TWM630923U - Probe holder for resistance detection of low resistance value - Google Patents

Abstract

A probe fixing device for low resistance resistance detection includes a fixed body and an extended body, the fixed body includes a first through hole, a second through hole, a third through hole and a fourth through hole, wherein the first through hole A through hole corresponds to the terminal electrode at one end of the first resistor away from the second resistor, the second through hole and the third through hole correspond to the terminal electrodes at two ends of the second resistor respectively, and the fourth through hole corresponds to the third through hole A terminal electrode at one end of the resistor away from the second resistor, and four probes are configured to be installed in the first through hole, the second through hole, the third through hole and the fourth through hole.

Description

Probe Holder for Low Resistance Resistance Detection

The present invention relates to a probe fixing device, especially a probe fixing device for low resistance resistance detection.

Currently known low-resistance resistors are formed by forming a resistive film on a substrate (usually composed of alumina ceramics or semiconductors), coating a protective layer on the outside of the resistive film, and providing two ends of the substrate respectively. A conductor electrode can be used as a resistor. Among them, according to the different forming methods of the resistive film, the known low-resistance resistors can be classified into thin-film resistors made by thin-film process and thick-film printing process. The fabricated thick film resistors. Another known low-resistance resistor is made of an alloy plate formed by punching. The alloy plate is covered with a package body, and two ends of the alloy plate are respectively plated with a conductive layer as terminal electrodes.

However, in the process of measuring low-resistance resistors, when the probe is in contact with the resistance to be measured, the slight displacement of the probe is more likely to cause fluctuations in the measured resistance value, which makes the measurement error range of low-resistance resistors high. , making it difficult to control the accuracy of low-value resistors.

Therefore, in order to overcome the shortcomings and deficiencies in the prior art, it is necessary to provide an improved probe fixing device for low-resistance resistance detection, so as to solve the above-mentioned problems of the conventional technology.

The main purpose of this creation is to provide a probe fixing device for low resistance resistance detection. By setting four perforations, the four probes passing through the perforations can be electrically connected to the corresponding ends of the three resistors. The terminal electrode is used to prevent the low resistance measurement from being affected by the displacement of the probe and cause the measured resistance to fluctuate, thereby reducing the error range of the resistance measurement.

In order to achieve the above purpose, this creation provides a probe for low resistance resistance detection. Needle fixing device, the probe fixing device is configured for a plurality of probes to be installed to detect a chip resistance placed in a resistance tester, the chip resistance at least has a first resistance, a second resistance and a third resistance , the probe fixing device includes a fixing body and an extending body, the fixing body includes a first through hole, a second through hole, a third through hole and a fourth through hole, wherein the first through hole corresponds to the first resistance A terminal electrode at one end away from the second resistor, the second through hole and the third through hole respectively correspond to the end electrodes at two ends of the second resistor, and the fourth through hole corresponds to an end of the third resistor away from the second resistor the terminal electrode, the probes are configured to be installed in the first through hole, the second through hole, the third through hole and the fourth through hole; the extension body extends from one end of the fixed body, and the extension body is configured It is used to be assembled on a mobile device of the resistance tester.

In an embodiment of the present invention, the first through hole, the second through hole, the third through hole and the fourth through hole are arranged at intervals on the same straight line, and the distance between the first through hole and the fourth through hole It is more than 3 times the distance between the second through hole and the third through hole.

In an embodiment of the present invention, the first through hole is configured to pass through the probe of the current needle, the second through hole is configured to pass through the probe of the voltage needle, and the third through hole is configured to supply the voltage The probe of the needle passes through, and the fourth perforation is configured for the probe of the current needle to pass through.

In an embodiment of the present invention, the fixed body further includes a plurality of wire management holes, the wire management holes are formed on one side of the surface of the fixed body, the first through holes, the second through holes, the first through holes The three through holes and the fourth through hole are located on the other side of the surface of the fixed body.

In an embodiment of the present invention, a first connecting surface of the fixing body is connected with a second connecting surface of the extending body, and the first connecting surface and the second connecting surface are partially abutted and partially exposed.

In an embodiment of the present invention, the extending body has a engaging surface, and the engaging surface is configured to engage with a groove of a connecting seat of the mobile device.

In an embodiment of the present invention, the extending body forms at least one screw hole, and the screw hole is configured to be locked on the connecting seat.

In an embodiment of the present invention, the probe fixing device further includes a probe fixture base, the probe fixture base has a plurality of alignment holes, and the alignment holes are configured to be connected with the first through hole. The hole, the second perforation, the third perforation and the fourth perforation communicate with each other for the probes to pass through the first perforation, the second perforation, the third perforation or the fourth perforation and the corresponding Alignment hole.

