TWM598019U - Infrared thermal imaging device for detecting processing error of printed circuit board - Google Patents

Infrared thermal imaging device for detecting processing error of printed circuit board Download PDF

Info

Publication number
TWM598019U
TWM598019U TW109203982U TW109203982U TWM598019U TW M598019 U TWM598019 U TW M598019U TW 109203982 U TW109203982 U TW 109203982U TW 109203982 U TW109203982 U TW 109203982U TW M598019 U TWM598019 U TW M598019U
Authority
TW
Taiwan
Prior art keywords
infrared
printed circuit
circuit board
window
plate
Prior art date
Application number
TW109203982U
Other languages
Chinese (zh)
Inventor
陳景翔
郭勁甫
Original Assignee
佰驟智能有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 佰驟智能有限公司 filed Critical 佰驟智能有限公司
Priority to TW109203982U priority Critical patent/TWM598019U/en
Publication of TWM598019U publication Critical patent/TWM598019U/en

Links

Images

Abstract

一種紅外熱影像檢測印刷電路板製程誤差裝置包括一紅外線照相機,一紅外線視窗(IR Window),一平板及一加熱器。紅外線視窗設置於紅外線照相機上方。平板設置於紅外線視窗上方。加熱器設置於平板上方。紅外線視窗與平板之間可放置一測試樣品。加熱器可產生熱能,並由平板及測試樣品吸收以提高溫度。紅外線照相機可截取紅外光影像,此紅外光影像經處理後可將每一畫素的紅外光影像轉換成每一畫素的相對應溫度。 An infrared thermal image detection printed circuit board manufacturing process error device includes an infrared camera, an infrared window (IR Window), a flat plate and a heater. The infrared window is arranged above the infrared camera. The flat panel is arranged above the infrared window. The heater is arranged above the plate. A test sample can be placed between the infrared window and the flat panel. The heater generates heat energy, which is absorbed by the plate and test sample to increase the temperature. An infrared camera can capture infrared light images, and the infrared light image can be processed to convert the infrared light image of each pixel into the corresponding temperature of each pixel.

Description

紅外熱影像檢測印刷電路板製程誤差裝置 Infrared thermal image detection printed circuit board manufacturing process error device

本創作係有關於一種紅外熱影像檢測印刷電路板製程誤差裝置。 This creation is related to an infrared thermal image detection device for printed circuit board manufacturing process errors.

軟性印刷電路板(Flexible Printed Circuit Board,FPCB)又稱軟板,具輕、薄、耐彎曲、低電壓、低消耗功率等特性,目前被大量應用在消費性電子產品、通訊產品、電腦設備、汽車、軍事等領域。 Flexible Printed Circuit Board (FPCB), also known as FPCB, has the characteristics of lightness, thinness, bending resistance, low voltage, and low power consumption. It is currently widely used in consumer electronics, communication products, computer equipment, Automobile, military and other fields.

請參閱第1圖,第1圖係軟性印刷電路板之一剖面結構示意圖,軟性印刷電路板100包括一軟性基板(Flexible Substrate)10及一覆蓋膜(Cover Layer)20。軟性基板10係將軟性銅箔基板(Flexible Copper Clad Laminate,FCCL)13和軟性絕緣基材11先經由接著劑12貼附後壓合,再經蝕刻等加工過程,最後留下所需的銅線路作為電子訊號傳輸媒介。覆蓋膜20係由軟性絕緣基材22及接著劑21組成,其主要功能為防止銅線路氧化及保護銅線路免受環境溫、濕度之影響。 Please refer to FIG. 1. FIG. 1 is a schematic cross-sectional structure diagram of a flexible printed circuit board. The flexible printed circuit board 100 includes a flexible substrate 10 and a cover layer 20. The flexible substrate 10 is a flexible copper clad laminate (FCCL) 13 and a flexible insulating base material 11 that are first attached via an adhesive 12 and then pressed together, and then subjected to processing processes such as etching, and finally the required copper circuit is left As an electronic signal transmission medium. The cover film 20 is composed of a flexible insulating substrate 22 and an adhesive 21, and its main function is to prevent oxidation of the copper circuit and protect the copper circuit from environmental temperature and humidity.

