US20020003100A1

US20020003100A1 - Magazine for semiconductor device

Info

Publication number: US20020003100A1
Application number: US09/897,886
Authority: US
Inventors: Shigeru Sembommatsu
Original assignee: NEC Corp
Current assignee: NEC Corp
Priority date: 2000-07-04
Filing date: 2001-07-05
Publication date: 2002-01-10
Also published as: JP2002019909A; TW504480B

Abstract

A magazine 12 for storing a plurality of packaged semiconductor integrated circuit devices 10, such as BGA packages, having connection terminals 1 located on a lower surface of the package, includes an elongated housing 9 having a pair of opposite end open mouths fitted with a rubber stopper or a bottle stopper. The housing includes a horizontal bottom plate 6, a pair of first side plates 4 extending from opposite edges of the horizontal bottom plate 6 in an inclined upward direction, a pair of second side plates 5 extending vertically upward from an upper edge of the pair of first side plates 4, respectively, and a horizontal upper plate 7 bridging an upper edge of the pair of second side plates 5. The pair of first side plates 4 have an inclined angle α which is necessary and sufficient to ensure that the connection terminals 1 of the semiconductor device 10 never contact with the first side plate 4 and the bottom plate 6 when the semiconductor device 10 is stored in the housing 9.

Description

BACKGROUND OF THE INVENTION

The present invention relates to a semiconductor device magazine for storing in an aligned condition a plurality of packaged semiconductor integrated circuit devices having connection terminals located on a lower surface of the package, as typified by a BGA (ball grid array) package, a PGA (pin grid array) package, and a LGA (land grid array) package. In this specification, the packaged semiconductor integrated circuit device will be simply called a semiconductor device.

A package shape for the semiconductor device includes various shapes. For example, FIG. 6A illustrates a sectional shape of a

BGA semiconductor device

100 a of a small individual mold type, and FIG. 6B illustrates a sectional shape of a BGA semiconductor device 100 of a full-wafer-encapsulated and cut-off type. FIG. 6C illustrates a bottom view of the semiconductor devices shown in FIGS. 6A and 6B. As shown in FIGS. 6A, 6B and 6C, the package shape for the semiconductor device includes the small individual mold type and the full-wafer-encapsulated and cut-off type.

As shown in FIGS. 6A and 6C, the

semiconductor device

100 a of the small individual mold type includes a mold resin 102 covering an upper surface of a substrate 103 and having a trapezoid sectional shape, and a number of connection terminals (balls) 101 arranged in the form of a matrix on a lower surface of the substrate 103. On the other hand, as shown in FIGS. 6B and 6C, the semiconductor device 100 of the full-wafer-encapsulated and cut-off type includes a mold resin 104 covering an upper surface of a substrate 103 and having a rectangular sectional shape, so that a package is constituted of the substrate 103 and the mold resin 104. This package has a rectangular sectional shape. A number of connection terminals (balls) 101 are arranged in the form of a matrix on a lower surface of the substrate 103, similarly to the small individual mold type.

The above mentioned

semiconductor devices

100 and 100 a have a feature that the number of connection terminals is greatly larger than that of a conventional QFP (quad flat package) and less electric noise is generated.

Conventionally, the semiconductor devices of the BGA type, the PGA type and the LGA type are wrapped by use of a tray. However, at the present, since the size and the weight of the semiconductor devices have become decreased, if the tray is used, a mounting speed becomes slow.

FIG. 7A is a cross-sectional view illustrating a conventional magazine accommodating or storing therein the semiconductor devices of the small individual mold type, and FIG. 7B is a cross-sectional view illustrating a conventional magazine accommodating or storing therein the semiconductor devices of the full-wafer-encapsulated and cut-off type. These

conventional magazines

100 and 100 a include a rectangular housing 109 confined by an upper plate 107, a lower plate 106 and a pair of side plates 105. On an inside surface of each side plate 105, a pair of horizontally inward extending guiding rails 114 are formed separately from each other by an appreciable distance in a vertical direction, so that a guiding groove 111 is defined by the pair of horizontally inward extending guiding rails 114 on the inside surface of each side plate 105. By inserting the substrate 103 of the

semiconductor device

100 and 100 a into a pair of grooves 111, the

semiconductor device

100 and 100 a is positioned in the magazine in such a condition that the connection terminals 101 are in no way in contact with the lower plate 106.

