TWM583946U - Probe connector structure and test module - Google Patents

Abstract

The present invention discloses a probe connector structure and a test module. The probe connector structure comprises: a fixing base, a probe unit and a metal shielding cover. The metal shielding cover comprises an abutting piece and a shielding piece, and the abutting piece has The opening is exposed for the abutting portion in the fixing seat, and the metal shielding cover can shield the opposite sides of the side edge of the probe unit to reduce radiation emission of the side edge region of the probe unit to achieve shielding radiation The effect of the test module using the probe connector structure of the present invention is that the radiation amount of each frequency can be further effectively suppressed to reach the set specification standard when performing the radiation radiation test.

Description

Probe connector structure and test module

The present invention relates to a probe connector structure and test module, and more particularly to a probe connector structure and test module capable of reducing radiation emission.

In the prior art, the test equipment for testing the system chip is based on specific requirements (for example: signal type, number of channels, number of objects to be tested in parallel, etc.), and has a pluggable circuit board module design to facilitate The required board modules can be replaced for testing purposes to meet diverse testing needs.

The prior art test equipment includes a plurality of circuit board modules and probe connectors for testing a board to be tested, and each of the circuit board modules providing test signals is transmitted through the corresponding probe connector. The test board to be tested is electrically connected. However, the probe connector emits radiation due to current flow during the conduction operation, which is unfavorable for the verification of the radiation test by the existing test equipment.

In order to overcome the deficiencies of the prior art, it is an object of the present invention to provide a probe connector structure having an occlusion structure to reduce emitted radiation.

For the above purpose or other purposes, the present invention discloses a probe connector structure for providing an electrical connection between a carrier to be tested and a test signal generating circuit board. The probe connector structure includes a fixing base and a a probe unit and a metal shielding cover, the fixing base includes a pair of connecting portions and two fixing arms, wherein the two fixing arms are disposed at two ends of the abutting portion and extend perpendicularly with respect to a length of the abutting portion; The needle unit includes a plurality of probes fixed in the abutting portion and arranged in an array, each of the probe portions being exposed under the abutting portion; the metal shielding cover is detachably disposed on the fixing base, the metal The shielding cover includes an abutting piece and a shielding piece, wherein the abutting piece has an opening for exposing the abutting portion, and the shielding piece extends perpendicularly with respect to the abutting piece and shields one side of the probe unit, The metal shielding cover shields a portion of each of the probes exposed under the abutting portion.

In an embodiment of the present invention, the abutting piece of the metal shielding cover has a plurality of abutting elastic pieces.

In an embodiment of the present invention, the metal shielding cover has a half-shield that extends perpendicularly relative to the abutting piece and is disposed on a side opposite to the shielding piece, the semi-shield extending vertically The length is shorter than the shielding piece, and the shielding piece and the half mask cover the exposed portion of the probe under the abutting portion.

In an embodiment of the present invention, the shielding sheet of the metal shielding cover extends vertically in the same length as each of the fixing arms.

In an embodiment of the present invention, the probe unit includes a plurality of offset ejector pins, each of the offset ejector pins has a thimble terminal and a bent terminal, and the bent terminal is offset from the The axis of the thimble terminal is extended and bent.

For the above purpose or other purposes, the present disclosure discloses a test module comprising the above probe connector structure and a test signal generating circuit board, the test signal generating circuit board comprising a universal connector and the universal connector An electrically connected circuit board is inserted into the universal connector, and one end of the probe unit of the probe connector structure is electrically connected to the universal connector, and the probe connector is electrically connected to the universal connector The other end of the probe unit of the structure is electrically connected to the carrier to be tested.

In an embodiment of the present invention, the test signal generating circuit board further includes a reinforcing strip structure, and the fixing board of the circuit board and the probe connector structure is fixed to the reinforcing strip structure.

In an embodiment of the present invention, the fixing seat is fixed to the reinforcing bar structure by two fixing arms.

In an embodiment of the present invention, the metal shielding cover has a shielding sheet and a half shielding sheet. The half shielding sheet is closer to the reinforcing strip structure than the shielding sheet, and the shielding sheet and the half masking sheet are shielded from the shielding sheet. The opposite sides of the probe unit and the side edges of the mount.

Therefore, in the probe connector structure of the present embodiment and the test module having the probe connector structure, the metal shielding cover can shield opposite sides of the side edge of the probe unit, and The amount of radiation emitted from the side edge region of the probe unit can be reduced to reduce or shield the radiation, and the radiation of each frequency is used in the test module using the probe connector structure of the present embodiment. The amount can be further effectively suppressed to reach the set specification standard.

