TWM583134U - Toroidal compact antenna test range - Google Patents

Toroidal compact antenna test range Download PDF

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Publication number
TWM583134U
TWM583134U TW108203140U TW108203140U TWM583134U TW M583134 U TWM583134 U TW M583134U TW 108203140 U TW108203140 U TW 108203140U TW 108203140 U TW108203140 U TW 108203140U TW M583134 U TWM583134 U TW M583134U
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curve
ring
reflecting surface
main
main reflecting
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TW108203140U
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張道治
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張道治
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Abstract

Toroidal CATR (Compact Antenna Test Range) consists of torus as main reflector, one or many sub-reflectors, and one or many feed antennas. The concave of torus points toward the rotation axis of torus. If various directions of incident plane waves to the rotation axis of quiet zone which is the rotation axis of torus are required, the geometry of each sub-reflector can be calculated by Fermat's principle and Snell's law with given relate part area of torus and relate feed location. This invent describes the method to generate various directions of incident plane wave at the quiet zone of antenna test range. By using this toroidal CATR, two dimensional and three dimensional antenna radiation patterns with one or many antennas can be measured simultaneously.

Description

環形縮距天線測試裝置Ring-shaped telescopic antenna test device

本新型是有關於藉由環形的反射面,結合不同多組輔反射面,及多組訊號饋入器,產生多組不同方向入射平面波到測試靜區內的裝置,供不同位置天線同時間量測天線場型(Radiation pattern)之裝置。 The invention relates to a device for generating a plurality of sets of different plane incident plane waves into the test static zone by using a ring-shaped reflecting surface, combining different sets of auxiliary reflecting surfaces, and a plurality of sets of signal feeding devices, for simultaneously measuring the position of the antennas at different positions. A device for measuring the Radiation pattern.

目前在量測天線的輻射場型時,需將天線置於可接收到類似理想之入射平面波(Plane wave)區域,理想平面波為波前(Wavefront)之電場(Electric field)振幅(Amplitude)大小相同,波前之電場相位(Phase)大小相同的區域,此條件下之區域稱為測試靜區(Quiet zone)。如要達到理想之平面波,待測天線與發射源距離需無限遠及電波傳播過程沒有多重路徑反射(Multiple reflections),折射(Refraction),或繞射(Diffraction)等發生,因此平面波視規格需求,波前(Wavefront)之電場(Electric field)振幅(Amplitude),及波前之電場相位(Phase)大小,可允許稍微 放寬,例如市面上之傳統遠場微波暗室測試靜區規格(如測試靜區大小為D,λ為波長,量測距離R為2D2/λ時之波前之電場二次方相位差22.5度,加上電波多重路徑反射或繞射等影響),為電場振幅變動±1分貝(Decibel),電場相位波紋(ripple)為±6度。如波長越短(頻率越高),為了維持同樣測試靜區大小D,量測距離R需增加,相對地,微波暗室之空間也需變大。 At present, when measuring the radiation pattern of the antenna, the antenna should be placed in a region where an ideal incident plane wave (Plane wave) can be received, and the ideal plane wave is the same as the wavefront electric field (Amplitude) amplitude (Amplitude). The area of the wavefront where the phase of the electric field is the same. The area under this condition is called the Quiet zone. In order to achieve the ideal plane wave, the distance between the antenna to be tested and the source of the antenna needs to be infinity and the process of radio wave propagation does not have multiple reflections, refraction, or diffraction, so the plane wave depends on the specification requirements. Wavefront's electric field amplitude (Amplitude), and the wavefront's electric field phase (Phase) size, allows for a slight relaxation, such as the traditional far-field microwave darkroom test quiet zone specifications (such as test dead zone) The size is D, λ is the wavelength, and the measurement of the distance R is 2D 2 /λ, the electric field quadratic phase difference of the wavefront is 22.5 degrees, plus the influence of electric wave multipath reflection or diffraction, etc., which is the fluctuation of the electric field amplitude ±1 Decibel, the electric field phase ripple is ±6 degrees. If the wavelength is shorter (the higher the frequency), in order to maintain the same test dead zone size D, the measurement distance R needs to be increased. In contrast, the space of the microwave darkroom also needs to be enlarged.

