US11019287B2 - Semi-global shutter imager - Google Patents

Semi-global shutter imager Download PDF

Info

Publication number
US11019287B2
US11019287B2 US16/745,763 US202016745763A US11019287B2 US 11019287 B2 US11019287 B2 US 11019287B2 US 202016745763 A US202016745763 A US 202016745763A US 11019287 B2 US11019287 B2 US 11019287B2
Authority
US
United States
Prior art keywords
pixels
block
pixel
time
blocks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US16/745,763
Other versions
US20200228734A1 (en
Inventor
Adrian Kaehler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Magic Leap Inc
Original Assignee
Magic Leap Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Magic Leap Inc filed Critical Magic Leap Inc
Priority to US16/745,763 priority Critical patent/US11019287B2/en
Publication of US20200228734A1 publication Critical patent/US20200228734A1/en
Priority to US17/239,498 priority patent/US11272127B2/en
Application granted granted Critical
Publication of US11019287B2 publication Critical patent/US11019287B2/en
Assigned to CITIBANK, N.A., AS COLLATERAL AGENT reassignment CITIBANK, N.A., AS COLLATERAL AGENT SECURITY INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MAGIC LEAP, INC., MENTOR ACQUISITION ONE, LLC, MOLECULAR IMPRINTS, INC.
Assigned to MAGIC LEAP, INC. reassignment MAGIC LEAP, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: KAEHLER, ADRIAN
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H04N5/3535
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50Control of the SSIS exposure
    • H04N25/53Control of the integration time
    • H04N25/531Control of the integration time by controlling rolling shutters in CMOS SSIS
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50Control of the SSIS exposure
    • H04N25/53Control of the integration time
    • H04N25/533Control of the integration time by using differing integration times for different sensor regions
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75Circuitry for providing, modifying or processing image signals from the pixel array
    • H04N5/3454
    • H04N5/3532
    • H04N5/378

