TWM581202U - Transfer type electrical test equipment - Google Patents

Transfer type electrical test equipment Download PDF

Info

Publication number
TWM581202U
TWM581202U TW108204801U TW108204801U TWM581202U TW M581202 U TWM581202 U TW M581202U TW 108204801 U TW108204801 U TW 108204801U TW 108204801 U TW108204801 U TW 108204801U TW M581202 U TWM581202 U TW M581202U
Authority
TW
Taiwan
Prior art keywords
transfer module
frame
rails
jig
jig frame
Prior art date
Application number
TW108204801U
Other languages
Chinese (zh)
Inventor
曹詣
潘奕華
Original Assignee
德律科技股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 德律科技股份有限公司 filed Critical 德律科技股份有限公司
Priority to TW108204801U priority Critical patent/TWM581202U/en
Publication of TWM581202U publication Critical patent/TWM581202U/en

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

A transfer type electrical test equipment includes a rack body, a lower fixture, and a transfer module. The lower fixture is fixed to the rack body. The transfer module is slidably engaged with the rack body, so as to move between an off-machine position and an in-machine position relative to the rack body. The transfer module includes two guiding rails. The guiding rails are configured to guide a fixture frame to move relative to the transfer module and configured to make the fixture frame to be movably retained therebetween. The transfer module is configured to assist the fixture frame to connect the lower fixture.

Description

移載式電測設備 Transfer type electrical measuring equipment

本揭示案是有關於一種電測設備。 The present disclosure relates to an electrical measuring device.

以電子產品來說,產品於構裝完成前必須進行電性功能測試,以確保出廠之電子產品於功能上的完整性;同時透過電性測試結果來作分類,藉以作為不同等級產品的評價依據。以半導體測試製程為例,待測組裝電路板(例如,封裝IC)送入測試機(Tester)中(例如,邏輯IC測試機、記憶體IC測試機、混合式IC測試機),其中為待測組裝電路板所量身訂作之測試程式進行細部相關控制,主要是藉由發出待測組裝電路板所需的電性信號,並接受回應自待測元件之電性信號,以作出產品電性測試結果判斷。 In the case of electronic products, the electrical function test must be carried out before the completion of the assembly to ensure the functional integrity of the manufactured electronic products. At the same time, the electrical test results are used for classification, so as to evaluate the products according to different grades. . Taking a semiconductor test process as an example, an assembled circuit board (for example, a package IC) to be tested is sent to a tester (for example, a logic IC tester, a memory IC tester, a hybrid IC tester), wherein The test program tailored to the assembled circuit board is subjected to detailed control, mainly by issuing an electrical signal required to assemble the circuit board to be tested, and accepting an electrical signal in response to the component to be tested to make a product power. The results of the sex test are judged.

而待測組裝電路板與電測設備之間必須透過轉換介面-電測治具,以讓測試作業順暢進行。一般來說,電測治具通常採用垂直式電測方法。具體來說,電測治具包含上治具與下治具。電測時會先將待測組裝電路板放置於下治具上,再使上治具隨著壓床機構逐漸靠近待測組裝電路板,使設置於治具上的探針與待測組裝電路板表面之焊點接觸,從而進行電 測。由此可知,電測治具是用來連接電測設備的測試接點與待測組裝電路板的接腳,以作為電性信號傳遞橋樑。 The test interface board and the electrical test equipment must pass through the conversion interface-electric test fixture to make the test work smooth. In general, electrical test fixtures usually use vertical electrical measurements. Specifically, the electrical test fixture includes an upper jig and a lower jig. During the electrical test, the assembled circuit board to be tested is placed on the lower fixture, and then the upper fixture is gradually brought closer to the assembled circuit board to be tested with the pressing mechanism, so that the probe disposed on the fixture and the assembled circuit to be tested are assembled. The solder joints on the surface of the board are in contact with each other Measurement. It can be seen that the electrical measuring fixture is used to connect the test contact of the electrical measuring device with the pin of the assembled circuit board to be tested, as an electrical signal transmission bridge.

在習知的電測設備中,電測設備與治具針板為一體式的,且放板載台設計於治具針板上方。然而,此習知電測設備至少包含如下缺點:(1)只適用單一待測板,無法換線擴充;(2)成本高;以及(3)可配合的待測板尺寸較小。 In the conventional electrical measuring device, the electrical measuring device and the jig needle plate are integrated, and the placing plate carrier is designed above the jig needle plate. However, the conventional electrical measuring device has at least the following disadvantages: (1) only a single board to be tested can be used, and the line cannot be expanded; (2) the cost is high; and (3) the size of the board to be tested can be small.

因此,提出一種可解決上述問題的電測設備,是目前業界亟欲投入研發資源解決的問題之一。 Therefore, it is proposed that an electrical measuring device that can solve the above problems is one of the problems that the industry is eager to invest in research and development resources.

有鑑於此,本揭示案之一目的在於提出一種可有效解決前述問題的移載式電測設備。 In view of this, one of the objects of the present disclosure is to propose a transfer type electrical measuring device that can effectively solve the aforementioned problems.

為了達到上述目的,依據本揭示案之一實施方式,一種移載式電測設備包含機架本體、下治具以及移載模組。下治具固定至機架本體。移載模組可滑動地銜接機架本體,進而可相對於機架本體移動於機外位置以及機內位置之間。移載模組包含兩導軌。兩導軌配置以導引治具框相對於移載模組移動,並配置以使治具框可移動地限位於其間。移載模組配置以協助治具框與下治具結合。 In order to achieve the above object, in accordance with an embodiment of the present disclosure, a transfer type electrical measuring device includes a frame body, a lower fixture, and a transfer module. The lower fixture is fixed to the frame body. The transfer module slidably engages the frame body and is movable relative to the frame body between the off-machine position and the in-machine position. The transfer module consists of two rails. The two rails are configured to guide the jig frame to move relative to the transfer module and are configured to move the jig frame movably therebetween. The transfer module is configured to assist in the combination of the fixture frame and the lower fixture.

於本揭示案的一或多個實施方式中,兩導軌各包含承載部以及側牆部。承載部配置以承載治具框。側牆部連接承載部。兩導軌之側牆部係配置以導引治具框相對於移載模組移動,並使治具框可移動地限位於其間。 In one or more embodiments of the present disclosure, the two rails each include a carrier portion and a side wall portion. The carrier is configured to carry a jig frame. The side wall portion is connected to the carrying portion. The side wall portions of the two rails are configured to guide the jig frame to move relative to the transfer module and to position the jig frame movably therebetween.

於本揭示案的一或多個實施方式中,承載部具有 複數個滾珠。滾珠配置以可滑動地承載治具框。 In one or more embodiments of the present disclosure, the carrier has A plurality of balls. The ball configuration is configured to slidably carry the jig frame.

於本揭示案的一或多個實施方式中,承載部具有複數個噴氣孔。 In one or more embodiments of the present disclosure, the load bearing portion has a plurality of gas vent holes.

於本揭示案的一或多個實施方式中,承載部具有磁浮元件。 In one or more embodiments of the present disclosure, the carrier has a magnetic floating element.

