TWM628841U - Wafer Frame Cleaning System - Google Patents

Wafer Frame Cleaning System Download PDF

Info

Publication number
TWM628841U
TWM628841U TW111202666U TW111202666U TWM628841U TW M628841 U TWM628841 U TW M628841U TW 111202666 U TW111202666 U TW 111202666U TW 111202666 U TW111202666 U TW 111202666U TW M628841 U TWM628841 U TW M628841U
Authority
TW
Taiwan
Prior art keywords
frame
cleaning
unit
wafer frame
wafer
Prior art date
Application number
TW111202666U
Other languages
Chinese (zh)
Inventor
陳宏奇
Original Assignee
孫建忠
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 孫建忠 filed Critical 孫建忠
Priority to TW111202666U priority Critical patent/TWM628841U/en
Publication of TWM628841U publication Critical patent/TWM628841U/en

Links

Images

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

本新型創作係關於一種晶圓框架清潔之系統,本新型創作主要係透過以水刀(Water jet cutter)作為晶圓框架之清洗,同時由於水刀之噴擊範圍可因噴頭調整而有較大之調整範圍且可消弭許多死角,同時在適度之壓力調節下,且也不會以「硬質」對於該晶圓框架產生形變或者傷損。且可以省卻以刮刀刮除之繁瑣配置與工序較為經濟便利且透過水刀之強力清洗更為潔淨。並配合一輪刷清潔單元,透過柔軟度與清洗程度之平衡,例如輪刷材質可以布輪、毛刷輪、研磨輪或者海綿之一或二種以上複合,以增進清洗更為潔淨。 This new creation is about a wafer frame cleaning system. The new creation is mainly based on the cleaning of the wafer frame by using a water jet cutter. At the same time, the spraying range of the water jet can be adjusted to a larger extent due to the nozzle adjustment. The adjustment range can eliminate many dead spots, and at the same time, under moderate pressure adjustment, the wafer frame will not be deformed or damaged by "hardness". And it can save the cumbersome configuration and process of scraping with a scraper, which is more economical and convenient, and the powerful cleaning through water jet is cleaner. And with a brush cleaning unit, through the balance of softness and cleaning degree, for example, the material of the brush can be one or more of cloth wheel, brush wheel, grinding wheel or sponge, to improve cleaning and cleaner.

Description

晶圓框架清潔之系統 Wafer Frame Cleaning System

本新型創作係關於一種晶圓製程之輔助設備,尤指一種晶圓框架清潔系統。 This novel creation relates to an auxiliary equipment for wafer process, especially a wafer frame cleaning system.

半導體晶圓製造過程中,會採用晶圓框架(Wafer Frame)提供用於晶圓切割、研磨過程中,放置與固定晶圓,並且會貼上支撐膠帶(或稱薄膜)以避免晶圓於切割、研磨的過程中滑脫,而在使用後,可以透過清潔工序將該支撐膠帶清洗即可再為使用。 In the semiconductor wafer manufacturing process, a wafer frame (Wafer Frame) will be used to place and fix the wafer during the wafer cutting and grinding process, and a support tape (or film) will be attached to prevent the wafer from being cut. , slip off during the grinding process, and after use, the support tape can be cleaned through the cleaning process before it can be used again.

對於此類清洗晶圓框架之清洗,本申請人曾經於2017年11月22日提出一「晶圓框架取回與清潔之系統及方法」,經核准為I628731號發明專利。當時申請人於該說明書中對於先前技術曾經陳述「因切割路線的規劃通常是為了得到矩形或方形的晶粒,被切割後的晶圓會有多餘的切割殘料,像是位於晶圓邊緣的不規則形狀。在材料回收的考量下,這些多餘的殘料必須回收供晶圓製造重複利用。因此,黏附在支撐膠帶上的晶圓切割餘料必須先與晶圓框架分離,接著再自支撐膠帶取下進行封裝回收利用。此外,分離後的晶圓框架亦可經過清潔後重複使用,關於……支撐膠帶與晶圓框架的分離,一般是以手工操作….如此的工法非常沒有效率,而且相當耗費人力及成本。……過程中大部分是以手工清除,如此清除的手 段也非常沒有效率,同樣消耗人力及成本」。 For such cleaning of the wafer frame, the applicant once proposed a "wafer frame retrieval and cleaning system and method" on November 22, 2017, which was approved as an invention patent No. I628731. At that time, the applicant stated in the specification regarding the prior art that "because the planning of the dicing route is usually to obtain rectangular or square dies, the diced wafer will have excess dicing residues, such as those located on the edge of the wafer. Irregular shapes. In consideration of material recovery, these excess remnants must be recovered for reuse in wafer fabrication. Therefore, wafer dicing remnants adhered to support tape must first be separated from the wafer frame and then self-supporting The tape is removed for packaging and recycling. In addition, the separated wafer frame can also be cleaned and reused. Regarding... the separation of the support tape and the wafer frame is generally performed manually.... This method is very inefficient, And it is quite labor-intensive and cost-intensive....Most of the process is manually removed, and the hands of such removal are The segment is also very inefficient, and also consumes manpower and costs.”