As mentioned above, the

housing

109 of the conventional magazine has a pair of grooves 111 provided on the pair of side plates 105 for receiving the substrate 103 in order to prevent the connection terminals 101 of the

semiconductor device

100 and 100 a from being contacted with the housing 109. With this arrangement, it is actually possible to surely prevent the connection terminals 101 of the

semiconductor device

100 and 100 a from being contacted with the housing 109. However, the magazines become dedicated magazines for the specific

limited semiconductor devices

100 and 100 a, respectively.

In the conventional magazine, in addition, the function of the guiding

rails

114 is to support the

semiconductor devices

100 and 100 a and to prevent the dislocation of the

semiconductor devices

100 and 100 a. However, when the width W of a peripheral clear zone of the lower surface of the substrate 103 (FIG. 6C) is small, it is necessary to shorten the height (projection distance) of the guiding rails 114 in order to avoid a contact between the connection terminals 101 and the guiding rails 114. In this condition, however, if the magazine is deformed because of a shock attributable to a falling, there occurs possibility that the connection terminals 101 such as ball terminals or lead pins contact with the guiding rails 114 and/or the substrate 103 falls from the guiding rails 114 thereby to become immobilized. Particularly, this problem becomes remarkable because the width W of the peripheral clear zone of the lower surface of the semiconductor device has become small with a recent microminiaturization of the semiconductor device. Actually, the width W of the peripheral clear zone of the lower surface of the semiconductor device has been reduced to 0.5 mm, so that the tolerance of a magazine molding becomes ±0.3 mm. Therefore, the height of the guiding rails 114 must be on the order of 0.1 mm to 0.2 mm. In this condition, a slight deformation of the magazine frequently results in the falling of the

semiconductor devices

100 and 100 a from the guiding rails 114.

BRIEF SUMMARY OF THE INVENTION

Accordingly, it is an object of the present invention to provide a semiconductor device magazine which has overcome the above mentioned problems of the prior art.

Another object of the present invention is to provide a semiconductor device magazine capable of surely storing semiconductor devices having connection terminals on a lower surface of the package, without possibility that the connection terminals become in contact with an inner surface of the magazine, regardless of the magnitude of the width W of the peripheral clear zone of the lower surface of the package.

Still another object of the present invention is to provide a semiconductor device magazine capable of surely storing semiconductor devices having connection terminals on a lower surface of the package, capable of preventing the falling of the semiconductor devices even if the magazine is deformed by for example a shock.

The above and other objects of the present invention are achieved in accordance with the present invention by a semiconductor device magazine for storing therein a semiconductor device having connection terminals formed on a lower surface of the semiconductor device, the semiconductor device magazine comprising a housing for storing the semiconductor device therein, the housing having at least one pair of inclined walls located to support the semiconductor device interposed between the one pair of inclined walls by the fact that opposite edges of the lower surface of the semiconductor device are abutted against the pair of inclined walls, and in such a condition that the connection terminals are in no contact with any internal wall surface of the housing. Here, the semiconductor device having the connection terminals formed on the lower surface of the semiconductor device can be exemplified by a BGA package, a PGA package and a LGA package.

As seen from the above, in the semiconductor device magazine in accordance with the present invention, the housing has at least a pair of inclined walls which are located to support the semiconductor device having the connection terminals formed on a lower surface of the semiconductor device interposed between the pair of inclined walls by the fact that the opposite edges of the lower surface of the semiconductor device are abutted against the pair of inclined walls and in a condition that the

connection terminals

1 are in no contact with any internal wall of the housing. Therefore, the semiconductor device can be stored in the semiconductor device magazine in accordance with the present invention with no damage to the connection terminals of the semiconductor device.

In addition, even if the semiconductor device magazine in accordance with the present invention is deformed at some degree, since the semiconductor device is supported by the pair of inclined walls differently from the prior art semiconductor device magazine in which each of a pair of opposite edges of the semiconductor device is supported between one pair of guiding rails, there is no possibility that the connection terminals are stained or damaged because of vibration in the course of a transport and/or a falling from the guiding rail.

Furthermore, the semiconductor device magazine in accordance with the present invention is very simple in construction in comparison with the prior art semiconductor device magazine having the pair of guiding rails for supporting the edge of the semiconductor device, the cost for fabricating the magazine can be greatly reduced.

In one preferred embodiment of the semiconductor device magazine, the housing further includes a pair of vertical walls extending vertically upward from an upper end of the one pair of inclined walls, respectively, the pair of vertical walls being separated from each other by such a distance ensuring that when one end of the semiconductor device becomes in contact with one of the pair of vertical walls, the connection terminals are in no contact with any internal wall surface of the housing.