於本揭示案的一或多個實施方式中,兩導軌各進一步包含限位部。限位部連接側牆部。承載部與限位部配置以使治具框可移動地限位於其間。 In one or more embodiments of the present disclosure, the two rails each further include a limiting portion. The limiting portion is connected to the side wall portion. The carrying portion and the limiting portion are configured to movably limit the jig frame therebetween.

於本揭示案的一或多個實施方式中,限位部具有磁吸元件。 In one or more embodiments of the present disclosure, the stop has a magnetic element.

於本揭示案的一或多個實施方式中,移載模組進一步包含兩鎖定機構。兩鎖定機構分別設置於兩導軌上。兩鎖定機構配置以將治具框分別鎖定至兩導軌中之限位部,以及配置以釋放治具框。 In one or more embodiments of the present disclosure, the transfer module further includes two locking mechanisms. The two locking mechanisms are respectively disposed on the two rails. The two locking mechanisms are configured to lock the jig frame to the limit in each of the two rails and to release the jig frame.

於本揭示案的一或多個實施方式中,移載模組進一步包含兩基板。兩基板可滑動地銜接機架本體,並分別可移動地銜接兩導軌,進而使兩導軌可朝向以及遠離兩基板移動。 In one or more embodiments of the present disclosure, the transfer module further includes two substrates. The two substrates slidably engage the frame body, and respectively movably engage the two rails, thereby allowing the two rails to move toward and away from the two substrates.

於本揭示案的一或多個實施方式中,移載式電測設備進一步包含兩驅動模組。兩驅動模組分別設置於兩基板上,並配置以分別驅動兩導軌朝向以及遠離兩基板移動。 In one or more embodiments of the present disclosure, the transfer type electrical testing device further includes two driving modules. The two driving modules are respectively disposed on the two substrates, and are configured to respectively drive the two rails toward and away from the two substrates.

於本揭示案的一或多個實施方式中,移載模組配置以沿著一方向相對於機架本體移動。兩導軌配置以沿著另一方向相對於兩基板移動。該方向與該另一方向實質上相互垂直。 In one or more embodiments of the present disclosure, the transfer module is configured to move relative to the frame body in a direction. The two rails are configured to move relative to the two substrates in the other direction. The direction is substantially perpendicular to the other direction.

於本揭示案的一或多個實施方式中,移載式電測設備進一步包含驅動模組。驅動模組設置於機架本體上,並配置以驅動移載模組相對機架本體移動。 In one or more embodiments of the present disclosure, the transfer type electrical testing device further includes a driving module. The driving module is disposed on the frame body and configured to drive the transfer module to move relative to the frame body.

於本揭示案的一或多個實施方式中,移載模組配置以沿著一方向相對於機架本體移動。兩導軌配置以導引治具框沿著另一方向移動。該方向與該另一方向實質上相互平行。 In one or more embodiments of the present disclosure, the transfer module is configured to move relative to the frame body in a direction. The two rails are configured to guide the jig frame to move in the other direction. The direction is substantially parallel to the other direction.

綜上所述,於本揭示案的移載式電測設備中,移載模組可相對於機架本體移動至機外位置,以利人工或機械手臂進行放板程序(亦即,將帶有載板的治具框安裝於移載模組中)。在放板程序完成之後,移載模組接著帶著治具框相對機架本體移動至機內位置,以對讓載板在移載式電測設備內進行測試,因此更符合人體工學或自動化產線之規劃。並且,移載模組上設置有可導引治具框,並使治具框可移動地限位於其間的導軌(亦即,此導軌可持住治具框,但仍留有讓治具框進行二維移動或三維移動之自由度),因此可以補償載板與下治具在安裝時的對位公差。藉由前述結構配置,本揭示案的移載式電測設備至少可以達到以下目的:(1)降低載板安裝時與下治具對位之困難度;以及(2)減少下治具的定位銷及載板的定位孔之磨耗,以增加下治具與載板的使用壽命。 In summary, in the transfer type electric measuring device of the present disclosure, the transfer module can be moved to the off-machine position relative to the rack body, so as to facilitate the boarding process by the manual or mechanical arm (ie, the belt will be carried The fixture frame with the carrier plate is installed in the transfer module). After the boarding process is completed, the transfer module is then moved to the internal position of the rack body with the jig frame to test the carrier board in the transfer type electrical measuring device, thereby being more ergonomic or Planning for automated production lines. Moreover, the transfer module is provided with a guide frame which can guide the jig frame and can be moved to be restricted between the guide rails (that is, the guide rail can hold the jig frame, but the jig frame is still left) The degree of freedom of two-dimensional movement or three-dimensional movement) can compensate for the alignment tolerance of the carrier and the lower fixture during installation. With the foregoing structural configuration, the transfer type electrical measuring device of the present disclosure can achieve at least the following purposes: (1) reducing the difficulty of alignment of the carrier with the lower fixture; and (2) reducing the positioning of the lower fixture. The wear of the pin and the positioning hole of the carrier plate increases the service life of the lower fixture and the carrier.

以上所述僅係用以闡述本揭示案所欲解決的問題、解決問題的技術手段、及其產生的功效等等,本揭示案之具體細節將在下文的實施方式及相關圖式中詳細介紹。 The above description is only for explaining the problems to be solved by the present disclosure, the technical means for solving the problems, the effects thereof, and the like, and the specific details of the present disclosure will be described in detail in the following embodiments and related drawings. .

100‧‧‧移載式電測設備 100‧‧‧Transfer type electrical measuring equipment

110‧‧‧機架本體 110‧‧‧Rack body

111‧‧‧底板 111‧‧‧floor

111a‧‧‧滑軌 111a‧‧‧rails

112‧‧‧頂板 112‧‧‧ top board

120‧‧‧下治具 120‧‧‧The lower fixture

121、162a‧‧‧定位銷 121, 162a‧‧ Locating pins

122、151‧‧‧定位孔 122, 151‧‧‧ positioning holes

130‧‧‧移載模組 130‧‧‧Transfer module

131、231、331、431‧‧‧導軌 131, 231, 331, 431‧‧ rails

131a、231a、331a‧‧‧承載部 131a, 231a, 331a‧‧‧ carrying parts

131a1‧‧‧滾珠 131a1‧‧‧ balls

131a2、161a‧‧‧導桿 131a2, 161a‧‧ ‧ guide

131b‧‧‧側牆部 131b‧‧‧ Side wall

131c、431c‧‧‧限位部 131c, 431c‧‧‧Limited

132‧‧‧鎖定機構 132‧‧‧Locking mechanism

132a‧‧‧鎖定件 132a‧‧‧Locking parts

132b‧‧‧驅動件 132b‧‧‧Driver

133‧‧‧基板 133‧‧‧Substrate

133a‧‧‧滑塊 133a‧‧‧ Slider

133b‧‧‧軸承 133b‧‧‧ bearing

134‧‧‧連接桿 134‧‧‧ Connecting rod

140、340‧‧‧治具框 140, 340‧‧ ‧ fixture frame

150‧‧‧載板 150‧‧‧ Carrier Board

160‧‧‧天板模組 160‧‧‧Surface Module

161‧‧‧上天板 161‧‧‧God board

162‧‧‧上治具 162‧‧‧Upper fixture

162b‧‧‧探針 162b‧‧‧Probe

170a、170b、170c‧‧‧驅動模組 170a, 170b, 170c‧‧‧ drive modules

231a1‧‧‧噴氣孔 231a1‧‧‧jet holes

331a1‧‧‧磁浮元件 331a1‧‧‧Magnetic components

341‧‧‧磁性元件 341‧‧‧Magnetic components

431c1‧‧‧磁吸元件 431c1‧‧‧ magnetic components

X、Y、Z‧‧‧方向 X, Y, Z‧‧ Direction

為讓本揭示案之上述和其他目的、特徵、優點與實施例能更明顯易懂,所附圖式之說明如下: The above and other objects, features, advantages and embodiments of the present invention will become more apparent and understood.

