TWM634772U - Elastic film for use in chemical mechanical grinding device - Google Patents

Elastic film for use in chemical mechanical grinding device Download PDF

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Publication number
TWM634772U
TWM634772U TW111204548U TW111204548U TWM634772U TW M634772 U TWM634772 U TW M634772U TW 111204548 U TW111204548 U TW 111204548U TW 111204548 U TW111204548 U TW 111204548U TW M634772 U TWM634772 U TW M634772U
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Taiwan
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contact portion
wafer
elastic film
chemical mechanical
wafer contact
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TW111204548U
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Chinese (zh)
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林永強
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朗曦科技股份有限公司
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Publication of TWM634772U publication Critical patent/TWM634772U/en

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Abstract

本創作之彈性膜配合一研磨頭使用,其包含有一晶圓接觸部與一連接晶圓接觸部之環形凸部,彈性膜以環形凸部固定於研磨頭,使得彈性膜與該研磨頭之間形成一壓力腔室。此外,晶圓接觸部具有多個不同硬度或材質的區域,前述具有不同硬度或材質之區域的形狀、尺寸大小、分布位置、排列密度等參數皆可依照實際需要作必要的變化,使得彈性膜以晶圓接觸部對晶圓所施加的壓力能適當調整,進而提升化學機械研磨的均勻性。The elastic film of the invention is used with a grinding head, which includes a wafer contact portion and an annular convex portion connected to the wafer contact portion, the elastic film is fixed on the grinding head with the annular convex portion, so that the gap between the elastic film and the grinding head A pressure chamber is formed. In addition, the contact portion of the wafer has multiple areas with different hardness or materials. The parameters such as the shape, size, distribution position, and arrangement density of the aforementioned areas with different hardness or materials can be changed as necessary according to actual needs, so that the elastic film The pressure exerted by the wafer contact portion on the wafer can be properly adjusted, thereby improving the uniformity of chemical mechanical polishing.

Description

用於化學機械研磨裝置之彈性膜Elastic Membranes for Chemical Mechanical Abrasive Devices

本創作與化學機械研磨裝置有關,特別是指一種用於化學機械研磨裝置之彈性膜。This creation is related to a chemical mechanical polishing device, in particular to an elastic membrane used in a chemical mechanical polishing device.

於進行化學機械研磨(Chemical-Mechanical Planarization,CMP)時,晶圓放置於研磨頭與研磨墊之間,將氣體注入研磨頭內,此時由彈性材質所製成的薄膜會受到氣體壓力的推擠而擴張,並對位於其下方的晶圓施加壓力,如此一來,研磨頭即可帶動晶圓相對研磨墊轉動,使得晶圓與研磨墊之間產生機械研磨作用,同時研磨漿會與晶圓上所欲平坦化的材料層發生化學研磨作用。During Chemical-Mechanical Planarization (CMP), the wafer is placed between the polishing head and the polishing pad, and the gas is injected into the polishing head. At this time, the film made of elastic material will be pushed by the gas pressure. Squeeze and expand, and exert pressure on the wafer below it. In this way, the grinding head can drive the wafer to rotate relative to the polishing pad, so that mechanical grinding will occur between the wafer and the polishing pad, and at the same time, the polishing slurry will be in contact with the wafer. The layer of material to be planarized on the circle undergoes chemical grinding.

然而在前述習知技術當中,注入研磨頭內的氣體會形成均勻地等壓,但是為達到更好的研磨均勻度須要調整晶圓各區域的壓力,進而提升後續製程的良率及欲製作元件的可靠度。However, in the aforementioned conventional technology, the gas injected into the grinding head will form a uniform pressure, but in order to achieve better grinding uniformity, the pressure of each area of the wafer needs to be adjusted, thereby improving the yield of subsequent processes and the components to be produced. reliability.

本創作之主要目的在於提供一種用於化學機械研磨裝置之彈性膜,其能提升化學機械研磨的均勻性。The main purpose of the present invention is to provide an elastic membrane for a chemical mechanical polishing device, which can improve the uniformity of chemical mechanical polishing.