為了在有限空間下有較大之測試靜區,且測試靜區大小不受頻率影響,現有的天線場型量測裝置,主要是採縮距式天線量測場(CATR,Compact Antenna Test Range)裝置執行,而現有的縮距式天線量測裝置主要可分二種,單一反射面之縮距式天線量測場,及雙反射面之縮距式天線量測場。單一反射面之縮距式天線量測場由偏心之部分拋物面為主要反射面,饋源置於拋物面之焦點(Focus)位置上,饋源輻射之球面波經拋物面反射後,就可得平面波,如考量較佳之天線功率效率(Antenna power efficiency)下,此縮距式天線輻射量測場測試靜區小。雙反射面之縮距式天線輻射量測場,常見主反射面為偏心之部分拋物面(Paraboloid)為主要反射面,輔反射面幾何形狀為部分之橢圓面(Ellipsoid)或部分之雙曲面(Hyperboloid),輔反射面之內(或外)焦點(Focus)與拋物面之焦點重疊,饋源置於輔反射面之外(或內)焦點,饋源輻射之球面波經輔反射面反射後,為等效虛擬饋源置於輔反射面之內(或 外)焦點輻射之球面波,這球面波經主要反射面反射後為平面波,如考量相同天線功率效率(Antenna power efficiency)下,雙反射面構成之測試靜區比單一反射面構成之測試靜區大。 In order to have a large test dead zone in a limited space, and the test dead zone size is not affected by the frequency, the existing antenna field type measuring device is mainly a CATR (Compact Antenna Test Range). The device is implemented, and the existing telescopic antenna measuring device can be mainly divided into two types, a telescopic antenna measuring field of a single reflecting surface, and a telescopic antenna measuring field of a double reflecting surface. The telescopic antenna measuring field of the single reflecting surface is composed of the eccentric part of the paraboloid as the main reflecting surface, and the feeding source is placed at the focus of the paraboloid. After the spherical wave of the feeding radiation is parabolically reflected, the plane wave can be obtained. If the antenna power efficiency (Antenna power efficiency) is considered, the distance measurement field of the teleconverter antenna is small. The radiation field of the telescopic antenna of the double reflecting surface, the common main reflecting surface is the eccentric part of the paraboloid (Paraboloid) is the main reflecting surface, and the auxiliary reflecting surface geometry is part of the elliptical surface (Ellipsoid) or part of the hyperboloid (Hyperboloid) ), the inner (or outer) focal point of the auxiliary reflecting surface overlaps with the focus of the paraboloid, and the feed is placed outside the (or inner) focus of the auxiliary reflecting surface, and the spherical wave of the feeding radiation is reflected by the auxiliary reflecting surface, The equivalent virtual feed is placed inside the secondary reflective surface (or Outside) the spherical wave of the focal radiation. The spherical wave is reflected by the main reflecting surface as a plane wave. For example, considering the same antenna power efficiency, the test dead zone composed of the double reflecting surface is a test dead zone composed of a single reflecting surface. Big.

要使以上兩種縮距式天線量測場測試靜區內,平面波之波前電場振幅及電場相位波紋(ripple)變化小,除了反射面表面幾何形狀失真小外,反射面之邊緣需特別處理,反射面之邊緣處理,常見為邊緣增加多個鋸齒型狀(Serrated edge)之反射面,或邊緣採用往後翻之滾邊(Rolled edge)型式,愈多之反射面之邊緣處理將增加成本及複雜度。另外,如要多個平面波由不同方向進入測試靜區,供測試靜區內待測載具上不同位置且不同指向之多個天線輻射場型測試,則須多組縮距式天線量測場之安排,由於主反射面為拋物面,因此增加架設複雜度及空間須求。 In order to make the above two kinds of telescopic antenna measurement field test static zone, the wavefront electric field amplitude and the electric field phase ripple of the plane wave change little, except for the distortion of the surface geometry of the reflection surface, the edge of the reflection surface needs special treatment. The edge treatment of the reflective surface is usually performed by adding a plurality of serrated edge reflective surfaces to the edge, or the edge adopting a rolled edge type, and the more edge treatment of the reflective surface increases the cost and the complexity. In addition, if multiple plane waves are to enter the test dead zone from different directions, for testing multiple antenna radiation field tests at different positions on the test object in the static zone and different directions, multiple sets of telescopic antenna measurement fields are required. According to the arrangement, since the main reflecting surface is a paraboloid, the erection complexity and space are required to be increased.

