US10516402B2 - Corrupted clock detection circuit for a phase-locked loop - Google Patents

Corrupted clock detection circuit for a phase-locked loop Download PDF

Info

Publication number
US10516402B2
US10516402B2 US16/232,893 US201816232893A US10516402B2 US 10516402 B2 US10516402 B2 US 10516402B2 US 201816232893 A US201816232893 A US 201816232893A US 10516402 B2 US10516402 B2 US 10516402B2
Authority
US
United States
Prior art keywords
reference clock
circuit
output
window detector
error
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US16/232,893
Other versions
US20190280695A1 (en
Inventor
Eric Paul LINDGREN
Arvind Sridhar
Jayawardan Janardhanan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Priority to US16/232,893 priority Critical patent/US10516402B2/en
Assigned to TEXAS INSTRUMENTS INCORPORATED reassignment TEXAS INSTRUMENTS INCORPORATED ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SRIDHAR, ARVIND, LINDGREN, ERIC PAUL, JANARDHANAN, JAYAWARDAN
Priority to CN201910162371.2A priority patent/CN110247656B/en
Publication of US20190280695A1 publication Critical patent/US20190280695A1/en
Application granted granted Critical
Publication of US10516402B2 publication Critical patent/US10516402B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
    • H03L7/095—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using a lock detector
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/08—Details of the phase-locked loop
    • H03L7/10—Details of the phase-locked loop for assuring initial synchronisation or for broadening the capture range
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
    • H03L7/00—Automatic control of frequency or phase; Synchronisation
    • H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
    • H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
    • H03L7/18—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using a frequency divider or counter in the loop

