TWM613699U - Retainer ring - Google Patents

Retainer ring Download PDF

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Publication number
TWM613699U
TWM613699U TW110202824U TW110202824U TWM613699U TW M613699 U TWM613699 U TW M613699U TW 110202824 U TW110202824 U TW 110202824U TW 110202824 U TW110202824 U TW 110202824U TW M613699 U TWM613699 U TW M613699U
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Taiwan
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grinding ring
wear
resistant layer
ring
grinding
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TW110202824U
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Chinese (zh)
Inventor
吳敏郎
增永秀樹
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法雅通商有限公司
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Priority to TW110202824U priority Critical patent/TWM613699U/en
Publication of TWM613699U publication Critical patent/TWM613699U/en

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Abstract

A retainer ring having a top surface, a bottom surface and an inner side surface is provided. The inner surface is located between the top surface and the bottom surface. The inner side surface is perpendicular to the top surface or the bottom surface to be suitable for fixing a wafer. The retainer ring includes a ring body and a polish-resistant layer. The polish-resistant layer covers the ring body. The retainer ring may have better abrasion resistance, a longer service life, and may improve the process stability in application. In addition, the retainer ring may be reproduced and the cost in use may be reduced.

Description

研磨環Grinding ring

本新型創作是有關於一種研磨環,且特別是有關於一種適用於化學機械研磨或其他半導體製程之研磨環。The present invention relates to a grinding ring, and particularly to a grinding ring suitable for chemical mechanical grinding or other semiconductor manufacturing processes.

現有的研磨環多為工程塑膠(如:PPS)及陶瓷聚醚醚酮板材(陶瓷PEEK)等材質。晶圓於進行研磨的同時,研磨環自身也會受到磨耗。因此,研磨環必須在處理一定的片數之後或使用一定的週期後進行更換。而現有的研磨環常被認為是一定期必須更換的消耗品且無法再生重複利用。The existing grinding rings are mostly made of engineering plastics (such as PPS) and ceramic polyether ether ketone plates (ceramic PEEK). While the wafer is being polished, the polishing ring itself is also subject to wear. Therefore, the grinding ring must be replaced after processing a certain number of pieces or after a certain period of use. The existing grinding ring is often regarded as a consumable that must be replaced regularly and cannot be regenerated and reused.

本新型創作提供一種研磨環,其可以具有較佳的抗磨耗、較長的使用壽命、應用上可以提昇製程穩定度。並且,研磨環可以進行再製而可以降低使用成本。The present invention provides a grinding ring, which can have better abrasion resistance, a longer service life, and can improve the process stability in application. In addition, the grinding ring can be remanufactured and the use cost can be reduced.

本新型創作的研磨環,具有頂面、底面及內側面。內側面位於頂面與底面之間。內側面垂直於頂面或底面以適於固定晶圓。研磨環包括環體以及耐磨層。耐磨層覆蓋環體。The grinding ring created by the new model has a top surface, a bottom surface and an inner side surface. The inner surface is located between the top surface and the bottom surface. The inner side surface is perpendicular to the top surface or the bottom surface to be suitable for fixing the wafer. The grinding ring includes a ring body and a wear-resistant layer. The wear-resistant layer covers the ring body.

在本新型創作的一實施例中,環體的材質包括鋁。In an embodiment of the present invention, the material of the ring body includes aluminum.

在本新型創作的一實施例中,耐磨層包括本徵碳膜。In an embodiment of the invention, the wear-resistant layer includes an intrinsic carbon film.

在本新型創作的一實施例中,耐磨層至少位於研磨環的底面。In an embodiment of the present invention, the wear-resistant layer is located at least on the bottom surface of the grinding ring.

在本新型創作的一實施例中,耐磨層完全覆蓋環體。In an embodiment of the present invention, the wear-resistant layer completely covers the ring body.

在本新型創作的一實施例中,耐磨層的表面粗糙度小於或等於0.03微米。In an embodiment of the present invention, the surface roughness of the wear-resistant layer is less than or equal to 0.03 microns.

在本新型創作的一實施例中,耐磨層的維氏硬度介於1500至2500。In an embodiment of the present invention, the Vickers hardness of the wear-resistant layer is between 1500 and 2500.

在本新型創作的一實施例中,耐磨層的摩擦係數介於0.1至0.25。In an embodiment of the present invention, the friction coefficient of the wear-resistant layer is between 0.1 and 0.25.

在本新型創作的一實施例中,耐磨層的厚度介於0.1至0.3微米。In an embodiment of the present invention, the thickness of the wear-resistant layer is between 0.1 and 0.3 microns.