覆蓋膜一般經由機器自動貼合,有時可能超過一層的覆蓋膜被貼在軟性基板表面,造成軟性印刷電路板無法彎折或者電路不通,使得軟性印刷電路板必須重工或報廢,徒增生產成本。傳統採用接觸掃描方式檢測覆蓋膜層數,往往需耗費大量時間,不符經濟效益。 The cover film is usually automatically attached by a machine. Sometimes more than one layer of the cover film may be attached to the surface of the flexible substrate, causing the flexible printed circuit board to be unable to bend or the circuit to be blocked, making the flexible printed circuit board to be reworked or scrapped, which increases production costs . The traditional contact scanning method to detect the number of cover film layers often takes a lot of time and is not economical.

有鑑於此,本創作之主要目的在於提供一種紅外熱影像檢測印刷電路板製程誤差裝置,以非接觸方式檢測軟性印刷電路板之覆蓋膜層數,可大幅降低檢測時間,降低生產成本。 In view of this, the main purpose of this creation is to provide an infrared thermal imaging device for detecting printed circuit board manufacturing process errors, which can detect the number of cover film layers of flexible printed circuit boards in a non-contact manner, which can greatly reduce the inspection time and reduce production costs.

本創作之紅外熱影像檢測印刷電路板製程誤差裝置包括一紅外線照相機,一紅外線視窗(IR Window),一平板及一加熱器。紅外線視窗設置於紅外線照相機上方。平板設置於紅外線視窗上方。加熱器設置於平板上方。紅外線視窗與平板之間可放置一測試樣品。加熱器可產生熱能,並由平板及測試樣品吸收以提高溫度。紅外線照相機可截取紅外光影像,此紅外光影像經處理後可將每一畫素的紅外光影像轉換成每一畫素的相對應溫度。 The infrared thermal image detection device for printed circuit board manufacturing process error of this creation includes an infrared camera, an infrared window (IR Window), a flat plate and a heater. The infrared window is arranged above the infrared camera. The flat panel is arranged above the infrared window. The heater is arranged above the plate. A test sample can be placed between the infrared window and the flat panel. The heater generates heat energy, which is absorbed by the plate and test sample to increase the temperature. An infrared camera can capture infrared light images, and the infrared light image can be processed to convert the infrared light image of each pixel into the corresponding temperature of each pixel.

其中紅外線視窗(IR Window)只允許中波長紅外線(Mid-wavelength Infrared,MWIR)通過。 The IR Window only allows Mid-wavelength Infrared (MWIR) to pass through.

其中加熱器可將平板及測試樣品加熱升溫最高至100℃左右。 Among them, the heater can heat the plate and the test sample up to about 100°C.

其中平板之材質可為不銹鋼、銅或碳化矽(SiC)。 The material of the plate can be stainless steel, copper or silicon carbide (SiC).

其中紅外線視窗之材質可為硫化鋅(ZnSe)、鍺(Ge)或矽(Si)。 The material of the infrared window can be zinc sulfide (ZnSe), germanium (Ge) or silicon (Si).

其中紅外線照相機可移動以調整紅外線照相機至測試樣品或平板之一垂直距離,以截取清晰的紅外光影像。 The infrared camera can be moved to adjust the vertical distance between the infrared camera and the test sample or the flat panel to capture clear infrared light images.

其中紅外線視窗可移動、平板可移動或紅外線視窗與平板可同時移動,以調整紅外線視窗至平板之一垂直距離,使測試樣品被紅外線視窗及平板壓合。 The infrared window can be moved, the plate can be moved, or the infrared window and the plate can be moved simultaneously to adjust the vertical distance between the infrared window and the plate, so that the test sample is pressed by the infrared window and the plate.

其中紅外線照相機解析度為1024x1024像素或2048x2048像 素。 The resolution of the infrared camera is 1024x1024 pixels or 2048x2048 pixels Prime.

其中測試樣品可為軟性印刷電路板(FPCB,Flexible Printed Circuit Board)。 The test sample may be a flexible printed circuit board (FPCB, Flexible Printed Circuit Board).

為使本創作之上述目的、特徵、和優點能更明顯易懂,下文特舉較佳實施例並配合所附圖式做詳細說明。 In order to make the above-mentioned purpose, features, and advantages of this creation more obvious and understandable, the following will specifically describe the preferred embodiments in conjunction with the accompanying drawings.

