TWM642473U - Circuit board with identifiable electrical check point - Google Patents

Abstract

A circuit board with identifiable electrical detection points is used to solve the problem that the identification of electrical detection points of conventional circuit boards is difficult and the defect position cannot be quickly confirmed. The system includes: a line section with several conductive lines electrically connected to several electronic components; and a test section with several detection points and several test lines, and the several detection points are a pair of One is electrically connected to the plurality of test lines, and each of the test lines is electrically connected to each of the electronic components in the circuit part, and an identification detection point is set for every N detection points, N is an integer greater than three, each of the identification detection points The shape of the pattern is different from other detection points.

Description

Circuit board with identifiable electrical detection points

The invention relates to a substrate for mounting electronic components, especially a circuit board with identifiable electrical detection points that can quickly find defect positions after electrical testing.

The known circuit board is used to carry multiple electronic components, and the conventional circuit board is electrically connected to the multiple electronic components through several conductive lines, such as resistors, capacitors, chips, etc., in order to test the components mounted on the circuit board Whether the electronic components meet the specifications, and to confirm whether there are short circuit or open circuit soldering defects, probes will be used to touch the conductive lines electrically connected to each electronic component to measure whether the electrical characteristics are correct. However, a large number of Electronic components require manpower and a long time to measure each electronic component one by one.

An automated testing machine system can replace the human inspection of the above-mentioned known circuit boards. The testing machine uses a Bed of Nails (Bed of Nails) jig with multiple probes to simultaneously contact multiple electronic components on the circuit board circuit. Soldering points can confirm the electrical characteristics of the multiple electronic components at one time. During the test process, the test machine controls the needle bed to move to the position on the circuit board in sequence through the program and then presses down the contact line. Quickly inspect all electronic components on a circuit board.

However, with the development trend of miniaturization, light weight and high performance of electronic products, the volume of electronic components on the circuit board is reduced, and the distribution density of conductive lines is increased and the line width is thinned. When the probe directly contacts the electronic components and When the soldering point of the circuit is damaged, the conductivity of the circuit may be damaged or the welding structure may be damaged, and even the electronic component may be crushed; in addition, the points of the probe contact test are scattered all over the circuit board along with the installation position of the electronic component, and the number is huge. When the automated test machine measures abnormal electrical values, although the test machine can record which probe is in contact with the defect, it cannot immediately determine which electronic component or soldering position on the circuit board is abnormal. As a result, test operators must search for the test position corresponding to the circuit board based on the probe number and the record of the test machine, so as to further confirm the mode and cause of the defect. Therefore, the testing process of the above-mentioned conventional circuit board is complicated and time-consuming, and also increases the probability of damage to the circuit board and electronic components.

In view of this, it is necessary to improve the conventional electrical testing of circuit boards.

In order to solve the above problems, the purpose of this creation is to provide a circuit board with identifiable electrical detection points, which can quickly identify the numbering sequence of the detection points.

The second purpose of this creation is to provide a circuit board with identifiable electrical testing points, which can prevent the circuit board circuit from being damaged or electronic components from being crushed during the testing process.

Another purpose of this invention is to provide a circuit board with identifiable electrical testing points, which can improve testing efficiency.

Direction or similar terms mentioned in this work, such as "left", "right", "upper", "lower", "inner", "outer", "side", etc., mainly refer to the direction of the attached drawing , each direction or similar terms are only used to assist in explaining and understanding the various embodiments of the creation, not to limit the creation.

The use of the quantifiers "one" or "one" in the elements and components described throughout this creation is only for convenience and to provide the usual meaning of the scope of this creation; it should be interpreted in this creation as including one or at least one, and a single The notion of also includes the plural unless it is obvious that it means otherwise.

The circuit board with identifiable electrical detection points of the invention includes: a circuit part with several conductive circuits electrically connected to several electronic components; and a test part with several detection points and Several test lines, the several test points are electrically connected to the several test lines one by one, each of the test lines is electrically connected to each of the electronic components in the circuit part, and an identification detection point is set for every N detection points , N is an integer greater than three, and the pattern shape of each identification detection point is different from other detection points.

Accordingly, the circuit board with identifiable electrical detection points in this creation is composed of several detection points that are electrically connected to the circuit part through several test lines, so that the probes of the testing machine can directly contact each of the detection points for testing. The test has the effect of avoiding damage to the circuit board circuit or crushing the electronic components. In addition, by forming several identification detection points at fixed intervals among the several detection points, it can assist the operator to identify the several detection points. The sequence of numbers and quickly find out the location of the detection point where the test abnormality occurs, which has the effect of improving test efficiency and reducing the burden of manpower.