In an embodiment of the present invention, the probe jig base has a slot, and the slot is configured to be engaged with the fixing body.

In an embodiment of the present invention, the fixing body has at least one first fixing hole, the probe fixture base has at least one second fixing hole, and the first fixing hole and the second fixing hole are configured to pass a screw through locked together.

As mentioned above, when the low-resistance resistors are measured, the terminal electrodes at the two ends of the second resistor are electrically connected to the probes of the two voltage needles respectively, and the first resistor is kept away from the The terminal electrode of one end of the second resistor is electrically connected to the probe of a current needle, and the terminal electrode of the end of the third resistor away from the second resistor is electrically connected to the probe of another current needle, The low resistance value measurement can avoid the fluctuation of the measured resistance value caused by the displacement of the probe, thereby reducing the error range of the resistance measurement.

101: Probe

102: Resistance Tester

103: Chip Resistors

104: Mobile Devices

105: Connector

106: Groove

2: Fixed body

201: The first connection surface

21: First Piercing

22: Second perforation

23: Third Piercing

24: Fourth Piercing

25: Cable management hole

26: The first fixing hole

3: Extended body

31: screw holes

301: Second connection surface

4: Probe fixture base

41: Alignment hole

42: Card slot

43: Second fixing hole

R1: first resistor

R2: Second resistor

R3: the third resistor

A, B, C, D: terminal electrodes

FIG. 1 is a schematic diagram of an embodiment of a probe fixing device for low resistance resistance detection according to the present invention.

FIG. 2 is a schematic diagram of a chip resistor according to an embodiment of a probe fixing device for low-resistance resistance detection according to the present invention.

FIG. 3 is a schematic diagram of an embodiment of a probe fixing device for low-resistance resistance detection combined with a connection seat according to the present invention.

FIG. 4 is a schematic diagram of the combination of an embodiment of a probe fixing device for low-resistance resistance detection and a probe fixture base according to the present invention.

5 to 10 are schematic diagrams of forming through holes with different spacings according to an embodiment of a probe fixing device for low-resistance resistance detection according to the present invention.

In order to make the above and other purposes, features and advantages of this creation more obvious and understandable, Hereinafter, specific examples of the present creation will be given and described in detail as follows in conjunction with the accompanying drawings. Furthermore, the directional terms mentioned in this creation, such as up, down, top, bottom, front, back, left, right, inside, outside, side, around, center, horizontal, horizontal, vertical, vertical, axial, Radial, uppermost or lowermost, etc., are only directions with reference to the attached drawings. Therefore, the directional terms used are for explaining and understanding this creation, not for limiting this creation.

Please refer to FIG. 1 and FIG. 2 , which is an embodiment of a probe fixing device for low-resistance resistance detection according to the present invention. The probe fixture is configured for mounting probes 101 (eg, current probes, voltage probes) to detect a chip resistor 103 placed under a resistance tester 102 , a plurality of low resistance values in the chip resistor 103 The resistors (mΩ) are arranged in a matrix, the chip resistor 103 at least has a first resistor R1, a second resistor R2 and a third resistor R3, the first resistor R1, the second resistor R2 and the third resistor R1 The resistor R3 is configured for contacting the probes 101 to measure the resistance value. In this embodiment, the probe fixing device includes a fixing body 2 and an extending body 3 . This creation will explain the detailed structure, relationship and principle of each part in detail below.

Please refer to FIG. 2 and FIG. 3 , the fixing body 2 includes a first through hole 21 , a second through hole 22 , a third through hole 23 and a fourth through hole 24 , wherein the first through hole 21 corresponds to the first through hole 21 The resistor R1 is far away from the terminal electrode A at one end of the second resistor. The second through hole 22 and the third through hole 23 correspond to the terminal electrodes B and C at the two ends of the second resistor R2, respectively, that is, the second through hole 22 corresponds to On the terminal electrode of one end B of the second resistor R2, the third through hole 23 corresponds to the terminal electrode C at the other end of the second resistor R2, and the fourth through hole 24 corresponds to the third resistor R3 away from the second resistor Terminal electrode D at one end of R2. As shown in FIG. 1 , the probes 101 are configured to be installed in the first through hole 21 , the second through hole 22 , the third through hole 23 and the fourth through hole 24 to contact the first resistor R1 , the The second resistor R2 and the third resistor R3 are used to measure the resistance value. In this embodiment, the first through-hole 21 , the second through-hole 22 , the third through-hole 23 and the fourth through-hole 24 are arranged on the same straight line at intervals, and the first through-hole 21 and the fourth through-hole 24 are The distance between them is more than three times the distance between the second through hole 22 and the third through hole 23 .