Definitions

  • the present disclosure relates to the field of digital imaging and in particular to a semi-global shutter imager that can capture multiple pixel blocks sequentially but with the pixels in each block captured synchronously.
  • An image sensor generally refers to the part of an image-capturing device (e.g., a camera) that can detect and convey the information required to form an image.
  • the image sensor can typically be a silicon semiconductor on which images are captured.
  • the sensor can be composed of an array of photosensitive diodes (i.e., photosites) that capture photons and converts them to electrons.
  • the buildup of electrons in each photosite can be converted to an electronic signal (e.g., a voltage), which can in turn be converted to digital data representing a picture element or pixel.
  • These elements or pixels can then be used for assembling the final image.
  • the final image can be stored in the camera's memory and retrieved to be viewed on a display and/or further manipulated.
  • a well-designed image sensor allows the camera to have a relatively high-speed frame rate that enables the camera to capture a larger number of images within a short period of time and, at the same time, uphold image quality by minimizing the amount of undesirable effects such as motion artifacts in the result images.
  • This disclosure generally relates to a semi-global shutter imager and mechanism that can capture and process multiple pixel blocks sequentially with the pixels in each block captured synchronously.
  • the sensor elements (or pixels) of the image sensor can be divided into multiple pixel blocks. All pixels in the same block can be exposed to light at the same time. Thereafter, while data from the exposed block of pixels is still being read out, another block of pixels can be exposed. This process can repeat until all pixels are exposed and read out. This can significantly reduce the delay between the exposure of the pixels and when the information captured in the pixels are analyzed, thereby increasing the frame rate (or speed) or the camera.
  • the semi-global imager can also reduce certain forms of undesirable distortions (e.g., motion artifacts) to the result images that can be caused by the sequential exposures of the pixel blocks.
  • undesirable distortions e.g., motion artifacts
  • an image sensor may include a two-dimensional pixel array divided into a plurality of blocks, each of the plurality of blocks comprising pixels arranged in at least two different rows and two different columns, and a shutter that exposes the plurality of blocks sequentially, with all pixels in each block being exposed synchronously.
  • the shutter may, for instance, be electronically controlled.
  • the pixel array may have various configurations.
  • the pixel array may include a rectangular array with M rows of pixels where M is no less than 100, and where a height of each block is at least one twentieth of a combined height of M rows but no more than one fifth of the combined height of M rows.
  • the pixel array may include a rectangular array with N columns where N is no less than 100, and wherein a width of each block is at least one twentieth of a combined width of N columns of pixels but no more than one fifth of the combined width of N columns.
  • Some of the blocks may include different number of pixels in other suitable arrangements and geometric shapes, while some of the blocks may include the same number of pixels.
  • the image sensor may include or be configured for use with a timing control module that transmits a timing signal to each of the blocks, where the timing signal initiates a sequence of exposures of the blocks.
  • the image sensor may include or be configured for use with separate readout electronics for each of the plurality of blocks, where the readout electronics may be capable of receiving and processing electronic signals from the pixels in a corresponding block.
  • Such separate readout electronics may, for instance, include an amplifier that amplifies the electronic signals and an analog-to-digital converter that converts the electronic signal to digital data.
  • the readout electronics may read out electronic signals from a first block of pixels immediately after an exposure of the first block is completed, and an exposure of a second block begins before the readout of the electronic signals from the first block is completed.
  • a method of capturing an image with an image sensor may include dividing a two-dimensional pixel array image area of the image sensor into a plurality of blocks, each of the plurality of blocks comprising pixels arranged in at least two different rows and two different columns, and sequentially exposing the plurality of blocks, with all pixels in each block being exposed synchronously.
  • the method may be used with image sensors of various configurations, such as an image sensor with a two-dimensional pixel array including M rows of pixels, where M is no less than 100, and where a height of each block is at least one twentieth of a combined height of M rows of pixels, but no more than one fifth of the combined height of M rows.
  • the method may be used with an image sensor with a two-dimensional pixel array including N columns, where N is no less than 100 and a width of each block is at least one twentieth of a combined width of N columns of pixels but no more than one fifth of the combined width of N columns.
  • the method may include transmitting a timing signal to each of the blocks, where the timing signal initiates a sequence of exposures of the blocks.
  • the method may also include reading out electronic signals arranged in at least a first block and a second block of the plurality of blocks sequentially.
  • the electronic signals from the first block of pixels may be read out immediately after an exposure of the first block is completed, and an exposure of the second block may begin before the readout of the electronic signals from the first block is completed.
  • there may be a delay between the exposure of the second block and the exposure of the first block where the delay is great enough to allow for a readout of the first block before the exposure of the second block is completed.
  • a digital camera may include an image sensor including a two-dimensional pixel array divided into a plurality of blocks, each of the plurality of blocks including pixels arranged in at least two different rows and at least two different columns; a lens that directs light to the image sensor; a shutter that exposes the plurality of blocks sequentially, with all pixels in each block being exposed synchronously, and a timing control module that controls the timing of a sequence of exposures of the blocks; readout electronics for each of the plurality of blocks where the readout electronics are capable of receiving and/or processing electronic signals from the pixels in a corresponding block; and a camera application-specific integrated circuit (ASIC) that assembles an image from an output of the readout electronics.
  • ASIC camera application-specific integrated circuit
  • FIG. 1 is a block diagram illustrating the exemplary components of a digital camera 100 , according to an embodiment of the disclosure.
  • FIG. 2 a is a block diagram illustrating the exemplary components of a CCD image sensor 200 with a global shutter.
  • FIG. 2 b is a block diagram illustrating the exemplary components of a CMOS image sensor 210 with a rolling shutter.
  • FIG. 3 a block diagram illustrating the exemplary components of an image sensor 300 with a semi-global shutter, according to an embodiment of the disclosure.
  • FIG. 4 illustrates an exemplary timeline of the exposures and readouts of three of the blocks in the semi-global shutter imager of FIG. 3 , according to an embodiment of the disclosure.
  • FIGS. 5 a -5 c illustrate various pixel block configurations suitable for various semi-global shutter imagers, according to an embodiment of the disclosure.
  • the term “digital camera” can refer to any digital image/video capturing device with an image sensor.
  • image sensor and “imager” can be used interchangeably to describe one or more components in a digital camera that can detect and convey the information that forms one or more images.
  • the image sensor can include an image area composed of an array of sensor elements such as photosites.
  • photosite photosensitive diode
  • photodiode are used interchangeably in this document.
  • Each sensor element can also be referred to as a “pixel” of the image sensor.
  • block and “pixel block” can refer to a region in the image area that includes multiple pixels of the image sensor.
  • each block of pixels can be of any size and geometric shape, according to the embodiments of this disclosure.
  • the blocks can be contiguous and/or have the largest practical ratio of area to boundary.
  • image can be used interchangeably to refer to a digital image captured by the image sensor of a digital camera.
  • An image can be a standalone image or a frame of a video.
  • This disclosure generally relates to a semi-global shutter imager and mechanism that can capture and process multiple pixel blocks sequentially with the pixels in each block captured synchronously.
  • the sensor elements (or pixels) of the image sensor can be divided up (or grouped) into multiple pixel blocks. All pixels in the same block can be exposed to light at the same time.
  • the exposure can be achieved by any suitable electrical control over the integrating element. For example, it can involve a combination of tying the charge surface to ground and closing a CMOS transistor from the element to the readout latch. Thereafter, while data from the exposed block of pixels is still being read out, another block of pixels can be exposed. This process can repeat until all pixels are exposed and read out.
  • the semi-global imager can also reduce certain forms of undesirable distortions (e.g., motion artifacts) to the result images that can be caused by the sequential exposures of the pixel blocks.
  • FIG. 1 is a block diagram illustrating the exemplary components of a digital camera 100 , according to an embodiment of the disclosure.
  • the digital camera 100 can include a lens 102 , an image sensor 104 , an Analog-to-Digital (A/D) Converter 106 , a camera Application-Specific Integrated Circuit (ASIC) 108 , a storage device 110 , and one or more input/output (I/O) devices 112 .
  • ASIC Application-Specific Integrated Circuit
  • I/O input/output
  • the image sensor 104 can include a two-dimensional array of sensor elements (e.g., photosites) 114 capable of capturing the light.
  • an electric change can build up in each photosite based on the amount of light captured.
  • the accumulated electric charge can then be transformed into a digital signal (e.g., a digital number) by the A/D Converter 106 .
  • each photosite can read out how much light is hitting the pixel at the moment of exposure and convert that into an electronic signal without storing any charge.
  • the electronic signal can then be digitized by the analog/digital (A/D) Converter 106 and then processed by the camera application-specific integrated circuit (ASIC) 108 to form an image element.
  • ASIC camera application-specific integrated circuit
  • a final image can be assembled when the camera ASIC 108 finishes processing the digital signals embodying the data captured by each and every photosite 114 of the image sensor 104 .
  • the process of forming the image can include the optional step of removing background noise from the result image.
  • the image can be stored in the storage 110 and/or output via the I/O device 112 .
  • the storage device 110 can be any suitable storage device including but not limited to a memory card, hard drive, internal memory, and external storage space such as a cloud storage service.
  • the I/O device 112 can output the image to a display (not shown in FIG. 1 ) of the digital camera 100 or transmit it over a network to another device.
  • FIG. 1 only illustrates some of the exemplary components of the digital camera 100 , which may include other components not shown in FIG. 1 .
  • the digital camera 100 can also include a flash, zoom and focus modules, anti-aliasing filter, battery, and other components commonly found in a digital camera.
  • the camera ASIC 108 can be connected to a central processing unit (CPU) designed to perform operations of the digital camera that are not handled by the camera ASIC 108 .
  • CPU central processing unit
  • Embodiments of the present disclosure are generally directed to the image sensor 104 illustrated in FIG. 1 and the shutter mechanisms associated with the image sensor 104 .
  • the shutter mechanism in a digital camera 100 can control the exposure of the sensor array of the image sensor 104 when an image is taken by the camera 100 .
  • the shutter mechanism can be electronic, mechanical, or a combination of both.
  • a timing mechanism can be built in the camera to control light exposure time for the pixels of the image sensor and, depending on the shutter mechanism, the order in which the pixels are exposed.
  • most digital cameras employ one of two types of shutter mechanisms, either a global shutter or a rolling shutter. As described in the following paragraphs, these two types of shutter mechanisms have their respective advantages and drawbacks.
  • FIG. 2 a is a simplified block diagram illustrating the exemplary components of a CCD image sensor 200 with a global shutter.
  • the CCD image sensor 200 is shown to include a 4 ⁇ 4 two-dimensional pixel array 202 , although it should be understood that the image sensor can include any number of columns and rows of pixels aligned in any configuration, or pixels arranged in any suitable configuration. In fact, it is not uncommon for a CCD image sense to have hundreds or even thousands of rows and/or columns of pixels. Each pixel can correspond to a photosite of the image sensor 200 and be capable of capturing photons.
  • the pixels 202 can be connected to an electron transfer register 204 , which can in turn be connected to readout electronics 206 that can include, but are not limited to, an amplifier and A/D converter. It should also be understood that the CCD image sensor 200 can include other components that are omitted from FIG. 2 a for clarity purposes.
  • the global shutter of the imager 200 of FIG. 2 a can operate such that when the shutter is “open,” light can reach the entire sensor array of the imager 200 for a predetermined period of time (shutter time or exposure time). During that time, all pixels 202 of the image sensor 200 can capture light (e.g., accumulate charge) in parallel. When the shutter is blocked, light can no longer reach the sensor and the pixels can become inactive.
  • the global shutter in a CCD digital camera can be electronically controlled in order to control the exposure.
  • the signals collected in the pixels can be transferred, for example, one pixel at a time, to the electron transfer register 204 , from where they can be read out and processed by the readout electronics 206 .
  • the process can include amplifying the signals and/or converting them into a digital format (e.g., digital numbers), which can form the result image.
  • the result image can include a number of keypoints, which can be defined by a small section of the image (e.g., a 5 ⁇ 5 or 10 ⁇ 10 pixel block) that includes one or more highly localizable and recognizable features of the image.
  • the keypoints can be produced by processing one or more of the raw pixels.
  • Each keypoint can include a descriptor that describes the keypoint so that it can be recognized in the different frames of a series of images taken consecutively. The movement of the camera and the direction in which it is pointing can be determined by matching the various keypoints from the different frames. This approach is often used when implementing SLAM (simultaneous localization and mapping) algorithms.
  • SLAM simultaneous localization and mapping
  • This sequential charge-transfer approach to the electron transfer register 204 and the readout electronics 206 employed by a global shutter imager can be time-consuming, especially if the image sensor includes a large number of pixels, because the data from each pixel of the imager has to be read out sequentially. That can mean that the delay between the exposure of the last pixels (along with all other pixels in a global shutter imager) and when these pixels can be analyzed (i.e., after all other pixels have been analyzed) can be significant. In other words, when information read out from these last pixels is finally processed, it may not necessarily reflect the current position of the camera with respect to a scene accurately if there was relative movement between the camera and the scene.
  • a global shutter allows a CCD image sensor to capture an entire image at the exact same moment by exposing all pixels simultaneously, one of the advantages of the global shutter is that the result image can usually have relatively high quality and be free of significant undesirable effects such as motion artifacts. All the keypoints (e.g., small pixel blocks) can be kept intact and easily identifiable in a series of consecutive images.
  • a second type of shutter mechanism can typically be found in digital cameras with complementary metal-oxide-semiconductor (CMOS) image sensors.