Wherein, the circuit part and the test part are located on the surface of a substrate, and the circuit part is located in the central area of the substrate, and the test part is located in the upper or lower edge area of the substrate. In this way, the probes of the testing machine can be tested through the peripheral testing part, avoiding touching the conductive lines and electronic components in the central area, which has the effect of preventing damage to the circuit board circuit and improving product yield.

Wherein, the plurality of detection points are arranged inwardly from the outer edge of the substrate, and the plurality of identification detection points are arranged in the plurality of detection points in the outermost first column. In this way, the densest detection points located in the first column can be set to identify the detection points, so that the test operator can easily calculate the number position of each detection point, which has the effect of quickly finding the location of the test defect .

Wherein, the pattern shape of each of the detection points is a rectangle, and each of the identification detection points is a rectangle with at least one truncated corner or arc corner. In this way, the test operator can visually distinguish the pattern shape difference between each of the inspection points and each of the identification inspection points, which has the effect of locating the inspection points and corresponding defect positions.

Wherein, the pattern center point of each of the identification detection points is the center of a circle to form an auxiliary circle, the diameter of the auxiliary circle is greater than or equal to 0.1 mm, and the truncation angle or arc angle of the identification detection points is located outside the range of the auxiliary circle. In this way, the auxiliary circle system can limit the pattern change range of the identification detection point, so as to avoid poor contact of the probe caused by irregular pattern or area reduction of the identification detection point, which has the effect of preventing test failure and improving measurement accuracy.

Wherein, the plurality of testing wires are electrically connected to the electrode ends of the plurality of electronic components, or welding points between the plurality of electronic components and the plurality of conductive circuits. In this way, through the several test lines, it is possible to measure whether the electronic components meet the specifications and confirm whether there are short circuit or open circuit welding defects, which has the effect of improving test efficiency and confirming the quality of the circuit board.

In order to make the above and other purposes, features and advantages of this creation more obvious and easy to understand, the preferred embodiments of this creation are specially cited below, and explained in detail with the accompanying drawings; in addition, the same symbols are marked in different drawings are considered the same, and their descriptions will be omitted.

Please refer to Figure 1, which is a preferred embodiment of a circuit board with identifiable electrical detection points in this invention, which includes a circuit part 1 and a test part 2, and the circuit part 1 and the test part 2 are located at The surface of a substrate S, and the circuit part 1 is located in the central area of the substrate S, and the test part 2 is located on the periphery of the circuit part 1, and the test part 2 is preferably located on the upper or lower edge of the substrate S area.

The line part 1 is a block formed by arranging and distributing several conductive lines, each of which is electrically connected to various electronic components through welding, so that several electronic components mounted on the circuit board form a loop for transmission and transmission. To process electrical signals to perform the functions of electronic products smoothly. Therefore, before the circuit board is assembled and shipped, it is necessary to ensure that the specifications of the electronic components are correct and the electrical properties are normal, and to confirm the soldering between the conductive lines and the electronic components. The structure is complete and there are no abnormalities such as short circuit and open circuit.

Please refer to Fig. 2 again, which is a partially enlarged view of the test section 2 in the area A shown in Fig. 1, the test section 2 has several detection points 21 and several test lines 22, and the several detection points 21 is a one-to-one electrical connection of the plurality of test lines 22, and then each of the test lines 22 is electrically connected to the electrode terminals or welding points of the electronic components in the circuit part 1, so that an electrical test machine The probes can directly contact the testing points 21, and test the electronic components through the test lines 22. During the testing process, the probes will not directly touch the electronic components and conductive circuits. The system can avoid damaging the circuit board circuit or crushing electronic components.

Please refer to Figure 2, the plurality of detection points 21 are preferably located close to the edge area of the substrate S, away from the central area of the substrate S where electronic components and conductive lines gather, and the plurality of detection points 21 can be obtained from the The outer edge of the substrate S is arranged inwardly, wherein the test lines 22 are interspersed between the test points 21 on the inner side to reduce the arrangement space of the test points 21. Therefore, the test points 21 on the outer side The denser the distribution of 21 is, the more scattered the distribution of the detection points 21 is on the inner side. In this embodiment, within a range of width R, there may be three detection points 21 in the outermost first column, and the second, The three columns are reduced to two detection points 21 , and the fourth to sixth columns have only one detection point 21 .

Again, among the several detection points 21 in the outermost first row, an identification detection point 21a is set for every N detection points 21, N is an integer greater than three, and the pattern shape of each identification detection point 21a is different from Other detection points 21 enable test operators to identify each of the identification detection points 21a, and through the regular interval arrangement of the identification detection points 21a, the numbering sequence of the several detection points 21 can be quickly calculated, for example , in this embodiment, N is six, that is, five detection points 21 are arranged between two adjacent identification detection points 21a, when the electrical testing machine detects the seventh probe from right to left When the electrical properties are abnormal, the test operator can immediately locate the first identification detection point 21a on the right corresponding to the sixth probe, and then the first detection point 21 on the left corresponds to the seventh probe, and judge the detection Defects in wires or electronic components electrically connected at point 21. The present invention cites the above-mentioned embodiments to illustrate the arrangement of the detection points 21 and the identification detection points 21a, but is not limited thereto.

