US10739278B2 - Contact lens defect inspection using UV illumination - Google Patents
Contact lens defect inspection using UV illumination Download PDFInfo
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- US10739278B2 US10739278B2 US15/355,595 US201615355595A US10739278B2 US 10739278 B2 US10739278 B2 US 10739278B2 US 201615355595 A US201615355595 A US 201615355595A US 10739278 B2 US10739278 B2 US 10739278B2
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- 230000007547 defect Effects 0.000 title claims abstract description 33
- 238000005286 illumination Methods 0.000 title description 34
- 238000007689 inspection Methods 0.000 title description 32
- 239000000463 material Substances 0.000 claims abstract description 33
- 238000001228 spectrum Methods 0.000 claims abstract description 14
- 238000000034 method Methods 0.000 claims description 17
- 230000003287 optical effect Effects 0.000 claims description 11
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 abstract description 10
- 238000004458 analytical method Methods 0.000 description 9
- 230000002950 deficient Effects 0.000 description 9
- 239000000049 pigment Substances 0.000 description 4
- 150000001875 compounds Chemical class 0.000 description 3
- 230000003111 delayed effect Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000001429 visible spectrum Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 239000012611 container material Substances 0.000 description 1
- 239000007850 fluorescent dye Substances 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005424 photoluminescence Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000002211 ultraviolet spectrum Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
-
- H04N5/2256—
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
- H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
- G01N2021/646—Detecting fluorescent inhomogeneities at a position, e.g. for detecting defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06146—Multisources for homogeneisation, as well sequential as simultaneous operation
- G01N2201/06153—Multisources for homogeneisation, as well sequential as simultaneous operation the sources being LED's
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10064—Fluorescence image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Definitions
- the present invention relates to an apparatus for inspecting defects in Ophthalmic lenses suspended in containers filled with Saline solution. More specifically, the present invention relates to an apparatus and method to inspect the Ophthalmic lens quality using Ultraviolet illumination.
- the present invention relates to an inspection system in an automated production line. More particularly, the invention relates to a system and method of inspection of ophthalmic lens that are illuminated with ultraviolet light. The lenses are inspected in containers prior to the sealing process.
- Ophthalmic lenses are packaged in small containers commonly called as blister packs.
- the containers typically contain a single ophthalmic lens submerged in saline solution.
- Prior art systems disclose inspection systems using LED illumination in the form of back light and front light. These type of inspection systems suffer from certain limitations in detecting very fine cracks, bubbles and edge defects in the lenses due to contaminated saline solution and bubbles in the solution that affects the quality of inspection and increases the inspection time significantly as the software has to perform more analysis of the image to differentiate between real and false defects.
- typical LED illumination systems have difficulty in highlighting deformities in the lens material, especially if the deformities are orientated along the axis of the illumination.
- Fluorescence is a process of photo-luminescence by which light of short wavelengths, either in the ultraviolet or the visible regions of the electromagnetic spectrum, is absorbed and re-radiated at longer wavelengths. The re-emission occurs within the visible region of the light spectrum.
- the fluorescent compounds in the contact lens material exhibit the phenomenon of fluorescing under ultraviolet light.
- the fluorescent light emanating from the pigment in the contact lens material is reflected within the polished optical surfaces of the lens and concentrated at the lens edge or any edge formed as a result of a defect or other deformity.
- the phenomena of fluorescing is especially pronounced at the edges of the material and where the material is broken or disrupted in its physical characteristics. No fluorescence is visible when the material is illuminated with standard LED illumination or Infra Red illumination. However the fluorescence is obvious when the same material is illuminated using ultraviolet illumination. Accordingly, defects such as voids, bubbles or cuts within the material will appear as bright (pixels) on the digital image captured by the camera, since little or no light in the fluorescent wavelength will be emitted from the section of the material representative of the defects. Accordingly, the present invention is particularly suited for detecting defects in pigmented lens material, even where those voids may be undetectable to the naked eye.
- An apparatus and methods are needed that can produce consistently enhanced images of contact lenses suspended in saline solution, to enable reliable and robust detection of edge defects, breakages and bubbles in the lenses. This is the objective of the present invention.
- the apparatus and method of the present invention address at least some of the difficulties seen in the prior art.
- the invention provided constitutes a high resolution camera and a lens to capture high quality images of the contact lens which is illuminated with UV light.
