TWM570523U - Holder, optical component and optical module - Google Patents
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- TWM570523U TWM570523U TW107207799U TW107207799U TWM570523U TW M570523 U TWM570523 U TW M570523U TW 107207799 U TW107207799 U TW 107207799U TW 107207799 U TW107207799 U TW 107207799U TW M570523 U TWM570523 U TW M570523U
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Abstract
Description
本新型涉及一種支架及具有支架的組件與模組,特別是涉及一種支架及具有支架的光學組件與光學模組。 The present invention relates to a bracket, a component and a module having the bracket, and particularly to a bracket, an optical component and an optical module having the bracket.
參閱圖1,一種現有的光學模組9,其包括一電路基板91、一晶片92、一支架93以及一光學元件94。該晶片92設置在電路基板91。支架93設置在電路基板91,並圍繞晶片92。光學元件94設置在支架93。前述的晶片92可採用發光晶片或光感測晶片。當採用發光晶片時,光學元件94即會對應使用上的需要,而採用具有聚光、勻光,或濾光等效果的鏡片。而當採用光感測晶片時,則需要考量到光線蒐集效果,又或者光導引路徑,而採用稜鏡、聚光透鏡等鏡片。所採用的光學元件94的不同,影響光學模組9的表現甚鉅。 Referring to FIG. 1, a conventional optical module 9 includes a circuit substrate 91, a wafer 92, a bracket 93, and an optical element 94. The wafer 92 is provided on a circuit board 91. The holder 93 is provided on the circuit substrate 91 and surrounds the wafer 92. The optical element 94 is provided on the holder 93. The aforementioned wafer 92 may be a light-emitting wafer or a light-sensing wafer. When a light-emitting wafer is used, the optical element 94 will correspond to the needs in use, and a lens having the effects of condensing, homogenizing, or filtering is used. When using a light sensing chip, it is necessary to consider the light collection effect or the light guide path, and use lenses such as chirps and condenser lenses. The difference of the optical element 94 used greatly affects the performance of the optical module 9.
現有的光學模組9已運用到各種不同的領域中,例如做為攜帶式電子裝置的照明模組、指示燈的光源,又或者用來作為指紋辨識器的光感測模組。在正常使用下,光學模組9難免被晃動或受到碰撞,而導致光學元件94逐漸鬆脫,甚至滑落出支架93。然而,現有的光學模組9沒有任何用來感測光學元件94有否脫落的設計,有改善的需要。 The existing optical module 9 has been used in various fields, such as a lighting module of a portable electronic device, a light source of an indicator light, or a light sensing module used as a fingerprint reader. Under normal use, the optical module 9 is unavoidably shaken or impacted, which causes the optical element 94 to gradually loosen and even slide out of the bracket 93. However, the existing optical module 9 does not have any design for detecting whether the optical element 94 is detached, and there is a need for improvement.
本新型所要解決的技術問題在於,針對現有技術的不足提供一種支架,其能讓電路基板內的電路偵測光學元件是否脫落。 The technical problem to be solved by the present invention is to provide a bracket for the shortcomings of the prior art, which can allow the circuit in the circuit substrate to detect whether the optical element has fallen off.
為了解決上述的技術問題,本新型所採用的其中一技術方案是,提供一種支架。所述支架適合設置於一電路基板上且支撐一光學元件。所述支架設有至少二個彼此分離的導電層;其中,所述導電層電性連接至所述電路基板。 In order to solve the above technical problems, one of the technical solutions adopted by the present invention is to provide a bracket. The bracket is suitable for being disposed on a circuit substrate and supporting an optical element. The bracket is provided with at least two conductive layers separated from each other; wherein the conductive layer is electrically connected to the circuit substrate.
本新型所要解決的技術問題在於,針對現有技術的不足提供一種光學組件,其能讓電路基板內的電路偵測光學元件是否脫落。 The technical problem to be solved by the present invention is to provide an optical component for the shortcomings of the prior art, which can enable the circuit in the circuit substrate to detect whether the optical element has fallen off.
為了解決上述的技術問題,本新型所採用的另外一技術方案是,提供一種光學組件,其包括:一支架以及一光學元件。所述支架設有至少二個彼此分離的導電層。所述光學元件設置在所述支架,且所述光學元件上設有至少一與所述導電層電性連接的透光導電層。 In order to solve the above technical problems, another technical solution adopted by the present invention is to provide an optical component, which includes: a bracket and an optical element. The bracket is provided with at least two conductive layers separated from each other. The optical element is disposed on the bracket, and the optical element is provided with at least one transparent conductive layer electrically connected to the conductive layer.