Definitions

  • a phase-locked loop is an electrical circuit that generates an output dock that is phase-locked to an input reference dock.
  • PLLs are used for a variety of purposes including, for example, communication systems, computers, and the like.
  • PLLs can be digital PLLS (DPLL) or analog PLL (APLL).
  • a circuit includes a selection circuit coupled to receive a plurality of reference clocks. The selection circuit is controlled by a control signal to output one of the plurality of reference clocks.
  • a phase-locked loop is coupled to an output of the selection circuit and uses the output reference clock from the selection circuit for phase locking an output clock generated by the phase-locked loop.
  • a plurality of reference clock window detector circuits is included. Each reference clock window detector circuit is coupled to receive a separate one of the plurality of reference clocks.
  • Each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window. Further, each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window.
  • a method in another example, includes detecting a first error condition corresponding to a first edge of a reference clock occurring before expiration of a first counter, detecting a second error condition corresponding to a second edge of the reference clock occurring after expiration of a second counter, asserting an error signal responsive to detection of the first error condition, and asserting the error signal responsive to detection of the second error condition.
  • FIG. 1 is a timing diagram illustrating a late reference clock.
  • FIG. 2 shows a schematic of a circuit that implements an early time window and a late time window to detect early or late reference clock edges.
  • FIG. 3 shows an example implementation of a reference clock window detector usable in the schematic of FIG. 2 .
  • FIG. 4 is a timing diagram illustrating the circuit's operation upon occurrence of an early clock.
  • FIG. 5 is a timing diagram illustrating the circuit's operation upon occurrence of a late clock.
  • FIG. 6 illustrates the early and late time windows implemented by the reference clock window detector of FIG. 3 .
  • a PLL phase locks an output clock to a reference clock.
  • the reference clock should have a constant frequency and thus constant period. However, it is possible that the period can vary from cycle to cycle of a reference clock. Jitter or other effects may cause a variation in the period of a reference clock.
  • a PLL should detect a corrupted reference clock as quickly as possible to eliminate phase perturbation on the PLL's output clock.
  • FIG. 1 illustrates several cycles of an ideal reference clock 50 and a corrupted reference clock 60 .
  • the ideal reference clock 50 has rising edges that occur at relatively fixed time periods. That is, the time period (T 1 ) of each cycle of the ideal reference clock 50 does not vary, or least by so little so as not to cause performance issues in a PLL that uses the ideal reference clock.
  • the first two cycles of the corrupted reference clock 60 have a constant period of T 2 as shown.
  • pulse 65 of the corrupted reference clock 60 has a rising edge that is substantially delayed from where it should have been (as denoted by dashed line 68 ).
  • Some PLL systems include a late clock detection capability in which a valid window 70 is implemented. If the next clock edge is detected before the current valid window 70 ends (as illustrated at 73 ), then that clock cycle is deemed to be valid. However, if the valid window 70 ends before the next reference clock edge (e.g., edge 75 ) occurs, a missing clock detect signal 80 is generated and the PLL system responds in a suitable manner.
  • FIG. 2 shows an example of a circuit 200 that detects both early and late reference clocks.
  • the circuit shown in the example of FIG. 2 includes a selection circuit 202 , a PLL 204 , reference clock window detector circuits 210 , and a finite state machine (FSM) 220 .
  • the selection circuit 202 may comprise a multiplexer (such as is shown in FIG. 2 ) or other form of selection circuit, and is referred to as a multiplexer 202 herein.
  • One or more reference clocks (REFCLK_ 1 through REFCLK_n) are provided to inputs of the multiplexer 202 , which selects one of the input reference clocks as an input reference clock (REFCLK_IN) to the PLL 204 .
  • the PLL 204 may comprise a DPLL and/or an APLL.
  • Each REFCLK_ 1 through REFCLK_n is provided to a separate reference clock window detector 210 .
  • REFCLK_ 1 is provided to reference clock window detector 210 a and REFCLK_n is provided to reference clock window detector 210 n (reference clock window detector circuits 210 a through 210 n collectively referred to as reference clock window detector circuits 210 ).
  • Each of the reference clock window detector circuits 210 asserts an error signal (ERROR) to the FSM 220 to indicate whether an early or late error condition has been detected for the corresponding reference clock. For example, ERROR asserted high indicates an early or late error condition and ERROR being low indicates absence of either kind of early/late error, or vice versa.
  • ERROR error signal
  • Each reference clock window detector 210 asserts ERROR responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window.
  • Each reference clock window detector circuit also asserts ERROR responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window.
  • two separate time windows are implemented—one for the detection of an erroneously early reference clock and the other for the detection of an erroneously late reference clock.
  • ERROR being asserted to the FSM 220 does not distinguish as to which type of error condition has occurred—either way a reference clock error has occurred and the FSM 220 will take corrective action.
  • the FSM 220 monitors the ERROR signals from the other reference clock window detectors 210 , selects another reference clock (assuming the corresponding reference clock window detector has not also actively asserted its ERROR signal), and asserts the control signal 222 to the multiplexer 202 to switch to a different reference clock.
  • the selection of which reference clock to use, to the extent multiple other reference clocks are provided to the multiplexer 202 is preconfigured into the FSM logic in some examples.
  • FIG. 3 provides an example implementation of a reference clock window detector 210 .
  • This example implementation includes an early counter 310 , a late counter 350 , flip-flops 315 , 320 , 330 , 355 , 360 , and 385 , inverter 322 , OR gate 380 , clock synchronizer 332 , and reference-based clear circuit 362 .
  • a sampling clock is provided to clock the early counter 310 and the late counter 350 .
  • the sampling clock is derived from a high frequency oscillator and then divided down to a suitable sampling frequency, which is greater than the frequency of the reference clock, REFCLK_x.
  • the clock synchronizer circuit 332 synchronizes REFCLK_x to the sampling clock and may include one or more flip-flops for this purpose.
  • the output from the clock synchronizer is labeled as REFCLK_IN, which is provided to the load inputs of the early and late counters 310 , 350 .
  • Assertion of load input causes each counter 310 , 350 to reset itself to an initial count value and to begin counting pulse of the sampling clock.
  • the initial count value is set to be different between the two counters so as to implement a late window that is longer than an early window.
  • the count value for the early counter 310 is shown as “n” and for the late counter 350 is shown a “m”.
  • the value m is larger than the value n in this example.
  • the counters 310 , 350 are count-down counters in that, following a reset event, each counter starts counting down from its programming count value (n or m as shown) to zero.
  • the output of each counter 310 , 350 is low while counting down until the terminal value (0) is reached, at which point the output is asserted high. That is, when the early counter 310 reaches 0, its output 311 (labeled as early counter output, ECOUT) is asserted. Similarly, when the late counter 350 reaches 0, its output 351 (labeled as late counter output, LCOUT) is asserted.
  • the output 311 of early counter 311 is provided to the clock input of flip-flop 315 and the output 351 of late counter 350 is provided to the clock input of flip-flop 355 .
  • the data (D) inputs of both flip-flops 315 and 355 are tied to a logic high level. Thus, if and when the early counter 310 reaches 0, its output transitions from low to high thereby clocking a logic high on the Q output (labeled as Q 1 ) of flip-flop 315 . Similarly, if and when the late counter 350 reaches 0, its output transitions from low to high thereby clocking a logic high on the Q output (labeled as Q 3 ) of flip-flop 355 .
  • the Q outputs of flip-flops 315 and 355 are provided to the data inputs of flips-flops 320 and 360 , respectively.
  • the sampling clock is used to clock flip-flop 360 .
  • Flip-flop 320 is clocked by the Q output (labeled as Q 2 ) of flip-flop 330 .
  • the Q bar (QB) output of flip-flop 320 is a signal labeled as EARLY FLAG.
  • Flip-flop 330 is clocked by REFCLK_x.
  • the Q output of flip-flop 360 is a signal labeled as LATE FLAG. Absent an early reference clock, the QB output (EARLY FLAG) of flip-flop 320 is logic low.
  • the Q output (LATE FLAG) of flip-flop 360 also is logic low.
  • the data input of flip-flop 330 is tied to a logic high.
  • the Q output of flip-flop 330 transitions from low to high upon a rising edge of REFCLK_X.
  • Flip-flop 330 is used to introduce a small time delay so that a subsequent edge of REFCLK_x is used to clock flip-flop 330 from the edge of REFCLK_x (REFCLK_IN) that resets the early counter 310 .
  • OR gate 380 is coupled to the QB output of flip-flop 320 and the Q output of flip-flop 360 to logically OR together EARLY FLAG and LATE FLAG to generate an ERROR signal.
  • Flip-flop 385 functions as a latch to hold ERROR on its Q output to the FSM 220 .
  • the ERROR signal to the FSM 220 can be either the output of OR gate 380 or the latched output from flip-flop 385 .
  • the reference-based clear circuit 362 generates a clear signal to clear flip-flops 330 , 315 and 355 responsive to REFCLK_IN.
  • the reference-based clear circuit 362 asserts the clear signal high upon a rising edge of REFCLK_IN and de-asserts the clear signal upon the next sampling clock rising edge.
  • FIG. 4 is a timing diagram further illustrating the operation of a reference clock window detector circuit 210 .
  • the signals shown include REFCLK_IN, ECOUNT 311 , LCOUNT 351 , Q 1 , Q 2 , Q 3 , EARLY FLAG, LATE FLAG, and ERROR.
  • Three cycles of REFCLK_IN are shown having rising edges 400 , 401 and 403 .
  • Dashed lines 406 indicate when rising edges of REFCLK_IN should occur in the absence of any early or late perturbations in the reference clock. In this example, rising edge 401 occurs at an appropriate time (not too early and not too late), but rising edge 403 occurs early.
  • the early counter 310 begins counting from its initial count value towards zero upon rising edge 400 of REFCLK_IN and counts down to zero, thereby defining the early window, at time point 405 .
  • the early counter 310 is again reset at rising edge 401 and again counts down to zero at time point 407 .
  • the early counter 310 is again reset and ECOUT is forced back to a logic low level. ECOUT again becomes logic high at 412 upon the early counter 310 again reaching 0.
  • EARLY FLAG remains logic low when Q 2 is asserted high as long as Q 1 is logic high.
  • the rising edge 401 occurs after the expiration of the early window which ends at 405 , and thus the EARLY FLAG remains at a logic 0 level as shown at 420 because Q 1 is high when Q 2 becomes high.
  • EARLY FLAG is asserted high at 430 because Q 1 is low when Q 2 experiences rising edge 425 .
  • ERROR is also asserted high at 440 from ORE gate 380 and/or from latching flip-flop 385 .
  • both counters 310 , 350 are reset. Late counter 350 is reset and before it reaches zero, and thus LCOUT remains low as shown. With LCOUT being low, the LATE FLAG remains low as well.
  • FIG. 5 shows a timing diagram to illustrate the operation of the reference clock window detector 210 in the case of a late reference clock.
  • Rising edge 502 occurs late in this example.
  • Dashed line 503 indicates the end of the early time window counted by early counter 310 and dashed line 504 indicates the end of the late time window counted by late counter 350 .
  • Rising edge 502 of REFCLK_IN occurs after the end of the late window ( 504 ).
  • LCOUT is already high ( 510 ) due to the late counter 350 having reached 0 and thus Q 3 also is forced high ( 512 ) by flip-flop 355 .
  • LATE FLAG Upon the next edge of the sampling clock, LATE FLAG also is forced high at 514 .
  • LATE FLAG being high causes OR gate 380 to assert ERROR high as well as is shown at 520 .
  • FIG. 6 illustrates the early time window 610 implemented via early counter 310 and the late time window 620 implemented via late counter 350 .
  • Each early time window 610 and each late time window 620 begin upon a rising edge of REFCLK_IN.
  • the early time window 610 ends based on the count value of early counter 310 which is smaller than the count value for the late counter 350 .
  • the time 625 between the expiration of the early time window 610 and the expiration of the late time window 620 is a valid window during which a rising edge of REFCLK_IN should occur, assuming a valid REFCLK_IN is present.
  • Waveform 600 shows multiple cycles of an ideal reference clock.
  • Waveform 602 shows an example of reference clock in which one of the edges 603 occurs prematurely.
  • Waveform 602 shows an example of reference clock in which one of the edges 605 occurs too late.
  • Edge 603 occurs before the valid time window 630 starts, a condition which causes EARLY FLAG to be asserted high ( 640 ).
  • Edge 605 occurs after the expiration of the valid time window 630 starts, a condition which causes LATE FLAG to be asserted high ( 650 ).
  • Couple means either an indirect or direct wired or wireless connection.
  • a first device couples to a second device, that connection may be through a direct connection or through an indirect connection via other devices and connections.
  • the recitation “based on” means “based at least in part on.” Therefore, if X is based on Y, X may be a function of Y and any number of other factors.

