TWM585351U - Testing device - Google Patents

Testing device Download PDF

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Publication number
TWM585351U
TWM585351U TW108209107U TW108209107U TWM585351U TW M585351 U TWM585351 U TW M585351U TW 108209107 U TW108209107 U TW 108209107U TW 108209107 U TW108209107 U TW 108209107U TW M585351 U TWM585351 U TW M585351U
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Taiwan
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test pattern
pattern unit
lens
light source
unit
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TW108209107U
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Chinese (zh)
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李昌遠
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儀銳實業有限公司
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Publication of TWM585351U publication Critical patent/TWM585351U/en

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Abstract

A testing device for testing an optical device is disclosed. The testing device includes a test pattern unit, a light source, a lens and a drive unit. The light source provides light which penetrates the test pattern unit. The test pattern unit is positioned on the same axis as the lens and is located between the light source and the lens. The drive unit drives the test pattern unit to displace along the axis so as to adjust the distance between the test pattern unit and the lens.

Description

檢測組件Detection component

本新型係關於一種檢測組件,尤其指一種可調整物距的檢測組件,適用於對光學裝置進行不同物距的光學檢測。The present invention relates to a detection component, in particular to a detection component with adjustable object distance, which is suitable for optical detection of optical devices with different object distances.

科技的演進使得光學裝置,如鏡頭或相機模組,在尺寸、規格和使用方式上都有所改變,而由於光學裝置在出廠前都會經過光學測試以確保其品質,其需要測試的項目也跟著增加。光學檢測最早是用無窮遠處對焦的設備,其利用平行光產生成像,可為正投影檢測或逆投影檢測;後來的近拍技術就需要光學裝置通過有限距離的對焦檢測。因此,現今許多光學裝置都需要經過無窮遠處和有限距離這兩種對焦檢測。The evolution of technology has made optical devices, such as lenses or camera modules, change in size, specifications, and use methods. Because optical devices undergo optical tests before they leave the factory to ensure their quality, the items that need to be tested also follow increase. Optical detection was the earliest device that focused at infinity. It uses parallel light to generate imaging, which can be front projection detection or back projection detection. Later macro technology requires optical devices to focus detection through a limited distance. Therefore, many optical devices today need to go through both infinity and limited distance focus detection.

圖1A顯示習知用以檢測光學裝置的檢測裝置示意圖。檢測裝置101具有光源130、測試圖案132、準直儀140、影像感測器110和計算裝置160。光源130發出光線照射並穿透測試圖案132,形成圖案化光型,圖案化光型通過待測裝置120後由準直儀140模擬成具無窮遠處之成像照射於影像感測器110上,而後計算裝置160擷取影像感測器110的影像資料進行分析。FIG. 1A is a schematic diagram of a conventional detection device for detecting an optical device. The detection device 101 includes a light source 130, a test pattern 132, a collimator 140, an image sensor 110, and a computing device 160. The light source 130 emits light and penetrates the test pattern 132 to form a patterned light pattern. After the patterned light pattern passes through the device under test 120, it is simulated by the collimator 140 to form an image with infinite distance on the image sensor 110. The computing device 160 then captures the image data of the image sensor 110 for analysis.

圖1B顯示另一種習知用以檢測光學裝置的檢測裝置示意圖。檢測裝置102與圖1B的檢測裝置101相似,差異在於檢測裝置102中的待測裝置120到準直儀140之間的光路,產生的是虛像。且測試圖案132可以移到測試圖案133的位置對待測裝置120進行不同的有限距離的對焦測試。FIG. 1B shows a schematic diagram of another conventional detection device for detecting an optical device. The detection device 102 is similar to the detection device 101 in FIG. 1B. The difference is that the optical path between the device under test 120 and the collimator 140 in the detection device 102 generates a virtual image. And the test pattern 132 can be moved to the position of the test pattern 133 to perform different limited distance focusing tests on the device to be tested 120.