在本新型創作的一實施例中,研磨環更具有多個溝槽以及多個嵌孔。多個溝槽位於底面。多個嵌孔位於頂面。In an embodiment of the present invention, the grinding ring further has a plurality of grooves and a plurality of embedded holes. A plurality of grooves are located on the bottom surface. A plurality of recessed holes are located on the top surface.

基於上述,由於本新型創作的研磨環包括耐磨層,因此可以具有較佳的抗磨耗、較長的使用壽命、應用上可以提昇製程穩定度。並且,研磨環可以進行再製而可以降低使用成本。Based on the above, since the grinding ring of the present invention includes a wear-resistant layer, it can have better abrasion resistance, longer service life, and improved process stability in application. In addition, the grinding ring can be remanufactured and the use cost can be reduced.

本新型創作構思可以以很多不同的形式體現並不應視為受限於在此提出的示例性實施方式。不如說,提供這些示例性實施方式使得本揭露將是完全和完整的,並且將向本案所屬技術領域中具有通常知識者充分表達本新型創作構思。然而,應理解的是,並非要將本新型創作構思限制於揭露的特定形式,相反,本新型創作構思將涵蓋落入本新型創作構思的精神和範圍內的所有修改、等同物和替代物。在整個說明書和各圖式中,相同的元件符號表示相同的元素。在圖式中,為了使本新型創作構思清楚,放大了結構的尺寸。The new creative concept can be embodied in many different forms and should not be regarded as limited to the exemplary embodiments presented here. Rather, these exemplary embodiments are provided so that this disclosure will be complete and complete, and will fully express the creative concept of the present invention to those with ordinary knowledge in the technical field of the case. However, it should be understood that the new creative concept is not limited to the specific form of disclosure. On the contrary, the new creative concept will cover all modifications, equivalents and substitutes that fall within the spirit and scope of the new creative concept. Throughout the specification and the drawings, the same reference numerals represent the same elements. In the drawings, in order to make the creative concept of the present invention clear, the size of the structure is enlarged.

在圖式中,可以根據製造技術及/或公差期望地修改示出的形狀。因此,示例性實施方式不應視為受限於示出的區域的特定的形狀。In the drawings, the shape shown can be modified as desired according to manufacturing technology and/or tolerances. Therefore, the exemplary embodiments should not be viewed as being limited to the specific shape of the illustrated area.

除非另外定義,在此使用的所有術語(包括技術術語和科學術語)具有與本新型創作所屬技術領域中具有通常知識者 通常理解相同的含義。還將理解的是,術語(諸如在通常使用的字典中定義的那些)應解釋為具有與在相關技術背景中的含義一致的含義,並不應以理想化或過於正式的意義解釋,除非在此明確這樣定義。Unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meanings commonly understood by those with ordinary knowledge in the technical field to which the creation of the new model belongs. It will also be understood that terms (such as those defined in commonly used dictionaries) should be interpreted as having meaning consistent with the meaning in the relevant technical context, and should not be interpreted in an idealized or overly formal sense, unless in This is clearly defined as such.

圖1是依照本新型創作的一實施例的一種研磨環的頂視示意圖。圖2是依照本新型創作的一實施例的一種研磨環的底視示意圖。圖3是依照本新型創作的一實施例的一種研磨環的部分底視示意圖。圖4是依照本新型創作的一實施例的一種研磨環的斷面示意圖。圖5是依照本新型創作的一實施例的一種研磨環的斷面示意圖。圖6是依照本新型創作的一實施例的一種研磨環的斷面示意圖。圖3可以是對應於圖2中區域C的放大圖。圖4可以是對應於圖1中A-A’斷面上的的對應斷面示意圖。圖5可以是對應於圖2中B-B’斷面上的的對應斷面示意圖。Fig. 1 is a schematic top view of a grinding ring according to an embodiment of the invention. Fig. 2 is a schematic bottom view of a grinding ring according to an embodiment of the invention. Fig. 3 is a schematic partial bottom view of a grinding ring according to an embodiment of the invention. Fig. 4 is a schematic cross-sectional view of a grinding ring according to an embodiment of the invention. Fig. 5 is a schematic cross-sectional view of a grinding ring according to an embodiment of the invention. Fig. 6 is a schematic cross-sectional view of a grinding ring according to an embodiment of the invention. FIG. 3 may be an enlarged view corresponding to area C in FIG. 2. Fig. 4 may be a schematic diagram of a corresponding cross-section corresponding to the A-A' cross-section in Fig. 1. Fig. 5 may be a schematic diagram of a corresponding cross-section corresponding to the B-B' cross-section in Fig. 2.