因此,本新型的一目的,即在提供一種除了低複雜度及節省空間需求外,且在量測場測試靜區內有多個不同方向之入射平面波,供載具上不同位置及不同方向之多天線同時間量測各別場型之環形縮距天線測試裝置。 Therefore, an object of the present invention is to provide an incident plane wave having a plurality of different directions in addition to low complexity and space saving requirements in the static field of the measurement field for different positions and different directions on the carrier. A multi-antenna simultaneous measurement of a ring-shaped pitch antenna test device of each field type.

於是,本新型環形縮距天線測試裝置包含一環形(Torus)的主反射面、至少一幾何形狀一樣(也可不一樣)在不同位置之輔反 射面、及至少一相對於輔反射面之訊號饋入器。 Therefore, the novel ring-shaped pitch antenna testing device comprises a torus main reflecting surface, at least one geometric shape (or different) in different positions. a surface, and at least one signal feeder relative to the auxiliary reflection surface.

該主反射面為環形反射面,且面上任何一點皆由兩個互相垂直主要曲率構成,其中之一曲率為一呈圓形線(Circle)的第一曲線之曲率,其曲率半徑隨第二曲線不同高度之位置而改變,但其曲率中心位置永遠在測場測試靜區中心位置,另一第二曲線之曲率中心位置在環形內,其形狀可為拋物線(Parabola)、雙曲線(Hyperbola)、橢圓線(Ellipse)、圓形線(Circle),及可公式表示之任何曲線等。 The main reflecting surface is an annular reflecting surface, and any point on the surface is composed of two mutually perpendicular main curvatures, wherein one of the curvatures is a curvature of a first curve of a circular circle, and the radius of curvature of the second curve The position of the curve varies at different heights, but the center of curvature is always in the center of the static test zone, and the center of curvature of the other second curve is in the ring. The shape can be parabola or hyperbola. , ellipse (Ellipse), circular line (Circle), and any curve that can be expressed by formula.

該一輔反射面之幾何形狀藉由主反射面上之部分反射面積,及相對應之饋源位置決定。由饋源位置輻射之球面波,經輔反射面反射到主反射面,再經主反射面反射成為平面波,朝向測場測試靜區中心位置,依費馬原理(Fermat principle),進行中兩波之間相對位置之相位差為等值,及史奈兒定律(Snell’s law),在反射點位置,入射角度等於反射角度,入射方向、反射方向,及反射點位置之法線為共平面。因此,饋源位置到輔反射面上反射點之距離R,加上輔反射面上反射點到主反射面上相對反射點之距離L,再加上主反射面反射後成為平面波之距離M,則依R+L+M為固定常數,及Snell’s定律,則輔反射面幾何形狀可算出。 The geometry of the auxiliary reflecting surface is determined by the partial reflection area of the main reflecting surface and the corresponding feeding position. The spherical wave radiated from the feed position is reflected by the auxiliary reflecting surface to the main reflecting surface, and then reflected by the main reflecting surface into a plane wave, and the center position of the dead zone is tested toward the field, and the two waves are performed according to the Fermat principle. The phase difference between the relative positions is equal, and Snell's law, at the position of the reflection point, the incident angle is equal to the reflection angle, and the normal directions of the incident direction, the reflection direction, and the position of the reflection point are coplanar. Therefore, the distance R from the feed position to the reflection point on the auxiliary reflection surface, plus the distance L from the reflection point on the auxiliary reflection surface to the reflection point on the main reflection surface, and the distance M of the plane wave after the reflection of the main reflection surface, According to R + L + M is a fixed constant, and Snell's law, the geometry of the auxiliary reflection surface can be calculated.

又,本新型的另一目的,即在提供一種除了低複雜度及節省空間需求外,且在量測場測試靜區內有多個不同方向之入射平 面波,供載具上不同位置及不同方向之多天線同時間量測各別場型之環形縮距天線測試裝置。 Moreover, another object of the present invention is to provide an incident flat with a plurality of different directions in addition to low complexity and space saving requirements in the measurement field test static zone. The surface wave is used to measure the ring-shaped telescopic antenna test device of each field at the same time for multiple antennas in different positions and different directions on the carrier.