換言之,於習知技術中,在完成對待測裝置進行無窮遠處的對焦測試後,需要先移開準直儀,然後依需求移動測試圖案到適當位置以便進行有限距離的對焦測試,且每次檢測新的待測裝置時,都需要重複上述移動準直儀及測試圖案的步驟。此作法不但費時,也很不方便。In other words, in the conventional technology, after the infinity focus test of the device under test is completed, the collimator needs to be removed first, and then the test pattern is moved to an appropriate position to perform a limited distance focus test, and each time When testing a new device under test, the steps of moving the collimator and testing the pattern described above need to be repeated. This is not only time-consuming but also inconvenient.

因此,為了克服習知技術的不足之處,本新型實施例所述之檢測組件利用驅動單元調整測試圖案單元和鏡頭之間的距離,使鏡頭可以根據測試圖案之距離而投射出無窮遠處的成像或有限距離的成像,以便在使用同一檢測組件的情況下對待測之光學裝置進行無窮遠處和有限距離兩種對焦檢測。Therefore, in order to overcome the shortcomings of the conventional technology, the detection component described in the embodiment of the present invention uses a driving unit to adjust the distance between the test pattern unit and the lens, so that the lens can project an infinite distance according to the distance of the test pattern Imaging or limited-distance imaging, so that the optical device to be tested can be used for both infinity and limited-distance focus detection with the same detection component.

本新型之目的為提供一種適用於檢測一光學裝置之檢測組件,包括測試圖案單元、光源以及驅動單元。測試圖案單元具有測試圖案,而光源具有光線以供穿透測試圖案。驅動單元連接測試圖案單元,用以驅動測試圖案單元沿著光線穿透測試圖案的軸線進行位移。The purpose of the present invention is to provide a detection component suitable for detecting an optical device, including a test pattern unit, a light source, and a driving unit. The test pattern unit has a test pattern, and the light source has light for penetrating the test pattern. The driving unit is connected to the test pattern unit, and is used for driving the test pattern unit to move along the axis through which the light penetrates the test pattern.

本新型之另一目的為提供一種適用於檢測一光學裝置之檢測組件,包括測試圖案單元、光源、驅動單元以及鏡頭。測試圖案單元和鏡頭位於同一軸線上,且測試圖案單元位於光源和鏡頭之間。驅動單元連接測試圖案單元且驅動測試圖案單元沿著軸線位移,以調整測試圖案單元和鏡頭之間的距離。Another object of the present invention is to provide a detection component suitable for detecting an optical device, including a test pattern unit, a light source, a driving unit, and a lens. The test pattern unit and the lens are located on the same axis, and the test pattern unit is located between the light source and the lens. The driving unit is connected to the test pattern unit and drives the test pattern unit to move along the axis to adjust the distance between the test pattern unit and the lens.

可選地,所述光源設置於所述驅動單元和所述測試圖案單元之間。Optionally, the light source is disposed between the driving unit and the test pattern unit.

可選地,所述光源連接所述測試圖案單元,且當所述測試圖案單元位移時,所述光源連動的位移。Optionally, the light source is connected to the test pattern unit, and when the test pattern unit is displaced, the light source is displaced in linkage.

可選地,所述檢測組件更包括軌道,其中所述測試圖案單元設於其上且沿著軌道位移。Optionally, the detection component further includes a track, wherein the test pattern unit is disposed thereon and is displaced along the track.

可選地,所述檢測組件更包括鏡頭架,用以架設一鏡頭於所述軸線上,其中所述測試圖案單元位於所述光源和鏡頭之間。另外,所述驅動單元驅動所述測試圖案單元沿著所述軸線位移以調整測試圖案單元和鏡頭之間的距離。Optionally, the detection component further includes a lens holder for mounting a lens on the axis, wherein the test pattern unit is located between the light source and the lens. In addition, the driving unit drives the test pattern unit to be displaced along the axis to adjust a distance between the test pattern unit and the lens.

可選地,所述驅動單元為馬達。Optionally, the driving unit is a motor.

可選地,所述鏡頭為定焦鏡頭。Optionally, the lens is a fixed focus lens.

