CN111693790A - Annular distance-reducing antenna testing device - Google Patents
Annular distance-reducing antenna testing device Download PDFInfo
- Publication number
- CN111693790A CN111693790A CN201910197830.0A CN201910197830A CN111693790A CN 111693790 A CN111693790 A CN 111693790A CN 201910197830 A CN201910197830 A CN 201910197830A CN 111693790 A CN111693790 A CN 111693790A
- Authority
- CN
- China
- Prior art keywords
- curve
- annular
- testing device
- reflecting surface
- main
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 54
- 230000005855 radiation Effects 0.000 abstract description 17
- 238000005259 measurement Methods 0.000 abstract description 5
- 230000005684 electric field Effects 0.000 description 12
- 238000010276 construction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000011514 reflex Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Aerials With Secondary Devices (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Abstract
An annular reduced-pitch antenna testing device comprises a group of annular main reflecting surfaces, a single group or a plurality of groups of auxiliary reflecting surfaces and a single group or a plurality of groups of signal feeders. The main reflecting surface is an annular reflecting surface, and the main reflecting surface is sunken to the annular central axis. The geometrical shape of the secondary reflection surface is obtained based on the wave characteristic principle of the Fermat principle. If a plurality of sets of plane waves are generated and directed toward the central axis of the ring from different directions, the geometrical shapes of the corresponding sets of auxiliary reflection surfaces can be calculated by using different blocks on the ring reflection surface and corresponding positions of different signal feeders. The invention can generate a plurality of groups of incident plane waves in different directions in an antenna test quiet zone, simultaneously provide the measurement of the radiation field patterns of the antennas of one or more groups of antennas in different directions, and can rapidly measure the radiation field patterns of two-dimensional and three-dimensional antennas.
Description
Technical Field
The invention relates to a device for generating a plurality of groups of plane waves incident in different directions to a test quiet zone by combining a plurality of groups of different auxiliary reflecting surfaces and a plurality of groups of signal feeders through an annular reflecting surface, and providing a device for measuring antenna patterns (Radiation patterns) of antennas at different positions at the same time.
Background
When measuring the radiation field pattern of an antenna, the antenna needs to be positioned in a region that can receive a Plane wave (Plane wave) similar to an ideal Plane wave, where the ideal Plane wave is a region where the Electric field (Electric field) Amplitude (Amplitude) of the wave front (wave front) is the same, and the Electric field Phase (Phase) of the wave front is the same, and the region under this condition is called a test Quiet zone (quick zone). If the ideal plane wave is to be achieved, the distance between the antenna to be measured and the emission source needs to be infinite and the electric waveThe propagation process does not occur Multiple path reflections (Multiple reflexes), refractions (refractions), or diffractions (diffractions), so that the requirements of the plane wave specification, the electric field (electric field) Amplitude (Amplitude) of the Wavefront (wave front), and the electric field Phase (Phase) magnitude of the Wavefront can be slightly relaxed, for example, the current far-field microwave dark room test quiet zone specification (e.g., the test quiet zone size is D, λ is the wavelength, and the measurement distance R is 2D) on the market2The quadratic phase difference of the electric field of the wave front at/λ is 22.5 degrees, plus the influence of the multipath reflection or diffraction of the radio wave, etc., the electric field amplitude varies by + -1 Decibel (Decibel), and the electric field phase ripple (ripple) is + -6 degrees. As the wavelength is shorter (the frequency is higher), the measurement distance R is increased to maintain the same test dead zone size D, and correspondingly, the space of the microwave dark room is also increased.
In order to have a larger testing dead zone in a limited space and the size of the testing dead zone is not affected by the frequency, the conventional Antenna field type measuring device is mainly implemented by a Compact Antenna Test Range (CATR) device, and the conventional Antenna field type measuring device can be divided into two types, namely a single-reflection-surface Antenna field and a dual-reflection-surface Antenna field. The field of the Antenna with a single reflection surface is mainly composed of an eccentric part of paraboloid, the feed source is placed at the Focus (Focus) of the paraboloid, and the spherical wave radiated by the feed source is reflected by the paraboloid to obtain a plane wave. A method for measuring radiation of Antenna with dual reflection surfaces includes such steps as using partial eccentric Paraboloid (Paraboloid) as main reflection surface, using partial Ellipsoid (Ellipsoid) or Hyperboloid (Hyperboloid) as auxiliary reflection surface, overlapping the inner (or outer) Focus (Focus) of auxiliary reflection surface with the Focus of Paraboloid, using the spherical wave radiated by feed source as equivalent virtual feed source, and using the spherical wave as plane wave after reflection by main reflection surface.
