TWM606860U - Roasting and detection system - Google Patents

Roasting and detection system Download PDF

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Publication number
TWM606860U
TWM606860U TW109212729U TW109212729U TWM606860U TW M606860 U TWM606860 U TW M606860U TW 109212729 U TW109212729 U TW 109212729U TW 109212729 U TW109212729 U TW 109212729U TW M606860 U TWM606860 U TW M606860U
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Taiwan
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opening
baking
outer cylinder
inner cylinder
detection
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TW109212729U
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Chinese (zh)
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王潮鴻
莊少鈞
黃建智
張欽宏
朱燕華
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財團法人食品工業發展研究所
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Priority to TW109212729U priority Critical patent/TWM606860U/en
Publication of TWM606860U publication Critical patent/TWM606860U/en

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Abstract

The present invention discloses a roasting and detection system. The system includes a roasting device and a detection device. The roasting device includes a hollow inner roller and a hollow outer roller. The inner roller is configured to rotate along a first route and around an axis by a first external force. The inner roller includes a fist annular wall forming an accommodation room and having a first aperture communicating with the accommodation room. The outer roller is disposed outside at least a part of the inner roller and configured to move between a first position and a second position by a second external force. The outer roller has a second aperture. The detection device is disposed adjacent to the roasting device and has a receiving aperture corresponding to the second aperture when the outer roller is at the second position. The first aperture during the rotation along the first route at least aligns with the second aperture when the outer roller is at the first position and the second position.

Description

烘焙及檢測系統Baking and inspection system

本創作係關於一種烘焙及檢測系統,尤其是關於一種咖啡豆烘焙及檢測系統。This creation is about a roasting and inspection system, especially a coffee bean roasting and inspection system.

根據統計,國人一年可消費28.5億杯咖啡,使我國咖啡飲料年產值已達750億元。從近年來各咖啡館如雨後春筍般出現在大街小巷的現象,足以顯示人們對於咖啡需求增高的同時,品質也是不可或缺的因素之一。換言之,人們的喜好已從一般便利商店可以購得的罐裝咖啡,提高為期待一杯從咖啡館精心手工沖泡的高品質現煮咖啡。然而,沖泡出一杯出色的咖啡,咖啡豆本身及其烘焙方式乃是最重要的關鍵所在。According to statistics, Chinese people can consume 2.85 billion cups of coffee a year, making my country's coffee beverages annual output value of 75 billion yuan. The phenomenon that cafes have sprung up in the streets and alleys in recent years is enough to show that while people's demand for coffee is increasing, quality is also one of the indispensable factors. In other words, people's preference has been improved from the canned coffee available from general convenience stores to the expectation of a cup of high-quality freshly brewed coffee carefully brewed by hand from a cafe. However, to brew a great cup of coffee, the coffee beans themselves and how they are roasted are the most important key.

在一般烘焙咖啡豆的過程中,習知設備僅可記錄其火力、風速、風溫、鍋爐轉速、溫差及濕度,作為決定烘焙時間的依據。在一般的烘焙作法中,係使用一探豆棒將少量咖啡豆取出,肉眼觀察其顏色,或是根據烘焙時的爆音或聞其味道,以經驗判斷烘焙是否完成。然而,這種採用經驗法則來判斷咖啡豆烘焙的方式過於主觀,無法運用科學量化的方式進行檢測和評斷。再者,這種傳統作法需要有經驗的咖啡豆烘焙師來操作,進而使成本過高,不符大眾大量的需求。In the process of general roasting coffee beans, the conventional equipment can only record its firepower, wind speed, wind temperature, boiler speed, temperature difference and humidity as the basis for determining the roasting time. In general roasting practices, a small amount of coffee beans are taken out with a bean stick, and the color is observed with the naked eye, or the roasting is judged by experience based on the popping sound or smell during roasting. However, this method of judging coffee beans roasting by using empirical rules is too subjective and cannot be detected and judged by scientific and quantitative methods. Moreover, this traditional method requires an experienced coffee bean roaster to operate it, which makes the cost too high and does not meet the mass demand of the public.

是以,提供一種烘焙及檢測系統,以對一農業作物進行全自動之烘焙及檢測,乃是業界所需。Therefore, it is necessary for the industry to provide a baking and inspection system for fully automatic baking and inspection of an agricultural crop.

緣是,本創作提供一種烘焙及檢測系統,以對一待測物件進行自動烘焙及檢測。The reason is that this creation provides a baking and inspection system to automatically bake and inspect an object to be tested.

本創作之一第一態樣揭露一種烘焙及檢測系統,包括:一烘焙裝置及一檢測裝置。烘焙裝置包括一中空內筒及一中空外筒。內筒可受一第一外力而沿一第一路徑繞一軸心旋轉,內筒包含一第一環形壁,第一環形壁內形成一容置空間且具有一第一開孔與容置空間相連通。外筒設置於內筒之至少一部分外,並可受一第二外力而至少於一第一位置及一第二位置間移動,外筒具有一第二開孔。檢測裝置鄰近於烘焙裝置設置,且具有一接收口,接收口對應於外筒於第二位置時之第二開孔。其中第一開孔於第一路徑旋轉時係至少與外筒於第一位置及第二位置時之第二開孔對齊。A first aspect of this creation discloses a baking and detection system, which includes: a baking device and a detection device. The baking device includes a hollow inner tube and a hollow outer tube. The inner cylinder can be subjected to a first external force to rotate around an axis along a first path. The inner cylinder includes a first annular wall. The first annular wall forms an accommodating space and has a first opening and a container. The space is connected. The outer cylinder is arranged outside at least a part of the inner cylinder and can be moved at least between a first position and a second position by a second external force. The outer cylinder has a second opening. The detection device is arranged adjacent to the baking device and has a receiving opening corresponding to the second opening when the outer cylinder is in the second position. The first opening is at least aligned with the second opening when the outer cylinder is in the first position and the second position when the first path rotates.

本創作之一第二態樣揭露一種烘焙及檢測系統,包括:一烘焙裝置及一檢測裝置。烘焙裝置包括一中空內筒及一中空外筒。內筒可受一第一外力而沿一第一路徑繞一軸心旋轉,內筒包含一第一環形壁,第一環形壁內形成一容置空間且具有一第一開孔,第一開孔與容置空間相連通。外筒設置於內筒之至少一部分外,並可受一第二外力而移動,外筒具有一第二開孔、一第三開孔、一蓋體及一閘門,蓋體及閘門分別以移動的方式開啟或關閉第二開孔及第三開孔,且第一開孔於第一路徑移動時對齊於第二開孔或第三開孔。檢測裝置鄰近於烘焙裝置設置,且具有一接收口,接收口對應於第三開口。A second aspect of this creation discloses a baking and detection system, including: a baking device and a detection device. The baking device includes a hollow inner tube and a hollow outer tube. The inner cylinder can be subjected to a first external force to rotate along a first path around an axis. The inner cylinder includes a first annular wall. The first annular wall forms an accommodating space and has a first opening. An opening communicates with the accommodating space. The outer cylinder is arranged outside at least a part of the inner cylinder and can be moved by a second external force. The outer cylinder has a second opening, a third opening, a cover and a gate. The cover and the gate can move separately The second opening and the third opening are opened or closed in a way, and the first opening is aligned with the second opening or the third opening when the first path moves. The detection device is arranged adjacent to the baking device and has a receiving opening, which corresponds to the third opening.

為更清楚了解本創作之特徵、內容與優點及其所能達成之功效,茲將本創作配合附圖,並以實施例之表達形式詳細說明如下,而其中所使用之圖式,其主旨僅為示意及輔助說明書之用,故不應就所附之圖式的比例與配置關係解讀、侷限本創作的申請專利範圍。In order to have a clearer understanding of the features, content and advantages of this creation and its achievable effects, this creation is combined with drawings, and detailed descriptions are given in the form of embodiments as follows, and the schematics used therein are only For the purpose of illustration and supplementary description, it should not be interpreted as to limit the scope of patent application for this creation on the basis of the proportion and configuration relationship of the attached drawings.

本創作揭露一種烘焙及檢測系統,其可採用全自動的方式對於一農業作物進行烘焙及檢測。舉例來說,農業作物可以是咖啡豆。在本創作中,操作者可事先設定咖啡豆之烘焙程度及香氣風味,以烘焙出客製化之咖啡豆。烘焙程度例如是深烘焙、中烘焙或低烘焙。烘焙程度的差異可經由設定而區分。在本創作其他實施例中,烘焙及檢測系統亦可應用於其他物件,例如其他需要烘焙或烘烤之農作物。This creation discloses a roasting and inspection system that can roast and inspect an agricultural crop in a fully automatic manner. For example, the agricultural crop can be coffee beans. In this creation, the operator can set the roasting degree and aroma of coffee beans in advance to roast customized coffee beans. The degree of baking is, for example, deep baking, medium baking, or low baking. The difference in baking degree can be distinguished by setting. In other embodiments of the invention, the baking and detection system can also be applied to other objects, such as other crops that need to be baked or roasted.

請參照圖1及圖2,其中圖1為本創作第一實施例之烘焙及檢測系統100之立體圖,圖2為本創作圖1之烘焙及檢測系統100之側視圖。本實施例之烘焙及檢測系統100包括一烘焙裝置1、一檢測裝置2及一控制裝置3。檢測裝置2設置於烘焙裝置1旁。控制裝置3分別電性連接烘焙裝置1及檢測裝置2,以控制烘焙裝置1及檢測裝置2的運作。Please refer to FIGS. 1 and 2. FIG. 1 is a perspective view of the baking and inspection system 100 of the first embodiment of the creation, and FIG. 2 is a side view of the baking and inspection system 100 of the creation of FIG. 1. The baking and detection system 100 of this embodiment includes a baking device 1, a detection device 2 and a control device 3. The detection device 2 is arranged beside the baking device 1. The control device 3 is electrically connected to the baking device 1 and the detection device 2 respectively to control the operations of the baking device 1 and the detection device 2.

