US20070241272A1 - Image sensor package structure and method for manufacturing the same - Google Patents
Image sensor package structure and method for manufacturing the same Download PDFInfo
- Publication number
- US20070241272A1 US20070241272A1 US11/404,730 US40473006A US2007241272A1 US 20070241272 A1 US20070241272 A1 US 20070241272A1 US 40473006 A US40473006 A US 40473006A US 2007241272 A1 US2007241272 A1 US 2007241272A1
- Authority
- US
- United States
- Prior art keywords
- chip
- substrate
- electrodes
- image sensor
- sensor region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000004519 manufacturing process Methods 0.000 title claims description 5
- 238000000034 method Methods 0.000 title claims description 5
- 239000000758 substrate Substances 0.000 claims abstract description 32
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14618—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
Abstract
An image sensor package structure includes a substrate, a chip, a plurality of wires, and a frame layer. The substrate has an upper surface, which is formed with first electrodes, and a lower surface, which is formed with second electrodes corresponding to electrically connect to the first electrodes. The chip has a sensor region and a plurality of bonding pads located at the side of the sensor region of the chip, and is mounted on the upper surface of the substrate. The plurality of wires are electrically connected the bonding pads of the chip to the first electrodes of the substrate. The frame layer is inserted with a transparent layer, and is arranged on the upper surface of the substrate to cover the chip.
Description
- 1. Field of the Invention
- The invention relates an image sensor package structure and method for manufacturing the same, and particular to a structure for packaging an image sensor, the size of the package may be decreased.
- 2. Description of the Related Art
- Referring to
FIG. 1 , it is an image sensor structure includes asubstrate 10,frame layer 18, achip 26, a plurality ofwires 28, and a transparent layer 3. - The
substrate 10 has anfirst surface 12 on which plurality offirst electrodes 15 are formed, and asecond surface 14 on which plurality ofsecond electrodes 16 are formed, thefirst electrodes 15 are corresponding to electrically connect to thesecond electrodes 16. - The
frame layer 18 has aupper surface 20 and alower surface 22, thelower surface 22 of theframe layer 18 is adhered on thefirst surface 22 of thesubstrate 10 to form acavity 24. - The
chip 26 is arranged on thefirst surface 12 of thesubstrate 10, and is located within thecavity 24, and is formed withbonding pads 27. - The
wire 28 has afirst end 30 and asecond end 32, thefirst end 30 is electrically connected thebonding pad 27 of thechip 26, thesecond end 30 is electrically connected thefirst electrodes 15 of thesubstrate 10. - The
transparent layer 34 is adhered on theupper surface 20 of theframe layer 18. - An objective of the invention is to provide an image sensor package structure and method for manufacturing the same, and capable of decreasing the size of the package.
- To achieve the above-mentioned object, the invention includes a substrate, a chip, a plurality of wires, and a frame layer. The substrate has an upper surface, which is formed with first electrodes, and a lower surface, which is formed with second electrodes corresponding to electrically connect to the first electrodes. The chip has a sensor region and a plurality of bonding pads located at the side of the sensor region of the chip, and is mounted on the upper surface of the substrate. The plurality of wires are electrically connected the bonding pads of the chip to the first electrodes of the substrate. The frame layer is inserted with a transparent layer, and is arranged on the upper surface of the substrate to cover the chip.
-
FIG. 1 is a schematic illustration showing a conventional image sensor package structure. -
FIG. 2 is a cross-sectional schematic illustration showing an image sensor package of the present invention. -
FIG. 3 is second schematic illustration showing an image sensor package structure of the present invention. - Please refer to
FIG. 2 , an image sensor package structure includes asubstrate 40, achip 42,wires 44, aframe layer 46, and atransparent layer 48. - The
substrate 40 has anupper surface 50, which is formed with afirst electrodes 54, and alower surface 52, which is formed withsecond electrodes 56 corresponding to electrically connect to thefirst electrodes 54. - The
chip 42 has asensor region 58 and a plurality ofbonding pads 60 located at the side of thesensor region 58 of thechip 42, and is mounted on theupper surface 50 of thesubstrate 40. - The plurality of
wires 44 are electrically connected thebonding pads 60 of thechip 42 to thefirst electrodes 54 of thesubstrate 40. - The
frame layer 46 is inserted with atransparent layer 48, and is arranged on theupper surface 50 of thesubstrate 40 to cover thechip 42. - Please refer to
FIG. 3 , the frame layer is formed with aprotection layer 62, and is located under thetransparent layer 48 to surround thesensor region 58 of thechip 42. - Please refer to
FIG. 2 , the method for manufacturing an image sensor package structure includes the step of: - Providing a
substrate 40 has anupper surface 50, which is formed with afirst electrodes 54, and alower surface 52, which is formed withsecond electrodes 56 corresponding to electrically connect to thefirst electrodes 54. - Providing a
chip 42 has asensor region 58 and a plurality ofbonding pads 60 located at the side of thesensor region 58 of thechip 42, and is mounted on theupper surface 50 of thesubstrate 40. - Providing a plurality of
wires 44 are electrically connected thebonding pads 60 of thechip 42 to thefirst electrodes 54 of thesubstrate 40. - Providing a
frame layer 46 is inserted with atransparent layer 48, and is arranged on theupper surface 50 of thesubstrate 40 to cover thechip 42. Theframe layer 46 is formed with aprotection layer 62, and is located under thetransparent layer 48 to surround thesensor region 58 of thechip 42. - While the invention has been described by the way of an example and in terms of a preferred embodiment, it is to be understood that the invention is not limited to the disclosed embodiment. On the contrary, it is intended to cover various modifications. Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications.