In order to reduce the variation of the wave front electric field amplitude and the electric field phase ripple (ripple) of the plane wave in the field test dead zone of the two reduced-pitch antennas, besides the small distortion of the surface geometry of the reflection surface, the edge of the reflection surface needs to be specially processed, the edge of the reflection surface is processed, usually the reflection surface with a plurality of sawtooth-shaped edges (rounded edge) is added to the edge, or the edge adopts a Rolled edge (Rolled edge) type, and the edge processing of the reflection surface increases the cost and the complexity. In addition, if multiple plane waves enter the testing quiet zone from different directions for testing the radiation patterns of multiple antennas at different positions and different directions on the carrier to be tested in the testing quiet zone, multiple sets of reduced-pitch antenna measurement fields are required, and the main reflection surface is a paraboloid, thereby increasing the complexity of installation and the requirement of space.
Disclosure of Invention
An object of the present invention is to provide a circular reduced-pitch antenna testing apparatus, which has a plurality of incident plane waves in different directions in a testing dead zone of a measuring field for simultaneously measuring different field patterns of multiple antennas at different positions and in different directions on a carrier, in addition to low complexity and space saving requirements.
The invented testing device for circular reduced-pitch antenna comprises a main reflective surface of circular (Torus), at least one auxiliary reflective surface with same (or different) geometrical shape and different positions, and at least one signal feeder relative to the auxiliary reflective surface.
The main reflection surface is a ring-shaped reflection surface, and any point on the surface is composed of two mutually perpendicular main curvatures, one curvature is the curvature of a first curve in a circular line (Circle), the curvature radius of the first curve changes with the positions of different heights of a second curve, but the curvature center position of the first curve is permanently far away from the center position of a field test dead zone, the curvature center position of the other second curve is in a ring shape, and the shape of the main reflection surface can be parabolic line (Parabola), hyperbolic line (Hyperbola), elliptic line (Ellipse), circular line (Circle), any curve capable of being expressed by a formula and the like.
The geometry of the secondary reflector is determined by the partial reflection area on the primary reflector and the corresponding feed source position. The spherical wave radiated from the feed source position is reflected to the main reflection surface by the auxiliary reflection surface, and then reflected by the main reflection surface to become a plane wave, and the plane wave is directed to the central position of the tested quiet zone. Therefore, the distance R from the feed source to the reflection point on the auxiliary reflection surface, the distance L from the reflection point on the auxiliary reflection surface to the relative reflection point on the main reflection surface, and the distance M of the plane wave formed by the reflection of the main reflection surface are added, and the geometrical shape of the auxiliary reflection surface can be calculated according to the fixed constant of R + L + M and the Snell's law.
In addition, another objective of the present invention is to provide a circular shrinking pitch antenna testing apparatus, which has a plurality of incident plane waves with different directions in the testing dead zone of the measuring field for simultaneously measuring different field patterns of multiple antennas at different positions and in different directions on the carrier, in addition to low complexity and space saving requirements.
The invention relates to a test device for a circular reduced-pitch antenna, which comprises a main reflecting surface, at least one signal feeder and at least one auxiliary reflecting surface.
The main reflecting surface is annular.
The at least one signal feeder is spaced apart from the annular main reflective surface.
The surface geometry of the at least one secondary reflector is defined by the surface formula of the primary reflector and the position of the signal feeder.
The three are mutually matched to generate a plurality of plane waves incident in different directions in a testing quiet zone for measuring the patterns received or transmitted by a plurality of antennas.
Preferably, the annular main reflection surface is formed by two orthogonal curves, a trajectory of one curve is a circular line, a center of the circular line is on a central axis of the testing dead zone, and a trajectory of the other curve is one of a parabola, a hyperbola, an elliptic line, a circular line and a curve which can be expressed by a formula.
