TWM607872U - Imaging device for surface inspection - Google Patents

Abstract

This creation discloses a surface inspection imaging device, which includes a workbench, two camera devices and two light-emitting modules. The workbench is used to carry the workpiece to be inspected with a curved surface and a smooth surface. The two camera devices are arranged relative to the workpiece to be inspected, and the imaging axes of the two camera devices are perpendicular to each other. Each camera device has a telecentric lens and an image capturing unit located on the imaging surface of the telecentric lens. Each light-emitting module has a beam splitter and a light-emitting unit; the beam splitter is between the workpiece to be inspected and the telecentric lens; the light-emitting unit irradiates an irradiating light to the beam splitter, which forms a parallel light through the beam splitter and irradiates the workpiece to be inspected. Wherein, each image capturing unit uses parallel rays to capture the first image and the second image corresponding to the workpiece to be inspected.

Description

Imaging device for surface inspection

This creation is related to the technical field of an imaging device, in particular to a surface inspection imaging device used to inspect surface defects.

Modern production equipment can produce products at very high speeds. Of course, the requirements for the appearance of the product have also increased. The abnormal appearance of the product itself is a reason for the return of the product. In addition, the abnormal appearance can show potential defects in the product structure, which is another reason for the product being returned.

In recent years, the way of inspection has gradually changed from manual inspection to automated inspection, which can reduce human eye errors due to problems such as different standards or fatigue. Among them, the optical inspection method is the most accurate in automated inspection, and it will not damage the surface of the target. Therefore, how to use optical inspection in automated inspection to make it possible to inspect components quickly and accurately is a goal that technicians in the field are striving for.

In summary, the creator of this creation has designed a surface inspection imaging device to improve on the shortcomings of the existing technology, thereby enhancing the industrial application.

In view of the above-mentioned conventional technology problems, the purpose of this creation is to provide a surface inspection imaging device to improve the above-mentioned conventional technology problems.

Based on the above objective, the author provides an imaging device for surface inspection, which includes a workbench, a first camera device, a first light-emitting module, a second camera device, and a second light-emitting module. The workbench is used to carry the workpiece to be inspected, the workpiece to be inspected has a curved surface, and the surface of the workpiece to be inspected is a smooth surface. The first camera device is arranged relative to the workpiece to be inspected, and the first camera device has a first telecentric lens and a first image capturing unit; the first image capturing unit is located on the imaging surface of the first telecentric lens Above, the first telecentric lens has a first imaging axis, and the first imaging axis is aligned with the workpiece to be inspected. The first light-emitting module has a first beam splitter and a first light-emitting unit; the first beam splitter is a semi-transmissive half-reflecting mirror, and the first beam splitter is located on the first imaging axis and between the to-be-inspected Between the workpiece and the first telecentric lens; the first light-emitting unit is located on one side of the first imaging axis, the first light-emitting unit irradiates the first beam splitter with the first irradiation light; the first irradiation light passes through The first beam splitter forms a first parallel light, and the first parallel light irradiates the workpiece to be inspected. The second camera device is arranged relative to the workpiece to be inspected, and the second camera device has a second telecentric lens and a second image capturing unit; the second image capturing unit is located on the imaging surface of the second telecentric lens Above, the second telecentric lens has a second imaging axis, the second imaging axis is perpendicular to the first imaging axis, and the second imaging axis is aligned with the workpiece to be inspected. The second light-emitting module has a second beam splitter and a second light-emitting unit; the second beam splitter is a semi-transmissive half-reflecting mirror, and the second beam splitter is located on the second imaging axis and between the to-be-inspected Between the workpiece and the second telecentric lens; the second light-emitting unit is located on one side of the second imaging axis, and the second light-emitting unit irradiates the second illuminating light to the second beam splitter; the second illuminating light passes through The second beam splitter forms a second parallel light system and the second parallel light irradiates the workpiece to be inspected. Wherein, the first image capturing unit uses the first parallel light to capture the first image corresponding to the workpiece to be inspected; the second image capturing unit uses the second parallel light to capture the first image corresponding to the The second image of the workpiece to be inspected.

Preferably, the first camera device and the second camera device capture the curved surface to generate the first image and the second image, respectively.

