TWM583545U - Multi-segment elastic conductive probe - Google Patents
Multi-segment elastic conductive probe Download PDFInfo
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- TWM583545U TWM583545U TW107204999U TW107204999U TWM583545U TW M583545 U TWM583545 U TW M583545U TW 107204999 U TW107204999 U TW 107204999U TW 107204999 U TW107204999 U TW 107204999U TW M583545 U TWM583545 U TW M583545U
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- sleeve
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- contact
- recessed hole
- conductive probe
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- 239000000523 sample Substances 0.000 title claims abstract description 44
- 230000006835 compression Effects 0.000 description 7
- 238000007906 compression Methods 0.000 description 7
- 230000008602 contraction Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005484 gravity Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
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Abstract
Description
本創作係涉及一種多段彈性導電探針,尤指以小壓力獲得大壓縮量的一種多段彈性導電探針。 This creation relates to a multi-segment elastic conductive probe, especially a multi-segment elastic conductive probe that obtains a large compression with a small pressure.
目前測試機具所使用的導電探針,為了獲得更良好的接觸導電,都需要使用較大的壓力,增加導電探針的壓縮量,用以避免產生接觸不良而影響測試。但是,一般的導電探針因為針體直徑較小,通常直徑會在3釐米以下,而且其導電探針的結構體中,僅具有單一的彈簧增加接觸導電的作用。從而,一般的導電探針在針體直徑較小、單一彈簧的情況下,為獲得良好的接觸導電效能,必須加大導電探針在測試產品上的壓力。如此,針體直徑小的導電探針容易造成對測試產品的損傷,高壓力的運作同時容易造成導電探針的損耗,造成測試運作過程中,難以達到理想測試效果,如何能以小壓力獲得大壓縮量的導電探針,實為一般的導電探針必要進行的改善。 At present, in order to obtain better contact conductivity, the conductive probes used in testing tools need to use a larger pressure and increase the compression amount of the conductive probes to avoid poor contact and affect the test. However, the diameter of the general conductive probe is generally smaller than 3 cm because the diameter of the needle body is small, and the structure of the conductive probe has only a single spring to increase the contact conductivity. Therefore, in the case of a common conductive probe with a small needle diameter and a single spring, in order to obtain good contact conductivity, the pressure of the conductive probe on the test product must be increased. In this way, the conductive probe with a small needle diameter is likely to cause damage to the test product, and the high pressure operation is also likely to cause the loss of the conductive probe, which makes it difficult to achieve the ideal test effect during the test operation. How can a large pressure be obtained with a small pressure? Compressed conductive probes are a necessary improvement for general conductive probes.
有鑑於此,有必要提供以小壓力獲得大壓縮量的一種多段彈性導電探針。 In view of this, it is necessary to provide a multi-stage elastic conductive probe which obtains a large amount of compression with a small pressure.
本創作提供一種多段彈性導電探針,包括一接觸部、至少一支撐部以及一固定部,該接觸部套接於該支撐部的一端,該支撐部的另一端套接於該固定部,該接觸部與該支撐部的套接處具有一第一卡扣部以及一第一彈性件,使該接觸部可伸縮的設置於該支撐部的一端,該支撐部與該固定部的套接處具有一第二卡扣部以及一第二彈性件,使該支撐部可伸縮的設置於該固定部,且該接觸部被觸壓朝向該支撐部收縮,該支撐部同時朝向該固定部收縮。 The present invention provides a multi-section elastic conductive probe, which includes a contact portion, at least one support portion, and a fixing portion. The contact portion is sleeved on one end of the support portion, and the other end of the support portion is sleeved on the fixing portion. The socket of the contact portion and the support portion has a first buckle portion and a first elastic member, so that the contact portion is telescopically disposed at one end of the support portion, and the socket of the support portion and the fixed portion There is a second buckle portion and a second elastic member, the support portion is telescopically disposed on the fixing portion, and the contact portion is contracted toward the support portion by being pressed, and the support portion is contracted toward the fixing portion at the same time.
相較現有技術,本新型創作多段彈性導電探針,藉由該接觸部、該支撐部與該固定部之間具有彈性的多段套接結構,實現導電探針以小壓力獲得大壓縮量的良好實用效能。 Compared with the prior art, the novel multi-stage elastic conductive probe is created by the elastic multi-section socket structure between the contact portion, the support portion and the fixed portion, so that the conductive probe can achieve good compression with a small pressure. Practical performance.