Furthermore, the housing preferably includes a first horizontal wall coupling between a lower end of the one pair of inclined walls and a second horizontal wall coupling between an upper end of the pair of vertical walls, the first horizontal wall being separated from the second horizontal wall by such a distance ensuring that when the semiconductor device becomes in contact with the first horizontal wall, the connection terminals are in no contact with any internal wall surface of the housing.

In another preferred embodiment of the semiconductor device magazine, the housing includes a second pair of inclined walls which are respectively located at positions corresponding to opposite ends of the semiconductor device stored in the housing and which are respectively inclined in directions opposite to respective inclined directions of the first named one pair of inclined walls.

In this embodiment, at the respective positions corresponding to the opposite ends of the semiconductor device stored in the housing, the second pair of inclined walls can be coupled directly to the first named one pair of inclined walls, respectively. Alternatively, at the respective positions corresponding to the opposite ends of the semiconductor device stored in the housing, the second pair of inclined walls are coupled to the first named one pair of inclined walls by a pair of vertical walls, respectively.

Furthermore, the housing preferably includes a first horizontal wall coupling between a lower end of the first named one pair of inclined walls and a second horizontal wall coupling between an upper end of the second pair of inclined walls.

Preferably, each of the inclined walls has an inclined angle not less than 45 degrees. In addition, the housing can be formed of polystrene or polyvinyl chloride.

The above and other objects, features and advantages of the present invention will be apparent from the following description of preferred embodiments of the invention with reference to the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagrammatic cross-sectional view of a first embodiment of the semiconductor device magazine in accordance with the present invention; [0023]
FIG. 2A is a diagrammatic cross-sectional view of the semiconductor device magazine shown in FIG. 1, storing a BGA type semiconductor device; [0024]
FIG. 2B is a diagrammatic perspective view of the semiconductor device magazine shown in FIG. 1, storing the BGA type semiconductor device; [0025]
FIG. 3A is a diagrammatic cross-sectional view of a second embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device; [0026]
FIG. 3B is a diagrammatic cross-sectional view of the second embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device having a different shape; [0027]
FIG. 3C is a diagrammatic cross-sectional view of the second embodiment of the semiconductor device magazine in accordance with the present invention, storing the BGA type semiconductor device in a different storing mode; [0028]
FIG. 4A is a diagrammatic cross-sectional view of a third embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device; [0029]
FIG. 4B is a diagrammatic cross-sectional view of the third embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device having a different shape; [0030]
FIG. 4C is a diagrammatic cross-sectional view of the third embodiment of the semiconductor device magazine in accordance with the present invention, storing the BGA type semiconductor device in a different storing mode; [0031]
FIG. 5 is a diagrammatic cross-sectional view of a fourth embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device; [0032]
FIG. 6A is a diagrammatic cross-sectional view of the conventional semiconductor device of the small individual mold type; [0033]
FIG. 6B is a diagrammatic cross-sectional view of the conventional semiconductor device of the full-wafer-encapsulated and cut-off type; [0034]
FIG. 6C is a bottom view of the semiconductor device shown in FIGS. 6A and 6B; [0035]
FIG. 7A is a diagrammatic cross-sectional view of the conventional semiconductor device magazine storing the semiconductor device of the small individual mold type; and [0036]
FIG. 7B is a diagrammatic cross-sectional view of the conventional semiconductor device magazine storing the semiconductor device of the full-wafer-encapsulated and cut-off type.[0037]