第1A圖為繪示根據本揭示案一實施方式之移載式電測設備的立體圖,其中移載模組相對於機架本體位於機外位置。 FIG. 1A is a perspective view of a transfer type electrical measuring device according to an embodiment of the present disclosure, wherein the transfer module is located at an off-machine position with respect to the frame body.

第1B圖為繪示第1A圖中之移載式電測設備的另一立體圖,其中移載模組相對於機架本體位於機內位置。 FIG. 1B is another perspective view of the transfer type electrical measuring device in FIG. 1A, wherein the transfer module is located at an internal position relative to the frame body.

第2A圖為繪示根據本揭示案一實施方式之移載模組與帶有載板之治具框的立體分解圖。 FIG. 2A is an exploded perspective view showing the transfer module and the jig frame with the carrier according to an embodiment of the present disclosure.

第2B圖為繪示第2A圖中之移載模組與帶有載板之治具框的立體組合圖。 2B is a perspective assembled view of the transfer module in FIG. 2A and the jig frame with the carrier.

第3圖為繪示第2B圖中之結構沿著線段3-3的局部剖面圖。 Figure 3 is a partial cross-sectional view of the structure of Figure 2B taken along line 3-3.

第4圖為繪示第2A圖中之移載模組的局部立體放大圖。 Fig. 4 is a partially enlarged perspective view showing the transfer module in Fig. 2A.

第5A圖為繪示第1B圖中之移載式電測設備的正視圖,其中載板與下治具分離。 Figure 5A is a front elevational view showing the transfer type electrical measuring device of Figure 1B, wherein the carrier is separated from the lower fixture.

第5B圖為繪示第1B圖中之移載式電測設備的另一正視圖,其中載板下降而與下治具定位。 FIG. 5B is another front view showing the transfer type electric measuring device in FIG. 1B, wherein the carrier plate is lowered to be positioned with the lower jig.

第5C圖為繪示第1B圖中之移載式電測設備的另一正視圖,其中上治具下降而與下治具定位。 FIG. 5C is another front view showing the transfer type electric measuring device in FIG. 1B, wherein the upper jig is lowered to be positioned with the lower jig.

第6圖為繪示根據本揭示案另一實施方式之移載模組與治具框的局部剖面圖。 FIG. 6 is a partial cross-sectional view showing the transfer module and the jig frame according to another embodiment of the present disclosure.

第7圖為繪示根據本揭示案另一實施方式之移載模組與治具框的局部剖面圖。 FIG. 7 is a partial cross-sectional view showing a transfer module and a jig frame according to another embodiment of the present disclosure.

第8圖為繪示根據本揭示案另一實施方式之移載模組與治 具框的局部剖面圖。 FIG. 8 is a diagram showing the transfer module and the treatment according to another embodiment of the present disclosure. A partial section view with a frame.

以下將以圖式揭露本揭示案之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本揭示案。也就是說,在本揭示案部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之,且不同實施方式中的相同元件以相同的元件符號標示。 The embodiments of the present disclosure are disclosed in the following drawings, and for the sake of clarity, many of the details of the practice will be described in the following description. However, it should be understood that these practical details are not intended to limit the disclosure. That is, in some embodiments of the present disclosure, these practical details are not necessary. In addition, the structures and elements that are conventionally used in the drawings are illustrated in a simplified schematic manner, and the same elements in the different embodiments are denoted by the same reference numerals.

請參照第1A圖以及第1B圖。第1A圖為繪示根據本揭示案一實施方式之移載式電測設備100的立體圖,其中移載模組130相對於機架本體110位於機外位置。第1B圖為繪示第1A圖中之移載式電測設備100的另一立體圖,其中移載模組130相對於機架本體110位於機內位置。以下將詳細說明本揭示案之移載式電測設備100所包含之各元件的結構、功能以及各元件之間的連接關係。 Please refer to Figure 1A and Figure 1B. FIG. 1A is a perspective view of a transfer type electrical test apparatus 100 according to an embodiment of the present disclosure, wherein the transfer module 130 is located at an off-machine position with respect to the rack body 110. FIG. 1B is another perspective view of the transfer type electrical testing device 100 of FIG. 1A, wherein the transfer module 130 is located at an internal position relative to the frame body 110. The structure, function, and connection relationship between the components included in the transfer type electrical measuring device 100 of the present disclosure will be described in detail below.

如第1A圖與第1B圖所示,於本實施方式中,移載式電測設備100包含機架本體110、下治具120、移載模組130、天板模組160以及驅動模組170a。機架本體110可視為骨架,其包含相連且彼此相對的頂板112與底板111。下治具120固定至機架本體110的底板111。移載模組130可滑動地銜接機架本體110,進而可沿著一方向(例如,第1A圖中所示之方向X)相對於機架本體110移動於機外位置(如第1A圖所示) 以及機內位置(如第1B圖所示)之間。移載模組130配置以持住帶有載板150的治具框140,因此可帶著治具框140相對於機架本體110移動。天板模組160包含相連的上天板161以及上治具162。上天板161具有複數個導桿161a,這些導桿161a可滑動地連接機架本體110的頂板112,進而使得上天板161可沿著一方向(例如,第1A圖中所示之方向Z)朝向以及遠離下治具120移動。驅動模組170a固定至機架本體110的頂板112,並配置以驅動上天板161朝向以及遠離下治具120移動。 As shown in FIG. 1A and FIG. 1B , in the present embodiment, the load-bearing electrical testing device 100 includes a rack body 110 , a lower fixture 120 , a transfer module 130 , a sky plate module 160 , and a driving module 170a. The frame body 110 can be viewed as a skeleton that includes a top plate 112 and a bottom plate 111 that are connected and opposite each other. The lower fixture 120 is fixed to the bottom plate 111 of the frame body 110. The transfer module 130 slidably engages the frame body 110 and is movable relative to the frame body 110 in an outward direction along a direction (for example, the direction X shown in FIG. 1A) (as shown in FIG. 1A). Show) And between the machine position (as shown in Figure 1B). The transfer module 130 is configured to hold the jig frame 140 with the carrier 150 so that it can be moved relative to the frame body 110 with the jig frame 140. The roof module 160 includes a connected upper plate 161 and an upper fixture 162. The upper plate 161 has a plurality of guide rods 161a slidably coupled to the top plate 112 of the frame body 110, so that the upper plate 161 can be oriented in a direction (for example, the direction Z shown in FIG. 1A). And move away from the lower fixtures 120. The drive module 170a is fixed to the top plate 112 of the frame body 110 and configured to drive the upper sky plate 161 to move toward and away from the lower jig 120.