在本實施例之烘焙裝置1結構中,烘焙裝置1包括一中空內筒4及一中空外筒5,外筒5設置於內筒4之至少一部分外。更詳細來說,本實施例所揭示之外筒5係環繞於內筒4之一部分之外。此外,烘焙裝置1更包括一第一驅動裝置6及一第二驅動裝置7。第一驅動裝置6及第二驅動裝置7可分別位於內筒4之相對兩側。第一驅動裝置6耦接內筒4,以提供一第一外力至內筒4,使內筒4可受第一外力而沿一軸心A旋轉。第二驅動裝置7耦接外筒5,以提供一第二外力予外筒5,使外筒5受第二外力而相對於內筒4移動,進而使外筒5至少可位於一第一位置及一第二位置。本實施例之外筒5受第二外力而亦沿著與內筒4旋轉時相同之軸心A而圍繞著內筒4周圍旋轉。在本實施例中,外筒5圍繞著內筒4而以同向方式旋轉。然而,在其他實施例中,外筒5可圍繞著內筒4而以反向方式旋轉。另外,內筒4及外筒5之間可包含一滑軌及/或軸承結構(未繪示),以使內筒4及外筒5平穩地相對旋轉移動。In the structure of the baking device 1 of this embodiment, the baking device 1 includes a hollow inner tube 4 and a hollow outer tube 5, and the outer tube 5 is arranged outside at least a part of the inner tube 4. In more detail, the outer cylinder 5 disclosed in this embodiment surrounds a part of the inner cylinder 4. In addition, the baking device 1 further includes a first driving device 6 and a second driving device 7. The first driving device 6 and the second driving device 7 may be located on opposite sides of the inner cylinder 4 respectively. The first driving device 6 is coupled to the inner cylinder 4 to provide a first external force to the inner cylinder 4 so that the inner cylinder 4 can be rotated along an axis A by the first external force. The second driving device 7 is coupled to the outer cylinder 5 to provide a second external force to the outer cylinder 5, so that the outer cylinder 5 moves relative to the inner cylinder 4 by the second external force, so that the outer cylinder 5 can be located at least at a first position And a second position. In this embodiment, the outer cylinder 5 is subjected to a second external force and also rotates around the inner cylinder 4 along the same axis A as when the inner cylinder 4 rotates. In this embodiment, the outer cylinder 5 rotates in the same direction around the inner cylinder 4. However, in other embodiments, the outer cylinder 5 may rotate around the inner cylinder 4 in a reverse manner. In addition, a sliding rail and/or a bearing structure (not shown) may be included between the inner cylinder 4 and the outer cylinder 5 to enable the inner cylinder 4 and the outer cylinder 5 to move smoothly relative to each other.

本實施例所揭示之內筒4為圓柱形,且內筒4包含一第一環形壁40及二底蓋42。二底蓋42分別設置於第一環形壁40的相對兩端,以封閉第一環形壁40之兩端。二底蓋42的其中之一可包括可樞轉之一門(未繪示),用以將內筒4內之物件400取出(例如已烘焙完成之咖啡豆),另一底蓋42則與第一驅動裝置6之動力源機械地耦接。The inner cylinder 4 disclosed in this embodiment is cylindrical, and the inner cylinder 4 includes a first annular wall 40 and two bottom covers 42. Two bottom covers 42 are respectively disposed on opposite ends of the first annular wall 40 to close the two ends of the first annular wall 40. One of the two bottom covers 42 may include a pivotable door (not shown) for taking out the objects 400 in the inner cylinder 4 (for example, roasted coffee beans), and the other bottom cover 42 and the first The power source of a driving device 6 is mechanically coupled.

在本實施例中,外筒5亦為圓柱形,且包含一第二環形壁50、一導引柱8及一外蓋9。第二環形壁50圍繞內筒4之第一環形壁40。導引柱8係設置於第二環形壁50上,並自第二環形壁50徑向向外延伸。導引柱8為中空狀而形成一通道。外蓋9以可活動的方式樞接於導引柱8頂緣,用以啟閉導引柱8內之通道。在其他實施例中,外筒5另外可具有一鎖固件(未繪示),鎖固件可以電動或人工的方式將外蓋9固定於導引柱8上,並以電動或人工的方式解除外蓋9的固定。In this embodiment, the outer cylinder 5 is also cylindrical, and includes a second annular wall 50, a guide post 8 and an outer cover 9. The second annular wall 50 surrounds the first annular wall 40 of the inner cylinder 4. The guiding post 8 is disposed on the second annular wall 50 and extends radially outward from the second annular wall 50. The guiding column 8 is hollow to form a channel. The outer cover 9 is pivotally connected to the top edge of the guide column 8 in a movable manner for opening and closing the channel in the guide column 8. In other embodiments, the outer cylinder 5 may additionally have a locking member (not shown). The locking member can fix the outer cover 9 on the guide post 8 in an electric or manual manner, and release the outer cover 9 in an electric or manual manner. Fixing of cover 9.

另一方面,外筒5可包含至少一齒條52。齒條52可以焊接的方式環繞設置於第二環形壁50外。如圖2所示,第二驅動裝置7包括一動力源70及一齒輪72,動力源70機械地耦接齒輪72,且齒輪72嚙合齒條52。藉此,第二驅動裝置7藉由齒輪72及齒條52之間的嚙合關係而以動力源70輸出之動力驅動外筒5相對於軸心A產生一特定角度之旋轉移動。在本實施例中,第一驅動裝置6之動力源及第二驅動裝置7之動力源70均為馬達。On the other hand, the outer cylinder 5 may include at least one rack 52. The rack 52 can be arranged around the second annular wall 50 by welding. As shown in FIG. 2, the second driving device 7 includes a power source 70 and a gear 72. The power source 70 is mechanically coupled to the gear 72, and the gear 72 meshes with the rack 52. Thereby, the second driving device 7 uses the power output from the power source 70 to drive the outer cylinder 5 to rotate at a specific angle relative to the axis A through the meshing relationship between the gear 72 and the rack 52. In this embodiment, the power source of the first driving device 6 and the power source 70 of the second driving device 7 are both motors.

如圖1至圖5所示,在本實施例中,檢測裝置2包含一殼體20及一彈性遮蔽件22。殼體20具有接收口24,接收口24對應外筒5於第二位置時的導引柱8(參見圖5)。彈性遮蔽件22設置於接收口24旁,以可活動的方式遮蔽接收口24。舉例來說,彈性遮蔽件22的材質可包括矽膠。當外筒5之導引柱8移動至接收口24時,可以推動彈性遮蔽件22而使彈性遮蔽件22暫時變形,以使導引柱8進入殼體20內。當導引柱8自殼體20移出時,彈性遮蔽件22會恢復原狀(恢復成原來的位置),以遮蔽接收口24,而使殼體20內部不會暴露於外。在其他實施例中,彈性遮蔽件22亦可由人工的方式開啟,或是經由圖1所示之控制裝置3開啟。As shown in FIGS. 1 to 5, in this embodiment, the detection device 2 includes a housing 20 and an elastic shield 22. The housing 20 has a receiving opening 24 corresponding to the guiding post 8 when the outer cylinder 5 is in the second position (see FIG. 5). The elastic shielding member 22 is arranged beside the receiving opening 24 to cover the receiving opening 24 in a movable manner. For example, the material of the elastic shield 22 may include silicone. When the guide post 8 of the outer cylinder 5 moves to the receiving opening 24, the elastic shield 22 can be pushed to temporarily deform the elastic shield 22 so that the guide post 8 enters the housing 20. When the guide post 8 is removed from the housing 20, the elastic shielding member 22 will return to its original shape (return to its original position) to cover the receiving opening 24, so that the interior of the housing 20 will not be exposed to the outside. In other embodiments, the elastic shield 22 can also be opened manually or by the control device 3 shown in FIG. 1.

控制裝置3包含多個處理模組以及軟體,對資料進行運算、儲存及控制。控制裝置3上可設置儀表板30以及按鍵32,供操作者進行操作。The control device 3 includes multiple processing modules and software to perform calculation, storage and control of data. The control device 3 can be provided with a dashboard 30 and buttons 32 for the operator to operate.

另外,烘焙及檢測系統100更可包括一支架90,其用以支撐內筒4及外筒5。支架90上可以設置滾輪(未繪示),當內筒4及外筒5旋轉移動時,支架90不會隨著內筒4及外筒5旋轉。In addition, the baking and inspection system 100 may further include a bracket 90 for supporting the inner tube 4 and the outer tube 5. A roller (not shown) can be provided on the bracket 90, and when the inner tube 4 and the outer tube 5 rotate and move, the bracket 90 will not rotate with the inner tube 4 and the outer tube 5.

請參考圖3,其為本創作圖1之烘焙及檢測系統100之第一作動之局部剖面圖。內筒4之第一環形壁40內形成一容置空間44,且第一環形壁40上形成一第一開孔46,第一開孔46係與容置空間44相連通。內筒4內外亦可依需求設置若干加熱單元、風扇單元、溫度測量單元、風速測量單元等(未繪示)。加熱單元可以是火爐或是電子加熱爐,用以對咖啡豆加熱至一預設溫度。風扇單元用以對待測物件400(咖啡豆)進行吹拂。溫度測量單元用以測量加熱溫度。風速測量單元可測量容置空間44內之風速。加熱單元、風扇單元、溫度測量單元及風速測量單元係為熟知本領域之技術者之一般常識,故不再贅述。Please refer to FIG. 3, which is a partial cross-sectional view of the first action of the baking and inspection system 100 in FIG. An accommodating space 44 is formed in the first annular wall 40 of the inner cylinder 4, and a first opening 46 is formed in the first annular wall 40, and the first opening 46 is communicated with the accommodating space 44. Several heating units, fan units, temperature measurement units, wind speed measurement units, etc. (not shown) can also be provided inside and outside the inner cylinder 4 according to requirements. The heating unit can be a stove or an electronic heating stove for heating the coffee beans to a preset temperature. The fan unit is used for blowing the object 400 (coffee beans) under test. The temperature measuring unit is used to measure the heating temperature. The wind speed measuring unit can measure the wind speed in the accommodating space 44. The heating unit, the fan unit, the temperature measurement unit and the wind speed measurement unit are common knowledge of those skilled in the art, so they will not be repeated here.