100‧‧‧多段彈性導電探針 100‧‧‧Multi-stage elastic conductive probe
10‧‧‧接觸部 10‧‧‧Contact
12‧‧‧接觸端 12‧‧‧ contact end
14‧‧‧第一套筒 14‧‧‧first sleeve
20‧‧‧支撐部 20‧‧‧ support
22‧‧‧第一凹孔 22‧‧‧The first concave hole
24‧‧‧第二凹孔 24‧‧‧Second recess
26‧‧‧止擋部 26‧‧‧stop
30‧‧‧固定部 30‧‧‧Fixed section
32‧‧‧固定端 32‧‧‧Fixed end
34‧‧‧第二套筒 34‧‧‧Second sleeve
40‧‧‧第一卡扣部 40‧‧‧First buckle section
401‧‧‧第一凸起部 401‧‧‧first raised part
403‧‧‧第二凸起部 403‧‧‧second raised part
42‧‧‧第一彈性件 42‧‧‧The first elastic member
50‧‧‧第二卡扣部 50‧‧‧Second buckle section
501‧‧‧第三凸起部 501‧‧‧ the third protrusion
503‧‧‧第四凸起部 503‧‧‧ fourth raised part
52‧‧‧第二彈性件 52‧‧‧Second elastic member
圖1係本創作多段彈性導電探針一具體實施例的立體示意圖。 FIG. 1 is a perspective view of a specific embodiment of the multi-stage elastic conductive probe of the present invention.
圖2係圖1多段彈性導電探針的Π-Π的剖視圖。 FIG. 2 is a cross-sectional view of the Π-Π of the multi-stage elastic conductive probe of FIG. 1. FIG.
圖3係圖1多段彈性導電探針的觸壓狀態的剖視圖。 FIG. 3 is a cross-sectional view of a contact pressure state of the multi-stage elastic conductive probe of FIG. 1.
下面將結合附圖對本創作作一具體介紹。 The following will make a specific introduction to this creation with reference to the drawings.
請參閱圖1及圖2,圖1係本創作多段彈性導電探針一具體實施例的立體示意圖。圖2係圖1多段彈性導電探針的Π-Π的剖視圖。圖1中的該多段彈性導電探針100,包括一接觸部10、至少一支撐部20以及一固定部30,該接觸部10位於該多段彈性導電探針100的頂端,且套接於該支撐部20的一 端,該支撐部20的另一端則套接於該固定部30。該接觸部10與該支撐部20的套接處具有一第一卡扣部40以及一第一彈性件42(如圖2所示),而該支撐部20與該固定部30的套接處具有一第二卡扣部50以及一第二彈性件52。該接觸部10藉由該第一卡扣部40以及該第一彈性件42可伸縮的設置於該支撐部20的一端,該支撐部20藉由該第二卡扣部50以及該第二彈性件52可伸縮的設置於該固定部30,且該接觸部10被觸壓朝向該支撐部20收縮,該支撐部20同時朝向該固定部30收縮。本實施例中,該接觸部10具有一接觸端12以及一第一套筒14(如圖2所示),該接觸端12位於該接觸部10的頂端,該第一套筒14位於該接觸部10的內部,該第一套筒14的開口端朝向該支撐部20的一端。另外,該支撐部20的一端具有一第一凹孔22,該第一凹孔22位於該支撐部20的內部,且該第一凹孔22的開口端朝向該第一套筒14,使該第一套筒14開口端與該第一凹孔22開口端套接。具體言之,該接觸部10與該支撐部20一端的套接,是藉由該接觸部10的該第一套筒14的開口端,插入該支撐部20一端的該第一凹孔22的開口端,並由該第一卡扣部40使該接觸部10與該支撐部20一端完成套接接合。 Please refer to FIG. 1 and FIG. 2. FIG. 1 is a schematic perspective view of a specific embodiment of the multi-stage elastic conductive probe of the present invention. FIG. 2 is a cross-sectional view of the Π-Π of the multi-stage elastic conductive probe of FIG. 1. FIG. The multi-stage elastic conductive probe 100 in FIG. 1 includes a contact portion 10, at least one support portion 20, and a fixing portion 30. The contact portion 10 is located at the top of the multi-stage elastic conductive probe 100 and is sleeved on the support. Part 20 of a The other end of the supporting portion 20 is sleeved on the fixing portion 30. The sleeve portion of the contact portion 10 and the support portion 20 has a first buckle portion 40 and a first elastic member 42 (as shown in FIG. 2), and the sleeve portion of the support portion 20 and the fixing portion 30. There is a second buckle portion 50 and a second elastic member 52. The contact portion 10 is telescopically disposed at one end of the support portion 20 by the first buckle portion 40 and the first elastic member 42. The support portion 20 is provided by the second buckle portion 50 and the second elasticity. The member 52 is telescopically disposed on the fixing portion 30, and the contact portion 10 is contracted toward the support portion 20 by being pressed, and the support portion 20 is contracted toward the fixing portion 30 at the same time. In this embodiment, the contact portion 10 has a contact end 12 and a first sleeve 14 (as shown in FIG. 2). The contact end 12 is located at the top of the contact portion 10, and the first sleeve 14 is located at the contact. Inside the portion 10, the open end of the first sleeve 14 faces one end of the support portion 20. In