Landscapes

  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Synchronisation In Digital Transmission Systems (AREA)

Abstract

A selection circuit receives a plurality of reference clocks. The selection circuit is controlled by a control signal to output one of the plurality of reference clocks. A phase-locked loop couples to an output of the selection circuit and uses the selected reference clock for phase locking an output clock. A plurality of reference clock window detector circuits is included. Each reference clock window detector circuit receives a separate reference clock. Each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window. Further, each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window.

Description

RELATED APPLICATIONS
This application claims priority to U.S. Provisional Application No. 62/640,603, filed Mar. 9, 2018, which is hereby incorporated by reference.
BACKGROUND
A phase-locked loop (PLL) is an electrical circuit that generates an output dock that is phase-locked to an input reference dock. PLLs are used for a variety of purposes including, for example, communication systems, computers, and the like. PLLs can be digital PLLS (DPLL) or analog PLL (APLL).
SUMMARY
In at least one example, a circuit includes a selection circuit coupled to receive a plurality of reference clocks. The selection circuit is controlled by a control signal to output one of the plurality of reference clocks. A phase-locked loop is coupled to an output of the selection circuit and uses the output reference clock from the selection circuit for phase locking an output clock generated by the phase-locked loop. A plurality of reference clock window detector circuits is included. Each reference clock window detector circuit is coupled to receive a separate one of the plurality of reference clocks. Each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window. Further, each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window.
In another example, a method includes detecting a first error condition corresponding to a first edge of a reference clock occurring before expiration of a first counter, detecting a second error condition corresponding to a second edge of the reference clock occurring after expiration of a second counter, asserting an error signal responsive to detection of the first error condition, and asserting the error signal responsive to detection of the second error condition.
BRIEF DESCRIPTION OF THE DRAWINGS
For a detailed description of various examples, reference will now be made to the accompanying drawings in which:
FIG. 1 is a timing diagram illustrating a late reference clock.
FIG. 2 shows a schematic of a circuit that implements an early time window and a late time window to detect early or late reference clock edges.
FIG. 3 shows an example implementation of a reference clock window detector usable in the schematic of FIG. 2.
FIG. 4 is a timing diagram illustrating the circuit's operation upon occurrence of an early clock.
FIG. 5 is a timing diagram illustrating the circuit's operation upon occurrence of a late clock.
FIG. 6 illustrates the early and late time windows implemented by the reference clock window detector of FIG. 3.
 DETAILED DESCRIPTION
As noted above, a PLL phase locks an output clock to a reference clock. The reference clock should have a constant frequency and thus constant period. However, it is possible that the period can vary from cycle to cycle of a reference clock. Jitter or other effects may cause a variation in the period of a reference clock. A PLL should detect a corrupted reference clock as quickly as possible to eliminate phase perturbation on the PLL's output clock.
Some PLLs include a missing clock detection capability as illustrated in FIG. 1. FIG. 1 illustrates several cycles of an ideal reference clock 50 and a corrupted reference clock 60. The ideal reference clock 50 has rising edges that occur at relatively fixed time periods. That is, the time period (T1) of each cycle of the ideal reference clock 50 does not vary, or least by so little so as not to cause performance issues in a PLL that uses the ideal reference clock. The first two cycles of the corrupted reference clock 60 have a constant period of T2 as shown. However, pulse 65 of the corrupted reference clock 60 has a rising edge that is substantially delayed from where it should have been (as denoted by dashed line 68).
Some PLL systems include a late clock detection capability in which a valid window 70 is implemented. If the next clock edge is detected before the current valid window 70 ends (as illustrated at 73), then that clock cycle is deemed to be valid. However, if the valid window 70 ends before the next reference clock edge (e.g., edge 75) occurs, a missing clock detect signal 80 is generated and the PLL system responds in a suitable manner.
While generally satisfactory for detecting a late or missing clock, early clocks cannot be detected with this scheme. An early clock (i.e., a clock edge that occurs substantially before it should have occurred) can also impair the performance of a PLL. The examples described herein advantageously detect both early and late clocks.
FIG. 2 shows an example of a circuit 200 that detects both early and late reference clocks. The circuit shown in the example of FIG. 2 includes a selection circuit 202, a PLL 204, reference clock window detector circuits 210, and a finite state machine (FSM) 220. The selection circuit 202 may comprise a multiplexer (such as is shown in FIG. 2) or other form of selection circuit, and is referred to as a multiplexer 202 herein. One or more reference clocks (REFCLK_1 through REFCLK_n) are provided to inputs of the multiplexer 202, which selects one of the input reference clocks as an input reference clock (REFCLK_IN) to the PLL 204. The PLL 204 may comprise a DPLL and/or an APLL.
Each REFCLK_1 through REFCLK_n is provided to a separate reference clock window detector 210. REFCLK_1 is provided to reference clock window detector 210 a and REFCLK_n is provided to reference clock window detector 210 n (reference clock window detector circuits 210 a through 210 n collectively referred to as reference clock window detector circuits 210). Each of the reference clock window detector circuits 210 asserts an error signal (ERROR) to the FSM 220 to indicate whether an early or late error condition has been detected for the corresponding reference clock. For example, ERROR asserted high indicates an early or late error condition and ERROR being low indicates absence of either kind of early/late error, or vice versa. Each reference clock window detector 210 asserts ERROR responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window. Each reference clock window detector circuit also asserts ERROR responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window. Thus, two separate time windows are implemented—one for the detection of an erroneously early reference clock and the other for the detection of an erroneously late reference clock. In this example, ERROR being asserted to the FSM 220 does not distinguish as to which type of error condition has occurred—either way a reference clock error has occurred and the FSM 220 will take corrective action.
If one of REFCLK_1 through REFCLK_n is currently being selected through multiplexer 202 to provide REFCLK_IN to the PLL 204 and the reference clock window detector 210 for that particular reference clock detects an early or late condition, that reference clock window detector asserts is ERROR signal to the FSM 220. In response, the FSM 220 monitors the ERROR signals from the other reference clock window detectors 210, selects another reference clock (assuming the corresponding reference clock window detector has not also actively asserted its ERROR signal), and asserts the control signal 222 to the multiplexer 202 to switch to a different reference clock. The selection of which reference clock to use, to the extent multiple other reference clocks are provided to the multiplexer 202, is preconfigured into the FSM logic in some examples.
FIG. 3 provides an example implementation of a reference clock window detector 210. This example implementation includes an early counter 310, a late counter 350, flip- flops 315, 320, 330, 355, 360, and 385, inverter 322, OR gate 380, clock synchronizer 332, and reference-based clear circuit 362. A sampling clock is provided to clock the early counter 310 and the late counter 350. The sampling clock is derived from a high frequency oscillator and then divided down to a suitable sampling frequency, which is greater than the frequency of the reference clock, REFCLK_x. The clock synchronizer circuit 332 synchronizes REFCLK_x to the sampling clock and may include one or more flip-flops for this purpose. The output from the clock synchronizer is labeled as REFCLK_IN, which is provided to the load inputs of the early and late counters 310, 350.
Assertion of load input (e.g., a rising edge of REFCLK_IN) causes each counter 310, 350 to reset itself to an initial count value and to begin counting pulse of the sampling clock. The initial count value is set to be different between the two counters so as to implement a late window that is longer than an early window. The count value for the early counter 310 is shown as “n” and for the late counter 350 is shown a “m”. The value m is larger than the value n in this example.