另一方面,如圖3所示,第二環形壁50具有一第二開孔54。導引柱8係設置於第二開孔54處,且自第二環形壁50徑向向外延伸而於其內形成通道86,通道86與第二開孔54相連通。On the other hand, as shown in FIG. 3, the second annular wall 50 has a second opening 54. The guide post 8 is disposed at the second opening 54 and extends radially outward from the second annular wall 50 to form a channel 86 therein, and the channel 86 communicates with the second opening 54.

在本實施例中,檢測裝置2更包含一第一檢測單元10及一第二檢測單元12。第一檢測單元10及第二檢測單元12均設置於殼體20內,且分別電性連接控制裝置3(參見圖1及圖2)。In this embodiment, the detection device 2 further includes a first detection unit 10 and a second detection unit 12. The first detection unit 10 and the second detection unit 12 are both arranged in the housing 20, and are respectively electrically connected to the control device 3 (see FIGS. 1 and 2).

第一檢測單元10用以檢測待測物件400之一第一性質。第一檢測單元10可包含一影像擷取裝置(如相機)14及一光源16。舉例來說,第一檢測單元10之影像擷取裝置14可以擷取待測物件400(例如本實施例之咖啡豆)之一影像,並可將該影像傳送至控制裝置3。控制裝置3可以判定該影像之色澤(第一性質),例如藉由RGB(紅綠藍)之檢測值或是灰階之檢測值來判定。在一實施例中,影像擷取裝置14可為一般市售之數位相機或是工業用數位相機。The first detection unit 10 is used to detect a first property of the object 400 to be tested. The first detection unit 10 may include an image capturing device (such as a camera) 14 and a light source 16. For example, the image capturing device 14 of the first detection unit 10 can capture an image of the object 400 (for example, coffee beans in this embodiment) to be tested, and can transmit the image to the control device 3. The control device 3 can determine the color of the image (first property), for example, by the detection value of RGB (red, green and blue) or the detection value of gray scale. In one embodiment, the image capturing device 14 can be a generally commercially available digital camera or an industrial digital camera.

第二檢測單元12用以檢測待測物件400之相異於第一性質之一第二性質。第二檢測單元12可包含一近紅外光檢測器(Near Infrared Spectrometer,NIR)。更詳細來說,本實施例所揭示之檢測裝置2之第二檢測單元12可包含一探針型或微型近紅外光檢測器,以利於裝置於殼體20內。第二檢測單元12之近紅外光檢測器用以檢測檢測物之化學性質或特定成份(第二性質)之辨識,例如待測物件400(咖啡豆)之蔗糖含量。近紅外線光譜(near-infrared spectroscopy),是光波也是電磁波的一種,也是波長780-2500 nm之吸收光譜,在食品應用上常牽涉O-H、N-H及C-H等化學鍵之相互作用,也因為光與物質間能源的轉換,當分子吸收到近紅外光的能量時會產生振動。但並不是所有光線的能量都會被分子吸收,而是會選擇符合其特有分子及能階之不連續光的能量,所以不同分子會吸收不同波長之光,可用來進行食品之定性及定量分析。但也需要傳統化學分析得到的數值才能跟近紅外線掃瞄之光譜進行統計迴歸分析。是以,本創作之檢測裝置2利用這種原理,可進行特定組成分之檢測(例如蔗糖之檢測)。舉例來說,探針型或微型近紅外光檢測器可以是EXNER Process equipment GMBH之EXcell 241 NIR biomass sensor、Syntpot OÜ之MATRIX-F Fourier Transform Near Infrared (FT-NIR) spectrometer、OTO Photonics(台灣超微光學)之口袋鷹-近紅外 TM(Pocket Hawk - Near-infrared TM, PH-NIR)系列光譜儀。 The second detection unit 12 is used to detect a second property that is different from the first property of the object 400 under test. The second detection unit 12 may include a Near Infrared Spectrometer (NIR). In more detail, the second detection unit 12 of the detection device 2 disclosed in this embodiment may include a probe type or a miniature near-infrared light detector to facilitate the device in the housing 20. The near-infrared light detector of the second detection unit 12 is used to detect the identification of the chemical properties or specific components (second properties) of the detected object, such as the sucrose content of the object 400 (coffee beans) to be detected. Near-infrared spectroscopy (near-infrared spectroscopy) is a kind of light wave and electromagnetic wave. It is also an absorption spectrum with a wavelength of 780-2500 nm. Food applications often involve the interaction of chemical bonds such as OH, NH, and CH. It is also due to the interaction between light and matter Energy conversion, when molecules absorb the energy of near-infrared light, they will vibrate. But not all the energy of light will be absorbed by molecules, but the energy of discontinuous light that meets its unique molecules and energy levels will be selected, so different molecules will absorb light of different wavelengths, which can be used for qualitative and quantitative analysis of food. However, the values obtained by traditional chemical analysis are also required to perform statistical regression analysis with the near-infrared scanning spectrum. Therefore, the detection device 2 of the present invention uses this principle to detect specific components (for example, detection of sucrose). For example, the probe-type or miniature near-infrared light detector can be EXNER Process equipment GMBH’s EXcell 241 NIR biomass sensor, Syntpot OÜ’s MATRIX-F Fourier Transform Near Infrared (FT-NIR) spectrometer, OTO Photonics (Taiwan Supermicro optical) Eagle's pocket - near infrared TM (pocket Hawk - near-infrared TM, PH-NIR) spectrometers.

上述第一檢測單元10及第二檢測單元12的實施例僅為舉例。在其他實施例中,第一檢測單元10可包含一近紅外光檢測器,而第二檢測單元12可包含一影像擷取裝置及一光源。此外,本實施例圖式中第一檢測單元10及第二檢測單元12的位置僅為示意,第一檢測單元10及第二檢測單元12的實際位置將根據實際需求進行調整。The foregoing embodiments of the first detection unit 10 and the second detection unit 12 are only examples. In other embodiments, the first detection unit 10 may include a near-infrared light detector, and the second detection unit 12 may include an image capturing device and a light source. In addition, the positions of the first detection unit 10 and the second detection unit 12 in the drawings of this embodiment are only for illustration, and the actual positions of the first detection unit 10 and the second detection unit 12 will be adjusted according to actual needs.

為確認所獲得之訊號與所欲量測之組成分(例如蔗糖)之關聯性,可事先利用近紅外光檢測器對不同品種及不同烘焙程度之待測物件400(咖啡豆)進行其定性及定量分析。故近紅外光檢測器係作為建立資料庫或評估分析某特定成分(例如蔗糖)可行性之前端工具。舉例來說,這種預先建立資料庫之近紅外光檢測器可以是一種桌上型近紅外光檢測器,例如位於美國麻塞諸塞州之Unity Scientific公司所生產之Spectra Star XT NIR Analyzer。在建立具有足夠多資訊之資料庫後,操作者即可藉由這些資訊來事先設定不同品種及不同烘焙程度之待測物件400所需的烘焙時間、溫度、風量、旋轉速度等。舉例來說,經由多次實驗而收集之資訊可得出若需烘焙出低烘焙及第一品種之咖啡豆,則需要在一第一時間及一第一溫度之條件下進行烘焙;若需烘焙出中烘焙及第二品種之咖啡豆,則需要一第二時間及一第二溫度之條件下進行烘焙。然而,在一些實施例中,在烘焙咖啡豆的過程中,可區分為不同時間區段,以在各不同時間長度的區段中以不同溫度進行烘焙。In order to confirm the correlation between the obtained signal and the desired measurement component (such as sucrose), the near-infrared light detector can be used in advance to qualitatively and determine the object 400 (coffee beans) of different varieties and different roasting levels. Quantitative analysis. Therefore, the near-infrared light detector is used as a front-end tool for establishing a database or evaluating the feasibility of analyzing a specific component (such as sucrose). For example, the near-infrared light detector with a pre-built database may be a desktop near-infrared light detector, such as the Spectra Star XT NIR Analyzer produced by Unity Scientific, Massachusetts, USA. After a database with sufficient information is created, the operator can use the information to pre-set the baking time, temperature, air volume, rotation speed, etc. of the object 400 to be tested for different varieties and different baking levels. For example, the information collected through many experiments shows that if you need to roast low-roasted and first-variety coffee beans, you need to roast under the conditions of a first time and a first temperature; For middle roast and second varieties of coffee beans, it takes a second time and a second temperature to roast. However, in some embodiments, the roasting of coffee beans can be divided into different time sections, so as to roast at different temperatures in the sections of different time lengths.

此外,為獲得大量資料,可先利用本創作之烘焙及檢測系統來建立資料庫。當數據齊全後,即可開始製作客製化之烘焙作業。除此之外,當資料齊全後,控制裝置3可增設一智慧模式,依據在烘焙過程中所接收之烘焙度及蔗糖資訊變化自行調整烘焙參數,客製化並逐步擬合操作者所需之烘焙程度及風味。In addition, in order to obtain a large amount of data, the baking and inspection system of this creation can be used to establish a database. When the data is complete, you can start making customized baking operations. In addition, when the data is complete, the control device 3 can add a smart mode to adjust the baking parameters according to the changes in the baking degree and sucrose information received during the baking process, customize and gradually fit the operator’s needs Degree of baking and flavor.