addition, one end of the support portion 20 has a first recessed hole 22, which is located inside the support portion 20, and an open end of the first recessed hole 22 faces the first sleeve 14 so that the The open end of the first sleeve 14 is sleeved with the open end of the first recessed hole 22. Specifically, the socket of the contact portion 10 and one end of the support portion 20 is inserted into the first recessed hole 22 at one end of the support portion 20 through the open end of the first sleeve 14 of the contact portion 10. At the open end, the first buckling portion 40 enables the contact portion 10 and one end of the supporting portion 20 to be sleeved together.
請參閱圖2所示,該接觸部10與該支撐部20一端的套接,主要是該接觸部10插入該支撐部20的一端,並由該接觸部10的該第一套筒14的開口端,相對該支撐部20一端的該第一凹孔22的開口端進行套接接合。本實施例中,該第一套筒14開口端與該第一凹孔22開口端之間藉由該第一卡扣部40進行套接接合。該第一卡扣部40包括一第一凸起部401以及一第二凸起部403,該第一凸起部401位於該第一套筒14開口端的外緣,該第二凸起部403位於該第一凹孔22開口端的內緣,該第一凸起部401與該第二凸起部403在該 第一套筒14開口端與該第一凹孔22開口端相互卡持,穩固該接觸部10在該支撐部20一端的套接。具體言之,該第一卡扣部40的該第一凸起部401與該第二凸起部403,是分別在該第一套筒14開口端與該第一凹孔22開口端設置,且該第一凸起部401是在該第一套筒14開口端的外緣,該第二凸起部403則是在該第一凹孔22開口端的內緣,藉由該第一套筒14開口端與該第一凹孔22開口端的套接,該第一凸起部401與該第二凸起部403即可相互卡持,使該接觸部10穩固的套接在該支撐部20的一端不會脫離,達成該接觸部10與該支撐部20的套接連結。其中,該第一套筒14與該第一凹孔22相對套接的內部設置該第一彈性件42,使得該第一凸起部401與該第二凸起部403相互卡持具有伸張彈力,維持該接觸部10凸伸於該支撐部20的一端並具有彈性。 Please refer to FIG. 2, the socket of the contact portion 10 and one end of the support portion 20 is mainly inserted into one end of the support portion 20 through the opening of the first sleeve 14 of the contact portion 10. The end is sleeve-jointed to the open end of the first recessed hole 22 at one end of the support portion 20. In this embodiment, the first end of the first sleeve 14 and the open end of the first recessed hole 22 are sleeved and engaged by the first buckle portion 40. The first latching portion 40 includes a first protruding portion 401 and a second protruding portion 403. The first protruding portion 401 is located on the outer edge of the open end of the first sleeve 14, and the second protruding portion 403. The first protruding portion 401 and the second protruding portion 403 are located on the inner edge of the open end of the first recessed hole 22. The open end of the first sleeve 14 and the open end of the first recessed hole 22 are clamped to each other, and the socket of the contact portion 10 at one end of the support portion 20 is stabilized. Specifically, the first protruding portion 401 and the second protruding portion 403 of the first latching portion 40 are respectively provided at the open end of the first sleeve 14 and the open end of the first recessed hole 22, The first protruding portion 401 is at the outer edge of the open end of the first sleeve 14, and the second protruding portion 403 is at the inner edge of the open end of the first recessed hole 22. The open end is sleeved with the open end of the first recessed hole 22, and the first raised portion 401 and the second raised portion 403 can be engaged with each other, so that the contact portion 10 is firmly sleeved on the supporting portion 20. One end is not detached, and the sleeve 10 is connected to the contact portion 10 and the support portion 20. Wherein, the first sleeve 14 and the first recessed hole 22 are oppositely sleeved to each other, and the first elastic member 42 is provided, so that the first protruding portion 401 and the second protruding portion 403 are clamped to each other and have a stretch elastic force. , Maintaining the contact portion 10 protruding from one end of the support portion 20 and having elasticity.