Claims (4)
1. An image sensor package structure, the package comprising:
a substrate having an upper surface, which is formed with first electrodes, and a lower surface, which is formed with second electrodes correspond to electrically connect to the first electrodes;
a chip having a sensor region and a plurality of bonding pads located at the side of the sensor region of the chip, and mounted on the upper surface of the substrate;
a plurality of wires electrically connecting the bonding pads of the chip to the first electrodes of the substrate; and
a frame layer inserted with a transparent layer, and arranged on the upper surface of the substrate to cover the chip, wherein the frame layer is formed with a protection layer, which is located under the transparent layer to surround the sensor region of the chip.
2. (canceled)
3. A method for manufacturing an image sensor package structure, comprising the steps of:
providing a substrate having an upper surface, which is formed with first electrodes, and a lower surface, which is formed with second electrodes correspond to electrically connect to the first electrodes;
providing a chip having a sensor region and a plurality of bonding pads located at the side of the sensor region of the chip, and mounted on the upper surface of the substrate;
providing a plurality of wires electrically connecting the bonding pads of the chip to the first electrodes of the substrate; and
providing a frame layer inserted with a transparent layer, and arranged on the upper surface of the substrate to cover the chip, wherein the frame layer is formed with a protection layer, which is located under the transparent layer to surround the sensor region of the chip.
4. (canceled)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/404,730 US20070241272A1 (en) | 2006-04-14 | 2006-04-14 | Image sensor package structure and method for manufacturing the same |
US11/986,227 US20080067334A1 (en) | 2006-04-14 | 2007-11-19 | Image sensor package structure and method for manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/404,730 US20070241272A1 (en) | 2006-04-14 | 2006-04-14 | Image sensor package structure and method for manufacturing the same |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/986,227 Continuation-In-Part US20080067334A1 (en) | 2006-04-14 | 2007-11-19 | Image sensor package structure and method for manufacturing the same |
Publications (1)
Publication Number | Publication Date |
---|---|
US20070241272A1 true US20070241272A1 (en) | 2007-10-18 |
Family
ID=38603957
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/404,730 Abandoned US20070241272A1 (en) | 2006-04-14 | 2006-04-14 | Image sensor package structure and method for manufacturing the same |
Country Status (1)
Country | Link |
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US (1) | US20070241272A1 (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070211163A1 (en) * | 2006-03-10 | 2007-09-13 | Advanced Semiconductor Engineering Inc. | Image Sensor Package and Method for Manufacturing the Same |
US20080309805A1 (en) * | 2007-06-14 | 2008-12-18 | Hon Hai Precision Industry Co., Ltd. | Image sensor package |
DE102009045397B4 (en) * | 2009-10-06 | 2020-09-24 | Robert Bosch Gmbh | Optical device and method of making an optical device |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6696738B1 (en) * | 2002-11-12 | 2004-02-24 | Kingpak Technology Inc. | Miniaturized image sensor |
US20040140420A1 (en) * | 2003-01-16 | 2004-07-22 | Ken Dai | Image sensor having increased number of pixels |
US20040211881A1 (en) * | 2003-04-23 | 2004-10-28 | Pierre Liu | Image sensor capable of avoiding lateral light interference |
US20050013098A1 (en) * | 2003-07-16 | 2005-01-20 | Hsin Chung Hsien | Image sensor and method for manufacturing the same |
US6874227B2 (en) * | 2003-06-03 | 2005-04-05 | Kingpak Technology Inc. | Method for packaging an image sensor |
-
2006
- 2006-04-14 US US11/404,730 patent/US20070241272A1/en not_active Abandoned
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6696738B1 (en) * | 2002-11-12 | 2004-02-24 | Kingpak Technology Inc. | Miniaturized image sensor |
US20040140420A1 (en) * | 2003-01-16 | 2004-07-22 | Ken Dai | Image sensor having increased number of pixels |
US20040211881A1 (en) * | 2003-04-23 | 2004-10-28 | Pierre Liu | Image sensor capable of avoiding lateral light interference |
US6874227B2 (en) * | 2003-06-03 | 2005-04-05 | Kingpak Technology Inc. | Method for packaging an image sensor |
US20050013098A1 (en) * | 2003-07-16 | 2005-01-20 | Hsin Chung Hsien | Image sensor and method for manufacturing the same |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070211163A1 (en) * | 2006-03-10 | 2007-09-13 | Advanced Semiconductor Engineering Inc. | Image Sensor Package and Method for Manufacturing the Same |
US20080309805A1 (en) * | 2007-06-14 | 2008-12-18 | Hon Hai Precision Industry Co., Ltd. | Image sensor package |
DE102009045397B4 (en) * | 2009-10-06 | 2020-09-24 | Robert Bosch Gmbh | Optical device and method of making an optical device |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: KINGPAK TECHNOLOGY INC., TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:HO, MON NAN;TU, HSIU WEN;PENG, CHEN PIN;AND OTHERS;REEL/FRAME:017661/0857 Effective date: 20060320 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |