TWM567953U - Semiconductor package structure with spaced protrusions - Google Patents
Semiconductor package structure with spaced protrusions Download PDFInfo
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- TWM567953U TWM567953U TW107204237U TW107204237U TWM567953U TW M567953 U TWM567953 U TW M567953U TW 107204237 U TW107204237 U TW 107204237U TW 107204237 U TW107204237 U TW 107204237U TW M567953 U TWM567953 U TW M567953U
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48145—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15158—Shape the die mounting substrate being other than a cuboid
- H01L2924/15159—Side view
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/191—Disposition
- H01L2924/19101—Disposition of discrete passive components
- H01L2924/19102—Disposition of discrete passive components in a stacked assembly with the semiconductor or solid state device
- H01L2924/19103—Disposition of discrete passive components in a stacked assembly with the semiconductor or solid state device interposed between the semiconductor or solid-state device and the die mounting substrate, i.e. chip-on-passive
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Abstract
一種具有間隔凸部的半導體封裝結構,係在一基板上設置至少二個間隔凸部;一第一晶片設於該等間隔凸部上,並與該基板電性連接;一第二晶片設於該基板與該等間隔凸部所圍的一容置空間中,並與該基板電性連接;以及一塑封體,在該基板上包覆該等間隔凸部﹑該第一晶片與該第二晶片並且填滿該容置空間;藉此可減少整體封裝結構的電路佈線﹑維持半導體封裝結構之強度﹑減少打引線次數﹑以及減少引線使用量。A semiconductor package structure having spacer protrusions is provided with at least two spacer protrusions on a substrate; a first wafer is disposed on the spacer protrusions and electrically connected to the substrate; and a second wafer is disposed on the substrate The substrate and the accommodating space surrounded by the spacers are electrically connected to the substrate; and a molding body covering the spacers, the first wafer and the second on the substrate The wafer fills the accommodating space; thereby reducing circuit wiring of the overall package structure, maintaining the strength of the semiconductor package structure, reducing the number of lead wires, and reducing the amount of lead used.
Description
本創作涉及半導體封裝的技術領域。特別是可以減少整體封裝結構的電路佈線﹑維持半導體封裝結構之強度﹑減少打引線次數﹑以及減少引線使用量的半導體封裝結構。This creation relates to the technical field of semiconductor packaging. In particular, the semiconductor package structure can reduce the circuit wiring of the overall package structure, maintain the strength of the semiconductor package structure, reduce the number of lead wires, and reduce the amount of lead used.
習知的半導體封裝結構可以分為兩種:第一種為將晶片堆疊在一 基板上再予封裝的結構;第二種則是將多個晶片配置於基板上再予以封裝。Conventional semiconductor packaging structures can be divided into two types: the first is a structure in which wafers are stacked on a substrate and then packaged; the second is a structure in which multiple wafers are arranged on a substrate and then packaged.
圖1係顯示習知的晶片堆疊形態的封裝結構,此種封裝結構係在一基板A上至少堆疊第一晶片B與第二晶片C,再將各晶片打引線D至基板A以電性連接,因此,此種封裝結構的打引線次數較多,整體封裝結構的電路佈線較複雜。FIG. 1 shows a conventional packaging structure of a chip stack. This packaging structure is a method in which at least a first wafer B and a second wafer C are stacked on a substrate A, and then each wafer is wired D to the substrate A for electrical connection. Therefore, this package structure has a large number of lead times, and the circuit wiring of the overall package structure is more complicated.
圖2係顯示習知另一種將至少二個晶片B﹑C配置於基板A上的封裝結構,此種結構因為將多個晶片平放於基板上,因而會增加基板的使用面積,造成整體封裝結構尺寸增加,如此對於短小輕薄的電子產品而言,需要進一步克服以降低半導體封裝結構的尺寸。Figure 2 shows another conventional packaging structure in which at least two wafers B and C are arranged on a substrate A. This structure will increase the area of the substrate and cause the overall package because multiple wafers are placed on the substrate. The structure size has increased, so for short and thin electronic products, it needs to be further overcome to reduce the size of the semiconductor package structure.
又,圖3所示為台灣專利公開第200623290號所揭露的半導體元件封裝構造,係在一基板A上表面形成一凹槽A1,該凹槽A1內置入一第一晶片B(被動元件)並使第一晶片B電性連接至基板A,再將一第二晶片C(半導體元件)跨置於該凹槽A1上方的基板A的上表面B,藉此可較前述的習知堆疊封裝結構大幅減少整體之封裝厚度以增加封裝效率。In addition, FIG. 3 shows the semiconductor device package structure disclosed in Taiwan Patent Publication No. 200623290. A groove A1 is formed on the upper surface of a substrate A. The groove A1 is built into a first chip B (passive component) and The first chip B is electrically connected to the substrate A, and then a second chip C (semiconductor element) is placed across the upper surface B of the substrate A above the groove A1, so that the package packaging structure can be compared with the conventional stacking package. Significantly reduce the overall package thickness to increase packaging efficiency.
惟,台灣專利公開第200623290號揭露的半導體封裝結構由於是在基板A上形成凹槽A1,以致於基板A在凹槽A1的位置因為厚度減小而降低了強度;並且因為第一晶片B與第二晶片C分別配置在凹槽A1內與凹槽A1外而使得佈線較為複雜。However, the semiconductor package structure disclosed in Taiwan Patent Publication No. 200623290 is because the groove A1 is formed on the substrate A, so that the position of the substrate A in the groove A1 is reduced due to the reduced thickness; and because the first wafer B and the The second wafer C is disposed inside the groove A1 and outside the groove A1 respectively, so that wiring is complicated.
本創作的其中一目的在於提供一種半導體封裝結構,其可降低多個晶片堆疊形態之封裝結構的電路佈線複雜度。One of the objectives of this creation is to provide a semiconductor package structure that can reduce the complexity of circuit wiring of a package structure in the form of multiple wafer stacks.
本創作的另一目的在於提供一種半導體封裝結構,其可以在降低半導體封裝後的整體厚度情況下維持封裝結構之強度。Another purpose of this creation is to provide a semiconductor package structure that can maintain the strength of the package structure while reducing the overall thickness of the semiconductor package.
本創作提供的具有間隔凸部的半導體封裝結構,其技術手段包括:一基板;至少二間隔凸部,設於該基板上;一第一晶片,設於該等間隔凸部上,並與該基板電性連接;一第二晶片,設於該基板與該等間隔凸部所圍的一容置空間中,並與該基板電性連接;以及一塑封體,在該基板上包覆該等間隔凸部﹑該第一晶片與該第二晶片並且填滿該容置空間。The technical package of the semiconductor package structure provided with spaced convex portions provided in this creation includes: a substrate; at least two spaced convex portions provided on the substrate; a first wafer provided on the spaced convex portions and connected with the spaced convex portions. The substrate is electrically connected; a second chip is disposed in an accommodating space surrounded by the substrate and the spaced convex portions, and is electrically connected to the substrate; and a plastic package covering the substrate on the substrate The space convex portion, the first wafer and the second wafer fill the accommodation space.
在本創作之具有間隔凸部的半導體封裝結構的一實施例中,該間隔凸部可以是獨立的元件,以被安裝於該基板上。In an embodiment of the semiconductor package structure with a space convex portion, the space convex portion may be an independent component to be mounted on the substrate.
在本創作之具有間隔凸部的半導體封裝結構的另一實施例中,該間隔凸部可以是形成於該基板上的凸肋。In another embodiment of the semiconductor package structure with a space convex portion, the space convex portion may be a rib formed on the substrate.
在本創作之具有間隔凸部的半導體封裝結構的一實施例中,該等間隔凸部可以包括二個,並且配置於相對兩側。In an embodiment of the semiconductor package structure with spaced convex portions, the spaced convex portions may include two spaced convex portions and are disposed on opposite sides.
在本創作之具有間隔凸部的半導體封裝結構的另一實施例中,該等間隔凸部可以包括四個,並且配置於一矩形的四個角落。In another embodiment of the semiconductor package structure with spaced-apart protrusions, the spaced-apart protrusions may include four and are disposed at four corners of a rectangle.
在本創作之具有間隔凸部的半導體封裝結構的另一實施例中,該等間隔凸部的俯視平面可以具有一幾何形狀。In another embodiment of the semiconductor package structure with spaced-apart protrusions, the plan view of the spaced-apart protrusions may have a geometric shape.
較佳者,該幾何形狀可以是L形狀,並且彼此相鄰的二個間隔凸部之間呈對稱地配置。Preferably, the geometric shape may be an L shape, and two spaced-apart convex portions adjacent to each other are symmetrically arranged.
較佳者,本創作之封裝結構中的間隔凸部為非導電性之絕緣材料。Preferably, the spacer protrusions in the packaging structure of this creation are non-conductive insulating materials.