- the UV light fundamentally excites the contact lens material or fluorescent pigments that exist within the contact lens material.
- the re-emitted light, which is of a longer wavelength in the visible spectrum passes through an appropriate filter to prevent the camera from picking up stray and other spectrum of light.
- 365 nm ultraviolet
- an object of the present invention to provide an improved method of inspecting contact lenses wherein the lenses are illuminated with Ultraviolet light and images are captured using a specific wavelength color filter (For eg: of 542 nm) positioned in front of the Camera lens.
- a specific wavelength color filter Form eg: of 542 nm
- FIG. 1 shows an illustration of the optical and illumination system according to the present invention.
- FIG. 2 shows an illustration of the optical and illumination system of prior art.
- FIG. 3 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 2 that incorporates a standard LED illumination module.
- FIG. 4 shows an enlarged image of area B 1 in FIG. 3 .
- FIG. 5 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 1 that incorporates a Ultraviolet LED illumination module.
- FIG. 6 shows an enlarged image of area B 1 in FIG. 5 .
- FIG. 7 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 2 that incorporates a standard LED illumination module.
- FIG. 8 shows an enlarged image of area B 2 in FIG. 7 .
- FIG. 9 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 1 that incorporates a Ultraviolet LED illumination module.
- FIG. 10 shows an enlarged image of area B 2 in FIG. 9 .
- FIG. 11 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 2 that incorporates a standard LED illumination module.
- FIG. 12 shows an enlarged image of area B 3 in FIG. 11 .
- FIG. 13 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 1 that incorporates a Ultraviolet LED illumination module.
- FIG. 14 shows an enlarged image of area B 3 in FIG. 13 .
- FIG. 15 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 2 that incorporates a standard LED illumination module.
- FIG. 16 shows an enlarged image of area B 4 in FIG. 15 .
- FIG. 17 shows an image of ophthalmic lens of a defective lens at the edge, captured using the inspection system in FIG. 1 that incorporates a Ultraviolet LED illumination module.
- FIG. 18 shows an enlarged image of area B 4 in FIG. 17 .
- a system 100 and method for detecting defects at the edges, bubbles and breakages and other deformities within the lens material includes a camera 220 having a lens 210 suitably integrated to a computer for analysis of the image captured by camera 220 as seen through the lens 210 .
- the camera 220 may include an integral or detached illumination module 130 that emits ultraviolet light synchronously with the operation of a shutter or a strobe controlling electronics module (not shown), as is well known in the art.
- first optical filter 110 is disposed over the lens 210 of the camera 220 thereof such that any light entering the lens 210 must first pass through the first optical filter 110 .
- the first optical filter 110 is selected to block those wave lengths of light that include the wavelengths that excite the fluorescence of the contact lens 150 , being inspected.
- the camera 220 obtains an image that includes the light emitted through the effect of fluorescence but devoid of details from the spectrum of light rejected by the first optical filter 110 .
- the placement of the first optical filter 110 whether in front of or behind the lens 210 of the camera 220 , does not affect the operation of the present invention.
- the present invention may incorporate an ultraviolet (UV) light source 130 , or alternatively a plurality thereof, disposed in an array around the lens 210 of the camera 220 in order to provide comprehensive UV light illumination of the inspection target at a plurality of incident angles.
- the UV light sources 130 may comprise a plurality of UV light emitting diodes (LEDs) emitting light at a wavelength sufficient to excite fluorescent emission in the contact lens 150 suspended in a saline solution 140 all of which are held in a container 120 being inspected.
- the container material 120 may include, but not limited to translucent or frosted plastic material.
- the LEDs used to illuminate the contact lens may be selected to emit radiation in the spectrum required to excite fluorescent emission for a given lens material type. Accordingly, it is possible to either select a different optical filter to tailor the excitation light spectrum based on a UV LED array 210 , or select an LED array to correspond to the requisite excitation light spectrum.
- the UV LEDs based illumination module may be energized to emit light synchronously with the operation of the camera 220 in order to reduce the requisite electrical power required to operate the UV LEDs as well as extend the useful life of the LEDs as well as to eliminate smear in the image capture. This may be accomplished by utilizing a commercial electronic strobe controller (not shown) to deliver a programmed time pulse to the LED array synchronously with the camera 220 image acquisition process.