本新型所要解決的技術問題在於,針對現有技術的不足提供一種光學模組,其能讓電路基板內的電路偵測光學元件是否脫落。 The technical problem to be solved by the present invention is to provide an optical module for the shortcomings of the prior art, which can enable the circuit in the circuit substrate to detect whether the optical element has fallen off.
為了解決上述的技術問題,本新型所採用的另外再一技術方案是,提供一種光學模組,其包括:一電子組件以及一光學組件。所述電子組件包括一電路基板以及一晶片元件。所述光學組件設置在所述電子組件,並包括一支架以及一光學元件。所述支架圍繞所述晶片元件,且所述支架設有至少二個彼此分離並與所述電子組件電性連接的導電層。所述光學元件設置在所述支架,且所述光學元件上設有至少一與所述導電層電性連接的透光導電層。 In order to solve the above technical problem, another technical solution adopted by the present invention is to provide an optical module, which includes: an electronic component and an optical component. The electronic component includes a circuit substrate and a chip component. The optical component is disposed on the electronic component and includes a bracket and an optical element. The bracket surrounds the wafer element, and the bracket is provided with at least two conductive layers separated from each other and electrically connected to the electronic component. The optical element is disposed on the bracket, and the optical element is provided with at least one transparent conductive layer electrically connected to the conductive layer.
本新型的其中一有益效果在於,電子組件內的電路能通過支架上設置的導電層來偵測光學元件是否脫落,並執行對應的保護措施。 One of the beneficial effects of the present invention is that the circuit in the electronic component can detect whether the optical element is detached through the conductive layer provided on the bracket, and execute corresponding protection measures.
為使能更進一步瞭解本新型的特徵及技術內容,請參閱以下有關本新型的詳細說明與圖式,然而所提供的圖式僅用於提供參考與說明,並非用來對本新型加以限制。 In order to further understand the features and technical contents of the new model, please refer to the following detailed description and drawings of the new model, however, the drawings provided are only for reference and description, and are not intended to limit the new model.
1‧‧‧電子組件 1‧‧‧Electronic components
11‧‧‧晶片元件 11‧‧‧Chip Components
12‧‧‧電路基板 12‧‧‧circuit board
2‧‧‧光學組件 2‧‧‧ Optical components
21‧‧‧支架 21‧‧‧ bracket
211‧‧‧圍繞壁 211‧‧‧ around the wall
212‧‧‧凸緣 212‧‧‧ flange
213‧‧‧凹槽 213‧‧‧Groove
214‧‧‧通道 214‧‧‧channel
215‧‧‧容置區 215‧‧‧accommodation area
22‧‧‧導電層 22‧‧‧ conductive layer
221‧‧‧底端 221‧‧‧ bottom
222‧‧‧連接端 222‧‧‧Connector
23‧‧‧光學元件 23‧‧‧Optical Elements
24‧‧‧透光導電層 24‧‧‧ Transparent conductive layer
241‧‧‧主體段 241‧‧‧Main section
242‧‧‧導通端 242‧‧‧Conductive terminal
9‧‧‧光學模組 9‧‧‧ Optical Module
91‧‧‧電路基板 91‧‧‧circuit board
92‧‧‧晶片 92‧‧‧Chip
93‧‧‧支架 93‧‧‧Scaffold
94‧‧‧光學元件 94‧‧‧optical element
圖1為剖視示意圖,說明現有的光學模組。 FIG. 1 is a schematic cross-sectional view illustrating a conventional optical module.
圖2為立體示意圖,說明本新型第一實施例。 FIG. 2 is a schematic perspective view illustrating a first embodiment of the present invention.
圖3為圖2的III-III剖面的剖面示意圖,說明第一實施例。 FIG. 3 is a schematic cross-sectional view taken along the line III-III in FIG. 2 to explain the first embodiment.
圖4為剖面示意圖,說明第一實施例的另一變化態樣。 FIG. 4 is a schematic cross-sectional view illustrating another variation of the first embodiment.
圖5為俯視示意圖,說明第一實施例的光學元件。 FIG. 5 is a schematic plan view illustrating the optical element of the first embodiment.
圖6為俯視示意圖,說明第一實施例的光學元件的另一變化態樣。 FIG. 6 is a schematic plan view illustrating another variation of the optical element of the first embodiment.
