | 2003-12-16 | 2005-07-07 | President And Fellows Of Harvard College | Silica nanowires for optical waveguiding and method of their manufacture |
US7208094B2 (en) * | 2003-12-17 | 2007-04-24 | Hewlett-Packard Development Company, L.P. | Methods of bridging lateral nanowires and device using same |
US9040090B2 (en) * | 2003-12-19 | 2015-05-26 | The University Of North Carolina At Chapel Hill | Isolated and fixed micro and nano structures and methods thereof |
EP3242318A1 (en) * | 2003-12-19 | 2017-11-08 | The University of North Carolina at Chapel Hill | Monodisperse micro-structure or nano-structure product |
WO2005064337A1 (en) * | 2003-12-22 | 2005-07-14 | Koninklijke Philips Electronics N.V. | Optical nanowire biosensor based on energy transfer |
US8025960B2 (en) * | 2004-02-02 | 2011-09-27 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US7553371B2 (en) * | 2004-02-02 | 2009-06-30 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US20110039690A1 (en) * | 2004-02-02 | 2011-02-17 | Nanosys, Inc. | Porous substrates, articles, systems and compositions comprising nanofibers and methods of their use and production |
US20090227107A9 (en) * | 2004-02-13 | 2009-09-10 | President And Fellows Of Havard College | Nanostructures Containing Metal Semiconductor Compounds |
WO2005093831A1 (en) * | 2004-02-13 | 2005-10-06 | President And Fellows Of Harvard College | Nanostructures containing metal-semiconductor compounds |
US7381579B2 (en) * | 2004-02-26 | 2008-06-03 | Samsung Sdi Co., Ltd. | Donor sheet, method of manufacturing the same, method of manufacturing TFT using the donor sheet, and method of manufacturing flat panel display device using the donor sheet |
US7394118B2 (en) * | 2004-03-09 | 2008-07-01 | University Of Southern California | Chemical sensor using semiconducting metal oxide nanowires |
US7595528B2 (en) | 2004-03-10 | 2009-09-29 | Nanosys, Inc. | Nano-enabled memory devices and anisotropic charge carrying arrays |
EP1723676A4 (en) * | 2004-03-10 | 2009-04-15 | Nanosys Inc | Nano-enabled memory devices and anisotropic charge carrying arrays |
US20050202615A1 (en) * | 2004-03-10 | 2005-09-15 | Nanosys, Inc. | Nano-enabled memory devices and anisotropic charge carrying arrays |
EP1738378A4 (en) * | 2004-03-18 | 2010-05-05 | Nanosys Inc | Nanofiber surface based capacitors |
US7115971B2 (en) * | 2004-03-23 | 2006-10-03 | Nanosys, Inc. | Nanowire varactor diode and methods of making same |
US7407738B2 (en) * | 2004-04-02 | 2008-08-05 | Pavel Kornilovich | Fabrication and use of superlattice |
US20050218397A1 (en) * | 2004-04-06 | 2005-10-06 | Availableip.Com | NANO-electronics for programmable array IC |
US7330369B2 (en) * | 2004-04-06 | 2008-02-12 | Bao Tran | NANO-electronic memory array |
US7862624B2 (en) * | 2004-04-06 | 2011-01-04 | Bao Tran | Nano-particles on fabric or textile |
US7019391B2 (en) * | 2004-04-06 | 2006-03-28 | Bao Tran | NANO IC packaging |
US20050218398A1 (en) * | 2004-04-06 | 2005-10-06 | Availableip.Com | NANO-electronics |
US7250319B2 (en) * | 2004-04-16 | 2007-07-31 | Applied Materials, Inc. | Method of fabricating quantum features |
US7820445B2 (en) * | 2004-04-22 | 2010-10-26 | Velocys | Fluidization and solids processing in microchannel devices |
CN102004393B (en) * | 2004-04-27 | 2013-05-01 | 伊利诺伊大学评议会 | Composite patterning devices for soft lithography |
KR20050104034A (en) * | 2004-04-27 | 2005-11-02 | 삼성에스디아이 주식회사 | Manufacturing method of nano wire |
US20080055581A1 (en) * | 2004-04-27 | 2008-03-06 | Rogers John A | Devices and methods for pattern generation by ink lithography |
US20050279274A1 (en) * | 2004-04-30 | 2005-12-22 | Chunming Niu | Systems and methods for nanowire growth and manufacturing |
US20050241959A1 (en) * | 2004-04-30 | 2005-11-03 | Kenneth Ward | Chemical-sensing devices |
US7785922B2 (en) | 2004-04-30 | 2010-08-31 | Nanosys, Inc. | Methods for oriented growth of nanowires on patterned substrates |
US7727820B2 (en) * | 2004-04-30 | 2010-06-01 | Hewlett-Packard Development Company, L.P. | Misalignment-tolerant methods for fabricating multiplexing/demultiplexing architectures |
US7683435B2 (en) * | 2004-04-30 | 2010-03-23 | Hewlett-Packard Development Company, L.P. | Misalignment-tolerant multiplexing/demultiplexing architectures |
CN101010780B (en) * | 2004-04-30 | 2012-07-25 | 纳米系统公司 | Systems and methods for nanowire growth and harvesting |
US7247531B2 (en) | 2004-04-30 | 2007-07-24 | Hewlett-Packard Development Company, L.P. | Field-effect-transistor multiplexing/demultiplexing architectures and methods of forming the same |
CA2568140A1 (en) * | 2004-05-24 | 2006-07-20 | Trustees Of Boston University | Controllable nanomechanical memory element |
US8075863B2 (en) | 2004-05-26 | 2011-12-13 | Massachusetts Institute Of Technology | Methods and devices for growth and/or assembly of nanostructures |
JP3682057B1 (en) * | 2004-05-31 | 2005-08-10 | 雅勤 安次富 | Nanotube position control method, nanotube position control flow path pattern, and electronic device using nanotube |
KR101260981B1 (en) | 2004-06-04 | 2013-05-10 | 더 보오드 오브 트러스티스 오브 더 유니버시티 오브 일리노이즈 | Methods and devices for fabricating and assembling printable semiconductor elements |
US7799699B2 (en) | 2004-06-04 | 2010-09-21 | The Board Of Trustees Of The University Of Illinois | Printable semiconductor structures and related methods of making and assembling |
US7521292B2 (en) | 2004-06-04 | 2009-04-21 | The Board Of Trustees Of The University Of Illinois | Stretchable form of single crystal silicon for high performance electronics on rubber substrates |
US7943491B2 (en) | 2004-06-04 | 2011-05-17 | The Board Of Trustees Of The University Of Illinois | Pattern transfer printing by kinetic control of adhesion to an elastomeric stamp |
US8217381B2 (en) | 2004-06-04 | 2012-07-10 | The Board Of Trustees Of The University Of Illinois | Controlled buckling structures in semiconductor interconnects and nanomembranes for stretchable electronics |
US8088483B1 (en) | 2004-06-08 | 2012-01-03 | Nanosys, Inc. | Process for group 10 metal nanostructure synthesis and compositions made using same |
TWI406890B (en) * | 2004-06-08 | 2013-09-01 | Sandisk Corp | Post-deposition encapsulation of nanostructures : compositions, devices and systems incorporating same |
US7776758B2 (en) | 2004-06-08 | 2010-08-17 | Nanosys, Inc. | Methods and devices for forming nanostructure monolayers and devices including such monolayers |
US7968273B2 (en) * | 2004-06-08 | 2011-06-28 | Nanosys, Inc. | Methods and devices for forming nanostructure monolayers and devices including such monolayers |
US8563133B2 (en) * | 2004-06-08 | 2013-10-22 | Sandisk Corporation | Compositions and methods for modulation of nanostructure energy levels |
CA2567930A1 (en) | 2004-06-08 | 2005-12-22 | Nanosys, Inc. | Methods and devices for forming nanostructure monolayers and devices including such monolayers |
US7709880B2 (en) * | 2004-06-09 | 2010-05-04 | Nantero, Inc. | Field effect devices having a gate controlled via a nanotube switching element |
US20050274772A1 (en) * | 2004-06-14 | 2005-12-15 | Nelson Curtis L | Treating an area to increase affinity for a fluid |
US20050276933A1 (en) * | 2004-06-14 | 2005-12-15 | Ravi Prasad | Method to form a conductive structure |
US20050276911A1 (en) * | 2004-06-15 | 2005-12-15 | Qiong Chen | Printing of organometallic compounds to form conductive traces |
WO2006107312A1 (en) * | 2004-06-15 | 2006-10-12 | President And Fellows Of Harvard College | Nanosensors |
US7446335B2 (en) * | 2004-06-18 | 2008-11-04 | Regents Of The University Of Minnesota | Process and apparatus for forming nanoparticles using radiofrequency plasmas |
EP1779417A2 (en) * | 2004-06-21 | 2007-05-02 | 3M Innovative Properties Company | Patterning and aligning semiconducting nanoparticles |
DE102004031579B4 (en) * | 2004-06-29 | 2012-12-27 | Forschungsverbund Berlin E.V. | Peptides for inhibiting the interaction of protein kinase A and protein kinase A anchor proteins, nucleic acid molecule comprising the vector, host cell, recognition molecule directed against them, pharmaceutical composition containing them, kit containing them and their use |
WO2006078281A2 (en) * | 2004-07-07 | 2006-07-27 | Nanosys, Inc. | Systems and methods for harvesting and integrating nanowires |
US20060014271A1 (en) * | 2004-07-16 | 2006-01-19 | Yujun Song | Fabrication of a completely polymeric microfluidic reactor for chemical synthesis |
WO2007013872A2 (en) | 2004-07-22 | 2007-02-01 | The Board Of Trustees Of The University Of Illinois | Sensors employing single-walled carbon nanotubes |
US20060024814A1 (en) * | 2004-07-29 | 2006-02-02 | Peters Kevin F | Aptamer-functionalized electrochemical sensors and methods of fabricating and using the same |
US7405002B2 (en) * | 2004-08-04 | 2008-07-29 | Agency For Science, Technology And Research | Coated water-soluble nanoparticles comprising semiconductor core and silica coating |
US7943418B2 (en) * | 2004-09-16 | 2011-05-17 | Etamota Corporation | Removing undesirable nanotubes during nanotube device fabrication |
US8089152B2 (en) * | 2004-09-16 | 2012-01-03 | Nanosys, Inc. | Continuously variable graded artificial dielectrics using nanostructures |
US7365395B2 (en) * | 2004-09-16 | 2008-04-29 | Nanosys, Inc. | Artificial dielectrics using nanostructures |
US8471238B2 (en) * | 2004-09-16 | 2013-06-25 | Nantero Inc. | Light emitters using nanotubes and methods of making same |
US8558311B2 (en) | 2004-09-16 | 2013-10-15 | Nanosys, Inc. | Dielectrics using substantially longitudinally oriented insulated conductive wires |
US7365632B2 (en) * | 2004-09-21 | 2008-04-29 | Nantero, Inc. | Resistive elements using carbon nanotubes |
US20060240227A1 (en) * | 2004-09-23 | 2006-10-26 | Zhijun Zhang | Nanocrystal coated surfaces |
US7534489B2 (en) * | 2004-09-24 | 2009-05-19 | Agency For Science, Technology And Research | Coated composites of magnetic material and quantum dots |
JP2008515654A (en) * | 2004-10-12 | 2008-05-15 | ナノシス・インク. | Fully integrated organic layer process for manufacturing plastic electronic components based on conducting polymers and semiconductor nanowires |
US7473943B2 (en) * | 2004-10-15 | 2009-01-06 | Nanosys, Inc. | Gate configuration for nanowire electronic devices |
US7141807B2 (en) * | 2004-10-22 | 2006-11-28 | Agilent Technologies, Inc. | Nanowire capillaries for mass spectrometry |
US7931941B1 (en) | 2004-10-29 | 2011-04-26 | Pchem Associates, Inc. | Synthesis of metallic nanoparticle dispersions capable of sintering at low temperatures |
US20100147657A1 (en) * | 2004-11-02 | 2010-06-17 | Nantero, Inc. | Nanotube esd protective devices and corresponding nonvolatile and volatile nanotube switches |
CA2586120A1 (en) * | 2004-11-02 | 2006-12-28 | Nantero, Inc. | Nanotube esd protective devices and corresponding nonvolatile and volatile nanotube switches |
US20060112983A1 (en) * | 2004-11-17 | 2006-06-01 | Nanosys, Inc. | Photoactive devices and components with enhanced efficiency |
US7569503B2 (en) | 2004-11-24 | 2009-08-04 | Nanosys, Inc. | Contact doping and annealing systems and processes for nanowire thin films |
US20060110618A1 (en) * | 2004-11-24 | 2006-05-25 | General Electric Company | Electrodes for photovoltaic cells and methods for manufacture thereof |
US8629770B2 (en) * | 2004-11-29 | 2014-01-14 | Gregory J. Hummer | Sensor for container monitoring system |
US7560366B1 (en) | 2004-12-02 | 2009-07-14 | Nanosys, Inc. | Nanowire horizontal growth and substrate removal |
US8154002B2 (en) * | 2004-12-06 | 2012-04-10 | President And Fellows Of Harvard College | Nanoscale wire-based data storage |
US8278011B2 (en) | 2004-12-09 | 2012-10-02 | Nanosys, Inc. | Nanostructured catalyst supports |
CA2588548A1 (en) | 2004-12-09 | 2006-06-15 | Nanosys, Inc. | Nanowire-based membrane electrode assemblies for fuel cells |
US7939218B2 (en) * | 2004-12-09 | 2011-05-10 | Nanosys, Inc. | Nanowire structures comprising carbon |
US7842432B2 (en) * | 2004-12-09 | 2010-11-30 | Nanosys, Inc. | Nanowire structures comprising carbon |
JP5132934B2 (en) * | 2004-12-28 | 2013-01-30 | パナソニック株式会社 | Semiconductor nanowire and semiconductor device including the nanowire |
WO2006084276A2 (en) * | 2005-02-04 | 2006-08-10 | The Regents Of The University Of California | Enzyme catalyzed metallic nanoparticle synthesis |