於是,本新型環形縮距天線測試裝置僅用一組環型的主反射面配合至少一輔反射面,及至少一相對應的訊號饋入器,即可產生多個不同方向入射之平面波於測試靜區,供多個天線接收或發射之場型量測之用,該等輔反射面的幾何形狀由該主反射面的表面方程式及該等訊號饋入器的位置共同定義。 Therefore, the novel ring-shaped pitch antenna testing device can generate a plurality of plane waves incident in different directions by using only one set of ring-shaped main reflecting surfaces with at least one auxiliary reflecting surface and at least one corresponding signal feeding device. The quiet zone is used for field type measurement of multiple antennas for receiving or transmitting. The geometry of the auxiliary reflecting surfaces is defined by the surface equation of the main reflecting surface and the positions of the signal feeders.

較佳地,環形縮距天線測試裝置,包含一組環型的主反射面,及至少一輔反射面,該環型的主反射面由兩正交之曲線構成,其中之一曲線為圓形曲線,圓心在測試靜區中心軸線上。另一曲線可為拋物線(Parabola)、雙曲線(Hypcrbola)、橢圓線(Ellipse)、圓形線(Circle)、及可公式表示之任何曲線等其中之一。 Preferably, the ring-shaped pitch antenna testing device comprises a set of ring-shaped main reflecting surfaces and at least one auxiliary reflecting surface, wherein the main reflecting surface of the ring-shaped type is composed of two orthogonal curves, wherein one of the curves is circular Curve, the center of the circle is on the central axis of the test zone. Another curve may be one of Parabola, Hypcrbola, Ellipse, Circle, and any curve that can be formulated.

較佳地,該環型的主反射面由兩主要曲線構成,其一第一曲線為圓形曲線,圓心在測試靜區中心軸線上。 Preferably, the main reflecting surface of the ring type is composed of two main curves, a first curve of which is a circular curve, and the center of the circle is on the central axis of the test dead zone.

該環型的主反射面的一第二曲線可為拋物線方程式。 A second curve of the main reflecting surface of the ring type may be a parabolic equation.

該環型的主反射面的一第二曲線可為雙曲線方程式。 A second curve of the main reflecting surface of the ring type may be a hyperbolic equation.

該環型的主反射面的一第二曲線可為橢圓線方程式。 A second curve of the main reflecting surface of the ring type may be an elliptical line equation.

該環型的主反射面的一第二曲線可為方程式表示之曲線等。 A second curve of the main reflecting surface of the ring type may be a curve represented by an equation or the like.

本新型的功效在於:藉由該第一曲線圍繞該中心軸線形 成的該主反射面,及界定出的該輻射空間,及由該主反射面的表面方程式與該訊號饋入器的位置共同界定出的該輔反射面,以在該輻射空間中產生在各種方向行進的測量用電磁波,進而可量測到該至少一天線在特定時間點下接收而產生對應的電磁輻射參數,同時根據該主反射面的幾何結構特性,減少了須進行邊緣處理的區域,且可提升測試靜區尺寸因而降低反射面施工難度及製造成本。 The effect of the novel is that the first curve surrounds the central axis The main reflecting surface, and the defined radiation space, and the auxiliary reflecting surface defined by the surface equation of the main reflecting surface and the position of the signal feeder to be generated in the radiation space The measurement of the direction of travel uses electromagnetic waves, which in turn can measure the at least one antenna to be received at a specific time point to generate corresponding electromagnetic radiation parameters, and at the same time, according to the geometrical characteristics of the main reflection surface, the area to be edge-treated is reduced. Moreover, the size of the test dead zone can be increased, thereby reducing the construction difficulty and manufacturing cost of the reflective surface.