DETAILED DESCRIPTION OF THE INVENTION

Now, embodiments of the semiconductor device magazine in accordance with the present invention will be described with reference to the drawings. [0038]
Referring to FIG. 1, there is shown a diagrammatic cross-sectional view of a first embodiment of the semiconductor device magazine in accordance with the present invention. FIG. 2A is a diagrammatic cross-sectional view of the semiconductor device magazine shown in FIG. 1, storing a BGA type semiconductor device. FIG. 2B is a diagrammatic perspective view of the semiconductor device magazine shown in FIG. 1, storing the BGA type semiconductor device. [0039]
The magazine of the first embodiment, generally designated by the [0040] reference number 12, includes an elongated housing 9 extending in one direction having a pair of opposite open ends each confining a mouth which is fitted with and closed by a rubber stopper (not shown) or a bottle stopper (not shown). By fitting the rubber stopper or the bottle stopper into the mouth of each end of the magazine 12, semiconductor devices 10 stored in the magazine 12 are prevented from dropping from the magazine 12.
The [0041] housing 9 includes a horizontal bottom plate 6 (horizontal wall), a pair of first side plates 4 (inclined side walls) extending from opposite side edges of the horizontal bottom plate 6 in such an inclined upward direction so that a spacing between the pair of inclined side plates 4 increases toward an upward direction, a pair of second side plates 5 (vertical side walls) extending vertically upward from an upper edge of the pair of first side plates 4, respectively, and a horizontal upper plate 7 (horizontal wall) bridging an upper edge of the pair of second side plates 5. The cross-sectional view of this housing 9 is symmetry to a central vertical line.
The [0042] first side plate 4 is inclined to the adjacent second side plate 5 with an inclined angle α which is necessary and sufficient to ensure that connection terminals 1 of the semiconductor device 10 never contact with the first side plate 4 and the bottom plate 6 (any wall surface) when the semiconductor device 10 is stored in the housing 9. In addition, the pair of second side plates 5 are separated from each other by a distance necessary and sufficient to ensure that, even when either side end of the semiconductor device 10 is in contact with the second side plate 5, the connection terminals 1 of the semiconductor device 10 never contact with the first side plate 4 and the bottom plate 6 (the other wall surface). Furthermore, the bottom plate 6 and the upper plate 7 are separated from each other by a distance necessary and sufficient to ensure that, even when the semiconductor device 10 contacts with the upper plate 7 in an inclined condition, the connection terminals 1 of the semiconductor device 10 never contact with the first side plate 4, the second side plate 5 and the bottom plate 6 (the other wall surface).
Thus, the [0043] housing 9 enclosed and confined by the bottom plate 6, the upper plate 7, the first side plates 4 and the second side plates 5, which satisfy the above condition, is formed, and a plurality of semiconductor devices 10 are stored in the housing 9, as shown in FIG. 2B.
Namely, as shown in FIG. 2A, BGA [0044] type semiconductor devices 10 are stored in the magazine 12 of the first embodiment. The semiconductor devices 10 as shown in FIG. 2A are formed by encapsulating an upper surface of a wafer with resin, mounting terminals (balls) 1 on a lower surface of a wafer (a lower surface of the substrate 3), and cutting out the resin-encapsulated wafer into individual chips, and is called the full-wafer-encapsulated and cut-off type semiconductor device, which is the same as the prior art semiconductor device 100 shown in FIG. 6B. Namely, the semiconductor device 10 has a mold resin 2 of a rectangular sectional shape formed on an upper surface of the substrate 3 and a number of connection terminals 1 arranged in the form of a matrix on a lower surface of the substrate 3. The semiconductor devices 10 are stored in the housing 9 in such a condition that opposite edges of the lower surface of the substrate 3 of the semiconductor device 10 are in contact with the first side plates 4, as shown in FIG. 2A.
Furthermore, not only the [0045] BGA semiconductor devices 10 of the full-wafer-encapsulated and cut-off type but also the BGA semiconductor devices 100 a of the small individual mold type as shown in FIG. 6A, which are formed by mounting terminals (balls) 1 on a lower surface of a wafer (a lower surface of the substrate 3), cutting out the wafer into individual chips, and encapsulating each single chip with resin, can be stored in the magazine 12. The small individual mold type BGA semiconductor device includes a mold resin of a trapezoid sectional shape covering an upper surface of a substrate and a number of connection terminals arranged in the form of a matrix on a lower surface of the substrate, as shown in FIGS. 6A and 6C.
As mentioned above, in the [0046] magazine 12 of this first embodiment, since the first side plate 4 is inclined by the angle α, the semiconductor device 10 is interposed between and supported by the pair of first side plates 4 by the fact that the opposite edges of the lower surface of the semiconductor device 10 are abutted against the first side plates 4, in a condition that the connection terminals 1 are in no contact with the first side plates 4 and the bottom plate 6 (any wall surface). Since only the opposite lower edges of the semiconductor device 10 (namely, an apex of an angle when viewed in a cross-section) are abutted against the first side plates 4 as shown in FIG. 2A, a contact area between the semiconductor device 10 and the first side plates 4 is very small, so that the semiconductor device 10 can be smoothly moved in the magazine 12 in a longitudinal direction (one direction) of the magazine 12.