100:軟性印刷電路板 100: Flexible printed circuit board

10:軟性基板 10: Flexible substrate

11:軟性絕緣基材 11: Flexible insulating substrate

12:接著劑 12: Adhesive

13:軟性銅箔基板 13: Flexible copper foil substrate

20:覆蓋膜 20: Cover film

21:接著劑 21: Adhesive

22:軟性絕緣基材 22: Flexible insulating substrate

200:紅外熱影像檢測印刷電路板製程誤差裝置 200: Infrared thermal image detection printed circuit board process error device

110:紅外線照相機 110: Infrared camera

120:紅外線視窗 120: infrared window

130:平板 130: tablet

140:加熱器 140: heater

150:軟性印刷電路板 150: flexible printed circuit board

第1圖係軟性印刷電路板之一剖面結構示意圖。 Figure 1 is a schematic cross-sectional structure diagram of a flexible printed circuit board.

第2圖係依據本創作之紅外熱影像檢測印刷電路板製程誤差裝置之一實施例示意圖。 FIG. 2 is a schematic diagram of an embodiment of an apparatus for detecting PCB manufacturing process errors based on the infrared thermal image of the present invention.

第3圖係本創作之紅外熱影像檢測印刷電路板製程誤差裝置檢測軟性印刷電路板之示意圖。 Figure 3 is a schematic diagram of the infrared thermal image detection printed circuit board manufacturing process error device of this creation to detect flexible printed circuit boards.

請參閱第2圖,第2圖係本創作之紅外熱影像檢測印刷電路板製程誤差裝置之一實施例示意圖。紅外熱影像檢測印刷電路板製程誤差裝置200包括一紅外線照相機110、一紅外線視窗120、一平板130及一加熱器140。紅外線視窗120設置於紅外線照相機110上方。平板130設置於紅外線視窗120上方。加熱器140設置於平板130上方。紅外線視窗120與平板130之間可放置一測試樣品(未圖示),此測試樣品可以為軟性印刷電路板(FPCB,Flexible Printed Circuit Board)。加熱器140可產生熱能並由平板130及測試樣品吸收,使得平板130及測試樣品升溫最高至100℃左右。紅外線視窗(IR Window)只允許中波長紅外線 (Mid-wavelength Infrared,MWIR)通過。紅外線照相機110可移動以調整紅外線照相機110至測試樣品或平板130之一垂直距離,以截取清晰的紅外光影像,此紅外光影像經處理後可將每一畫素的紅外光影像轉換成每一畫素的相對應溫度。 Please refer to Figure 2. Figure 2 is a schematic diagram of an embodiment of the device for detecting printed circuit board manufacturing process errors with infrared thermal images of this invention. The infrared thermal image detection printed circuit board process error device 200 includes an infrared camera 110, an infrared window 120, a flat plate 130 and a heater 140. The infrared window 120 is disposed above the infrared camera 110. The flat plate 130 is disposed above the infrared window 120. The heater 140 is disposed above the plate 130. A test sample (not shown) can be placed between the infrared window 120 and the flat plate 130, and the test sample can be a flexible printed circuit board (FPCB, Flexible Printed Circuit Board). The heater 140 can generate heat energy and be absorbed by the flat plate 130 and the test sample, so that the flat plate 130 and the test sample are heated up to about 100°C. IR Window only allows mid-wavelength infrared (Mid-wavelength Infrared, MWIR) passed. The infrared camera 110 can move to adjust the vertical distance between the infrared camera 110 and the test sample or the flat plate 130 to capture a clear infrared light image. After the infrared light image is processed, the infrared light image of each pixel can be converted into each The corresponding temperature of the pixel.

底下將更進一步詳細說明紅外熱影像檢測印刷電路板製程誤差裝置測量軟性印刷電路板之過程。 The process of measuring the flexible printed circuit board by the infrared thermal image detection printed circuit board manufacturing process error device will be explained in further detail below.

請再參閱第2圖,先將加熱器140之電源開關(未圖示)打開進行加熱,使得平板130之溫度升溫至大約100℃,再使用紅外線照相機110拍攝平板130之一紅外線影像,此紅外線影像經分析後可得到每一畫素的起始溫度T0,每一畫素的起始溫度即可對應到平板130表面之每一區域的起始溫度。 Please refer to Figure 2 again. First, turn on the power switch (not shown) of the heater 140 for heating, so that the temperature of the plate 130 rises to about 100°C, and then use the infrared camera 110 to take an infrared image of the plate 130. After the image is analyzed, the starting temperature T 0 of each pixel can be obtained, and the starting temperature of each pixel can correspond to the starting temperature of each area on the surface of the flat plate 130.