CN1976869B (en) * | 2005-02-10 | 2010-12-22 | 松下电器产业株式会社 | Structure for holding fine structure, semiconductor device, TFT driving circuit, panel, display, sensor and their manufacturing methods |
KR100661696B1 (en) * | 2005-02-22 | 2006-12-26 | 삼성전자주식회사 | Semiconductor Nanowire of Heterostructure and Method for Producing the same |
US7671398B2 (en) * | 2005-02-23 | 2010-03-02 | Tran Bao Q | Nano memory, light, energy, antenna and strand-based systems and methods |
US7211503B2 (en) * | 2005-02-24 | 2007-05-01 | Hewlett-Packard Development Company, L.P. | Electronic devices fabricated by use of random connections |
EP1696473A3 (en) * | 2005-02-25 | 2009-06-10 | Samsung Electronics Co.,Ltd. | Silicon nano wires, semiconductor device including the same, and method of manufacturing the silicon nano wires |
US7375012B2 (en) * | 2005-02-28 | 2008-05-20 | Pavel Kornilovich | Method of forming multilayer film |
CN1830753A (en) * | 2005-03-10 | 2006-09-13 | 清华大学 | Assembling method of carbon nanometer pipe and carbon nanometer pipe device |
US7625780B2 (en) * | 2005-03-15 | 2009-12-01 | Regents Of The University Of Minnesota | Fluidic heterogeneous microsystems assembly and packaging |
US20060212977A1 (en) * | 2005-03-16 | 2006-09-21 | Charles Otis | Characterizing electron beams |
KR101100887B1 (en) * | 2005-03-17 | 2012-01-02 | 삼성전자주식회사 | Thin film transistor, thin film transistor array panel, and manufacturing method thereof |
JP4965835B2 (en) * | 2005-03-25 | 2012-07-04 | キヤノン株式会社 | Structure, manufacturing method thereof, and device using the structure |
CN1840465B (en) * | 2005-03-30 | 2010-09-29 | 清华大学 | Method for manufacturing unidimensional nano material device |
CN100572260C (en) * | 2005-03-31 | 2009-12-23 | 清华大学 | The manufacture method of unidimensional nano material device |
US7670882B2 (en) | 2005-04-05 | 2010-03-02 | Hewlett-Packard Development Company, L.P. | Electronic device fabrication |
US20060276056A1 (en) * | 2005-04-05 | 2006-12-07 | Nantero, Inc. | Nanotube articles with adjustable electrical conductivity and methods of making the same |
US9287356B2 (en) | 2005-05-09 | 2016-03-15 | Nantero Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US8941094B2 (en) | 2010-09-02 | 2015-01-27 | Nantero Inc. | Methods for adjusting the conductivity range of a nanotube fabric layer |
CA2517299A1 (en) * | 2005-08-26 | 2007-02-26 | Chromedx Inc. | Hollow needle assembly |
US8206650B2 (en) * | 2005-04-12 | 2012-06-26 | Chromedx Inc. | Joint-diagnostic spectroscopic and biosensor meter |
CA2507323A1 (en) * | 2005-05-13 | 2006-11-13 | Chromedx Inc. | Diagnostic whole blood and plasma apparatus |
US20100245803A1 (en) * | 2005-04-12 | 2010-09-30 | Chromedx Inc. | Blood sample holder for spectroscopic analysis |
US7740804B2 (en) * | 2005-04-12 | 2010-06-22 | Chromedx Inc. | Spectroscopic sample holder |
US7745498B2 (en) * | 2005-04-13 | 2010-06-29 | Nanosys, Inc. | Nanowire dispersion compositions and uses thereof |
US7687876B2 (en) * | 2005-04-25 | 2010-03-30 | Smoltek Ab | Controlled growth of a nanostructure on a substrate |
US7352029B2 (en) * | 2005-04-27 | 2008-04-01 | International Business Machines Corporation | Electronically scannable multiplexing device |
US7491423B1 (en) | 2005-05-02 | 2009-02-17 | Sandia Corporation | Directed spatial organization of zinc oxide nanostructures |
US7749922B2 (en) * | 2005-05-05 | 2010-07-06 | The Board Of Trustees Of The University Of Illinois | Nanowire structures and electrical devices |
US9911743B2 (en) | 2005-05-09 | 2018-03-06 | Nantero, Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US7479654B2 (en) * | 2005-05-09 | 2009-01-20 | Nantero, Inc. | Memory arrays using nanotube articles with reprogrammable resistance |
US8217490B2 (en) * | 2005-05-09 | 2012-07-10 | Nantero Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US8513768B2 (en) * | 2005-05-09 | 2013-08-20 | Nantero Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US8013363B2 (en) * | 2005-05-09 | 2011-09-06 | Nantero, Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US7835170B2 (en) | 2005-05-09 | 2010-11-16 | Nantero, Inc. | Memory elements and cross point switches and arrays of same using nonvolatile nanotube blocks |
US7782650B2 (en) * | 2005-05-09 | 2010-08-24 | Nantero, Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US9196615B2 (en) * | 2005-05-09 | 2015-11-24 | Nantero Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US8183665B2 (en) * | 2005-11-15 | 2012-05-22 | Nantero Inc. | Nonvolatile nanotube diodes and nonvolatile nanotube blocks and systems using same and methods of making same |
US7598127B2 (en) | 2005-05-12 | 2009-10-06 | Nantero, Inc. | Nanotube fuse structure |
TWI264271B (en) * | 2005-05-13 | 2006-10-11 | Delta Electronics Inc | Heat sink |
FR2885913B1 (en) * | 2005-05-18 | 2007-08-10 | Centre Nat Rech Scient | COMPOSITE ELEMENT COMPRISING A CONDUCTIVE SUBSTRATE AND A NANOSTRUCTURED METAL COATING. |
US20100227382A1 (en) * | 2005-05-25 | 2010-09-09 | President And Fellows Of Harvard College | Nanoscale sensors |
EP1941554A2 (en) * | 2005-06-02 | 2008-07-09 | Nanosys, Inc. | Light emitting nanowires for macroelectronics |
US8545790B2 (en) * | 2005-06-04 | 2013-10-01 | Gregory Konesky | Cross-linked carbon nanotubes |
WO2006132659A2 (en) * | 2005-06-06 | 2006-12-14 | President And Fellows Of Harvard College | Nanowire heterostructures |
US7517558B2 (en) * | 2005-06-06 | 2009-04-14 | Micron Technology, Inc. | Methods for positioning carbon nanotubes |
US7915122B2 (en) | 2005-06-08 | 2011-03-29 | Nantero, Inc. | Self-aligned cell integration scheme |
BRPI0611821A2 (en) * | 2005-06-10 | 2011-12-20 | Gilupi Gmbh | diagnostic nanosensor, method to produce it, use of it, detection method |
CN101292365B (en) * | 2005-06-17 | 2012-04-04 | 依路米尼克斯公司 | Photovoltaic wire of nano structure and manufacturing method thereof |
US20090050204A1 (en) * | 2007-08-03 | 2009-02-26 | Illuminex Corporation. | Photovoltaic device using nanostructured material |
US20100193768A1 (en) * | 2005-06-20 | 2010-08-05 | Illuminex Corporation | Semiconducting nanowire arrays for photovoltaic applications |
US20070001581A1 (en) * | 2005-06-29 | 2007-01-04 | Stasiak James W | Nanostructure based light emitting devices and associated methods |
US7276424B2 (en) * | 2005-06-29 | 2007-10-02 | Hewlett-Packard Development Company, L.P. | Fabrication of aligned nanowire lattices |
US7538040B2 (en) * | 2005-06-30 | 2009-05-26 | Nantero, Inc. | Techniques for precision pattern transfer of carbon nanotubes from photo mask to wafers |
AU2006272626B2 (en) * | 2005-07-26 | 2010-12-09 | Oregon Health & Science University | Nanoparticle probes for capture, sorting and placement of targets |
SG183720A1 (en) * | 2005-08-12 | 2012-09-27 | Cambrios Technologies Corp | Nanowires-based transparent conductors |
JP2009507397A (en) * | 2005-08-22 | 2009-02-19 | キュー・ワン・ナノシステムズ・インコーポレイテッド | Nanostructure and photovoltaic cell implementing it |
US7777291B2 (en) * | 2005-08-26 | 2010-08-17 | Smoltek Ab | Integrated circuits having interconnects and heat dissipators based on nanostructures |
US7883927B2 (en) * | 2005-08-31 | 2011-02-08 | Micron Technology, Inc. | Method and apparatus to sort nanotubes |
US20070238319A1 (en) * | 2005-08-31 | 2007-10-11 | Jewell-Larsen Nels E | Mechanically actuated nanotube switches |
AU2006347609A1 (en) * | 2005-09-06 | 2008-05-08 | Nantero, Inc. | Carbon nanotubes for the selective transfer of heat from electronics |
US8525143B2 (en) * | 2005-09-06 | 2013-09-03 | Nantero Inc. | Method and system of using nanotube fabrics as joule heating elements for memories and other applications |
EP1929276B1 (en) * | 2005-09-06 | 2011-07-27 | Nantero, Inc. | Nanotube sensor system and method of use |
JP2009513368A (en) * | 2005-09-23 | 2009-04-02 | ナノシス・インコーポレイテッド | Method for doping nanostructures |
CN101310373B (en) * | 2005-09-29 | 2012-01-25 | 松下电器产业株式会社 | Method of mounting electronic circuit constituting member |
US8957259B2 (en) * | 2005-09-30 | 2015-02-17 | Battelle Memorial Institute | Dimethyl ether production from methanol and/or syngas |
US20070086916A1 (en) * | 2005-10-14 | 2007-04-19 | General Electric Company | Faceted structure, article, sensor device, and method |
US8425858B2 (en) * | 2005-10-14 | 2013-04-23 | Morpho Detection, Inc. | Detection apparatus and associated method |
US7608478B2 (en) * | 2005-10-28 | 2009-10-27 | The Curators Of The University Of Missouri | On-chip igniter and method of manufacture |
US7927437B2 (en) * | 2005-10-28 | 2011-04-19 | The Curators Of The University Of Missouri | Ordered nanoenergetic composites and synthesis method |
KR101390619B1 (en) | 2005-11-21 | 2014-04-30 | 나노시스, 인크. | Nanowire structures comprising carbon |
US7439560B2 (en) * | 2005-12-06 | 2008-10-21 | Canon Kabushiki Kaisha | Semiconductor device using semiconductor nanowire and display apparatus and image pick-up apparatus using the same |
JP2007158119A (en) * | 2005-12-06 | 2007-06-21 | Canon Inc | Electric element having nano wire and its manufacturing method, and electric element assembly |
US7402531B1 (en) | 2005-12-09 | 2008-07-22 | Hewlett-Packard Development Company, L.P. | Method for selectively controlling lengths of nanowires |
KR20080078879A (en) * | 2005-12-19 | 2008-08-28 | 어드밴스드 테크놀러지 머티리얼즈, 인코포레이티드 | Production of carbon nanotubes |
US20070144305A1 (en) * | 2005-12-20 | 2007-06-28 | Jablonski Gregory A | Synthesis of Metallic Nanoparticle Dispersions |
KR20070067308A (en) * | 2005-12-23 | 2007-06-28 | 삼성전자주식회사 | Organic light emitting diode and method for manufacturing thereof and organic light emitting diode display provided with the same |
JP2009522197A (en) * | 2005-12-29 | 2009-06-11 | ナノシス・インコーポレイテッド | Method for oriented growth of nanowires on patterned substrates |
US7741197B1 (en) | 2005-12-29 | 2010-06-22 | Nanosys, Inc. | Systems and methods for harvesting and reducing contamination in nanowires |
US8318520B2 (en) * | 2005-12-30 | 2012-11-27 | Lin Ming-Nung | Method of microminiaturizing a nano-structure |
US8048192B2 (en) * | 2005-12-30 | 2011-11-01 | General Electric Company | Method of manufacturing nanoparticles |
US20070155025A1 (en) * | 2006-01-04 | 2007-07-05 | Anping Zhang | Nanowire structures and devices for use in large-area electronics and methods of making the same |
US7611906B2 (en) * | 2006-01-23 | 2009-11-03 | Applied Nanotech Holdings, Inc. | Functionalized carbon nanotubes |
US20090278556A1 (en) * | 2006-01-26 | 2009-11-12 | Nanoselect, Inc. | Carbon Nanostructure Electrode Based Sensors: Devices, Processes and Uses Thereof |
US8907384B2 (en) | 2006-01-26 | 2014-12-09 | Nanoselect, Inc. | CNT-based sensors: devices, processes and uses thereof |
JP2009530214A (en) * | 2006-01-30 | 2009-08-27 | 本田技研工業株式会社 | Catalyst for the growth of carbon single-walled nanotubes |
US7501985B2 (en) * | 2006-01-31 | 2009-03-10 | Motorola, Inc. | Nanostructured tunable antennas for communication devices |
US20070186629A1 (en) * | 2006-02-10 | 2007-08-16 | Ying-Lan Chang | Functionalizable nanowire-based AFM probe |
WO2008054839A2 (en) * | 2006-03-03 | 2008-05-08 | William Marsh Rice University | Carbon nanotube diameter selection by pretreatment of metal catalysts on surfaces |
JP2009528254A (en) | 2006-03-03 | 2009-08-06 | ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ | Spatally arranged nanotubes and method of making nanotube arrays |
WO2007105405A1 (en) * | 2006-03-10 | 2007-09-20 | Matsushita Electric Industrial Co., Ltd. | Method and device for mounting anisotropically-shaped member, method of manufacturing electronic device, electronic device, and display |
US7774929B2 (en) * | 2006-03-14 | 2010-08-17 | Regents Of The University Of Minnesota | Method of self-assembly on a surface |
US8404313B1 (en) * | 2006-03-22 | 2013-03-26 | University Of South Florida | Synthesis of nanocrystalline diamond fibers |
US7498215B2 (en) * | 2006-04-03 | 2009-03-03 | Canon Kabushiki Kaisha | Method of producing product including silicon wires |
WO2007117698A2 (en) | 2006-04-07 | 2007-10-18 | Qd Vision, Inc. | Composition including material, methods of depositing material, articles including same and systems for depositing material |