Furthermore, as mentioned above, the pair of [0047] second side plates 5 are separated from each other by a distance necessary and sufficient to ensure that, even when the semiconductor device 10 becomes in contact with one of the second side plates 5, the connection terminals 1 of the semiconductor device 10 never contact with the first side plate 4 and the bottom plate 6 (the other wall surface). Therefore, when the semiconductor device 10 is moved along the first side plate 4, since the semiconductor device 10 is restrained by the pair of second side plates 5, the semiconductor device 10 is prevented from greatly deviating from a center position
Moreover, also as mentioned above, the [0048] bottom plate 6 and the upper plate 7 are separated from each other by a distance necessary and sufficient to ensure that, when the semiconductor device 10 becomes inclined to the upper plate 7, the connection terminals 1 of the semiconductor device 10 never contact with the first side plate 4, the second side plate 5 and the bottom plate 6. Therefore, the connection terminals 1 of the semiconductor device 10 contact with none of the first side plate 4, the second side plate 5 and the bottom plate 6, by action of a restriction based on the upper plate 7.
As seen from the above, in this embodiment of the semiconductor device magazine in accordance with the present invention, since the guiding rails [0049] 14 provided in the prior art magazine are omitted, there does not occur such a situation that the semiconductor device 100 falls from the groove 111, which had occurred because of a deform of the magazine in the prior art magazine.
Furthermore, the inclined angle α of the [0050] first side plate 4 is preferred to be not less than 45 degrees. If the inclined angle α of the first side plate 4 is less than 45 degrees, when a force acts on the magazine 12 from a direction of an upper plate side of the semiconductor devices 10, there is a fear that the magazine 12 is deformed with the result that the semiconductor device 100 becomes immobilized between the pair of first side plates 4. In addition, in the case that the inclined angle α of the first side plate 4 is less than 45 degrees, when a temperature elevates and the magazine 12 expands in a horizontal direction so that the distance between the pair of first side plates 4 becomes large and the semiconductor device 10 falls toward the bottom plate, and thereafter, when the magazine shrinks, the semiconductor device 10 cannot displace or return toward the upper plate 7 because the semiconductor device 100 becomes immobilized between the pair of first side plates 4.
In the embodiment of the semiconductor device magazine, even if the [0051] connection terminals 1 are located to a position near to a peripheral edge of the lower surface of the semiconductor device with the result that the width W of the peripheral clear zone of the lower surface of the semiconductor device is small, since the first side plates 1 are located with the inclined angle α, the semiconductor device 10 can be stored in the housing 9 with no contact between the connection terminals 1 and the first side plates 4 and the bottom plate 6. Therefore, it is possible to prevent contact between the connection terminals 1 such as ball terminals and the side plates 4 and the bottom plate 6. Accordingly, when the semiconductor devices 10 are stored in the magazine 12 in accordance with the present invention and the magazine 12 is transported, it is possible to prevent a damage and a deform caused by a contact to the connection terminals 1 such as the ball terminals and a contamination in the connection terminals 1 such as the ball terminals.
Moreover, since the semiconductor device magazine of this embodiment is simplified in construction in comparison with the prior art semiconductor device magazine, it is possible to reduce the cost for a die used for molding the [0052] magazine 12. In addition, since the prior art magazine has the guiding rails 114, the prior art magazine is formed of an expensive material such as polycarbonate and polyethylene terephtalate having an excellent moldability. However, according to the present invention, since the structure of the magazine 12 is greatly simplified, the magazine 12 can be formed of an inexpensive material such as polystrene (PS) and polyvinyl chloride (PVC). Therefore, the cost for fabricating the magazine 12 can be reduced.
Now, a second embodiment of the semiconductor device magazine in accordance with the present invention will be described. FIG. 3A is a diagrammatic cross-sectional view of the second embodiment of the semiconductor device magazine in accordance with the present invention, storing the BGA [0053] type semiconductor device 10. FIG. 3B is a diagrammatic cross-sectional view of the second embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device of a different shape in a first storing mode. FIG. 3C is a diagrammatic cross-sectional view of the second embodiment of the semiconductor device magazine in accordance with the present invention, storing the BGA type semiconductor device of the different shape in a second storing mode. In FIGS. 3A, 3B and 3C, elements corresponding to those shown in FIGS. 1, 2A and 2B are given the same reference numbers, and explanation will be omitted.
The magazine of this second embodiment, generally designated by the [0054] reference number 12A, is different from the first embodiment in the following points: The horizontal bottom plate 6 (horizontal wall) and a horizontal upper plate 7 a (horizontal wall) have the same width in a horizontal width direction. The pair of second side plates 5 (vertical side walls) are positioned at a position apart outward from opposite side ends of each of the bottom plate 6 and the upper plate 7 a. A pair of third side plates 8 (second inclined side walls) are provided to bridge an upper edge of the pair of second side plates 5 and opposite side ends of the upper plate 7 a.
The second embodiment is the same as the first embodiment in the other point: Namely, a pair of first side plates [0055] 4 (inclined side walls) are provided to bridge a lower edge of the pair of second side plates 5 and opposite side ends of the bottom plate 6.