下表一為本創作一實施例之深中淺烘焙之咖啡豆的RGB值及灰階值。RGB值及灰階值的範圍均為0至255。    淺焙咖啡豆 中焙咖啡豆 深焙咖啡豆 R值範圍區間 40~74 36~76 24~57 G值範圍區間 19~48 19~50 19~45 B值範圍區間 0~28 2~31 12~34 R值平均 57.42 48.98 35.23 G值平均 32.41 29.09 25.67 B值平均 14.36 15.1 19.95 灰階值 37.83 33.44 27.88 表一、不同焙度咖啡豆之色彩量化檢測值 Table 1 below shows the RGB values and grayscale values of the dark, medium and light roasted coffee beans in an embodiment of the creation. The range of RGB value and grayscale value is 0 to 255. Light roasted coffee beans Medium roasted coffee beans Deep roasted coffee beans R value range interval 40~74 36~76 24~57 G value range interval 19~48 19~50 19~45 B value range interval 0~28 2~31 12~34 R value average 57.42 48.98 35.23 G value average 32.41 29.09 25.67 B value average 14.36 15.1 19.95 Grayscale value 37.83 33.44 27.88 Table 1. Color quantitative detection values of coffee beans with different roasting degrees

下表二為本創作一實施例之不同焙度咖啡豆之蔗糖含量之分析值。 樣品名 取樣克數(g) 定容體積(mL) 儀器分析值 蔗糖(g/mL) 樣品中濃度 蔗糖(g/100g) 淺烘焙咖啡豆 1.94 10 0.00088314 0.46 中烘焙咖啡豆 1.95 10 0.00059407 0.30 深烘焙咖啡豆 2 10 0 0.00 表二、不同焙度咖啡豆之蔗糖含量 Table 2 below is the analysis value of the sucrose content of coffee beans with different roasting degrees according to an embodiment of the creation. Sample name Sampling grams (g) Constant volume (mL) Instrumental analysis value sucrose (g/mL) Concentration of sucrose in the sample (g/100g) Light roasted coffee beans 1.94 10 0.00088314 0.46 Medium roasted coffee beans 1.95 10 0.00059407 0.30 Deep roasted coffee beans 2 10 0 0.00 Table 2. Sucrose content of coffee beans with different roasting degrees

咖啡豆內的蔗糖含量多寡對於沖泡後咖啡的香氣有顯著的相關性,其在烘焙過程中內部蔗糖含量會隨著焙度逐漸下降,從上表中亦可看出此趨勢。The sucrose content in coffee beans has a significant correlation with the aroma of the coffee after brewing. During the roasting process, the internal sucrose content will gradually decrease with the roasting degree. This trend can also be seen from the above table.

以下介紹本實施例烘焙及檢測系統100之作動流程。請參閱圖3,首先,於一接收狀態時,內筒4之第一開孔46可位於圖面之上方。此時,外筒5係位於第一位置,即本實施例中外筒5之第二開孔54係與內筒4之第一開孔46對齊。換句話說,控制裝置3係控制內筒4與外筒5均靜止不動,且使第一開孔46對應於外筒5在第一位置的第二開孔54而相連通。此時,可將待測物件400(例如本實施例之咖啡豆)自外筒5之導引柱8依序通過外筒5之第二開孔54及內筒4之第一開孔46而倒入內筒4之容置空間44中。The following describes the operation process of the baking and inspection system 100 of this embodiment. Please refer to FIG. 3. First, in a receiving state, the first opening 46 of the inner cylinder 4 can be located above the drawing. At this time, the outer cylinder 5 is in the first position, that is, the second opening 54 of the outer cylinder 5 is aligned with the first opening 46 of the inner cylinder 4 in this embodiment. In other words, the control device 3 controls both the inner tube 4 and the outer tube 5 to be stationary, and makes the first opening 46 communicate with the second opening 54 of the outer tube 5 at the first position. At this time, the object 400 (such as coffee beans in this embodiment) can be passed from the guide post 8 of the outer tube 5 through the second opening 54 of the outer tube 5 and the first opening 46 of the inner tube 4 in sequence. Pour into the accommodating space 44 of the inner cylinder 4.

請參閱圖4,其為本創作圖1之烘焙及檢測系統100之第二作動之局部剖面圖。此時,停止倒入待測物件400並關閉外蓋9,圖1所示之第一驅動裝置6驅動內筒4以圖面之順時鐘方向沿軸心A連續旋轉而具有第一路徑R1(即旋轉路徑),同時可對內筒4內之待測物件400進行烘焙作業。其中,烘焙及旋轉的時間、速度、加熱溫度、風力等參數均可事先由操作者自訂,或是經由控制裝置3內儲存的資料而進行該等參數之控制,以期得到待測物件400所欲之烘焙度、香氣及風味。該烘焙步驟為本領域所屬技藝人士所熟知之流程,故不再贅述。Please refer to FIG. 4, which is a partial cross-sectional view of the second action of the baking and inspection system 100 in FIG. At this time, stop pouring the object 400 to be tested and close the outer cover 9. The first driving device 6 shown in FIG. 1 drives the inner cylinder 4 to continuously rotate along the axis A in the clockwise direction of the drawing to have a first path R1 ( That is, the rotation path), and at the same time, the object to be tested 400 in the inner cylinder 4 can be baked. Among them, the parameters such as baking and rotating time, speed, heating temperature, wind power, etc. can be customized by the operator in advance, or they can be controlled through the data stored in the control device 3, in order to obtain 400 test objects. Desired baking degree, aroma and flavor. This baking step is a process well known to those skilled in the art, so it will not be repeated.

請參閱圖5,其為本創作圖1之烘焙及檢測系統100之第三作動之局部剖面圖。當烘焙到所設定之時間後,第二驅動裝置7(如圖1所示)的動力源70驅動外筒5使其沿第二路徑R2而從原先之第一位置(圖4)旋轉移動至一第二位置(圖5)。詳細來說,如圖5之圖面方向所示,於一釋放狀態時,第二驅動裝置7的動力源70帶動齒輪72以逆時鐘方向轉動,齒輪72再帶動外筒5的齒條52以順時鐘方向轉動。此時,外筒5的導引柱8可由圖4所示之內筒4上方(即圖面約零點鐘之方位,外筒5的第一位置)沿著第二路徑R2順時針沿軸心A旋轉移動至內筒4之右下方(即圖面約四點鐘之方位,外筒5的第二位置),即導引柱8移動至檢測裝置2之接收口24處。此時,導引柱8推動彈性遮蔽件22而使彈性遮蔽件22暫時變形,以使導引柱8進入殼體20內,而樞接於導引柱8一側頂緣之外蓋9則因重力而自動打開。當內筒4繼續旋轉而其第一開孔46與外筒5之第二開孔54對齊時,內筒4內一小部分的待測物件420會因離心力及重力的影響自導引柱8落入至檢測裝置2內之一透明容器26中。由此可知,由於第一開孔46之第一路徑R1係至少與第二開孔54之第二路徑R2部分重疊(即,內筒4的旋轉路徑的一部分會經過第二開孔54),故於第一開孔46及第二開孔54對齊時,待測物件400中一小部分的待測物件420會掉出內筒4外,並經由導引柱8的通道86而落入鄰近位於外筒5處於第二位置時之第二開孔54的檢測裝置2中。經過一段時間後(例如數秒鐘),或是判定一定數量或重量之部分待測物件420已落入檢測裝置2後,第二驅動裝置7可以反方向驅動外筒5復歸原位,即外筒5可從第二位置回歸到第一位置,以避免更多的待測物件400落入檢測裝置2中。Please refer to FIG. 5, which is a partial cross-sectional view of the third action of the baking and inspection system 100 in FIG. When the baking reaches the set time, the power source 70 of the second driving device 7 (as shown in FIG. 1) drives the outer cylinder 5 to rotate along the second path R2 from the original first position (FIG. 4) to A second position (Figure 5). In detail, as shown in the direction of the drawing in FIG. 5, in a released state, the power source 70 of the second driving device 7 drives the gear 72 to rotate in a counterclockwise direction, and the gear 72 then drives the rack 52 of the outer cylinder 5 to Turn clockwise. At this time, the guide post 8 of the outer cylinder 5 can be moved clockwise along the axis along the second path R2 from above the inner cylinder 4 as shown in FIG. 4 (that is, the position at about zero o'clock in the drawing, the first position of the outer cylinder 5). A rotates and moves to the lower right of the inner cylinder 4 (that is, the position at about four o'clock in the drawing, the second position of the outer cylinder 5), that is, the guide column 8 moves to the receiving port 24 of the detection device 2. At this time, the guide post 8 pushes the elastic shield 22 to temporarily deform the elastic shield 22, so that the guide post 8 enters the housing 20, and the outer cover 9 pivotally connected to the top edge of the guide post 8 Automatically open due to gravity. When the inner cylinder 4 continues to rotate and its first opening 46 is aligned with the second opening 54 of the outer cylinder 5, a small part of the object to be tested 420 in the inner cylinder 4 will self-guide the column 8 due to the influence of centrifugal force and gravity. Drop into a transparent container 26 in the detection device 2. It can be seen that since the first path R1 of the first opening 46 is at least partially overlapped with the second path R2 of the second opening 54 (that is, a part of the rotation path of the inner cylinder 4 passes through the second opening 54), Therefore, when the first opening 46 and the second opening 54 are aligned, a small part of the object to be tested 420 in the object to be tested 400 will fall out of the inner cylinder 4 and fall into the neighboring area through the channel 86 of the guide column 8. It is located in the detection device 2 of the second opening 54 when the outer cylinder 5 is in the second position. After a period of time (for example, a few seconds), or after it is determined that a certain number or weight of the test object 420 has fallen into the detection device 2, the second driving device 7 can drive the outer cylinder 5 back to the original position, that is, the outer cylinder 5 can return from the second position to the first position to prevent more objects 400 to be tested from falling into the detection device 2.

此外,當烘焙至所設定之期間時,控制裝置3亦可發出訊號或警報提醒操作者。操作者可根據訊息及/或警報進行人工之調整或協助。In addition, when the baking reaches the set period, the control device 3 can also send out a signal or alarm to remind the operator. The operator can manually adjust or assist according to the message and/or alarm.