21‧‧‧天線 21‧‧‧Antenna

22‧‧‧接收分析器 22‧‧‧Receiver analyzer

31‧‧‧主反射面 31‧‧‧Main reflective surface

4‧‧‧訊號饋入器 4‧‧‧Signal Feeder

51‧‧‧輔反射面 51‧‧‧Auxiliary reflector

C1‧‧‧第一曲線 C1‧‧‧ first curve

C2‧‧‧第二曲線 C2‧‧‧second curve

L1‧‧‧曲率半徑 L1‧‧‧ radius of curvature

L2‧‧‧中心軸線 L2‧‧‧ central axis

R1‧‧‧輻射空間 R1‧‧‧radiation space

R2‧‧‧測試靜區 R2‧‧‧ test quiet zone

S1~S3‧‧‧有效輻射區域 S1~S3‧‧‧effective radiation area

本新型的其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中:圖1是本新型環形縮距天線測試裝置的一實施例之俯視圖,及產生中間方向平面波之正向圖,說明本新型一個環形的主反射面、多個輔反射面,及多個饋源位置之示意圖;圖2是一示意圖,輔助說明該實施例相關元件的設置位置;圖3是一局部示意圖(含主反射面,輔反射面,饋源位置,及測試靜區等),說明該實施例的一輻射空間中相關元件的設置位置及電磁波行進方向;及圖4說明實例之模擬波束成形方向,在測試靜區多波束分別有0度,45度,90度,135度,180度,225度,270度,315度等方向之平面波,本例之測試靜區內每一波束之平面波振幅維度變動 幅度為±0.65分貝。 Other features and effects of the present invention will be apparent from the following description of the drawings, wherein: FIG. 1 is a plan view of an embodiment of the novel annular-recess antenna testing device, and generating a positive direction of the plane wave in the middle direction FIG. 2 is a schematic view showing a ring-shaped main reflecting surface, a plurality of auxiliary reflecting surfaces, and a plurality of feeding positions; FIG. 2 is a schematic view for explaining the setting position of the related elements of the embodiment; FIG. 3 is a partial schematic view (including main reflective surface, auxiliary reflective surface, feed position, and test dead zone, etc.), indicating the position of the relevant components in a radiation space of this embodiment and the direction of travel of the electromagnetic wave; and FIG. 4 illustrates the simulated beamforming direction of the example In the test static zone, multiple beams have plane waves of 0 degrees, 45 degrees, 90 degrees, 135 degrees, 180 degrees, 225 degrees, 270 degrees, 315 degrees, etc. In this example, the plane wave amplitude of each beam in the static zone is tested. Dimensional change The amplitude is ±0.65 decibels.

參閱圖1、圖2、圖3,本新型環形縮距天線測試裝置(Toroidal compact antenna test range)的一實施例,用於在一測試靜區R2,量測多個天線21接收平面電磁波(Plane electromagnetic wave)後的天線輻射場型(Antenna radiation pattern)參數,包含一環形(Torus)的主反射面(Main reflector)31、至少一訊號饋入器(feed horn)4,及至少一輔反射面(Sub-reflector)51。 Referring to FIG. 1, FIG. 2 and FIG. 3, an embodiment of the present invention relates to a Toroidal compact antenna test range for measuring a plurality of antennas 21 to receive planar electromagnetic waves in a test dead zone R2 (Plane) Antenna radiation pattern parameter after electromagnetic wave, comprising a Torus main reflector 31, at least one signal horn 4, and at least one auxiliary reflection surface (Sub-reflector) 51.

需先說明的是,本實施例的訊號饋入器4與輔反射面5的數量可為多個,且每一訊號饋入器4設置位置不同,每一輔反射面51的幾何形狀可為相同,亦也可為不同,本實施例以下關於訊號饋入器4與輔反射面5的說明其數量皆為多個。 It should be noted that the number of the signal feeder 4 and the auxiliary reflection surface 5 of the embodiment may be multiple, and each of the signal feeders 4 is disposed at a different position, and the geometry of each auxiliary reflection surface 51 may be The same or different, in the present embodiment, the description of the signal feeder 4 and the auxiliary reflection surface 5 is plural.

該環形的主反射面31上任何一點,皆由一為圓形曲線的第一曲線C1,及與該第一曲線C1正交之第二曲線C2構成,該第二曲線C2的態樣為圓形曲線,拋物曲線,橢圓曲線,雙曲線,及可公式表示之任何曲線,第一曲線C1之一曲率半徑L1隨第二曲線C2之高度位置而改變,但第一曲線C1之曲率中心L1永遠在測試靜區之中心軸線L2上。因此第一曲線C1及第二曲線C2構成之主反射面 為環形的主反射面。 Any point on the annular main reflecting surface 31 is composed of a first curve C1 which is a circular curve and a second curve C2 which is orthogonal to the first curve C1, and the second curve C2 is a circle a curve, a parabola curve, an elliptic curve, a hyperbola, and any curve that can be expressed by the formula. One of the curvatures L1 of the first curve C1 changes with the height position of the second curve C2, but the center of curvature L1 of the first curve C1 is always On the center axis L2 of the test dead zone. Therefore, the first curve C1 and the second curve C2 constitute the main reflection surface It is the main reflection surface of the ring.