在本創作之具有間隔凸部的半導體封裝結構的一實施例中,該非導電性之絕緣材料可以是薄膜黏晶材料(Die Attach Film, DAF)。In one embodiment of the semiconductor packaging structure with spaced convex portions of the present invention, the non-conductive insulating material may be a Die Attach Film (DAF).
在本創作之具有間隔凸部的半導體封裝結構的另一實施例中,該非導電性之絕緣材料可以是工程塑膠材料。In another embodiment of the semiconductor package structure with spaced convex portions, the non-conductive insulating material may be an engineering plastic material.
本創作提供的具有間隔凸部的半導體封裝結構具有以下的優點及效果: 1. 本創作透過在基板上設置至少二個間隔凸部,並且直接在該等間隔凸部上放置晶片以及與基板電性連接,可以減少整體封裝結構的電路佈線的複雜度。 2. 本創作設於基板上的間隔凸部可以為肋條,藉由肋條可以加強半導體封裝結構之強度。 3. 可以減少打引線的次數,減少引線材料使用量。The semiconductor package structure provided with spacer protrusions provided by this creation has the following advantages and effects: 1. This creation is by setting at least two spacer protrusions on the substrate, and directly placing a wafer on the spacer protrusions and communicating with the substrate. Sexual connection can reduce the complexity of circuit wiring of the overall packaging structure. 2. The spacer protrusions provided on the substrate can be ribs. The ribs can enhance the strength of the semiconductor package structure. 3. It can reduce the number of lead wires and the amount of lead material used.
以下配合圖式對本創作之其它目的及功能做進一步的說明,俾能對本創作有詳盡的了解。The following explains the other purposes and functions of this creation in conjunction with the drawings, so that you can have a thorough understanding of this creation.
圖4為顯示本創作之具有間隔凸部的半導體封裝結構的第一實施例;如圖4所示,本創作提供的具有間隔凸部的半導體封裝結構,可以包括一基板1﹑二個間隔凸部2﹑一第一晶片3與一第二晶片4;其中,所述基板1為佈設有必要的電路的電路板。所述間隔凸部2為獨立的元件,並且被結合固定於基板1的表面,例如,可以使用黏著劑將間隔凸部2黏固固定於基板1上;在本創作的第一實施例中,該二個間隔凸部2可以配置在基板1上表面的對稱兩側,使得二個間隔凸部2與基板1之間形成一容置空間S;該間隔凸部2較佳地可以使用非導電性之絕緣材料,例如,薄膜黏晶材料(Die Attach Film, DAF)﹑工程塑膠材料等。FIG. 4 shows a first embodiment of the semiconductor package structure with spaced convex portions of the present invention; as shown in FIG. 4, the semiconductor package structure with spaced convex portions provided by this material may include a substrate 1 and two spaced convex portions. The part 2, a first wafer 3, and a second wafer 4; wherein the substrate 1 is a circuit board on which necessary circuits are arranged. The spaced convex portion 2 is an independent element and is fixed and fixed to the surface of the substrate 1. For example, the spaced convex portion 2 can be fixed and fixed on the substrate 1 by using an adhesive. In the first embodiment of the present invention, The two spaced convex portions 2 may be disposed on symmetrical sides of the upper surface of the substrate 1, so that an accommodation space S is formed between the two spaced convex portions 2 and the substrate 1. The spaced convex portions 2 may preferably be non-conductive. Insulating materials such as Die Attach Film (DAF), engineering plastic materials, etc.