針對前述問題,申請人進一步研發而產生該I628731號發明專利,而在該I628731發明專利中,依據說明書所載,其中所指之清潔工作以一清潔機構進行,該清潔機構包含一第一平台,具有一水平支撐面用以支撐所述晶圓框架;一刮刀,具有一刀鋒部且經配置以該刀鋒部靠近該第一平台的水平支撐面,使該刀鋒部能夠適當地接觸所述晶圓框架的表面來進行刮除工作。 In response to the aforementioned problems, the applicant further developed the patent for invention No. I628731, and in the patent for invention I628731, according to the description, the cleaning work referred to is performed by a cleaning mechanism, and the cleaning mechanism includes a first platform, There is a horizontal support surface for supporting the wafer frame; a scraper has a blade edge and is configured so that the blade edge part is close to the horizontal support surface of the first platform, so that the blade edge part can properly contact the wafer the surface of the frame for scraping work.

雖該發明具有實質功效,惟申請人基於研發不輟,認為亦可採取其他之取代工事與系統,以避免刮刀之在使該刀鋒部接觸所述晶圓框架的表面來進行刮除工作時同時對該晶圓框架產生硬質性之傷損。 Although the invention has substantial effects, the applicant, based on continuous research and development, believes that other alternative works and systems can also be adopted to avoid the scraping work when the blade is brought into contact with the surface of the wafer frame at the same time. Hard damage occurs to the wafer frame.

有鑑於前述,本新型創作人認為應有一種改善之系統,為此提供一種晶圓框架清潔系統,係用於清潔一晶圓框架,包括一機台主體,該機台主體包括一框架載入單元,用以承接該晶圓框架;一框架輸送單元,與該框架載入單元形成輸送性之連接,用以承接該晶圓框架;一清洗單元,用以清洗該晶圓框架,該清洗單元容許該框架輸送單元貫穿,且於該框架輸送單元之路徑依序間隔設有第一水刀清洗單元以及一第二水刀清洗單元;一框架取回單元,與該清洗單元形成輸送性之連接,其特徵在於該框架輸送單元之路徑之該第一水刀清洗單元與該第二水刀清洗單元之間設有一輪刷清潔單元。藉以將該晶圓框架置放於該框架載入單元;然後藉由該框架載入單元與該框架輸送單元間輸送性之連接,將該晶圓框架輸送至該框架輸送單元:繼而將該晶圓框架透過該清洗單元之第一水刀清洗單元初 步清洗,可先剝離大部分的晶圓框架上的條碼及殘膠;該晶圓框架透過該清洗單元之輪刷清潔單元進一步清洗,以增進清洗更為潔淨。並配合一輪刷清潔單元,透過柔軟度與清洗程度之平衡,例如輪刷材質可以布輪、毛刷輪、研磨輪或者海棉之一或二種以上複合,以增進清洗更為潔淨。該晶圓框架透過該清洗單元之第二水刀清洗單元再為清洗;經過風乾或乾燥;再由該框架取回單元與該清洗單元形成輸送性之連接而取回該晶圓框架。 In view of the foregoing, the inventors of the present invention believe that there should be an improved system, and provide a wafer frame cleaning system for cleaning a wafer frame, including a machine main body, and the machine main body includes a frame loading a unit for receiving the wafer frame; a frame conveying unit for forming a conveying connection with the frame loading unit for receiving the wafer frame; a cleaning unit for cleaning the wafer frame, the cleaning unit The frame conveying unit is allowed to pass through, and a first water jet cleaning unit and a second water jet cleaning unit are arranged at intervals along the path of the frame conveying unit; a frame retrieval unit forms a conveying connection with the cleaning unit , which is characterized in that a brush cleaning unit is arranged between the first water jet cleaning unit and the second water jet cleaning unit in the path of the frame conveying unit. Thereby, the wafer frame is placed in the frame loading unit; then the wafer frame is transported to the frame transporting unit through the transportable connection between the frame loading unit and the frame transporting unit; then the wafer frame is transported to the frame transporting unit. The circular frame passes through the first water jet cleaning unit of the cleaning unit In the step of cleaning, most of the barcode and residual glue on the wafer frame can be stripped first; the wafer frame is further cleaned by the wheel brush cleaning unit of the cleaning unit, so as to improve the cleaning and make it cleaner. And cooperate with a brush cleaning unit, through the balance between softness and cleaning degree, for example, the material of the brush can be one or more combination of cloth wheel, brush wheel, grinding wheel or sponge to improve cleaning and cleaner. The wafer frame is cleaned again by the second water jet cleaning unit of the cleaning unit; air-dried or dried; and then the frame retrieval unit and the cleaning unit form a conveying connection to retrieve the wafer frame.