  • CMOS complementary metal-oxide-semiconductor
  • a rolling shutter can allow individual pixels or individual columns/rows of pixels to be exposed sequentially so that the information at a first pixel (or a first column/row of pixels) can be read out while the next pixel (or next column/row of pixels) is being exposed to light.
  • the CMOS image sensors can achieve this rolling effect by turning on/off the pixels (or columns/rows of pixels) systematically in a predetermined order.
  • FIG. 2 b is a block diagram illustrating the exemplary components of a CMOS image sensor 210 with a rolling shutter.
  • the CMOS image sensor 210 is shown to include a 4 ⁇ 4 two-dimensional pixel array, although it should be understood that the image sensor can have any number of columns and rows of pixels aligned in any configuration, or arranged in any suitable configuration.
  • Each pixel 211 , 212 , 213 of the two-dimensional pixel array of FIG. 2 b can be a photodiode capable of converting light into electronic signals.
  • a grid of conductive interconnects 214 , 218 overlaying the image sensor 210 can connect the pixels by rows and columns for applying timing and readout signals.
  • the interconnects can include row signal lines (collectively 214 ) for transmitting timing signals from a clock and timing control module 216 to each pixel (or each row/column of pixels).
  • the timing signal can control when each individual pixel or row of pixels is exposed to light and also when the electronic signals from each pixel are read out.
  • the interconnects can also include vertical output lines (collectively as 218 ) for reading out the signals from the pixels and transmitting them to readout electronics (collectively as 220 ) for further processing. As illustrated in FIG. 2 b , each output line can be connected to separate readout electronics 220 .
  • the readout electronics 220 for each output line can include, for example, an amplifier and A/D converter, which can amplify and convert the signals into a digital format (e.g., digital numbers). The digital information can be used to assemble a final image.
  • a digital format e.g., digital numbers
  • the digital information can be used to assemble a final image.
  • at least some of the readout electronics 220 can be embedded in the individual pixels of the image sensor. It should also be understood that the CMOS image sensor 210 of FIG. 2 b can include other components that are omitted from the figure for purpose of clarity.
  • This architecture of the CMOS sensor 210 allows each of its pixels 212 (or each row/column of pixels) to be turned on/off independently and the signals from the pixels (or rows/columns of pixels) to be read out sequentially.
  • the clock and timing control module 216 can send out timing signals to the individual pixels (or individual rows/columns of pixels) to control the timing of their exposure. As soon as one pixel is exposed, its value can be read out. There is virtually no delay between the exposure and the readout.
  • the shuttering effect with regard to each pixel (or row/column of pixels) can be programmed to occur on a rolling basis across all pixels.
  • the second pixel 212 can be finishing its capturing process.
  • the third pixel 213 can be capturing light.
  • every pixel (or row of pixels) is read out a bit later than every other pixel (or the next row of pixels). Every pixel (or row) readout can be skewed relative to its neighbor by a fraction of, for example, a microsecond.
  • the rolling shutter staggers the exposure time for the individual pixels (or individual rows/columns of pixels), the information captured by different pixels will be captured at different moments in time. If there are relative movements between objects in the scene being captured and the camera, the result image can have noticeable motion artifacts such as wobble, skew, smear, etc. due to the staggered exposure of the different pixels. This is one of the drawbacks of a rolling shutter imager.
  • one or more keypoints may be distorted beyond recognition as a result of not all the pixels in a keypoint is exposed at the same time. The distorted keypoints may no longer be able to identify the corresponding features in a series of consecutive frames, thus affecting the camera's ability to track its own movement or the movement of an object being captured.
  • both of the above-discussed shutter mechanisms have significant drawbacks: the global shutter imagers can cause delays between pixel exposure and analysis and the rolling shutter imagers can cause undesirable effects (e.g., distortions) to the resultant images.
  • the following embodiments disclose image sensors with a third type of shutter mechanism, referred to herein as a “semi-global shutter.”
  • a semi-global shutter can reduce the delays between pixel exposure and analysis while reducing certain forms of undesirable distortions.
  • image sensors with semi-global shutters can divide (or group) its two-dimensional pixel array into multiple pixel blocks, each block including multiple pixels in a region of the image area.
  • a semi-global shutter can allow all pixels in the same block to be exposed simultaneously and read out as a group.
  • semi-global shutters may be able to capture images free of motion artifacts, at least within each pixel block.
  • the blocks can be exposed and readout on a rolling basis. That is, while data from one block of pixels is read out and processed, the next block of pixels can be exposed. This can allow the blocks to be exposed in an overlapping or sequential manner, which can significantly reduce or eliminate the delay between consecutive exposures that a global shutter imager typically suffer. This can provide speed advantages.
  • semi-global shutters can reduce the amount of motion artifacts that can often be associated with images taken with rolling shutter imagers. In various embodiments, this can be achieved by dividing the pixels into the optimal number of pixel blocks according the requirements and/or intended usage of the camera.
  • a rolling shutter is typically programmed to expose and read out one pixel or one row/column of pixels at a time. For an image sensor with a large number of pixels (or rows of pixels), the difference in the exposure time of each pixel or row of pixels caused by the rolling exposure can be substantial, resulting in easily-noticeable motion artifacts in the final images.
  • a semi-global shutter can roll through blocks of multiple rows/columns of pixels at a time.
  • the amount of potential motion artifacts could effectively be reduced by a factor of about ten compared to a rolling shutter that rolls through the pixels one row at a time.
  • the pixel blocks can be defined to achieve a balance between frame rate and image quality for any particular camera with a semi-global shutter images.
  • FIG. 3 is a block diagram illustrating the exemplary components of an image sensor 300 with a semi-global shutter.
  • the image area of the sensor 300 can be divided into 9 pixel blocks in a 3 ⁇ 3 layout.
  • the top row can include pixel blocks 301 , 302 , 303 .
  • Each block can include multiple pixels.
  • An enlarged view of block 303 shows that block 303 includes a 4 ⁇ 4 array of pixels.
  • each block can include the same number of pixels arranged in the same formation.
  • the disclosure is not so limited and in other embodiments the blocks can include different numbers and/or arrangements of pixels. Every pixel 312 in the blocks can be a sensor element (i.e., photosite) capable of converting light into electronic signals.
  • Every pixel 312 in the blocks can be a sensor element (i.e., photosite) capable of converting light into electronic signals.
  • a number of block signal lines can transmit timing signals from a clock and timing control module 308 to each of the nine pixel blocks.
  • the timing signal can control when each pixel block is exposed to light and also when the electronic signals from the pixel blocks are read out.
  • FIG. 3 Although only three block signal lines are shown in FIG. 3 , it should be understood that every pixel block may be separately connected to the clock and timing control module 308 and can be triggered independently.
  • a number of output lines 306 can transmit the electronic signals from the pixels in each pixel block to readout electronics 316 for processing. Only three vertical lines are marked as output lines 306 in FIG. 3 for clarity purposes.
  • every pixel block may be separately connected to the readout electronics 316 and the signals from each pixel block can be read out in parallel.
  • the readout electronics 316 in this embodiment can be designed to process signals received from each of the nine pixel blocks in parallel.
  • the readout electronics 316 can include nine separate submodules each responsible for processing signals from one of the nine pixel blocks.
  • submodules 321 , 322 , 323 can readout signals from pixel blocks 301 , 302 , 303 respectively.
  • Each submodule can include, for example, an amplifier and A/D converter for amplifying and converting the signals into a digital format (e.g., digital numbers), respectively.
  • the digital information can be processed to assemble a final image.
  • the semi-global shutter imager 300 of FIG. 3 can include other components that are omitted from the figure for clarity purposes.
  • the exemplary arrangement schematically shown in FIG. 3 may be expanded for any suitable number of pixel blocks and their respective submodules.
  • the semi-global shutter can be programmed to expose the pixel blocks on a rolling basis. For example, within the same pixel block, all the pixels can be exposed simultaneously and the signals from each pixel in the pixel block can be read out one pixel at a time and transferred over one of the output lines to a corresponding submodule in the readout electronics 316 . Each pixel block may not be exposed again until the readout is completed. However, while the first pixel block 301 is being read out, a second pixel block 302 can be exposed. Similarly, while the signals from the pixels in the second pixel block 302 are being read out, a third pixel block 303 can be exposed. This overlapping in exposure and readout of the different blocks can minimize or eliminate the delays that typically occur between exposures in a global shutter imager.
  • FIG. 4 illustrates an exemplary timeline of the exposures (top) and readouts (bottom) of three of the pixel blocks 301 , 302 , 303 in the semi-global shutter imager 300 of FIG. 3 .
  • the exposure and readout of each block 301 , 302 , 303 can be sequential, but the triggering of successive blocks can be overlapping.
  • Each pixel block can be exposed slightly after its predecessor, with the exposure delay allowing for readout of one or more previously-exposed pixel blocks before the current pixel block completes its exposure.
  • exposure of pixel block 302 in the sequence may be triggered before the readout time for the previous pixel block (e.g., pixel block 301 ) can be completed.
  • the exposure of block pixel 303 may be triggered before the readout time for block 302 can be completed. This can increase the use of the output digital transfer bandwidth from the imager.
  • all the pixel blocks (including the six not shown in the timeline of FIG. 4 ) complete a cycle of exposure and readout.
  • the first block i.e., block 301 ) can be exposed again without any delay.
  • the pixel blocks can be triggered sequentially, in which each block can begin its exposure only after the prior pixel block has completed its exposure. For example, this can be suitable for computer vision applications, as blurring effects from motion may not include identical sub-windows of integration time. Regardless of whether overlapping or sequential triggering is implemented, the pixel blocks can be read out immediately after their exposure time is complete.
  • the information generated by a semi-global shutter imager can be more accurate in reflecting the location and/or movement of the camera and/or scene being captured than a global-shutter imager of the same pixel resolution, which would require the entire image to be readout before information from the pixels can be analyzed.
  • One potential delay in a semi-global shutter imager may occur when the signals from individual pixels in the same block are read out. However, this delay can be significantly shorter than the delay in a comparable global shutter imager.
  • the delay on a global shutter imager is 15 milliseconds for the pixels read out last
  • the delay on a semi-global shutter imager for the same pixels (or any of the last pixels in each block) is only 1.5 milliseconds if the semi-global shutter imager is divided into ten pixel blocks of the same size. Accordingly, the images captured with semi-global shutter imagers may be superior for machine readable images such as those used for tracking keypoints in an image.
  • both semi-global shutters and rolling shutters can capture an image by scanning across the scene rather than taking a snapshot of the entire scene
  • semi-global shutter can achieve better image quality than a rolling shutter when there is relative movement between the camera and the scene for some applications.
  • the number of pixel blocks in a semi-global shutter imager can be much lower than the number of pixels or rows in a rolling shutter imager.
  • the motion artifacts in the final image can be confined. The only regions in an image that may be affected by the sequential exposure of the pixel blocks are the boundaries between the blocks.
  • motion artifacts can appear anywhere on an image taken by a camera with rolling shutter imager because the rolling shutter rolls through the pixels one row at a time.
  • these images may be suitable for machine readable images such as those used for tracking keypoints in an image.
  • a 9 ⁇ 9 pixel array of a semi-global shutter imager can be divided into three pixel blocks each including three rows of pixels, resulting in two boundaries between the three pixel blocks. If the same 9 ⁇ 9 pixel array is read out row by row using a rolling shutter, there are eight boundaries between the nine rows. That corresponds to significantly more areas that may be affected by motion artifacts in the images taken with the rolling shutter imager than those taken with the semi-global shutter imager. In addition, the fewer boundaries in the semi-global shutter can also mean that fewer keypoints would get distorted beyond recognition when the shutter rolls through the pixel blocks.
  • a semi-global shutter can divide the image array into any suitable number of pixel blocks and each pixel block can have any suitable number of pixels.
  • the number of pixel blocks can be set to both achieve a shorter delay between pixel exposure and analysis than a comparable global shutter imager and be less prone to certain forms of distortions in the result images than a comparable rolling shutter imager. For example, one might wish to divide a 1000 ⁇ 1000 pixel image area of a semi-global shutter imager into 10 blocks (e.g., each a 100 ⁇ 1000 block).
  • the rolling shutter effect e.g., motion artifacts
  • the rolling shutter effect can only be an issue at the boundaries between the pixel blocks rather than throughout the image area as would be the case in a rolling shutter imager.
  • a semi-global shutter imager For cameras that require a short delay between pixel exposure and analysis, it would be ideal to have a semi-global shutter imager having an image area divided into a large number of pixel blocks, each including fewer pixels. In contrast, for cameras that favor image quality (e.g., minimizing certain forms of distortion) over shorter periods of delay, a semi-global shutter imager with a small number of pixel blocks can be more desirable.
  • a semi-global imager may include pixel blocks of any suitable geometric shape and arrangement. While FIG. 3 illustrates one embodiment in which the exemplary blocks are squares of the same size, FIGS. 5 a -5 c illustrate other exemplary divisions of pixel blocks suitable for various semi-global shutter imagers.
  • FIG. 5 a illustrates an image area divided horizontally into five (or N number of) rectangular pixel blocks 510 , each including the same number of rows of pixels.
  • FIG. 5 b illustrates an image area divided vertically into five (or M number of) pixel blocks 520 , each having the same number of columns of pixels.
  • FIG. 5 c illustrates a configuration of five pixel blocks 530 that are of different shapes and/or sizes.
  • the number and/or geometric shape of the pixel blocks can be optimized so that the areas between the pixel blocks are kept to a minimum. This can provide significant advantage in image quality for a semi-global shutter imager than a rolling shutter imager.
  • a semi-global shutter can be implemented by assembling multiple relatively low-resolution imagers in the same configuration (e.g., each block in FIG. 3 substituted by a standalone low resolution imager). These relatively low-resolution imagers can have their triggers staggered in time and controlled by a central controller. Each imager can individually operate at a pixel clock rate such that the transmission per pixel block is inversely a function of the size of the imager. In one embodiment, when cutting the wafer for the low-resolution imagers, the dies for the individual imagers may not be separated by the cutting.