圖7為剖面示意圖,說明本新型第二實施例。 FIG. 7 is a schematic cross-sectional view illustrating a second embodiment of the present invention.
圖8為剖面示意圖,說明本新型第三實施例。 FIG. 8 is a schematic cross-sectional view illustrating a third embodiment of the present invention.
圖9為剖面示意圖,說明第三實施例的另一變化態樣。 FIG. 9 is a schematic cross-sectional view illustrating another variation of the third embodiment.
圖10為剖面示意圖,說明本新型第四實施例。 FIG. 10 is a schematic cross-sectional view illustrating a fourth embodiment of the present invention.
以下是通過特定的具體實施例來說明本新型所公開有關“支架、光學組件及光學模組”的實施方式,本領域技術人員可由本說明書所公開的內容瞭解本新型的優點與效果。本新型可通過其他不同的具體實施例加以施行或應用,本說明書中的各項細節也可基於不同觀點與應用,在不悖離本新型的構思下進行各種修改與變更。另外,本新型的附圖僅為簡單示意說明,並非依實際尺寸的描繪,事先聲明。以下的實施方式將進一步詳細說明本新型的相關技術內容,但所公開的內容並非用以限制本新型的保護範圍。 The following is a description of specific embodiments to describe the implementation of the "bracket, optical component, and optical module" disclosed by the present invention. Those skilled in the art can understand the advantages and effects of the present invention from the contents disclosed in this specification. The present invention may be implemented or applied through other different specific embodiments, and various details in this specification may also be based on different viewpoints and applications, and various modifications and changes may be made without departing from the concept of the new model. In addition, the drawings of the present invention are merely schematic illustrations, and are not drawn according to actual dimensions, and are stated in advance. The following embodiments will further describe the related technical content of the present invention in detail, but the disclosed content is not intended to limit the protection scope of the present invention.
參閱圖2及圖3,本新型第一實施例提供一種光學模組,其包括:一電子組件1以及一光學組件2。 Referring to FIG. 2 and FIG. 3, a first embodiment of the present invention provides an optical module including an electronic component 1 and an optical component 2.
電子組件1包括一晶片元件11以及一電路基板12。晶片元件 11設置在電路基板12,並受電路基板12內的驅動電路(圖未示)來驅動運作,可選自但不限於發光晶片或光感測晶片。發光晶片可例舉如:發光二極體(LED)、諧振腔發光二極體(RCLED),或垂直腔雷射二極體(VCSEL),但並不限於此。光感測晶片採用可見光感測晶片或非可見光感測晶片,其可例舉如:CCD晶片、CMOS晶片,但並不限於此。所採用的晶片為何,可以依據實際上的需要而自行選用,並不以本新型所公開者為限制。 The electronic component 1 includes a chip component 11 and a circuit substrate 12. Chip component 11 is disposed on the circuit substrate 12 and driven by a driving circuit (not shown) in the circuit substrate 12, and may be selected from, but not limited to, a light emitting chip or a light sensing chip. The light emitting chip may be, for example, a light emitting diode (LED), a resonant cavity light emitting diode (RCLED), or a vertical cavity laser diode (VCSEL), but is not limited thereto. The light sensing chip is a visible light sensing chip or a non-visible light sensing chip, which may be exemplified by a CCD chip and a CMOS chip, but is not limited thereto. What kind of chip is used can be selected according to actual needs, and is not limited by the disclosure of the new model.
電子組件1能內設一檢測電路(圖未示),而檢測電路可以整併在晶片元件11內,或者設置在電路基板12內,又或者,檢測電路就是晶片元件11的驅動電路本身,製造者可以依據需要進行調整,並沒有任何限制。 The electronic component 1 can be provided with a detection circuit (not shown), and the detection circuit can be integrated in the wafer element 11 or in the circuit substrate 12, or the detection circuit is the driving circuit itself of the wafer element 11, and is manufactured You can make adjustments as needed without any restrictions.