總而言之,本新型透過驅動單元改變測試圖案單元的成像位置,測試圖案單元的成像位置與待測的光學裝置的距離為待測的光學裝置的物距。透過改變測試圖案單元的成像位置,即可以對待測的光學裝置進行不同物距的成像測試。因此,相對於先前技術,本新型提供了一個更便利且檢測效率更佳的檢測組件。In a word, the new type changes the imaging position of the test pattern unit through the driving unit. The distance between the imaging position of the test pattern unit and the optical device to be measured is the object distance of the optical device to be measured. By changing the imaging position of the test pattern unit, imaging tests with different object distances can be performed on the optical device to be tested. Therefore, compared with the prior art, the present invention provides a more convenient and better detection component.

為讓本新型之上述和其他目的、特徵及優點能更明顯易懂,配合所附圖示,做詳細說明如下。In order to make the above and other objects, features, and advantages of the present model more comprehensible, the accompanying drawings are described in detail below.

為充分瞭解本新型之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本新型做一詳細說明,說明如後。In order to fully understand the purpose, characteristics and effects of the present invention, the following specific embodiments and the accompanying drawings are used to make a detailed description of the present invention, which will be described later.

本新型實施例提供一種用於檢測光學裝置的檢測組件,以解決習知需要使用不同或多個檢測設備單元以達到對光學裝置進行無窮遠處和有限距離兩種對焦檢測。進一步地,本新型實施例利用驅動單元移動測試圖案單元,來調整測試圖案單元和鏡頭之間的距離。檢測光學裝置時,檢測組件之鏡頭可依據距離投射出無窮遠處或有限距離的成像到光學裝置和影像感測器,與影像感測器連接之電腦裝置即可分析光學裝置在無窮遠與有限距的光學特性。The embodiment of the present invention provides a detection component for detecting an optical device, so as to solve the conventional need to use different or multiple detection equipment units to achieve two types of focus detection of the optical device at infinite distance and limited distance. Further, the embodiment of the present invention uses the driving unit to move the test pattern unit to adjust the distance between the test pattern unit and the lens. When detecting an optical device, the lens of the detection component can project an infinite distance or a limited distance to the optical device and the image sensor according to the distance. The computer device connected to the image sensor can analyze the optical device at infinity and limited. Distance optical characteristics.

首先,請參照圖2,圖2是本新型實施例之檢測組件的示意圖。如圖2所示,檢測組件200包括光源210、測試圖案單元220、驅動單元230以及鏡頭240。光源210可提供光線用以照射測試圖案單元220。測試圖案單元220位於光源210和鏡頭240之間並具有可透光之測試圖案,舉例來說,測試圖案單元220可以是遮光罩,而測試圖案則是於遮光罩上刻出的圖案,例如十字形,但測試圖案的形狀不用以限制本新型。驅動單元230連接測試圖案單元220以便驅動測試圖案單元220位移,進而調整測試圖案單元220和鏡頭240之間的距離d。First, please refer to FIG. 2, which is a schematic diagram of a detection component according to an embodiment of the present invention. As shown in FIG. 2, the detection assembly 200 includes a light source 210, a test pattern unit 220, a driving unit 230, and a lens 240. The light source 210 can provide light to illuminate the test pattern unit 220. The test pattern unit 220 is located between the light source 210 and the lens 240 and has a light-transmissive test pattern. For example, the test pattern unit 220 may be a hood, and the test pattern is a pattern engraved on the hood, such as ten Glyph, but the shape of the test pattern need not limit the new model. The driving unit 230 is connected to the test pattern unit 220 so as to drive the test pattern unit 220 to be displaced, thereby adjusting the distance d between the test pattern unit 220 and the lens 240.