In the example of FIG. 3, the counters 310, 350 are count-down counters in that, following a reset event, each counter starts counting down from its programming count value (n or m as shown) to zero. The output of each counter 310, 350 is low while counting down until the terminal value (0) is reached, at which point the output is asserted high. That is, when the early counter 310 reaches 0, its output 311 (labeled as early counter output, ECOUT) is asserted. Similarly, when the late counter 350 reaches 0, its output 351 (labeled as late counter output, LCOUT) is asserted. The output 311 of early counter 311 is provided to the clock input of flip-flop 315 and the output 351 of late counter 350 is provided to the clock input of flip-flop 355. The data (D) inputs of both flip- flops 315 and 355 are tied to a logic high level. Thus, if and when the early counter 310 reaches 0, its output transitions from low to high thereby clocking a logic high on the Q output (labeled as Q1) of flip-flop 315. Similarly, if and when the late counter 350 reaches 0, its output transitions from low to high thereby clocking a logic high on the Q output (labeled as Q3) of flip-flop 355.
The Q outputs of flip- flops 315 and 355 are provided to the data inputs of flips- flops 320 and 360, respectively. The sampling clock is used to clock flip-flop 360. Flip-flop 320 is clocked by the Q output (labeled as Q2) of flip-flop 330. The Q bar (QB) output of flip-flop 320 is a signal labeled as EARLY FLAG. Flip-flop 330 is clocked by REFCLK_x. The Q output of flip-flop 360 is a signal labeled as LATE FLAG. Absent an early reference clock, the QB output (EARLY FLAG) of flip-flop 320 is logic low. Similarly, absent a late reference clock, the Q output (LATE FLAG) of flip-flop 360 also is logic low. The data input of flip-flop 330 is tied to a logic high. The Q output of flip-flop 330 transitions from low to high upon a rising edge of REFCLK_X. Flip-flop 330 is used to introduce a small time delay so that a subsequent edge of REFCLK_x is used to clock flip-flop 330 from the edge of REFCLK_x (REFCLK_IN) that resets the early counter 310.
OR gate 380 is coupled to the QB output of flip-flop 320 and the Q output of flip-flop 360 to logically OR together EARLY FLAG and LATE FLAG to generate an ERROR signal. Flip-flop 385 functions as a latch to hold ERROR on its Q output to the FSM 220. The ERROR signal to the FSM 220 can be either the output of OR gate 380 or the latched output from flip-flop 385.
The following discussion explains the operation of the early window to detect an early reference clock. For the early reference clock detection, while early counter 310 is counting down, but before its terminal count is reached, the output 311 of the early counter is 0 and the Q output of flip-flop 315 is 0. Flip-flop 320 has been preset by the output of inverter 322 (via FSM 220) and thus its QB output (EARLY FLAG) is logic 0. Upon occurrence of an early reference clock (i.e., a reference clock rising edge that occurs after the early counter 310 has been reset and is counting down but before the early counter 310 reaches 0), flip-flop 330 is clocked thereby forcing its Q output to transition from low to high and clocking flip-flop 320. Flip-flop 320 at this point is clocked with its D input being 0 which then causes EARLY FLAG to transition to a high logic level and ERROR is asserted high via OR gate 380.
The following discussion explains the operation of the late window to detect a late reference clock. For the late reference clock detection, while late counter 350 is counting down, but before its terminal count is reached, the output 351 of the late counter is 0 and the Q output of flip-flop 315 is 0. Flip-flop 360 has been cleared by the FSM 220, and thus its Q output (LATE FLAG) is logic 0. Once the late counter 350 counts down to 0, flip-flop 355 is then clocked thereby forcing the Q output of flip-flop 355 to a logic high level, which in turn forces the Q output of flip-flop 360 (LATE) FLAG to become logic high upon the next rising edge of the sampling clock. OR gate 380 then causes its ERROR output signal to become logic high in response to LATE FLAG being high. Had the next rising edge of REFCLK_x occurred before the late counter 350 expired, the late counter 350 would have been reset by the REFCLK_x edge and not permitted to count down to 0.
The reference-based clear circuit 362 generates a clear signal to clear flip- flops 330, 315 and 355 responsive to REFCLK_IN. In one example, the reference-based clear circuit 362 asserts the clear signal high upon a rising edge of REFCLK_IN and de-asserts the clear signal upon the next sampling clock rising edge.
FIG. 4 is a timing diagram further illustrating the operation of a reference clock window detector circuit 210. The signals shown include REFCLK_IN, ECOUNT 311, LCOUNT 351, Q1, Q2, Q3, EARLY FLAG, LATE FLAG, and ERROR. Three cycles of REFCLK_IN are shown having rising edges 400, 401 and 403. Dashed lines 406 indicate when rising edges of REFCLK_IN should occur in the absence of any early or late perturbations in the reference clock. In this example, rising edge 401 occurs at an appropriate time (not too early and not too late), but rising edge 403 occurs early. The early counter 310 begins counting from its initial count value towards zero upon rising edge 400 of REFCLK_IN and counts down to zero, thereby defining the early window, at time point 405. The early counter 310 is again reset at rising edge 401 and again counts down to zero at time point 407. Once the early counter 310 reaches zero, its ECOUT 311 is asserted high as shown at 410. Once rising edge 401 occurs, the early counter 310 is again reset and ECOUT is forced back to a logic low level. ECOUT again becomes logic high at 412 upon the early counter 310 again reaching 0.
EARLY FLAG remains logic low when Q2 is asserted high as long as Q1 is logic high. The rising edge 401 occurs after the expiration of the early window which ends at 405, and thus the EARLY FLAG remains at a logic 0 level as shown at 420 because Q1 is high when Q2 becomes high. EARLY FLAG is asserted high at 430 because Q1 is low when Q2 experiences rising edge 425. As soon as EARLY FLAG is asserted high, ERROR is also asserted high at 440 from ORE gate 380 and/or from latching flip-flop 385.
Upon each rising edge of REFCLK_IN, both counters 310, 350 are reset. Late counter 350 is reset and before it reaches zero, and thus LCOUT remains low as shown. With LCOUT being low, the LATE FLAG remains low as well.
FIG. 5 shows a timing diagram to illustrate the operation of the reference clock window detector 210 in the case of a late reference clock. Rising edge 502 occurs late in this example. Dashed line 503 indicates the end of the early time window counted by early counter 310 and dashed line 504 indicates the end of the late time window counted by late counter 350. Rising edge 502 of REFCLK_IN occurs after the end of the late window (504). When that occurs, LCOUT is already high (510) due to the late counter 350 having reached 0 and thus Q3 also is forced high (512) by flip-flop 355. Upon the next edge of the sampling clock, LATE FLAG also is forced high at 514. LATE FLAG being high causes OR gate 380 to assert ERROR high as well as is shown at 520.
FIG. 6 illustrates the early time window 610 implemented via early counter 310 and the late time window 620 implemented via late counter 350. Each early time window 610 and each late time window 620 begin upon a rising edge of REFCLK_IN. The early time window 610 ends based on the count value of early counter 310 which is smaller than the count value for the late counter 350. The time 625 between the expiration of the early time window 610 and the expiration of the late time window 620 is a valid window during which a rising edge of REFCLK_IN should occur, assuming a valid REFCLK_IN is present.
Waveform 600 shows multiple cycles of an ideal reference clock. Waveform 602 shows an example of reference clock in which one of the edges 603 occurs prematurely. Waveform 602 shows an example of reference clock in which one of the edges 605 occurs too late. Edge 603 occurs before the valid time window 630 starts, a condition which causes EARLY FLAG to be asserted high (640). Edge 605 occurs after the expiration of the valid time window 630 starts, a condition which causes LATE FLAG to be asserted high (650).
In this description, the term “couple” or “couples” means either an indirect or direct wired or wireless connection. Thus, if a first device couples to a second device, that connection may be through a direct connection or through an indirect connection via other devices and connections. The recitation “based on” means “based at least in part on.” Therefore, if X is based on Y, X may be a function of Y and any number of other factors.
Modifications are possible in the described embodiments, and other embodiments are possible, within the scope of the claims.