光學組件2設置在電子組件1,並包括一支架21以及一光學元件23。支架21包括一圍繞壁211、一凸緣212以及二凹槽213。圍繞壁211概呈立方柱形,且繞著晶片元件11設置在電路基板12,並圍繞界定出一通道214。圍繞壁211的形狀可以依據實際需要而進行調整,並不以立方柱形為限,亦可以為圓柱形、多角柱形等。凸緣212位在通道214內並設置在圍繞壁211,並將通道214分隔出一位於上方的容置區215。凹槽213是由圍繞壁211的壁面凹陷所形成,且分別位在圍繞壁211的兩不同側,且從圍繞壁211外部的底側向上延伸,通過圍繞壁211的頂側,並向內再向下延伸至凸緣212。 The optical component 2 is disposed on the electronic component 1 and includes a bracket 21 and an optical element 23. The bracket 21 includes a surrounding wall 211, a flange 212 and two grooves 213. The surrounding wall 211 is substantially in the shape of a cubic column, and is disposed on the circuit substrate 12 around the wafer element 11, and defines a channel 214 around it. The shape of the surrounding wall 211 may be adjusted according to actual needs, and is not limited to a cubic column shape, and may be a cylindrical shape, a polygonal column shape, or the like. The flange 212 is located in the channel 214 and is disposed on the surrounding wall 211 and divides the channel 214 into an upper receiving area 215. The groove 213 is formed by a recess of the wall surface surrounding the wall 211, and is located on two different sides of the surrounding wall 211, and extends upward from the bottom side outside the surrounding wall 211, passes through the top side of the surrounding wall 211, and inward Extends down to the flange 212.
支架21設有二個彼此分離的導電層22。每一導電層22的底端221與支架21底側切齊並電性連接至電路基板12,且包括一用來與光學元件23接觸的連接端222。導電層22設置在支架21的外壁面、內壁面以及內部三者中的其中一者,並沒有任何限制,端視需求而定。當導電層22設置在支架21的外壁面或內壁面時,導電層22可以使用無電鍍法披覆在支架21,也可以直接貼附金屬片至支架21,製造方法並沒有一定的限制。連接端222可以僅延 伸到圍繞壁211的頂側並指向並接觸光學元件23,又或者,連接端222可以延伸至圍繞壁211的內壁面以接觸光學元件23,在本第一實施例中,是以延伸到圍繞壁211的內壁面為例子。 The bracket 21 is provided with two conductive layers 22 separated from each other. The bottom end 221 of each conductive layer 22 is aligned with the bottom side of the support 21 and is electrically connected to the circuit substrate 12, and includes a connection end 222 for contacting the optical element 23. The conductive layer 22 is disposed on one of the outer wall surface, the inner wall surface, and the inside of the bracket 21 without any restrictions, and it depends on the requirements. When the conductive layer 22 is disposed on the outer wall surface or the inner wall surface of the bracket 21, the conductive layer 22 may be coated on the bracket 21 by using an electroless plating method, or a metal sheet may be directly attached to the bracket 21, and the manufacturing method is not limited. The connection end 222 can only be extended It extends to the top side of the surrounding wall 211 and points and contacts the optical element 23. Alternatively, the connecting end 222 may extend to the inner wall surface of the surrounding wall 211 to contact the optical element 23. In the first embodiment, The inner wall surface of the wall 211 is an example.
值得一提的是,導電層22可以形成在凹槽213內,又或者形成在凹槽213外,端視需要而定。每一個導電層22設置方式可以相同,也可以不同,亦視需要而定。在本第一實施例中,導電層22是以設置在凹槽213內為例子。 It is worth mentioning that the conductive layer 22 may be formed in the groove 213 or outside the groove 213, and the end depends on the needs. The arrangement of each conductive layer 22 may be the same or different, and it depends on needs. In the first embodiment, the conductive layer 22 is provided in the groove 213 as an example.
參閱圖2及圖4,光學元件23設置在支架21的容置區215內,其形狀與容置區215的形狀相配合,因此在本第一實施例中是呈矩形。光學元件23可定義出面向晶片元件11的下表面,以及面向外界的上表面。光學元件23可選自但不限於:透鏡、稜鏡、濾鏡。透鏡可例舉如:平面型透鏡、聚光型透鏡、散光型透鏡,但並不限於此。稜鏡可例舉如:色散稜鏡、反射稜鏡、偏光稜鏡,但不限於此。濾鏡可例舉如:CPL偏光鏡、ND減光鏡、UV保護鏡,但不限於此。光學元件23的材質可採用透明塑料或玻璃。前述透明塑料可選自聚酸甲酯(Polymethylmethacrylate,PMMA)、聚碳酸酯(Polycarbonate,PC)、聚醚酰亞胺(Polyetherimide,PEI)、環烯烴共聚物(Cyclo olefin coplymer,COC),或其等的混合。為了便於說明,在本第一實施例中是以玻璃製成的平面透鏡為例子。 Referring to FIG. 2 and FIG. 4, the optical element 23 is disposed in the accommodating region 215 of the bracket 21, and its shape matches the shape of the accommodating region 215. Therefore, it is rectangular in the first embodiment. The optical element 23 may define a lower surface facing the wafer element 11 and an upper surface facing the outside. The optical element 23 may be selected from, but not limited to, a lens, a lens, and a filter. Examples of the lens include a planar lens, a condensing lens, and a astigmatism lens, but are not limited thereto. Examples of chirp include: dispersion chirp, reflection chirp, and polarized chirp, but are not limited to this. The filter may be, for example, a CPL polarizer, an ND filter, or a UV protective lens, but is not limited thereto. The material of the optical element 23 may be transparent plastic or glass. The transparent plastic may be selected from polymethylmethacrylate (PMMA), polycarbonate (PC), polyetherimide (PEI), cyclic olefin coplymer (COC), or And so on. For convenience of explanation, a flat lens made of glass is used as an example in the first embodiment.