所述第一晶片3與第二晶片4可以分別是被動元件或其他半導體元件。首先將第二晶片4設於基板1與該等間隔凸部2所圍的容置空間S中,並使第二晶片4與基板1上的電路電性連接,例如透過銲接以電性連接;然後將第一晶片3安裝固定於該等間隔凸部2上,例如以黏著劑將第一晶片3黏合固定於間隔凸部2上,再於第一晶片3與基板1上的電路之間進行打引線,使得第一晶片3與基板1電性連接。最後將組合後的基板1﹑間隔凸部2﹑第一晶片3與第二晶片4置入模具中進行封裝製程,在該封裝製程中,將液態的絕緣塑封材料注入模具中,該塑封材料於模具中流動而填滿容置空間S,同時在基板1的上表面包覆於各個間隔凸部2﹑第一晶片3與第二晶片4,待塑封材料凝固後形成固態的塑封體5以保護內部的第一晶片3﹑第二晶片4﹑引線6及電路,並完成整體之封裝。The first wafer 3 and the second wafer 4 may be passive components or other semiconductor components, respectively. First, the second wafer 4 is set in an accommodation space S surrounded by the substrate 1 and the spaced convex portions 2, and the second wafer 4 is electrically connected to a circuit on the substrate 1, for example, electrically connected by soldering; Then, the first wafer 3 is mounted and fixed on the spaced convex portions 2, for example, the first wafer 3 is adhered and fixed on the spaced convex portions 2 with an adhesive, and then performed between the first wafer 3 and the circuit on the substrate 1. Make a lead so that the first wafer 3 and the substrate 1 are electrically connected. Finally, the combined substrate 1, the spaced convex portion 2, the first wafer 3 and the second wafer 4 are put into a mold for a packaging process. In the packaging process, a liquid insulating plastic sealing material is injected into the mold. The mold flows to fill the containing space S, and at the same time, the upper surface of the substrate 1 is covered with each of the spaced protrusions 2, the first wafer 3 and the second wafer 4. After the molding material solidifies, a solid molding body 5 is formed to protect it. The first chip 3, the second chip 4, the lead 6 and the circuit are completed inside, and the whole package is completed.
圖5為顯示本創作之具有間隔凸部的半導體封裝結構的第二實施例;如圖5所示,本創作提供的具有間隔凸部的半導體封裝結構,可以包括一基板1﹑二個間隔凸部2﹑一第一晶片3與一第二晶片4;其中,所述基板1為佈設有必要的電路的電路板。所述間隔凸部2為製造基板1時直接在基板1上表面形成凸出結構的凸肋;在本創作的第二實施例中,該二個間隔凸部2係配置在基板1上表面的對稱兩側,使得二個間隔凸部2與基板1之間形成一容置空間S;同樣的,該間隔凸部2較佳地可以使用非導電性之絕緣材料,例如,薄膜黏晶材料(Die Attach Film, DAF)﹑工程塑膠材料等。FIG. 5 shows a second embodiment of the semiconductor package structure with spaced convex portions of the present invention; as shown in FIG. 5, the semiconductor package structure with spaced convex portions provided by the present invention may include a substrate 1 and two spaced convex portions The part 2, a first wafer 3, and a second wafer 4; wherein the substrate 1 is a circuit board on which necessary circuits are arranged. The spaced convex portions 2 are raised ribs that directly form a protruding structure on the upper surface of the substrate 1 when the substrate 1 is manufactured. In the second embodiment of the present invention, the two spaced convex portions 2 are arranged on the upper surface of the substrate 1. The two sides are symmetrical, so that an accommodation space S is formed between the two spaced protrusions 2 and the substrate 1. Similarly, the spaced protrusions 2 may preferably be made of a non-conductive insulating material, for example, a thin film die-bonding material ( Die Attach Film (DAF), engineering plastic materials, etc.
在本創作的第二實施例中,所述第一晶片3與第二晶片4可以分別是被動元件或其他半導體元件。首先將第二晶片4設於基板1與該等間隔凸部2所圍的容置空間S中,並使第二晶片4與基板1上的電路電性連接,例如透過銲接以電性連接;然後將第一晶片3安裝固定於該等間隔凸部2上,例如以黏著劑將第一晶片3黏合固定於間隔凸部2上,再於第一晶片3與基板1上的電路之間進行打引線,使得第一晶片3與基板1電性連接。最後將組合後的基板1﹑間隔凸部2﹑第一晶片3與第二晶片4置入模具中進行封裝製程,在該封裝製程中,將液態的絕緣塑封材料注入模具中,該塑封材料於模具中流動而填滿容置空間S,同時在基板1的上表面包覆於各個間隔凸部2﹑第一晶片3與第二晶片4,待塑封材料凝固後形成固態的塑封體5以保護內部的第一晶片3﹑第二晶片4﹑引線6及電路,並完成整體之封裝。In the second embodiment of the present invention, the first wafer 3 and the second wafer 4 may be passive components or other semiconductor components, respectively. First, the second wafer 4 is set in an accommodation space S surrounded by the substrate 1 and the spaced convex portions 2, and the second wafer 4 is electrically connected to a circuit on the substrate 1, for example, electrically connected by soldering; Then, the first wafer 3 is mounted and fixed on the spaced convex portions 2, for example, the first wafer 3 is adhered and fixed on the spaced convex portions 2 with an adhesive, and then performed between the first wafer 3 and the circuit on the substrate 1. Make a lead so that the first wafer 3 and the substrate 1 are electrically connected. Finally, the combined substrate 1, the spaced convex portion 2, the first wafer 3 and the second wafer 4 are put into a mold for a packaging process. In the packaging process, a liquid insulating plastic sealing material is injected into the mold. The mold flows to fill the containing space S, and at the same time, the upper surface of the substrate 1 is covered with each of the spaced protrusions 2, the first wafer 3 and the second wafer 4. After the molding material solidifies, a solid molding body 5 is formed to protect it. The first chip 3, the second chip 4, the lead 6 and the circuit are completed inside, and the whole package is completed.