- the camera 220 obtains an image that includes the light emitted by the lens 150 through the effect of fluorescence created as a result of the UV light source 130 , but devoid of details from the spectrum of light rejected by the first optical filter 110 .
- the apparatus in FIG. 2 relates to prior art commonly designed for inspecting defects in contact lenses.
- the apparatus 200 in FIG. 2 differs from the apparatus 100 of the present invention shown in FIG. 1 , where in the backlight or common LED illumination 160 of FIG. 2 is positioned below the object of inspection 150 compared to the front light UV LED illumination 130 of FIG. 1 which is positioned on top of the object 150 to be inspected.
- FIG. 3 shows an image of an ophthalmic lens captured using apparatus 200 illustrated in FIG. 2 .
- a probable defect is seen in the form of a broken edge in the area shown by box B 1 .
- An enlarged image of the box B 1 ( FIG. 3 ) is shown in FIG. 4 .
- the edge of the ophthalmic is seen as a Black edge with a small and insignificant break in the edge.
- the edge in FIG. 4 may or may not be detected as a defect. This ambiguity may result in the Ophthalmic lens being inspected as a GOOD or BAD lens. More analysis may need to be done on the image which results in delayed inspection result.
- FIG. 5 shows an image of the same ophthalmic lens of FIG. 3 , but with the image captured using apparatus 100 as illustrated in FIG. 1 .
- the area indicated by box B in FIG. 5 is shown enlarged in FIG. 6 .
- the edge of the ophthalmic lens is seen as a white edge due to the florescence phenomenon when exposed to UV LED illumination utilized in apparatus 100 . It is evident that the white circular line representing the edge of the ophthalmic lens shows a non-continuous white line, indicating a defect at the edge of the lens. Further analysis by the software, the break in the white line indicating the edge in FIG. 6 of the lens is accurately and consistently detected as a non-continuous edge.
- FIG. 7 shows an image of an ophthalmic lens captured using apparatus 200 illustrated in FIG. 2 .
- a probable defect is seen in the form of a bubble within the lens material in the area shown by box B 2 .
- An enlarged image of the box B 2 ( FIG. 7 ) is shown in FIG. 8 .
- the bubble is seen as a round defect with at the edge of the lens.
- the bubble in FIG. 8 may or may not be detected as a defect. This ambiguity may result in the Ophthalmic lens being inspected as a GOOD or BAD lens. More analysis may need to be done on the image which results in delayed inspection result.
- FIG. 9 shows an image of the same ophthalmic lens of FIG. 7 , but with the image captured using apparatus 100 as illustrated in FIG. 1 .
- the area indicated by box B 2 in FIG. 9 is shown enlarged in FIG. 10 .
- the edge of the ophthalmic lens is seen as a white edge due to the florescence phenomenon when exposed to UV LED illumination utilized in apparatus 100 . It is also evident that the semi-circular white circular line representing the edge of the bubble within the ophthalmic lens is very prominent and can be reliably and repeatedly detected. It is important to note that on further analysis by software algorithms, measurements such as diameter of the bubble, any foreign particle etc., is easily accomplished as the image is greatly enhanced.
- FIG. 11 shows an image of an ophthalmic lens captured using apparatus 200 illustrated in FIG. 2 .
- the contact lens is positioned at a spot in the container 120 wherein it coincides with the edge of the Saline solution.
- a bubble defect is observed in the area B 3 .
- An enlarged image of the box B 3 ( FIG. 11 ) is shown in FIG. 12 .
- a faint bubble is seen very close to the black edge of the lens and the Saline solution.
- the bubble is seen as a round defect with at the edge of the lens.
- the bubble in FIG. 12 may or may not be detected as a defect. This ambiguity may result in the Ophthalmic lens being inspected as a GOOD or BAD lens. More analysis may need to be done on the image which results in delayed inspection result.
- FIG. 13 shows an image of the same ophthalmic lens of FIG. 11 , but with the image captured using apparatus 100 as illustrated in FIG. 1 .
- the area indicated by box B 3 in FIG. 13 is shown enlarged in FIG. 14 .
- the edge of the ophthalmic lens is seen as a white edge due to the florescence phenomenon when exposed to UV LED illumination utilized in apparatus 100 . It is also evident that the semi-circular white circular line representing the edge of the bubble within the ophthalmic lens is significantly enhanced without merging into the Saline Solution background as observed in FIG. 12 .