Abstract

This disclosure is directed to an image sensor. The image sensor includes a two-dimensional pixel array divided into a plurality of blocks, each of the plurality of blocks comprising pixels arranged in at least two different rows and two different columns, and a shutter mechanism that exposes the plurality of blocks sequentially, with all pixels in each block being exposed synchronously.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser. No. 15/916,250, filed Mar. 8, 2018, which is a continuation of U.S. patent application Ser. No. 15/159,491, filed May 19, 2016, which claims benefit of U.S. Provisional Patent Application No. 62/163,730, filed on May 19, 2015, entitled “SEMI-GLOBAL SHUTTER IMAGER”, of which are hereby incorporated by reference in their entirety.
FIELD OF THE INVENTION
The present disclosure relates to the field of digital imaging and in particular to a semi-global shutter imager that can capture multiple pixel blocks sequentially but with the pixels in each block captured synchronously.
BACKGROUND OF THE INVENTION
An image sensor (or imager) generally refers to the part of an image-capturing device (e.g., a camera) that can detect and convey the information required to form an image. In a digital camera, the image sensor can typically be a silicon semiconductor on which images are captured. Structurally, the sensor can be composed of an array of photosensitive diodes (i.e., photosites) that capture photons and converts them to electrons. The buildup of electrons in each photosite can be converted to an electronic signal (e.g., a voltage), which can in turn be converted to digital data representing a picture element or pixel. These elements or pixels can then be used for assembling the final image. The final image can be stored in the camera's memory and retrieved to be viewed on a display and/or further manipulated.
Ideally, a well-designed image sensor allows the camera to have a relatively high-speed frame rate that enables the camera to capture a larger number of images within a short period of time and, at the same time, uphold image quality by minimizing the amount of undesirable effects such as motion artifacts in the result images.
BRIEF SUMMARY OF THE INVENTION
This disclosure generally relates to a semi-global shutter imager and mechanism that can capture and process multiple pixel blocks sequentially with the pixels in each block captured synchronously. The sensor elements (or pixels) of the image sensor can be divided into multiple pixel blocks. All pixels in the same block can be exposed to light at the same time. Thereafter, while data from the exposed block of pixels is still being read out, another block of pixels can be exposed. This process can repeat until all pixels are exposed and read out. This can significantly reduce the delay between the exposure of the pixels and when the information captured in the pixels are analyzed, thereby increasing the frame rate (or speed) or the camera. In addition, by setting an optimal number of pixel blocks for a given semi-global shutter image sensor and exposing all pixels in each pixel block at the same time, the semi-global imager can also reduce certain forms of undesirable distortions (e.g., motion artifacts) to the result images that can be caused by the sequential exposures of the pixel blocks.
Generally, an image sensor may include a two-dimensional pixel array divided into a plurality of blocks, each of the plurality of blocks comprising pixels arranged in at least two different rows and two different columns, and a shutter that exposes the plurality of blocks sequentially, with all pixels in each block being exposed synchronously. The shutter may, for instance, be electronically controlled. The pixel array may have various configurations. For example, the pixel array may include a rectangular array with M rows of pixels where M is no less than 100, and where a height of each block is at least one twentieth of a combined height of M rows but no more than one fifth of the combined height of M rows. As another example, the pixel array may include a rectangular array with N columns where N is no less than 100, and wherein a width of each block is at least one twentieth of a combined width of N columns of pixels but no more than one fifth of the combined width of N columns. Some of the blocks may include different number of pixels in other suitable arrangements and geometric shapes, while some of the blocks may include the same number of pixels.
In some variations, the image sensor may include or be configured for use with a timing control module that transmits a timing signal to each of the blocks, where the timing signal initiates a sequence of exposures of the blocks. Furthermore, the image sensor may include or be configured for use with separate readout electronics for each of the plurality of blocks, where the readout electronics may be capable of receiving and processing electronic signals from the pixels in a corresponding block. Such separate readout electronics may, for instance, include an amplifier that amplifies the electronic signals and an analog-to-digital converter that converts the electronic signal to digital data. Furthermore, in one variations of the image sensor, the readout electronics may read out electronic signals from a first block of pixels immediately after an exposure of the first block is completed, and an exposure of a second block begins before the readout of the electronic signals from the first block is completed. In another variation, there may be delay between the exposure of a second block and the exposure of a first block, where the delay is great enough to allow for a readout of the first block before the second block completes its exposure.
Generally, a method of capturing an image with an image sensor may include dividing a two-dimensional pixel array image area of the image sensor into a plurality of blocks, each of the plurality of blocks comprising pixels arranged in at least two different rows and two different columns, and sequentially exposing the plurality of blocks, with all pixels in each block being exposed synchronously. The method may be used with image sensors of various configurations, such as an image sensor with a two-dimensional pixel array including M rows of pixels, where M is no less than 100, and where a height of each block is at least one twentieth of a combined height of M rows of pixels, but no more than one fifth of the combined height of M rows. As another example, the method may be used with an image sensor with a two-dimensional pixel array including N columns, where N is no less than 100 and a width of each block is at least one twentieth of a combined width of N columns of pixels but no more than one fifth of the combined width of N columns.
The method may include transmitting a timing signal to each of the blocks, where the timing signal initiates a sequence of exposures of the blocks. The method may also include reading out electronic signals arranged in at least a first block and a second block of the plurality of blocks sequentially. In one variation, the electronic signals from the first block of pixels may be read out immediately after an exposure of the first block is completed, and an exposure of the second block may begin before the readout of the electronic signals from the first block is completed. Furthermore, there may be a delay between the exposure of the second block and the exposure of the first block where the delay is great enough to allow for a readout of the first block before the exposure of the second block is completed.
Generally, a digital camera may include an image sensor including a two-dimensional pixel array divided into a plurality of blocks, each of the plurality of blocks including pixels arranged in at least two different rows and at least two different columns; a lens that directs light to the image sensor; a shutter that exposes the plurality of blocks sequentially, with all pixels in each block being exposed synchronously, and a timing control module that controls the timing of a sequence of exposures of the blocks; readout electronics for each of the plurality of blocks where the readout electronics are capable of receiving and/or processing electronic signals from the pixels in a corresponding block; and a camera application-specific integrated circuit (ASIC) that assembles an image from an output of the readout electronics.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a block diagram illustrating the exemplary components of a digital camera 100, according to an embodiment of the disclosure.
FIG. 2a is a block diagram illustrating the exemplary components of a CCD image sensor 200 with a global shutter.
FIG. 2b is a block diagram illustrating the exemplary components of a CMOS image sensor 210 with a rolling shutter.
FIG. 3 a block diagram illustrating the exemplary components of an image sensor 300 with a semi-global shutter, according to an embodiment of the disclosure.
FIG. 4 illustrates an exemplary timeline of the exposures and readouts of three of the blocks in the semi-global shutter imager of FIG. 3, according to an embodiment of the disclosure.
FIGS. 5a-5c illustrate various pixel block configurations suitable for various semi-global shutter imagers, according to an embodiment of the disclosure.
DETAILED DESCRIPTION OF THE INVENTION
In the following description of preferred embodiments, reference is made to the accompanying drawings which form a part hereof, and in which it is shown by way of illustration specific embodiments which can be practiced. It is to be understood that other embodiments can be used and structural changes can be made without departing from the scope of the embodiments of this disclosure.
As used herein, the term “digital camera” can refer to any digital image/video capturing device with an image sensor. The terms “image sensor” and “imager” can be used interchangeably to describe one or more components in a digital camera that can detect and convey the information that forms one or more images. The image sensor can include an image area composed of an array of sensor elements such as photosites. The terms “photosite,” “photosensitive diode,” and “photodiode” are used interchangeably in this document. Each sensor element can also be referred to as a “pixel” of the image sensor. The terms “block” and “pixel block” can refer to a region in the image area that includes multiple pixels of the image sensor. It should be noted that each block of pixels can be of any size and geometric shape, according to the embodiments of this disclosure. In the preferred embodiments, the blocks can be contiguous and/or have the largest practical ratio of area to boundary. The terms “image,” “result image,” and “final image” can be used interchangeably to refer to a digital image captured by the image sensor of a digital camera. An image can be a standalone image or a frame of a video.
This disclosure generally relates to a semi-global shutter imager and mechanism that can capture and process multiple pixel blocks sequentially with the pixels in each block captured synchronously. The sensor elements (or pixels) of the image sensor can be divided up (or grouped) into multiple pixel blocks. All pixels in the same block can be exposed to light at the same time. The exposure can be achieved by any suitable electrical control over the integrating element. For example, it can involve a combination of tying the charge surface to ground and closing a CMOS transistor from the element to the readout latch. Thereafter, while data from the exposed block of pixels is still being read out, another block of pixels can be exposed. This process can repeat until all pixels are exposed and read out. This can significantly reduce the delay between the exposure of the pixels and when the information captured in the pixels are analyzed. In addition, by setting an optimal number of pixel blocks for a given image sensor and exposing all pixels in each pixel block at the same time, the semi-global imager can also reduce certain forms of undesirable distortions (e.g., motion artifacts) to the result images that can be caused by the sequential exposures of the pixel blocks.
FIG. 1 is a block diagram illustrating the exemplary components of a digital camera 100, according to an embodiment of the disclosure. The digital camera 100 can include a lens 102, an image sensor 104, an Analog-to-Digital (A/D) Converter 106, a camera Application-Specific Integrated Circuit (ASIC) 108, a storage device 110, and one or more input/output (I/O) devices 112. When a shutter button (not shown in FIG. 1) on the camera 100 is pressed, light can pass through the lens 102 and reach the image sensor 104. The image sensor 104 can include a two-dimensional array of sensor elements (e.g., photosites) 114 capable of capturing the light. In certain types of image sensors (e.g., CCD sensors), an electric change can build up in each photosite based on the amount of light captured. The accumulated electric charge can then be transformed into a digital signal (e.g., a digital number) by the A/D Converter 106. In other types of image sensors (e.g., CMOS sensors), each photosite can read out how much light is hitting the pixel at the moment of exposure and convert that into an electronic signal without storing any charge. The electronic signal can then be digitized by the analog/digital (A/D) Converter 106 and then processed by the camera application-specific integrated circuit (ASIC) 108 to form an image element.
A final image can be assembled when the camera ASIC 108 finishes processing the digital signals embodying the data captured by each and every photosite 114 of the image sensor 104. The process of forming the image can include the optional step of removing background noise from the result image. The image can be stored in the storage 110 and/or output via the I/O device 112. The storage device 110 can be any suitable storage device including but not limited to a memory card, hard drive, internal memory, and external storage space such as a cloud storage service. The I/O device 112 can output the image to a display (not shown in FIG. 1) of the digital camera 100 or transmit it over a network to another device.
It should be understood that FIG. 1 only illustrates some of the exemplary components of the digital camera 100, which may include other components not shown in FIG. 1. For example, the digital camera 100 can also include a flash, zoom and focus modules, anti-aliasing filter, battery, and other components commonly found in a digital camera. The camera ASIC 108 can be connected to a central processing unit (CPU) designed to perform operations of the digital camera that are not handled by the camera ASIC 108.
Embodiments of the present disclosure are generally directed to the image sensor 104 illustrated in FIG. 1 and the shutter mechanisms associated with the image sensor 104. The shutter mechanism in a digital camera 100 can control the exposure of the sensor array of the image sensor 104 when an image is taken by the camera 100. The shutter mechanism can be electronic, mechanical, or a combination of both. A timing mechanism can be built in the camera to control light exposure time for the pixels of the image sensor and, depending on the shutter mechanism, the order in which the pixels are exposed. Presently, most digital cameras employ one of two types of shutter mechanisms, either a global shutter or a rolling shutter. As described in the following paragraphs, these two types of shutter mechanisms have their respective advantages and drawbacks.
Global shutters can typically be found in cameras with Charge Coupled Device (CCD) image sensors. FIG. 2a is a simplified block diagram illustrating the exemplary components of a CCD image sensor 200 with a global shutter. For illustration purposes, the CCD image sensor 200 is shown to include a 4×4 two-dimensional pixel array 202, although it should be understood that the image sensor can include any number of columns and rows of pixels aligned in any configuration, or pixels arranged in any suitable configuration. In fact, it is not uncommon for a CCD image sense to have hundreds or even thousands of rows and/or columns of pixels. Each pixel can correspond to a photosite of the image sensor 200 and be capable of capturing photons. The pixels 202 can be connected to an electron transfer register 204, which can in turn be connected to readout electronics 206 that can include, but are not limited to, an amplifier and A/D converter. It should also be understood that the CCD image sensor 200 can include other components that are omitted from FIG. 2a for clarity purposes.
The global shutter of the imager 200 of FIG. 2a can operate such that when the shutter is “open,” light can reach the entire sensor array of the imager 200 for a predetermined period of time (shutter time or exposure time). During that time, all pixels 202 of the image sensor 200 can capture light (e.g., accumulate charge) in parallel. When the shutter is blocked, light can no longer reach the sensor and the pixels can become inactive. The global shutter in a CCD digital camera can be electronically controlled in order to control the exposure.
After the capture is completed, the signals collected in the pixels can be transferred, for example, one pixel at a time, to the electron transfer register 204, from where they can be read out and processed by the readout electronics 206. The process can include amplifying the signals and/or converting them into a digital format (e.g., digital numbers), which can form the result image.
In digital imaging, the result image can include a number of keypoints, which can be defined by a small section of the image (e.g., a 5×5 or 10×10 pixel block) that includes one or more highly localizable and recognizable features of the image. The keypoints can be produced by processing one or more of the raw pixels. Each keypoint can include a descriptor that describes the keypoint so that it can be recognized in the different frames of a series of images taken consecutively. The movement of the camera and the direction in which it is pointing can be determined by matching the various keypoints from the different frames. This approach is often used when implementing SLAM (simultaneous localization and mapping) algorithms.
This sequential charge-transfer approach to the electron transfer register 204 and the readout electronics 206 employed by a global shutter imager can be time-consuming, especially if the image sensor includes a large number of pixels, because the data from each pixel of the imager has to be read out sequentially. That can mean that the delay between the exposure of the last pixels (along with all other pixels in a global shutter imager) and when these pixels can be analyzed (i.e., after all other pixels have been analyzed) can be significant. In other words, when information read out from these last pixels is finally processed, it may not necessarily reflect the current position of the camera with respect to a scene accurately if there was relative movement between the camera and the scene. For example, if it takes a typical global shutter CCD imager around 15 milliseconds between exposures to read out all the pixel values and calculate the keypoints of the image, there can be a 15 milliseconds delay before information from the last pixels are analyzed, which may affect, for example, the determination of the camera's movement (or movement in the scene being captured). This is one of the main drawbacks of a global shutter imager.