為了達成上述主要目的,本創作之彈性膜包含有一晶圓接觸部與一環形凸部。該晶圓接觸部呈圓盤狀,且該晶圓接觸部具有一第一表面與一背對該第一表面之第二表面,該晶圓接觸部以該第二表面接觸一晶圓;該環形凸部一體地連接於該接觸部之第一表面,用以和一研磨頭作固定,使得該彈性膜與該研磨頭之間形成一壓力腔室,其中,該晶圓接觸部具有多個不同硬度或材質的區域。In order to achieve the above main purpose, the elastic film of the present invention includes a wafer contact portion and an annular convex portion. The wafer contact portion is disk-shaped, and the wafer contact portion has a first surface and a second surface facing away from the first surface, and the wafer contact portion contacts a wafer with the second surface; the wafer contact portion contacts a wafer with the second surface; The annular convex portion is integrally connected to the first surface of the contact portion for fixing with a grinding head, so that a pressure chamber is formed between the elastic film and the grinding head, wherein the wafer contact portion has a plurality of Areas of different hardness or material.

由上述可知,當氣體注入該壓力腔室內,該彈性膜會受到氣體壓力的推擠而擴張,並對位於其下方的晶圓施加壓力,由於具有不同硬度或材質之該等區域在形狀、尺寸大小、分布位置、排列密度等參數方面皆可依照實際需要作必要的變化,使得彈性膜以該晶圓接觸部對該晶圓所施加的適當壓力,進而提升化學機械研磨的均勻性。It can be seen from the above that when the gas is injected into the pressure chamber, the elastic membrane will be pushed and expanded by the gas pressure, and exert pressure on the wafer below it. Parameters such as size, distribution position, and arrangement density can be changed as necessary according to actual needs, so that the elastic film exerts an appropriate pressure on the wafer through the contact portion of the wafer, thereby improving the uniformity of chemical mechanical polishing.

較佳地,該晶圓接觸部用不同硬度或材質的材料(例如聚四氟乙烯、不鏽鋼、鋁或其他可和橡膠、矽膠等彈性材料結合之硬質塑料)以一體成形的方式所製成,使得晶圓接觸部具有多個不同硬度或材質的區域。Preferably, the wafer contact part is made of materials of different hardness or material (such as polytetrafluoroethylene, stainless steel, aluminum or other hard plastics that can be combined with elastic materials such as rubber and silicon rubber) in an integrated manner, The wafer contact portion has multiple regions of different hardness or material.

較佳地,該晶圓接觸部具有一中央區域、一鄰接於該中央區域周圍之中間區域及一鄰接該中間區域周圍之周邊區域,該中央區域、該中間區域及該周邊區域具有不同的硬度或材質。Preferably, the wafer contact portion has a central region, a middle region adjacent to the central region and a peripheral region adjacent to the middle region, the central region, the middle region and the peripheral region have different hardness or material.

較佳地,該晶圓接觸部的內部埋設多個不同硬度或材質的材料,例如聚四氟乙烯、不鏽鋼、鋁或其他可和橡膠、矽膠等彈性材料結合之硬質塑料,使該晶圓接觸部具有多個不同硬度或材質的區域。Preferably, a plurality of materials of different hardness or material are buried inside the wafer contact part, such as polytetrafluoroethylene, stainless steel, aluminum or other hard plastics that can be combined with elastic materials such as rubber and silicone, so that the wafer contacts The top has multiple regions of different hardness or material.

有關本創作所提供對於用於化學機械研磨裝置之彈性膜的詳細構造、特點、組裝或使用方式,將於後續的實施方式詳細說明中予以描述。然而,在本創作領域中具有通常知識者應能瞭解,該等詳細說明以及實施本創作所列舉的特定實施例,僅係用於說明本創作,並非用以限制本創作之專利申請範圍。The detailed structure, characteristics, assembly or usage of the elastic membrane used in the chemical mechanical polishing device provided by the present creation will be described in the detailed description of the following embodiments. However, those with ordinary knowledge in the field of this creation should be able to understand that these detailed descriptions and the specific embodiments listed for implementing this creation are only used to illustrate this creation, and are not used to limit the scope of patent applications for this creation.

申請人首先在此說明,於整篇說明書中,包括以下介紹的實施例以及申請專利範圍的請求項中,有關方向性的名詞皆以圖式中的方向為基準。其次,在以下將要介紹之實施例以及圖式中,相同之元件標號,代表相同或近似之元件或其結構特徵。The applicant hereby explains that in the entire specification, including the embodiments described below and the claims of the scope of the patent application, the nouns related to direction are based on the directions in the drawings. Secondly, in the embodiments and drawings to be described below, the same component numbers represent the same or similar components or their structural features.