光學元件23設有一透光導電層24。透光導電層24自鄰近光學元件23的一角延伸至鄰近其對角。透光導電層24包括一主體段241以及二導通端242。透光導電層24的主體段241位在光學元件23的上表面或下表面,在第一實施例中是以位在上表面為例子。主體段241的形狀可以為S形(如圖5所示)或長條形(如圖6所示),第一實施例中是以S形為例子,但並不以此為限。導通端242與導電層22電性連接,可以位在與主體段241相同的一面(如圖3所示),又或者位在光學元件23的側邊(如圖4所示),並沒有任何限制,只要能與導電層22的連接端222電性連接即可,在第 一實施例中是以位在光學元件23的上表面為例子。透光導電層24的寬度可以大於、小於或等於導電層22的寬度,並沒有任何限制,在第一實施例中,是以透光導電層24的寬度小於導電層22的寬度為例子。 The optical element 23 is provided with a transparent conductive layer 24. The transparent conductive layer 24 extends from one corner adjacent to the optical element 23 to the opposite corner. The transparent conductive layer 24 includes a main body section 241 and two conductive ends 242. The main body segment 241 of the light-transmitting conductive layer 24 is located on the upper surface or the lower surface of the optical element 23. In the first embodiment, the upper surface or the lower surface is used as an example. The shape of the main body section 241 may be an S shape (as shown in FIG. 5) or an elongated shape (as shown in FIG. 6). In the first embodiment, the S shape is taken as an example, but it is not limited thereto. The conducting terminal 242 is electrically connected to the conductive layer 22, and can be located on the same side as the main body section 241 (as shown in FIG. 3) or on the side of the optical element 23 (as shown in FIG. 4), without any Limitation, as long as it can be electrically connected to the connection end 222 of the conductive layer 22, In one embodiment, the upper surface of the optical element 23 is used as an example. The width of the light-transmitting conductive layer 24 may be greater than, less than or equal to the width of the conductive layer 22, and there is no limitation. In the first embodiment, the width of the light-transmitting conductive layer 24 is smaller than the width of the conductive layer 22 as an example.
透光導電層24採用透光並具有導電性的材料製成,其材料選自但不限於:金屬、三氧化二銦摻雜錫(In2O3:Sn,ITO)、二氧化錫摻雜氟(SnO2:F,FTO)、二氧化錫摻雜銻(SnO2:Sb,ATO),及氧化鋅摻雜鋁(ZnO:Al,AZO)。當採用金屬時,其厚度需低於10nm,且材質可例舉如金、銀、鉑、銅、鋁、鉻、鈀、銠,但並不限於此。在本第一實施例中,是以三氧化二銦摻雜錫(ITO)為例子。 The light-transmitting conductive layer 24 is made of a light-transmitting and conductive material selected from, but not limited to, metals, indium trioxide-doped tin (In 2 O 3 : Sn, ITO), and tin dioxide Fluorine (SnO 2 : F, FTO), tin dioxide doped antimony (SnO 2 : Sb, ATO), and zinc oxide doped aluminum (ZnO: Al, AZO). When a metal is used, its thickness needs to be less than 10 nm, and the material can be exemplified by gold, silver, platinum, copper, aluminum, chromium, palladium, and rhodium, but it is not limited thereto. In the first embodiment, indium trioxide doped tin (ITO) is taken as an example.
