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Application filed by Київський Політехнічний Інститут, Киевский политехнический институтfiledCriticalКиївський Політехнічний Інститут
Priority to UA4876528ApriorityCriticalpatent/UA16868A1/en
Publication of UA16868A1publicationCriticalpatent/UA16868A1/en
The invention relates to measurement technique. The sensor contains a substrate with the film sensing element placed consequently on it made of a nickel-based material with the alloying additive, a protective coating and electric terminals. Ytterbium is used as the alloying additive which contents makes 3-4 mass percent.