Claims (18)

What is claimed is:
1. A circuit, comprising:
a selection circuit coupled to receive a plurality of reference clocks, the selection circuit controlled by a control signal to output one of the plurality of reference clocks;
a phase-locked loop coupled to an output of the selection circuit and to use the output reference clock from the selection circuit for phase locking an output clock from the phase-locked loop; and
a plurality of reference clock window detector circuits, each reference clock window detector circuit coupled to receive a separate one of the plurality of reference clocks, and wherein each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window;
wherein each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window;
wherein each reference clock window detector circuit includes:
a first counter to count a sampling clock for a period of time corresponding to the early time window, and
a second counter to count the sampling clock for a period of time corresponding to the late time window.
2. A circuit, comprising:
a selection circuit coupled to receive a plurality of reference clocks, the selection circuit controlled by a control signal to output one of the plurality of reference clocks;
a phase-locked loop coupled to an output of the selection circuit and to use the output reference clock from the selection circuit for phase locking an output clock from the phase-locked loop; and
a plurality of reference clock window detector circuits, each reference clock window detector circuit coupled to receive a separate one of the plurality of reference clocks, and wherein each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window;
wherein each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window;
wherein each reference clock window detector circuit includes a first counter and a second counter, and the first counter to be programmed with a different count value than the second counter.
3. The circuit of claim 1, wherein each reference clock window detector circuit further includes a digital circuit coupled to outputs first and second counters to generate the error signal, the digital circuit including a plurality of flip-flops.
4. The circuit of claim 3, wherein the digital circuit includes a first flip-flop coupled to the output of the first counter and a second flip-flop coupled to the output of the second counter.
5. A circuit, comprising:
a selection circuit coupled to receive a plurality of reference clocks, the selection circuit controlled by a control signal to output one of the plurality of reference clocks;
a phase-locked loop coupled to an output of the selection circuit and to use the output reference clock from the selection circuit for phase locking an output clock from the phase-locked loop; and
a plurality of reference clock window detector circuits, each reference clock window detector circuit coupled to receive a separate one of the plurality of reference clocks, and wherein each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window;
wherein each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window;
wherein each reference clock window detector circuit includes:
a first flip-flop to generate an early flag responsive to the early reference clock edge error;
a second flip-flop to generate a late flag responsive to the late reference clock edge error; and
a logic gate coupled to both the first and second flip-flops, the logic gate to generate the error signal.
6. The circuit of claim 5, wherein the logic gate comprises an OR gate.
7. A circuit, comprising:
a selection circuit coupled to receive a plurality of reference clocks, the selection circuit controlled by a control signal to output one of the plurality of reference clocks;
a phase-locked loop coupled to an output of the selection circuit and to use the output reference clock from the selection circuit for phase locking an output clock from the phase-locked loop; and
a plurality of reference clock window detector circuits, each reference clock window detector circuit coupled to receive a separate one of the plurality of reference clocks, and wherein each reference clock window detector circuit asserts an error signal responsive to an early reference clock edge error in which the reference clock window detector circuit detects a reference clock edge before expiration of an early time window;
wherein each reference clock window detector circuit asserts the error signal responsive to a late reference clock edge error in which the reference clock window detector circuit detects a reference clock edge after expiration of a late time window;
further including a finite state machine coupled the plurality of reference clock window detector circuits, the finite state machine is to assert the control signal to the selection circuit to select a different reference clock from a currently selected reference clock for the phase-lock loop responsive to an error signal asserted by the reference clock window detector circuit coupled to receive the currently selected reference clock.
8. A circuit, comprising:
a first counter including a first clock input, a first load input, and a first count output;
a second counter including a second clock input, a second load input, and a second count output, the first and second clock inputs coupled to receive a same sampling clock and the first and second load inputs coupled to receive a reference clock;
a digital circuit coupled to the first and second count outputs, the digital circuit to generate an error signal responsive to receipt of a clock edge of the reference clock before the first counter reaches its terminal count; and
the digital circuit is to generate the error signal responsive to receipt of a clock edge of the reference clock after the second counter reaches its terminal count.
9. The circuit of claim 8, wherein the first and second counters are to count for different numbers of edges of the sampling clock.
10. The circuit of claim 8, wherein the digital circuit includes a first flip-flop coupled to receive the first count output and a second flip-flop coupled to receive the second count output.
11. The circuit of claim 8, further including:
a first flip-flop to generate a first error flag responsive to a reference clock edge occurring before the first counter reaches its terminal count; and
a second flip-flop to generate a second flag responsive to a reference clock edge occurring after the second counter reaches its terminal count.
12. The circuit of claim 11, further including a logic gate coupled to both the first and second flip-flops, the logic gate to generate an error signal responsive to assertion of either the first or second flag.
13. The circuit of claim 12, wherein the logic gate comprises an OR gate.
14. The circuit of claim 8, further comprising a phase-locked loop coupled to receive the reference clock.
15. The circuit of claim 8, wherein the first and second counters comprise count-down counters.
16. A method, comprising:
detecting a first error condition corresponding to a first edge of a reference clock occurring before expiration of a first counter;
detecting a second error condition corresponding to a second edge of the reference clock occurring after expiration of a second counter;
asserting an error signal responsive to detection of the first error condition; and
asserting the error signal responsive to detection of the second error condition.
17. The method of claim 16, wherein detecting the first error condition includes causing a first counter to count for a first time window and wherein detecting the second error condition includes causing a second counter to count for a second time window different in length than the first time window.
18. The method of claim 16, further comprising selecting a difference reference clock for a phase-locked loop based on the error signal.
US16/232,893 2018-03-09 2018-12-26 Corrupted clock detection circuit for a phase-locked loop Active US10516402B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
US16/232,893 US10516402B2 (en) 2018-03-09 2018-12-26 Corrupted clock detection circuit for a phase-locked loop
CN201910162371.2A CN110247656B (en) 2018-03-09 2019-03-05 Damaged clock detection circuit for phase-locked loop

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201862640603P 2018-03-09 2018-03-09
US16/232,893 US10516402B2 (en) 2018-03-09 2018-12-26 Corrupted clock detection circuit for a phase-locked loop

Publications (2)

Publication Number Publication Date
US20190280695A1 US20190280695A1 (en) 2019-09-12
US10516402B2 true US10516402B2 (en) 2019-12-24

Family

ID=67844115

Family Applications (1)

Application Number Title Priority Date Filing Date
US16/232,893 Active US10516402B2 (en) 2018-03-09 2018-12-26 Corrupted clock detection circuit for a phase-locked loop

Country Status (2)

Country Link
US (1) US10516402B2 (en)
CN (1) CN110247656B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20220174629A1 (en) * 2020-11-30 2022-06-02 Viettel Group Method and apparatus for data frame synchronization of 5g base station
US11762584B2 (en) 2020-10-22 2023-09-19 International Business Machines Corporation Inferring the state of a write-only device by mapping control register values and feedback signal values