當光學元件23放置在支架21的容置區215時,透光導電層24的導通端242就會分別與導電層22的連接端222電性連接,再通過導電層22電性連接至檢測電路,即構成一保護電路。通過讓檢測電路探測保護電路中的電阻或電流值,即可知曉導電層22與透光導電層24間是否保持電性連接。如此,當光學元件23自支架21上鬆脫而脫離時,透光導電層24就會一同即脫離導電層22,即呈現斷路,此時檢測電路即檢測到保護電路呈斷路並切斷驅動電路的運作,停止晶片元件11的運行,以避免晶片元件11受損;又或者,當將晶片元件11的驅動電路作為檢測電路時,只要將保護電路與驅動電路串聯,當透光導電層24脫離導電層22而呈斷路,此時同樣會切斷驅動電路,進而讓晶片元件11停止運行。 When the optical element 23 is placed in the accommodating area 215 of the bracket 21, the conductive ends 242 of the light-transmitting conductive layer 24 are electrically connected to the connection ends 222 of the conductive layer 22, respectively, and then electrically connected to the detection circuit through the conductive layer 22. , Which constitutes a protection circuit. By letting the detection circuit detect the resistance or current value in the protection circuit, it can be known whether the conductive layer 22 and the transparent conductive layer 24 are electrically connected. In this way, when the optical element 23 is detached from the bracket 21 and detached, the light-transmitting conductive layer 24 will be detached from the conductive layer 22, that is, an open circuit will occur. At this time, the detection circuit will detect that the protection circuit is open and cut off the drive circuit To stop the operation of the chip element 11 to avoid damage to the chip element 11; or, when the driving circuit of the chip element 11 is used as a detection circuit, as long as the protection circuit is connected in series with the driving circuit, when the transparent conductive layer 24 is detached The conductive layer 22 is disconnected. At this time, the driving circuit is also cut off, and the wafer element 11 is stopped.
通過上述說明,可將本第一實施例的優點歸納如下: Through the above description, the advantages of the first embodiment can be summarized as follows:
一、電子組件1內的電路能通過支架21上設置的導電層22來偵測光學元件23是否脫落,並執行對應的保護措施。 1. The circuit in the electronic component 1 can detect whether the optical element 23 is detached through the conductive layer 22 provided on the bracket 21 and perform corresponding protection measures.
二、電子組件1內的電路能夠通過檢測透光導電層24是否導通,即可知曉光學元件23是否脫落,並執行對應的保護措施。 2. The circuit in the electronic component 1 can know whether the optical element 23 has fallen off by detecting whether the light-transmitting conductive layer 24 is conducting, and perform corresponding protection measures.
三、將透光導電層24配置在光學元件23的上表面,能夠用 來感測光學元件23的磨損情況。當外物磨擦到光學元件23的上表面時,就會同時磨擦到透光導電層24,如此,若光學元件23遭遇到過多的磨擦,就容易將透光導電層24自光學元件23上磨除,使保護電路呈現斷路,進而停止晶片元件11的運作。 3. The transparent conductive layer 24 is arranged on the upper surface of the optical element 23, and can be used To sense the wear of the optical element 23. When a foreign object rubs on the upper surface of the optical element 23, it will also rub the light-transmitting conductive layer 24 at the same time. In this way, if the optical element 23 encounters excessive friction, it is easy to rub the light-transmitting conductive layer 24 from the optical element 23 In addition, the protection circuit is opened, and the operation of the chip element 11 is stopped.
四、透光導電層24採用S形,較能確保光學元件23表面的各處都有透光導電層24,如:角落、周邊、中央等位置,如此,通過此種配置,能夠進一步確保當外物磨擦到光學元件23的同時也能夠磨擦到透光導電層24,提高感測光學元件23磨損情況的能力。 Fourth, the light-transmitting conductive layer 24 adopts an S-shape, which can ensure that the light-transmitting conductive layer 24 is everywhere on the surface of the optical element 23, such as corners, perimeters, and centers. With this configuration, it can further ensure that When foreign objects are rubbed against the optical element 23, they can also rub against the light-transmitting conductive layer 24, thereby improving the ability to sense the wear condition of the optical element 23.
五、將導電層22設置在凹槽213內,能夠避免導電層22被外物磨擦毀損而使保護電路呈斷路,進而讓晶片元件11停止運行。換言之,通過將導電層22設置在凹槽213,能確保保護電路呈斷路是由於光學元件23脫離支架21或是透光導電層24毀損。 5. The conductive layer 22 is disposed in the groove 213, which can prevent the conductive layer 22 from being abraded and damaged by a foreign object to cause the protection circuit to be disconnected, thereby stopping the chip element 11 from operating. In other words, by arranging the conductive layer 22 in the groove 213, it can be ensured that the protection circuit is broken because the optical element 23 is detached from the bracket 21 or the transparent conductive layer 24 is damaged.