於實際應用中,驅動模組170a可採用馬達與皮帶的組合、馬達與螺桿的組合、氣壓缸與活塞桿的組合…等方式達到驅動天板模組160相對機架本體110移動的目的,但本揭示案並不以此為限。 In practical applications, the driving module 170a can achieve the purpose of driving the roof module 160 relative to the frame body 110 by using a combination of a motor and a belt, a combination of a motor and a screw, a combination of a pneumatic cylinder and a piston rod, etc., but This disclosure is not limited in this regard.

具體來說,移載模組130包含兩基板133以及連接桿134。兩基板133可滑動地銜接機架本體110。連接桿134的兩端分別連接兩基板133。如第1A圖與第1B圖所示,於本實施方式中,機架本體110的底板111具有兩滑軌111a。兩滑軌111a相互平行,並實質上沿著方向X延伸。移載模組130的兩基板133各對應地具有兩滑塊133a。兩滑塊133a分別可滑動地銜接兩滑軌111a,藉以使得移載模組130可沿著方向X相對於機架本體110移動於機外位置(如第1A圖所示)以及機內位置(如第1B圖所示)之間。另外,移載式電測設備100還進一步包含兩驅動模組170b。兩驅動模組170b設置於機架本體110的底板111上(例如,分別位於底板111的兩滑軌111a的側旁),並配置以分別驅動兩基板133相對兩滑軌111a滑動。於實際應 用中,底板111上的兩滑軌111a與兩基板133上的兩滑塊133a係可互換的。 Specifically, the transfer module 130 includes two substrates 133 and a connecting rod 134. The two substrates 133 slidably engage the frame body 110. Two ends of the connecting rod 134 are respectively connected to the two substrates 133. As shown in FIGS. 1A and 1B, in the present embodiment, the bottom plate 111 of the frame body 110 has two slide rails 111a. The two slide rails 111a are parallel to each other and extend substantially in the direction X. The two substrates 133 of the transfer module 130 each have two sliders 133a. The two sliding blocks 133a slidably engage the two sliding rails 111a, respectively, so that the transfer module 130 can be moved relative to the frame body 110 in the direction X relative to the frame body 110 (as shown in FIG. 1A) and the internal position ( As shown in Figure 1B). In addition, the transfer type electrical testing device 100 further includes two driving modules 170b. The two driving modules 170b are disposed on the bottom plate 111 of the frame body 110 (for example, respectively located on the side of the two sliding rails 111a of the bottom plate 111), and are configured to respectively drive the two substrates 133 to slide relative to the two sliding rails 111a. Actually In use, the two slide rails 111a on the bottom plate 111 are interchangeable with the two sliders 133a on the two substrates 133.

於實際應用中,兩驅動模組170b可採用馬達與皮帶的組合、馬達與螺桿的組合、氣壓缸與活塞桿的組合…等方式達到驅動移載模組130相對機架本體110移動的目的,但本揭示案並不以此為限。 In practical applications, the two driving modules 170b can achieve the purpose of driving the transfer module 130 to move relative to the frame body 110 by using a combination of a motor and a belt, a combination of a motor and a screw, a combination of a pneumatic cylinder and a piston rod, and the like. However, this disclosure is not limited to this.

請參照第2A圖以及第2B圖。第2A圖為繪示根據本揭示案一實施方式之移載模組130與帶有載板150之治具框140的立體分解圖。第2B圖為繪示第2A圖中之移載模組130與帶有載板150之治具框140的立體組合圖。於本實施方式中,移載模組130進一步包含兩導軌131。兩導軌131相互平行,並實質上沿著方向X延伸,藉以導引帶有載板150的治具框140沿著方向X相對於移載模組130移動。於實際應用中,兩導軌131亦可沿著相異於方向X的另一方向(例如,第1A圖中所示之方向Y)延伸。 Please refer to Figure 2A and Figure 2B. FIG. 2A is an exploded perspective view of the transfer module 130 and the fixture frame 140 with the carrier 150 according to an embodiment of the present disclosure. FIG. 2B is a perspective assembled view of the transfer module 130 and the jig frame 140 with the carrier 150 in FIG. 2A. In the embodiment, the transfer module 130 further includes two guide rails 131. The two guide rails 131 are parallel to each other and extend substantially in the direction X, thereby guiding the jig frame 140 with the carrier plate 150 to move relative to the transfer module 130 along the direction X. In practical applications, the two rails 131 may also extend in another direction that is different from the direction X (for example, the direction Y shown in FIG. 1A).

藉由前述結構配置,即可在移載模組130相對於機架本體110移動至機外位置(如第1A圖所示)時,以人工或機械手臂進行放板程序(亦即,將帶有載板150之治具框140與移載模組130的兩導軌131銜接,使得移載模組130持住治具框140)。並且,在放板程序完成之後,移載模組130接著帶著治具框140相對機架本體110移動至機內位置(如第1B圖所示),以讓載板150可在移載式電測設備100內進行測試,因此更符合人體工學或自動化產線之規劃。 With the foregoing configuration, the transfer module 130 can be placed in the manual or mechanical arm when the transfer module 130 is moved relative to the frame body 110 to the off-machine position (as shown in FIG. 1A) (ie, the tape is loaded. The jig frame 140 of the carrier 150 is engaged with the two guide rails 131 of the transfer module 130 such that the transfer module 130 holds the jig frame 140). And, after the boarding process is completed, the transfer module 130 is then moved to the internal position (as shown in FIG. 1B) with respect to the frame body 110 with the jig frame 140, so that the carrier 150 can be in the transfer type. The test is carried out in the electrical measuring device 100, so it is more in line with the planning of the ergonomic or automated production line.

於本實施方式中,移載模組130的兩導軌131還配 置以使治具框140可移動地限位於其間。具體來說,請參照第3圖,其為繪示第2B圖中之結構沿著線段3-3的局部剖面圖。於本實施方式中,兩導軌131各包含承載部131a以及側牆部131b(第3圖僅代表性繪示一者)。承載部131a配置以承載治具框140。側牆部131b連接承載部131a。兩導軌131之側牆部131b係配置以導引治具框140沿著方向X相對於移載模組130移動,並使治具框140在方向Y上可移動地限位於其間。換言之,兩導軌131的側牆部131b之間留有讓治具框140進行二維移動之自由度。另外,為了方便治具框140插入兩導軌131的側牆部131b之間,可在兩側牆部131b的同一端設計導角。 In the embodiment, the two guide rails 131 of the transfer module 130 are also equipped. It is placed such that the jig frame 140 is movably spaced therebetween. Specifically, please refer to FIG. 3, which is a partial cross-sectional view of the structure in FIG. 2B along line segment 3-3. In the present embodiment, each of the two guide rails 131 includes a receiving portion 131a and a side wall portion 131b (the third drawing is only representatively shown). The carrying portion 131a is configured to carry the jig frame 140. The side wall portion 131b is connected to the carrying portion 131a. The side wall portions 131b of the two guide rails 131 are disposed to guide the jig frame 140 to move relative to the transfer module 130 along the direction X, and to move the jig frame 140 movably therebetween in the direction Y therebetween. In other words, the degree of freedom for the jig frame 140 to move two-dimensionally is left between the side wall portions 131b of the two guide rails 131. In addition, in order to facilitate insertion of the jig frame 140 between the side wall portions 131b of the two guide rails 131, the lead angles may be designed at the same end of the side wall portions 131b.