Referring to FIG. 1 and FIG. 3 , the extending body 3 is formed from a The extension body 3 is configured to be assembled on a connecting seat 105 of a mobile device 104 of the resistance tester 102, wherein the mobile device 104 can drive the fixed body 2 of the probe fixing device along X, The Y or Z axis moves so that the probes 101 can move to desired positions to be electrically connected to the first resistor R1 , the second resistor R2 and the third resistor R3 of the chip resistor 103 . In this embodiment, the first through hole 21 is configured for the probe 101 of the current needle to pass through, the second through hole 22 is configured for the probe 101 of the voltage needle to pass through, and the third through hole 23 is configured to pass through The probe 101 of the voltage needle passes through, and the fourth through hole 24 is configured for the probe 101 of the current needle to pass through.

It should be noted that the terminal electrode A and the terminal electrode D provide a constant current, and the voltage between the second resistor R2 is measured through the terminal electrode B and the terminal electrode C, so as to convert the resistance value of the second resistor R2, wherein the The terminal electrodes A, B, C and D correspond to the first through hole 21 , the second through hole 22 , the third through hole 23 and the fourth through hole 24 respectively, so that the distance between the terminal electrode A and the terminal electrode D is The distance between the electrode B and the terminal electrode C is more than 3 times. Since the low resistance value measurement of the conventional technology is easily affected by the slight displacement of the probe, the measured resistance value will fluctuate. This invention is used for low resistance value resistors. The probe fixing device for detection achieves stable measurement by contacting the plurality of probes 101 with the terminal electrodes A, B, C and D arranged at a specific distance, respectively.

Referring to FIG. 3 , the fixing body 2 further includes a plurality of wire management holes 25 . The wire management holes 25 are formed on one side of the surface of the fixing body 2 and are configured for connecting the probes 101 . Wire stretch. The first through hole 21 , the second through hole 22 , the third through hole 23 and the fourth through hole 24 are located on the other side of the surface of the fixing body 2 . In addition, a first connecting surface 201 of the fixed body 2 is connected with a second connecting surface 301 of the extending body 3 , wherein the first connecting surface 201 and the second connecting surface 301 are partially abutted and partially exposed.

Referring to FIG. 3 , the extending body 3 has an engaging surface 302 , and the engaging surface 302 is configured to engage with a groove 106 of the connecting base 105 of the mobile device 104 . In addition, at least one screw hole 31 is formed on the extending body 3 , and the screw hole 31 is configured to be locked in the groove 106 of the connecting base 105 .

Referring to FIG. 4 , the probe fixing device further includes a probe fixture base 4 , the probe fixture base 4 has a plurality of alignment holes 41 , and the alignment holes 41 are configured to be connected with the first The through-hole 21 , the second through-hole 22 , the third through-hole 23 and the fourth through-hole 24 communicate with each other for the probes 101 to pass through the first through-hole 21 , the second through-hole 22 , the third through-hole 23 or The fourth through hole 24 and the corresponding alignment hole 41 . In addition, the probe fixture base 4 further has a clamping slot 42 , and the clamping slot 42 is configured to be engaged with the fixing body 2 . In this embodiment, the fixing body 2 has at least one first fixing hole 26 , the probe fixture base has at least one second fixing hole 43 , and the first fixing hole 26 and the second fixing hole 43 are configured for Fastened together with screws.

Please refer to FIG. 5 to FIG. 10 , in other embodiments, the probe fixing device for low resistance resistance detection of the present invention can also set a first through hole 21 with different spacings according to the chip resistance of different size resistances. , a second through hole 22, a third through hole 23 and a fourth through hole 24, wherein the spacing shown in FIG. 5 is the smallest, and the distance (2.6mm) between the first through hole 21 and the fourth through hole 24 is the The distance (0.75 mm) between the second through hole 22 and the third through hole 23 is three times or more. The spacing shown in FIG. 6 is greater than the spacing shown in FIG. 5. The distance between the first through hole 21 and the fourth through hole 24 (4.3 mm) is the distance between the second through hole 22 and the third through hole 23 (1.3 mm) more than 3 times. The spacing shown in FIG. 7 is greater than the spacing shown in FIG. 6. The distance between the first through hole 21 and the fourth through hole 24 (5.5 mm) is the distance between the second through hole 22 and the third through hole 23 (1.6 mm) more than 3 times. The spacing shown in FIG. 8 is greater than the spacing shown in FIG. 7. The distance (8.6 mm) between the first through hole 21 and the fourth through hole 24 is the distance between the second through hole 22 and the third through hole 23 (2.6 mm) more than 3 times. The spacing shown in FIG. 9 is greater than the spacing shown in FIG. 8. The distance (14 mm) between the first through hole 21 and the fourth through hole 24 is equal to the distance between the second through hole 22 and the third through hole 23 (4.3 mm) 3 times or more. The spacing shown in FIG. 10 is greater than the spacing shown in FIG. 9. The distance between the first through hole 21 and the fourth through hole 24 (18.3 mm) is the distance between the second through hole 22 and the third through hole 23 (5.7 mm) more than 3 times.