六、當透光導電層24的導通端242延伸到光學元件23的側邊,此結構能夠增加與導電層22的接觸面積,確保彼此間有效地電性連接。因此,只有當光學元件23完全脫離支架21或幾近脫離21支架時,透光導電層24才不會與導電層22接觸而讓保護電路呈現斷路。如此,可以避免因為些微晃動導致導電層22與透光導電層24錯開而呈斷路,使檢測電路誤判。 6. When the conducting end 242 of the light-transmitting conductive layer 24 extends to the side of the optical element 23, this structure can increase the contact area with the conductive layer 22 and ensure effective electrical connection with each other. Therefore, only when the optical element 23 completely disengages from the bracket 21 or almost disengages from the 21 bracket, the transparent conductive layer 24 will not contact the conductive layer 22 and the protection circuit will be opened. In this way, it is possible to avoid that the conductive layer 22 and the light-transmitting conductive layer 24 are staggered and disconnected due to slight shaking, so that the detection circuit may misjudge.
七、因導電層22的寬度大於透光導電層24的寬度,兩者相貼合時不易因為製造時所生的誤差而無法電性連接。 7. Since the width of the conductive layer 22 is greater than the width of the light-transmitting conductive layer 24, it is not easy for the two to be electrically connected when the two are bonded together because of errors during manufacturing.
參閱圖7,本新型第二實施例,大致與第一實施例相同,差異僅在於透光導電層24的導通端242延伸至光學元件23的側邊,且導電層22設置在支架21的內部。因為導電層22是設置在支架21的內部,所以第二實施例的支架21不設有凹槽213(見圖2)。 Referring to FIG. 7, the second embodiment of the present invention is substantially the same as the first embodiment, except that the conducting end 242 of the light-transmitting conductive layer 24 extends to the side of the optical element 23, and the conductive layer 22 is disposed inside the bracket 21. . Since the conductive layer 22 is provided inside the bracket 21, the bracket 21 of the second embodiment is not provided with a groove 213 (see FIG. 2).
導電層22設置在支架21內部的方式,是依據支架21的用料 及製程相配合調整。當支架21採用熱可塑材料,可先將導電層22放置在用來製作支架21的模具內,而後灌注塑料包覆導電層22,並進一步固化成形為支架21;而當支架21是採用陶瓷材料時,則可以先將導電層22放置於胚料內,而後共同燒結,使導電層22埋設在支架21內。然而製作方式可以依據任何習知工法進行調整,並不以此為限。 The manner in which the conductive layer 22 is provided inside the bracket 21 is based on the materials of the bracket 21 And process adjustments. When the stent 21 is made of a thermoplastic material, the conductive layer 22 can be placed in the mold used to make the stent 21, and then the plastic-coated conductive layer 22 is poured, and further cured to form the stent 21; and when the stent 21 is made of ceramic material In this case, the conductive layer 22 may be placed in the blank first, and then sintered together to embed the conductive layer 22 in the bracket 21. However, the production method can be adjusted according to any conventional method, and is not limited to this.
當導電層22埋設在支架21內部,更能避免導電層22受外物磨擦而毀損,能更進一步確保保護電路呈斷路是由於光學元件23脫離支架21或是透光導電層24毀損,而非由於導電層22本身受損。 When the conductive layer 22 is embedded in the bracket 21, the conductive layer 22 can be prevented from being damaged by the friction of foreign objects, which can further ensure that the protection circuit is broken because the optical element 23 is detached from the bracket 21 or the transparent conductive layer 24 is damaged, rather than being damaged. Since the conductive layer 22 itself is damaged.
如此,本第二實施例除了具備第一實施例的優點外,通過將導電層22埋設在支架21內,還能夠進一步的確保偵測光學元件23是否脫離支架21或過度磨損的準確性。 In this way, in addition to the advantages of the first embodiment, the second embodiment can further ensure the accuracy of detecting whether the optical element 23 is detached from the bracket 21 or excessively worn by embedding the conductive layer 22 in the bracket 21.