Therefore, a lower end of the pair of [0056] first side plates 4 are coupled to the lower plate 6. An upper end of the pair of third side plates 8 are coupled to the upper plate 7 a. The first side plates 4 and the pair of third side plates 8 are coupled by the pair of second side plates 5.
At each side end of the [0057] semiconductor device 10, the first side plate 4 and the corresponding third side plate 8 of the housing 9A are inclined opposite to each other. Each third side plate 8 is inclined to the adjacent second side plate 5 with an inclined angle β which is necessary and sufficient to ensure that when the semiconductor device 10 of the full-wafer-encapsulated and cut-off type is stored in the housing 9A in such a condition that the connection terminals 1 are directed toward the third side plates 8, the connection terminals 1 of the semiconductor device 10 never contact with the third side plates 8 and the upper plate 7 a (any wall surface). This inclined angle β is an angle of the third side plate 8 to the second side plate 5, as shown in FIGS. 3A-3C. In this embodiment, the inclined angle β is preferred to be not less than 45 degrees, for the same reason as that for the angle of the first side plate 4 to the second side plate 5.
In this embodiment, as mentioned above, the [0058] first side plate 4 is formed with the inclined angle α at a lower portion of the magazine 12A, and the third side plate 8 is formed with the inclined angle β at an upper portion of the magazine 12A, and further, the second side plates 5 are formed to bridge the first side plates 4 and the third side plates 8. Therefore, the semiconductor device 10 is abutted against the third side plates 8, similar to the first side plate 4. Namely, if the magazine 12A is reversed or turned and if the semiconductor device 10 is inserted into the magazine 12A in a condition that the connection terminals 1 are directed downward, the semiconductor device 10 is interposed between and supported by the pair of third side plates 8 by the fact that opposite edges of the lower surface of the semiconductor device 10 are abutted against the third side plates 8, in a condition that the connection terminals 1 are in no contact with the third side plates 8 and the upper plate 7 a. At this time, since a contact area between the semiconductor device 10 and the magazine 12A is very small, the semiconductor device 10 can be smoothly moved in the magazine 12A in a longitudinal direction (one direction) of the magazine 12A.
In addition, as shown in FIGS. 3B and 3C, the semiconductor device [0059] 10 a of the small individual mold type can be stored in the magazine 12A. In this case, the semiconductor device 10 a is stored in the magazine 12A either in a first storing mode in which the connection terminals 1 are directed toward the bottom plate 6 or in a second storing mode in which the connection terminals 1 are directed toward the upper plate 7 a. Accordingly, the semiconductor devices 10 and 10 a can be stored either in a first direction in which the connection terminals 1 are directed toward the first side plates 4 or in a second direction in which the connection terminals 1 are directed toward the second side plates 8. In addition, when the semiconductor devices 10 and 10 a are stored into the magazine 12A and then transported together with the magazine 12A, if the magazine 12A is revered or turned, the semiconductor devices 10 and 10 a can be inserted into the magazine 12A by inverting the direction of the connection terminals. At this time, since the connection terminals 1 do not contact anywhere within the magazine 12A, the semiconductor devices 10 and 10 a can be transported with no damage. In addition, when the semiconductor devices 10 and 10 a are inserted into the magazine 12A, since the direction of the upper side and the lower side is not limited, the working for inserting the semiconductor device into the magazine becomes easy and therefore workability is elevated.
In this embodiment, the inclined angle α of the [0060] first side plates 4 and the inclined angle β of the third side plates 8 are determined by the height of the semiconductor devices 10 and 10 a stored in the magazine 12A and the width W of a peripheral clear zone of the lower surface of the semiconductor devices 10 and 10 a. Therefore, by making the inclined angle α of the first side plates 4 and the inclined angle β of the third side plates 8 different from each other, two kinds of semiconductor devices 10 and 10 a can be stored in a common magazine 12A. In this case, it is possible to reduce the cost for a die used for molding the magazine 12A. In addition, a wrapping source can be utilized in common to different kinds of semiconductor devices. Furthermore, it is possible to reduce the number of stock management steps for the magazines.
Next, a third embodiment of the semiconductor device magazine in accordance with the present invention will be described. FIG. 4A is a diagrammatic cross-sectional view of the third embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device of the small individual mold type. FIG. 4B is a diagrammatic cross-sectional view of the third embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device of the full-wafer-encapsulated and cut-off type in a first storing mode. FIG. 4C is a diagrammatic cross-sectional view of the third embodiment of the semiconductor device magazine in accordance with the present invention, storing the BGA type semiconductor device of the full-wafer-encapsulated and cut-off type in a second storing mode. In FIGS. 4A, 4B and [0061] 4C, elements corresponding to those shown in FIGS. 3A, 3B and 3C are given the same reference numbers, and explanation will be omitted.
The magazine of this third embodiment, generally designated by the [0062] reference number 12B, is different from the second embodiment only in that the second side plates 5 (vertical wall) are not provided, and the first side plates 4 (inclined wall) are coupled directly to the third side plates 8 (other inclined wall) at opposite end sides of the semiconductor devices stored in a housing 9B. In the other points, the third embodiment is the same as the second embodiment. For example, the semiconductor device 10 a of the small individual mold type is stored in the magazine 12B, as shown in FIG. 4A.