- the bubble in FIG. 14 is seamlessly detected by the analysis software and furthermore it is repeatedly and consistently located accurately to ensure assured quality of the inspected product.
- FIG. 15 shows an image of an ophthalmic lens captured using apparatus 200 illustrated in FIG. 2 .
- a probable crack defect is seen in the box area B 4 .
- An enlarged image of the box B 4 ( FIG. 15 ) is shown in FIG. 16 .
- Some parts of the area in B 4 shows a dark line which is discontinuous in certain parts and faint in other parts. Inspection of this defect can yield unreliable results.
- FIG. 17 shows an image of the same ophthalmic lens of FIG. 15 , but with the image captured using apparatus 100 as illustrated in FIG. 1 .
- the area indicated by box B 4 in FIG. 17 is shown enlarged in FIG. 18 .
- the defect seen in box B 4 of FIG. 18 appears like a probable crack appears like a prominent dark line when exposed to UV LED illumination utilized in apparatus 100 . It is also evident that the line is continuous with high contrast, which results in the defect being reliably and repeatedly detected when analyzed by the inspection system.
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Abstract
Description
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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US16/940,564 US11408834B2 (en) | 2015-11-18 | 2020-07-28 | Contact lens defect inspection using UV illumination |
Applications Claiming Priority (2)
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SG10201509497VA SG10201509497VA (en) | 2015-11-18 | 2015-11-18 | Contact lens defect inspection using uv illumination |
SG10201509497V | 2015-11-18 |
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US16/940,564 Division US11408834B2 (en) | 2015-11-18 | 2020-07-28 | Contact lens defect inspection using UV illumination |
Publications (2)
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US20170138867A1 US20170138867A1 (en) | 2017-05-18 |
US10739278B2 true US10739278B2 (en) | 2020-08-11 |
Family
ID=58640351
Family Applications (2)
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US15/355,595 Active 2038-04-02 US10739278B2 (en) | 2015-11-18 | 2016-11-18 | Contact lens defect inspection using UV illumination |
US16/940,564 Active US11408834B2 (en) | 2015-11-18 | 2020-07-28 | Contact lens defect inspection using UV illumination |
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US16/940,564 Active US11408834B2 (en) | 2015-11-18 | 2020-07-28 | Contact lens defect inspection using UV illumination |
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US (2) | US10739278B2 (en) |
JP (1) | JP2017106909A (en) |
KR (1) | KR20170058318A (en) |
CN (1) | CN106940306A (en) |
DE (1) | DE102016122146A1 (en) |
MY (1) | MY191431A (en) |
SG (1) | SG10201509497VA (en) |
TW (1) | TW201733335A (en) |
Families Citing this family (5)
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US20180356558A1 (en) * | 2017-06-08 | 2018-12-13 | Novartis Ag | Method for detecting the presence or absence of an ophthalmic lens within a receptacle |
KR102194289B1 (en) * | 2019-03-18 | 2020-12-22 | 주식회사 유니온커뮤니티 | Apparatus and Method for Inspecting Cutting-off Ability of Blue or Violet Light |
WO2022050151A1 (en) * | 2020-09-02 | 2022-03-10 | 京セラ株式会社 | Contact lens, case for contact lens, and contact lens unit |
US11796418B2 (en) * | 2020-10-14 | 2023-10-24 | Emage Vision Pte. Ltd. | Contact lens defect analysis and tracing system |
US11861823B2 (en) * | 2021-04-27 | 2024-01-02 | Johnson & Johnson Vision Care, Inc. | Microfluidic device and method for quantifying contact lens deposition |
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Also Published As
Publication number | Publication date |
---|---|
TW201733335A (en) | 2017-09-16 |
JP2017106909A (en) | 2017-06-15 |
US20200355626A1 (en) | 2020-11-12 |
US20170138867A1 (en) | 2017-05-18 |
CN106940306A (en) | 2017-07-11 |
KR20170058318A (en) | 2017-05-26 |
DE102016122146A1 (en) | 2017-05-18 |
SG10201509497VA (en) | 2017-06-29 |
US11408834B2 (en) | 2022-08-09 |
MY191431A (en) | 2022-06-27 |
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