另外,移載模組130的兩導軌131各進一步包含限位部131c(第3圖僅代表性繪示一者)。限位部131c連接側牆部131b。承載部131a與限位部131c配置以使治具框140在方向Z上可移動地限位於其間。換言之,任一導軌131的承載部131a與限位部131c之間留有讓治具框140進行第三維移動之自由度。於本實施方式中,承載部131a、側牆部131b與限位部131c共同構成U字型外型,但本揭示案並不以此為限。 In addition, each of the two guide rails 131 of the transfer module 130 further includes a limiting portion 131c (the third drawing is only representatively shown). The stopper portion 131c is connected to the side wall portion 131b. The carrying portion 131a and the limiting portion 131c are disposed such that the jig frame 140 is movably spaced therebetween in the direction Z. In other words, the degree of freedom in the third dimensional movement of the jig frame 140 is left between the bearing portion 131a of any of the guide rails 131 and the stopper portion 131c. In the present embodiment, the bearing portion 131a, the side wall portion 131b, and the limiting portion 131c together form a U-shaped outer shape, but the disclosure is not limited thereto.

請參照第4圖,其為繪示第2A圖中之移載模組130的局部立體放大圖。於本實施方式中,移載模組130進一步包含兩鎖定機構132(第4圖僅代表性繪示一者)。兩鎖定機構132分別設置於兩導軌131上。兩鎖定機構132配置以將治具框140分別鎖定至兩導軌131中之限位部131c,以及配置以釋放治具框140。具體來說,鎖定機構132包含驅動件132b以及鎖定件132a。驅動件132b設置於承載部131a上,並配置以驅動 鎖定件132a朝向以及遠離對應之限位部131c移動,藉以利用鎖定件132a將治具框140鎖定至限位部131c或釋放治具框140。於本實施方式中,鎖定件132a係貫穿承載部131a,並可由承載部131a面向限位部131c的表面露出,而驅動件132b位於承載部131a背對限位部131c的一側。 Please refer to FIG. 4 , which is a partial enlarged view of the transfer module 130 in FIG. 2A . In the present embodiment, the transfer module 130 further includes two locking mechanisms 132 (fourth diagram is only representatively shown). The two locking mechanisms 132 are respectively disposed on the two guide rails 131. The two locking mechanisms 132 are configured to lock the jig frame 140 to the limiting portions 131c of the two guide rails 131, respectively, and to release the jig frame 140. Specifically, the locking mechanism 132 includes a driving member 132b and a locking member 132a. The driving member 132b is disposed on the carrying portion 131a and configured to drive The locking member 132a moves toward and away from the corresponding limiting portion 131c, thereby locking the jig frame 140 to the limiting portion 131c or releasing the jig frame 140 by the locking member 132a. In the present embodiment, the locking member 132a is penetrated through the carrying portion 131a and can be exposed by the surface of the supporting portion 131a facing the limiting portion 131c, and the driving member 132b is located on the side of the carrying portion 131a facing away from the limiting portion 131c.

另外,如第2A圖與第2B圖所示,於本實施方式中,移載式電測設備100進一步包含兩驅動模組170c。兩驅動模組170c分別設置於兩基板133上,並配置以分別驅動兩導軌131朝向以及遠離兩基板133移動。具體來說,承載部131a的底部具有複數個導桿131a2,而基板133的頂部對應地具有軸承133b。承載部131a的導桿131a2分別與基板133的軸承133b可滑動地連接。藉此,移載模組130的兩導軌131即可帶著治具框140(例如,沿著方向Z)朝向或遠離兩基板133移動。 Further, as shown in FIGS. 2A and 2B, in the present embodiment, the transfer type electrical test apparatus 100 further includes two drive modules 170c. The two driving modules 170c are respectively disposed on the two substrates 133, and are arranged to drive the two guiding rails 131 to move toward and away from the two substrates 133, respectively. Specifically, the bottom of the carrying portion 131a has a plurality of guide bars 131a2, and the top of the substrate 133 has a bearing 133b correspondingly. The guide bars 131a2 of the carrier portion 131a are slidably coupled to the bearings 133b of the substrate 133, respectively. Thereby, the two guide rails 131 of the transfer module 130 can be moved toward or away from the two substrates 133 by the jig frame 140 (for example, along the direction Z).

於實際應用中,驅動模組170c可採用馬達與皮帶的組合、馬達與螺桿的組合、氣壓缸與活塞桿的組合…等方式達到驅動兩導軌131相對兩基板133移動的目的,但本揭示案並不以此為限。 In practical applications, the driving module 170c can achieve the purpose of driving the two guide rails 131 to move relative to the two substrates 133 by using a combination of a motor and a belt, a combination of a motor and a screw, a combination of a pneumatic cylinder and a piston rod, etc., but the present disclosure Not limited to this.

請參照第5A圖、第5B圖以及第5C圖。第5A圖為繪示第1B圖中之移載式電測設備100的正視圖,其中載板150與下治具120分離。第5B圖為繪示第1B圖中之移載式電測設備100的另一正視圖,其中載板150下降而與下治具120定位。第5C圖為繪示第1B圖中之移載式電測設備100的另一正視圖,其中上治具162下降而與下治具120定位。 Please refer to FIG. 5A, FIG. 5B and FIG. 5C. FIG. 5A is a front elevational view showing the transfer type electrical measuring device 100 of FIG. 1B in which the carrier 150 is separated from the lower jig 120. FIG. 5B is another front view showing the transfer type electrical measuring device 100 in FIG. 1B, in which the carrier 150 is lowered to be positioned with the lower jig 120. FIG. 5C is another front view showing the transfer type electrical measuring device 100 in FIG. 1B, in which the upper jig 162 is lowered to be positioned with the lower jig 120.