當部分待測物件420落入檢測裝置2一小段時間(例如數秒鐘)後,可依序(即,分別)或同時進行一第一檢測步驟(開啟光源16並控制影像擷取裝置14擷取影像)及一第二檢測步驟(利用第二檢測單元12之近紅外光檢測器以近紅外線光掃描偵測)。即,使用第一檢測單元10及第二檢測單元12對落入至檢測裝置2中靜止之部分待測物件420(大部分的待測物件400仍位於內筒4中)進行檢測。需要注意的是,由於目前部分待測物件420為靜止狀態,故第一檢測單元10及第二檢測單元12對於靜止之部分待測物件420的檢測結果相較於仍在旋轉烘焙中之待測物件400的檢測明顯會有更好的準確度。故,檢測裝置2之影像擷取裝置14不需要高度精密的昂貴相機即可達到本案所需之擷取影像效果。When part of the test object 420 falls into the detection device 2 for a short period of time (for example, a few seconds), a first detection step can be performed sequentially (ie, separately) or simultaneously (turn on the light source 16 and control the image capture device 14 to capture Image) and a second detection step (using the near infrared light detector of the second detection unit 12 to scan and detect with near infrared light). That is, the first detection unit 10 and the second detection unit 12 are used to detect the stationary part of the test object 420 (most of the test objects 400 are still located in the inner cylinder 4) falling into the detection device 2. It should be noted that since some of the objects to be tested 420 are currently in a static state, the detection results of the first detecting unit 10 and the second detecting unit 12 for the stationary part of the objects to be tested 420 are compared with those of the objects to be tested that are still being rotated. The detection of the object 400 will obviously have better accuracy. Therefore, the image capturing device 14 of the detection device 2 does not require a highly sophisticated expensive camera to achieve the image capturing effect required in this case.

如上所述,第一檢測單元10及第二檢測單元12係可以擷取影像及偵測近紅外光的方式測量部分待測物件420之性質。可藉由擷取影像而檢測部分待測物件420之RGB值或是灰階檢測值,當該檢測值等於或超過一預設之第一門檻值時,即可代表烘焙已完成(已達成所欲之烘焙度)。此外,可藉由近紅外光檢測部分待測物件420之一特定組成物成分之檢測(例如蔗糖),當該檢測值等於或超過一預設之第二門檻值時,即可代表烘焙已完成(已達成所欲之風味或香氣)。需要注意的是,操作者可事先設定是否要該二檢測值均須分別符合第一門檻值及第二門檻值方可認定烘焙完成;或是,操作者可事先設定只要符合第一門檻值或第二門檻值即可認定烘焙完成。換句話說,操作者可事先設定只要所欲之烘焙程度及風味香氣之一者有符合標準即可,或是烘焙程度及風味香氣均需符合標準。As described above, the first detection unit 10 and the second detection unit 12 can measure the properties of a part of the object to be tested 420 by capturing images and detecting near-infrared light. The RGB value or grayscale detection value of part of the object to be tested 420 can be detected by capturing the image. When the detection value is equal to or exceeds a preset first threshold, it means that the baking has been completed (all the results have been reached). Desire baking degree). In addition, the near-infrared light can be used to detect the detection of a specific component of the object 420 (such as sucrose). When the detection value is equal to or exceeds a preset second threshold, it can represent that the baking has been completed (The desired flavor or aroma has been achieved). It should be noted that the operator can set in advance whether the two detection values must meet the first threshold and the second threshold respectively before the baking is considered complete; or, the operator can set in advance as long as the first threshold or The second threshold value can be deemed to be completed. In other words, the operator can pre-set as long as one of the desired baking degree and flavor aroma meets the standard, or both the baking degree and flavor aroma must meet the standard.

當控制裝置3判定烘焙步驟完成後,即可停止內筒4之運轉,之後再將烘焙完成之咖啡豆取出即告完成。在一實施例中,可使用自動的方式將內筒4內烘焙好的物件400取出。在其他實施例中,可使用人工的方式將烘焙好的物件400自內筒4取出。When the control device 3 determines that the roasting step is completed, the operation of the inner cylinder 4 can be stopped, and then the roasted coffee beans are taken out to complete. In one embodiment, the baked object 400 in the inner cylinder 4 can be taken out in an automatic manner. In other embodiments, the baked object 400 can be taken out from the inner cylinder 4 manually.

若控制裝置3判定烘焙步驟尚未完成,則需進行另一段期間之烘焙。舉例來說,控制裝置3可根據該二檢測值與第一門檻值及第二門檻的差異進行運算而得出需要再烘焙之時間。此時,內筒4即會繼續運轉並於該期間繼續進行烘焙。之後,可再將原先落入至檢測裝置2內之已測部分物件以人工或自動的方式自檢測區(即透明容器26)移除,並再進行一次釋放步驟。釋放步驟即如前所述,將外筒5旋轉移動而使其第二開孔54移動至圖5所示外筒5之第二位置,以使內筒4的旋轉路徑的一部分(第一開孔46)對應於第二開孔54,且檢測裝置2之接收口24亦對應於導引柱8及第二開孔54。如此,可再使物件400之另一部分將經由第一開孔46及第二開孔54而落入至檢測裝置2內以再進行一次檢測。若所檢測值大於或等於第一門檻值及第二門檻值之至少一者或二者(即上述事先設定是要全部符合,或是其中之一符合),即代表檢測通過。當檢測合格時,則可停止內筒4旋轉,並取出物件400。若檢測仍不符合第一門檻值及第二門檻值之至少一者或二者,則可再進一第三次烘焙作業,並接續進行上述步驟,直到檢測符合門檻值為止。If the control device 3 determines that the baking step has not been completed, another period of baking is required. For example, the control device 3 can calculate the time required for rebake according to the difference between the two detection values and the first threshold and the second threshold. At this time, the inner cylinder 4 will continue to operate and continue to bake during this period. After that, part of the objects that have been tested that originally fell into the detection device 2 can be manually or automatically removed from the detection area (that is, the transparent container 26), and the release step can be performed again. The release step is as described above, the outer cylinder 5 is rotated to move its second opening 54 to the second position of the outer cylinder 5 shown in FIG. 5, so that a part of the rotation path of the inner cylinder 4 (first opening The hole 46) corresponds to the second opening 54 and the receiving opening 24 of the detection device 2 also corresponds to the guiding post 8 and the second opening 54. In this way, another part of the object 400 can fall into the detection device 2 through the first opening 46 and the second opening 54 to perform another detection. If the detected value is greater than or equal to at least one or both of the first threshold value and the second threshold value (that is, whether the above-mentioned preset setting is to meet all or one of them meets), it means that the detection is passed. When the test is qualified, the rotation of the inner cylinder 4 can be stopped, and the object 400 can be taken out. If the detection still does not meet at least one or both of the first threshold value and the second threshold value, a third baking operation can be performed, and the above steps can be continued until the detection meets the threshold value.

在其他實施例中,當檢測值未符合門檻值時,即會告知操作者。操作者可以人工判定的方式決定是否進行下一次的烘焙作業。In other embodiments, when the detected value does not meet the threshold value, the operator will be notified. The operator can decide whether to proceed with the next baking operation by manual judgment.

以下介紹本創作之另一實施例,請參照圖6,其為本創作第二實施例之烘焙及檢測系統200之第一作動之局部剖面圖。本實施例與前述實施例之結構大致相同,為其不同之處主要在於導引柱8'之設計。在本實施例中,導引柱8'的兩側可為不同長度,其圖示之左側80可較右側82略長,且外蓋9'以可活動的方式樞接於導引柱8'之左側80。外筒5另可具有一鎖固件(未繪示),可以自動或人工的方式將外蓋9'固定於導引柱8'上,或解除外蓋9'於導引柱8'上的固定。在本實施例中,導引柱8'及外蓋9'之至少之一者可為透明,以利於第一檢測單元10及第二檢測單元12穿透導引柱8'或外蓋9'而對物件400進行檢測。Another embodiment of this creation is introduced below. Please refer to FIG. 6, which is a partial cross-sectional view of the first action of the baking and inspection system 200 of the second embodiment of the creation. The structure of this embodiment is substantially the same as the previous embodiment, and the difference is mainly in the design of the guide post 8'. In this embodiment, the two sides of the guide post 8'can have different lengths. The left side 80 shown in the figure can be slightly longer than the right side 82, and the outer cover 9'is pivotally connected to the guide post 8'in a movable manner. 80 on the left. The outer cylinder 5 may additionally have a locking member (not shown), which can automatically or manually fix the outer cover 9'on the guide post 8', or release the fixation of the outer cover 9'on the guide post 8' . In this embodiment, at least one of the guide post 8'and the outer cover 9'may be transparent to facilitate the first detection unit 10 and the second detection unit 12 to penetrate the guide post 8'or the outer cover 9' The object 400 is detected.

以下介紹本實施例之烘焙及檢測方法。首先,如圖6所示,經由外蓋9'已打開之導引柱8',將待測之物件400放入內筒4之容置空間44內。The baking and detection methods of this embodiment are described below. First, as shown in FIG. 6, the object 400 to be tested is put into the accommodating space 44 of the inner cylinder 4 through the guide post 8 ′ with the outer cover 9 ′ opened.

請參照圖7,其為圖6之烘焙及檢測系統200之第二作動之局部剖面圖。接著,將外蓋9'關上且固定於導引柱8'上。內筒4開始旋轉並於一預定時間中對物件400進行烘焙。Please refer to FIG. 7, which is a partial cross-sectional view of the second action of the baking and inspection system 200 of FIG. 6. Then, close the outer cover 9'and fix it on the guide post 8'. The inner cylinder 4 starts to rotate and bake the object 400 in a predetermined time.

請參照圖8,其為圖6之烘焙及檢測系統200之第三作動之局部剖面圖。當烘焙一預定時間後,外筒5開始順時鐘旋轉而沿著第二路徑R2至第二位置,而外筒5之導引柱8'會導入至檢測裝置2中。此時,內筒4會繼續旋轉。接著,當內筒4之第一開孔46於旋轉中對應於第二開孔54時,待測物件400會自內筒4掉入導引柱8'中。因為旋轉之離心力與重力的影響,待測物件400會落入導引柱8'的底部(即,外蓋9'的內側上)。Please refer to FIG. 8, which is a partial cross-sectional view of the third action of the baking and inspection system 200 of FIG. 6. After baking for a predetermined time, the outer cylinder 5 starts to rotate clockwise and follows the second path R2 to the second position, and the guide post 8 ′ of the outer cylinder 5 is guided into the detection device 2. At this time, the inner cylinder 4 will continue to rotate. Then, when the first opening 46 of the inner cylinder 4 corresponds to the second opening 54 during rotation, the object 400 to be tested will fall from the inner cylinder 4 into the guide post 8'. Due to the influence of the centrifugal force of rotation and gravity, the object 400 to be tested will fall into the bottom of the guide post 8'(ie, on the inner side of the outer cover 9').

