US11796989B2 - Monitoring system and monitoring method - Google Patents

Monitoring system and monitoring method Download PDF

Info

Publication number
US11796989B2
US11796989B2 US17/050,654 US201917050654A US11796989B2 US 11796989 B2 US11796989 B2 US 11796989B2 US 201917050654 A US201917050654 A US 201917050654A US 11796989 B2 US11796989 B2 US 11796989B2
Authority
US
United States
Prior art keywords
monitoring
node
variable
abnormality
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active, expires
Application number
US17/050,654
Other languages
English (en)
Other versions
US20210240174A1 (en
Inventor
Wei Wang
Kojin Yano
Tetsushi Suzuki
Kenichirou OKADA
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Assigned to HITACHI, LTD. reassignment HITACHI, LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: OKADA, Kenichirou, SUZUKI, TETSUSHI, WANG, WEI, YANO, KOJIN
Publication of US20210240174A1 publication Critical patent/US20210240174A1/en
Application granted granted Critical
Publication of US11796989B2 publication Critical patent/US11796989B2/en
Active legal-status Critical Current
Adjusted expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • G05B23/0248Causal models, e.g. fault tree; digraphs; qualitative physics
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/021Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system adopting a different treatment of each operating region or a different mode of the monitored system, e.g. transient modes; different operating configurations of monitored system
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G05B23/0281Quantitative, e.g. mathematical distance; Clustering; Neural networks; Statistical analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management
    • G06Q10/06Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00Administration; Management
    • G06Q10/20Administration of product repair or maintenance
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06QINFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00Systems or methods specially adapted for specific business sectors, e.g. utilities or tourism
    • G06Q50/10Services
    • G06Q50/26Government or public services
    • G06Q50/40
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B15/00Systems controlled by a computer
    • G05B15/02Systems controlled by a computer electric
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0283Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]
US17/050,654 2018-09-27 2019-02-08 Monitoring system and monitoring method Active 2040-09-02 US11796989B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018181281A JP7036697B2 (ja) 2018-09-27 2018-09-27 監視システム及び監視方法
JP2018-181281 2018-09-27
PCT/JP2019/004735 WO2020066052A1 (fr) 2018-09-27 2019-02-08 Système de surveillance et procédé de surveillance

Publications (2)

Publication Number Publication Date
US20210240174A1 US20210240174A1 (en) 2021-08-05
US11796989B2 true US11796989B2 (en) 2023-10-24

Family

ID=69951310

Family Applications (1)

Application Number Title Priority Date Filing Date
US17/050,654 Active 2040-09-02 US11796989B2 (en) 2018-09-27 2019-02-08 Monitoring system and monitoring method

Country Status (4)

Country Link
US (1) US11796989B2 (fr)
EP (1) EP3859472B1 (fr)
JP (1) JP7036697B2 (fr)
WO (1) WO2020066052A1 (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11532132B2 (en) * 2019-03-08 2022-12-20 Mubayiwa Cornelious MUSARA Adaptive interactive medical training program with virtual patients
CN111950936B (zh) * 2020-08-31 2023-08-18 平安国际智慧城市科技股份有限公司 空气质量监测方法、装置、设备及介质
JP7188470B2 (ja) * 2021-01-28 2022-12-13 横河電機株式会社 分析方法、分析プログラムおよび情報処理装置
CN115310567B (zh) * 2022-10-12 2022-12-20 合肥凯泉电机电泵有限公司 一种基于大数据的污水处理设备运行监测系统及方法
CN115422555B (zh) * 2022-11-04 2023-02-28 北京华云安信息技术有限公司 后门程序检测方法、装置、电子设备及存储介质

Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09269217A (ja) 1996-03-29 1997-10-14 Kawasaki Heavy Ind Ltd 鉄道用軌道の異常検知方法および異常検知装置
JPH10238920A (ja) 1997-02-24 1998-09-11 Sanyo Electric Co Ltd 機器の運転状態管理装置
EP1724717A2 (fr) 2001-03-08 2006-11-22 California Institute Of Technology Estimation de la cohérence spatio-temporelle en temps réel pour identification en mode autonome et recherche de l'invariance
US7181374B1 (en) 2001-05-31 2007-02-20 Vanderbilt University Qualitative diagnosis system and method
US20080219544A1 (en) 2007-03-09 2008-09-11 Omron Corporation Factor estimating support device and method of controlling the same, and factor estimating support program
WO2010082322A1 (fr) 2009-01-14 2010-07-22 株式会社日立製作所 Procédé et système de contrôle d'anomalie de dispositif
JP2011070334A (ja) * 2009-09-25 2011-04-07 Hitachi Ltd 異常診断装置及び異常診断方法
US20110131162A1 (en) 2008-03-08 2011-06-02 Tokyo Electron Limited Autonomous biologically based learning tool
WO2011145496A1 (fr) * 2010-05-20 2011-11-24 株式会社日立製作所 Dispositif de diagnostic de contrôle et procédé de diagnostic de contrôle
US20120136629A1 (en) * 2009-06-11 2012-05-31 Kenji Tamaki Apparatus abnormality monitoring method and system
US20120290879A1 (en) 2009-08-28 2012-11-15 Hisae Shibuya Method and device for monitoring the state of a facility
JP2015190970A (ja) * 2014-03-31 2015-11-02 株式会社Ihi 計測値解析装置及び計測値解析方法
JP2016045556A (ja) 2014-08-20 2016-04-04 日本電信電話株式会社 ログ間因果推定装置、システム異常検知装置、ログ分析システム、及びログ分析方法
WO2018140365A1 (fr) 2017-01-24 2018-08-02 Siemens Aktiengesellschaft Système et procédé de technologie d'ingénierie cognitive pour automatisation et commande de systèmes
EP3358508A1 (fr) 2017-02-03 2018-08-08 Kabushiki Kaisha Toshiba Appareil de détection d'anomalies, procédé de détection d'anomalies et programme
US20190095300A1 (en) * 2017-09-27 2019-03-28 Panasonic Intellectual Property Corporation Of America Anomaly diagnosis method and anomaly diagnosis apparatus
CN110275505A (zh) * 2018-03-14 2019-09-24 欧姆龙株式会社 异常检测系统、支持装置以及模型生成方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018181281A (ja) 2017-04-21 2018-11-15 富士通株式会社 ストレージシステム、制御装置及びストレージ装置

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09269217A (ja) 1996-03-29 1997-10-14 Kawasaki Heavy Ind Ltd 鉄道用軌道の異常検知方法および異常検知装置
JPH10238920A (ja) 1997-02-24 1998-09-11 Sanyo Electric Co Ltd 機器の運転状態管理装置
EP1724717A2 (fr) 2001-03-08 2006-11-22 California Institute Of Technology Estimation de la cohérence spatio-temporelle en temps réel pour identification en mode autonome et recherche de l'invariance
US7181374B1 (en) 2001-05-31 2007-02-20 Vanderbilt University Qualitative diagnosis system and method
US20080219544A1 (en) 2007-03-09 2008-09-11 Omron Corporation Factor estimating support device and method of controlling the same, and factor estimating support program
JP2009116842A (ja) 2007-03-09 2009-05-28 Omron Corp 要因推定支援装置およびその制御方法、ならびに要因推定支援プログラム
US20110131162A1 (en) 2008-03-08 2011-06-02 Tokyo Electron Limited Autonomous biologically based learning tool
JP2011517807A (ja) 2008-03-08 2011-06-16 東京エレクトロン株式会社 生物学に基づく自律学習ツール
US20110276828A1 (en) * 2009-01-14 2011-11-10 Kenji Tamaki Apparatus anomaly monitoring method and system
WO2010082322A1 (fr) 2009-01-14 2010-07-22 株式会社日立製作所 Procédé et système de contrôle d'anomalie de dispositif
US20120136629A1 (en) * 2009-06-11 2012-05-31 Kenji Tamaki Apparatus abnormality monitoring method and system
US20120290879A1 (en) 2009-08-28 2012-11-15 Hisae Shibuya Method and device for monitoring the state of a facility
JP2011070334A (ja) * 2009-09-25 2011-04-07 Hitachi Ltd 異常診断装置及び異常診断方法
WO2011145496A1 (fr) * 2010-05-20 2011-11-24 株式会社日立製作所 Dispositif de diagnostic de contrôle et procédé de diagnostic de contrôle
US9378183B2 (en) * 2010-05-20 2016-06-28 Hitachi, Ltd. Monitoring diagnostic device and monitoring diagnostic method
US20170010591A1 (en) * 2014-03-31 2017-01-12 Ihi Corporation Measured value analysis apparatus and measured value analysis method
JP2015190970A (ja) * 2014-03-31 2015-11-02 株式会社Ihi 計測値解析装置及び計測値解析方法
JP2016045556A (ja) 2014-08-20 2016-04-04 日本電信電話株式会社 ログ間因果推定装置、システム異常検知装置、ログ分析システム、及びログ分析方法
WO2018140365A1 (fr) 2017-01-24 2018-08-02 Siemens Aktiengesellschaft Système et procédé de technologie d'ingénierie cognitive pour automatisation et commande de systèmes
EP3358508A1 (fr) 2017-02-03 2018-08-08 Kabushiki Kaisha Toshiba Appareil de détection d'anomalies, procédé de détection d'anomalies et programme
US20190095300A1 (en) * 2017-09-27 2019-03-28 Panasonic Intellectual Property Corporation Of America Anomaly diagnosis method and anomaly diagnosis apparatus
CN110275505A (zh) * 2018-03-14 2019-09-24 欧姆龙株式会社 异常检测系统、支持装置以及模型生成方法