本新型採用該輪刷清潔單元本身可以做高速旋轉,產生更多的摩擦力去接觸晶圓框架表面,同時配合水流,增加切削力、髒污代謝以及維持工作溫度利用不同材質間的特性帶走表面殘膠。舉例來說晶圓框架是不銹鋼,膠是軟性樹脂,刷輪材質選擇就能選比膠硬但比框架軟的材質。 The new model adopts the wheel brush cleaning unit itself to rotate at high speed, generate more friction to contact the surface of the wafer frame, and at the same time cooperate with the water flow to increase cutting force, dirt metabolism and maintain working temperature. glue residue on the surface. For example, the wafer frame is made of stainless steel, and the glue is a soft resin. The material of the brush wheel can be selected from a material that is harder than the glue but softer than the frame.

本新型創作透過水刀(Water jet cutter)的原理是將水流以高壓方式噴擠,因此具有強力之清潔效果。雖然水刀技術並非為本案所獨創(本案亦非單純以水刀為訴求標的),惟在適當之流程配置下作為晶圓框架之清洗,同時由於水刀之噴擊範圍可因噴頭調整而有較大之調整範圍且可消弭許多死角,同時在適度之壓力調節下,且也不會以「硬質」對於該晶圓框架產生形變或者傷損。且可以省卻以刮刀刮除之繁瑣配置與工序較為經濟便利且透過水刀之強力清洗更為潔淨。 The principle of the new creation through the water jet cutter is to squeeze the water flow with high pressure, so it has a strong cleaning effect. Although the water jet technology is not unique to this case (and this case is not purely based on water jet), it can be used for wafer frame cleaning under proper process configuration. At the same time, the spray range of water jet can be adjusted due to nozzle adjustment. The large adjustment range can eliminate many dead spots, and at the same time, under moderate pressure adjustment, the wafer frame will not be deformed or damaged by "hardness". And it can save the cumbersome configuration and process of scraping with a scraper, which is more economical and convenient, and the powerful cleaning through water jet is cleaner.

且透過該第一水刀清洗單元、第二水刀清洗單元之清洗,其效果對於該晶圓框架所設之可供感應器辨識的條碼,不但可以免除回收過程中手工清除,且搭配該輪刷清潔單元亦可進一步克服乾固後的殘膠硬度而去除殘膠。 And through the cleaning of the first water jet cleaning unit and the second water jet cleaning unit, the effect of the bar code set on the wafer frame that can be recognized by the sensor can not only avoid manual removal during the recycling process, but also cooperate with the wheel. The brush cleaning unit can further overcome the hardness of the glue residue after drying and remove the glue residue.