請參閱圖1及圖2,本創作第1實施例之彈性膜10包含有一呈圓盤狀之晶圓接觸部20,晶圓接觸部20具有多個不同硬度或材質的區域,在本實施例中,晶圓接觸部20由不同硬度或材質的材料以一體成形的方式所製成。更進一步來說,如圖2及圖3所示,晶圓接觸部20具有一中央區域22、一鄰接於中央區域22周圍之中間區域24及一鄰接中間區域24周圍之周邊區域26,中央區域22、中間區域24及周邊區域26分別由不同硬度或材質的材料所製成,例如聚四氟乙烯、不鏽鋼、鋁或其他可和橡膠、矽膠等彈性材料結合之硬質塑料,使得中央區域22、中間區域24及周邊區域26具有不同的硬度或材質。然而值得一提的是,中央區域22、中間區域24及周邊區域26具有一致的厚度,至於在硬度或材質方面並沒有一定的大小順序,三者的硬度或材質大小可以依照實際需要作必要的變化。此外,在本實施例中,中央區域22呈圓形,中間區域24及周邊區域26皆呈環形,但實際上並不以前述形狀為限。Please refer to Fig. 1 and Fig. 2, the elastic film 10 of the first embodiment of the present invention comprises a disc-shaped wafer contact portion 20, the wafer contact portion 20 has a plurality of regions with different hardness or materials, in this embodiment Among them, the wafer contact portion 20 is made of materials with different hardness or materials in an integral manner. Furthermore, as shown in FIGS. 2 and 3 , the wafer contact portion 20 has a central area 22, an intermediate area 24 adjacent to the central area 22, and a peripheral area 26 adjacent to the intermediate area 24. The central area 22. The middle area 24 and the peripheral area 26 are made of materials with different hardness or materials, such as polytetrafluoroethylene, stainless steel, aluminum or other hard plastics that can be combined with elastic materials such as rubber and silicone, so that the central area 22, The middle region 24 and the peripheral region 26 have different hardnesses or materials. However, it is worth mentioning that the central region 22, the middle region 24 and the peripheral region 26 have the same thickness, and there is no certain order in terms of hardness or material, and the hardness or material size of the three can be adjusted according to actual needs. Variety. In addition, in this embodiment, the central area 22 is circular, and the middle area 24 and the peripheral area 26 are both ring-shaped, but they are not limited to the aforementioned shapes.

此外,晶圓接觸部20更具有一第一表面28與一背對第一表面28之第二表面30,本創作第1實施例之彈性膜10更包含有四環形凸部32、34、36、38,該等環形凸部32、34、36、38以一體成形的方式連接於晶圓接觸部20之第一表面28,且該等環形凸部32、34、36、38相對於晶圓接觸部20之中心由外往內呈間隔排列,在此值得一提的是,該等環形凸部32、34、36、38的形狀和高度可以依照實際需要作必要的變化,在此不加以限定。In addition, the wafer contact portion 20 further has a first surface 28 and a second surface 30 facing away from the first surface 28. The elastic membrane 10 of the first embodiment of the present invention further includes four annular protrusions 32, 34, 36. , 38, the annular protrusions 32, 34, 36, 38 are connected to the first surface 28 of the wafer contact portion 20 in an integrated manner, and the annular protrusions 32, 34, 36, 38 are relatively to the wafer The center of the contact portion 20 is arranged at intervals from the outside to the inside. It is worth mentioning here that the shapes and heights of the annular protrusions 32, 34, 36, and 38 can be changed as necessary according to actual needs. limited.