Because a global shutter allows a CCD image sensor to capture an entire image at the exact same moment by exposing all pixels simultaneously, one of the advantages of the global shutter is that the result image can usually have relatively high quality and be free of significant undesirable effects such as motion artifacts. All the keypoints (e.g., small pixel blocks) can be kept intact and easily identifiable in a series of consecutive images.
A second type of shutter mechanism, the rolling shutter, can typically be found in digital cameras with complementary metal-oxide-semiconductor (CMOS) image sensors. In contrast to the global shutter, a rolling shutter can allow individual pixels or individual columns/rows of pixels to be exposed sequentially so that the information at a first pixel (or a first column/row of pixels) can be read out while the next pixel (or next column/row of pixels) is being exposed to light. The CMOS image sensors can achieve this rolling effect by turning on/off the pixels (or columns/rows of pixels) systematically in a predetermined order.
FIG. 2b is a block diagram illustrating the exemplary components of a CMOS image sensor 210 with a rolling shutter. For illustration purposes, the CMOS image sensor 210 is shown to include a 4×4 two-dimensional pixel array, although it should be understood that the image sensor can have any number of columns and rows of pixels aligned in any configuration, or arranged in any suitable configuration. Each pixel 211, 212, 213 of the two-dimensional pixel array of FIG. 2b can be a photodiode capable of converting light into electronic signals. A grid of conductive interconnects 214, 218 overlaying the image sensor 210 can connect the pixels by rows and columns for applying timing and readout signals. In particular, the interconnects can include row signal lines (collectively 214) for transmitting timing signals from a clock and timing control module 216 to each pixel (or each row/column of pixels). The timing signal can control when each individual pixel or row of pixels is exposed to light and also when the electronic signals from each pixel are read out. The interconnects can also include vertical output lines (collectively as 218) for reading out the signals from the pixels and transmitting them to readout electronics (collectively as 220) for further processing. As illustrated in FIG. 2b , each output line can be connected to separate readout electronics 220. The readout electronics 220 for each output line can include, for example, an amplifier and A/D converter, which can amplify and convert the signals into a digital format (e.g., digital numbers). The digital information can be used to assemble a final image. In some CMOS sensors, at least some of the readout electronics 220 can be embedded in the individual pixels of the image sensor. It should also be understood that the CMOS image sensor 210 of FIG. 2b can include other components that are omitted from the figure for purpose of clarity.
This architecture of the CMOS sensor 210 allows each of its pixels 212 (or each row/column of pixels) to be turned on/off independently and the signals from the pixels (or rows/columns of pixels) to be read out sequentially. In operation, the clock and timing control module 216 can send out timing signals to the individual pixels (or individual rows/columns of pixels) to control the timing of their exposure. As soon as one pixel is exposed, its value can be read out. There is virtually no delay between the exposure and the readout. In addition, the shuttering effect with regard to each pixel (or row/column of pixels) can be programmed to occur on a rolling basis across all pixels. For example, when the pixel value of the first pixel 211 is being read out, the second pixel 212 can be finishing its capturing process. Similarly, when the pixel value of the second pixel 212 is being read out, the third pixel 213 can be capturing light. Similarly, if a row of pixels is exposed and readout together, the next row can begin capturing light before the previous row finishes its readout. Essentially, every pixel (or row of pixels) is read out a bit later than every other pixel (or the next row of pixels). Every pixel (or row) readout can be skewed relative to its neighbor by a fraction of, for example, a microsecond. Thus, there is almost always at least one pixel being exposed and there is almost no delay between exposure and readout for any individual pixel. This allows cameras with rolling shutter imagers to reduce, for at least some of the pixels, the delay between the exposure of the pixel and analysis of the information read out from the pixel. The reduction can be especially significant for pixels that are exposed and read out last compared to if they were processed by a global shutter imager.
However, because the rolling shutter staggers the exposure time for the individual pixels (or individual rows/columns of pixels), the information captured by different pixels will be captured at different moments in time. If there are relative movements between objects in the scene being captured and the camera, the result image can have noticeable motion artifacts such as wobble, skew, smear, etc. due to the staggered exposure of the different pixels. This is one of the drawbacks of a rolling shutter imager. In addition, one or more keypoints may be distorted beyond recognition as a result of not all the pixels in a keypoint is exposed at the same time. The distorted keypoints may no longer be able to identify the corresponding features in a series of consecutive frames, thus affecting the camera's ability to track its own movement or the movement of an object being captured.
In short, both of the above-discussed shutter mechanisms have significant drawbacks: the global shutter imagers can cause delays between pixel exposure and analysis and the rolling shutter imagers can cause undesirable effects (e.g., distortions) to the resultant images. To minimize these shortcomings, the following embodiments disclose image sensors with a third type of shutter mechanism, referred to herein as a “semi-global shutter.” A semi-global shutter can reduce the delays between pixel exposure and analysis while reducing certain forms of undesirable distortions.
Specifically, image sensors with semi-global shutters can divide (or group) its two-dimensional pixel array into multiple pixel blocks, each block including multiple pixels in a region of the image area. A semi-global shutter can allow all pixels in the same block to be exposed simultaneously and read out as a group. As such, semi-global shutters may be able to capture images free of motion artifacts, at least within each pixel block. The blocks can be exposed and readout on a rolling basis. That is, while data from one block of pixels is read out and processed, the next block of pixels can be exposed. This can allow the blocks to be exposed in an overlapping or sequential manner, which can significantly reduce or eliminate the delay between consecutive exposures that a global shutter imager typically suffer. This can provide speed advantages.
In addition, semi-global shutters can reduce the amount of motion artifacts that can often be associated with images taken with rolling shutter imagers. In various embodiments, this can be achieved by dividing the pixels into the optimal number of pixel blocks according the requirements and/or intended usage of the camera. As discussed above, a rolling shutter is typically programmed to expose and read out one pixel or one row/column of pixels at a time. For an image sensor with a large number of pixels (or rows of pixels), the difference in the exposure time of each pixel or row of pixels caused by the rolling exposure can be substantial, resulting in easily-noticeable motion artifacts in the final images. A semi-global shutter can roll through blocks of multiple rows/columns of pixels at a time. As an example, if each block has 10 rows, the amount of potential motion artifacts could effectively be reduced by a factor of about ten compared to a rolling shutter that rolls through the pixels one row at a time. Ideally, the pixel blocks can be defined to achieve a balance between frame rate and image quality for any particular camera with a semi-global shutter images.
FIG. 3 is a block diagram illustrating the exemplary components of an image sensor 300 with a semi-global shutter. The image area of the sensor 300 can be divided into 9 pixel blocks in a 3×3 layout. For example, the top row can include pixel blocks 301, 302, 303. Each block can include multiple pixels. An enlarged view of block 303 shows that block 303 includes a 4×4 array of pixels. In this embodiment, each block can include the same number of pixels arranged in the same formation. However, the disclosure is not so limited and in other embodiments the blocks can include different numbers and/or arrangements of pixels. Every pixel 312 in the blocks can be a sensor element (i.e., photosite) capable of converting light into electronic signals.
A number of block signal lines (collectively 304) can transmit timing signals from a clock and timing control module 308 to each of the nine pixel blocks. The timing signal can control when each pixel block is exposed to light and also when the electronic signals from the pixel blocks are read out. Although only three block signal lines are shown in FIG. 3, it should be understood that every pixel block may be separately connected to the clock and timing control module 308 and can be triggered independently. A number of output lines 306 can transmit the electronic signals from the pixels in each pixel block to readout electronics 316 for processing. Only three vertical lines are marked as output lines 306 in FIG. 3 for clarity purposes. However, it should be understood that every pixel block may be separately connected to the readout electronics 316 and the signals from each pixel block can be read out in parallel. The readout electronics 316 in this embodiment can be designed to process signals received from each of the nine pixel blocks in parallel. As illustrated, the readout electronics 316 can include nine separate submodules each responsible for processing signals from one of the nine pixel blocks. For example, submodules 321, 322, 323 can readout signals from pixel blocks 301, 302, 303 respectively. Each submodule can include, for example, an amplifier and A/D converter for amplifying and converting the signals into a digital format (e.g., digital numbers), respectively. The digital information can be processed to assemble a final image. It should also be understood that the semi-global shutter imager 300 of FIG. 3 can include other components that are omitted from the figure for clarity purposes. The exemplary arrangement schematically shown in FIG. 3 may be expanded for any suitable number of pixel blocks and their respective submodules.
In operation, the semi-global shutter can be programmed to expose the pixel blocks on a rolling basis. For example, within the same pixel block, all the pixels can be exposed simultaneously and the signals from each pixel in the pixel block can be read out one pixel at a time and transferred over one of the output lines to a corresponding submodule in the readout electronics 316. Each pixel block may not be exposed again until the readout is completed. However, while the first pixel block 301 is being read out, a second pixel block 302 can be exposed. Similarly, while the signals from the pixels in the second pixel block 302 are being read out, a third pixel block 303 can be exposed. This overlapping in exposure and readout of the different blocks can minimize or eliminate the delays that typically occur between exposures in a global shutter imager.
FIG. 4 illustrates an exemplary timeline of the exposures (top) and readouts (bottom) of three of the pixel blocks 301, 302, 303 in the semi-global shutter imager 300 of FIG. 3. As illustrated, the exposure and readout of each block 301, 302, 303 can be sequential, but the triggering of successive blocks can be overlapping. Each pixel block can be exposed slightly after its predecessor, with the exposure delay allowing for readout of one or more previously-exposed pixel blocks before the current pixel block completes its exposure. As an example, exposure of pixel block 302 in the sequence may be triggered before the readout time for the previous pixel block (e.g., pixel block 301) can be completed. Similarly, the exposure of block pixel 303 may be triggered before the readout time for block 302 can be completed. This can increase the use of the output digital transfer bandwidth from the imager. When all the pixel blocks (including the six not shown in the timeline of FIG. 4) complete a cycle of exposure and readout. The first block (i.e., block 301) can be exposed again without any delay.
Alternatively, the pixel blocks can be triggered sequentially, in which each block can begin its exposure only after the prior pixel block has completed its exposure. For example, this can be suitable for computer vision applications, as blurring effects from motion may not include identical sub-windows of integration time. Regardless of whether overlapping or sequential triggering is implemented, the pixel blocks can be read out immediately after their exposure time is complete.
Because there is less delay between the exposures of a pixel block and the analysis of the information captured by the pixels in the pixel block, the information generated by a semi-global shutter imager can be more accurate in reflecting the location and/or movement of the camera and/or scene being captured than a global-shutter imager of the same pixel resolution, which would require the entire image to be readout before information from the pixels can be analyzed. One potential delay in a semi-global shutter imager may occur when the signals from individual pixels in the same block are read out. However, this delay can be significantly shorter than the delay in a comparable global shutter imager. For example, if the delay on a global shutter imager is 15 milliseconds for the pixels read out last, the delay on a semi-global shutter imager for the same pixels (or any of the last pixels in each block) is only 1.5 milliseconds if the semi-global shutter imager is divided into ten pixel blocks of the same size. Accordingly, the images captured with semi-global shutter imagers may be superior for machine readable images such as those used for tracking keypoints in an image.
Although both semi-global shutters and rolling shutters can capture an image by scanning across the scene rather than taking a snapshot of the entire scene, semi-global shutter can achieve better image quality than a rolling shutter when there is relative movement between the camera and the scene for some applications. This is because the number of pixel blocks in a semi-global shutter imager can be much lower than the number of pixels or rows in a rolling shutter imager. By dividing the pixels into fewer pixel blocks, the motion artifacts in the final image can be confined. The only regions in an image that may be affected by the sequential exposure of the pixel blocks are the boundaries between the blocks. In contrast, motion artifacts can appear anywhere on an image taken by a camera with rolling shutter imager because the rolling shutter rolls through the pixels one row at a time. However, these images may be suitable for machine readable images such as those used for tracking keypoints in an image.
As an example, a 9×9 pixel array of a semi-global shutter imager can be divided into three pixel blocks each including three rows of pixels, resulting in two boundaries between the three pixel blocks. If the same 9×9 pixel array is read out row by row using a rolling shutter, there are eight boundaries between the nine rows. That corresponds to significantly more areas that may be affected by motion artifacts in the images taken with the rolling shutter imager than those taken with the semi-global shutter imager. In addition, the fewer boundaries in the semi-global shutter can also mean that fewer keypoints would get distorted beyond recognition when the shutter rolls through the pixel blocks.
A semi-global shutter can divide the image array into any suitable number of pixel blocks and each pixel block can have any suitable number of pixels. In various embodiments, any arrangement of pixel blocks, including ones of non-equal size, non-compact, or non-contiguous configurations, is possible. Preferably, the number of pixel blocks can be set to both achieve a shorter delay between pixel exposure and analysis than a comparable global shutter imager and be less prone to certain forms of distortions in the result images than a comparable rolling shutter imager. For example, one might wish to divide a 1000×1000 pixel image area of a semi-global shutter imager into 10 blocks (e.g., each a 100×1000 block). It can reduce the delay between pixel exposure and analysis, for at least some of the pixels, by 10 times compared to a global shutter imager with the same 1000×1000 pixel image area. Additionally, the rolling shutter effect (e.g., motion artifacts) can only be an issue at the boundaries between the pixel blocks rather than throughout the image area as would be the case in a rolling shutter imager.
For cameras that require a short delay between pixel exposure and analysis, it would be ideal to have a semi-global shutter imager having an image area divided into a large number of pixel blocks, each including fewer pixels. In contrast, for cameras that favor image quality (e.g., minimizing certain forms of distortion) over shorter periods of delay, a semi-global shutter imager with a small number of pixel blocks can be more desirable.
A semi-global imager may include pixel blocks of any suitable geometric shape and arrangement. While FIG. 3 illustrates one embodiment in which the exemplary blocks are squares of the same size, FIGS. 5a-5c illustrate other exemplary divisions of pixel blocks suitable for various semi-global shutter imagers. In particular, FIG. 5a illustrates an image area divided horizontally into five (or N number of) rectangular pixel blocks 510, each including the same number of rows of pixels. FIG. 5b illustrates an image area divided vertically into five (or M number of) pixel blocks 520, each having the same number of columns of pixels. FIG. 5c illustrates a configuration of five pixel blocks 530 that are of different shapes and/or sizes. As discussed above, the number and/or geometric shape of the pixel blocks can be optimized so that the areas between the pixel blocks are kept to a minimum. This can provide significant advantage in image quality for a semi-global shutter imager than a rolling shutter imager.
In one embodiment, instead of dividing the image area of an relatively large resolution image sensor into multiple pixel blocks (as shown in FIG. 3 for example), a semi-global shutter can be implemented by assembling multiple relatively low-resolution imagers in the same configuration (e.g., each block in FIG. 3 substituted by a standalone low resolution imager). These relatively low-resolution imagers can have their triggers staggered in time and controlled by a central controller. Each imager can individually operate at a pixel clock rate such that the transmission per pixel block is inversely a function of the size of the imager. In one embodiment, when cutting the wafer for the low-resolution imagers, the dies for the individual imagers may not be separated by the cutting.
It should be understood that, the application of the present disclosure is not limited to the above-mentioned embodiments. It will be possible for a person skilled in the art to make modifications or replacements according to the above description, all of those modifications or replacements shall all fall within the scope of the appended claims of the present disclosure.