(1):機台主體 (1): The main body of the machine

(2):框架載入單元 (2): Frame loading unit

(3):框架輸送單元 (3): Frame conveying unit

(31):工作區段 (31): Working section

(311):掣動滾輪 (311): Turn the wheel

(4):清洗單元 (4): Cleaning unit

(41):第一水刀清洗單元 (41): The first water jet cleaning unit

(42):輪刷清潔單元 (42): Wheel brush cleaning unit

(43):第二水刀清洗單元 (43): Second water jet cleaning unit

(5):框架取回單元 (5): Frame retrieval unit

(6):晶圓框架 (6): Wafer frame

第一圖係本新型創作架構示意圖 The first picture is a schematic diagram of the new creative structure

第二圖係本新型創作架構立體圖 The second figure is a three-dimensional view of the new creative structure

第三圖係本新型創作側視示意圖 The third figure is a schematic side view of the new creation

第四圖係晶圓框架立體示意圖 The fourth figure is a three-dimensional schematic diagram of the wafer frame

第五圖係本新型創作工作區段示意圖 The fifth figure is a schematic diagram of the new creative work section

第六圖系本新型創作之流程圖 The sixth figure is the flow chart of the new creation

以下藉由圖式之配合,說明本新型創作之構造、特點以及實施例,俾使貴審查委員對本新型創作有更進一步之理解。 The following describes the structure, features and embodiments of the novel creation with the help of the drawings, so that your reviewers can have a further understanding of the novel creation.

請參閱第一圖,配合第二、三圖所示,本新型創作係關於一種晶圓框架清潔系統,係用於清潔如第四圖所示之晶圓框架(6),且該清潔作業主要係將該晶圓框架(6)上所附著之支撐膠帶除去之工事。 Please refer to the first figure, in conjunction with the second and third figures, the present invention relates to a wafer frame cleaning system, which is used for cleaning the wafer frame (6) as shown in the fourth figure, and the cleaning operation is mainly It is the work of removing the support tape attached to the wafer frame (6).

本新型創作之系統主要包括一機台主體(1),該機台主體(1)包括:一框架載入單元(2);用以承接該晶圓框架(6);按,晶圓框架(6)主要是在半導體封裝製程可以用來承載並框定晶圓,同時提供搬運。而對於使用後之晶圓框架(6)可以依據一貫自動化流程加以清洗,或由本框架載入單元(2)加以承接。一框架輸送單元(3):與該框架載入單元(2)形成輸送性之連接,用以承接該晶圓框架(6);該輸送性之連接,可以利用輸送帶或者機器手臂等自動化移動設備加以進行。 一清洗單元(4):用以清洗該晶圓框架(6),該清洗單元(4)容許該框架輸送單元(3)貫穿,且於該框架輸送單元之路徑依序間隔設有第一水刀清洗單元(41)、一輪刷清潔單元(42),該輪刷清潔單元(42)考量柔軟度與清洗程度之平衡,其輪刷材質可以布輪、毛刷輪、研磨輪或者海綿之一或二種以上複合以增進清洗更為潔淨。以及一第二水刀清洗單元(43);本新型採用該輪刷清潔單元(42)本身可以做高速旋轉,產生更多的摩擦力去接觸晶圓框架表面,同時配合水流,增加切削力、髒污代謝以及維持工作溫度利用不同材質間的特性帶走表面殘膠。舉例來說晶圓框架是不銹鋼,膠是軟性樹脂,刷輪材質選擇就能選比膠硬但比框架軟的材質。 The new creation system mainly includes a machine main body (1), the machine main body (1) includes: a frame loading unit (2); for receiving the wafer frame (6); press, the wafer frame ( 6) Mainly in the semiconductor packaging process, it can be used to carry and frame wafers, while providing handling. After use, the wafer frame (6) can be cleaned according to a consistent automated process, or taken over by the frame loading unit (2). A frame conveying unit (3): forms a conveying connection with the frame loading unit (2) to receive the wafer frame (6); the conveying connection can be automatically moved by a conveyor belt or a robotic arm. equipment to be carried out. A cleaning unit (4): used for cleaning the wafer frame (6), the cleaning unit (4) allows the frame conveying unit (3) to pass through, and is provided with first water at intervals in the path of the frame conveying unit A knife cleaning unit (41), a wheel brush cleaning unit (42), the wheel brush cleaning unit (42) considers the balance between softness and cleaning degree, and the wheel brush material can be one of cloth wheel, brush wheel, grinding wheel or sponge Or a combination of two or more to enhance cleaning and make it cleaner. and a second water jet cleaning unit (43); the new model adopts the wheel brush cleaning unit (42) itself to perform high-speed rotation, generate more frictional force to contact the surface of the wafer frame, and at the same time cooperate with water flow to increase cutting force, Dirt metabolism and maintenance of working temperature take advantage of the characteristics of different materials to take away the residual glue on the surface. For example, the wafer frame is made of stainless steel, and the glue is a soft resin. The material of the brush wheel can be selected from a material that is harder than the glue but softer than the frame.