In this embodiment, the spacing in a vertical direction between the [0063] first side plate 4 and the adjoining third side plate 8 decreases toward a joining point between the first side plate 4 and the adjoining third side plate 8. Therefore, when the semiconductor device 10 a is moved along the first side plate 4, the deviation of the semiconductor device 10 a is restrained by the first side plates 4 and the third side plates 8, with the result that the dislocation of the semiconductor device 10 a is prevented. Namely, an advantage similar to that obtained in the first and second embodiments can be obtained.
In addition, as shown in FIGS. 4B and 4C, the [0064] semiconductor device 10 of the full-wafer-encapsulated and cut-off type can be stored in the magazine 12B. In this case, the semiconductor device 10 is stored in the magazine 12B either in a first storing mode in which the connection terminals 1 are directed toward the bottom plate 6 or in a second storing mode in which the connection terminals 1 are directed toward the upper plate 7 a. In addition, by making the inclined angle α of the first side plates 4 and the inclined angle β of the third side plates 8 different from each other, two kinds of semiconductor devices 10 and 10 a can be stored in a common magazine 12B.
Then, a fourth embodiment of the semiconductor device magazine in accordance with the present invention will be described. FIG. 5 is a diagrammatic cross-sectional view of the fourth embodiment of the semiconductor device magazine in accordance with the present invention, storing a BGA type semiconductor device. In FIG. 5, elements corresponding to those shown in FIGS. 3A, 3B and [0065] 3C are given the same reference numbers, and explanation will be omitted.
In the magazine of this fourth embodiment, generally designated by the [0066] reference number 12C, a pair of inclined side plates 4 (inclined wall) extend from opposite side ends of a bottom plate 6 in such an inclined upward direction so that a spacing between the pair of inclined side plates 4 increases toward an upward direction, and an upper plate 7 (horizontal wall) is formed to have their opposite ends coupled to an upper end of the pair of inclined side plates 4, respectively. Thus, a housing 9C is constituted. In the other points, the fourth embodiment is the same as the third embodiment. For example, the semiconductor device 10 of the full-wafer-encapsulated and cut-off type can be stored in the magazine 12C of this embodiment, as shown in FIG. 5. However, the semiconductor device of the small individual mold type can be also stored in the magazine 12C of this embodiment.
This embodiment can be said to be featured in that the kind of semiconductor device that can be stored in the magazine is limited to only one kind of the two kinds of [0067] semiconductor device 10 and 10 a which can be stored in the magazine 12B of the third embodiment and in that the one kind of semiconductor device can be stored in the magazine in only one storing mode. Accordingly, an internal volume of this embodiment can be made smaller than that of the first to third embodiments, with the result that the magazine can be reduced in size, and therefore, the material cost can be correspondingly reduced.
In the semiconductor device magazine in accordance with the present invention, the kind of semiconductor device (of the full-wafer-encapsulated and cut-off type and the small individual mold type) that can be stored in the magazine is in no way limited to only the BGA semiconductor device, but any kind of semiconductor device having connection terminals formed on a lower surface of the semiconductor device can be stored in the semiconductor device magazine in accordance with the present invention. For example, the PGA semiconductor device and the LGA semiconductor device can be stored in the semiconductor device magazine in accordance with the present invention. [0068]
As mentioned above in detail, the semiconductor device magazine in accordance with the present invention comprises a housing having at least a pair of inclined walls which are located to support the semiconductor device having the connection terminals formed on a lower surface of the semiconductor device interposed between the pair of inclined walls by the fact that opposite edges of the lower surface of the semiconductor device are abutted against the pair of inclined walls and in a condition that the [0069] connection terminals 1 are in no contact with any internal wall of the housing. Therefore, the semiconductor device can be stored in the semiconductor device magazine in accordance with the present invention with no damage to the connection terminals of the semiconductor device.
In addition, even if the semiconductor device magazine in accordance with the present invention is deformed at some degree, since the semiconductor device is supported by the pair of inclined walls differently from the prior art semiconductor device magazine in which each of a pair of opposite edges of the semiconductor device is supported between one pair of guiding rails, there is no possibility that the connection terminals are stained or damaged because of vibration in the course of a transport and/or a falling from the guiding rail. [0070]
Furthermore, the semiconductor device magazine in accordance with the present invention is very simple in construction in comparison with the prior art semiconductor device magazine having the pair of guiding rails for supporting the edge of the semiconductor device, the cost for fabricating the magazine can be greatly reduced. [0071]
The invention has thus been shown and described with reference to the specific embodiments. However, it should be noted that the present invention is in no way limited to the details of the illustrated structures but changes and modifications may be made within the scope of the appended claims. [0072]