In order to fully understand the purpose, features and effects of this creation, the following specific examples, together with the attached drawings, provide a detailed description of the creation, as explained below:

As used herein, the terms "comprising, including, having" or any other similar terms are intended to be limited to the ones listed herein, but may include, but not Other elements that are often inherent in the device.

In this document, new embodiments may be formed in any combination between the described embodiments or between the technical features without conflict.

Please refer to FIG. 1 and FIG. 2 at the same time, which is an exploded schematic view and a combined schematic view of the probe connector structure of the present embodiment. The probe connector structure of the embodiment is used for providing an electrical connection between a test board (not shown) and a test signal generating circuit board (not shown). For example, the probe connector structure One end is connected to or connected to the test board to be tested, and the other end is abutted or plugged into the test signal generating circuit board to electrically connect the test board to be tested and the test signal generating circuit board. Thereby, the two receive or transmit electrical signals to each other.

The probe connector structure 1 includes a fixing base 10, a probe unit 20 and a metal shielding cover 30. The fixing base 10 includes a pair of connecting portions 11 and two fixing arms 12, and the two fixing arms 12 are disposed thereon. The two ends of the abutting portion 11 extend perpendicularly with respect to the longitudinal direction of the abutting portion 11; the probe unit 20 includes a plurality of probes 21 fixed in the abutting portion 11 and arranged in an array, each of the probes 21 The metal shielding cover 30 includes a contact piece 31 and a shielding piece 32. The metal shielding cover 30 is detachably disposed on the fixing base 10. The metal shielding cover 30 includes an abutting piece 31 and a shielding piece 32. An opening 33 is formed in the mating portion 11 . The shielding sheet 32 extends perpendicularly to the abutting piece 31 and shields one side of the probe unit 20 . The metal shielding cover 30 shields each of the probes 21 . The portion exposed under the abutting portion 11.

As shown in FIG. 1 , the abutting portion 11 and the two fixing arms 12 of the fixing base 10 can be substantially U-shaped; the abutting portion 11 can have a plurality of through holes 111, and the through holes 111 are The arrays are arranged and interposed for the probes 21; the abutting portions 11 may include, but are not limited to, bosses of a generally rectangular cube for insertion into corresponding corresponding insertion holes of the carrier to be tested.

The metal shielding cover 30 is configured to cover the fixing base 10, and the abutting piece 31 of the metal shielding cover 30 corresponds to one side of the fixing seat 10 having the abutting portion 11, and the abutting piece 31 is The opening 33 is provided for the abutting portion 11 to be exposed (FIG. 2), so that the upper ends of the probes 21 provided in the abutting portion 11 can be exposed.

As an example, the material of the metal shield cover 30 can be made of, for example, copper, aluminum, steel, or other metal.

The shielding piece 32 of the metal shielding cover 30 is connected to the abutting piece 31 and extends substantially perpendicular to the abutting piece 31. That is, the shielding piece 32 is substantially perpendicular to the abutting piece 31 when the metal shielding cover 30 is After the cover is disposed on the fixing base 10, the shielding piece 32 can straddle the area between the two fixed arms 12 adjacent to one side of the probe unit 20, and correspondingly shields the between the two fixed arms 12 One side of the probe unit 20 is used to reduce the amount of radiation emitted by the side edge region of the probe unit 20, thereby achieving the effect of reducing radiation.

The length of the shielding piece 32 of the metal shielding cover 30 is perpendicular to the length of each of the fixing arms 12, and the side of the area between the two fixing arms 12 can be shielded.

Please refer to FIG. 3 and FIG. 4 together, which is an exploded perspective view and a schematic view of another perspective view of the probe connector structure of the present embodiment.

Further, as shown in FIG. 3 and FIG. 4 , the metal shielding cover 30 can have a half-mask 35 extending perpendicularly relative to the abutting piece 31 and disposed opposite to the shielding piece 32 . On one side, the amount of radiation emitted by the side edge region of the probe unit 20 can be further reduced. The length of the semi-shield 35 extending vertically is shorter than that of the shielding sheet 32, so that the metal shielding cover 30 forms a notch on one side of the semi-shield 35, and the shielding sheet 32 and the half-mask 35 are The portion of each of the probes 21 exposed under the abutting portion 11 is shielded, and the recess is for exposing a portion of the test signal generating circuit board to facilitate the arrangement or wiring of the electrical connection members.