US7601294B2 (en) * | 2006-05-02 | 2009-10-13 | Babcock & Wilcox Technical Services Y-12, Llc | High volume production of nanostructured materials |
US20070256937A1 (en) * | 2006-05-04 | 2007-11-08 | International Business Machines Corporation | Apparatus and method for electrochemical processing of thin films on resistive substrates |
US20070258192A1 (en) * | 2006-05-05 | 2007-11-08 | Joel Schindall | Engineered structure for charge storage and method of making |
US7544546B2 (en) * | 2006-05-15 | 2009-06-09 | International Business Machines Corporation | Formation of carbon and semiconductor nanomaterials using molecular assemblies |
US20070275498A1 (en) * | 2006-05-26 | 2007-11-29 | Paul Beecher | Enhancing performance in ink-jet printed organic semiconductors |
US7393699B2 (en) | 2006-06-12 | 2008-07-01 | Tran Bao Q | NANO-electronics |
JP2009540333A (en) | 2006-06-12 | 2009-11-19 | プレジデント アンド フェロウズ オブ ハーバード カレッジ | Nanosensors and related technologies |
US20080181958A1 (en) * | 2006-06-19 | 2008-07-31 | Rothrock Ginger D | Nanoparticle fabrication methods, systems, and materials |
US8106382B2 (en) * | 2006-06-21 | 2012-01-31 | Panasonic Corporation | Field effect transistor |
WO2008111947A1 (en) | 2006-06-24 | 2008-09-18 | Qd Vision, Inc. | Methods and articles including nanomaterial |
WO2008105792A2 (en) | 2006-06-24 | 2008-09-04 | Qd Vision, Inc. | Methods for depositing nanomaterial, methods for fabricating a device, methods for fabricating an array of devices and compositions |
KR100785347B1 (en) | 2006-07-27 | 2007-12-18 | 한국과학기술연구원 | Alignment of semiconducting nanowires on metal electrodes |
WO2008013508A1 (en) * | 2006-07-28 | 2008-01-31 | Nanyang Technological University | Method of aligning nanotubes |
US8084101B2 (en) * | 2006-08-01 | 2011-12-27 | The Board of Regents of the Nevada Systems of Higher Education on behalf of the University of Nevada, Las Vegas | Fabrication of patterned and ordered nanoparticles |
US20120132534A1 (en) * | 2006-08-01 | 2012-05-31 | The Board Of Regents Of The Nev. Sys. Of Higher Ed On Behalf Of The Unlv | Growth of nanotubes from patterned and ordered nanoparticles |
US20100002324A1 (en) * | 2006-08-31 | 2010-01-07 | Cambridge Enterprise Limited | Optical Nanomaterial Compositions |
US8323789B2 (en) | 2006-08-31 | 2012-12-04 | Cambridge Enterprise Limited | Nanomaterial polymer compositions and uses thereof |
US8409475B2 (en) * | 2006-09-11 | 2013-04-02 | Evident Technologies, Inc. | Method of making semiconductor nanocrystal composites |
WO2008033303A2 (en) | 2006-09-11 | 2008-03-20 | President And Fellows Of Harvard College | Branched nanoscale wires |
WO2008033388A2 (en) * | 2006-09-12 | 2008-03-20 | Qd Vision, Inc. | A composite including nanoparticles, methods, and products including a composite |
US7686886B2 (en) * | 2006-09-26 | 2010-03-30 | International Business Machines Corporation | Controlled shape semiconductor layer by selective epitaxy under seed structure |
US7442575B2 (en) * | 2006-09-29 | 2008-10-28 | Texas Christian University | Method of manufacturing semiconductor nanowires |
US20080081326A1 (en) * | 2006-10-03 | 2008-04-03 | Jun Amano | Methods and devices for diagnostic testing |
JP5409369B2 (en) * | 2006-10-12 | 2014-02-05 | カンブリオス テクノロジーズ コーポレイション | Nanowire-based transparent conductor and its application |
US8018568B2 (en) * | 2006-10-12 | 2011-09-13 | Cambrios Technologies Corporation | Nanowire-based transparent conductors and applications thereof |
WO2008147431A2 (en) * | 2006-10-12 | 2008-12-04 | Cambrios Technologies Corporation | Functional films formed by highly oriented deposition of nanowires |
US8120448B2 (en) * | 2006-10-19 | 2012-02-21 | The Regents Of The University Of California | High frequency nanotube oscillator |
US7582975B1 (en) | 2006-10-19 | 2009-09-01 | Hewlett-Packard Development Company, L.P. | Nanowire device and method of making the same |
US20080093693A1 (en) * | 2006-10-20 | 2008-04-24 | Kamins Theodore I | Nanowire sensor with variant selectively interactive segments |
CN101573778B (en) | 2006-11-07 | 2013-01-02 | 奈米系统股份有限公司 | Systems and methods for nanowire growth |
WO2008060455A2 (en) | 2006-11-09 | 2008-05-22 | Nanosys, Inc. | Methods for nanowire alignment and deposition |
JP4204641B2 (en) * | 2006-11-10 | 2009-01-07 | パナソニック株式会社 | Particle placement apparatus and particle placement method |
WO2008127314A1 (en) | 2006-11-22 | 2008-10-23 | President And Fellows Of Harvard College | High-sensitivity nanoscale wire sensors |
US7786024B2 (en) * | 2006-11-29 | 2010-08-31 | Nanosys, Inc. | Selective processing of semiconductor nanowires by polarized visible radiation |
US8258047B2 (en) * | 2006-12-04 | 2012-09-04 | General Electric Company | Nanostructures, methods of depositing nanostructures and devices incorporating the same |
US20080136861A1 (en) * | 2006-12-11 | 2008-06-12 | 3M Innovative Properties Company | Method and apparatus for printing conductive inks |
US8293040B2 (en) * | 2006-12-11 | 2012-10-23 | The Curators Of The University Of Missouri | Homogeneous mesoporous nanoenergetic metal oxide composites and fabrication thereof |
US20080152899A1 (en) * | 2006-12-11 | 2008-06-26 | The Curators Of The University Of Missouri | Reducing electrostatic discharge ignition sensitivity of MIC materials |
US20080135956A1 (en) * | 2006-12-12 | 2008-06-12 | General Electric Company | Articles and assembly for magnetically directed self assembly and methods of manufacture |
US8686490B2 (en) * | 2006-12-20 | 2014-04-01 | Sandisk Corporation | Electron blocking layers for electronic devices |
US20080150003A1 (en) * | 2006-12-20 | 2008-06-26 | Jian Chen | Electron blocking layers for electronic devices |
US20080150004A1 (en) * | 2006-12-20 | 2008-06-26 | Nanosys, Inc. | Electron Blocking Layers for Electronic Devices |
US20080150009A1 (en) * | 2006-12-20 | 2008-06-26 | Nanosys, Inc. | Electron Blocking Layers for Electronic Devices |
US7847341B2 (en) | 2006-12-20 | 2010-12-07 | Nanosys, Inc. | Electron blocking layers for electronic devices |
US7838865B2 (en) | 2006-12-22 | 2010-11-23 | Palo Alto Research Center Incorporated | Method for aligning elongated nanostructures |
US7838933B2 (en) * | 2006-12-22 | 2010-11-23 | Palo Alto Res Ct Inc | Printing method for high performance electronic devices |
US7659200B2 (en) * | 2007-01-05 | 2010-02-09 | International Business Machines Corporation | Self-constrained anisotropic germanium nanostructure from electroplating |
US7972875B2 (en) | 2007-01-17 | 2011-07-05 | The Board Of Trustees Of The University Of Illinois | Optical systems fabricated by printing-based assembly |
US8394483B2 (en) * | 2007-01-24 | 2013-03-12 | Micron Technology, Inc. | Two-dimensional arrays of holes with sub-lithographic diameters formed by block copolymer self-assembly |
GB0701444D0 (en) * | 2007-01-25 | 2007-03-07 | Iti Scotland Ltd | Detecting analytes |
US7851784B2 (en) * | 2007-02-13 | 2010-12-14 | Nano-Electronic And Photonic Devices And Circuits, Llc | Nanotube array electronic devices |
US20080238882A1 (en) * | 2007-02-21 | 2008-10-02 | Ramesh Sivarajan | Symmetric touch screen system with carbon nanotube-based transparent conductive electrode pairs |
JP2010520626A (en) | 2007-03-01 | 2010-06-10 | ピーケム アソシエイツ、インク. | Shielding with metallic nanoparticle compositions and related apparatus and methods |
US8083953B2 (en) * | 2007-03-06 | 2011-12-27 | Micron Technology, Inc. | Registered structure formation via the application of directed thermal energy to diblock copolymer films |
US7680553B2 (en) * | 2007-03-08 | 2010-03-16 | Smp Logic Systems Llc | Methods of interfacing nanomaterials for the monitoring and execution of pharmaceutical manufacturing processes |
WO2008112764A1 (en) | 2007-03-12 | 2008-09-18 | Nantero, Inc. | Electromagnetic and thermal sensors using carbon nanotubes and methods of making same |
EP1973179B1 (en) * | 2007-03-19 | 2010-08-25 | Hitachi, Ltd. | Guiding nanowire growth |
US8557128B2 (en) | 2007-03-22 | 2013-10-15 | Micron Technology, Inc. | Sub-10 nm line features via rapid graphoepitaxial self-assembly of amphiphilic monolayers |
WO2008118861A2 (en) * | 2007-03-23 | 2008-10-02 | The University Of North Carolina At Chapel Hill | Discrete size and shape specific organic nanoparticles designed to elicit an immune response |
US8097175B2 (en) * | 2008-10-28 | 2012-01-17 | Micron Technology, Inc. | Method for selectively permeating a self-assembled block copolymer, method for forming metal oxide structures, method for forming a metal oxide pattern, and method for patterning a semiconductor structure |
US7959975B2 (en) | 2007-04-18 | 2011-06-14 | Micron Technology, Inc. | Methods of patterning a substrate |
US8294139B2 (en) | 2007-06-21 | 2012-10-23 | Micron Technology, Inc. | Multilayer antireflection coatings, structures and devices including the same and methods of making the same |
US20090321364A1 (en) | 2007-04-20 | 2009-12-31 | Cambrios Technologies Corporation | Systems and methods for filtering nanowires |
US8372295B2 (en) | 2007-04-20 | 2013-02-12 | Micron Technology, Inc. | Extensions of self-assembled structures to increased dimensions via a “bootstrap” self-templating method |
GB0708381D0 (en) * | 2007-04-30 | 2007-06-06 | Nokia Corp | Method for forming a semiconductor structure |
US8268720B2 (en) * | 2007-04-30 | 2012-09-18 | Hewlett-Packard Development Company, L.P. | Method of positioning catalyst nanoparticle and nanowire-based device employing same |
US7892610B2 (en) * | 2007-05-07 | 2011-02-22 | Nanosys, Inc. | Method and system for printing aligned nanowires and other electrical devices |
EP3543357A1 (en) * | 2007-05-08 | 2019-09-25 | Trustees of Boston University | Chemical functionalization of solid-state nanopores and nanopore arrays and applications thereof |
GB0709165D0 (en) | 2007-05-11 | 2007-06-20 | Nexeon Ltd | A silicon anode for a rechargeable battery |
WO2009005908A2 (en) * | 2007-05-22 | 2009-01-08 | Nantero, Inc. | Triodes using nanofabric articles and methods of making the same |
US8404124B2 (en) | 2007-06-12 | 2013-03-26 | Micron Technology, Inc. | Alternating self-assembling morphologies of diblock copolymers controlled by variations in surfaces |
US8080615B2 (en) * | 2007-06-19 | 2011-12-20 | Micron Technology, Inc. | Crosslinkable graft polymer non-preferentially wetted by polystyrene and polyethylene oxide |
US20080315430A1 (en) * | 2007-06-22 | 2008-12-25 | Qimonda Ag | Nanowire vias |
KR101672553B1 (en) | 2007-06-25 | 2016-11-03 | 큐디 비젼, 인크. | Compositions and methods including depositing nanomaterial |
WO2009017911A1 (en) * | 2007-06-26 | 2009-02-05 | Nanomix, Inc. | Nanoelectronic electrochemical test device |
KR20100051055A (en) * | 2007-06-26 | 2010-05-14 | 솔라리티, 아이엔씨. | Lateral collection photovoltaics |
GB0713898D0 (en) | 2007-07-17 | 2007-08-29 | Nexeon Ltd | A method of fabricating structured particles composed of silcon or a silicon-based material and their use in lithium rechargeable batteries |
KR20100044176A (en) * | 2007-07-19 | 2010-04-29 | 바이엘 머티리얼사이언스 아게 | Method for producing thin, conductive structures on surfaces |
US10011481B2 (en) | 2007-07-24 | 2018-07-03 | Technion Research And Development Foundation Ltd. | Chemically sensitive field effect transistors and uses thereof in electronic nose devices |
JP5535915B2 (en) | 2007-09-12 | 2014-07-02 | スモルテック アーベー | Connection and bonding of adjacent layers by nanostructures |
US7915146B2 (en) | 2007-10-23 | 2011-03-29 | International Business Machines Corporation | Controlled doping of semiconductor nanowires |
US7871571B2 (en) * | 2007-10-25 | 2011-01-18 | Parker John A | Biomolecule analyzing system |
WO2009061843A2 (en) * | 2007-11-07 | 2009-05-14 | Massachusetts Institute Of Technology | Induced-charge electrokinetics with high-slip polarizable surfaces |
PT2222908E (en) * | 2007-12-06 | 2013-03-28 | 3M Innovative Properties Co | Electret webs with charge-enhancing additives |
US8674212B2 (en) * | 2008-01-15 | 2014-03-18 | General Electric Company | Solar cell and magnetically self-assembled solar cell assembly |
US8610125B2 (en) * | 2008-01-24 | 2013-12-17 | Nano-Electronic And Photonic Devices And Circuits, Llc | Nanotube array light emitting diodes |
US8624224B2 (en) * | 2008-01-24 | 2014-01-07 | Nano-Electronic And Photonic Devices And Circuits, Llc | Nanotube array bipolar transistors |