請再參閱圖2,該固定部30具有一固定端32以及一第二套筒34,該固定端32位於該固定部30的底端,該第二套筒34位於該固定部30的內部,而該第二套筒34的開口端朝向該支撐部20的另一端。另外,該支撐部20的另一端具有一第二凹孔24,該第二凹孔24位於該支撐部20的內部,且該第二凹孔24的開口端朝向該第二套筒34的開口端,使該第二套筒34開口端與該第二凹孔24開口端套接。具體言之,該固定部30與該支撐部20另一端的套接,主要是藉由該支撐部20的另一端,插入該固定部30的該第二套筒34的開口端,使該支撐部20的另一端與該固定部30套接接合。換言之,該固定部30與該支撐部20另一端的套接,是該支撐部20另一端插入該固定部30,並藉由該支撐部20另一端的該第二凹孔24開口端與該固定部30的該第二套筒34開口端進行套接接合。再者,該第二凹孔24開口端與該第二套筒34開口端之間藉由該第二卡扣部50進行套接接合。 Please refer to FIG. 2 again, the fixing portion 30 has a fixing end 32 and a second sleeve 34. The fixing end 32 is located at the bottom end of the fixing portion 30. The second sleeve 34 is located inside the fixing portion 30. The open end of the second sleeve 34 faces the other end of the support portion 20. In addition, the other end of the support portion 20 has a second recessed hole 24, which is located inside the support portion 20, and the open end of the second recessed hole 24 faces the opening of the second sleeve 34. End, the open end of the second sleeve 34 is sleeved with the open end of the second recessed hole 24. Specifically, the socket of the fixing portion 30 and the other end of the supporting portion 20 is mainly inserted into the open end of the second sleeve 34 of the fixing portion 30 through the other end of the supporting portion 20 to enable the support. The other end of the portion 20 is sleeve-engaged with the fixing portion 30. In other words, the fixing of the fixing portion 30 and the other end of the support portion 20 is that the other end of the support portion 20 is inserted into the fixing portion 30 and the opening end of the second recess hole 24 at the other end of the support portion 20 is connected to the The open end of the second sleeve 34 of the fixing portion 30 is sleeve-jointed. Moreover, the second concave hole 24 and the open end of the second sleeve 34 are sleeved and engaged by the second buckle portion 50.
本實施例中,該第二卡扣部50包括一第三凸起部501以及一第四凸起部503,該第三凸起部501位於該第二凹孔24開口端的外緣,該第四凸起部503位於該第二套筒34開口端的內緣,該第三凸起部501與該第四凸起部503在該第二凹孔24開口端與該第二套筒34開口端相互卡持,穩固該支撐部20的另一端在該固定部30的套接。具體言之,該第二卡扣部50的該第三凸起部501與該第四凸起部503,是分別在該第二凹孔24開口端與該第二套筒34開口端設置,且該第三凸起部501是在該第二凹孔24開口端的外緣,該第四凸起部503則是在該第二套筒34開口端的內緣,藉由該第二凹孔24開口端與該第二套筒34開口端的套接,該第三凸起部501與該第四凸起部503即可相互卡持,使該支撐部20的另一端穩固的套接在該固定部30不會脫離,達成該支撐部20與該固定部30的套接連結。其中,該第二凹孔24與該第二套筒34相對套接的內部設置的該第二彈性件52,使得該第三凸起部501與該第四凸起部503相互卡持具有伸張彈力,維持該支撐部20凸伸於該固定部30的頂端並具有彈性。從而,該多段彈性導電探針100的該接觸部10,彈性的套接於該支撐部20的一端,該支撐部20的另一端上又再彈性的套接於該固定部30頂端,且該支撐部20兩端的該第一凹孔22與該第二凹孔24之間是一止擋部26,該止擋部26分別抵靠該第一凹孔22與該第二凹孔24內的該第一彈性件42與該第二彈性件52,使該第一彈性件42與該第二彈性件52藉由該支撐部20而連動,形成該多段彈性導電探針100的多段伸縮結構。 In this embodiment, the second latching portion 50 includes a third protruding portion 501 and a fourth protruding portion 503. The third protruding portion 501 is located on the outer edge of the open end of the second recessed hole 24. Four raised portions 503 are located on the inner edge of the open end of the second sleeve 34, and the third raised portions 501 and the fourth raised portion 503 are at the open end of the second recessed hole 24 and the open end of the second sleeve 34 The two ends are clamped to each other, and the socket of the other end of the supporting portion 20 is fixed to the fixing portion 30. Specifically, the third protruding portion 501 and the fourth protruding portion 503 of the second buckle portion 50 are respectively provided at the open end of the second recessed hole 24 and the open end of the second sleeve 34. The third convex portion 501 is an outer edge of the open end of the second concave hole 24, and the fourth convex portion 503 is