如第1A圖、第5A圖與第5B圖所示,於本實施方 式中,下治具120具有複數個定位銷121,而載板150具有複數個定位孔151。移載模組130在第5A圖中的位置係對應於其在第1B圖中的機內位置,此時載板150與下治具120分離。為了使載板150在移載式電測設備100內進行測試,需先將載板150與下治具120精準定位。因此,可藉由兩驅動模組170c(見第2A圖與第2B圖)分別驅動兩導軌131朝向兩基板133移動,使得治具框140由第5A圖所示的位置下降到第5B圖所示的位置。在此下降過程中,下治具120的定位銷121會分別插入載板150的定位孔151,藉以準確地定位載板150相對於下治具120的位置。實務上,載板150與下治具120在安裝時會有對位公差,但如前所述,由於導軌131留有讓治具框140進行二維移動或三維移動之自由度(亦即,浮動機制),因此載板150在下治具120的定位銷121插入定位孔151時會自動移動對位,進而可降低載板150安裝時與下治具120對位之困難度。不僅如此,前述浮動機制還可有效減少下治具120的定位銷121及載板150的定位孔151之磨耗,以增加下治具120與載板150的使用壽命。另外,為了更進一步導引定位銷121插入定位孔151並減少磨耗,可在定位銷121的末端或定位孔151的入口設計導角。 As shown in Figure 1A, Figure 5A and Figure 5B, in this embodiment In the formula, the lower fixture 120 has a plurality of positioning pins 121, and the carrier 150 has a plurality of positioning holes 151. The position of the transfer module 130 in FIG. 5A corresponds to its in-machine position in FIG. 1B, at which time the carrier 150 is separated from the lower jig 120. In order to test the carrier 150 in the transfer type electrical measuring device 100, the carrier 150 and the lower fixture 120 need to be accurately positioned. Therefore, the two driving modules 170c (see FIGS. 2A and 2B) can respectively drive the two rails 131 to move toward the two substrates 133, so that the jig frame 140 is lowered from the position shown in FIG. 5A to the fifth panel. The location shown. During this descent, the positioning pins 121 of the lower jig 120 are respectively inserted into the positioning holes 151 of the carrier 150 to accurately position the carrier 150 relative to the lower jig 120. In practice, the carrier plate 150 and the lower jig 120 have alignment tolerances during installation, but as described above, the guide rail 131 has a degree of freedom for the jig frame 140 to move two-dimensionally or three-dimensionally (ie, The floating mechanism is such that the carrier plate 150 automatically moves the alignment position when the positioning pin 121 of the lower fixture 120 is inserted into the positioning hole 151, thereby reducing the difficulty of positioning the carrier 150 when it is aligned with the lower fixture 120. Moreover, the floating mechanism can effectively reduce the wear of the positioning pin 121 of the lower fixture 120 and the positioning hole 151 of the carrier 150 to increase the service life of the lower fixture 120 and the carrier 150. In addition, in order to further guide the positioning pin 121 to be inserted into the positioning hole 151 and reduce wear, a lead angle may be designed at the end of the positioning pin 121 or the entrance of the positioning hole 151.

如第1A圖、第5B圖與第5C圖所示,於本實施方式中,為了使載板150在移載式電測設備100內進行測試,可接著再將上治具162與下治具120精準定位。因此,可藉由驅動模組170a(見第1A圖)驅動整個天板模組160朝向下治具120移動,使得天板模組160由第5B圖所示的位置下降到第5C 圖所示的位置。在此下降過程中,上治具162的定位銷162a會分別插入下治具120的定位孔122,藉以準確地定位上治具162相對於下治具120的位置。同時,上治具162的探針162b會與設置於載板150表面上之電路板(圖未視)的焊點接觸,從而進行電測。 As shown in FIG. 1A, FIG. 5B and FIG. 5C, in the present embodiment, in order to test the carrier 150 in the transfer type electrical measuring device 100, the upper fixture 162 and the lower fixture can be further used. 120 precise positioning. Therefore, the entire roof module 160 can be driven to move toward the lower jig 120 by the driving module 170a (see FIG. 1A), so that the roof module 160 is lowered from the position shown in FIG. 5B to the 5C. The position shown in the figure. During this descent, the positioning pins 162a of the upper jig 162 are respectively inserted into the positioning holes 122 of the lower jig 120, thereby accurately positioning the position of the upper jig 162 relative to the lower jig 120. At the same time, the probe 162b of the upper jig 162 is in contact with the solder joint of the circuit board (not shown) provided on the surface of the carrier 150 to perform electrical measurement.

請回到第3圖,於本實施方式中,導軌131的承載部131a具有複數個滾珠131a1。滾珠131a1配置以可滑動地承載治具框140。藉此,即可使治具框140在承載部131a上順暢地滑動,以利於載板150的定位孔151與下治具120的定位銷121之間的對位。 Returning to Fig. 3, in the present embodiment, the carrier portion 131a of the guide rail 131 has a plurality of balls 131a1. The ball 131a1 is configured to slidably carry the jig frame 140. Thereby, the jig frame 140 can be smoothly slid on the carrying portion 131a to facilitate the alignment between the positioning hole 151 of the carrier 150 and the positioning pin 121 of the lower jig 120.

請參照第6圖,其為繪示根據本揭示案另一實施方式之移載模組130與治具框140的局部剖面圖。於本實施方式中,移載模組130的導軌231包含承載部231a、側牆部131b以及限位部131c,其中側牆部131b以及限位部131c相同或相似於第3圖所示之實施方式,因此可參照前述相關描述,在此恕不贅述。需說明的是,本實施方式相較於第3圖所示之實施方式的差異處,在於本實施方式的承載部231a具有複數個噴氣孔231a1。噴氣孔231a1貫穿承載部231a。噴氣孔231a1的上開口面向限位部131c,噴氣孔231a1的下開口可連接至氣體源(圖未示)。當治具框140銜接於導軌231時,藉由氣體源提供適當流速或壓力的氣體,並經由噴氣孔231a1而將治具框140朝向限位部131c噴射,即可使治具框140在承載部231a上方順暢地浮動,同樣有利於載板150的定位孔151與下治具120的定位銷121之間的對位。 Please refer to FIG. 6 , which is a partial cross-sectional view showing the transfer module 130 and the fixture frame 140 according to another embodiment of the present disclosure. In the present embodiment, the guide rail 231 of the transfer module 130 includes a bearing portion 231a, a side wall portion 131b, and a limiting portion 131c, wherein the side wall portion 131b and the limiting portion 131c are the same or similar to the implementation shown in FIG. Therefore, reference may be made to the related descriptions above, and details are not described herein. It should be noted that the difference between the embodiment and the embodiment shown in FIG. 3 is that the carrier portion 231a of the present embodiment has a plurality of gas injection holes 231a1. The gas injection hole 231a1 penetrates through the bearing portion 231a. The upper opening of the gas injection hole 231a1 faces the stopper portion 131c, and the lower opening of the gas injection hole 231a1 is connectable to a gas source (not shown). When the jig frame 140 is engaged with the guide rail 231, a gas of a proper flow rate or pressure is supplied by the gas source, and the jig frame 140 is ejected toward the limiting portion 131c via the gas-jet hole 231a1, so that the jig frame 140 is carried. The smooth floating above the portion 231a also facilitates the alignment between the positioning hole 151 of the carrier 150 and the positioning pin 121 of the lower jig 120.

請參照第7圖,其為繪示根據本揭示案另一實施方式之移載模組130與治具框340的局部剖面圖。於本實施方式中,移載模組130的導軌331包含承載部331a、側牆部131b以及限位部131c,其中側牆部131b以及限位部131c相同或相似於第3圖所示之實施方式,因此可參照前述相關描述,在此恕不贅述。需說明的是,本實施方式相較於第3圖所示之實施方式的差異處,在於本實施方式的承載部331a具有磁浮元件331a1,而治具框340上對應地設置有磁性元件341。舉例來說,承載部331a的磁浮元件331a1為電磁鐵,而治具框340的磁性元件341包含鐵磁材料。當治具框340銜接於導軌331時,藉由承載部331a的磁浮元件331a1對治具框340的磁性元件341提供適當磁性斥力,即可使治具框340在承載部331a上方順暢地浮動,同樣有利於載板150的定位孔151與下治具120的定位銷121之間的對位。於實際應用中,承載部331a的磁浮元件331a1與治具框340的磁性元件341亦可為兩永久磁鐵,且兩者的同極性端係相面對。 Please refer to FIG. 7 , which is a partial cross-sectional view showing the transfer module 130 and the jig frame 340 according to another embodiment of the present disclosure. In the present embodiment, the guide rail 331 of the transfer module 130 includes a bearing portion 331a, a side wall portion 131b, and a limiting portion 131c, wherein the side wall portion 131b and the limiting portion 131c are the same or similar to the implementation shown in FIG. Therefore, reference may be made to the related descriptions above, and details are not described herein. It should be noted that the difference between the embodiment and the embodiment shown in FIG. 3 is that the carrier portion 331a of the present embodiment has the magnetic floating element 331a1, and the jig frame 340 is provided with the magnetic element 341 correspondingly. For example, the maglev element 331a1 of the carrier portion 331a is an electromagnet, and the magnetic element 341 of the jig frame 340 contains a ferromagnetic material. When the jig frame 340 is engaged with the guide rail 331, the magnetic element 341a1 of the bearing portion 331a provides a proper magnetic repulsive force to the magnetic element 341 of the jig frame 340, so that the jig frame 340 can smoothly float above the carrying portion 331a. The alignment between the positioning hole 151 of the carrier 150 and the positioning pin 121 of the lower jig 120 is also advantageous. In practical applications, the magnetic floating element 331a1 of the carrying portion 331a and the magnetic element 341 of the jig frame 340 may also be two permanent magnets, and the same polarity end faces of the two faces.