Preferably, it further comprises a mobile module, the mobile module is arranged on the worktable, and the mobile module makes the workpiece to be inspected rotate or move.

Preferably, it further comprises a vertical displacement module, the vertical displacement module is arranged on the workbench, the first camera device and the first light emitting module are arranged on the vertical displacement module, the vertical displacement module is Drive the first camera device and the first light-emitting module to shift in a vertical direction.

Preferably, it further includes a lateral displacement module, the lateral displacement module is arranged on the workbench, the second camera device and the second light-emitting module are arranged on the lateral displacement module, the lateral displacement module is Drive the second camera device and the second light-emitting module to shift in the lateral direction.

Preferably, it further includes a processing module that is electrically connected to the first camera device and the second camera device, and receives the first image and the second image, and based on the first image or the second image The second image determines whether the workpiece to be inspected is qualified or unqualified.

Preferably, it further comprises a control module which is electrically connected to the first light-emitting unit and the second light-emitting unit, and the control module controls the brightness of the first irradiated light of the first light-emitting unit and The brightness of the second irradiated light of the second light-emitting unit.

The lens of the imaging device for surface inspection in this creation uses a telecentric lens, and uses a beam splitter to reflect the illuminating light into parallel rays for imaging. Because the surface of the workpiece to be inspected is a curved surface, there are roughly three areas in the image, such as the overexposed or underexposed two areas on both sides of the normally exposed area and the normally exposed area, while the normal exposure The area is the area to be inspected. In this way, in the subsequent procedure, it is convenient to extract the normally exposed area for inspection. In addition, the surface inspection imaging device of this invention can simultaneously inspect two areas of the workpiece to be inspected, thereby improving inspection efficiency.

The technical features of this creation will be explained in detail below with specific embodiments and accompanying drawings, so that those with ordinary knowledge in the technical field can easily understand the purpose, technical features, and advantages of this creation.

In order to facilitate the understanding of the technical features, content and advantages of this creation and its achievable effects, this creation is combined with the accompanying drawings, and is described in detail in the form of embodiments as follows, and the schematics used therein are only In order to illustrate and supplement the manual, it may not be the true proportions and precise configuration after the implementation of this creation. Therefore, the proportion and configuration relationship of the attached drawings should not be interpreted, and the scope of rights of the creation in actual implementation should not be interpreted. Narrate.

It should be noted that when an element is referred to as being "connected to", "installed in" or "installed in" another element, it can be directly connected or set to another element, or a centered element may exist at the same time. In addition, if the terms "first", "second", and "third" are used for descriptive purposes only, they cannot be understood as indicating or implying relative importance or its sequence or directional relationship.

Hereinafter, the imaging device for surface inspection created according to the present invention will be described with reference to related drawings. For ease of understanding, the same elements in the following embodiments are indicated by the same symbols.

Please refer to Figures 1 to 4. Figure 1 is a schematic structural diagram of the first embodiment of the created surface inspection imaging device. Figure 2 is a schematic diagram of the structure of the first camera device and the first light-emitting module of the first embodiment of the created surface inspection imaging device. Figure 3 is a block diagram of the first embodiment of the created surface inspection imaging device. Figure 4 is a schematic diagram of the first image of the first embodiment of the created surface inspection imaging device.

As shown in the figure, a surface inspection imaging device 1 created by the present invention includes a workbench 10, a first camera device 20, a first light-emitting module 30, a second camera device 40, and a second light-emitting module 50. The imaging device 1 for surface inspection is used to inspect the surface of a product or component with a bright and smooth surface. Among them, the workpiece 9 to be inspected has a curved surface 91, and the surface of the workpiece 9 to be inspected is a smooth surface. For example, the workpiece 9 to be inspected may be a tubular or barrel-shaped element, and its appearance is electroplated to have a bright and smooth surface. Among them, the workpiece 9 to be inspected is whether there are scratches, foreign objects, stains, etc. on the inspected surface. Among them, the workbench 10 is used to carry the workpiece 9 to be inspected, so that the workpiece 9 to be inspected can be inspected stably.