請參照圖1至圖6,研磨環100具有頂面101、底面102及內側面103。內側面103位於頂面101與底面102之間。內側面103垂直於頂面101或底面102。內側面103適於固定晶圓(未直接繪示)。藉由研磨環(外觀可能類似於研磨環100)固定晶圓的方式常見於半導體製程(如:化學機械研磨製程(Chemical mechanical polishing process;CMP process);但不限)領域,故於此不加以贅述。Please refer to FIGS. 1 to 6, the grinding ring 100 has a top surface 101, a bottom surface 102 and an inner surface 103. The inner surface 103 is located between the top surface 101 and the bottom surface 102. The inner side surface 103 is perpendicular to the top surface 101 or the bottom surface 102. The inner surface 103 is suitable for fixing a wafer (not directly shown). The method of fixing the wafer by the polishing ring (the appearance may be similar to the polishing ring 100) is commonly used in the semiconductor manufacturing process (such as: chemical mechanical polishing process (CMP process); but not limited), so it is not applied here. Go into details.

在一實施例中,研磨環100也可以被稱為保持環、固定環、扣環或卡環,但本新型創作不限於此。In an embodiment, the grinding ring 100 may also be called a retaining ring, a fixing ring, a buckle ring or a snap ring, but the invention is not limited to this.

在本實施例中,研磨環100的底面102上可以具有多個溝槽120。溝槽120從內側面103向外(即,向外側面104的方向)延伸。溝槽120的圖案或方向可以依據設計上的需求而加以調整,於本新型創作並不加以限制。另外,為求清楚表示,如圖2中並未一一標示所有的溝槽120。In this embodiment, the bottom surface 102 of the grinding ring 100 may have multiple grooves 120. The groove 120 extends outward from the inner side surface 103 (ie, in the direction of the outer side surface 104). The pattern or direction of the groove 120 can be adjusted according to design requirements, and is not limited in the creation of the present invention. In addition, for clarity, not all the grooves 120 are marked one by one in FIG. 2.

在一實施例中,在進行研磨製程或拋光製程時,溝槽120可以作為研磨液或拋光液流通的通道。In one embodiment, during the grinding process or the polishing process, the groove 120 can be used as a channel through which the grinding liquid or the polishing liquid flows.

在本實施例中,溝槽120在靠近內側面103處具有凹陷123,但本新型創作不限於此。In this embodiment, the groove 120 has a depression 123 near the inner side surface 103, but the invention is not limited to this.

在本實施例中,研磨環100的頂面101上可以具有多個嵌孔110。藉由嵌孔110可以使研磨環100直接地或間接地安裝於研磨頭(未繪示)上。研磨環(外觀可能類似於研磨環100)與研磨頭的安裝方式常見於半導體製程(如:化學機械研磨製程(Chemical Mechanical Polishing process;CMP process);但不限)領域,故於此不加以贅述。嵌孔110的形態或配置方式可以依據設計上的需求而加以調整,於本新型創作並不加以限制。In this embodiment, the top surface 101 of the grinding ring 100 may have a plurality of insertion holes 110. The grinding ring 100 can be directly or indirectly mounted on the grinding head (not shown) through the insertion hole 110. The installation method of the polishing ring (the appearance may be similar to the polishing ring 100) and the polishing head is commonly used in the semiconductor manufacturing process (such as: Chemical Mechanical Polishing process (CMP process); but not limited), so I will not repeat it here. . The shape or configuration of the embedding hole 110 can be adjusted according to design requirements, and is not limited in the creation of the present invention.

在一實施例中,嵌孔110可以是螺孔,但本新型創作不限於此。In an embodiment, the embedded hole 110 may be a screw hole, but the invention is not limited to this.

在本實施例中,嵌孔110可以包括第一嵌孔111及第二嵌孔112。第一嵌孔111的孔徑可以大於第二嵌孔112的孔徑,但本新型創作不限於此。另外,為求清楚表示,如圖1中並未一一標示所有的第一嵌孔111及第二嵌孔112。In this embodiment, the embedded hole 110 may include a first embedded hole 111 and a second embedded hole 112. The diameter of the first recessed hole 111 may be larger than the diameter of the second recessed hole 112, but the invention is not limited to this. In addition, for clarity, not all the first insertion holes 111 and the second insertion holes 112 are indicated one by one in FIG. 1.

在本實施例中,在頂面101或底面102的法線方向(即,垂直於頂面101或底面102的一方向)上,嵌孔110基本上不重疊於溝槽120。In this embodiment, in the normal direction of the top surface 101 or the bottom surface 102 (ie, a direction perpendicular to the top surface 101 or the bottom surface 102), the recessed hole 110 does not substantially overlap the groove 120.