再進一步地說明,該主反射面31的實質外觀呈現環狀圍繞,且表面呈弧形,且該主反射面31以環狀形式圍繞的空間即為被界定出的輻射空間R1,而該第二曲線C2的軌跡滿足拋物線方程式、橢圓線方程式、雙曲線方程式,圓方程式,或可由方程式表示之曲線等,在實際設計製造該主反射面31時,由於殼體在第一曲線C1的對稱與連續性,未有邊緣繞射問題,且該第二曲線C2邊緣之電場振幅大小可由訊號饋入器場型及輔反射面決定,因此邊緣繞射處理相對簡單,使除了施工簡單外,該主反射面31也將有較大的測試靜區尺寸。更具體地說,該主反射面的面上任何一點皆由兩個互相垂直主要曲線構成,其中之一曲線為圓形線(Circle),其曲率中心位置在測試靜區軸線中心上,另一正交曲線可為拋物線(Parabola)、雙曲線(Hyperbola)、橢圓線(Ellipse)、圓形線(Circle),及可公式表示之任何曲線等。 It is further explained that the substantial appearance of the main reflective surface 31 is annularly surrounded and the surface is curved, and the space surrounded by the main reflective surface 31 in an annular form is the defined radiation space R1, and the The trajectory of the two-curve C2 satisfies the parabolic equation, the elliptic equation, the hyperbolic equation, the circular equation, or the curve represented by the equation, etc., when the main reflective surface 31 is actually designed and manufactured, due to the symmetry of the casing in the first curve C1 Continuity, there is no edge diffraction problem, and the magnitude of the electric field amplitude at the edge of the second curve C2 can be determined by the signal feeder field type and the auxiliary reflection surface, so the edge diffraction processing is relatively simple, so that in addition to the simple construction, the main The reflective surface 31 will also have a larger test dead zone size. More specifically, any point on the surface of the main reflecting surface is composed of two mutually perpendicular main curves, one of which is a circular line whose center of curvature is at the center of the axis of the test dead zone, and the other The orthogonal curve can be a parabola, a hyperbola, an ellipse, a circle, and any curve that can be formulated.

此外,被量測的該等天線21是放置於該輻射空間R1的一測試靜區(Quiet zone)R2內,該測試靜區R2,在本案例為在此區域內的平面電磁波的振幅變化為1.3分貝、即振幅漣波介於-0.65分貝至0.65分貝間,及相位角度漣波介於-5°至5°間。 In addition, the measured antennas 21 are placed in a Quiet zone R2 of the radiation space R1, and the test dead zone R2, in this case, the amplitude of the plane electromagnetic wave in the region is changed to 1.3 decibels, ie amplitude chopping between -0.65 decibels to 0.65 decibels, and phase angle chopping between -5° and 5°.

該等訊號饋入器4位於該輻射空間R1,並輻射多個與該平面波相關的饋入訊號,其中,S1~S3各為每一訊號饋入器4輻射 的饋入訊號的有效輻射區域。 The signal feeder 4 is located in the radiation space R1 and radiates a plurality of feed signals related to the plane wave, wherein each of the S1~S3 is radiated by each signal feeder 4 The effective radiation area of the feed signal.

該等輔反射面51的表面方程式由該主反射面31的表面方程式及該訊號饋入器4的位置共同定義,且該等訊號饋入器4朝該等輔反射面51入射該等饋入球面波訊號時,該等輔反射面51將該等饋入球面波訊號反射至該主反射面31,再經第一反射面31反射出行進方向朝中心軸線L2的平面電磁波,用以供被量測的該等天線21接收後產生對應的場型參數,並由該接收分析器22量測相關數據。 The surface equations of the auxiliary reflecting surfaces 51 are defined by the surface equation of the main reflecting surface 31 and the position of the signal feeder 4, and the signal feeders 4 inject the feedings toward the auxiliary reflecting surfaces 51. When the spherical wave signal is transmitted, the auxiliary reflecting surface 51 reflects the feeding spherical wave signal to the main reflecting surface 31, and then reflects the plane electromagnetic wave traveling toward the central axis L2 through the first reflecting surface 31 for supplying The measured antennas 21 are received to generate corresponding field type parameters, and the receiving analyzer 22 measures the relevant data.