Preferably, the annular main reflecting surface is formed by two curves, wherein a first curve is a circular curve, and the center of the first curve is on the central axis of the testing quiet zone.
Preferably, the other second curve of the annular main reflecting surface is a parabolic formula.
Preferably, the second curve of the annular main reflecting surface is a hyperbolic formula.
Preferably, the other second curve of the annular main reflecting surface is an elliptic curve formula.
Preferably, the other second curve of the annular main reflection surface is a curve which can be expressed by formula.
The invention has the following effects: the main reflecting surface is formed by the first curve around the central axis, the defined radiation space and the auxiliary reflecting surface are defined by the surface formula of the main reflecting surface and the position of the signal feeder together, so that electromagnetic waves for measurement advancing in various directions are generated in the radiation space, and then the corresponding electromagnetic radiation parameters generated by receiving the at least one antenna at a specific time point can be measured.
Drawings
Other features and effects of the present invention will become apparent from the following detailed description of the embodiments with reference to the accompanying drawings, in which:
FIG. 1 is a top view of an embodiment of the annular scaled antenna test apparatus of the present invention, and a front view of a generated mid-direction plane wave, illustrating a schematic diagram of an annular primary reflector, a plurality of secondary reflectors, and a plurality of feed locations of the present invention;
FIG. 2 is a schematic view for explaining the arrangement positions of the relevant components of the embodiment;
FIG. 3 is a partial schematic view (including main reflector, sub-reflector, feed source position, and test dead space), illustrating the arrangement positions of the relevant components and the traveling direction of the electromagnetic wave in a radiation space according to the embodiment; and
fig. 4 illustrates exemplary simulated beamforming directions for beams having plane waves with directions of 0 degrees, 45 degrees, 90 degrees, 135 degrees, 180 degrees, 225 degrees, 270 degrees, 315 degrees, etc. in the test quiet zone, where the amplitude dimension of the plane waves of each beam in the test quiet zone of this example varies by ± 0.65 db.
Detailed Description
Referring to fig. 1 and 2, an embodiment of a circular reduced-pitch Antenna testing apparatus (toroid compact Antenna testing) of the present invention is used for measuring Antenna radiation field pattern (Antenna radiation pattern) parameters after a plurality of antennas 21 receive planar electromagnetic waves (planar electromagnetic waves) in a testing quiet zone R2, and includes a Main reflector (Main reflector)31 of a circular shape (Torus), at least one signal feeder (fed reflector) 4, and at least one auxiliary reflector (Sub-reflector) 51.
It should be noted that, the number of the signal feeders 4 and the auxiliary reflective surfaces 51 of the present embodiment may be plural, and the installation position of each signal feeder 4 is different, and the geometric shape of each auxiliary reflective surface 51 may be the same or different, and the following description of the signal feeders 4 and the auxiliary reflective surfaces 51 of the present embodiment is that the number thereof is plural.
At any point on the annular main reflective surface 31, the annular main reflective surface 31 is formed by a first curve C1 which is a circular curve and a second curve C2 which is orthogonal to the first curve C1, the second curve C2 is in the form of a circular curve, a parabolic curve, an elliptic curve, a hyperbolic curve, or any curve which can be expressed by formula, a curvature radius L1 of the first curve C1 varies with the height position of the second curve C2, but the curvature center of the first curve C1 is always on the central axis L2 of the test dead zone. Therefore, the main reflection surface formed by the first curve C1 and the second curve C2 is a ring-shaped main reflection surface.
It is further described that the substantial appearance of the main reflective surface 31 is annularly surrounded, the surface is arc-shaped, the space surrounded by the main reflective surface 31 in the form of an annular is the defined radiation space R1, the trajectory of the second curve C2 satisfies the equation of parabola, the equation of elliptic curve, the equation of hyperbolic curve, the equation of circle, or the curve represented by the equation, when the main reflective surface 31 is actually designed and manufactured, because the symmetry and continuity of the shell in the first curve C1 have no problem of edge diffraction, and the magnitude of the electric field amplitude at the edge of the second curve C2 can be determined by the signal feeder field type and the auxiliary reflective surface, the edge diffraction processing is relatively simple, so that the main reflective surface 31 will have a larger test dead zone size besides the simple construction. More specifically, any point on the surface of the main reflection surface is composed of two mutually perpendicular main curves, one of the curves is a circular line (Circle) with a curvature center located on the center of the axis of the test dead zone, and the other orthogonal curve can be a parabolic line (Parabola), a hyperbolic line (Hyperbola), an elliptic line (Ellipse), a circular line (Circle), any curve capable of being expressed by a formula, and the like.