檢測組件200之光源210、測試圖案單元220、驅動單元230以及鏡頭240可經由設置於底座250上而整合為一個單件。底座250上更可設置軌道260,其中測試圖案單元240設置於軌道260上且沿著軌道260進行位移。The light source 210, the test pattern unit 220, the driving unit 230, and the lens 240 of the detection component 200 can be integrated into a single piece by being disposed on the base 250. The base 250 can further include a track 260, wherein the test pattern unit 240 is disposed on the track 260 and is displaced along the track 260.

於本實施例中,光源210連接測試圖案單元220,因此當測試圖案單元220位移時,光源210連動的位移。光源210和測試圖案單元220可以是如圖2所示為兩個連接的組件或是如圖2長虛點線所示為整合的單一組件。光源210可以是LED照明系統或任何提供光線穿透測試圖案的裝置。另外,光源210依據待檢測的光學裝置400的用途,而可以是可見光、不可見光、寬頻或窄頻的光源。In this embodiment, the light source 210 is connected to the test pattern unit 220. Therefore, when the test pattern unit 220 is displaced, the light source 210 is displaced in conjunction. The light source 210 and the test pattern unit 220 may be two connected components as shown in FIG. 2 or integrated single components as shown by the long dotted line in FIG. 2. The light source 210 may be an LED lighting system or any device that provides a light penetration test pattern. In addition, the light source 210 may be a visible light, an invisible light, a broadband or a narrow-band light source according to the application of the optical device 400 to be detected.

當測試圖案單元220被驅動單元230驅動位移時,其係朝著鏡頭240進行水平方向的位移。換句話說,測試圖案單元220和鏡頭240之間的距離d之改變僅為距離線長度的增加或減少,而距離線軸向是不變的。When the test pattern unit 220 is driven and displaced by the driving unit 230, it is displaced horizontally toward the lens 240. In other words, the change in the distance d between the test pattern unit 220 and the lens 240 is only an increase or decrease in the distance line length, and the distance line axial direction is constant.

接著,請參照圖3,其顯示本新型實施例之檢測組件200的結構。檢測組件200的底座250上設有光源210、測試圖案單元220、驅動裝置230以及鏡頭240。其中光源210和測試圖案單元220經由連結件215連接,並透過承載架280架設於軌道260上。鏡頭240則透過鏡頭架270架設於底座250上,且鏡頭240和測試圖案單元220位於同一軸線A上。當驅動單元230驅動測試圖案單元220作動時,測試圖案單元220沿著軌道260和軸線A位移,相對並朝向鏡頭240前進或後退。Next, please refer to FIG. 3, which shows the structure of the detection assembly 200 according to the embodiment of the present invention. The base 250 of the detection assembly 200 is provided with a light source 210, a test pattern unit 220, a driving device 230, and a lens 240. The light source 210 and the test pattern unit 220 are connected via a connecting member 215 and are mounted on the rail 260 through the supporting frame 280. The lens 240 is mounted on the base 250 through the lens holder 270, and the lens 240 and the test pattern unit 220 are located on the same axis A. When the driving unit 230 drives the test pattern unit 220 to operate, the test pattern unit 220 is displaced along the track 260 and the axis A, and advances or retreats relative to and toward the lens 240.

驅動單元230可以是馬達,如線性馬達、伺服馬達、步進馬達、旋轉馬達等,或任何可以促使測試圖案單元210移動的裝置,本新型並不加以限定。The driving unit 230 may be a motor, such as a linear motor, a servo motor, a stepping motor, a rotary motor, or any other device that can cause the test pattern unit 210 to move, which is not limited in the present invention.