In this embodiment, the abutting piece 31 of the metal shielding cover 30 has a plurality of abutting elastic pieces 34. Each of the abutting elastic pieces 34 is connected at one end to the abutting piece 31, and the other end is upwardly lifted for elastic contact. The bottom surface of the carrier to be tested is used to achieve grounding.

In the probe unit 20, each of the probes 21 can be a pogo pin (spring probe), and each of the probes 21 is correspondingly abutted or inserted by being exposed to the upper end and the lower end of the abutting portion 11 to The test board and the test signal generating circuit board are electrically connected to the test signal generating circuit board.

Please refer to FIG. 5 , which is a schematic structural diagram of the probe in the present embodiment.

In the probe unit 20, the probes 21 may include a plurality of offset ejector pins 211, each of the offset ejector pins 211 having a thimble terminal 21A and a bent terminal 21B, the bent terminal 21B being offset from the ejector pin The axis of the terminal 21A is extended and bent so that the ejector terminal 21A and the bent terminal 21B of each of the offset ejector pins 211 can be connected to a co-located contact and the position is offset from the offset contact of the co-located contact. Therefore, the probe connector structure of the present embodiment can be applied to the test carrier to be tested with the offset contact, so that the test carrier with the offset contact can be tested with the connector with the same contact. The signal generation circuit board is electrically connected.

For example, corresponding to the position of the test contact of the test board to be tested, the through holes 111 on the mating portion 11 may all be in an array of co-located arrays, or may be partially offset and partially in-situ. For an array, please refer to FIG. 6 , which is a schematic diagram of the top surface of the docking portion 11 in the embodiment. If there is a partial offset through hole 111A, the probe unit 20 can adopt a corresponding The number of offset thimbles 211, the offset distance d of the bent terminal 21B from the axis of the thimble terminal 21A (FIG. 5) is equal to the center point of one of the offset through holes 111A of the abutting portion 11 and the nearest neighbor The center point of the co-located via 111B of one of the columns (or the most adjacent row) extends the pitch D of the line L (Fig. 6).

Please refer to FIG. 7 , which is a schematic structural diagram of a test module in another embodiment of the present invention.

The test module 100 includes the probe connector 1 and a test signal generating circuit board 40. The test signal generating circuit board 40 includes a universal connector 41 and a circuit electrically connected to the universal connector 41. The probe connector structure 1 is inserted into the universal connector 41. One end of the probe unit 20 of the probe connector structure 1 is electrically connected to the universal connector 41. The probe connector is electrically connected to the universal connector 41. The other end of the probe unit 20 of the structure 1 is electrically connected to the carrier to be tested.

Please refer to FIG. 8 , which is a schematic diagram of a test module of another embodiment of the present invention, which is installed in a test device, and is used for plugging into the test device 200 to test the test signal generating circuit. The test signal generated by the board 40 is supplied to the carrier board 50 to be tested.

In this embodiment, the test signal generating circuit board 40 further includes a reinforcing strip structure 43. The reinforcing strip structure 43 can be attached to the circuit board 42 by a screw, and the shape of the reinforcing strip structure 43 mainly corresponds to The strip profile of the edge of the circuit board 42 is used to increase the mechanical strength of the test signal generating circuit board 40; the circuit board 42 and the fixing base 10 of the probe connector structure 1 are fixed to the reinforcing strip structure 43, for example It is said that the fixing base 10 is fixed to the reinforcing strip structure 43 by the two fixing arms 12.

Referring to FIG. 1 to FIG. 4, FIG. 7 and FIG. 8 , in the metal shielding cover 30 of the embodiment, the half mask 35 is closer to the reinforcing strip structure 43 than the shielding sheet 32 , and the shielding sheet 32 and the half The mask 35 is shielded on opposite sides of the side edges of the probe unit 20 and the fixing base 10. The metal shielding cover 30 is locked to the reinforcing structure strip 43 by one side of the half mask 35.

According to the probe connector structure of the present embodiment and the test module having the probe connector structure, the metal shielding cover can shield the opposite sides of the side edge of the probe unit, and The amount of radiation emitted from the side edge region of the probe unit can be reduced to reduce or shield the radiation, and the radiation of each frequency is used in the test module using the probe connector structure of the present embodiment. The amount can be further effectively suppressed to reach the set specification standard.