Claims

1. A semiconductor device magazine for storing therein a semiconductor device having connection terminals formed on a lower surface of the semiconductor device, the semiconductor device magazine comprising a housing for storing said semiconductor device therein, said housing having at least one pair of inclined walls located to support said semiconductor device interposed between said one pair of inclined walls by the fact that opposite edges of said lower surface of said semiconductor device are abutted against the pair of inclined walls, and in such a condition that said connection terminals are in no contact with any internal wall surface of said housing.

2. A semiconductor device magazine claimed in claim 1 wherein said housing further includes a pair of vertical walls extending vertically upward from an upper end of said one pair of inclined walls, respectively, said pair of vertical walls being separated from each other by such a distance ensuring that when one end of said semiconductor device becomes in contact with one of said pair of vertical walls, said connection terminals are in no contact with any internal wall surface of said housing.

3. A semiconductor device magazine claimed in claim 2 wherein said housing further includes a first horizontal wall coupling between a lower end of said one pair of inclined walls and a second horizontal wall coupling between an upper end of said pair of vertical walls, said first horizontal wall being separated from said second horizontal wall by such a distance ensuring that when said semiconductor device becomes in contact with said first horizontal wall, said connection terminals are in no contact with any internal wall surface of said housing.

4. A semiconductor device magazine claimed in claim 1 wherein said housing includes a second pair of inclined walls which are respectively located at positions corresponding to opposite ends of said semiconductor device stored in said housing and which are respectively inclined in directions opposite to respective inclined directions of said one pair of inclined walls.

5. A semiconductor device magazine claimed in claim 4 wherein at the respective positions corresponding to the opposite ends of said semiconductor device stored in said housing, said second pair of inclined walls are coupled directly to said one pair of inclined walls, respectively.

6. A semiconductor device magazine claimed in claim 4 wherein at the respective positions corresponding to the opposite ends of said semiconductor device stored in said housing, said second pair of inclined walls are coupled to said one pair of inclined walls by a pair of vertical walls, respectively.

7. A semiconductor device magazine claimed in claim 4 wherein said housing further includes a first horizontal wall coupling between a lower end of said one pair of inclined walls and a second horizontal wall coupling between an upper end of said second pair of inclined walls.

8. A semiconductor device magazine claimed in claim 5 wherein said housing further includes a first horizontal wall coupling between a lower end of said one pair of inclined walls and a second horizontal wall coupling between an upper end of said second pair of inclined walls.

9. A semiconductor device magazine claimed in claim 6 wherein said housing further includes a first horizontal wall coupling between a lower end of said one pair of inclined walls and a second horizontal wall coupling between an upper end of said second pair of inclined walls.

10. A semiconductor device magazine claimed in claim 1 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

11. A semiconductor device magazine claimed in claim 2 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

12. A semiconductor device magazine claimed in claim 3 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

13. A semiconductor device magazine claimed in claim 4 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

14. A semiconductor device magazine claimed in claim 5 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

15. A semiconductor device magazine claimed in claim 6 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

16. A semiconductor device magazine claimed in claim 7 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

17. A semiconductor device magazine claimed in claim 8 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

18. A semiconductor device magazine claimed in claim 9 wherein each of said inclined walls has an inclined angle of not less than 45 degrees.

19. A semiconductor device magazine claimed in claim 2 wherein said housing is formed of polystrene or polyvinyl chloride.

20. A semiconductor device magazine claimed in claim 4 wherein said housing is formed of polystrene or polyvinyl chloride.