鏡頭240和測試圖案單元220之間的距離d,或更詳細的說,鏡頭240和圖案化光型的距離,可決定鏡頭240投射出的成像是位在無窮遠距離或有限距離,而不同的成像即可用來檢測不同的光學特性。因利用公式{ }計算鏡頭240的焦距f、像距q 與物距p (即本新型之距離d) 為習知技術, 此處不再贅述。鏡頭240可以是定焦鏡頭,或任何可以投射出無窮遠處和有限距離之成像的鏡頭,本發明並不加以限定。於本實施例中,鏡頭240是已經設置在檢測組件200裡,但於其他實施例中,檢測組件可以僅設有鏡頭架,而鏡頭則於進行光學檢測時再架設於鏡頭架上。 The distance d between the lens 240 and the test pattern unit 220, or more specifically, the distance between the lens 240 and the patterned light pattern, may determine whether the imaging projected by the lens 240 is located at an infinite distance or a limited distance, and is different Imaging can be used to detect different optical characteristics. Thanks to the formula { } Calculating the focal length f, image distance q, and object distance p (that is, the distance d of the new model) of the lens 240 is a conventional technique, and is not repeated here. The lens 240 may be a fixed focus lens, or any lens capable of projecting imaging at infinity and a limited distance, which is not limited in the present invention. In this embodiment, the lens 240 is already installed in the detection component 200, but in other embodiments, the detection component may be provided with only a lens holder, and the lens is mounted on the lens holder during optical detection.

圖4是本新型實施例之檢測組件200使用於檢測光學裝置的狀態示意圖。在光學檢測的環境中,檢測組件200和影像感測器500分別設置於待測之光學裝置400的前後兩端。當進行光學裝置400在無窮遠處之光學特性的檢測時,檢測組件200的驅動單元230接收由控制機台(未示)發出的控制指令並依照控制指令驅動測試圖案單元220移到可令鏡頭240投射出無窮遠成像的位置。檢測時,光源210的光線穿透測試圖案單元220的測試圖案,形成未成像之圖案化光型,透過鏡頭240投射出無窮遠的圖案化光型,進而通過待測之光學裝置400並成像於影像感測器500。影像感測器500再把影像資料傳送到電腦裝置(未示)進行無窮遠光學特性的分析。FIG. 4 is a schematic diagram of a state in which the detection assembly 200 of the embodiment of the present invention is used in a detection optical device. In an optical detection environment, the detection component 200 and the image sensor 500 are respectively disposed at the front and rear ends of the optical device 400 to be measured. When detecting the optical characteristics of the optical device 400 at infinity, the driving unit 230 of the detection module 200 receives a control instruction issued by a control machine (not shown) and drives the test pattern unit 220 to move the lens according to the control instruction. 240 projects the position of infinity imaging. During the detection, the light from the light source 210 penetrates the test pattern of the test pattern unit 220 to form an unimaged patterned light pattern, projects an infinite patterned light pattern through the lens 240, and then passes through the optical device 400 to be measured and is imaged on Image sensor 500. The image sensor 500 then transmits the image data to a computer device (not shown) for analysis of infinite optical characteristics.

接下來對同一個光學裝置400進行在有限距離之光學特性的檢測時,檢測組件200的驅動單元230接收由控制機台(未示)發出的另一個控制指令並依照控制指令驅動測試圖案單元220移到可令鏡頭240投射出有限距成像的位置。檢測時,光源210的光線穿透測試圖案單元220的測試圖案,形成未成像之圖案化光型,透過鏡頭240投射出有限距的圖案化光型,進而通過光學裝置400並成像於影像感測器500。影像感測器500再把影像資料傳送到電腦裝置(未示)進行有限距光學特性的分析。Next, when the optical characteristics of the same optical device 400 are measured at a limited distance, the driving unit 230 of the detection module 200 receives another control instruction issued by the control machine (not shown) and drives the test pattern unit 220 according to the control instruction. Move to a position where the lens 240 can project a limited distance image. During the detection, the light from the light source 210 penetrates the test pattern of the test pattern unit 220 to form an unimaged patterned light pattern. A limited distance patterned light pattern is projected through the lens 240, and then passes through the optical device 400 and is imaged on the image sensor.器 500。 500. The image sensor 500 then transmits the image data to a computer device (not shown) for analysis of the optical characteristics at a limited distance.