In addition, the antenna 21 to be measured is placed in a test Quiet zone (quick zone) R2 of the radiation space R1, where the test Quiet zone R2, in this case, is a region where the amplitude variation of the planar electromagnetic wave is 1.3 db, i.e., the ripple of the amplitude is between-0.65 db and 0.65 db, and the ripple of the phase angle is between-5 ° and 5 °.
The signal feeder 4 is located in the radiation space R1 and radiates a plurality of feeding signals related to the plane wave, wherein S1 to S3 are effective radiation areas of the feeding signals radiated by each signal feeder 4.
The surface formula of the auxiliary reflective surface 51 is defined by the surface formula of the main reflective surface 31 and the position of the signal feeder 4, and when the signal feeder 4 inputs the feed spherical wave signal to the auxiliary reflective surface 51, the auxiliary reflective surface 51 reflects the feed spherical wave signal to the main reflective surface 31, and then the planar electromagnetic wave with the traveling direction facing the central axis L2 is reflected by the main reflective surface 31, so that the measured antenna 21 generates corresponding field type parameters after receiving the planar electromagnetic wave, and the receiving analyzer 22 measures the related data.
It should be noted that the surface geometry of the secondary reflecting surface 51 is determined by the surface formula of the primary reflecting surface 31 and the position of the signal feeder 4 in combination with the geometric Ray tracing (Ray tracing).
In addition, the present invention can also use the ring-shaped main reflection surface to match with the same (or different) auxiliary reflection surface and the feeder to achieve the purpose of testing the plane waves with different directions in the dead zone.
Furthermore, the present invention can use the ring-shaped main reflection surface to match with the feeder mechanically moving along the fixed track and the corresponding auxiliary reflection surface to achieve the plane wave with the opposite direction in the testing quiet zone, and the two-dimensional rotation platform for supporting the antenna to be tested can simultaneously test the three-dimensional radiation pattern of the antenna of the multi-antenna system.
As described above, in the embodiments of the present invention, in addition to rapidly testing the two-dimensional (Twodimension) field pattern of the multi-antenna system, if a turntable is added to support the antenna to be tested, the Three-dimensional (Three dimension) field pattern of the multi-antenna system can also be rapidly tested.
Referring to fig. 4, in the actual simulation of the present embodiment, beam forming (beamforming) is performed on beams facing different directions (45 °, 90 °, 135 °, 180 °, 215 °, 270 °, 315 °, and 360 °) of L2, and thus, the result shows that, in the present embodiment, a plane incident wave can be formed in each direction of L2 and received by the antenna to be tested.
In summary, the annular reduced-pitch antenna testing device of the present invention reduces the area to be processed by the geometric structural characteristics of the main reflective surface with the annular appearance, thereby increasing the size of the testing dead zone and reducing the construction difficulty and manufacturing cost of the reflective surface. Thus, the creation purpose of the invention is achieved. On the other hand, because the first curve track of the main reflection surface is a circle formula, the annular orthogonal second curve track can be a parabola formula, an elliptic line formula, a hyperbolic formula, a circle formula, or a curve which can be expressed by a formula, etc., the geometric shape of the auxiliary reflection surface is determined by the partial area of the main reflection surface and the position of the signal feeder, for example, the positions of a plurality of signal feeders are arranged to be circular, the relative position of the annular main reflection surface defines the relative geometric shape of the auxiliary reflection surface, plane waves incident in different directions are arranged on the central axis of the tested quiet zone, and furthermore, according to a simulation result obtained by actual parameters, the multiple antennas in the reduced-pitch antenna measuring device can be fully verified, and can respectively receive plane electromagnetic waves from different directions at the same time, so that one or more antennas can simultaneously measure the two-dimensional antenna radiation field pattern.