在實際使用時,如圖4所示,彈性膜10以最外圍的環形凸部32的外周面抵靠於一拘束環40,彈性膜10以最外圍的環形凸部32的頂端組設於一研磨頭42,研磨頭42具有一內環壁44與一環設於內環壁44之外環壁46,研磨頭42之內環壁44抵接於彈性膜10之晶圓接觸部20的第一表面28且位於最內圍的二個環形凸部36、38之間,研磨頭42之外環壁位於最外圍的二個環形凸部32、34之間,使得彈性膜10與研磨頭42之間形成內中外三個壓力腔室48。另外,彈性膜10以晶圓接觸部20的第二表面30抵接一晶圓50,晶圓50放置於一研磨墊52上。當對三個壓力腔室48注入氣體時,彈性膜10之晶圓接觸部20會受到氣體壓力的推擠而擴張,並對位於其下方的晶圓50施加壓力,由於晶圓接觸部20具有多個不同硬度或材質的區域,前述區域在形狀及尺寸大小等參數方面皆可依照實際需要作必要的變化,然後搭配三個壓力腔室48的氣體壓力變化,使得彈性膜10以晶圓接觸部20對晶圓50所施加的壓力能均勻分布,進而提升化學機械研磨的均勻性。In actual use, as shown in FIG. 4 , the outer peripheral surface of the outermost annular convex portion 32 of the elastic membrane 10 leans against a restraint ring 40, and the elastic membrane 10 is assembled on a top end of the outermost annular convex portion 32. The grinding head 42, the grinding head 42 has an inner ring wall 44 and an outer ring wall 46 arranged on the inner ring wall 44, the inner ring wall 44 of the grinding head 42 abuts against the first wafer contact portion 20 of the elastic film 10 Surface 28 and between the two innermost annular protrusions 36, 38, the outer ring wall of the grinding head 42 is located between the outermost two annular protrusions 32, 34, so that the elastic membrane 10 and the grinding head 42 Three pressure chambers 48 are formed between the inner, middle and outer. In addition, the elastic film 10 contacts a wafer 50 with the second surface 30 of the wafer contact portion 20 , and the wafer 50 is placed on a polishing pad 52 . When gas is injected into the three pressure chambers 48, the wafer contact portion 20 of the elastic film 10 will be pushed and expanded by the gas pressure, and will exert pressure on the wafer 50 below it, because the wafer contact portion 20 has A plurality of areas with different hardness or materials, the parameters of the aforementioned areas can be changed according to the actual needs in terms of shape and size, and then the gas pressure changes in the three pressure chambers 48 make the elastic film 10 contact with the wafer The pressure exerted by the part 20 on the wafer 50 can be evenly distributed, thereby improving the uniformity of chemical mechanical polishing.

另一方面,彈性膜的結構可以有不同變化。請參閱圖5至圖7,本創作第2實施例之彈性膜60所提供的晶圓接觸部62以埋入射出的方式埋設多個不同硬度或材質的材料68,例如聚四氟乙烯、不鏽鋼、鋁或其他可和橡膠、矽膠等彈性材料結合之硬質塑料,使得晶圓接觸部62具有多個不同硬度或材質的塊狀區域。更進一步來說,在本實施例中,前述材料68主要位於中央區域64及周邊區域66,其中分布在中央區域64的材料68具有不同的幾何形狀,另外分布在周邊區域66的材料68呈環狀,然而實際上,前述材料68的形狀、尺寸大小、分布位置及排列密度等參數皆可依照實際需要作必要的變化,並不以本實施例所繪製的態樣為限。藉此,利用晶圓接觸部62在內部埋設多個不同硬度或材質的材料,並且搭配三個壓力腔室48的氣體壓力變化,使得彈性膜60以晶圓接觸部62對晶圓50所施加的壓力能均勻分布,進而提升化學機械研磨的均勻性。On the other hand, the structure of the elastic membrane can vary in various ways. Please refer to FIG. 5 to FIG. 7, the wafer contact portion 62 provided by the elastic film 60 of the second embodiment of the present invention is embedded with a plurality of materials 68 with different hardness or materials, such as polytetrafluoroethylene, stainless steel, etc. , aluminum or other hard plastics that can be combined with elastic materials such as rubber and silicone, so that the wafer contact portion 62 has multiple block-shaped regions with different hardness or materials. Furthermore, in this embodiment, the aforementioned materials 68 are mainly located in the central area 64 and the peripheral area 66, wherein the materials 68 distributed in the central area 64 have different geometric shapes, and the materials 68 distributed in the peripheral area 66 are in the form of rings. However, in fact, the parameters such as the shape, size, distribution position and arrangement density of the aforementioned materials 68 can be changed as necessary according to actual needs, and are not limited to the aspects drawn in this embodiment. In this way, the wafer contact portion 62 is used to embed a plurality of materials with different hardness or materials inside, and with the change of gas pressure in the three pressure chambers 48, the elastic film 60 exerts a force on the wafer 50 through the wafer contact portion 62 . The pressure can be evenly distributed, thereby improving the uniformity of chemical mechanical grinding.