圖6為顯示本創作之具有間隔凸部的半導體封裝結構的第三實施例;如圖6所示,本創作提供的具有間隔凸部的半導體封裝結構,可以包括一基板1﹑四個間隔凸部2﹑一第一晶片3與一第二晶片4;其中,所述基板1為佈設有必要的電路的電路板。所述四個間隔凸部2可以是獨立的元件,並且被結合固定於基板1的表面,例如,可以使用黏著劑將間隔凸部2黏固固定於基板1上;或者,該四固間隔凸部2也可以是在製造基板1時直接在基板1上表面形成凸出結構的凸肋;在本創作的第三實施例中,該四個間隔凸部2係配置在基板1上表面的一矩形的四個角落的位置,使得四個間隔凸部2與基板1之間形成一容置空間S;同樣的,該間隔凸部2較佳地可以使用非導電性之絕緣材料,例如,薄膜黏晶材料(Die Attach Film, DAF)﹑工程塑膠材料等。較佳者,該等間隔凸部2的俯視平面可以具有一幾何形狀,例如L形狀,並且彼此相鄰的二個間隔凸部2之間呈對稱地配置。FIG. 6 shows a third embodiment of the semiconductor package structure with spaced convex portions of the present invention. As shown in FIG. 6, the semiconductor package structure with spaced convex portions provided by this material may include a substrate 1 and four spaced convex portions. The part 2, a first wafer 3, and a second wafer 4; wherein the substrate 1 is a circuit board on which necessary circuits are arranged. The four spaced convex portions 2 may be independent components, and are fixed and fixed to the surface of the substrate 1. For example, the spaced convex portions 2 may be fixed and fixed on the substrate 1 by using an adhesive; The portion 2 may also be a rib that directly forms a protruding structure on the upper surface of the substrate 1 when the substrate 1 is manufactured. In the third embodiment of the present invention, the four spaced convex portions 2 are arranged on one of the upper surfaces of the substrate 1. The positions of the four corners of the rectangle form an accommodation space S between the four spaced protrusions 2 and the substrate 1. Similarly, the spaced protrusions 2 may preferably be made of a non-conductive insulating material, such as a film Die Attach Film (DAF), engineering plastic materials, etc. Preferably, the planar view of the spaced convex portions 2 may have a geometric shape, such as an L shape, and two spaced convex portions 2 adjacent to each other are symmetrically arranged.
在本創作的第三實施例中,所述第一晶片3與第二晶片4可以分別是被動元件或其他半導體元件。首先將第二晶片4設於基板1與該等間隔凸部2所圍的容置空間S中,並使第二晶片4與基板1上的電路電性連接,例如透過銲接以電性連接;然後將第一晶片3安裝固定於該等間隔凸部2上,例如以黏著劑將第一晶片3黏合固定於間隔凸部2上,再於第一晶片3與基板1上的電路之間進行打引線,使得第一晶片3與基板1電性連接。最後將組合後的基板1﹑間隔凸部2﹑第一晶片3與第二晶片4置入模具中進行封裝製程,在該封裝製程中,將液態的絕緣塑封材料注入模具中,該塑封材料於模具中流動而填滿容置空間S,同時在基板1的上表面包覆於各個間隔凸部2﹑第一晶片3與第二晶片4,待塑封材料凝固後形成固態的塑封體5以保護內部的第一晶片3﹑第二晶片4﹑引線6及電路,並完成整體之封裝。In the third embodiment of the present invention, the first wafer 3 and the second wafer 4 may be passive elements or other semiconductor elements, respectively. First, the second wafer 4 is set in an accommodation space S surrounded by the substrate 1 and the spaced convex portions 2, and the second wafer 4 is electrically connected to a circuit on the substrate 1, for example, electrically connected by soldering; Then, the first wafer 3 is mounted and fixed on the spaced convex portions 2, for example, the first wafer 3 is adhered and fixed on the spaced convex portions 2 with an adhesive, and then performed between the first wafer 3 and the circuit on the substrate 1. Make a lead so that the first wafer 3 and the substrate 1 are electrically connected. Finally, the combined substrate 1, the spaced convex portion 2, the first wafer 3 and the second wafer 4 are put into a mold for a packaging process. In the packaging process, a liquid insulating plastic sealing material is injected into the mold. The mold flows to fill the containing space S, and at the same time, the upper surface of the substrate 1 is covered with each of the spaced protrusions 2, the first wafer 3 and the second wafer 4. After the molding material solidifies, a solid molding body 5 is formed to protect it. The first chip 3, the second chip 4, the lead 6 and the circuit are completed inside, and the whole package is completed.