接著,可依序或同時執行第一檢測步驟以及第二檢測步驟,以對待測物件400進行檢測。本實施例之第一檢測步驟以及第二檢測步驟與前實施例類似,故不再贅述。在本實施例中,若檢測符合預定之門檻值,外筒5會回到第一位置,並使導引柱8'內之已檢測物經外筒5之第二開孔54及內筒4之第一開孔46而落入內筒4之容置空間44中。接著內筒4可停止旋轉,完成烘焙作業。若檢測不符合預定之門檻值,外筒5會回到第一位置,並使導引柱8'內之已檢測物經外筒5之第二開孔54及內筒4之第一開孔46而落入內筒4之容置空間44中。接著,於另一段預定時間,內筒4繼續進行旋轉烘焙。之後,進行前述釋放及檢測步驟。即,使外筒5旋轉,以使待測的部分物件400進入導引柱8'內,並在檢測裝置2內對待測的部分物件進行檢測。在本實施例中,需要注意的是,部分待測物件420係置於導引柱8'內進行量測,且可藉由外筒5之反向旋轉而再回到內筒4中,故可使全部之物件400在烘焙及檢測作業中都容置於烘焙裝置1內。如此,由於物件400均在烘焙裝置1中,可有效避免外在的影響,進而提高檢測之準確性。Then, the first detection step and the second detection step can be performed sequentially or simultaneously to detect the object 400 under test. The first detection step and the second detection step of this embodiment are similar to the previous embodiment, so they will not be repeated. In this embodiment, if the detection meets the predetermined threshold value, the outer tube 5 will return to the first position, and the detected object in the guiding column 8'will pass through the second opening 54 of the outer tube 5 and the inner tube 4 The first opening 46 falls into the accommodating space 44 of the inner cylinder 4. Then the inner cylinder 4 can stop rotating to complete the baking operation. If the detection does not meet the predetermined threshold value, the outer cylinder 5 will return to the first position, and the detected object in the guiding column 8'will pass through the second opening 54 of the outer cylinder 5 and the first opening of the inner cylinder 4 46 and fall into the accommodating space 44 of the inner cylinder 4. Then, in another predetermined period of time, the inner cylinder 4 continues to rotate and bake. After that, the aforementioned release and detection steps are performed. That is, the outer cylinder 5 is rotated so that the part of the object 400 to be tested enters the guide column 8 ′, and the part of the object to be tested is detected in the detection device 2. In this embodiment, it should be noted that part of the object to be tested 420 is placed in the guide column 8'for measurement, and can be returned to the inner tube 4 by the reverse rotation of the outer tube 5, so All the objects 400 can be contained in the baking device 1 during baking and inspection operations. In this way, since the objects 400 are all in the baking device 1, external influences can be effectively avoided, thereby improving the accuracy of detection.

此外,在本實施例中,由於導引柱8'兩側不同高度的設計,當外筒5位於第二位置時,可使透明外蓋9'平行於檢測裝置2的底面,易於將第一檢測單元10之影像擷取裝置14及第二檢測單元12對準於透明外蓋9,進而有利於第一檢測單元10及第二檢測單元12檢測之準確性。In addition, in this embodiment, due to the design of different heights on both sides of the guide post 8', when the outer cylinder 5 is in the second position, the transparent outer cover 9'can be made parallel to the bottom surface of the detection device 2, which is easy to set the first The image capturing device 14 and the second detection unit 12 of the detection unit 10 are aligned with the transparent outer cover 9, thereby facilitating the accuracy of detection by the first detection unit 10 and the second detection unit 12.

圖9為本創作第三實施例之烘焙及檢測系統300之立體圖。圖10為本創作圖9之烘焙及檢測系統300之第一作動之局部剖面圖。本實施例與圖1至圖5所示之實施例類似,故相同之處不再贅述。FIG. 9 is a perspective view of the baking and inspection system 300 according to the third embodiment of the creation. FIG. 10 is a partial cross-sectional view of the first action of the baking and inspection system 300 created in FIG. 9. This embodiment is similar to the embodiment shown in FIG. 1 to FIG. 5, so the similarities will not be repeated.

在本實施例中,外筒5'不會相對於軸心A旋轉;外筒5'包含一第二環形壁50、一中空第一導引柱8a以及一中空第二導引柱8b,且外筒5'之第二環形壁50上具有一第二開孔54及一第三開孔56。第一導引柱8a及第二導引柱8b分別對應圖10所示之第二開孔54及第三開孔56而相連通,且均設置於第二環形壁50上,並自第二環形壁50分別徑向向外延伸。In this embodiment, the outer cylinder 5'does not rotate with respect to the axis A; the outer cylinder 5'includes a second annular wall 50, a hollow first guiding column 8a and a hollow second guiding column 8b, and The second annular wall 50 of the outer cylinder 5 ′ has a second opening 54 and a third opening 56. The first guide post 8a and the second guide post 8b respectively correspond to the second opening 54 and the third opening 56 shown in FIG. 10 and communicate with each other, and are both disposed on the second annular wall 50, and are connected from the second The annular walls 50 respectively extend radially outward.

在本實施例中,第一導引柱8a包含一外蓋9。如圖10所示,當外蓋9打開時,待測物件400可自第一導引柱8a放入內筒4中。另外第二導引柱8b之內端緣可包含一閘門84,而第二導引柱8b之外端緣連通於檢測裝置2內。控制裝置3可控制閘門84之移動,進而控制第二導引柱8b之第三開孔56之啟閉。換句話說,當閘門84關閉時,待測物件400無法自內筒4進入第二導引柱8b內。當閘門84開啟時且當內筒4之第一開孔46對應於外筒5'之第三開孔56時,待測物件400即可自內筒4進入第二導引柱8b內。In this embodiment, the first guiding post 8a includes an outer cover 9. As shown in FIG. 10, when the outer cover 9 is opened, the object 400 to be tested can be put into the inner cylinder 4 from the first guide post 8a. In addition, the inner edge of the second guiding column 8b may include a gate 84, and the outer edge of the second guiding column 8b is connected to the detection device 2. The control device 3 can control the movement of the gate 84, and further control the opening and closing of the third opening 56 of the second guiding pillar 8b. In other words, when the gate 84 is closed, the object 400 to be tested cannot enter the second guiding column 8b from the inner cylinder 4. When the gate 84 is opened and when the first opening 46 of the inner cylinder 4 corresponds to the third opening 56 of the outer cylinder 5', the object 400 to be tested can enter the second guiding column 8b from the inner cylinder 4.

以下介紹本實施例之烘焙及檢測之方法。如圖10所示,可先打開第一導引柱8a之外蓋9,並使第一導引柱8a之第二開孔54對應於內筒4之第一開孔46。接著,將待測物件400自第一導引柱8a之外蓋9放入內筒4中。此時,第二導引柱8b內端緣之閘門84處於關閉狀態。The baking and detection methods of this embodiment are described below. As shown in FIG. 10, the outer cover 9 of the first guiding post 8 a can be opened first, and the second opening 54 of the first guiding post 8 a corresponds to the first opening 46 of the inner cylinder 4. Then, the object 400 to be tested is put into the inner cylinder 4 from the outer cover 9 of the first guiding column 8a. At this time, the gate 84 at the inner edge of the second guide column 8b is in a closed state.

圖11為本創作圖9之烘焙及檢測系統300之第二作動之局部剖面圖。如圖11所示,啟動內筒4,以使內筒4開始沿著第一路徑R1旋轉並對待測物件400進行烘焙。FIG. 11 is a partial cross-sectional view of the second action of the baking and inspection system 300 created in FIG. 9. As shown in FIG. 11, the inner cylinder 4 is activated so that the inner cylinder 4 starts to rotate along the first path R1 and the object 400 to be tested is baked.

圖12為本創作圖9之烘焙及檢測系統300之第三作動之局部剖面圖。當經過一段時間後,可於一小段時間內開啟第二導引柱8b之閘門84,當內筒4之第一開孔46對應於第三開孔56時,待測的部分物件420會落入第二導引柱8b內。接著,待測的部分物件420再經由第二導引柱8b而落入於檢測裝置2之透明容器26中。接著,關閉閘門84,以避免過多之待測物件400落入第二導引柱8b。FIG. 12 is a partial cross-sectional view of the third action of the baking and inspection system 300 created in FIG. 9. After a period of time, the gate 84 of the second guide post 8b can be opened within a short period of time. When the first opening 46 of the inner cylinder 4 corresponds to the third opening 56, part of the object 420 to be tested will fall Into the second guide column 8b. Then, some objects 420 to be tested fall into the transparent container 26 of the detection device 2 through the second guide post 8b. Then, the gate 84 is closed to prevent too many objects 400 to be tested from falling into the second guiding pillar 8b.

此時,第一檢測單元10以及第二檢測單元12可同時或依序(分別)對位於透明容器26內靜止之部分物件420進行檢測。當檢測符合門檻值時,則可停止內筒4之運轉,並完成烘焙作業。當檢測未符合門檻值時,則繼續內筒4之運轉,繼續進行烘焙作業。需要注意的是,當檢測未符合門檻值時,原先位於檢測裝置2中已檢測完成的物件400將可以人工或全自動的方式自檢測裝置2中移除,以使透明容器26得以容置新的待測物件400。At this time, the first detection unit 10 and the second detection unit 12 can simultaneously or sequentially (respectively) detect the static part of the object 420 in the transparent container 26. When the detection meets the threshold value, the operation of the inner cylinder 4 can be stopped, and the baking operation can be completed. When the detection does not meet the threshold value, the operation of the inner cylinder 4 is continued, and the baking operation is continued. It should be noted that when the detection does not meet the threshold value, the detected object 400 originally located in the detection device 2 will be manually or fully automatically removed from the detection device 2 so that the transparent container 26 can contain the new The object under test 400.