Claims (16)

What is claimed is:
1. A device comprising:
a two-dimensional pixel array comprising a first block and a second block, each of the first block and the second block comprising a respective plurality of pixels, wherein the first block does not overlap the second block in the two-dimensional pixel array;
a shutter configured to:
synchronously expose, in a first time window beginning at a first time, the plurality of pixels of the first block;
synchronously expose, in a second time window beginning at a second time later than the first time, the plurality of pixels of the second block;
first readout circuitry corresponding to the first block, the first readout circuitry configured to receive, at a third time between the first time and the second time, a first signal corresponding to the first block; and
second readout circuitry, different from the first readout circuitry, corresponding to the second block, the second readout circuitry configured to receive, at a fourth time later than the second time, a second signal corresponding to the second block.
2. The device of claim 1, wherein:
each of the first block and the second block has a respective height that is at least one twentieth of the height of the two-dimensional pixel array and no more than one fifth of the height of the two-dimensional pixel array; and
each of the first block and the second block has a respective width that is at least one twentieth of the width of the two-dimensional pixel array and no more than one fifth of the width of the two-dimensional pixel array.
3. The device of claim 1, wherein the plurality of pixels of the first block comprises a first number of pixels, and the plurality of pixels of the second block comprises a second number of pixels, equal to the first number.
4. The device of claim 1, wherein the plurality of pixels of the first block comprises a first number of pixels, and the plurality of pixels of the second block comprises a second number of pixels, different from the first number.
5. The device of claim 1, wherein the plurality of pixels of the first block comprises a first geometric shape, and the plurality of pixels of the second block comprises a second geometric shape, different from the first geometric shape.
6. The device of claim 1, further comprising a timing module, wherein:
synchronously exposing the plurality of pixels of the first block comprises synchronously exposing the plurality of pixels of the first block in response to receiving a first signal from the timing module; and
synchronously exposing the plurality of pixels of the second block comprises synchronously exposing the plurality of pixels of the second block in response to receiving the first signal from the timing module.
7. The device of claim 1, wherein:
the device is configured to generate, based on an output of the first readout circuitry and further based on an output of the second readout circuitry, an image signal.
8. The device of claim 7, wherein device is further configured to present the image signal as input to a SLAM algorithm.
9. A method comprising:
synchronously exposing, in a first time window beginning at a first time, a respective plurality of pixels of a first block of a two-dimensional pixel array;
synchronously exposing, in a second time window beginning at a second time later than the first time, a respective plurality of pixels of a second block of a two-dimensional pixel array, wherein the first block does not overlap the second block in the two-dimensional pixel array;
presenting, at a third time between the first time and the second time, to first readout circuitry corresponding to the first block, a first signal corresponding to the first block; and
presenting, at a fourth time later than the second time, to second readout circuitry corresponding to the second block, a second signal corresponding to the second block, wherein the first readout circuitry is different from the second readout circuitry.
10. The method of claim 9, wherein:
each of the first block and the second block has a respective height that is at least one twentieth of the height of the two-dimensional pixel array and no more than one fifth of the height of the two-dimensional pixel array; and
each of the first block and the second block has a respective width that is at least one twentieth of the width of the two-dimensional pixel array and no more than one fifth of the width of the two-dimensional pixel array.
11. The method of claim 9, wherein the plurality of pixels of the first block comprises a first number of pixels, and the plurality of pixels of the second block comprises a second number of pixels, equal to the first number.
12. The method of claim 9, wherein the plurality of pixels of the first block comprises a first number of pixels, and the plurality of pixels of the second block comprises a second number of pixels, different from the first number.
13. The method of claim 9, wherein the plurality of pixels of the first block comprises a first geometric shape, and the plurality of pixels of the second block comprises a second geometric shape, different from the first geometric shape.
14. The method of claim 9, wherein:
synchronously exposing the plurality of pixels of the first block comprises synchronously exposing the plurality of pixels of the first block in response to receiving a first signal from a timing module; and
synchronously exposing the plurality of pixels of the second block comprises synchronously exposing the plurality of pixels of the second block in response to receiving the first signal from the timing module.
15. The method of claim 9, further comprising generating, based on an output of the first readout circuitry and further based on an output of the second readout circuitry, an image signal.
16. The method of claim 15, further comprising presenting the image signal as input to a SLAM algorithm.
US16/745,763 2015-05-19 2020-01-17 Semi-global shutter imager Active US11019287B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US16/745,763 US11019287B2 (en) 2015-05-19 2020-01-17 Semi-global shutter imager
US17/239,498 US11272127B2 (en) 2015-05-19 2021-04-23 Semi-global shutter imager

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201562163730P 2015-05-19 2015-05-19
US15/159,491 US9948874B2 (en) 2015-05-19 2016-05-19 Semi-global shutter imager
US15/916,250 US10594959B2 (en) 2015-05-19 2018-03-08 Semi-global shutter imager
US16/745,763 US11019287B2 (en) 2015-05-19 2020-01-17 Semi-global shutter imager

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
US15/916,250 Continuation US10594959B2 (en) 2015-05-19 2018-03-08 Semi-global shutter imager

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US17/239,498 Continuation US11272127B2 (en) 2015-05-19 2021-04-23 Semi-global shutter imager

Publications (2)

Publication Number Publication Date
US20200228734A1 US20200228734A1 (en) 2020-07-16
US11019287B2 true US11019287B2 (en) 2021-05-25

Family

ID=57320790

Family Applications (4)

Application Number Title Priority Date Filing Date
US15/159,491 Active US9948874B2 (en) 2015-05-19 2016-05-19 Semi-global shutter imager
US15/916,250 Active 2036-07-26 US10594959B2 (en) 2015-05-19 2018-03-08 Semi-global shutter imager
US16/745,763 Active US11019287B2 (en) 2015-05-19 2020-01-17 Semi-global shutter imager
US17/239,498 Active US11272127B2 (en) 2015-05-19 2021-04-23 Semi-global shutter imager

Family Applications Before (2)

Application Number Title Priority Date Filing Date
US15/159,491 Active US9948874B2 (en) 2015-05-19 2016-05-19 Semi-global shutter imager
US15/916,250 Active 2036-07-26 US10594959B2 (en) 2015-05-19 2018-03-08 Semi-global shutter imager

Family Applications After (1)

Application Number Title Priority Date Filing Date
US17/239,498 Active US11272127B2 (en) 2015-05-19 2021-04-23 Semi-global shutter imager

Country Status (11)

Country Link
US (4) US9948874B2 (en)
EP (1) EP3298773A4 (en)
JP (3) JP7029961B2 (en)
KR (2) KR102511493B1 (en)
CN (1) CN108141575B (en)
AU (1) AU2016264606B2 (en)
CA (1) CA2986476A1 (en)
HK (1) HK1252419A1 (en)
IL (4) IL287335B (en)
NZ (2) NZ776286A (en)
WO (1) WO2016187469A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11272127B2 (en) 2015-05-19 2022-03-08 Magic Leap, Inc. Semi-global shutter imager

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107886476B (en) * 2016-09-30 2021-06-15 联咏科技股份有限公司 Method of texture synthesis and image processing apparatus using the same
US10873714B2 (en) 2017-11-09 2020-12-22 Semiconductor Components Industries, Llc Image sensor with multiple pixel access settings
CN110413805B (en) * 2018-04-25 2022-02-01 杭州海康威视数字技术股份有限公司 Image storage method and device, electronic equipment and storage medium
US11103763B2 (en) 2018-09-11 2021-08-31 Real Shot Inc. Basketball shooting game using smart glasses
US11141645B2 (en) 2018-09-11 2021-10-12 Real Shot Inc. Athletic ball game using smart glasses
WO2020154524A1 (en) 2019-01-25 2020-07-30 Magic Leap, Inc. Eye-tracking using images having different exposure times
CN109862281B (en) * 2019-01-31 2021-01-08 中国科学院长春光学精密机械与物理研究所 Camera Link imaging system with adjustable exposure time in global shutter mode
CN114127610A (en) 2019-05-20 2022-03-01 奇跃公司 Systems and techniques for estimating eye pose
JP7451188B2 (en) 2020-01-24 2024-03-18 三星電子株式会社 image sensor
CN111601053B (en) * 2020-05-20 2021-07-27 上海炬佑智能科技有限公司 Image sensor, global shutter control method and computer storage medium
CN111728578B (en) * 2020-06-09 2023-09-01 重庆金山科技(集团)有限公司 Capsule endoscope control method and capsule endoscope
WO2022093657A1 (en) 2020-10-28 2022-05-05 Gigajot Technology, Inc. Dual-progression pixel readout
KR20220077735A (en) 2020-12-02 2022-06-09 삼성전자주식회사 Image sensor and pixel array of image sensor
CN113674685B (en) * 2021-08-25 2023-02-24 维沃移动通信有限公司 Pixel array control method and device, electronic equipment and readable storage medium