如此一來,光學裝置400的兩種光學特性:無窮遠距離及有限距離,皆可以使用檢測組件200做檢測。亦即,可以使用同樣的檢測設備做無窮遠對焦檢測和有限距離對焦檢測,不需再另加或移除檢測設備,因此增加了光學檢測的便利性。In this way, the two optical characteristics of the optical device 400: infinite distance and limited distance, can be detected by the detection component 200. That is, the same detection device can be used for infinity focus detection and limited distance focus detection, without the need to add or remove the detection device, thereby increasing the convenience of optical detection.

圖5A和圖5B分別為本案新型另一實施例之檢測組件300的俯視示意圖和側視示意圖。檢測組件300包括光源310、測試圖案單元320、驅動單元330以及鏡頭架370,其中鏡頭340可透過鏡頭架370架設在測試圖案單元320鄰近,並組裝至底座350。測試圖案單元320透過移動件365連接到驅動單元330,而驅動單元330利用移動件365驅動測試圖案單元320位移。於此實施例中,光源310雖然與測試圖案單元320結構上分離,但其光線仍可在穿透測試圖案單元320的測試圖案後照射到鏡頭340,也因此,當測試圖案單元320沿著光線穿透測試圖案的軸線位移時,光源310不會連動位移。5A and 5B are a schematic top view and a side view of a detection component 300 according to another embodiment of the present invention. The detection component 300 includes a light source 310, a test pattern unit 320, a driving unit 330, and a lens frame 370. The lens 340 can be mounted adjacent to the test pattern unit 320 through the lens frame 370 and assembled to the base 350. The test pattern unit 320 is connected to the driving unit 330 through the moving member 365, and the driving unit 330 uses the moving member 365 to drive the test pattern unit 320 to be displaced. In this embodiment, although the light source 310 is structurally separated from the test pattern unit 320, its light can still reach the lens 340 after passing through the test pattern of the test pattern unit 320. Therefore, when the test pattern unit 320 is along the light When the axis penetrating the test pattern is displaced, the light source 310 does not move in tandem.

本新型實施例揭露了驅動單元以軌道和移動件的方式驅動測試圖案單元位移,但其僅為實施例中的範例,並不限定本新型驅動單元和測試圖案單元的連接關係和驅動實施方式。The embodiment of the present invention discloses that the driving unit drives the displacement of the test pattern unit in the manner of a track and a moving member, but it is only an example in the embodiment, and does not limit the connection relationship and the driving implementation manner of the new driving unit and the test pattern unit.

綜合以上所述,本新型實施例提供的檢測組件係利用驅動單元驅動測試圖案單元位移以調整測試圖案單元和鏡頭之間的距離,使鏡頭可因應物距而投射無窮遠處或有限距離的成像,而投射出的成像可用來檢測光學裝置的光學特性。如此,使用者,例如廠商,在設有本新型之檢測組件和影像感測器的檢測環境中置入待測之光學裝置後,即可分別進行無窮遠對焦檢測和有限距對焦檢測,然後擷取影像資訊並分析後,取得光學裝置在無窮遠處和有限距離的光學特性。本新型實施例提供的檢測組件可於光學檢測時自動切換兩種對焦檢測,無需再添增或移除檢測設備,因此可減少光學檢測的成本和增加檢測效率。To sum up, the detection component provided by the new embodiment uses a driving unit to drive the displacement of the test pattern unit to adjust the distance between the test pattern unit and the lens, so that the lens can project imaging at infinite or limited distance according to the object distance. , And the projected image can be used to detect the optical characteristics of the optical device. In this way, a user, such as a manufacturer, can place an infinity focus detection and a limited distance focus detection separately after placing the optical device to be tested in the detection environment provided with the new type of detection component and image sensor, and then capture After taking image information and analyzing it, the optical characteristics of the optical device at infinity and at a limited distance are obtained. The detection component provided by the new embodiment can automatically switch between two types of focus detection during optical detection, without adding or removing detection equipment, so it can reduce the cost of optical detection and increase detection efficiency.