請參照第8圖,其為繪示根據本揭示案另一實施方式之移載模組130與治具框340的局部剖面圖。於本實施方式中,移載模組130的導軌431包含承載部131a、側牆部131b以及限位部431c,其中承載部131a以及側牆部131b相同或相似於第3圖所示之實施方式,因此可參照前述相關描述,在此恕不贅述。需說明的是,本實施方式相較於第3圖所示之實施方式的差異處,在於本實施方式的限位部431c具有磁吸元件431c1,而治具框340上對應地設置有磁性元件341。舉例來 說,限位部431c的磁吸元件431c1為電磁鐵,而治具框340的磁性元件341包含鐵磁材料。當治具框340銜接於導軌431時,藉由限位部431c的磁吸元件431c1對治具框340的磁性元件341提供適當磁性吸力,即可使治具框340在承載部131a上方順暢地浮動,同樣有利於載板150的定位孔151與下治具120的定位銷121之間的對位。除此之外,藉由限位部431c的磁吸元件431c1對治具框340的磁性元件341提供較大的磁性吸力,還可達到將治具框340鎖定至限位部431c的目的,因此可有效取代第4圖所示之鎖定機構132。 Please refer to FIG. 8 , which is a partial cross-sectional view showing the transfer module 130 and the jig frame 340 according to another embodiment of the present disclosure. In the present embodiment, the guide rail 431 of the transfer module 130 includes a bearing portion 131a, a side wall portion 131b, and a limiting portion 431c, wherein the carrying portion 131a and the side wall portion 131b are the same or similar to the embodiment shown in FIG. Therefore, reference may be made to the aforementioned related description, and details are not described herein. It should be noted that the difference between the embodiment and the embodiment shown in FIG. 3 is that the limiting portion 431c of the present embodiment has the magnetic element 431c1, and the jig frame 340 is correspondingly provided with the magnetic element. 341. For example It is said that the magnetic element 431c1 of the stopper portion 431c is an electromagnet, and the magnetic element 341 of the jig frame 340 contains a ferromagnetic material. When the jig frame 340 is engaged with the guide rail 431, the magnetic element 341c1 of the limiting portion 431c provides appropriate magnetic attraction to the magnetic element 341 of the jig frame 340, so that the jig frame 340 can smoothly pass over the carrying portion 131a. Floating also favors the alignment between the positioning holes 151 of the carrier 150 and the positioning pins 121 of the lower jig 120. In addition, the magnetic element 431c1 of the limiting portion 431c provides a large magnetic attraction to the magnetic element 341 of the jig frame 340, and the purpose of locking the jig frame 340 to the limiting portion 431c is also achieved. The locking mechanism 132 shown in Fig. 4 can be effectively replaced.

於其他一些實施方式中,設置於限位部431c的磁吸元件431c1亦可與第3圖中設置於承載部131a的滾珠131a1、第6圖中設置於承載部231a的噴氣孔231a1或第7圖中設置於承載部331a的磁浮元件331a1進行組合。 In some other embodiments, the magnetic element 431c1 provided in the limiting portion 431c may also be provided with the air blast hole 231a1 or the seventh hole provided in the bearing portion 231a in the ball 131a1 and the sixth figure provided in the carrying portion 131a in FIG. The maglev elements 331a1 provided in the carrying portion 331a are combined in the drawing.

由以上對於本揭示案之具體實施方式之詳述,可以明顯地看出,於本揭示案的移載式電測設備中,移載模組可相對於機架本體移動至機外位置,以利人工或機械手臂進行放板程序(亦即,將帶有載板的治具框安裝於移載模組中)。在放板程序完成之後,移載模組接著帶著治具框相對機架本體移動至機內位置,以對讓載板上的待測板在移載式電測設備內進行測試,因此更符合人體工學或自動化產線之規劃。並且,移載模組上設置有可導引治具框,並使治具框可移動地限位於其間的導軌(亦即,此導軌可持住治具框,但仍留有讓治具框進行二維移動或三維移動之自由度),因此可以補償載板與下治具在安裝時的對位公差。藉由前述結構配置,本揭示案的移載式 電測設備至少可以達到以下目的:(1)降低載板安裝時與下治具對位之困難度;以及(2)減少下治具的定位銷及載板的定位孔之磨耗,以增加下治具與載板的使用壽命。 From the above detailed description of the specific embodiments of the present disclosure, it can be clearly seen that in the transfer type electric measuring device of the present disclosure, the transfer module can be moved to the off-machine position relative to the rack body, The manual or mechanical arm is used for the boarding process (that is, the fixture frame with the carrier plate is installed in the transfer module). After the boarding process is completed, the transfer module is then moved to the internal position of the rack body with the jig frame to test the board to be tested in the transfer type electric measuring device, and thus Ergonomic or automated production line planning. Moreover, the transfer module is provided with a guide frame which can guide the jig frame and can be moved to be restricted between the guide rails (that is, the guide rail can hold the jig frame, but the jig frame is still left) The degree of freedom of two-dimensional movement or three-dimensional movement) can compensate for the alignment tolerance of the carrier and the lower fixture during installation. By the foregoing structural configuration, the transfer type of the present disclosure The electrical measuring equipment can achieve at least the following purposes: (1) reducing the difficulty of alignment of the carrier with the lower fixture; and (2) reducing the wear of the positioning pin of the lower fixture and the positioning hole of the carrier to increase the lowering The service life of the fixture and the carrier.

雖然本揭示案已以實施方式揭露如上,然其並不用以限定本揭示案,任何熟習此技藝者,在不脫離本揭示案的精神和範圍內,當可作各種的更動與潤飾,因此本揭示案的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present disclosure has been disclosed in the above embodiments, it is not intended to limit the present disclosure, and any person skilled in the art can make various changes and refinements without departing from the spirit and scope of the present disclosure. The scope of protection of the disclosure is subject to the definition of the scope of the appended patent application.