US8492249B2 (en) * | 2008-01-24 | 2013-07-23 | Nano-Electronic And Photonic Devices And Circuits, Llc | Methods of forming catalytic nanopads |
US8610104B2 (en) * | 2008-01-24 | 2013-12-17 | Nano-Electronic And Photonic Devices And Circuits, Llc | Nanotube array injection lasers |
US8440994B2 (en) * | 2008-01-24 | 2013-05-14 | Nano-Electronic And Photonic Devices And Circuits, Llc | Nanotube array electronic and opto-electronic devices |
US8603246B2 (en) * | 2008-01-30 | 2013-12-10 | Palo Alto Research Center Incorporated | Growth reactor systems and methods for low-temperature synthesis of nanowires |
US8999492B2 (en) | 2008-02-05 | 2015-04-07 | Micron Technology, Inc. | Method to produce nanometer-sized features with directed assembly of block copolymers |
US8101261B2 (en) * | 2008-02-13 | 2012-01-24 | Micron Technology, Inc. | One-dimensional arrays of block copolymer cylinders and applications thereof |
JP2011514873A (en) * | 2008-02-14 | 2011-05-12 | コンパクトジーティーエル パブリック リミテッド カンパニー | Catalytic reaction module |
JP5474835B2 (en) | 2008-02-25 | 2014-04-16 | スモルテック アーベー | Formation and selective removal of conductive auxiliary layers for nanostructure processing |
US20100015462A1 (en) * | 2008-02-29 | 2010-01-21 | Gregory Jablonski | Metallic nanoparticle shielding structure and methods thereof |
US8308930B2 (en) * | 2008-03-04 | 2012-11-13 | Snu R&Db Foundation | Manufacturing carbon nanotube ropes |
TWI723953B (en) | 2008-03-05 | 2021-04-11 | 美國伊利諾大學理事會 | Stretchable and foldable electronic devices |
US8426313B2 (en) | 2008-03-21 | 2013-04-23 | Micron Technology, Inc. | Thermal anneal of block copolymer films with top interface constrained to wet both blocks with equal preference |
US8425982B2 (en) | 2008-03-21 | 2013-04-23 | Micron Technology, Inc. | Methods of improving long range order in self-assembly of block copolymer films with ionic liquids |
US8273591B2 (en) * | 2008-03-25 | 2012-09-25 | International Business Machines Corporation | Super lattice/quantum well nanowires |
GB2458907A (en) * | 2008-04-01 | 2009-10-07 | Sharp Kk | Device interconnects |
GB2458906A (en) * | 2008-04-01 | 2009-10-07 | Sharp Kk | Nanowire manufacture |
GB2459251A (en) * | 2008-04-01 | 2009-10-21 | Sharp Kk | Semiconductor nanowire devices |
CN101552203B (en) * | 2008-04-02 | 2010-07-21 | 中国科学院微电子研究所 | Method for realizing ZnO nanowire fixation in preparation of ZnO nanowire field effect tube |
US8470701B2 (en) * | 2008-04-03 | 2013-06-25 | Advanced Diamond Technologies, Inc. | Printable, flexible and stretchable diamond for thermal management |
WO2009137241A2 (en) | 2008-04-14 | 2009-11-12 | Bandgap Engineering, Inc. | Process for fabricating nanowire arrays |
US8114300B2 (en) * | 2008-04-21 | 2012-02-14 | Micron Technology, Inc. | Multi-layer method for formation of registered arrays of cylindrical pores in polymer films |
US8114301B2 (en) | 2008-05-02 | 2012-02-14 | Micron Technology, Inc. | Graphoepitaxial self-assembly of arrays of downward facing half-cylinders |
US7902540B2 (en) * | 2008-05-21 | 2011-03-08 | International Business Machines Corporation | Fast P-I-N photodetector with high responsitivity |
US7765698B2 (en) * | 2008-06-02 | 2010-08-03 | 3M Innovative Properties Company | Method of making electret articles based on zeta potential |
EP2297086A4 (en) * | 2008-06-02 | 2012-01-25 | 3M Innovative Properties Co | Charge-enhancing additives for electrets |
AU2009255469B2 (en) * | 2008-06-02 | 2012-03-29 | 3M Innovative Properties Company | Electret webs with charge-enhancing additives |
CA2765422A1 (en) * | 2008-06-13 | 2009-12-17 | Incitor, Llc | Single strand dimensional construction of dna in 3d space |
WO2010005707A1 (en) * | 2008-06-16 | 2010-01-14 | The Board Of Trustees Of The University Of Illinois | Medium scale carbon nanotube thin film integrated circuits on flexible plastic substrates |
US9249502B2 (en) * | 2008-06-20 | 2016-02-02 | Sakti3, Inc. | Method for high volume manufacture of electrochemical cells using physical vapor deposition |
US7945344B2 (en) * | 2008-06-20 | 2011-05-17 | SAKT13, Inc. | Computational method for design and manufacture of electrochemical systems |
US8587989B2 (en) * | 2008-06-20 | 2013-11-19 | Nantero Inc. | NRAM arrays with nanotube blocks, nanotube traces, and nanotube planes and methods of making same |
US8680574B2 (en) * | 2008-07-22 | 2014-03-25 | The Regents Of The University Of Michigan | Hybrid nanostructure array |
US8166819B2 (en) * | 2008-07-24 | 2012-05-01 | Northrop Grumman Systems Corporation | Standing wave field induced force |
KR101045128B1 (en) * | 2008-08-04 | 2011-06-30 | 서울대학교산학협력단 | Manufacturing cross-structures of nanostructures |
US8673258B2 (en) * | 2008-08-14 | 2014-03-18 | Snu R&Db Foundation | Enhanced carbon nanotube |
US8357346B2 (en) * | 2008-08-20 | 2013-01-22 | Snu R&Db Foundation | Enhanced carbon nanotube wire |
US8070929B2 (en) * | 2008-08-21 | 2011-12-06 | Snu R&Db Foundation | Catalyst particles on a tip |
US7917966B2 (en) * | 2008-08-21 | 2011-03-29 | Snu R&Db Foundation | Aligned nanostructures on a tip |
US8021640B2 (en) | 2008-08-26 | 2011-09-20 | Snu R&Db Foundation | Manufacturing carbon nanotube paper |
US7959842B2 (en) * | 2008-08-26 | 2011-06-14 | Snu & R&Db Foundation | Carbon nanotube structure |
US20100051932A1 (en) * | 2008-08-28 | 2010-03-04 | Seo-Yong Cho | Nanostructure and uses thereof |
US8758217B2 (en) * | 2008-09-02 | 2014-06-24 | Georgia Tech Research Corporation | Piezoelectric nanowire vibration sensors |
TWI405836B (en) * | 2008-09-26 | 2013-08-21 | Lite On Electronics Guangzhou | Fluorescence material |
TW201014937A (en) | 2008-10-06 | 2010-04-16 | Clean Venture 21 Corp | Method for producing semiconductor particles |
US8097926B2 (en) | 2008-10-07 | 2012-01-17 | Mc10, Inc. | Systems, methods, and devices having stretchable integrated circuitry for sensing and delivering therapy |
US8389862B2 (en) | 2008-10-07 | 2013-03-05 | Mc10, Inc. | Extremely stretchable electronics |
US8372726B2 (en) * | 2008-10-07 | 2013-02-12 | Mc10, Inc. | Methods and applications of non-planar imaging arrays |
US9289132B2 (en) * | 2008-10-07 | 2016-03-22 | Mc10, Inc. | Catheter balloon having stretchable integrated circuitry and sensor array |
US8886334B2 (en) * | 2008-10-07 | 2014-11-11 | Mc10, Inc. | Systems, methods, and devices using stretchable or flexible electronics for medical applications |
US9006133B2 (en) | 2008-10-24 | 2015-04-14 | Oned Material Llc | Electrochemical catalysts for fuel cells |
WO2010058516A1 (en) * | 2008-11-18 | 2010-05-27 | パナソニック株式会社 | Method for mounting member |
US7915637B2 (en) | 2008-11-19 | 2011-03-29 | Nantero, Inc. | Switching materials comprising mixed nanoscopic particles and carbon nanotubes and method of making and using the same |
JP4477100B1 (en) * | 2008-11-26 | 2010-06-09 | パナソニック株式会社 | Method of arranging electronic elements on electrodes formed on a substrate and electrically bonding them |
US9643252B2 (en) * | 2008-12-02 | 2017-05-09 | Massachusetts Institute Of Technology | Electrically controlled catalytic nanowire growth based on surface charge density |
US7981772B2 (en) * | 2008-12-29 | 2011-07-19 | International Business Machines Corporation | Methods of fabricating nanostructures |
US8389387B2 (en) * | 2009-01-06 | 2013-03-05 | Brookhaven Science Associates, Llc | Segmented nanowires displaying locally controllable properties |
JP5458300B2 (en) * | 2009-02-09 | 2014-04-02 | 公立大学法人横浜市立大学 | Microstructure deposition apparatus and method |
TWI383055B (en) * | 2009-02-17 | 2013-01-21 | Univ Nat Chunghsing | The Method of Making Metal Material Pattern |
US8276106B2 (en) * | 2009-03-05 | 2012-09-25 | International Business Machines Corporation | Swarm intelligence for electrical design space modeling and optimization |
US7816275B1 (en) * | 2009-04-03 | 2010-10-19 | International Business Machines Corporation | Gate patterning of nano-channel devices |
US7943530B2 (en) * | 2009-04-03 | 2011-05-17 | International Business Machines Corporation | Semiconductor nanowires having mobility-optimized orientations |
US8237150B2 (en) * | 2009-04-03 | 2012-08-07 | International Business Machines Corporation | Nanowire devices for enhancing mobility through stress engineering |
US8013324B2 (en) * | 2009-04-03 | 2011-09-06 | International Business Machines Corporation | Structurally stabilized semiconductor nanowire |
US7902541B2 (en) * | 2009-04-03 | 2011-03-08 | International Business Machines Corporation | Semiconductor nanowire with built-in stress |
JP5686988B2 (en) * | 2009-05-04 | 2015-03-18 | シャープ株式会社 | Catalyst layer used for membrane electrode assembly for fuel cell, membrane electrode assembly for fuel cell using the same, fuel cell, and production method thereof |
WO2010129869A1 (en) * | 2009-05-07 | 2010-11-11 | The Trustees Of Boston University | Manufacture of nanoparticles using nanopores and voltage-driven electrolyte flow |
TWI671811B (en) | 2009-05-12 | 2019-09-11 | 美國伊利諾大學理事會 | Printed assemblies of ultrathin, microscale inorganic light emitting diodes for deformable and semitransparent displays |
DE202009017416U1 (en) * | 2009-05-12 | 2010-04-15 | Lonza Ag | Reactor and set of reactors |
KR102067922B1 (en) | 2009-05-19 | 2020-01-17 | 원드 매터리얼 엘엘씨 | Nanostructured materials for battery applications |
WO2010138506A1 (en) | 2009-05-26 | 2010-12-02 | Nanosys, Inc. | Methods and systems for electric field deposition of nanowires and other devices |
US8357464B2 (en) | 2011-04-01 | 2013-01-22 | Sakti3, Inc. | Electric vehicle propulsion system and method utilizing solid-state rechargeable electrochemical cells |
US8623288B1 (en) | 2009-06-29 | 2014-01-07 | Nanosys, Inc. | Apparatus and methods for high density nanowire growth |
US8368125B2 (en) * | 2009-07-20 | 2013-02-05 | International Business Machines Corporation | Multiple orientation nanowires with gate stack stressors |
WO2011010988A1 (en) * | 2009-07-20 | 2011-01-27 | Hewlett-Packard Development Company, L.P | Nanowire sensor with angled segments that are differently functionalized |
WO2011017173A2 (en) * | 2009-07-28 | 2011-02-10 | Bandgap Engineering Inc. | Silicon nanowire arrays on an organic conductor |
US8574673B2 (en) | 2009-07-31 | 2013-11-05 | Nantero Inc. | Anisotropic nanotube fabric layers and films and methods of forming same |
US8128993B2 (en) * | 2009-07-31 | 2012-03-06 | Nantero Inc. | Anisotropic nanotube fabric layers and films and methods of forming same |
US20110034008A1 (en) * | 2009-08-07 | 2011-02-10 | Nantero, Inc. | Method for forming a textured surface on a semiconductor substrate using a nanofabric layer |
US10084103B1 (en) * | 2009-08-24 | 2018-09-25 | University Of South Florida | Electric field tuning of PbS quantum dots for high efficiency solar cell application |
US8574685B1 (en) * | 2009-08-24 | 2013-11-05 | University Of South Florida | Electric field tuning of PbS quantum dots for high efficiency solar cell application |
FR2950044B1 (en) | 2009-09-11 | 2011-12-09 | Commissariat Energie Atomique | PROCESS FOR PREPARING A FUNCTIONAL STRUCTURED SURFACE AND SURFACE OBTAINED BY THE PROCESS |
WO2011038228A1 (en) | 2009-09-24 | 2011-03-31 | President And Fellows Of Harvard College | Bent nanowires and related probing of species |
US20110076841A1 (en) * | 2009-09-30 | 2011-03-31 | Kahen Keith B | Forming catalyzed ii-vi semiconductor nanowires |
US20110073840A1 (en) * | 2009-09-30 | 2011-03-31 | Palo Alto Research Center Incorporated | Radial contact for nanowires |
WO2011041727A1 (en) | 2009-10-01 | 2011-04-07 | Mc10, Inc. | Protective cases with integrated electronics |
US20110218756A1 (en) * | 2009-10-01 | 2011-09-08 | Mc10, Inc. | Methods and apparatus for conformal sensing of force and/or acceleration at a person's head |
US8351239B2 (en) * | 2009-10-23 | 2013-01-08 | Nantero Inc. | Dynamic sense current supply circuit and associated method for reading and characterizing a resistive memory array |
US8895950B2 (en) | 2009-10-23 | 2014-11-25 | Nantero Inc. | Methods for passivating a carbonic nanolayer |
WO2011050331A2 (en) * | 2009-10-23 | 2011-04-28 | Nantero, Inc. | Method for passivating a carbonic nanolayer |
KR101161060B1 (en) * | 2009-11-30 | 2012-06-29 | 서강대학교산학협력단 | Arranging apparatus into columnar structure for nano particles and Method for arranging the same |