Citations (61)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030052989A1 (en) 2001-07-18 2003-03-20 Bean Heather Noel Non-polarizing shutter/CCD module
US20050073451A1 (en) 2003-07-14 2005-04-07 University Of Rochester Multiplexed-input-separated sigma-delta analog-to-digital converter design for pixel-level analog-to-digital conversion
US20070206201A1 (en) 2006-03-02 2007-09-06 De Groot Peter Phase Shifting Interferometry With Multiple Accumulation
US20080079960A1 (en) 2006-09-29 2008-04-03 Fujifilm Corporation Image processing method and apparatus, and image forming method and apparatus
US7466255B1 (en) 2005-11-17 2008-12-16 University Of Rochester Multiplexed-input-separated Σ-Δ analog-to-digital converter for pixel-level analog-to-digital conversion utilizing a feedback DAC separation
US20090122168A1 (en) 2007-11-14 2009-05-14 Novatek Microelectronics Corp. Method for resetting image sensing and image sensing device using the same
US20100134662A1 (en) * 2007-05-10 2010-06-03 Isis Innovation Ltd Image capture device and method
US20100276572A1 (en) * 2005-06-02 2010-11-04 Sony Corporation Semiconductor image sensor module and method of manufacturing the same
US7847846B1 (en) 2006-05-16 2010-12-07 University Of Rochester CMOS image sensor readout employing in-pixel transistor current sensing
US20100327176A1 (en) * 2009-06-30 2010-12-30 Canon Kabushiki Kaisha Image pickup apparatus, image pickup system, and control method thereof
US20110101205A1 (en) * 2009-10-30 2011-05-05 Invisage Technologies, Inc. Systems and methods for color binning
US20110293259A1 (en) 2010-05-25 2011-12-01 Apple Inc. Scene Adaptive Auto Exposure
US20120062705A1 (en) 2010-09-03 2012-03-15 Ilia Ovsiannikov Overlapping charge accumulation depth sensors and methods of operating the same
US20120082399A1 (en) * 2010-09-30 2012-04-05 Olympus Corporation Calculation device and method
US20120127353A1 (en) 2010-11-22 2012-05-24 Canon Kabushiki Kaisha Image-pickup system and method of controlling same
US20120200749A1 (en) 2011-02-03 2012-08-09 Ulrich Boettiger Imagers with structures for near field imaging
US20120274835A1 (en) 2009-11-30 2012-11-01 Panasonic Corporation Image capturing apparatus and camera main body
US20120307030A1 (en) * 2011-05-12 2012-12-06 Olive Medical Corporation Image sensor for endoscopic use
US20130056616A1 (en) 2011-09-01 2013-03-07 Sony Corporation Image sensor, light quantity measurement method, and microscope system
US20130057942A1 (en) 2011-09-02 2013-03-07 Xiaojia Wang Color display devices
US20130264489A1 (en) 2012-04-04 2013-10-10 Canon Kabushiki Kaisha Radiation imaging apparatus, radiation imaging system, and control method for the radiation imaging apparatus
US20130287119A1 (en) 2008-07-29 2013-10-31 Marvell World Trade Ltd. Processing rasterized data
US20140022348A1 (en) 2010-11-19 2014-01-23 Primesense Ltd. Depth mapping using time-coded illumination
US20140022431A1 (en) * 2012-07-19 2014-01-23 Nanyang Innovation & Enterprise Office Cmos image sensor
US20140027613A1 (en) 2012-07-27 2014-01-30 Scott T. Smith Bayer symmetric interleaved high dynamic range image sensor
US20140072237A1 (en) 2011-10-17 2014-03-13 Kabushiki Kaisha Toshiba Encoding device, decoding device, encoding method, and decoding method
US20140078556A1 (en) 2012-09-19 2014-03-20 John T. Anderson, III Method of forming security markings
US20140076180A1 (en) 2012-09-19 2014-03-20 John T. Anderson, III System for forming security markings using structured microdots
US20140076184A1 (en) 2012-09-19 2014-03-20 John T. Anderson III Method for forming structured microdots
US20140133575A1 (en) 2012-11-13 2014-05-15 Hon Hai Precision Industry Co., Ltd. Electronic device and method for splitting image
US20140133768A1 (en) 2012-11-13 2014-05-15 Hon Hai Precision Industry Co., Ltd. Electronic device and method for splitting image
US20140138548A1 (en) 2012-11-20 2014-05-22 Board Of Regents, The University Of Texas System Apparatus and methods for photosensor quadrant sharing
US20140152793A1 (en) * 2012-06-07 2014-06-05 Complete Genomics, Inc. Techniques for scanned illumination
US20140226047A1 (en) 2013-02-11 2014-08-14 Tower Semiconductor Ltd. Shared Readout Low Noise Global Shutter Image Sensor Method
EP2770297A1 (en) 2013-02-21 2014-08-27 Mitutoyo Corporation Shape measuring apparatus
US20140300756A1 (en) * 2013-04-08 2014-10-09 Iix Inc. Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device
US20140340433A1 (en) 2011-11-09 2014-11-20 Au Optronics Corporation Three-dimensional display panel and driving method thereof
US20140347532A1 (en) * 2013-05-21 2014-11-27 Samsung Electronics Co. Ltd. Electronic sensor and method for controlling the same
WO2015001646A1 (en) 2013-07-04 2015-01-08 株式会社ニコン Electronic apparatus, electronic apparatus control method, and control program
US20150009376A1 (en) * 2012-03-30 2015-01-08 Nikon Corporation Image pickup element and image pickup device
US20150015754A1 (en) 2013-07-11 2015-01-15 Sony Corporation Solid-state imaging device, solid-state imaging method, and electronic apparatus
US20150036029A1 (en) 2013-08-01 2015-02-05 Harvest Imaging bvba Image sensor with shading detection
US20150049230A1 (en) * 2012-10-12 2015-02-19 Samsung Electronics Co., Ltd. Image sensor and method of operating the same
US20150062304A1 (en) 2013-01-15 2015-03-05 Mobileye Vision Technologies Ltd. Stereo assist with rolling shutters
JP2015046737A (en) 2013-08-28 2015-03-12 株式会社ニコン Image sensor and imaging apparatus
US20150077590A1 (en) * 2012-05-02 2015-03-19 Nikon Corporation Imaging device
US20150097999A1 (en) * 2013-10-08 2015-04-09 Canon Kabushiki Kaisha Image capturing apparatus and control method thereof
US20150124132A1 (en) * 2012-05-25 2015-05-07 Sony Corporation Imaging element, driving method, and electronic apparatus
US20150130977A1 (en) 2013-11-11 2015-05-14 Semiconductor Components Industries, Llc Image sensors with n-row parallel readout capability
US20150158289A1 (en) 2013-12-10 2015-06-11 Canon Kabushiki Kaisha Image recording apparatus, image recording method, and storage medium
US9077911B2 (en) * 2010-08-23 2015-07-07 Red.Com, Inc. Multi-exposure video
US20150222801A1 (en) * 2014-01-31 2015-08-06 Wolfvision Innovation Gmbh Image recording method having adaptive marking light emission and such an image recording device
US20150358571A1 (en) * 2013-01-25 2015-12-10 Innovaciones Microelectrónicas S.L.(Anafocus) Advanced region of interest function for image sensors
US20150381918A1 (en) * 2013-02-21 2015-12-31 Sony Corporation Solid-state imaging device and imaging apparatus
US20150381915A1 (en) * 2013-02-13 2015-12-31 Sony Corporation Solid-state imaging device, driving method thereof, and imaging apparatus
US20160014360A1 (en) * 2014-07-11 2016-01-14 Imperx, Inc. Area scan interline transfer ccd imaging device and apparatus with tdi scanning mode
US9277146B2 (en) * 2013-08-12 2016-03-01 Samsung Electronics Co., Ltd. Image sensor, method of operating the same, and system including the image sensor
US20160105596A1 (en) 2014-10-08 2016-04-14 Olympus Corporation Imaging device and shooting method
US20160150128A1 (en) * 2014-11-25 2016-05-26 Raytheon Company Method and apparatus for improving resolution in a tdi image
US20160269659A1 (en) 2013-10-21 2016-09-15 Sony Corporation Solid-state image-capturing element and electronic device
US9948874B2 (en) 2015-05-19 2018-04-17 Magic Leap, Inc. Semi-global shutter imager

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3668611B2 (en) 1998-06-19 2005-07-06 株式会社東芝 Image photographing apparatus and method
JP3909691B2 (en) * 2002-09-12 2007-04-25 株式会社日立製作所 In-vehicle image processing device
JP2006148861A (en) 2004-10-21 2006-06-08 Matsushita Electric Ind Co Ltd Image signal processing device and method
JP4561439B2 (en) 2005-03-30 2010-10-13 株式会社デンソー Imaging device
JP4252098B2 (en) 2006-09-20 2009-04-08 三洋電機株式会社 Photodetector
JP5521721B2 (en) 2009-08-28 2014-06-18 ソニー株式会社 Image sensor and camera system
TWI559763B (en) 2009-10-01 2016-11-21 索尼半導體解決方案公司 Image taking device and camera system
CN102273188B (en) * 2009-11-06 2013-07-31 松下电器产业株式会社 Image capture device
EP2348704A1 (en) 2010-01-26 2011-07-27 Paul Scherrer Institut A single photon counting readout chip with neglibible dead time
JP2011222708A (en) * 2010-04-08 2011-11-04 Sony Corp Solid-state imaging apparatus, method of manufacturing the same, and electronic device
US8488055B2 (en) * 2010-09-30 2013-07-16 Apple Inc. Flash synchronization using image sensor interface timing signal
JP2013005017A (en) * 2011-06-13 2013-01-07 Sony Corp Image pickup apparatus, image pickup apparatus control method, and program
JP2013130643A (en) * 2011-12-20 2013-07-04 Olympus Corp Auto-focus device, imaging apparatus, and auto-focus method
KR101889932B1 (en) * 2012-07-25 2018-09-28 삼성전자주식회사 Apparatus and Method for photographing image
US9143673B2 (en) * 2012-09-19 2015-09-22 Google Inc. Imaging device with a plurality of pixel arrays
JP6056572B2 (en) 2013-03-14 2017-01-11 株式会社ニコン Imaging device
KR20150118213A (en) * 2014-04-11 2015-10-22 에스케이하이닉스 주식회사 Image sensing device
KR102301620B1 (en) * 2015-02-02 2021-09-14 삼성전자주식회사 Photographing apparatus and method for the light leakage correction
JP6700924B2 (en) * 2016-04-08 2020-05-27 キヤノン株式会社 Image processing apparatus, control method thereof, and program