此外,水刀(Water jet cutter)的原理是將水流以高壓方式噴擠,因此具有強力之清潔效果。雖然水刀技術並非為本案所獨創(本案亦非單純以水刀為訴求標的),惟在適當之流程配置下作為晶圓框架之清洗,,同時由於水刀之噴擊範圍可因噴頭調整而有較大之調整範圍且可消弭許多死角,同時在適度之壓力調節配合下,也不會以「硬質」對於該晶圓框架產生形變或者傷損。從而減少更換該晶圓框架之機會而相對於產能速度能夠提升。一框架取回單元(5),與該清洗單元(3)形成輸送性之連接,以作為接收該晶圓框架(6)。 In addition, the principle of the water jet cutter is to squeeze the water flow with high pressure, so it has a strong cleaning effect. Although the water jet technology is not unique to this case (and this case is not purely based on water jet), it can be used to clean the wafer frame under proper process configuration. At the same time, the spray range of the water jet can be adjusted by the nozzle. It has a large adjustment range and can eliminate many dead spots. At the same time, under the moderate pressure adjustment, the wafer frame will not be deformed or damaged by "hardness". Thereby, the chance of replacing the wafer frame can be reduced and the speed relative to the throughput can be improved. A frame retrieving unit (5) forms a conveying connection with the cleaning unit (3) for receiving the wafer frame (6).

請參閱第五圖所示,本新型創作更佳之實施例,由於該晶圓框架(6)主體為一中空狀之環體,因此該框架輸送單元(3)可以在對應該清洗單元(4)之各個工作區域(第一水刀清洗單元(41)、輪刷清潔單元(42)以及該第 二水刀清洗單元(43)),可以各形成一個工作區段(31),該各個工作區段(31)各沿該晶圓框架(6)之環體設有複數掣動滾輪(311),該複數掣動滾輪(311)可以為各上下一組,而對該晶圓框架(6)形成夾制並進行掣動。並令該晶圓框架(6)局部對應該第一水刀清洗單元(41)、輪刷清潔單元(42)以及該第二水刀清洗單元(43)之沖洗或刷洗。 Please refer to Fig. 5, which is a better embodiment of the present invention. Since the main body of the wafer frame (6) is a hollow ring body, the frame conveying unit (3) can be used in the corresponding cleaning unit (4). each working area (the first water jet cleaning unit (41), the wheel brush cleaning unit (42) and the first water jet cleaning unit (41) Two water jet cleaning units (43)), each of which can form a working section (31), and each working section (31) is provided with a plurality of locking rollers (311) along the ring body of the wafer frame (6). , the plurality of locking rollers (311) can be set up and down, and the wafer frame (6) is clamped and locked. And the wafer frame (6) is partially corresponding to the flushing or brushing of the first water jet cleaning unit (41), the wheel brush cleaning unit (42) and the second water jet cleaning unit (43).

