UA68570U - A probe device for study of electro-physical characteristics of semiconductor structures - Google Patents
A probe device for study of electro-physical characteristics of semiconductor structuresInfo
- Publication number
- UA68570U UA68570U UAU201112260U UAU201112260U UA68570U UA 68570 U UA68570 U UA 68570U UA U201112260 U UAU201112260 U UA U201112260U UA U201112260 U UAU201112260 U UA U201112260U UA 68570 U UA68570 U UA 68570U
- Authority
- UA
- Ukraine
- Prior art keywords
- electro
- physical characteristics
- semiconductor structures
- probe device
- study
- Prior art date
Links
Abstract
A probe device for measurement of electro-physical characteristics of semiconductor structures includes spring-loaded probes for supply of test signals. Additional probes are included, those are placed to the guide openings of fluoroplastic plate arranged by template in places corresponding to applied contacts on the test sample.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
UAU201112260U UA68570U (en) | 2011-10-19 | 2011-10-19 | A probe device for study of electro-physical characteristics of semiconductor structures |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
UAU201112260U UA68570U (en) | 2011-10-19 | 2011-10-19 | A probe device for study of electro-physical characteristics of semiconductor structures |
Publications (1)
Publication Number | Publication Date |
---|---|
UA68570U true UA68570U (en) | 2012-03-26 |
Family
ID=63013333
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
UAU201112260U UA68570U (en) | 2011-10-19 | 2011-10-19 | A probe device for study of electro-physical characteristics of semiconductor structures |
Country Status (1)
Country | Link |
---|---|
UA (1) | UA68570U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2618598C1 (en) * | 2015-11-17 | 2017-05-04 | Акционерное общество "Эпиэл" | Measuring probe device and method for measuring electrophysical parameters of semiconductor wafers |
-
2011
- 2011-10-19 UA UAU201112260U patent/UA68570U/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2618598C1 (en) * | 2015-11-17 | 2017-05-04 | Акционерное общество "Эпиэл" | Measuring probe device and method for measuring electrophysical parameters of semiconductor wafers |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
HK1214360A1 (en) | Test device for electrochemical analysis | |
IL232255B (en) | Methods and apparatus for measuring a property of a substrate | |
EP2817617A4 (en) | Devices, methods, and test kits for electronic analyte assaying | |
PH12016501754A1 (en) | High-planarity probe card for a testing apparatus of electronic devices | |
MX363552B (en) | Method and device for testing a transformer. | |
BR112014014758A2 (en) | Calibration transfer method for a test instrument | |
EP2858102A4 (en) | Semiconductor probe for testing quantum cell, test device, and test method | |
UY34193A (en) | APPARATUS FOR MEASURING AN OBJECT | |
BR112013026599A2 (en) | continuous coil assembly, continuous coil assembly testing device and test method | |
EP2422289A4 (en) | Field device with measurement accuracy reporting | |
GB201105400D0 (en) | Apparatus for current measurement | |
GB201009997D0 (en) | Apparatus for testing a liquid specimen | |
HK1204050A1 (en) | Accurate analyte measurements for electrochemical test strip based on multiple calibration parameters | |
SG11201405703RA (en) | Probe card for an apparatus for testing electronic devices | |
FR2964741B1 (en) | DEVICE FOR TESTING A TUBULAR SAMPLE | |
HK1222597A1 (en) | A testing device for testing analytes in liquid samples | |
AR059361A1 (en) | DEVICE AND METHODS TO DETECT AND QUANTIFY ONE OR MORE OBJECTIVE AGENTS | |
IN2014DN03279A (en) | ||
GB201212887D0 (en) | Apparatus for testing a liquid specimen | |
UA68570U (en) | A probe device for study of electro-physical characteristics of semiconductor structures | |
FR3013174B1 (en) | DEVICE FOR TESTING A CONCENTRATION PHOTOVOLTAIC MODULE | |
EP2545358A4 (en) | System for testing semiconductors | |
BR112014006296A2 (en) | method for detecting an analyte | |
FR2990764B1 (en) | DEVICE FOR TESTING AND MONITORING DIGITAL CIRCUITS | |
FR2964457B1 (en) | TEST DEVICE FOR MEASURING THE EFFORTS SUPPORTED BY A TIRE |