參閱圖8,本新型第三實施例,大致與第一實施例相同,差異僅在於透光導電層24是設置在光學元件23的下表面。因導電層22的連接端222是延伸到鄰近光學元件23的下表面,因此能夠與透光導電層24進行電性連接。 Referring to FIG. 8, the third embodiment of the present invention is substantially the same as the first embodiment, except that the transparent conductive layer 24 is disposed on the lower surface of the optical element 23. Since the connection end 222 of the conductive layer 22 extends to the lower surface of the adjacent optical element 23, it can be electrically connected to the light-transmitting conductive layer 24.
參閱圖9,第三實施例的另一變化態樣,是導電層22設置在支架21的內壁面。導電層的底端221同樣電性連接到電路基板12,而連接端222是延伸至支架21的凸緣212上側。通過此方式,透光導電層24同樣能與導電層22相貼合並電性連接。 Referring to FIG. 9, another variation of the third embodiment is that the conductive layer 22 is disposed on the inner wall surface of the bracket 21. The bottom end 221 of the conductive layer is also electrically connected to the circuit substrate 12, and the connection end 222 extends to the upper side of the flange 212 of the bracket 21. In this way, the light-transmitting conductive layer 24 can also adhere to the conductive layer 22 and be electrically connected.
如此,本第三實施例除了不能感測光學元件23的磨損情況外,具備有第一實施例同樣的優點。製造者可以依據實際上需求進行選用,如所用的光學模組不欲擁有感測光學元件23磨損情況的功能時,即可採用本實施例的方案。因此,第三實施例提供另一種技術方案,讓製造者可以依據實際上的需求進行調整。 As such, the third embodiment has the same advantages as the first embodiment except that the abrasion of the optical element 23 cannot be sensed. Manufacturers can choose according to actual needs. For example, when the optical module used does not want to have the function of sensing the wear condition of the optical element 23, the solution of this embodiment can be adopted. Therefore, the third embodiment provides another technical solution, so that the manufacturer can adjust according to actual needs.
參閱圖10,本新型第四實施例,大致與第三實施例相同,差異僅在於透光導電層24的導通端242延伸至光學元件23的側邊,且導電層22設置在支架21的內部。導電層22的設置方式,與第二實施例相同,在此不予贅述。 Referring to FIG. 10, the fourth embodiment of the present invention is substantially the same as the third embodiment, except that the conducting end 242 of the light-transmitting conductive layer 24 extends to the side of the optical element 23, and the conductive layer 22 is disposed inside the bracket 21. . The arrangement of the conductive layer 22 is the same as that of the second embodiment, and details are not described herein.
如此,本第四實施例除了具備第三實施例的優點外,通過將導電層22埋設在支架21內,還能夠進一步的確保偵測光學元件23是否脫離支架21或過度磨損的準確性。 Thus, in addition to the advantages of the third embodiment, the fourth embodiment can further ensure the accuracy of detecting whether the optical element 23 is detached from the bracket 21 or excessively worn by embedding the conductive layer 22 in the bracket 21.
綜上所述,支架21上設置的導電層22能讓電路基板12內的電路偵測光學元件23是否自支架21脫落,並執行對應的保護措施。因此,確實達成本新型的目的。 In summary, the conductive layer 22 provided on the bracket 21 allows the circuit in the circuit substrate 12 to detect whether the optical element 23 has fallen off the bracket 21 and perform corresponding protection measures. Therefore, the purpose of a new type of cost is indeed achieved.
以上所公開的內容僅為本新型的優選可行實施例,並非因此侷限本新型的申請專利範圍,所以凡是運用本新型說明書及圖式內容所做的等效技術變化,均包含於本新型的申請專利範圍內。 The contents disclosed above are only the preferred and feasible embodiments of the new model, and therefore do not limit the scope of the patent application for the new model. Therefore, any equivalent technical changes made using the description and drawings of the new model are included in the new model application Within the scope of the patent.
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CN111211204A (en) * | 2018-11-22 | 2020-05-29 | 纮华电子科技(上海)有限公司 | Flip-chip type light emitting module |
TWI697019B (en) * | 2018-06-11 | 2020-06-21 | 海華科技股份有限公司 | Holder, optical component and optical module |
CN111520619A (en) * | 2019-02-01 | 2020-08-11 | 光宝光电(常州)有限公司 | Light source device |
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TWI697019B (en) * | 2018-06-11 | 2020-06-21 | 海華科技股份有限公司 | Holder, optical component and optical module |
CN111211204A (en) * | 2018-11-22 | 2020-05-29 | 纮华电子科技(上海)有限公司 | Flip-chip type light emitting module |
CN111520619A (en) * | 2019-02-01 | 2020-08-11 | 光宝光电(常州)有限公司 | Light source device |
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