US8097515B2 (en) * | 2009-12-04 | 2012-01-17 | International Business Machines Corporation | Self-aligned contacts for nanowire field effect transistors |
US8384065B2 (en) * | 2009-12-04 | 2013-02-26 | International Business Machines Corporation | Gate-all-around nanowire field effect transistors |
US8173993B2 (en) * | 2009-12-04 | 2012-05-08 | International Business Machines Corporation | Gate-all-around nanowire tunnel field effect transistors |
US8455334B2 (en) | 2009-12-04 | 2013-06-04 | International Business Machines Corporation | Planar and nanowire field effect transistors |
US8143113B2 (en) | 2009-12-04 | 2012-03-27 | International Business Machines Corporation | Omega shaped nanowire tunnel field effect transistors fabrication |
US8129247B2 (en) * | 2009-12-04 | 2012-03-06 | International Business Machines Corporation | Omega shaped nanowire field effect transistors |
US10441185B2 (en) | 2009-12-16 | 2019-10-15 | The Board Of Trustees Of The University Of Illinois | Flexible and stretchable electronic systems for epidermal electronics |
JP6046491B2 (en) | 2009-12-16 | 2016-12-21 | ザ ボード オブ トラスティーズ オブ ザ ユニヴァーシティー オブ イリノイ | In vivo electrophysiology using conformal electronics |
US9936574B2 (en) | 2009-12-16 | 2018-04-03 | The Board Of Trustees Of The University Of Illinois | Waterproof stretchable optoelectronics |
JP2013514193A (en) * | 2009-12-17 | 2013-04-25 | メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング | Nanoparticle deposition |
CN105347297B (en) * | 2009-12-22 | 2018-01-09 | 昆南诺股份有限公司 | Method for preparing nano thread structure |
US9126836B2 (en) | 2009-12-28 | 2015-09-08 | Korea University Research And Business Foundation | Method and device for CNT length control |
US8222704B2 (en) * | 2009-12-31 | 2012-07-17 | Nantero, Inc. | Compact electrical switching devices with nanotube elements, and methods of making same |
US8722492B2 (en) * | 2010-01-08 | 2014-05-13 | International Business Machines Corporation | Nanowire pin tunnel field effect devices |
US9534124B2 (en) * | 2010-02-05 | 2017-01-03 | Cam Holding Corporation | Photosensitive ink compositions and transparent conductors and method of using the same |
KR101709823B1 (en) | 2010-02-12 | 2017-02-23 | 난테로 인크. | Methods for controlling density, porosity, and/or gap size within nanotube fabric layers and films |
US20110203632A1 (en) * | 2010-02-22 | 2011-08-25 | Rahul Sen | Photovoltaic devices using semiconducting nanotube layers |
US8513722B2 (en) * | 2010-03-02 | 2013-08-20 | Micron Technology, Inc. | Floating body cell structures, devices including same, and methods for forming same |
US9608119B2 (en) | 2010-03-02 | 2017-03-28 | Micron Technology, Inc. | Semiconductor-metal-on-insulator structures, methods of forming such structures, and semiconductor devices including such structures |
US8507966B2 (en) | 2010-03-02 | 2013-08-13 | Micron Technology, Inc. | Semiconductor cells, arrays, devices and systems having a buried conductive line and methods for forming the same |
US8288795B2 (en) | 2010-03-02 | 2012-10-16 | Micron Technology, Inc. | Thyristor based memory cells, devices and systems including the same and methods for forming the same |
US9646869B2 (en) * | 2010-03-02 | 2017-05-09 | Micron Technology, Inc. | Semiconductor devices including a diode structure over a conductive strap and methods of forming such semiconductor devices |
US9202954B2 (en) * | 2010-03-03 | 2015-12-01 | Q1 Nanosystems Corporation | Nanostructure and photovoltaic cell implementing same |
CN105496423A (en) * | 2010-03-17 | 2016-04-20 | 伊利诺伊大学评议会 | Implantable biomedical devices on bioresorbable substrates |
US10661304B2 (en) | 2010-03-30 | 2020-05-26 | Nantero, Inc. | Microfluidic control surfaces using ordered nanotube fabrics |
US20110240099A1 (en) * | 2010-03-30 | 2011-10-06 | Ellinger Carolyn R | Photovoltaic nanowire device |
CN101840852A (en) * | 2010-04-02 | 2010-09-22 | 中国科学院半导体研究所 | Method for manufacturing ordered semiconductor nanostructures on graphical semiconductor substrate |
US8324940B2 (en) * | 2010-04-13 | 2012-12-04 | International Business Machines Corporation | Nanowire circuits in matched devices |
US8309185B2 (en) * | 2010-05-04 | 2012-11-13 | National Tsing Hua University | Nanoparticle film and forming method and application thereof |
US8361907B2 (en) | 2010-05-10 | 2013-01-29 | International Business Machines Corporation | Directionally etched nanowire field effect transistors |
WO2011142717A1 (en) * | 2010-05-11 | 2011-11-17 | Qunano Ab | Gas-phase synthesis of wires |
US8324030B2 (en) | 2010-05-12 | 2012-12-04 | International Business Machines Corporation | Nanowire tunnel field effect transistors |
US8809112B2 (en) * | 2010-05-21 | 2014-08-19 | Merck Patent Gmbh | Selectively etching of a carbon nano tubes (CNT) polymer matrix on a plastic substructure |
AU2011258422C1 (en) | 2010-05-24 | 2017-03-30 | Lummus Technology Llc | Nanowire catalysts |
GB2482311A (en) | 2010-07-28 | 2012-02-01 | Sharp Kk | II-III-N and II-N semiconductor nanoparticles, comprising the Group II elements Zinc (Zn) or Magensium (Mg) |
GB2482312A (en) * | 2010-07-28 | 2012-02-01 | Sharp Kk | II-III-V semiconductor material, comprising the Group II elements Zn or Mg, Group III elements In or Ga or Al and Group V elements N or P |
US8859423B2 (en) | 2010-08-11 | 2014-10-14 | The Arizona Board Of Regents On Behalf Of The University Of Arizona | Nanostructured electrodes and active polymer layers |
US8835231B2 (en) | 2010-08-16 | 2014-09-16 | International Business Machines Corporation | Methods of forming contacts for nanowire field effect transistors |
US8304493B2 (en) | 2010-08-20 | 2012-11-06 | Micron Technology, Inc. | Methods of forming block copolymers |
US8536563B2 (en) | 2010-09-17 | 2013-09-17 | International Business Machines Corporation | Nanowire field effect transistors |
US8763525B2 (en) * | 2010-12-15 | 2014-07-01 | Carestream Health, Inc. | Gravure printing of transparent conductive films containing networks of metal nanoparticles |
US8450131B2 (en) | 2011-01-11 | 2013-05-28 | Nanohmics, Inc. | Imprinted semiconductor multiplex detection array |
WO2012097163A1 (en) | 2011-01-14 | 2012-07-19 | The Board Of Trustees Of The University Of Illinois | Optical component array having adjustable curvature |
CN102148160B (en) * | 2011-01-19 | 2013-03-06 | 青岛大学 | Method for preparing P-type SiC nanowire filed-effect tube |
US8598621B2 (en) | 2011-02-11 | 2013-12-03 | Micron Technology, Inc. | Memory cells, memory arrays, methods of forming memory cells, and methods of forming a shared doped semiconductor region of a vertically oriented thyristor and a vertically oriented access transistor |
US9001495B2 (en) | 2011-02-23 | 2015-04-07 | Fastcap Systems Corporation | High power and high energy electrodes using carbon nanotubes |
US8952418B2 (en) | 2011-03-01 | 2015-02-10 | Micron Technology, Inc. | Gated bipolar junction transistors |
US8519431B2 (en) | 2011-03-08 | 2013-08-27 | Micron Technology, Inc. | Thyristors |
US10770745B2 (en) | 2011-11-09 | 2020-09-08 | Sakti3, Inc. | Monolithically integrated thin-film solid state lithium battery device having multiple layers of lithium electrochemical cells |
RU2462785C1 (en) * | 2011-04-05 | 2012-09-27 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Национальный исследовательский университет" "МИЭТ" (МИЭТ) | Method of making ordered nanostructures |
WO2012158709A1 (en) | 2011-05-16 | 2012-11-22 | The Board Of Trustees Of The University Of Illinois | Thermally managed led arrays assembled by printing |
CA2837201C (en) | 2011-05-24 | 2018-02-13 | Siluria Technologies, Inc. | Catalysts for petrochemical catalysis |
CN104271880A (en) | 2011-05-24 | 2015-01-07 | 快帽系统公司 | Power system for high temperature applications with rechargeable energy storage |
WO2012166686A2 (en) | 2011-05-27 | 2012-12-06 | Mc10, Inc. | Electronic, optical and/or mechanical apparatus and systems and methods for fabricating same |
WO2012167096A2 (en) | 2011-06-03 | 2012-12-06 | The Board Of Trustees Of The University Of Illinois | Conformable actively multiplexed high-density surface electrode array for brain interfacing |
JP2014523841A (en) | 2011-06-07 | 2014-09-18 | ファーストキャップ・システムズ・コーポレイション | Energy storage medium for ultracapacitors |
CN102263171B (en) * | 2011-06-24 | 2013-10-09 | 清华大学 | Epitaxial substrate, preparation method for epitaxial substrate and application of epitaxial substrate as grown epitaxial layer |
US9558894B2 (en) | 2011-07-08 | 2017-01-31 | Fastcap Systems Corporation | Advanced electrolyte systems and their use in energy storage devices |
IL287733B2 (en) | 2011-07-08 | 2023-04-01 | Fastcap Systems Corp | High temperature energy storage device |
US9304074B2 (en) * | 2011-07-19 | 2016-04-05 | University of Pittsburgh—of the Commonwealth System of Higher Education | Methods for making and compositions of two dimensional particle arrays |
KR102051770B1 (en) | 2011-07-26 | 2019-12-03 | 원드 매터리얼 엘엘씨 | Nanostructured battery active materials and methods of producing same |
US8772848B2 (en) | 2011-07-26 | 2014-07-08 | Micron Technology, Inc. | Circuit structures, memory circuitry, and methods |
US9017634B2 (en) | 2011-08-19 | 2015-04-28 | Fastcap Systems Corporation | In-line manufacture of carbon nanotubes |
US8301285B2 (en) | 2011-10-31 | 2012-10-30 | Sakti3, Inc. | Computer aided solid state battery design method and manufacture of same using selected combinations of characteristics |
US8900963B2 (en) | 2011-11-02 | 2014-12-02 | Micron Technology, Inc. | Methods of forming semiconductor device structures, and related structures |
EA038017B1 (en) | 2011-11-03 | 2021-06-23 | Фасткэп Системз Корпорейшн | Production logging instrument |
US9127344B2 (en) | 2011-11-08 | 2015-09-08 | Sakti3, Inc. | Thermal evaporation process for manufacture of solid state battery devices |
EA029490B1 (en) * | 2011-11-29 | 2018-04-30 | Силурия Текнолоджиз, Инк. | Nanowire catalysts and methods for their use and preparation |
WO2013089867A2 (en) | 2011-12-01 | 2013-06-20 | The Board Of Trustees Of The University Of Illinois | Transient devices designed to undergo programmable transformations |
KR101878350B1 (en) * | 2012-01-10 | 2018-08-08 | 삼성전자주식회사 | Nano-piezoelectric generator and method of manufacturing the same |
EP2809837A4 (en) * | 2012-02-03 | 2015-11-11 | Qunano Ab | High-throughput continuous gas-phase synthesis of nanowires with tunable properties |
US8946678B2 (en) | 2012-03-15 | 2015-02-03 | Virginia Commonwealth University | Room temperature nanowire IR, visible and UV photodetectors |
WO2013149181A1 (en) | 2012-03-30 | 2013-10-03 | The Board Of Trustees Of The University Of Illinois | Appendage mountable electronic devices conformable to surfaces |
EP2855011A2 (en) | 2012-05-24 | 2015-04-08 | Siluria Technologies, Inc. | Catalytic forms and formulations |
KR102061093B1 (en) | 2012-05-25 | 2019-12-31 | 솔 발테익스 에이비 | Concentric flow reactor |
US9087699B2 (en) | 2012-10-05 | 2015-07-21 | Micron Technology, Inc. | Methods of forming an array of openings in a substrate, and related methods of forming a semiconductor device structure |
US9171794B2 (en) | 2012-10-09 | 2015-10-27 | Mc10, Inc. | Embedding thin chips in polymer |
US9627717B1 (en) | 2012-10-16 | 2017-04-18 | Sakti3, Inc. | Embedded solid-state battery |
US9082911B2 (en) | 2013-01-28 | 2015-07-14 | Q1 Nanosystems Corporation | Three-dimensional metamaterial device with photovoltaic bristles |
US9263669B2 (en) | 2013-03-13 | 2016-02-16 | International Business Machines Corporation | Magnetic trap for cylindrical diamagnetic materials |
US9093377B2 (en) | 2013-03-13 | 2015-07-28 | International Business Machines Corporation | Magnetic trap for cylindrical diamagnetic materials |
US20140264998A1 (en) | 2013-03-14 | 2014-09-18 | Q1 Nanosystems Corporation | Methods for manufacturing three-dimensional metamaterial devices with photovoltaic bristles |
US9954126B2 (en) | 2013-03-14 | 2018-04-24 | Q1 Nanosystems Corporation | Three-dimensional photovoltaic devices including cavity-containing cores and methods of manufacture |
US20140274671A1 (en) | 2013-03-15 | 2014-09-18 | Siluria Technologies, Inc. | Catalysts for petrochemical catalysis |