本創作藉由前述的具有間隔凸部的半導體封裝結構,由於透過在基板1上設置至少二個間隔凸部2,並且將一晶片銲接在基板1上,而另一晶片直接設置在該等間隔凸部2上並且與基板打引線電性連接,所以可以減少整體封裝結構的電路佈線的複雜度,以及可以減少打引線的次數,減少引線材料使用量;再者,由於基板1的厚度沒有受到破壞或減小,再加上安裝的間隔凸部2具有補強肋條的作用,因而可以加強半導體封裝結構之強度。This creation uses the aforementioned semiconductor package structure with spaced convex portions. Since at least two spaced convex portions 2 are provided on the substrate 1, a wafer is soldered to the substrate 1, and the other wafer is directly disposed at the spaces. The bumps 2 are electrically connected to the substrate, so the complexity of the circuit wiring of the overall package structure can be reduced, the number of times of wiring can be reduced, and the amount of lead material used can be reduced. Furthermore, the thickness of the substrate 1 is not affected. Destruction or reduction, and the mounting of the spaced protruding portion 2 can strengthen the ribs, so that the strength of the semiconductor package structure can be enhanced.
以上所述僅為用以解釋本創作之較佳實施例,並非據以對本創作做任何的限制,因此,舉凡任何形式上之改變均仍應包括在本創作所欲保護之範圍。The above is only a preferred embodiment for explaining this creation, and is not based on any restrictions on this creation. Therefore, any change in any form should still be included in the scope of protection of this creation.
1‧‧‧基板1‧‧‧ substrate
2‧‧‧間隔凸部2‧‧‧ space convex
3‧‧‧第一晶片3‧‧‧ the first chip
4‧‧‧第二晶片4‧‧‧Second Chip
5‧‧‧塑封體5‧‧‧Plastic body
6‧‧‧引線6‧‧‧ Lead
S‧‧‧容置空間S‧‧‧ accommodation space
A‧‧‧基板A‧‧‧ substrate
A1‧‧‧凹槽A1‧‧‧Groove
B‧‧‧第一晶片B‧‧‧First Chip
C‧‧‧第二晶片C‧‧‧Second Chip
D‧‧‧引線D‧‧‧Leader
圖1係顯示習知的晶片堆疊形態的封裝結構之示意圖; 圖2係顯示習知將二個晶片配置於基板上的封裝結構之示意圖; 圖3為台灣專利公開第200623290號之半導體元件封裝構造之示意圖; 圖4為顯示本創作之具有間隔凸部的半導體封裝結構的第一實施例,其中的間隔凸部為獨立的元件並且安裝於基板上; 圖5為顯示本創作之具有間隔凸部的半導體封裝結構的第二實施例,其中的間隔凸部為形成於基板上的凸肋;以及 圖6為顯示本創作之具有間隔凸部的半導體封裝結構的第三實施例,其中包括有四個配置於一矩形的四個角落的L形間隔凸部,並且彼此相鄰的二個間隔凸部之間呈對稱地配置。FIG. 1 is a schematic diagram showing a conventional package structure of a stacked wafer form; FIG. 2 is a schematic diagram showing a conventional package structure in which two wafers are arranged on a substrate; FIG. 3 is a semiconductor device package structure of Taiwan Patent Publication No. 200623290 Schematic diagram; FIG. 4 shows the first embodiment of the semiconductor package structure with spaced convex portions, where the spaced convex portions are independent components and mounted on the substrate; The second embodiment of the semiconductor package structure, wherein the spacer protrusions are ribs formed on the substrate; and FIG. 6 shows a third embodiment of the semiconductor package structure with spacer protrusions, which includes four L-shaped spaced convex portions are arranged at the four corners of a rectangle, and two spaced convex portions adjacent to each other are arranged symmetrically.
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