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI668962B (en) * 2018-10-02 2019-08-11 新唐科技股份有限公司 Clock adjustable device and transmission system and method thereof
US10790838B1 (en) * 2019-05-14 2020-09-29 Intel Corporation Method and apparatus to perform dynamic frequency scaling while a phase-locked loop operates in a closed loop
US11356147B1 (en) * 2020-12-03 2022-06-07 Shenzhen GOODIX Technology Co., Ltd. Feedback-pause-controlled radiofrequency carrier tracking for amplitude-modulated signals with an unstable reference clock

Citations (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5200933A (en) 1992-05-28 1993-04-06 The United States Of America As Represented By The United States Department Of Energy High resolution data acquisition
US5304954A (en) 1991-08-08 1994-04-19 Fujitsu Limited PLL synthesizer having frequency dividers with reset control
EP0644657A1 (en) 1993-09-20 1995-03-22 Fujitsu Limited Phase-locked oscillator circuit
US5796682A (en) 1995-10-30 1998-08-18 Motorola, Inc. Method for measuring time and structure therefor
JPH11143570A (en) 1997-11-11 1999-05-28 Kawasaki Steel Corp Clock stop signal generation circuit for lsi
US5959502A (en) 1997-08-15 1999-09-28 Texas Instruments Incorporated Analog phase-locked loop including voltage regulator
US6308055B1 (en) 1998-05-29 2001-10-23 Silicon Laboratories, Inc. Method and apparatus for operating a PLL for synthesizing high-frequency signals for wireless communications
US6310653B1 (en) 1995-12-12 2001-10-30 Ronald D. Malcolm, Jr. Phase comparison and phase adjustment for synchronization to a reference signal that is asynchronous with respect to a digital sampling clock
US6584574B1 (en) 1997-12-17 2003-06-24 Sony Corporation Flexible phase-locked loop system to indicate synchronization using difference between internal and external clock signals
US6597249B2 (en) 2001-09-04 2003-07-22 Prominenet Communications, Inc. Fast coarse tuning control for PLL frequency synthesizer
US7126429B2 (en) * 2003-10-11 2006-10-24 Zarlink Semiconductor Inc. Digital phase locked loop with selectable normal or fast-locking capability
US20070085570A1 (en) 2005-10-13 2007-04-19 Fujitsu Limited Digital phase detector improving phase detection resolution thereof
US20090015338A1 (en) 2007-07-13 2009-01-15 Frey Douglas R Dividerless pll architecture
US20090219073A1 (en) 2008-03-03 2009-09-03 Qualcomm Incorporated High resolution time-to-digital converter
US20090267664A1 (en) 2008-04-29 2009-10-29 Toshiya Uozumi Pll circuit
JP2009260866A (en) 2008-04-21 2009-11-05 Sharp Corp Pll circuit
US7755439B2 (en) 2007-11-05 2010-07-13 Samsung Electronics Co., Ltd. Phase locked loop circuit performing two point modulation and gain calibration method thereof
US7876136B2 (en) 2007-04-04 2011-01-25 Samsung Electronics Co., Ltd. Phase-locked-loop circuit having a pre-calibration function and method of pre-calibrating the same
US20110234270A1 (en) 2010-03-25 2011-09-29 Kabushiki Kaisha Toshiba Local oscillator and phase adjusting method for the same
US20110273210A1 (en) 2010-05-07 2011-11-10 Krishnasawamy Nagaraj Low power digital phase lock loop circuit
US20120056769A1 (en) 2010-09-02 2012-03-08 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for time to digital conversion with calibration and correction loops
US8179174B2 (en) 2010-06-15 2012-05-15 Mstar Semiconductor, Inc. Fast phase locking system for automatically calibrated fractional-N PLL
US20120161834A1 (en) 2010-12-23 2012-06-28 Electronics And Telecommunication Research Institute Digital phase locked loop having insensitive jitter characteristic for operating circumstances
US8368438B2 (en) 2010-03-05 2013-02-05 Renesas Electronics Corporation Phase locked loop circuit and control method thereof
US20130051290A1 (en) 2011-08-31 2013-02-28 Renesas Electronics Corporation High-frequency signal processing device and wireless communication system
US20140225653A1 (en) 2013-02-13 2014-08-14 Silicon Laboratories Inc. Cascaded pll for reducing low-frequency drift in holdover mode
US20140266351A1 (en) 2013-03-14 2014-09-18 Samsung Electronics Co., Ltd. Delay-locked loop circuit and method of controlling the same
US20140266354A1 (en) 2013-03-13 2014-09-18 Electronics And Telecommunications Research Institute Digital phase-locked loop
US8957711B2 (en) * 2013-04-29 2015-02-17 Microsemi Semiconductor Ulc Phase locked loop with precise phase and frequency slope limiter
US20150077279A1 (en) 2013-09-17 2015-03-19 Qualcomm Incorporated Time-to-digital converter
US9020089B2 (en) 2013-07-12 2015-04-28 Infineon Technologies Ag Phase-locked loop (PLL)-based frequency synthesizer
US20150188553A1 (en) 2013-12-26 2015-07-02 Noam Familia Apparatus for symmetric and linear time-to-digital converter (tdc)
WO2015161890A1 (en) 2014-04-25 2015-10-29 Universitat Politècnica De Catalunya Adaptive clocking configurations and calibration methods thereof
US20150372690A1 (en) 2014-06-23 2015-12-24 Intel IP Corporation Circuit, a time-to-digital converter, an integrated circuit, a transmitter, a receiver and a transceiver
US20160056827A1 (en) 2014-08-20 2016-02-25 Gerasimos S. Vlachogiannakis Fractional-N Frequency Synthesizer Incorporating Cyclic Digital-To-Time And Time-To-Digital Circuit Pair
US20160156362A1 (en) 2014-12-01 2016-06-02 Samsung Electronics Co., Ltd. Time-to-digital converter using stochastic phase interpolation
US20160164532A1 (en) 2014-12-05 2016-06-09 Texas Instruments Incorporated Clock conditioner circuitry with improved holdover exit transient performance
US20160204787A1 (en) 2013-09-26 2016-07-14 Intel Corporation Apparatus and method for fast phase locking for digital phase locked loop
US20160238998A1 (en) 2015-02-17 2016-08-18 Nxp B.V. Time to digital converter and phase locked loop
US9490820B2 (en) 2014-09-12 2016-11-08 Seiko Epson Corporation Fractional N-PLL circuit, oscillator, electronic device, and moving object
US20160352506A1 (en) 2015-05-29 2016-12-01 Silicon Laboratories Inc. Dual path timing wander removal
US20160380759A1 (en) 2015-06-26 2016-12-29 Kabushiki Kaisha Toshiba Phase locked loop, wireless communication apparatus and wireless communication method
US9634826B1 (en) 2015-11-30 2017-04-25 Intel Corporation Apparatus and method for automatic bandwidth calibration for phase locked loop
EP3182592A1 (en) 2014-12-18 2017-06-21 Huawei Technologies Co. Ltd. Digital fractional frequency phase-locked loop control method and phase-locked loop
US20170187383A1 (en) 2015-12-23 2017-06-29 Cirrus Logic International Semiconductor Ltd. Phase locked loops
US9859901B1 (en) 2016-03-08 2018-01-02 Integrated Device Technology, Inc. Buffer with programmable input/output phase relationship
US10075173B2 (en) 2016-11-22 2018-09-11 Silicon Laboratories Inc. Digital fast lock for phase-locked loops
US20180269885A1 (en) 2017-03-17 2018-09-20 Kabushiki Kaisha Toshiba Oscillator, semiconductor device and wireless communication apparatus
US10128858B2 (en) 2017-04-04 2018-11-13 Intel Corporation Phase-locked loop circuitry including improved phase alignment mechanism
US10135452B2 (en) 2017-02-21 2018-11-20 Infineon Technologies Ag Digital frequency synthesizer with robust injection locked divider
US10141941B2 (en) 2016-12-30 2018-11-27 Huawei Technologies Co., Ltd. Differential PLL with charge pump chopping
US20180351558A1 (en) 2017-06-02 2018-12-06 Taiwan Semiconductor Manufacturing Co., Ltd. All-digital phase locked loop using switched capacitor voltage doubler
US10185349B2 (en) 2013-12-03 2019-01-22 Intel Corporation Apparatus and method for extending frequency range of a circuit and for over-clocking or under-clocking
US10200047B2 (en) 2016-05-25 2019-02-05 Imec Vzw DTC-based PLL and method for operating the DTC-based PLL
US10291214B2 (en) 2017-03-01 2019-05-14 Analog Devices Global Unlimited Company Feedforward phase noise compensation