需再說明的是,該等輔反射面51的表面幾何形狀是由該第一反射面31的表面方程式與該等訊號饋入器4的位置搭配幾何射線追蹤法(Ray tracing)所決定。 It should be noted that the surface geometry of the auxiliary reflecting surfaces 51 is determined by the surface equation of the first reflecting surface 31 and the position of the signal feeders 4 by geometric tracing.

此外,本新型也可用環型的主反射面,配合相同(或不相同)之輔反射面及訊號饋入器,達到測試靜區內有不同方向之平面波。 In addition, the present invention can also use the ring-shaped main reflecting surface, with the same (or different) auxiliary reflecting surface and signal feeder, to achieve plane waves with different directions in the test static zone.

再者,本新型還可用環型的主反射面,配合沿固定軌跡機械移動之訊號饋入器及其對應之輔反射面,達到在測試靜區有相對方向之平面波,加上支撐待測天線之二維旋轉台,可同時測試多天線系統之天線三維輻射場型。 Furthermore, the present invention can also use a ring-shaped main reflecting surface, a signal feeding device mechanically moving along a fixed trajectory and its corresponding auxiliary reflecting surface, to achieve a plane wave having a relative direction in the test dead zone, and supporting the antenna to be tested. The two-dimensional rotating table can simultaneously test the three-dimensional radiation pattern of the antenna of the multi-antenna system.

如前所述者,本新型的實施例,除了可快速測試多天線系統之天線二維(Two dimension)場型外,如加上支撐待測天線之 轉台,也可快速測試多天線系統之天線三維(Three dimension)場型。 As described above, the embodiment of the present invention, in addition to rapidly testing the antenna two-dimensional field type of the multi-antenna system, such as supporting the antenna to be tested The turntable can also quickly test the three-dimensional field of the antenna of a multi-antenna system.

參閱圖4,為本實施例在實際模擬時,對朝向L2不同方向(45°、90°、135°、180°、215°、270°、315°、360°)的波束成形(beamforming),由此結果可知,在本實施例的確可在L2各方向形成平面入射波而被待測天線所接收。 Referring to FIG. 4, in the actual simulation, beamforming is performed in different directions (45°, 90°, 135°, 180°, 215°, 270°, 315°, 360°) toward L2. From this result, it can be seen that in the present embodiment, a plane incident wave can be formed in each direction of L2 and received by the antenna to be tested.

綜上所述,本新型環形縮距天線測試裝置藉由環形外觀的主反射面所具備的幾何結構特性,減少了須進行邊緣處理的區域,據此提升測試靜區尺寸因而降低反射面施工難度及製造成本。因此確實達成本發明的創作目的。另一方面,也由於主反射面之,第一曲線軌跡為圓方程式,環形之正交第二曲線軌跡可為拋物線方程式、橢圓線方程式、雙曲線方程式,及圓方程式,或可方程式表示之曲線等,輔反射面幾何形狀由主反射面之部分面積、及該訊號饋入器位置所決定,如將多個訊號饋入器位置安排為圓形,於環形的主反射面相對位置,界定出該相對之輔反射面幾何形狀,將在測試靜區之中心軸線上具有不同方向入射之平面波,再者,依據以實際參數得到的模擬結果,充分驗證多天線在本新型縮距式天線量測裝置,各自可同時收到來自不同方向的平面電磁波,供一或多個天線同時量測二維天線輻射場型之用。 In summary, the novel ring-shaped antenna test device reduces the area to be edge-treated by the geometrical characteristics of the main reflective surface of the annular appearance, thereby increasing the size of the test dead zone and thus reducing the difficulty of construction of the reflective surface. And manufacturing costs. Therefore, the creative purpose of the present invention is indeed achieved. On the other hand, also due to the main reflection surface, the first curve trajectory is a circular equation, and the circular second trajectory of the ring can be a parabolic equation, an elliptical equation, a hyperbolic equation, and a circular equation, or a curve represented by an equation. Etc., the geometry of the auxiliary reflecting surface is determined by the area of the main reflecting surface and the position of the signal feeder. For example, the positions of the plurality of signal feeders are arranged in a circular shape, and the relative positions of the main reflecting surfaces of the ring are defined. The relative auxiliary reflecting surface geometry will have plane waves incident in different directions on the central axis of the test dead zone, and further, according to the simulation result obtained by the actual parameters, fully verify the multi-antenna measurement in the novel telescopic antenna. The devices can each receive planar electromagnetic waves from different directions for one or more antennas to simultaneously measure the radiation pattern of the two-dimensional antenna.