The present invention has been disclosed in the above preferred embodiments, and it should be understood by those skilled in the art that the present invention is only intended to depict the present invention and should not be construed as limiting the scope of the present invention. It should be noted that variations and permutations equivalent to those of the embodiments are intended to be included within the scope of the present invention. Therefore, the scope of protection of this creation is subject to the definition of the scope of patent application.

1‧‧‧ probe connector structure  10‧‧‧ Fixed seat  11‧‧‧Docking Department  111‧‧‧through hole  111A‧‧‧Positive through hole  111B‧‧‧Peer through hole  12‧‧‧Fixed Arm  20‧‧‧ probe unit  21‧‧‧ probe  211‧‧‧ eccentric thimble  21A‧‧‧Tear terminal  21B‧‧‧Bent terminal  30‧‧‧Metal cover  31‧‧‧ Abutment  32‧‧‧ Masking  33‧‧‧ openings  34‧‧‧Abutment shrapnel  35‧‧‧Half-mask  40‧‧‧Test signal generation board  41‧‧‧Common connector  42‧‧‧ boards  43‧‧‧Strengthened strip structure  50‧‧‧Billing board to be tested  100‧‧‧Test module  200‧‧‧Test equipment  D‧‧‧ offset spacing  D‧‧‧ spacing  L‧‧‧ Extension line  

Fig. 1 is an exploded perspective view showing the structure of a probe connector of the present embodiment.  2 is a schematic view showing the combination of the probe connector structure of the present embodiment.  Fig. 3 is an exploded perspective view showing the structure of the probe connector of the present embodiment.  4 is a schematic view showing a combination of another perspective of the probe connector structure of the present embodiment.  Fig. 5 is a schematic structural view of a probe in the present embodiment.  [Fig. 6] is a schematic view of the top surface of the butting portion in the present embodiment  FIG. 7 is a schematic structural diagram of a test module in another embodiment of the present invention.  8 is a schematic diagram of a test module according to another embodiment of the present invention, which is disposed in a test device.  

Claims (9)

A probe connector structure for providing an electrical connection between a carrier to be tested and a test signal generating circuit board, the probe connector structure comprising:
a fixing base comprising a pair of connecting portions and two fixing arms, wherein the two fixing arms are disposed at two ends of the abutting portion and extend perpendicularly with respect to a length of the abutting portion;
a probe unit comprising a plurality of probes fixed in the mating portion and arranged in an array, each of the probe portions being exposed under the abutting portion; and a metal shielding cover detachably covering the fixing The metal shielding cover includes an abutting piece and a shielding piece, wherein the abutting piece has an opening for exposing the abutting portion, the shielding piece extending perpendicularly relative to the abutting piece and shielding the probe unit On one side, the metal shielding cover shields a portion of each of the probes exposed under the abutting portion. The probe connector structure of claim 1, wherein the abutting piece of the metal shielding cover has a plurality of abutting elastic pieces. The probe connector structure of claim 1 or 2, wherein the metal shielding cover has a half-mask, the half-mask extending perpendicularly relative to the abutting piece and disposed on a side opposite to the shielding piece The length of the semi-shield extending vertically is shorter than the shielding sheet, and the shielding sheet and the half mask shielding a portion of the probe exposed under the abutting portion. The probe connector structure of claim 3, wherein the shielding piece of the metal shielding cover extends vertically to the same length as each of the fixing arms. The probe connector structure of claim 3, wherein the probe unit comprises a plurality of offset thimbles, each of the offset thimbles having a thimble terminal and a bent terminal, the bending The terminal is extended and bent in such a manner as to deviate from the axis of the thimble terminal. A test module comprising:
The probe connector structure of any one of claims 1 to 5; and a test signal generating circuit board comprising a universal connector and a circuit board electrically connected to the universal connector, the probe connection The probe structure is inserted into the universal connector, and one end of the probe unit of the probe connector structure is electrically connected to the universal connector, and the other end of the probe unit of the probe connector structure is for testing Electrical connection of the carrier. The test module of claim 6, wherein the test signal generating circuit board further comprises a reinforcing strip structure, and the fixing board of the circuit board and the probe connector structure is fixed to the reinforcing strip structure. The test module of claim 7, wherein the fixing seat is fixed to the reinforcing bar structure by two fixing arms. The test module of claim 7, wherein the metal shielding cover has a shielding sheet and a half mask, the half mask being closer to the reinforcing strip structure than the shielding sheet, the shielding sheet and the half masking system The opposite sides of the side edges of the probe unit and the fixing seat are shielded.