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2945545B2 (en) * 1992-04-02 1999-09-06 三菱電機株式会社 PLL circuit device and phase difference detection circuit device
US7595672B2 (en) * 2007-09-25 2009-09-29 Richwave Technology Corp. Adjustable digital lock detector
US8766689B2 (en) * 2010-12-29 2014-07-01 Telefonaktiebolaget L M Ericsson (Publ) Phase-frequency detection method

Patent Citations (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5304954A (en) 1991-08-08 1994-04-19 Fujitsu Limited PLL synthesizer having frequency dividers with reset control
US5200933A (en) 1992-05-28 1993-04-06 The United States Of America As Represented By The United States Department Of Energy High resolution data acquisition
EP0644657A1 (en) 1993-09-20 1995-03-22 Fujitsu Limited Phase-locked oscillator circuit
US5796682A (en) 1995-10-30 1998-08-18 Motorola, Inc. Method for measuring time and structure therefor
US6310653B1 (en) 1995-12-12 2001-10-30 Ronald D. Malcolm, Jr. Phase comparison and phase adjustment for synchronization to a reference signal that is asynchronous with respect to a digital sampling clock
US5959502A (en) 1997-08-15 1999-09-28 Texas Instruments Incorporated Analog phase-locked loop including voltage regulator
JPH11143570A (en) 1997-11-11 1999-05-28 Kawasaki Steel Corp Clock stop signal generation circuit for lsi
US6584574B1 (en) 1997-12-17 2003-06-24 Sony Corporation Flexible phase-locked loop system to indicate synchronization using difference between internal and external clock signals
US6308055B1 (en) 1998-05-29 2001-10-23 Silicon Laboratories, Inc. Method and apparatus for operating a PLL for synthesizing high-frequency signals for wireless communications
US6597249B2 (en) 2001-09-04 2003-07-22 Prominenet Communications, Inc. Fast coarse tuning control for PLL frequency synthesizer
US7126429B2 (en) * 2003-10-11 2006-10-24 Zarlink Semiconductor Inc. Digital phase locked loop with selectable normal or fast-locking capability
US20070085570A1 (en) 2005-10-13 2007-04-19 Fujitsu Limited Digital phase detector improving phase detection resolution thereof
US7876136B2 (en) 2007-04-04 2011-01-25 Samsung Electronics Co., Ltd. Phase-locked-loop circuit having a pre-calibration function and method of pre-calibrating the same
US20090015338A1 (en) 2007-07-13 2009-01-15 Frey Douglas R Dividerless pll architecture
US7755439B2 (en) 2007-11-05 2010-07-13 Samsung Electronics Co., Ltd. Phase locked loop circuit performing two point modulation and gain calibration method thereof
US20090219073A1 (en) 2008-03-03 2009-09-03 Qualcomm Incorporated High resolution time-to-digital converter
JP2009260866A (en) 2008-04-21 2009-11-05 Sharp Corp Pll circuit
US20090267664A1 (en) 2008-04-29 2009-10-29 Toshiya Uozumi Pll circuit
US8368438B2 (en) 2010-03-05 2013-02-05 Renesas Electronics Corporation Phase locked loop circuit and control method thereof
US20110234270A1 (en) 2010-03-25 2011-09-29 Kabushiki Kaisha Toshiba Local oscillator and phase adjusting method for the same
US20110273210A1 (en) 2010-05-07 2011-11-10 Krishnasawamy Nagaraj Low power digital phase lock loop circuit
US8179174B2 (en) 2010-06-15 2012-05-15 Mstar Semiconductor, Inc. Fast phase locking system for automatically calibrated fractional-N PLL
US20120056769A1 (en) 2010-09-02 2012-03-08 Taiwan Semiconductor Manufacturing Co., Ltd. Method and system for time to digital conversion with calibration and correction loops
US20120161834A1 (en) 2010-12-23 2012-06-28 Electronics And Telecommunication Research Institute Digital phase locked loop having insensitive jitter characteristic for operating circumstances
US20130051290A1 (en) 2011-08-31 2013-02-28 Renesas Electronics Corporation High-frequency signal processing device and wireless communication system
US20140225653A1 (en) 2013-02-13 2014-08-14 Silicon Laboratories Inc. Cascaded pll for reducing low-frequency drift in holdover mode
US20140266354A1 (en) 2013-03-13 2014-09-18 Electronics And Telecommunications Research Institute Digital phase-locked loop
US20140266351A1 (en) 2013-03-14 2014-09-18 Samsung Electronics Co., Ltd. Delay-locked loop circuit and method of controlling the same
US8957711B2 (en) * 2013-04-29 2015-02-17 Microsemi Semiconductor Ulc Phase locked loop with precise phase and frequency slope limiter
US9020089B2 (en) 2013-07-12 2015-04-28 Infineon Technologies Ag Phase-locked loop (PLL)-based frequency synthesizer
US20150077279A1 (en) 2013-09-17 2015-03-19 Qualcomm Incorporated Time-to-digital converter
US20160204787A1 (en) 2013-09-26 2016-07-14 Intel Corporation Apparatus and method for fast phase locking for digital phase locked loop
US10185349B2 (en) 2013-12-03 2019-01-22 Intel Corporation Apparatus and method for extending frequency range of a circuit and for over-clocking or under-clocking
US20150188553A1 (en) 2013-12-26 2015-07-02 Noam Familia Apparatus for symmetric and linear time-to-digital converter (tdc)
WO2015161890A1 (en) 2014-04-25 2015-10-29 Universitat Politècnica De Catalunya Adaptive clocking configurations and calibration methods thereof
US20150372690A1 (en) 2014-06-23 2015-12-24 Intel IP Corporation Circuit, a time-to-digital converter, an integrated circuit, a transmitter, a receiver and a transceiver
US20160056827A1 (en) 2014-08-20 2016-02-25 Gerasimos S. Vlachogiannakis Fractional-N Frequency Synthesizer Incorporating Cyclic Digital-To-Time And Time-To-Digital Circuit Pair
US9490820B2 (en) 2014-09-12 2016-11-08 Seiko Epson Corporation Fractional N-PLL circuit, oscillator, electronic device, and moving object
US20160156362A1 (en) 2014-12-01 2016-06-02 Samsung Electronics Co., Ltd. Time-to-digital converter using stochastic phase interpolation
US20160164532A1 (en) 2014-12-05 2016-06-09 Texas Instruments Incorporated Clock conditioner circuitry with improved holdover exit transient performance
EP3182592A1 (en) 2014-12-18 2017-06-21 Huawei Technologies Co. Ltd. Digital fractional frequency phase-locked loop control method and phase-locked loop
US20170288686A1 (en) 2014-12-18 2017-10-05 Huawei Technologies Co., Ltd. Method for controlling digital fractional frequency-division phase-locked loop and phase-locked loop
US20160238998A1 (en) 2015-02-17 2016-08-18 Nxp B.V. Time to digital converter and phase locked loop
US20160352506A1 (en) 2015-05-29 2016-12-01 Silicon Laboratories Inc. Dual path timing wander removal
US20160380759A1 (en) 2015-06-26 2016-12-29 Kabushiki Kaisha Toshiba Phase locked loop, wireless communication apparatus and wireless communication method
US9634826B1 (en) 2015-11-30 2017-04-25 Intel Corporation Apparatus and method for automatic bandwidth calibration for phase locked loop
US20170187383A1 (en) 2015-12-23 2017-06-29 Cirrus Logic International Semiconductor Ltd. Phase locked loops
US10193561B2 (en) 2015-12-23 2019-01-29 Cirrus Logic, Inc. Phase locked loops
US9859901B1 (en) 2016-03-08 2018-01-02 Integrated Device Technology, Inc. Buffer with programmable input/output phase relationship
US10200047B2 (en) 2016-05-25 2019-02-05 Imec Vzw DTC-based PLL and method for operating the DTC-based PLL
US10075173B2 (en) 2016-11-22 2018-09-11 Silicon Laboratories Inc. Digital fast lock for phase-locked loops
US10141941B2 (en) 2016-12-30 2018-11-27 Huawei Technologies Co., Ltd. Differential PLL with charge pump chopping
US10135452B2 (en) 2017-02-21 2018-11-20 Infineon Technologies Ag Digital frequency synthesizer with robust injection locked divider
US10291214B2 (en) 2017-03-01 2019-05-14 Analog Devices Global Unlimited Company Feedforward phase noise compensation
US20180269885A1 (en) 2017-03-17 2018-09-20 Kabushiki Kaisha Toshiba Oscillator, semiconductor device and wireless communication apparatus
US10128858B2 (en) 2017-04-04 2018-11-13 Intel Corporation Phase-locked loop circuitry including improved phase alignment mechanism
US20180351558A1 (en) 2017-06-02 2018-12-06 Taiwan Semiconductor Manufacturing Co., Ltd. All-digital phase locked loop using switched capacitor voltage doubler