US9650732B2 (en) | 2013-05-01 | 2017-05-16 | Nantero Inc. | Low defect nanotube application solutions and fabrics and methods for making same |
US9229328B2 (en) | 2013-05-02 | 2016-01-05 | Micron Technology, Inc. | Methods of forming semiconductor device structures, and related semiconductor device structures |
US9823539B2 (en) * | 2013-06-26 | 2017-11-21 | Empire Technology Development Llc | Methods and systems for forming optical modulators using micro-contact lithography |
US10654718B2 (en) | 2013-09-20 | 2020-05-19 | Nantero, Inc. | Scalable nanotube fabrics and methods for making same |
US9177795B2 (en) | 2013-09-27 | 2015-11-03 | Micron Technology, Inc. | Methods of forming nanostructures including metal oxides |
US10872737B2 (en) | 2013-10-09 | 2020-12-22 | Fastcap Systems Corporation | Advanced electrolytes for high temperature energy storage device |
KR20150054179A (en) * | 2013-11-11 | 2015-05-20 | 삼성전자주식회사 | Laser-induced ultrasound generator and method of fabricating the same |
EP4325025A3 (en) | 2013-12-20 | 2024-04-24 | Fastcap Systems Corporation | Electromagnetic telemetry device |
US11270850B2 (en) | 2013-12-20 | 2022-03-08 | Fastcap Systems Corporation | Ultracapacitors with high frequency response |
EP3137211A2 (en) | 2014-05-02 | 2017-03-08 | Siluria Technologies, Inc. | Heterogeneous catalysts |
EP3194070B1 (en) | 2014-09-17 | 2020-12-23 | Lummus Technology LLC | Catalysts for oxidative coupling of methane and oxidative dehydrogenation of ethane |
CA2906871A1 (en) * | 2014-09-26 | 2016-03-26 | Jin Zhang | Luminescent resonance energy transfer sensors for non-invasively and continuously monitoring glucose for diabetes |
KR102459315B1 (en) | 2014-10-09 | 2022-10-27 | 패스트캡 시스템즈 코포레이션 | Nanostructured electrode for energy storage device |
US9627709B2 (en) | 2014-10-15 | 2017-04-18 | Sakti3, Inc. | Amorphous cathode material for battery device |
JP6378070B2 (en) * | 2014-12-15 | 2018-08-22 | 東京エレクトロン株式会社 | Deposition method |
US9299430B1 (en) | 2015-01-22 | 2016-03-29 | Nantero Inc. | Methods for reading and programming 1-R resistive change element arrays |
EP3251133A4 (en) | 2015-01-27 | 2018-12-05 | FastCAP Systems Corporation | Wide temperature range ultracapacitor |
BR112017025616A2 (en) | 2015-06-01 | 2018-08-07 | Univ Illinois | alternative approach to uv capture |
EP3304430A4 (en) | 2015-06-01 | 2019-03-06 | The Board of Trustees of the University of Illionis | Miniaturized electronic systems with wireless power and near-field communication capabilities |
WO2016200897A1 (en) | 2015-06-08 | 2016-12-15 | The Florida State University Research Foundation, Inc. | Single-layer light-emitting diodes using organometallic halide perovskite/ionic-conducting polymer composite |
EP3145038A1 (en) * | 2015-09-15 | 2017-03-22 | Technische Universität München | Nanowire laser structure and fabrication method |
WO2017079063A1 (en) | 2015-11-04 | 2017-05-11 | The Florida State University Research Foundation, Inc. | Printed halide perovskite light-emitting diodes and method of manufacture |
US10925543B2 (en) | 2015-11-11 | 2021-02-23 | The Board Of Trustees Of The University Of Illinois | Bioresorbable silicon electronics for transient implants |
US9719926B2 (en) * | 2015-11-16 | 2017-08-01 | International Business Machines Corporation | Nanopillar microfluidic devices and methods of use thereof |
US11988662B2 (en) | 2015-12-07 | 2024-05-21 | Nanohmics, Inc. | Methods for detecting and quantifying gas species analytes using differential gas species diffusion |
US10386365B2 (en) | 2015-12-07 | 2019-08-20 | Nanohmics, Inc. | Methods for detecting and quantifying analytes using ionic species diffusion |
US10386351B2 (en) | 2015-12-07 | 2019-08-20 | Nanohmics, Inc. | Methods for detecting and quantifying analytes using gas species diffusion |
US10278318B2 (en) * | 2015-12-18 | 2019-04-30 | Intel Corporation | Method of assembling an electronic component using a probe having a fluid thereon |
AU2017244132A1 (en) * | 2016-03-30 | 2018-10-18 | Waqas KHALID | Nanostructure array based sensors for electrochemical sensing, capacitive sensing and field-emission sensing |
US9953202B2 (en) * | 2016-05-11 | 2018-04-24 | Waqas Khalid | Nanostructure based super-capacitor for pressure and fingerprint sensor |
US9941001B2 (en) | 2016-06-07 | 2018-04-10 | Nantero, Inc. | Circuits for determining the resistive states of resistive change elements |
US9934848B2 (en) | 2016-06-07 | 2018-04-03 | Nantero, Inc. | Methods for determining the resistive states of resistive change elements |
JP6419362B1 (en) | 2016-06-10 | 2018-11-07 | リンテック オブ アメリカ インコーポレーテッドLintec of America, Inc. | Nanofiber sheet |
CN106041118A (en) * | 2016-06-18 | 2016-10-26 | 合肥松雷信息科技有限公司 | Preparation method of Ag@AgCl core-shell nanowire structure |
JP7155104B2 (en) | 2016-07-15 | 2022-10-18 | ワンディー マテリアル、 インコーポレイテッド | Manufacturing apparatus and methods for making silicon nanowires on carbon-based powders for use in batteries |
EP3281910B1 (en) * | 2016-08-11 | 2019-10-02 | IMEC vzw | Method of forming micro-pipes on a substrate and a structure formed therewith |
US10944398B2 (en) * | 2016-09-30 | 2021-03-09 | Uchicago Argonne, Llc | Systems and methods for ultrafast plasmonic response in doped, colloidal nanostructures |
US10782014B2 (en) | 2016-11-11 | 2020-09-22 | Habib Technologies LLC | Plasmonic energy conversion device for vapor generation |
MX2019006454A (en) | 2016-12-02 | 2019-08-01 | Fastcap Systems Corp | Composite electrode. |
US10355206B2 (en) | 2017-02-06 | 2019-07-16 | Nantero, Inc. | Sealed resistive change elements |
US10873026B2 (en) * | 2017-03-10 | 2020-12-22 | Wisconsin Alumni Research Foundation | Alignment of carbon nanotubes in confined channels |
US11370023B2 (en) | 2019-01-28 | 2022-06-28 | Global Graphene Group, Inc. | Production of metal nanowires directly from metal particles |
CN109881247B (en) * | 2019-03-14 | 2020-05-22 | 北京大学 | Preparation method of bent SnTe single crystal nanowire |
US11557765B2 (en) | 2019-07-05 | 2023-01-17 | Fastcap Systems Corporation | Electrodes for energy storage devices |
CN113054122B (en) * | 2019-12-27 | 2022-06-07 | Tcl科技集团股份有限公司 | Preparation method of inorganic nano material, inorganic nano material and light-emitting diode |
CN111024672B (en) * | 2020-01-06 | 2021-06-11 | 云南大学 | Method for detecting mercury ions based on fluorescent perovskite liquid-liquid extraction |
CN113351265B (en) * | 2021-05-26 | 2022-10-25 | 西安交通大学 | Processing method of micro-wire magnetic field-driven microfluid magnetic mixing system |
Citations (85)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5196396A (en) * | 1991-07-16 | 1993-03-23 | The President And Fellows Of Harvard College | Method of making a superconducting fullerene composition by reacting a fullerene with an alloy containing alkali metal |
US5252835A (en) * | 1992-07-17 | 1993-10-12 | President And Trustees Of Harvard College | Machining oxide thin-films with an atomic force microscope: pattern and object formation on the nanometer scale |
US5274602A (en) * | 1991-10-22 | 1993-12-28 | Florida Atlantic University | Large capacity solid-state memory |
US5338430A (en) * | 1992-12-23 | 1994-08-16 | Minnesota Mining And Manufacturing Company | Nanostructured electrode membranes |
US5505928A (en) * | 1991-11-22 | 1996-04-09 | The Regents Of University Of California | Preparation of III-V semiconductor nanocrystals |
US5512131A (en) * | 1993-10-04 | 1996-04-30 | President And Fellows Of Harvard College | Formation of microstamped patterns on surfaces and derivative articles |
US5640343A (en) * | 1996-03-18 | 1997-06-17 | International Business Machines Corporation | Magnetic memory array using magnetic tunnel junction devices in the memory cells |
US5674592A (en) * | 1995-05-04 | 1997-10-07 | Minnesota Mining And Manufacturing Company | Functionalized nanostructured films |
US5690807A (en) * | 1995-08-03 | 1997-11-25 | Massachusetts Institute Of Technology | Method for producing semiconductor particles |
US5751018A (en) * | 1991-11-22 | 1998-05-12 | The Regents Of The University Of California | Semiconductor nanocrystals covalently bound to solid inorganic surfaces using self-assembled monolayers |
US5840435A (en) * | 1993-07-15 | 1998-11-24 | President And Fellows Of Harvard College | Covalent carbon nitride material comprising C2 N and formation method |
US5897945A (en) * | 1996-02-26 | 1999-04-27 | President And Fellows Of Harvard College | Metal oxide nanorods |
US5920078A (en) * | 1996-06-20 | 1999-07-06 | Frey; Jeffrey | Optoelectronic device using indirect-bandgap semiconductor material |
US5962863A (en) * | 1993-09-09 | 1999-10-05 | The United States Of America As Represented By The Secretary Of The Navy | Laterally disposed nanostructures of silicon on an insulating substrate |
US5990479A (en) * | 1997-11-25 | 1999-11-23 | Regents Of The University Of California | Organo Luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes |
US5997832A (en) * | 1997-03-07 | 1999-12-07 | President And Fellows Of Harvard College | Preparation of carbide nanorods |
US6004444A (en) * | 1997-11-05 | 1999-12-21 | The Trustees Of Princeton University | Biomimetic pathways for assembling inorganic thin films and oriented mesoscopic silicate patterns through guided growth |
US6036774A (en) * | 1996-02-26 | 2000-03-14 | President And Fellows Of Harvard College | Method of producing metal oxide nanorods |
US6048616A (en) * | 1993-04-21 | 2000-04-11 | Philips Electronics N.A. Corp. | Encapsulated quantum sized doped semiconductor particles and method of manufacturing same |
US6128214A (en) * | 1999-03-29 | 2000-10-03 | Hewlett-Packard | Molecular wire crossbar memory |
US6136156A (en) * | 1996-03-01 | 2000-10-24 | Virginia Commonwealth University | Nanoparticles of silicon oxide alloys |
US6159742A (en) * | 1998-06-05 | 2000-12-12 | President And Fellows Of Harvard College | Nanometer-scale microscopy probes |
US6190634B1 (en) * | 1995-06-07 | 2001-02-20 | President And Fellows Of Harvard College | Carbide nanomaterials |
US6207229B1 (en) * | 1997-11-13 | 2001-03-27 | Massachusetts Institute Of Technology | Highly luminescent color-selective materials and method of making thereof |
US6225198B1 (en) * | 2000-02-04 | 2001-05-01 | The Regents Of The University Of California | Process for forming shaped group II-VI semiconductor nanocrystals, and product formed using process |
US6256767B1 (en) * | 1999-03-29 | 2001-07-03 | Hewlett-Packard Company | Demultiplexer for a molecular wire crossbar network (MWCN DEMUX) |
US6274007B1 (en) * | 1999-11-25 | 2001-08-14 | Sceptre Electronics Limited | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
US6306736B1 (en) * | 2000-02-04 | 2001-10-23 | The Regents Of The University Of California | Process for forming shaped group III-V semiconductor nanocrystals, and product formed using process |
US6360736B1 (en) * | 2000-02-18 | 2002-03-26 | Yung Che Cheng | Air gun firing system |
US6383923B1 (en) * | 1999-10-05 | 2002-05-07 | Agere Systems Guardian Corp. | Article comprising vertically nano-interconnected circuit devices and method for making the same |
US6413489B1 (en) * | 1997-04-15 | 2002-07-02 | Massachusetts Institute Of Technology | Synthesis of nanometer-sized particles by reverse micelle mediated techniques |
US6438025B1 (en) * | 1999-09-08 | 2002-08-20 | Sergei Skarupo | Magnetic memory device |
US20020117659A1 (en) * | 2000-12-11 | 2002-08-29 | Lieber Charles M. | Nanosensors |
US6445006B1 (en) * | 1995-12-20 | 2002-09-03 | Advanced Technology Materials, Inc. | Microelectronic and microelectromechanical devices comprising carbon nanotube components, and methods of making same |
US6447663B1 (en) * | 2000-08-01 | 2002-09-10 | Ut-Battelle, Llc | Programmable nanometer-scale electrolytic metal deposition and depletion |
US20020125192A1 (en) * | 2001-02-14 | 2002-09-12 | Lopez Gabriel P. | Nanostructured devices for separation and analysis |
US20020127495A1 (en) * | 2001-03-12 | 2002-09-12 | Axel Scherer | Method of fabricating nanometer-scale flowchannels and trenches with self-aligned electrodes and the structures formed by the same |
US20020130353A1 (en) * | 1999-07-02 | 2002-09-19 | Lieber Charles M. | Nanoscopic wire-based devices, arrays, and methods of their manufacture |