在本實施例中,研磨環100的頂面101上可以具有環型溝130,但本新型創作不限於此。嵌孔110可以位於環型溝130所圍繞的範圍內。In this embodiment, the top surface 101 of the grinding ring 100 may have an annular groove 130, but the invention is not limited to this. The insertion hole 110 may be located in a range surrounded by the annular groove 130.

研磨環100包括環體140以及耐磨層150。耐磨層150覆蓋環體140。The grinding ring 100 includes a ring body 140 and a wear-resistant layer 150. The wear-resistant layer 150 covers the ring body 140.

在本實施例中,環體140的材質包括金屬。在一實施例中,環體140的材質為鋁。In this embodiment, the material of the ring body 140 includes metal. In one embodiment, the material of the ring body 140 is aluminum.

在本實施例中,耐磨層150包括本徵碳膜(Intrinsic Carbon Film;ICF)。如此一來,若耐磨層150經由多次地研磨而有耗損,可以藉由鍍覆(coating)的方式再製,而可以達到再生及/或重複利用的目的。In this embodiment, the wear-resistant layer 150 includes an intrinsic carbon film (Intrinsic Carbon Film; ICF). In this way, if the wear-resistant layer 150 is worn out after multiple grindings, it can be reproduced by coating to achieve the purpose of regeneration and/or reuse.

在本實施例中,耐磨層150至少位於研磨環100的底面102。也就是說,研磨環100的底面102可以是耐磨層150的至少一部分。In this embodiment, the wear-resistant layer 150 is at least located on the bottom surface 102 of the grinding ring 100. In other words, the bottom surface 102 of the grinding ring 100 may be at least a part of the wear-resistant layer 150.

在本實施例中,耐磨層150完全地覆蓋環體140,但本新型創作不限於此。In this embodiment, the wear-resistant layer 150 completely covers the ring body 140, but the invention is not limited to this.

在本實施例中,耐磨層150的表面粗糙度小於或等於0.03微米(micrometer;µm)。相較於氮化鈦(TiN)膜層或其他藉由濺鍍法(如:非平衡磁控濺鍍(Unbalanced Magnetron Sputtering),但不限)所形成的膜層,由本徵碳膜所形成的耐磨層150的表面粗糙度較小。In this embodiment, the surface roughness of the wear-resistant layer 150 is less than or equal to 0.03 microns (micrometer; µm). Compared to titanium nitride (TiN) films or other films formed by sputtering methods (such as Unbalanced Magnetron Sputtering, but not limited), those formed by intrinsic carbon films The surface roughness of the wear-resistant layer 150 is relatively small.

在一實施例中,耐磨層150的表面粗糙度可以是針對研磨環100的底面102處進行量測。另外,可以藉由原子顯微儀(atomic force microscope;AFM)進行表面粗糙度的量測,但本新型創作不限於此。In an embodiment, the surface roughness of the wear-resistant layer 150 may be measured at the bottom surface 102 of the grinding ring 100. In addition, the surface roughness can be measured by an atomic force microscope (AFM), but the invention is not limited to this.

在本實施例中,耐磨層150的維氏硬度(HV)介於1500至2500。如此一來,可以提升研磨環100的使用壽命。In this embodiment, the Vickers hardness (HV) of the wear-resistant layer 150 is between 1500 and 2500. In this way, the service life of the grinding ring 100 can be increased.

在本實施例中,耐磨層150的摩擦係數介於0.1至0.25。摩擦係數例如可以藉由常用的標準(如:ASTM G99標準,但不限)之銷對盤(pin-on-disk)磨耗試法進行試驗。In this embodiment, the friction coefficient of the wear-resistant layer 150 is between 0.1 and 0.25. The friction coefficient can be tested by the pin-on-disk abrasion test method of commonly used standards (such as ASTM G99 standard, but not limited), for example.

在本實施例中,耐磨層150的厚度151介於0.1至0.3微米。In this embodiment, the thickness 151 of the wear-resistant layer 150 is between 0.1 and 0.3 microns.

綜上所述,本新型創作的研磨環可以具有較佳的抗磨耗、較長的使用壽命、應用上可以提昇製程穩定度。並且,研磨環可以進行再製而可以降低使用成本。In summary, the grinding ring created by the new invention can have better abrasion resistance, longer service life, and improved process stability in application. In addition, the grinding ring can be remanufactured and the use cost can be reduced.