As mentioned above, when these low-resistance resistors are measured, the terminal electrodes B and C at the two ends of the second resistor R2 are respectively electrically connected to the probes 101 of the two voltage pins, and at the same time the first resistor The terminal electrode A at the end of R1 away from the second resistor is electrically connected to the probe 101 of a current needle, and the end electrode at the end of the third resistor R3 away from the second resistor R2 D is electrically connected to the probe 101 of the other current needle, so as to prevent the low resistance measurement from being affected by the displacement of the probe and causing the measured resistance to fluctuate, thereby reducing the error range of the resistance measurement.

Although this creation has been disclosed with examples, it is not intended to limit this creation. Anyone who is familiar with the art can make various changes and modifications without departing from the spirit and scope of this creation. Therefore, this creation is protected by The scope shall be determined by the scope of the appended patent application.

2: Fixed body

21: First Piercing

22: Second perforation

23: Third Piercing

24: Fourth Piercing

3: Extended body

Claims (10)

A probe fixing device for low resistance resistance detection, the probe fixing device is configured for a plurality of probes to be installed to detect a chip resistance placed in a resistance tester, the chip resistance at least has a first resistance , a second resistor and a third resistor, the probe fixing device includes: a fixing body, including a first through hole, a second through hole, a third through hole and a fourth through hole, wherein the first through hole corresponds to The first resistor is far away from a terminal electrode at one end of the second resistor, the second through hole and the third through hole respectively correspond to the terminal electrodes at two ends of the second resistor, and the fourth through hole corresponds to the third resistor away from the first through hole. A terminal electrode at one end of two resistors, the probes are configured to be installed in the first through hole, the second through hole, the third through hole and the fourth through hole; and an extension body extending from one end of the fixed body , the extension body is configured to be combined on a mobile device of the resistance tester. The probe fixing device for low-resistance resistance detection according to claim 1, wherein the first through hole, the second through hole, the third through hole and the fourth through hole are arranged at intervals on the same straight line, and the The distance between the first through hole and the fourth through hole is more than three times the distance between the second through hole and the third through hole. The probe fixing device for low-resistance resistance detection according to claim 1, wherein the first through hole is configured for the probe of the current needle to pass through, and the second through hole is configured for the probe of the voltage needle to pass through Passing through, the third through hole is configured for the probe of the voltage needle to pass through, and the fourth through hole is configured for the probe of the current needle to pass through. The probe fixing device for low resistance resistance detection according to claim 1, wherein the fixing body further comprises a plurality of wire management holes, and the wire management holes are formed on the surface of the fixing body On one side of the fixed body, the first through hole, the second through hole, the third through hole and the fourth through hole are located on the other side of the surface of the fixed body. The probe fixing device for low-resistance resistance detection according to claim 1, wherein a first connection surface of the fixing body is connected with a second connection surface of the extending body, and the first connection surface is connected to The second connection surface is partially attached and partially exposed. The probe fixing device for low-resistance resistance detection as claimed in claim 1, wherein the extending body has an engaging surface, and the engaging surface is configured to engage a groove of a connecting seat of the mobile device superior. The probe fixing device for low-resistance resistance detection according to claim 6, wherein at least one screw hole is formed on the extending body, and the screw hole is configured to be locked on the connection base. The probe fixing device for low-resistance resistance detection according to claim 1, wherein the probe fixing device further comprises a probe jig base, the probe jig base has a plurality of alignment holes, the The alignment hole is configured to communicate with the first through hole, the second through hole, the third through hole and the fourth through hole, so that the probes can pass through the first through hole, the second through hole and the third through hole at the same time. The perforation or the fourth perforation and the corresponding and alignment holes. The probe fixing device for low-resistance resistance detection according to claim 8, wherein the probe fixture base has a card slot, and the card slot is configured to be engaged with the fixing body. The probe fixing device for low resistance resistance detection according to claim 9, wherein the fixing body has at least one first fixing hole, the probe fixture base has at least one second fixing hole, and the first fixing hole The hole and the second fixing hole are configured to be fastened together by screws.

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