Claims (13)

一種移載式電測設備,包含:一機架本體;一下治具,固定至該機架本體;以及一移載模組,可滑動地銜接該機架本體,進而可相對於該機架本體移動於一機外位置以及一機內位置之間,其中該移載模組包含兩導軌,該兩導軌配置以導引一治具框相對於該移載模組移動,並配置以使該治具框可移動地限位於其間,並且該移載模組配置以協助該治具框與該下治具結合。 A shifting type electrical measuring device comprises: a rack body; a lower fixture fixed to the rack body; and a transfer module slidably engaging the rack body, thereby being relative to the rack body Moving between an off-machine position and an in-machine position, wherein the transfer module includes two guide rails configured to guide a jig frame to move relative to the transfer module, and configured to enable the treatment The frame is movably spaced therebetween, and the transfer module is configured to assist the jig frame in combination with the lower jig. 如請求項第1項所述之移載式電測設備,其中該兩導軌各包含:一承載部,配置以承載該治具框;以及一側牆部,連接該承載部,其中該兩導軌之該些側牆部係配置以導引該治具框相對於該移載模組移動,並使該治具框可移動地限位於其間。 The load-bearing electrical testing device of claim 1, wherein the two rails each comprise: a carrying portion configured to carry the jig frame; and a side wall portion connecting the carrying portion, wherein the two guiding rails The side wall portions are configured to guide the jig frame to move relative to the transfer module, and to move the jig frame movably therebetween. 如請求項第2項所述之移載式電測設備,其中該承載部具有複數個滾珠,該些滾珠配置以可滑動地承載該治具框。 The load-bearing electrical measuring device of claim 2, wherein the carrying portion has a plurality of balls configured to slidably carry the jig frame. 如請求項第2項所述之移載式電測設備,其中該承載部具有複數個噴氣孔。 The transfer type electrical measuring device according to claim 2, wherein the carrying portion has a plurality of air holes. 如請求項第2項所述之移載式電測設備,其中該承載部具有一磁浮元件。 The transfer type electrical measuring device according to claim 2, wherein the carrying portion has a magnetic floating element. 如請求項第2項所述之移載式電測設備,其中該兩導軌各進一步包含一限位部,該限位部連接該側牆部,其中該承載部與該限位部配置以使該治具框可移動地限位於其間。 The load-bearing electrical testing device of claim 2, wherein the two rails further comprise a limiting portion, the limiting portion is connected to the side wall portion, wherein the carrying portion and the limiting portion are configured to The jig frame is movably limited to be located therebetween. 如請求項第6項所述之移載式電測設備,其中該限位部具有一磁吸元件。 The transfer type electrical measuring device of claim 6, wherein the limiting portion has a magnetic element. 如請求項第6項所述之移載式電測設備,其中該移載模組進一步包含兩鎖定機構,設置於該兩導軌上,該兩鎖定機構配置以將該治具框分別鎖定至該兩導軌的該些限位部,以及配置以釋放該治具框。 The transfer type electrical test device of claim 6, wherein the transfer module further comprises two locking mechanisms disposed on the two rails, the two locking mechanisms being configured to respectively lock the fixture frame to the The limiting portions of the two rails are configured to release the jig frame. 如請求項第1項所述之移載式電測設備,其中該移載模組進一步包含兩基板,該兩基板可滑動地銜接該機架本體,並分別可移動地銜接該兩導軌,進而使該兩導軌可朝向以及遠離該兩基板移動。 The transfer type electrical test device of claim 1, wherein the transfer module further comprises two substrates, the two substrates slidably engage the frame body, and respectively movably engage the two guide rails, and further The two rails are movable toward and away from the two substrates. 如請求項第9項所述之移載式電測設備,進一步包含兩驅動模組,分別設置於該兩基板上,並配置以分別驅動該兩導軌朝向以及遠離該兩基板移動。 The load-bearing electrical testing device of claim 9, further comprising two driving modules respectively disposed on the two substrates and configured to respectively drive the two guiding rails toward and away from the two substrates. 如請求項第9項所述之移載式電測設備,其中該移載模組配置以沿著一方向相對於該機架本體移動,該兩導軌配置以沿著另一方向相對於該兩基板移動,並且該方向與該另一方向實質上相互垂直。 The transfer type electrical test apparatus of claim 9, wherein the transfer module is configured to move relative to the frame body in a direction, the two rails being configured to be opposite to the two in another direction The substrate moves and the direction is substantially perpendicular to the other direction. 如請求項第1項所述之移載式電測設備,進一步包含一驅動模組,設置於該機架本體上,並配置以驅動該移載模組相對該機架本體移動。 The load-bearing electrical test device of claim 1, further comprising a driving module disposed on the frame body and configured to drive the transfer module to move relative to the frame body. 如請求項第1項所述之移載式電測設備,其中該移載模組配置以沿著一方向相對於該機架本體移動,該兩導軌配置以導引該治具框沿著另一方向移動,並且該方向與該另一方向實質上相互平行。 The transfer type electrical test device of claim 1, wherein the transfer module is configured to move relative to the frame body in a direction, the two guide rails are configured to guide the jig frame along another Moving in one direction, and the direction is substantially parallel to the other direction.
TW108204801U 2019-04-18 2019-04-18 Transfer type electrical test equipment TWM581202U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW108204801U TWM581202U (en) 2019-04-18 2019-04-18 Transfer type electrical test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW108204801U TWM581202U (en) 2019-04-18 2019-04-18 Transfer type electrical test equipment

Publications (1)

Publication Number Publication Date
TWM581202U true TWM581202U (en) 2019-07-21

Family

ID=68050666

Family Applications (1)

Application Number Title Priority Date Filing Date
TW108204801U TWM581202U (en) 2019-04-18 2019-04-18 Transfer type electrical test equipment

Country Status (1)

Country Link
TW (1) TWM581202U (en)

Similar Documents

Publication Publication Date Title
CN108627756B (en) Circuit board test system, circuit board test method and circuit board installation device
KR101732629B1 (en) Alignment device for multi probe unit
CN109261533B (en) Full-automatic horizontal flying probe test system
CN102290363B (en) Apparatus for driving placing table
CN107008773B (en) Position shaping device
CN106290990A (en) Can the positioner of the most electronic units fixes and the implement of application thereof
TWM581202U (en) Transfer type electrical test equipment
CN110355771A (en) A kind of robot trajectory's operation module for Technique Authentication real training
CN111879978B (en) Test fixture and test device
CN208654303U (en) A kind of big face magnet suction measurement equipment
CN208255267U (en) A kind of docking mechanism for testing production line
CN209894905U (en) Load-carrying type electric equipment
CN107932539B (en) Mechanical arm for grabbing multilayer new energy battery module and data sampling plate thereof
TW201835592A (en) Circuit board test system and circuit board test method
CN208283038U (en) Luminescence component detection device
CN201174860Y (en) Suction device for vision detection
CN105021851B (en) Vertical flying probe machine clamp and its design method
JP4443937B2 (en) Automated test system with compliance for tester positioning and method of operating it
CN210449946U (en) Wafer tester
TWM520778U (en) Pressing module
CN205333680U (en) Press module
CN206411360U (en) The automatic lighting jig of liquid crystal display
TWM562976U (en) Inspecting equipment for light-emitting device
US12019116B2 (en) Apparatus for aligning device having fine pitch and method therefor
CN218319435U (en) Positioning device