Please refer to Figures 3 to 6, which are partial enlarged views of the identification detection point 21a shown in Figure 2, the detection point 21 and the pattern shape of the identification detection point 21a can be a rectangle, wherein the identification The detection point 21a has at least one truncated corner or arc angle. As shown in Figure 3, the upper left corner of the identification detection point 21a forms a truncated angle; as shown in Figure 4, the upper left and upper right sides of the identification detection point 21a are Each side forms a truncated angle; as shown in Figure 5, the upper left of the identification detection point 21a forms a truncated angle, and the upper right forms an arc angle; as shown in Figure 6, the two sides of the identification and detection point 21a The truncated corners meet.

Also, draw an auxiliary circle C with the center point of the pattern of the identification detection point 21a as the center of the circle, the diameter D of the auxiliary circle C is greater than or equal to 0.1 mm, and the truncation or arc angle of the identification detection point 21a is preferably located at the auxiliary circle C. Outside the range of circle C, the pattern change range of the identification detection point 21a can be limited to avoid poor contact of the probe due to the irregular pattern or area reduction of the identification detection point 21a, which can prevent test failure and improve measurement accuracy. degree of effect.

To sum up, the circuit board with identifiable electrical detection points in this creation is composed of several detection points that are electrically connected to the circuit part through several test lines, so that the probes of the testing machine can directly contact each of the detection points For testing, it has the effect of avoiding damage to the circuit board circuit or crushing electronic components. In addition, by forming several identification detection points at fixed intervals among the several detection points, it can assist the operator to identify the several detection points. The numbering sequence of the inspection points and quickly find out the location of the inspection point where the test abnormality occurs has the effect of improving the test efficiency and reducing the manpower burden.

Although this creation has been disclosed by using the above-mentioned preferred embodiments, it is not intended to limit this creation. Anyone who is familiar with this technology can make various changes and modifications relative to the above-mentioned embodiments without departing from the spirit and scope of this creation. Therefore, the scope of protection of this creation shall include all changes within the meaning and equivalent scope recorded in the appended scope of patent application.

1: Line Department 2: Testing department 21: Detection point 21a: Identify detection points 22: Test line S: Substrate R: width C: auxiliary circle D: diameter

[Fig. 1] A plan view of a preferred embodiment of the invention. [Picture 2] An enlarged view of area A shown in Fig. 1. [Fig. 3] An enlarged view of the pattern shape of the identification and detection points of the preferred embodiment of the invention. [Fig. 4] An enlarged view of the pattern shape of the identification and detection points of another embodiment of the invention. [Fig. 5] An enlarged view of the pattern shape of the identification and detection points of another embodiment of the invention. [Fig. 6] An enlarged view of the pattern shape of the recognition detection point in another embodiment of the invention.

2: Testing department

21: Detection point

21a: Identify detection points

22: Test line

S: Substrate

R: width

C: auxiliary circle

Claims (6)

A circuit board with identifiable electrical detection points, comprising: a circuit part having several conductive lines electrically connected to several electronic components; and A test section has several detection points and several test lines, the several detection points are electrically connected to the several test lines one-to-one, each of the test lines is electrically connected to each of the electronic components in the line section, An identification detection point is set for every N detection points, N is an integer greater than three, and the pattern shape of each identification detection point is different from other detection points. The circuit board with identifiable electrical detection points as claimed in claim 1, wherein the circuit part and the test part are located on the surface of a substrate, and the circuit part is located in the central area of the substrate, and the test part is located on the substrate edge or lower edge area. A circuit board with identifiable electrical detection points as in claim 2, wherein the several detection points are arranged inwardly from the outer edge of the substrate, and the several identification detection points are set on the outermost first row of the several in the detection point. The circuit board with identifiable electrical detection points according to claim 1, wherein the pattern shape of each detection point is a rectangle, and each identification detection point is a rectangle with at least one truncated corner or arc corner. A circuit board with identifiable electrical detection points as claimed in claim 4, wherein the pattern center point of each of the identification detection points is the center of a circle to form an auxiliary circle, the diameter of the auxiliary circle is greater than or equal to 0.1 mm, and the identification detection points The truncated or rounded corners lie outside the limits of this construction circle. The circuit board with identifiable electrical detection points as claimed in claim 1, wherein the plurality of test lines are electrically connected to the electrode terminals of the plurality of electronic components, or the welding between the plurality of electronic components and the plurality of conductive lines point.

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