an inner edge of the open end of the second sleeve 34. The open end is sleeved with the open end of the second sleeve 34, and the third protruding portion 501 and the fourth protruding portion 503 can be clamped to each other, so that the other end of the supporting portion 20 is firmly sleeved to the fixing. The portion 30 is not detached, and a sleeve connection between the support portion 20 and the fixing portion 30 is achieved. Wherein, the second elastic member 52 disposed inside the second recessed hole 24 and the second sleeve 34 is relatively sleeved, so that the third protruding portion 501 and the fourth protruding portion 503 are clamped to each other to have an extension. The elastic force maintains the supporting portion 20 protruding from the top of the fixing portion 30 and has elasticity. Therefore, the contact portion 10 of the multi-stage elastic conductive probe 100 is elastically sleeved on one end of the support portion 20, and the other end of the support portion 20 is elastically sleeved on the top of the fixing portion 30, and the Between the first recessed hole 22 and the second recessed hole 24 at both ends of the support portion 20 is a stopper 26 which abuts against the first recessed hole 22 and the second recessed hole 24 respectively. The first elastic member 42 and the second elastic member 52 cause the first elastic member 42 and the second elastic member 52 to be linked through the support portion 20 to form a multi-stage telescopic structure of the multi-stage elastic conductive probe 100.
請再參閱圖3,係圖1多段彈性導電探針的觸壓狀態的剖視圖。該多段彈性導電探針100在進行測試時,該接觸部10的該接觸端12會受一壓力(圖中未標示)作用在該接觸部10上。該接觸部10受到該壓力,位於該接觸部10 與該支撐部20一端內部的該第一彈性件42即會受力。藉由該多段彈性導電探針100的多段伸縮結構,該第一彈性件42受力時,位於該支撐部20另一端的該第二彈性件52也會同時受力,且因作用力與反作用力關係,該第一彈性件42與該第二彈性件52的受力會相同。因此,單一壓力作用在該接觸部10上時,驅使該第一彈性件42與該第二彈性件52同時受相同的力。本實施例中,該第一彈性件42受力,使該接觸部10縮向該支撐部20的一端,該第二彈性件52的受力,使該支撐部20縮向該固定部30。從而,該接觸部10的單一受力,可驅使該接觸部10與該支撐部20進行二段的收縮。而且,如果不計算該第一彈性件42與該第二彈性件52的彈性係數K質以及該支撐部20的重力,該第一彈性件42與該第二彈性件52的受力會相同。換言之,該接觸部10的單一受力,不但使該第一彈性件42與該第二彈性件52同時受相同的力,並且獲得二倍的收縮變數。相較單一彈簧壓縮要產生二倍的收縮變數,顯然需要增加二倍的壓力。最後,該接觸部10、該支撐部20以及該固定部30是一杆狀體,該第一凸起部401、該第二凸起部403、該第三凸起部501以及該第四凸起部503均為環狀凸起,該環狀凸起在該第一凹孔內22與該第二套筒34內形成的空間,使該接觸部10在該支撐部20的一端作伸縮運作,該支撐部20的另一端在該固定部30作伸縮運作。該多段彈性導電探針100的多段伸縮結構,可實現以小壓力獲得大壓縮量的良好實用效能。 Please refer to FIG. 3 again, which is a cross-sectional view of the contact pressure state of the multi-stage elastic conductive probe of FIG. 1. When the multi-stage elastic conductive probe 100 is tested, the contact end 12 of the contact portion 10 is subjected to a pressure (not shown) on the contact portion 10. The contact portion 10 receives the pressure and is located in the contact portion 10 The first elastic member 42 inside one end of the supporting portion 20 is stressed. With the multi-stage telescopic structure of the multi-stage elastic conductive probe 100, when the first elastic member 42 is stressed, the second elastic member 52 located at the other end of the support portion 20 is also simultaneously stressed, and due to the acting force and the reaction In a force relationship, the forces of the first elastic member 42 and the second elastic member 52 will be the same. Therefore, when a single pressure acts on the contact portion 10, the first elastic member 42 and the second elastic member 52 are driven by the same force at the same time. In this embodiment, the first elastic member 42 is forced to cause the contact portion 10 to contract to one end of the support portion 20, and the second elastic member 52 is subjected to the force to