The first camera device 20 is disposed relative to the workpiece 9 to be inspected, and the first camera device 20 has a first telecentric lens 21 and a first image capturing unit 22. The telecentric lens has the advantages of low distortion, will not change the image size with the change of the object distance, can reduce the magnification error rate and increase the measured depth of field, and maintain the image clarity and accurate screening of defects. The first image capturing unit 22 is located on the imaging surface of the first telecentric lens 21, and the first telecentric lens 21 has a first imaging axis 211. Moreover, the first imaging axis 211 is aligned with the workpiece 9 to be inspected. In particular, the first imaging axis 211 is aligned with the surface to be inspected of the workpiece 9 to be inspected, such as a curved surface, that is, the first imaging device 20 captures the curved surface 91 to generate the first image 221.

The first light-emitting module 30 has a first beam splitter 31 and a first light-emitting unit 32. Wherein, the first beam splitter 31 is located on the first imaging axis 211 and between the workpiece 9 to be inspected and the first telecentric lens 21, and the first light-emitting unit 32 is located on the first imaging axis 211 On one side, the first light-emitting unit 32 irradiates the first light beam 321 to the first beam splitter 31. Since the first beam splitter 31 is a semi-transmissive half mirror, the first camera device 20 can capture an image of the workpiece 9 to be inspected, and the first irradiated light 321 of the first light-emitting unit 32 can pass through the first beam splitter The reflection of 31 forms a first parallel light 311 irradiating the workpiece 9 to be inspected.

Similarly, the second camera device 40 is disposed relative to the workpiece 9 to be inspected, and the second camera device 40 has a second telecentric lens 41 and a second image capturing unit 42. The second image capturing unit 42 is located on the imaging surface of the second telecentric lens 41, and the second telecentric lens 41 has a second imaging axis 411. Wherein, the second imaging axis 411 is perpendicular to the first imaging axis 211, and the second imaging axis 411 is aligned with the workpiece 9 to be inspected. In particular, the second imaging axis 411 is aligned with the surface to be inspected of the workpiece 9 to be inspected, such as a curved surface, that is, the second camera device 40 captures the curved surface 91 to generate the second image 421.

The second light-emitting module 50 has a second beam splitter 51 and a second light-emitting unit 52. Wherein, the second beam splitter 51 is located on the second imaging axis 411 and between the workpiece 9 to be inspected and the second telecentric lens 41, and the second light emitting unit 52 is located on the second imaging axis 411 On one side, the second light-emitting unit 52 irradiates the second light beam 521 to the second beam splitter 51. Since the second beam splitter 51 is a semi-transmissive half mirror, the second camera device 40 can capture an image of the workpiece 9 to be inspected, and the second irradiated light 521 from the second light-emitting unit 52 passes through the second beam splitter 51 Reflected by, forms a second parallel light 511 irradiating the workpiece 9 to be inspected.

Incidentally, there may be an included angle between the first beam splitter 31 and the first imaging axis 211 and between the second beam splitter 51 and the second imaging axis 411, and preferably, the included angle may be 45 degrees.

With the above, the first image capturing unit 22 can use the first parallel light 311 to capture the first image 221 corresponding to the workpiece 9 to be inspected, and the second image capturing unit 42 can use the second The parallel rays 511 are used to capture the second image 421 corresponding to the workpiece 9 to be inspected.

The lenses of the first camera device 20 and the second camera device 40 of the present invention use a telecentric lens, and a beam splitter is used to reflect the irradiated light into parallel rays for imaging. Since the surface to be inspected of the workpiece 9 to be inspected is a curved surface, roughly three areas are formed in the first image 221 and the second image 421, such as overexposure or overexposure on both sides of the normally exposed area and the normally exposed area The two insufficient areas, and the normal exposure area is the area to be inspected, as shown in Figure 4. In this way, in the subsequent procedure, it is convenient to extract the normally exposed area for inspection.

On the other hand, the imaging device 1 for surface inspection of the present invention further includes a moving module 61, which is arranged on the worktable 10, and the moving module 61 can rotate or move the workpiece 9 to be inspected. . Since the imaging device 1 for surface inspection created by this invention can only capture images of a partial area of the workpiece 9 to be inspected each time, the moving module 61 can drive the workpiece 9 to be inspected to rotate or move to adjust the capture The area of the workpiece 9 to be inspected. Among them, the mobile module can be, for example, a motor, a ball screw, a gear, a rack, or a combination thereof, which is a technology well known to those with ordinary knowledge in the relevant technical field, and will not be repeated here.