本新型創作之操作步驟,如第六圖所示,至少包括以下步驟: The operation steps of the new creation, as shown in the sixth figure, at least include the following steps:

1.將該晶圓框架(6)置放於該框架載入單元(2); 1. Place the wafer frame (6) on the frame loading unit (2);

2.藉由該框架載入單元(2)與該框架輸送單元(3)間輸送性之連接,將該晶圓框架(6)輸送至該框架輸送單元(3): 2. By means of the transportable connection between the frame loading unit (2) and the frame transporting unit (3), the wafer frame (6) is transported to the frame transporting unit (3):

3.該晶圓框架(6)透過該清洗單元(4)之第一水刀清洗單元(41)初步清洗;且基於溶解度與洗淨程度之考量,本新型創作之該第一水刀清洗單元(41)內之水刀內可以自來水、純水或者添加各種酸鹼藥劑或溶劑,先剝離大部分的晶圓框架(6)上的條碼及殘膠; 3. The wafer frame (6) is preliminarily cleaned by the first water-jet cleaning unit (41) of the cleaning unit (4); and based on the consideration of solubility and cleaning degree, the first water-jet cleaning unit of the novel creation (41) Tap water, pure water or various acid-base agents or solvents can be added to the water jet in (41), and most of the barcodes and residual glue on the wafer frame (6) can be peeled off first;

4.該晶圓框架(6)透過該清洗單元(4)之輪刷清潔單元(42)進一步清洗;該輪刷清潔單元(42)考量柔軟度與清洗程度之平衡,其輪刷材質可以布輪、毛刷輪、研磨輪或者海綿之一或二種以上複合以增進清洗更為潔淨。 4. The wafer frame (6) is further cleaned by the wheel brush cleaning unit (42) of the cleaning unit (4); the wheel brush cleaning unit (42) considers the balance between softness and cleaning degree, and the wheel brush material can be cloth. One or more of wheel, brush wheel, grinding wheel or sponge are combined to improve cleaning and cleanliness.

5.該晶圓框架(6)透過該清洗單元(4)之第二水刀清洗單元(43)再為清洗;同樣且基於與最終端洗淨確保髒污無殘留之考量,本發明之該第二水刀清洗單元(43)內之水刀內可以自來水、純水或者添加各種酸鹼藥劑或溶劑作第二度清洗; 5. The wafer frame (6) is cleaned again through the second water jet cleaning unit (43) of the cleaning unit (4); similarly and based on the consideration of cleaning at the final end to ensure no contamination and no residue, the The water jet in the second water jet cleaning unit (43) can be cleaned with tap water, pure water, or by adding various acid-base agents or solvents for the second cleaning;

6.經過風乾或乾燥; 6. After air drying or drying;

7.再由該框架取回單元(5)與該清洗單元(3)形成輸送性之連接而取回該晶 圓框架(6)。 7. The frame retrieval unit (5) and the cleaning unit (3) form a transportable connection to retrieve the crystal. Round frame (6).

綜上所述,本新型創作確實符合可專利之積極要件,且無不予專利之消極要件,爰依法提出專利申請。惟舉凡依本新型創作申請專利範圍所作之均等變化,皆屬本案訴求標的之範疇。 To sum up, the new creation does meet the positive requirements for patentability, and there are no negative requirements for non-patentability, so a patent application can be filed in accordance with the law. However, all the equal changes made according to the scope of the patent application for this new type of creation belong to the scope of the subject matter of this case.

(1):機台主體 (1): The main body of the machine

(2):框架載入單元 (2): Frame loading unit

(3):框架輸送單元 (3): Frame conveying unit

(4):清洗單元 (4): Cleaning unit

(41):第一水刀清洗單元 (41): The first water jet cleaning unit

(42):輪刷清潔單元 (42): Wheel brush cleaning unit

(43):第二水刀清洗單元 (43): Second water jet cleaning unit

(5):框架取回單元 (5): Frame retrieval unit

Claims (4)