US20020130311A1 (en) * | 2000-08-22 | 2002-09-19 | Lieber Charles M. | Doped elongated semiconductors, growing such semiconductors, devices including such semiconductors and fabricating such devices |
US6465813B2 (en) * | 1998-06-16 | 2002-10-15 | Hyundai Electronics Industries Co., Ltd. | Carbon nanotube device |
US6471761B2 (en) * | 2000-04-21 | 2002-10-29 | University Of New Mexico | Prototyping of patterned functional nanostructures |
US20020158342A1 (en) * | 2001-03-14 | 2002-10-31 | Mark Tuominen | Nanofabrication |
US20020163079A1 (en) * | 2001-05-02 | 2002-11-07 | Fujitsu Limited | Integrated circuit device and method of producing the same |
US20020175408A1 (en) * | 2001-03-30 | 2002-11-28 | The Regents Of The University Of California | Methods of fabricating nanostructures and nanowires and devices fabricated therefrom |
US20030012723A1 (en) * | 2001-07-10 | 2003-01-16 | Clarke Mark S.F. | Spatial localization of dispersed single walled carbon nanotubes into useful structures |
US6515339B2 (en) * | 2000-07-18 | 2003-02-04 | Lg Electronics Inc. | Method of horizontally growing carbon nanotubes and field effect transistor using the carbon nanotubes grown by the method |
US6515325B1 (en) * | 2002-03-06 | 2003-02-04 | Micron Technology, Inc. | Nanotube semiconductor devices and methods for making the same |
US20030044777A1 (en) * | 1993-10-28 | 2003-03-06 | Kenneth L. Beattie | Flowthrough devices for multiple discrete binding reactions |
US20030042562A1 (en) * | 2001-08-30 | 2003-03-06 | Carsten Giebeler | Magnetoresistive device and electronic device |
US20030071246A1 (en) * | 2001-01-23 | 2003-04-17 | Grigorov Leonid N. | Quantum devices based on crystallized electron pairs and methods for their manufacture and use |
US20030089899A1 (en) * | 2000-08-22 | 2003-05-15 | Lieber Charles M. | Nanoscale wires and related devices |
US6566704B2 (en) * | 2000-06-27 | 2003-05-20 | Samsung Electronics Co., Ltd. | Vertical nano-size transistor using carbon nanotubes and manufacturing method thereof |
US6586785B2 (en) * | 2000-06-29 | 2003-07-01 | California Institute Of Technology | Aerosol silicon nanoparticles for use in semiconductor device fabrication |
US20030186522A1 (en) * | 2002-04-02 | 2003-10-02 | Nanosys, Inc. | Methods of positioning and/or orienting nanostructures |
US20030189202A1 (en) * | 2002-04-05 | 2003-10-09 | Jun Li | Nanowire devices and methods of fabrication |
US6656573B2 (en) * | 2001-06-26 | 2003-12-02 | Hewlett-Packard Development Company, L.P. | Method to grow self-assembled epitaxial nanowires |
US6672925B2 (en) * | 2001-08-17 | 2004-01-06 | Motorola, Inc. | Vacuum microelectronic device and method |
US20040005258A1 (en) * | 2001-12-12 | 2004-01-08 | Fonash Stephen J. | Chemical reactor templates: sacrificial layer fabrication and template use |
US20040026684A1 (en) * | 2002-04-02 | 2004-02-12 | Nanosys, Inc. | Nanowire heterostructures for encoding information |
US20040036128A1 (en) * | 2002-08-23 | 2004-02-26 | Yuegang Zhang | Multi-gate carbon nano-tube transistors |
US6706566B2 (en) * | 2001-01-03 | 2004-03-16 | International Business Machines Corporation | Methodology for electrically induced selective breakdown of nanotubes |
US20040061422A1 (en) * | 2002-09-26 | 2004-04-01 | International Business Machines Corporation | System and method for molecular optical emission |
US6760245B2 (en) * | 2002-05-01 | 2004-07-06 | Hewlett-Packard Development Company, L.P. | Molecular wire crossbar flash memory |
US6762094B2 (en) * | 2002-09-27 | 2004-07-13 | Hewlett-Packard Development Company, L.P. | Nanometer-scale semiconductor devices and method of making |
US6773616B1 (en) * | 2001-11-13 | 2004-08-10 | Hewlett-Packard Development Company, L.P. | Formation of nanoscale wires |
US6790425B1 (en) * | 1999-10-27 | 2004-09-14 | Wiliam Marsh Rice University | Macroscopic ordered assembly of carbon nanotubes |
US6798000B2 (en) * | 2000-07-04 | 2004-09-28 | Infineon Technologies Ag | Field effect transistor |
US20040213307A1 (en) * | 2002-07-19 | 2004-10-28 | President And Fellows Of Harvard College | Nanoscale coherent optical components |
US6815218B1 (en) * | 1999-06-09 | 2004-11-09 | Massachusetts Institute Of Technology | Methods for manufacturing bioelectronic devices |
US6815706B2 (en) * | 2002-12-17 | 2004-11-09 | Hewlett-Packard Development Company, L.P. | Nano optical sensors via molecular self-assembly |
US20040238887A1 (en) * | 2001-07-05 | 2004-12-02 | Fumiyuki Nihey | Field-effect transistor constituting channel by carbon nano tubes |
US6831017B1 (en) * | 2002-04-05 | 2004-12-14 | Integrated Nanosystems, Inc. | Catalyst patterning for nanowire devices |
US6838297B2 (en) * | 1998-03-27 | 2005-01-04 | Canon Kabushiki Kaisha | Nanostructure, electron emitting device, carbon nanotube device, and method of producing the same |
US6846565B2 (en) * | 2001-07-02 | 2005-01-25 | Board Of Regents, The University Of Texas System | Light-emitting nanoparticles and method of making same |
US20050064618A1 (en) * | 2001-08-20 | 2005-03-24 | Brown Simon Anthony | Nanoscale electronic devices & frabrication methods |
US6888208B2 (en) * | 2003-07-30 | 2005-05-03 | Hewlett-Packard Development Company, L.P. | Square-law detector based on spin injection and nanowires |
US6903717B2 (en) * | 2001-09-28 | 2005-06-07 | Hitachi, Ltd. | Display device having driving circuit |
US20060006463A1 (en) * | 2004-07-09 | 2006-01-12 | Islam M S | Nanowire device with (111) vertical sidewalls and method of fabrication |
US7052588B2 (en) * | 2002-11-27 | 2006-05-30 | Molecular Nanosystems, Inc. | Nanotube chemical sensor based on work function of electrodes |
US7051945B2 (en) * | 2002-09-30 | 2006-05-30 | Nanosys, Inc | Applications of nano-enabled large area macroelectronic substrates incorporating nanowires and nanowire composites |
US7064372B2 (en) * | 2002-09-30 | 2006-06-20 | Nanosys, Inc. | Large-area nanoenabled macroelectronic substrates and uses therefor |
US7091120B2 (en) * | 2003-08-04 | 2006-08-15 | Nanosys, Inc. | System and process for producing nanowire composites and electronic substrates therefrom |
US7098393B2 (en) * | 2001-05-18 | 2006-08-29 | California Institute Of Technology | Thermoelectric device with multiple, nanometer scale, elements |
US7097820B2 (en) * | 1996-08-08 | 2006-08-29 | William Marsh Rice University | Continuous fiber of single-wall carbon nanotubes |
US7135728B2 (en) * | 2002-09-30 | 2006-11-14 | Nanosys, Inc. | Large-area nanoenabled macroelectronic substrates and uses therefor |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5332910A (en) | 1991-03-22 | 1994-07-26 | Hitachi, Ltd. | Semiconductor optical device with nanowhiskers |
WO1996029629A2 (en) | 1995-03-01 | 1996-09-26 | President And Fellows Of Harvard College | Microcontact printing on surfaces and derivative articles |
US6068800A (en) | 1995-09-07 | 2000-05-30 | The Penn State Research Foundation | Production of nano particles and tubes by laser liquid interaction |
CA2175512A1 (en) * | 1996-05-01 | 1997-11-02 | Stan Janus | Drug injection system with self-aspiration feature |
US6146227A (en) | 1998-09-28 | 2000-11-14 | Xidex Corporation | Method for manufacturing carbon nanotubes as functional elements of MEMS devices |
US6261469B1 (en) | 1998-10-13 | 2001-07-17 | Honeywell International Inc. | Three dimensionally periodic structural assemblies on nanometer and longer scales |
AUPP976499A0 (en) * | 1999-04-16 | 1999-05-06 | Commonwealth Scientific And Industrial Research Organisation | Multilayer carbon nanotube films |
US6361861B2 (en) | 1999-06-14 | 2002-03-26 | Battelle Memorial Institute | Carbon nanotubes on a substrate |
KR100865105B1 (en) * | 1999-06-28 | 2008-10-24 | 캘리포니아 인스티튜트 오브 테크놀로지 | Microfabricated elastomeric valve and pump systems |
US6216631B1 (en) * | 1999-08-12 | 2001-04-17 | The Mitre Corporation | Robotic manipulation system utilizing patterned granular motion |
US6919009B2 (en) * | 1999-10-01 | 2005-07-19 | Nanoplex Technologies, Inc. | Method of manufacture of colloidal rod particles as nanobarcodes |
KR100372335B1 (en) * | 1999-11-05 | 2003-02-17 | 일진나노텍 주식회사 | Synthesis method for controlling diameter of carbonnanotubes using catalytic metal fine patterns |
US6248674B1 (en) | 2000-02-02 | 2001-06-19 | Hewlett-Packard Company | Method of aligning nanowires |
US7335603B2 (en) * | 2000-02-07 | 2008-02-26 | Vladimir Mancevski | System and method for fabricating logic devices comprising carbon nanotube transistors |
US6294450B1 (en) * | 2000-03-01 | 2001-09-25 | Hewlett-Packard Company | Nanoscale patterning for the formation of extensive wires |
CA2403278A1 (en) * | 2000-03-16 | 2001-09-20 | Subramanian Venkat Shastri | Microlaboratory devices and methods |
US6297592B1 (en) | 2000-08-04 | 2001-10-02 | Lucent Technologies Inc. | Microwave vacuum tube device employing grid-modulated cold cathode source having nanotube emitters |
US6858455B2 (en) * | 2001-05-25 | 2005-02-22 | Ut-Battelle, Llc | Gated fabrication of nanostructure field emission cathode material within a device |
-
2002
- 2002-09-10 US US10/239,000 patent/US6872645B2/en not_active Expired - Lifetime
-
2003
- 2003-04-01 WO PCT/US2003/009827 patent/WO2003085700A2/en not_active Application Discontinuation
- 2003-04-01 WO PCT/US2003/009991 patent/WO2003085701A2/en not_active Application Discontinuation
- 2003-04-01 US US10/405,992 patent/US6962823B2/en not_active Expired - Lifetime
- 2003-04-01 EP EP10008050A patent/EP2253583A2/en not_active Withdrawn
- 2003-04-01 AU AU2003260527A patent/AU2003260527A1/en not_active Abandoned
- 2003-04-01 AU AU2003222134A patent/AU2003222134A1/en not_active Abandoned
- 2003-04-01 EP EP03718122A patent/EP1522106A4/en not_active Withdrawn
- 2003-04-01 EP EP03746100A patent/EP1508161A4/en not_active Withdrawn
-
2004
- 2004-12-01 US US11/000,557 patent/US7164209B1/en not_active Expired - Lifetime
-
2005
- 2005-05-31 US US11/142,563 patent/US7151209B2/en not_active Expired - Lifetime
-
2006
- 2006-11-21 US US11/602,784 patent/US7422980B1/en not_active Expired - Lifetime
-
2008
- 2008-08-05 US US12/186,405 patent/US7651944B2/en not_active Expired - Lifetime
-
2009
- 2009-02-12 US US12/370,280 patent/US20090173931A1/en not_active Abandoned
Patent Citations (94)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5196396A (en) * | 1991-07-16 | 1993-03-23 | The President And Fellows Of Harvard College | Method of making a superconducting fullerene composition by reacting a fullerene with an alloy containing alkali metal |
US5274602A (en) * | 1991-10-22 | 1993-12-28 | Florida Atlantic University | Large capacity solid-state memory |
US5751018A (en) * | 1991-11-22 | 1998-05-12 | The Regents Of The University Of California | Semiconductor nanocrystals covalently bound to solid inorganic surfaces using self-assembled monolayers |
US5505928A (en) * | 1991-11-22 | 1996-04-09 | The Regents Of University Of California | Preparation of III-V semiconductor nanocrystals |
US5252835A (en) * | 1992-07-17 | 1993-10-12 | President And Trustees Of Harvard College | Machining oxide thin-films with an atomic force microscope: pattern and object formation on the nanometer scale |
US5338430A (en) * | 1992-12-23 | 1994-08-16 | Minnesota Mining And Manufacturing Company | Nanostructured electrode membranes |
US6048616A (en) * | 1993-04-21 | 2000-04-11 | Philips Electronics N.A. Corp. | Encapsulated quantum sized doped semiconductor particles and method of manufacturing same |
US5840435A (en) * | 1993-07-15 | 1998-11-24 | President And Fellows Of Harvard College | Covalent carbon nitride material comprising C2 N and formation method |
US5962863A (en) * | 1993-09-09 | 1999-10-05 | The United States Of America As Represented By The Secretary Of The Navy | Laterally disposed nanostructures of silicon on an insulating substrate |
US5512131A (en) * | 1993-10-04 | 1996-04-30 | President And Fellows Of Harvard College | Formation of microstamped patterns on surfaces and derivative articles |
US20030044777A1 (en) * | 1993-10-28 | 2003-03-06 | Kenneth L. Beattie | Flowthrough devices for multiple discrete binding reactions |
US5674592A (en) * | 1995-05-04 | 1997-10-07 | Minnesota Mining And Manufacturing Company | Functionalized nanostructured films |
US6190634B1 (en) * | 1995-06-07 | 2001-02-20 | President And Fellows Of Harvard College | Carbide nanomaterials |