請參閱第3圖。接著將一軟性印刷電路板150放置於紅外線視窗120及平板130之間,使軟性印刷電路板150之覆蓋膜(未圖示)面向紅外線照相機110,紅外線照相機110拍攝覆蓋膜(未圖示)之一紅外線影像,此紅外線影像經分析後可得到每一畫素的最終溫度T1,每一畫素的最終溫度即可對應到覆蓋膜(未圖示)表面之每一區域的最終溫度。最後再分析處理溫度差△T(△T=T1-T0)即可判斷出覆蓋膜的層數。 Please refer to Figure 3. Next, a flexible printed circuit board 150 is placed between the infrared window 120 and the flat plate 130 so that the cover film (not shown) of the flexible printed circuit board 150 faces the infrared camera 110, and the infrared camera 110 photographs the cover film (not shown) An infrared image. After the infrared image is analyzed, the final temperature T 1 of each pixel can be obtained. The final temperature of each pixel can correspond to the final temperature of each area on the surface of the cover film (not shown). Finally, analyze and process the temperature difference △T (△T=T 1 -T 0 ) to determine the number of layers of the cover film.

雖然本發明已以實施方式揭露如上,然其並非用以限定本發明,任何熟悉此技藝者,在不脫離本發明的精神和範圍內,當可作各種的更動與潤飾,因此本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone familiar with the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection of the present invention The scope shall be subject to the scope of the attached patent application.

200:紅外熱影像檢測印刷電路板製程誤差裝置 200: Infrared thermal image detection printed circuit board process error device

110:紅外線照相機 110: Infrared camera

120:紅外線視窗 120: infrared window

130:平板 130: tablet

140:加熱器 140: heater

Claims (9)

一種紅外熱影像檢測印刷電路板製程誤差裝置,包括: An infrared thermal image detection device for printed circuit board manufacturing process errors, including: 一紅外線照相機; An infrared camera 一紅外線視窗(IR Window),該紅外線視窗設置於該紅外線照相機上方; An infrared window (IR Window), the infrared window is arranged above the infrared camera; 一平板,該平板設置於該紅外線視窗上方;以及 A flat plate which is arranged above the infrared window; and 一加熱器,該加熱器設置於該平板上方; A heater, the heater is arranged above the plate; 其中該紅外線視窗與該平板之間可放置一測試樣品; A test sample can be placed between the infrared window and the plate; 其中該加熱器可產生熱能,並由該平板以及該測試樣品吸收以提高溫度; The heater can generate heat energy, which is absorbed by the plate and the test sample to increase the temperature; 其中該紅外線照相機可截取一紅外光影像,該紅外光影像經處理後可將每一畫素的紅外光影像轉換成每一畫素的相對應溫度。 The infrared camera can capture an infrared light image, and the infrared light image can be processed to convert the infrared light image of each pixel into the corresponding temperature of each pixel. 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該紅外線視窗(IR Window)只允許中波長紅外線(Mid-wavelength Infrared,MWIR)通過。 As described in the first item of the scope of the patent application, the infrared thermal image detection printed circuit board process error device, wherein the infrared window (IR Window) only allows mid-wavelength infrared (Mid-wavelength Infrared, MWIR) to pass. 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該加熱器可將該平板以及該測試樣品加熱升溫最高至100℃左右。 As described in the first item of the scope of patent application, the infrared thermal image detection printed circuit board manufacturing process error device, wherein the heater can heat the plate and the test sample up to about 100°C. 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該平板之材質可為不銹鋼、銅或碳化矽(SiC)。 As described in the first item of the scope of the patent application, the infrared thermal image detection printed circuit board manufacturing process error device, wherein the material of the flat plate can be stainless steel, copper or silicon carbide (SiC). 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該紅外線視窗之材質可為硫化鋅(ZnSe)、鍺(Ge)或矽(Si)。 In the infrared thermal image detection printed circuit board process error device described in the first item of the patent application, the material of the infrared window can be zinc sulfide (ZnSe), germanium (Ge) or silicon (Si). 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該紅外線照相機可移動以調整該紅外線照相機至該測試樣品或該平板之一垂直距離,以截取清晰的該紅外光影像。 As described in the first item of the scope of patent application, the infrared thermal image detection printed circuit board process error device, wherein the infrared camera can be moved to adjust the vertical distance between the infrared camera and the test sample or the flat plate to capture the clear infrared Light image. 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該紅外線視窗可移動、該平板可移動或該紅外線視窗與該平板可同時移動,以調整該紅外線視窗至該平板之一垂直距離,使該測試樣品被該紅外線視窗以及該平板壓合。 For example, the infrared thermal image detection printed circuit board process error device described in the first item of the patent application, wherein the infrared window can be moved, the plate can be moved, or the infrared window and the plate can be moved at the same time to adjust the infrared window to the A vertical distance of the flat plate enables the test sample to be pressed together by the infrared window and the flat plate. 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該紅外線照相機解析度為1024x1024像素或2048x2048像素。 As described in the first item of the scope of patent application, the infrared thermal image detection printed circuit board process error device, wherein the infrared camera has a resolution of 1024x1024 pixels or 2048x2048 pixels. 如申請專利範圍第1項所述之紅外熱影像檢測印刷電路板製程誤差裝置,其中該測試樣品可為軟性印刷電路板(FPCB,Flexible Printed Circuit Board)。 As described in the first item of the scope of patent application, the infrared thermal image detection printed circuit board manufacturing process error device, wherein the test sample can be a flexible printed circuit board (FPCB, Flexible Printed Circuit Board).
TW109203982U 2020-04-07 2020-04-07 Infrared thermal imaging device for detecting processing error of printed circuit board TWM598019U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW109203982U TWM598019U (en) 2020-04-07 2020-04-07 Infrared thermal imaging device for detecting processing error of printed circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW109203982U TWM598019U (en) 2020-04-07 2020-04-07 Infrared thermal imaging device for detecting processing error of printed circuit board