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
International Search Report in corresponding PCT Application No. PCT/US2019/021599 dated May 30, 2019 (2 pages).
International Search Report in corresponding PCT Application No. PCT/US2019/021966 dated Jun. 20, 2019 (2 pages).
International Search Report in corresponding PCT Application No. PCT/US2019/021968 dated Jun. 13, 2019 (2 pages).
International Search Report in corresponding PCT Application No. PCT/US2019/030892 dated Aug. 1, 2019 (3 pages).
Michael H. Perrott, "Tutorial on Digital Phase-Locked Loops;" CICC 2009. Sep. 2009 (118 pgs).
Texas Instruments Data Sheet LMK05028 Low-Jitter Dual-Channel Network Synchronizer Clock with EEPROM, Feb. 2018 (94 pages).

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11762584B2 (en) 2020-10-22 2023-09-19 International Business Machines Corporation Inferring the state of a write-only device by mapping control register values and feedback signal values
US20220174629A1 (en) * 2020-11-30 2022-06-02 Viettel Group Method and apparatus for data frame synchronization of 5g base station
US11683771B2 (en) * 2020-11-30 2023-06-20 Viettel Group Method and apparatus for data frame synchronization of 5G base station

Also Published As

Publication number Publication date
CN110247656B (en) 2024-04-26
CN110247656A (en) 2019-09-17
US20190280695A1 (en) 2019-09-12

Similar Documents

Publication Publication Date Title
US10516402B2 (en) Corrupted clock detection circuit for a phase-locked loop
US8076979B2 (en) Lock detection circuit for phase locked loop
US7084681B2 (en) PLL lock detection circuit using edge detection and a state machine
US8258831B1 (en) Method and apparatus for clock generator lock detector
KR100303897B1 (en) Low-power jitter-compensated phase-locked loop and how to reduce power and maintain low jitter at the same time
EP2633620B1 (en) Pll dual edge lock detector
US6157690A (en) Digital PLL circuit
US10491222B2 (en) Switch between input reference clocks of different frequencies in a phase locked loop (PLL) without phase impact
KR20000051784A (en) Delay locked loop and method for controlling the same
CN102497204A (en) Start up circuit for delay locked loop
KR101982194B1 (en) Delay control circuit and clock generating circuit including the same
US7015727B2 (en) Generating a lock signal indicating whether an output clock signal generated by a PLL is in lock with an input reference signal
WO2006044123A1 (en) Reducing metastable-induced errors from a frequency detector that is used in a phase-locked loop
US11868193B2 (en) System and method for compensating for a droop event
US6834093B1 (en) Frequency comparator circuit
US6768385B2 (en) Intelligent phase lock loop
US7567100B2 (en) Input clock detection circuit for powering down a PLL-based system
US8513994B2 (en) State machine for deskew delay locked loop
US6747518B1 (en) CDR lock detector with hysteresis
US6339833B1 (en) Automatic recovery from clock signal loss
US20230006681A1 (en) Phase-locked loop slip detector
US20120110365A1 (en) Method for locking frequency of usb device and usb frequency locking device
US7382163B2 (en) Phase frequency detector used in digital PLL system
US7023944B2 (en) Method and circuit for glitch-free changing of clocks having different phases
US10901018B2 (en) System and method for droop detection

Legal Events

Date Code Title Description
FEPP Fee payment procedure

Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

AS Assignment

Owner name: TEXAS INSTRUMENTS INCORPORATED, TEXAS

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LINDGREN, ERIC PAUL;SRIDHAR, ARVIND;JANARDHANAN, JAYAWARDAN;SIGNING DATES FROM 20190116 TO 20190121;REEL/FRAME:048236/0721

STPP Information on status: patent application and granting procedure in general

Free format text: NON FINAL ACTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER

STPP Information on status: patent application and granting procedure in general

Free format text: NOTICE OF ALLOWANCE MAILED -- APPLICATION RECEIVED IN OFFICE OF PUBLICATIONS

STPP Information on status: patent application and granting procedure in general

Free format text: PUBLICATIONS -- ISSUE FEE PAYMENT VERIFIED

STCF Information on status: patent grant

Free format text: PATENTED CASE

MAFP Maintenance fee payment

Free format text: PAYMENT OF MAINTENANCE FEE, 4TH YEAR, LARGE ENTITY (ORIGINAL EVENT CODE: M1551); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY

Year of fee payment: 4