100:研磨環 101:頂面 102:底面 103:內側面 104:外側面 110:嵌孔 111:第一嵌孔 112:第二嵌孔 120:溝槽 123:凹陷 130:環型溝 140:環體 150:耐磨層 151:厚度 C、D:區域 100: Grinding ring 101: top surface 102: Bottom 103: inside 104: Outer side 110: recessed hole 111: first recessed hole 112: second recessed hole 120: groove 123: sunken 130: Ring groove 140: ring body 150: wear layer 151: Thickness C, D: area

圖1是依照本新型創作的一實施例的一種研磨環的頂視示意圖。 圖2是依照本新型創作的一實施例的一種研磨環的底視示意圖。 圖3是依照本新型創作的一實施例的一種研磨環的部分底視示意圖。 圖4是依照本新型創作的一實施例的一種研磨環的斷面示意圖。 圖5是依照本新型創作的一實施例的一種研磨環的斷面示意圖。 圖6是依照本新型創作的一實施例的一種研磨環的斷面示意圖。 Fig. 1 is a schematic top view of a grinding ring according to an embodiment of the invention. Fig. 2 is a schematic bottom view of a grinding ring according to an embodiment of the invention. Fig. 3 is a schematic partial bottom view of a grinding ring according to an embodiment of the invention. Fig. 4 is a schematic cross-sectional view of a grinding ring according to an embodiment of the invention. Fig. 5 is a schematic cross-sectional view of a grinding ring according to an embodiment of the invention. Fig. 6 is a schematic cross-sectional view of a grinding ring according to an embodiment of the invention.

100:研磨環 100: Grinding ring

101:頂面 101: top surface

103:內側面 103: inside

104:外側面 104: Outer side

110:嵌孔 110: recessed hole

111:第一嵌孔 111: first recessed hole

112:第二嵌孔 112: second recessed hole

130:環型溝 130: Ring groove

Claims (10)

一種研磨環,具有一頂面、一底面及一內側面,該內側面位於該頂面與該底面之間,該內側面垂直於該頂面或該底面以適於固定一晶圓,且該研磨環包括: 一環體;以及 一耐磨層,覆蓋該環體。 A grinding ring has a top surface, a bottom surface and an inner side surface, the inner side surface is located between the top surface and the bottom surface, the inner side surface is perpendicular to the top surface or the bottom surface so as to be suitable for fixing a wafer, and the Grinding ring includes: A ring body; and A wear-resistant layer covers the ring body. 如請求項1所述的研磨環,其中該環體的材質包括鋁。The grinding ring according to claim 1, wherein the material of the ring body includes aluminum. 如請求項1所述的研磨環,其中該耐磨層包括本徵碳膜(intrinsic carbon film)。The grinding ring according to claim 1, wherein the wear-resistant layer includes an intrinsic carbon film. 如請求項1所述的研磨環,其中該耐磨層至少位於該研磨環的該底面。The grinding ring according to claim 1, wherein the wear-resistant layer is located at least on the bottom surface of the grinding ring. 如請求項4所述的研磨環,其中該耐磨層完全覆蓋該環體。The grinding ring according to claim 4, wherein the wear-resistant layer completely covers the ring body. 如請求項1所述的研磨環,其中該耐磨層的表面粗糙度小於或等於0.03微米。The grinding ring according to claim 1, wherein the surface roughness of the wear-resistant layer is less than or equal to 0.03 microns. 如請求項1所述的研磨環,其中該耐磨層的維氏硬度介於1500至2500。The grinding ring according to claim 1, wherein the Vickers hardness of the wear-resistant layer is between 1500 and 2500. 如請求項1所述的研磨環,其中該耐磨層的摩擦係數介於0.1至0.25。The grinding ring according to claim 1, wherein the friction coefficient of the wear-resistant layer is between 0.1 and 0.25. 如請求項1所述的研磨環,其中該耐磨層的厚度介於0.1至0.3微米。The grinding ring according to claim 1, wherein the thickness of the wear-resistant layer is between 0.1 and 0.3 microns. 如請求項1所述的研磨環,更具有: 多個溝槽,位於該底面;以及 多個嵌孔,位於該頂面。 The grinding ring as described in claim 1, further having: A plurality of grooves located on the bottom surface; and A plurality of embedded holes are located on the top surface.
TW110202824U 2021-03-17 2021-03-17 Retainer ring TWM613699U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115609498A (en) * 2022-10-24 2023-01-17 石英俊 A rare earth polishing disc with small cutting particle size and high polishing efficiency

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115609498A (en) * 2022-10-24 2023-01-17 石英俊 A rare earth polishing disc with small cutting particle size and high polishing efficiency

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