Publications (1)

Publication Number Publication Date
TWM598019U true TWM598019U (en) 2020-07-01

Family

ID=72602809

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109203982U TWM598019U (en) 2020-04-07 2020-04-07 Infrared thermal imaging device for detecting processing error of printed circuit board

Country Status (1)

Country Link
TW (1) TWM598019U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114877839A (en) * 2022-05-25 2022-08-09 上海哥瑞利软件股份有限公司 Error detection method after point position adjustment of semiconductor packaging bonding wire
TWI808622B (en) * 2022-01-21 2023-07-11 國立高雄科技大學 Temperature-controlled heat source processing system and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI808622B (en) * 2022-01-21 2023-07-11 國立高雄科技大學 Temperature-controlled heat source processing system and method
CN114877839A (en) * 2022-05-25 2022-08-09 上海哥瑞利软件股份有限公司 Error detection method after point position adjustment of semiconductor packaging bonding wire
CN114877839B (en) * 2022-05-25 2023-05-16 上海哥瑞利软件股份有限公司 Error detection method after adjustment of bonding wire point positions of semiconductor package

Similar Documents

Publication Publication Date Title
TWM598019U (en) Infrared thermal imaging device for detecting processing error of printed circuit board
JP5853476B2 (en) Infrared detector and electronic device
TWI468703B (en) Wiring testing method, wiring testing device, wiring testing computer program product, and storage medium
US8316532B2 (en) Method of producing a wired circuit board
TWI289658B (en) Substrate inspection device and inspection method
US7298887B2 (en) System for and method of analyzing surface condition of PCB using RGB colors
JP2007108110A (en) Method and device for inspecting substrate
JPS59218938A (en) Method for testing wiring pattern of printed board
WO2013005841A1 (en) Method for determining laminate direction for laminate type electronic component, laminate direction determination device for laminate type electronic component, method for manufacturing serial laminate type electronic component, and manufacturing device for serial laminate type electronic component
US6340817B1 (en) Inspection method for unpopulated printed circuit boards
JP2011007627A (en) Base material, and method and apparatus for measuring minute displacement of the base material
JP2014074706A (en) Visibility evaluation method for transparent base material, positioning method for laminate and manufacturing method for printed circuit board
KR102626352B1 (en) Method and device for inspecting defect on substrate
Remes et al. Non-contact characterization of flexible hybrid electronics by synchronized thermography
JPS59218967A (en) Method for testing wiring pattern of printed circuit board
WO2020107647A1 (en) Repairing method in manufacturing process for array substrate
CN101426340A (en) Producing method of wired circuit board
TWI296705B (en) Device and method for inspecting a matrix substrate
JP2008292303A (en) Connection state inspection device, connection state inspection method, and connection system
JP2013145162A (en) Inspection device and module assembly apparatus
JP7353209B2 (en) dummy wafer
US20120262612A1 (en) Electro optical modulator, electro optical sensor, and detecting method thereof
TWI684769B (en) Electronic component testing module, manufacturing method and testing method thereof
TWI724432B (en) Automatic detection system and method
KR100853861B1 (en) Apparatus and method for testing inkjet printed circuit board