根據本創作一實施例中之一種烘焙及檢測方法,其包括下列步驟。提供上述之烘焙及檢測系統100、200。進行一接收步驟,內筒4與外筒5均靜止不動,且內筒4之第一開孔46對應於在一第一位置的外筒5之第二開孔54,將多個物件400經第一開孔46及第二開孔54置入內筒4之容置空間44內。於一第一期間旋轉內筒4並烘焙物件400。進行一釋放步驟,將外筒5移動而使第二開孔54移動至一第二位置,以使內筒4的旋轉路徑的一部分對應於第二開孔54,且檢測裝置2之接收口24對應於第二開孔54,以使部分待測物件420經第一開孔46及第二開孔54落入至檢測裝置2內。將外筒5移回第一位置。對部分待測物件420檢測,以產生一檢測值。當檢測值等於或超過一門檻值時,則內筒4停止旋轉且停止烘焙。According to a baking and detection method in an embodiment of the invention, it includes the following steps. Provide the above-mentioned baking and inspection systems 100 and 200. In a receiving step, both the inner tube 4 and the outer tube 5 are stationary, and the first opening 46 of the inner tube 4 corresponds to the second opening 54 of the outer tube 5 at a first position, and a plurality of objects 400 are passed through The first opening 46 and the second opening 54 are placed in the accommodating space 44 of the inner cylinder 4. During a first period, the inner cylinder 4 is rotated and the object 400 is baked. Perform a release step to move the outer cylinder 5 to move the second opening 54 to a second position, so that a part of the rotation path of the inner cylinder 4 corresponds to the second opening 54 and the receiving port 24 of the detection device 2 Corresponding to the second opening 54, so that part of the object to be tested 420 falls into the detection device 2 through the first opening 46 and the second opening 54. Move the outer cylinder 5 back to the first position. Part of the object to be tested 420 is detected to generate a detection value. When the detection value is equal to or exceeds a threshold value, the inner cylinder 4 stops rotating and stops baking.

本實施例之烘焙及檢測方法,更包括:當檢測值小於門檻值時,則內筒4繼續旋轉且烘焙於一第二期間。進行釋放步驟,將外筒5移動而使第二開孔54移動至第二位置,以使另一部分之物件400經第一開孔46及第二開孔54落入至檢測裝置2內。對另一部分之物件400檢測,以產生另一檢測值。當另一檢測值等於或超過門檻值時,則內筒4停止旋轉且停止烘焙。The baking and detection method of this embodiment further includes: when the detection value is less than the threshold value, the inner cylinder 4 continues to rotate and the baking is performed in a second period. The release step is performed to move the outer cylinder 5 to move the second opening 54 to the second position, so that another part of the object 400 falls into the detection device 2 through the first opening 46 and the second opening 54. The other part of the object 400 is detected to generate another detection value. When another detection value is equal to or exceeds the threshold value, the inner drum 4 stops rotating and stops baking.

綜合上述,本創作揭露一種烘焙及檢測系統100、200與方法,以對一農業作物(例如咖啡豆)進行烘焙及檢測。其中,於一實施例,烘焙及檢測系統100、200之外筒5可相對於軸心A旋轉移動,以使待測物件400進入內筒4中烘焙,或使待測物件400移出內筒4外而進入檢測裝置2內進行檢測。如此之全自動方式對靜止之待測物件400進行烘焙及檢測系統100、200及方法,在低成本、快速、不需人力的情況下快速取得具有操作者所欲品質(例如烘焙程度或香味)的烘焙物。同時,經過科學化的檢測,避免人為失誤而造成龐大的損失。再者,待測物件400於待測裝置中檢測,可避免內筒4於烘焙時高熱、動態及水氣之干擾,或是處於外界之干擾,而可擷取高品質影像,進而有效提升檢測的準確度。In summary, this creation discloses a roasting and inspection system 100, 200 and a method to roast and inspect an agricultural crop (such as coffee beans). Wherein, in one embodiment, the outer cylinder 5 of the baking and inspection system 100, 200 can rotate relative to the axis A, so that the object 400 to be tested enters the inner cylinder 4 for baking, or the object 400 to be tested is moved out of the inner cylinder 4 The outside enters the detection device 2 for detection. In such a fully automatic way, the baking and inspection systems 100, 200 and methods for the stationary object 400 to be tested can quickly obtain the quality desired by the operator (such as baking degree or fragrance) at low cost, quickly, and without manpower. Baked goods. At the same time, through scientific testing, huge losses caused by human error are avoided. Furthermore, the object 400 to be tested is detected in the device to be tested, which can avoid the interference of high heat, dynamics and moisture of the inner cylinder 4 during baking, or interference from the outside, and can capture high-quality images, thereby effectively improving the detection Accuracy.

於另一實施例中,烘焙及檢測系統300之外筒5'不會相對於軸心A旋轉,而具有可分別啟閉的二導引柱8a、8b,以控制待測物件400之進出,如此亦可達成本創作之效果。In another embodiment, the outer cylinder 5'of the baking and inspection system 300 does not rotate relative to the axis A, but has two guide posts 8a, 8b that can be opened and closed respectively to control the entry and exit of the object 400 to be tested. This can also achieve the effect of cost creation.

本文中的用語「一」或「一種」係用以敘述本創作之元件及成分。此術語僅為了敘述方便及給予本創作之基本觀念。此敘述應被理解為包括一種或至少一種,且除非明顯地另有所指,表示單數時亦包括複數。於申請專利範圍中和「包含」一詞一起使用時,該用語「一」可意謂一個或超過一個。此外,本文中的用語「或」其意同「及/或」。The term "one" or "one" in this article is used to describe the elements and components of this creation. This term is only for the convenience of description and to give the basic idea of this creation. This description should be understood to include one or at least one, and unless clearly indicated otherwise, the singular also includes the plural. When used with the word "including" in the scope of the patent application, the term "a" can mean one or more than one. In addition, the term "or" in this article means the same as "and/or".

除非另外規定,否則諸如「上方」、「下方」、「向上」、「左邊」、「右邊」、「向下」、「頂」、「底」、「垂直」、「水平」、「側」、「較高」、「下部」、「上部」、「上方」、「下面」等空間描述係關於圖中所展示之方向加以指示。應理解,本文中所使用之空間描述僅出於說明之目的,且本文中所描述之結構之實際實施可以任何相對方向在空間上配置,此限制條件不會改變本創作實施例之優點。舉例來說,在一些實施例之描述中,提供「在」另一元件「上」之一元件可涵蓋前一元件直接在後一元件上(例如,與後一元件實體接觸)的狀況以及一或複數個介入元件位於前一元件與後一元件之間的狀況。Unless otherwise specified, such as "above", "below", "up", "left", "right", "down", "top", "bottom", "vertical", "horizontal", "side" , "Higher", "Lower", "Upper", "Above", "Below" and other space descriptions indicate the directions shown in the figure. It should be understood that the spatial description used in this article is for illustrative purposes only, and the actual implementation of the structure described in this article can be spatially arranged in any relative direction, and this restriction will not change the advantages of the creative embodiment. For example, in the description of some embodiments, providing an element "on" another element can cover the situation where the previous element is directly on the next element (for example, in physical contact with the next element) and a Or a situation where a plurality of intervening elements are located between the previous element and the next element.

如本文中所使用,術語「大致」、「實質上」、「實質的」及「約」用以描述及考慮微小之變化。當與事件或情形結合使用時,該等術語可意指事件或情形明確發生之情況以及事件或情形極近似於發生之情況。As used herein, the terms "approximately", "substantial", "substantial" and "about" are used to describe and consider minor changes. When used in conjunction with an event or situation, these terms can mean a situation in which the event or situation clearly occurs and an event or situation that closely approximates the situation in which it occurred.

以上所述之實施例僅係為說明本創作之技術思想及特點,其目的在使熟習此項技藝之人士能夠瞭解本創作之內容並據以實施,當不能以之限定本創作之專利範圍,依本創作所揭示之精神所作之均等變化或修飾,仍應涵蓋在本創作之專利範圍內。The above-mentioned embodiments are only to illustrate the technical ideas and characteristics of this creation, and their purpose is to enable those who are familiar with this art to understand the content of this creation and implement them accordingly. When it cannot be used to limit the scope of patents of this creation, Equal changes or modifications made in accordance with the spirit of this creation should still be covered by the scope of the patent of this creation.

1:烘焙裝置 2:檢測裝置 3:控制裝置 4:內筒 5, 5':外筒 6:第一驅動裝置 7:第二驅動裝置 8, 8':導引柱 8a:第一導引柱 8b:第二導引柱 9, 9':外蓋 10:第一檢測單元 12:第二檢測單元 14:影像擷取裝置 16:光源 20:殼體 22:彈性遮蔽件 24:接收口 26:透明容器 30:儀表板 32:按鍵 40:第一環形壁 42:底蓋 44:容置空間 46:第一開孔 50:第二環形壁 52:齒條 54:第二開孔 56:第三開孔 70:動力源 72:齒輪 80:左側 82:右側 84:閘門 86:通道 90:支架 100:烘焙及檢測系統 200:烘焙及檢測系統 300:烘焙及檢測系統 400:物件 420:物件 A:軸心 R1:第一路徑 R2:第二路徑 1: Baking device 2: Detection device 3: control device 4: inner cylinder 5, 5': Outer cylinder 6: The first driving device 7: The second driving device 8, 8': guide post 8a: The first guide column 8b: second guide column 9, 9': Outer cover 10: The first detection unit 12: The second detection unit 14: Image capture device 16: light source 20: shell 22: Elastic shield 24: receiving port 26: transparent container 30: Dashboard 32: Button 40: The first annular wall 42: bottom cover 44: housing space 46: first opening 50: second annular wall 52: rack 54: second opening 56: third opening 70: power source 72: Gear 80: left 82: right 84: Gate 86: Channel 90: bracket 100: Baking and inspection system 200: Baking and inspection system 300: Baking and inspection system 400: Object 420: Object A: Axis R1: first path R2: second path