In another aspect, the imaging device 1 for surface inspection of the present invention further includes a vertical displacement module 62 and a lateral displacement module 63. The vertical displacement module 62 is arranged on the workbench 10, the first camera device 20 and the first light emitting module 30 are arranged on the vertical displacement module 62, and the vertical displacement module 62 drives the first camera The device 20 and the first light-emitting module 30 are displaced in the vertical direction. The lateral displacement module 63 is arranged on the workbench 10, the second camera device 40 and the second light-emitting module 50 are arranged on the lateral displacement module 63, and the lateral displacement module 63 drives the second camera The device 40 and the second light-emitting module 50 are displaced in the lateral direction.

Among them, the vertical displacement module 62 and the lateral displacement module 63 can be similar to the combination of a ball nut, a screw and a motor, and the camera device can be arranged on the ball nut to be driven and displaced. The technologies that are generally well known to knowledgeable persons will not be repeated here.

Please refer to FIG. 5, which is a block diagram of the second embodiment of the created surface inspection imaging device. In this embodiment, the operation and configuration of the components with the same reference symbols are the same as or similar to those in the previous embodiment, and the same or similar parts to the previous embodiment will not be repeated here. As shown in the figure, in this embodiment, the imaging device 1 for surface inspection of the present invention further includes a processing module 71 and a control module 72.

Wherein, the processing module 71 is electrically connected to the first camera device 20 and the second camera device 40, and receives the first image 221 and the second image 421, and according to the first image 221 or the second image The image 421 determines whether the workpiece 9 to be inspected is qualified or unqualified. For example, as shown in FIG. 6, the first image 221 is qualified and the second image 421 is unqualified. For example, the processing module 71 can use image recognition technology to identify predetermined features, such as scratches, nail marks, and uneven features from the first image 221 or the second image 421, and then determine whether the workpiece 9 to be inspected is Pass or fail.

In addition, the control module 72 is electrically connected to the first light-emitting unit 32 and the second light-emitting unit 52, and the control module 72 controls the brightness of the first irradiated light 321 of the first light-emitting unit 32 and the second light-emitting unit 52. The brightness of the second illuminating light 521 of the two light-emitting units 52. In other words, by controlling the first light-emitting unit 32 and the second light-emitting unit 52 of the control module 72, the brightness of the light source can be adjusted according to conditions such as the color depth of the workpiece 9 to be inspected, so that the inspection can be performed more effectively.

The above description is only illustrative, and not restrictive. Any equivalent modifications or changes made without departing from the spirit and scope of this creation shall be included in the scope of the attached patent application.

1: Imaging device for surface inspection 10: Workbench 20: The first camera 21: The first telecentric lens 211: The first imaging axis 22: The first image capture unit 221: First Image 30: The first light-emitting module 31: The first beam splitter 311: The first parallel ray 32: The first light-emitting unit 321: The first illuminating light 40: Second camera device 41: second telecentric lens 411: Second imaging axis 42: The second image capture unit 421: second image 50: The second light-emitting module 51: second beam splitter 511: second parallel ray 52: The second light-emitting unit 521: second illuminating light 61: mobile module 62: Vertical displacement module 63: Lateral displacement module 71: Processing Module 72: control module 9: Workpiece to be inspected 91: curved surface

In order to more clearly illustrate the technical solution of the creative embodiment, the following will briefly introduce the drawings that need to be used in the description of the creative embodiment. Obviously, the drawings described below are only some embodiments of the creative. Those with ordinary knowledge in the technical field can also obtain other drawings based on these drawings. Figure 1 is a schematic structural diagram of the first embodiment of the created surface inspection imaging device. Figure 2 is a schematic diagram of the structure of the first camera device and the first light-emitting module of the first embodiment of the created surface inspection imaging device. Figure 3 is a block diagram of the first embodiment of the created surface inspection imaging device. Figure 4 is a schematic diagram of the first image of the first embodiment of the created surface inspection imaging device. Figure 5 is a block diagram of the second embodiment of the created surface inspection imaging device. Figure 6 is a schematic diagram of the application of the second embodiment of the created surface inspection imaging device.