惟以上所述者,僅為本新型之較佳實施例而已,當不能 以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。 However, the above is only the preferred embodiment of the present invention, when not Therefore, the scope of the novel implementation is limited, that is, the simple equivalent changes and modifications made by the present invention in the scope of the patent application and the contents of the patent specification are still within the scope of the novel patent.

Claims (7)

一種環形縮距天線測試裝置,僅用一組環型的主反射面配合至少一輔反射面,及至少一相對應的訊號饋入器,即可產生多個不同方向入射之平面波於測試靜區,供多個天線接收或發射之場型量測之用,該等輔反射面的幾何形狀由該主反射面的表面方程式及該等訊號饋入器的位置共同定義。 A ring-shaped pitch antenna testing device can use only one set of ring-shaped main reflecting surfaces to cooperate with at least one auxiliary reflecting surface and at least one corresponding signal feeder to generate a plurality of plane waves incident in different directions in the test dead zone For field type measurement for receiving or transmitting by a plurality of antennas, the geometry of the auxiliary reflecting surfaces is defined by the surface equation of the main reflecting surface and the positions of the signal feeders. 如請求項1所述的環形縮距天線測試裝置,包含一組環型的主反射面,及至少一輔反射面,該環型的主反射面由兩正交之曲線構成,其中之一曲線為圓形曲線,圓心在測試靜區中心軸線上,另一曲線可為拋物線(Parabola)、雙曲線(Hyperbola)、橢圓線(Ellipse)、圓形線(Circle)、及可公式表示之任何曲線等其中之一。 The ring-shaped pitch antenna testing device according to claim 1, comprising a ring-shaped main reflecting surface and at least one auxiliary reflecting surface, wherein the main reflecting surface of the ring-shaped type is composed of two orthogonal curves, one of which is a curve For a circular curve, the center of the circle is on the central axis of the test zone, and the other curve can be parabola, hyperbola, ellipse, circle, and any curve that can be expressed. Wait for one of them. 如請求項1所述的環形縮距天線測試裝置,其中,該環型的主反射面由兩主要曲線構成,其一第一曲線為圓形曲線,圓心在測試靜區中心軸線上。 The ring-shaped pitch antenna testing device according to claim 1, wherein the main reflecting surface of the ring type is composed of two main curves, a first curve of which is a circular curve, and a center of the circle is on the central axis of the test dead zone. 如請求項3所述的環形縮距天線測試裝置,其中,該環型的主反射面的一第二曲線可為拋物線方程式。 The ring-shaped pitch antenna testing device of claim 3, wherein a second curve of the main reflecting surface of the ring type is a parabolic equation. 如請求項3所述的環形縮距天線測試裝置,其中,該環型的主反射面的一第二曲線可為雙曲線方程式。 The ring-shaped pitch antenna testing device of claim 3, wherein a second curve of the main reflecting surface of the ring type is a hyperbolic equation. 如請求項3所述的環形縮距天線測試裝置,其中,該環型的主反射面的一第二曲線可為橢圓線方程式。 The ring-shaped pitch antenna testing device of claim 3, wherein a second curve of the main reflecting surface of the ring type is an elliptical line equation. 如請求項3所述的環形縮距天線測試裝置,其中,該環型的主反射面的一第二曲線可為方程式表示之曲線等。 The ring-shaped pitch antenna testing device according to claim 3, wherein a second curve of the main reflecting surface of the ring type is a curve represented by an equation or the like.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557766A (en) * 2019-09-10 2021-03-26 川升股份有限公司 Antenna measurement system for multiple-input multiple-output air transmission

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557766A (en) * 2019-09-10 2021-03-26 川升股份有限公司 Antenna measurement system for multiple-input multiple-output air transmission

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