一種晶圓框架清潔系統,係用於清潔一晶圓框架,包括一機台主體,該機台主體包括一框架載入單元,用以承接該晶圓框架;一框架輸送單元,與該框架載入單元形成輸送性之連接,用以承接該晶圓框架;一清洗單元,用以清洗該晶圓框架,該清洗單元容許該框架輸送單元貫穿,且於該框架輸送單元之路徑依序間隔設有第一水刀清洗單元以及一第二水刀清洗單元;一框架取回單元,與該清洗單元形成輸送性之連接,其特徵在於該框架輸送單元之路徑之該第一水刀清洗單元與該第二水刀清洗單元之間設有一輪刷清潔單元。 A wafer frame cleaning system is used for cleaning a wafer frame, including a machine main body, the machine main body includes a frame loading unit for receiving the wafer frame; a frame conveying unit, and the frame carrying unit The input unit forms a conveying connection for receiving the wafer frame; a cleaning unit is used for cleaning the wafer frame, the cleaning unit allows the frame conveying unit to pass through, and is arranged at intervals in the path of the frame conveying unit There are a first water jet cleaning unit and a second water jet cleaning unit; a frame retrieval unit, which forms a conveying connection with the cleaning unit, characterized in that the first water jet cleaning unit in the path of the frame conveying unit is connected to the A brush cleaning unit is arranged between the second water jet cleaning units. 如申請專利範圍第1項所述之晶圓框架清潔系統,其中該框架輸送單元在對應該清洗單元之各個工作區域各形成一個工作區段,該各個工作區段各沿該晶圓框架之環體設有複數掣動滾輪。 The wafer frame cleaning system according to claim 1, wherein the frame conveying unit forms a working section in each working area corresponding to the cleaning unit, and each working section is along the ring of the wafer frame The body is provided with multiple control wheels. 如申請專利範圍第2項所述之晶圓框架清潔系統,其中該複數掣動滾輪為各上下一組。 The wafer frame cleaning system as described in item 2 of the claimed scope, wherein the plurality of control rollers are one set up and one down. 如申請專利範圍第1項所述之晶圓框架清潔系統,其中該輪刷清潔單元之輪刷材質可以為選自布輪、毛刷輪、研磨輪或者海綿之一或其複合。 According to the wafer frame cleaning system described in item 1 of the claimed scope, the brush material of the brush cleaning unit can be selected from one or a combination of a cloth wheel, a brush wheel, a grinding wheel or a sponge or a combination thereof.
TW111202666U 2022-03-17 2022-03-17 Wafer Frame Cleaning System TWM628841U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW111202666U TWM628841U (en) 2022-03-17 2022-03-17 Wafer Frame Cleaning System

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW111202666U TWM628841U (en) 2022-03-17 2022-03-17 Wafer Frame Cleaning System

Publications (1)

Publication Number Publication Date
TWM628841U true TWM628841U (en) 2022-06-21

Family

ID=83063858

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111202666U TWM628841U (en) 2022-03-17 2022-03-17 Wafer Frame Cleaning System

Country Status (1)

Country Link
TW (1) TWM628841U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI804239B (en) * 2022-03-17 2023-06-01 孫建忠 System and method for wafer frame cleaning

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI804239B (en) * 2022-03-17 2023-06-01 孫建忠 System and method for wafer frame cleaning

Similar Documents

Publication Publication Date Title
JP3044277B2 (en) Wafer cleaning and cleaning / drying equipment
TWI680834B (en) Wafer edge grinding device and method
KR102142893B1 (en) Method of polishing back surface of substrate and substrate processing apparatus
TWM628841U (en) Wafer Frame Cleaning System
JP2007324516A (en) Work processing device
TWI327132B (en)
JP2003209089A (en) Cleaning method, cleaning device and dicing device for wafer
WO2016143273A1 (en) Wafer chamfering apparatus and wafer chamfering method
TWI804239B (en) System and method for wafer frame cleaning
TWI628731B (en) System and method for retrieving and purifying wafer frame
KR101408442B1 (en) A recycle device for pellicle
JPS6028385B2 (en) washing drying equipment
JP4295469B2 (en) Polishing method
JPH06208979A (en) Manufacturing system for semiconductor wafer
JP5385519B2 (en) Cleaning device with chamfering function
JP2016019936A (en) Roll cleaning device
JP2007099553A (en) Method for processing flat glass and apparatus for it
KR20100052831A (en) Post-lapping cleaning process and apparatus for semiconductor wafer
KR102220014B1 (en) System for finishing and taping surface of metal plate
JPH06208982A (en) Cleaning and drying apparatus for semiconductor wafer
WO2022201665A1 (en) Cleaning device for wafer-suctioning chuck structure
KR200198418Y1 (en) Removing apparatus of default on the wafer chuck table
JPH0115454B2 (en)
JP3053256B2 (en) Wafer slice-based peeling / cleaning method and apparatus, and wafer processing / transporting apparatus
JP2005152817A (en) Cleaning apparatus and apparatus for manufacturing semiconductor device