本新型在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,上述實施例僅用於描繪本新型,而不應解讀為限制本新型之範圍。應注意的是,舉凡與前述實施例等效之變化與置換,均應設為涵蓋於本新型之範疇內。因此,本新型之保護範圍當以申請專利範圍所界定者為準。The present invention has been disclosed in the foregoing with a preferred embodiment. However, those skilled in the art should understand that the above embodiments are only used to describe the present invention and should not be interpreted as limiting the scope of the present invention. It should be noted that all changes and substitutions equivalent to the foregoing embodiments should be included in the scope of the present invention. Therefore, the protection scope of this new model shall be the one defined by the scope of patent application.

101‧‧‧檢測裝置
102‧‧‧檢測裝置
110‧‧‧影像感測器
120‧‧‧待測裝置
130‧‧‧光源
132‧‧‧測試圖案
133‧‧‧測試圖案
140‧‧‧準直儀
160‧‧‧計算裝置
200‧‧‧檢測組件
210‧‧‧光源
215‧‧‧連結件
220‧‧‧測試圖案單元
230‧‧‧驅動單元
240‧‧‧鏡頭
250‧‧‧底座
260‧‧‧軌道
270‧‧‧鏡頭架
280‧‧‧承戴架
300‧‧‧檢測組件
310‧‧‧光源
320‧‧‧測試圖案單元
330‧‧‧驅動單元
340‧‧‧鏡頭
350‧‧‧移動件
365‧‧‧底座
370‧‧‧鏡頭架
400‧‧‧光學裝置
500‧‧‧影像感測器
101‧‧‧detection device
102‧‧‧Detection device
110‧‧‧Image Sensor
120‧‧‧device under test
130‧‧‧light source
132‧‧‧test pattern
133‧‧‧Test pattern
140‧‧‧collimator
160‧‧‧ Computing Device
200‧‧‧Detection components
210‧‧‧ light source
215‧‧‧link
220‧‧‧Test pattern unit
230‧‧‧Drive unit
240‧‧‧ lens
250‧‧‧ base
260‧‧‧ track
270‧‧‧ lens holder
280‧‧‧bearing rack
300‧‧‧Detection components
310‧‧‧light source
320‧‧‧test pattern unit
330‧‧‧Drive unit
340‧‧‧ lens
350‧‧‧ moving parts
365‧‧‧base
370‧‧‧ lens holder
400‧‧‧ Optical device
500‧‧‧Image Sensor

圖1A顯示習知光學測試裝置。FIG. 1A shows a conventional optical test device.

圖1B顯示另一習知光學測試裝置。FIG. 1B shows another conventional optical test device.

圖2是本新型實施例之檢測組件的俯視示意圖。FIG. 2 is a schematic top view of a detection component according to the embodiment of the present invention.

圖3是本新型實施例之檢測組件的結構示意圖。FIG. 3 is a schematic structural diagram of a detection component according to the embodiment of the present invention.

圖4是本新型實施例之檢測組件使用於檢測光學裝置時的狀態示意圖。FIG. 4 is a schematic diagram of a state of the detection assembly according to the embodiment of the present invention when it is used in a detection optical device.

圖5A與圖5B分別是本新型另一實施例之檢測組件的俯視示意圖及側視示意圖。5A and 5B are a schematic plan view and a side view of a detection component according to another embodiment of the present invention.

Claims (13)