圖1為本創作第一實施例之烘焙及檢測系統之立體圖。 圖2為本創作圖1之烘焙及檢測系統之側視圖。 圖3為本創作圖1之烘焙及檢測系統之第一作動之局部剖面圖。 圖4為本創作圖1之烘焙及檢測系統之第二作動之局部剖面圖。 圖5為本創作圖1之烘焙及檢測系統之第三作動之局部剖面圖。 圖6為本創作第二實施例之烘焙及檢測系統之第一作動之局部剖面圖。 圖7為本創作圖6之烘焙及檢測系統之第二作動之局部剖面圖。 圖8為本創作圖6之烘焙及檢測系統之第三作動之局部剖面圖。 圖9為本創作第三實施例之烘焙及檢測系統之立體圖。 圖10為本創作圖9之烘焙及檢測系統之第一作動之局部剖面圖。 圖11為本創作圖9之烘焙及檢測系統之第二作動之局部剖面圖。 圖12為本創作圖9之烘焙及檢測系統之第三作動之局部剖面圖。 Figure 1 is a three-dimensional view of the baking and inspection system of the first embodiment of the creation. Figure 2 is a side view of the baking and inspection system created in Figure 1. Figure 3 is a partial cross-sectional view of the first action of the baking and inspection system created in Figure 1. Figure 4 is a partial cross-sectional view of the second actuation of the baking and inspection system created in Figure 1. Figure 5 is a partial cross-sectional view of the third action of the baking and inspection system created in Figure 1. 6 is a partial cross-sectional view of the first action of the baking and inspection system of the second embodiment of the creation. Figure 7 is a partial cross-sectional view of the second actuation of the baking and inspection system created in Figure 6. Figure 8 is a partial cross-sectional view of the third actuation of the baking and inspection system created in Figure 6. Fig. 9 is a perspective view of the baking and inspection system of the third embodiment of the creation. Figure 10 is a partial cross-sectional view of the first action of the baking and inspection system created in Figure 9. Figure 11 is a partial cross-sectional view of the second actuation of the baking and inspection system created in Figure 9. Figure 12 is a partial cross-sectional view of the third action of the baking and inspection system created in Figure 9.

1:烘焙裝置 1: Baking device

2:檢測裝置 2: Detection device

3:控制裝置 3: control device

4:內筒 4: inner cylinder

5:外筒 5: Outer cylinder

6:第一驅動裝置 6: The first driving device

7:第二驅動裝置 7: The second driving device

8:導引柱 8: guide post

9:外蓋 9: Outer cover

20:殼體 20: shell

22:彈性遮蔽件 22: Elastic shield

24:接收口 24: receiving port

30:儀表板 30: Dashboard

32:按鍵 32: Button

40:第一環形壁 40: The first annular wall

42:底蓋 42: bottom cover

50:第二環形壁 50: second annular wall

52:齒條 52: rack

70:動力源 70: power source

72:齒輪 72: Gear

90:支架 90: bracket

100:烘焙及檢測系統 100: Baking and inspection system

A:軸心 A: Axis

Claims (14)

一種烘焙及檢測系統,包括: 一烘焙裝置,其包括: 一中空內筒,其可受一第一外力而沿一第一路徑繞一軸心旋轉,該內筒包含一第一環形壁,該第一環形壁內形成一容置空間且具有一第一開孔與該容置空間相連通;及 一中空外筒,其設置於該內筒之至少一部分外,並可受一第二外力而至少於一第一位置及一第二位置間移動,該外筒具有一第二開孔;及 一檢測裝置,鄰近於該烘焙裝置設置,且具有一接收口,該接收口對應於該外筒於該第二位置時之該第二開孔; 其中該第一開孔於該第一路徑旋轉時係至少與該外筒於該第一位置及該第二位置時之該第二開孔對齊。 A baking and detection system, including: A baking device, which includes: A hollow inner cylinder, which can be subjected to a first external force to rotate along a first path around an axis, the inner cylinder includes a first annular wall, the first annular wall forms an accommodation space and has a The first opening communicates with the accommodating space; and A hollow outer cylinder, which is arranged outside at least a part of the inner cylinder and can be moved at least between a first position and a second position by a second external force, the outer cylinder having a second opening; and A detecting device arranged adjacent to the baking device and having a receiving opening corresponding to the second opening when the outer cylinder is in the second position; The first opening is at least aligned with the second opening when the outer cylinder is at the first position and the second position when the first path rotates. 如請求項1之烘焙及檢測系統,更包括: 一控制裝置,用以控制該內筒及該外筒之運動,其中 於一接收狀態時,該控制裝置控制該內筒與該外筒均靜止不動,且該第一開孔對應於該外筒於該第一位置的該第二開孔;及 於一釋放狀態時,該控制裝置控制該內筒旋轉,而該外筒移動而使該第二開孔移動至該第二位置,以使該第一開孔的該第一路徑的一部分對應於該第二開孔,且該接收口對應於該第二開孔。 For example, the baking and inspection system of claim 1, including: A control device for controlling the movement of the inner cylinder and the outer cylinder, wherein In a receiving state, the control device controls both the inner cylinder and the outer cylinder to be stationary, and the first opening corresponds to the second opening of the outer cylinder at the first position; and In a released state, the control device controls the inner cylinder to rotate, and the outer cylinder moves to move the second opening to the second position, so that a part of the first path of the first opening corresponds to The second opening, and the receiving opening corresponds to the second opening. 如請求項1之烘焙及檢測系統,其中該烘焙裝置更包括: 一第一驅動裝置,耦接該內筒,以提供該第一外力至該內筒;及 一第二驅動裝置,耦接該外筒,以提供該第二外力至該外筒。 Such as the baking and detection system of claim 1, wherein the baking device further includes: A first driving device coupled to the inner cylinder to provide the first external force to the inner cylinder; and A second driving device is coupled to the outer cylinder to provide the second external force to the outer cylinder. 如請求項3之烘焙及檢測系統,其中 該外筒更包含一第二環形壁及至少一齒條,該齒條設置於該第二環形壁外; 該第二驅動裝置包括一動力源以及一齒輪,該動力源機械耦接該齒輪,且該齒輪嚙合該齒條。 Such as the baking and inspection system of claim 3, where The outer cylinder further includes a second annular wall and at least one rack, and the rack is disposed outside the second annular wall; The second driving device includes a power source and a gear, the power source is mechanically coupled to the gear, and the gear engages the rack. 如請求項1之烘焙及檢測系統,其中該外筒更包含中空之一導引柱,設置於該第二開孔處並向外延伸,該導引柱與該第二開孔相連通。For example, the baking and inspection system of claim 1, wherein the outer cylinder further includes a hollow guide post, which is arranged at the second opening and extends outward, and the guide post is in communication with the second opening. 如請求項5之烘焙及檢測系統,其中該外筒更包含一外蓋,其以可活動的方式樞接於該導引柱,以控制該導引柱內一通道之啟閉。Such as the baking and inspection system of claim 5, wherein the outer cylinder further includes an outer cover pivotally connected to the guide column in a movable manner to control the opening and closing of a channel in the guide column. 如請求項5之烘焙及檢測系統,其中於一釋放狀態時,該導引柱移動至該檢測裝置之該接收口處。For example, the baking and detection system of claim 5, wherein in a released state, the guide column moves to the receiving port of the detection device. 如請求項1之烘焙及檢測系統,其中該檢測裝置包含: 一殼體,其具有該接收口; 一第一檢測單元,其用以檢測一第一性質;及 一第二檢測單元,其用以檢測一第二性質。 For example, the baking and detection system of claim 1, wherein the detection device includes: A housing with the receiving port; A first detection unit for detecting a first property; and A second detection unit for detecting a second property. 如請求項8之烘焙及檢測系統,其中該第一檢測單元包含一影像擷取裝置及一光源。Such as the baking and detection system of claim 8, wherein the first detection unit includes an image capture device and a light source. 如請求項8之烘焙及檢測系統,其中該第二檢測單元包含一近紅外光檢測器。Such as the baking and detection system of claim 8, wherein the second detection unit includes a near infrared light detector. 如請求項8之烘焙及檢測系統,其中該檢測裝置更包含一彈性遮蔽件,設置於該接收口,以遮蔽該接收口。Such as the baking and detection system of claim 8, wherein the detection device further includes an elastic shielding member disposed at the receiving port to shield the receiving port. 如請求項1之烘焙及檢測系統,其中該外筒係受該第二外力而沿該軸心旋轉。Such as the baking and inspection system of claim 1, wherein the outer cylinder is rotated along the axis by the second external force. 一種烘焙及檢測系統,包括: 一烘焙裝置,其包括: 一中空內筒,其可受一第一外力而沿一第一路徑繞一軸心旋轉,該內筒包含一第一環形壁,該第一環形壁內形成一容置空間且具有一第一開孔,其與該容置空間相連通;及 一中空外筒,其設置於該內筒之至少一部分外,並可受一第二外力而移動,該外筒具有一第二開孔、一第三開孔、一蓋體及一閘門,該蓋體及該閘門分別以移動的方式開啟或關閉該第二開孔及該第三開孔,且該第一開孔於該第一路徑移動時對齊於該第二開孔或該第三開孔;及 一檢測裝置,鄰近於該烘焙裝置設置,且具有一接收口,該接收口對應於該第三開口。 A baking and detection system, including: A baking device, which includes: A hollow inner cylinder, which can be subjected to a first external force to rotate along a first path around an axis, the inner cylinder includes a first annular wall, the first annular wall forms an accommodation space and has a The first opening is communicated with the accommodating space; and A hollow outer cylinder is arranged outside at least a part of the inner cylinder and can be moved by a second external force. The outer cylinder has a second opening, a third opening, a cover and a gate. The cover and the gate respectively open or close the second opening and the third opening in a movable manner, and the first opening is aligned with the second opening or the third opening when the first path moves Hole; and A detection device is arranged adjacent to the baking device and has a receiving opening corresponding to the third opening. 如請求項13之烘焙及檢測系統,更包含一控制裝置,其可令該蓋體及該閘門移動,以分別控制該第二開孔及該第三開孔之啟閉。For example, the baking and detection system of claim 13 further includes a control device that can move the cover and the gate to control the opening and closing of the second opening and the third opening respectively.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI782330B (en) * 2020-09-25 2022-11-01 財團法人食品工業發展研究所 Roasting and detection system and method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI782330B (en) * 2020-09-25 2022-11-01 財團法人食品工業發展研究所 Roasting and detection system and method

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