US5690807A (en) * | 1995-08-03 | 1997-11-25 | Massachusetts Institute Of Technology | Method for producing semiconductor particles |
US6445006B1 (en) * | 1995-12-20 | 2002-09-03 | Advanced Technology Materials, Inc. | Microelectronic and microelectromechanical devices comprising carbon nanotube components, and methods of making same |
US5897945A (en) * | 1996-02-26 | 1999-04-27 | President And Fellows Of Harvard College | Metal oxide nanorods |
US6036774A (en) * | 1996-02-26 | 2000-03-14 | President And Fellows Of Harvard College | Method of producing metal oxide nanorods |
US6136156A (en) * | 1996-03-01 | 2000-10-24 | Virginia Commonwealth University | Nanoparticles of silicon oxide alloys |
US5640343A (en) * | 1996-03-18 | 1997-06-17 | International Business Machines Corporation | Magnetic memory array using magnetic tunnel junction devices in the memory cells |
US5920078A (en) * | 1996-06-20 | 1999-07-06 | Frey; Jeffrey | Optoelectronic device using indirect-bandgap semiconductor material |
US7097820B2 (en) * | 1996-08-08 | 2006-08-29 | William Marsh Rice University | Continuous fiber of single-wall carbon nanotubes |
US5997832A (en) * | 1997-03-07 | 1999-12-07 | President And Fellows Of Harvard College | Preparation of carbide nanorods |
US6413489B1 (en) * | 1997-04-15 | 2002-07-02 | Massachusetts Institute Of Technology | Synthesis of nanometer-sized particles by reverse micelle mediated techniques |
US6004444A (en) * | 1997-11-05 | 1999-12-21 | The Trustees Of Princeton University | Biomimetic pathways for assembling inorganic thin films and oriented mesoscopic silicate patterns through guided growth |
US6207229B1 (en) * | 1997-11-13 | 2001-03-27 | Massachusetts Institute Of Technology | Highly luminescent color-selective materials and method of making thereof |
US6322901B1 (en) * | 1997-11-13 | 2001-11-27 | Massachusetts Institute Of Technology | Highly luminescent color-selective nano-crystalline materials |
US5990479A (en) * | 1997-11-25 | 1999-11-23 | Regents Of The University Of California | Organo Luminescent semiconductor nanocrystal probes for biological applications and process for making and using such probes |
US6838297B2 (en) * | 1998-03-27 | 2005-01-04 | Canon Kabushiki Kaisha | Nanostructure, electron emitting device, carbon nanotube device, and method of producing the same |
US6159742A (en) * | 1998-06-05 | 2000-12-12 | President And Fellows Of Harvard College | Nanometer-scale microscopy probes |
US6465813B2 (en) * | 1998-06-16 | 2002-10-15 | Hyundai Electronics Industries Co., Ltd. | Carbon nanotube device |
US6256767B1 (en) * | 1999-03-29 | 2001-07-03 | Hewlett-Packard Company | Demultiplexer for a molecular wire crossbar network (MWCN DEMUX) |
US6128214A (en) * | 1999-03-29 | 2000-10-03 | Hewlett-Packard | Molecular wire crossbar memory |
US6815218B1 (en) * | 1999-06-09 | 2004-11-09 | Massachusetts Institute Of Technology | Methods for manufacturing bioelectronic devices |
US20020130353A1 (en) * | 1999-07-02 | 2002-09-19 | Lieber Charles M. | Nanoscopic wire-based devices, arrays, and methods of their manufacture |
US6438025B1 (en) * | 1999-09-08 | 2002-08-20 | Sergei Skarupo | Magnetic memory device |
US6383923B1 (en) * | 1999-10-05 | 2002-05-07 | Agere Systems Guardian Corp. | Article comprising vertically nano-interconnected circuit devices and method for making the same |
US6790425B1 (en) * | 1999-10-27 | 2004-09-14 | Wiliam Marsh Rice University | Macroscopic ordered assembly of carbon nanotubes |
US6274007B1 (en) * | 1999-11-25 | 2001-08-14 | Sceptre Electronics Limited | Methods of formation of a silicon nanostructure, a silicon quantum wire array and devices based thereon |
US6225198B1 (en) * | 2000-02-04 | 2001-05-01 | The Regents Of The University Of California | Process for forming shaped group II-VI semiconductor nanocrystals, and product formed using process |
US6306736B1 (en) * | 2000-02-04 | 2001-10-23 | The Regents Of The University Of California | Process for forming shaped group III-V semiconductor nanocrystals, and product formed using process |
US6360736B1 (en) * | 2000-02-18 | 2002-03-26 | Yung Che Cheng | Air gun firing system |
US6471761B2 (en) * | 2000-04-21 | 2002-10-29 | University Of New Mexico | Prototyping of patterned functional nanostructures |
US6566704B2 (en) * | 2000-06-27 | 2003-05-20 | Samsung Electronics Co., Ltd. | Vertical nano-size transistor using carbon nanotubes and manufacturing method thereof |
US6586785B2 (en) * | 2000-06-29 | 2003-07-01 | California Institute Of Technology | Aerosol silicon nanoparticles for use in semiconductor device fabrication |
US6798000B2 (en) * | 2000-07-04 | 2004-09-28 | Infineon Technologies Ag | Field effect transistor |
US6803260B2 (en) * | 2000-07-18 | 2004-10-12 | Lg Electronics Inc. | Method of horizontally growing carbon nanotubes and field effect transistor using the carbon nanotubes grown by the method |
US6515339B2 (en) * | 2000-07-18 | 2003-02-04 | Lg Electronics Inc. | Method of horizontally growing carbon nanotubes and field effect transistor using the carbon nanotubes grown by the method |
US6447663B1 (en) * | 2000-08-01 | 2002-09-10 | Ut-Battelle, Llc | Programmable nanometer-scale electrolytic metal deposition and depletion |
US20020130311A1 (en) * | 2000-08-22 | 2002-09-19 | Lieber Charles M. | Doped elongated semiconductors, growing such semiconductors, devices including such semiconductors and fabricating such devices |
US20030089899A1 (en) * | 2000-08-22 | 2003-05-15 | Lieber Charles M. | Nanoscale wires and related devices |
US7129554B2 (en) * | 2000-12-11 | 2006-10-31 | President & Fellows Of Harvard College | Nanosensors |
US20020117659A1 (en) * | 2000-12-11 | 2002-08-29 | Lieber Charles M. | Nanosensors |
US6706566B2 (en) * | 2001-01-03 | 2004-03-16 | International Business Machines Corporation | Methodology for electrically induced selective breakdown of nanotubes |
US20030071246A1 (en) * | 2001-01-23 | 2003-04-17 | Grigorov Leonid N. | Quantum devices based on crystallized electron pairs and methods for their manufacture and use |
US20020125192A1 (en) * | 2001-02-14 | 2002-09-12 | Lopez Gabriel P. | Nanostructured devices for separation and analysis |
US20020127495A1 (en) * | 2001-03-12 | 2002-09-12 | Axel Scherer | Method of fabricating nanometer-scale flowchannels and trenches with self-aligned electrodes and the structures formed by the same |
US20020158342A1 (en) * | 2001-03-14 | 2002-10-31 | Mark Tuominen | Nanofabrication |
US20020175408A1 (en) * | 2001-03-30 | 2002-11-28 | The Regents Of The University Of California | Methods of fabricating nanostructures and nanowires and devices fabricated therefrom |
US6882051B2 (en) * | 2001-03-30 | 2005-04-19 | The Regents Of The University Of California | Nanowires, nanostructures and devices fabricated therefrom |
US6996147B2 (en) * | 2001-03-30 | 2006-02-07 | The Regents Of The University Of California | Methods of fabricating nanostructures and nanowires and devices fabricated therefrom |
US20020163079A1 (en) * | 2001-05-02 | 2002-11-07 | Fujitsu Limited | Integrated circuit device and method of producing the same |
US7098393B2 (en) * | 2001-05-18 | 2006-08-29 | California Institute Of Technology | Thermoelectric device with multiple, nanometer scale, elements |
US6656573B2 (en) * | 2001-06-26 | 2003-12-02 | Hewlett-Packard Development Company, L.P. | Method to grow self-assembled epitaxial nanowires |
US6846565B2 (en) * | 2001-07-02 | 2005-01-25 | Board Of Regents, The University Of Texas System | Light-emitting nanoparticles and method of making same |
US20040238887A1 (en) * | 2001-07-05 | 2004-12-02 | Fumiyuki Nihey | Field-effect transistor constituting channel by carbon nano tubes |
US20030012723A1 (en) * | 2001-07-10 | 2003-01-16 | Clarke Mark S.F. | Spatial localization of dispersed single walled carbon nanotubes into useful structures |
US6672925B2 (en) * | 2001-08-17 | 2004-01-06 | Motorola, Inc. | Vacuum microelectronic device and method |
US20050064618A1 (en) * | 2001-08-20 | 2005-03-24 | Brown Simon Anthony | Nanoscale electronic devices & frabrication methods |
US20030042562A1 (en) * | 2001-08-30 | 2003-03-06 | Carsten Giebeler | Magnetoresistive device and electronic device |
US6903717B2 (en) * | 2001-09-28 | 2005-06-07 | Hitachi, Ltd. | Display device having driving circuit |
US6773616B1 (en) * | 2001-11-13 | 2004-08-10 | Hewlett-Packard Development Company, L.P. | Formation of nanoscale wires |
US20040005258A1 (en) * | 2001-12-12 | 2004-01-08 | Fonash Stephen J. | Chemical reactor templates: sacrificial layer fabrication and template use |
US7081385B2 (en) * | 2002-03-06 | 2006-07-25 | Micron Technology, Inc. | Nanotube semiconductor devices and methods for making the same |
US6515325B1 (en) * | 2002-03-06 | 2003-02-04 | Micron Technology, Inc. | Nanotube semiconductor devices and methods for making the same |
US20040026684A1 (en) * | 2002-04-02 | 2004-02-12 | Nanosys, Inc. | Nanowire heterostructures for encoding information |
US6872645B2 (en) * | 2002-04-02 | 2005-03-29 | Nanosys, Inc. | Methods of positioning and/or orienting nanostructures |
US20030186522A1 (en) * | 2002-04-02 | 2003-10-02 | Nanosys, Inc. | Methods of positioning and/or orienting nanostructures |
US6831017B1 (en) * | 2002-04-05 | 2004-12-14 | Integrated Nanosystems, Inc. | Catalyst patterning for nanowire devices |
US20030189202A1 (en) * | 2002-04-05 | 2003-10-09 | Jun Li | Nanowire devices and methods of fabrication |
US6760245B2 (en) * | 2002-05-01 | 2004-07-06 | Hewlett-Packard Development Company, L.P. | Molecular wire crossbar flash memory |
US20040213307A1 (en) * | 2002-07-19 | 2004-10-28 | President And Fellows Of Harvard College | Nanoscale coherent optical components |
US20040036128A1 (en) * | 2002-08-23 | 2004-02-26 | Yuegang Zhang | Multi-gate carbon nano-tube transistors |
US20040036126A1 (en) * | 2002-08-23 | 2004-02-26 | Chau Robert S. | Tri-gate devices and methods of fabrication |
US20040061422A1 (en) * | 2002-09-26 | 2004-04-01 | International Business Machines Corporation | System and method for molecular optical emission |
US6762094B2 (en) * | 2002-09-27 | 2004-07-13 | Hewlett-Packard Development Company, L.P. | Nanometer-scale semiconductor devices and method of making |
US7051945B2 (en) * | 2002-09-30 | 2006-05-30 | Nanosys, Inc | Applications of nano-enabled large area macroelectronic substrates incorporating nanowires and nanowire composites |
US7064372B2 (en) * | 2002-09-30 | 2006-06-20 | Nanosys, Inc. | Large-area nanoenabled macroelectronic substrates and uses therefor |
US7135728B2 (en) * | 2002-09-30 | 2006-11-14 | Nanosys, Inc. | Large-area nanoenabled macroelectronic substrates and uses therefor |
US7233041B2 (en) * | 2002-09-30 | 2007-06-19 | Nanosys, Inc. | Large-area nanoenabled macroelectronic substrates and uses therefor |
US7052588B2 (en) * | 2002-11-27 | 2006-05-30 | Molecular Nanosystems, Inc. | Nanotube chemical sensor based on work function of electrodes |
US6815706B2 (en) * | 2002-12-17 | 2004-11-09 | Hewlett-Packard Development Company, L.P. | Nano optical sensors via molecular self-assembly |
US6888208B2 (en) * | 2003-07-30 | 2005-05-03 | Hewlett-Packard Development Company, L.P. | Square-law detector based on spin injection and nanowires |
US7091120B2 (en) * | 2003-08-04 | 2006-08-15 | Nanosys, Inc. | System and process for producing nanowire composites and electronic substrates therefrom |
US20060006463A1 (en) * | 2004-07-09 | 2006-01-12 | Islam M S | Nanowire device with (111) vertical sidewalls and method of fabrication |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109989101A (en) * | 2019-04-04 | 2019-07-09 | 西京学院 | A kind of indium antimonide nanowire preparation method |
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EP1508161A4 (en) | 2009-08-19 |
EP1522106A2 (en) | 2005-04-13 |
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AU2003260527A8 (en) | 2003-10-20 |
US20080293244A1 (en) | 2008-11-27 |
US6872645B2 (en) | 2005-03-29 |
WO2003085701A2 (en) | 2003-10-16 |
US7651944B2 (en) | 2010-01-26 |
WO2003085701A3 (en) | 2004-12-29 |
US20050230356A1 (en) | 2005-10-20 |
AU2003222134A8 (en) | 2003-10-20 |
EP1522106A4 (en) | 2009-12-16 |
US7151209B2 (en) | 2006-12-19 |
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