The above description is only a preferred embodiment of the present invention, and the scope of the present invention should not be limited thereby, and all the simple equivalent changes and modifications made by the claims and the contents of the specification should be included in the scope of the present invention.
Claims (7)
1. An annular reduced-pitch antenna testing device, comprising:
an annular main reflecting surface;
at least one signal feeder arranged at an interval with the annular main reflecting surface; and
at least one auxiliary reflection surface, the surface geometry of which is defined by the surface formula of the main reflection surface and the position of the signal feeder,
the three are mutually matched to generate a plurality of plane waves incident in different directions in a testing quiet zone for measuring the patterns received or transmitted by a plurality of antennas.
2. The circular reduced-pitch antenna testing device as claimed in claim 1, wherein the main reflective surface of the circular shape is formed by two orthogonal curves, one curve has a circular trace with a center on a central axis of the testing dead zone, and the other curve has a trace of one of a parabola, a hyperbola, an ellipse, a circular trace and a formulable curve.
3. An annular reduced-pitch antenna testing device according to claim 1, wherein the annular main reflecting surface is formed by two curves, a first curve is a circular curve, and the center of the first curve is on the central axis of the testing quiet zone.
4. The circular reduced-pitch antenna testing device as claimed in claim 3, wherein another second curve of the main reflective surface of the circular shape is a parabolic formula.
5. An annular distance antenna testing device according to claim 3, wherein the second curve of the main reflecting surface is a hyperbolic formula.
6. An annular reduced-pitch antenna testing device according to claim 3, wherein the other second curve of the annular main reflecting surface is an elliptic equation.
7. An annular distance antenna testing device according to claim 3, wherein the second curve of the annular main reflecting surface is a formulable curve.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910197830.0A CN111693790A (en) | 2019-03-15 | 2019-03-15 | Annular distance-reducing antenna testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910197830.0A CN111693790A (en) | 2019-03-15 | 2019-03-15 | Annular distance-reducing antenna testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111693790A true CN111693790A (en) | 2020-09-22 |
Family
ID=72475890
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910197830.0A Pending CN111693790A (en) | 2019-03-15 | 2019-03-15 | Annular distance-reducing antenna testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111693790A (en) |
-
2019
- 2019-03-15 CN CN201910197830.0A patent/CN111693790A/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5121129A (en) | EHF omnidirectional antenna | |
| Van Atta et al. | Contributions to the antenna field during World War II | |
| US4218683A (en) | Range focus lens | |
| US5557282A (en) | Height finding antenna apparatus and method of operation | |
| CA1039843A (en) | Aberration correcting subreflectors for toroidal reflector antennas | |
| JP7329085B2 (en) | High-speed OTA production line test platform | |
| CN107623184B (en) | A kind of multilayer dielectricity antenna realizing side and penetrating with end-fire function | |
| US9472856B2 (en) | Antenna | |
| CN209764952U (en) | Annular distance-reducing antenna testing device | |
| CN106936524B (en) | Test system of wireless terminal | |
| US5175562A (en) | High aperture-efficient, wide-angle scanning offset reflector antenna | |
| CN211955669U (en) | Compact range testing system based on angle feed | |
| TWM583134U (en) | Toroidal compact antenna test range | |
| CN210665888U (en) | Composite test system | |
| CN111693790A (en) | Annular distance-reducing antenna testing device | |
| Fry et al. | aerails for centimetre wave lengths | |
| TWI713252B (en) | Toroidal compact antenna test range | |
| US20190207686A1 (en) | Compact antenna range reflector with reduced edge diffraction | |
| US4631547A (en) | Reflector antenna having sidelobe suppression elements | |
| CN110764158A (en) | Terahertz imaging system based on reflection-type frequency control beam scanning device | |
| USH514H (en) | Compact range for variable-zone measurements | |
| RU2461928C1 (en) | Combined monopulse cassegrain antenna with excitation from phased antenna array | |
| US11101569B2 (en) | Toroidal compact antenna test range | |
| CN110611170A (en) | New method for designing remote sensing scanning antenna | |
| CN112886252B (en) | Compact range shaped feed source and compact range system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200922 |