一種檢測組件,適用於檢測一光學裝置,該檢測組件包括:
一測試圖案單元,具有一測試圖案;
一光源,用以提供光線穿透該測試圖案;以及
一驅動單元,連接該測試圖案單元;
其中該驅動單元驅動該測試圖案單元沿著該光線穿透該測試圖案的軸線進行位移。
A detection component is suitable for detecting an optical device. The detection component includes:
A test pattern unit having a test pattern;
A light source for providing light to penetrate the test pattern; and a driving unit connected to the test pattern unit;
The driving unit drives the test pattern unit to be displaced along an axis through which the light penetrates the test pattern.
如請求項第1項所述之檢測組件,更包括:
一底座,其中該測試圖案單元、該光源和該驅動單元設於該底座上。
The detection component described in item 1 of the request item further includes:
A base, wherein the test pattern unit, the light source and the driving unit are disposed on the base.
如請求項第1項所述之檢測組件,其中光源設置於該驅動單元和該測試圖案單元之間。The detection component according to claim 1, wherein the light source is disposed between the driving unit and the test pattern unit. 如請求項第1項所述之檢測組件,其中該光源連接該測試圖案單元,且當該測試圖案單元位移時,該光源連動的位移。The detection component according to claim 1, wherein the light source is connected to the test pattern unit, and when the test pattern unit is displaced, the light source is displaced in linkage. 如請求項第1項所述之檢測組件,更包括:
一軌道,其中該測試圖案單元設於其上,且該測試圖案單元沿著該軌道位移。
The detection component described in item 1 of the request item further includes:
A track in which the test pattern unit is disposed thereon, and the test pattern unit is displaced along the track.
如請求項第1項所述之檢測組件,更包括:
一鏡頭架,用以架設一鏡頭於該軸線上,其中該測試圖案單元位於該光源和該鏡頭之間。
The detection component described in item 1 of the request item further includes:
A lens holder is used to mount a lens on the axis, wherein the test pattern unit is located between the light source and the lens.
如請求項第6項所述之檢測組件,其中該驅動單元驅動該測試圖案單元沿著該軸線位移,以調整該測試圖案單元和該鏡頭之間的距離。The detection component according to claim 6, wherein the driving unit drives the test pattern unit to move along the axis to adjust a distance between the test pattern unit and the lens. 一種檢測組件,適用於檢測一光學裝置,該檢測組件包括:
一光源;
一鏡頭;
一測試圖案單元,設於該光源和該鏡頭之間;以及
一驅動單元,連接該測試圖案單元;
其中該測試圖案單元和該鏡頭位於同一軸線上,且該驅動單元驅動該測試圖案單元沿著該軸線位移以調整該鏡頭和該測試圖案單元之間的距離。
A detection component is suitable for detecting an optical device. The detection component includes:
A light source
A shot
A test pattern unit disposed between the light source and the lens; and a driving unit connected to the test pattern unit;
The test pattern unit and the lens are located on the same axis, and the driving unit drives the test pattern unit to move along the axis to adjust the distance between the lens and the test pattern unit.
如請求項第8項所述之檢測組件,更包括:
一底座,其中該光源該鏡頭該測試圖案單元和該驅動單元設置於該底座上。
The detection component described in item 8 of the request item further includes:
A base, wherein the light source, the lens, the test pattern unit and the driving unit are disposed on the base.
如請求項第8項所述之檢測組件,其中該光源設置於該驅動單元和該測試圖案單元之間。The detection component according to item 8 of the claim, wherein the light source is disposed between the driving unit and the test pattern unit. 如請求項第8項所述之檢測組件,其中該光源連接該測試圖案單元,且當該測試圖案單元位移時,該光源連動的位移。The detection component according to claim 8, wherein the light source is connected to the test pattern unit, and when the test pattern unit is displaced, the light source is displaced in linkage. 如請求項第8項所述之檢測組件,更包括:
一軌道,其中該測試圖案單元設於其上,且該測試圖案單元沿著該軌道位移。
The detection component described in item 8 of the request item further includes:
A track in which the test pattern unit is disposed thereon, and the test pattern unit is displaced along the track.
如請求像第8項所述之檢測組件,其中該鏡頭為一定焦鏡頭。A detection component as described in item 8 is requested, wherein the lens is a fixed focus lens.
TW108209107U 2019-07-12 2019-07-12 Testing device TWM585351U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848663A (en) * 2020-06-10 2021-12-28 三赢科技(深圳)有限公司 Lens module testing device
CN113848663B (en) * 2020-06-10 2024-05-10 三赢科技(深圳)有限公司 Lens module testing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848663A (en) * 2020-06-10 2021-12-28 三赢科技(深圳)有限公司 Lens module testing device
CN113848663B (en) * 2020-06-10 2024-05-10 三赢科技(深圳)有限公司 Lens module testing device

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