10:彈性膜 20:晶圓接觸部 22:中央區域 24:中間區域 26:周邊區域 28:第一表面 30:第二表面 32:環形凸部 34:環形凸部 36:環形凸部 38:環形凸部 40:拘束環 42:研磨頭 44:內環壁 46:外環壁 48:壓力腔室 50:晶圓 60:彈性膜 62:晶圓接觸部 64:中央區域 66:周邊區域 68:材料 10: Elastic film 20: Wafer contact part 22: Central area 24: Middle area 26: Surrounding area 28: First Surface 30: second surface 32: Annular convex part 34: Annular convex part 36: Annular convex part 38: Annular convex part 40: restraint ring 42: Grinding head 44: inner ring wall 46: Outer ring wall 48: Pressure chamber 50: Wafer 60: elastic film 62: Wafer contact part 64: Central area 66: Surrounding area 68:Material

圖1為本創作第1實施例之彈性膜的俯視圖。 圖2為圖1沿2-2剖線之剖視圖。 圖3為圖2的局部放大圖。 圖4為本創作第1實施例之彈性膜配合研磨頭使用的局部剖視圖。 圖5為本創作第2實施例之彈性膜的俯視圖。 圖6為圖5沿6-6剖線之剖視圖。 圖7為圖5沿7-7剖線之剖視圖。 Fig. 1 is the plan view of the elastic membrane of the first embodiment of the present invention. Fig. 2 is a cross-sectional view along line 2-2 in Fig. 1 . FIG. 3 is a partially enlarged view of FIG. 2 . Fig. 4 is a partial cross-sectional view of the elastic film used in conjunction with the grinding head in the first embodiment of the invention. Fig. 5 is a top view of the elastic membrane of the second embodiment of the present invention. Fig. 6 is a cross-sectional view of Fig. 5 along line 6-6. Fig. 7 is a cross-sectional view along line 7-7 in Fig. 5 .

10:彈性膜 10: Elastic film

20:晶圓接觸部 20: Wafer contact part

22:中央區域 22: Central area

24:中間區域 24: Middle area

26:周邊區域 26: Surrounding area

28:第一表面 28: First Surface

30:第二表面 30: second surface

32:環形凸部 32: Annular convex part

34:環形凸部 34: Annular convex part

36:環形凸部 36: Annular convex part

38:環形凸部 38: Annular convex part

Claims (6)

一種用於化學機械研磨裝置之彈性膜,組設於一研磨頭使用,該彈性膜包含有一晶圓接觸部與一環形凸部,該晶圓接觸部呈圓盤狀,且該晶圓接觸部具有一第一表面與一背對該第一表面之第二表面,該環形凸部一體地連接於該接觸部之第一表面,且該環形凸部用以固定於該研磨頭,使得該彈性膜與該研磨頭之間形成一壓力腔室,其中,該晶圓接觸部具有多個不同硬度或材質的區域。 An elastic membrane used in a chemical mechanical polishing device, which is assembled on a grinding head, the elastic membrane includes a wafer contact portion and an annular convex portion, the wafer contact portion is disc-shaped, and the wafer contact portion It has a first surface and a second surface facing away from the first surface, the annular convex part is integrally connected to the first surface of the contact part, and the annular convex part is used to fix the grinding head so that the elastic A pressure chamber is formed between the membrane and the grinding head, wherein the wafer contact portion has a plurality of regions of different hardness or material. 如請求項1所述之用於化學機械研磨裝置之彈性膜,其中,該晶圓接觸部由不同硬度或材質的材料所製成。 The elastic film for chemical mechanical polishing device according to claim 1, wherein the wafer contact part is made of materials with different hardness or material. 如請求項2所述之用於化學機械研磨裝置之彈性膜,其中,該晶圓接觸部具有一中央區域、一鄰接於該中央區域周圍之中間區域及一鄰接該中間區域周圍之周邊區域,該中央區域、該中間區域及該周邊區域具有不同的硬度或材質。 The elastic film for a chemical mechanical polishing device according to claim 2, wherein the wafer contact portion has a central area, an intermediate area adjacent to the central area, and a peripheral area adjacent to the intermediate area, The central area, the middle area and the peripheral area have different hardness or material. 如請求項3所述之用於化學機械研磨裝置之彈性膜,其中,該中央區域呈圓形,該中間區域及該周邊區域皆呈環形。 The elastic membrane used in a chemical mechanical polishing device according to claim 3, wherein the central area is circular, and both the central area and the peripheral area are ring-shaped. 如請求項1所述之用於化學機械研磨裝置之彈性膜,其中,該晶圓接觸部的內部埋設多個不同硬度或材質的材料。 The elastic film for chemical mechanical polishing device according to claim 1, wherein a plurality of materials with different hardness or material are buried inside the wafer contact portion. 如請求項5所述之用於化學機械研磨裝置之彈性膜,其中,該等材料呈圓形、環形或塊狀。 The elastic film for chemical mechanical polishing device according to claim 5, wherein the materials are in the shape of a circle, a ring or a block.
TW111204548U 2022-05-03 2022-05-03 Elastic film for use in chemical mechanical grinding device TWM634772U (en)

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