Patent Citations (69)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030052989A1 (en) 2001-07-18 2003-03-20 Bean Heather Noel Non-polarizing shutter/CCD module
US20050073451A1 (en) 2003-07-14 2005-04-07 University Of Rochester Multiplexed-input-separated sigma-delta analog-to-digital converter design for pixel-level analog-to-digital conversion
US20100276572A1 (en) * 2005-06-02 2010-11-04 Sony Corporation Semiconductor image sensor module and method of manufacturing the same
US7466255B1 (en) 2005-11-17 2008-12-16 University Of Rochester Multiplexed-input-separated Σ-Δ analog-to-digital converter for pixel-level analog-to-digital conversion utilizing a feedback DAC separation
US20070206201A1 (en) 2006-03-02 2007-09-06 De Groot Peter Phase Shifting Interferometry With Multiple Accumulation
US7847846B1 (en) 2006-05-16 2010-12-07 University Of Rochester CMOS image sensor readout employing in-pixel transistor current sensing
US20080079960A1 (en) 2006-09-29 2008-04-03 Fujifilm Corporation Image processing method and apparatus, and image forming method and apparatus
US20120257101A1 (en) 2007-05-10 2012-10-11 Isis Innovation Limited Image capture device and method
US20100134662A1 (en) * 2007-05-10 2010-06-03 Isis Innovation Ltd Image capture device and method
US20090122168A1 (en) 2007-11-14 2009-05-14 Novatek Microelectronics Corp. Method for resetting image sensing and image sensing device using the same
US20130287119A1 (en) 2008-07-29 2013-10-31 Marvell World Trade Ltd. Processing rasterized data
US20100327176A1 (en) * 2009-06-30 2010-12-30 Canon Kabushiki Kaisha Image pickup apparatus, image pickup system, and control method thereof
US20110101205A1 (en) * 2009-10-30 2011-05-05 Invisage Technologies, Inc. Systems and methods for color binning
US20120274835A1 (en) 2009-11-30 2012-11-01 Panasonic Corporation Image capturing apparatus and camera main body
US20110293259A1 (en) 2010-05-25 2011-12-01 Apple Inc. Scene Adaptive Auto Exposure
US9077911B2 (en) * 2010-08-23 2015-07-07 Red.Com, Inc. Multi-exposure video
US20120062705A1 (en) 2010-09-03 2012-03-15 Ilia Ovsiannikov Overlapping charge accumulation depth sensors and methods of operating the same
US8483491B2 (en) * 2010-09-30 2013-07-09 Olympus Corporation Calculation device and method
US20120082399A1 (en) * 2010-09-30 2012-04-05 Olympus Corporation Calculation device and method
US20140022348A1 (en) 2010-11-19 2014-01-23 Primesense Ltd. Depth mapping using time-coded illumination
US20120127353A1 (en) 2010-11-22 2012-05-24 Canon Kabushiki Kaisha Image-pickup system and method of controlling same
US20120200749A1 (en) 2011-02-03 2012-08-09 Ulrich Boettiger Imagers with structures for near field imaging
US20120307030A1 (en) * 2011-05-12 2012-12-06 Olive Medical Corporation Image sensor for endoscopic use
US20160256041A1 (en) * 2011-05-12 2016-09-08 DePuy Synthes Products, Inc. Image sensor for endoscopic use
US9980633B2 (en) * 2011-05-12 2018-05-29 DePuy Synthes Products, Inc. Image sensor for endoscopic use
US20130056616A1 (en) 2011-09-01 2013-03-07 Sony Corporation Image sensor, light quantity measurement method, and microscope system
US20130057942A1 (en) 2011-09-02 2013-03-07 Xiaojia Wang Color display devices
US20140072237A1 (en) 2011-10-17 2014-03-13 Kabushiki Kaisha Toshiba Encoding device, decoding device, encoding method, and decoding method
US20140340433A1 (en) 2011-11-09 2014-11-20 Au Optronics Corporation Three-dimensional display panel and driving method thereof
US20150009376A1 (en) * 2012-03-30 2015-01-08 Nikon Corporation Image pickup element and image pickup device
US20130264489A1 (en) 2012-04-04 2013-10-10 Canon Kabushiki Kaisha Radiation imaging apparatus, radiation imaging system, and control method for the radiation imaging apparatus
US20150077590A1 (en) * 2012-05-02 2015-03-19 Nikon Corporation Imaging device
US20150124132A1 (en) * 2012-05-25 2015-05-07 Sony Corporation Imaging element, driving method, and electronic apparatus
US20140152793A1 (en) * 2012-06-07 2014-06-05 Complete Genomics, Inc. Techniques for scanned illumination
US20140022431A1 (en) * 2012-07-19 2014-01-23 Nanyang Innovation & Enterprise Office Cmos image sensor
US20140027613A1 (en) 2012-07-27 2014-01-30 Scott T. Smith Bayer symmetric interleaved high dynamic range image sensor
US20140076184A1 (en) 2012-09-19 2014-03-20 John T. Anderson III Method for forming structured microdots
US20140076180A1 (en) 2012-09-19 2014-03-20 John T. Anderson, III System for forming security markings using structured microdots
US20140078556A1 (en) 2012-09-19 2014-03-20 John T. Anderson, III Method of forming security markings
US20150049230A1 (en) * 2012-10-12 2015-02-19 Samsung Electronics Co., Ltd. Image sensor and method of operating the same
US20140133768A1 (en) 2012-11-13 2014-05-15 Hon Hai Precision Industry Co., Ltd. Electronic device and method for splitting image
US20140133575A1 (en) 2012-11-13 2014-05-15 Hon Hai Precision Industry Co., Ltd. Electronic device and method for splitting image
US20140138548A1 (en) 2012-11-20 2014-05-22 Board Of Regents, The University Of Texas System Apparatus and methods for photosensor quadrant sharing
US20150062304A1 (en) 2013-01-15 2015-03-05 Mobileye Vision Technologies Ltd. Stereo assist with rolling shutters
US20150358571A1 (en) * 2013-01-25 2015-12-10 Innovaciones Microelectrónicas S.L.(Anafocus) Advanced region of interest function for image sensors
US20140226047A1 (en) 2013-02-11 2014-08-14 Tower Semiconductor Ltd. Shared Readout Low Noise Global Shutter Image Sensor Method
US20150381915A1 (en) * 2013-02-13 2015-12-31 Sony Corporation Solid-state imaging device, driving method thereof, and imaging apparatus
EP2770297A1 (en) 2013-02-21 2014-08-27 Mitutoyo Corporation Shape measuring apparatus
US20150381918A1 (en) * 2013-02-21 2015-12-31 Sony Corporation Solid-state imaging device and imaging apparatus
US20140300756A1 (en) * 2013-04-08 2014-10-09 Iix Inc. Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device
US20140347532A1 (en) * 2013-05-21 2014-11-27 Samsung Electronics Co. Ltd. Electronic sensor and method for controlling the same
WO2015001646A1 (en) 2013-07-04 2015-01-08 株式会社ニコン Electronic apparatus, electronic apparatus control method, and control program
EP3018893A1 (en) 2013-07-04 2016-05-11 Nikon Corporation Electronic apparatus, electronic apparatus control method, and control program
US20150015754A1 (en) 2013-07-11 2015-01-15 Sony Corporation Solid-state imaging device, solid-state imaging method, and electronic apparatus
US20150036029A1 (en) 2013-08-01 2015-02-05 Harvest Imaging bvba Image sensor with shading detection
US9277146B2 (en) * 2013-08-12 2016-03-01 Samsung Electronics Co., Ltd. Image sensor, method of operating the same, and system including the image sensor
JP2015046737A (en) 2013-08-28 2015-03-12 株式会社ニコン Image sensor and imaging apparatus
US20150097999A1 (en) * 2013-10-08 2015-04-09 Canon Kabushiki Kaisha Image capturing apparatus and control method thereof
US20160269659A1 (en) 2013-10-21 2016-09-15 Sony Corporation Solid-state image-capturing element and electronic device
US9584745B2 (en) * 2013-11-11 2017-02-28 Semiconductor Components Industries, Llc Image sensors with N-row parallel readout capability
US20150130977A1 (en) 2013-11-11 2015-05-14 Semiconductor Components Industries, Llc Image sensors with n-row parallel readout capability
US20150158289A1 (en) 2013-12-10 2015-06-11 Canon Kabushiki Kaisha Image recording apparatus, image recording method, and storage medium
US20150222801A1 (en) * 2014-01-31 2015-08-06 Wolfvision Innovation Gmbh Image recording method having adaptive marking light emission and such an image recording device
US20160014360A1 (en) * 2014-07-11 2016-01-14 Imperx, Inc. Area scan interline transfer ccd imaging device and apparatus with tdi scanning mode
US20160105596A1 (en) 2014-10-08 2016-04-14 Olympus Corporation Imaging device and shooting method
US20160150128A1 (en) * 2014-11-25 2016-05-26 Raytheon Company Method and apparatus for improving resolution in a tdi image
US9948874B2 (en) 2015-05-19 2018-04-17 Magic Leap, Inc. Semi-global shutter imager
US20180198995A1 (en) 2015-05-19 2018-07-12 Magic Leap, Inc. Semi-global shutter imager
US10594959B2 (en) 2015-05-19 2020-03-17 Magic Leap, Inc. Semi-global shutter imager

Non-Patent Citations (9)

* Cited by examiner, † Cited by third party
Title
European Search Report dated Apr. 17, 2018 for EP Application No. 16797331.2 filed on Dec. 18, 2017, twelve pages.
Examination Report dated Jan. 14, 2021, for Indian Application No. 201747040483, with English transiation, seven pages.
Final Office Action dated Nov. 9 2020, for JP Application No. 2017-560252, with English translation, 22 pages.
International Preliminary Report on Patentability dated Nov. 30, 2017, for PCT Patent Application No. PCT/US2016/033354, Internationally filed on May 19, 2016, 8 pages.
International Search Report dated Sep. 16, 2016, for PCT Patent Application No. PCT/US2016/033354, Internationally filed on May 19, 2016, 2 pages.
Non-Final Office Action dated Jul. 15, 2019, for U.S. Appl. No. 15/916,250, filed Mar. 8, 2018, 14 pages.
Notice of Allowance dated Nov. 4, 2019, for U.S. Appl. No. 15/916,250, filed Mar. 8, 2018, eight pages.
Notice of reasons for rejection, dated May 13, 2020, for JP Application No. 2017-560252, with English translation, 12 pages.
Written Opinion of the International Searching Authority dated Sep. 16, 2016, for PCT Patent Application No. PCT/US2016/033354, Internationally filed on May 19, 2016, 6 pages.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11272127B2 (en) 2015-05-19 2022-03-08 Magic Leap, Inc. Semi-global shutter imager

Also Published As

Publication number Publication date
NZ737677A (en) 2023-06-30
KR102550584B1 (en) 2023-06-30
JP2018516013A (en) 2018-06-14
US20160344957A1 (en) 2016-11-24
IL280427B (en) 2021-12-01
AU2016264606A1 (en) 2017-12-14
KR20180010230A (en) 2018-01-30
US10594959B2 (en) 2020-03-17
JP2021013186A (en) 2021-02-04
AU2016264606B2 (en) 2020-09-03
WO2016187469A1 (en) 2016-11-24
CA2986476A1 (en) 2016-11-24
US11272127B2 (en) 2022-03-08
US20210329180A1 (en) 2021-10-21
IL287335B (en) 2022-07-01
IL255709B (en) 2021-02-28
JP7438251B2 (en) 2024-02-26
EP3298773A1 (en) 2018-03-28
JP7128872B2 (en) 2022-08-31
US9948874B2 (en) 2018-04-17
IL255709A (en) 2018-01-31
NZ776286A (en) 2023-06-30
CN108141575A (en) 2018-06-08
CN108141575B (en) 2020-10-30
JP2022060543A (en) 2022-04-14
KR102511493B1 (en) 2023-03-16
US20200228734A1 (en) 2020-07-16
JP7029961B2 (en) 2022-03-04
US20180198995A1 (en) 2018-07-12
IL294178B2 (en) 2023-07-01
IL280427A (en) 2021-03-01
IL294178A (en) 2022-08-01
IL287335A (en) 2021-12-01
IL294178B1 (en) 2023-03-01
HK1252419A1 (en) 2019-05-24
KR20230042135A (en) 2023-03-27
EP3298773A4 (en) 2018-05-16

Similar Documents

Publication Publication Date Title
US11272127B2 (en) Semi-global shutter imager
US20180241953A1 (en) Methods and apparatus for pixel binning and readout
WO2017013806A1 (en) Solid-state imaging device
US9191566B2 (en) Image pickup apparatus, method for image pickup and computer-readable recording medium
US20110128425A1 (en) Cmos image sensor with selectable hard-wired binning
US10225441B2 (en) Time delay and integration (TDI) imaging sensor and method
US10735677B2 (en) Image capturing apparatus, method, and storage medium for image flicker detection and control
US7932942B2 (en) Solid-state imaging device including three stacked photoelectric conversion layers, three accumulators, and a single readout circuit
JP7118659B2 (en) IMAGING DEVICE, IMAGING DEVICE CONTROL METHOD AND PROGRAM
JP7400863B2 (en) Imaging device and imaging device
JP2006238205A (en) Imaging apparatus and imaging method
JP5926034B2 (en) Image sensor
JP2011188379A (en) Imaging apparatus and solid-state image sensor

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

STPP Information on status: patent application and granting procedure in general

Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION

STPP Information on status: patent application and granting procedure in general

Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT RECEIVED

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED

STCF Information on status: patent grant

Free format text: PATENTED CASE

AS Assignment

Owner name: CITIBANK, N.A., AS COLLATERAL AGENT, NEW YORK

Free format text: SECURITY INTEREST;ASSIGNORS:MOLECULAR IMPRINTS, INC.;MENTOR ACQUISITION ONE, LLC;MAGIC LEAP, INC.;REEL/FRAME:060338/0665

Effective date: 20220504

AS Assignment

Owner name: MAGIC LEAP, INC., FLORIDA

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:KAEHLER, ADRIAN;REEL/FRAME:064233/0531

Effective date: 20160512