1: Imaging device for surface inspection

10: Workbench

20: The first camera

21: The first telecentric lens

22: The first image capture unit

30: The first light-emitting module

32: The first light-emitting unit

40: Second camera device

41: second telecentric lens

42: The second image capture unit

50: The second light-emitting module

51: second beam splitter

52: The second light-emitting unit

61: mobile module

62: Vertical displacement module

63: Lateral displacement module

9: Workpiece to be inspected

91: curved surface

Claims (7)

An imaging device for surface inspection, which comprises: A worktable for carrying a workpiece to be inspected, the workpiece to be inspected has a curved surface, and the surface of the workpiece to be inspected is a smooth surface; A first camera device is set relative to the workpiece to be inspected, and the first camera device has a first telecentric lens and a first image capturing unit, and the first image capturing unit is located at the first telecentric lens. On the imaging surface of the lens, the first telecentric lens has a first imaging axis, and the first imaging axis is aligned with the workpiece to be inspected; A first light-emitting module has a first beam splitter and a first light-emitting unit. The first beam splitter is a semi-transmissive half-reflective mirror. The first beam splitter is located on the first imaging axis and intervenes. Between the workpiece to be inspected and the first telecentric lens, the first light-emitting unit is located on one side of the first imaging axis, and the first light-emitting unit irradiates a first irradiation light to the first beam splitter, and the second An irradiating ray forms a first parallel ray through the first beam splitter, and the first parallel ray irradiates the workpiece to be inspected; A second camera device is arranged relative to the workpiece to be inspected, and the second camera device has a second telecentric lens and a second image capturing unit, the second image capturing unit is located at the second telecentric lens On the imaging surface of the lens, the second telecentric lens has a second imaging axis, and the second imaging axis is perpendicular to the first imaging axis, and the second imaging axis is aligned with the workpiece to be inspected; A second light-emitting module has a second beam splitter and a second light-emitting unit, the second beam splitter is a half-transmitting half-reflecting mirror, and the second beam splitter is located on the second imaging axis and intervenes Between the workpiece to be inspected and the second telecentric lens, the second light-emitting unit is located on one side of the second imaging axis, and the second light-emitting unit irradiates a second irradiation light to the second beam splitter. Two irradiating light rays form a second parallel light ray through the second beam splitter, and the second parallel light ray irradiates the workpiece to be inspected; Wherein, the first image capturing unit uses the first parallel light to capture a first image corresponding to the workpiece to be inspected, and the second image capturing unit uses the second parallel light to capture a first image corresponding to A second image of the workpiece to be inspected. The imaging device for surface inspection according to claim 1, wherein the first camera device and the second camera device capture the curved surface to generate the first image and the second image. The imaging device for surface inspection according to claim 1, which further includes a mobile module, the mobile module is arranged on the worktable, and the mobile module rotates or moves the workpiece to be inspected. The imaging device for surface inspection according to claim 1, which further includes a vertical displacement module, the vertical displacement module is arranged on the workbench, the first camera device and the first light-emitting module are arranged on the The vertical displacement module drives the first camera device and the first light-emitting module to move in a vertical direction. The imaging device for surface inspection according to claim 1, which further includes a lateral displacement module, the lateral displacement module is arranged on the workbench, the second camera device and the second light-emitting module are arranged on the The lateral displacement module drives the second camera device and the second light-emitting module to shift in the lateral direction. The imaging device for surface inspection according to claim 1, which further includes a processing module electrically connected to the first camera device and the second camera device, and receives the first image and the first image Two images, and judging whether the workpiece to be inspected is qualified or unqualified according to the first image or the second image. The imaging device for surface inspection according to claim 1, which further includes a control module electrically connected to the first light-emitting unit and the second light-emitting unit, and the control module controls the first light-emitting unit and the second light-emitting unit. The brightness of the first illuminating light of the light-emitting unit and the brightness of the second illuminating light of the second light-emitting unit.

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