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Extended European Search Report issued in European Application No. 19867453.3 dated May 13, 2022 (10 pages).
International Search Report (PCT/ISA/210) issued in PCT Application No. PCT/JP2019/004735 dated May 7, 2019 with English translation (four (4) pages).
Japanese-language Written Opinion (PCT/ISA/237) issued in PCT Application No. PCT/JP2019/004735 dated May 7, 2019 (six (6) pages).
Yano et al., "Data Modeling Technology in Railway Operation and Maintenance", Creating Smart Rail Services Using Digital Technologies, Sep. 2018, pp. 96-100, vol. 100, Issue No. 5, with English Translation (11 pages).

Also Published As

Publication number Publication date
WO2020066052A1 (fr) 2020-04-02
JP7036697B2 (ja) 2022-03-15
EP3859472B1 (fr) 2023-10-25
EP3859472A1 (fr) 2021-08-04
EP3859472A4 (fr) 2022-06-15
JP2020052714A (ja) 2020-04-02
US20210240174A1 (en) 2021-08-05

Similar Documents

Publication Publication Date Title
US11796989B2 (en) Monitoring system and monitoring method
KR101713985B1 (ko) 예지 정비 방법 및 장치
JP5868216B2 (ja) クラスタリング装置及びクラスタリングプログラム
US8255100B2 (en) Data-driven anomaly detection to anticipate flight deck effects
EP3236398A1 (fr) Système de recommandation de maintenance basé sur une estimation de l'efficacité de la maintenance
JP2020052714A5 (fr)
JP7040851B2 (ja) 異常検知装置、異常検知方法及び異常検知プログラム
US20170097980A1 (en) Detection method and information processing device
JP6875179B2 (ja) システム分析装置、及びシステム分析方法
US10325214B2 (en) Physical quantities prediction apparatus and method
US20070088550A1 (en) Method for predictive maintenance of a machine
WO2018104985A1 (fr) Procédé, programme et système d'analyse d'anomalie
US11093314B2 (en) Time-sequential data diagnosis device, additional learning method, and recording medium
US20180052726A1 (en) Information processing device, information processing method, and recording medium
JP6521096B2 (ja) 表示方法、表示装置、および、プログラム
CN108268689A (zh) 加热元件的状态诊断与评估方法及其应用
JP6489235B2 (ja) システム分析方法、システム分析装置、および、プログラム
JP2017010232A (ja) プラント診断装置及びプラント診断方法
JPWO2019049523A1 (ja) リスク評価装置、リスク評価システム、リスク評価方法、及び、リスク評価プログラム
JP5771317B1 (ja) 異常診断装置及び異常診断方法
JP6915693B2 (ja) システム分析方法、システム分析装置、および、プログラム
KR102108975B1 (ko) 함정설비의 상태기반 정비 지원 장치 및 방법
JP2007164346A (ja) 決定木変更方法、異常性判定方法およびプログラム
KR20160053977A (ko) 모델 적응을 위한 장치 및 방법
JP2023036469A5 (fr)

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

AS Assignment

Owner name: HITACHI, LTD., JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WANG, WEI;YANO, KOJIN;SUZUKI, TETSUSHI;AND OTHERS;REEL/FRAME:054391/0195

Effective date: 20200911

STPP Information on status: patent application and granting procedure in general

Free format text: APPLICATION DISPATCHED FROM PREEXAM, NOT YET DOCKETED

STPP Information on status: patent application and granting procedure in general

Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION

STPP Information on status: patent application and granting procedure in general

Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED

STPP Information on status: patent application and granting procedure in general

Free format text: AWAITING TC RESP, ISSUE FEE PAYMENT VERIFIED

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED

STCF Information on status: patent grant

Free format text: PATENTED CASE