cause the support portion 20 to be contracted to the fixing portion 30. Therefore, a single force of the contact portion 10 can drive the contact portion 10 and the support portion 20 to perform two-stage contraction. Moreover, if the elastic coefficient K of the first elastic member 42 and the second elastic member 52 and the gravity of the support portion 20 are not calculated, the force of the first elastic member 42 and the second elastic member 52 will be the same. In other words, the single force of the contact portion 10 not only causes the first elastic member 42 and the second elastic member 52 to receive the same force at the same time, but also doubles the shrinkage variable. Compared to a single spring compression to produce a double contraction variable, it is obviously necessary to double the pressure. Finally, the contact portion 10, the support portion 20 and the fixing portion 30 are rod-shaped bodies, the first protruding portion 401, the second protruding portion 403, the third protruding portion 501, and the fourth protruding portion. The rising portions 503 are ring-shaped protrusions. The space formed by the ring-shaped protrusions in the first recessed hole 22 and the second sleeve 34 makes the contact portion 10 perform a telescopic operation on one end of the support portion 20. The other end of the supporting portion 20 performs a telescoping operation on the fixing portion 30. The multi-stage telescopic structure of the multi-stage elastic conductive probe 100 can achieve a good practical effect of obtaining a large compression amount with a small pressure.
本創作該多段彈性導電探針100,藉由該接觸部10、該支撐部20與該固定部30之間具有彈性的多段套接結構,實現該多段彈性導電探針100以小壓力獲得大壓縮量的良好實用效能。 This multi-segment elastic conductive probe 100 is created by the elastic multi-segment socket structure between the contact portion 10, the support portion 20 and the fixing portion 30, so that the multi-segment elastic conductive probe 100 achieves large compression with low pressure Good practical performance.
應該指出,上述實施例僅為本創作的較佳實施例,本領域技術人員還可在本創作精神內做其他變化。這些依據本創作精神所做的變化,都應包含在本創作所要求保護的範圍之內。 It should be noted that the above embodiments are merely preferred embodiments of the present invention, and those skilled in the art can make other changes within the spirit of the present invention. These changes made in accordance with the spirit of this creation should be included in the scope of protection required by this creation.
Claims (10)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820292013.4U CN208458761U (en) | 2018-03-01 | 2018-03-01 | Multi-segment elastic conductive probe |
| ??201820292013.4 | 2018-03-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TWM583545U true TWM583545U (en) | 2019-09-11 |
Family
ID=65155305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW107204999U TWM583545U (en) | 2018-03-01 | 2018-04-17 | Multi-segment elastic conductive probe |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN208458761U (en) |
| TW (1) | TWM583545U (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117761537A (en) * | 2023-11-20 | 2024-03-26 | 智新科技股份有限公司 | A power battery testing tool and its control method |
| CN121454103A (en) * | 2026-01-08 | 2026-02-03 | 儒众智能科技(苏州)有限公司 | Coaxial probe with stable connection |
-
2018
- 2018-03-01 CN CN201820292013.4U patent/CN208458761U/en not_active Expired - Fee Related
- 2018-04-17 TW TW107204999U patent/TWM583545U/en unknown
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| CN208458761U (en) | 2019-02-01 |
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